built-in logic block observer - organization zarchitecture

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C. Stroud 10/06 BILBO 1 Built Built - - In Logic Block Observer In Logic Block Observer - - Organization Organization Architecture Architecture Operation Operation Test Session Scheduling Test Session Scheduling BIST Controller BIST Controller Concurrent BILBO Concurrent BILBO Benefits & Limitations Benefits & Limitations

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C. Stroud 10/06 BILBO 1

BuiltBuilt--In Logic Block Observer In Logic Block Observer -- OrganizationOrganization

ArchitectureArchitectureOperationOperationTest Session SchedulingTest Session SchedulingBIST ControllerBIST ControllerConcurrent BILBOConcurrent BILBOBenefits & LimitationsBenefits & Limitations

C. Stroud 10/06 BILBO 2

BuiltBuilt--In Logic Block Observer (BILBO)In Logic Block Observer (BILBO)by by KoenemannKoenemann & & MuchaMucha, 1979, 1979

1st BIST approach proposed1st BIST approach proposedBIST logic added to all BIST logic added to all FFsFFs

plus logic for characteristic polynomialplus logic for characteristic polynomialBILBO control leads B1 & B2 facilitateBILBO control leads B1 & B2 facilitate

system mode system mode -- normal operationnormal operationreset mode reset mode -- initializationinitializationLFSR mode LFSR mode -- TPGTPGMISR mode MISR mode –– ORAORA

Scan mode neededScan mode neededBIST results retrievalBIST results retrievalInitialization of Initialization of TPGsTPGs

to nonto non--0 values0 valuesTestTest--perper--clock BISTclock BIST

Exhaustive testing of combinational logicExhaustive testing of combinational logic

Zi

B1B2

Qi-1

D Q

CK Q

Qi

Qi

CombLogicaddedto FF

BILBO FF

BILBO

BILBO

CombLogic

Z

B1B2

Q

C. Stroud 10/06 BILBO 3

BILBO EvolutionBILBO EvolutionOriginal implementationOriginal implementation

Required mode pin B1 Required mode pin B1 to control TPG vs. to control TPG vs. MISR mode during MISR mode during testingtesting

Forcing logic 0s on Z Forcing logic 0s on Z inputs causes MISR to inputs causes MISR to function as LSFR for function as LSFR for TPGTPG

Used external FB LFSRUsed external FB LFSRLater implementation added Later implementation added control signal B3control signal B3

To control TPG vs. To control TPG vs. MISR modesMISR modes

C. Stroud 10/06 BILBO 4

BILBO EvolutionBILBO EvolutionModified BILBO was Modified BILBO was introduced for practical introduced for practical ASIC implementationsASIC implementations

NAND gates used NAND gates used for CMOS for CMOS ““friendlyfriendly””standard cellsstandard cellsOnly two control Only two control signals neededsignals neededMinimizes area Minimizes area overheadoverheadMost frequently used Most frequently used BILBO approachBILBO approach

C. Stroud 10/06 BILBO 5

BILBO OperationBILBO OperationAt least 2 test sessions requiredAt least 2 test sessions required

Test session 1:Test session 1:CktsCkts A & C are CUTsA & C are CUTsBILBO 1 = MISRBILBO 1 = MISRBILBO 2 = LFSRBILBO 2 = LFSR

Test session 2:Test session 2:CktCkt B is CUTB is CUTBILBO 1 = LFSRBILBO 1 = LFSRBILBO 2 = MISRBILBO 2 = MISR

Need scan mode toNeed scan mode toRetrieve BIST results from Retrieve BIST results from MISRsMISRsInitialize Initialize LFSRsLFSRs to nonto non--0 values0 values

Works well for pipelined architecturesWorks well for pipelined architecturesOtherwise, problems with feedbackOtherwise, problems with feedback

Requires test session schedulingRequires test session scheduling

CUT A

CUT B

CUT C

LFSR

MISR

BILBO 1

BILBO 2

TestSession

1

MISR

LFSR

TestSession

2

LFSR

MISR

Scan In

Scan Out

C. Stroud 10/06 BILBO 6

Test Session SchedulingTest Session SchedulingPractical application Practical application of BILBO typically of BILBO typically requires scheduling requires scheduling of multiple test of multiple test sessions based on sessions based on interconnection of interconnection of registers and registers and combinational logiccombinational logic

C. Stroud 10/06 BILBO 7

Register SelfRegister Self--AdjacencyAdjacencyCommon in Common in FSMsFSMs

Next state is function of current stateNext state is function of current stateBILBO must simultaneously function as TPG and ORABILBO must simultaneously function as TPG and ORA

Signatures act as test vectorsSignatures act as test vectorsLoose pseudoLoose pseudo--exhaustive nature of test vectorsexhaustive nature of test vectors

One solution One solution –– the Concurrent BILBO (CBILBO)the Concurrent BILBO (CBILBO)Doubles #Doubles #FFsFFs to create independent TPG and ORAto create independent TPG and ORA

Register R1

Register R2

CombinationalLogic

system operation

R1=TPG(LFSR)

R2=ORA(MISR)

CombinationalLogic

BILBO operation CBILBO operation

R1=TPG(LFSR)

R2=ORA

CombinationalLogic

R2=TPG

C. Stroud 10/06 BILBO 8

Concurrent BILBOConcurrent BILBOAdds additional register to allow TPG and MISR to operate Adds additional register to allow TPG and MISR to operate independently in cases of register selfindependently in cases of register self--adjacencyadjacency

C. Stroud 10/06 BILBO 9

BILBO SummaryBILBO SummaryNot practical but historically significant since it got BIST staNot practical but historically significant since it got BIST startedrted

Led to pseudoLed to pseudo--exhaustiveexhaustive selfself--test (PEST)test (PEST)Led to Circular BISTLed to Circular BIST

C. Stroud 10/06 BILBO 10

BILBO SummaryBILBO SummaryAdvantagesAdvantages

TestTest--perper--clock clock archtecturearchtecturePseudoPseudo--exhaustive testingexhaustive testing

No need for fault simulationNo need for fault simulationWorks well for pipelined applicationsWorks well for pipelined applications

DisadvantagesDisadvantagesDifficult to implement in practical applicationsDifficult to implement in practical applications

Multiple test sessions requireMultiple test sessions requireTest session scheduling can be difficultTest session scheduling can be difficult

Requires multiple primitive polynomials of varying degreesRequires multiple primitive polynomials of varying degreesRegister selfRegister self--adjacency difficult to overcomeadjacency difficult to overcome

Higher area overhead than other BIST approachesHigher area overhead than other BIST approachesMore than two gate delays in every critical pathMore than two gate delays in every critical path