design techniques for cmos broadband amplifiers papers/cmoset_2009_cmos... · s1 c g v out transfer...
TRANSCRIPT
1-25High-Speed Devices and Integrated Circuits Group, NTHU
Design Techniques for CMOS Broadband Amplifiers
Shawn S. H. Hsu and Allen J. D. JinHigh-speed Devices and Integrated Circuits Group
Electrical Engineering and Institute of Electronics EngineeringNational Tsing Hua University, Hsin Chu, Taiwan
02/19/2009
2-25High-Speed Devices and Integrated Circuits Group, NTHU
Outline• Introduction
− Application of broadband amplifiers− CMOS design considerations and challenges− Different wideband techniques
• π-type inductor peaking (PIP)− Transfer function analysis− A 40-Gb/s TIA using 0.18-μm CMOS technology
• Asymmetric transformer peaking− Transfer function analysis− A miniaturized 70-GHz amplifier using 0.13-μm CMOS technology
• Summary and conclusion
3-25High-Speed Devices and Integrated Circuits Group, NTHU
Broadband Amplifiers for communications
• Wireless communication system
RT
I/QDemodulator
PLL
I/QModulator
Filter
PA
MixerLNA
LO
Multiplier
Antenna
Filter
Filter
Switch
4-25High-Speed Devices and Integrated Circuits Group, NTHU
Broadband Amplifiers for communications (cont.)
• Optical communication system
Digital Logic
FiberPD
TIA LA CDR DMUX
FiberLD
MUXTx
Rx
DriverDigital Logic
• To meet requirement of high-speed and low-noise, III-V or SiGetechnology is preferred
Still a challenge if using CMOS to design
5-25High-Speed Devices and Integrated Circuits Group, NTHU
Optical interconnect
[Ref.]: Photonics research group, INTEC
• Intra-chip optical interconnecta miniaturized optical communication system on chipOne of the bottlenecks: high-speed, small-size,and low power broadband amplifiers in CMOS
[Ref.]: R. G. Beausoleil, IEEE LEOS, 2007, HP laboratories
[Ref.]: W. Bogaerts, Photonics and Nanostructures, IMEC
6-25High-Speed Devices and Integrated Circuits Group, NTHU
How far can we push the RF circuit performance using CMOS?
Circuit configuration (simpler solution is always a better solution) Inductive components (effective way to enhance Gain-BW)Layout (the key to success)
• In addition to continuous scaling of CMOS, what else can we do?
• Major considerations when designing a CMOS broadband amplifier
Chip area (cost) Gain-Bandwidth productPower consumptionGroup delay, noise, linearity, ..
7-25High-Speed Devices and Integrated Circuits Group, NTHU
Scaling of CMOS and Limitation for High-speed Operation
Gain= Rd
BW= 1/Rd(Cd+Cg)
GBW= 1/(Cd+Cg)
Gain= Rg
BW= 1/Rg(Cpd+Cg)
GBW= 1/(Cpd+Cg)
RdCd Cg
gmvgs voutipd
CgCpd Rg
• C↓ GBW↑ Speed↑
0
50
100
150
200
250
fT a
nd f m
ax (G
Hz)
0.25 μm
0.18 μm
0.13 μm
90 nm
65 nm
0.35 μm
fmaxfT
• For transimpedance gain consideration
8-25High-Speed Devices and Integrated Circuits Group, NTHU
• Feedback amplifier− simple to design and small chip area− not easy to achieve high gain if a large
bandwidth is required
• Inductive peaking amplifier− No additional DC power − high gain can be obtained by cascade
amplification (gain multiplied fromeach stage)
− Inductors consume a large chip area
Broadband Techniques for Amplifiers
• Distributed amplifier− form virtual transmission line to achieve
a large BW− large DC power consumption and chip
area (parallel amplification; gain added from each stage)
☺☺
☺☺
☺☺
☺☺
Rf
RLCd
gmvgs
vgs
—
+Cg
Cd
gmvgs Ld
CL
Rd
Cg
—
+vgs
Cd
gmvgs Ld
CL
Rd
Cg
—
+vgs
9-25High-Speed Devices and Integrated Circuits Group, NTHU
Inductive Peaking Technique
zs ω+
zω
p
z
ss
ωω
++
zp ωω , ω
ps ω+1
pω ω ω
• Inductor can introduce a zero in the transfer function to enhance BW
• Inductor can also introduce complex conjugate poles to enhance BW if the damping factor ζ is smaller than 0.707
200
2 21 )(
ωζω ++∝
sssH
)1(- 201 −+= ζζωP
)1(- 202 −−= ζζωP
10-25High-Speed Devices and Integrated Circuits Group, NTHU
Shunt Inductor Peaking
• A zero is introduced by Ld to extend BW • Bandwidth enhancement ratio (BWER) is 1.85
[Ref.] S. S. Mohan, M. del M. Hershenson, S. P. Boyd, and T. H. Lee, “Bandwidth extension in CMOS with optimized on-chipinductors,” IEEE J. of Solid-State Circuits, vol. 35, pp. 346-355, Mar. 2000.
0.0 0.5 1.0 1.5 2.0 2.5-6
-3
0
3
6
9
Nor
mal
ized
gai
n (d
B)
Normalized frequency (rad/s)
a: without any peaking techniques b: inductor peaking
Vdd
Rd
Cd Cg
gmvgs
Ld
vout
11-25High-Speed Devices and Integrated Circuits Group, NTHU
Shunt-Series Peaking
[Ref.] S. Galal and B. Razavi, “40-Gb/s amplifier and ESD protection circuit in 0.18 µm CMOS technology,”IEEE J. of Solid-State Circuits, vol. 39, pp. 2389-2396, Dec. 2004.
Vdd
Rd
Cd Cg
gmvgs
Ld
voutLs
• A zero and a pair of complex conjugate poles are introduced to extend BW, and the BWER is 1.83 (Cg/Cd= 3)
0.0 0.5 1.0 1.5 2.0 2.5-6
-3
0
3
6
9
Nor
mal
ized
gai
n (d
B)
Normalized frequency (rad/s)
a: without any peaking techniques b: inductor peaking c: shunt-series peakking
12-25High-Speed Devices and Integrated Circuits Group, NTHU
T-coil Peaking
[Ref.] S. Galal and B. Razavi, “Broadband ESD protection circuits in CMOS technology,” IEEE J. of Solid-State Circuits, vol. 38, pp. 2334-2340, Dec. 2003.
Vdd
Rd
Cd Cg
gmvgs vout
CcLd
k
Ld
• A zero and two pairs of complex conjugate poles areintroduced to extend BW, and the BWER is 2.40
0.0 0.5 1.0 1.5 2.0 2.5-6
-3
0
3
6
9
Nor
mal
ized
gai
n (d
B)
Normalized frequency (rad/s)
a: without any peaking techniques b: inductor peaking c: shunt-series peakking d: T-coil peaking
13-25High-Speed Devices and Integrated Circuits Group, NTHU
Proposed π-type Inductor Peaking (PIP)
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0-6
-3
0
3
6
9
Nor
mal
ized
gai
n (d
B)
Normalized frequency (rad/s)
e: without any inductors f : Ld2
g: Ld2 + Ls1
h: Ld2 + Ls1 + Ld1
Vdd
Rd1
Cd
gmvgs
Rd2
Ld1 Ld2Ls1
voutCg
• Introduce two zeros and two pairs of complex poles • The BWER is 3.31 with a gain flatness within 2 dB
14-25High-Speed Devices and Integrated Circuits Group, NTHU
( )5
54
43
32
210
2
2
1
12
2
2
1
1
21
1
DsDsDsDssDDRL
RLs
RL
RLs
RRsH d
d
d
d
d
d
d
d
ddPIP +++++
+⎟⎟⎠
⎞⎜⎜⎝
⎛++
=
( )( )( )
( ) ( )( )
Ldsdd
ddddLds
LdsddsdLdsddd
LsddsdddddLd
Ldddsdd
dd
CCLLLDLRLRCCLD
CCLRRLLCLLLCLDCLRCLRLRLRCCD
CCRRLLLDRRD
1215
122114
1211121213
121112212
211211
210
=+=
++++=++++=
++++=+=
where
ddd
dds
ddd
CRL
CRL
CRL
××=
××=
××=
211
211
212
80.0
86.0
50.1
Vdd
Rd1
Cd
gmvgs
Rd2
Ld1 Ld2Ls1
voutCg
Transfer Function of PIP Topology
Two pairs of complex conjugate poles
Two zeros
15-25High-Speed Devices and Integrated Circuits Group, NTHU
Zero, Pole, and Complex poles
• Both damping factors ζLd1, p1 and ζLd1, p4 are < 0.707, BW enhancement
Ld2 + Ls1 + Ld1
─
Ld2 + Ls1
─
Ld2
─
─
─
without PIP
Damping factor
Complex pole
Pole
Zero
Ld2 + Ls1 + Ld1
─
Ld2 + Ls1
─
Ld2
─
─
─
without PIP
Damping factor
Complex pole
Pole
Zero
00.11 =pω
33.11 =zω
37.2
21.1
4,13,1
2,11,1
=
==
=
pLspLs
pLspLs
ωω
ωω
50.233.1
2
1
==
z
z
ωω
14.0
63.0
4,1
1,1
=
=
pLd
pLd
ξ
ξ
16.12,21,2
=
= pLdpLd ωω
79.01,2 =pLdξ
33.11 =zω
28.0
82.0
3,1
1,1
=
=
pLs
pLs
ξ
ξ01.3
28.1
5,14,1
2,11,1
=
==
=
pLdpLd
pLdpLd
ωω
ωω
39.13,1 =pLdω
79.0 1,2 =pLdζ 82.0 1,1 =pLsζ28.0 3,1 =pLsζ
63.0 1,1 =pLdζ14.0 4,1 =pLdζ
Ld2 + Ls1 + Ld1
─
Ld2 + Ls1
─
Ld2
─
─
─
without PIP
Damping factor
Complex pole
Pole
Zero
Ld2 + Ls1 + Ld1
─
Ld2 + Ls1
─
Ld2
─
─
─
without PIP
Damping factor
Complex pole
Pole
Zero
00.11 =pω
33.11 =zω
37.2
21.1
4,13,1
2,11,1
=
==
=
pLspLs
pLspLs
ωω
ωω
50.233.1
2
1
==
z
z
ωω
14.0
63.0
4,1
1,1
=
=
pLd
pLd
ξ
ξ
16.12,21,2
=
= pLdpLd ωω
79.01,2 =pLdξ
33.11 =zω
28.0
82.0
3,1
1,1
=
=
pLs
pLs
ξ
ξ01.3
28.1
5,14,1
2,11,1
=
==
=
pLdpLd
pLdpLd
ωω
ωω
39.13,1 =pLdω
79.0 1,2 =pLdζ 82.0 1,1 =pLsζ28.0 3,1 =pLsζ
63.0 1,1 =pLdζ14.0 4,1 =pLdζ
16-25High-Speed Devices and Integrated Circuits Group, NTHU
Circuit Topology of 40 Gb/s TIA
• 4 CS stages in cascadelow power and high gain
• π-type inductor peaking (PIP)wide BW
• The circuit BW is enhanced 11x by PIP
Vdd
RD RD
L4 L5
L6
RD RD
L4 L5
L6
RD RD
L4 L5
L6
RM RM
L7 L8
L9
M1 M2 M3 M4
Out
In
RM RM
L1 L2
L3
0 5 10 15 20 25 30 35 4025
30
35
40
45
50
55
Z T (dBΩ)
Frequency (GHz)
TIA without PIP TIA with PIP
17-25High-Speed Devices and Integrated Circuits Group, NTHU
Layout Considerations
• Full-custom designed inductors to reduce chip area
• Use GCPW (grounded coplanar wave guide) structure
improve shielding for lossy Sisubstrate and reduce crosstalkremove guard-ring of inductor to further reduce the size
1.17 x 0.46 mm2
Vdd Gnd Vdd
Gnd
In
Gnd
Gnd
Out
Gnd1.17 x 0.46 mm2
Vdd Gnd Vdd
Gnd
In
Gnd
Gnd
Out
Gnd
6.5μm
3μmM6M5M4M3M2M1
Ground Signal Ground
Si Substrate
5μm
18-25High-Speed Devices and Integrated Circuits Group, NTHU
0 5 10 15 20 25 30 35 400
10
20
30
40
50
60
0
50
100
150
200
250
300
Z T (dBΩ)
Frequency (GHz)
Z IN (Ω
)
Measured ZT and Eye Diagram
• Gain: 51 dBΩ
• BW: 30.5 GHz ( ~ 0.5 fT)
Iin: 740 μApp
231-1 PRBS
40-Gb/s
263 mVpp
10 ps
40-Gb/s
263 mVpp
10 ps
19-25High-Speed Devices and Integrated Circuits Group, NTHU
Comparison with Prior Art
[Ref.] J. Jin and S. Hsu, “A 40-Gb/s transimpedance amplifier in 0.18-µm CMOS technology,” IEEE J. Solid-State Circuits,vol. 43, no. 6, pp. 1449-1457, June, 2008.
20-25High-Speed Devices and Integrated Circuits Group, NTHU
Asymmetric Transformer Peaking
• Unequaled LP and LS
suitable for unequaled Cd and Cg
707.0707.0
2
1
<<
ξξ
( ) ( )( ) ( ) ( ) ( )kCCLLsCCRLsCLLksCLCLCLsCCsR
RLLkLsRsZ
gdSPgdPdSPgSdSdPgd
SPST −++−++++++
−+=
121/1
4322
Introduce one zero and two pairs of complex conjugate poles k-related terms are negative ⇒ frequencies of zero and complex poles↑Achieve a BWER up to 5
1
2
3
4
5
10 20 30 40 50 60
Frequency (GHz)
Cg/
Cd
RD
M1
LP
LS
k
LP≠LS
VDD
RD
M1
LP
LS
k
LP≠LS
VDD
21-25High-Speed Devices and Integrated Circuits Group, NTHU
Amplifier Configuration
• 5 cascaded CS stages: high gain• RM and RD: matching/biasing resistors• Gain: 10.3 dB• BW: 80.6 GHz (only 7.0 GHz
w/o inductive network)
VDD
RD
M1 OutIn
RD
LS
M1
RD
LS
M1
RD
LS
M1
RD
LS
M1
RMInductive network
Inductive network
Inductive network
Inductive network
Inductive network
Inductive network
0 20 40 60 80 10005
1015202530
S21
(dB
)
Frequency (GHz)
A : Without any peaking technique B : Shunt peaking C : Shunt-series peaking D : Symmetric transformer peaking E : Asymmetric T-coil peaking F : Asymmetric transformer peaking
22-25High-Speed Devices and Integrated Circuits Group, NTHU
Transformer Layout and Chip Micrograph
In Out
VDD GND VDD
Chip area: 0.39 mm2
Core area: 0.05 mm2
660 μm
core area
590 μm
In Out
VDD GND VDD
Chip area: 0.39 mm2
Core area: 0.05 mm2
660 μm
660 μm
core area
590 μm590 μm
• Layout of the asymmetric transformer(optimized for chip area and k)
0 10 20 30 40 50 60 70 80 90 1000.0
0.1
0.2
0.3
0.4
0.5
0.6
0
2
4
6
8
10
12
LS
QS
L P and
LS (n
H),
k
Frequency (GHz)
k
QP
LP
QP a
nd Q
S
23-25High-Speed Devices and Integrated Circuits Group, NTHU
Measurement Results
• Good agreement between measured and simulated results
• BW: 70.6 GHz • Gain-bandwidth product GBW: 231 GHz
24-25High-Speed Devices and Integrated Circuits Group, NTHU
Comparison with Prior Art
[Ref.] J. Jin and S. Hsu, “A miniaturized 70-GHz broadband amplifier in 0.13-µm CMOS technology," IEEE Trans. Microwave Theory Tech., vol. 56, no. 12, pp. 3086-3092, Dec. 2008.
25-25High-Speed Devices and Integrated Circuits Group, NTHU
Summary and Conclusion• A 40 Gb/s transimpedance amplifier (TIA) was achieved
using the proposed π-type Inductor Peaking (PIP)technique by 0.18-μm CMOS technology
• A 70-GHz miniaturized (core area only 0.05 mm2)broadband amplifier was achieved using the proposedasymmetric transformer peaking technique by 0.13-μm CMOS technology
Acknowledgement We would like to thank National Chip Implementation Center (CIC)and TSMC for the chip fabrication, and National Nano Device Laboratories (NDL) for chip measurements.