summer '07 at cls

Summer '07 at CLS

Small Angle X-Ray Scattering

Peter Chen Chithra Karunakaran & Konstantine Kaznatcheev

Purpose

to provide an alternative imaging technique to STXM : to understand structural information of sample

(Feser/Jacobsen)

(Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999))

Reconstruction

image

hologram

diffraction pattern

SEM image of letters, fabricated by gold dots, (100 nm in diameter each); diffraction pattern (middle) and reconstructed image (Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999)).

Only intensity is obtained, phase information is lost.

Purpose

to image smaller samples

0 10 20 30 40

10

20

30

40

latex spheres 5%, visible light

a=0.44mk /x=2.53; n=1.5

0 0.001 0.002

0.001

0.002a=88nm /x=0.5; n=1.5

Mie polar diagrams

sm

all

x=

a/

la

rge0 300 600 900

300

600

900

0

45

90

135

180

a=2.2mk/ x=12.6; n=1.5

0 100 200

100

200

0

45

90

135

180

a=10nm/x=25.3; n=0.998-i0.0011

0 0.010.020.030.040.05

0.01

0.02

0.03

0.04

0.05

0

45

90

135

180

a=2nm/x=5; n=0.998-i0.0011

Au particles; x-ray

to test stability and integrity of the optics and the microscope

Tasks

Tasks: create software determine camera setup

in the STXM experimentation

take data with respect to different variables

orientation geometry nature of samples

Andor Vacuum supported CCD. 512 x 512 12.3 x 12.3 mm

Software

Software Visual Basic .NET 2003

Requirements basic: single imaging,

video, exposure settings, etc.

long exposure aXis readable data and

header output beamline read and control

Mechanics

Implementation external placement

8

SAXS

incident beamfocus

sample

scattered wave

1st order beam

camera

detector

zone plate

OSA

Scans on the Mesh

xx

x

Exposure: 100 sec

Energy: 710 eV

10

Change in Focus

Defocusing of beam

by 30 um by 10 um

Change in Energy

Energy: 709 eVEnergy: 705 eVEnergy: 703 eV

Change in Slit Size

10 um x 10 um slit size20 um x 20 um slit size50 um x 50 um slit size100 um x 100 um slit size

13

Consistency

Iron ParticlesExposure: 100 secEnergy: 710 eVBackground Corrected

10 nm particle.

Camera Placement Issue