accelerator laboratory of the ruđer boškovićinstituteruđer bošković institute, zagreb, croatia...
TRANSCRIPT
Accelerator laboratory of the Ruđer Bošković Institute
Laboratory for ion beam interactionsDivision of experimental physics,Zagreb, Croatia
Ruđer Bošković Institute, Zagreb, Croatia
Scientific: Milko Jakšić, Tonči Tadić, Iva Bogdanović Radović, Zvonko Medunić, Stjepko Fazinić
Development: Natko Skukan, Mladen Bogovac,
Postgraduate students: Željko Pastuović, Zdravko Siketić, Marko Karlušić,
Technical: Andrija Gajski, Željko Periša
Others: Hideshi Muto,
History of accelerators at the Ruđer Bošković Institute
1956.
200 keV
neutron generator
1962.
Cyclotron
(20 MeV deuterons) 1987 Tandem van de Graaff
Ruđer Bošković Institute, Zagreb, Croatia
Accelerator laboratory – today
S1
S2
M1
M2
M3
D1D2 Q1
tQ2
Q3
QM
DM
E1E2
HV
F1F2
F3
F3
tQ1 tS2 tM2
tM3
S3
tM1
F1tS1
tE1 tL1
tHV
tS1
Alphatross
SputteringDuoplasmatron
Nuclearmicroprobe
H.R. PIXE
Nuclear reactions
H.R. ERDA
PIXERBS
6.0 MV EN Tandem Van de Graaff
1.0 MVHVE Tandetron
• 6.0 MV EN Tandem Van de Graaff
Ruđer Bošković Institute, Zagreb, Croatia
• 1963 – 1984 Rice University, Houston, Texas• Since 1987 in routine operation in Zagreb • Two ion sources – Alphatros (H, He), sputtering (Li, C, O,....)• Five beam lines
• Beam lines
• Existing beam lines of EN Tandem accelerator
1. IAEA beam line - routine PIXE/RBS
2. TOF ERDA
3. Nuclear reactions chamber
4. High resolution PIXE / ion implant.
5. Nuclear microprobe
• 1.0 MV Tandetron
Ruđer Bošković Institute, Zagreb, Croatia
• High Voltage Engineering, The Netherlands(funded by Ministry of science of Croatia and IAEA)
• Direct extraction duoplasmatron ion source• Sputtering ion source (planned for 2006)• Terminal voltage range 0.1 – 1.0 MV, high stability,
beam currents up to 50 µA
• 1.0 MV Tandetron
• Tandetron beam lines (plans)
• External beam for cultural heritage objects• New microprobe for heavy ions / low energies • Two beams chamber for materials modification
1. New developments
• ACCEL6 & ACCEL1 – accelerator computer control• Beam optics calculation• Calculation of electric field distribution• SPECTOR – data acquisition and sample positioning• Remote experiments• New scattering chambers (microprobe and TOF ERDA)
Ruđer Bošković Institute, Zagreb, Croatia
Computer control – ACCEL6 for EN Tandem Van de Graaff and ACCEL1 for Tandetron accelerator
Natko Skukan – IRBDejan Đurđenić - Dilogic
Ruđer Bošković Institute, Zagreb, Croatia
Capabilities:Remote control (from remote computers)Reads beam optics parameters from previous experimentsCalculates changes of parameters for change of energy and/or ionSecurity interlock system
- 16 bit AD/DA modules (8 AD, 8DA) (controls for ion sources, accelerator and beam optics system)- 8 digital inputs, 8 digital outputs - Controls are based on TESTPOINT
Beam optics calculations –for ion beam from Tandetron to nuclear microprobe
Marko Karlušić
ion beamfrom Tandetronaccelerator
Ruđer Bošković Institute, Zagreb, Croatia
900 mag. sw. mag. quad.1 quad.2 obj. slits
The Robin Hood method – a novel numerical method for electrostatic problems based on a non-local charge transfer
P. Lazić, H. Štefančić, H. AbrahamTheoretical Physics Division
Article available on line at: http://xxx.lanl.gov/abs/physics/0411192
Ruđer Bošković Institute, Zagreb, Croatia
Solution of electric field and potentialwith 1.0 MVinside the Tandteron tank
SPECTOR –Data acquisition /target positioning & beam scanning software
Mladen Bogovac
Ruđer Bošković Institute, Zagreb, Croatia
Long distance accelerator experiment –In colaboration with INFN & Universita di Torino
Ruđer Bošković Institute, Zagreb, Croatia
TORINO
ZAGREB
780 km
WEB1E8 1E9 1E10
0,3
0,4
0,5
0,6
0,7
0,8
0,9
1,0
10/09/2004 14:42:48
1-5 MeV protons
CC
E
FLUENCE (cm−2)
yexp10 yexp20 yexp30 yexp40 yexp60 y y y y y
Zvonko!Switch off
Natko music!
N. Skukan, M. Bogovac
New microprobe scattering chamber
Z. Medunić, M. Jakšić, A. Gajski
Ruđer Bošković Institute, Zagreb, Croatia
ERDA
PIXE
xyz &rotation
Load lock
STIM
TOF ERDA system
Z. Siketić, I. Bogdanović Radović, A. Gajski
12 MeV 16O
CN
O
2. Research highlights
Ruđer Bošković Institute, Zagreb, Croatia
• Basic research in nuclear and atomic physics1. Light nuclei nuclear reactions
(Laboratory for nuclear reactions - Đ. Miljanić et al)2. Inner shell ionisation, chemical effects 3. Elastic scattering of light ions, data base
• Materials science and applications1. Transport of charge carriers – characterisation/modification2. Analysis of thin films (RBS &ERDA) with nm depth resolution3. Modification of insulators
• Analytical applications1. Cultural heritage objects – HRZ2. Technological projects (cement, solar cells)3. Air polution monitoring4. Other analytical services
• Basic research
- Inner shell ionisation – x-ray spectroscopy ☻ chemical effects in Kβ line of Vanadium
compounds
450 500 550 600 650
102
103
104
VV2O3VO2 VCNH4VO3VCl2VO(SO4)*5H2OV2O5
Channel
Cou
nts
520 540 560 580 600 620 640 660 6800
50
100
150
200
250
300
350
400
450
500VV2O3VO2 VCNH4VO3VCl2VO(SO4)*5H2OV2O5
Channel
Cou
nts
Ruđer Bošković Institute, Zagreb, Croatia
• Basic research
- Elastic scattering of light ions ☻ 2.0 to 6 MeV Li7 ion beam on hydrogen
Ruđer Bošković Institute, Zagreb, Croatia
• Materials science
Ruđer Bošković Institute, Zagreb, Croatia
- Thin film analysis – depth profiling – for nm depth resolution☻ RBS Rutherford backscattering – beam of protons, He, Li, C ions
(nm depth resolution with grazing incidence, or TOF system)☻ ERDA - IEE system for H only & 3D on nuclear microprobe (O beam)
- TOF system for other elements (I, Au beam)☻ion implantation
- Study of Charge Transport properties by Time Resolved and Temperature dependent Ion Beam Induced Charge
• Thin film analysis – IEE ERDA for hydrogen
Sample (on x,y,zmanipulator)
Beam entrance
Microscope
SB Detector
Microchannel plate (MCP)
Carbon foils
Spherical chamber37,5O
7,5O
CF Flange
2D distribution of hydrogen at 300 nm depthScan 500 x 500 µm
0 100 200 300 400 500 6000
10
20
30
40
50
60
inte
nsity
depth (nm)
measurement SRIM 2003 simulation
4.5 MeV 16O beamDepth profile up to 500 nm!surface depth resolution 20 nm!
• Study of Charge Transport properties – IBIC technique
Grainboundaries
Scan area
Scanarea
Frontal IBIC
Lateral IBICIBIC pulse
(p)
(n)
Bias voltage
(Junction)
Chargetraps
Frontal IBIC• short range - surface dead layers• long range – defects, impurities
Frontal IBIC• short range - surface dead layers• long range – defects, impurities
Lateral IBIC• contribution of both charge carriers• electric field profile
Lateral IBIC• contribution of both charge carriers• electric field profile
Lost Charge• trapping, detrapping• recombination (radiative - IL)• polarisation• grain boundaries,
dislocations, strains,...• Contacts, dead layers
Lost Charge• trapping, detrapping• recombination (radiative - IL)• polarisation• grain boundaries,
dislocations, strains,...• Contacts, dead layers
t(µs)
-1 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18
VO
(mV
)
-2
0
2
4
6
8
10
12
14
16
18
20
-100 V-200 V-40 V-80 V-1000 V
t(µs)
-1 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18
VO
(mV
)
-2
0
2
4
6
8
10
12
14
16
18
20
-100 V-200 V-40 V-80 V-1000 V
Time Resolved IBICTime Resolved IBIC
• IBIC analysis of Si pin diodes☻ position dependent radiation damage by 4 MeV O ions
Before irradiation After irradiation
• Applications
Ruđer Bošković Institute, Zagreb, Croatia
Routine analysis will be done in future using Tandetron accelerator !
- Nuclear microprobe PIXE analysis for cultural heritage (IAEA TC project)☻ St. Marko church portal restoration (with HRZ)☻ XVII century peinter Master HGG (Hans Georg Geiger) SLO/HR cooperation☻ Chinese porcelain (bilateral project with Beijing)☻ Other objects (alloys, pigments, ceramics, porcelain, etc)
CuFeSi CuFeSi
YELLOW
BROWN
• Applications
Ruđer Bošković Institute, Zagreb, Croatia
- Environmental studies – PIXE analysis of air particulates☻ for NIST - Certified reference materials – homogeneity tests for candidate CRMs and intercomparisons ☻ Collaboration with Instutute for Medical Research – national air quality monitoring program ☻ Single particle analysis for source recognition
3. New areas
Ruđer Bošković Institute, Zagreb, Croatia
protons
alphas7Li
12C16O
1. Defectsa. 3D radiation damage structures
• Lythography• Engineering of electronic
tranport propertiesb. Single ion efects (for high
energy loss dE/dx)• Membranes, etc
1. Defectsa. 3D radiation damage structures
• Lythography• Engineering of electronic
tranport propertiesb. Single ion efects (for high
energy loss dE/dx)• Membranes, etc
1 MeVProtons – 15 µmAlpha – 4 µm O – 1.5 µm Cu – 800 nmAu – 250 nm
EN tandem:0.5 – 6 MV
Tandetron:0.1 – 1 MV
Ruđer Bošković Institute, Zagreb, Croatia
2. Ion Implantation- IRB – small fluences!
- but 3D!
2. Ion Implantation- IRB – small fluences!
- but 3D!
Ruđer Bošković Institute, Zagreb, Croatia