umc 0.18µm radiation hardness studies progress since last collaboration meeting sven löchner
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Experiment Electronics
UMC 0.18µm radiation hardness studies
Progress since last Collaboration Meeting
Sven LöchnerGSI Darmstadt
15th CBM Collaboration MeetingApril 13th, 2010
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 2Experiment Electronics
AgendaAgenda
• GRISU Project - Reminder– ASIC– Single Event Effects Testing site– Microprobe Testing site– Total Ionising Dose Testing
• Progress / News since last Collaboration Meeting– TID– SEE– Microprobe
• Summary
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 3Experiment Electronics
Reminder: GRISU projectReminder: GRISU project
Project objectives: Characterisation of UMC 0.18µm CMOSprocess concerning :• Vulnerability against Single Event Effects (SEE), especially
Single Event Upsets (SEU) and Single Event Transients (SET)– SEU cross section for different Flip-Flop designs and layouts– SET sensitivity of the UMC 0.18µm process – Critical Linear Energy Transfer (LETcrit )
• Single Transistor measurements– Comparison of transistor models by simulation– Total Ionising Dose (TID)
Characterisation of the UMC 0.18µm process under irradiation• leakage currents• threshold shifts,• annealing
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 4Experiment Electronics
GRISU test ASICGRISU test ASIC
Test structures for TID
measurements
Test structures for SEU measurements
Test structures for SET measurements, Qcrit
Ring oscillator for TID / SEU measurements
GRISU chip
• UMC 0.18µm process
• 1.5 x 1.5 mm²
• 64 pads– 28 core pads– 36 pads
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 5Experiment Electronics
Low Energy testing siteLow Energy testing site
• Installation of a test facility for ASIC irradiation with heavy ions at X6 cave at GSI (in cooperation with bio physics group)
• Beam monitoring via ionisation chamber
• Dosimetry setup available• Irradiation of DUT in air• Testing parameters:
– 11.4 MeV/u
– LET in the range of 1...62 MeV·cm2/mg (SiO2)
– 103…1012 ions / (cm2 s)
– 50mm beam size
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 6Experiment Electronics
Microprobe testing siteMicroprobe testing site
Setup of a single hit heavy ion test environment for ASIC
irradiation (micro beam test line)
• possibility of a localised radiation of the DUT
• resolution: ~500nm
• scanning area: down to 10x10µm²
• energy of ions: 4.8 MeV/u
First results from Xe-132 test:
• plot shows overlay of detected ion positions (3) which triggered an SET and chip layout
SET homogeneity map of ASIC
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 7Experiment Electronics
TTotal otal IIonizing onizing DDose (TID) testsose (TID) tests
• TID testing with X-rays– Irradiation facility at Institute for Experimental Nuclear Physics,
University of Karlsruhe– 60keV X-ray, 40...240krad/h
• GRISU chips tested– Total dose between 320krad and 1000krad(SiO2)
– Operating dose rate between 80krad/h and 230krad/h– Measurements: leakage current, threshold shift, transition times, total
power consumption, annealing, … of non-hardened digital library
Leakage current of ESD protection diodes increased by factor of 100 Average core current increased by factor 2 (after 600krad) Transition times of ring oscillator inverters decrease (changing of
NMOS / PMOS ratio) Good annealing performance
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 8Experiment Electronics
Progress (since last meeting)Progress (since last meeting)
TID testing with X-rays
Due to a miscalibration of the X-ray system at Karlsruhe:
dose rate was only ~40% than displayed by the diagnostic system(wrong for all measurements between 2008 and 2009)
all results are now updated Cadence simulation models (for different dose levels) still need
to be updated
No influence on annealingStill good annealing performance
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 9Experiment Electronics
Progress (since last meeting)Progress (since last meeting)
SEE testing
• 7 irradiation tests so far– C-12, Ar-40, Ni-58, Ru-96, Xe-132– final dosimetry for Ar-40 and Ru-96 run are not yet done
• problems with the “old” GSI scanning electron microscope (SEM)
• now scheduled with new system for end of April
All Cross section measurements will then be updated
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 10Experiment Electronics
Progress (since last meeting)Progress (since last meeting)
Microprobe testing
• 2nd testing with the GSI microprobe system (Au-197 run 02/2010)– Improve of the spatial resolution– First results are combined together with ASIC layout
D-FlipFlop with additional buffersPosition of triggered SEE events – DFF loaded with „0“Position of triggered SEE events – DFF loaded with „1“Overlay of both triggered events
Redundant layout structures should keep at least 1um apart
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 11Experiment Electronics
Work progress at GSI so far…Work progress at GSI so far… Development of a UMC 0.18µm Test-ASIC (GRISU) Installation of testing site for SEE measurements Installation of a micro beam testing site for single ion hit
measurements TID testing of the UMC 0.18µm process at Karlsruhe
Still to do: TID irradiation with low dose rates Long term test with gamma source (for example Co-60) Neutron test “On hold”: 3rd iteration of GRISU test ASIC “on hold
• Triple redundant test structures (for SEU / SET improvement)• Test circuits for SET suppression• Re-design of the DICE layout cells (decrease SEU cross-section)
Right now nothing is contradicting against the UMC 0.18µm process
April 13th, 2010 15th CBM Collaboration Meeting - Sven Löchner 12Experiment Electronics
Additional Talks & DocumentsAdditional Talks & Documents
Reference to further talks:• EE-Gruppenmeeting (7.7.2008)
GRISU Statusreport
• CBM-XYTER Family Planning Workshop (5.12.2008)UMC 0.18μm radiation hardness studies
• IT/EE-Palaver (20.1.09) Untersuchung von Strahlungseffekten in anwendungs- spezifischen
integrierten Schaltungen (ASIC) Strahlungseffekte
• 13th CBM Collaboration Meeting (12.3.2009)Radiation hardness studies - Update
• EE-Gruppenmeeting (29.6.2009)GRISU Microbeam Irradiation
• 14th CBM Collaboration Meeting (7.10.2009)UMC 0.18μm radiation hardness studies - Update
Link: http://wiki.gsi.de/cgi-bin/view/EE/GRISU
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