MikroMasch SPM Library: www.spmtips.com/bibliography/

Bibliography on applicatons of Scanning Probe Microscopy to characterization of inorganic materials

Compiled by Oleg Boldenkov, taurus@mikromasch.com

Last updated on October 28, 2002 (Titles are sorted in alphabetical order. The years of all articles issued since 2000 are marked red) 1628 A Novel Self-Assembled Monolayer Coated Microcantilever for Low Level Cesium Detection H. F. Ji, R. Dabestani, E. Finot, T. Thundat, G. M. Brown and P. F. Britt Chem. Commun., (2000) 6, 457. 1002 A scanning probe microscopy study of the (001) surfaces of V2O5 and V6O13 G.S. Rohrer, M.-H. Whangbo, R.L. Smith, D.-K. Seo, K.S. Lee Surface Science, 367 (1996), 1, 87-95 305 Acidic dissolution of plagioclase: in-situ observations by hydrothermal atomic force microscopy - A study by direct-lattice resolution electron microscopy S.R. Higgins, S.M. Swapp, D.E. Janney, K.G. Knauss, C.M. Eggleston, G. Jordan Geochimica et Cosmochimica Acta, 63 (1999), 19-20, 3183-3191 165 AFM and SEM studies of CdS thin films produced by an ultrasonic spray pyrolysis method M.C. Baykul, A. Balcioglu Microelectronic Engineering, 51-52 (2000), 703-713 241 AFM and SEM study of the effects of etching on IPS-Empress 2TM dental ceramic X.-P. Luo, N. Silikas, M. Allaf, N.H.F. Wilson, D.C. Watts Surface Science, 491 (2001), 3, 388-394 1352 AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale A.L. Tolstikhina, N.V. Belugina, S.A. Shikin Ultramicroscopy 82 (2000) 149-152 144 AFM image visualization of layered dichalcogenides, 1T-MTe2(M = V, Ta) K.A. Yee, C. Pyun, C. Kim, S.-J. Kim, S.-J. Park, I.C. Jeon Journal of Physics and Chemistry of Solids, 58 (1997), 4, 659-663 166 AFM imaging of the surface of natural heulandite O. Matsuoka, S. Sugiyama, H. Nozoye, T. Honda, S. Yamamoto, Y. Banno Microporous and Mesoporous Materials, 21 (1998), 1-3, 1-6 154 AFM measurement of the grain size in polycrystalline titanium silicides F. Cazzaniga, G. Pavia, A. Sabbadini, S. Spiga, G. Queirolo Microelectronic Engineering, 55 (2001), 1-4, 93-99

MikroMasch SPM Library: www.spmtips.com/bibliography/ 112 AFM observation for the oxygen deficiency effect on the surface morphology of VO2 thin films M. Nagashima, H. Wada Journal of Crystal Growth, 179 (1997), 3-4, 539-545 117 AFM observation of barium nitrate {111} and {100} faces: - spiral growth and two-dimensional nucleation growth P. Bennema, W.J.P. Van Enckevort, M. Plomp, K. Maiwa Journal of Crystal Growth, 186 (1998), 1-2, 214-223 246 AFM observation of monatomic step movements on NaCl(001) with the help of adsorbed water H. Shindo, M. Ohashi, K. Baba, A. Seo Surface Science, 357-358 (1996), 111-114 126 AFM observation of surface activation of ruthenium oxide electrodes during hydrogen evolution C. Linlin, D. Guay, F.H. Pollak, F. Levy Journal of Electroanalytical Chemistry, 429 (1997), 1-2, 185-192 194 AFM observations and simulations of jarosite growth at the molecular scale: probing the basis for the incorporation of foreign ions into jarosite as a storage mineral U. Becker, B. Gasharova Physics and Chemistry of Minerals, 28 (2001), 8, 545-556 172 AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact C. Ruehlicke, M.A. Briere, D. Schneider Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 99 (1995), 1-4, 528-531 230 AFM studies of electron-stimulated desorption process of KBr(001) surface B. Such, P. Czuba, P. Piatkowski, M. Szymonski Surface Science, 451 (2000), 1-3, 203-207 39 AFM studies on ZnS thin films grown by atomic layer epitaxy R. Resch, T. Prohaska, M. Grasserbauer, M. Leskela, G. Friedbacher, M. Ritala, J. Ihanus Applied Surface Science, 120 (1997), 1-2, 43-50 28 AFM study of a SiC film grown on Si(100) surface using a C2H4 beam T. Takami, Y. Igari, I. Abe, S. Ishidzuka, I. Kusunoki Applied Surface Science, 169-170 (2001), 300-304 185 AFM study of growth of Bi2Sr2-xLaxCuO6 thin films H. Yang, Z. Zhao, D. Yang, H. Tao, L. Li, Y. Zhang

3

Physica C: Superconductivity and its Applications, 282-287 (1997), 561-562 278 AFM study of templated growth of cadmium sulfide nanoparticles using pure and mixed arachidate films K.Y. Simon Ng, H. Li, G. Mao Thin Solid Films, 358 (2000), 1-2, 62-72 149 AFM, SEM, EDX and HRTEM study of the crystalline growth rate anisotropy-induced internal stress and surface roughness of YBaCuO thin film F. Pailloux, R.J. Gaboriaud, C. Champeaux, A. Catherinot Materials Characterization, 46 (2001), 1, 55-63 807 Alkali cluster films on insulating substrates: comparison between scanning force microscopy and extinction data S.D. Jett, F. Balzer, H.-G. Rubahn Chemical Physics Letters, 297 (1998), 3-4, 273-280 307 Ambient atomic force microscopy images of stilbite and their interpretation by molecular simulations M. Komiyama, A. Miyamoto, Y. Oumi, M. Kubo, K. Tsujimichi Applied Surface Science, 121-122 (1997), 543-547 121 An AFM study of the properties of passive films on iron surfaces D.J. Meier, J. Li Journal of Electroanalytical Chemistry, 454 (1998), 1-2, 53-58 54 An AFM study of the topography of natural MoS2 following treatment in an RF-oxygen plasma N.-Y. Cui, A. McKinley, N.M.D. Brown Applied Surface Science, 151 (1999), 1-2, 17-28 223 An AFM study of the tribological properties of NaCl(100) surfaces under moist air H. Bluhm, L. Xu, M. Salmeron Surface Science, 407 (1998), 1-3, 251-255 133 An AFM-SEM investigation of the effect of silica fume and fly ash on cement paste microstructure V. G. Papadakis, E. J. Pedersen, H. Lindgreen Journal of Materials Science (full set), 34 (1999), 4, 683-690 311 An atomic force microscopy study of super-dislocation/micropipe complexes on the 6H-SiC(0001) growth surface G.S. Rohrer, J. Giocondi, M. Skowronski, V. Balakrishna, G. Augustine, H.M. Hobgood, R.H. Hopkins Journal of Crystal Growth, 181 (1997), 4, 351-362 315 An atomic force microscopy study of thin copper oxide films grown by molecular beam epitaxy on MgO(100) A. Brazdeikis, U.O. Karlsson, A.S. Flodstrom

4

Thin Solid Films, 281-282 (1996), 1-2, 57-59 56 An exploratory study of the topography of a CdI2 single crystal using AFM N.-Y. Cui, N.M.D. Brown, A. McKinley Applied Surface Science, 152 (1999), 3-4, 266-270 318 An investigation using atomic force microscopy and X-ray photoelectron spectroscopy of the modification of the surface of mica with an argon RF-plasma discharge Z.-H. Liu, N.M.D. Brown Applied Surface Science, 90 (1995), 2, 155-164 291 Analysis of surface forces on oxides in aqueous solutions using AFM T. Arai, D. Aoki, Y. Okabe, M. Fujihira Thin Solid Films, 273 (1996), 1-2, 322-326 325 Annealing of CaF2 adlayers grown on Si(111): investigations of the morphology by atomic force microscopy R. Kayser, H. Pietsch, A. Klust, J. Wollschlager Thin Solid Films, 336 (1998), 1-2, 120-123 809 Apparent contrast of molecularly thin films of water at ionic crystal surfaces M. Ishikawa, T. Yamada, S. Okita, K. Miura Applied Surface Science, 140 (1999), 3-4, 415-421 810 Application of non-contact scanning force microscopy to the study of water adsorption on graphite, gold and mica M. Luna, J. Colchero, A. Gil, J. Gomez-Herrero, A.M. Baro Applied Surface Science, 157 (2000), 4, 393-397 24 Aqueous degradation of Bi-2212 single crystals: An AFM study of surface alteration S.A. Holt, R. Zhao, S. Myhra Applied Surface Science, 84 (1995), 2, 125-131 812 Atomic and chemical resolution in scanning force microscopy on ionic surfaces A.L. Shluger, A.I. Livshits Applied Surface Science, 141 (1999), 3-4, 274-286 338 Atomic force microscopy and permeability study of stretching-induced gas barrier loss of AlOx layers C.P. Barker, J.P.S. Badyal, K.-H. Kochem, R.S.A. Kelly, K.M. Revell Thin Solid Films, 259 (1995), 1, 46-52 340 Atomic force microscopy and scanning electron microscopy study of MgO(110) surface faceting D.R. Giese, F.J. Lamelas, H.A. Owen, R. Plass, M. Gajdardziska-Josifovska Surface Science, 457 (2000), 3, 326-336

5

341 Atomic force microscopy and scanning tunneling microscopy studies of AlCl3-graphite intercalation compound N. Ikemiya, E. Shimazu, S. Hara, H. Shioyama, Y. Sawada Carbon, 34 (1996), 2, 277-279 347 Atomic force microscopy as a tool to correlate nanostructure to properties of glasses E. Radlein, G.H. Frischat Journal of Non-Crystalline Solids, 222 (1997), 69-82 349 Atomic force microscopy evidence for K+ domains on freshly cleaved mica C.E. Thompson, P.A. Campbell, L.J. Sinnamon, D.G. Walmsley Surface Science, 410 (1998), 2-3, L768-L772 350 Atomic Force Microscopy Examination of the Evolution of the Surface Morphology of Bi4Ti3O12 grown by Molecular Beam Epitaxy G.W. Brown, M.E. Hawley, C.D. Theis, J. Yeh, D.G. Schlom Journal of Electroceramics, 4 (2000), 2/3, 351-356 351 Atomic force microscopy examination of the evolution of the surface morphology of Bi4Ti3O12 grown by molecular beam epitaxy C.D. Theis, J. Yeh, D.G. Schlom, M.E. Hawley, G.W. Brown Thin Solid Films, 357 (1999), 1, 13-17 356 Atomic force microscopy images of MgO(100) and TiO2(110) under water and aqueous aromatic molecule solutions M. Gu, M. Komiyama Applied Surface Science, 120 (1997), 1-2, 125-128 365 Atomic force microscopy investigation of the surface topography and adhesion of nickel nanoparticles to submicrospherical silica D. Aurbach, S. Ramesh, A. Gedanken, Y. Cohen Chemical Physics Letters, 287 (1998), 3-4, 461-467 375 Atomic force microscopy of dislocation locking effects at gold film LiF substrate interface C. Coupeau, F. Cleymand, J. Grilhe Scripta Materialia, 43 (2000), 2, 187-192 376 Atomic force microscopy of gibbsite S. Lloyd, R.M. Cornell, G.M. Parkinson, S.M. Thurgate Applied Surface Science, 135 (1998), 1-4, 178-182 377 Atomic force microscopy of heavy metal fluoride glasses (Erratum in Journal of Non-Crystalline Solids, 217 (1997), 2-3, 115-120) L. Anselm, G.H. Frischat Journal of Non-Crystalline Solids, 213-214 (1997), 375-380

6

380 Atomic force microscopy of KH2PO4 crystallization in moist media T.G. Chernevich, L.N. Rashkovich, O.A. Shustin Journal of Crystal Growth, 206 (1999), 3, 252-254 385 Atomic force microscopy of synthetic barite microcrystals B.P. Gaber, D.D. Archibald, J.D. Hopwood, S. Mann, T. Boland Journal of Crystal Growth, 172 (1997), 1-2, 231-248 395 Atomic force microscopy studies of two-dimensional epitaxial growth of Bi2Sr2-xLaxCuO6+d thin films Y. Z. Zhang, H. T. Yang, L. Li, D. G. Yang, H. J. Tao, B. R. Zhao, Z. X. Zhao Journal of Materials Science Letters, 16 (1997), 13, 1095-1098 396 Atomic force microscopy studies on the surface morphology of {111} tabular AgBr crystals M. Plomp, J.G. Buijnsters, G. Bogels, W.J.P. van Enckevort, D. Bollen Journal of Crystal Growth, 209 (2000), 4, 911-923 398 Atomic force microscopy study of (001) SrTiO3 surfaces B. Stauble-Pumpin, B. Ilge, V.C. Matijasevic, P.M.L.O. Scholte, A.J. Steinfort, F. Tuinstra Surface Science, 369 (1996), 1-3, 313-320 399 Atomic force microscopy study of a perovskite-type layered compound, (C6H5CH2CH2NH3)2CuCl4 J.-K. Kang, I.C. Jeon Synthetic Metals, 71 (1995), 1-3, 1879-1880 405 Atomic force microscopy study of nanoindentation creep on the (100) face of MgO single crystals K. Sangwal, P. Gorostiza, F. Sanz Surface Science, 446 (2000), 3, 314-322 406 Atomic Force Microscopy Study of NaOH Corroded Al2O3-TiO2-SiO2 Coatings on Glass Yongjuan Du, Edda Radlein, Gunther Heinz Frischat Journal of Sol-Gel Science and Technology, 13 (1998), 1/3, 763-767 409 Atomic force microscopy study of silica nanopowder compacts Steven Harrington, Da-Ming Zhu, A. Thirunavukkarasu, Anil. Misra Journal of Materials Science (full set), 34 (1999), 9, 2075-2079 410 Atomic force microscopy study of the CaF2(111) surface: from cleavage via island to evaporation topographies K. Wandelt, H. Dabringhaus, J.B. Engelhardt Surface Science, 448 (2000), 2-3, 187-200 411 Atomic force microscopy study of the growth mechanism of ultrathin YBa2Cu3O7 (YBCO) films

7

B.R. Zhao, L.Z. Zheng, L. Li, C.L. Bai, C.F. Zhu, X.W. Wang, P.C. Zhang, Q. Li, C. Wang Thin Solid Films, 289 (1996), 1-2, 70-73 414 Atomic Force Microscopy Study of TiO2 Films Obtained by the Sol-Gel Method Maria Zaharescu, Maria Crisan, I. Musevic Journal of Sol-Gel Science and Technology, 13 (1998), 1/3, 769-773 416 Atomic force microscopy study on the anatase crystallization of long term stored Al2O3-TiO2-SiO2 coatings on glass Yongjuan Du, G. H. Frischat Journal of Materials Science (full set), 35 (2000), 10, 2561-2564 422 Atomic force microscopy with a conducting tip : correlation studies between microstructure and electrical properties of YBaCuO thin films A.F. Degardin, O. Schneegans, F. Houze, E. Caristan, A. De Luca, P. Chretien, L. Boyer, A.J. Kreisler Physica C: Superconductivity and its Applications, 341-348 (2000), 1965-1968 428 Atomic islands on the (100) alkali halide surfaces observed with atomic force microscopy K. Miura, K. Maeda Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 116 (1996), 1-4, 486-491 58 Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM H. Hosoi, K. Sueoka, K. Hayakawa, K. Mukasa Applied Surface Science, 157 (2000), 4, 218-221 430 Atomic structures and growth morphologies of electrodeposited Te film on Au(100) and Au(111) observed by in situ atomic force microscopy N. Ikemiya, D. Iwai, K. Yamada, R. Vidu, S. Hara Surface Science, 369 (1996), 1-3, 199-208 813 Atomic-layer chemical vapor deposition of SnO2 for gas-sensing applications A. Rosental, A. Tarre, A. Gerst, T. Uustare, V. Sammelselg Sensors and Actuators B: Chemical, 77 (2001), 1-2, 297-300 57 Atomic-scale structures on a non-stoichiometric TiO2(110) surface studied by noncontact AFM M. Ashino, T. Uchihashi, K. Yokoyama, Y. Sugawara, S. Morita, M. Ishikawa Applied Surface Science, 157 (2000), 4, 212-217 439 Catalyst genesis studied by atomic force microscopy R.M. Lambert, C.M.C. de Castilho, D.P.C. Bird Surface Science, 449 (2000), 1-3, L221-L227 1013 Characterisation of multilayer ramp-type REBa2Cu3O7-d structures by scanning probe microscopy and high-resolution electron microscopy D.H.A. Blank, A.J.H.M. Rijnders, M.A.J. Verhoeven, R.M.H. Bergs, H. Rogalla, K. Verbist, O.I. Lebedev, G. Van Tendeloo

8

Journal of Alloys and Compounds, 251 (1997), 1-2, 206-208 33 Characterisation of oxygen plasma-modified mica surfaces using XPS and AFM Z.-H. Liu, N.M.D. Brown, A. McKinley Applied Surface Science, 108 (1997), 3, 319-332 150 Characterization of anodic porous alumina by AFM Y. Sui, J.M. Saniger Materials Letters, 48 (2001), 3-4, 127-136 268 Characterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films G.W. Bao, S.F.Y. Li Talanta, 45 (1998), 4, 751-757 444 Characterization of inner surface phenomena in capillary electrophoresis capillaries by electron microscopy, atomic force microscopy and secondary ion mass spectroscopy S. Kaupp, H. Watzig Journal of Chromatography A, 781 (1997), 1-2, 55-65 189 Characterization of shock-compacted bulk YBCO by magnetic torque measurements, X-ray diffraction analysis and AFM-image H. Kezuka, M. Kikuchi, Y. Syono, K. Fukuoka, S. Kawamata, K. Okuda Physica C: Superconductivity and its Applications, 341-348 (2000), 2453-2454 823 Combined in-situ investigations of atmospheric corrosion of copper with SFM and IRAS coupled with QCM M. Wadsak, M. Schreiner, T. Aastrup, C. Leygraf Surface Science, 454-456 (2000) 246-250 1107 Combined Kerr-/magnetic force microscopy on NdFeB crystals of different crystallographic orientation W. Rave, R. Schafer, A. Hubert, E. Zueco, L. Schultz Journal of Magnetism and Magnetic Materials, 190 (1998), 1-2, 42-47 1371 Comparison of heteroepitaxial YBa2Cu3O7-d and TiO2 thin film growth A. Roshko, F. J. B. Stork, D. A. Rudman, D. J. Aldrich, P. A. Morris Hotsenpiller Journal of Crystal Growth 174 (1997) 398-408 193 Comparison of the surface structure of the tetrahedral sheets of muscovite and phlogopite by AFM Y. Kuwahara Physics and Chemistry of Minerals, 28 (2001), 1, 1-8 461 Conducting atomic force microscopy studies on local electrical properties of ultrathin SiO2 films A. Ando, R. Hasunuma, T. Maeda, K. Sakamoto, K. Miki, Y. Nishioka, T. Sakamoto

9

Applied Surface Science, 162-163 (2000), 401-405 824 Contrast mechanism in non-contact SFM imaging of ionic surfaces A.I. Livshits, A.L. Shluger, A.L. Rohl Applied Surface Science, 140 (1999), 3-4, 327-332 825 Control of the 2D/3D transition of the growth mechanism in the YBCO/Ce1-xLaxO2-x/2/SrTiO3 system D. Keller, C. Belouet, D. Chambonnet Physica C: Superconductivity and its Applications, 302 (1998), 2-3, 198-206 464 Correlating surface forces with surface reactivity of gypsum crystals by atomic force microscopy. Comparison with rheological properties of plaster E. Finot, E. Lesniewska, J.-P. Goudonnet, J.-C. Mutin, M. Domenech, A. At Kadi Solid State Ionics, 141-142 (2001), 39-46 466 Correlation between surface forces and surface reactivity in the setting of plaster by atomic force microscopy E. Finot, E. Lesniewska, J.-P. Goudonnet, J.C. Mutin Applied Surface Science, 161 (2000), 3-4, 316-322 467 Crystallization of SiO2-TiO2 glassy films studied by atomic force microscopy A. Karthikeyan, R.M. Almeida Journal of Non-Crystalline Solids, 274 (2000), 1-3, 169-174 831 Determination of growth rates of (100) and (110) faces of synthetic goethite by scanning force microscopy - Application to iron (hydr)oxides T. Hiemstra, T.P. Wetche, S.J. Hug, P.G. Weidler Geochimica et Cosmochimica Acta, 62 (1998), 21-22, 3407-3412 1302 Diamond-like-carbon and molybdenum disulfide nanotribology studies using atomic force measurements L.V. Santos, V.J. Trava-Airoldi, K. Iha, E.J. Corat, M.C. Salvadori Diamond and Related Materials, 10 (2001), 3-7, 1049-1052 217 Dielectric Property and Equivalent Circuit of a-Zirconium Phosphate System Related to the Phase Transition and its AFM Image I.C. Jeon, H.S. Yim, C.H. Kim Solid State Communications, 106 (1998), 8, 535-540 833 Different stages of water adsorption on Au studied by dynamic SFM and jumping mode A. Gil, J. Colchero, J. Gomez-Herrero, A.M. Baro Applied Physics A: Materials Science & Processing, 72 (2001), 7, S137-S140 240 Direct observation of hydration of TiO2 on Ti using electrochemical AFM: freely corroding versus potentiostatically held J.P. Bearinger, C.A. Orme, J.L. Gilbert

10

Surface Science, 491 (2001), 3, 370-387 67 Dissolution Kinetics of Calcite in 0.1 M NaCl Solution at Room Temperature: An Atomic Force Microscopic (AFM) Study Ryoji Shiraki, Peter A. Rock, William H. Casey Aquatic Geochemistry, 6 (2000), 1, 87-108 478 Dissolution kinetics of magnesite in acidic aqueous solution, a hydrothermal atomic force microscopy (HAFM) study: step orientation and kink dynamics G. Jordan, S.R. Higgins, C.M. Eggleston, K.G. Knauss, W.W. Schmahl Geochimica et Cosmochimica Acta, 65 (2001), 23, 4257-4266 479 Dissolution of barite by a chelating ligand: An atomic force microscopy study A. Putnis, J.L. Junta-Rosso, M.F. Hochella Geochimica et Cosmochimica Acta, 59 (1995), 22, 4623-4632 834 Dissolution Rates of Calcite (10-14) Obtained by Scanning Force Microscopy: Microtopography-Based Dissolution Kinetics on Surfaces with Anisotropic Step Velocities - An atomic force microscopy study W. Rammensee, G. Jordan Geochimica et Cosmochimica Acta, 62 (1998), 6, 941-947 835 Dynamic low-temperature scanning force microscopy on nickel oxide (001) W. Allers, S. Langkat, R. Wiesendanger Applied Physics A: Materials Science & Processing, 72 (2001), 7, S27-S30 1350 Dynamic oxide interfaces by microscopic techniques at high resolutions Y. Iwasawa Surface Science 402–404 (1998) 8–19 482 Early stages of growth and nanostructure of Pb(Zr,Ti)O3 thin films observed by atomic force microscopy M. Dinescu, O. Kolosov, P. Verardi, F. Craciun, F. Dinelli Thin Solid Films, 336 (1998), 1-2, 281-285 488 Electrical properties of CoSi2 precipitates in cobalt-implanted silicon: a conducting atomic force microscopy study J. M. Mao, J. B. Xu, Q. C. Peng, S. P. Wong, I. H. Wilson Journal of Materials Science Letters, 17 (1997), 3, 219-222 838 Electrochemical intercalation of perchlorate ions in HOPG: an SFM/LFM and XPS study B. Schnyder, D. Alliata, R. Kotz, H. Siegenthaler Applied Surface Science, 173 (2001), 3-4, 221-232 839 Electrodeposition of hydroxyapatite coatings in basic conditions M. Manso, C. Jimenez, C. Morant, P. Herrero, J. Martnez-Duart Biomaterials, 21 (2000), 17, 1755-1761

11

490 Energetic ion impacts on quartz surfaces: A study by atomic force microscopy I.H. Wilson, J.B. Xu, R.A.B. Devine, R.P. Webb Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 118 (1996), 1-4, 473-477 491 Environmental degradation of YBa2Cu3O7-x thin films: Analysis by atomic force microscopy S. Myhra, G. Watson, S.A. Holt, R.-P. Zhao, A. Katsaros, N. Savvides Physica C: Superconductivity and its Applications, 243 (1995), 1-2, 123-133 1404 Epitaxial layer sheet resistance outside and under ohmic contacts measurements using electrostatic force microscopy J.F. Bresse, S. Blayac Solid-State Electronics, 45 (2001), 7, 1071-1076 496 Etching and surface termination of K2Cr2O7 {001} faces observed using in situ atomic force microscopy M. Plomp, W.J.P. van Enckevort, E. Vlieg Journal of Crystal Growth, 216 (2000), 1-4, 413-427 497 Ex situ investigation of surface topography of as-grown potassium dihydrogen phosphate crystals by atomic force microscopy M.J. Krasinski, R. Rolandi Journal of Crystal Growth, 169 (1996), 3, 548-556 75 Fine atomic image of mica cleavage planes obtained with an atomic force microscope (AFM) and a novel procedure for image processing M. Baba, S. Kakitani, H. Ishii, T. Okuno Chemical Physics, 221 (1997), 1-2, 23-31 184 First AFM observation of thin cermet films close to the percolation threshold using a conducting tip M. Gadenne, P. Gadenne, O. Schneegans, F. Houze, P. Chretien, C. Desmarest, J. Sztern Physica B: Condensed Matter, 279 (2000), 1-3, 94-97 502 Force modulation atomic force microscopy: background, development and application to electrodeposited cerium oxide films G.E. Thompson, F.-B. Li, R.C. Newman Applied Surface Science, 126 (1998), 1-2, 21-33 848 From anisotropic dots to smooth RFe2>(110) single crystal layers (R = rare earth) A. Mougin, C. Dufour, N. Maloufi, K. Dumesnil, Ph. Mangin The European Physical Journal B, 19 (2001), 2, 289-296 34 FTIR-ATR, AFM, and UHV-STM characterization of the interface of SiO2/Si(001) induced by thick SiO2 formation

12

K. Namba, T. Komeda, Y. Nishioka Applied Surface Science, 117-118 (1997), 198-201 510 Fundamental measurements of the friction of clean and oxygen-covered VC(100) with ultrahigh vacuum atomic force microscopy: evidence for electronic contributions to interfacial friction P.B. Merrill, S.S. Perry Surface Science, 418 (1998), 1, 342-351 512 Gibbsite growth kinetics on gibbsite, kaolinite, and muscovite substrates: atomic force microscopy evidence for epitaxy and an assessment of reactive surface area - I. the solubility of gibbsite in the system Na-K-Cl-OH-Al(OH)4 from 0 to 100 oC J.M. Hanchar, R.T. Cygan, N.C. Sturchio, K.L. Nagy Geochimica et Cosmochimica Acta, 63 (1999), 16, 2337-2351 852 Growth and dissolution on the CaF2 (111) surface observed by scanning force microscopy G. Jordan, W. Rammensee Surface Science, 371 (1997), 2-3, 371-380 187 Growth and etching phenomena observed by STM/AFM on pulsed-laser deposited YBa2Cu3O7-d films B. Dam, J.H. Rector, B. Stauble-Pumpin, R. Griessen, U. Poppe, N.J. Koeman Physica C: Superconductivity and its Applications, 261 (1996), 1-2, 1-11 514 Growth kinetics of hydroxyapatite crystal revealed by atomic force microscopy K. Onuma, T. Kameyama, A. Ito, T. Tateishi Journal of Crystal Growth, 154 (1995), 1-2, 118-125 516 Growth of potassium sulfate crystals in the presence of organic dyes: in situ characterization by atomic force microscopy A. Mauri, M. Moret Journal of Crystal Growth, 208 (2000), 1-4, 599-614 517 Growth of zinc sulfide thin films on (100) Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy M. Leskela, G. Friedbacher, M. Grasserbauer, M.P. Valkonen, R. Resch, S. Lindroos Applied Surface Science, 136 (1998), 1-2, 131-136 854 Gypsum growth in the presence of background electrolytes studied by Scanning Force Microscopy D. Bosbach, J.L. Junta-Rosso, U. Becker, M.F. Hochella Geochimica et Cosmochimica Acta, 60 (1996), 17, 3295-3304 855 Gypsum growth in the presence of growth inhibitors: a scanning force microscopy study D. Bosbach, M.F. Hochella Chemical Geology, 132 (1996), 1-4, 227-236

13

1629 Highly Selective Microcantilever Sensor for Cesium Ion Detection. T. Thundat, E. Finot, H.-F. Ji, R. Dabestani, P.F. Britt, P. V. Bonnesen, G. M. Brown, R. J. Warmack Proc. Electrochem. Soc., (1999), 99-23, 314-319 526 Hydrophobic polytetrafluoroethylene-modified PbO2: ex situ observations of morphology during nucleation and growth via atomic force microscopy H. Chun Nan, H. Bing Joe Journal of Electroanalytical Chemistry, 388 (1995), 1-2, 53-67 533 Imaging of atomic-scale structure of oxide surfaces and adsorbed molecules by noncontact atomic force microscopy H. Onishi, Y. Iwasawa, K.-i. Fukui Applied Surface Science, 140 (1999), 3-4, 259-264 535 Imaging of sub-surface nano particles by tapping-mode atomic force microscopy J. Feng, L.-T. Weng, C.-M. Chan, J. Xhie, L. Li Polymer, 42 (2001), 5, 2259-2262 8 Imaging problems on insulators: What can be learnt from NC-AFM modelling on CaF2 A.S. Foster, A.L. Rohl, A.L. Shluger Applied Physics A: Materials Science & Processing, 72 (2001), 7, S31-S34 536 Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy C.L. Pang, H. Raza, S.A. Haycock, G. Thornton Applied Surface Science, 157 (2000), 4, 233-238 538 Imaging the atomic-scale structure of vanadia powder surface using ambient atomic force microscopy Yolande Barbaux, S. Peralta, A. Da Costa, C. Mathieu Surface Science, 395 (1998), 1, L201-L206 857 Impregnated cathode surface investigations by SFM/STM and SEM/EDX C. Makovicka, A. Hardt, G. Gartner, W. Hermann, D.U. Wiechert Applied Surface Science, 111 (1997), 70-75 238 In situ AFM observations of oxide film formation on Cu(111) and Cu(100) surfaces under aqueous alkaline solutions N. Ikemiya, T. Kubo, S. Hara Surface Science, 323 (1995), 1-2, 81-90 544 In situ atomic force microscopy studies of electrodeposition mechanism of cerium oxide films: nucleation and growth out of a gel mass precursor F.-B. Li, R.C. Newman, G.E. Thompson Electrochimica Acta, 42 (1997), 16, 2455-2464

14

548 In situ characterization of halide adsorption and Ag-halide growth on Ag(111) electrodes using atomic force microscopy A.A. Gewirth, D.D. Sneddon Surface Science, 343 (1995), 3, 185-200 1623 In situ detection of calcium ions with chemically modified microcantilevers H.-F. Ji and T. G. Thundat, Biosensors & Bioelectronics, (2002), 17, 337-343 552 In situ study of the recovery of nanoindentation deformation of the (100) face of MgO crystals by atomic force microscopy K. Sangwal, P. Gorostiza, F. Sanz Surface Science, 442 (1999), 2, 161-178 562 Interpretation of scanning tunneling microscopy and atomic force microscopy images of 1T-TiS2 H. Martinez, M. Loudet, P. Azavant Surface Science, 400 (1998), 1-3, 247-257 567 Investigation of growth modes of cadmium mercury thiocyanate crystal by atomic force microscopy X.N. Jiang, D.L. Sun, D. Xu, D.R. Yuan, M.K. Lu, S.Y. Guo, Q. Fang Journal of Crystal Growth, 233 (2001), 1-2, 196-207 136 Investigation of Interactions Between Polymer-coated Nano-Y-TZP Particles by AFM Jun Wang, Lian Gao Journal of Materials Science Letters, 18 (1999), 3, 181-183 284 Investigation of the nucleation of c-BN by AFM measurements R. Freudenstein, A. Klett, W. Kulisch Thin Solid Films, 398-399 (2001), 217-221 863 Ion track diameters in mica studied with scanning force microscopy R. Neumann, J. Ackermann, N. Angert, C. Trautmann, M. Dischner, T. Hagen, M. Sedlacek Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 107 (1996), 1-4, 181-184 864 Ion tracks in mica studied with scanning force microscopy using force modulation R. Neumann, J. Ackermann, N. Angert, C. Trautmann, M. Dischner, T. Hagen, M. Sedlacek Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 116 (1996), 1-4, 492-495 1127 Irradiation effects on the surface morphology and on the magnetic microstructure of giant magnetoresistance La0.7Sr0.3MnO3 thin films studied by magnetic force microscopy

15

J.F. Hamet, F. Elard, C. Mathieu, J. Wolfman, R. Desfeux, C. Simon, A. Da Costa Journal of Magnetism and Magnetic Materials, 196-197 (1999), 123-125 578 Langmuir-Blodgett films of ruthenium phosphine complexes characterized by Atomic Force Microscopy K. Wonhrath, S.V. Mello, M.A. Pereira-da-Silva, O.N. Oliveira Synthetic Metals, 121 (2001), 1-3, 1425-1426 867 Latent (sub-surface) tracks in mica studied by tapping mode scanning force microscopy D.D.N.B. Daya, C.T. Reimann, A. Hallen, B.U.R. Sundqvist, P. Hakansson Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 111 (1996), 1-2, 87-90 1309 Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples M. Grasserbauer, M. Leskela, G. Friedbacher, R. Resch, T. Kanniainen, L. Niinisto, S. Lindroos Applied Surface Science, 120 (1997), 1-2, 51-57 1310 Lateral force microscopy investigations of the crystallization of SrBi2Ta2O9 thin films B.K. Ju, K.B. Lee Thin Solid Films, 334 (1998), 1-2, 65-70 283 Lattice-resolution AFM oil the layered dichalcogenide WSe2 in the sliding regime T. Schimmel, J. Kuppers, M. Lux-Steiner Thin Solid Films, 264 (1995), 2, 212-216 1313 Lubricious zinc oxide films grown by pulsed laser deposition: Lateral force microscopy of wear surfaces S. V. Prasad, J. J. Nainaparampil, J. S. Zabinski Journal of Materials Science Letters, 19 (2000), 22, 1979-1981 292 Magnetron sputtering SiC films investigated by AFM R.A. Simao, A.K. Costa, C.A. Achete, S.S. Camargo Thin Solid Films, 377-378 (2000), 490-494 590 Measurement of surface roughness by atomic force microscopy and Rutherford backscattering spectrometry of CdS nanocrystalline films S.N. Sahu, S.N. Sarangi, K.K. Nanda Applied Surface Science, 133 (1998), 4, 293-297 591 Measurement of Young's modulus of nanocrystalline ferrites with spinel structures by atomic force acoustic microscopy E. Kester, U. Rabe, L. Presmanes, P. Tailhades, W. Arnold Journal of Physics and Chemistry of Solids, 61 (2000), 8, 1275-1284 148 Measuring agglomerates in ceramic fibres using AFM

16

M. Prica Journal of the European Ceramic Society, 18 (1998), 5, 457-465 1314 Mechanical properties of hexagonal boron nitride synthesized from film of Cu/BN mixture by surface segregation K.S. Lee, Y.S. Kim, M. Tosa, A. Kasahara, K. Yosihara Applied Surface Science, 169-170 (2001), 420-424 242 Mechanical properties of in situ demineralised human enamel measured by AFM nanoindentation M. Finke, J.A. Hughes, D.M. Parker, K.D. Jandt Surface Science, 491 (2001), 3, 456-467 598 Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2 S. Antoranz Contera, T. Yoshinobu, H. Iwasaki, K. Kisoda Surface Science, 441 (1999), 2-3, 384-390 124 Micromorphology changes of silicon oxide on Si(111) during current oscillations: a comparative in situ AFM and FTIR study H.-J. Lewerenz, H. Jungblut, S. Rauscher, O. Nast Journal of Electroanalytical Chemistry, 442 (1998), 1-2, 169-174 605 Microstructural examination of layered coatings by scanning electron microscopy, transmission electron microscopy, and atomic force microscopy D.G. Rickerby, T. Friesen Materials Characterization, 36 (1996), 4-5, 213-223 179 Microstructure and growth mechanism of Pt-Al2O3 co-sputtered nanocermet films studied by SAXS, TEM and AFM C. Sella, M. Maaza, B. Pardo, F. Dunsteter, J.C. Martin, M.C. Sainte Catherine Physica A: Statistical Mechanics and its Applications, 241 (1997), 1-2, 192-198 607 Microstructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy N.Z. Lou, S. Jin, X. Liu, Z.H. Wilson, H. Bender, F. Zhang Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 142 (1998), 1-2, 61-66 116 Microtopography of the barite (001) face during growth: - AFM observations and PBC theory A. Putnis, M. Prieto, C.M. Pina, D. Bosbach Journal of Crystal Growth, 187 (1998), 1, 119-125 608 Mineral precipitation and dissolution in aqueous solution: in-situ microscopic observations on barite (001) with atomic force microscopy C. Hall, D. Bosbach, A. Putnis Chemical Geology, 151 (1998), 1-4, 143-160 626 Morphology of dual beam ion sputtered films investigated by atomic force microscopy

17

C.-C. Lee, J.-C. Hsu, D.T. Wei, J.-H. Lin Thin Solid Films, 308-309 (1997), 1-4, 74-78 630 Nanometer undulations on CaF2 cleaved surfaces observed by atomic force microscopy C. Coupeau, M.K. Small, N. Junqua, J. Grilhe Scripta Materialia, 34 (1996), 11, 1673-1678 636 Nanoscale thickness changes of nickel hydroxide films during electrochemical oxidation/reduction monitored by in situ atomic force microscopy P. Haring, R. Kotz Journal of Electroanalytical Chemistry, 385 (1995), 2, 273-277 884 Nanotribology: An UHV-SFM study on thin films of C60 and AgBr R. Luthi, E. Meyer, H. Haefke, L. Howald, W. Gutmannsbauer, M. Guggisberg, M. Bammerlin, H.-J. Guntherodt Surface Science, 338 (1995), 1-3, 247-260 641 Non-contact atomic force microscopy imaging of TiO2(100) surfaces H. Raza, S.A. Haycock, C.L. Pang, G. Thornton Applied Surface Science, 140 (1999), 3-4, 271-275 642 Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip H. Hosoi, M. Kimura, K. Hayakawa, K. Sueoka, K. Mukasa Applied Physics A: Materials Science & Processing, 72 (2001), 7, S23-S26 643 Nucleation and growth behavior of epitaxial Pb(Zr,Ti)O3/MgO(100) observed by atomic force microscopy Y. Xuan, N. Wakiya, N. Mizutani, K. Shinozaki, K. Kuroyanagi Thin Solid Films, 357 (1999), 2, 166-172 644 Nucleation and growth of SrTiO3/Si(100) observed by atomic force microscopy J.L. Penal, P. Bartolo-Perez, F. Leccabue, A.I. Oliva, R. Castro-Rodriguez, E. Vasco, M. Aguilar Applied Surface Science, 125 (1998), 1, 58-64 645 Observation of a new ridge structure along steps on the MgO(100) surface by non-contact atomic force microscopy K.-i. Fukui, Y. Iwasawa Surface Science, 441 (1999), 2-3, 529-541 647 Observation of Cd26As74 and Zn32P68 by atomic force microscopy A. Burian, A. Mosset, R. Coratger Thin Solid Films, 303 (1997), 1-2, 143-145 648 Observation of CdS crystal surface by atomic force microscopy Juniya Yoshino, Jun Morimoto, Hideo Wada Journal of Materials Science Letters, 16 (1997), 24, 1977-1979

18

1407 Observation of ferroelectric microdomains in LiNbO3 crystals by electrostatic force microscopy H. Nagata, J. Ichikawa, T. Fukuda, S. Tsunekawa Applied Surface Science, 137 (1999), 1-4, 61-70 650 Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy Q. Li, F. Gan Applied Surface Science, 181 (2001), 3-4, 239-247 651 Observation of short-wavelength recorded pits in GeSb2Te4 phase change thin film by atomic force microscopy M. Li, L. Men, F. Gan, J. Sun Applied Surface Science, 120 (1997), 1-2, 171-179 654 Observation of the V2O5(001) surface using ambient atomic force microscopy C. Mathieu, A. Da Costa, Y. Barbaux, H. Poelman, G. Dalmai-Vennik, L. Fiermans Surface Science, 370 (1997), 2-3, 339-344 667 Photochemically induced oxidation and silver deposition on amorphous germanium sulfide films studied using atomic force microscopy and ion beam methods G. Chen, J.H. Horton Thin Solid Films, 347 (1999), 1-2, 208-213 99 Point of zero charge of a corundum-water interface probed with optical second harmonic generation (SHG) and atomic force microscopy (AFM): New approaches to oxide surface charge A.G. Stack, S.R. Higgins, C.M. Eggleston Geochimica et Cosmochimica Acta, 65 (2001), 18, 3055-3063 678 Probing the surface forces of atomic layered SrTiO3 films by atomic force microscopy H. Tanaka, T. Kawai, H. Tabata Thin Solid Films, 342 (1999), 1-2, 4-7 895 Reactivity of gypsum faces according to the relative humidity by scanning force microscopy E. Finot, E. Lesniewska, J.-C. Mutin, J.-P. Goudonnet Surface Science, 384 (1997), 1-3, 201-217 685 Reflection high-energy electron diffraction and atomic force microscopy studies on homoepitaxial growth of SrTiO3(001) H. Yamamoto, M. Naito, H. Sato Physica C: Superconductivity and its Applications, 305 (1998), 3-4, 233-250 687 Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity

19

H.H. Teng, P. Fenter, L. Cheng, N.C. Sturchio Geochimica et Cosmochimica Acta, 65 (2001), 20, 3459-3474 186 RHEED/AFM analysis of YBCO epitaxial thin films grown by laser MBE M. Putti, I. Pallecchi, M.R. Cimberle, D. Marre, E. Giannini, A.S. Siri, C. Ferdeghini, G. Grassano, R. Rolandi, A. Diaspro Physica C: Superconductivity and its Applications, 282-287 (1997), 679-680 899 Scanning force microscope observations of corrosive wear on single-crystal brushite (CaHPO4·2H2O) in aqueous solution L. Scudiero, S.C. Langford, J.T. Dickinson Tribology Letters, 6 (1999), 1, 41-55 901 Scanning force microscopy and electron microscopy studies of pulsed laser deposited ZnO thin films: application to the bulk acoustic waves (BAW) devices M. Dinescu, C. Gherasim, N. Nastase, C. Flueraru, R. Dinu, P. Verardi, C. Ghica Journal of Crystal Growth, 197 (1999), 3, 523-528 909 Scanning force microscopy of heavy-ion induced damage in lithium fluoride single-crystals A. Muller, C. Muller, R. Neumann, F. Ohnesorge Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 166-167 (2000) 581-585 910 Scanning force microscopy of heavy-ion tracks in lithium fluoride R. Neumann, K. Schwartz, C. Trautmann, A. Muller Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 146 (1998), 1-4, 393-398 911 Scanning force microscopy of KI exposed to exciton-producing UV light R.T. Williams, R.M. Wilson Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 101 (1995), 1-2, 122-126 917 Scanning force microscopy studies of surface microstructure of Na-β”-Al2O3 single-crystal films O. Prakash, R. Khare, C.K. Kuo, P.S. Nicholson Solid State Ionics, 98 (1997), 1-2, 113-117 918 Scanning force microscopy study of single-crystal substrates used for thin-film growth of high-temperature superconductors R. Sum, H.P. Lang, H.-J. Guntherodt Physica C: Superconductivity and its Applications, 242 (1995), 1-2, 174-182 919 Scanning force microscopy study of surface tracks induced in mica by 78.2-MeV 127I ions D.D.N. Barlo Daya, A. Hallen, P. Hakansson, B.U.R. Sundqvist, C.T. Reimann Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 103 (1995), 4, 454-465

20

1049 Scanning probe microscopy and tunnelling measurements of polycrystalline tin oxide films T.K.S. Wong, W.K. Man Thin Solid Films, 287 (1996), 1-2, 45-50 1061 Scanning probe microscopy studies of Ebonex® electrodes J. R. Smith, A. H. Nahle, F. C. Walsh Journal of Applied Electrochemistry, 27 (1997), 7, 815-820 1062 Scanning Probe Microscopy Studies of the Substrate Annealing Effect on YBa2Cu3O7-x Thin Film Growth Y. Fan, A.G. Fitzgerald, B.E. Storey, A.O. Tooke Physica C: Superconductivity and its Applications, 341-348 (2000), 2339-2340 694 Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n=1,2) and [(Pb,Sb)S)]1.14NbS2 J. Rouxel, M.-H. Whangbo, D.-K. Seo, C. Deudon, S. Jobic, H. Bengel Surface Science, 400 (1998), 1-3, 266-276 920 Seeding effect on micro- and domain structure of sol-gel-derived PZT thin films A.L. Kholkin, A. Gruverman, A. Wu, M. Avdeev, P.M. Vilarinho, I.M. Miranda Salvado, J.L. Baptista Materials Letters, 50 (2001), 4, 219-224 925 SFM and SEM investigation of CdS layers from Langmuir-Blodgett film templates R. Rolandi, A. Diaspro, P. Facci Thin Solid Films, 327-329 (1998), 532-535 9 Simulation of NC-AFM images of xenon (111) H. Holscher, W. Allers, U.D. Schwarz, A. Schwarz, R. Wiesendanger Applied Physics A: Materials Science & Processing, 72 (2001), 7, S35-S38 1361 Spectroscopic study of the surface oxidation of a thin epitaxial Co layer R. Mamy Applied Surface Science 158 (2000) 353–356 927 Spin-contrast in non-contact SFM on oxide surfaces: theoretical modelling of NiO(001) surface A.S. Foster, A.L. Shluger Surface Science, 490 (2001), 1-2, 211-219 928 SrBi2Ta2O9 has only two polar axes - a problem for high density ferroelectric memory devices K. Franke, G. Martin, M. Weihnacht, A.V. Sotnikov Solid State Communications, 119 (2001), 3, 117-119 254 Stabilization of the rhombohedral polytype in MoS2 and WS2 microtubes: TEM and AFM study

21

M. Remskar, Z. Skraba, C. Ballif, R. Sanjines, F. Levy Surface Science, 433-435 (1999), 637-641 248 STM/AFM investigations of β-MoTe2, α-MoTe2 and WTe2 V. Marinkovic, S.W. Hla, A. Prodan, I. Musevic Surface Science, 352-354 (1996), 105-111 930 Stress induced movement of ferroelastic domain walls in BaTiO3 single crystals evaluated by scanning force microscopy J. Munoz-Saldana, G.A. Schneider, L.M. Eng Surface Science, 480 (2001), 1-2, L402-L410 706 Stress singularity near the crack-tip in silicon carbide: investigation by atomic force microscopy T. Kinoshita Acta Materialia, 46 (1998), 11, 3963-3974 1408 Stress-induced depolarization in PZT thin films, measured by means of electric force microscopy H. Huelz, K. Franke, M. Weihnacht Surface Science, 416 (1998), 1-2, 59-67 712 Structural properties of MOVPE-grown ZnSe studied by X-ray diffractometry, atomic force microscopy and electron microscopy H. Lakner, K. Heime, M. Heuken, C. Mendorf, E. Kubalek, Q. Liu, W. Taudt Journal of Crystal Growth, 197 (1999), 3, 507-512 715 Structure and modification of silver halide thin films using scanning tunneling and atomic force microscopy J. Blakely, A. Swanson Surface Science, 394 (1997), 1-3, 221-234 280 Studies using AFM and STM of the correlated effects of the deposition parameters on the topography of gold on mica Z.H. Liu, N.M.D. Brown Thin Solid Films, 300 (1997), 1-2, 84-94 40 Study of CdS nanocrystallites by AFM and Raman scattering spectroscopy S.N. Sahu, K.K. Nanda Applied Surface Science, 119 (1997), 1-2, 50-54 236 Study of the influence of adsorbed water on AFM friction measurements on molybdenum trioxide thin films W. Gulbinski, D. Pailharey, T. Suszko, Y. Mathey Surface Science, 475 (2001), 1-3, 149-158 93 Study of the initial stage of white rust formation on zinc single crystal by EIS, STM/AFM and SEM/EDS techniques L. Sziraki, E. Szocs, Z. Pilbath, K. Papp, E. Kalman

22

Electrochimica Acta, 46 (2001), 24-25, 3743 – 3754 718 Study of the low stress plasticity in single-crystal MgO by nanoindentation and atomic force microscopy C. Tromas, J. C. Girard, V. Audurier, J. Woirgard Journal of Materials Science (full set), 34 (1999), 21, 5337-5342 719 Study of the surface morphology of the (100) cleavage planes of MgO single crystals by atomic force microscopy F. Sanz, K. Sangwal, P. Gorostiza Surface Science, 424 (1999), 1, 139-144 167 Surface aging of HgI2 crystals studied by VASE and AFM H. Yao, L.A. Lim, R.B. James, M. Schieber, M. Natarajan Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 380 (1996), 1-2, 26-29 41 Surface analysis of two misfit layer compounds - (PbS)1.18(TiS2) and (PbS)1.18(TiS2)2 - by scanning probe microscopies (AFM and STM) and X-ray photoelectron spectroscopy (XPS) G. Pfister-Guillouzo, M. Loudet, C. Auriel, D. Gonbeau, H. Martinez Applied Surface Science, 125 (1998), 3-4, 259-272 936 Surface defect formation on gypsum surfaces due to grazing incidence 78.2 MeV 127I ions: A comparative study employing tapping-mode scanning force microscopy and shadow-replica electron microscopy C.T. Reimann, D.A. Kolesnikov, I.V. Vorobyova Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 122 (1997), 2, 255-261 727 Surface modification of MgO substrates from aqueous exposure: An atomic force microscopy study A. Crossley, C. Johnston, C.J. Sofield, S. Myhra, S.A. Holt, C.F. Jones, G.S. Watson Thin Solid Films, 292 (1997), 1-2, 96-102 730 Surface morphology of nitrided thin thermal SiO2 studied by atomic force microscopy R. Zonca, G. Tallarida, F. Cazzaniga, B. Crivelli, M. Alessandri Journal of Non-Crystalline Solids, 245 (1999), 1-3, 210-216 1330 Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy L.M. Eng, M. Bammerlin, Ch. Loppacher, M. Guggisberg, R. Bennewitz, R. Luthi, E. Meyer, H.-J. Guntherodt Applied Surface Science 140 (1999) 253–258 733 Surface observations of synthetic hydroxyapatite single crystal by atomic force microscopy K. Onuma, T. Kameyama, A. Ito, T. Tateishi

23

Journal of Crystal Growth, 148 (1995), 1-2, 201-206 735 Surface roughness characterization of NicalonTM and HI-NicalonTM ceramic fibers by atomic force microscopy N. Chawla, J.F. Mansfield, J.W. Holmes Materials Characterization, 35 (1995), 4, 199-206 740 Surface structure of natural crystals of mordenite as imaged by atomic force microscopy S. Yamamoto, O. Matsuoka, S. Sugiyama, T. Honda, Y. Banno, H. Nozoye Chemical Physics Letters, 260 (1996), 1-2, 208-214 742 Surface structure of synthesized mordenite crystal studied by atomic force microscopy S. Sugiyama, S. Yamamoto, O. Matsuoka, T. Honda, H. Nozoye, S. Qiu, J. Yu, O. Terasaki Surface Science, 377-379 (1997), 140-144 743 Surface structures of MgO(100) and SrTiO3(100) as revealed by atomic force microscopy N. Ikemiya, A. Kitamura, S. Hara Journal of Crystal Growth, 160 (1996), 1-2, 104-110 744 Surface structures of zeolites studied by atomic force microscopy S.S. Ono, O. Matsuoka, S. Yamamoto Microporous and Mesoporous Materials, 48 (2001), 1-3, 103-110 745 Surface topography of rapidly grown KH2PO4 crystals with additives: ex situ investigation by atomic force microscopy S. Genbo, T. Jing, W. Jianmin, Y. Shangfeng, L. Zhengdong, M. Bingwei Journal of Crystal Growth, 203 (1999), 3, 425-433 941 Surface track formation on mica surfaces due to grazing incidence 20.2 MeV C60 ions: a comparative study employing shadow-replica electron microscopy, tapping-mode and phase-imaging scanning force microscopy M. Bergqvist, S. Oscarsson, I.V. Vorobyova, J. Herbig, C.T. Reimann Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 149 (1999), 1-2, 119-128 272 TEM and AFM study of perovskite conductive LaNiO3 films prepared by metalorganic decomposition G. Chen, D. Wu, Z. Liu, X. Liu, A. Li, N. Ming, C. Ge Thin Solid Films, 336 (1998), 1-2, 386-390 285 TEM, AFM, and cathodoluminescence characterization of CdTe thin films M.M. Al-Jassim, Y. Yan, H.R. Moutinho, M.J. Romero, R.D. Dhere, K.M. Jones Thin Solid Films, 387 (2001), 1-2, 246-250 1321 The influence of pH on friction between oxide surfaces in electrolytes, studied with lateral force microscopy: application as a nanochemical imaging technique

24

G. Hahner, A. Marti, N.D. Spencer Tribology Letters, 3 (1997), 4, 359-365 946 The kinetic growth model applied to micropipes in 6H-SiC J. Heindl, W. Dorsch, T. Marek, H.P. Strunk, R. Eckstein, D. Hofmann, S.G. Muller, A. Winnacker Diamond and Related Materials, 6 (1997), 10, 1269-1271 275 The sol-gel preparation and AFM study of spinel CoFe2O4 thin film C. Liao, C. Yan, F. Cheng, Z. Peng, Z. Xu Thin Solid Films, 339 (1999), 1-2, 109-113 228 The surface structure of TiO2(001) after high temperature annealing studied by AFM, STM, and optical microscopy H. Norenberg, G.A.D. Briggs, F. Dinelli Surface Science, 446 (2000), 1-2, L83-L88 206 Topographic characterization of barium-hexaferrite powders using AFM (Erratum in Scripta Materialia, 35 (1996), 6, 785) S. Palomares-Sanchez, S. Ponce-Castaneda, F. Ruiz, M. Mirabal-Garcia, J.R. Martinez Scripta Materialia, 34 (1996), 8, 1195-1200 1624 Ultrasensitive Detection of Trace CrO4

2- Using a Microcantilever sensors H. F. Ji, T. Thundat, R. Dabestani, G. M. Brown, P. F. Britt, and P. Bonnesson Anal. Chem. 73 (2001), 7, 1572-1576 782 Very large-scale structures in sintered silica aerogels as evidenced by atomic force microscopy and ultra-small angle X-ray scattering experiments C. Marliere, F. Despetis, P. Etienne, T. Woignier, P. Dieudonne, J. Phalippou Journal of Non-Crystalline Solids, 285 (2001), 1-3, 148-153 273 XPS and AFM study of chemical mechanical polishing of silicon nitride G.-R. Yang, Y.-P. Zhao, Y.Z. Hu, R.J. Gutmann, T.P. Chow Thin Solid Films, 333 (1998), 1-2, 219-223