1997 glass, enamel

glass, enamelV 1530

10 - 192Atomistic Structure of Silicon Nitride/Silicate Glass Interfaces. —The different features of HRTEM images near the Si3N4/glass interface arefound to depend on the specimen thickness and the objective lens focus value.Thickness variations arise from preferential thinning at grain junctions duringion-milling and from atomic roughness along the boundary. No ordered phasedifferent from that of Si3N4 is identified at the interfacial region. The structureof the interface is very likely direct Si3N4/glass bonding. — (PAN, X.; J. Am.Ceram. Soc. 79 (1996) 11, 2975-2979; Dep. Mater. Sci. Eng., Univ. Mich.,Ann Arbor, MI 48109, USA; EN)

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