bedrock delineation by a seismic reflection/refraction survey at tead utah david sheley and jianhua...
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![Page 1: Bedrock Delineation by a Seismic Reflection/Refraction Survey at TEAD Utah David Sheley and Jianhua Yu](https://reader030.vdocuments.net/reader030/viewer/2022032704/56649d545503460f94a3033a/html5/thumbnails/1.jpg)
Bedrock Delineation by a Bedrock Delineation by a Seismic Seismic
Reflection/Refraction Reflection/Refraction Survey at TEAD UtahSurvey at TEAD Utah
David Sheley and Jianhua YuDavid Sheley and Jianhua Yu
![Page 2: Bedrock Delineation by a Seismic Reflection/Refraction Survey at TEAD Utah David Sheley and Jianhua Yu](https://reader030.vdocuments.net/reader030/viewer/2022032704/56649d545503460f94a3033a/html5/thumbnails/2.jpg)
OutlineOutline• AcquisitionAcquisition
• Reflection ProcessingReflection Processing
• Refraction ProcessingRefraction Processing
• InterpretationInterpretation
• ConclusionsConclusions
![Page 3: Bedrock Delineation by a Seismic Reflection/Refraction Survey at TEAD Utah David Sheley and Jianhua Yu](https://reader030.vdocuments.net/reader030/viewer/2022032704/56649d545503460f94a3033a/html5/thumbnails/3.jpg)
Survey LocationSurvey LocationN
orth
Nor
th1
Mil
e1
Mil
e
Mandate:Mandate:
Image Bedrock Image Bedrock
InterfaceInterface
Bedrock Depth:Bedrock Depth:
2 – 200? m2 – 200? m
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Acquisition ParametersAcquisition Parameters
• 120 40-Hz geopones120 40-Hz geopones
• 5 m receiver spacing5 m receiver spacing
• 2.5 m source spacing2.5 m source spacing
• Split spreadSplit spread
• 2630 m total line length2630 m total line length
• 1056 shot gathers1056 shot gathers
• EWG source (5 stacks)EWG source (5 stacks)
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EWG SourceEWG Source
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Recording ParametersRecording Parameters
• 1 ms sample interval1 ms sample interval
• 1500 samples/record1500 samples/record
• 120 active channels120 active channels
• 4-Hz low cut filter4-Hz low cut filter
• 500-Hz high cut (Nyquist) 500-Hz high cut (Nyquist) filterfilter
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OutlineOutline• AcquisitionAcquisition
• Reflection ProcessingReflection Processing
• Refraction ProcessingRefraction Processing
• InterpretationInterpretation
• ConclusionsConclusions
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Reflection Processing FlowReflection Processing Flow
Reformat DataReformat Data
CSG, CRG EditingCSG, CRG Editing
Band-Pass FilteringBand-Pass Filtering 10-50 Hz10-50 Hz
Automatic GainAutomatic GainControl (AGC)Control (AGC)
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Reflection Processing FlowReflection Processing Flow
Reformat DataReformat Data
CSG, CRG EditingCSG, CRG Editing
Band-Pass FilteringBand-Pass Filtering 10-50 Hz10-50 Hz
Automatic GainAutomatic GainControl (AGC)Control (AGC)
Refraction andRefraction andSurface Wave MuteSurface Wave Mute
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CMP 1179: Trace EditingCMP 1179: Trace Editing
Tim
e (m
s)T
ime
(ms)
00
400400
200200
800800
10001000
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CMP 1179: SW and Refr. MuteCMP 1179: SW and Refr. Mute
Tim
e (m
s)T
ime
(ms)
00
400400
200200
800800
10001000
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Reflection Processing FlowReflection Processing Flow
Reformat DataReformat Data
CSG, CRG EditingCSG, CRG Editing
Band-Pass FilteringBand-Pass Filtering 10-50 Hz10-50 Hz
Automatic GainAutomatic GainControl (AGC)Control (AGC)
Refraction andRefraction andSurface Wave MuteSurface Wave Mute
Velocity AnalysisVelocity Analysis
NMO CorrectionNMO Correction
Residual StaticsResidual Statics
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Reflection Processing FlowReflection Processing Flow
Reformat DataReformat Data
CSG, CRG EditingCSG, CRG Editing
Band-Pass FilteringBand-Pass Filtering 10-50 Hz10-50 Hz
Automatic GainAutomatic GainControl (AGC)Control (AGC)
Refraction andRefraction andSurface Wave MuteSurface Wave Mute
Velocity AnalysisVelocity Analysis
NMO CorrectionNMO Correction
Residual StaticsResidual Statics
BP Filtering andBP Filtering andAmplitude ScalingAmplitude Scaling
F-X PredictionF-X Prediction FilteringFiltering
Trace Mixing andTrace Mixing and AGC ScalingAGC Scaling
Output ResultOutput Result
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Final Reflection Section:Final Reflection Section:TimeTime
Tim
e (m
s)T
ime
(ms)
00
400400
200200
800800
00 1500150010001000500500 2500250020002000Offset (m)Offset (m)
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Final Reflection Section:Final Reflection Section:DepthDepth
Dep
th (
m)
Dep
th (
m)
00
400400
200200
800800
00 1500150010001000500500 2500250020002000Offset (m)Offset (m)
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CMP’s 599 and 600CMP’s 599 and 600
Tim
e (m
s)T
ime
(ms)
00
400400
200200
800800
10001000
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Final Reflection Section:Final Reflection Section:TimeTime
Tim
e (m
s)T
ime
(ms)
00
400400
200200
800800
00 1500150010001000500500 2500250020002000Offset (m)Offset (m)
CMP 600CMP 600 CMP 1180CMP 1180
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CMP’s 1179 and 1180CMP’s 1179 and 1180
Tim
e (m
s)T
ime
(ms)
00
400400
200200
800800
10001000
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OutlineOutline• AcquisitionAcquisition
• Reflection ProcessingReflection Processing
• Refraction ProcessingRefraction Processing
• InterpretationInterpretation
• ConclusionsConclusions
![Page 20: Bedrock Delineation by a Seismic Reflection/Refraction Survey at TEAD Utah David Sheley and Jianhua Yu](https://reader030.vdocuments.net/reader030/viewer/2022032704/56649d545503460f94a3033a/html5/thumbnails/20.jpg)
117,000 First Arrival Picks117,000 First Arrival PicksT
ime
(ms)
Tim
e (m
s)
00
400400
200200
800800
10001000
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Inversion ParametersInversion Parameters
• 117,000/127,000 picks117,000/127,000 picks
• 2.5 m grid size2.5 m grid size
• 2.5 m source spacing2.5 m source spacing
• 2730 x 220 m model (x,z)2730 x 220 m model (x,z)
• 160 x 80 max smoothing size160 x 80 max smoothing size
• 40 x 20 min smoothing size 40 x 20 min smoothing size
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Tomographic ResidualTomographic ResidualT
rave
ltim
e R
esid
ual
(m
s)T
rave
ltim
e R
esid
ual
(m
s)4545
2525
3535
1515
5500 1515101055 IterationIteration
160 x 80160 x 80 40 x 2040 x 2080 x 4080 x 40
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Velocity TomogramVelocity TomogramD
epth
(m
)D
epth
(m
)
00
200200
100100
00 1500150010001000500500 2500250020002000Offset (m)Offset (m)
00
40004000
Vel
ocit
y (m
/s)
Vel
ocit
y (m
/s)
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Tomogram & Raypath DensityTomogram & Raypath DensityD
epth
(m
)D
epth
(m
)
00
200200
100100
00 1500150010001000500500 2500250020002000Offset (m)Offset (m)
Dep
th (
m)
Dep
th (
m)
00
200200
100100
00 1500150010001000500500 2500250020002000Offset (m)Offset (m)
00
40004000
Vel
ocit
y (m
/s)
Vel
ocit
y (m
/s)
00
25002500
# of
Ray
s#
of R
ays
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OutlineOutline• AcquisitionAcquisition
• Reflection ProcessingReflection Processing
• Refraction ProcessingRefraction Processing
• InterpretationInterpretation
• ConclusionsConclusions
![Page 26: Bedrock Delineation by a Seismic Reflection/Refraction Survey at TEAD Utah David Sheley and Jianhua Yu](https://reader030.vdocuments.net/reader030/viewer/2022032704/56649d545503460f94a3033a/html5/thumbnails/26.jpg)
Refraction/Reflection ComparisonRefraction/Reflection ComparisonD
epth
(m
)D
epth
(m
)
00
200200
100100
00 1500150010001000500500 2500250020002000500500
3000+3000+
Vel
ocit
y (m
/s)
Vel
ocit
y (m
/s)
Offset (m)Offset (m)
Dep
th (
m)
Dep
th (
m)
00
200200
100100
00 1500150010001000500500 2500250020002000Offset (m)Offset (m)
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Refraction/Reflection with WellsRefraction/Reflection with WellsD
epth
(m
)D
epth
(m
)
00
200200
100100
00 1500150010001000500500 2500250020002000500500
3000+3000+
Vel
ocit
y (m
/s)
Vel
ocit
y (m
/s)
Dep
th (
m)
Dep
th (
m)
00
200200
100100
00 1500150010001000500500 2500250020002000
Offset (m)Offset (m)
Offset (m)Offset (m)
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InterpretationInterpretationD
epth
(m
)D
epth
(m
)
00
200200
100100
00 1500150010001000500500 2500250020002000500500
3000+3000+
Vel
ocit
y (m
/s)
Vel
ocit
y (m
/s)
Dep
th (
m)
Dep
th (
m)
00
200200
100100
00 1500150010001000500500 2500250020002000
Offset (m)Offset (m)
Offset (m)Offset (m)
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OutlineOutline• AcquisitionAcquisition
• Reflection ProcessingReflection Processing
• Refraction ProcessingRefraction Processing
• InterpretationInterpretation
• ConclusionsConclusions
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ConclusionsConclusions• Refraction tomography provides Refraction tomography provides
confidence in the reflection image. confidence in the reflection image.
• 40-Hz geophones did not sufficiently 40-Hz geophones did not sufficiently attenuate surface wave energy.attenuate surface wave energy.
• Source induced noise contaminated Source induced noise contaminated near offset traces.near offset traces.
• The source produced adequate The source produced adequate energy to image the bedrock contact.energy to image the bedrock contact.