design of a computer controlled test system for micro-electro-mechanical-resonator (memr) based gas...

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Design of a Computer Controlled Test System for Design of a Computer Controlled Test System for Micro-Electro-Mechanical-Resonator (MEMR) Based Gas Sensor Micro-Electro-Mechanical-Resonator (MEMR) Based Gas Sensor Presenter: Joshua Ward Co-Author: Robert MacKinnon Advisor: Prof. Mustafa Guvench Electrical Engineering Department – University of Southern Maine Electrical Engineering Department – University of Southern Maine Measurement Equipment used: HP 54504A Digital Oscilloscope HP 5335A Universal Counter HP 4194A Spectrum Analyzer KI 213 Programmable Source STM-1 Sycon Quartz Crystal Monitor The goals of this project are to design and develop a computer-controlled test system to measure and characterize the response of a MEMR device to various gas mixtures and concentrations. The resonance frequency of this MEMR device is determined by: ω = 1/(2π) * √k/m Which is the inverse of the product of its vibrating mass and its spring constant. The MEMR device will be coated with a thin film of a polymer with gas absorption properties. As a detectable gas is passed over the device its resonant frequency response will be noted. The MEMR device will respond to the presence and concentration of the gas to be sensed with a decrease in its resonance frequency. The computer software being used as the platform for this computer controlled test system is LabView, by National Instruments. This program is being used for interfacing, communicating, data acquisition and control between a personal computer and the measurement setup via GPIB bus and serial ports. It is a graphical programming language that uses icons instead of lines of text to create applications. The Test Setup: The gas or vapor to be sensed will be mixed with an inert carrier gas to adjust its concentration. The flow rates and concentration levels are being determined using computer controlled mass flow controllers. The LabView program being written will control the injection time and the mixing ratio of the gas along with temperature control within the test chamber. After each injection of gas, the program will trigger all measurement instruments and gather data to quantify and generate plots of sensor response vs. injected gas concentration and temperature. We will be using a Sycon Quartz Crystal Monitor as a reference. This device also monitors the frequency shift as a substance is deposited onto it. This is the LabView front page, or user control panel, for the Sycon Quartz Crystal Monitor. This measures the rate of deposition and thickness of the deposited film. A similar program will be written for the The MEMR device to be tested. The Test Set-Up Computer controlled Mass Flow Controller Unit Controlled Environment HP 5335A Universal Counter HP 54504A Digital Oscilloscope Computer, running LabView software Programmable Power supply GPIB Quartz Crystal Monitor MEMR Gas In Gas Out MFC Gas HP 4194A Impedance/Gain Analyzer

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Page 1: Design of a Computer Controlled Test System for Micro-Electro-Mechanical-Resonator (MEMR) Based Gas Sensor Presenter: Joshua Ward Co-Author: Robert MacKinnon

Design of a Computer Controlled Test System for Design of a Computer Controlled Test System for Micro-Electro-Mechanical-Resonator (MEMR) Based Gas SensorMicro-Electro-Mechanical-Resonator (MEMR) Based Gas Sensor

Presenter: Joshua Ward Co-Author: Robert MacKinnon Advisor: Prof. Mustafa GuvenchElectrical Engineering Department – University of Southern MaineElectrical Engineering Department – University of Southern Maine

Design of a Computer Controlled Test System for Design of a Computer Controlled Test System for Micro-Electro-Mechanical-Resonator (MEMR) Based Gas SensorMicro-Electro-Mechanical-Resonator (MEMR) Based Gas Sensor

Presenter: Joshua Ward Co-Author: Robert MacKinnon Advisor: Prof. Mustafa GuvenchElectrical Engineering Department – University of Southern MaineElectrical Engineering Department – University of Southern Maine

Measurement Equipment used:HP 54504A Digital OscilloscopeHP 5335A Universal CounterHP 4194A Spectrum AnalyzerKI 213 Programmable SourceSTM-1 Sycon Quartz Crystal Monitor

The goals of this project are to design and develop a computer-controlled test system to measure and characterize the response of a MEMR device to various gas mixtures and concentrations. The resonance frequency of this MEMR device is determined by:

ω = 1/(2π) * √k/mWhich is the inverse of the product of its vibrating mass and its spring constant. The MEMR device will be coated with a thin film of a polymer with gas absorption properties. As a detectable gas is passed over the device its resonant frequency response will be noted. The MEMR device will respond to the presence and concentration of the gas to be sensed with a decrease in its resonance frequency. The computer software being used as the platform for this computer controlled test system is LabView, by National Instruments. This program is being used for interfacing, communicating, data acquisition and control between a personal computer and the measurement setup via GPIB bus and serial ports. It is a graphical programming language that uses icons instead of lines of text to create applications.

The Test Setup:The gas or vapor to be sensed will be mixed with an inert carrier gas to adjust its concentration. The flow rates and concentration levels are being determined using computer controlled mass flow controllers. The LabView program being written will control the injection time and the mixing ratio of the gas along with temperature control within the test chamber. After each injection of gas, the program will trigger all measurement instruments and gather data to quantify and generate plots of sensor response vs. injected gas concentration and temperature. We will be using a Sycon Quartz Crystal Monitor as a reference. This device also monitors the frequency shift as a substance is deposited onto it.

This is the LabView front page, or user control panel, for the Sycon Quartz Crystal Monitor. This measures the rate of deposition and thickness of the deposited film. A similar program will be written for the MEMR device.

The MEMR device to be tested.

The Test Set-Up

Computer controlledMass Flow Controller Unit

Controlled EnvironmentHP 5335A Universal

Counter

HP 54504A Digital Oscilloscope

Computer, runningLabView software

ProgrammablePower supply

GPIB

Quartz Crystal Monitor

MEMR

Gas In

Gas Out

MFC

Gas

HP 4194A Impedance/Gain Analyzer