@ daedeok convention town (2004.03.24) cst em studio...

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CST Advanced Training 2004 CST Advanced Training 2004 @ @ Daedeok Daedeok Convention Town (2004.03.24) Convention Town (2004.03.24) CST CST EM EM Studio Studio TM TM : : Examples Examples Chang-Kyun PARK (Ph. D. St.) Thin Films & Devices (TFD) Lab. Thin Films & Devices (TFD) Lab. Dept. of Electrical Engineering, Dept. of Electrical Engineering, Hanyang University @ Hanyang University @ Ansan Ansan Campus, KOREA Campus, KOREA E-mail: [email protected]

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CST Advanced Training 2004CST Advanced Training 2004@ @ DaedeokDaedeok Convention Town (2004.03.24)Convention Town (2004.03.24)

CSTCST EM EM StudioStudioTMTM

:: ExamplesExamples

Chang-Kyun PARK (Ph. D. St.)

Thin Films & Devices (TFD) Lab.Thin Films & Devices (TFD) Lab.Dept. of Electrical Engineering,Dept. of Electrical Engineering,

Hanyang University @ Hanyang University @ AnsanAnsan Campus, KOREACampus, KOREA

E-mail: [email protected]

OOUTLINEUTLINE

Introduction

Example

E-staticElectrometer

CST EM CST EM StudioStudioTMTM v.2.0v.2.0

M-staticRotary Encoder

J-staticCircuit Breaker

TrackingElectron gun

RJ 45 LAN connectorVariable capacitor

Floating PotentialField EmitterTapered-type gated FEA

LFEddy current sensor

TFD Lab.TFD Lab.Hanyang UniversityHanyang UniversityProfessor: JinProfessor: Jin--SeokSeok ParkPark

TFD Lab. TFD Lab. TFD Lab.

Thin films and devices lab. for electronic displays and communications

http://tfd.hanyang.ac.kr

CST CST EM StudioEM Studio

MAFIAMAFIA

CST MAFIA

MAFIA® (Maxwell’s Equations by the Finite Integration Algorithm)MAFIA is an interactive program package for the computation of electromagnetic fields. It is based directly on the fundamental equations of electromagnetic fields, Maxwell’s equations.

MAFIA is a modular program, it is divided in preprocessor, postprocessor and solvers for different special cases of Maxwell’s equationsMAFIA includes an optimizer, it runs

interactively as well as in batch or semi interactive using predefined command sequences. It has a powerful command language for automation and optimizing purposes and an advanced interactive graphical output with thousands of display options

MAFIA ModuleMAFIA Module

MAFIA Module

CST MAFIA

MAFIAMAFIA

The Following modules are available (I)

CST MAFIA

M : Preprocessor, includes solid modeler, CAD import, 3D graphics P : Postprocessor, includes 3D graphics and calculation of deduced quantities like far field and impedanceS : Static field module, solves electrostatics, magnetostatics, heat flow problems, stationary current flow problems and electro-quasistaticproblemsT3 : Time domain module, simulates time dependent wave propagation, most general and versatile in application. Uses Cartesian coordinates TS3 : Time domain module, simulates charged particle movement in time dependent fields including the interaction of particles and fields. Uses Cartesian coordinates only TS2 : Time domain module, simulates charged particle movement in time dependent fields including the interaction of particles and fields in cylinder symmetrical structures

MAFIAMAFIA

The Following modules are available (II)

CST MAFIA

E : Frequency domain eigenmode module, finds modes in resonators and waveguidesW3 : Frequency domain module, covers the whole frequency rangeH3 : Thermodynamic module, solving thermodynamic problems in time domain in either Cartesian or polar coordinate systemT2 : Time domain module, simulates time dependent wave propagation within cylinder symmetrical structures. Not yet available under GUIOO : Optimizer with many built in strategies. Optimizing capabilities not yet completely available under GUIA3 : Time domain acoustic solver. Not yet available under GUI

The Simulation MethodThe Simulation MethodBackground of the Simulation Method

CST EM Studio

CST EM STUDIO is a general-purpose electromagnetic simulator based on the Finite Integration Technique (FIT), first purposed by Weiland in 1976/1977.

Finite Integration + PBA(Statics to THz)

Maxwell Grid Equations

E-static

0=∂∂t

ωita

∂∂

0≠∂∂t

M-static

J-static

Tracking

Frequency Domain (j>0)

Eigenvalue Problem (j=0)

Implicit

ExplicitTime

Domain

PICMAFIA

EMS MWS

CSTCST EM StudioEM StudioExample: EExample: E--staticstatic

SS--static 1: Electrometer static 1: Electrometer Introduction

CST EM Studio

PEC

This Example deals with the simulation of a simple electrometer device, which can be used for voltage measurements. The model used for the electrometer consists of three parts: the electrometer’s scale, the ground, and the pointer.Results of interest: the capacitance and the torque for different angles of the pointer

The main dimensions of the electrometer device (unit: cm)

Pointer(PEC, 1,000V)

Scale(Dielectric, ε=10)

Ground(PEC, 0V)

SS--static 1: Electrometer static 1: Electrometer

Summary

CST EM StudioMeshcells: 294,528

48min, 10secTotal solver time

AngleFrom 20 to 70 (11steps)

Parameter sweep

294,528Meshcells

ElectrostaticSolver

Mesh generation

SS--static 1: Electrometer static 1: Electrometer

Potential

CST EM Studio

E-Field

SS--static 1: Electrometer static 1: Electrometer

CST EM Studio

Torque vs angle

SS--static 2: RJ 45 Connector static 2: RJ 45 Connector Introduction

CST EM Studio

This example shows the calculation of the capacitance matrix of a RJ45 connection. The model consists of the connector and the corresponding socket, each containing eight wires for the signal transmission. The wires of the socket are fixed to a substrate plate, every other of them additionally connected to a metallic ground plane. This provides some kind of shielding effect for the transmission of the wire signals.

Results of interest: capacitance Matrix

SS--static 2: RJ 45 Connector static 2: RJ 45 Connector Define Potential

CST EM Studio

Potential 1(PCB PEC, 0V)

Potential 2(PCB PEC, 1V)

Potential 3(PCB PEC, 1V)

Potential 4(PCB PEC, 1V) Potential 5

(PCB PEC, 1V)

SS--static 2: RJ 45 Connector static 2: RJ 45 Connector

Potential

CST EM Studio

E-Field

SS--static 2: RJ 45 Connector static 2: RJ 45 Connector

Capacitance Matrix

CST EM Studio

SS--static 3: Variable Capacitor static 3: Variable Capacitor Introduction

CST EM Studio

The variable capacitor example demonstrates the parameter sweep feature in combination with the capacitance calculation.

Plate(PCB PEC, 0V)

Plate(PCB PEC, 1V)

Epsilon(Dielectric, ε=100)

Parameter Sweep

Capacitance Vs Alpha

CST EM Studio

SS--static 3: Variable Capacitor static 3: Variable Capacitor

SS--static 4: Floating Potential static 4: Floating Potential Introduction

CST EM Studio

This examples demonstrates how to consider floating potentials in an electrostatic calculation. It consists of four metallic plates and two plates of high dielectric material (relative permittivity 10000). On the two larger metallic plates a potential is defined, the other two metallic plates carry a charge of 0C.

Plate(PCB PEC, -1V)

Plate(PCB PEC, 1V)

PECFloating Potential

High dielectric material (relative permittivity 10000)Applied charge value: 0C

Result: Electric Field Distributions

CST EM Studio

1V

-1V

0.469V

-0.469V

0.467V

-0.467V

SS--static 4: Floating Potential static 4: Floating Potential

Result: Electric Field Distributions

CST EM Studio

SS--static 4: Floating Potential static 4: Floating Potential

Only PEC Conditions

CST EM Studio

SS--static 4: Floating Potential static 4: Floating Potential

Result: Potential Distributions

CST EM Studio

1V

-1V

0.469V0V

0V-0.469V

SS--static 4: Floating Potential static 4: Floating Potential

Result: Electric Field Distributions

CST EM Studio

SS--static 4: Floating Potential static 4: Floating Potential

X-cut Plane

Cathode (0V)

Isolated Electrode Ballast layer, a-Si

Insulator, SiO2

Gate (30V)

CNT

Anode (50V)

10μm

SS--static 5: Field emitter static 5: Field emitter

Material Property Unit: μm

CNT(PEC)

Diameter: 0.040Height: 1Tip radius: 0.020

Base: a-Si

Height: 2

Diameter: 0.040

SS--static 5: Field emitter static 5: Field emitter

PotentialUnit: μm

Cathode(0V)

Gate(30V)

Anode(50V)

SS--static 5: Field emitter static 5: Field emitter

Floating Potential Unit: μm

Isolated Electrode

CNT

SS--static 5: Field emitter static 5: Field emitter

Results: Potential Distribution

Isolated Electrode: 26V

Tip Region: 27V

SS--static 5: Field emitter static 5: Field emitter

Results: Electric Field Distribution

SS--static 5: Field emitter static 5: Field emitter

Results: 1D Plot

SS--static 5: Field emitter static 5: Field emitter

Geometry

Cathode (0V) Inter-dielectric Ballast layer, a-Si

Insulator, SiO2

Gate (50V) Parameter Sweep

CNT-Floating Potential (0C)

Monitoring Point

SS--static 6: Taperedstatic 6: Tapered--type Gatedtype Gated--FEA FEA

45o

68o

90o

Parameter Sweep (Pierce Electrode angle: 90o~12.5o)Result: Potential Distributions

SS--static 6: Taperedstatic 6: Tapered--type Gatedtype Gated--FEA FEA

Parameter Sweep (Pierce Electrode angle: 90o~12.5o)

45o

68o

90o

Result: Electric Field Distributions

SS--static 6: Taperedstatic 6: Tapered--type Gatedtype Gated--FEA FEA

ICP Reactor

SS--static 7: ICPstatic 7: ICP--Reactor Reactor

Simulation of ICP Reactor under DC Bias Conditions

System summary

OS: MS Windows XP V.5.1 SP1Model: Intel Zeon (SE7505VB2) 2

CPUProcess: Genuine Intel ~2790MhzMemory: 1,024.00MBGraphic Adapter: Quadro4 980XGL

Simulation summary

Tool: CST EM Studio TM v 1.3 (CST GmbH)

Simulation field: Electrostatic SolverNumber of nodes: 1,074,480Mesh generation time: 130 sSolver time: 13 s

Modeling of ICP Reactor

SS--static 7: ICPstatic 7: ICP--Reactor Reactor

Simulation

Conditions Simulation Results Under 300 V Conditions

Potential distribution

SS--static 7: ICPstatic 7: ICP--Reactor Reactor

Electric Field distribution

Conditions Simulation Results Under -450 V Conditions

Potential distribution

SS--static 7: ICPstatic 7: ICP--Reactor Reactor

Electric Field distribution

CSTCST EM StudioEM StudioExample: MExample: M--staticstatic

MM--static 1: Rotary Encoderstatic 1: Rotary EncoderIntroduction

CST EM Studio

In this tutorial a rotary encoder consisting of two iron yokes, a permanent magnet and two hall sensors is analyzed.

Both yokes form a magnetic circuit, which is driven by a cylindrical permanent magnet. Two hall sensors are placed in the air gap between the yokes to measure the flux density in the gap. By twisting the yokes the B-field changes linear with the rotation angle.

Upper Yoke(Iron 1000)

Bottom Yoke(Iron 1000)

Magnet

Hall Sensor

0.2 T|z

MM--static 1: Rotary Encoderstatic 1: Rotary Encoder

B-Field

CST EM Studio

MM--static 1: Rotary Encoderstatic 1: Rotary Encoder

Parameter Sweep

CST EM Studio

Field Watch Position

CSTCST EM StudioEM StudioExample: LF (Low Example: LF (Low Frequency) SolverFrequency) Solver

LF: Eddy Current SensorLF: Eddy Current SensorIntroduction

CST EM Studio

In this example and eddy current sensor is modeled to simulate non-destructive material test. You will analyze an eddy current sensor driven by a low frequency coil generating eddy currents in an aluminum probe plate.

The structure depicted above consists of the sensor, represented by an excitation current coil embedded in iron material. Below this sensor the probe plate is given as a lossy aluminum material, allowing the flow of eddy current. Inside this plate a material defect is modeled as a gap, which should be detected by the changing voltage at the coil.

LF: Eddy Current SensorLF: Eddy Current Sensor

CST EM Studio

B-Field (0o) Eddy Current (90o)

CSTCST EM StudioEM StudioExample: Stationary Example: Stationary Currents SolverCurrents Solver

SC: Circuit BreakerSC: Circuit BreakerIntroduction

CST EM Studio

In this example, you will analyze a circuit breaker consisting of two contact springs connected by a bridge.

One matter of concern is the current flow from one contact over the bridge to the other contact. Therefore two current port are defined for the stationary current solver. After the solver run the fields are visualized and then used as a source field for a subsequent carried out magnetostatic calculation.

Cupper(J-port, -0.05V)

Cupper(J-port, 0.05V)

Contact pad(PEC)

Bridge(PEC)

SC: Circuit BreakerSC: Circuit Breaker

CST EM Studio

Current Density

Loss Power (P): 6.856485e+001 [W]R = V2/P=0.1*0.1/P = 1.458473e-4I = P/V = V/R = 685.65 [A]

SC: Circuit BreakerSC: Circuit Breaker

CST EM Studio

H-Field

CSTCST EM StudioEM StudioExample: Tracking Example: Tracking SolverSolver

Tracking 1: Electron GunTracking 1: Electron GunIntroduction

CST EM Studio

This example demonstrated how a particle tracking can be performed. Two types of field results were used here, an electrostaic field is used to accelerate electrons being emitted from a cathode and a magnetostatic field which is caused by a helmholz coil in order to focus the electron beam.

Anode(PEC, 1000V)

Cathode(PEC, 0V)

Focus coil(0.4A)

Tracking 1: Electron GunTracking 1: Electron Gun

Particle Source

CST EM Studio

Emission Site(electron)

Particle Tracking