chapter 18 - 1
TRANSCRIPT
![Page 1: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/1.jpg)
Chapter 18 - 1
![Page 2: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/2.jpg)
Chapter 18 - 2
![Page 3: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/3.jpg)
Chapter 18 - 3
We will cover 18.1 – 18.13 and 18.15 – 18.23
TODAY• How are electrical conductance and resistance
characterized?
• What are the physical phenomena that distinguishconductors, semiconductors, and insulators?
• For metals, how is conductivity affected byimperfections, T, and deformation?
• For semiconductors, how is conductivity affectedby impurities (doping) and T?
Chapter 18: Electrical Properties
![Page 4: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/4.jpg)
Chapter 18 - 4
• Scanning electron microscope images of an IC:
• A dot map showing location of Si (a semiconductor):-- Si shows up as light regions.
• A dot map showing location of Al (a conductor):-- Al shows up as light regions.
Fig. (a), (b), (c) from Fig. 18.0, Callister 7e.
Fig. (d) from Fig. 18.27 (a), Callister 7e. (Fig. 18.27 is courtesy Nick Gonzales, National Semiconductor Corp., West Jordan, UT.)
(b)
(c)
View of an Integrated Circuit
0.5mm
(a)(d)
45μm
Al
Si (doped)
(d)
![Page 5: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/5.jpg)
Chapter 18 - 5
Electrical Conduction
• Resistivity, ρ and Conductivity, σ:-- geometry-independent forms of Ohm's Law
E: electricfieldintensity
resistivity(Ohm-m)
J: current density
conductivity
-- Resistivity is a material property & is independent of sample
ρ=Δ
AI
LV
σ =
1ρ
• Resistance:
σ=
ρ=
AL
ALR
• Ohm's Law:ΔV = I R
voltage drop (volts = J/C)C = Coulomb
resistance (Ohms)current (amps = C/s)
Ie-A
(cross sect. area) ΔV
L
![Page 6: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/6.jpg)
Chapter 18 - 6
Electrical Properties• Which will conduct more electricity?
• Analogous to flow of water in a pipe• So resistance depends on sample
geometry, etc.
D
2D IVARA ==ρ
![Page 7: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/7.jpg)
Chapter 18 - 7
DefinitionsFurther definitions
J = σ ε <= another way to state Ohm’s law
J ≡ current density
ε ≡ electric field potential = V/ or (ΔV/Δ )
flux a like area surface
currentAI
==
Current carriers• electrons in most solids • ions can also carry (particularly in liquid solutions)
Electron flux conductivity voltage gradient
J = σ (ΔV/Δ )
![Page 8: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/8.jpg)
Chapter 18 - 8
• Room T values (Ohm-m)-1
Selected values from Tables 18.1, 18.3, and 18.4, Callister 7e.
Conductivity: Comparison
Silver 6.8 x 10 7
Copper 6.0 x 10 7
Iron 1.0 x 10 7
METALS conductors
Silicon 4 x 10-4
Germanium 2 x 10 0
GaAs 10-6
SEMICONDUCTORS
semiconductors
= (Ω - m)-1
Polystyrene <10-14
Polyethylene 10-15-10-17
Soda-lime glass 10Concrete 10-9
Aluminum oxide <10-13
CERAMICS
POLYMERS
insulators
-10-10-11
![Page 9: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/9.jpg)
Chapter 18 - 9
What is the minimum diameter (D) of a Cu wire so that ΔV < 1.5 V?
Example: Conductivity Problem
100mCu wire I = 2.5A- +e-
ΔV
Solve to get D > 1.87 mm
< 1.5V
2.5A
6.07 x 10 (Ohm-m)7 -1
100m
IV
ALR Δ
=σ
=
4
2Dπ
![Page 10: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/10.jpg)
Chapter 18 -10
Callister 18.17
• A cylindrical metal wire 3 mm in diameter is required to carry a current of 12 A with a minimum of 0.01 V drop per foot (300 mm) of wire. Which of the metals and alloys listed in Table 18.1 are possible candidates?
![Page 11: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/11.jpg)
Chapter 18 -11
![Page 12: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/12.jpg)
Chapter 18 -12
![Page 13: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/13.jpg)
Chapter 18 -13
Electronic Band Structures
Adapted from Fig. 18.2, Callister 7e.
![Page 14: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/14.jpg)
Chapter 18 -14
Band Structure• Valence band – filled – highest occupied energy levels• Conduction band – empty – lowest unoccupied energy levels
valence band
Conductionband
Adapted from Fig. 18.3, Callister 7e.
![Page 15: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/15.jpg)
Chapter 18 -15
![Page 16: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/16.jpg)
Chapter 18 -16
![Page 17: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/17.jpg)
Chapter 18 -17
Conduction & Electron Transport• Metals (Conductors):-- Thermal energy puts
many electrons intoa higher energy state.
• Energy States:-- for metals nearby
energy statesare accessibleby thermalfluctuations.
+-
-
filled band
Energy
partly filled valence band
empty band
GAP
fille
d st
ates
Energy
filled band
filled valence band
empty band
fille
d st
ates
![Page 18: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/18.jpg)
Chapter 18 -18
Energy States: Insulators & Semiconductors
• Insulators:-- Higher energy states not
accessible due to gap (> 2 eV).
Energy
filled band
filled valence band
empty band
fille
d st
ates
GAP
• Semiconductors:-- Higher energy states separated
by smaller gap (< 2 eV).
Energy
filled band
filled valence band
empty band
fille
d st
ates
GAP?
![Page 19: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/19.jpg)
Chapter 18 -19
Charge Carriers
Two charge carrying mechanisms
Electron – negative chargeHole – equal & opposite
positive charge
Move at different speeds - drift velocity
Higher temp. promotes more electrons into the conduction band
∴ σ as T
Electrons scattered by impurities, grain boundaries, etc.
Adapted from Fig. 18.6 (b), Callister 7e.
![Page 20: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/20.jpg)
Chapter 18 -20
![Page 21: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/21.jpg)
Chapter 18 -21
Metals: Resistivity vs T, Impurities• Imperfections increase resistivity
-- grain boundaries-- dislocations-- impurity atoms-- vacancies
These act to scatterelectrons so that theytake a less direct path.
• Resistivityincreases with:-- temperature-- wt% impurity-- %CW
Adapted from Fig. 18.8, Callister 7e. (Fig. 18.8 adapted from J.O. Linde, Ann. Physik 5, p. 219 (1932); and C.A. Wert and R.M. Thomson, Physics of Solids, 2nd ed., McGraw-Hill Book Company, New York, 1970.)
ρ = ρthermal
+ ρimpurity
+ ρdeformation
T (°C)-200 -100 0
deformed Cu + 1.12 at%NiCu + 3.32 at%Ni
Cu + 2.16 at%Ni
1
2
3
4
5
6
Res
istiv
ity,
ρ
(10
-8O
hm-m
)
0
Cu + 1.12 at%Ni
“Pure” Cu
![Page 22: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/22.jpg)
Chapter 18 -22
Estimating Conductivity
Adapted from Fig. 7.16(b), Callister 7e.
• Question:-- Estimate the electrical conductivity σ of a Cu-Ni alloy
that has a yield strength of 125 MPa.
mmOh10x30 8 −=ρ −
16 )mmOh(10x3.31 −−=ρ
=σ
Yie
ld s
treng
th (M
Pa)
wt. %Ni, (Concentration C)0 10 20 30 40 5060
80100120140160180
21 wt%Ni
Adapted from Fig. 18.9, Callister 7e.
wt. %Ni, (Concentration C)R
esis
tivity
, ρ
(10-
8O
hm-m
)
10 20 30 40 500
1020304050
0
125
CNi = 21 wt%Ni
From step 1:
30
![Page 23: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/23.jpg)
Chapter 18 -23
Pure Semiconductors: Conductivity vs T
• Data for Pure Silicon:-- σ increases with T-- opposite to metals
Adapted from Fig. 19.15, Callister 5e. (Fig. 19.15 adapted from G.L. Pearson and J. Bardeen, Phys. Rev. 75, p. 865, 1949.)
electrical conductivity, σ(Ohm-m)-1
50 100 100010-210-1100101102103104
pure (undoped)
T(K)
electronscan crossgap athigher T
materialSiGeGaPCdS
band gap (eV)1.110.672.252.40
Selected values from Table 18.3, Callister 7e.
kT/Egap−∝σ eundoped
Energy
filled band
filled valence band
empty band
fille
d st
ates
GAP?
![Page 24: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/24.jpg)
Chapter 18 -24
Intrinsic Semiconductors• Pure material semiconductors: e.g., silicon &
germanium– Group IVA materials
• Compound semiconductors – III-V compounds
• Ex: GaAs & InSb
– II-VI compounds• Ex: CdS & ZnTe
– The wider the electronegativity difference between the elements the wider the energy gap.
![Page 25: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/25.jpg)
Chapter 18 -25
Conduction in Terms of Electron and Hole Migration
Adapted from Fig. 18.11, Callister 7e.• Electrical Conductivity given by:
# electrons/m3 electron mobility
# holes/m 3
hole mobilityhe epen μ+μ=σ
• Concept of electrons and holes:
electric fieldno applied
valence electron Si atom
electric field
+-
electron holepair creation
applied electric field
+-
applied
electron holepair migration
![Page 26: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/26.jpg)
Chapter 18 -26
Number of Charge CarriersIntrinsic Conductivity
σ = n|e|μe + p|e|μe
n =
σe μe +μn( )
=10−6(Ω⋅m)−1
(1.6x10−19C)(0.85+ 0.45 m2/V ⋅ s)
For GaAs n = 4.8 x 1024 m-3
For Si n = 1.3 x 1016 m-3
• for intrinsic semiconductor n = p∴ σ = n|e|(μe + μn)
• Ex: GaAs
![Page 27: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/27.jpg)
Chapter 18 -27
• Intrinsic:# electrons = # holes (n = p)--case for pure Si
• Extrinsic:--n ≠ p--occurs when impurities are added with a different
# valence electrons than the host (e.g., Si atoms)
Intrinsic vs Extrinsic Conduction
• n-type Extrinsic: (n >> p)
no applied electric field
5+
4+ 4+ 4+ 4+
4+
4+4+4+4+
4+ 4+
Phosphorus atom
valence electron
Si atom
conductionelectron
hole
een μ≈σ
• p-type Extrinsic: (p >> n)
no applied electric field
Boron atom
3+
4+ 4+ 4+ 4+
4+
4+4+4+4+
4+ 4+ hep μ≈σ
Adapted from Figs. 18.12(a) & 18.14(a), Callister 7e.
![Page 28: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/28.jpg)
Chapter 18 -28
Doped Semiconductor: Conductivity vs. T• Data for Doped Silicon:
-- σ increases doping-- reason: imperfection sites
lower the activation energy toproduce mobile electrons.
Adapted from Fig. 19.15, Callister 5e. (Fig. 19.15 adapted from G.L. Pearson and J. Bardeen, Phys. Rev. 75, p. 865, 1949.)
doped 0.0013at%B
0.0052at%B
elec
trica
l con
duct
ivity
, σ
(Ohm
-m)-
1
50 100 100010-210-1100101102103104
pure (undoped)
T(K)
• Comparison: intrinsic vsextrinsic conduction...
-- extrinsic doping level:1021/m3 of a n-type donorimpurity (such as P).
-- for T < 100 K: "freeze-out“,thermal energy insufficient toexcite electrons.
-- for 150 K < T < 450 K: "extrinsic"-- for T >> 450 K: "intrinsic"
Adapted from Fig. 18.17, Callister 7e. (Fig. 18.17 from S.M. Sze, Semiconductor Devices, Physics, and Technology, Bell Telephone Laboratories, Inc., 1985.)
cond
uctio
n el
ectro
n co
ncen
tratio
n (1
021/m
3 )
T(K)60040020000
1
2
3
freez
e-ou
t
extri
nsic
intri
nsic
dopedundoped
![Page 29: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/29.jpg)
Chapter 18 -29
• Allows flow of electrons in one direction only (e.g., usefulto convert alternating current to direct current.
• Processing: diffuse P into one side of a B-doped crystal.• Results:--No applied potential:
no net current flow.--Forward bias: carrier
flow through p-type andn-type regions; holes andelectrons recombine atp-n junction; current flows.
--Reverse bias: carrierflow away from p-n junction;carrier conc. greatly reducedat junction; little current flow.
p-n Rectifying Junction
++
+ ++
- ---
-p-type n-type
+ -
++ +
++
--
--
-
p-type n-typeAdapted from Fig. 18.21, Callister 7e.
+++
+
+
---
--
p-type n-type- +
![Page 30: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/30.jpg)
Chapter 18 -30
Properties of Rectifying Junction
Fig. 18.22, Callister 7e. Fig. 18.23, Callister 7e.
![Page 31: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/31.jpg)
Chapter 18 -31
Junction Transistor
Fig. 18.24, Callister 7e.
![Page 32: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/32.jpg)
Chapter 18 -32
Integrated Circuit Devices
• Integrated circuits - state of the art ca. 50 nm line width– 1 Mbyte cache on board– > 100,000,000 components on chip– chip formed layer by layer
• Al is the “wire”
Fig. 18.26, Callister 6e.
• MOSFET (metal oxide semiconductor field effect transistor)
![Page 33: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/33.jpg)
Chapter 18 -33
• Electrical conductivity and resistivity are:-- material parameters.-- geometry independent.
• Electrical resistance is:-- a geometry and material dependent parameter.
• Conductors, semiconductors, and insulators...-- differ in accessibility of energy states for
conductance electrons.• For metals, conductivity is increased by
-- reducing deformation-- reducing imperfections-- decreasing temperature.
• For pure semiconductors, conductivity is increased by-- increasing temperature-- doping (e.g., adding B to Si (p-type) or P to Si (n-type).
Summary
![Page 34: Chapter 18 - 1](https://reader034.vdocuments.net/reader034/viewer/2022051102/6276d65d3b30a363e2362c2a/html5/thumbnails/34.jpg)
Chapter 18 -34
Next time, Insulators (traditionally)
• Ceramics– Some structure– Capacitance, Dielectric properties– Ionic conduction
• Polymers– A bit on structure– Conducting polymers