design and development of thin double side silicon microstrip sensors for cbm experiment

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Design and development of thin double side silicon microstrip sensors for CBM experiment Mikhail Merkin Skobeltsyn Institute of Nuclear Physics Moscow State University 3rd Work Meeting of the CBM-MPD STS Consortium

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Design and development of thin double side silicon microstrip sensors for CBM experiment. Mikhail Merkin Skobeltsyn Institute of Nuclear Physics Moscow State University. 3rd Work Meeting of the CBM-MPD STS Consortium. 3rd Work Meeting of the CBM-MPD STS Consortium. Sensor Geometry. - PowerPoint PPT Presentation

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Page 1: Design and development of thin double side silicon microstrip sensors for CBM experiment

Design and development of thin double side silicon

microstrip sensors for CBM experiment

Mikhail MerkinSkobeltsyn Institute of Nuclear Physics

Moscow State University

3rd Work Meeting of the CBM-MPD STS Consortium

Page 2: Design and development of thin double side silicon microstrip sensors for CBM experiment

3rd Work Meeting of the CBM-MPD STS Consortium

Page 3: Design and development of thin double side silicon microstrip sensors for CBM experiment

Sensor Geometry

– According simulation optimal sensors size for central part, because very hard radiation environment and high multiplicity - 40 • 60 mm2

– Strip pitch for both sides - 58 μm– Stereoangle - ±7.5о

– Number of strips on both sides - 1024 – Number of readout chips for both sides -

8

3rd Work Meeting of the CBM-MPD STS Consortium

Page 4: Design and development of thin double side silicon microstrip sensors for CBM experiment

Sensor N-side Contact Pads

3rd Work Meeting of the CBM-MPD STS Consortium

Page 5: Design and development of thin double side silicon microstrip sensors for CBM experiment

N-side poly-Si resistors

3rd Work Meeting of the CBM-MPD STS Consortium

Page 6: Design and development of thin double side silicon microstrip sensors for CBM experiment

N-side p-stops configuration

3rd Work Meeting of the CBM-MPD STS Consortium

Page 7: Design and development of thin double side silicon microstrip sensors for CBM experiment

N-side Guard Rings

1-st CBM-Russia-JINR Collaboration Meeting May 19-22, 2009, Dubna, Russia

Page 8: Design and development of thin double side silicon microstrip sensors for CBM experiment

Sensor P-side 1st and 2nd metal

3rd Work Meeting of the CBM-MPD STS Consortium

Page 9: Design and development of thin double side silicon microstrip sensors for CBM experiment

Sensor P-side 1st and 2nd metal details

3rd Work Meeting of the CBM-MPD STS Consortium

Page 10: Design and development of thin double side silicon microstrip sensors for CBM experiment

P-side Guard Rings

3rd Work Meeting of the CBM-MPD STS Consortium

Page 11: Design and development of thin double side silicon microstrip sensors for CBM experiment

Baby sensor

3rd Work Meeting of the CBM-MPD STS Consortium

Page 12: Design and development of thin double side silicon microstrip sensors for CBM experiment

3rd Work Meeting of the CBM-MPD STS Consortium

Baby sensor- p-side

Page 13: Design and development of thin double side silicon microstrip sensors for CBM experiment

3rd Work Meeting of the CBM-MPD STS Consortium

Baby sensor – n-side

Page 14: Design and development of thin double side silicon microstrip sensors for CBM experiment

3rd Work Meeting of the CBM-MPD STS Consortium

Baby sensor – n-side

Page 15: Design and development of thin double side silicon microstrip sensors for CBM experiment

3rd Work Meeting of the CBM-MPD STS Consortium

Baby sensor – n-side

Page 16: Design and development of thin double side silicon microstrip sensors for CBM experiment

Results

•Number of masks:•N-side – 8•P-side – 9

•Estimated production time - 3 months + 1 month for masks production.

3rd Work Meeting of the CBM-MPD STS Consortium

Page 17: Design and development of thin double side silicon microstrip sensors for CBM experiment

Expected

• Full Depletion Voltage (FDV) - <50 V• Working voltage – 70 - 250 V• Dark current at 100 V – < 15 nА/см2

• AC capacitance - >10 pF/см• Capacitors breakdown voltage -

>170 V• Bias resistor value - 1.0 ± 0.4 MOhm• Number of bad strips - <0.5%/side

3rd Work Meeting of the CBM-MPD STS Consortium