author index

AAA BBB CCC DDD EEE FFF GGG HHH III JJJ KKK LLL MMM NNN OOO PPP QQQ RRR SSS TTT UUU VVV WWW XXX YYY ZZZ

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AAUUTTHHOORR IINNDDEEXX

23rd INTERNATIONAL CONFERENCE ON

MICROELECTRONICS PROCEEDINGS HOME UUTTHHOORR

AAA Adamovi, N. Development of a Totally Implantable Hearing Aid Adamschik, M. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Aghabekyan, A. Distribution of Slip Dislocations in Thermally Deformed Silicon Wafers Agueev, O. Influence of Rapid Thermal Annealing Modes of the Parameters of Ni/21R-SiC Contacts Aleksi, O. Symmetrical Thick Film EMI/RFI Filters Parallel Thermal Analysis of Hybrid and SMT Modules Using 2D and 3D Models


MICROELECTRONICS PROCEEDINGS

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AUTHOR INDEX

Aleksov, A. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Alluri, P. Technology Options for Developing Manufacturable Non-silicon Nanoelectronics Almansa, A. Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network Altenburg, H. Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors Amirouche, B. Low-Voltage, Low-Power and High Gain CMOS OTA using Active Positive Feedback with Feedforward and FDCM Techniques Andrejevi, M. Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis



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AUTHOR INDEX

Arshak, A. -Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation Arshak, K. Development of a Novel Humidity Sensor with Error-compensated Measurement System -Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films -radiation Dosimetry using Screen Printed Nickel Oxide Thick Films Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation Atanassova, E. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Thermal Ta2O5 - Alternative to SiO2 for High Density Dynamic Memories Conduction Mechanisms in Thin rf Sputtered Ta2O5 Films on Si and their Dependence on O2 Annealing Stress-Induced Leakage Currents in Thin Ta2O5 Films



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Atarodi, M. A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency Aubert, H. MEMS and NEMS Technologies for Wireless Communications Axelevitch, A. Novel Approach to Sputtered Tantalum Film Resistors with Controlled Pre-Defined Resistance Ayvazyan, G. Distribution of Slip Dislocations in Thermally Deformed Silicon Wafers BBB Bafleur, M. TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology



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Bahng, U. Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation Bai, J.B. Design of High-Power Reverse-Conducting Gate-Commutated Thyristors 23rd INTERNATIONAL CONFERENCE ON

MICROELECTRONICS PROCEEDINGS Bailbe, J.-P. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Balk, L. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Batcup, S. Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations

HOME Baudrand, H. MEMS and NEMS Technologies for Wireless Communications

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Beaudoin, F. TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology Belaroussi, M. Low-Voltage, Low-Power and High Gain CMOS OTA using Active Positive Feedback with Feedforward and FDCM Techniques



Bench, A. Approach to Solve the Reliability Problem at Packaging Level in the Matrix VLSI Benda, V. In-Process Diagnostics of Recombination Centers in Structures of Large-Area Solar Cells OCVD Carrier Lifetime Measurements on an Inhomogeneous Diode Structures Bertrand, G. TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology HOME Blyzniuk, M. Estimation of Parametric Sensitivity for Defects Size Distribution in VLSI Defect/Fault Analysis

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AAUUTTHHOORRSS

Bo, J. A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance


MICROELECTRONICS

Bojii, A. Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure PROCEEDINGS Boltovets, N. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Bouhdada, A. Influence of the Defects on the I-V Characteristics for LDD-nMOSFETs Bouzerara, L. Low-Voltage, Low-Power and High Gain CMOS OTA using Active Positive Feedback with Feedforward and FDCM Techniques HOME

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Breglio, G. Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal Simulations and Analytical Modeling


MICROELECTRONICS

Brenner, W. Development of a Totally Implantable Hearing Aid PROCEEDINGS Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network Brik, M. Mixed-Level Defect Simulation in Data-Paths of Digital Systems Buda, M. Quantum Well Intermixing for Optoelectronic Device Integration

HOME Butkiewicz, B. Thermal Investigation of the Three Types of NTC Thermistors

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CCC Cabestany, J. Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary Analysis


MICROELECTRONICS PROCEEDINGS Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification

Caudrillier, P. MEMS and NEMS Technologies for Wireless Communications Cazarre, A. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Cerdeira, A. Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET HOME Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment Cerdeira Estrada, A. Initial Synchronization Procedure for UMTS-FDD Mode in FPGA

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Cha, G.-H. Design Parameter Optimization for Hall Sensor Application Chakrabarti, P. Theoretical Analysis of Room Temperature InAs0.89Sb0.11 Mid-Infrared (MIR) Photodetector for CO Detection Chan, Y. Electromagnetic Interference of Switching Mode Power Regulator with Chaotic Frequency Modulation Chandra Shekhar, D. Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs Chang, C. Y. Process-Related Reliability Issues Toward Sub-100 nm Device Regime



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Chang, S.-I. Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region Chao, T. S. Process-Related Reliability Issues Toward Sub-100 nm Device Regime 23rd INTERNATIONAL CONFERENCE ON

MICROELECTRONICS PROCEEDINGS Charitat, G. Isolation Issues in Smart Power Integrated Circuits

Charlot, B. Access to Microsystem Technology: the CMP Services Solution Chatzitheodoridis, E. Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network

HOME Chechenin, Yu. Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

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Chen, L. Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional Quantum Mechanical Effects and Gate Tunneling Current Modeling on Direct Tunneling Current in Ultra-Thin Oxide NMOSFET Considering Quantum Mechanics 23rd INTERNATIONAL CONFERENCE ON

MICROELECTRONICS PROCEEDINGS Chen, W. Unified MOSFET Scaling Theory using Variational Method Chien, C. H. Process-Related Reliability Issues Toward Sub-100 nm Device Regime Chobola, Z. C-V and DLTS as Characterization Tools for Silicon Solar Cells

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Choi, Y.-I. Trench Emitter IGBT with Lateral and Vertical MOS Channels Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor (TIGBT) Improved Trench MOS Barrier Schottky (TMBS) Rectifier Choi, C.-S. Design Parameter Optimization for Hall Sensor Application Chung, S.-K. Trench Emitter IGBT with Lateral and Vertical MOS Channels Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor (TIGBT) Improved Trench MOS Barrier Schottky (TMBS) Rectifier Clough, F. Novel dual gate high voltage TFT with variable doping slot



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AUTHOR INDEX

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Colinge, C. SOI Devices for 0.1 m Gate Lengths Colinge, J.-P. SOI Devices for 0.1 m Gate Lengths 23rd INTERNATIONAL CONFERENCE ON

MICROELECTRONICS Combes, P. MEMS and NEMS Technologies for Wireless Communications Concannon, A. Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection Cotofana, S. FSM Non-minimal State Encoding for Low Power Courtois, B. Access to Microsystem Technology: the CMP Services Solution

PROCEEDINGS

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Cova, P. H+ Irradiation for Reverse Recovery Softness and Reliability of Power p-i-n Diodes for Snubberless Applications Cuoco, V. A novel vertical DMOS transistor in SOA technology for RF-power applications iri, V. Synthesis of Folded Fully Pipelined Bit-Plane Architecture ori, S. Design, Implementation and Comparison of Three General-Purpose Neurons



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AUTHOR INDEX


evizovi, D. Sheet Density of Electrons in Spacer Layer of AlGaN/GaN MODFET: Calculating and Analyzing DDD dAlessandro, V. Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal Simulations and Analytical Modeling SPICE Simulation of Electro-thermal Effects in New-Generation Multicellular VDMOS Transistors NASDAC - A New Simulation Tool for the Electro-Thermal Analysis of Bipolar Devices: Application to Multi-Finger AlGaAs/GaAs HBTs Danielsson, E. SiC Device Technology for High Voltage and RF Power Applications



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AUTHOR INDEX


Danil'tsev, V. Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application Dankovi, D. Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs Dao, L. Quantum Well Intermixing for Optoelectronic Device Integration Davazoglou, D. Electrical Stressing-induced Degradation Effects in Solid Phase Crystallized Polysilicon Thin Film Transistors Davidovi, V. Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs


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PROCEEDINGS

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AUTHOR INDEX

De Souza, M. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power Semiconductor Device Novel Dual Gate High Voltage TFT with Variable Doping Slot Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs Deenapanray, P. N. K. Quantum Well Intermixing for Optoelectronic Device Integration Del Medico, O. Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network Delori, H. Access to Microsystem Technology: the CMP Services Solution Demakov, K. Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts



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AUTHOR INDEX


Demierre, M. Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator Denisenko, A. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Desnica, V. Symmetrical Thick Film EMI/RFI Filters Detter, H. Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network Dimitrijev, S. Channel-Carrier Mobility Parameters for 4H SiC MOSFETs Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs



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Dmitruk, N. New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure Dobrescu, D. Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors Dobrescu, L. Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors Domeij, M. SiC Device Technology for High Voltage and RF Power Applications Drljaa, P. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator Dubuc, D. MEMS and NEMS Technologies for Wireless Communications


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PROCEEDINGS

inovi, Z. Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb and HgCdTe ordjevi, S. Symbolic-Numeric Co-Simulation of Large Analogue Circuits ori-Veljkovi, S. Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs



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AUTHOR INDEX

uri, Z. Silicon Resonant Cavity Enhanced UV Flame Detector Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and Nanocantilevers A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb and HgCdTe EEE Ebert, W. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Escobedo-Alatore, J. Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor



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AUTHOR INDEX

Estrada, M. Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment Etienne-Cummings, R. Biologically Inspired Vision Sensors Evtukh, A. Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device Application FFF Fedorenko, L. Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N2 - Laser Excitation



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AUTHOR INDEX

Fitzpatrick, P. Reed-Solomon Codecs for Optical Communications Flandre, D. Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET Flores, D. Novel Dual Gate High Voltage TFT with Variable Doping Slot Fomina, E. Low Power Synthesis Based on Information Theoretic Measures Frantlovi, M. Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and Nanocantilevers Frisina, F. SPICE Simulation of Electro-thermal Effects in New-Generation Multicellular VDMOS Transistors



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AUTHOR INDEX

Fu, L. Quantum Well Intermixing for Optoelectronic Device Integration GGG

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Gal, M. Quantum Well Intermixing for Optoelectronic Device Integration Garcia, R. Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment Garcia Sanchez, F. Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET HOME Golan, G. Novel Approach to Sputtered Tantalum Film Resistors with Controlled Pre-Defined Resistance AUTHOR INDEX


Golubovi, S. Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs Gonnard, O. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Graffeuil, J. MEMS and NEMS Technologies for Wireless Communications Grenier, K. MEMS and NEMS Technologies for Wireless Communications Grimalsky, V. Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor



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AUTHOR INDEX

Gupta, S. Theoretical Analysis of Room Temperature InAs0.89Sb0.11 Mid-Infrared (MIR) Photodetector for CO Detection HHH Haba, P. Hot-Carrier NMOST Degradation at Periodic Drain Signal A Study of Irradiation Damage in Commercial Power MOSFETs by Means of Split C-V and Conventional Methods Hadzaman, I. Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors Hadi-Vukovi, J. Phase Noise Amplitude Distribution as Indicator of Origin of Random Phase Perturbation in a Test Oscillator A Novel Analytical Model of a SiC MOSFET



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AUTHOR INDEX

Hamid, F. Analogue Integrated Circuit Synthesis from VHDL-AMS Behavioral Specifications Hardikar, S. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective Harris, J. -Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films -radiation Dosimetry using Screen Printed Nickel Oxide Thick Films Harutyunyan, H. Study of Photo-Emission Current Impact on Spectral Characteristics of Double Barrier Photo-Receiving Structure He, P. Unified MOSFET Scaling Theory using Variational Method



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Heffernan, D. Development of a Novel Humidity Sensor with Error-compensated Measurement System Heitzinger, C. A Calibrated Model for Silicon Self-Interstitial Cluster Formation and Dissolution Herzer, R. Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices Hini, I. Photoluminescence Caused by Presence of Defects and Oxides at the Surface of Hg1-xCdxTe Holland, A. Influence of Via Liner Properties on the Current Density and Resistance of Vias Hopper, P. Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection Simulation of Si-Ge BiCMOS ESD Structures Operation Including Spatial Current Instability Mode



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AUTHOR INDEX

Horita, S. A New Working Principle of Ferroelectric Gate FET Memory with an Additional Electrode Hristeva, N. Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device Applications III

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Ibrahim, A. C-V and DLTS as Characterization Tools for Silicon Solar Cells Igi, P. Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations HOME

AUTHOR INDEX Inoue, S. Analysis of Non-Volatile Latch Circuits with Ferroelectric-Gate Field Effect Transistors for Low Power and Low Voltage Operation


Ishiwara, H. A Novel Data Writing Method in a 1T2C-Type Ferroelectric Memory Analysis of Non-Volatile Latch Circuits with Ferroelectric-Gate Field Effect Transistors for Low Power and Low Voltage Operation Itoh, K. Trends in Low-Voltage EmbeddedRAM Technology Ivashin, D. Temperature Response of Irradiated MOSFETs Ivask, E. Mixed-Level Defect Simulation in Data-Paths of Digital Systems



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AUTHOR INDEX

JJJ Jablonski, P. Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary Analysis Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification Jaimovski, S. Phonon Participation in Superlattice Heat Capacity Jagadish, C. Quantum Well Intermixing for Optoelectronic Device Integration Jain, M. Theoretical Analysis of Room Temperature InAs0.89Sb0.11 Mid-Infrared (MIR) Photodetector for CO Detection Jaki, A. Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs



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AUTHOR INDEX

Jaki, O. Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and Nanocantilevers, A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb and HgCdTe Jaki, Z. A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb and HgCdTe Jakubec, A. Asymmetric Ratio Sensors of Nonelectric Quantities Jankovi, N. 1D Physically Based Non-Quasi-Static Analog Behavioral BJT Model for SPICE



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AUTHOR INDEX

Jankovi, S. Power Saving Modes in Modern Microcontroller Design and Chip Diagnostics Jevti, M. Phase Noise Amplitude Distribution as Indicator of Origin of Random Phase Perturbation in a Test Oscillator, Photoluminescence Caused by Presence of Defects and Oxides at the Surface of Hg1-xCdxTe A Novel Analytical Model of a SiC MOSFET Jeyakumar, R. Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture Ji, Y. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Joki, I. Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and Nanocantilevers



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AUTHOR INDEX

Jos, H. A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications Jovi, V. Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb and HgCdTe Jutman, A. On Efficient Logic-Level Simulation of Digital Circuits Represented by the SSBDD Model Juurlink, B. FSM Non-minimal State Encoding for Low Power



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AUTHOR INDEX

KKK Kakanakov, R. Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device Applications Kaltsas, G. Multipurpose Thermal Sensor Based on Seebeck Effect Kampouris, C. Advances in Silicon Carbide MOS Technology Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture Kang, H.-S. Design Parameter Optimization for Hall Sensor Application Kang, Y.-S. Trench Emitter IGBT with Lateral and Vertical MOS Channels



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AUTHOR INDEX

Karamarkovi, J. 1D Physically Based Non-Quasi-Static Analog Behavioral BJT Model for SPICE Karim, K. S. TFT Circuit Integration in a-Si:H Technology Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture Kasemsuwan, V. An Analytical Model of Short Channel MOSFET including Velocity Overshoot Kassamakova-Kolaklieva, L. Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device Applications Kazmierski, T. Analogue Integrated Circuit Synthesis from VHDL-AMS Behavioral Specifications Kazymyra, I. Estimation of Parametric Sensitivity for Defects Size Distribution in VLSI Defect/Fault Analysis



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AUTHOR INDEX

Keevallik, A. Low Power Synthesis Based on Information Theoretic Measures Kelleci, B. Pre-Power Amplifier for 5.2-5.8 GHz Band Kernajitskiy, A. Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N2 - Laser Excitation Khimenko, M. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates Khoa, T. A New Working Principle of Ferroelectric Gate FET Memory with an Additional Electrode



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AUTHOR INDEX

Kholevchuk, V. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates Khrykin, O. Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application Khudaverdyan, S. Study of Photo-Emission Current Impact on Spectral Characteristics of Double Barrier Photo-Receiving Structure Kim, E. D. Design of High-Power Reverse-Conducting Gate-Commutated Thyristors Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation Kim, H.-W. Trench Emitter IGBT with Lateral and Vertical MOS Channels Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor (TIGBT)



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AUTHOR INDEX

Kim, M.-S. Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor (TIGBT) Kim, N. K. Design of High-Power Reverse-Conducting Gate-Commutated Thyristors Kim, S. C. Design of High-Power Reverse-Conducting Gate-Commutated Thyristors Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation Kizjak, A. Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device Application Kment, Ch. Development of a Totally Implantable Hearing Aid



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AUTHOR INDEX

Koegst, M. FSM Non-minimal State Encoding for Low Power Koh, A. Advances in Silicon Carbide MOS Technology Kohn, E. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Kolyadina, E. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Konakova, R. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts



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AUTHOR INDEX

Kondekar, P. Analysis and Design of Superjunction Power MOSFET: CoolMOSTM for Improved On Resistance and Breakdown Voltage Using Theory of Novel Voltage Sustaining Layer Koo, S.-M. SiC Device Technology for High Voltage and RF Power Applications Koprinarova, J. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Korostynska, O. -radiation Dosimetry using Screen Printed Nickel Oxide Thick Films Koshevaya, S. Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor



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AUTHOR INDEX

Kouvatsos, D. Electrical Stressing-induced Degradation Effects in Solid Phase Crystallized Polysilicon Thin Film Transistors Krishnan, S. Novel Dual Gate High Voltage TFT with Variable Doping Slot Kulesza, Z. Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary Analysis Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification LLL Lal, R. K. Theoretical Analysis of Room Temperature InAs0.89Sb0.11 Mid-Infrared (MIR) Photodetector for CO Detection



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AUTHOR INDEX

Lane, W. Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs Latinovi, I. Design, Implementation and Comparison of Three General-Purpose Neurons Lazi, . Silicon Resonant Cavity Enhanced UV Flame Detector Multipurpose Thermal Sensor Based on Seebeck Effect Lee, H. Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region Lee, J. Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region Lee, S.-K. SiC Device Technology for High Voltage and RF Power Applications



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AUTHOR INDEX

Lee, X. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Leech, P. Influence of Via Liner Properties on the Current Density and Resistance of Vias Lemberski, I. FSM Non-minimal State Encoding for Low Power Lepinois, F. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Lepoeva, G. Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device Applications Lerner, R. PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency Emitters



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AUTHOR INDEX

Lescouzeres, L. TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology Li, Z. Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional Quantum Mechanical Effects and Gate Tunneling Current Unified MOSFET Scaling Theory using Variational Method Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Liberali, V. Evaluation of Epi layer Resistivity Effects in Mixed-Signal Submicron CMOS Integrated Circuits Lilin, T. A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance Lin, H. C. Process-Related Reliability Issues Toward Sub-100 nm Device Regime



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MIEL 2002

Linevih, H. Channel-Carrier Mobility Parameters for 4H SiC MOSFETs Lingareddy, M. Low - Vt Devices Replacement for Domino Circuits Lisovski, I. Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device Application Litovchenko, V. Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device Application Litovski, V. TSpice-Alecsis Co-simulation AUTHOR INDEX Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis Timing Simulation with VHDL Simulators


Litvinov, V. Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts Liu, L. Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional Quantum Mechanical Effects and Gate Tunneling Current Unified MOSFET Scaling Theory using Variational Method Liu, X. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Lomakin, S. Temperature Response of Irradiated MOSFETs Lonar, B. Aging of the Over-Voltage Protection Components



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AUTHOR INDEX

Lu, J. Q. Design of High-Power Reverse-Conducting Gate-Commutated Thyristors Lu, Z. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Lukovi, M. Symmetrical Thick Film EMI/RFI Filters Lunardi, L. Semiconductor Devices for Fiber Optic Communication Systems Lunardon, M. Initial Synchronization Procedure for UMTS-FDD Mode in FPGA Luo, D. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy



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AUTHOR INDEX



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MIEL 2002

Lutovac, M. Symbolic Computation of Digital Filter Transfer Function using MATLAB Lutz, J. PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency Emitters Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices Lytvyn, P. Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts MMM Ma, S. W. Electromagnetic Interference of Switching Mode Power Regulator with Chaotic Frequency Modulation

AUTHOR INDEX


Ma, Y. Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional Quantum Mechanical Effects and Gate Tunneling Current Modeling on Direct Tunneling Current in Ultra-Thin Oxide NMOSFET Considering Quantum Mechanics Macchiaroli, M. NASDAC - A New Simulation Tool for the Electro-Thermal Analysis of Bipolar Devices: Application to Multi-Finger AlGaAs/GaAs HBTs Maciak, J. Thermal Investigation of the Three Types of NTC Thermistors Maksimovi, D. Power Saving Modes in Modern Microcontroller Design and Chip Diagnostics Timing Simulation with VHDL Simulators



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AUTHOR INDEX

Malbaa, V. Formal Specification of an FPGA based Educational Microprocessor Formal Specification and Preliminary Design of an Asynchronous Traffic Light Controller Mamontova, I. New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure Mamykin, S. New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure Mandziy, B. Approach to Solve the Reliability Problem at Packaging Level in the Matrix VLSI Manhas, S. Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs Mani, I. Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs



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AUTHOR INDEX

Manolov, E. An Improved Bridge Track-and-Hold Circuit Mao, L.-F. A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations Marcato, L. Initial Synchronization Procedure for UMTS-FDD Mode in FPGA Marinkovi, Z. New Neural Models of Microwave Transistor Noise Parameters Based on Bias Conditions Markovi, P. Complex ASICs Verification with SystemC Markovi, V. New Neural Models of Microwave Transistor Noise Parameters Based on Bias Conditions



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AUTHOR INDEX

Marrakh, R. Influence of the Defects on the I-V Characteristics for LDD-nMOSFETs Marsi, S. Initial Synchronization Procedure for UMTS-FDD Mode in FPGA Marty, A. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Maslovsky, A. Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application Matveeva, L. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing



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AUTHOR INDEX

Mawby, P. Advances in Silicon Carbide MOS Technology Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations Improved 4H-Silicon Carbide Schottky Diodes using Multiple Metal Alloy Contacts Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture Mayeva, O. New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure Mazunov, D. Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device Application McDonagh, D. Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation Meijer, G. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors



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AUTHOR INDEX

Menozzi, R. H+ Irradiation for Reverse Recovery Softness and Reliability of Power p-i-n Diodes for Snubberless Applications Mezei, I. Formal Specification of an FPGA based Educational Microprocessor Mihov, M. Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation Mijalkovi, S. Compact Modeling for SiGe HBTs Milenin, V. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts Milentijevi, I. Synthesis of Folded Fully Pipelined Bit-Plane Architecture



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AUTHOR INDEX

Mileusni, S. A Study of Irradiation Damage in Commercial Power MOSFETs by Means of Split C-V and Conventional Methods Millan, J. Novel Dual Gate High Voltage TFT with Variable Doping Slot Milovanovi, B. New Neural Models of Microwave Transistor Noise Parameters Based on Bias Conditions Milovanovi, D. Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis Milovanovi, E. Optimizing AT2 Measure of Hexagonal Systolic Arrays Milovanovi, I. Optimizing AT2 Measure of Hexagonal Systolic Arrays



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AUTHOR INDEX

Min'ko, V. New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure Mirjani, D. Phonon Participation in Superlattice Heat Capacity Miti, S. Development of a Totally Implantable Hearing Aid Mitin, V. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Mladenov, M. An Improvable Ferroelectric Tactile Sensor with Acoustic Running Wave Moguilnaia, N. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective



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AUTHOR INDEX

Mohammadzadeh, A. Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs Moon, J.-W. Improved Trench MOS Barrier Schottky (TMBS) Rectifier Morante, J. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Moreno, M. Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary Analysis Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification Morgul, A. A Novel Current-Mode Design Scheme for Multi-Valued Logic Gates



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AUTHOR INDEX

Moroz, I. Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide Mozol', P. Appearance of Enriched Hg Regions in Solid State in CdHgTe Crystals Mrooz, O. Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors Mujkovi, V. Complex ASICs Verification with SystemC Murel, A. Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application Murray, F. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification



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AUTHOR INDEX

NNN Nadzhafova, O. Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N2 - Laser Excitation Nanver, L. A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications Napieralski, A. Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary Analysis Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification Nathan, A. TFT Circuit Integration in a-Si:H Technology Low Temperature a-Si:H TFT on Plastic Films: Materials and Fabrication Aspects Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture



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AUTHOR INDEX

Nemcsics, A. Modelling of Cd4GeSe6 Crystal Electrolyte Junction for Electrochemical Solar Cell Purposes Nenadovi, N. A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications Nenov, T. Multifunctional Temperature Sensor Nenova, Z. Multifunctional Temperature Sensor Netzel, M. PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency Emitters



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AUTHOR INDEX

Ngwendson, L. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power Semiconductor Device Nikoli, I. Synthesis of Folded Fully Pipelined Bit-Plane Architecture Nikoli, P. Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure Nishimura, M. Biologically Inspired Vision Sensors Novak, Z. OCVD Carrier Lifetime Measurements on an Inhomogeneous Diode Structures



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AUTHOR INDEX

Novkovski, N. Conduction Mechanisms in Thin rf Sputtered Ta2O5 Films on Si and their Dependence on O2 Annealing, Stress-Induced Leakage Currents in Thin Ta2O5 Films Novotny, I. Asymmetric Ratio Sensors of Nonelectric Quantities OOO

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Oates, A. Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs Odarich, V. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates

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AUTHOR INDEX Oklobdija, V. Clocking in Multi-GHz Environment


Orasson, E. Internet-Based Software for Teaching Test of Digital Circuits Ortiz-Conde, A. Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET Osmokrovi, P. Aging of the Over-Voltage Protection Components Ostapcuk, N. Complex ASICs Verification with SystemC stling, M. SiC Device Technology for High Voltage and RF Power Applications



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AUTHOR INDEX

PPP Paillotin, J.-F. Access to Microsystem Technology: the CMP Services Solution Palamutcuoglu, O. Pre-Power Amplifier for 5.2-5.8 GHz Band Parikh, C. Analysis and Design of Superjunction Power MOSFET: CoolMOSTM for Improved On Resistance and Breakdown Voltage Using Theory of Novel Voltage Sustaining Layer Park, J. SOI Devices for 0.1 m Gate Lengths Pascal, O. MEMS and NEMS Technologies for Wireless Communications



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AUTHOR INDEX

Paskaleva, A. Conduction Mechanisms in Thin rf Sputtered Ta2O5 Films on Si and their Dependence on O2 Annealing Patil, M. Analysis and Design of Superjunction Power MOSFET: CoolMOSTM for Improved On Resistance and Breakdown Voltage Using Theory of Novel Voltage Sustaining Layer Pavasovi, A. Design, Implementation and Comparison of Three General-Purpose Neurons Pavelka, R. Development of a Totally Implantable Hearing Aid Pecovska-Gjorgjevich, M. Conduction Mechanisms in Thin rf Sputtered Ta2O5 Films on Si and their Dependence on O2 Annealing Stress-Induced Leakage Currents in Thin Ta2O5 Films



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AUTHOR INDEX

Pejovi, M. Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs Perdu, P. TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology Pei, T. 1D Physically Based Non-Quasi-Static Analog Behavioral BJT Model for SPICE Petkovi, P. TSpice-Alecsis Co-simulation Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis Symbolic-Numeric Co-Simulation of Large Analogue Circuits Petrovi, D. Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network



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AUTHOR INDEX

Petrovi, R. A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies Pierasco, M. Initial Synchronization Procedure for UMTS-FDD Mode in FPGA Pinel, S. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Ping, H. A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance Plana, R. MEMS and NEMS Technologies for Wireless Communications Plewa, J. Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors



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MIEL 2002


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Pogorzelska, J. Thermal Investigation of the Three Types of NTC Thermistors Pons, P. MEMS and NEMS Technologies for Wireless Communications 23rd INTERNATIONAL CONFERENCE ON

MICROELECTRONICS Poole, K. Technology Options for Developing Manufacturable Non-silicon Nanoelectronics Pope, G. Improved 4H-Silicon Carbide Schottky Diodes using Multiple Metal Alloy Contacts Popov, A. An Improved Bridge Track-and-Hold Circuit Popov, D. Electrons in Cylindrical Quantum Wires

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Popovi, G. Development of a Totally Implantable Hearing Aid Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network Popovi, M. Multipurpose Thermal Sensor Based on Seebeck Effect Popovi, R. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator Popovici, E. Reed-Solomon Codecs for Optical Communications Portesine, M. H+ Irradiation for Reverse Recovery Softness and Reliability of Power p-i-n Diodes for Snubberless Applications

AUTHOR INDEX


Poustylnik, O. Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide Pritchard, M. Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture QQQ

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Quan, T.-H. In-Process Diagnostics of Recombination Centers in Structures of Large-Area Solar Cells Quintero, R. Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET HOME

AUTHOR INDEX


RRR Rabbia, L. MEMS and NEMS Technologies for Wireless Communications 23rd INTERNATIONAL

CONFERENCE ON MICROELECTRONICS

Radil, J. In-Process Diagnostics of Recombination Centers in Structures of Large-Area Solar Cells Radoji, B. Parallel Thermal Analysis of Hybrid and SMT Modules Using 2D and 3D Models Radulovi, K. Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure Silicon Resonant Cavity Enhanced UV Flame Detector Raik, J. Mixed-Level Defect Simulation in Data-Paths of Digital Systems On Efficient Logic-Level Simulation of Digital Circuits Represented by the SSBDD Model

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Ramovi, R. Parallel Thermal Analysis of Hybrid and SMT Modules Using 2D and 3D Models A Novel Analytical Model of a SiC MOSFET


MICROELECTRONICS

Sheet Density of Electrons in Spacer Layer of AlGaN/GaN MODFET: Calculating and Analyzing Randjelovi, D. Multipurpose Thermal Sensor Based on Seebeck Effect A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies A Novel Analytical Model of a SiC MOSFET Randji, A. Complex ASICs Verification with SystemC Ravariu, C. Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors Reece, P. Quantum Well Intermixing for Optoelectronic Device Integration

PROCEEDINGS

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Reeves, G. Influence of Via Liner Properties on the Current Density and Resistance of Vias


MICROELECTRONICS

Resendiz, L. Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment Reznicek, Z. Asymmetric Ratio Sensors of Nonelectric Quantities Rinaldi, N. Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal Simulations and Analytical Modeling SPICE Simulation of Electro-thermal Effects in New-Generation Multicellular VDMOS Transistors NASDAC - A New Simulation Tool for the Electro-Thermal Analysis of Bipolar Devices: Application to Multi-Finger AlGaAs/GaAs HBTs Risti, G. Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs

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MIEL 2002


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Rudenko, O. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates


MICROELECTRONICS

Rusu, A. Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors Ruika, Z. C-V and DLTS as Characterization Tools for Silicon Solar Cells SSS Saadaoui, M. MEMS and NEMS Technologies for Wireless Communications Sahandi, F. A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency

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MIEL 2002


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Sankara Narayanan, E. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power Semiconductor Device


MICROELECTRONICS

Novel Dual Gate High Voltage TFT with Variable Doping Slot Sazonov, A. Low Temperature a-Si:H TFT on Plastic Films: Materials and Fabrication Aspects Schmid, P. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Schott, C. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator Selberherr, S. A Calibrated Model for Silicon Self-Interstitial Cluster Formation and Dissolution

PROCEEDINGS

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MIEL 2002


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Semenko, M. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates


MICROELECTRONICS

Seo, K. S. Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation Servati, S. TFT Circuit Integration in a-Si:H Technology Sei, A. Formal Specification and Preliminary Design of an Asynchronous Traffic Light Controller Shashkin, V. Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application Shenai, K. Semiconductor Technologies for Powering MicroChips in the Information Age: From Source to Load

PROCEEDINGS

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Shin, H. Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region Shojaei, M. A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency Shpotyuk, O. Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors Shynkarenko, V. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Siemieniec, R. PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency Emitters Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices



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AUTHOR INDEX

Simi, Dj. Phase Noise Amplitude Distribution as Indicator of Origin of Random Phase Perturbation in a Test Oscillator Singh, R. Technology Options for Developing Manufacturable Non-silicon Nanoelectronics Sivoththaman, S. Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture Sklyar, T. Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N2 - Laser Excitation Slotboom, J. A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications



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AUTHOR INDEX

Smiljani, M. Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure Investigation of Surface Energy States on Si by Photoacoustic Spectroscopy Sokolovi, M. TSpice-Alecsis Co-simulation Soldo, I. Complex ASICs Verification with SystemC Song, C.-S. Design Parameter Optimization for Hall Sensor Application Spassov, D. Thermal Ta2O5 - Alternative to SiO2 for High Density Dynamic Memories Spirito, P. Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal Simulations and Analytical Modeling



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AUTHOR INDEX

Spulber, O. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power Semiconductor Device Stankovi, S. Aging of the Over-Voltage Protection Components Stefanovi, D. TSpice-Alecsis Co-simulation Steinberger, H. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Stevens, E. Reactive Ion Etching of 4H-SiC in C2F6-O2 and C2F6-Ar Mixture



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AUTHOR INDEX

Stojadinovi, N. Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs Stojanovi, N. Optimizing AT2 Measure of Hexagonal Systolic Arrays Stojev, M. Optimizing AT2 Measure of Hexagonal Systolic Arrays Stojkovi, S. Electrons in Cylindrical Quantum Wires Stourac, L. Noise Spectroscopy of Semiconductor Materials and Devices Stryahilev, D. Low Temperature a-Si:H TFT on Plastic Films: Materials and Fabrication Aspects



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AUTHOR INDEX


Sudkamp, W. Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices Sudnitson, A. An Approach to Synthesis of Mixed Synchronous/Asynchronous Digital Devices 23rd INTERNATIONAL CONFERENCE ON

MICROELECTRONICS Low Power Synthesis Based on Information Theoretic Measures Sumecz, F. Gripping Tools for Handling and Assembly of Microcomponents Handling and Assembly in MST - Final Results of European Network Sun, Y. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Svetlichnyi, A. Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts

PROCEEDINGS

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MIEL 2002


AAUUTTHHOORRSS

Sweet, M. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power Semiconductor Device Szekeres, A. Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device Application Szewczyk, R. Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary Analysis Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification ai, R. Sheet Density of Electrons in Spacer Layer of AlGaN/GaN MODFET: Calculating and Analyzing



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AUTHOR INDEX



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MIEL 2002

epanovi, M. Photoluminescence Caused by Presence of Defects and Oxides at the Surface of Hg1-xCdxTe etraji, J. Phonon Participation in Superlattice Heat Capacity Electrons in Cylindrical Quantum Wires ikula, J. Noise Spectroscopy of Semiconductor Materials and Devices TTT Tackac, A. MEMS and NEMS Technologies for Wireless Communications

AUTHOR INDEX Tan, C.-H. A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations


Tan, H. H. Quantum Well Intermixing for Optoelectronic Device Integration Tao, J. MEMS and NEMS Technologies for Wireless Communications Tasselli, J. Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification Tchamov, N. An Improved Bridge Track-and-Hold Circuit Tecpoyotl-Torres, M. Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor Temel, T. A Novel Current-Mode Design Scheme for Multi-Valued Logic Gates



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AUTHOR INDEX

ter Beek, M. Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection Theeuwen, S. A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications Tian, L. Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional Quantum Mechanical Effects and Gate Tunneling Current Modeling on Direct Tunneling Current in Ultra-Thin Oxide NMOSFET Considering Quantum Mechanics Unified MOSFET Scaling Theory using Variational Method Todorova, V. An Improvable Ferroelectric Tactile Sensor with Acoustic Running Wave Todorovi, D. Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure Investigation of Surface Energy States on Si by Photoacoustic Spectroscopy



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AUTHOR INDEX

Toki, T. Optimizing AT2 Measure of Hexagonal Systolic Arrays Synthesis of Folded Fully Pipelined Bit-Plane Architecture Torki, K. Access to Microsystem Technology: the CMP Services Solution Torres Jakome, A. Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide Toi, B. Electrons in Cylindrical Quantum Wires Toi, D. Symbolic Computation of Digital Filter Transfer Function using MATLAB Tousi, V. A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency



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AUTHOR INDEX

Towers, M. Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations Trbojevi, N. Silicon Resonant Cavity Enhanced UV Flame Detector Tremouilles, D. TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology Turmezei, P. Modelling of Cd4GeSe6 Crystal Electrolyte Junction for Electrochemical Solar Cell Purposes Tvaroek, V. Asymmetric Ratio Sensors of Nonelectric Quantities Twomey, K. Development of a Novel Humidity Sensor with Error-compensated Measurement System



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AUTHOR INDEX

UUU Ubar, R. Mixed-Level Defect Simulation in Data-Paths of Digital Systems On Efficient Logic-Level Simulation of Digital Circuits Represented by the SSBDD Model Internet-Based Software for Teaching Test of Digital Circuits Uphoff, H. Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors VVV Vakiv, M. Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors



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AUTHOR INDEX

Vaks, V. Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application Vamvakas, V. Electrical Stressing-induced Degradation Effects in Solid Phase Crystallized Polysilicon Thin Film Transistors Van der Spiegel, J. Biologically Inspired Vision Sensors Vanke, V. Non-Traditional Microwave Electronics Based on Electron Beam Transverse Grouping Vardanyan, A. Distribution of Slip Dislocations in Thermally Deformed Silicon Wafers Vashchenko, V. Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection Simulation of Si-Ge BiCMOS ESD Structures Operation Including Spatial Current Instability Mode



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MIEL 2002

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AUTHOR INDEX

Vasiljevi-Radovi, D. Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure Vasiltsov, I. Approach to Solve the Reliability Problem at Packaging Level in the Matrix VLSI Vellanki, A. Technology Options for Developing Manufacturable Non-silicon Nanoelectronics Vellvehi, M. Novel Dual Gate High Voltage TFT with Variable Doping Slot Venger, E. Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates



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MIEL 2002

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Vershinin, K. Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power Semiconductor Device Villain, J. Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors Vlasenko, O. Appearance of Enriched Hg Regions in Solid State in CdHgTe Crystals Vlasenko, Z. Appearance of Enriched Hg Regions in Solid State in CdHgTe Crystals Voitsikhovskyi, D. Structural-Phase Ordering in Ta2O5-p-Si Heterosystem Enhanced by Microwave Processing Vojinovi, O. Synthesis of Folded Fully Pipelined Bit-Plane Architecture



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MIEL 2002

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Vojnovi, B. Error Minimization of Sensor Pulse Signal Delay-Time Measurements Vujani A. Development of a Totally Implantable Hearing Aid A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies WWW Wang, J. Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional Quantum Mechanical Effects and Gate Tunneling Current Wang, X. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy



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MIEL 2002

Wong, H. Recent Developments in Silicon Optoelectronic Devices Electromagnetic Interference of Switching Mode Power Regulator with Chaotic Frequency Modulation Wong, P. Field Effect Transistors From Silicon MOSFETs to Carbon Nanotube FETs Wuttke, H.-D. Internet-Based Software for Teaching Test of Digital Circuits XXX Xi, L. A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance

AUTHOR INDEX


Xia, Y. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Xu, M.-Z. A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations Xu, Y. Novel Dual Gate High Voltage TFT with Variable Doping Slot YYY Yamamoto, S. A Novel Data Writing Method in a 1T2C-Type Ferroelectric Memory Analysis of Non-Volatile Latch Circuits with Ferroelectric-Gate Field Effect Transistors for Low Power and Low Voltage Operation



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MIEL 2002


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Yang, B. F. Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control Yastrubchak, O. New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure Yu, Z. Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional Quantum Mechanical Effects and Gate Tunneling Current Yusupov, M. Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N2 - Laser Excitation



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MIEL 2002


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ZZZ Zebrev, G. A Diagram Technique for Nonequilibrium Processes in Semiconductor Microstructures Temperature Response of Irradiated MOSFETs Zekentes, K. Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device Applications Zetterling, C.-M. SiC Device Technology for High Voltage and RF Power Applications Zhang, C. L. Design of High-Power Reverse-Conducting Gate-Commutated Thyristors Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation



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Zhang, G. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy Zhang, H.-Q. A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations Zhu, J. Z. Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control Zhu, Q. Low - Vt Devices Replacement for Domino Circuits Zleetni, S. M. -Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films



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MIEL 2002


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Zong, B. Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe Microscopy

ivanov, M. A Study of Irradiation Damage in Commercial Power MOSFETs by of Split C-V and Conventional Methods

ivanov, Lj. Symmetrical Thick Film EMI/RFI Filters



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