certificatefaenl.msi.com/ftp/ce documents/notebook/archive/ms-1632x... · 2015. 9. 9. ·...

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:[email protected] http://www.quietek.com

CERTIFICATE

Issued Date:Aug. 28, 2006 Report No.: 068L111-IT-CE-P11V04

This is to certify that the following designated product

Product : MEGA BOOK

Trade name : MSI

Model Number : MS-16321, MS-16323, MS-1632B, MS-16321B,

MS-16323B, M670

Company Name : MICRO-STAR INT’L Co., LTD.

This product, which has been issued the test report listed as above in QuieTek

Laboratory, is based on a single evaluation of one sample and confirmed to

comply with the requirements of the following EMC standard.

EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2: 2000 IEC 61000-4-2 Edition 1.2: 2001-04

EN 61000-3-3: 1995 + A1:2001 IEC 61000-4-3: 2002+A1: 2002

IEC 61000-4-4: 2004

IEC 61000-4-5 Edition 1.1: 2001-04

IEC 61000-4-6 Edition 2.1: 2004-11

IEC 61000-4-8 Edition 1.1: 2001-03

IEC 61000-4-11 Second Edition: 2004-03

TEST LABORATORY

George Chen / President

Test Report

Product Name ： MEGA BOOK

Model No. ： MS-16321, MS-16323, MS-1632B,

MS-16321B, MS-16323B, M670

Applicant ： MICRO-STAR INT’L Co., LTD.

Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,

Taiwan, R.O.C.

Date of Receipt ： 2006/08/14

Issued Date ： 2006/08/28

Report No. ： 068L111-IT-CE-P11V04

The test results relate only to the samples tested.The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity

The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were applied: The following Equipment:

Product : MEGA BOOK Model Number : MS-16321, MS-16323, MS-1632B, MS-16321B,

MS-16323B, M670 Trade Name : MSI

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard

EN 61000-3-2:2000 Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1:2001+A2:2003 : Product family standard

The following importer/manufacturer is responsible for this declaration:

Company Name :

Company Address :

Telephone : Facsimile :

Person is responsible for marking this declaration:

Name (Full Name) Position/ Title

Date Legal Signature

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: [email protected]

QTK No.: 068L111-IT-CE-P11V04

S ta tement o f Conformi ty

This certifies that the following designated product:

Product : MEGA BOOK Model Number : MS-16321, MS-16323, MS-1632B, MS-16321B,

MS-16323B, M670 Trade Name : MSI Company Name : MICRO-STAR INT’L Co., LTD.

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard

EN 61000-3-2:2000 Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1:2001+A2:2003 : Product family standard

TEST LABORATORY

George Chen / President

The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

0914

Report No： 068L111-IT-CE-P11V04

Page: 2 of 122

Test Report Cert i f icat ion Issued Date : 2006/08/28 Report No. : 068L111-IT-CE-P11V04

Product Name : MEGA BOOK

Applicant : MICRO-STAR INT’L Co., LTD.

Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan,

R.O.C.

Manufacturer : MICRO-STAR INT’L Co., LTD.

Model No. : MS-16321, MS-16323, MS-1632B,

MS-16321B, MS-16323B, M670

Rated Voltage : AC 230 V / 50 Hz

EUT Voltage : AC 100-240V,50/60Hz Trade Name : MSI

Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class B

EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2000EN 61000-3-3:1995+A1:2001

AS/NZS CISPR 22: 2004

Test Result : Complied

Performed Location : Linkou EMC laboratory

No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo

Shiang, Taipei, 244 Taiwan, R.O.C.

TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789

Documented By :

( Leven Huang )

Reviewed By :

( Dino Chen )

Approved By :

( George Chen )


Page: 3 of 122

Laboratory Information

We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/ The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, DGT, CNLA

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI

0914

1313


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TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7 1.1. EUT Description ...................................................................................................... 7 1.2. Mode of Operation .................................................................................................. 9 1.3. Tested System Details........................................................................................... 10 1.4. Configuration of Tested System ............................................................................ 11 1.5. EUT Exercise Software ......................................................................................... 12 2. Technical Test ........................................................................................................... 13 2.1. Summary of Test Result ........................................................................................ 13 2.2. List of Test Equipment ........................................................................................... 14 2.3. Measurement Uncertainty ..................................................................................... 17 2.4. Test Environment .................................................................................................. 19 3. Conducted Emission (Main Terminals)...................................................................... 21 3.1. Test Specification .................................................................................................. 21 3.2. Test Setup ............................................................................................................. 21 3.3. Limit....................................................................................................................... 21 3.4. Test Procedure ...................................................................................................... 22 3.5. Deviation from Test Standard ................................................................................ 22 3.6. Test Result ............................................................................................................ 23 3.7. Test Photograph .................................................................................................... 35 4. Conducted Emissions (Telecommunication Ports).................................................... 37 4.1. Test Specification .................................................................................................. 37 4.2. Test Setup ............................................................................................................. 37 4.3. Limit....................................................................................................................... 37 4.4. Test Procedure ...................................................................................................... 38 4.5. Deviation from Test Standard ................................................................................ 38 4.6. Test Result ............................................................................................................ 39 4.7. Test Photograph .................................................................................................... 57 5. Radiated Emission.................................................................................................... 59 5.1. Test Specification .................................................................................................. 59 5.2. Test Setup ............................................................................................................. 59 5.3. Limit....................................................................................................................... 59 5.4. Test Procedure ...................................................................................................... 60 5.5. Deviation from Test Standard ................................................................................ 60 5.6. Test Result ............................................................................................................ 61 5.7. Test Photograph .................................................................................................... 65 6. Harmonic Current Emission ...................................................................................... 67


Page: 5 of 122

6.1. Test Specification .................................................................................................. 67 6.2. Test Setup ............................................................................................................. 67 6.3. Limit....................................................................................................................... 67 6.4. Test Procedure ...................................................................................................... 69 6.5. Deviation from Test Standard ................................................................................ 69 6.6. Test Result ............................................................................................................ 70 6.7. Test Photograph .................................................................................................... 74 7. Voltage Fluctuation and Flicker................................................................................. 75 7.1. Test Specification .................................................................................................. 75 7.2. Test Setup ............................................................................................................. 75 7.3. Limit....................................................................................................................... 75 7.4. Test Procedure ...................................................................................................... 76 7.5. Deviation from Test Standard ................................................................................ 76 7.6. Test Result ............................................................................................................ 77 7.7. Test Photograph .................................................................................................... 79 8. Electrostatic Discharge ............................................................................................. 80 8.1. Test Specification .................................................................................................. 80 8.2. Test Setup ............................................................................................................. 80 8.3. Limit....................................................................................................................... 80 8.4. Test Procedure ...................................................................................................... 81 8.5. Deviation from Test Standard ................................................................................ 81 8.6. Test Result ............................................................................................................ 82 8.7. Test Photograph .................................................................................................... 84 9. Radiated Susceptibility ............................................................................................. 85 9.1. Test Specification .................................................................................................. 85 9.2. Test Setup ............................................................................................................. 85 9.3. Limit....................................................................................................................... 85 9.4. Test Procedure ...................................................................................................... 86 9.5. Deviation from Test Standard ................................................................................ 86 9.6. Test Result ............................................................................................................ 87 9.7. Test Photograph .................................................................................................... 89 10. Electrical Fast Transient/Burst............................................................................... 90 10.1. Test Specification............................................................................................... 90 10.2. Test Setup.......................................................................................................... 90 10.3. Limit ................................................................................................................... 90 10.4. Test Procedure .................................................................................................. 91 10.5. Deviation from Test Standard............................................................................. 91 10.6. Test Result ......................................................................................................... 92


Page: 6 of 122

10.7. Test Photograph ................................................................................................ 94 11. Surge..................................................................................................................... 96 11.1. Test Specification............................................................................................... 96 11.2. Test Setup.......................................................................................................... 96 11.3. Limit ................................................................................................................... 96 11.4. Test Procedure .................................................................................................. 97 11.5. Deviation from Test Standard............................................................................. 97 11.6. Test Result ......................................................................................................... 98 11.7. Test Photograph .............................................................................................. 100 12. Conducted Susceptibility ..................................................................................... 101 12.1. Test Specification............................................................................................. 101 12.2. Test Setup........................................................................................................ 101 12.3. Limit ................................................................................................................. 102 12.4. Test Procedure ................................................................................................ 102 12.5. Deviation from Test Standard........................................................................... 102 12.6. Test Result ....................................................................................................... 103 12.7. Test Photograph .............................................................................................. 105 13. Power Frequency Magnetic Field........................................................................ 107 13.1. Test Specification............................................................................................. 107 13.2. Test Setup........................................................................................................ 107 13.3. Limit ................................................................................................................. 107 13.4. Test Procedure ................................................................................................ 107 13.5. Deviation from Test Standard........................................................................... 107 13.6. Test Result ....................................................................................................... 108 13.7. Test Photograph .............................................................................................. 110 14. Voltage Dips and Interruption ...............................................................................111 14.1. Test Specification..............................................................................................111 14.2. Test Setup.........................................................................................................111 14.3. Limit ..................................................................................................................111 14.4. Test Procedure ................................................................................................ 112 14.5. Deviation from Test Standard........................................................................... 112 14.6. Test Result ....................................................................................................... 113 14.7. Test Photograph .............................................................................................. 115 15. Attachment .......................................................................................................... 116 　 EUT Photograph.................................................................................................. 116


Page: 7 of 122

1. General Information

1.1. EUT Description

Product Name MEGA BOOK Trade Name MSI Model No. MS-16321, MS-16323, MS-1632B, MS-16321B, MS-16323B, M670

Component

Power Adapter #1 MFR: LI SHIN,M/N:LSE0202C1990 Input: AC 100-240V, 50/60Hz, 1.5A Output: DC 19V, 4.74A Cable Out: Non-Shielded,1.8m,with one ferrite core bonded. Power Cord: Non-Shielded,1.2m

Power Adapter #2 MFR:LITEON,M/N:PA-1900-04 Input: AC 100-240V,50/60Hz,1.5A Output: DC 19V,4.74A Cable Out:Non-Shielded,1.8m,with one ferrite core bonded. Power Cord: Non-Shielded,1.2m

Note : The EUT is including six models for different marketing requirement.


Page: 8 of 122

MS-16323 AVL Keyparts mean is SKU key parts items Vendor Model Description 1 2 3 4 5 6 7 8 9 10

Turion 64bits Dual core CPU K8,AMD/TMDTL50HAX4CT,,1.6GHz,MPGA-638pin,TURION64-31W-1600MHz (S1 SOCKET) TL50 256KBx2 L2 CACHE,RoHS COMPLIANCE

ˇ

CPU K8,AMD/TMDTL52HAX5CT,,1.6GHz,MPGA-638pin,TURION64-31W-1600MHz (S1 SOCKET) TL52 512KBx2 L2 CACHE,RoHS COMPLIANCE

ˇ


ˇ ˇ


ˇ ˇ

Sampron CPU K8,AMD/SMS3200HAX4CM,,1.6GHz,MPGA-638pin,512KB L2 CACHE MOBILE SEMPRON(S1 SOCKET) 25W SERIES 3200+,RoHS COMPLIANCE

ˇ

CPU K8,AMD/SMS3400HAX3CM,,1.8GHz,MPGA-638pin,256KB L2 CACHE MOBILE SEMPRON(S1 SOCKET) 25W SERIES 3400+,RoHS COMPLIANCE

ˇ ˇ

CPU AMD

CPU K8,AMD/SMS3500HAX4CM,,1.8GHz,MPGA-638pin,512KB L2 CACHE MOBILE SEMPRON(S1 SOCKET) 25W SERIES 3500+,RoHS COMPLIANCE

ˇ ˇ

LCD Samsung Samsung LTN154X3-L01-H 15.4" WXGA( Glare,RoHS type ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

Fujitsu MHV2060BH (RoHS) 60G/5400rpm ˇ




TOSHIBA MK6034GSX (RoHS) 60G/5400rpm ˇ



TOSHIBA MK1234GSX (RoHS) 120G/5400rpm ˇ ˇ

HDD

WD 80G/5400rpm ˇ

HLDS GCC-4244N(combo) CDRW/DVDROM combo/Slim type/24X-R/24X-RW/8X-DVDROM/24X-CDROM/HLDS/RoHS COMPLIANCE

ˇ ˇ

Philips SCB5265(combo) CDRW/DVDROM combo/Slim type/24X-R/24X-RW/8X-DVDROM/24X-CDROM/PHILIPS /SCB5265/RoHS COMPLIANCE

ˇ ˇ

Lite-on SSC-2485K(combo) CDRW/DVDROM COMBO/SLIM TYPE/24X-R/24X-RW/8X-DVDROM/24X-CDROM/LITEON //RoHS COMPLIANCE

ˇ ˇ

HLDS GMA-4082N(supermulti) ,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/5X-DVD-RAM/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/GMA-4082N, RoHS(EU EXEMPTION)

ˇ ˇ

ODD

Lite-on ˇ ˇ

Transcend TS64MSQ64V5J DDRII 533, 512M, Samsung chip, RoHs ˇ

Transcend TS128MSQ64V5J DDRII 533 1G, Samsung chip, RoHs ˇ

Nanya NT512T64UHA1FN-37B DDRII 533, 512M, RoHs ˇ

Transcend TS64MSQ64V6M DDRII 667, 512M Infineon chip, RoHs ˇ

Transcend TS64MSQ64V6J DDRII 667, 512M, Micron chip, RoHs ˇ

Transcend TS64MSQ64V6J DDRII 667, 512M, Samsung chip, RoHs ˇ

Transcend TS64MSQ64V6J, DDR II 667, 512M,HYNIX CHIP,Rohs ˇ

Transcend TS128MSQ64V6J DDRII 667, 1G, Samsung chip, RoHs ˇ

Nanya NT512T64UHA1FN-3C DDRII 667, 512M, RoHs ˇ

RAM

Nanya NT1G6408HA0BN-3C DDRII 667, 1G, RoHs ˇ

Inverter Sampo YIVNMS0018D11-- ,SYS/MODULE/INVERTER/SAMPO/YIVNMS0018D11--/NOTEBOOK INVERTER FOR 15 TFT LCD/FOR MS-1034,LEAD FREE

ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

9cell ˇ ˇ ˇ ˇ

Battery

6cell CBPIL44 ˇ ˇ ˇ ˇ ˇ ˇ

Li-shin LSE0202C1990 /3pins POWER SUPPLY ADAPTOR/90W/90-264Vin/4.74A/19Vout 3PINS/LI SHIN// FOR MS-1037,RoHS COMPLIANCE

ˇ ˇ ˇ ˇ ˇ

AC-adapter

LITEON PA-1900-04 /3pins

SYS/POWER SUPPLY ADAPTOR/90W/90-264Vin/4.74A/19Vout/LITEON/ PA-1900-04RM/FOR MS-1058,RoHS COMPLIANCE

ˇ ˇ ˇ ˇ ˇ

Power Cord power cord 3 PINS EXT POWER CORD,USA,1,1830mm,PLUG-3P/CONN-3P,FOR MS-1003,, ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

K/B Chicony 103 keys(MS-16323 only) SYS KEYBOARD,103KEY,CHICONY/MP-03233US-3596 (122mm Membrane) NEW ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

Touch Pad ELANTECH TOUCHPAD MODULE/ELANTECH/810406-1853/ 73.7mm*43 mm ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

Touch Pad Mylar Hui teing Touchpad mylar silver ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

MDC Modem Q COM ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

WLAN MSI MS-6833B WIRELESS,6833B,1A,4L,2.35inchx1.76inch/pcs,5.68inchx3.57inch/PNL/4,Green, ENIG,26833B-1A.zip,RoHS COMPLIANCE ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ ˇ

High-Tek Wireless LAN Antenna Cable-R ANTENNA/HIGH-TEK/RIGHT/FOR MS-1039,RoHS COMPLIANCE ˇ ˇ ˇ ˇ ˇAntenna

High-Tek Wireless LAN Antenna Cable-L ANTENNA/HIGH-TEK/LEFT/FOR MS-1039,RoHS COMPLIANCE ˇ ˇ ˇ ˇ ˇ


Page: 9 of 122

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode

Mode 01: Mode 02: Mode 03: Mode 04: Mode 05: Mode 06: Mode 07: Mode 08: Mode 09: Mode 10:

Final Test Mode

Emission Mode 01: Mode 02:

Immunity Mode 01: Mode 02:


Page: 10 of 122

1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are:

Product Manufacturer Model No. Serial No. Power Cord

1 Monitor SAMSUNG 1200NF 800077E Non-Shielded, 1.8m

2 USB Keyboard BTC 5200U N/A N/A

3 USB Mouse Logitech M-BE58 HCA24311471 N/A

4 Walkman AIWA HS-TA164 N/A N/A

5 Microphone &

Earphone

PCHOME N/A N/A Non-Shielded, 2m

6 SATA HDD Onnto ST-M10 A01926-F03-0010 Non-Shielded,

1.8m,with one ferrite

core bonded.

7 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m

8 Notebook PC DELL PPT N/A Non-Shielded, 0.8m

9 Monitor ADI CM703 038054T10203876A Non-Shielded, 1.8m

10 COMBO HDD TeraSys F12-UF A0100215-64b0011 Non-Shielded, 1.8m

11 COMBO HDD TeraSys F12-UF A0100215-64b0018 Non-Shielded 1.8m

12 COMBO HDD TeraSys F12-UF A0100215-64b0005 Non-Shielded, 1.8m


Page: 11 of 122

1.4. Configuration of Tested System

Connection Diagram

Signal Cable Type Signal cable Description

A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded

B USB Keyboard Cable Shielded, 1.8m

C USB Mouse Cable Shielded, 1.8m

D Audio Cable Non-Shielded, 1.6m

E Earphone &Microphone Cable Non-Shielded, 1.6m

F SATA Cable Shielded, 1m

G LAN Cable Non-Shielded, 7m

H Telephone Cable Non-Shielded, 7m

I Telephone Cable Non-Shielded, 7m

J S-VIDEO Cable Shielded, 1.6m

K USB Cable Shielded, 1.5m

L USB Cable Shielded, 1.5m

M USB Cable Shielded, 1.5m


Page: 12 of 122

1.5. EUT Exercise Software

1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 Notebook reads data from disk. 4 Notebook sends “H” pattern to monitor.

5 Notebook reads and writes data into and from modem. 6 Notebook will read data from floppy disk and then writes the data into floppy disk , same

operation for hard disk. 7 Repeat the above procedure (4) to (7).


Page: 13 of 122

2. Technical Test

2.1. Summary of Test Result

No deviations from the test standards Deviations from the test standards as below description:

Emission

Performed Item Normative References Test

Performed Deviation

Conducted Emission EN 55022:1998+A1:2000+A2:2003 Class

BAS/NZS CISPR 22: 2004

Yes No

Impedance Stabilization

Network

EN 55022:1998+A1:2000+A2:2003 Class B

AS/NZS CISPR 22: 2004

Yes No

Radiated Emission EN 55022:1998+A1:2000+A2:2003 Class

BAS/NZS CISPR 22: 2004

Yes No

Power Harmonics EN 61000-3-2:2000 Yes No

Voltage Fluctuation and

Flicker

EN 61000-3-3:1995+A1:2001 Yes No

Immunity

Performed Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No

Radiated susceptibility IEC 61000-4-3:2002+A1:2002 Yes No

Electrical fast transient/burst IEC 61000-4-4:2004 Yes No

Surge IEC 61000-4-5 Edition 1.1: 2001-04 Yes No

Conducted susceptibility IEC 61000-4-6 Edition 2.1: 2004-11 Yes No

Power frequency magnetic field IEC 61000-4-8 Edition 1.1: 2001-03 Yes No

Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No


Page: 14 of 122

2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 836858/022 2006/02/18 LISN R&S ESH3-Z5 836679/020 2006/02/14 LISN R&S ENV4200 833209/007 2006/07/13 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2005/09/07 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator

Capacitive Voltage Probe Schaffner CVP2200A 18331 2005/11/11 EMI Test Receiver R&S ESCS 30 836858/022 2006/02/18 LISN R&S ENV4200 833209/007 2006/07/13 LISN R&S ESH3-Z5 836679/020 2006/02/14 lmpedance Stabilization Network Schaffner ISN T400 19099 2006/07/15

Pulse Limiter R&S ESH3-Z2 357.88.10.52 2005/09/07

RF Current Probe FCC F-65 10KHz~1GHz 198 2005/11/11

Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2005/09/15 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2006/07/25 EMI Test Receiver R&S ESI 26 838786/004 2006/06/19 EMI Test Receiver R&S ESCS 30 838251/001 2006/05/11 Horn Antenna Schwarzbeck BBHA9120D 305 2006/08/10

Pre-Amplifier MITEQ AMF-4D-180400-45-6P 925974 2006/01/03

Pre-Amplifier QTK N/A N/A 2006/01/03 Spectrum Analyzer Advantest R3162 101102468 2005/10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2006/06/29

IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2006/06/29

Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2006/06/29

IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2006/06/29

Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system Schaffner NSG 438 167 2006/03/24 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A


Page: 15 of 122

Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A

Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date

AF-BOX R&S AF-BOX ACCUST 100007 N/A

Audio Analyzer R&S UPL 16 100137 2006/03/16 Bilog Antenna Schaffner Chase CBL6112B 2450 2006/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2006/08/02 CMU200 UNIV.RADIOCOMM R&S CMU200 104846 2006/03/16

Directional Coupler A&R DC 6180 22735 2006/08/03 Dual Microphone Supply B&K 5935 2426784 2006/08/04 Mouth Simulator B&K 4227 2439692 2006/08/04 Power Amplifier A&R 100W10000M7 A285000010 N/A Power Amplifier A&R 30S1G3 309453 N/A Power Meter R&S NRVD(P.M) 100219 2006/04/21 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2006/08/04

Signal Generator R&S SMY02(9K-2080) 825454/028 2005/10/03

Electrical fast transient/burst / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe 2005/12/28

Surge / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe 2005/12/28

Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator 2006/04/21

Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 199749-020IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A

Triaxial ELF Magnetic Field Meter F.B.BELL 4090 9852 2006/05/30

Voltage dips and interruption / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe 2005/12/28


Page: 16 of 122

Schaffner NSG 2050 System Mainframe Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28

Damped osc. Wave 100kHz and 1MHz Schaffner PNW2056 200124-058SC 2005/12/28

Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03

PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28

Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 2006/03/27 CDN Schaffner TRA U150 20454 2006/03/27 CDN M016S Schaffner CAL U100A 20410 2006/03/27 CDN M016S Schaffner TRA U150 21167 2006/03/27 CDN T002 Schaffner CAL U100 20491 2006/03/27 CDN T002 Schaffner TRA U150 21169 2006/03/27 CDN T400 Schaffner CAL U100 17735 2006/03/27 CDN T400 Schaffner TRA U150 21166 2006/03/27 Coupling Decoupling Network Schaffner CDN M016S 20822 2006/03/27

Coupling Decoupling Network Schaffner CDN M016S 20823 2006/03/27

Coupling Decoupling Network Schaffner CDN T002 19018 2006/03/27

Coupling Decoupling Network Schaffner CDN T400 21226 2006/03/27

EM-CLAMP Schaffner KEMZ 801 21024 2006/04/21


Page: 17 of 122

2.3. Measurement Uncertainty Conducted Emission

The measurement uncertainty is evaluated as ± 2.26 dB.

Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 dB.

Radiated Emission The measurement uncertainty is evaluated as ± 3.19 dB.

Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.

Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.

Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 　 10-10 and

2.76%. Surge

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.

Conducted susceptibility


Page: 18 of 122

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %.

Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.


Page: 19 of 122

2.4. Test Environment

Performed Item Items Required Actual

Temperature (°C) 15-35 25

Conducted Emission

Humidity (%RH) 25-75 50

Barometric pressure (mbar) 860-1060 950-1000


Impedance Stabilization Network




Radiated Emission




Electrostatic Discharge




Radiated susceptibility




Electrical fast transient/burst




Surge Humidity (%RH) 10-75 46



Conducted susceptibility




Power frequency Humidity (%RH) 25-75 47


Page: 20 of 122

magnetic field



Voltage dips and interruption




Page: 21 of 122

3. Conducted Emission (Main Terminals)

3.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004

3.2. Test Setup

3.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 – 46

0.50-5.0 56 46

5.0 - 30 60 50

Remarks: In the above table, the tighter limit applies at the band edges.


Page: 22 of 122

3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard No deviation.


Page: 23 of 122

3.6. Test Result Site : SR-1 Time : 2006/08/15 - 16:41

Limit : CISPR_B_00M_QP Margin : 0

EUT : MEGA BOOK Probe : LISN-L(023) - Line1

Power : AC 230V/50Hz Note : MODE 1


Page: 24 of 122

Site : SR-1 Time : 2006/08/15 - 16:43




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 0.670 51.740 52.410 -12.247 64.657 QUASIPEAK

2 0.259 0.324 47.790 48.114 -14.772 62.886 QUASIPEAK

3 * 0.517 0.300 47.170 47.470 -8.530 56.000 QUASIPEAK

4 0.779 0.310 42.650 42.960 -13.040 56.000 QUASIPEAK

5 2.197 0.350 38.800 39.150 -16.850 56.000 QUASIPEAK

6 3.752 0.390 38.240 38.630 -17.370 56.000 QUASIPEAK

Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 25 of 122

Site : SR-1 Time : 2006/08/15 - 16:43

Limit : CISPR_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 0.670 49.680 50.350 -4.307 54.657 AVERAGE

2 0.259 0.324 46.390 46.714 -6.172 52.886 AVERAGE

3 * 0.517 0.300 43.580 43.880 -2.120 46.000 AVERAGE

4 0.779 0.310 36.210 36.520 -9.480 46.000 AVERAGE

5 2.197 0.350 37.530 37.880 -8.120 46.000 AVERAGE

6 3.752 0.390 33.860 34.250 -11.750 46.000 AVERAGE



Page: 26 of 122

Site : SR-1 Time : 2006/08/15 - 16:50


EUT : MEGA BOOK Probe : LISN-N(023) - Line2



Page: 27 of 122

Site : SR-1 Time : 2006/08/15 - 16:52




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.189 0.300 49.540 49.840 -15.046 64.886 QUASIPEAK

2 0.259 0.300 48.610 48.910 -13.976 62.886 QUASIPEAK

3 * 0.451 0.310 43.660 43.970 -13.430 57.400 QUASIPEAK

4 0.970 0.320 40.160 40.480 -15.520 56.000 QUASIPEAK

5 7.552 0.460 34.580 35.040 -24.960 60.000 QUASIPEAK

6 19.529 0.900 33.230 34.130 -25.870 60.000 QUASIPEAK



Page: 28 of 122

Site : SR-1 Time : 2006/08/15 - 16:52




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.189 0.300 47.660 47.960 -6.926 54.886 AVERAGE

2 * 0.259 0.300 47.870 48.170 -4.716 52.886 AVERAGE

3 0.451 0.310 39.030 39.340 -8.060 47.400 AVERAGE

4 0.970 0.320 38.440 38.760 -7.240 46.000 AVERAGE

5 7.552 0.460 27.060 27.520 -22.480 50.000 AVERAGE

6 19.529 0.900 26.680 27.580 -22.420 50.000 AVERAGE



Page: 29 of 122

Site : SR-1 Time : 2006/08/15 - 17:38





Page: 30 of 122

Site : SR-1 Time : 2006/08/15 - 17:40




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.494 0.300 46.580 46.880 -9.291 56.171 QUASIPEAK

2 0.771 0.310 43.570 43.880 -12.120 56.000 QUASIPEAK

3 1.005 0.317 43.930 44.247 -11.753 56.000 QUASIPEAK

4 1.923 0.340 36.260 36.600 -19.400 56.000 QUASIPEAK

5 3.462 0.380 33.730 34.110 -21.890 56.000 QUASIPEAK

6 9.783 0.590 27.470 28.060 -31.940 60.000 QUASIPEAK



Page: 31 of 122

Site : SR-1 Time : 2006/08/15 - 17:40




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.494 0.300 28.570 28.870 -17.301 46.171 AVERAGE

2 * 0.771 0.310 28.750 29.060 -16.940 46.000 AVERAGE

3 1.005 0.317 25.160 25.477 -20.523 46.000 AVERAGE

4 1.923 0.340 24.070 24.410 -21.590 46.000 AVERAGE

5 3.462 0.380 25.600 25.980 -20.020 46.000 AVERAGE

6 9.783 0.590 21.060 21.650 -28.350 50.000 AVERAGE



Page: 32 of 122

Site : SR-1 Time : 2006/08/15 - 17:41





Page: 33 of 122

Site : SR-1 Time : 2006/08/15 - 17:42




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.431 0.310 44.860 45.170 -12.801 57.971 QUASIPEAK

2 0.591 0.310 39.240 39.550 -16.450 56.000 QUASIPEAK

3 * 0.904 0.320 44.160 44.480 -11.520 56.000 QUASIPEAK

4 1.955 0.350 37.650 38.000 -18.000 56.000 QUASIPEAK

5 3.474 0.390 33.850 34.240 -21.760 56.000 QUASIPEAK

6 20.994 0.940 31.280 32.220 -27.780 60.000 QUASIPEAK



Page: 34 of 122

Site : SR-1 Time : 2006/08/15 - 17:42




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.431 0.310 26.680 26.990 -20.981 47.971 AVERAGE

2 * 0.591 0.310 29.270 29.580 -16.420 46.000 AVERAGE

3 0.904 0.320 26.990 27.310 -18.690 46.000 AVERAGE

4 1.955 0.350 25.220 25.570 -20.430 46.000 AVERAGE

5 3.474 0.390 24.900 25.290 -20.710 46.000 AVERAGE

6 20.994 0.940 26.070 27.010 -22.990 50.000 AVERAGE



Page: 35 of 122

3.7. Test Photograph Test Mode : Mode 01: Description : Front View of Conducted Test

Test Mode : Mode 01: Description : Back View of Conducted Test


Page: 36 of 122

Test Mode : Mode 02: Description : Front View of Conducted Test

Test Mode : Mode 02: Description : Back View of Conducted Test


Page: 37 of 122

4. Conducted Emissions (Telecommunication Ports)

4.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004

4.2. Test Setup

4.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 84 – 74 74 – 64

0.50 - 30 74 64

Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz.


Page: 38 of 122

4.4. Test Procedure Telecommunication Port:

The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.



Page: 39 of 122

4.6. Test Result Site : SR-1 Time : 2006/08/18 - 11:15

Limit : ISN_Voltage_B_10db_00M_QP Margin : 0

EUT : MEGA BOOK Probe : ISN-T400 - Line1

Power : AC 230V/50Hz Note : MODE 1,ISN 100Mbps


Page: 40 of 122

Site : SR-1 Time : 2006/08/18 - 11:16




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.193 9.896 52.120 62.016 -20.755 82.771 QUASIPEAK

2 * 0.408 9.874 56.970 66.844 -9.785 76.629 QUASIPEAK

3 1.673 9.820 45.790 55.610 -18.390 74.000 QUASIPEAK

4 5.295 9.800 48.870 58.670 -15.330 74.000 QUASIPEAK

5 7.923 9.790 56.440 66.230 -17.770 84.000 QUASIPEAK

6 16.228 9.940 61.920 71.860 -12.140 84.000 QUASIPEAK



Page: 41 of 122

Site : SR-1 Time : 2006/08/18 - 11:16

Limit : ISN_Voltage_B_10db_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.193 9.896 49.110 59.006 -13.765 72.771 AVERAGE

2 0.408 9.874 47.300 57.174 -9.455 66.629 AVERAGE

3 1.673 9.820 38.880 48.700 -15.300 64.000 AVERAGE

4 5.295 9.800 46.430 56.230 -7.770 64.000 AVERAGE

5 7.923 9.790 54.190 63.980 -10.020 74.000 AVERAGE

6 * 16.228 9.940 60.120 70.060 -3.940 74.000 AVERAGE



Page: 42 of 122

Site : SR-1 Time : 2006/08/18 - 11:21





Page: 43 of 122

Site : SR-1 Time : 2006/08/18 - 11:23




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.193 9.896 51.940 61.836 -20.935 82.771 QUASIPEAK

2 0.455 9.870 59.800 69.670 -5.616 75.286 QUASIPEAK

3 * 0.771 9.840 60.600 70.440 -3.560 74.000 QUASIPEAK

4 5.013 9.800 46.930 56.730 -17.270 74.000 QUASIPEAK

5 9.990 9.780 60.540 70.320 -13.680 84.000 QUASIPEAK

6 14.978 9.950 43.770 53.720 -30.280 84.000 QUASIPEAK



Page: 44 of 122

Site : SR-1 Time : 2006/08/18 - 11:23




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.193 9.896 48.860 58.756 -14.015 72.771 AVERAGE

2 0.455 9.870 52.200 62.070 -3.216 65.286 AVERAGE

3 * 0.771 9.840 50.960 60.800 -3.200 64.000 AVERAGE

4 5.013 9.800 23.260 33.060 -30.940 64.000 AVERAGE

5 9.990 9.780 37.250 47.030 -26.970 74.000 AVERAGE

6 14.978 9.950 18.050 28.000 -46.000 74.000 AVERAGE



Page: 45 of 122

Site : SR-1 Time : 2006/08/18 - 13:30

Limit : ISN_Voltage_B_00M_QP Margin : 0


Power : AC 230V/50Hz Note : MODE 1,TECLCOM


Page: 46 of 122

Site : SR-1 Time : 2006/08/18 - 13:32




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.181 9.900 58.590 68.490 -14.624 83.114 QUASIPEAK

2 0.287 9.890 44.440 54.330 -25.756 80.086 QUASIPEAK

3 1.802 9.820 38.630 48.450 -25.550 74.000 QUASIPEAK

4 3.791 9.810 36.400 46.210 -27.790 74.000 QUASIPEAK

5 7.119 9.790 35.800 45.590 -28.410 74.000 QUASIPEAK

6 19.158 9.920 36.690 46.610 -27.390 74.000 QUASIPEAK



Page: 47 of 122

Site : SR-1 Time : 2006/08/18 - 13:32

Limit : ISN_Voltage_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.181 9.900 56.690 66.590 -6.524 73.114 AVERAGE

2 0.287 9.890 42.020 51.910 -18.176 70.086 AVERAGE

3 1.802 9.820 34.980 44.800 -19.200 64.000 AVERAGE

4 3.791 9.810 26.400 36.210 -27.790 64.000 AVERAGE

5 7.119 9.790 30.250 40.040 -23.960 64.000 AVERAGE

6 19.158 9.920 34.970 44.890 -19.110 64.000 AVERAGE



Page: 48 of 122

Site : SR-1 Time : 2006/08/18 - 11:35





Page: 49 of 122

Site : SR-1 Time : 2006/08/18 - 11:37




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.287 9.890 56.900 66.790 -13.296 80.086 QUASIPEAK

2 * 0.478 9.870 55.570 65.440 -9.189 74.629 QUASIPEAK

3 0.763 9.840 49.470 59.310 -14.690 74.000 QUASIPEAK

4 6.701 9.790 56.110 65.900 -18.100 84.000 QUASIPEAK

5 13.420 9.960 61.020 70.980 -13.020 84.000 QUASIPEAK

6 16.228 9.940 63.270 73.210 -10.790 84.000 QUASIPEAK



Page: 50 of 122

Site : SR-1 Time : 2006/08/18 - 11:38




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.287 9.890 55.600 65.490 -4.596 70.086 AVERAGE

2 0.478 9.870 49.760 59.630 -4.999 64.629 AVERAGE

3 0.763 9.840 43.530 53.370 -10.630 64.000 AVERAGE

4 6.701 9.790 53.020 62.810 -11.190 74.000 AVERAGE

5 13.420 9.960 57.640 67.600 -6.400 74.000 AVERAGE

6 * 16.228 9.940 60.380 70.320 -3.680 74.000 AVERAGE



Page: 51 of 122

Site : SR-1 Time : 2006/08/18 - 11:42





Page: 52 of 122

Site : SR-1 Time : 2006/08/18 - 11:44




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.189 9.897 61.580 71.477 -11.409 82.886 QUASIPEAK

2 * 0.455 9.870 60.960 70.830 -4.456 75.286 QUASIPEAK

3 0.763 9.840 51.890 61.730 -12.270 74.000 QUASIPEAK

4 4.959 9.800 48.170 57.970 -16.030 74.000 QUASIPEAK

5 10.002 9.780 64.760 74.540 -9.460 84.000 QUASIPEAK

6 12.181 9.854 44.360 54.214 -29.786 84.000 QUASIPEAK



Page: 53 of 122

Site : SR-1 Time : 2006/08/18 - 11:44




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.189 9.897 61.570 71.467 -1.419 72.886 AVERAGE

2 0.455 9.870 51.970 61.840 -3.446 65.286 AVERAGE

3 0.763 9.840 46.960 56.800 -7.200 64.000 AVERAGE

4 4.959 9.800 32.810 42.610 -21.390 64.000 AVERAGE

5 10.002 9.780 48.600 58.380 -15.620 74.000 AVERAGE

6 12.181 9.854 20.080 29.934 -44.066 74.000 AVERAGE



Page: 54 of 122

Site : SR-1 Time : 2006/08/18 - 13:35





Page: 55 of 122

Site : SR-1 Time : 2006/08/18 - 13:36




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.181 9.900 59.020 68.920 -14.194 83.114 QUASIPEAK

2 0.298 9.890 43.020 52.910 -26.861 79.771 QUASIPEAK

3 1.689 9.820 37.950 47.770 -26.230 74.000 QUASIPEAK

4 3.755 9.810 35.920 45.730 -28.270 74.000 QUASIPEAK

5 7.244 9.790 36.280 46.070 -27.930 74.000 QUASIPEAK

6 18.681 9.920 37.300 47.220 -26.780 74.000 QUASIPEAK



Page: 56 of 122

Site : SR-1 Time : 2006/08/18 - 13:36

Limit : ISN_Voltage_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.181 9.900 56.550 66.450 -6.664 73.114 AVERAGE

2 0.298 9.890 37.940 47.830 -21.941 69.771 AVERAGE

3 1.689 9.820 36.400 46.220 -17.780 64.000 AVERAGE

4 3.755 9.810 26.520 36.330 -27.670 64.000 AVERAGE

5 7.244 9.790 31.590 41.380 -22.620 64.000 AVERAGE

6 18.681 9.920 35.620 45.540 -18.460 64.000 AVERAGE



Page: 57 of 122

4.7. Test Photograph Test Mode : Mode 01: Description : Front View of ISN Test

Test Mode : Mode 01: Description : Back View of ISN Test


Page: 58 of 122

Test Mode : Mode 02: Description : Front View of ISN Test

Test Mode : Mode 02: Description : Back View of ISN Test


Page: 59 of 122

5. Radiated Emission

5.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22

5.2. Test Setup

5.3. Limit

Limits Frequency

(MHz) Distance (m) dBuV/m

30 – 230 10 30

230 – 1000 10 37

Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Page: 60 of 122

5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1GHz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters.



Page: 61 of 122

5.6. Test Result Site : SITE 3 Time : 2006/08/16 - 14:44


EUT : MEGA BOOK Probe : LKCBL6112(2704)-10M - HORIZONTAL


Frequency (MHz) Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin (dB) Limit (dBuV/m) Detector Type

1 119.725 12.953 13.898 26.851 -3.149 30.000 PEAK

2 * 207.025 9.773 17.735 27.509 -2.491 30.000 PEAK

3 308.875 13.786 15.266 29.052 -7.948 37.000 PEAK

4 624.125 20.860 7.655 28.515 -8.485 37.000 PEAK

5 757.500 21.672 7.098 28.770 -8.230 37.000 PEAK

6 854.500 22.477 6.777 29.254 -7.746 37.000 PEAK

Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or

average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 62 of 122

Site : SITE 3 Time : 2006/08/16 - 14:47


EUT : MEGA BOOK Probe : LKCBL6112(2704)-10M - VERTICAL



(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)


1 308.875 13.803 14.403 28.206 -8.794 37.000 QUASIPEAK

2 330.700 14.376 14.459 28.835 -8.165 37.000 QUASIPEAK

3 500.450 18.354 7.610 25.964 -11.036 37.000 QUASIPEAK

4 624.125 21.210 5.044 26.254 -10.746 37.000 QUASIPEAK

5 830.250 21.445 5.930 27.375 -9.625 37.000 QUASIPEAK

6 * 966.050 22.938 11.396 34.334 -2.666 37.000 QUASIPEAK




Page: 63 of 122

Site : SITE 3 Time : 2006/08/16 - 14:49


EUT : MEGA BOOK Probe : LKCBL6112(2704)-10M - HORIZONTAL



(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)


1 119.725 12.953 13.583 26.536 -3.464 30.000 QUASIPEAK

2 * 207.025 9.773 17.135 26.909 -3.091 30.000 QUASIPEAK

3 308.875 13.786 14.617 28.403 -8.597 37.000 QUASIPEAK

4 626.550 20.834 8.542 29.376 -7.624 37.000 QUASIPEAK

5 670.200 20.634 8.774 29.408 -7.592 37.000 QUASIPEAK

6 820.550 21.845 7.453 29.298 -7.702 37.000 QUASIPEAK




Page: 64 of 122

Site : SITE 3 Time : 2006/08/16 - 14:51


EUT : MEGA BOOK Probe : LKCBL6112(2704)-10M - VERTICAL



(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)


1 207.025 10.040 18.220 28.260 -1.740 30.000 QUASIPEAK

2 304.025 13.722 14.016 27.738 -9.262 37.000 QUASIPEAK

3 502.875 18.472 8.398 26.870 -10.130 37.000 QUASIPEAK

4 624.125 21.210 6.423 27.633 -9.367 37.000 QUASIPEAK

5 837.525 21.486 6.095 27.581 -9.419 37.000 QUASIPEAK

6 * 961.200 23.009 12.442 35.451 -1.549 37.000 QUASIPEAK




Page: 65 of 122

5.7. Test Photograph Test Mode : Mode 01: Description : Front View of Radiated Test

Test Mode : Mode 01: Description : Back View of Radiated Test


Page: 66 of 122

Test Mode : Mode 02: Description : Front View of Radiated Test

Test Mode : Mode 02: Description : Back View of Radiated Test


Page: 67 of 122

6. Harmonic Current Emission

6.1. Test Specification According to EMC Standard : EN 61000-3-2

6.2. Test Setup

6.3. Limit (a) Limits of Class A Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n


Page: 68 of 122

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 ≤ n ≤ 39 (odd harmonics only)

3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current per watt

mA/W


A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 ≤ n ≤ 39 (odd harmonics only)

3.85/n See limit of Class A


Page: 69 of 122

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 70 of 122

6.6. Test Result Product MEGA BOOK

Test Item Power Harmonics

Test Mode Mode 01:

Date of Test 2006/08/16 Test Site No.3 Shielded Room

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-0.9-0.6-0.30.00.30.60.9

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.000.050.100.150.200.250.300.35

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.


Page: 71 of 122


THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000

Highest parameter values during test:

V_RMS (Volts): 229.76 Frequency(Hz): 50.00

I_Peak (Amps): 0.743 I_RMS (Amps): 0.343

I_Fund (Amps): 0.285 Crest Factor: 2.456

Power (Watts): 73.5 Power Factor: 0.933

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.001 3 0.066 0.250 0.0 0.068 0.375 0.00 Pass 4 0.000 5 0.014 0.140 0.0 0.014 0.205 0.00 Pass 6 0.001 7 0.008 0.074 0.0 0.009 0.108 0.00 Pass 8 0.000 9 0.006 0.037 0.0 0.006 0.055 0.00 Pass 10 0.000 11 0.003 0.026 0.0 0.004 0.038 0.00 Pass 12 0.000 13 0.002 0.022 0.0 0.002 0.033 0.00 Pass 14 0.000 15 0.004 0.019 0.0 0.004 0.028 0.00 Pass 16 0.000 17 0.003 0.017 0.0 0.004 0.025 0.00 Pass 18 0.000 19 0.002 0.015 0.0 0.002 0.022 0.00 Pass 20 0.000 21 0.002 0.013 0.0 0.002 0.020 0.00 Pass 22 0.000 23 0.002 0.012 0.0 0.002 0.018 0.00 Pass 24 0.000 25 0.002 0.011 0.0 0.002 0.017 0.00 Pass 26 0.000 27 0.002 0.011 0.0 0.002 0.015 0.00 Pass 28 0.000 29 0.001 0.010 0.0 0.001 0.015 0.00 Pass 30 0.000 31 0.001 0.009 0.0 0.001 0.014 0.00 Pass 32 0.000 33 0.001 0.009 0.0 0.002 0.013 0.00 Pass 34 0.000 35 0.001 0.008 0.0 0.001 0.012 0.00 Pass 36 0.000 37 0.001 0.008 0.0 0.001 0.011 0.00 Pass 38 0.000 39 0.001 0.007 0.0 0.001 0.011 0.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 72 of 122

Product MEGA BOOK

Test Item Power Harmonics

Test Mode Mode 02:



Current & voltage waveforms

-0.9-0.6-0.30.00.30.60.9

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.000.050.100.150.200.250.300.350.400.45

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #7 with 13.71% of the limit.


Page: 73 of 122


THC(A): 0.07 I-THD(%): 23.53 POHC(A): 0.004 POHC Limit(A): 0.038

Highest parameter values during test:

V_RMS (Volts): 229.76 Frequency(Hz): 50.00

I_Peak (Amps): 0.635 I_RMS (Amps): 0.397

I_Fund (Amps): 0.355 Crest Factor: 2.008

Power (Watts): 88.1 Power Factor: 0.965

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.001 3 0.059 0.299 0.0 0.061 0.449 0.00 Pass 4 0.000 5 0.027 0.167 0.0 0.031 0.251 0.00 Pass 6 0.000 7 0.011 0.088 0.0 0.018 0.132 13.51 Pass 8 0.000 9 0.003 0.044 0.0 0.005 0.066 7.48 Pass 10 0.000 11 0.005 0.031 0.0 0.005 0.046 0.00 Pass 12 0.000 13 0.004 0.026 0.0 0.005 0.039 0.00 Pass 14 0.000 15 0.002 0.023 0.0 0.004 0.034 0.00 Pass 16 0.000 17 0.002 0.020 0.0 0.003 0.030 10.25 Pass 18 0.000 19 0.003 0.018 0.0 0.003 0.027 0.00 Pass 20 0.000 21 0.002 0.016 0.0 0.002 0.019 0.00 Pass 22 0.000 23 0.001 0.015 0.0 0.002 0.020 7.97 Pass 24 0.000 25 0.001 0.014 0.0 0.002 0.020 0.00 Pass 26 0.000 27 0.001 0.013 0.0 0.002 0.019 10.38 Pass 28 0.000 29 0.001 0.012 0.0 0.001 0.018 0.00 Pass 30 0.000 31 0.001 0.011 0.0 0.001 0.016 0.00 Pass 32 0.000 33 0.001 0.010 0.0 0.001 0.015 0.00 Pass 34 0.000 35 0.001 0.010 0.0 0.001 0.015 0.00 Pass 36 0.000 37 0.001 0.009 0.0 0.001 0.011 0.00 Pass 38 0.000 39 0.001 0.009 0.0 0.001 0.013 0.00 Pass 40 0.000

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 74 of 122

6.7. Test Photograph Test Mode : Mode 01: Description : Power Harmonics Test Setup

Test Mode : Mode 02: Description : Power Harmonics Test Setup


Page: 75 of 122

7. Voltage Fluctuation and Flicker

7.1. Test Specification

According to EMC Standard : EN 61000-3-3

7.2. Test Setup

7.3. Limit The following limits apply:

－ the value of Pst shall not be greater than 1.0; － the value of Plt shall not be greater than 0.65; － the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500

ms; － the relative steady-state voltage change, dc, shall not exceed 3.3 ％; － the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions; b) 6 ％ for equipment which is:

－ switched manually, or － switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax of 6％producing a rectangular voltage change characteristic twice per

hour will give a P1t of about 0.65.


Page: 76 of 122

c) 7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

7.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 77 of 122

7.6. Test Result Product MEGA BOOK

Test Item Voltage Fluctuation and Flicker

Test Mode Mode 01:


Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

13:4

2:3

0

Plt and limit line

0.10.20.30.40.50.6

Plt

13:4

2:3

0

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.64 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass


Page: 78 of 122

Product MEGA BOOK

Test Item Voltage Fluctuation and Flicker

Test Mode Mode 02:


Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

14:0

6:3

0

Plt and limit line

0.10.20.30.40.50.6

Plt

14:0

6:3

0

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.63 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass


Page: 79 of 122

7.7. Test Photograph Test Mode : Mode 01: Description : Flicker Test Setup

Test Mode : Mode 02: Description : Flicker Test Setup


Page: 80 of 122

8. Electrostatic Discharge

8.1. Test Specification According to Standard : IEC 61000-4-2

8.2. Test Setup

8.3. Limit

Item Environmental Phenomena

Units Test Specification Performance Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge ±4 Contact Discharge

B


Page: 81 of 122

8.4. Test Procedure

Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.

8.5. Deviation from Test Standard

No deviation.


Page: 82 of 122

8.6. Test Result Product ME

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