celebrations4 metrologist | july 2015 vol. 8 no. 3 newmembers mchale & associates 4700 coster...

NCSLI WORLDWIDE NEWS

Publisher NCSL InternationalEditor Linda Stone, NCSL InternationalContributing Editors Prof. Horst Czichos, BHT Berlin, University of Applied SciencesMark Kuster, Pantex MetrologyEditorial Committee Craig Gulka, NCSLI Executive DirectorTim Osborne, Trescal How to Reach Us:NCSL International2995 Wilderness Place, Suite 107Boulder, CO 80301-5404 USAPhone 303-440-3339 • Fax 303-440-3384

© Copyright 2015, NCSL International. Permission to quote excerpts or to reprint any articles should be obtained from NCSL International. NCSLI, for its part, hereby grants permission to quote excerpts and reprint articles from this magazine with acknowledgment of the source. Individual teachers, students, researchers, and libraries in nonprofit institutions and acting for them are permitted to make hard copies of articles for teaching or research purposes. Copying of articles for sale by document delivery services or suppliers, or beyond the free copying allowed above is not permitted. Reproduction in a reprint collection, or for advertising or promotional purposes, or republication in any form requires permission from NCSL International.

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Publication ISSN #1940-2988Vol. 8, No. 3, July 2015

Metrologist is published byNCSL International and distributedto its member organizations.

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contact Linda Stone at [email protected].

Vol. 8 No. 2 • June 2013

IN THIS ISSUE:The Circle Game: The use of theLunar Distance and Related Measurementsfor Celestial and Satellite-Based Navigationand Timekeeping

Two-Color One-Way FrequencyTransfer in a Metropolitan OpticalFiber Data Network

Experimental and Simulation Study fora Time Transfer Service via aCommercial Geostationary Satellite

A Survey of Time Transfer viaa Bidirectional Fiber Link for PreciseCalibration Services

measure®

YOUR REACH

www.ncsli.org July 2015 | Metrologist 1

34

inthisissue

World Metrology DayCelebrations

12

NCSLI WORLDWIDE NEWS JUL

2015

specialfeaturescontents

Steeped in STEMWilliam Hinton16Joe D. Simmons ScholarshipAward Winner22Eurolab 25th AnniversaryRoger Burton26

World Metrology DayCelebrations12

Technical PaperVirtual Instrumentation - New ChallengesJorge Martins and Paul Packebush

38

Toward a MeasurementInformation InfrastructureSmart CertificatesMark Kuster

34

From the President 2From the Boardroom 3

NCSLI New Members 42015 Workshop & Symposium 6

2016 Technical Exchange 372016 Call For Papers 46

New Products and Services 48Regional News 51

Trescal Conference Lab Tour 60

International NewsNRC Canada 24

Letter From Europe 30 CIM 2015 Conference 25

CPEM 2016 Conference 29 Test & Measurement Conference 71

Advertisers Index 72

16

22

38

26

2 Metrologist | July 2015 Vol. 8 No. 3

regionalnews

Greetings! I hope you are enjoying the start of summer and

are making your plans to attend the 2015 NCSLI Workshop &

Symposium that will be held at the Gaylord Texan Resort and

Convention Center in Grapevine, Texas from July 19-23. The

conference theme is “Measurement Science and the Quality of

Life.” You will be seeing some exciting changes this year, so I

hope to see you there.

In April, I had the privilege to represent NCSLI and attend

Eurolab’s 25th Anniversary celebration in Odense, Denmark. It

was a great opportunity to interact with our European friends

and learn more about Eurolab. You can read more details about

the event in my review article included in this issue.

At our lab, we recently celebrated World Metrology Day with a

BBQ lunch for our employees. World Metrology Day is an annual

celebration of the signature by representatives of 17 nations

of the Meter Convention on 20 May 1875. The Convention

set the framework for global collaboration in the science of

measurement and in its industrial, commercial and societal

applications. The original aim of the Meter Convention - the

world-wide uniformity of measurement - remains as important

today as it was in 1875. More information can be found at

http://www.worldmetrologyday.org/. Our celebration included

Roger Burton | NCSLI President

fromthepresident

a contest with two questions for the attendees: 1) What year

was the Meter Convention signed? and 2), What are the seven

base units of the SI system? How well would you have done

answering those two questions? Check out some of the other

World Metrology Day celebrations in this issue.

I would like to congratulate Lindsey Bass, the 2015 Joe D.

Simmons Scholarship award winner. Lindsey is a junior at

Virginia Tech majoring in Mechanical Engineering and Music

Performance. Read more about this highly motivated young lady

on page 22.

We are making plans now for the 2016 NCSLI Technical

Exchange, which will be held at the Omni Jacksonville Hotel, in

Jacksonville, Florida on February 1-2. You can pencil this in on

your calendar now, and more details will be forthcoming as we

get closer to the date.

I would like to take this opportunity to thank the conference

committee and all the volunteers involved in making our

annual conference a great success. I look forward to seeing

everyone in Grapevine!

[email protected]


The April 2015 meeting of the NCSLI

Board of Directors was held April 26-

29 in Overland Park, Kansas. Nineteen

board members and three guests

were in attendance to kick off the

discussions. Key topics of discussion

included the 2014 financial numbers,

the 2015 proposed budget, the 2015

Slate of Candidates, and the ISO/IEC

17025 revision.

The NCSLI Treasurer, Ingrid Ulrich, gave a presentation to the

board on the financial health of the organization based on the

completion of the 2014 financial audit. Ingrid also reported that

work continues with the NCSLI team to make improvements in

the financial monitoring tools. Following these discussions, the

2015 proposed budget was presented for voting and approved.

In other discussions, the board approved the 2015 Slate of

Candidates. The 2015 Slate includes the following: Dr. James

Olthoff, as the 2016 Executive Vice President; Paul Packebush,

Bob Sawyer, and Tim Osborne, as Vice Presidents in various

roles. In accordance with the NCSLI Bylaws, notification of

the membership regarding the candidates on the 2015 ballot is

required by July 1, 2015. Any additional nominations for the

ballot must be submitted prior to August 1, 2015. The distribution

of the election ballot is required by August 15, 2015. For more

information on the balloting and election procedure, a copy of

the NCSLI Bylaws is available on the NCSLI website.

Also, during these meetings, the board held a special session

on training and certification. The discussions focused on

potential avenues to promote continuous improvement and

value in the training provided by NCSLI. Key points from the

session were captured and are now being incorporated into a

business proposal. Further review of this topic and discussion of

the business proposal are expected at the October, 2015 meeting.

The Vice President of Standards and Practices, Jeff Gust,

presented an update on the activities of the ISO/CASCO Working

Group 44 on the revision of ISO/IEC 17025. The first meeting

of the working group was held in early February with the next

meeting scheduled in June. It was reported that a draft of the

document is expected later this year.

The next board meeting will take place at our annual conference

in Grapevine, Texas in July. The October meeting will be in Lake

Tahoe, Nevada. The board meetings are open to everyone and we

would welcome your attendance and participation.

[email protected]

fromtheboardroom

The Boardroom

NCSLI Board of Directors.

Dana Leaman | NCSLI Secretary


newmembers

McHale & Associates4700 Coster Road Knoxville, TN 37912 Contact: Dave Price, 865-588-2654, [email protected]

National Calibration, Incorporated3737 E. Broadway Road Phoenix, AZ 85040 Contact: Robert “Buck” Halloran, 602-437-0114, [email protected]

National Calibration Inc. (NCI) is an A2LA accredited full service laboratory serving a variety of clients throughout the United States. NCI began as a department within one of its sister companies in 1955 and became a separate entity in 1985. NCI has been meeting and satisfying the needs of a diverse set of clients ranging from aviation to construction, from government to industry. NCI’s professional technicians’ service and repair a wide variety of instrumentation and measuring devices in strict compliance of industry standards and requirements.

Providing in lab and on-site service, NCI is a true one stop shop for all of your calibration needs. Our state of the art, on-line tracking system, “Cal Hub” allows clients instant access to their reports and inventory for scheduling, organizing or printing a missing report. With locations in 4 states across the west, NCI has the personnel and capabilities to customize your calibration program to meet or exceed expectations. Call us toll free at 1-800-NCI-4500 for more information or a quote and see how NCI can serve you and help make your calibration program a winner.

Primo Instrument, Inc.4407 Charleroi Montreal, Quebec, H1H 1TC, Canada Contact: Christian Lefroit, 514-329-3242, [email protected]

Sandia National LaboratoriesP.O. Box 5800 MS 0665 Albuquerque, NM 87185 Contact: Meaghan Carpenter, 505-845-0883, [email protected]

Setra Systems159 Swanson Rd Boxborough, MA 01719 Contact: Tom Lish, 978-263-1400, [email protected]

Accurate Solutions Atlanta6303 Woodlore Drive N.W. Acworth, GA 30101 Contacts: Robert Hamilton, 770-428-9400 [email protected] Galen Evans, 770-355-0407 [email protected]

Allometrics, Incorporated2500 Bayport Blvd Seabrook, TX 77586-2405 Contact: Jayson Dirks, 281-474-3329, [email protected]

Allometrics specializes in laboratory product sales and instrument services. Incorporated since 1978, our growth and success as a distributor and service provider has enabled us to operate from 2 branches - Seabrook, TX and Baton Rouge, LA. These geographical locations enable us to best serve the Gulf Coast markets where we excel; Chemical, Petrochemical, Refining, Universities, Environ-mental, Bio-medical, Medical, Metallurgical, Aerospace, Food Pro-cessing, Pharmaceutical.

Today, our sales consist primarily of general laboratory products and instrumentation. As a well-known accredited service provider, we manage a broad base of experience in the disciplines of testing, cer-tification and repair where we have the highest levels of technical competency; Laboratory Balances, Weight Measurement, HEPA Fil-tered Systems, Chemical Fume Hoods, Temperature Measurement, Gas Chromatography, Microscopy, Coulometry, Conductivity, pH.

Enercon Services Canada, Inc.325 Rue Joliette 912, Longueuil, Quebec, J4H 2G6, Canada Contact: Jean-Philippe Bedard, [email protected]

IndySoft Corporation212 Adley Way Greenville, SC 29607 Contact: Charles Thompson, (864) 627-8858 [email protected]

At IndySoft we believe the purchase of a calibration or tooling asset management system is one of the most important decisions you can make in relation to your quality program needs. We un-derstand that these are your operations and the right software package is going to be the one that can compliment and aug-ment your process, not unflinchingly dictate how you have to run your business. At IndySoft we take the time to understand your business needs and challenges, then pull from our extensive experience to offer just the right mix of products and services to meet your long-term goals. We look forward to hearing from you, learning about your business, and showing you all the great things you can accomplish by working with us.

Welcome

mailto:[email protected]











newmembers

SIMCO Electronics65 E. Wadsworth Park Drive, Ste. 101 Draper, UT 84020 Contact: Curtis Keller, 801-576-0790, [email protected]

Space Exploration Technologies1 Rocket Road Hawthorne, CA 90250 Contact: Rodney Weissenburger, [email protected]

SpaceX is a US-based advanced technology company founded by residing CEO and CTO, Elon Musk. Founded in 2002, SpaceX builds rockets and spacecraft from the ground up, including cut-ting edge electronics, software, vehicle structures, and engine systems. The Falcon Launch Vehicle and Dragon Spacecraft pro-grams are some of the most ambitious engineering systems in the world, designed to support our ultimate goals of aviation-like spaceflight capability and making humanity a multi-planet spe-cies. Our team is made up of more than 3,000 SpaceXers located across our Hawthorne, California headquarters; and other facili-ties in Florida, Texas, and Washington, DC.

Transportation Technology Center, IncorporatedP.O. Box 11130 Pueblo, CO 81001 Contact: Steve Renfrow, 719-585-1846 [email protected]

Transportation Technology Center, Inc. (TTCI), a wholly owned subsidiary of the Association of American Railroads. TTCI is a world-class transportation research and testing organization, providing emerging technology solutions for the railway indus-try throughout North America and the world. Headquartered in Pueblo, Colorado TTCI manages extensive track facilities, state-of-the-art laboratory facilities, and a highly talented engineering and support staff.

GEO Calibration2190 Smithtown AvenueRonkonkoma, NY 11779

Tel: (631) 471 - 6157Fax: (631) 471 - 6158Email: [email protected]

www.GeoCalibration.com Distributors Welcome

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Please visit www.GeoCalibration.com for:

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GAYLORD TEXAN RESORT AND CONVENTION CENTER | GRAPEVINE, TEXAS | JULY 19 – 23, 2015 TUTORIAL PROGRAM: JULY 19 – 20 | EXHIBITION HALL: JULY 20 – 23 | TECHNICAL PROGRAM: JULY 21 – 23

NCSLI 2015 Workshop & SymposiumMeasurement Science and the Quality of Life

MEASUREMENT SCIENCE

AND THE

OF

LIFE

GAYLORD TEXAN RESORT AND CONVENTION CENTERGRAPEVINE, TEXAS | JULY 19 – 23, 2015

TUTORIAL PROGRAM: JULY 19 – 20 | EXHIBITION HALL: JULY 20 – 23 | TECHNICAL PROGRAM: JULY 21 – 23 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Workshop & Symposium2015

MEASUREMENT SCIENCE AND THE QUALITY OF LIFE

Have you considered what impact Measurement Science has had on the quality of your life? If you take time to consider it,

you can appreciate what a large impact it has.

Conference SponsorsTHANK YOU TO OUR

Gold Sponsors

Media Sponsor

Silver Sponsors


Keynote SpeakersTUESDAY, JULY 21 | 8:30 AM - 10:30 AM | GRAPEVINE AB

THURSDAY, JULY 23 | 8:30 AM - 10:30 AM | GRAPEVINE AB

Dr. Chris Greer, NISTCommunities ranging from small towns to megacities are looking to the power of emerging Internet of technologies to better manage their resources and improve everything from health and safety to transportation and energy. They can meet their smart city needs with cyber-physical systems — interconnected hybrids of engineered and IT systems — if key engineering, security, and measurement challenges can be addressed. This presentation will focus on the example of smart grid as a foundation for smart city solutions, including measurement science principles for smart

city systems design and analysis, standards and guidelines for interoperability, and test beds for science-based design.

Dr. Chris Greer is NIST Senior Executive for Cyber Physical Systems and National Coordinator for Smart Grid Interoperability. In these positions, he is responsible for strategic planning, program implementation and coordination with partners across the public and private sectors. Prior to joining NIST, Dr. Greer served as Assistant Director for Information Technology R&D in the White House Office of Science and Technology Policy and Cybersecurity Liaison to the National Security Staff.

Steve Russell, Duke EnergyThe electric utility industry has largely remained unchanged for over a century. However, electric utilities have recently experienced a renaissance in the area commonly referred to as “Smart Grid.” Advances in technology have affected utilities in two ways. For the customer, technology is driving the need for highly reliable electric service as well as flexibility associated with electric sources, pricing, and services. For the utility, technology is enabling the performance to the electric grid to be driven to unprecedented levels of efficiency and reliability. Key catalysts and enablers for this

dynamic change are advances in measurement science and measurement technology. This presentation will discuss the past and present impacts of measurement science on the revitalization of the electric grid, and it will discuss emerging needs and challenges that measurement science is poised to address in the future.

Steve Russell is the DMS/DA Project Director for Duke Energy Carolinas and the Alstom DMS product within Grid Modernization. During his 29 year career with Duke Energy, Steve has worked in a wide variety of leadership roles including engineering, field operations and construction, finance, forecasting, scheduling, outage management and dispatching operations, metering, and corporate compliance and ethics. Steve also served as assistant to two of Duke Power’s presidents where he managed the office of the president and worked on a wide variety of special projects both internal and external to Duke Energy.

Amy Young, Filmmaker“Relying on the kindness of strangers”A metrologist’s work is unknown to most people. And the impact of metrology is hidden behind systems that work invisibly—as intended. So how can the general public understand the effect of measurement on the quality of life? This presentation shows some filmmaking strategies to engage the general public in mass measurement and in the work of metrologists, engineers, and

physicists. Video clips and other examples are taken from prime-time television and from the forthcoming documentary film, The State of the Unit. Intended for a general audience, the film presents the redefinition of the kilogram through location filming and interviews with people who weigh molecules, gunpowder, corn harvests, and kilograms.

Screenwriter Amy Young is a filmmaker with strong experience in communicating science to a general audience. For six seasons, she was a technical script consultant on the CBS show NUMB3RS, which won a Public Service Award from the National Science Board. For her current documentary project, The State of the Unit: The Kilogram, Amy has filmed and interviewed people weighing everything from atoms to semi-trucks, gunpowder and fields of corn.

Amy graduated from CalArts with an MFA in Film Directing. She currently works for two universities as a videographer and as program staff for a computational physics research group.


Exhibit HallMONDAY, JULY 20 - THURSDAY, JULY 23 | LONGHORN EXHIBIT HALL EF

Metrology MixersMeet and mingle with fellow

conference attendees at these fun networking events.

TUESDAY, JULY 21 | 4:00 PM - 5:30 PMDrinks and Appetizers

Salmon sponsored by Fluke Calibration

WEDNESDAY, JULY 22 | 4:00 PM - 5:30 PMIce Cream Social

MONDAY, JULY 20, 20156:00 PM – 8:00 PM Exhibitor Welcome Reception

TUESDAY, JULY 21, 20157:30 AM - 8:30 AM Continental Buffet Breakfast7:30 AM - 5:30 PM Exhibit Viewing 11:30 AM - 1:00 PM Lunch Buffet in Exhibit Hall11:30 AM - 12:30 PM Poster Presentations4:00 PM - 5:30 PM Metrology Mixer Join us for drinks, appetizers and networking! Salmon sponsored by Fluke Calibration

WEDNESDAY, JULY 22, 20157:30 AM - 8:30 AM Continental Breakfast7:30 AM - 5:30 PM Exhibit Viewing 11:30 AM - 1:00 PM Lunch Buffet in Exhibit Hall11:30 AM - 12:30 PM Poster Presentations4:00 PM - 5:30 PM Metrology Mixer Join us for networking and the Ice Cream Social!

THURSDAY, JULY 23, 201510:00 AM - 1:00 PM Open to the Public Exhibit Hall closes at 1:00 PM


regionalnews

ExhibitorsA.com Electronic Measurement Technology 623

A.K.O. Inc. Torque Specialties Div. 504

ABTech 208

AccuMac Corporation 210

ACR Technical Services Inc. 607

AcuCal, Inc. 626

Additel Corporation SPONSOR 315

Alpha Electronics Corporation 613

American Association for Laboratory Accreditation (A2LA) 414

American Technical Services 105

Ametek Test & Calibration Instruments 213

ANAB 212

Andeen-Hagerling, Inc. 214

AOIP 523

ASQ-MQD 122

AssetSmart 314

Automotive Industry Action Group 120

Bruel & Kjaer North America Inc. 617

Cal Lab Solutions, Inc. 104

Colorado Engineering Experiment Station Inc. (CEESI) 422

Consumers Energy Lab Services SPONSOR 622

Essco Calibration Laboratory 521

Exelon Powerlabs 507

Flexim Americas 604

Fluke Calibration SPONSOR 307

Fowler Precision Tools 322

GE Measurement & Control Solutions 327

GEO Calibration 602

Guildline Instruments 321

IEEE 116

Interface, Inc. 313

International Accreditation Service (IAS) 603

International Test and Evaluation Association 426

Isotech North America 102

JM Test Systems, Inc. 118

Kaymont Consolidated 610

Keysight Technologies SPONSOR 405

King Nutronics Corporation 620

Liberty Labs, Inc. 323

Lockheed Martin Misson Systems and Training 206

Lockheed Martin IS&GS 409

Mahr Federal, Inc. 320

regionalnews

Masy BioServices 513

Measurement Science Conference 124

Measurements International 306

Mensor SPONSOR 202

Mettler Toledo 609

Michell Instruments Inc. 527

Mitutoyo America Corporation 228

Morehouse Instrument Company, Inc. 103

National Institute of Standards and Technology 117

National Research Council Canada 223

National Voluntary Laboratory Accreditation Program (NVLAP) 217

NCSL International 301

NCSLI — Dimensional PT Program 127

Northrop Grumman Corporation 302

Norway Labs 515

Ohm-Labs, Inc. 412

On Time Support, Inc. 716

Pond Engineering Laboratories 516

Pratt & Whitney Measurement Systems 508

Precision Environments, Inc. SPONSOR 417

Presys Instruments Inc. 428

Quality Magazine SPONSOR 601

Radian Research 427

Ralston Instruments 606

RH Systems, LLC 517

Rice Lake Weighing 221

Sartorius Mechatronics Corporation 416

Setra Systems, Inc. 616

Sika USA Inc. 720

Tegam, Inc. 310

Tektronix, Inc. 401

The Bionetics Corporation 211

The Boeing Company SPONSOR 621

The Modal Shop 209

Thunder Scientific Corporation 501

Tovey Engineering, Inc. 526

Transcat, Inc. 207

Transmille Calibration 100

Trescal Inc. SPONSOR 411

TRS - Rentelco 611

Vaisala, Inc. 600

Vibration Research Corporation 506

Western Environmental Corp. 511

WorkPlace Training, Inc. 205

Yokogawa Corporation Of America 312


The National Metrology Laboratory (NML) of The Gambia Standards

Bureau (TGSB) has recognized the event of World Metrology Day

yearly by organizing a host of sensitization programs for different sec-

tors of the economy. This year NML intends to continue in the same

vein by collaborating closely with the Weights and Measures Bureau

(WMB), the institution responsible for Legal Metrology in The Gam-

bia in commemoration of World Metrology Day. Below is the list of

activities planned for recognizing the signing the Metre Convention:

• TV and radio talk shows for the general public

• Sensitization workshop for stakeholders on World Metrology day

• Sensitizing local “Sandikaa” vendors of main markets within

the Greater Banjul

• Site visits and free calibration promotion for public institution

• Metrology sensitization for tertiary institutions

World Metrology DayCelebrations

World Metrology Day, The Gambia

worldmetrologyday

Africa

World Metrology Day National Research Council of Canada (NRC)To celebrate World Metrology Day and Interna-

tional Year of Light 2015, the National Research

Council of Canada (NRC)’s national metrology

institute, NRC Measurement Science and Stan-

dards, launched an awareness raising campaign

with the theme “Lights, camera, measure!”

diffusing articles, internet banners and posters

displayed in all NRC facilities across Canada.

The campaign promoted how measurement sci-

ence uses light for quality standards and how

accurate and reliable measurement underpins

industrial success across all sectors of the econ-

omy. NRC also hosted a seminar with invited

speaker, Dr. Isabelle Berbezier, Research Direc-

tor, of CNRS, Institute Matériaux Microélec-

tronique Nanosciences of Provence, Marseilles,

France, who gave a presentation on Roadmap

for SiGe Studies.

Canada


worldmetrologyday

The first Metrology Student Colloquium “Interacting with metrol-

ogy” was held at Universidad Politécnica de Santa Rosa Jáuregui

(UPSRJ) from May 20 to May 22 within the commemorative dates

of the World Metrology Day. The event was organized by the In-

dustrial Metrology Engineering Department with the participation

of students from all generations. [email protected]

For celebrating 2015 World Metrology Day,

the Center for Measurement Standards, ITRI

(CMS/ITRI) co-organized a conference focus-

ing on the same topic of the theme of this

year - Measurements and Light on May 18.

A total of 200 metrology-related participants

were attracted to attend the event.

CMS/ITRI was very pleased to invite Dr.

Martin Milton, Director of BIPM to Taiwan

to publicize the event with us together. Dr.

Milton gave a speech during the Conference

entitled “The Importance of Metrology for

Standards, Industry and Trade.” He outlined

the key elements of metrology, the recent

progress towards a new SI, and new challeng-

es for metrology in chemistry and biology.

World Metrology Day Celebration Universidad Politécnica de Santa Rosa Jáuregui in Mexico

World Metrology Day Nouakchott, Mauritania

World Metrology Day in Taiwan

The Universidad Politecnica de Ramos Arizpe from Saltillo Coahuila was pres-ent in the Colloquium as a Guest. University represented by 27 students, pro-fessors and administrative staff and the Rector Raúl Martínez Sergio Farias.

Dr. Martin Milton, Director of BIPM (right 7) was invited to Taiwan to publicize the event.

Mexico

Mauritania

Taiwan


worldmetrologyday

Lockheed Martin, Ocala OperationsLockheed Martin Missiles and Fire Control Ocala Operations

celebrated World Metrology Day by sharing what Metrology is

and why it is important to our line of business. Topics also covered

were calibration labels and inspection plates used in the Ocala

facility along with key command media for Control of Company-

Owned Standard Tools and Use of Ovens and Chambers in the

Manufacturing Process. The celebration also included Cake for

all to enjoy.

Consumers Energy Laboratory ServicesConsumers Energy’s Laboratory Services takes time to recognize World

Metrology Day with employees each year. The purpose of celebrating

is to help inform employees of what metrology is and what it means

to us in our everyday lives. The theme for 2015 is ‘Measurements

and Light’ which was chosen to collaborate with the UNESCO

International Year of Light and Light-based technologies 2015. The

alignment of these topics aims to focus on the key role light plays in

our daily lives and the importance light holds for our future.

Essco Calibration Laboratory

McClelland Elementary School

USAFlorida Michigan

Massachusetts

New HamshireRoy Carnival – Metrology Asc. Manager, Richard Fromert - QA Engineering Sr Mgr, Mike Whitman - Metrologist Sr, Ryan Boorman - Technician Calibration

McClelland Elementary School, Magnets and Magnetism.


worldmetrologyday

We’re handing out FREE hot dogs in our

lab today to the site. How cool is that!

Dave Perkins

Metrology Engineer

HP - Corvallis, Oregon

Fluke Calibration celebrates World Metrology Day with games, cake, and a “Lunch and Learn” presentationFluke Calibration celebrated World Metrology Day with a variety of fun and educational

activities in multiple locations:

• In the temperature calibration center of excellence in American Fork Utah, the team

played a rousing game of Metrology Word Search.

• In the pressure and flow calibration center of excellence in Phoenix, Arizona, the

theme was cake and lots of it.

• There was cake in the Everett headquarters as well, plus a display of antique calibration

instruments. The highlight of the day was a “Lunch and Learn” presentation by Fluke

Chief Corporate Metrologist Jeff Gust on “The Pending 2018 Redefinition of the SI.”

• Fluke Calibration associates in Norwich, United Kingdom enjoyed a variety of cakes

and watched Jeff Gust’s video. They also played a variety of measurement games.

• Fluke Calibration associates also participated in the NCSLI Northwestern Region Mea-

surement Training Summit and World Metrology Day Celebration in Beaverton, Oregon.

To celebrate in American Fork, we had ice

cream sundaes and watched Jeff Gust’s

presentation on the upcoming changes to

the SI. I also went to a local 5th grade class

and shared a presentation on metrology

and temperature – froze a racquetball in

liquid nitrogen, all kinds of fun!

Mike Coleman

Fluke Calibration

Oregon Washington

Utah


learning+development

STEMGirlsBACKGROUNDNew Hampshire Governor Maggie Has-

san, in a statement dated January 13,

2015, observed that “modernizing how

we educate our students in the STEM

fields of science, technology, engi-

neering and math is critical to helping

them develop the skills needed for good

jobs in the innovation economy…”1

Executive Order 2014-012 established the

Governor’s Task Force on K-12 Science,

Technology, Engineering and Math (STEM)

Education3, returning their final report to

the Governor this past January. A por-

tion of the report documents a significant

gap between the numbers of girls as com-

pared to boys in STEM related education.

“Nationally, only 25 percent of engineers

and scientists are women” and census data

for New Hampshire finds “that only about

one in four (27 percent) of the computer

and mathematical occupations and… one

in seven (14 percent) architecture and en-

gineering occupations are held by women”

according to the report.

Steeped in

TECHNOLOGY DAY

By William Hinton, New Hampshire statewide Metrology Ambassador


THE CHALLENGEHow do we improve these statistics? How do we make an impact?

We do what we have been doing for many years now within NCSL

International through our education outreach efforts. The 2015

GTD (Girls Technology Day) event allowed us an opportunity to

participate in STEM related activities with an enhanced focus on

the girls and a much larger target audience.

The first GTD event was a one day event held March 14, 2013 at

NHTI (New Hampshire Technical Institute) in Concord, NH. Lisa

Danley, Director, Career Development Bureau, stated that this

event fostered the development of partnerships between the ed-

ucation community and industry within the state, with 120 girls

participating in 10 workshops that first year. Non-traditional ac-

tivities for this first GTD were based on programs in Vermont and

other states and the planning committee retooled this information

to create a STEM based event with a focus on information technol-

ogy and manufacturing. NHTI again hosted the 2014 GTD event

with 205 girls participating.

THE PROCESSGirls Technology Day 2015 was a collaboration between the New Hampshire Department of Education, the New Hampshire Community College System and industry and trade partners.The phenomenal success of this program, demonstrated by the

annual growth with a doubling of the attendees, resulted in 485

ninth and tenth grade girls participating in the workshops and

other events. Logistics required dividing the group in half with

the venue expanding to two days with NHTI and Manchester

Community College each hosting one day of the event. Twen-

ty-six high schools took advantage of 38 workshops from 57 pre-

senters representing academia and industry along with countless

volunteers assisting administration, workshops and a noon-time

vendor/college fair.

Meghan Haidul (right), NextEra Energy – Seabrook Station’s Fire

Protection Engineer and Cindy Brown, Senior Vice President for

the Dyn Corporation, were keynote speakers for this year’s event

as well as role models for the girls in attendance.

Meghan also visited the metrology workshop and spoke to the

girls about STEM careers and her engineering role at Seabrook Sta-

tion. She was impressed with how excited the girls were to be in-

volved and getting to interact with the materials and equipment,

saying “It was good to see girls’ realizing it was okay to be ‘nerdy’.

The girl peers seemed to make it okay. “

NCSL International metrology ambassadors have been in-

volved with local area students through education outreach for

many years. Courtney Ritchings, Education Consultant for the

Career Development Bureau was aware of NCSL International re-

lated education outreach on the state and local level and asked

William Hinton and his group of volunteers to support the 2015

GTD event. The material this group typically presents at an event

is agnostic to gender and would work well for the target audi-

ence. However, the event organizers desired to have the girls

more deeply immersed in hands-on experimentation, discovery

and learning.

William Hinton, owner of Hinton Technical Services; Gary Con-

falone and Eric Rosenberg of ECM Global Solutions in Topsfield,

MA and Tim Osmer, New Hampshire State Metrologist, facilitated

The bleachers were filled with 9th and 10th grade girls for the opening ceremony of the 2015 GTD event.



three Metrology/STEM experiments within the workshop. Tradi-

tional presentations were retooled with additional material and

equipment to provide experiments and experiences in the applica-

tion and use of metrology related to STEM.

WORKSHOP EXPERIMENTSThree sub-workshop experiments were conducted in the area

of metrology of length and temperature measurements. Gary

and Eric provided a Faro Edge Arm and presented “Metrology

– Length – Laser Measurement. “ The operating theory, design

and STEM applications for the Faro laser measurement arm along

with an explanation of data acquisition were discussed and

demonstrated. Once the girls understood the operating theory

and the delicate operating requirements for this machine, they

were allowed to operate the unit, collecting scans of many differ-

ent objects including a facial scan of one of the students and a

biomedical skeleton. The scan data was captured as a point cloud

in the attached laptop where the rendering could be further ma-

nipulated. The technology behind the Faro Edge Arm made this

equipment the darling of our workshop. Tim Osmer commented

that “ECM’s FARO arm is always a show

piece and a unique opportunity for

anyone that gets to use it”.

Tim Osmer mentored

“Metrology – Temperature

– Infrared Thermometry”

using an infrared ther-

mometer from the NCSL

International Vernier kit

to measure insulation

performance on engi-

neered wall panels, con-

structed by the students.

The girls designed and as-

sembled their wall structures

from an assortment of materials

and installed them on the test fixture

which contained a 60 watt lamp (heat source). After the initial wall

temperatures were recorded, the heat source was energized and the

wall exteriors were monitored with the infrared thermometer. Test

data was collected every three minutes and uploaded to an Excel file

that charted the wall performance. The data was evaluated and the

best and worst performing wall panels were subjected to a forensic

analysis to determine why the walls performed with such disparity.

The Metrology Laboratory at NextEra Energy’s Seabrook Station,

and an NCSL International member, provided an additional infra-

red thermometer and a FLIR thermal imaging camera that allowed

the girls to search the event location for heated components (lamp

ballasts, heat ducts, etc.). Since it was well below freezing during the

day, they were also monitoring for poor, degraded or missing insu-

lation in exterior walls and windows. The girls soon discovered that

the FLIR camera could be used to measure the temperature of their

teammates with some interesting results. A spontaneous investiga-

tion was started by several students who noted an interesting arti-

fact in the images of those who wore glasses. Some lens coatings for

glare and scratch control have some infrared reflectance or absor-

bance properties making the lens standout against the background.

Metrology Workshop – Eric Rosenberg (ECM), Gary Confalone (ECM), Keynote Speaker Meghan Haidul (NextEra Energy), William Hinton (Hinton Technical Services) and Tim Osmer (NH State Metrologist).

“Industry involvement is

necessary to expose kids to

different career paths they

probably don’t know exist. This

is especially true for girls who

are rarely exposed to these STEM

careers, or who may be steered

away because of cultural and

social norms.”

- Gary Confalone, ECM

Girls in this experiment learn how to use the Faro arm to scan an artifact, assisted here by Eric Rosenberg.



William Hinton mentored “Metrology

– Temperature – Ice Point” using a tem-

perature probe and the Quest data collec-

tion unit from the Vernier kit. Vernon

Alt, Learning and Development committee

chairman, supported this

event by purchasing

and donating two

Vernier tempera-

ture probes for

incorporation

into the NCSLI

Kit. The abili-

ty to prepare

two concurrent

ice baths allowed

a control bath to

compare data against a second bath altered

with salt to measure the change in ice melt

point and resulting temperature depression.

Distilled ice and water were combined in

two insulated containers. Once the baths

were at equilibrium and relatively stable at

0 °C, one bath was dosed with NaCl (table

salt) and the effect on the temperature was

monitored, analyzed and discussed. The

girls noted that additional salt would lower

the temperature even further. Time con-

straints only allowed for two doses during

the experiment. For the sake of simplicity,

-20 °C was accepted as the lowest achiev-

able point. (The lowest obtainable tem-

perature is -21.1 °C at the point where the

solution becomes a eutectic mixture.)

“The experienceparticipating in GTD provided me with new information on STEM, careers to explore, and taught me that you can accomplish anything as a woman- there’s no limit to what you can do based on your gender.” - Anonymous Student

“I hope that you could

expand the program to

all high school girls, so

that we as sophomores

can come back and

learn more as juniors

and seniors.”

- Kearsarge Student

Girls receive coaching in the use of a FLIR infrared imaging camera from Tim Osmer.

Interaction with the metrology equipment found alternate uses for infrared technology.

Students prepare identical ice-point baths in preparation for dosing one with table salt.


“I really like howhands on and fun all of the things were, yet still educational. Nothing was boring and I think we learned a lot from this

experience.” - Kearsarge Student


The science and engineering behind this phenomenon result-

ed in dialog with New Hampshire state Governor Maggie Hassan

during her afternoon visit to our workshop on the first day. There

was discussion regarding salting roads and walkways for safety,

the limits of effectiveness and how predictions of weather con-

ditions can be used to calculate the amount of salt the state may

need to dispense.

The Governor asked the girls if this type of event was of value

and the response was overwhelmingly positive. “The opportunity

to get our hands on the equipment and perform the experiments

was better than simply having a reading assignment from our

teacher then testing our memory” responded one student.

The Governor then challenged them saying “…you have a re-

sponsibility to talk with your teachers and parents and let them

know that this is a style of education that works for you.”

Feedback from the girls, observations of the other workshops

and the massive amount of work and preparations that went into

this two day event demonstrate the importance of engaging and

embracing this very important segment of our population. NCSL

International, in concert with academia and industry across the

country, will continue to successfully address STEM in general and

Metrology specifically to the girls in our communities.

William Hinton

NextEra Energy Retiree and Owner of Hinton Technical Services, LLC

in Rochester, NH.

[email protected]

An NCSLI member since 1996, Hinton is a past NCSLI Board

Member currently engaged in writing NCSLI documents and is a

New Hampshire statewide Metrology Ambassador.

Future STEM professionals collecting thermal data for their insulation performance experim

ent.

“STEM is vital for the future of food

security, water security, economic security and independence. STEM countries will lead, all others will be reliant.”

- Tim Osmer, NH State

Metrologist

Governor Maggie Hassan speaking with the girls in the Metrology workshop.

REFERENCES1. Governor Hassan’s Statement on

the STEM Task Force Report,

Communications Office, January

13, 2015

http://governor.nh.gov/media/

news/2015/pr-2015-01-13-stem.htm

2. Executive Order 2014-01, “Estab-

lishing the Governor’s Task Force on

Science, Technology, Engineering

and Math Education”

http://governor.nh.gov/media/or-

ders/documents/eo-2014-01.pdf

3. “Governor’s Task Force on K-12

STEM Education”

http://governor.nh.gov/commis-

sions-task-forces/stem/

documents/stem-01-2015-final-re-

port.pdf

July 2012 : Metrologist 13www.ncsli.org

Inspiring the Next GenerationWe seek to inspire the next generation of mea-surement scientists by introducing them to the diverse opportunities of careers in metrology.

Promoting Measurement ScienceMeasurements are the foundation of our global economy. Everything we purchase, create, de-sign, and build depends on metrology. Our goal is to promote the value of metrology’s impact in our everyday lives.

Educating to Meet Workforce ChallengesWe are committed to cultivating life-long edu-cation and professional development through scholarships, training opportunities, publica-tions, networking, collaboration and support of professional certification.

Investing in Measurement Science We strive to identify, secure, and invest the financial resources necessary to reach our strategic learning and development goals: inspire, promote and educate the next genera-tion of metrologists.


Lindsey Bass is a junior double majoring in Mechanical Engineering and Music Performance at Virginia Tech.She is originally from Pasadena, Maryland. As an active

undergrad, Lindsey is a member of Virginia Tech’s

University Honors Program, and in the summer

of 2014, she joined the Design, Research,

and Education for Additive Manufacturing

Systems (DREAMS) lab where she mainly

works with PolyJet material jetting, an

Additive Manufacturing (AM) process

involving liquid photopolymer selectively

jetted and simultaneously cured by UV

light in a layer-by-layer fabrication process.

Because AM applications are rapidly

expanding, there exists a need to quantify

the mechanical properties of the materials

to ensure reliable performances in different environments.

Lindsey’s current research explores two common materials

printed on the Objet350 Connex printer: a polypropylene-

like material (VeroWhitePlus) and an elastomer-like material

(TangoBlackPlus.) She printed standard tensile testing “dogbone”

specimens in six various mixtures of these two materials

and in three build orientations. Performing tensile

testing allowed her to characterize key anisotropic

properties such as ultimate strength, modulus

of elasticity, and elongation at break for

each material. She has also investigated

how aging of parts in different lighting

conditions affects material properties as

well as how part spacing on the build tray

affects part strength with attention to UV

light over-cure.

Lindsey previously completed a summer

undergraduate research fellowship involving

Additive Manufacturing (AM) at the National

Institute of Standards and Technology (NIST)

involving process-intermittent measurement of the binder

jetting process to help establish a future method of feedback

control on a 3D printer.

Her interest of combining creativity with technology and hands-

on engineering increases her drive to continue pursuing AM. Also

a member of the Virginia Tech Chamber Singers, Lindsey’s other

extra-curricular involvements include participating in a world

premiere opera, studying abroad for a semester in Switzerland via

the Presidential Global Scholars Program, and holding multiple

leadership roles in the Newman Catholic Community with the

musicians and mission trips.

[email protected]


LindseyBass

173857--removing VeroWhite specimens from the Objet350 Connex printer.

Joe D. SimmonsMETROLOGY SCHOLARSHIPWINNER


QUALIFIED STUDENTS ARE ENCOURAGED TO APPLY

$3000 SCHOLARSHIP

Founded in the memory of Joe Simmons to support the study of measurement science

and metrology related quality topics.

For application forms or more information contact your advisor, student aid office, or the Scholarship itself at:

[email protected] www.ncsli.org (search Simmons)

Submit to: Simmons Scholarship

2995 Wilderness Place, Suite 107Boulder, CO 80301

Completed applications are due March 1

Joe D. Simmons NIST (NBS) (1963-1994)

1992 NCSLI, William A. Wildhack award winner. 1995 MSC, Andrew J. Woodington award winner.

Co-founder and Chair of ASQ Measurement Quality Division.

PROMOTINGACADEMIC

EXCELLENCE IN METROLOGY

www.ncsli.org


internationalnews

By The National Research Council Canada

Leading in Emerging Areas of NanotechnologyAs Canada’s leading Research and

Technology Organization, the National

Research Council of Canada (NRC)

offers innovative technology and high-

performance laboratories that address

some of the world’s foremost innovation

challenges. One such challenge is nanoscale

measurement. Through its expertise in

Measurement Science and Standards,

NRC enables the characterization

and standardization of manufactured

nanomaterials, including cellulose

nanocrystals (CNCs), which are emerging

as a highly valuable material for industry.

Cellulose nanocrystals – the eco alternative to oil-based productsCellulose nanocrystals (CNCs) are tiny, rod-

shaped particles composed of crystalline

cellulose. They are primarily derived from

wood but can also be extracted from other

plant materials, from bacteria to algae. CNCs

are the most abundant natural biopolymer

(complex, chain-like molecules made up

of repeating chemical blocks) found in

nature. In addition to being renewable and

sustainable, they provide an eco-friendly

alternative to oil-based products.

CNCs have high mechanical strength,

high surface area and thermal stability.

Their ability to take various forms, such

as gels and films, has triggered a wave

of recent activities aimed at turning

nanocellulose into commercial products

in diverse areas, including composite

materials, biomedical applications, paints,

coatings and packaging.

Certified Reference MaterialsGiven their unique properties, CNCs are

poised to penetrate numerous markets. The

National Research Council is supporting

Canada’s leadership position in the

production of CNCs by releasing two unique

Certified Reference Materials to further

develop and support CNC material for

the Canadian economy. These highly

homogeneous reference materials are used

to benchmark performance evaluations

and to ensure that testing protocols return

accurate information – regardless of where

or when the testing is performed.

Development of standardsNRC also supports the commercialization

of cellulosic nanomaterials by its

involvement in the development of

documentary standards. On behalf of

the Standards Council of Canada, NRC

is leading the development of a technical

report on CNCs with the International

Standards Organization (ISO). The report

will provide a framework for future

development of international standards

for CNCs and for nanocellulose-enhanced

products, facilitating their entry into

global markets.

Developing technical specifications and

standards for new products assists industry

to improve operations and become more

efficient. Standards help break down

barriers to international trade and open up

global markets. Furthermore, conformity

to standards reassures consumers that new

products are safe and do not pose a risk to

either humans or the environment.

For example, the Canadian Forestry

Service (CFS), looking to promote this next

wave of technology development in the

forestry/pulp and paper sector, is providing

external support to NRC for its standards

work, recognizing that international

standards are essential in ensuring the

adoption of Canadian products in the

global marketplace.

With its work in nanotechology, the

National Research Council of Canada is

helping to ensure a safe transition toward

the development of new products and

materials, such as cellulose nanotcrystals,

and is achieving quality levels that are

recognized world-wide.

[email protected]

Atomic force microscopy image of cellulose nanocrystals extracted from wood pulp. (Credit: The National Research Council of Canada)

http://www.nrc-cnrc.gc.ca/eng/solutions/advisory/crm/inorganic/list_products.html



25thAnniversaryof EurolabAt the invitation of Lorens Sibbeson, the Secretary of Eurolab

Denmark, I was pleased to represent NCSL International at the

Eurolab 25th Anniversary celebration and related meetings. The

meetings were held at the Radisson Blu H.C. Andersen Hotel in

Odense, Denmark on April 8–10, 2015. For those who may not

know, one of the claims to fame for Odense is being the birthplace

and home town of Hans Christian Andersen.

The events began on April 8, with the meeting of the Eurolab

Technical Committee for Quality Assurance (TCQA). The

meeting was chaired by the TCQA Vice-Chair, Irache Visiers Sanz

(EUROLAB España).

Various topics were discussed during the TCQA meeting, such as:

• Improving relationships with metrology/calibration laboratories;

• TCQA documents: Cook Books, Technical Documents, and Position

Papers later approved by the Board of Administrators (BoA);

• Standardization: Revision of ISO/IEC 17025. EUROLAB has been

actively involved in the revision process from an early stage,

having representatives in the working groups. The EUROLAB

representatives will continue to follow up the activities of the

working groups and the committees they attend.

The anniversary celebration continued the following day

with the EUROLAB 25th Anniversary Seminar. The Seminar

was titled: “Traceable testings in the International Context. The

Role of EUROLAB in the past 25 years – and in the next!” and

included delegates from 19 countries to discuss the role of me-

trology in Europe and identify some of the EUROLAB highlights

and involvement in the sector. This seminar was an excellent

platform for sharing the experiences and expectations of speak-

ers as well as participants from the laboratory sector. It was also

By Roger Burton, NCSLI President

Jiri Sobola and Roger Burton sign a new MOU between NCSL International and Eurolab.

internationalnews


internationalnews

an occasion to exchange memories with

the EUROLAB past-Presidents, present the

EUROLAB evolution during the past 25

years, and look towards future develop-

ments and opportunities.

The seminar included eight formal

presentations.

Dr. Horst Czichos, EUROLAB represen-

tative to NCSL International, gave an in-

teresting talk about the involvement of

EUROLAB in relation to the role of metrol-

ogy and testing to characterize materials

and products.

Warren Merkel, Chief of NVLAP, pre-

sented a talk on “Metrology in the Ac-

creditation Perspective.” NVLAP (National

Voluntary Laboratory Accreditation Pro-

gram) provides third party accreditation

to testing and calibration n laboratories in

response to legislative actions or requests

from government agencies or private sec-

tor organizations. What are the synergies

with NIST and their activities?

My presentation was “NCSL Interna-

tional: Serving the World of Measure-

ment, More than 50 Years of Experience

in the Field.” I provided a brief look back

at how our organization was formed, pro-

vided a short history of NCSLI, reviewed

our current strategic plan, and presented

the value of NCSLI and what the benefits

are for being a member. Many of the at-

tendees were interested in NCSL Interna-

tional activities and expressed an interest

in becoming a member and attending the

Workshop & Symposium in July.

These and all other presentations from the

seminar are available on the EUROLAB 25th

Anniversary website: http://eurolab25.dk/

Roger Burton presents plaque to Jiri Sobola (former Eurolab President) on behalf of NCSL International to recognize EUROLAB’S 25 years.

Roger Burton, NCSL International President.

http://eurolab25.dk/


CPC4000Industrial Pressure Controller

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The successful seminar was followed that evening by the Gala

Dinner to celebrate the EUROLAB 25th anniversary. During the

dinner, I was honored to present a plaque to Jiri Sobola (former

Eurolab President) on behalf of NCSL International to recognize

EUROLAB’S 25 years of success.

The EUROLAB General Assembly meeting was conducted on

the third and final day of the event. During the General assembly

meeting, Jiri Sobola and I signed a new MOU between NCSL

International and Eurolab.

During the General Assembly, the EUROLAB members elected a

new EUROLAB Board of Administrators:

• Álvaro Silva Ribeiro, RELACRE, EUROLAB President

• Jeff Llewellyn, BMTA, Vice-President

• Ruud Zantman, Fenelab, Vice-President and Treasurer

New Members of the BoA:

• Paolo Moscatti, Alpi Associazione

• Alexander Šafařík-Pštrosz, EUROLAB-CZ

• Kurt Ziegler, EUROLAB-Deutschland

Reelected members to the BoA:

• Ewa Bulska, POLLAB

• Jeff Llewellyn, BMTA

• José-Luis Sanchez, EUROLAB-España

• Ömer Güzel, TURKLAB, Representative of associated members

TCQA Chair:

Irache Visiers was elected as the new chair of the TCQA, following

Manfred Golze.

The EUROLAB General Assembly 2015 closed with thank-you

remarks from new President Álvaro Silva Ribeiro to the former

President Jiří Sobola for his valuable contributions and hard work

for EUROLAB.

If you have any questions, please contact the EUROLAB General

Secretariat: [email protected].

[email protected]

internationalnews


Conference on Precision Electromagnetic Measurements

This biennial conference is the premier international forum for the exchange of information on precision electromagnetic measurements.

JULY 10-15, 2016OTTAWA, CANADA

www.cpem2016.com Hosted by the National Research Council Canada

2170_CPEM_ad_8.375X10.875_e_v1_HR.pdf 1 2015-01-22 8:43 AM


internationalnews

Letter fromEuropeBy Prof. Horst CzichosBHT Berlin, University of Applied Sciences, Contributing Editor

The role of metrology and testingto characterize materials and productsEUROLAB, the European Federation of Measurement, Testing and Analytical Laboratories commemorated its 25th Anniversary in April

with an Anniversary Seminar, organized by EUROLAB-Denmark, and entitled “Traceable Testings in the International Context.” As Past

President of EUROLAB I was invited to give a talk on the role of metrology and testing to characterize materials and products. This Letter

summarizes the contents of this talk with key figures and explanations.

1. Background: Origin of Conformity Assessment• To facilitate the free movement of goods, persons, services, and capital – while protecting essential

public needs, e.g. safety, health, environment – the New Approach was established 1985 in the European Union (EU) as flexible regulatory framework for market and trade.

• Essential requirements are defined in EU-Directives. CE marking declares that the product is safe and in conformity with the relevant EU Directives.

• Harmonised EN Standards define the technical details Ô European Standards are valid in the whole EU, conflicting National Standards have to be withdrawn: “one standard, one test, accepted everywhere”.

• In connection with the formation of the European Union, EUROLAB was set up in Brussels April 1990. Since 1998 it is a Legal Entity under Belgian Law, composed of National Associations of Measurement, Testing and Analytical Laboratories with over 2,000 members and about 100,000 technical experts and laboratory practitioners. EUROLAB represents the laboratory community regarding political and technical issues, its members perform confomity assessment services.

2. Conformity Assessment as requirement for market and trade – and metrology and testing as scientific and technological base to characterize materials and products

The EU: 28 states,

24 languages, 500 million citizen

2

2. Conformity Assessment as requirement for market and trade

3. Metrology and Testing as scientific and technological base to

characterize technical objects


internationalnews

3. Metrology and Testing as base to characterize technical objects

4. Methodology of MeasurementMeasurement begins with the definition of the measurand, the quantity intended to be measured.

2

2. Conformity Assessment as requirement for market and trade

3. Metrology and Testing as scientific and technological base to

characterize technical objects

3

4. Methodology of Measurement

5. Methodology of Testing


internationalnews

5. Methodology of TestingTesting begins with the definition of the characteristics of an object to be determined by applying a test load to the object with refrence

to a test procedure.

6. The combination of Metrology and TestingThe combined methodologies of measurement and testing are necessary to characterize technical objects.

3

4. Methodology of Measurement

5. Methodology of Testing

4

6. The combination of Metrology and Testing


internationalnews

Combination of Metrology and TestingExample: Determination of Elasticity and Strength of a Technical Object

7. Traceability in Metrology and Testing: the Confidence Ring

AcknowledgmentAt the 25th Anniversary of EUROLAB I am very grateful to all collegues

with whom I discussed over the years the topics presented in this talk.

Some figures of the presentation were adopted from the Handbook

of Metrology and Testing, which was worked out in an international

cooperation wth contributions from Europe, Japan and the USA.

[email protected]

4

6. The combination of Metrology and Testing

5

7. Traceability requirements to characterize materials and products:

the Confidence Ring

***************

[email protected]

!"#

Springer

Handbookoƒ

Metrology and Testing

Czichos Saito Smith Editors

HKS 91

specialfeature

Toward aMeasurementInformationInfrastructure Smart Certificates

By Mark KusterPantex Metrology, Contributing Editor

Hello again and welcome to your MII column. This time we cook up a basic data model for smart certificates. As we will see, the stock we previously laid up in our MII instrument specifications and accreditation scope document models will come in handy. Let’s get started.



specialfeature

Pie in the SkyFirst, reconsider the main information that certificates supply:

• The customer, service, and UUT1 identification• The vendor and its accreditation status• Dates, personnel, procedures and deviations, amendments, miscellaneous info• Sampling detail, environmental conditions, other qualifiers• Measurement method and results, uncertainties, specifications, confor-

mance statements, traceability evidence

From an MII perspective, we would like to capture that information,

not only in an aesthetically pleasing human-readable document, but

also in a standardized machine-recognizable format, one version

either packaging or generating the other. Such a semantically

meaningful certificate would allow MII-aware software to

• Receive notification and retrieve the document directly from the vendor’s web service;

• Validate the vendor, accreditation status, ID numbers, dates, traceability, and the other pertinent administrative detail;

• Match reported measurements to the requested measurements and the vendor’s accreditation scope;

• Check that uncertainties suffice and fall within the accredited scope or tested specifications equal the expected specifications;

• Determine whether the conformance-tested instruments fell in tolerance before adjustments or test newly and previously reported values for metrological equivalence

• Initiate non-conformance actions if appropriate;• Transfer the reported results to the appropriate automation systems, data

files, lab management system, and uncertainty budgets;• Pass along the whole measurement chain’s traceability data to smokelessly2

account for correlations.

GastronomyWe obviously have a large plate before us so we will take it one bite

at a time. This installment will digest the more administrative tidbits

and freeze the juiciest technical leftovers for later.

Borrowing from past columns’ recipes for instrument specifications

and accreditation scopes, we jot down this high-level data model that

handles either a single instrument or a system of NI instruments:

Certificate

• System Identifier• Customer Identifier• Measuring Entity• Service• Accreditation (optional)• Qualification• Environmental Conditions• Measuring Instrument 1 Results

– Instrument 1 Identifier

– (technical data organized by functions and ranges)

• Measuring Instrument 2 Results ⋮

• Measuring Instrument NI Results• Locale-Language• Human-Readable Document• Visual Aids Script

We borrow past material not only for ease, but for compatibility—

information from the various MII documents should flow

seamlessly between them. So, reusing the appropriate specification

model elements, the UUT identifiers may appear like:

System or Instrument Identifier

• Unique ID (UUID3, hash, URL4, DOI5, etc.)• Nomenclature• Manufacturer• Model

Similarly, the Measuring Entity comes from the capability scope

model, structured simply as

Measuring Entity

• Organization Identifier• Organization Name

with the Service Identifier that matches the vendor’s appropriate

General Function (test, calibration, inspection, etc.) from its

capability scope document. The optional Accreditation element

holds the unique IDs that enable its validation:

Accreditation

• AB Identifier• Scope Identifier• AB Logo-Signature

For example, an ILAC6 or other registration web service might

accept the AB7 Identifier and direct the inquiry to the correct

AB web service, which would take the Scope Identifier and AB

Logo-Signature, validate the AB Logo approval, and serve up the

accreditation document for examination. A secure implementation

would detect unscrupulous vendors’ false accreditation claims that

A2LA’s8 Peter Unger has reported.

The customer information, new to this MII document, might

include:

Customer

• Unique Identifier• Name• Address

The qualifications element comprises all the administrative

data pulled from the vendor’s prepopulated laboratory

management system that qualify the service and fulfill certificate

content requirements such as those in ISO17025, including

cryptographically protected electronic signatures:

1 Unit under test2 See the April 2013 column.3 Universally unique identifier4 Universal resource locator5 Digital object identifier6 International Laboratory Accreditation Cooperation7 Accreditation body8 American Association for Laboratory Accreditation

specialfeature

Qualification

• Certification Date• Expiration Date (optional)• Procedure Identification• Procedure Deviations• Sampling Detail• Miscellaneous Text• Amendments• Personnel Identification• Approval Signature

Next, the Environmental Conditions element also draws from

the specifications document model

Conditions

• Quantity Value Interval 1• Quantity Value Interval 2 ⋮

• Quantity Value Interval NC

and lists the NC relevant environmental parameters’ values or

ranges within which the vendor performed the measurements.

Since the data structure matches that for the specification

document’s Operation Conditions and Reference Conditions, MII-

software may validate the certification conditions or use them

together with the instrument’s Quantity Function and Condition

Equations to correct measurement results for future Operating

Conditions as required.

As with our other MII documents, let’s stir in a Locale-Language

element to customize the certificate for a world region’s language

and character set, the Human-Readable Document template, and

the Visual Aids Script technology to populate any desired graphics.

That wraps up the basic ingredients for smart certificates. Perhaps

a bit bland so far, but in upcoming installments, we will continue

this discussion, add some VIM9 spice, and slice into the technical

detail. After that, a few tastings and revisions should refine our

model to cover most or all certificate flavors in use.

Conference DelectablesFollowing past practice, we would like to highlight some MII-

related topics from the upcoming NCSLI Workshop & Symposium

in Grapevine, Texas. A glance at the tutorial abstracts elsewhere

in this issue or at http://events.ncsli.org/ should entice you to

sample them further. The items with the more evident MII tastes

and aromas include:

• T2: LabVIEW™ Automation• T3, T5, T7, T11-T14, T19-T23, T25-T27: These metrology courses cover a

nice variety of measurement and analysis techniques optimized for specific measurement areas and equipment. If you attend one or more, think about how MII instrument models might capture the metrological knowledge presented.10

• T8: Geometric Dimensioning and Tolerancing (instrument specs)• T10: Lab Management Software. Don’t forget to ask Walter when he plans

to add MII features to his checklist!

The core technical program, both posters and live sessions,

offers traditional and more exotic dishes related to instruments,

uncertainty, automation, reports, accreditation, and other MII-

related fare too numerous to mention individually. Take a look at

the menu and enjoy your selections. Many thanks to those of you

who fired up your own grill to create these entrees.

An MII will require many chefs and burn lots of calories on

discussion, feedback and implementation so please send your

thoughts and ideas via email or the MII community discussion

forum at www.ncsli.org. See you in Grapevine.

[email protected]

9 International Vocabulary of Metrology10 See the October 2013 through April 2014 columns.


February 1-2, 2016OMNI JACKSONVILLE HOTEL

245 WATER STREET | JACKSONVILLE, FLORIDA 32202 | 904-355-6664

The NCSLI Technical Exchange provides a forum for exchanging ideas, measurement techniques, best practices and innovations with others interested in metrology industry trends. This measurement training will build or enhance specific hands-on skills in the calibration of measurement and test equipment, and teach best practices along with

introducing new and innovative calibration hardware, software and calibration services.

This two-day event will offer metrology training covering several fields. Each training session is taught by subject matter experts from throughout the industry.

For registration questions and answers, please call theNCSLI business office. 303-440-3339 or visit ncsli.org

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technicalpaper

1. IntroductionThe trends of increasing device complexity

and technology convergence are driving

test systems to be more flexible. Test

systems must accommodate device changes

over time, even though cost pressures

are demanding longer system lifetimes.

One way to accomplish these objectives

is through a software-defined, modular

architecture. Virtual Instrumentation

provides options for the hardware platform

and software implementations, required to

meet these challenges.

Fundamentally there are two types

of instrumentation today, virtual and

traditional. Figure 1 illustrates the

architectures of these types.

AbstractHigh accuracy Virtual Instrumentation applications in the industry have grown exponentially in the last ten years, particularly after the

adoption of the PXI Modular Instrumentation standard.

Measurement system developers pick and choose off the shelf measurement I/O and controller capability to create custom measurement

systems that do not require custom hardware. Most of the integration work is done by R&D engineers and software developers who are not

concerned with long term maintenance or accuracy evaluation. In addition calibration requirements of the measurement systems are, in

most cases, not fully addressed. Complicating matters further, the Modular Instruments are often integrated within more complex systems

or they are seen as computer extensions that do not require adjustment or calibration. This preconception cannot be further from the

truth, and can ultimately lead to customer liability due to inaccurate measurements. Today, Modular Instrument based T&M performance

is comparable or superior to conventional instruments, and like them, they require comparable levels of calibration and traceability.

Not all computer based instruments are born equal. Modular Instrumentation independent hardware and software nature poses

further challenges to manufacturers and developers. The T&M expert needs to evaluate characteristics that are taken for granted on

bulkier bench top equipment. Only the best Modular Instrument manufacturers offer solutions to these questions. On the other hand,

the T&M industry will greatly benefit from the unique characteristics of these instruments, reduce their own development processes and

improve time to market.

The purpose of this paper is to raise the awareness of the industry community, and in particular measurement system integrators,

quality assurance officers and calibration laboratory managers of the necessity to apply the same level of scrutiny and traceability to

modular T&M instruments as they do for the conventional equipment used by their organizations.

By Jorge Martins and Paul Packebush National Instruments

Virtual Instrumentation New Challenges

Figure 1 - Traditional and Virtual Instrumentation.


The diagrams show the similarities in these two

approaches. Both have measurement hardware, a chassis,

a power supply, a bus, a processor, an OS, and a user

interface. Because the approaches use the same basic

components, the most obvious difference from a purely

hardware standpoint is how the components are packaged.

A traditional instrument puts all of the components in the

same box for every discrete instrument. An example of a

stand-alone instrument is a manual instrument controlled

with GPIB, USB, or LAN/Ethernet. These instruments are

designed as discrete entities with defined functionality.

By contrast, Virtual Instrument provides the raw data from the

hardware directly to users, allowing them to define their own

measurements and user interface. With this software-defined

approach, users make custom measurements, and modify the

system if requirements change; for example, to add instruments,

channels, or measurement modes.

This combination of flexible, user-defined software and scalable

hardware components is the core of Modular Instrumentation.

2. Modular Hardware for System ScalabilityModular Instrumentation can take several forms. In a well designed

Modular Instrumentation system, many of the components - such

as the chassis and power supply - are shared across instrument

modules not duplicated for every instrument function.

In cases such as PXI (PCI eXtensions for Instrumentation)

- a rugged platform for test, measurement and control - the

measurement hardware is housed in an industrial chassis. In a

PXI system, the host computer can be embedded in the chassis (as

shown in Figure 3) or it can be a separate laptop, desktop, or server

that controls the measurement hardware through a cabled interface.

This sharing of the chassis and controller greatly reduces cost

but also enables the user to control the measurement-and-analysis

software. While there are many configuration choices for Modular

Instrumentation, the differentiator between this approach and

traditional instrumentation is that the software is open, so that the

user can define his/her own measurements as test needs change or

as measurements are unavailable on traditional instruments.

While the term “modular” is sometimes misapplied based on

the hardware packaging alone, Modular Instrumentation is about

more than just packaging. Users expect other benefits from a

Modular Instrumentation system:

• Reduced capital equipment costs and system size: Deploy a

complete test system for a lower cost with the same footprint as

a single traditional instrument.

• Rapid test development: Design and deploy test systems faster.

• Faster test execution with increased flexibility: Achieve higher

performance with PC data buses, multicore processors, and

field-programmable gate arrays (FPGAs).

• Increased system scalability and success: Add or update

functionality as your needs evolve and benefit from world-class

services and support.

3. Modular Instrument ArchitectureWhile interchangeability of a Modular Instrument system is a

huge benefit, there is more to creating a test and measurement

platform than plugging hardware into a chassis or backplane. The

total platform contains both hardware and software components

at many different levels. Figure 4 represents the total investment

for a Modular Instrument platform.

The layer, Measurement and Control Services, is one of the most

crucial elements of a Modular Instrumentation system, though of-

ten overlooked. This layer represents the driver I/O software and

hardware configuration tools. This driver software is critical, be-

cause it provides the connectivity between the test development

software and the hardware for measurement and control.

Instrument drivers provide a set of high-level, human-readable

functions for interfacing with instruments. Each instrument driv-

er is specifically tailored to a particular model of instrument to

provide an interface to its unique capabilities. Of particular im-

Figure 2 - Examples of Modular Instrument hardware.

Figure 3 - Example of ModularInstruments Chassis PXI.

technicalpaper


technicalpaper

portance in an instrument driver is its inte-

gration with the Application Development

Environment (ADE) so that the instrument

commands are a seamless part of the ap-

plication development. System developers

need instrument driver interfaces opti-

mized for their development environment

of choice, for example, LabVIEW, C, C++,

or Microsoft .NET.

Also represented in Measurement and Con-

trol Services are configuration tools. These

configuration tools include resources for con-

figuring and testing I/O, as well as storing scal-

ing, calibration, and channel-aliasing infor-

mation. These tools are important for quickly

building, troubleshooting, and maintaining

an instrumentation system.

The software in the ADE layer provides

the tools to develop the code or procedure

for the application.

Every layer of this software architecture

should be considered for a Modular

Instrumentation system.

4. Adoption of Modular InstrumentationThe adoption of Modular Instrumentation

as a test platform continues to grow.

Considering only PXI systems there are

over 1,500 individual products support by

over 60 vendors [1].

Understanding the growth and adoption

rates of Modular Instruments, in all their

variations, helps us to see that metrology

laboratories will have an increased need to

service this type of instrumentation.

5. Case Study on Measurement AccuracyMany developers look at PXI instruments

as low accuracy versions of state-of-the-

art benchtop T&M instruments. Some

refer to them as “mindless beasts, which

uncertainties cannot be determined even

if we try to”, a statement that is not the

case. Modern PXI T&M instruments have

performance, capabilities, functions and

characteristics comparable and in most

cases superior to the best traditional

benchtop counterparts. That is not to say

that challenges in performing accurate

repeatable measurement do not exist for

PXI instrumentation, but instead these

challenges are common to all high accuracy

measurements. As an example, the following

sections compare the characteristics and

capabilities of two high performance PXI

based instruments to comparable world

class traditional instruments.

The most common and widely used

measurement instruments are the digital

multimeter and the oscilloscope. For the

purpose of this comparison a 7½ -digit

DMM and a 300 MHz oscilloscope are

chosen. The intent of this comparison is

not to evaluate all PXI and conventional

DMM characteristics and functions, but

rather to highlight their similarities and

basic specifications.

5.1. 7½ -digit DMMThis simple comparison of a 7½ -digit

DMM’s basic features shows that the

level of performance achieved by today’s

PXI Modular Instruments is at the level

of the best benchtop DMM’s. In addition

PXI Modular Instruments add the design

flexibility required to carry out extensive

measurement analysis in real time by

taking advantage of ever improving off the

shelf computer technology.

Device I/O and Connectivity

(Modular Instrument, Sources, Switches, Motion,

Vision, Data Acquisition, Digital, etc.)

Computing System and Form Factor

(cPCI, PXI, Embedded Processor,

Triggering, Synchronization)

Measurement and Control Services

(Drivers, Test Panels, Configuration SW)

Application Development Environment

(LabVIEW, C++, .NET, Others)

Operating System

(Windows, Linux, VxWorks, Embedded, etc.)

Environments

Instrument or I/O Libraries

Test

Programs

Figure 4 - Modular Instrument test and measurement system.

DC V 90 day accuracy Temperature Coefficient

PXI Benchtop Ratio PXI Benchtop Comparison

[18-28]°C [18-28]°C PXI vs. Benchtop [0-55]°C [0-50]°C PXI vs. Benchtop

100 mV ± 2.5 µV ± 3.7 µV 1.5x better ± 0.13 µV/°C ± 0.63 µV/°C 4.8x better

10 V ± 95 µV ± 260 µV 2.7x better ± 3.1 µV/°C ± 40 µV/°C 13x better

1000 V ± 18.5 mV ± 43 mV 2.3x better ± 0.31 µV/°C ± 6.1 mV/°C 20x better

Reading rate/s

7½-digit 7 6 1 more reading/s

6½-digit 100 57 43 more reading/s


technicalpaper

Resistance 90 day accuracy Temperature Coefficient



100Ω/4w ± 3.5 mΩ ± 5 mΩ 1.4x better ± 92 µΩ/°C ± 700 µΩ/°C 7.6x better

1 GΩ/2w ± 60 kΩ ± 20 kΩ 3x worst ± 2.5 MΩ/°C ± 4.0 MΩ/°C 1.6x better

Digitizer 2 year accuracy Flatness error


[18-28]°C [18-28]°C PXI vs. Bench top 340 kHz BW na PXI vs. Bench top

Voltage 1.8 MS/s na na ± 0.014 dB na na

Current 1.8 MS/s na na ± 0.01 dB na na

AC V 2 year accuracy Temperature Coefficient



10 V @ 1 Hz ± 12.5 mV ± 15 mV 1.2x better ± 100 µV/°C ± 800 µV/°C 8x better

10 V @ 100 kHz ± 40 mV ± 33 mV 1.2x worst ± 600 µV/°C ± 800 µV/°C 1.3x better

DC I 90 day accuracy Temperature Coefficient



1 µA ± 360 pA na na ± 26 pA/°C na na

100 µA ± 9.1 nA ± 35 nA 3.9x better ± 1.1 nA/°C ± 7.2 nA/°C 6x better

2 A ± 870 µA ± 1280 µA 1.4x better ± 24 µA/°C ± 126 µA /°C 5x better

Technology advances continue to provide new features that make

the oscilloscope more useful to engineers. One of the most significant

transformations of the oscilloscope is its transition into the digital

domain, enabling powerful features such as digital signal processing

and waveform analysis.

Today’s digital oscilloscopes include a high speed, low resolution

(typically 8 bits) analog-to-digital converter (ADC), defined controls,

displays, and a built-in processor to run software algorithms for

common measurements.

Modular Instrument based digitizers, on the other hand, leverage

the latest processing power and high resolution display available

from a PC, while providing all the other features that comprise an

oscilloscope. As a result, they are used not only for oscilloscope

measurements, but also as spectrum analyzers, frequency counters,

ultrasonic receivers, and other customer measurements.

Standalone oscilloscopes are vendor-defined while Modular

Instrument digitizers are user-defined and flexible in the applications

they can solve. A benchtop oscilloscope provides many of the standard

functions that are common to the needs of engineers. As you can

imagine, these standard functions will not solve every application,

especially for automated test applications. If custom measurements

are required, a modular digitizer provides more options.

AC V 90 day accuracy

Comparison

PXI Benchtop PXI vs. Benchtop

Bandwidth 300 MHz 300 MHz =

Sampling rate 1 GS/s/2ch. or 2GS/s/1ch. 2.5 GS/s 2.5x worst

Vertical resolution 8 bit 9 bit 1 bit less

Accuracy 1V ± 2.3 % ± 2 % 1.2x worst

Time base accuracy ± 25 µHz/Hz ± 20 µHz/Hz 1.3x worst

Maximum record length 100,000 10,000 10x better

5.2. 300 MHz Oscilloscope


technicalpaper

6. Basic Calibration Requirements - Maintain traceabilityThe Modular Instruments transition from basic measurement low

accuracy to high performance measurement instruments happened

gradually over the course of several years. Some organizations and

users still have the misconception that they don’t need traceability

to the SI units and periodic calibration for them. At the same time

they evaluate the measurement results provided by their non-

calibrated instruments and make decisions about the quality of

their products. This oversight is potentially damaging for the long

term reputation of the user and extremely costly in the short term,

in case of a product recall or a stop shipping notice.

Several factors contributed to this dangerous misconception:

• A relatively long transition period from low accuracy to high

accuracy measurement instruments

• Perception of Modular Instruments as a digital computer boards

• The remote location of the PXI chassis and modules in the plant

• Lack of front panel controls

• Measurements are available in a computer monitor

• Presentation of the measurement results, after mathematical

treatment in a graphic form or a PASS/FAIL indication.

• Misleading messages from less informed sales representatives

that their boards never need verification. Their measurements

are solid as a rock, trust us!

PXI Modular Instruments measurement performance and

accuracy is comparable to the equivalent benchtop instruments

and need to be treated as such.

The process used to verify these instruments must:

• Check directly or indirectly all critical functions and

measurement capabilities

• Use a methodology that achieves the required uncertainties

under specific conditions

• Have an adequate uncertainty analysis

• Have an unbroken traceability chain to the SI units

• Be performed under controlled and repeatable conditions

7. Understanding Chassis MaintenancePXI systems are used in a wide range of applications including

benchtop, rack-mount and embedded setups. In each case we must

consider the system’s ambient temperature, cooling clearances

and power quality.

7.1. Chassis Airflow and CoolingThe ambient temperature of a PXI system is defined as the

temperature at the chassis fan inlet (air intake). This air intake

is usually located either at the rear or bottom of the chassis. If

the PXI chassis is setup as a benchtop instrument, a simple room

temperature measurement is a good estimate of its temperature. If

it is rack mounted the same measurement may not be the actual

ambient temperature of the PXI system due to heat dissipation

from surrounding equipment.

Adequate ambient temperature evaluation is a concern for rack-

mount deployments. If the PXI system is deployed in a rack there

are several guidelines that should be considered:

• Where possible place high power units above the PXI system(s).

• Use rack fan trays, at the top, at the bottom or both, depending

on power dissipation requirements.

• Design you rack layout to avoid abrupt temperature variations

• Strictly follow chassis cooling clearances requirements

Adequate cooling clearances are fundamental to keep the ambient

temperature of your PXI system stable and within the specifications

for all of the system components. The chassis must be installed in

such a way that the cooling clearances meet the specifications stated

in the manufacturer’s manual. A common clearance specification

Figure 6 – Example of PXI instruments and chassis.

Figure 7 - The ambient temperature of a PXI system is defined as the tem-perature at the air intake, which can be on the rear or bottom of the chassis.

Figure 8 - An example of two PXI 18-slot chassis rack-mounted with the required 1.75 in. (1U) of cooling clearance above each chassis.


technicalpaper

for a PXI chassis with a rear air intake and top/side exhaust is a

minimum of 3 in. of clearance from the air intake on the rear of the

chassis and 1.75 in. (1 U) of clearance above and on the sides of the

chassis. The figure below shows an example of two 18-slot chassis

with the required 1U of clearance above each chassis.

7.2. Power QualityLike any other measurement instrument, the quality of the power

provided to the PXI system it is very important, it should have

low noise and distortion. It must be properly grounded, to a high

quality ground, either through the power cord or the chassis

grounding screw.

7.3. Calibration laboratory deploymentEven in a well controlled calibration laboratory environment,

either a benchtop or a rack mounted configuration can benefit

from the application of few simple techniques to improve the

cooling performance and temperature stability of the chassis.

• Filler panels – Empty slots must have filler panels installed to

attain the chassis temperature specification.

• Slot blockers – Install slot blockers on all unused chassis slots

to reduce air flow bypass and improve airflow through the

installed devices

• Fan speed selector – If the chassis has a fan speed selector with

AUTO option select a constant speed adequate for the chassis

power load, instead of the AUTO option.

8. Calibration Environmental ConcernsThere is some discussion about how PXI instruments should be calibrat-

ed. Some believe that they should be externally calibrated in situ with its

chassis and the other companion instruments. Others feel that it is ac-

ceptable to send the individual instruments to the calibration laboratory.

The more advanced PXI instruments use a self calibration function

to compensate for the majority of temperature effects. Temperature

impact that is not compensated for by self calibration is included in the

full operating temperature range accuracy. Based on these premises,

PXI instruments can be adjusted and/or calibrated independently of

the chassis and companion instruments in the normal calibration

laboratory environmental conditions. The calibration laboratory

should follow the recommendations of paragraph Understanding

Figure 9 - Slot blockers can improve the cooling performance of PXI chassis by reducing air flow bypass.


technicalpaper

chassis maintenance concerning all aspects of air flow, cooling,

laboratory deployment and power quality.

Once the instrument is reinstalled in its usual measurement

deployment it should reach a stable operating temperature for the

period recommended by the manufacturer before a self calibration

is performed. Moving an instrument from one slot to another in

a PXI chassis is equivalent to moving a conventional instrument

from one room to another. The self calibration, in most cases, is

valid within a defined temperature range from self calibration; for

example Tcal ± 1 °C or Tcal ± 3 °C .The PXI chassis temperature

can be monitored regularly to decide if another self calibration is

required to compensate for temperature variations.

Specific measurement applications and chassis loads (e.g.

chassis with high accuracy measurement instruments along with

switching high power boards) may require closer monitoring Most

Modular Instruments have an onboard temperature sensor that is

used to monitor instrument temperature.

9. Software driver impact on Adjustment and CalibrationThe hardware is the body of a Modular Instrument while the

SW driver is the brain, the smallest error in the driver can have

a significant impact in the behavior and performance of the all

instrument. When performing an adjustment the SW driver:

• Interfaces with the standard to obtain the its assigned value

• Interfaces with the Unit Under Test (UUT), to obtain the readings

• Performs mathematical computations using more or less

sophisticated algorithms

• Stores the adjustment constants in the UUT

After an adjustment it is fundamental to run a comprehensive

calibration/verification procedure to confirm that the adjustment

constants were properly calculated and saved in the instrument

hardware.

10. Software driver updatesUnlike conventional instruments which firmware is seldom

updated, Modular Instruments software drivers may be regularly

updated to improve the performance, add functions and features,

or keep the instrument up to date with different communication

standards and computer software. In principle it is a good practice

to use the latest instrument driver, however any update should be

considered carefully.

Most manufacturers publish, along with the driver release,

a detailed description of the changes and their impact on

the instrument. If any of these modifications are related to

the measurement functions of the instrument, it may be

advantageous to consider performing an external calibration

with the new driver before the instrument is put into service.

Many times these updates don’t have any impact in the

measurement process and the driver update can be done with

confidence and without an external calibration.

When a Modular Instrument is sent for external calibration the

user must verify if the driver used by the calibration laboratory

matches the user’s driver. If not an impact evaluation should

be performed.

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technicalpaper

Case 1 - The calibration laboratory driver version is newer than the user’s

• Determine how many driver revisions were released between

your driver revision and the calibration laboratory driver.

• Carefully read each revision release document to find if any

impacts the instrument measurement functions.

• If none has impact on the measurement functions you can

accept the calibration and should consider updating your system

to the newest driver.

• If one or more has impact on the measurement functions there

are two options:

° Update your system to the calibration laboratory current driver

and accept the calibration.

° Request the calibration laboratory to perform the calibration

with a driver that matches the user’s revision number. We do

not recommend this approach because it is almost impossible

for the calibration laboratory to keep copies of all previous

drivers’ versions for all instruments.

Case 2 - The calibration laboratory driver version is older than the user’s

• Find how many drivers revisions were released between your

driver and calibration laboratory driver.

• Carefully read each revision release document to find if any

impacts the instrument measurement functions.

• If none has impact on the measurement functions you can

accept the calibration.

• If any has impact on the measurement functions reject the

calibration and request a new adjustment and verification done

with the most current driver.

When performing Modular Instrument external calibration it is

fundamental to keep track of the software driver revision number

for future reference.

The calibration laboratories and users are encouraged to use

the latest driver revision to maintain compatibility and the

instruments’ performance at their best.

11. Adjustment constants protectionMost PXI manufacturers recognized that the measurement

instruments need to be protected from unintended or unauthorized

adjustment, to fulfill this requirement an adjustment password

protection and time stamp should be available.

12. Modular Instruments interchangeabilityThe interchangeability of modules is one key to the success of

Modular Instruments. Vendors design Modular Instruments to

operate within specification regardless of Computing System,

Chassis and slot within the chassis, as long as the operating

requirements are met. For the customer this makes it more

convenient to return only the Modular Instrument for service.

For the laboratory this means an investment in the appropriate

computing systems and hardware.

References

1. PXI alliance www.pxisa.org

[email protected]

Who do you call when your testequipment requires service?

Trescal, who else?Trescal is a worldwide leader for the calibration and repair of test, measurement,

and diagnostic equipment with an extensive range of solutions for the management of equipment and measurement processes.

Simply stated, “We do it all.”Call 810.225.4601 today and visit trescal.com for the answers

to all your test equipment repair needs and more.

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United States: Atlanta 678.965.4660 l Baltimore 410.337.0687 l Charlotte 704.987.4300 l Chicago 847.718.0172 Cleveland 440.442.8080 l Dallas/Ft. Worth 214.591.8300 l Detroit 810.225.4601 l Houston 281.242.2957

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4243 Metrologist 2015_4139 Metrologist 2015 6/16/15 10:23 AM Page 1

http://www.pxisa.org/


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2016 NCSLI WORKSHOP & SYMPOSIUM

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regionalnews2016 CALL FOR PAPERSThe NCSL International 2016 Workshop & Symposium theme is Measurement Accuracy and the Impact on Society. Measurements in science are important because they are used to express results and make conclusions for just about everything; therefore accuracy is crucial. Even the slightest error in measurement can render impractical data.

Accurate measurements not only impact us through technological innovations, but also through other aspects of our lives. For example, accurate measurements are needed as they ensure that the weight and volume of goods sold in the market are correct, thus maintaining a fair playing field between competitive buyers and sellers.

Please consider sharing your metrological experiences regarding Measurement Accuracy and the Impact on Society.


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manufacturers. One turnkey package includes the VNA, signal generator, microwave power

standards, software and accessories for immediate productivity.

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Consumers Energy offers Phasor Measurement Unit (PMU) Type Certification ServicePMU hardware is based on proven technology and is used to gather and act on information in an automated fashion to improve the

efficiency, reliability, economics, and sustainability in the production and distribution of electricity. Phasor Measurement Units (PMU’s)

are at a minimum, synchronized 3 phase data acquisition systems that are able to sample electrical grid current, voltage, phase, and

frequency. Communication is accomplished in packets which contain command, configuration, data, and header frames. Data rates can

be as fast as 50 (50Hz) and 60 (60Hz) frames per second. The data acquired by PMU’s is orders of magnitude in speed and resolution better

than legacy Supervisory Control and Data Acquisition Systems (SCADA).

Interoperability across manufacturer and product lines is a fundamental requirement to ensure data integrity.

The new certification service provides complete type acceptance testing of PMU’s to IEEE C37.118 Standard for

Synchrophasor Measurements for Power Systems and the associated IEEE Synchrophasor Measurement Test

Suite Specification which stipulates acceptance criteria, test methods, and measurement uncertainty.

Consumers Energy- Laboratory Services in Jackson, Michigan became an IEEE Authorized Testing

facility for the IEEE Sychrophasor Certification Program in May 2015.

www.laboratoryservices.com

New ProductsandServices

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newproductsandservices

New Series of Precision Fluid BathsGuildline Instruments is pleased to announce the release of a new 5600 Series of Precision Fluid Baths. The

Company has been making the most stable and reliable fluid and oil baths since its incorporation over 58

years ago. In recent years many customers have approached Guildline requesting that we develop a new

line of high performance fluid and oil baths for metrology and oceanography applications with better

performance and a modern user interface.

As a result, Guildline has developed unique features and functionality that make the 5600 Series the

best Fluid Baths now and for the future. This Series of Fluid Baths is designed for both electrical metrology

and oceanographic applications and can be used with oil, water, salt water, and other liquids. These high

precision fluid/oil baths provide uniform, constant fluid temperature over a range from -5°C to 55°C with a

unique laminar flow, and with stability as low as ±0.001°C. Three convenient sizes are available: 50 Liters,

75 Liters, or 100 Liters; all containing a proprietary EMI Shielded Fiberglass tank that is corrosion resistant.

[email protected] | 800-310-8104 x104

New Benchtop Pressure Controller Provides a Standalone Solution to 3,000 psi (200 bar)Yorba Linda, Calif., Jul 1, 2015–Additel Corporation introduces their new ADT780 series benchtop pressure

controllers with precision accuracy to 0.005% of reading + 0.005% FS. The ADT780 configurations have the

unique capability of generating pressure to 3,000 psi (200 bar) without the aid of a gas supply. By utilizing

an electric pump this unit produces pressures to 1,000 psi (70 bar) and with an electric pump and gas

booster to 3,000 psi (200 bar).

Each unit comes with one Intelligent Pressure Module configured to the many range offerings provided.

Standard accuracy sensors are certified with a 1 year accuracy of 0.02% FS. The precision quartz-based

sensors improve the 1 year accuracy specification to 0.005% of reading + 0.005% FS. Each unit contains

process calibrator functionality with HART® and Profibus PA communication capabilities.

The Additel 780 series offers two base ranges: to 1,000 psi (70 bar) and to 3,000 psi (200 bar). The base

range establishes the maximum controlling range of the controller. Each configuration includes a control

sensor in which is preselect to the range best suited for the application need. External and internal sensors

can be used which allows for expanded range and accuracy capability in the future.

Mensor Releases CPC4000 Industrial Pressure ControllerSan Marcos, Texas – July 23, 2015, Mensor announces the release of the CPC4000 Industrial Pressure Controller.

The CPC4000 Industrial Pressure Controller represents the most recent advancement in an affordable, entry-level pressure controller for

the calibration and instrumentation industry.

Key features include:

• Custom pressure ranges from 1 to 3045 psi

• Up to two transducers with auto-ranging

• Barometric reference for emulation

• 0.02% accuracy

• Fast and stable control

• Optional contamination filter

This product features a modern intuitive user interface and a price that will fit your budget. The CPC4000 stands out for its ease of

use, versatility and affordability. In addition, custom transducer ranges make it configurable to your specific requirements. Remote

communication to a computer is achieved via IEEE-488, RS232, USB, Ethernet or optional WiFi.

The Mensor CPC4000 Industrial Pressure Controller gives the user ultimate control and versatility at an affordable price. It provides an

automated way to maintain pressure for calibrating and testing pressure gauges, transducers, transmitters or other pressure sensing instruments.

www.mensor.com

Send your Product or Service announcements to: [email protected]

http://www.mensor.com

The HPC40 Series is the world’s first combined pressure

and mA loop calibrator to be fully temperature compensated

from -20 to 50° C. You can count on the same accuracy whether measuring pressure,

current, voltage, or temperature.

The HPC40 Series is the world’s first combined pressure

and mA loop calibrator to be fully temperature compensated

from -20 to 50° C. You can count on the same accuracy whether measuring pressure,

current, voltage, or temperature.

0.035% of Reading Accuracy

Gauge, Absolute, and Differential Pressure to 15,000 psi / 1000 bar / 100 MPa

Advanced Simplicity “Non-Menu” Interface

Measure & Source mA with External Loop Power or Internal 24 VDC Power Supply

High Accuracy Thermometer with “True Ohm” Technology

Store & Recall Previously Used Screens

Flexible Power Options Including Rechargeable

0.035% of Reading Accuracy

Gauge, Absolute, and Differential Pressure to 15,000 psi / 1000 bar / 100 MPa

Advanced Simplicity “Non-Menu” Interface

Measure & Source mA with External Loop Power or Internal 24 VDC Power Supply

High Accuracy Thermometer with “True Ohm” Technology

Store & Recall Previously Used Screens

Flexible Power Options Including Rechargeable

CrystalXP2i

CrystalnVision Lab

JOFRAASC-400

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JOFRARTC Series

M & GPKII


Brian KingGulf Coastregionalnews

JM Test Systems located in Baton Rouge,

Louisiana, graciously hosted the NCSLI

Gulf Coast Section Meeting on April 28th,

2015 at their new electrical safety testing

laboratory. After a brief meet-and-greet, the

meeting was kicked off at 9:00 by the Section

Coordinator Brian King of A2Research. He,

and the President of JM Test Systems Mr.

Scott Morrison, welcomed the 26 attendees

and briefly went over the day’s agenda before

introducing Dr. Hy Tran.

Dr. Tran, Sandia National Laboratories

and the NCSLI Central Division VP, gave

the NCSLI Board of Director’s update

and encouraged everyone to attend the

upcoming NCSLI Conference to be held in

Grapevine, Texas.

Mike Scott, of The Modal Shop was

next on the agenda. Mike gave a 45

minute presentation on the “Calibration

and Verification of Vibration Protection

Systems.” His presentation touched on the

advantages and challenges that exist in the

calibration process.

After a short break, the attendees enjoyed a

tour of JM Test Systems new Electrical Safety

Laboratory and the Metrology facilities.

Many compliments of the size and scope

of the facilities were shared by many of the

participants.

Next, we broke for a wonderful lunch

which was graciously provided by JM Test

Systems. The Jambalaya was highly talked

about and enjoyed by all!

Next up was Jason Dewar of Fluke

Calibration who gave an informative

presentation on the “HART Communication

Protocol.” He provided a brief history

of the origins of the protocol as well as

outlining the advantages associated with

the technology.

Our final presentation was given by

Richard Roddis of Fluke Calibration, whose

topic was of special interest to those in

attendance. His presentation was entitled

“Fluke’s Artifact Calibration and Its Use in

Calibration of 8.5 Digit DMM’s.” Richard

was able to give the attendees the necessary

tools in which to analyze their own use

scenarios and perhaps take advantage of 24

hour specifications or 90 day specifications

of laboratory standards that they may

already have.

The day was concluded with a group

photo and a thanking of all in attendance

for their participation, the speakers for

their contributions, and JM Test Systems

for hosting this very successful meeting.

[email protected]

Gulf Coast Meeting.


regionalnews

Beverly Garcia

University of Alabama Huntsville (UAH) Shelby Center for Science

and Technology, once again, proved itself to be an excellent venue

for the Huntsville Section spring meeting on April 30, 2015.

After morning announcements by coordinator Beverly Garcia,

Mark Lapinskes, NCSLI Division VP delivered a Board of Directors

update and information on the upcoming conference.

Meeting presentations featured:

Topic: High Resistance Measurement SystemsMike Frisz, Measure-

ments International

Topic: Good Weighing Practices

Ian Ciesniewski, Mettler Toledo

Topic: Fluke’s Artifact Calibration and its use in Calibration

of 8.5 Digit DMMs

Richard Roddis, Fluke Calibration

Topic: Calibration & Verification of Vibration

Protection Systems

Mike Scott, The Modal Shop

Topic: Understanding the HART Protocol –

Communication vs. Calibration

Jason Dewar, Fluke/Martel

Following the meeting we held an open forum

where attendees were given the opportunity to

discuss NCSLI membership participation and

how it relates to their workplace.

Breakfast and lunch were provided by

Pinnacle Test Solutions, Southern Market-

ing Associates, Keysight Technologies,

Tegam, and JM Test Systems, Inc

After door prizes the meeting was adjourned.

The Huntsville Fall Section meeting is tentatively scheduled for

November 19, 2015.

[email protected]

Mike Frisz.

Ian Ciesniewski. Richard Roddis.

Mike Scott. Jason Dewar.

Huntsville




The Los Angeles/Orange County Section 1422 meeting was held

on May 12, 2015 at Transcat in Fullerton, California. A total of 44

participants were in attendance. This event covered a range of topics

relating to improving uncertainty, quality, and measurements. Tours

of the Transcat laboratories were conducted throughout the meeting.

After a brief welcome by Jon Sanders, the Los Angeles/Orange

County Section Coordinator, Jack Somppi, the NCSLI Western

US Division VP, provided an introduction to NCSL International

and board update. Jack’s presentation covered an update on board

meetings, NCSLI membership benefits, and divisional highlights.

Of particular interest were the upcoming events, namely the 2015

NCSLI Workshop & Symposium in July.

After the host introduction by Tim Mason, Howard Zion, Director

of Service Application Engineering, Transcat, started the technical

portion of the meeting covering In Tolerance Non-Conformance

Investigation. Many presentations focus on out of tolerance (OOT)

non-conformance investigation and the steps required to ensure

the results are not biased. Howard explores the conditions where

and instrument could be believed to be in tolerance but actually

have a negative impact on the process it is used in. Guard banding

and decision rules were discussed within this presentation.

Following Howard, Jack Somppi, Business Development

Manager, Measurements International, presented “Taking the

Ohm from the SI to the Workbench to Benefit Industry.” Jack’s

presentation reviewed the standards, instrumentation, and

measurement techniques that support resistance through ranges of

more than 20 orders of magnitude with the best possible traceable

measurement uncertainties. He also presented an overview of

Jon Sanders

LA Orange County

LA Orange County Meeting.

regionalnews


regionalnews

metrology equipment ranging from the intrinsic standard for

resistance, through primary to secondary and working standards.

During lunch Bob Stern, chair of the NCSLI 174 Standards

Writing Group and currently employed by Keysight Technologies,

presented on “Leveraging Automation to Assure the Quality of

Calibration Results and Why It Matters.” He provided several

examples of how Keysight has recently been able to apply near

real-time statistical analysis for quality process control in their

calibration labs which has resulted in significant improvements

when combined with periodic proficiency testing. He discussed

how the process works and provided data from examples of their

quality monitoring.

In the afternoon Marty Conway, Regional Sales Manager,

Fluke Calibration discussed “How to Know Your Temperature

Probe is in Tolerance and How to Keep It in Tolerance.” Marty

discussed temperature probe drift, probe types, and causes for drift.

He showed the ins and outs of As Found data and determining

tolerance status of temperature probes. Clear instructions for

calculating tolerance status will be given plus some helpful tips on

how to keep temperature probes in tolerance.

Chester Franklin, Franklin Training Group presented on the topic

of “Establishing a RAMP,” which stands for Risk Assessment and

Mitigation Plan for calibration laboratories. Chester showed a tool for

risk analysis called Failure Mode and Effects Analysis (FMEA). FMEA

was one of the first systematic techniques developed by reliability

engineers for analyzing risks in order to ensure the reliability of

processes and operations. Usually thought of as a manufacturing or

engineering design too it is applicable to calibration laboratories as

well. The first step in using this tool is an understanding of what is

meant by Failure Mode. After that it is relatively easy to identify failure

modes, in other words incidents that could cause failures. The FMEA

tool provides ways to evaluate and rate the effects of failures, and the

criticality of those effects, and then how to prioritize preventive and/

or corrective actions to mitigate those effects.

To wrap up the meeting door prizes were provided complements

of NCSLI, Additel Corporation and Keysight Technologies.

Exhibitors included Additel Corporation, AssetSmart, Fluke

Calibration, International Accredition Service (IAS), King Nutronics

Corporation, Measurements International, Rotronic Instrument

Corporation and Wilmington Instruments.

The Los Angeles/Orange County Section would like to thank all

the exhibitors for supporting this event. The presenters for their

time and knowledge, and Transcat for their facility - they did a

fantastic job!

We are very excited for our next section meeting which is

scheduled for November 11, 2015 in Los Angeles, California at

Baxter..

[email protected]

Tim Mason, Transcat.

Bob Stern, Keysight Technologies.


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regionalnews

The New England region held its spring meeting on

May 13, 2015 in scenic Pepperell, Massachusetts.

Our host was Masy BioServices, a provider to the

pharmaceutical, medical device, biotechnology,

and regulated industries markets. Breakfast was

provided by ProTEQ Solutions.

Our first speaker was Elizabeth Carbonel-

la. Elizabeth is a Senior Accreditation Officer

for the American Association for Labora-

tory Accreditation (A2LA). She regularly

conducts training, on behalf of A2LA, for

CABs, assessors and users of accredit-

ed organizations on a variety of top-

ics related to the ISO/IEC 17025 and

ISO/IEC 17020 standards.

Elizabeth provided a mini-tutorial

on “Root Cause Analysis.” She

introduced terms associated with

root cause analysis, and provided

clarity on when a root cause

analysis is required. We were

provided tips and tools for

performing root cause analysis.

Pitfalls and common mistakes

in performing a root cause

analysis were also illustrated.

Real-world examples were sited, and methodology was discussed

in providing objective evidence to resolve issues. The importance and

processes of monitoring corrective actions were advanced as well.

Elizabeth provided an introduction and illustration of tools that

should be used in a root cause analysis. These included techniques

in interviewing, the concept of fish bone diagrams, and the “5

whys” to identify a root cause.

A non-metrology example of how to use the “5 whys” was

illustrated as follows; A person borrows a bicycle from a friend

to use for training for a bike run. The back tire goes flat (and it

happens multiple times).

Tim Cooke

New England

Elizabeth Carbonella.

New England Meeting.



regionalnews

The first “why” is why did it go flat? The short answer is there

was a hole in the tube. The person borrowing the bike replaces the

tube. But to find out the reason(s) it keeps happening, there is a

second “Why.” That is, “Why is there a hole in the tube?”

This leads to group discussion. Was there a nail or foreign object

found in the tire? Was there enough air in the tire? What were the

road and environmental conditions?

Elizabeth taught us that by asking the right questions, and not

being satisfied with just the obvious answer to the first “why,” you

can find the root cause!

George Rodriguez, PhD, Senior Scientific Manager for Artel,

then provided a presentation on “Value Stream Mapping.” Artel is

introducing a new volume measuring instrument that is based on

air space compression and the ideal gas law. It is an interesting

technology, and Artel is in the process of value stream mapping to

identify how metrology activities add value to the customer for this

product. This includes the efficient application of standards, defining

the calibration and testing processes, and adding value of importance

to the customers for this new product. The process, and what Artel

has learned in applying value stream mapping, with particular

emphasis on the metrology component, was reviewed. We were

able to have some group discussions on bringing this value to the

customer... and were afforded the opportunity of putting ourselves

in the customer shoes, to know what is really important to them.

Eliminating showstoppers, or roadblocks, to the process of providing

desired results to the customer was an important part of the dialogue.

After a hearty lunch (graciously provided by our hosts at Masy

Bioservices), George Rodriguez continued at the podium with a new

topic “The Business Case for Developing and Observing Voluntary

Standards.” George related that an ISO document for specifying

and testing volumetric performance of automated liquid handling

systems had recently been developed. It was an interesting case study

of 18 different parties (inclusive of manufacturers, end users and third

party services) getting together to find common ground and come up

with a “prototype standard” that would benefit all stakeholders. The

concept of International Workshop Agreements (IWA) was discussed.

Those who participated had to weigh the cost of participation against

the benefits. This session discussed key technical outcomes and what

remained to be done. The advantages, as well as potential drawbacks,

of participating in such a process were included in group deliberation.

Cesar D. (Jun) Bautista, Jr. PhD, Senior Director of Laboratory

Operations at Masy BioServices rounded out a full day of learning

with his presentations. Discussed were recent updates, proposed

changes, and future initiatives in metrology regulations.

Jun acquainted us to the probable revisions to ISO 9001:2015.

These include the additional management responsibilities contained

therein. Management must ensure the risks that affect customer

satisfaction are identified. There is additional focus on fault

prevention... as opposed to correcting things after they go wrong.

The reason for the upcoming roll-out of the revised

ISO/IEC 17025 was also presented. The old standard references

many documents that are now obsolete. The proposed and updated

requirements contained in the new standard were also discussed.

Jun also provided highlights of the new RP-6 rewrite. Included

in the 5 year review will be revised table of contents, reference to

Good Automated Manufacturing Practice (GAMP), and relevance

to ISO/IEC 17025 and ISO 13485.

Jun delivered insight on the amendments to USP 41 /USP 1251.

Proper test weight values are the source of some confusion, so this

was clarified. Jun also shed some light on the topic of rounding

errors and resolution definitions for calibration of balances.

Lastly, the Guide for the Determination of Uncertainty in

Measurements (GUM) was deliberated. With dialog on the

concept of the unification of type A and B uncertainties and less

emphasis on degrees of freedom, there was interest in this topic

by all who attended.

A tour of the Masy BioServices facility was then made available

to the attendees.

We thank our host, and all the presenters, for what was a

very interesting and informative day to the over 30 industry

professionals in attendance. I hope to see you all again at the 2015

Workshop & Symposium, July 19-23 in Grapevine, Texas as well as

at our next regional meeting in October.

[email protected]

George Rodriguez. Jun Bautista, Jr.


Your comprehensive partner for cGMP production services.

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On April 21, 2015, a New York City Section Meeting was held,

and although there hasn’t been a meeting in this area for many

years, the scheduled topics for the presentations appeared to

resonate and drew attendees from around the region. Jennifer

Camarda, Premium Weighing Sales Specialist at Sartorius, worked

with Marcus McNeely, NCSLI Northeastern US Division VP, to

coordinate the meeting as well as host the meeting at Sartorius’

facility in Bohemia, New York. Jennifer also accepted the

nomination to become the NYC Section Coordinator.

The meeting featured the following three presentations and

then ended with a tour of the Sartorius facility.

First up was Edward Mulhern and Leon Chao, Mechanical Engi-

neers at NIST presenting “Towards the Definition and Dissemination

of a New International Mass Standard: Precision Metrology and the

Real World.” They discussed how NIST will realize and disseminate

a Planck constant based kilogram via the Watt Balance, the current

mass calibration system and its traceability to the official mass stan-

dard, the International Prototype Kilogram (IPK) and also appreciate

how the new SI affects science, industry and daily life. They even

displayed the Lego version of the Watt Balance (see group picture).

Scott Mimbs, retired NASA Metrology Program Manager presented

“Metrology and the Consequences of Bad Measurement Decisions.”

He discussed how measurement-based decisions flow through the

product lifecycle, how measurement decision risk can translate

to product risk and also identify the three essentials elements of

“good” measurement data.

Jennifer Camarda, Premium Weighing Sales Specialist at

Sartorius presented “USP Chapter 41: It’s Easier than You Think.”

She discussed the recent changes to the USP Chapter 41, including

revised terminology and calculations as it now defines repeatability

and accuracy, which now specifies the operating range of a balance

as well as offered recommendations on how to perform the test.

Examples were also shown to demonstrate different outcomes of

the operating range.

Sartorius supplies high-quality lab instruments such as

balances, mass comparators, pipettes and lab water purification

systems, as well as offers the widest range of consumables,

including filters, pipette tips and products for microbiological

quality control. “We look forward to our next New York City

section meeting.”

[email protected]

Jennifer Camarda

New York Cityregionalnews

New York City Meeting.


regionalnews

Come Tour the Trescal Dallas Calibration Laboratory and help us celebrate the

opening of our new facility!

As part of this year’s NCSL International Workshop & Symposium, conference theme “Measurement Science and the Quality of Life,” Trescal is sponsoring a tour of our new facility in Irving, Texas, just 15 minutes from the Gaylord Texan Resort and Convention Center.

When: ................................... Thursday July 23, 2015

Two Tour Times: ................ 11:00 a.m. and 12:00 p.m. Facility tour will be approximately 50 minutes with reception and open discussion following

Where: ................................. Trescal, 6601 Beltline Rd, Suite 140, Irving, Texas 75063

Cost: ...................................... $10.00 (Fee will be donated to the NCSLI Education fund).

Transportation: For your convenience, buses are available to pick up and return from the Gaylord Convention Center Circle lower-level underneath the exhibit hall. (You are welcome to drive to the Trescal facility to participate in either or both the tour and reception).

Activities Include:- Trescal Global Overview- Tour of Trescal’s Facility- See the Mitutoyo Measurement show room- New RF suite- TAM Online asset management overview

Register Today!www.ncsli.org


James Littlefield

Northern Ohioregionalnews

The Northern Ohio/Western Pennsylvania section held its spring

meeting on April 14th, 2015. The meeting was hosted by the

Keithley Instruments, Cleveland, Ohio. A special thanks to the

Keithley’s team and our contact Ralph Travise.

We started the meeting at 9:00 am with introductions of all

participates.

The first presentation, “Gage Error Studies” was presented by

Paul Mathews of Mathews Malnar and Bailey, Inc. Paul presented

a case study of hand held bore gages used to hold tight tolerances

on the large diameter bore of gears for Caterpillar. The studies

objective was to determine the best gage. Several old and new

gages were evaluated. The analysis of the data was surprising -

people’s prior opinions of the different measurement instruments

didn’t have any bearing on how the instruments performed. In the

end, the oldest gage should the least variation.

Ben Yurick, Design Engineer for Keithley Instruments, presented

concerns and issues with electronic equipment measurement

uncertainty specifications. Comparison and contrast of different AC

measuring techniques including traditional AC RMS converter IC’s

and digit sampling techniques utilized in today’s digital multimeters.

We uncovered accuracy differences, crest factor uncertainty, design

limitations, and calibration/verification challenges.

The morning sessions ended with a tour of Keithley’s Metrology

department. Ralph Travise, Quality Manage for Keithley, included

a description of Metrology Department’s role in supporting

Keithley instruments. Keithley team members describe the systems

at each test station.

At noon, participates were dismissed for lunch. Keithly provided

in-house dining facilities.

Dilip Shah, of E=mc3, provided training and hands on

demonstration of Proficiency Testing. Training include the need

for proficiency testing, current industry requirements, and an

explanation of some the options. Dilip divided attendees into

groups and dispensed artifacts. Groups then participated in a

proficiency testing study. Afterwards, Dilip analyzed the data and

presented results. A Q&A session followed.

The meeting wrapped up with Lloyd Baker, NCSLI Regional

Coordinator. Lloyd covered NCSLI Updates, held an open

discussion, including reviewing NCSLI‘s mission and recruited

volunteers.

Planning is underway for our next meeting in October 2015.

[email protected]

Dilip Shah.


regionalnews

The Southern Ohio/Kentucky Section held a meeting on 16 April

2015. The Ohio Department of Agriculture (ODA), Division of

Weights and Measures hosted the meeting at their Reynoldsburg

complex. The Bionetics Corporation, Newark Metrology

Operations, sponsored meeting refreshments and lunch for

attendees. Mr. Matthew Denslow, Bionetics Training Manager and

Section Coordinator greeted attendees. Mr. Daniel Walker from

the ODA Weights and Measures Division’s calibration laboratory

assisted with attendee registration and later provided a tour of

the laboratory. The day’s agenda began with Ms. Fran Elson-

Houston, Chief of the Weights and Measures division explaining

the many responsibilities of the ODA and the numerous divisions

of the campus. Next, Fran introduced the ODA Director, Mr.

David Daniels. Mr. Daniels welcomed attendees emphasizing

the importance that measurement plays to Ohio commerce. He

thanked Fran for all the great support she and her team provide.

I greatly appreciate Mr. Daniels taking the time from his busy

schedule to speak to our group. His doing so truly demonstrates his

understanding of the importance measurement plays to society.

Mr. Lloyd Baker, 1130 NCSLI Mid-Western Regional Coordina-

tor, presented the NCSLI Board of Directors’ meeting activities,

highlighted with the welcoming of our new NCSLI President Rog-

er Burton. Lloyd encouraged everyone to attend the upcoming

conference and tutorial program. Additionally, Lloyd discussed

the many current committee projects and asked anyone interested

to volunteer to help.

Mr. Warren Merkel Chief, National Voluntary Laboratory Ac-

creditation Program, spoke to the group next giving a presentation

titled, “From Paris, France to Paris, Ohio: The Role of International

Mutual Recognition Arrangements in Traceability.” Mr. Merkel’s

explanation of the International Bureau of Weights and Measures

(BIPM) and numerous subcommittees provided a clear insight to

their purpose. Mr. Merkel went on to describe the development

and interaction of the global regional metrology organizations.

Next, we discussed the purpose and role of the International Lab-

oratory Accreditation Cooperation (ILAC). Membership in ILAC

provides for the recognition of accrediting bodies and promotes

confidence in the services provided by an accredited member.

SouthernOhio/Kentucky

Matthew Denslow

Southern Ohio/Kentucky Meeting.



regionalnews

Concluding the presentation Mr. Merkel touched on how the Na-

tional Conference for Weights and Measures has influenced legal

metrology within the United States.

Mr. Dilip Shah, President E=MC3 Solutions Inc., again volunteered

his time for our NCSLI members with a presentation titled, “The

Impact of Legal Metrology on Everyday Life.” Dilip provided

examples of how conversion factors can influence the result and

of how not being aware of measurement uncertainty can critically

impact the consumer. In respect to measurement it is noted that

emphasis must be placed on the documentation of traceability.

Consumer confidence can be achieved through the purchase of

products and services from accredited vendors. Dilip pointed out

the various common components of a properly documented test

or calibration certificate. It is the responsibility of the purchaser to

ensure they have received all the information requested.

Following lunch, meeting attendees were given a tour of the

numerous campus facilities. We began with the calibration

laboratory. The laboratory is accredited to ISO 17025:2005 through

NVLAP and is certified by NIST to provide metrological traceability

for the State of Ohio. The laboratory’s scope of calibration and

measurement capabilities includes surveying rods and tapes,

mass determination and volume transfer. Weights and Measures

Division personnel are proud to operate one of four National Type

Evaluation Program (NTEP) laboratories. This laboratory evaluates

new scale designs and technology such as the automatic weighing

systems, point of sale scales and multiple dimensions measuring

devices. Next, the group visited the Animal Health Division where

we introduced to the necropsy laboratory, the animal disease

diagnostic laboratory and the infectious disease area. The group

then traveled to the Consumer Protection Laboratory. While

there we were introduced to the microbiology, pesticides, general

chemistry and analytical toxicology sections. These laboratories

support dairy and meat inspection and other food safety programs,

plant industry and the animal industry. Unfortunately we were

not able to visit the remaining divisions due to time constraints

but thanks for the tour.

[email protected]

Mr. Warren Merkel Chief, National Voluntary Laboratory Accreditation Program.

Imagine maintaining and protecting smart grid reliability through testing and calibration.

THAT’S US.

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Michael DuncanTennesseeregionalnews

The Tennessee Section of the NCSLI celebrated World Metrology

Day with a spring meeting at the Oak Ridge National Laboratory on

May 20. With over 64 registered attendees and several more drop-

in participants from the Oak Ridge National Laboratory’s research

and operations staff. Attendees also included several members of

the International Society for Automation (ISA) who were especially

interested in the field calibration topics and in developing closer

ties with the metrology laboratories. The meeting included several

excellent technical presentations on topics including, “High

Resistance Calibrations” Mike Frisz, Measurements International;

“Understanding OMIL Weight Classes” Ann Crowley, Rice Lake;

“Good Weighing Practices” Ian Ciesniewski, Mettler Toledo;

“Field Calibrations” Cliff Ambrose, Trescal; and “The Role of

International Mutual Recognition Arrangements in Traceability”

Barbara Belzer, NIST.

In addition to the technical presentations, the meeting

included an exhibit room where metrology equipment and service

companies and representatives were offered a first-come, first-serve

opportunity to exhibit their equipment and services. A total of 9

exhibitors participated in the exhibit hall opportunity with several

expressing interest in future opportunities. The exhibit room, the

continental breakfast (Compliments of Mettler-Toledo) and lunch

(Compliments of Beamex and Additel) provided an excellent

venue for networking and collaborating.

The meeting culminated with a tour of the Oak Ridge National

Laboratory’s Metrology Lab, where interest was high in some

unique measurement areas such as air velocity (wind tunnels),

laser Frequency/wavelength and the Echelon I mass lab as well as

the other primary-level measurement capabilities.

A post-meeting online survey is currently being conducted

and the feedback obtained in the survey will be used to identify

potential topics of interest for future meetings, identify venues

which may be beneficial to members and generally used to

improve future meetings.

[email protected] Tennessee Meeting.

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regionalnews

Chris KuczynskiTwin Citiesregionalnews

The Twin Cities NCSLI Section 1311 held their first meeting of the

year on May 7. We met at the St. Louis Park Community Center

where we’ve had several meetings. The event was sponsored by

Fox Valley Metrology, a longtime supporter and sponsor of the

NCSLI section! This full day event had four presenters, two of

which were from out of town. We had 66 attendees which is a bit

low for our section.

The first presenter was Dr. Michael Marcus from Lumetrics.

Dr. Marcus has over 37 years’ experience in the development of

metrology and measurement systems for manufacturing process

monitoring and control applications. He received his PhD in

Applied an Engineering Physics from Cornell University. He has

97 patents issued and is the inventor of the technology used in

the Optigauge®. Dr. Marcus presented “Non-contact light-based

thickness measurement, related applications and challenges.”

He explained the basics of the technology, it’s advantages and

limitations, and demonstrated some typical applications including

measurements of medical and ophthalmic devices. Lumetrics is

the manufacturer of the Optigauge® which was on display at the

meeting. Some of us were interested in the technology used in

the Optigauge®, but the majority was much more interested in

its application. It really is a remarkable measurement device in its

capability and accuracy (measurement uncertainty).

Barry Eisan from Vaisala presented next. Barry graduated from

Wentworth Institute of Technology with a Bachelor of Science in

Applied Physics. He’s been with Vaisala for 24 years and recently

changed positions from instrument sales to concentrate on sales

for Continuous Monitoring Systems. His presentation topic was

“Independent Environmental Monitoring System vs. Building

Automation System (BAS) for Validated Data Storage.” Barry

showed us the advantages and disadvantages of a BAS. Many if

not most manufacturers have some type of a BAS to manage the

environmental controls – at least temperature. Some are more

sophisticated than others. But a CMS, continuous monitoring

system, can provide the information at the accuracy you need

for validated data storage, particularly in life science businesses

Twin Cities Meeting.


regionalnews

(medical device, pharmaceutical manufacturers, etc.). In

particular, calibration labs need both a very accurate monitoring

system and precise control. The systems offered by Vaisala provide

the accuracy needed to monitor critical environments. In case

you hadn’t heard, Vaisala bought Veriteq and has integrated their

products into their systems.

Up next was Josh Zahorik from Burns Engineering. Josh is a

Design Engineer and the Calibration Lab Technical Manager.

He has had previous experience as a Design and Applications

Engineer for ProSpect Analytical NIR Technology, performed

process control for the Gluek Brewing Company, and graduated

from the University of Minnesota with a Bachelor’s Degree

in Material Science and Engineering, minoring in Chemistry.

Josh’s presentation, “Aligning Lab Results with Temperature

Measurements in Small Diameter Lines” covered the terminology,

available technologies, and the key factors in their selection and

installation so that the error between the laboratory and process

results can be minimized. Josh showed us that measurements

taken in the laboratory may not align with process measurements

for a given sensor due to a variety of factors. There were quite

a few diagrams to show what factors impact temperature

measurements in processes. The diameter of the line as well as

the placement of the sensor in the flow can make a significant

difference in the results.

The last presentation of the day was by Gary Meyer with J-G

Technologies. His background includes over 59 years of experience

in electronics, calibration, measurements, quality, radio broad-

casting/engineering, aircraft radio maintenance, airline simulator

maintenance, electrical test design, electronic sales, and technical

education in computers and metrology at Ridgewater College. He

also holds classes for his own consulting firm, J&G Technology,

provides technical support for WorkPlace Training customers, and

instructs courses for the QC Group in Minnetonka, MN. Gary’s

presentation, “Statistics and Math for Technicians,” provided in-

formation on the math requirements for ASQ exams such as Cer-

tified Calibration Technician (CCT), Certified Quality Technician

(CQT), and Certified Quality Engineer (CQT). He reviewed the

requirements for each and then began an in-depth explanation of

specific requirements for the CCT. Much of this would also apply

to other certifications. However, he covered specifics for the CCT

such as measurement uncertainty. Included were several videos of

how to use a TI-30X IIS calculator for some of the math.

It was a great NCSLI Section meeting with presentations and

product demonstrations. We are thankful for having such a large

and active section here in the Twin Cities. We are planning our

next meeting for September or October this year.

This was my last meeting as the Twin Cities Section Coordinator.

It’s been a great opportunity and I’m happy to have served the

local community. Corey Garbers with Martin Calibration will be

taking over the coordinator position.

[email protected]

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regionalnews

For our NCSLI Utah Section meeting, we met at the Utah State Space

Dynamics Laboratory which is a research and development arm of

Utah State University in Logan, Utah. It is a very applicable and

interesting place to meet because SDL has contributed significantly

to research efforts in space-born observations of earth’s atmosphere

as well as exploring galaxies with highly advanced IR detectors used

on satellites used to find asteroids, take high resolution images of

galaxies, among other scientific activities.

We started the day with Jack Somppi delivering a message of

greetings from the NCSLI Board of Directors including updates on

NCSLI activities and events. After that, we were excited to have

representatives from the Utah Department of Agriculture – Weights

and Measures Laboratory, Brett Gurney, Bill Rigby, and Shelley

Walker, present on their legal metrology program. It was interesting

to hear the huge impact they have in all our lives, most of which we

don’t even realize. It was really interesting to hear how the Weights

and Measures Lab recently made news in Utah. A few years ago they

had received several questions and concerns about scales being used

in the trade of precious metals. They began a program in 2013 to

visit all the precious metal traders in the state of Utah to check their

scales and work with them on making proper measurements. In the

first year they found that more than 62% of the scales were out of

tolerance. As they worked with the shops, providing education and

training, they were able to see that only 17% of scales were out of

tolerance in 2014. This was a great example of how metrology really

does make a difference in the world.

After lunch we were able to rotate through multiple demonstra-

tions provided by our meeting sponsors; Additel Corporation, Fluke

Calibration, and The Modal Shop. We learned how to make auto-

mated low-pressure measurements and automated accelerometer

calibrations. We also saw a demo on the importance of understand-

ing emissivity settings in IR thermometry.

Our afternoon technical presentation was provided by Mike

Dillon, a Product Group Manager, from The Modal Shop. He

spoke on calibration of dynamic sensors (accelerometers). It was

very interesting to see how different accelerometer technologies

work and the different ways of calibrating them. We were also

able to learn how accelerometers can be used for dynamic pressure

measurements as well.

We appreciate everyone who helped with this meeting,

especially Marla Richman at SDL who did a great job with getting

the facility set up for us and a nice catered lunch. She even picked

up a variety of Utah State Aggie ice cream for our afternoon snack!

[email protected]

Mike ColemanUtah

Utah Meeting.

regionalnews


Mons Lee

Washington/Oregonregionalnews

On World Metrology Day; present and fu-

ture scientists, engineers, and technicians

joined the celebration by attending the

NCSLI Northwestern Region “Measure-

ment Training Summit” held at Tektronix’s

scenic Beaverton, Oregon, Campus. The

overall goal of the meeting was to provide a

high quality measurement science summit

at minimal cost to attendees through mea-

surement practice tutorials, white paper

presentations, hands on demonstrations,

and lab tours.

As the new Washington/Oregon sec-

tion coordinator, this was my first time

planning and coordinating an NCSLI

meeting. I learned that planning and co-

ordinating a section meeting can be chal-

lenging, but having a good team to aide

in the meeting planning process can help

mitigate these challenges.

Our team consisted of measurement and

quality professionals working together from

the electronics and aerospace industries,

with Jennifer Fleenor of Tektronix taking

the lead on a variety tasks that significantly

supported our planning. Each team member

was able to bring a unique skill set to the table,

and contributed to the meeting by helping

obtain the venue and meeting sponsorship,

getting the word out to measurement

professionals and students, planning the

logistics of setting up the meeting space,

recruiting exhibitors to demonstrate their

latest and greatest measurement equipment,

and most importantly enlisting training and

knowledge transfer opportunities in the form

of tutorial and white paper presentations.

Without this team in place, the meeting

wouldn’t have been the success it was.

The meeting began with Randy Van

Wie of Tektronix welcoming attendees,

discussing safety, and giving a brief

overview of the scheduled Tektronix Service

lab tour. Following Randy was Jack Somppi

of Measurements International, and NCSLI

Division VP. Jack shared a brief summary of

the recent NCSLI Board of Directors meeting

including; revisions to ISO/IEC 17025, the

benefits of having an NCSLI membership

and the upcoming NCSLI Workshop &

Symposium in Grapevine, Texas.

I provided the final introductory remarks

by introducing World Metrology Day and

reinforcing why we have these meetings; to

learn, to try something new, and to network

with our fellow measurement and quality

professionals. Attendees then broke out to

pursue training, presentations, and get their

hands on measurement equipment.

Amongst the many interesting white

paper presentations and tutorials that

ranged from measurement systems analysis

to using water as the ultimate liquid density

standard, one presentation tied in directly

with the World Metrology Day theme,

“Measurements and Light.”

Brian Kenison of The Boeing Company

gave a tutorial on “Photometric Measure-

ments of a Light Meter.” Using a portable

measurement apparatus fabricated at home

that serves as a rugged replica of the lab ap-

paratus he uses at his Boeing metrology lab

in Seattle, Washington. Brian introduced at-

tendees to one of the more unique measure-

ment parameters in metrology, Photometry.

Northwestern Meeting.


regionalnews

He began by describing how Photometry is the science of light mea-

surement in terms of its perceived brightness to the human eye as a

subset of Radiometry, and defining and discussing common terms

to this measurement parameter; the candela, lumens, lux, illumi-

nance, photopic response, luminous flux, and the inverse square

law of light intensity. After introducing attendees to Photometry,

Brian used his portable lab apparatus to demonstrate how one goes

about calibrating a light meter using a calibrated lamp, screens, and

distances to provide measurement traceability for light intensity

measurements and why these measurements are important to the

manufacturing of aerospace products. Brian highlighted the role

light plays in our daily lives and their importance to our future.

To finish the meeting, we held a group discussion to thank our

presenters and demonstrators, discuss what people had learned

during the meeting, and get feedback on how to make future

meetings better. We also reached out to attendees to pursue acting

as hosts to future NCSLI meetings and encouraged them to spread

the word on the benefits of being an NCSLI member and attending

section and regional meetings. The goal of providing high quality,

high value measurement training to new and future measurement

and quality professionals was achieved thanks to our meeting

sponsors Tektronix and The Boeing Company, our planning team,

the presenters, exhibitors and NCSLI. Thanks again to everyone for

making the meeting a success! We are looking forward to more

meetings like this in the future.

[email protected]

Jay Skovbjerg of Anton Paar, discusses water as the ultimate density standard.

Jordan Hiller of JMP, presenting on Measurement Systems Analysis.

Randy Van Wie of Tektronix, pre-senting on Oscilloscope Bandwidth Measurements.

Jennifer Fleenor of Tektronix, discusses Internal Proficiency Testing.

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Reliable measurements have a fundamental impact on the quality of life of people on all levels of society.

What are the things required to improve the quality of our lives? Philosophically we think of more permanent things such as relationships. The physical aspects of quality of life, such as the air

we breathe, the water we drink, the food we eat, good health, the energy and resources we need to create wealth and prosperity, are also very important. Reliable measurements are

an integral requirement for the preservation, monitoring and enhancement of all these physical aspects required for the improvement of quality of life.

Measurements have an impact on our survival. The quality assurance performed on the production of the food we eat is based on measurement results.

Also the monitoring of ambient air quality and water quality depends on measurement results. Primary health care is based on measurements,

such as blood pressure, EKG, MR scans, etc.

Manufacturing and trade will not be possible without measurements, such as the dimensions of a spark plug , the octane number and volume dispensed by a petrol pump, the purity and accurate mass of an ounce of gold being traded on the stock exchanges of the world. Research and innovation also depends on an international system of units that are comparable between countries all over the world.

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