1 (Company Confidential)

XRF Metrology XRF Metrology

Tools for Solar Tools for Solar

PhotovoltaicPhotovoltaic

ManufactureManufacture

Company Confidential

2 (Company Confidential)

Age of Solid State Energy PV Efficiency Gains & Cost Reduction

will achieve Convergence With Fossil Fuel Grid Costs

Solar Metrology: The Convergence

3 (Company Confidential)

Low-cost solar PV factories of the

future will utilize:

New Materials: R&D

Products: Process

Develop and commercialize

new low cost solar PV panels through

capacity ramp and yield

management.

Solar Metrology: The Market Driver

4 (Company Confidential)

Solar Metrology: The Market Potential

PV Metrology Equipment Market: $5 billion TAM projected by 2012.

One Trillion-Dollar Global Electricity Generation Industry

Solar PV currently <1% of total annual electric

power generation worldwide.

Solar PV market share in vicinity of 10%

anticipated by 2020.

5 (Company Confidential)

Solar Metrology: What We Do

We Provide an Enabling

Technology…

Solar Metrology tools are required to

manufacture the active layer in

photovoltaic (PV) cells that converts

sunlight to electricity.

Solar Metrology technology enables

manufacturers to conduct R&D, control

processes and manage yield to produce

high-efficiency, low-cost commercial solar PV

panels.

TCOWindow Layer (CdS)

CIGSBack Contact (Mo)

Glass, Stainless, Plastic

CIGS Layer

6 (Company Confidential)

MoCIGS

CdS

Substrate

Photons from the X-Ray tube impinge on the sample material (CdS or CIGS/Electrode Layer/Substrate). Atoms are ionized and fluoresce characteristic emissions that are collected by a detector then amplified, digitized , and sorted into a histogram (intensity vs. energy – spectrum) and displayed

Solar Metrology: How We Do It

7 (Company Confidential)

Solar Metrology: Who Will Do It

THE SOLAR MANAGEMENT TEAM…

Has over 100 years cumulative experience in the XRF business.

Formed Matrix Metrologies in 2003

Has existing base of success to leverage in transition to solar.

Has designed and marketed six XRF product lines, with an installed base in excess of 5000 units.

Members have held key management positions at Thermo, Veeco Instruments, Fisons and Kevex.

8 (Company Confidential)

Solar Metrology: Who Will Do ItMANAGEMENT TEAM:

FRANK REILLY: President & Sales/Marketing Director (Principal)Successfully managed Matrix Metrologies as a going concern for five years.

(Years XRF Experience: 22) FRANK FERRANDINO: V.P. & Dir. of Technology/Project Management (Principal)

Patented X-ray optical beam and detector column with vacuum conduit; developed

and patented NIST-traceable metal calibration standards. (Years XRF Experience: 26) JIM BOGERT: Director, Domestic Sales, Spectroscopist (Principal)

Developed advanced mathematical methods for spectral analysis; extensive surface analysis, materials engineering and sales force management experience. (Years XRF Experience: 26)

IGOR LENICKY: Director, International Sales, QC Engineer (Principal)Experienced global marketer of advanced technology-based instrumentation.(Years XRF Experience: 30)

TIM CAHANEY: Director, Marketing/Product Management (Principal)Experienced in development of process and metrology equipment solutions for semiconductor industry and Polytechnic Inst. of NY graduate (Years Semi Experience: 30)

BOARD OF DIRECTORS: Frank Reilly, Frank Ferrandino, Walter ScherrADVISORS: WALTER SCHERR: Founder of Panafax (first commercially availably fax machine), Litton,

Sperry and Veeco Instruments; operated XRF Industrial Measurement Group at Veeco.

EDWARD BRAUN: MBO Veeco instruments (1991); CEO Veeco; President of SEMI and Solar Product Development Specialist at Veeco.

9 (Company Confidential)

Solar Metrology: Product Platforms

Our Products SMX-BEN, SMX-ILH, SMX-ISI

The System SMX is a unique family of three platforms designed exclusively for the Photovoltaic manufacturing industry for multi-layer thickness and composition measurements of flexible or rigid substrates. Presently containing XRF technology it allows for the inclusion of other “best-of-breed” measurement technologies.

SMX-BEN for Bench top Measurements

SMX-ILH for In-Line, Near-Line Atmospheric Measurements- Integrated or Remote X-Ray head; Static, Linear, and Dual-Axis Configurations

SMX-ISI for In-situ Vacuum Measurements- Static or Linear X-Ray headConfigurations

10 (Company Confidential)

Solar Metrology: Tool Insertion Points

XRF Tool Insertion Points

R&D, Process development, Failure analysis Material selection, Layer formulations

Off-Line Process Control

Detailed individual Product Sampling

Yield Management

In-line and In-situ measurement of PV cells and panels

11 (Company Confidential)

Solar Metrology: Moving Forward

Future PV Manufacturing Requirements

Capacity Ramp of existing technology

Enhanced Yield Management

Continuous Gains in Conversion Efficiency

Future Solar Metrology Requirements

Expansion of global distribution channels

Rapid product development

Procurement of additional metrology Methods