Deformation measurementby compton alignment

Satoru Takahashi, Nagoya Univ.

OPERA emulsion workshop

Procedure of compton alignment for large area

• global alignment by X-ray mark

• division small area and local alignment with compton tracks for each area– unit area:5*5mm2

CS pl1

CS pl2

PH>=10dr<150μmdθ<0.4rad

signal : 35.5significance : 27.8shift vector:

10.80, -8.66

peak# : 37 Area:119 (11, 9)

mean : 1.49RMS : 1.28

BG#/(6×6)μm2

position displacement

position displacement

position displacement

ev : 174969, CS : 2-20, KCl : 14h

Area:000 (0, 0)

signal : 12.7significance : 11.4shift parameter:-2.12, 0.97

Area: 050 (2, 4)

signal : 33.59significance : 26.97shift parameter:1.62 -3.85

Area:150 (6, 12)

signal : 27.62significance : 23.05shift parameter:5.01 -3.92

Area:100 (4, 8)

signal : 29.46significance : 23.68shift parameter:2.41 -3.82

shift vector map

Shift vector shows X-ray mark alignment error and deformation.

shift vector distribution

Mean [micron] : 3.4, -4.8 : X-ray mark alignment errorRMS [micron] : 3.9, 2.6 : deformationMax [micron] : 13.8 : maximum position displacement due to X-ray alignment error and deformation

differential vector map

RMS : 0.32um/mm

ev : 124528, CS : 6-9, KCl : 14hMean [micron] : -4.3, -15.0RMS [micron] : 4.2, 5.4Max [micron] : 26.7

0.30[micron/mm]

ev : 124528, CS : 5-9, KCl : 14hMean [micron] : -2.9, 11.0RMS [micron] : 4.3, 7.8Max [micron] : 31.5

0.33[micron/mm]

ev : 3874834, CS : 12-7, KCl : 4hMean [micron] : 5.6, 2.7RMS [micron] : 3.5, 2.1Max [micron] : 12.6

0.30[micron/mm]

Summary

ev cs KCl [h] area mean RMS Max differential x [cm] y [cm] x [um] v [um] x [um] y [um] r[um] [um/ mm]

174969 2_20 14 6 11.5 3.4 - 4.8 3.9 2.6 13.8 0.32124528 6_9 14 6 11.5 - 4.3 - 15 4.2 5.4 26.7 0.3124528 5_9 14 5 11.5 - 2.9 11 4.3 7.8 31.5 0.33

3874834 12_7 4 5 4 5.6 2.7 3.5 2.1 12.6 0.3

X-ray alignment error [micron] : (4.8, 11.1)deformation [micron] : (4.0, 4.5)maximum position displacement [micron] : 31.5

4.8, 11.1 (RMS)

4.0, 4.5(average)

31.5 (Max.)