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SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED RESEARCH

AND TESTING (SICART )

(Sponsored by Department of Science and Technology, Govt. of India, New Delhi)

Sardar Patel Centre for Science and Technology

Vallabh Vidyanagar- 388120,

Dist: Anand, Gujarat, India

Phone: +91-2692-234966 Fax: +91-2692-238355

E-mail: sicart_cvm@hotmail.com Website: www.sicart.res.in

Inauguration Picture of SICART

Major Objectives of SICART

Vision: To serve the industry and academic institutes persuing scientific research for building a better society by providing total scientific solutions.

Mission:

To bridge the gap between industries and academic research institutes by

spreading awareness of the importance of Material Analysis.

SICART is committed to the pursuit of excellence and its objectives are:

1. To provide instrument facilities to Research Institutions, Universities and Industries

within and outside Gujarat state.

2. To help and provide Consultation/R&D facilities to nearby industries.

3. To establish linkages with various National level and other reputed laboratories so

as to collaborate in research projects.

4. To help industries in developing indigenous instrumentation systems/products for

measurement, calibration and testing and issuing certification on the quality of raw

materials and products.

Authorization

1. Sophisticated Analytical Instruments Facility Supported by

Department of Science & Technology (Govt. of India)

2. Recognized by DSIR as a Research Centre

3. Recognized by Gujarat Pollution Control Board as External

Environmental Auditor, Schedule- I

4. Recognized by NABL

5. Recognized by Sardar Patel University as Research Centre for Ph.D.

study

List of Technical Staff

Sr. No.

Employee Name Designation Qualification

1 Prof. (Dr.) A. R. Jani

Hon. Director

M.Sc. (Physics) Ph.D. (Physics)

2 Dr. S. V. Patel

Sr. Scientific Officer

M.Sc. (Chemistry) Ph.D. (Polymer Chemistry)

3 Dr. M. P Patel

Sr. Scientific Officer

M.Sc. (Materials Science) Ph.D. (Materials Science)

4 Dr. K. K. Tiwari

Sr. Scientific Officer

M.Sc. (Environment Science), NET, Ph.D.

5 Dr. M. R. Tiwari

Sr. Scientific Officer

M.Sc. (Inorganic Chemistry) Ph.D. (Industrial Chemistry)

6 Dr. G. R. Chauhan

Sr. Scientific Officer

M.Sc. (Analytical Chemistry) Ph.D. (Chemistry)

7 N. B. Patel

Jr. Scientific Officer

M.Sc. (Industrial Chemistry)

8 V. J. Patel

Jr. Scientific Officer

M.Sc. (Solid State Physics)

9 Rima Sheth Technician M.Sc. (Analytical Chemistry)

10 V. A. Patel Technical Assistant

M.Sc. (Electronics)

11 Dhanvi Patel Technical Assistant

M. Sc. (Bio- Technology)

12 Dipen Patel Trainee Technician

M.Sc. (Analytical Chemistry)

Sophisticated Instrumentation Facility Available in SICART

(1) Field Emission Gun Scanning Electron Microscopy (FEG-

SEM)

Make: FEI Ltd Model: Nova NanoSEM 450

Resolution: 1.0nm at 15kV, 1.4nm at 1kV , 3.5nm at 100V,Accelerating

Voltage: 20V to 30kV, Beam current: upto

200nA Magnification: X25 to X10,00,000Field Emission Gun:Ultra-high

brightness Schottky emitter

(2) Environment Scanning Electron Microscope with EDAX

Philips, Holland, ESEM TMP+EDAX

Emission Current: 0 to 200 µA, Accelerating Voltage: 0.2 to 30 kV, Resolution with

Tungsten filament 3.5 nm at 30 kv, Magnification 10x to 400000x, Automatic scaled

micron marker, Specimen movement: X = 50 mm, Y = 50 mm, Secondary and

Gaseous Secondary with Energy Dispersive X- ray Analysis (EDAX) for qualitative

element analysis

(3) Transmission Electron Microscope (TEM) 200 kV

Technai-20, Phillips, Holland

Electron Source: LaB6 and Tungsten Filament, Accelerating Voltage

Point Resolution: 0.27nm, Magnification: 25x to 7,50,000x,

Single tilt sample holder with CCD Camera (Ultra microtome and Ultra Cutter for

sample Preparation)

(4) Inductively Coupled Plasma Spectrometer (ICP-OES)

Perkin Elmer,USA, Optima 3300 RL

Simultanious detection ,RF frequency:40MHz,RF power:750 to 1500 watts,Pump: 3

channel peristaltic pump 0.2 to 2.5 ml/m,spectrometer:6000pixel SCD Detector ,5000

Emission line resolution,Range:165 to 782nm for UV & VIS,Results:60 elements can

be detected in 1 min.

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(5) X- Ray Diffractometer (XRD)

Philips, Holland, X-pert MPD

Source: Cu target X-Ray tube,X-Ray Power: 2KW,

Detector: Xe-filled Proportional detector,Software:JCPD data base for powder

diffractometry,2 theta Measurement range: 2 to 136, Diffractometer radius: 130 to

230mm

(6) Wavelength Dispersive-X-Ray Fluorescence (WD-XRF)

Description: 4Kw, WD-XRF sequential basic system, X ray tube: Ultra thin Be

window (75µm) Detectors: Scintillation and flow counter detection Software:

Omnian software, TOXAL module, WROXI Mineral and mining Modules.

(7) 400 MHz FT-NMR Spectrometer (FT-NMR)

Model- Bruker, Switzerland, Avance III, Topspin 2.1

Liquid and Solid multi nuclei probe

Low-Temperature Facility (Range up to -800C)

Timing Resolution 12.5 ns, Minimum event time 25 ns, Single Chip RF generation,

Highest Phase resolution (0.0055°), Highest Frequency resolution (0.005 Hz)

Solid nuclei(31P ,29Si ,23Na ,27Al ,51V ,71Ga ,119Sn ,201Pb )

Useful for structure identification of organic, inorganic and polymer compound.

(8) Fourier Transform Infrared Spectrometer (FTIR)

Perkin Elmer,USA:Spectrum-GX

FTIR Spectrometer: Normal range: 4000-400cm-1

Operating Mode:MIR and NIR (Absorbance, Transmittance and Reflectance )

Scanning range: 15600-30cm-1

Scan time: 20scan/second

Resoluiton:0.15cm-1

Single Beam/Ratio:Single,Ditector:MIRTGS

(9) UV-VIS-NIR Spectrometer

Model-Perkin Elmer, USA, Lambda 19

Wavelength Range: 185-3200 nm for Absorbance/Transmission and 200-2500 for

Reflectance

Double Beam, Double Monochromator, Ratio Recording

Lamp: Deuterium (UV), Tungsten-Halogen (VIS/NIR)

Detectors: Photomultiplier tube for UV/Vis

Solid sample attachment: Lead-Sulphide cell (PbS) for NIR

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(10) LC-MS-MS (LCQ Fleet, TSQ Quantum Access)

Thermofisher scientific, USA

LCQ fleet and TSQ Quantum Access: ESI and APCI Source Quantum with HPLC

System

Mass range: LCQ Fleet: 50-2000 Daltons, TSQ-30-3000 Daltons

Pump: dual piston delivery system, built-in vacuum degasser.

Pressure range: 0 to 5800 PSI (0 to 400 bar) at flow rates up to 2 ml/min.

Operating temperature: 10°C to 40°C. Quaternary low pressure system.

(11) High Performance Liquid Chromatograph (HPLC)

Perkin Elmer, USA, Series-200

Quaternary gradient system ,flow rate 0.1 to 10ml/min variable operating back

pressure 5000psi,C-18,C-8 column, Detectors: Photo Diode Array (PDA

),range:190nm to 800nm,UV-VIS:190nm to 800nm,Flurescence Detector;range-

200nm to 900nm,sensitivity range 0.0001 to 2.0 AUS

(12) Gel Permeation Chromatography (GPC)

Perkin Elmer, USA, Series-200:

Determinations of Molecular weight of Polymer samples (Mn & Mw), Polydispersity.

Column: PL gel, Mixed-B, Mixed-D.

Molecular Weight distribution (range: 500-300000gm/mol)

Detector: Refractive Index (RI)

(13) High Performance Thin Layer Chromatograph (HPTLC)

Camag-Switzerland WinCat

Automatic applicator (Linomat-5) of selectable sample volume. GMP, GLP compliant

image plate scanner-3 and documentation (reproster-3) system.Scane range :( 190nm

to 800nm) Deuterium lamp tungsten lampand mercury lamp.

(14) Ion Chromatography (IC)

Dionex Dx – 600 IC System,

Electrochemical and absorbance detector

For sample separation of ions from one another, lanthanides, sugars, amino acids etc

(15) Gas Chromatography with Head Space

Perkin Elmer, USA, Auto System XL

Detector: FID (100 oC - 450oC), TCD (100 oC - 350oC) Detector, NPD and ECD,

Auto sampler

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(16) Gas Chromatograph with mass spectroscopy (GC-MS)

Perkin Elmer, USA, System XL with NIST Library

Analyser: Single Quadrupole with prefilter, Mass range: 20-650 Daltans (amu), Mass

stability:0.1m/z mass accuracy over 48 hours, Ionization modes: electro ionization

positive / negative, chemical ionization.

(17) Particle Size Analyzer (PSA)

Symantec-HELOS-BF, Germany

Laser Diffraction particle size determination system

Particle size range:0.5µm to 875 µm

Accuracy for Dry and Liquid sample

(18) CHN/S/O Elemental Analyser

2400 Series II, Perkin Elmer, USA,

Analyzed Elements: Carbon, Hydrogen, Nitrogen, Sulfur and Oxygen; Operating

Mode: CHN, CHNS and OXYGEN, Accuracy: 0.3 % abs, Analysis Time: 6 to 8

minutes per sample

(19) Thermal Analysis (DSC, TGA, STA)

Perkin Elmer, USA, (DSC-PYRIS-1; TGA-7)

Temperature Range: DSC (0°C to 400°C)

TGA (RT to 1000°C)

Sensibility: 0.1 gm (0.0001 mg)

Atmosphere: Nitrogen or Air

(19) STA

Perkin Elmer, USA.

Model- STA 8000.

Specification - Simultaneous analysis of TG with DTA mode and DSC.

Temperature-30°C to 1000°C

Atmosphere: Nitrogen.

(20) Mercury Porosimeter

ThermoQuest, USA, 440 & 140 with ultra Micropore

Operating Pressure:0.1to 400 Mpa,

Measuring Range for Pore Radius:

Pasal 140:1900 to 58,000 nm

Pasal 440: 31.8 to 7,500 nm

(21) Universal Testing Machine (UTM)

Shimadzu, Japan, AG 100 KNG

Capacity:100KN (10000 kgf),Load measuring accuracy :+0.5% of indicated load

,cross head speed range:0.05 to 1000mm/min,Cross head speed precision: :+0.1

,Effective test width :575nm,Load cell of 100KN,1kgf.

(22) Total Organic Carbon (TOC) Analyzer

Shimadzu, Japan, TOC-VCSN/TNM-1

Measurement range: Total Carbon: 0 to 25000 mg/l; Inorganic Carbon: 0 to 3000

mg/l; Total Nitrogen: 0 to 4000 mg/l; Measurement Time: 10 minute per sample

(23) Micro Hardness Tester (MHT)

Shimadzu, Japan, HMV-2T

Maximum load: 19.61 N, Test load range: 10 to 2000 gf in 9 steps. Load duration: 5

second to 999 seconds in 1 sec increment High test measuring accuracy: 0.01 µ

(24) Laser Flash Thermal Diffusivity

NETZSCH, Burlington-MA USA

Temperature Range: Ambient to300 Deg., Standard sample Size: 12.7 mm Diameter.

Thermal Diffusivity Range: 0.001 to 10cm²/S.

Laser Type: Nd glass

Accuracy: Thermal Diffusivity and Specific Heat: +/- 5%

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(25) Ambient Air Quality Monitoring Mobile Van

(Environnment SA, France)

Measurement of Carbon monoxide, Total hydrocarbons, Oxides of nitrogen, Ozone,

Particulate matter, Sulphur dioxide and meteorological parameters

Environmental Analysis/ Monitoring/ Auditing Facilities

Water and wastewater analysis

Solid waste and soil analysis

Stack pollution monitoring

Environmental Audit and Environmental Consultancy Services

Environmental Research & Development

Contact for more information:

Prof. (Dr.) A. R. Jani, Hon. Director

SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED

RESEARCH AND TESTING (SICART ) (Sponsored by Department of Science and Technology, Govt. of India, New Delhi)

Sardar Patel Centre for Science and Technology

Vallabh Vidyanagar – 388120, Dist: Anand, Gujarat, INDIA

Phone: +91-2692-234966, +91 9925520338 (M); Fax: +91-2692-238355

E-mail: janiar51@gmail.com

Ex. Professor-Director

UGC-Human Resource Development Center

(UGC-HRDC) Sardar Patel University & Former Professor and Head & [Dean (Faculty of Science)]

P. G. Department of Physics, Sardar Patel University.

Vallabh Vidyanagar 388 120

Gujarat State, INDIA