AD-AL14 117 FEDERAL AVIATION ADMINISTRATION TECHNICAL CENTER ATL-ETC F/6 1/3CONPENDIUM OF LISHTNINO EFFECTS ON FUTURE AIRCRAFT ELECTRONIC- ETCIU)
UNCLASSIFIED DOT/FAA/CT62/30 M
DOTFA/C8230A Compendium of LightningEffects on Future AircraftElectronic Systems
Nickolus 0. Rasch
February 1982
Compendium
This document is available to the U.S. public- through the National Technical Information
Service, Springfield, Virginia 22161.
DTIV7fC) - A 18
US Deparment of Transpotatin ATUchnical CenterAtlantic City Airport, N.J. 08405
-- -- A.
NOTICE
This document is disseminated under the sponsorship ofthe Department of Transportation in the interest ofinformation exchange. The United States Governmentassumes no liability for the contents or use thereof.
The United States Government does not endorse productsor manufacturers. Trade or manufacturer's names appearherein solely because they are considered essential tothe object of this report.
1
Technical Report Documentation Page1. Report No. 2. Government Accessoon No. 3. Recipiont's Catalog No.
DOT/FAA/CT-82/230 -oeen AJesi
4. Title and Suboole 5. Report DateFebruary 1982
A COMPENDIUM OF LIGHTNING EFFECTS ON FUTURE AIRCRAFT 6. Performing Organization CodeSYSTEMS
8. Performing Organization Report No.7. Authorls)
Nickolus 0. Rasch ACT-3409. Performing Organization Name and Address 10. Work Unit No. (TRAIS)Federal Aviation AdministrationTechnical Center 11. Contract or Grant No.Atlantic City Airport, New Jersey 08405 182-340-100
13. Type of Report and Period Covered
12. Sponsoring Agency Name and AddressU.S. Department of Transportation FinalFederal Aviation Administration November 4-8, 1981Technical Center 14. Sponsoring Agency Code
Atlantic City Airport, New Jersey 08405
15. Supplementary Notes
16. Abstract
This publication is a composite of presentations given at the NASA-Langley ResearchCenter/FAA Technical Center "Lightning Effects on Future Aircraft Systems Workshop"held on November 4-6, 1981, at the NASA-Langley Research Center Facility.
The presentations encompassed the full spectrum of lightning research from lightingphenomonology, lightning modeling, electromagnetic issues associated with compositematerials, to the lightning/aircraft electromagnetic interaction analysis. Alsoincluded are a total of five presentations assessing the Digital System upsetphenomen. <
17. Key Words 18. Distribution StatementTriboelectrification Document is available to the U.S. publicCorona through the National Technical InformationStepped Leader Service, Springfield, Virginia 22161Tortuous Channel
19. Security Classif. (of this report) 20. Security Clascif. (of this page) 21. No. of Pages 22. Price
Unclassified Unclassified 251
Form DOT F 1700.7 (8-72) Reproduction of completed page authorized
till III
IAI
A
I' I'
Eu E~
II
2c wo a 0 Q0
* 4
*m
Wa
C2
PREFACE
The "Lightning Effects on Future Aircraft Electronic Systems" workshop,November 4-6, 1981, sponsored by the NASA-Langley Research Center inconjunction with the Federal Aviation Administration (FAA) Technical Center,provided an ideal vehicle for information exchange. This workshop providedregional and headquarters personnel with an insight into the magnitude of theproblem, and the progress being accomplished through existing and futureFAA programs.
protection of electrical and electronic subsystems and equipments against
the atmospheric electricity hazards constituted by lightning and staticelectricity must be taken into special account in the design of advancedtechnology aircraft. Two primary factors have contributed to an increasedpotential hazard to new generation aircraft: (1) The increasingly widespreaduse of digital microelectronic subsystems and/or avionic equipment which areinherently susceptible to upset and damage caused by electrical transientsto implement flight and mission critical functions; and (2) the reducedelectromagnetic shielding provided by many advanced structural materials.Present military and civil design guides and standards are being reviewed toassure adequate protection for new generation aircraft.
The NASA-Langley Research Center Electronic System Branch of the FlightElectronic Division was the host for this workshop; which is a major elementin the FAA Technical Center's Advanced Integrated Flight Systems (AIFS)program. The AIFS program objectives are to acquire and disseminate data,enhance communications, and provide Aviation Standards, lead and/or certifyregions airworthiness/certification personnel with a vehicle for informationtransfer in this highly technological area of lightning research as relatedto aircraft flight safety.
The personnel from the NASA-Langley Research Center Aircraft Electronic SystemBranch and their associates exhibited professionalism in the planning, assemblingthe technical experts and material, and conducting this workshop. It is witha deep and sincere sense of gratitude that we of the FAA would like to extendour appreciation to those persons for a job well done.
-a -tV L Cotinl s
IvalobllitY C'odes
iii
-- : .. . . . .. : _- ., .
TABLE OF CONTENTS
Page
Lightning Effects Research Program - by Mr. Felix Pitts I
Lightning Phenomenology - by Dr. M. Levine 5
Flight Experiment Definition and Summary - by Mr Felix Pitts 19
Data System Description - by Mr. Mitchel E. Thomas 29
Electromagnetic Sensors for Aircraft Lightning Reseach -by Mr. Klaus P. Zaepfel 39
Lightning Modeling - by Dr. M. Levine 51
Interpretation of In-Flight Test Data Approach, Problems and Outlook -
by Dr. R. A. Perala 61
Corona and Streamer Effects - by Dr. R. A. Perala 76
An Analysis Method for the F-106 Direct Strike Data -by Dr. T. F. Trost 81
An Overview of the Electrical/Electromagnetic Impact of AdvancedComposite Materials on Aircraft Design - by Dr. John C. Corbin, Jr. 91
Structural Application of Composite Materials and the DirectEffects of Lightning Strikes - by Mr. William E. Howell 155
Lightning Interaction Analysis - by Dr. Karl S. Kunz 171
Intermittent/Transient Faults in Digital Computers -by Dr. Gerald M. Masson 195
A Microprocessor-Based Upset Test Method - by Ms. Celeste M. Belcasto 213
Diagnostic Emulation Analysis--Need and Techniqueby Mr. Gerard E. Migneault 221
Digital System Hardware Description Technique Used in Emulation -
by Mr. Robert M. Thomas, Jr. 231
The Need for Transient Data in a CARE III Reliability Analysis -
by Mr. Salvatore J. Bavuso 241
v
i ,- "
LIGHTNING EFFECTS RESEARCH PROGRAM
by
Mr. Felix Pitts
Langley Research CenterNational Aeronautics and Space Administration
The current research program being pursued at the LangleyResearch Center on lightning and its effects on digitalelectronic systems will be presented.
4 -
A-AA
-I
LIGHTNING EFFECTS
CURRENT TRANSPORT AIRCRAFT STRUCK ABOUT ONCE PER YEAR
- ALUMINUM ,SKIN
- HYDRAULIC/MECHANICAL PRIMARY CONTROLS
- MOSTLY NUISANCE PROBLEMS CAUSED BY LIGHTNING
m FUTURE AIRCRAFT WILL EMPLOY- COMPOSITE STRUCTURE
- DIGITAL AVIONICS/ELECTRONIC CONTROLS
SUSCEPTIBLE TO DISTURBANCE
POTENTIAL FOR UPSET
. EED FOR FUTURE AIRCRAFT DESIGNS
- BETTER UNDERSTANDING OF IN-FLIGHT LIGHTNING ENVIRONMENT
- TECHNIQUES FOR ASSESSINIG DIGITAL SYSTEM PERFORMANCE INLIGHTNING ENVIRONMENT
LIGHTNING EFFECTS RESEARCH PROGRAM
D SA/C RESPONSE:SIUMENTATION SYSTEM/CALE DIAGNOSTIC EMULATIONli .c ....iI/VOLTAGES AD -STATE TRANSITION
ILIHTNING SOURCE: CURRENTS
I DIGITAL SYSTEM "
~USET ITEST TEST DNFINIT
3
LIGHTNING PHENOMENOLOGY
by
Dr. M. LeVine
Goddard Space Flight CenterNational Aeronautics and Space Administration
State-of-the-art of lightning knowledge: Theories ofcharge generation, the lightning discharge, steppedleaders, return strokes, fundamental electromagneticsof lightning, statistical distribution of lightningcharacteristics.
5 fwmium p~aa u nam
10
+ -33
CI..OUD - CLOUD -8c
CLOUD - GROUND
0 +30
70psec 60ILS
L~\ Mscim
h -20 msec ~ 440 mriec-P, I.4 30 mseci>I j60pnc
DART DARTLEADER LEADER I
-~:STEPPEDv
LEADER
RETURN RETURN RETURNTROKE STROKE STROKE
LU t
to r- c LU0 0 0I~
LU 24
LC0 0o 0- CI-,wl 023 c-~o .- 0
> 4 a r
LU otL
LU uj x x
2U 00 R cc o=L to N~' La Lo C04 U-(VU-( ACD a
I..
c'- oo LU o U0f WL44 4jW)r e(
0O 0 0 us CC
~80 ~ 0 ~OL4 x x C4O > Q t- i4
Mi oJ C!JZlb WLU
C-3 in N -a -
cm to c
HISTORICAL PERSPEC VE
1752 B. FRANKLIN
IM6 FIRST PHOTOGRAPH
1916 C. T. R.WILSON(FIELD MIWL
1929 BOYS AMERARADIATION RELD(OS 1 = INS
STUDIES ON OUTH AFRICA
SCHONLAND
1980 STERD PHOOS) NEW MEYJCO TECH GET CA o
WIDEBAND DIGTAL EMI TI 1170I
THUNDESTORM RESEARCH PROJCT
Ism. Is
maI
TU
UC
'.4
E9
>49
10
CL
C I-~ch
LLU
I -
LLU
LU
cowL
DISTRIBUTIN OF CHAR85 IN A THUNDERCLOUD
+ + -45
113
FIELD HANGES3STE
00
AN4TENNA INTEGRATOR LOAD
E I NTEGRATOR
12
SLOW ELECTRIC FIELD CHANGES
INThAGWUD
CLOUD -GROUND
FAST ELECTRIC FIELD CHANGES
LOW RESOLUTION HIGH RESOLUTION
FIRST RETURN STROKE
SLOW E
CLOUD PROCESS
FAST E
I A -
0 .1 .2 .3 .4 0 20 406080 100
TIME (SECONDS) TIME (pb
13
FIRST RETURN STROKE
SUBSEQUENT RETURN STROKE
INTRA CLOUD PROCESS
I I I I I I I I
-400 -200 0 200 400TIME (/.Ls)
14
* S - t
RADIO RECEIVER
a.OuO-cOUO RAS
CLOu-mUN RASH
0. 01 . 0.3 0.4 & .0 07 0.8 0.89 110 1.1 I,,TIME WSCONOS)
3 MHz 2~~
30 MHz
139 MHz
295 MHz
SLOW E
0.0 0.5 1.0IME (SECONDS)
15
-~ . a7
3 MHz
30 MHz
139 MHz 1. .
295 M~I
!
SLOW E
I I I I I I I J
0.0 0.5 1.0TIME (SECONDS)
OPTICAL
SLOW E
FAST E+
RF 1W MHz)
. 0 w 100 160 20 2W
TIME (MILUSECONOl
416I .-
MAPPING USING RF RADIATION
A - -- - - -. --3 *
1 t2
-2 00 202
30SUBSQUET RETURN
STROKErz15-
I w
0 20 40
157
17I~
30
25
20 -I(T 0[aO - *aJJT) + OY-0-T
~1a - 20104 SeC- 1
uj 15 -5015 ec-,cc ~y - X10 3 SOC- 1cc
5
0 I0 20 40 60 80 100 120 140 160 180 200o
TIME (us)
18
FLIGHT EXPERIMENT DEFINITION ANID SUMMARY
by
Mr. Felix Pitts
Langley Research CenterNational Aeronautics and Space Administration
Description of NASA F-106B in-flight direct strike measure-ment program. Electromagnetic measurements, instrumentationconcept, and results summary.
19
SI*PIJF)ED LiGHTING MODEL
ELECTROSTATIC r,\~" CAG
H a (tDc a it-0/ +i a it-D/ci
I.H + + ID.
20
MEASUREMENTS SUMMARY
AMPLITUDEMEASUREMENT SYMBOL RANGE SENSOR TYPE
RATE OF CHANGE OF FLUSH PLATE
ELECTRIC FLUX DENSITY 50 A/M2 DIPOLE
RATE OF CHANGE OF MULTIGAP
MAGNETIC FLUX DENSITY B 2 X 104 TESLA/SEC LOOP
RATE OF CHANGE OF INDUCTIVE
CURRENT 10 ' A/SEC CURRENT PROBE
MEASUREMENTS SUMMARY
MEASUREMENT SYMBOL DIMENSION SENSOR TYPE
* RATE OF CHANGE OF FLUSH PLATEELECTRIC FLUX DENSITY t A/M2 DIPOLE
* RATE OF CHANGE OF MULTIGAPMAGNETIC FLUX DENSITY TESA/SEC LOOP
* RATE OF CHANGE OF INDUCTIVECURRENT I A/SEC CURRENT-PROBE
* ELECTRIC FIELD E V/M FIELD MILL
* CURRENT I A CURRENT TRANSFORMER
21
MEASUREMENT LOCATIONS - 1980
D----(ELECTRIC FLUX DENSITY)
=A (MAGNETIC FLUX DENSITY)
A= - (TOTAL CURRENT)
40 x 103 1980 LIGHTNING OCCURRENCES
69 PENETRATIONS 10 STRIKES
35-
30-
25 -
ALTITUDE
20FEET
1 .5
4 5-
0 l1b 2 0 2 4 6 .5 5.0
PENETRATIONS STRIKES STRIKES/PEN
22
-~Mil
INSTRUMENTATION SYSTEM
EXPNDI!DBI)MTIO
RCA DVISR TRNSIET REORZE
23mv-
24
I
- I
fiSi
C
L C --~ a C.
C - C
I a,'Ii'
* a a qaq.q.eea.q~..q. I b.
333 ~ i * !!!~ 3 ~ U,
* ,.,v mu is-a L.minII.diI..iiiiiiiieg~
a a ~ * U q aI-
~* m4
I--J
cd~
ESC
C
I- I -
C.D- B - a --J - ~ I,
- L U.LE ~.__ - - a C- E C A
I :~ aI- - Sci-,I- IC -
L.i..J - ~ pill, liii
* Si- U .3 iiitIiIII!tIIIIIIIIIif ! ~ meT
.- ib muiaoa sj ljgg
a-I-
I
-C
CU,
Si
.1 >1.4 -~= a,
Ii* - m
IC
a
* a a - ~
.*,u muicco 3~1 1AfII~
25
1981 LIGHTNING OCCURRENCES
40 ),13.
Ill PENETRATIONS 10 STRIKES
30
ALTITUDE 2
FEET
103
00 10 20 0 2 4 0 1.0
PENETRATIONS STRIKES STRIKES/PEN
TIME: 19 18-39 DATE AUGUST 9. 1901LOGGER NUMBER: F 106 FLIGHT NUMBER: 43
+25000 - -
20000 -
1500 - -- -
10000 -
4020000 60 20
TIME (MICROSECO#405)
X INDICATES TRIGGER POINT
26
DATA SUMMARY
1980
- 19 FLIGHTS 69 STORM PENETRATIONS
- 10 STRIKES 17 TRANSIENTS: (7 b, 5 t, I)
- RESULTS REPORTED:NASA TM 81946 "1980 DIRECT STRIKE LIGHTNING DATA'AIAA 81-0083 "ElM MEASUREMENT Of DIRECT LIGHTNING STRIKES TO A/C"
24 FLIGHTS 111 STORM PENETRATIONS
10 STRIKES 27 TRANSIENTS
1 BOOM CURRENT (BOEING)
16 t, 10 6 (DISTANT)
MAXIMUM MEASURED VALUES
b 30.5 AIM2 > 340 KV/O,1 ,s
8 1160 T/s - > 2 KA/O,I ,s
I 15 KA
OTHER F-106 LIGHTNING EXPERIMENTS
e ATMOSPHERIC CHEMISTRY EXPERIMENTS - LARC
1980 - SHOWED N20 ENHANCEMENT NEAR LIGHTNING
1981 - SHOWED CO ENHANCEMENT NEAR LIGHTNING
o X-RAY EXPERIMENT - U. WASHINGTON
1980 - SHOWED INCREASED COUNT NEAR LIGHTNING
1981 -BEING EVALUATED
a OPTICAL SIGNATURE EXPERIMENT - NSSL
- PROTOTYPE FOR ORBITAL LIGHTNING MAPPER
- RESULTS BEING ANALYZED AT NSSL
@ STORM SCOPE-TURBULENCE/LIGHTNING DO NOT ALWAYS CORRELATE
- LIGHTNING LOCATIONS DISPLAYED TEND TO BE FURTHER FROMAIRCRAFT POSITION THAN RADAR CONTOURS (BUT AT SAME BEARING)
o BOEING DATA LOGGER
- FIRST BOOM CURRENT RECORDED AUGUST 1981
27
DATA SYSTEM DESCRIPTION
by
Mr. Mitchel E. Thomas
Langley Research CenterNational Aeronautics and Space Administration
The research data-gathering system on the F-106B aircraftdeveloped for in-flight measurement of direct and nearbylightning strike characteristics is described. Details ofthe design and performance are presented for system com-ponents including the digital transient recorders, widebandanalog recorder, fiber optic control and diagnostic links,power system isolation, and system shielding.
.
29
It M05fl PA(Z DLaaS.J ium
L4 "
LIGHTNING INSTRUMENTATION SYSTEM
o WIDE BANDWIDTH FOR SUBMICROSECOND SIGNAL RESOLUTION
- 10 NS SAMPLE INTERVAL
* CONTINUOUS RECORDS FOR DEFINITION OF FULL LIGHTNING SCENARIO
- 15 MHz ANALOG BANDWIDTH
s PROTECT AGAINST SPURIOUS RESPONSES (EMI)
- SHIELDED ENCLOSURE
- MOTOR-GENERATOR POWER ISOLATION
- FIBER OPTIC CONTROL
s AUTOMATIC OPERATION
UGHINING INSTRUMENTATION SYSTEMSYSTEM CONTROL-'_ f'-IRIG B TIME
IFIBER OPTIC N I
SCURRENTI EE ELSMHz
, I 1 MPLFE ANALG
BOOM 12 2C)RCRELOOPS TRANSIENT G;
• FUSELAGE RECORDES& WINGS 4)(2 CH)
FWD.. TA IL, ITGAO'16 CH) MGEI
&WINGS 11TP
"RcR''- :' Z ZGE"ER'OR H RECOR'DRE -_PWFIELEDENLOUR
(14!C
I '~ ~ INSTRILmENTATioN SYSTEM
- *EE~EXPNED EUUUUEUEEUEUEE~~~~NAumEC RECORDERuupuuuuummuuuum
RCA DVISR TRLIE EU U4- UPOE SUPPLI 200
ELECTRC MOTO
TRANSIENT RECORDER
6-BIT 131072 6-BIT-0AID WRD/AANALOGCONVER- WODDIA i
MCONVER- CONVER- OUIPUSPTE TER
DIGITALOUTPUTS
S IGNAL
INPUT
INT. • TRIGGER, TIME BASEEXT. TRIGGER __1_AND
INPUT EXT. CONTROL CIRCUITRY
EXPANDED TRANSIENT WAVEFORM RECORDER FEATURES
I 6-BIT AMPLITUDE RESOLUTION (1.56%)
1 FREQUENCY RESPONSE - DC TO 50 MHz
* 131072 (217) DATA WORD CAPACITY
I SAMPLE RATES UP TO 100 MHz
I DATA WINDOW LENGTH OF 1310 MICROSECONDS AT 100 MHz
I INTERNAL OR EXTERNAL TRIGGERING
I DATA WINDOW SELECTION WHICH IS BEFORE, DURING, OR
AFTER TRIGGER EVENT
32
33
WIDEBAND ANALOG RECORDER
o VIDEO RECORD TECHNIQUES
s FREQUENCY MODULATED CARRIER
o 10 Hz TO 15 MHz BANDWIDTH
a 12 MINUTES RECORD TIME
* 2 CHANNELS & 2 AUXILIARY
LOGARITHMIC AMPLIFIERS 22222 .L s 1v
161o 11l. 1. 8K l022 23
l6pf 47lO47f
• IS
S11A2 6. 68~ 56.f-- 6111 022
IO 8 222 T-- is8 0
lofIf 2N97l lOOf .
3.5 ' 22 ;43
,! 22
34
COMPRESSION AMPLIFIER
s 15 MHz BANDWIDTH
s DIFFERENTIAL INPUT, 50 OHM IMPEDANCE
o E0 - 1 + .3 LOG EIN
o 60 dB DYNAMIC RANGE
1.0 -
INPUT o.i -VOLTS
0.01 -
0.001 -1
I I 10 .2 .4 .6 .8 1.0
OUTPUT, VOLTS
SIMPLIFIED SHIELDING TOPOLOGY
AIRCRAFTMETAL SENSRSURFACES
7
rDATA SYSTEM DATA RECORDERMETAL ENCLOSURE CHASSIS
i I APERTURE PENETRATION
35
LIGHTNING INSTRUMENTATION CONTROL
FBRFIBER ONE POE
POWIR ON/OFF SW. = OPTIC - OPTIC DEODR CONTROLXMRRCVR [
FBRFIBER] TONE ITAPE I
TAPE RUNISTOP SW.- - - -OPTIC DECODER CONTROLXMTR RCVR
RECORD TONE FFIBER FIBER TN
INDICATOR DECODER OPTIC - - -- OPTIC REC/w-Ec TRANSrIENTRCRXMTR RECORDER
RECOAD TONE F~IBER FIBER TONEINDICATOR& DECODER OC --- PI REC/v~ TRANSIENT
RCRXMTR RECORDER
RECORD TONE FIBER F IBE R ,-..TONE MAGNETIC
INDICATOR DECODER OPTIC - - - OPTIC TAPERCRXMTR X1 REC/w RECORDER
COCKPIT FIBER SHIELDEDCONTROL OPTIC ENCLOSUREPANEL CABLES
x109
6 I-DOT SENSOR RESPONSE
04z0L)
WN,
-6 1LLIjIJ 11 fi uiujjuju u ill]550 S75 600 625 650 6.75 700
MICROSECONDS
36
LU
V) 4;
04
z4
373
ELECTROMAGNETIC SENSORS FOR AIRCRAFT LIGHTNING RESEARCH
by
Mr. Klaus P. Zaepfel
Langley Research CenterNational Aeronautics and Space Administration
Electromagnetic sensors designed for measuring EM fieldsand currents during lightning strikes to the F-106B researchaircraft are described. Sensor theoretical basis, perform-ance, and parallel-plate transmission line used to check andcalibrate these sensors are described.
39
PMEUING ?AMu BLAUE.iT FIUW
MEASUREMENT REQUIREMENTS
MEASUREMENT FIELD CHANGE OUTPUT
1 50A/m2 (A E ~ 6 x 10 _ per 0. ips) > 100V
2' 2xle Teslals > 100v
IlOkA per 0. lp s > bOyv
SENSOR CHARACTERISTICS
*DESIGN PRINCIPLES, DEVELOPED BY AIR FORCE WEAPONS LAB FOR NEMP
*WIDE BANDWIDTH: >:80MHz (tR :S 44 fls)
*SIMPLE GEOMETRY: CALIBRATION BY RULER
*APPROXIMATELY 100 V OUTPUT FOR FULL-SCALE DIRECT STRIKE
40
DEFINITIONS: ELECTRIC FIELDS
E.-FIELD , vl, IC CORONA(Ekedric Field Irbicisity) +CULRRENT
IC It i- D-Area- 0DIPLACEMENr
I t TOTAL CURRENT
NoCroncL, rt- 6 AreA
D, C/-- In Coronk, Its (Jo' 5)AreaEkedrkc Flux DeA sty) trL
(Surfctcw-, Charje Dwisity)
Forfla pte, D--ps
D- c E. wh4ere f 't
0tevr.tivitr of dkctic.
SENSOR FUNDAMENTALS
CLOUD or LIGHTNING
CHANGING E-FIELD(it)
AI RCRAFTA FUSELAGE
NO CORONA CORONA
it.I4 D5AREA it-{ct ) AREA
[4 GROUND 1VOUT, R It
41
£ .. -- -
D-DOT SE -NSOR IN F-106 FUSELAGE PANEL
42 iD A
'JT SENS011
/lo/ 1 =2.2 RC, R 5W0/ rrl r t = tr+ PROPAGATION TIME
rj A
~*,out i T
\\ \ i'4" -~A =irr2, r2 rr
-'4 1 12
SECTION A-AT
DEFINITION: MAGNETIC FIE.LDS
/
MAXWELL-AMPERE LAW: dlfJA
+2-1Tr IAAr
43
SENSOR FUNDAMENTALS
El. -A-I
MAXWELL-FARADAY LAW: ACd -. dA
V 4 dA B- DOT S.,.,~
cit fJA2rf
v._,.-Mi, M-?,LIA-dA I -DOT Seuisor
B-DOT SENSOR
B
Vot 2. -R 10 1000A00 -1r2 100
B2v OUT
44
[B PWU I~ Nl.)R ON F- V(b F U 0 I A(,[ PANEL
45
I-DOT SENSOR
10Q(L s+ 1.t r 22 R
100 vout m
10 -21T b
OUT ~~CO t4D UC TORTO A IRFRAME
SENSO GROUN PLN
TeeTi 44
GENERDUCTOR
FLTPAETA SMION LINEGCLRATORDSPA
OSCILLOSCOPEPE OCLLOSOP
E4
BO' SESO GR-N PLANE--- ~~.
Tee_ _ _ _ _ _
PU--L- -SFA
FLAT-PLATE TRANSMISSION LINE CALIBRATOR
7CALIBRATOR
- "-' ; . 11 ROUND PLANE
47
Lu
LnU
LALU
LUJ LUJ
Il) >
(U)
Wo0Ur.
C%A
U)C
WlI--
0
E )
48
SUMMARY OF SENSOR PARAMETERS
SENSOR LOCATI ON DESIGN SENSITIVITY RISETIME
i - FUSELAGE/TAIL CIRCULAR 4. lx10_2 2 2.4n
STWINGS RECTANGULAR 2.74102 m 2 3.0 ns
B-DOT FUSELAGE 2 GAPS, 4 LOAD PO INTS 5703m 2 .85 ns
B-DOT WINGS I GAP, I LOAD POINT 5.54103 m 2 2.0Ons
I-DOT RADOME 1 GAP. 4 LOAD POINTS 2.l4xl9 H 0.8 ns
FIELD MILLS
Ev
49
mks
50
LIGHTNING MODELING
by
Dr. M. LeVine
Goddard Space Flight CenterNational Aeronautics and Space Administration
The ground-based lightning measurements made at WallopsFlight Center concurrently with the in-flight direct strikemeasurements are described. Lightning mathematical modeldevelopment to arrive at credible lightning models for use
in induced effects electromagnetic coupling studies isdiscussed.
51
i, : .. . .. .. .... . . .. .. . . .... a w
AL
...... OBSERVER
OBSERVER
IMAGE
CHANNEL GEOMETRY
X-Z PLANE Y-Z PLANE4
3-
2-
0
2 1 1 2 2 1 1 2
* KILOMETERS
52
CHANNEL GEOMETRY
XZ PLANE V-i PLANE
6-
5
* 4-
3-
2 -
01
-3 2 -1 1 2 3 -3 .2 .1 1 2,3
KILOMETERS
30
25
20 -I(T) 10 I(e -T - e-l)+ j(e-yT .. 6 -dT) 1
I- = 2004 sec-1uz15 f3=51 5 sec-I
cr- y - 1010 3 sec-1
o 10 d = 20104 SeC-1
5
0 - 10 20 40 60 80 100 120 140 160 180 200,
TIME (ps)
53
CHANNEL GEOMETRY0401 ,6 .6
6.000. Y.Z PLANE 6.000 X-Z PLANE
J4' 4,000
S2.000 2.000
1,000 1.000-
.400 -3375 220t0 .1125 0 1120 2200 -22W0 .1126 0 1121 2W0 3375 4W0METERS METERS
I .146 SPECTRUM OFRADIATED WAVEFORM
V-RADIATED WAVEFORM 20 LOG IE(vl'
,0 2 4 oo S I00 10. Ile lo e lop i too
TIME IMlefflconmd PlIOUINCY (HE)
>
w
- SIMULATED L SIMULATED
04 s o020 40 60 80 100
TIME (Microweconds) TIME (Mkerwconds)
LL MEASURED 14MEASURED
S 0 20 40 60 60 10 40 m 1t0oN
TIME (Microseconde) TIME (Mkomnnds)
54
00
00
00
-ISO0 o HORNER & BRADLEY, 13'640x KIMPARA, 1965
-200 I
1 10 102 og104 lo0 log
FREQUENCY 1kHz)
1.0
0.6-
0.2
-0.20 20 go0 3 100
TIME (IA a)
-70-
-110
-130110 102 I03 104
FREQUENCY (kHz)
55
-40
wm
-5s0
LVL
-2001.01 10.10 103 10.0
FREQUIENCY (Hz)
o 56
A-L
RADIATED WAVE FORM X-Z PLANE Y-Z PLANE
4-
2-
0-4
.4 3
S 0 a0 40 D S0 0100 -2 -1 1 2 -21 1 2
0 3
-2
~f 0 20 40 60 so0100 -2.-1 1 2 -2 -1 1 2
4-6
2
-2 .
.4
0 20 40 60 6 100 -2 -1 1 2 -2 1 1 2TIME fps)I KILOMETERS
-10-TORTUU CHANNEL
:) -150-STRAIGHT CHANNEL
-200
1 010.031) 0
FRQECwkz
C57
cr.150
wa-
Cd) THEORY
SERHAN, ET. AL. (1980)
---- LeVINE & MENEGHINI
-200
1 10 102 103 104 105FREQUENCY (MHz)
. . .........
020 40 so UD
TIME tWSI
1.1061
imsim
59
cLOSER
- - ~p - - - - - - - -
I -p -II -II /I /I /
//
//
/I /I /I II /I II I
II /I II I
II
I* I I
I~
I4 Il
'4~
0 4 8 12 *16 3
TWE (M 8)
60
r-r---r fl
INTERPRETATION OF IN-FLIGHT TEST DATA APPROACH,PROBLEMS, AND OUTLOOK
by
Dr. R. A. Perala
Electromagnetic Applications, Incorporated
Discussion of the direct strike data interpretation pro-blem and issues to be resolved. Review of lightning/aircraftinteraction process and aircraft electrical resonance con-siderations. Approach for generalization of F-106 data toother aircraft classes.
61
OUTLINE
I 11 _16H1NINI~bA RCAI I INIL.RALI ION PRO.1Y,
I THE NEED FOR IN-FLIGHT TEST DATA
I EXTENSION OF DATA TO OTHER AIRCRAFT
I LIGHTNING MODELING
I AIRCRAFT MODELING
I EXAMPLES
STEPPED LEADER APPROACHING AIRCRAFT RETURN STROKE THROUGH THE AIRCRAFT
STEPPED LEADER ATTACHMENT AND CONTINUED NO RETURN STROKE THROUGH THE AIRCRAFTPROPAGATION FROM AN AIRCRAFT
62
A * -
LIGHTNING/AIRCRAFT INTERACTION DESCRIPTION
* AIRCRAFT IN LARGE STATIC FLECIRIC Fifil), 10-100 (V/M IYPICAl
A AI RCRAVI rIOuIABLY At. RI AI)Y C IiAli( II IU I I I I II I ( 11, 111 AIItN
* APPROACHING STEPPED LEADER GIVES LARGE E, 11/'I-
* WHEN E LARGE ENOUGH, AIRCRAFT STREAMERS
* STREAMER ATTACHES TO APPROACHING LEADER
* CHARGE FROM LEADER DEPOSITED ON AIRCRAFT AND ELEVATES ITS POTENTIAL
* WHEN ITS POTENTIAL IS HIGH ENOUGH, LEADER CONTINUES FROM AIRCRAFT
TO DESTINATION
* STEPPED LEADER CURRENT FLOWS THROUGH AIRCRAFT UNTIL RETURN STROKE
* RETURN STROKE CURRENT LOWERS AIRCRAFT POTENTIAL
* AIRCRAFT IN CORONA DURING MUCH OF THIS TIME
APPROACHING LEADER E FIELDS
6000
400
. 00
0 100, 400 600 60go0o0
DISTANCE M HEIGHT ABOVE GROUND M
ELECTRIC GRADIENT BELOW LEADER CHANNEL: (a) AS FUNCTIONOF HORIZONTAL DISTANCE AND (b) AS FUNCTION OF HEIGHT OF
LEADER TIP ABOVE GROUND
ASSUME DE . Of lh ?h 6 nSe
n T IT and iT .5x10 se
WE GET Ki - 1.2 x 10atOO000at
1.5 x 1010 at 10-20 111
63
AIRCRAFT STREAMERING
CURRENTS PROBABLY LESS THAN IOOA, BASED ON GROUND STREAMER DATA
* WAVESHAPES: 10 vsec RISETIMES
* NEGATIVE CHARGE ENTERING AIRCRAFT AT STREAMER POINT
* STREAMERING CAN OCCUR FROM CRITICAL POINTS
I STREAMERING INFLUENCED BY STATIC FIELD
I ELECTRIC FIELD ON AIRCRAFT REVERSES AT ATTACHMENT
STEPPED LEADER CURRENTFLOW THROUGH AIRCRAFT
AIRCRAFT NEEDS TO ACCUMULATE 100 PC OF CHARGE FOR STEPPED LEADER TO
CONTINUE ON FROM AIRCRAFT
* IF LEADER CURRENT iS IO00A RISING IN 100 nso CHARGING TIME IS ABOUT 150 ns
* DURING THIS TIME AIRCRAFT NORMAL ELECTRIC FIELDS APPROACH 3 MV/m
* THIS GIVES E/at 2 x 1013 V/m/sec
" LEADER CURRENT CONTINUES THROUGH AIRCRAFT AND ELECTRIC FIELD STAYS
CONSTANT AND CURRENT ASSUMES THE SLOWLY INCREASING ARC CURRENT UPON
WHICH IS SUPERIMPOSED LEADER PULSE CURRENTS
* AIRCRAFT IS IN CORONA DURING THIS PHASE
64
100-500A
usJ~
STEPPED LEADER CURRENTS
J- AND K- CHANGES
J-CHANGES; SLOW, 100A CURRENTS
K -CHANGES: SEVERAL THOUSAND A~MPS
POSSIBLY 50 Ns RISE TIMES
65
ISSUES OF IN1[RL'I, AND
THE NEED FOR IN-FLIGHT TEST DATA
I ATTACHMENT PROCESS
* WHAT ARE I AND
* HOW IMFUrTANT ARE NUNILINEAIF (tUFFIINA, ';ITRIAFt I 111 1 !v!,
* WFAT IS TIlE EQUIVALENT CIRLIlI F 1i1 IFAlIF (hIFANNLL IMIlIANLlF
NORTON CURRENT SOURCE)
* RETURN STROKE
* WHAT ARE E AND ,_ ?
* WHAT ARE H AND jF?
* HOW IMPORTANT ARE NONLINEAR EFFECTS?
I WHAT IS THE RETURN STROKE EQUIVALENT CIRCUIT?
I NEARBY LIGHTNINGi How IMPORTANT IS IT?
* How APPLICABLE ARE STATE OF THE ART LIGHTNING MODELS AT AIRCRAFT ALTITUTE. "
0 MODELS SO FAR ARE BASED ON TERRESTRIAL OBSERVATIONS
* HODELS HAVE NOT BEEN TESTED AT AIRCRAFT ALTITUDES
I OBTAIN DATA ON INTRACLOUD LIGHTNING
I HOW DOES THE AIRCRAFT INTERACT WITH LIGHTNING? IS TilE LIGHTNING EN ;"
ITSELF MODEIFIED BY THE PRESENCE OF AN AIRCRAFT? IS IT DIFFERENT ,
DIFFERENT AIRCRAFT,
THE OBJECTIVE OF DATA INTERPRETATION
I WHAT ARE THE LIGHTNINGS THAT CAUSE THE F106B RESPONSES?(AN INVERSE PROBLEM)
I WHAT WOULD BE THE RESPONSE OF A DIFFERENT AIRCRAFT?
I CAN A METHODOLOGY BE DEVELOPED FOR EXTENDING IN-FLIGHT DATA
FROM ANY AIRCRAFT TO ANY OTHER AIRCRAFT?
66
' ____ .... __- - --- L 4-- . .,
APPROACH
Lightning F106 F106 1106 Grnd.TesEnvironment 3DFD Computer In-Flight Data (ScalelMModels Model Data deling fl
Checkout
Sai ignfcteoyNnierte
Mdedtffccation of ECraoltinpehoolg
Measur7
Predicted~
IMPORTANCE OF NEAR MISS DATA
I INTERACTION CALCULATIONS CAN BE DONE LINEARLY, WITHOUTCOMPLICATIONS INTRODUCED BY NONLINEARITIES
I DATA CAN BE USED To INFER NEARBY LIGHTNING ELECTROMAGNETICWAVEFORMS AT AIRCRAFT ALTITUDES To CORRELATE WITH PREDICTIONS
/R
/ GROUND (or-0)
a 4R
A DRAWING DEFINING ALL GEOMETRICAL PARAMETERS NEEDED IN TNECALCULATION OF ELECTRIC AND MIAGNETIC FIELDS. (FROM4 UI4AN)
68
Slope v
Z4 V'4
-Unit arm
Current
Z32 Vt3
breakdownPUiWIcurrent
Z22 V12Corona
Height, z curn
12 3 14 oil t2 13 14 rlime
CURRENT DISTRIBUTION FOR THE MODEL OF LIN ET AL. (1980) IN WHICH THEBREAKDOWN PULSE CURRENT IS CONSTANT WITH HEIGHT. THE CONSTANT VELOCITY
OF THE BREAKDOWN PULSF CURRENT IS V. CURRENT PROFILES ARE SHOWN AT FOUR
DIFFERENT TIMES t1THR UJGH t, WHEN THE RETURN STROKE WAVEFRONT AND THEBREAKDOWN PULSE CURRENT ARE AT FOUR DIFFERENT HEIGHTS ITHROUGH z24RESPECTIVELY, (FROM UMAN)
20
-total current---*corona Current
15 uniform current.... pulse current
..... ~ ~ -
0................., -5L 6---. - -- -
10 20 30 40 0 60 70 so 90 100A4 TIME (Pssc)
RETURN STROKE CURRENT COMPONENTS AT GROUND FOR ATYPICAL SUBSEQUENT STROKE CALCULATED FROM MEASURED
ELECTRIC AND MAGNETIC FIELDS (FROM UMAN)
69
.........
......................
ai
A 1zoo
* 3 3 3
- u~m *toits-
70 M
mAlka
0
LA-
a LI
N UUz
2 ac
LL
LU
L-
LU
La
z
TLU
Lt 0
inj
'AMA.
r-4
-AJ
Uj-
72
at (a. c
L)> 1(t.Jiz * t1 CxC)(j).Z(k.yn)l M _______
(''A (JIA is (k) - (W)S t*U). I y ,z
m () * 1-1/)AR * ~ ) * (-1)a y * (k) - (k-I)A.z *f (n- )A t
.A1'an
V z%11) - )u - 71) ) clI -1'
at1 1 -~
S.F.t (11,R) * Is"(Jk- 0 '~l Mbr )lZCiJk) 'ICZ' 2*t /.I - *I)
wck an]
3-912 W(I1*.J.) l-i 1'1tJk 5~(~~) -H"( Jk clk~ 1
'Ii).) 7,u) ( I(1 .1uaI
l cl ean-
all~~~~ ~ ~ y:1L4g~Y4~~tlc~. Jel -,cad(nI
a a .cancan
A. 1.4.k ) *y ."I kI y.J J,,-.~k *c :l (,n-'
M ~ *411 2cl~ kcl.1 Ia a
3-D FINITE DIFFERENCE EQUATIONS IN RECTANGULARCOORDINATES SET UP WITH EXTERNALLY SUPPLIED H FIELDS
73
.36 '0
~ .2 200 2C . -200
15
~-400 10
S-6000
-. 1 -800 150 1 2 3 4 -10000 1 2 3 4 01 M 2 3 '
TIME (is) TIME (wTIE us
DATA FROM FLIGHT 80-038, RECORD 4
20
-MEASURED
15
~10
I ol ;j- - - - - - -
IIt
.1 'I1CJMPUTED
-51I
0 100 200 300 400 500
TIME (NS)
COMPARISON OF MEASURD RESPONSE (FLIGHT 80-18) AND COMPUTED WITH T3DFD ANDA 30Ns RISE TIME, 590 AMPERE STEP CURRENT SOURCE, NOSE TO TAIL.
74
CORONA AND STREAMER EFFECTS
by
Dr. R. A. Perala
Electromagnetic Applications, Incorporated
Description of possible corona effects on direct strike data,review of elements and state-of-the-art of corona modeling,and application of corona modeling to lightning/aircraft inter-action. Corona to arc transition, importance, and modeling of
streamers.
75
75
z0
0:0
LL LUI
0 i0
00
0-0
zZo F-
I- 4I
C:):
L-
I-- 0(
LL.LLU)
F--
0 I-
C.
C:.)
76
CORONA: BASIC MECHANISM
I REQUIREMENT: FREE ELECTRONS ACCELERATED BY ELECTRIC FIELD
Avalanche Electrons
dn - ndxe Ii n - Nunmber of Electrons
Trigger Electron AirMolecule x Distance
\ 8 a -Townsend Ionization Coefficient
Ilectric He~ld Positive
Ion
I' SOURCE OF FREE (TRIGGER) ELECTRONS: BACKGROUND IONIZATION CAUSED BY COSM1IC RAYS;r ..2 X 107 ELECTRON-ION4 PARIS/(m 3 _sec). THIS GIVES AMIBIENT AIR CONDUCTIVITY
10-3 ho/in.
77
L ist 'm.
ELECTRON AND ION LOSS MECHANISMS
* ELECTRON ATTACHMENT TO NEUTRAL AIR MOLECULES TO FORM NEGATIVE IONS
ATTACHMENT RATEE
RECOMBINATION OF POSITIVE IONS AND ELECTRONS TO FORM NEUTRAL PARTICLES
RECOMBINATION RATE 8
* RECOMBINAZION OF POSITIVE AND NEGATIVE IONS
RECOMBINATION RATE Y
AIR CHEMISTRY EQUATIONS FOR CORONA
dnet)t + [o 4 (t) + ae G I n e(t) Q~)
dt- e e
dn,(t) + [Ble (t) + yn_(t)] Q(t) + G ne (t).
dt
*AIR CONDUCTIVITY a - q (p e n e + vi(n. + n+)
I CONDUCTIVITY - FEEDS BACK INTO MAXWELL'S EQUATIONS
A x +
I COEFFICIENTS G, e, 'Ve IN TURN DEPEND UPON E
I COEFFICIENTS ALSO DEPEND UPON HUMIDITY AND AIR PRESSURE
78
* IF WE ASSUME SPACE CHARGE NEUTRALITY
* HOWEVER, SPACE CHARGE EFFECTS ARE IMPORTANT FOR CORONA, SO WE NEED TO INCLUDL:
V 5 + =0
p (n+4 n_ ne q
J = (n+ n n e e) q
ALSO NEED TO INCLUDE PARTICLE DYNAMICS
F s (f + V X x B), s REFERS TO SPECIES
RESULTS FOR A ROD-PLANE GAP.NUMERICAL RESULTS ASSUME SPACE CHARGE NEUTRALITY,
64 KV 3
'40ONS MEASUREDRISETIME L
2-
.15cm
PLANE 0 100 TI 00 300
79
EFFECTS OF NONLINEARITIES
* AIR CONDUCTIVITY MAY SHIELD APERTURES...
IE
AIR BREAKDOWN MAY CAUSE INCREASES IN at o FOR EXAMPLE, AS
INDICATED ON A PREVIOUS SLIDE
* AIRCRAFT COMPLEX RESONANT FREQUENCIES MAY CHANGE BECAUSE CORONA
AND STREAMERS EFFECTIVELY EXTEND AIRCRAFT DIMENSIONS
STREAMERS
BASED ON GROUND MEASUREMENTS, AMPLITUDES LIMITED TO -100 A
U No MODEL BASED ON FIRST PRINCIPLES IS KNOWN TO EXIST FOR STREAMER
FORMATION AND PROPAGATION
S AT PRESENT, MODELING IS PROBABLY BEST ACCOMPLISHED BY PRESCRIBING
NONLINEAR CURRENT SOURCE REPRESENTATIONS
80
AN ANALYSIS METHOD FOR THE F-106 DIRECT STRIKE DATA
by
Dr. T. F. Trost
Texas Tech University
Summary of characteristics of electric and magnetic fields
and currents measured during strikes. Description of
laboratory modeling of direct strike fields and currentsincluding test apparatus, airplane model, and data acquisi-tion system. Comparison of model results with in-flight data:
Resonances, attachment points, and waveforms. First orderinterpretation of in-flight data as a lightning input-aircraft
response problem.
4
81
&- ... z
F-106 DIRECT STRIKE DATA
OBJECTIVES
I. MEASURE STRENGTHS AMD WAVEFORMS OF ELECTRIC AND MAGNETICFIELDS ON AIRCRAFT
II. INTERPRET WAVEFORMSA. DETERMINE WHICH CHARACTERISTICS OF WAVEFORMS ARE
DUE TO ELECTROMAGNETIC MODES OF AIRCRAFT/CHANNELB. INFER NATURE OF IONIZATION PROCESSESC. STATE IMPLICATIONS OF MEASURED WAVEFORMS REGARDING
COUPLING TO INTERIOR
APPARATUS FORAIRCRAFT-LIGHTNING MODEUNG
F - 1/2 IN. HELIAX CABLE
.!41 IN.SEMIRIGIDCABLE
36 IN. 1 8DOF- 106S-OMODEL SENSORS
/0- DOTJ
OSCILLOSCOPEWITH
CAMERA
PL.ANE
VERTICAL2 SAMPLING
INTEGRATORY'
62
0-DOT AT NOSE
1E-3 V
lee
-189
9 1.24 3.485.12 M 6 2.
IE-2 YS I-20
00
-20-3
-Q6
5.12 15.36 25.6IE-9 S
B-DOT AT FUSELAGE
IE-3 V
6848
-20
-Wl
-Ml
0 19.24 20.485.12 15.36 25.6
IE-9 SIE-12 VS
is
-25
-30
5.12 15.36 25.6IE-9 S
83
TRANSFER FUNCTIONSFOR THE F-106 MODEL
FREQUENCY DOMAIN DESCRIPTION
TRANSFER FOURIER TRANSFORM OF OUTPUTFUNCTION FOURIER TRANSFORM OF INPUT
INPUT: B-DOT NEAR LOWER WIREOUTPUTS: D-DOT AT NOSE
B-DOT ON FUSELAGE OVER RIGHT WINGB-DOT AT VARIOUS LOCATIONS NEAR SURFACED-DOT AT VARIOUS LOCATIONS NEAR SURFACE
EXAMPLES OF TRAN4SFER FUNCTIONS
1E-3 C4WD-DOT AT NOSE
380
2mIN
INso
a 19.95 39.89
9.97 29.92 49.8?IE6H
IE-3
B-DOT ON FUSELAGE
" 169ISO
40
1 I9.95 39.899.97 29.9 49.8?
IE 6 HZ
84
PRONY ANALYSIS OF FIELDSMEASURED ON THE MODEL
REPRESENT SENSOR OUTPUT WAVEFORMS AS FOLLOWS:N G-t
V(t) = I A e cos(wit +*.j~w1 1
= 2NR.e 1
s.i = cy.+jw.i ARE NATURAL FREQUENCIES OR POLES
R. ARE RESIDUES
FIVE LOWEST 1NATURAL FREQUENCIES "
OF F-106 MODEL
0 0
0
4c L
-4 7r
852
50 -- 1
40-
in 30.
Height ICloud- to- GroundTlightning Polk
Image Intro -Cloud
Charges lightning path
Model. of thunderStorni charge distribution.
CHARACTERISTIC TLMES
CORONA CURRENT RISETIME (LABORATORY MEAS.) 10-50 ns
LIGHTNING CURRENT RISETIME (REMOTE ELECTRICFIELD MEAS.) 30-8000 ns
PERIOD OF LOWEST ELECTROMAGNETIC MODE OFF-106 (LABORATORY SCALE MODEL flEAS.) 110 no
TIME CONSTANT FOR CHARGING F-106 IN*CHANNEL (ESTIMATE) -250 no
4 -106 DIRECT STRIKE RISETIME OF B 20-40 no
OF D 20-1000 na
86
T/S 1C-6 T
4W B9O 46 S-DOT
36
-498 15
-699 5
-sea aa .512 1041.536284 2.56 19.08 2.639.23 4.158.39
IE-6 S 1( 6 HZ1E-6 T
5 7 B
-16
-15
-2...........1.-4 2.4
.512 1.536 2.56IE-6 S
C/M2/S IE-6 C/112
3 0-DO
2.50
2
-5 1.5-19
-15 .
8, 1.024 2.048 a 29.16 48.31.512 1.536 2.56 19.98 393.23 59.39
IE-6 S 1E(6 HZIE-6 C/M2
* .5D
9
-5
-1 .5
-2.5
.512 1.536 2.56IE-6 S
87
CI25D-DOT 1E-6 C/4Q
28 80-038-05is 4
to 3 V101xi
* 2
-5
-1 I-- I. .4 2."4 a 3.16 4.31.512 1.536 2.56 19.18Ue 3 90.3
IE-6 S IE 6 NZIE-6 C/M
4
3.53D
21.5
a2.5
IE-6 S
T/S lE-6 T B-DOT
495 80-038-05 16
No 12
a a
- 4-40
.52 IE-6 S 2.5 18.98
IE-6 T8
.1 4
-4
.512 1.536 2.56IE-6 S
88
lE 6 A/S AI-DOT14
see 80-038-0514
3m8 lee I-DOT
18o 66
8 46
-100 28
a 1.02 2.04 a 4.13 81.25.51 1.53 2.55 2.06 6.19 10.31
IE-6 S IE 6 HZ
8
40
29
.51 1.53 2.55IE-6 S
SOME RESULTS FROM COMPARISONOF MODEL AND IN-FLIGHT DATA
IN-FLIGHT FREQUENCY SPECTRUM PEAKS ARE INGENERAL AGREEMENT WITH MODES OF MODEL
AT 9MHz AND 21 MHz
SHOULD BE ABLE TO INFER SOME CHANNEL PROPERTIESFROM IN-FLIGHT SPECTRA
rN-FLIGHT D-DOT WAVEFORMS LONGER DURATION THANB-DOT WHEREAS DURATIONS SAME ON MODEL
89
AN OVERVIEW OF THE ELECTRICAL/ELECTROMAGNETIC IMPACT OFADVANCED COMPOSITE MATERIALS ON AIRCRAFT DESIGN
by
Dr. John C. Corbin, Jr.
Wright-Patterson Air Force Base
The impact of the application of composite structures inaircraft presented from the electromagnetic viewpoint.Fundamental electromagnetic differences between metal andcomposite aircraft are described and technology develop-ments in shielding effectiveness, joint and fuel systemdesign, and power system/equipment integration are reviewed.
91
MNZ1IW PAM BLAI.NT 1
CA)z
00
zz
z a:
C/)
-J 00w CC CC
z Z w/ 00_0 cc co) x c
0 w *w C U0z I-J a
P C.) <~ C/
z z
a I- 0
0 UWz w
0 WW
w 0) -
92
I-
w
LLLZ
W~ U
m 0 .C/)C /
o CCC
LU 93
w -.- l
~LLJH
~ 00
L--H < CLI~r LL 0n< ILU~ < -y -j
0 j 0 0
Z UZ
(.:) LL)
H HI H I z
>L~ <~ H<QE, mP- -H <A0
0 Di IL a.
2L <
LLJu~< 10 0 z
'I U I -
U- z
Ln < > w94
AD~17 FDRLAITO DIITAINTEeNCLCNE l-T /
COMPENDIUM OF LIONTNINO EFFECTS ON FUTURE AIRCRAFT ErLECTRONIC--ETC CU)
UNCLASSIFED OT/FAACT2/30 N
moEEEohIUEEEEEEmhssmhhhhhhhhEEEEEEmoEEohE,EEElimEoEEohhoI
W ~I--I- i~C/) Cl)
I.-p wW W <
0 cc
Wc uW zwzccc8 0Z?0- 0
L0 0 0L
oL CC Z OO.
O)Z 0- Z> 0 0
jr Z CI~1. L3 Q CCOO) M.0 j
LU -J> cc -jWW ZZ _o<C)-
CM Wz z~
- - - L
w zZ 0~
(4)
wI
'-U.
"a<cc-a
4 cc
"Jog o -CO) Z c M U
00w0IUz c0r tcc0C0)W _jU
-4Q 3 !'
z LZ OX 96
w
C/)0
_ w LJ <-jLU IL w-z
cc 0 (1)
LU L D :0Cl)
LL <c 00Chin CD
C) U.oMw 0CZ0cn I- 0
Lj~ (1)c 0 >- X CLU 4 :CL0 0~ >
w W t. Cl)
co(nZ <
p 0 CC -J w
Lijc!) 2 0 w >z a m I
97
AIRCRAFT APPLICATIONS
*YF-16 FORWARD FUSELAGE
* F/A 18 HORNET
* AV-8B V/STOL
* 767
98
99
vi cm
0UU
co
10
LLIICA
zC
101~
00
Uc 00 0
WW
00ILzz
..7 .....
LLg
d -z
102
LJ
c- L&
f5 C),
LA C e _
C,,0
LLU
00
41
103
----------
LUJ
LLJ
C-,
LUA
II
'.4b
104
w zww
I-J -J w/ L
Iww c c~0>M - CL) 0/ (M)
10o W WC/Wi
C. - / UC)
QE -O0 C/) C L )cL). ZC/ WUJ C/)cWQ.aIC/
W 0. Z w
C/) C) zW j U
u 000* .
IC~c C F-F105
z
z wU
H1 0 05
w U) C/-CZ > < -j im
(LI U) -jLL )> zzz
La.
LU) z wLU 0 H.
0I L U LL cc 0 U)< ()) LU H
zo CL U) > w Low L 0 (0 w)~
cc U~ LLLuL H- LZ w
106
00
z 0-1
LL
LU
LUJ
C.:lC/ LI < L
w cc
co
CO 0 W0U
-J I- I- -
LLII ILI- 0.0 .>
107
R www
W) LLU U
L c .U LCl) Wa:w LrU..WzCL LZ<.
UOL Z W-j2 u L
COO (n U@0-W
0 c W -F-P1080
ok,,
xl I L
klCo
'no
~wU.
10910
L) U.-U U
02ww
&) C- )
I-
C/) wjw 0 0
C)w zU) C/) ~ z LL
o~C/) < <0P nz crO0O0Z mf
U. LL ~LL J )CCCW LL z < <<
0 -k uo 0
0 LLWr0cr0jLQ
110
0 -J
0 0U 0
w 04 0. 0
LU0 1,-Z LU z L0I("U w zi
cc >-f (JOw W ZjW4w
cm. 0j0 cc U
cm, -J 0 w~ 0 -wJ
LU cc.m w Z dI)
4 * * Su4 U
ccn=0 00M jiAc
W A
cc 1c1c
z0 -d
> W zlzi 0 00 U)
U- 0z wL cc
ZQ) Z l)or z aw wi
'4,R w Z-W WO<
0L % 0C/) C60
o/ C/) L)u. 0 OOC/)wLIZ I) C/) < 0 u
WL LL LLJ 0
C/ W LC/)LL
0./ C 0LSL L 0 U. cc 0 0.... ml'
*) 00 0
C..f) > LL L.LC/) L U LL112L
LU
U.'J
0 wLo < CD 0LLS z < LL
COO w m z 0CID C> i
1 L.C w -J wLw~~ Zl Z L:cl.:o~ 0 D.
Z(/) d < D o z
t:,-J -j -i -J 0 z_OOw w w w w w ~I
Z Z Z CD
0 0
.4c
113
cc 0 0
2 w L
LL 0 0
C,) w %-t -Ucc IC C ZLU _ w
x /) CCLJ 0LL a.WIC)ML .- uwL / _ N cLUJZc C) Uae <
LU -I -L
UfJ z
0 LL 0 C)W0 00C/) *- C)c
114
0~Q IL
00
x
CC
w4 0
LLLc-
11
0-0
W1
- a
CL c;
> 4-
00
0 _ _0 O
C.f) Ut
c-z
w
LA.
C,
II
0 0
00 0T 00
116
0
-J CD
CL 0'i CL 0 Q.
0~~~~ 0 I
0..C a N P z- >o) e wo
Z- C) 0- zLLJ= ZZ-
COO),~ .. U>< < 2MU
-n F-) CC 00 ~
JJ W cZ 0 Ow 0-
C/ 0. w 0 C/)J Z % z cra.. (n / z -w -
- - z .
L) L) a. F-
*0 0[[ 0uu .UL
117
xSn
Ca.0
N
'-4tz.
0
9.-'
0
14
118
* a-* * ,-~ .4 .t.
C.,
00
o 00
z
w N
0 CULON
.j.
L0
LUw
C,
Ei) -- SU 1311 UP04
11
:c3
00
CL -
-w >z~1 -
OO0
>1>
6: ClC
ww
w
Z0
wmNo0
LI- _ _ _
_j 0
Q 0 0
120
-j0 -Jz
COO) z w-1I wL
-,I 0-LJ M
HL -. Z -j 0 LH
i b WW w z0 )U) U - :,r) C/)
LLJ - LLH
-m 0LwwJ wo000 0 H~ rZ
0J w L>-:> C0(:5-) 0 0
cc ~~0. LUJ C/) U Cm~ ~ mw 2 L )z C/
E C C/) Z2 HHn %-. wL Z -.. Z
cc 0LJ 0 p p-j )D-J H L_ - zi
L.U -'0>LL - ZcrZ Z 0.
cc LL0. H
*V w 0
121
EMI LEAKAGE TEST PANEL LIST
CONF IGURAT ION
IDENT. CONFIGURATION JOINT JOINT SFAL CONFIGUR~ATION
A G/E Tape Hat'l None None
BG/E Cloth Wone None
C Aluminum None None
1) G/E (fIn Plated) None Norio
G OlE-Aluminum Single Lap Form-In-PIlice (FIP) Seal
Shear
G/OE-Aluminum Single Lap Tin Plated-FIP Seal
Shear
JG/E-Aluminum Single Lap FIP Seal
Shear
K GlE-Aluminum Single Lap HIP Seal-Finger Stock
Shear
L G/E-G/E Single Lap Tin Plated
Shear
P4 G/E-G/E Double Lap Fay Seal
Shear
N Aluminum-Aluminum Double Lap Fay Seal
Shear
P G/E-Aluminum Single Lap FlrP Seal-Finger Stock
Shear
R G/E-G/E Single Lap Tin Plated-FIP Seal-Finger Stock
122
TYPICAL TEST CONFIGURATIONS
To Receiver
Test Probe
Test ,.Specimen -' - -
/l-- - -- Test Enclosure
To Signal Source• / Xmit Antenna
GP03-0153-8
123
E --. .. . .-J,
EMI TEST PANEL DATARELATIVE PERFORMANCE OF PANELS WITH SEAMS
Relative
Test Panel Description Seam Preparation Performance
E H
N Aluminum-Aluminum None Double Lap Shear (OLS) 100 97
L Graphite/Epoxy Cloth - Graphite/ Tin Plated. Sealed 84 84
Epoxy Cloth
P Aluminum - Graphite/Epoxy Cloth Flonding Strip, Sealed 69 79
R Graphite/Epoxy Cloth - Graphite/ Tin Plated, fonding Strip 64 78
Epoxy Cloth Sealed
G Aluminum - Graphite/Epoxy Cloth Sealed 58 99
H Aluminum - Graphite/Epoxy Cloth Tin Plated, Sealed 49 96
M Graphite/Epoxy Cloth - Graphite/ None (DLS) 50 4
Epoxy Cloth
K Graphite/Epoxy Cloth - Graphite/ Bonding Strip, Sealed 37 55
Epoxy Cloth
J Graphite/Epoxy Cloth - Graphite/ Sealed 10 68
Epoxy Cloth
C (4) Aluminum 99 99
0 (4) Tin Plated, Graphite/Epoxy Cloth 95 89
A (4) Graphite/Epoxy Tape 80 71
B (4) Graphite/Epoxy Cloth 70 79
NOTES:
I. All panels show relationship to best panel whose value is 100
2. E (electric field)
3. H (magnetic field)
1 i4. One piece panels (no seams)
5. Single lap sheer (SLS) unless otherwise Indicated
6. The seals are a formed-In-place rubber gasket used to prevent water leaks
124
wo0<
ow UL. UU
LI- F-I-i-N L0 z' 0 cc
0m LW ZI-u-I zLJ >~
:z 0/
0 0D 0
0/ o/o5j
wl~cc L WLCC I-
125
ADJACENT GRAPHITE/EPOXY AND ALUMINUMLIGHTNING ATTACHMENT CHARACTERISTICS
Ioli in -JI
2 in,
1-0- 0
2 in.
0- c
J11
1261 P~ .6
- r--z--~A ~ ~ ~ I GrphteEpx
U-
(V E0) 4-
Zi Cl) ( 0 C)
L ) L).- 3 +- +
4) 4) - -
0 0 0 z z C) - L L-4U- -
L I- L , L L,
0 Wn V) (n ( n L U)(n. C) -l CL CL C
L c) O :3 a0 0 0VC ( V (
0.0(I) a, 0 ) INC) a
(V (V (V ( (VP (
-1 <) C) -) 0)0 0) D0z E I I I I E I0 0 - 0 U LL
<0
wz0.0
4: C L
zz
d 0
£1127
L :f 0 0 go 0 O 0 0
m0
- - N - C14
06E N
LU 8 N -4
C.) -0
0zi -r
U. 4-
0 o oW ~ F (A -4
o Op~~V) I'I- -
-w
(/ D <f C f
1 co (/) C.D x L0-I w1
C.) - ~ C 128U
z cc
0 z W
M Z 4 W .- U -40e W 0 0 z z0~
X M i0 I- L)Z
0C cc 00 J C)w
N C.)0 U
(1) z U i W ~jW/)w 0 z Zo 0z
L-S z.- W c
L U 0~ - z w
04 0 W 0 LL~ 4 ~M.LLJ - U C
0. zZ C/ 00 4Z 4
C7 z o -I LLL 01
0 W) LLJ W 1 - 4 - jc
LL ) LU. 4 - MW .Z aW W
0.4 Z) 0 0- a-W -2
ow z z ) 0 z~ >~W~ 0 Q0 jJ1 C C (7)J J L
4 - i r ~ w 0 :13
cn in( >O ZL L 00 WL-u..
V0 >0 L 0 0L
129
0) -
00
CocCV 4.'4-
LL)
QI x E
0 a- 0
I~CL
C.Y CL~0
wLL.
LL
13
z0
00
Cl) 2
000
00
m~ o
tL C
00
00
I-.2
I-D CL
/ !1c\i m 0-
CC
E 7@
131
w
- -c (flu.00 w
X 0*
c -
00~
zz r-
:1~~ c5
40J
132
00
X0
~0
Eo
_ _ E
C)~ C)
0. IC0 a)
3:- 0 c00
0 00 L0
_ _ _ N
<0 U
0 0coz C4C
A::SP061A
E3
cnc
cc <
LUU.0.
FAL
ow
00
00
w
Zw
C,
w,
134
COO)LUJ
COO)
COP) u
C.1) ccE
U cnc
< cc
L 0
I iT*C #O ,
<35
- . .- --------- - - -;-cc
wIW
CO) 0 <LL-J W 0
W- z Z =-
LLWW Z0' W cLJLJ c/) a. )c )LU0 RT~ A-W w
- W L o0 - L
<00 <OLLI
(/)C w0 McolIzF < 00'- L
> > Z ~0- CC LWF-~ wZOzz
w )WM0Z=
-10 0w 0 0
=) p: D 036
ui : 0 c
I,, I, V7l'xj ~
1.U
uI.
.2 'x
~13
0coz
zuJ
IzLU
W.
LU~LU
zu
z
1 38
EMI TEST SETUP IN ANECHOIC CHAMBER(A) ANTENNA, (B) FIELD METER, (C) WING
139
wall.
CC N ZLzL CD w i
w <LJ0w 0 0/)W
CO) ~ 0 Z cl W C/) -0I- <-~ oO C/WL Z U0o z~ zWmLU0 z w Z 1 <C
I- 0 O - WLJC/) zcLi Zz z 10LU 0w< < Z 0 Z
r 0 LL <Z)w :D cc 0< w
LL.L 0I-
LU o ZO C0 1 .. 0 o « CC
Z u n < <
ZU U- 0
I- Ow0 0 =.< I
I- WLL <O < < wc0w0 cc N ~ >0
w 0 0- LLZ C
140
<- 0 CC I WW
.j LJLLC.!W
LA. 0 DLJ ~ WwLA. m- - x
a.I z
I- aZZ
Z010
0u..2 0O
0 0
ui 141
0 c0 --LL 3z WI-
w wi wlZ ~~ rrZ L
I-U _ LL
Mr- LLL Z-J/)c
cc OZLLJ U LL
C/) W LJZWL
ZOO 0 wcrLL
1 " L. 13 j WC..> 0 % 5 Ow ZO
LL. >~I N 0
*A a 0 M
< C.)142
0 LLJ0 1= Lu 4
CIRCUIT AND PROBE ATTACHMENT POINTS
H 9i Vi, tag, PNobw Loc
/X
772
4/1
G if* -p? -
A l,,
10,
.\N
rAll d-mlh~s in inhesGl.il
143
Clo
z < 0 . w
L)wa C) <
al-I w z CC
0 00
c~LLcI WLL. 1
c c C !L0 WC C Z oZ
C.) L 0 Cl I144
LLI
wwLUJ
o oC. C/)M -j
W c
C5 0 C/)I ccw C
ca0 C/)-C/) w
c J ccw oo ~ 0 C/)0 0 00L.C/) LL 0 o
(nn cc 0_0 nZ c z C) C/o
Z 0co W WL wo U0
cc- 0 L w 0oe W U. C U. W
V CW
000
145
__ zCOLL <
CC 0
00 - :DCCLU--
_ Wz
00 Qu0LWLL ) e - C< ~ ( L/ 0LL
0) W0c
C)z 0U
-JwJ zwwLO~ J OI < -
00 c,0 z S U
146 o
SIMPLIFIED BLOCK DIAGRAM OF LIGHTNING TEST SETUP
St I
32
I0
0 10 26 0 500Ttme pusec Tm i
'Not -,5 ill iis
ICurrent C.Boied JIn
*.N.Botd on
Coupons
LLU
cz 75i
wl L LL
u 0J- i z- CM
LLU CO wi 0 CZOz w-LJ
ooLC.). C.
I- =zj o
LU uJ LU)
mx
LLLU
z miLUL
148
0-j
0
Q. -J LL)
Cu) 0 C-
-JLC
00
I-n
zWC
z U"
00
C) v) -J
14
ui C)
o -r
ui U, c
>I 004
F- u0
z>
C.)
C,
LU
zcCL0
150
wz w W
o0 C/)~(
cC)
DWCJ C/)O~W 1 L (. 0 Z F
ILJ- c/ w 0 Z 0~LL V)C)0o c0
LOjLLS W CL' p w .(Z/ C/)- C-) Z/ 0 -COO < 0 <. W j-.-
U- 0
0 L0z CC /)( C)U0 L.
151
aZ
ccL I 0aca. a.
C-a. I. C
W-w
- a., x
3 0 .4
-J -i b mwzo 0o L.
z - 2 S L
o-o~ C - a ca t
14 z w
::aa - mS~usus 1
ft ft ow tv .
wM A~ W.0 aaW4L% -aj
-~ a152
0
0L 0w l
Cl Z 0 - C/
Cd. 0 C) z F > LL 0
>0- > CC > L
<LLZ L3 W0- 0 <wj0uEnW w.m Z uI-
* 0 0i 0
Ei (- L I < -
0 0)
(I) -J!) < O C14
CC C/ CC FQ(i C
C7) c cc CV)w U a_1- 04 U
03 0 cc c -n0ccLr
c -L W zL Du ZO z c < W- -I-o CL0 Z c
z~c _L <cL)Fc 0 z Z
cc~ C J Q) 'C) toZ3O 0< Z/ E oo
<o w
o ? C 0 r 0 -i LO- 0 cc0 LW 0z wojw L
_ _- O z W ccwmC) -
-0 Z 0cc coD U0 D .1eLL~( .J< W a. u 0
ic u..ccY ( W 0 0
u..Gr D<c Fc0 0 uccw. a-~~ z 01.-j cc OQ
LLJm ;; Y b~l < CI. <Z.0 o cv, C) Z rj?' 5~ LLCCC)cc (.C 4 a. cc
*r LLW, c~~~- c-c CC>'- o -L)~i LdL wC /) o L x
(j Z 0 IfWl oc) I- o zcli C/) o L/)i (DD0Q
W Z T- DF- cnZ *F-L -
Zc a 0 cc jDW C) 0 >- D 02< 0
03 6 u.z 0 c coW~m 0<
:3 uj Go 1U) : -1 7 ;a L C
F- dc- LLJ154
STRUCTURAL APPLICATION OF COMPOSITE MATERIALS ANDTHE DIRECT EFFECTS OF LIGHTNING STRIKES
by
Mr. William E. Howell
Langley Research CenterNational Aeronautics and Space Administration
The direct effects of lightning strikes on compositematerials and protection approaches will be described.Approaches to EMI shielding which maintain weight advan-tage and structural integrity over the life of the
airframe will be discussed.
155
Mon -.4
SCOPE OF PRESENTATION
0 ADVANCED COMPOSITE MATERIALS
o APPLICATIONS IN AIRCRAFT STRUCTURES
0 LANGLEY'S RESEARCH ON DIRECT EFFECTS OF
LIGHTNING ON COMPOSITE STRUCTURES
MATERIAL PROPERTIES
PROPERTIES
STRENGTH, MODULUS, DENSITY RESISTIVITY, COSTMATERIAL KSI X 103 KSI LB/IN, OHM-CM $/B
GRAPHITE-EPOXY 110-225 18 0.055 0,9-1.1X10-4 30
KEVLAR-EPOXY 75-270 11 0.050 * 15
GLASS-EPOXY 75-200 6 0,070 • 10
ALUMINUM 55 10 0.101 2.8x10"6 2
DIELECTRIC MATERIAL (NON-CONDUCTOR)
156
FILAMENt PRE-IMPREGNATED TAPE LAMINATED STRUCTURE
GLASS1BORON
GRAPHITEf
KEVLARJ
MATRIX FlBI
EPOXY 1AR)POLY IMI DE
ALUM INUM J
IURI
~ -. 15.7
_ASSsi.
GRAPHITE-EPOXY SPOILERS FOR 737 COMMERCIAL FLIGHT SERVICE
FLIGHT SERVICE EVALUATION OF PRD-491EPOXY PANELS ON LOCKHEED L-1011 AIRCRAFT
159
COMPOSITESECONDARYSTRUCTURES
BOEING 727 COMPOSITE ELEVATOR
DOUGLAS DC-10 COMPOSITE RUDDER LOCKHEED L-1011 COMPOSITE AILERON
DC-10 COMPOSIE RUDDER
160
Lji~
V
BOEING 767 COMPOSITE STRUCTURE APPLICATIONS
r HYBRID COMPOSITE (KEVLARIGRAPHITE) STABILIZER TIPS
GRAPHITE COMPOSITE RUDDRF IXED T. E. FIXtD T.tL.
PANELS SPOILERS PANELS
INBOARD ELEVATORS
\- SEAL PLATES
so WING TO BODY/ -" ' FA I R IN G
0 0OUTBOARD0 A ILERONS
/. MAIN LANDING LEADING EDGEZ= GEAR DOORS \ ACCESS DOORS
NOSE LANDING (BODY)
GEAR DOORS COWL COMPONENTS
LIGHTNING PROTECTION SYSTEM FOR 727 ELEVATORF4A7
DECORATIVE PAINT 61790.05 cm (0. 02 in.) 6061 ALUMINUM
FAY SURFACE DSEAL/ADHESIVE-FIBERGLASS DIELECTRIC (2 PLIES) TYPICAL 120
_________________ I
A-AA-A ~99.06 __
/AA (39. 00 in)
STATIC DISCHARGEFITTING (3 PLACES)
FAIRING F IBERGLASS DIELECTRIC(2 PLIES)(EXISTING FIBERGLASS)" ,.05 cm (0.02 in.) 6061 LIGHTNINGSTEEL BALANCE WEIGHT DIVERTER STRIP
FAIRING(EXISTING FIBERGLASS)
161
A.2
AIRCRAFT STRIKE ZONES
* :'ZONE2A
-ZONES 1S AND 21
GRAPHITE/EPOXY UPPER AFT RUDDER 5176
DOUGLAS DC-1aF IBERGLASS -EPOXY
TI P ASSEMBLY
RIBS REA R SPAR
FRONT SPARALUMINUM ALLOY
DRIVE FITTINGS-.(2 PLACES)
FI BERGLASS-EPOXY'AUIMALOLEADIN EDGECONDUCTIVE STRAP
I FIBERGLASS-EPOXYI TRAILING EDGE
ANGLES
ALUMIUM ALOY LGRAPHITE(RH OPPOSITE
HINGE FITTINGS/ CLOSING RIB OiEDFRCRTY(5 PLACES)
162
STATIC DISCHARGEMAST BASE
LIGHTNING EFFECTS ON COMPOSITE STRU.CTURES
VERTICAL FIN CAP
LENGT 8 6 INI.Il
HEIGH 19 IN
WEIGHT 31 LB
MATERIALS
OEVLAR 49 EPOXY F-106B RESEARCH AIRCRAFT
GRAPHITE EPOXY
163
EXAMPLE PROTECTION SYSTEMS
o FLAME SPRAYED ALUMINUM
o ALUMINIZED GLASS (THORSTRAND®)
o ALUMINUM STRIPS/TAPE
o METAL SCREEN OR WIRE MESH
CERTIFICATION CURRENT TEST WAVEFORM COMPONENTSFOR
EVALUATION OF DIRECT EFFECTS
COMPONENT A
COMPONENT B
COMPONENT DCURRENT
I ,I
TIME
164
F-106B COMPOSITE FIN TIPS
o KEVLAR-EPOXY WITH THORSTRAND®
o GRAPHITE/EPOXY WITHOUT PROTECTION
o GRAPHITE/EPOXY WITH FLAME SPRAYED ALUMINUM
o KEVLAR/EPOXY WITH FLAME SPRAYED ALUMINUM
165
F1 068B COM PU1SI1T E F IN T IP A S SM ..Y
166
EFFECT OF LIGHTNING
ON
KEVLAR/EPOXY WITH THORSTRAND
UNPAINTED PAINU
p 105 IA ip 6 kA
ACTION INTEGRAL 0 82 106A2 ACTION INTEGRAL -0,41 106 A2Is
GRITE TRESE NO
KEVIAR IU
HylIRB MHICAL UPR
167
6L. '
168
CONCLUDING REMARKS
o COMPOSITES EXHIBIT STRUCTURAL ADVANTAGES COMPARED TO METALS
o EXCELLENT IN-SERVICE PERFORMANCE AND MAINTENANCE EXPERIENCE HAVE BEEN
ACHIEVED WITH OVER 150 COMPOSITE COMPONENTS DURING 8 YEARS AND OVER
2 MILLION HOURS OF FLIGHT SERVICE WITH NO SIGNIFICANT DAMAGE FROM
LIGHTNING STRIKES
o EFFECTS OF LIGHTNING ON COMPOSITE MATERIALS AND LIGHTNING PROTECTION
SYSTEMS ARE BEING EVALUATED
o GROUND AND FLIGHT DATA BASE IS BEING DEVELOPED FOR THE ELECTRICALSAFETY OF AIRCRAFT
169
-. ~.-
LIGHTNING INTERACTION ANALYSIS
by
Dr. Karl S. Kunz
Kunz Associates, Incorporated
Description of lightning interaction analyses and howthey are performed including lightning model, aircraftgeometry, interior equipment and cable layout, and model-ing of interconnecting system. Sample direct strike
problem and (generic) expected results. Overview ofmathematical basis used in interaction analysis anddescription of finite difference method.
'-I
171 MONiJ M MAN 94 nU
* -- *--- BE
WHAT IS A LIGHTNING INTERACTION ANALYSIS -
A MATHEMATICAL TREATMENT OF THE PROPAGATION OF
ELECTROMAGNETIC ENERGY FROM A LIGHTNING BOLT TO
AN AIRCRAFT AND ON INTO SUSCEPTIBLE INTERIOR
EQUIPMENT
USES EXPERIMENTALLY DETERMINED CHARACTERISTICS
AS THE INPUTS OF MATHEMATICAL MODELS
PREDICTS RESPONSE LEVELS (VOLTAGE AND CURRENT) AT
THE INPUTS (PINS) OF SUSCEPTIBLE EQUIPMENT
ALLOWS UPSET/DAMAGE/FAILURE ASSESSMENTS TO BE MADE
.FOR THE SUSCEPTIBLE EQUIPMENT
WHY A LIGHTNING INTERACTION ANALYSIS AND NOT JUST EXPERIMENT -
EXPANDS ON' EXPERIMENT
- SOURCE VARIATIONS, AIRCRAFT MODIFICATIONS AND
,EQUIPMENT CAN BE ACCOMODATED
INCREASES UNDERSTANDING
- MODELING INCREASES UNDERSTANDING AS MODELS ARE
REFINED AND MADE MORE ACCURATE
* EFFECTIVE
- ANALYSIS CAN BE QUICKLY AND INEXPENSIVELY PER-
FORMED, WHILE ADEQUATE ACCURRACY IS MAINTAINED
172
HOW IS A LIGHTNING INTERACTION ANALYSIS PERFORMED -
DEFINE SOURCE (DIRECT STRIKE, RADIATED FIELDS, ETC$),
AIRCRAFT (707, 747, ETC.) AND POSSIBLY SUSCEPTIBLE
EQUIPMENT (RADAR, NAVIGATIONAL EQUIPMENTj ETC.) -
OBTAIN RELEVANT EXPERIMENTAL DATA, SUCH AS
- LIGHTNING TIME BEHAVIOR OR SPECTRUM
- AIRCRAFT GEOMETRY AND CONSTRUCTION
- INTERIOR EQUIPMENT AND CABLE LAYOUTS
- ELECTRICAL PARAMETERS (CABLE IZE, SHIELDING,IMPEDANCE, TERMINATIONS, ETC.)
- DEVICE UPSET/DAMAGE/FAILURE THRESHOLDS ANDMECHANISMS
MODEL THE INTERCONNECTED SYSTEM OF SOURCE, AIRCRAFT
AND EQUIPMENT
SELECT A MATHEMATICALLY TRACTABLE REALIZATION OF THE
MODEL
CHECK THE MATHEMATICAL MODEL FOR COMPLETENESS AND
VALIDITY (COMPARE PREDICTIONS WITH KNOWN EXPERIMENTAL
RESULTS)
PREDICT RESPONSES AT THE SELECTED SUSCEPTIBLE EQUIPMENT
, EXAMINE SENSITIVITY TO PARAMETER VARIATIONS (OPTIONAL
"SAFETY" MEASURE)
173
r'PIAL PROBLEM
RESPQHS
LIGHTN$ DEFAILS
100KA Ax
174
AIRCRAFT DETAILS
air conditioner, cbnlgtcabin Pressure,power system contros
circuit e,.aacer panels fuel pumps and gauges
instrument panel niepesrs
oil pressure,tchometer,fire warning,generator,solenoid valves,
Land controls
Typical elements and cabling associated with the aircraft
power system.
tailcone
main deck
prumouri uipfn bayesubbulkhead
Elem taryvolues ft teuircrft.y
crwm welwlcab75
e4 i.en ba
CABLE DETAILS
CA lE TYPES
(TRANSMISSION LINES)
6 COAXIAL ......................
a TRIAXIAL........................
0 11ULTIAXIAL ............................
• TWINAXIAL ....................
I OPEN LINES
" STRIPLINE --
" MICROSTRIP .-
" TWO-WIRE 0 6
" EDGESTRIP --
" EDGEWIRE 0-
" WIRE OVER GROUND
MATHEMATICAL REALIZATION -
GENERAL REQUIREMENTS -
SOURCE X EXTERIOR RESPONSE X PENETRATION X INTERIORRESPONSE X SHIELDING EFFECT = RESPONSE AT PIN
* EXTERIOR RESPONSE X PENETRATION X INTERIOR RESPONSE
MOST DIFFICULT PART
POSSIBLE APPROACHES (MAY BE COMBINED WITH TRANSMISSION
LINE THEORY, BETHE SMALL HOLE THEORY, MULTIPLE RUNS, ETC.)
- SIMPLE CANONICAL SHAPES
- MOM THIN WIRE TYPE CODES (EFIE)- PATCH CODES (MFIE)- FINITE DIFFERENCE TECHNIQUES
176
= , .I
CANOJNICAL SWAE
z
z-h
-Ie 1117
grud ln
Diag am e va bradcrsed inidet an elecrocla tpherid.clidr
177
WIRE MMUEL/BOR 'S
'Itll)
21.6 mi/it -Ur1~l24.5m , N
/ C
24.3m - i33
8.5 M
ATM
Stic (intesectigcylnder)_modlofheb1_airraftnth
wing-fowr an wig-wp configurations
9. hi
26
Tom
.m : 1*..-
Body-of-revolution model of the EC-135 aircraft. Current zones
are indicated with dotted lines.
178
mom
Solle COMPUZZauoual Apects of Thin-Wire Mlodefing
2q-L -H L
F ~ 7 j2/5L
After MILLER L M4ORTON [4..203
After RICHMOND 14M.2]
After POGGPO L MILLER t4.21
After DIAZ (4.21After THEILE[(5=
Repruewtative wire grid model strucIt
1 79
FINIITE DIFFERENCE F-111 MODEL
/
- /
FINITE DIFFERENCE METHOD -
BASED ON BRUTE FORCE TIME STEPPING OF MAXWELL'S
EQUATIONS
INCORPORATES ANY MATHEMATICALLY EXPRESSIBLE' SOURCE,
I.E. (t) = e t - e Bt
" ACCURATE EXTERIOR RESPONSE PREDICTIONS
* WITH EXPANSION TECHNIQUE CAN, ALSO, PERFORM INTERIORRESPONSE PREDICTIONS AT REASONABLE COST
CAN HANDLE COMPOSITES, AS WELL AS METAL AIRCRAFT
PANELS
180
.,-,m
DEFINITION OF THE FINITE DIFFERENCE APPROACH
Finite differencing consists of replacing continuous
partial derivatives in P.D.E.'s with appropriate finite
differences. For example:
y - A (yn) - Yn-l " Yn ; 'yA [A(Yn) Yn+2" 2yn+ + Yn ; etc.
Finite differencing discritizes the P.D.E. and, hence,
the problem being solved, i.e.
Finite differencing is, therefore, an approximation
that in the limit of zero mesh size is exact.
Finite differencing does not require any special model
of the problem to facilitate a solution, just the appro-
priate P.D.E. such as:
I- T V2T + Q/ k or ( r - " e" ) -"
(heat equation) (portion of Maxwell Equationsfor thin scatterer in cylin-dri cal coordinates)
181
EVOLUTION OF PRECEEDING FINITE DIFFERENCE APPROACH TO EM
t _ ., 4.-
• The Maxwell Equations
" Classical Boundary Value Solutions
• Introduction of Computers/Computer Oriented Numerical Analysis
" Integral Equation Approaches (EFIE and MFIE)
" Finite Difference as presently applied to EM coupling
1) feasibility of application to realistic problems -
K.S. Lee - "Num. Sol. of Int. Bound. Val. Prob. Involv-
ing Maxwell's Equas. in Iso. Media", IEEE Trans-
actions A and P, May,1966.
2) application in 2D to realistic problem with radiation
boundary condition -
D.E. Merewether - "Trans. Currents Induced on a Metallic
Body of Rev. by an EM Pulse", IEEE Trans-
actions on EMC, May, 1971.
3) formulation of 3D code with radiation boundary condition -
R. Holland - "THREDE: A Free-Field EMP Coupling and Scat-
tering Code", Mission Research Corp., AMRC-
R-95, Sept., 1976.
182
EVOLUTION - 2
4) application to complex scattering object with com-
parison to experiment -
K.S. Kunz and K.M. Lee - "A Three-Dim. Finite-Diff. Solu.
to the Ext. Response of an Aircraft
to a Complex Transient EM Environ-
ment: Part 1 -The Method and Its Im-
plementation and Part 2 - Comparison
of Predictions and Measurements",
IEEE Transactions on EMC, May, 1978.
5) expand subvolume in a second run for increased spatial
and frequency resolution -
K.S. Kunz and L.T. Simpson - "A Technique for Increasing the
Resolution of Finite-Difference
Solutions of the Maxwell Equations",
IEEE Trancact on on EMC
November, 19816) generalize the 3D code to treat lossy dielectrics -
R. Holland, L.T. Simpson and K.S. Kunz -
"Finite-Difference Analysis of EMP Coupling to Lossy
Dielectric Structures", IEEE Transactions on EMC,
August, 1980.
183
Law
33 ~ ~ ~ ~ t r EEZfWANS.ACT IONS~. ONELC a I C OMPATI BIkLT'V. V OL. Er.IC-20 NO.-~ A~y 07b
-. 0 2t0 500o 790 1_~0 1 0 250 500 750 --- ro
FiS. 17. T.P. R[L. jAf). EI Fuselals. Fig. 21. TP. 382.jA(IJ.EU IJ.5S.e
10 ...
2' U& 0U '
1Fig. 22. T.P. 3 10j aFm v
Fir-I& 382.JA, .).)I Fmebs.
~~Ii U~0.25__ _ _ _fir.. -0.2S-
0 250- Sao 80 1
o0 250 500 75 1000 Tire (ns)Fi&.23. 1.?. 332, Qf).£g Fushlqu
-Fig. 19. 7.?.RI.Q2(t.EU Fuw.Ia.
:\00.000.-
10 100
SAMPLE PERFECTLY CONDUCTING A/C RESULTS '
184
INCREASED RESOLUTION USING EXPANSION TECHNP*UE-A/C UNEXPANDED-
toc-. ,o ~ A~ ft 4m 1. so
N,.S00." 1it
-A/C EXPANDED -
PlgweO 7. Fitoended Amg Showinsg Cockbit Arma Dtail.
185
S
5
L I
I
'I r. ~-~ - -
~4:~ fI *-
.j.
I15-
S 4 ' 9
9, (9111,9 * *9
j.j*I)~)- * 3 *
-'
5'
I
E.if
I*
LIJ 1
I a -I
7 ,., a:
-I Si *~' I I
p J I.; Z i'. -
z Ii'
-
U* S
K * S
(.9.) ~* -J
Sn I
I x N, e
- I .3 I
I- 1 g~~qq~ -S
-J SM ' *
-~
I*SSM1S*,9U.
- U *
La..I
U, 5'
cd~ S.
-J
B31
a!'I
t
12
- .9
-, ii- up
* - aa* -. Lg
186
S.- -
7
S
*
6
*6 ..~
*
* I
I
.1 I..
_________ 1. I
I I:
__________ I
U I*
U U I
~1
(WhUl:~ - . . .
.
I (111W. 3 - -
1II
M p
SbLb
-
* S
Pd
P. -,
4 I I
& I
UU.*1
I I*
U.
U.
U. * I -
.1;.5,, * -~ U t.
.~ *t-~-~
I! U jJ~... .
-- II .5 *~*Y,,* -
-. ** OS
-£ I
ba a
*
.0
Lb
U.1.5
I I I
I I I U* I
I 5
1
4 .1
.2 U. U.
-*~I
U '5 U
-I U .1
-~
LI
I~IuI~2- * ,I ..a I-,3I*.Iu
* * * Sb
* 3lb
Pd
P .9 .9lb
187
*~' ~
IN1TERIOR COUPLING APPROACH
Contiguous Ski" "Ide of the Aircraft for Diffusion Calculatin
Perfectly Conducting Airtraft with Sem
Cmplement of the sow i'adel
ORIGINAL GEOMETRY CONJliGAr/ftONPLEM4ljl GtIOJRY
Electrically Conductingj I ~ow ,Screen SI lcrclI ulu I"
I S. ren.
"total
I>I
E lectrically /I.MI1eialIConducti ng 1:f i.onduc I I nq
Source sI Cwjat
flcric aly AprueMagnetically
(oI I Il petr Conduc tIg w)Wire
Origjinal and Counjuwateltnmnplenment Geoemtry-1, lanar Screen txample
188
Escat. -E nc af(t)tan tan/ I / Electrically
Conducting
EatResistive (iretan t. (E H 4s )R/L Segment ( emns
tnloop ofRes istance
R
Escat. -E inctan tan *
___________________Aircraft Surface
Lightning Channel Source
Hscat. -H mc ug(t)tan tan
Magnetically(E E1as1) onjugate Conducting
,sa.lo Resistive Wiretan RL Segment (3 segments)
Hscatl Hinc 0tan Htan
Comnplementary Aircraft Surface
Conjugate Lightning Channel Source
189
I 1 tM~ ~ II So' Id. nAI% t
Orgia Sufc nSt[ A -AE, f
no zeroed
I7drcl I
wire
finit Difrnefruaino/h CmlmnayArrf ufc
Giin t he ufer ce rwauoofteCmpetayAcaf Srfc
AttacimientChannel
.uruace tal taH 0
Resistiveen ChannelnCwphereuae/tnpeni C-- ea tr as It rs laO ifr Fnt tfee c psi;I
(YE190
,,sea, I "
PIN PREDICTIONS - SINGLE MULTILAYERED CABLE
m-
\ GNU
............ f hu~a.......
Moee nf aerW cableLModel of * cabim
USE F.D, TO FIND CURRENTS ALONG CABLE SHEATH,Ib
USE SURFACE TRANSFER IMPEDANCE, ZT AS DEFINED BY
SCHELKUNOFF, TO FIND THE INTERIOR CURRENTS: -*Ia(x) =J G1 (x,x') -ZT , Ib(x')dx'
WHERE Gil IS THE APPROPRIATE GREEN'S FUNCTION THAT
INCORPORATES THE CORRECT BOUNDARY CONDITIONS FOR
THE GEOMETRY AT HAND
EVALUATE la (x = L) TO FIND THE. CURRENT AT THE PIN
EVALUATE THE VOLTAGE ACROSS THE DEVICE CONNECTED TO THEPIN, Vd, USING THE PIN CURRENT AND THE DEVICE'S IMPEDENCE
Zd, I.E. Vd = Ia(X = L)Zd.
ONLY DIFFUSION THROUGH SHIELD CONSIDERED
191
A7 A114 117 FEDERAL AVIATION ADMINISTRATION TECHNICAL CENTER ATL-ETC F/6 1/3
COMPENDIUM OF LIGHTNING EFFECTS ON FUTURE AIRCRAFT ELECTRONIC-(TC(UI
UNCLASSIFIED DOT/FAA/CT-62/30I ~ EnnunEnunuuIlEEllEEllllEEE*EEEIIIIII
EXPECTED RESULTS-
* EXTERIOR RESPONSE -SIMILAR TO PERFECTLY CONDUCTINGA/C RESPONSES
*INTERIOR CABLE RESPONSE, WIRE EXTERIOR - WEAKLYDAMPED SINUSOID, SEE BELOW
PIN RESPONSE -SIMILAR TO WIRE EXTERIOR
Interior Geometry of Exoended Recion
10's .
ow i: __ _ _i.0 .es 10' :111110 100 200 300 400 107
T i m e ( n s )F r q . ( H Z )
Smol of reditedResults
192
SUMMARY
FEATURES
o Any fuselage exterior geometry can be modeled, including:
- composites
- conducting panels
- mix of composite and metal
o Various coupling pathways can be modeled, including:
- diffusion through composite panels
- seams around panels
- small apertures around doors/hatches/wheel wells, etc.
- large apertures such as windows
o Detailed interior geometries can be treated, including:
- individual wires with various terminations
- surrounding "fill"
- adjacent wires to within a cell size (-O.05m or -2" at best)
o Fast risetime (~30-5Ons) pulses can be easily incorporated
o Non-linear effects can be modeled
- attachment points can be selected based on experience, whiledetachment points can be selected based on fields exceedingpreset thresholds
- interior arcing can be modeled similarly
193
AREAS OF APPLICATION
0 Exterior I and V response predictions as a function of:
- position
- A C construction (metal or composite or mix)
- excitation source
- attachment/detachment location
o Interior Responses
- interior field levels
- wire currents
- transfer functions
o Hazard Assessment
- induced current damage
- field induced upset
- fuel ignition from arcing
o Protection Measures Evaluation
- field/charge and current penetration reduction(from covered seams, mesh across windows, etc.)
- arc suppression(from cable rerouting, interior geometry changes, etc.)
- protective device effects
1 (depends on "threat" spectrum, device location, deviceoperations, etc.)
INTERMITTENT/TRANSIENT FAULTS IN DIGITAL COMPUTERS
by
Dr. Gerald M. Masson
Johns Hopkins University
Need and objectives of digital system upset assessmentmethodology: The definition of upset. Description ofapproach being developed for assessing upset potentialof digital systems. Upset model types and importance ofburst error models; dominant importance of program transi-tion models. Definition and use of system state probabilitytransition matrix in upset analyses. Example of upsettolerant microcontroller.
195
EAULL ANALYSIS EAUL TOULERANC
* FAULTS * DUPLEX SYSTEMS
- PERMANENT - ROLLBACK
- INTERMITTENT * TMR SYSTEMS- TRANSIENT - ROLLAEAD
- I/T * DIAGNOSABLE SYSTEMS
* MODELS - INTELLIGENT UNITS
- STUCK-AT
* TESTS- DETECTION
- LOCATION
MICROPROCESSOR CONTROLLERS FAULTS IN MICROPROCESSORS
HARDWARE * CPU TESTING- CENTRAL PROCESSING UNIT (CPU) ' RECOVERY STRATEGIES
- READ-ONLY MEMORY (ROM) - DUPLICATION
- READ/WRITE MEMORY (RAM) - TMR
- INPUT/OUTPUT DEVICES (I/O) - WATCHDOG TIMER
- SUPPORT LOGIC
* SOFTWARE- LOOKUP TABLES- CHARACTERIZATION
I. INPUT SENSORS SCANNEDI. DATA PROCESSINGIII. CONTROL SIGNALS TO ACTUATORS
196
i
IWATCHIDOG TIMER
M ICROPROCESSOR
RESET T2T
INPUT
INPUT
x
RESET
INPUT
FIGURE 1. WATCHDOG TIMlER
197
I--
DAV~
HL
19
LIC.7
OPERATING INPUT CONTROL OUTPUT
ENVIRONMENT SYSTEM
!CONTROL
FIGURE 3. CONTROL SYSTEM SITUATED IN ITS ENVIRONMENT
EQUIVALENT
~FAULT
I'-- GENERATOR
FUNCTION
INPUT TRANSFORMP ER TURBATION INPUT
OPERATING INPUT EQUIVALENT OUTPT
ENVIRONMENT CONTROL SYSTEM
CONT ROL
FIGURE 4. CONTROL SYSTEM SITUATED IN EQUIVALENT HOSTILE ENVIRONMENT
199
FAULT/SYSTEM I NTERACTI ON
* CONTROL SYSTEM INTERACTS WITH ENVIRONMENT
* I NTERNI TTENT/TRANS IENT FAULTS- SYSTEM OTRANSIENT M RESPONSE- SYSTEM STEADY STATE* RESPONSE
[FAULT SOURCES
n FUN:TC)NNFPLIT RNF M
FAULT
LEVEL
FIGUR NM5. CONTROL SYSTEM STAE NHSL NIOMN
200
FAULTS. ERRORS. AND UPSETS
* FAILURES
- CIRCUIT LEVEL
- ANALOG NATURE
* FAULTS
- LOGICAL LEVEL
- DIGITAL NATURE
- LOGICAL DIFFERENCE AT FAULT SITE
F ERRORS- LOGICAL LEVEL
- DIGITAL NATURE
- DUE TO PROPAGATION OF FAULTS
- LOSS OF SYNCHRONIZATION PROBLEM
NEW DEFINITION
* UPSETS
- SYSTEM LEVEL
- FUNCTIONAL NATURE
- TRANSFER FUNCTION
CONTAINMENT SETS
* A FINITE SET OF MUTUALLY EXCLUSIVE FUNCTIONAL STATES
* COVERS ALL POSSIBLE SYSTEM TRANSFER FUNCTIONS
* INCLUDES
- VALID STATES- ERRONEOUS STATES
201
.=-. . ... ; :... .I .. . ./ --° - ' qb - . - , ' '" :..,,.T_ '. ,,,=. '
4-
CONTAINMENT SET TRANSITIONS
TRANSITION MATRIX:
T-1il ,WHERE Pjj IS THE PROBABILITY OF A TRANSITIONFROM STATE i TO STATE i ,GIVEN THAT AN ERROR HAS OCCURRED
[Po]
L (K+l) = T L (K) , L (K) PIiI
Pn'
p1 (K) IS THE PROBABILITY OF BEING IN CONTAINMENT STATELi £ (L) AFTER K UPSETS
AFTER K UPSETS,
L (K) = T KL (0)
FAULT ANALYSIS AND SYSTEM VALIDATION
*SINGLE UPSET ENVIRONMENT
-P 1 1 OF T[lP.] OF MAJOR CONCERN
*MULTIPLE UPSET ENVIRONMENT
-P 11OF TK FOR LARGE K OF MAJOR CONCERN
*EXAMPLE
= 15/16 T~= 78 1/8111/4 1/16 ,18 7/8
[1 T*K5/19 15/19] I (*) [1/2 1/2]
14/19 4/19 , - 1/2 1/2J
202
1/4
5/16
B) T*1/8
7/18
1/8
FIGURE 6. TWO 2-LOOP IMPLEMENTATIONS
FAUL TOLERANE
° CONTAINMENT SET AND TRANSITION MATRIX ANALYSIS PROVIDES FEEDBACKTO IMPROVE DESIGNS
" REMOVAL OF ERRONEOUS ELEMENTS FROM THE CONTAINMENT SET
AUTOMATICALLY PROVIDES FAULT TOLERANCE
203
CONTAINMENT SET FOR MICROPROCESSORS
° PROGRAM TYPES
- EXITING
- LOOPING
" TAKE THE CONTAINMENT SET TO CONSIST OF ALL POSSIBLE LOOP PROGRAMS
- INCLUDES VALID LOOPS
- INCLUDES ERRONEOUS LOOPS
GIVEN THE EXECUTION OF LOOP PROGRAM Li c {L) UPSETS CAN
BE CHARACTERIZED AS:
(1) DATA CHANGE --
DATA VALUES ARE MODIFIED, BUT EXECUTIONREMAINS IN Li
(2) PROGRAM BUMP --
EXECUTION TEMPORARILY DIVERGES FROM Li BUT
EVENTUALLY RETURNS TO Li
(3) PROGRAM TRANSITION --
EXECUTION JUMPS FROM L i TO L.A , L L
PROGRAM TRANSITION = STEADY STATE OPERATIONAL DEVIATIONTRANSITION INTO INVALID EMBEDDED LOOP = SYSTEM CRASH
204
hflRECONTENTS
NONtIAL EXECUTION N OP-CODE
ERRONEOUS EXECUTION N+1 DATA
NORMIAL EXECUTION N OP- CODEERRONEOUS EXECUTION N+1 DATA 0ERRONEOUS EXECUTION N+2 DMIA I
ERRONEOUS EXECUTION N DATA TABLEERRONEOUS EXECUTION N+1 DATA TABLE
FIGURE 7. ERRONEOUS LOOP INSTRUICTION EXECUTION
R~esult Addr Data LO Code Li Code L2 Code other
LO 0000 00 NOP
L; 00C9 00 OLO 0OCA 33 X->VI AOC3RLi WEd C3 -JMP 0D3HLO oocc D3 OUT 0Lo OOCD 00 N OPLO 00CR 22 LXI ROCFC3HL2 Od? C3 C -~3 PRLo GODO cvp I IMTLO ODI 00 POP IILO 00D2 32 STA OCDC3H SLi 00D3 C3 imp OdIN
4Lo GOD4 Ca RITYLo GODS 00 NOPLO 00D6 C3 imp OCABLO 00D7 CA 33 0LO GODS 00 POP
Lo 0009 00 POP
Lo 001 00uoLO 001? C7 RE? 0
Figure U. An Erroneous Loop Example for the 305
205
DATA BU .
MICROPROCESSOR ROM RAM 0
SELECT SELECTrLC
ADR5 ECODE DECODE DCOE
__ BUS
PROGRAM-PATH DJVERTERS
*HARDWARE *SOFTWARE
- CLOCK STOP - JUMP CATEGORY INSTRUCTIONS- HALT - CALL CATEGORY INSTRUCTIONS- READY - RETURN CATEGORY INSTRUCTIONS- HOLD (+ EFFECTS OF OUNDEFINEDv
2 - INTERRUPTS I NSTRUCTIONS)
SA PROGRAM STRUCTURAL ANALYSIS IS MADE BASED ON PATH DIVERTERS
206
9O4---
ULT T N O E DSI CALLE
-OTINOU w LC up
UN R 0 LouT OP ISTRUCTU EXS
(OP-CODE FETCH DETECTION)
u-i- - BAD FETCH DETE.CTORIL q'(ROM RESTRICT MECHANISM)
- OPTIONAL SAFE ROM
- REQUIRES 2-3 INTEGRATED CIRCUITS
207
- COTNUU CLC
-UNONDIIONL INTRUCIONEXECTIO(O-CDEFEC DTETIN
TOALE I
CRASH-PROOF SOFTWARE DESIGN RULES SUMARY
1. PROGRAM EXECUTION FROM RAM Is PROHIBITED.
2. EXIT FROM TEMPQRARY LOOPS MUST BE GUARANTEED.
3. STABLE LOOPS MUST INCLUDE A CALL TO A CHECK SUBROUTINE, WHICH GUARANTEES ALL
ASSUMPTIONS THE PROGRAM REQUIRES FOR CONTINUED EXECUTION. (THESE INCLUDE
ASSUMPTIONS ON 1/0, INTERRUPTS, AND VARIABLES.)
L. RETURN FROM ALL POSSIBLE INTERRUPTS MUST BE GUARANTEED.
5. SUBROUTINES CANNOT CALL THEMSELVES.
6. SUBROUTINES CANNOT MODIFY THE STACK POINTER OR THE RETURN ADDRESS.
7. WITHIN SUBROUTINES, MEMORY STORE INSTRUCTIONS WHICH PERMIT A VARIABLE STORE
ADDRESS MUST GUARANTEE THAT THE REGISTER USED AS THE ADDRESS POINTER CANNOT
POINT TO THE STACK SPACE.
8. INSTEAD OF USING RET OR RCR INSTRUCTIONS, A JIP OR JCN TO A SPECIAL RETURN
ROUTINE WHICH GUARANTEES THAT THE STACK POINTER POINTS WITHIN THE STACK SPACE
BEFORE RETURNING MUST BE USED. (THE RETURN ROUTINE CONTAINS THE ONLY RETINSTRUCTION IN THE ENTIRE PROGRAM.)
9. A STACK WALL MUST BE ADDED. (LEAVE UNUSED RIM SPACE AS 00 OR FF.)
10. THE PCHL INSTRUCTION CANNOT BE USED.
, 11. EITHER A SAFE ROMI MUST BE USED, OR ALL ERRONEOUS LOOPS AND ERRONEOUS CALLS
TO ADDRESSES WHICH, WHEN CONSIDERED TO BE SUBROUTINES, DO NOT SATISFY EITHER
RULE 5, 6, 7, OR 8 MUST BE REMOVED.
208
FAULT TOLERANT CONTROLLER TEST SYSTEM
" NOISY POWER SUPPLY TEST SOURCE
" DUAL LED CONTROLLERS
* UNMODIFIED SOFTWARE
- LED 1.1
- LED 4.6
° CRASH-PROOF SOFTWARE
- LED 2.2
- LED 3,3
- LED 3.4
- LED 5.2
- OVERHEAD
LED 2.2/LED 1.1 = 8.5 %LED 5.2/LED 4.6 = 14 Z
LED 3.3/LED 2.2 = 35 ZLED 3.3/LED 1.1 = 47 Z
SOFTWARE TOOLS
* DESIGN AIDS FOR FAULT TOLERANCE IMPLEMENTATION
" INTERACTIVE USE PROVIDES EFFECTIVE AND EFFICIENT DESIGN
- SAFE
- PRODUCES SAFE ROM CONTENTS FROM SOURCE CODE
S, - OUTPUT USED AS INPUT TO LOOP
LOOP
- LOCATES BANNED PROGRAM STRUCTURES
- LOCATES ERRONEOUS LOOPS
- PROVIDES CHECK ON INTENTIONAL LOOPS
209
LOOP ANALYSIS OP LED 1.1, FAGE I
P LE . .OBJLED.. 1 .*SAF'
ONLY VALID (Vv) OR ERRONEOUS CC*§') ? ELOOP: ERRONEOUSO0IBrD PSH PSWGOFC 00 HOPOPDg C3 r3 O0 JMP OFscar3 05 D(CR 800r4 CS RZ
LOP SEAEEH? NLST CALI O? YONLY VALID CVv) OR RRONEOUS CC,e') ELOOP: ERRONEOUS
036D PC 07 rB Cm r907 [1/0
LOOP: ERRONEOUS0395 rc OP PC CM FEOr [1/0]
LOOP SEARCH? NLIST CALLS? NLIST MEMORY STORES? YONLY VALID (V,v) OR ERRONEOUS (Et') ?VLOOP: VALIDDD6A 77 NOV MA
LOOP: VALIDOOAC 34 IN M
LOOP: VALIDDon3 36 o0 NVI M, 00
** MAIN ANID SWTCH SET DS ERRONEOUS **
% LOOP LEDI.I.OBJ LCDI.i.sArcLOOP SEARCH? YONLY VALID CV~v) OR ERRONEOUS (E.,r) ? VLOOP: VALIDO09D CD EB 01 CALL 0CE4OOAD OD DCR COOAI C? 9D 00 JNZ 009D
LOOP: VALID0OP3. 05 iCR I:OOD4 CS RZO'S Fa INX H006 7E MOV A*MOF7 P3 INX HOars F rO CPI PO
4 ODFA C2 F'5 O0 JN7 OOr5OarD C3 P3 00 JMP 00P3
LOOP: VALIDOOF5 23 INX HO0P6 7E MOV A,.OOr7 23 INX HOO' PC F'O CPI '0GOFA C2 F5 00 JNZ Or5
LOOP: VALID00F3 05 DCR 800P4 CS RZ0QF5 23 INX HOP6 7E MOY AM
210
im - " .84 I M40a ".4 4oC £090 1 S .a 0 060.0 0on 0 us.
* .4 '.1 toI *4 . 4
54 C Iwo 0UMJ. 04'
4i 0 0 49 041 0 405
0
.45 4
N0 inP an " 4
944OA
-21
C)
LLLU
C,,
C/) I--
F- W-
Lo 2
Pu-l C/)lLoLo9 CL)
F-1- CLJ Z .,
F- F- CI- - 0-
C)Cl D-" Li C)4lCe) Eb-" l M - C/)
C: LDL J - - LI CD /)0 L C) _j = C-) ) 0 5
C- LL C/l)C F- V) MC0) -2
I LLI I;:A -
212~
A MICROPROCESSOR-BASED UPSET TEST METHOD
by
Ms. Celeste M. Belcastro
Langley Research CenterNational Aeronautics and Space Administration
Description of a microprocessor-based upset testing
method employing transient waveforms randomly injectedinto a digital unit. Upset test data presented along
with preliminary observations.
213
OUTLINE
9 BACKGROUND
0 RESEARCH OBJECTIVES OF UPSET TESTING
S'UPSET TEST DESIGN CRITERIA
0 UPSET TEST HARDWARE IMPLEMENTATION
0 PRELIMINARY OBSERVATIONS
0 FUTURE PLANS
~t
o 0!
214
INDUICED FFFECTS.TESTING LEVELS
*SYSTEM AND SUBSYSTEM ASSESSMENT.-
CABLE EXCITATION
*CHANGING MAGNETIC FIELD IN A COUPLING TRANSFORMER
*TRANSVERSE ELECTROMAGNETIC WAVES GENERATED ONPARALLEL-PLATE TRANSMISS ION LINES
* INDIVIDUAL UNIT ASSESSMENT-
INTERFACE CIRCUIT INJECTION
*DIRECT APPLICATIOI OF TRANSIENT WAVEFORMS TO PIN CONNECTIONS,
RESEARCH OBJECTIVES
6 SHORT RANGE
*DEVELOP A METHODOLOGY TO TEST A DIGITAL
SYSTEM FOR UPSETS
.0 LONG RANGE
I CHARACTERIZE UPSET PHENOMENA
*DEVELOP DIGITAL FAULT SIGNATURES THAT
MODEL UPSETS
- DIAGNOSTIC EMULATION
- UPSET VULNERABILITY ASSESSMENT
215
UPSET TEST CRITERIA
* CHOOSE A CANDIDATE PROCESSOR/CONTROLLER
0 INJECT TRANSIENT SIGNALS RANDOMLY
0. ENHANCE SIMULATION
* AVOID SYNCHRONIZATION
0 IDENTIFY PROCESSOR'S INTERNAL STATE WHEN INJECTION OCCURS
*'DETERMINE IF UPSET .OCCURS INDEPENDENTLY
OF PROCESSING STATE
0 VARY THE TRANSIENT SIGNAL INJECTION POINT
* DETERMINE IF UPSET SUSCEPTIBILITY
IS UNIFORM THROUGHOUT THE
PROCESSING SYSTEM
0 OBTAIN BIT PATTERNS
* DEVELOP FAULT SIGNATURES
CANDIDATE PROCESSOR/CONTROLLER
INTEL pP UNIT-
ADDRESS BUS
DAABSOUTPUT krDAABS u DATA
COK0, 8080 F MEM~ORYF
CKTS, 0. CPU 6E-- R
INPUTT STATUSINPUTA WORDREADY mux TLINE.U
C014TROLFROM CPU
INPUT' DATA
216
PROGRAMMING-HI ERARCHY
PROGRAMMER
8080 INSTRUCTION SET(24i4 INSTRUCTIONS)
PROGRAM
OPERATION CODE (OP-CODE)
8080 PP
INSTRUCT ION CYCLES
MACHINE CYCLES (IDENTIFIED BY STATUS BITS)
STATES
CLOCK CYCLES (02)
MICROPROCESSOR MACHIINE CYCLES
TVPUE MACHINiE SIAIUJIMl M0JQL CLOCK--CYCLESCCLE S/i S. sa s! Sa 52 SI so
INSTRUCTION FETCH 1 0 1 0 0 0 1. 0 4~ (11MFMORY READ 1 0' 0 0 0 0 1 0 3MEMORY WRITE 0 0 0 0 0 0 0 0301%4STACK READ 1 0 0 0 0 1 1 0 3STACK WRITE 0 o a 0 0 1 0 0 3
jjINPUT 0 1 00 0 0 10 3
OUJir 0 0U 1 0 .0 u 03INIERRUPT 0 0 1 0 0 0 1 1 .5HALT 1 0 0 0 1 0 1 0 3xINTERRUPT WilI LE HALT 0 0 1 0 1 0 1 1 5
217
UPSET TEST CONFIGURATIQN
I TRASIENT IANSIENT f DIGITAL UNIIT
INJECTION sI C~. N - UNDER l~EOTlL SOUR1CE RA
COAROL LO C WE pP 11
TIME
TIMR I UPSET ERR
I DETECTOR ~
SI UNPERTURBEDTRANSIENT SIGNAL REIlENCE ___
INJECTOR/ECORDER ON I I"RA
imrEL Itp 02
~~ UPSET flFiECTOR/RECORDEll
TELETYPE 1/O
LIGHTNING INDUCED EFFECTS WAVEFORMVS
4 DAMPED SINUSOID
I DECAYING EXPONENTIAL
218
I1AMPFfl SINlISO!I1L WAVFFOBN
v
WAVEFORM FREQUENCY tr Ins) id
I I Mz 12202 SO max Ampli1tude decreases',2 10 M Izt 201% 5 max 25-S06 in 4 cycles
ta L
+ + R2C- tdvo C R
1 MIz 10 Mmz
R :68 11 R45L=196 Jim 13.5 IuN
C - 129 pF C -18.7 PF
WAVEFORM t1. (ns) td (115)3500 mlax 170 (Nt
4100 max 2 (!2tV'i
j~k + +1 td
td 170 ps i., 2 t IO.
R =1.0 YD R 1.13 VuC s0.0068 iF 1 4/0 i
219
PRELIMINARY OBSERVATIONS
0 UPSET HAS BEEN INDUCED AND OBSERVED IN THE LABORATORY
8 UPSET DOES NOT OCCUR AFTER EACH TRANSIENT SIGNAL INJECTION
-4 IMPLIES CORRELATION BETWEEN UPSET AND PROCESSIN(P STATE
* NORMAL FUNCTION IS RESTORED BY RESETTING AND/OR
REPROGRAMMING THE SYSTEM
Q STATUS BIT SEQUENCES HAVE BEEN RECORDED THAT DO NOT
CORRESPOND TO AN 8080 MACHINE CYCLE
IMPLIES UNDEFINED PROCESSING' STATES BEING ENTERED
FUTURE PLANS
a COMPLETE THE FOLLOWING UPSET TEST MATRIX
INI I VUL- WAV1,IOIIM0 I DlATA DOS1 INES1
11 ClIIIP
WAVrT OflM 2 AUDlIESS PITS2 IINIS
x xWAVI:~10,A 3 CONTRlOL I.INIIS
CPU n Cl WAVEFOAiM 4 110 LINES
* PERFORM A STATISTICAL ANALYSIS OF THE TIME
DATA TO RELATE UPSET TO
0 INTERNAL STATE OF THE CAN .DIDATE PROCESSOR
I TRANSIENT SIGNAL INJECTION POINT
* UTILIZE A SOFTWARE SIMULATION APPROACH TO DEVELOP
FAULT SIGNATURES FROM THE STATUS BYTE DATA
220
DIAGNOSTIC EMULATION ANALYSIS--NEED AND TECHNIQUE
by
Mr. Gerard E. Migneault
Langley Research CenterNational Aeronautics and Space Administration
A brief description of the problem of determining failuremodes will clarify the usefulness of emulation. The dis-
cussion will cover the relationship of complexity, defini-tional flaws, specific software dependent behavior andlumped parameter analytical models. Deterministic and
stochastic application possibilities of emulation will beidentified, as will implementation details - at thelevel of a conceptual scheme and in terms of supportingcomponents. A sample application will be described.Future possible directions will be identified.
221
~"~ 7 ~r -
CHARACTERISTICS OF FAULT TOLERANCE
e REDUNDANCY
0 ERROR DETECTION
o CONTINUED OPERATION
-- RECOVERY
see INCREASED COMPLEXITY
* SAFETY REQUIREMENT IMPLIES PROBABILITY OF SYSTEM FAILURE
IN 10-HOUR FLIGHT LESS THAN ABOUT 10-9
e FAULT INTOLERANT SYSTEM
WORST COMPONENT/DEVICE
MTTF -1010 HOURS
NOT FEASIBLE TODAY
* SYSTEM MUST TOLERATE FAULTS AND BE MAINTAINED
222
N NA C I N- (N-1) A C x 142 R
i-Cl 1-1 0
SYSTEM FAILURE
NSYSTEM MTTF - a-DEVICE MTTF- j
a out aK C 7 Ck
FAULT TOLERANT SYSTEM
10 DEVICE SYSTEM MTTF+
MTTF
223
MAINTAINED FAULT TOLERANT SYSTEM
2A
*MTTF aL.~ 3 A lt
MAINT A J
-10 10 HOURS 1t
* UrT - DEVICE MTTF
EPAIR No. OF DEVICES
*ECONOMICS - MULIFUNCTION DEVICES
o MORE COMLEXITY
TOLERANCE OF DEFINITIONAL FLAWS SOFTWARE PRIME CULPRIT
N h
4 1-k 1-kt
(SYSTEM FAILIRE SSE ALR
TOLERANCE OF DEFINITIONAL FLAWS
SOFTWARE PRIME CULPRIT
224
NA C1 (N- I)A C 2 CN..R I
I- I- C C
-k I1tk 1k
SYSTM FAILURE
H/U +S/W FAULT TOLERANT MODEL
*ANALYTICAL. SOLUTION TECHNIQUE
PROS FAIL = 1-. [Au(I-k)]t N-R
*BUT
0.g9gggg(C 1 s10.9999<C 2 51
o!uL(1-k) 0.0000000001
MTTR ARECOVERY
0.1 SEC
.1 SEC
120M -
1200
120-
0 12
0.2
0 0.1 1 10 10 2 10~ 3 10 10 6
I kEkIN.ATION DIGITAL SIMULATION
TEST DURATION FOR10FAULT INSERTIONS FOR200 0 GATE EQUIVALENTS CPUWITH ARITRARY MEMORYANm SOFT WARE
225
OBJECTIVE
DEVELOPMENT AND SPECIFICATION OF AN EMULATION TECHNIQUE FOR GENERATINGSTATISTICALLY SIGNIFICANT QUANTITIES OF FAILURE MODES EFFECTS DATA OFHIGHLY RELIABLE COMPUTER SYSTEMS
JUSTIFICATION
e IN HIGHLY RELIABLE, FAULT TOLERANT SYSTEMS SYSTEM FAILURE MODES DUETO DESIGN FLAWS BECOME SIGNIFICANT - PERI4APS DOMINANT
e CREDIBILITY OF'ANALYTICAL RELIABILITY MODELS IS DEPENDENT UPON AMOUNTOF DATA FROM WHICH INPUT PARAMETERS ARE- DERIVED
• HIGH RELIABILITY (10"9) OF SYSTEMS BEING ANALYZED PRECLUDES USE/LIFETIMETESTING OF ACTUAL SYSTEMS BECAUSE OF INORDINATELY LONG KTTF's
* NO OTHER MEANS IDENTIFIED TO ACQUIRE SUFFICIENT DATA FOR THE ABOVE.
TECHNICAL APPROACH
e DEVELOPMENT OF FAST EMULATION ALGORITHMS CAPABLE OF SUPPORTINGFAULT INSERTION
-GATE LOGIC LEVEL- HYBRID LEVELS
GATE/CHIP/REGISTER/INSTRUCTION COMBINATIONS
e IMPLEMENTATION OF ALGORITHMS IN A HORIZONTALLY MICROPROGRAMMABLECOMPUTER AS AN ALGORITHM TESTRED WITH OPERATIONS SYSTEMS
* DEVELOPMENT AND SPECIFICATION OF NEEDED SUPPORT CAPABILITIES
- META COMPILERS/ASSEMBLERS- DATA RECORDING CAPABILITIES- RUN TIME CONTROL FUNCTIONS- FAULT TABLE GENERATORS- H/W DESCRIPTION TRANSLATOR- ENVIRONMENT SIMULATOR/INTERFACING- DATA POST PROCESSORS- OPERATOR GRAPHICS
226
-.. /WPLOGIC AcR~I~.-.
GENERATORO
INU HOGIC OBJECT CODE - -OUTPUTGENERATOR OI
IL DIAGNOSTIC O0BSERVER :: - ', DIAGNOSTICS.
A 0 0 0 0 1 11n 0 0 1 0 1 v
x 0 0 0 11 vv VV I 1 0 0 VY
:Az vz
New PriorState State
CONCEPTUAL EM1ULATIONI SCHEME
227
T.* '
V00
b e
d
c d fe
v6
a bc d etfa y3'
a I1100 00 0 000 0
0 00 1 100 0 00 00
d~~ 0 0 0 0 0 1 1 0 0 0 0
0 000110 0 0 0
( 0 0 00 00 0 0101
SAMPLE LATENT FAULT ANALYSIS
.3
FAILURERATrIO .2 \
0 1 2
''FCRETCCESBFR4ROEUSDT EEAE
'228
DIAGNOSTIC EMULATION APPLICATIONS
DETERMINISTIC:
I HARDWARE LOGIC DESIGN ANALYSIS.
I SOFTWARE DESIGN ANALYSIS,
I SYSTEM (H/W & S/W) EFFICIENCY/MISMATCH ANALYSIS#
I H/W/S/W/SYSTEM FAILURE MODES & EFFECTS ANALYSIS
I SYSTEM PERFORMANCE ANALYSIS IN A SIMULATED MISSION
DIAGNOSTIC EMULATION APPLICATIONS
STATISTICAL:
I LATENT FAULT ANALYSIS AND MODELING,
I COVERAGE DETERMINATION AND MODELING.
I TRANSIENT FAULT ANALYSIS.
229
DIGITAL SYSTEM HARDWARE DESCRIPTION TECHNIQUE USED IN EMULATION
by
Mr. Robert M. Thomas, Jr.
Langley Research CenterNational Aeronautics and Space Administration
A technique to translate a digital circuit descriptioninto the form required to emulate the circuit at the gate
and flip-flop level is described. This technique, imple-mented as computer programs, takes as input a descriptionof the integrated circuit and translates the descriptioninto tables for the emulation. Integrated circuit descrip-
tion language is described.
23123u APm ILAwI4W F1U
EMUSLATOR
--. 7ASSEMBLER T
FAULT
iI
GENERATOR
-~ INPUT HIW OBETCD - UPTGENERATOR LOGIC OBETCD- 1,UPT
EMULATOR
D ANOSTICOBSERVER IDAGOTC
OUTLINE
e HARDWARE DESCRIPTION LANGUAGE
o TRANSLATION
* FAULT GENERATION AND INSERTION
232
HARDWARE DESCRIPTION LANGUAGE
SYSI I MA I I C k 111 S ,I OR, I XIISI -tNti I I ARIWAIKI 106 1{
IN A FORM USABLE BY THE TRANSLATOR.
SOURCE OF INFORMATION
SCHEMATI CS
- INTEGRATED CIRCUIT TYPES- INTERCONNECTIONS- NAMES OF EACH IC
INTEGRATED CIRCUIT DATA SHEETS
- GATE/FLIP-FLOP MODELS
HARDWARE DESCRIPTION LANGUAGE
LANGUAGE ELEMENTS
GATE TYPES: AND, OR, NOT, NAND, NOR, EXCLUSIVE OR,EXCLUSIVE NOR
FLIP-FLOP TYPES: D, J-K, R-S, T
INTEGRATED CIRCUIT. IDENTIFIERS: ALPHA-NUMERIC
INTEGRATED CIRCUITCONNECTIONS: PIN TO PIN
233
CHIP DESCRIPTION
$ CHIP DEFINITIONTYPEPOWERDESCRIPTIONUNUSED PINSFUNCTIONS
G-S=G-AG-R=C-CG-A'
G-B'
G-D 0=G-D )G-D 2=G-D 3=G-D 4=G-D 5C-D 6C-D 7=G-W (P-6) =
G-Y (P-5) =END CHIP
LATCHED PARALLEL TO SERIAL CONVERTER SCHEfMATIC
DATA LATCH +Sv +Sv
0 DO DO 2 ~)
PARALLEL 2 D2 Q2 6 2 )2 y -- ~ SERIAL DATA3 - 03 Q3 9 1)3
DATA L 4 04 Q41; )I
014D
6 523 D A
4 12DS Q
7I CLOCKU CD7 010 IC)D
7 4 1 .5 2 7 3~ G H -- 1 0
SIROA~C>L - AlE MODELno 2 k.
D2A-
G- 04
D7~E L VCC = -1, G~D =
~~~~~~~HPDESCRIPTION FO 74EO IH AA EETR LLILS151
UNUSED PINlS N IONEFUNICTIN
-3= IOT(P-7)G-Al AIND P-i 1)G-B =Alit'(P-I 0)G-C a AND(P-9)6-A' = l4OT (G-A)'
II" OTtGB..-6-C' = IIOT(G-C)3-DO - AIID(6-S. P-4v 6-A-' * -B', 6-C.)G-DI - AllD(6-S, P-3v G-Aq G-B'o 6-C:')G-D2 - FIND (G-S, P-2, G-A's 6-B, G-C-)G-D3 - RflD(G-So P-I, 6-A, 6-B, 6-C')G-D4 - AND(.G-Sp P-15o G-A-'q G-B'o G-C)G-D-. - AHD (GLSZ, P-14w G-A, G-B', 6-C)G-D6 - AID (G-S 9 P-13o G-A>, G-B, 6-C)G-D7 - AtID'6-Sq P-129 6-A' G-Bp G-C)G-IWhP-6) a NOR(G-DO6-rI,6-D~,6-D3,6-D4,G6-D5,G-D6,G-D7)6-'v(P-5) a 110T6-IJ)
S EflD CHIP S
235
INTEGRATED CIRCUIT NAME TABLE
NAMEICJTYPE
IC 1 74LS273IC 2 74LS151IC 3 74LS169
INTEGRATED CIRCUIT CONNECTION TABLE
OUTPUT DESTINATION SIGNAL NAME(OPT IONAL)
IC 1-2 IC 2-4
IC 1-5 IC 2-3IC 1-6 IC 2-2Ic 1-9 IC 2-15
IC 1-12 IC 2-14IC 1-15 IC 2-13
IC 1-16 IC 2-12
IC 1-19i IC 2-5 OUTPUT CONNECTOR SERIAL DATA
IC31 C21
IC 3-13 IC 2-11IC 3-13 IC 2-10
236
*iiijl * 114
TRANSLATION PROCESS
TRANSLATION PROCESS
CONVERT A PSEUDO ENGLISH CIRCUIT DESCRIPTION TO APACKED BINARY ENCODED FORM REQUIRED BY THE EMULATIONALGORITHM
REJECT DESCRIPTION THAT DOES NOT FOLLOW PRECISELYTHE HARDWARE DESCRIPTION LANGUAGE RULES
237
EMULATION MATRIX
SOURCE
6-S 6-A Gil 6-C G-A' (i-f' (i-C' G-DO
6-A
6-B
6-C
6-A' x
DESTINATION 6-B' x
6-C'
6-DO x x x x
A 0 0 0 0 1 11 VA
x 0 0 0 1 1vy1I 1 0 0 -
Z V
z
New Prior*State State
CONCEPTUAL EM1ULATIONl SCHEME
238
FAULT GENERATION AND INSERTION
FAULT SELECTION
- MANUAL - SELECTED BY EXPERIMENTER
- AUTOMATIC - RANDOMLY SELECTED
FAULT INSERTION
- MODIFY EMULATION MATRIX TO REFLECTFAULT
FAULT OCCURRENCE
- INFORMATION TO EMULATION ALGORITHM
AS TO WHEN FAULT OCCURS
SUMMARY
DEVELOPING THE TOOLS TO SUPPORT GATE/FLIP-FLOP LEVEL
EMULATION OF DIGITAL COMPUTERS
i'1 - HARDWARE DESCRIPTIOIN LANGUAGE.i
- TRANSLATOR PROGRAM
- PAULT GENERATOR PROGRAMS
239
THE NEED FOR TRANSIENT DATA IN A
CARE III RELIABILITY ANALYSIS
by
Mr. Salvatore J. Bavuso
Langley Research Center
National Aeronautics and Space Administration
The recently developed CARE III (Computer-Aided Reli-ability Estimation) computer program incorporates atransient/intermittent fault model that is mathematicallyaccurate in contrast to many existing reliability evaluatorprograms which employ approximations for the transient/intermittent model. The CARE III transient/intermittent
model will be discussed and compared to existing approxi-mating models. Computational complexity arising from theuse of the CARE III transient/intermittent model will alsobe addressed.
'1
241 -
P5,a-a u
ADVANCED RELIABILITY ASSESSMENT TECHNIQUES
OBJECTIVE: DEVELOP A CAPABILITY TO ASSESS THE RELIABILITY OF ANY
FAULT-TOLERANT COMPUTER-BASED SYSTEM, INCLUDING
EXECUTIVE SOFTWARE
Interprocessor bus
Triplex computer architecture.
31='l X2 X3 - X1 X? X3 +X 1 X2 13(TVO Out or three channels operational)
so *X 1 X2 X3 2.At(01w out of three(A.Udwimls 'hahulo3 operatloalj)
*operational) )-p A2 tS 2 'l K1 2 3
-I3A(l ya
r3 :R X1
(syten failure)
Markov state space model of triplex channel RCS.
242
P0 (t + At).- P0 (t) - 3AC I tP0(t - 3u(1 - C1 )htp0 (t)
Urn t + At) - P0 (t), . dO~t -Up (t)At-O A
dPa -WOP(t)dt
-~~t . 3.C P0(t) - 12.PI(t)
dt~~ * ~ 2 1(t) - ).P2 (t)
dP3 (t) - 3X(1 - CI)P0 (t) +2,(1 - C 2 ) 1 t . 2 z
where P0 Is the probability ot the System being In state SO, that is
P 0 = P(50) P1 W P(s1 P2 a P(S2 ) P3 -
and the initial conditions are
P0 (0) . 1 - P .. P(O) P3(C) a0
P0 (t) e x
P1 (t) - 3C,(e-2xt -3)
P2t.3C C fe-A - 2e-2.t + 0-t)
PP() 1 - [P(t) + P1 1L) +. P(t)]
243
310 /0/0 m P/rWr2i
3
52
LAT 3ACC
-0-MI01.2S1.25
NORM 3ACC /.25/.25
3
3 0 /. 2S/.MPXA/D 2713
DG*
r3 S/.l COUPLERCOMPASS 2401.25/.40
190/.25/.40 Com. 293
IS/_oj
0- MZFROCm 5o/.25/.40v moiy l ..........................
U01.05/. 10 93
130 1. ZS/. 4'
3
31J-57-D&-j 3 DADS 3 PITOT 3 VRAM 20 200 STATIC
- - - - - 8013 300 /. 2S/. 40
ROLL-32130/.05/.l
WATCH 3 x 3$ 3PITC 3SERVO 1301.051.1
12/.05/.Io 3I HYDR. Sl 3 YAW 34
SUPPLY 60/.05/.10 SERVO 130/.OSI.l
CWS- DELETE R/A AND ILS
-Akw- Term ARCS Dependency Tree
244
6-1
MIN""
4--
0 I ih
49
o 0o
zz
4245
NUPIER OF STATE NEEDEDFOR'A:MAR0OVMODEL
LET: n-NUMBER OF *'COUPLED" STAGES
k1 NUMBER OF POSSIBLE FAULT TYPES IN M~ STAGE
NUMBER OF POSSIBLE FAULT STATES/TYPE 'IN f T1 STAGE
mi NUMBER OF MODULE FAILURES THAT CAN BE TOLERATED
IN THE iTH STAGE
THEN NUMBER OF STSTEN STATES N IS
n i L + j-I
R.I., If n -4 and k 2, A 3, u,2 for all it N 614,656
n
CARE III N 2fR (m + 1) 162
CARE III APPROACH
* DEFINE SYSTEM STATE ONLY IN TERMS OF
NUMBER OF EXISTING FAULTS
* INDEPENDENTLY EVALUATE TRANSITION PARAMETERS
AS A FUtICTION OF DISTRIBTION OF POSSIBLE
* FAULT TYPES AqD STATES
0DETERMINE RELIABILITY USING KOLM'OGOROV'S
FORWARD DIFFERENTIAL EQUATIONS
* NUMBER OF STATES DRASTICALLY REDUCED;
TRANSITION RATES NECESSARILY TIME-DEPENDENT 8 1 v)
246
9'7
COMPUTER AIDED RELIABIITY E S1I MATI OW
(CARE I II I
NII -ANYHIGIA (N"I' 11"
FAISTING~/C cr UA ON.
SYIICARE 1 1II&
c±J PROGRAM
F~AULT TREE
V ,FAU FAULT HANDLING
HANDLING DATA IPT
AOIPRSONA 8ONITOING
I.INTERMITTENSE A TANSoENTS 1 CYBER 175
F 4ut HANDCLASS
:ELECTRONIC COMPUTER*HYDRAULIC*MECH ANI CAL
110- WSAGES NST~tS-2.N1.5,M-3.3. IRLPCD-4,RLPLOT-TSle0- IU~CAT tWCAT8oi.lJTVPd1.1I)-l.JTVP(1,2)-1.
140- SRTI14E FT.1S. ,SYSFLO-TCPLFLG-TSISO- SIM1 FALT-RE 7-1-8I160- 1 2 3 3179- 3 0 1 a.I115- SIM1 CRITICAL-FAULT PAIRS190- 1 1S 16 18Me1 10210- 9 1S 1M.-162a12834 5 6?7S910
23-1? 2 11 12 13 14 1S240-18 0 16 1?
Sys.FAILUR
16 SYSTEM FAILS IF STAGEFAILU. 1 OR 2 FAILS OR A
30i 1 5BSFO FALROCCURS.
COMPUTER BusIsSAE STAGE 1A ''
1 2 (DSAGSYSTEM TREE 2/10 2/5 A CRITICAL PAIR FAULT MODEL
1-10 11-16
CRITICAL PAIR FAULT TREE
247
PERMANENT, TRANSIENT/INTERMITTENT FAULT ANALOG
PERMANENT FAULT TRANSIENT/INTERMITTENT FAULT
LOGICAL FAULT MODEL S-A-1/S-A-O S-A-I/S-A-OAFTER FAULT ARRIVAL DETERMINISTIC: T F < T <STOCHASTIC T FOR DURATION OF
S-A-i AND S-A-OEXPONENTIAL: f (0 = ae -i
FAULT ARRIVAL MODEL WEIBULL: f(t) = w)xtff e-Atw
EXPONENTIAL: f(t) = xe-At
TRANSIENT AND PERMANENT FAULTSCONVENTIONAL MARKOV MODEL
2-UNIT SYSTEM
A= PERMANENT FAILURE RATE (ARRIVAL RATE)
AT = TRANSIENT RATE (ARRIVAL RATE)
1= PROPORTION OF TRANSIENTS THAT ARE MISTAKEN FOR PERM4ANENT FAILURES
I- (2Xp+ 1- 21TIA 1 x + 1 .xT )At
(2AT1)T)t(1 t.i
01F
248
C9 F
B E
Overall reliability model of two-unit system.
Aggregated reliability model for a two-unit system.
System states defined by number of failed nodulesof each type
* Transition rates determined by averaging overallfailure types and states
249
SINGLE-FAULT MODEL EQUATIONSVARIABLE
*(t) 3 - 0 trUOd(r FEEAR( IT)
ftP t -. rt~)+ 0 * (t-T) P (-r)dT- PAI(IT)
Pb (t) ( *t. + *k)brd 1 (T)
p~t e M *ap(T)d()e(t-T)dT + * (t-r)P eCT) d- PERR(IT)
PS (t) - e 0'(t)d(t) + 0 3 (t-t)p e(T) dr PEARCIT)
p.(t) - t Wr (t) + 0 ) *t-Tr)p-(r)dT PNEAR( IT)
,t
Pf(t) -(1-C) pe Ur) E t-r) dT PFLD( IT)
TA () 0 C Pe(T)C(t-T)( + ae 4 8 )C dT + pwCt) PSIA(IT)
BW 1T- Pe()(
250
oolib) Fau] t Moud!
02 p 1 (t)
A 11
IA 6 (t)
0 OD2
A
2
ADVANCED RELIABILITY ASSESSMENT DEVELOPMENT
ACCOMPLISHED 1981 1982 1983
DEVELOPED RELIABILITY CARE IIIASSESSMENT PROGRAM - A ENHANCEMENTBASIC TOOL FOR THE AUTO SENSITIV;COMPARATIVE ANALYSIS OF QUICK LOOK
DIFFERENT AVIONIC SYSTEMS. CARE IIIVALI DAT ION
APPLICABILITYo ARCHITECTURAL SOFTWARE
STRUCTURE4 FAULT TOLERANT- NUIIR Cl
M ECHANISMS CARE I I Io TRANSI ENT ANALYSIS
TOLERANT TECHNIQUEMECHANISMS
o FAILURE RATE W IERCEliDATA PUR HRETICA
a AVIONIC ICA
SUCCESS IDATIONCRITERIA
PEER REVIEW
251