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cSi Solar Panel Failures: From Chamber Testing to Field Installations
Shuying Yang/K Whitfield 4/7/2015 PVMC Workshop, Orland, FL
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Abstract Solar panels/modules are designed for 25 years’ warranty
(extending to 30 years for some ambitious module manufacturers). Extensive qualification is done at module component level and also extensive reliability/durability testing are performed on module level. Still significant field failures are experienced for the industry. This short presentation is meant to have a brief review on what might go wrong from the accelerated stress testing to field installations. This is also meant to stimulate the interest for the industry to look for what is the gap of the accelerated testing to the real field applications, and potentially to predict the field performance based on stress testing.
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Outlines § What might go wrong § Typical Accelerated Testing related failures
• DH/TC/PID/MLT § Typical Field Failures
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What Might Go Wrong: Module Components § Glass: Corrosion/Yellowing/Cracking/PID* § Encapsulant: Yellowing/Delam/Transmission Loss/Snail Trail*/PID* § Cell: Corrosion/Cracking/Snail Trail/Hotspot/PID § Conducting Ribbon: Corrosion/Poor Soldering § Flux: Interaction to Cell (Cell Corrosion)/Poor Soldering § Backsheet: Delamination/Cracking/Yellowing/Scratching/Burning § Jbox: Diode, Cable, Connector, Sealing, Adhesion to JBox § Sealant: Adhesion to Jbox/Backsheet/Frame § Pottant: Compatibility with Jbox/Thermal Expansion § Frame: Mounting integrity § Labels/Ink: Delamination/Weatherability
*Contributing Factor
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Typical Accelerated Testing § IEC61215/IEC61730/UL1703 and Industrial Requirements
• Damp Heat (85°C/85%) • Temperature Cycling (-40°C to 85°C) • Humidity Freeze • Mechanical Load Testing (MLT: 2400Pa or 5400Pa or other
loading) • Potential Induced Degradation (PID)
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Typical DH (extended) Related Failures § Cell Corrosion § Connector Crack § Backsheet Crack § EVA/Glass Delam § Bussing ribbon corrosion
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Temperature Cycle Related Failures § Ag Finger Defects § Cell Cracks § Ribbon/cell soldering defects
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Mechanical Load Testing Failures § Cell Crack § Frame Failures (deformed/torn/permanent warpage)
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Jbox Detachment § Wrong sealant material choice, ended with aged/delam
sealant to backsheet
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Cell Crack/ Module Delam § Delam patterns along the crack lines § Corrosion/Delam along the Ag fingers near cell edges
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Jbox Related; Diode Failures § Shorted diode: burned
Jbox § Burning Connectors:
§ Jbox failure due to loose screw connection
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Encapsulant Browning § EVA browning in the middle of the cell, perimeter showed
photo bleaching
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References § Ref: IEA-
PVPS_T13-01_2014_Review_of_Failures_of_Photovoltaic_Modules
§ Internet § Private Communication: “Disaster Deck” by Kent Whitfield § Santa Rita Jail Field Trip (~10 years installation)
Thank You ! [email protected]; [email protected]