1.5 giga hertz ultra high speed adc testing on atesoc.yonsei.ac.kr/test/papers/6th/g-2 ate ac signal...

2005. 7. 1. Jin-Soo Ko 제 6 회 테스트 학술 대회1

1.5 Giga Hertz Ultra High Speed ADC Testing on ATE

Jin-Soo KoTeradyn Inc.

제 6 회 테스트 학술 대회22005. 7. 1. Jin-Soo Ko

Contents

w Giga Hertz ADC Overvieww Challenges to ATE Systemsw Tiger Mixed Signal Instruments Introduction w Device Test Requirementsw Tiger System Configurationw DIB Design Techniquew Dynamic Testing Resultsw Conclusion


Giga Hertz ADC Overview

w Flash, Folding Architecturesw 6 to 10 Bit Resolutionw ~500MHz to 2~3 GHz Sample Ratew Bipolar, SiGe, CMOS Processesw Differential Analog Input, Differential

Digital Output, Differential Clockw BGA, LQFP Packages


Giga Hertz ADC Applications

w Direct RF Down Conversionw Digital RF/IF Signal Processingw Satellite Set-top Boxesw Electronic Countermeasures/Electronic

Warfarew High Speed Data Acquisitionw ATE Systemsw Digital Oscilloscopesw …


Test System Requirements

w High Frequency High Performance Sine Wave Signal Generatorw Low Jitter High Frequency Clock Generatorw Ultra High Speed Digital Pin Electronics

with DSSC ( Digital Signal Source and capture) Capabilitiesw Differential Analog & Digital Capabilities


AC Instruments for GHz ADC Testing

AC Instrument Description

LFAC 1.2 MHz, 90 dB Source and Dig

BBAC DC to 15 MHz Source and Digitizer

VHFCW 250 MHz CW Source

AWGLAN Octal Diff Outputs, 250 MHz BW

AWG2500 10-bit, 2500 Msps, DC to 1400 MHzBW

3.2GHz CW Src Microwave Sine Wave Source

PicoClock 1 GHz Clock, <1.5 pS rms Jitter


DPE32: Differential Pin Electronics

Differential Driver6-Level Output Waveform

Differential ComparatorPass/Fail Signal

1.6 GbpsDrive/Compare/ IO

High Speed Differential Digital Instruments for GHz ADC Testing


“V” means compare to LOW or HIGH and send data to capture memory

Tiger DSSC - Digital Signal I/O

10110HLHLXX---10110H--HHLHL------111-----X00XXXXX---11101000000LHH10110HLHLXX---10110H--HHLHL------111-----X00

REPEAT 32 10110HLHLXXWWWWWWWWWWW10110HLHLXX---10110H--HHLHL------111-----X00XXXXX---11101000000LHH10110HLHLXX---10110H--HHLHL------111-----X00XXXXX---11101000000LHH10110HLHLXX---10110H--HHLHL------111-----X00

REPEAT 32 10110HLHLXXVVVVVVVVVVV10110HLHLXX---10110H--HHLHL------111-----X00XXXXX---11101000000LHH

010000001100101011000111110110110010000000010011011011011100110100..

“W” means substitute data from the source segment memory

?????????????????????????????????????????????????????????????????????????????..

DUT needs a specific ‘waveform’

‘Captured waveform’ to be processed.

Result is a ‘performance’measurement like SNR

Functional Testing

Digital Signal Segment #132 samples

Digital Signal Capture #132 samples

FunctionalTest Requirement

PerformanceTest Requirement


Tiger DC Instruments

DC Instruments Quantity Description

AAPU’s Up to 48 ±30 V, ±30 mA

VI Up to 7 ±60 V, ±200 mA

HCU Up to 4 ±30 V, ±2 A

Quad Voltage Source Up to 8 +6 V, 5 A(QVS) Sources Gangable to 10 A

High Current Power Up to 24 8 @ 6 A per board,Supplies (HCPS) Sources Gangable to 48 A


Device Test Requirements

w 1.5Gsps, 8Bit ADCw INL, DNL < 1.0 LSBw Dynamic Testing @ fi = 250MHz, fs = 1.5GHz

n SNR > 45 dBn THD < -50 dBn SFDR < -50 dBn SINAD > 44 dBn ENOB > 7.0 LSBn IMD < -66.8dBc


Test Setup

CW

AWG

Ext. Src

Ext. Clk

HSD

Pico Clk

BPF

DIGCAP

DIGCAP

DUT

QVS, dutsrc, duthcu, etc

w DUT Input, Output, CLK are Differential

w DIGCAP: Parallel Octal Moden 4 Bit Widthn 2 for Primary Data

Outputn 2 for Auxiliary

Data Outputn 750Msps Data Rate

w High Freq Relays Controlled by SDBs

w BPF: Low distortion CW signal shaping


Dual Tone Generation

w Multi-Site Parallel Testing

w High Quality Dual Tone Generation

w Improving IMD Performance by Using 2 Independent Sources

w CW Source:n 250MHz Rangen 1 Hz Stepn 12Bit Resolution

w Combiner/Splitter

CW2

CW1

Combiner Splitter

f1

f2f1 f2

f1 f2f1 f2

To Site #0

To Site #1

vhfawgvhfcw


DIB Design Information

w Dual Site Designw 20 Layers:

n 8 GND Layersn 4 Power Layersn 6 Internal Layersn 1 Component Siden 1 Solder Side

w Single GND Planew Splitted PWR Planesw Avoid through holesw Matching impedance

Site #0Site #1

BPF

Ext. ClkInput

Ext. Sig. Input

High Speed Relays

Combiner/Splitter


PECL Digital Output Termination

•Differential drive

•Force high

• common mode 1.3v (device spec)

•50 Ohm termination

Drive Side:

Receive Side:•Differential Receive

•Compare pattern

•Vod = 0.2v (device Spec)


Dynamic Test Pattern

Pattern Running in T8 ModeDIGCAPs for

Primary Data Output

DIGCAPs for Auxiliary Data Output


External Instrument Integration

Marconi 2026

CableTrunk

ATEMainframe

ATETesthead

Generic CC/Cardletfor signal delivery

10M Ref.

DIB


Test Results: CW Src for Fs=0.8GHz

w Fs=0.8GHz fi=250MHz,


Test Results: Ext Src for Fs=0.8GHz



Test Results: CW Src for Fs=1.5GHz

SNR = 45.72dB

THD =-67.84dB

SFDR =-57.88dB

SINAD = 45.70dB

ENOB = 7.30dB



Test Results: Ext Src for Fs=1.5GHz


SNR = 47.45dB

THD =-67.31dB

SFDR =-63.45dB

SINAD = 47.41dB

ENOB = 7.58dB


Dual Tone IMD Testing Resultsw Fs = 1.5GHzw Fi1 = 249.5MHzw Fi2 = 250.5MHzw IMD <= -67dBw Clk Src: Marconi 2026w Sig Src: HP8644B

1.5 giga hertz ultra high speed adc testing on atesoc.yonsei.ac.kr/test/papers/6th/g-2 ate ac signal...

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