advisor : p. c. yu speaker : g. s. hong

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Nanostructured broadband antireflection coatings on AlInP fabricated by nanoimprint lithography Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box 692, 33101 Tampere, Finland

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Nanostructured broadband antireflection coatings on AlInP fabricated by nanoimprint lithography . Advisor : P. C. Yu Speaker : G. S. Hong. Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box 692, 33101 Tampere, Finland . - PowerPoint PPT Presentation

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Page 1: Advisor : P. C. Yu Speaker : G. S.  Hong

Nanostructured broadband antireflection coatings on AlInP fabricated by nanoimprint lithography

Advisor : P. C. YuSpeaker : G. S. Hong

Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box 692, 33101 Tampere, Finland

Page 2: Advisor : P. C. Yu Speaker : G. S.  Hong

Outline

Introduction Experiment Results Conclusion

Page 3: Advisor : P. C. Yu Speaker : G. S.  Hong

Moth-eye AR structures.

AlInP has a very large band gap (1.3~2.4eV) and high transparency.

This letter demonstrates moth-eye antireflection coatings fabricated by UV-nanoimprint lithography (NIL) on AlInP/GaAs structure.

Introduction

moth’s head moth-eye

Page 4: Advisor : P. C. Yu Speaker : G. S.  Hong

Fabrication

The yield is approximately 95% over an 4 cm^2 consisted of 4.4x1e9 nanocones.

Arrays of metallic nanocones fabricated by UV-nanoimprint lithographyJuha M. Kontio *, Janne Simonen, Juha Tommila, Markus PessaOptoelectronics Research Centre, Tampere University of Technology, P.O. Box 692, FIN-33101, Tampere, Finland

Page 5: Advisor : P. C. Yu Speaker : G. S.  Hong

Fabrication steps (1)

Laser interference lithography (LIL) UV - NIL

http://0rz.tw/mev4Chttp://0rz.tw/IAGJV

Page 6: Advisor : P. C. Yu Speaker : G. S.  Hong

Fabrication steps (2)

PMMA Si

GeUV-NIL resist

Page 7: Advisor : P. C. Yu Speaker : G. S.  Hong

Structure in Simulation

Page 8: Advisor : P. C. Yu Speaker : G. S.  Hong

A :30/170/370 nm (top diameter/base diameter/height) B : 50/220/370 nmC : 80/300/440 nmReference : 1 um AlInP

Simulation & Measurement

Page 9: Advisor : P. C. Yu Speaker : G. S.  Hong

The simulated values are lower than the measured ones partly due to :

The imperfect model of the dielectric function.

The roughness of the etched surfaces.

The silver mirror used as a reference in the measurements.

Arithmetic average reflectivities

Page 10: Advisor : P. C. Yu Speaker : G. S.  Hong

Reflection of the laser GaAs’PLAbsorption of the laser and the PL in the AlInP layer

PL intensities

Page 11: Advisor : P. C. Yu Speaker : G. S.  Hong

Conclusion

An average reflectivity of 2.7% was achieved for wide spectral range 450–1650 nm.

Using PL measurements, we have shown that the surface recombination and patterning induced losses are low.

Page 12: Advisor : P. C. Yu Speaker : G. S.  Hong

Thanks for your attention !