design of dsp testing environment
DESCRIPTION
Technion - Israel institute of technology department of Electrical Engineering. הטכניון - מכון טכנולוגי לישראל הפקולטה להנדסת חשמל. Design of DSP testing environment. Performed By: Safovich Yevgeny307015578 Instructors: Eli Shoshan Yevgeni Rifkin. Table of Content:. Introduction - PowerPoint PPT PresentationTRANSCRIPT
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Design of DSP testing environment
Performed By:Safovich Yevgeny 307015578
Instructors: Eli Shoshan
Yevgeni Rifkin
הטכניון - מכון טכנולוגי לישראל
הפקולטה להנדסת חשמל
Technion - Israel institute of technologydepartment of Electrical Engineering
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Table of Content:
Introduction Goal Testing Environment Architecture Principles of Architecture Scope Test routines description Module for Tests Control Status
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Introduction
Satellites are exposed to several sources of ionizing radiation: Trapped radiation Galactic cosmic rays Solar flares
This radiation induces transient and permanent changes in semiconductor devices Single Event Latch-Ups (SEL) Total Ionizing Doze (TID)
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Introduction (cont.)
We are going to measure the impact of radiation on DSP
DSP 6416 has been chosen for: Requested by the customer It is used for calculations and control on satellites Project “LOKO” of an archiving algorithm has been
developed in EE faculty for this DSP It is one of the most advanced of its type
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Goal
Test DSP operation during radiation Total Ionizing Doze (TID)
Quantify reversal of bits per each module Output statistical summary of the results
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Environment
Tests Control GUI:• Parameters Setting
• Control
• Results
• Analysis
JTAG cable
XDS510
TEB 6416 Host
Tests Execution:• Initial settings
• Behavior verification
• Output results
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Architecture
TEB C6416
DSP(C & Asm)
JTAG
XDS510 emulator
Code Composer
Tests Control UI(VB)
PC
COM
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Architecture (cont.)
PC (Host) Connection to DSP via JTAG DSP control by using COM technology (Code
Composer is exposed by COM interface) Access to DSP memory space Ability to run program routines Ability to analyze test results externally Convenient GUI
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Architecture (cont.)
DSP (controlled by the Host) Used in TEB development environment Availability of external memory (EMIF) The test program is executed from external
memory (with minor exceptions) “Fast” tests execution (vs. running tests on Host)
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Principles of Architecture
DSP All tests are executed by DSP
PC (Host) Control the testing routines Gather & Output results
Interface All data exchange is done by DSP external
memory (not influenced by radiation)
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Principles of Architecture (cont.) PC
Initialize development environment Reset TEB & DSP
Load the test program to DSP Set active testing routine(s) according to user’s
selection Run program on DSP Gather & present immediate results from DSP
(EMIF) Complete collection of results & analysis
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Principles of Architecture (cont.) DSP
Separate testing route per each module
Module state initialization Test execution Behavior verification & errors’ analysis
(+counters) Output results to external memory space (EMIF)
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Scope
Only state containing modules to be tested Each module should be tested “separately” Errors (“damaged” addresses / modules)
should be counted
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Scope (cont.)
Modules to be tested: Internal Memory (1Mb) CPU EDMA MCBSP (0 – 2) Timers (0 – 2)
Modules not to be tested (defined by customer): VCP TCP EMIF A/B (no buffers) UTOPIA HPI PCI External memory PLL
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Scope (cont.)
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Test routines description
CPU All 6416 opcodes are tested Each opcode is given “sample” input values Opcode result is compared to the pre-calculated
one
MCBSP A “sample” data is written to each port The data is read from the port and compared to
the input one
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Test routines description (cont.) Internal Memory
Backup critical program Interrupts handlers Timer test routines
Fill memory by sample data (the addresses values)
Wait for reversal of bits Repeat the above for data = NOT of address
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Test routines description (cont.) EDMA
Schedule the following transfers finalized by EDMA interrupt:
Data Block
Data Block
Data Block
Backup
Image
Source
Data Block
1. Data Block -> Backup
2. Source -> Data Block
3. Data Block -> Image
4. Backup -> Data Block
5. Comparison: Source – Image
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Test routines description (cont.) Timers
Each timer is tested by the following routine:
Set clock to 1/8 of the internal clock Start timer Run a loop of with a counter variable The code is written in such a way that:
Each loop iteration takes 8 CPU cycles Counter variable should reach the same number as the
timer’s one Loop is finished upon timer interrupt
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Module for Tests Control
Tests execution control: Reset TEB & DSP Reset Statistics Run single test once (loop) Run all tests once (loop) Automatic Reset upon program failure (watchdog) Immediate results presentation
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Module for Tests Control (cont.) Full results analysis:
Gather all errors counters Show errors counters per module Present graph of errors distribution on memory Presentation of errors average, std. dev, min, max Ability to save results (addresses sorted by errors
frequency)
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Module for Tests Control (cont.)
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Module for Tests Control (cont.)
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Module for Tests Control (cont.) Summary:
Total tests count: 6Total errors: 18Auto resets performed: 0
CPU:Tests count: 1Total errors: 1
…
Memory:Tests count: 2Total errors: 14Avg. total errors per test: 7Min. errors per address: 0Max. errors per address: 2
Memory - errors per address report:Addr.[hex] Errors70000 2…
Text file format:
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Status
DSP Test routines are ready Host Control Module is ready Documentation – in progress