db/daq – to implement: …. still working on direct connection with labview set-up obtain list of...
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DB/DAQ – to implement:• …. still working on direct connection with Labview set-up• obtain list of batches from DB• get list of SSD in selected batch from DB (we had 3 cases of batchID-SSDID mismatch)• pop-up message with last SSD tested• recover possibility of saving image from dimensional test set-up
Statistics• 433 tests (dimensional and/or electrical)• 334 geometrical – 258 electrical• almost doubled rate of geometrical tests (still margin with chuck)
Suggestions for operators:• write E/G on envelope after test• better storage (e.g. label boxes with batch ID content)• non-conformances analysis
Corner names mistake
A
BC
D
the change will be transparent to the user – you just will be prompted on corner D instead of A
List of all non-conformances up to 31/01/02SSD_ID batch operator 'date' test flag 'note'
DH00519 SWX60699Alessandro Brez 21-Oct-01 IV 3 scratch - large on bias ring - high current
DH00557 SWX60700 Gloria Spandre 29-Nov-01 IV 2 presence of particulateDH00560 SWX60700 Gloria Spandre 29-Nov-01 IV 2 presence of particulateDH00567 SWX60700
Francesco Zetti 29-Nov-01 IV 2 scratch - small on pad
DH00593 SWX60702 Nicola Omodei 30-Nov-01 IV 2 scratch - small on padDH00609 SWX60702 Luca Latronico 03-Dec-01 IV 2 scratch - barely visibleDH00627 SWX60702
Johann Cohen-Tanugi 04-Dec-01 IV 2 irregular IV curve
DH00764 SWX60733 Gloria Spandre 05-Dec-01 IV 2 irregular IV curveDH00732 SWX60709
Johann Cohen-Tanugi 06-Dec-01 dimensional 2 weird bias ring at A corner
DH00736 SWX60709Johann Cohen-Tanugi 06-Dec-01 dimensional 3 broken edge
DH00791 SWX60734 Michael Kuss 07-Dec-01 IV 2 irregular IV curveDH00798 SWX60734 Nicola Omodei 07-Dec-01 IV 2 irregular IV curveDH00810 SWX60734
Johann Cohen-Tanugi 22-Jan-02 IV 3 sparks after bad probe handling yet IV curve looks fine
DH00811 SWX60734Johann Cohen-Tanugi 22-Jan-02 IV 2
Curve is ugly but within specifications leakage current is twice the value for same batch
DH00805 SWX60734 Gloria Spandre 24-Jan-02 IV 2 presence of particulate identified as AlDH00809 SWX60734 Gloria Spandre 24-Jan-02 IV 2 scratch from bias pad to outer edgeDH00826 SWX60735 Gloria Spandre 24-Jan-02 IV 2 IV irregular high I but within specsDH00668 swx60703
Luisella Vigiani 25-Jan-02 dimensional 2 scratch little on the corner B
DH00674 swx60708Luisella Vigiani 25-Jan-02 dimensional 2 scratch little on the corner B
DH00828 SWX60735 Michael Kuss 25-Jan-02 IV 2 IV irregular breakdown below 200VDH00838 SWX60735 Nicola Omodei 25-Jan-02 IV 2 IV irregular 300nA at 200VDH00858 SWX60735 Luca Latronico 26-Jan-02 IV 2 IV curve irregularities I twice than usuallyDH00896 SWX60736 Luca Baldini 28-Jan-02 dimensional 2 ID mismatchDH00897 SWX60736 Luca Baldini 28-Jan-02 dimensional 2 ID mismatchDH00915 SWX60737 Nicola Omodei 29-Jan-02 dimensional 2 presence of particulateDH00949 SWX60742 Luca Baldini 29-Jan-02 dimensional 2 No SSDID on scratched waferDH00718 SWX60709
Johann Cohen-Tanugi 29-Jan-02 IV 2 Scratches
DH00718 SWX60709Johann Cohen-Tanugi 29-Jan-02 CV 2 Scratches
DH00977 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 no Id or very badly etched and non matching
DH00978 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 bad ID etching
DH00983 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 bad Id
DH00984 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 no Id
DH00986 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 missing ID
DH00987 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 missing Id
34 warning/failed test over407 SSD tested (dimensional/electrical or both)
dimensional: 14/308 ~ 4.5%electrical IV: 19/246 ~ 7.7%electrical CV: 1/246 ~ 0
• Should same warning be duplicated for IV and CV tests? (e.g. DH00718 marked as scratched for both tests) -> NO• clarify meaning of irregular IV • clarify meaning of broken edge
…. let’s analyze more in depth to learn how to behave
8.35% non-conformance rate -> a bit conservative?!specifically:
common questions and answers:
IV irregularities picture gallery
DH00627 DH00838
quite high (3/4 times average) leakage current
do not report
DH00791
DH00858
moderately high (2 times average) leakage current
do not report
IV irregularities picture gallery
DH00764 DH00826
Strange/unexpected shape
• redo measurement• report as warning
IV irregularities picture gallery
again a strange shape but indeed dangerous (breakdown?)
DH00828
do report a warning
IV irregularities picture gallery
nevertheless within specs, so
What’s wrong here?
DH00798
do not report
IV irregularities picture gallery
this reduces non-conformances to 30
Scratches
DH00809
• report as warning• check if current increased and is still within specs
Scratches
DH00567
scratches on pad produced during testing
should be a random and learning-phase problem
• check current• do not report if you see no effect
Scratches
DH00593
Labelled as scratches
DH00668
DH00674
learning-phase problem
• report only if bigger • I will add a ‘minor break’ warning option in the menu
DH00732
learning-phase problem
Deviations from standard pattern
‘ weird bias ring at corner A’
do not report unless very seriuos (e.g. interrupted or shortened strips - should affect current and coupling – specify)
this reduces non-conformances to 25
Problems with IDs
2 ID mismatch -> ID changed on envelope – report?
7 missing or faint scratch-ID -> • report as warning• contact HPK
Should be a problem related to this particular batch