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CE TEST REPORT

of

EN55022 / CISPR 22 / AS/NZS CISPR 22 Class B

EN55024 / CISPR 24 / IMMUNITY EN61000-3-2 / EN61000-3-3

Product : USB Flash Drive

Model(s): blitz; C250; C400; C450; C500; c800; click; colling; DNA; Fizz; fliptop; Glisten; m400; Mild; mini-elf; Poten; rango; So Hot; SoCool; TED; v-cut; well-j

Capacity: 1GB~64GB

Brand: EMTEC

Applicant: Dexxon Group Holding

Address: 79, avenue Louis Roche, 92238 Gennevilliers, France

Test Performed by: International Standards Laboratory <Lung-Tan LAB> *Site Registration No. BSMI: SL2-IN-E-0013; SL2-R1/R2-E-0013; TAF: 0997 FCC: TW1036; IC: IC4067B-1; NEMKO: ELA 113B VCCI: <Conduction 02>C-1440, T-1676, <Conduction 03>C-2845, T-1464, <Conduction 04>C-4778, T-2295, <Chamber 02>R-1435, G-17, <Chamber 12>R-2598, G-16, <Chamber 14>G-211, *Address: No. 120, Lane 180, Hsin Ho Rd., Lung-Tan Dist., Tao Yuan City 325, Taiwan *Tel: 886-3-407-1718; Fax: 886-3-407-1738

Report No.: ISL-16LE292CE-MB Issue Date : October 17, 2016

This report totally contains 60 pages including this cover page and contents page.

Test results given in this report apply only to the specific sample(s) tested and are traceable to national or international standard through calibration of the equipment and evaluating measurement uncertainty herein.

This test report shall not be reproduced except in full, without the written approval of International Standards Laboratory.

International Standards Laboratory Report Number: ISL-16LE292CE-MB

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Contents of Report

1. General ............................................................................................................................. 1 1.1 Certification of Accuracy of Test Data ......................................................................... 1 1.2 Test Standards............................................................................................................... 2 1.3 Description of EUT ...................................................................................................... 4 1.4 Description of Support Equipment ............................................................................... 5 1.5 Software for Controlling Support Unit ......................................................................... 6 1.6 I/O Cable Condition of EUT and Support Units .......................................................... 7

2. Power Main Port Conducted Emissions .......................................................................... 8 2.1 Test Setup and Procedure ............................................................................................. 8 2.2 Conduction Test Data: Configuration 1........................................................................ 9 2.3 Conduction Test Data: Configuration 2...................................................................... 11 2.4 Test Setup Photo ......................................................................................................... 13

3. Telecommunication Port Conducted Emissions ............................................................ 17 3.1 Test Setup and Procedure ........................................................................................... 17

4. Radiated Disturbance Emissions .................................................................................... 18 4.1 Test Setup and Procedure ........................................................................................... 18 4.2 Radiation Test Data: Configuration 1 ......................................................................... 20 4.3 Radiation Test Data: Configuration 2 ......................................................................... 24 4.4 Test Setup Photo ......................................................................................................... 28

5. Electrostatic discharge (ESD) immunity ....................................................................... 32 5.1 Test Specification ....................................................................................................... 32 5.2 Test Setup ................................................................................................................... 32 5.3 Test Result .................................................................................................................. 32 5.4 Test Point: Configuration 1 ........................................................................................ 33 5.5 Test Point: Configuration 2 ........................................................................................ 34 5.6 Test Setup Photo ......................................................................................................... 35

6. Radio-Frequency, Electromagnetic Field immunity ...................................................... 36 6.1 Test Specification ....................................................................................................... 36 6.2 Test Setup ................................................................................................................... 36 6.3 Test Result .................................................................................................................. 36 6.4 Test Setup Photo ......................................................................................................... 37

7. Electrical Fast transients/burst immunity ....................................................................... 38 7.1 Test Specification ....................................................................................................... 38 7.2 Test Setup ................................................................................................................... 39 7.3 Test Result .................................................................................................................. 39 7.4 Test Setup Photo ......................................................................................................... 40

8. Surge Immunity ............................................................................................................. 41 8.1 Test Specification ....................................................................................................... 41 8.2 Test Setup ................................................................................................................... 41 8.3 Test Result .................................................................................................................. 41 8.4 Test Setup Photo ......................................................................................................... 42

9. Immunity to Conductive Disturbance ............................................................................ 43 9.1 Test Specification ....................................................................................................... 43 9.2 Test Setup ................................................................................................................... 43 9.3 Test Result .................................................................................................................. 43 9.4 Test Setup Photo ......................................................................................................... 44


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Contents of Report

10. Power Frequency Magnetic Field immunity.................................................................. 45 10.1 Test Specification .................................................................................................... 45 10.2 Test Setup ................................................................................................................ 45 10.3 Test Result ............................................................................................................... 45 10.4 Test Setup Photo...................................................................................................... 46

11. Voltage Dips, Short Interruption and Voltage Variation immunity .............................. 47 11.1 Test Specification .................................................................................................... 47 11.2 Test Setup ................................................................................................................ 47 11.3 Test Result ............................................................................................................... 47 11.4 Test Setup Photo...................................................................................................... 48

12. Harmonics ...................................................................................................................... 49 12.1 Test Specification .................................................................................................... 49 12.2 Test Setup ................................................................................................................ 49 12.3 Test Result ............................................................................................................... 49

13. Voltage Fluctuations ...................................................................................................... 50 13.1 Test Specification .................................................................................................... 50 13.2 Test Setup ................................................................................................................ 50 13.3 Test Result ............................................................................................................... 50 13.4 Test Data ................................................................................................................. 51 13.5 Test Setup Photo...................................................................................................... 52

14. Appendix ........................................................................................................................ 53 14.1 Appendix A: Test Equipment .................................................................................. 53 14.2 Appendix B: Uncertainty of Measurement ............................................................. 56 14.3 Appendix C: Photographs of EUT Please refer to the File of ISL-16LE292P-MB 57


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1. General

1.1 Certification of Accuracy of Test Data

Standards: Please refer to 1.2

Equipment Tested: USB Flash Drive

Model: blitz; C250; C400; C450; C500; c800; click; colling; DNA; Fizz; fliptop; Glisten; m400; Mild; mini-elf; Poten; rango; So Hot; SoCool; TED; v-cut; well-j

Capacity: 1GB~64GB

Brand: EMTEC

Applicant: Dexxon Group Holding

Sample received Date: June 29, 2016

Final test Date: EMI: refer to the date of test data

EMS: July 5, 2016

Test Site: International Standards Laboratory

Chamber 12; Chamber 14; Conduction 04; Immunity 02

Test Distance: 10M; 3M (above1GHz) (EMI test)

Temperature: refer to each site test data

Humidity: refer to each site test data

Input power: Conduction input power: AC 230 V / 50 Hz

Radiation input power: AC 230 V / 50 Hz

Immunity input power: AC 230 V / 50 Hz

Test Result: PASS

Report Engineer: Elly Duan

Test Engineer:

______________________

Bear Perng

Approved By:

______________________

W.H. Chang / Director


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1.2 Test Standards

The tests which this report describes were conducted by an independent electromagnetic compatibility consultant, International Standards Laboratory in accordance with the following

EN 55022:2010+AC:2011, CISPR 22:2008 (modified): Class B: Limits and methods of measurement of Radio Interference characteristics of Information Technology Equipment. AS/NZS CISPR 22:2009 with Amdt 1 (2010) (CISPR 22 Ed. 6.0): Class B: Information technology equipment - Radio disturbance characteristics-Limits and methods of measurement

EN 55024:2010+A1:2015 and CISPR 24:2010+A1:2015: Information technology equipment- Immunity characteristics - Limits and methods of measurement.

Standard Description Results Criteria

EN 61000-4-2:2009 IEC 61000-4-2:2008

Electrostatic Discharge Pass B

EN 61000-4-3:2006+A1:2008 +A2:2010 IEC 61000-4-3:2006+A1:2007+A2:2010

Radio-Frequency, Electromagnetic Field

Pass A

EN 61000-4-4:2012 IEC 61000-4-4:2012

Electrical Fast Transient/Burst Pass B

EN 61000-4-5:2014 IEC 61000-4-5:2014

Surge Pass B

EN 61000-4-6:2014+AC:2015 IEC 61000-4-6:2013

Conductive Disturbance Pass A

EN 61000-4-8:2010 IEC 61000-4-8:2009

Power Frequency Magnetic Field Pass A

EN 61000-4-11:2004 IEC 61000-4-11:2004

Voltage Dips / Short Interruption and Voltage Variation

>95% in 0.5 period Pass B

30% in 25 period Pass C

>95% in 250 period Pass C

Standard Description Results

EN 61000-3-2:2014 IEC 61000-3-2:2014

Limits for harmonics current emissions Pass

EN 61000-3-3:2013 IEC 61000-3-3:2013

Limits for voltage fluctuations and flicker in low-voltage supply systems.

Pass


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1.2.1 Performance Criteria for Compliance: EN 55024

Performance criterion A During and after the test the EUT shall continue to operate as intended without operator intervention. No degradation of performance or loss of function is allowed below a minimum performance level specified by the manufacturer when the EUT is used as intended. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and by what the user may reasonably expect from the EUT if used as intended. Performance criterion B After the test, the EUT shall continue to operate as intended without operator intervention. No degradation of performance or loss of function is allowed, after the application of the phenomena below a performance level specified by the manufacturer, when the EUT is used as intended. The performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is allowed. However, no change of operating state or stored data is allowed to persist after the test. If the minimum performance level (or the permissible performance loss) is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and by what the user may reasonably expect from the EUT if used as intended. Performance criterion C During and after testing, a temporary loss of function is allowed, provided the function is self-recoverable, or can be restored by the operation of the controls or cycling of the power to the EUT by the user in accordance with the manufacturer’s instructions. Functions, and/or information stored in non-volatile memory, or protected by a battery backup, shall not be lost.


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1.3 Description of EUT

EUT Description USB Flash Drive Condition Pre-Production Model blitz; C250; C400; C450; C500; c800; click; colling; DNA; Fizz;

fliptop; Glisten; m400; Mild; mini-elf; Poten; rango; So Hot; SoCool; TED; v-cut; well-j

Serial Number N/A Power From Personal Computer USB2.0 Port Supply Control IC PS2251-68 PCBA Number P0VK568FS1400E1A Highest working frequency 480MHz The radiation test should be tested till 2GHz The memory capacities listed below is chosen by the applicant to be the representative configuration for testing in this report. Test Configuration for EMI: Configuration Memory Capacity Control IC Housing Test Mode Explanation

1 64GB PS2251-68

Metal Shown in the EUT Photo-1~22 Plastic Shown in the EUT Photo-3~4

Test configurations for EMS: (configuration 2 test ESD and RS only) Configuration Memory Capacity Control IC Housing Test Mode Explanation

1 64GB PS2251-68 Metal Shown in the EUT Photo-1~22 64GB PS2251-68 Plastic Shown in the EUT Photo-3~4

Model Difference:

Configuration Housing Memory Capacity Market blitz; C250; C400; C450; C500; c800; click; colling; DNA; Fizz;

fliptop; Glisten; m400; Mild; mini-elf; Poten; rango; So Hot;

SoCool; TED; v-cut; well-j

Metal

1GB~64GB Different customer

Plastic

EMI Noise Source:

Refer to the photo Control IC Point EUT-7 PS2251-68 U1

EMI Solution: N/A


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1.4 Description of Support Equipment For EMI Support unit: 1~6 For EMS Support unit 1~5、7

No Unit Model /

Serial No. Brand Power Cord FCC ID

1 Personal Computer DX7400 S/N: N/A

HP Non-shielded FCC DOC

2 PS/2 Keyboard Y-S0002 S/N: N/A

Logitch N/A FCC DOC

3 PS/2 Mouse M-SBM96B S/N: NA Logitch N/A FCC DOC

4 HP Printer C930

S/N: N/A HP Non-shielded FCC DOC

5 Aceex Modem DM1414 S/N: N/A

Aceex Non-shielded FCC DOC

6 27” LCD Monitor B273HU S/N: NA acer Non-shielded FCC DOC

7 24” LCD Monitor U2410F

S/N: N/A DELL Non-shielded FCC DOC


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1.5 Software for Controlling Support Unit Test programs exercising various part of EUT were used. The programs were executed as follows: For EMI & EMS test configuration: 1. PC running Winthrax to read and write the EUT. 2. Send signal to the Printer through PC Parallel Port. 3. Send signal to the Modem through PC Serial Port. 4. Send H pattern to the LCD Monitor through PC D-SUB Port. 5. Repeat the above steps.

Filename Issued Date EUT Winthrax 06/04/2005

Printer IntelEMC.exe 04/11/2007 Modem IntelEMC.exe 04/11/2007 Monitor IntelEMC.exe 04/11/2007


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1.6 I/O Cable Condition of EUT and Support Units

Description Path Cable Length Cable Type

AC Power Cable 110V (~240V) to PC SPS 1.8m Non-shielded

PS/2 Keyboard Data Cable

PS/2 Keyboard to PC PS/2 Keyboard Port

1.8m Shielded

PS/2Mouse Data Cable

PS/2Mouse to PC PS/2 Mouse Port 1.8m Shielded

Printer Data Cable Printer to PC Parallel Port 1.8m Shielded

Modem Data Cable Modem to PC Serial Port 1.8m Shielded

Monitor Data CableMonitor D-SUB Port to PC D-SUB

Port 1.8m

Shielded (with core)


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2. Power Main Port Conducted Emissions

2.1 Test Setup and Procedure

2.1.1 Test Setup

2.1.2 Test Procedure

The measurements are performed in a 3.5m x 3.4m x 2.5m shielded room, which referred as Conduction 01 test site, or a 3m x 3m x 2.3m test site, which referred as Conduction 02 test site. The EUT was placed on non-conduction 1.0m x 1.5m table, which is 0.8 meters above an earth-grounded.

Power to the EUT was provided through the LISN which has the Impedance (50ohm/50uH) vs. Frequency Characteristic in accordance with the standard. Power to the LISNs were filtered to eliminate ambient signal interference and these filters were bonded to the ground plane. Peripheral equipment required to provide a functional system (support equipment) for EUT testing was powered from the second LISN through a ganged, metal power outlet box which is bonded to the ground plane at the LISN.

The interconnecting cables were arranged and moved to get the maximum measurement. Both the line of power cord, hot and neutral, were measured. All of the interface cables were manipulated according to EN 55022 requirements.

The highest emissions were analyzed in details by operating the spectrum analyzer in fixed tuned mode to determine the nature of the emissions and to provide information which could be useful in reducing their amplitude.

2.1.3 EMI Receiver/Spectrum Analyzer Configuration (for the frequencies tested) Frequency Range: 150KHz--30MHzDetector Function: Quasi-Peak / Average ModeResolution Bandwidth: 9KHz


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2.2 Conduction Test Data: Configuration 1

Table 2.2.1 Power Line Conducted Emissions (Line)

Note: Margin = QP/AVG Emission - Limit QP/AVG Emission = QP_R/AVG_R + Correct Factor Correct Factor = LISN Loss + Cable Loss A margin of -8dB means that the emission is 8dB below the limit The frequency spectrum graph is for final peak graph, and the attached table is for QP/AVG test result. If peak data can pass, it will be shown in “QP/AVG Correct” column, if not, QP/AVG data will instead.


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Table 2.2.2 Power Line Conducted Emissions (Neutral)



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2.3 Conduction Test Data: Configuration 2

Table 2.3.1 Power Line Conducted Emissions (Line)



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Table 2.3.2 Power Line Conducted Emissions (Neutral)



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2.4 Test Setup Photo Configuration 1 Front View


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Back View


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Configuration 2 Front View


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Back View


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3. Telecommunication Port Conducted Emissions


3.1.1 Test Setup


The measurements are performed in a 3.5m x 3.4m x 2.5m shielded room, which referred as Conduction 01 test site, or a 3m x 3m x 2.3m test site, which referred as Conduction 02 test site. The EUT was placed on non-conduction 1.0m x 1.5m table, which is 0.8 meters above an earth-grounded.

The EUT, any support equipment, and any interconnecting cables were arranged and moved to get the maximum measurement. All of the interface cables were manipulated according to EN 55022 requirements.

The port of the EUT was connected to the support equipment through the ISN and linked in normal condition.

AC input power for the EUT & the support equipment power outlets were obtained from the same filtered source that provided input power to the LISN.

The highest emissions were analyzed in details by operating the spectrum analyzer in fixed tuned mode to determine the nature of the emissions and to provide information could be useful in reducing their amplitude.

3.1.3 EMI Receiver/Spectrum Analyzer Configuration (for the frequencies tested) Frequency Range: 150KHz--30MHzDetector Function: Quasi-Peak / Average ModeResolution Bandwidth: 9KHz

**Remarks: It is not necessary to be tested on this item.


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4. Radiated Disturbance Emissions


4.1.1 Test Setup

The 3dB beam width of the horn antenna used for the test is as shown in the table below.

Frequency (GHz) E-plane H-plane (min) d= 3 m

w (m)

1 88° 147° 88° 5.79

2 68° 119° 68° 4.04

3 73° 92° 73° 4.44

4 70° 89° 70° 4.20

5 55° 60° 55° 3.12

6 63° 62° 62° 3.60


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The radiated emissions test will then be repeated on the open site or chamber to measure the amplitudes accurately and without the multiple reflections existing in the shielded room. The EUT and support equipment are set up on the turntable of one of 10 meter open field sites or 10 meter chamber. Desktop EUT are set up on a wooden stand 0.8 meter above the ground or floor-standing arrangement shall be placed on the horizontal ground reference plane. The test volume for a height of up to 30 cm may be obstructed by absorber placed on the ground plane.

For the initial measurements, the receiving antenna is varied from 1-4 meter height and is changed in the vertical plane from vertical to horizontal polarization at each frequency. The highest emissions between 30 MHz to 1000 MHz were analyzed in details by operating the spectrum analyzer and/or EMI receiver in quasi-peak mode to determine the precise amplitude of the emissions. The highest emissions between 1 GHz to 6 GHz were analyzed in details by operating the spectrum analyzer in peak and average mode to determine the precise amplitude of the emissions.

At the highest amplitudes observed, the EUT is rotated in the horizontal plane while changing the antenna polarization in the vertical plane to maximize the reading. The interconnecting cables were arranged and moved to get the maximum measurement. Once the maximum reading is obtained, the antenna elevation and polarization will be varied between specified limits to maximize the readings. All of the interface cables were manipulated according to EN 55022 requirements.

The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes. If the highest frequency of the internal sources of the EUT is less than 108 MHz, the measurement shall only be made up to 1 GHz. If the highest frequency of the internal sources of the EUT is between 108 MHz and 500 MHz, the measurement shall only be made up to 2 GHz. If the highest frequency of the internal sources of the EUT is between 500 MHz and 1 GHz, the measurement shall only be made up to 5 GHz. If the highest frequency of the internal sources of the EUT is above 1 GHz, the measurement shall be made up to 5 times the highest frequency or 6 GHz, whichever is less.

4.1.3 Spectrum Analyzer Configuration (for the frequencies tested)

Frequency Range: 30MHz--1000MHzDetector Function: Quasi-Peak ModeResolution Bandwidth: 120KHz Frequency Range: Above 1 GHz to 6 GHzDetector Function: Peak/Average ModeResolution Bandwidth: 1MHz


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4.2 Radiation Test Data: Configuration 1 Table 4.2.1 Radiated Emissions (Horizontal)

* Note: Margin = Emission – Limit Emission = Radiated Amplitude + Correct Factor Correct Factor = Antenna Correction Factor + Cable Loss A margin of -8dB means that the emission is 8dB below the limit BILOG Antenna Distance: 10 meters Below 1GHz test, if the peak measured value meets the QP limit, it is unnecessary to perform the QP measurement.


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* Note: Margin = Emission – Limit Emission = Radiated Amplitude + Correct Factor Correct Factor = Antenna Correction Factor + Cable Loss – Pre-Amplifier Gain A margin of -8dB means that the emission is 8dB below the limit Horn Antenna Distance: 3 meters Above 1GHz test, if the peak measured value meets the average limit, it is unnecessary to perform the average measurement.


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Table 4.2.2 Radiated Emissions (Vertical)



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4.3 Radiation Test Data: Configuration 2 Table 4.3.1 Radiated Emissions (Horizontal)



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Table 4.3.2 Radiated Emissions (Vertical)



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4.4 Test Setup Photo Configuration 1 Front View (30MHz~1GHz)

Back View (30MHz~1GHz)


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Front View (above 1GHz)

Back View (above 1GHz)


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Configuration 2 Front View (30MHz~1GHz)

Back View (30MHz~1GHz)


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Front View (above 1GHz)

Back View (above 1GHz)


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5. Electrostatic discharge (ESD) immunity

5.1 Test Specification

Port: Enclosure Basic Standard: EN 61000-4-2/ IEC 61000-4-2

(details referred to Sec 1.2) Test Level: Air +/- 2 kV, +/- 4 kV, +/- 8 kV

Contact +/- 4 kV Criteria: B Test Procedure refer to ISL QA -T4-E-S7 Temperature: 21 °C Humidity: 45%

Selected Test Point

Air: discharges were applied to slots, aperture or insulating surfaces. 10 single air discharges were applied to each selected points.

Contact: Total 200 discharges minimum were to the selected contact points.

Indirect Contact Points: 25 discharges were applied to center of one edge of VCP and each EUT side of HCP with 10 cm away from EUT.

5.2 Test Setup

EUT is 1m from the wall and other metallic structure. When Battery test mode is needed, a cable with one 470K resister at two rare ends is connected from metallic part of EUT and screwed to HCP.

5.3 Test Result

Performance of EUT complies with the given specification.

10cm

EUT

470K

For battery test mode VCP: 0.5m x 0.5m

HCP: 1.6m x 0.8m

Non-Metallic Table

0.5mm insulation

470K 470K

Ground reference Plane

80cm


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5.4 Test Point: Configuration 1 Red arrow lines indicate the contact points, and blue arrow lines indicate the air points.


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5.5 Test Point: Configuration 2 Red arrow lines indicate the contact points, and blue arrow lines indicate the air points.


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5.6 Test Setup Photo


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6. Radio-Frequency, Electromagnetic Field immunity



(details referred to Sec 1.2) Test Level: 3 V/m Modulation: AM 1KHz 80% Frequency range: 80 MHz~1 GHz Frequency Step: 1% of last step frequency Dwell time: 3s Polarization: Vertical and Horizontal EUT Azimuth Angle 0 90 180 270 Criteria: A Test Procedure refer to ISL QA -T4-E-S8 Temperature: 22°C Humidity: 58%

6.2 Test Setup The field sensor is placed at one calibration grid point to check the intensity of the established fields on both polarizations. EUT is adjusted to have each side of EUT face coincident with the calibration plane. A CCD camera and speakers are used to monitor the condition of EUT for the performance judgment.

6.3 Test Result



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7. Electrical Fast transients/burst immunity


Port: AC mains Basic Standard: EN 61000-4-4/ IEC 61000-4-4

(details referred to Sec 1.2) Test Level: AC Power Port: +/- 1 kV

Rise Time: 5ns Hold Time: 50ns Repetition Frequency: 5KHz Criteria: B Test Procedure refer to ISL QA -T4-E-S9 Temperature: 21°C Humidity: 60%

Test Procedure The EUT was setup on a nonconductive table 0.1 m above a reference ground plane. Test Points Polarity Result Comment

Line + N 60 sec - N 60 sec

Neutral + N 60 sec - N 60 sec

Ground + N 60 sec - N 60 sec

Line to + N 60 sec Neutral - N 60 sec Line to + N 60 sec Ground - N 60 sec

Neutral to + N 60 sec Ground - N 60 sec

Line to Neutral + N 60 sec to Ground - N 60 sec

Note: ’N’ means normal, the EUT function is correct during the test.


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7.2 Test Setup EUT is at least 50cm from the conductive structure.

7.3 Test Result



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8. Surge Immunity



(details referred to Sec 1.2) Test Level: Line to Line: +/- 0.5 kV, +/- 1 kV

Line to Earth: +/- 0.5 kV, +/- 1 kV, +/- 2kV Rise Time: 1.2us Hold Time: 50us Repetition Rate: 30 seconds Angle: 0 90 180 270Criteria: B Test Procedure: refer to ISL QA -T4-E-S10 Temperature: 22°C Humidity: 61%

8.2 Test Setup

8.3 Test Result


Test Generator

EUT

Signal To AC main Supply

CDN

80 cm

To the Peripherals

Non-Metallic / Non-Conducted Table

Metal Full Soldered Ground Plane


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9. Immunity to Conductive Disturbance



(details referred to Sec 1.2) Test Level: 3 V Modulation: AM 1KHz 80% Frequency range: 0.15 MHz - 80MHz Frequency Step: 1% of last Frequency Dwell time: 3s Criteria: A CDN Type: CDN M2+M3, CDN T2 Test Procedure refer to ISL QA -T4-E-S11 Temperature: 21°C Humidity: 58%

9.2 Test Setup

9.3 Test Result


0.1 m support

EUT

CDN CDN To AC main

50

To AE

Test Generator

>3cm

10~30cm 6dB

Att.

Reference Ground Plane


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10. Power Frequency Magnetic Field immunity



(details referred to Sec 1.2) Test Level: 1A/m Polarization: X, Y, Z Criteria: A Test Procedure refer to ISL QA -T4-E-S12 Temperature: 22°C Humidity: 59%

10.2 Test Setup

10.3 Test Result


Induction Coil (1m x 1m)

AE Insulation

Test Generator

EUT

80cm

To AC main

Non-Metallic Table

To AC main


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11. Voltage Dips, Short Interruption and Voltage Variation immunity



(details referred to Sec 1.2) Test Level: Criteria:

>95% in 0.5 period B

Test Level: Criteria:

30% in 25 period C

Test Level: Criteria:

>95% in 250 period C

Phase: 0; 180 Test intervals: 3 times with 10s each Test Procedure refer to ISL QA -T4-E-S13 Temperature: 22°C Humidity: 58%

11.2 Test Setup

11.3 Test Result


Test Generator

EUT

80cm

To AE

Ground Reference Plane

Non-Metallic Table

To AC main

EUT AC supply


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12. Harmonics


Port: AC mains Active Input Power: <75W Basic Standard: EN61000-3-2/IEC 61000-3-2

(details referred to Sec 1.2) Test Duration: 2.5min Class: D Test Procedure refer to ISL QA -T4-E-S14 Temperature: 21°C Humidity: 60%

Test Procedure The EUT is supplied in series with shunts or current transformers from a source having the same nominal voltage and frequency as the rated supply voltage and frequency of the EUT. The EUT is configured to its rated current with additional resistive load when the testing is performed. Equipment having more than one rated voltage shall be tested at the rated voltage producing the highest harmonics as compared with the limits.

12.2 Test Setup

12.3 Test Result

Active input power under 75W, no limit apply, declare compliance


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13. Voltage Fluctuations


Port: AC mains Basic Standard: EN61000-3-3/IEC61000-3-3

(details referred to Sec 1.2) Test Procedure refer to ISL QA -T4-E-S14 Observation period: For Pst 10min

For Plt 2 hours Temperature: 21°C Humidity: 60%

Test Procedure The EUT is supplied in series with reference impedance from a power source with the voltage and frequency as the nominal supply voltage and frequency of the EUT.

13.2 Test Setup

13.3 Test Result



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13.4 Test Data

Flicker Test Summary per EN/IEC61000-3-3 Ed. 3.0 (2013) (Run time)

Test duration (min): 120 Data file name: CTSMXL_F-001214.cts_data Test Result: Pass Status: Test Completed Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

10:3

4:1

9

10:4

4:2

8

10:5

4:3

7

11:0

4:4

6

11:1

4:5

5

11:2

5:0

4

11:3

5:1

3

11:4

5:2

2

11:5

5:3

1

12:0

5:4

0

12:1

5:4

9

12:2

5:5

8

Plt and limit line

0.2

0.3

0.4

0.5

0.6

Plt

12:2

5:5

8

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.12 Highest dt (%): 0.00 Test limit (%): N/A N/A T-max (mS): 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): -0.08 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.201 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.183 Test limit: 0.650 Pass


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14. Appendix 14.1 Appendix A: Test Equipment

14.1.1 Test Equipment List Location Con04

Equipment Name Brand Model S/N Last Cal. Date

Next Cal. Date

Conduction 04 LISN 18 ROHDE & SCHWARZ

ENV216 101424 02/05/2016 02/05/2017

Conduction 04 LISN 19 ROHDE & SCHWARZ

ENV216 101425 03/12/2016 03/12/2017

Conduction 04 Conduction 04-3 Cable

WOKEN CFD 300-NL conduction 04-3

07/28/2015 07/28/2016

Conduction04 EMI Receiver 16 ROHDE & SCHWARZ

ESCI 101221 10/07/2015 10/07/2016

Location Chmb12


Next Cal. Date

Radiation (Chamber12)

BILOG Antenna 18 Schwarzbeck Schwarzbeck VULB 9168+EMCI-N-6-05

646 01/11/2016 01/11/2017


Preamplifier 26 EMCI EMC9135 980297 01/21/2016 01/21/2017


Coaxial Cable Chmb 12-10M-01

PEWC CFD400-NL Chmb 12-10M-01

07/17/2015 07/17/2016


EMI Receiver 10 ROHDE & SCHWARZ

ESCI 100567 07/30/2015 07/30/2016

Location Chmb14


Next Cal. Date

Rad. Above 1GHz

Spectrum Analyzer 24 (1G~26.5GHz)

Agilent N9010A MY49060537 07/30/2015 07/30/2016

Rad. Above 1GHz

Horn Antenna 06 (1G~18G)

ETS 3117 00066665 11/30/2015 11/30/2016

Rad. Above 1GHz

Preamplifier 13 (1G-18G)

MITEQ JS44-00101800-25-10P-44

1329256 07/28/2015 07/28/2016

Rad. Above 1GHz

Microwave Cable 25 (1G-18G)

EMC Instruments

EMC104-NM-SM-6000

141111 11/25/2015 11/25/2016

Rad. Above 1GHz

Microwave Cable 26 (1G-18G)

EMC Instruments

EMC104-NM-SM-800

141112 11/25/2015 11/25/2016


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Location Equipment Name Brand Model S/N Last Cal.

Date Next Cal. Date

EN61K-4-2 ESD Gun 05 EM TEST Dito V0640101838 06/12/2016 06/12/2017 EN61K-4-3 Broadband

Log-Periodic Antenna

AR AT1080 310698 N/A N/A

EN61K-4-3 Horn Antenna RF-01 AR ATS700M11G

0335864 N/A N/A

EN61K-4-3 Amplifier 80Mz~1GHz 250W

AR 250W1000A 312494 N/A N/A

EN61K-4-3 Amplifier 800MHz~4.2GHz 50W

AR 50S1G4M1 312762 N/A N/A

EN61K-4-3 Amplifier 4.0~8.0GHz 35W

AR 35S4G8AM1 0335752 N/A N/A

EN61K-4-3 Broadband Coupler 80M~1GHz

Amplifier Research

DC6180A 0341805 N/A N/A

EN61K-4-3 Coaxial Cable INSULATED NPS-4806-2360-NP3

108599.003.01.03

N/A N/A

EN61K-4-3 Broadband Coupler 0.8G~4.26GHz

AR DC7144A 0335226 N/A N/A

EN61K-4-3 Broadband Coupler 4G~8GHz

AR DC7350A 0335817 N/A N/A

EN61K-4-3 Signal Generator 07 ROHDE& SCHWARZ

SMB100A 107780 09/09/2015 09/09/2016

EN61K-4-4/4-5

EFT and SURGE Test System

EM TEST UCS-500 M6B

V0728102674 01/21/2016 01/21/2017

EN61K-4-4 Capacitive Coupling Clamp

EM TEST HFK 0907-106 01/21/2015 01/21/2017

EN61K-4-6 CDN M2+M3 04 Frankonia CDN M2+M3 A2210235/2013 08/19/2015 08/19/2016 EN61K-4-6 CDN T2 04 FCC Inc. FCC-801-T2 02067 08/19/2015 08/19/2016 EN61K-4-6 CDN T4 04 FCC Inc. FCC-801-T4 02069 09/14/2015 09/14/2016 EN61K-4-6 CDN T8-10_1 Teseq GmbH CDN T8 10 41242 02/23/2016 02/23/2017 EN61K-4-6 Coaxial Cable 4-6

02-1 4-6 02-1 N/A N/A

EN61K-4-6 Conducted Immunity Test System 02

Frankonia CIT-10-75-DC

126B1301/2014 02/23/2016 02/23/2017

EN61K-4-6 EM-Clamp Schaffner KEMZ-801 19215 N/A N/A EN61K-4-8 Magnetic Field

Immunity Loop FCC F-1000-4-8-L-

1M 01037 05/17/2016 05/17/2017

EN61K-4-8 Magnetic Field Test Generator

FCC F-1000-4-8-G-125A

01038 05/17/2016 05/17/2017

EN61K-4-11 Voltage Dip and UP Simulator

NoiseKen VDS-2002 VDS0640162 10/15/2015 10/15/2016

EN61K-3-2/3, EN61K-3-11-12

(Harmonic/Flicker) MX Series CTSH Compliance Test System

California Instruments

MX60T04GH10400

72793 06/02/2016 06/02/2017

PS: N/A => The equipment does not need calibration.


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14.1.2 Software for Controlling Spectrum/Receiver and Calculating Test Data

Test Item Filename Version

EN61000-3-2 California Instruments CTSMXL 2 <2.9.0 >

EN61000-3-3 California Instruments CTSMXL 2 <2.9.0 >

EN61000-4-2 N/A 2.0

EN61000-4-3 i2 4.130102k

EN61000-4-4 EMC TEST 4.10

EN61000-4-5 EMC Partner 1.69

EN61000-4-6 FRANKONIA CD-LAB V5.221

EN61000-4-8 N/A

EN61000-4-11 NOISE KEN 2.0

Site Filename Version Issue Date

Conduction/Radiation EZ EMC ISL-03A2 3/6/2013


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14.2 Appendix B: Uncertainty of Measurement The measurement uncertainty refers to CISPR 16-4-2:2011. The coverage factor k = 2 yields approximately a 95 % level of confidence. <Conduction 04> AMN: ±2.88dB <Chamber 12 (10M)> Horizontal 30MHz~200MHz: ±3.93dB 200MHz~1000MHz: ±4.09dB Vertical 30MHz~200MHz: ±4.58dB 200MHz~1000MHz: ±3.99dB <Chamber 14 (3M)> 1GHz~6GHz: ±4.94dB <Immunity 02>

Test item Uncertainty Test item Uncertainty EN 61000-4-2 (ESD) EN 61000-4-6 (CS)

Rise time tr ≦ 15% CDN ± 1.36dB Peak current Ip ≦ 6.3% EM Clamp ± 3.19dB current at 30 ns ≦ 6.3% EN 61000-4-8 (Magnetic) ± 5.59% current at 60 ns ≦ 6.3% EN 61000-4-11 (Dips)

EN 61000-4-3 (RS) ± 2.19dB Time ± 2.80% EN 61000-4-4 (EFT) Voltage ± 0.04% voltage rise time (tr) ± 6.2% EN 61000-4-34 (Dips) peak voltage value (VP) ± 8.6% Time ± 2.80% voltage pulse width (tw) ± 5.9% Voltage ± 1.70% EN 61000-4-5 (Surge)

Time ± 3.9% Voltage ± 3.9% Current ± 2.7%

Test item Uncertainty Test item Uncertainty

EN 61000-3-2 (Harmonics)

± 3.98 % EN 61000-3-12 (Harmonics)

Voltage ±0.10% Current ±0.15%

EN 61000-3-3 (Fluctuations and Flicker)

± 3.98 % EN 61000-3-11 (Fluctuations and Flicker)

Voltage ±0.10% Current ±0.15%


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14.3 Appendix C: Photographs of EUT Please refer to the File of ISL-16LE292P-MB

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