change of resistance test stand

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PROJECT MEMBERS: COLIN PAYNE-ROGERS JACOB LENNOX Change of Resistance Test Stand PROJECT GUIDE/MENTOR: DR. BENJAMIN VARELA PRIMARY CUSTOMER: JOE MANAHAN SPONSOR: COOPER CROUSE-HINDS

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Change of Resistance Test Stand. Project Members: Colin Payne-Rogers Jacob Lennox. Project Guide/Mentor: Dr. Benjamin Varela. Primary Customer: Joe Manahan. Sponsor: Cooper Crouse-Hinds. Project Description. - PowerPoint PPT Presentation

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Page 1: Change of Resistance Test Stand

PROJECT MEMBERS:COLIN PAYNE-ROGERS

JACOB LENNOX

Change of Resistance Test Stand

PROJECT GUIDE/MENTOR:DR. BENJAMIN VARELA

PRIMARY CUSTOMER:JOE MANAHAN

SPONSOR:COOPER CROUSE-HINDS

Page 2: Change of Resistance Test Stand

Project Description

Project Goal: To Design/Build a prototype test stand to measure the temperature of a maximum of 6 coils using a linear regression 4-wire resistance method.

Project Overview: The test stand will include but is not limited to a cart/apparatus, laptop with LabView, data acquisition hardware, control circuitry and switching hardware, power dissipation circuitry and hardware. The apparatus is intended to use LabView to allow the user to run the test with minimal intervention. The prototype will be tested at RIT at 120VAC due to safety concerns.

Page 3: Change of Resistance Test Stand

Project Description

Page 4: Change of Resistance Test Stand

Customer Specifications

Design and Build a Relay Circuit Operation: 120-480VAC, 50-60Hz Amphenol cable or similar connection Controls electrical power for the operation

Select and Purchase a Digital Multimeter Resolution: 0.01Ohms Able to be calibrated

Select and Purchase a Data Acquisition System

Additional temperature measurement using thermocouple

Page 5: Change of Resistance Test Stand

Customer Specifications

Write a LabView program for the test stand Communicate with and control measurement hardware Measure the resistance of a maximum of 6 coils

40 readings every 30 seconds (one reading at a time) Operator flexibility on coil selection (for measurements) Plot Resistance versus Time for each coil Make a Linear Regression of the data to calculate the temperature

of the data at the beginning of the test Store the data in up to 9 different portable format files Operator input: time, date, coil material Selectable functions: pre-run test, run auto-test, view results,

print results, terminate All of the components must be contained in a rolling

enclosure Test Stand must comply with UL 844

Page 6: Change of Resistance Test Stand

Meeting Priorities

Proof-of-Concept Experimental DesignExperimental resultsProposed prototype relay circuit designBill of MaterialsTest Plan

Inquire about laptop and LabView licensing

Page 7: Change of Resistance Test Stand

Experimental Circuit Design

Page 8: Change of Resistance Test Stand

Experimental Circuit Design

Page 9: Change of Resistance Test Stand

Experimental Circuit Design

Page 10: Change of Resistance Test Stand

Experimental Results

 Rc from DMM

not from DMM

Cooper

Rc (Ω) 4.1 3.66

Th (°C) 51.75 86.52

Rh (Ω) 4.57 4.57

RITRc (Ω) 3.801 3.361

Th (°C) 55.92 93.94

Rh (Ω) 4.3037 4.3037

 

Coil 1 Resistance (Ω)

Coil 2 Resistance (Ω)

Direct-to-Ballast 3.798 2.678Through Relay Circuit 3.801 2.677

Page 11: Change of Resistance Test Stand

Experimental Results

Page 12: Change of Resistance Test Stand

Relay Circuit Design

Page 13: Change of Resistance Test Stand

Bill of Materials

Accessory Vendor PNDescription Indv. Cost QTY Cost

PXI Chassis NI781162-01

NI PXIe-1073

$ 1,499.00 1

$ 1,499.00

Chassis Power Cord NI763000-01  

$ 9.00 1

$ 9.00

DMM NI780011-01 NI PXI-4065

$ 1,499.00 1

$ 1,499.00

Relay Module NI778572-66 NI PXI-2566

$ 1,080.00 1

$ 1,080.00

Relay Terminal Block NI

778717-66 TB-2666

$ 277.00 1

$ 277.00

System Assurance NI960903-02  

$ 310.00 1

$ 310.00

Power Circuit RelayMcMaster Carr 7230K91 4PST

$ 76.91 4

$ 307.64

Power Circuit Relay Allied Elec70198625 DPST

$ 10.07 1

$ 10.07

USB DAQ NI779051-01 USB-6008

$ 169.00 1

$ 169.00

Circuit Total   $ 5,160.71

Labtop       $ 500.00 1

$ 500.00

Labview Lisence NI     $ 999.00 1

$ 999.00

Miscellaneous     Cart etc. $ 1,000.00 1

$ 1,000.00

*Highlighted Boxes are approximate costs Total $ 7,659.71

Page 14: Change of Resistance Test Stand

Test Plan

Number Description

1

Test the ballast temperature/resistance measurements with a borrowed 4-wire multimeter but the updated relay circuit (using "final hardware" and one coil rather than "experimental hardware"). Show the exponential decay, and the difference in resistance measurements when measuring the ballast directly and through the circuit.

2

Test the ability to switch between different coil measurements using the NI switch, manually and automatically, and then verify the results from test #1 for the same coil when switching to the other coils inbetween each measurement (possibly taking all coil measurements)...with the borrowed multimeter still?

3

Show that initial measurements are capable of being taken within 5 seconds, and that all 6 coil measurements are capable of being taken at the required rate. This would be a final "proof-of-concept" test, showing that the LabView program can be used to measure 6 coils as quickly as needed and can spit out the correct data (data compared to #1). The NI multimeter used this time to show that it is calibrated as well as the borrowed multimeter.

4

Test the calibration routine by using a "correct" and "incorrect" calibration. The "correct" calibration for the calibration routine should give the correct ballast (room temperature) results while the "incorrect" calibration should offset the ballast resistance measurements? This test depends on the final method for calibration.

Page 15: Change of Resistance Test Stand

Timeline

Task Completed By

Select and Purchase Hardware End of Week 11 of MSD I

First version of LabView Code Completed (using simulated hardware)

End of Week 2 of MSD II

CAD Models (cart design) End of Week 3 of MSD II

Order Cart Hardware End of Week 4 of MSD II

Complete Testing with NI Hardware (not on cart)

End of Week 6 of MSD II

Assembled Electronics End of Week 7 of MSD II

Complete any other testing at RIT (120 VAC, with cart, full tests with LabView)

End of Week 8 of MSD II

End of Week 9 of MSD II

Finalize Senior Design Requirements End of Week 10 of MSD II