1

4. EMC measurement methods

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Why EMC standard measurement methods

Check EMC compliance of ICs, equipments and systems

Comparison of EMC performances between different products, different technologies, designs, PCB routings

Improve interaction between customers and providers (same protocols, same

set-up)

EMC measurement methods

3

Device under testCoupling device

Coupling network

Antennas

Wave guide

Acquisition system

Spectrum analyzer

EMI receiver

Oscilloscope

Emission – General measurement set-up

Radiated or conducted coupling

50Ω adapted path

Control - Acquisition

Emission requirements verified ?

Emission measurement methods

4

IEC 61967-2

(TEM : 1GHz)

IEC 61967-3/6

(Near field scan, 5GHz)

IEC 61967-4

(1/150 ohm, 1 GHz)

IEC 61967-5

(WBFC, 1 GHz)

IEC 61967-7

(Mode Stirred Chamber: 18 GHz)

IEC 61967-2

(GTEM 18 GHz)

International standards for IC emission measurement methods

Emission measurement methods

5

GTEM cell : radiated emission up to 18 GHz

septumseptum

test test boardboard

foam foam absorberabsorber

50 Ohms 50 Ohms resistive loadresistive load

septumseptum

test test boardboard

foam foam absorberabsorber

50 Ohms 50 Ohms resistive loadresistive load

Emission spectrum

Emission measurement methods

6

SpectrumAnalyser

1ohm

IC

Complex implementation

with multiple power pins

IEC 61967-4 International Standard : 1/150 Ohm method

Emission measurement methods

7

Microcontroller - 32 MHz scan

Low

High

X axis

Y axis

dBµV

freq

32MHz

IEC 61967-3 International Standard : Near field scan

Emission measurement methods

8

Hx Probe

Priviledged current

measurement

Power rails

CPU 12RAM

2K

32K FEEPROM28K

FEEPROM

Power rails

MS-CAN

ATD1

ATD0

PWM

ECT

MIBUSMSI

EE1K

MMIINTBDM

KWU

LIM D60CGM

WCR

MEBIBKP

Emission measurement methodsIEC 61967-3 International Standard : Silicon scan

9

Immunity measurement methodsImmunity – General measurement set-up

Device under test

Coupling deviceCoupling network

Antennas

Wave guide

Radiated or conducted coupling

Disturbance generation

Harmonic signal

Transients

Burst

50Ω adapted path

Failure detectionInjected level Extraction

Immunity requirements verified ?

10

IEC 62132-2

(Bulk Current Injection : 1 GHz)

IEC 62132-3

(Direct Power Inj 1GHz)

IEC 62132-4

(TEM/GTEM)

IEC 62132-5

(WBFC 1 GHz)

New proposal:

(LIHA : 10 GHz)

Still research:

(NFS 10 GHz)

International standards for IC susceptibility measurement methods

Immunity measurement methods

11

Immunity measurement methods

10W Amplifier

Oscilloscope

PC Monitoring

Signal generator

IEEE Bus or

Good signal

Failure signalPrinted Circuit Board

Device under test

Dout

Coupling Capacitance DUT

Power increase loop until failure

Frequency loop 1 MHz – 3 GHz

IEC 62132-3 International Standard : Direct Power Injection

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Immunity measurement methods

Inductive coupling to the network Parasitic current injected on the chip Limited to 1 GHz

Normal current

Parasitic current

RF power

CAN Bus

Microcontroler

DUT

Fault

Measured current

IEC 62132-2 International Standard : Bulk Current Injection

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EMC equipments

Vector Network Analyzer 10 GHz (100 K€)

Signal Synthesizer 6 GHz (20 K€) GTEM cell 18 GHz

(15 K€)

Spectrum analyzer 40 GHz (40 K€)

Amplifier 3 GHz 100W (60 K€)

Expensive …. Complete EMC laboratory : 500 K€

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5. EMC models

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Models – What for ?IC designers want to predict EMC prior fabrication

Noise margin

Voltage bounce on Vdd

IC designers want to predict power integrity and EMI during design cycle to

avoid redesign

EMC models and prediction tools have to be integrated to their design flows

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Models – What for ?

© Siemens Automotive Toulouse

Most of the time, EMC measurements are performed once the equipment is built.

No improvements can be done at conception phase.

Predict EMC performances IC, board, equipment optimizations

Equipment designers want to predict EMC before fabrication

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EMC of IC models

Complexity

Level

Equipment

Board

Component

Physicalspice

V, Z

106 R,L,C,ILEECS

ICEM

Dipoles

102 R,L,C,I

101 R,L,C,I

101 dipoles

100 V(f), 100 Z(f)

x-highhighlow medium

Expo PowerSI

104 R,L,C,I

EMC Models depends on the targeted complexity and the confidentiality.

Confidentiality