Research ArticlePartially Coherent, Radially Polarized Beam withAnnular Apodization
C. Mariyal,1 P. Suresh,1 K. B. Rajesh,2 and T. V. S. Pillai3
1 Department of ECE, National College of Engineering, Tirunelveli, Tamilnadu 627007, India2Department of Physics, Chikkanna Government Arts College, Tirupur, Tamilnadu 641602, India3 Department of Physics, University College of Engineering, Nagercoil, Tamilnadu 629002, India
Correspondence should be addressed to P. Suresh; [email protected]
Received 30 August 2013; Accepted 29 October 2013; Published 19 January 2014
Academic Editors: B. Gu and D.-S. Seo
Copyright Β© 2014 C. Mariyal et al. This is an open access article distributed under the Creative Commons Attribution License,which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Based on the vectorial Debye theory, the tight focusing properties of partially coherent, radially polarized vortex beams areinvestigated in detail. In this paper, we propose to use an amplitudemodulated filter in combination with a highNA lens to generatelong focal depth in the focal region. Numerical results show that the generation of long focal depth of FWHM (22.08π) is achieved,which finds useful application in microscopy techniques such as particle acceleration, laser processing, optical micromanipulation,and beam shaping.
1. Introduction
In recent years, the partially coherent light under tight focus-ing finds huge applications such as optical communica-tion, optical sensors, optical data storage, optical manipu-lation, microscopy, material processing, microparticle trap-ping manipulation, and optical measuring instruments [1β8]. Recently, several groups have explored the propertiesof optical vortex formed in partially coherent light boththeoretically and experimentally. In 1998, Gori et al. con-structed partially coherent beams carefully to carry opticalvortex modes theoretically [9β11] and experimentally byBogatyryova et al. [12]. Richards and Wolf investigated thefocusing properties of incident linearly polarized beam bya high NA lens, based on vectorial diffraction theory [13].Nowadays, the cylindrical vector beam has attracted verymuch attention due to its unique properties under tightfocusing [14β18]. Recently, Youngworth and Brown reportedthat the tightly focused radially polarized beams producea tighter spot with a strong longitudinal component andthat azimuthally polarized beams produce a hollow lightspot [14]. The partially coherent light has universality in itscharacteristics, so it is important to investigate the radiallypolarized partially coherent beams [19, 20]. However, nodetailed studies were available on the tight focusing effect of
partially coherent beams on the high NA focusing objectivelens. Recently, Guo et al. [21] studied the tight focusing prop-erties of partially coherent radially polarized vortex beams.Most of these near field applications demand subwavelengthbeam with a large depth of focus (DOF) and high resolution.A lot of optical methods to improve the resolution limitand the depth of focus were extensively investigated usingamplitude apertures [22, 23], phase apertures [23], or theircombination [24, 25] in the last few years. In this paper,we investigate the tight focusing properties of amplitudemodulated radially polarized partially coherent vortex beamthat is tightly focused by a high NA lens based on the vectordiffraction theory. The numerical result shows that one cangenerate an optical needle in the focal region of an incidentbeam with amplitude modulated filter which is very muchuseful for optical micromanipulation applications.
2. Theory
We assume that the field amplitude in the source plane is aGaussian model with an optical vortex that can be expressedas [26]
π(π1, π2, 0) = π΄ (π
1, π2) exp [ππ (π
2β π1)] , (1)
Hindawi Publishing Corporatione Scientific World JournalVolume 2014, Article ID 160945, 5 pageshttp://dx.doi.org/10.1155/2014/160945
2 The Scientific World Journal
where
π΄ (π1, π2) = exp[β
(π2
1+ π2
2)
π2
0
] exp[β(π2
1β π2
2)
πΏ2
π
] , (2)
where πΏπis the source coherence length.
Under condition π = π sin π, where π is the focal lengthof the objective, the cross-spectral density of such a partiallycoherent vortex beam of the pupil can be expressed as
π΄ (π1, π2) = exp[β
π2(sin2π
1+ sin2π
2)
π2
0
]
Γ exp[βπ2(sin2π
1β sin2π
2)
πΏ2
π
] .
(3)
When a completely coherent radially polarized vortexbeam is focused through a high NA objective lens, the totalelectric field in the focal region can be expressed as [25β28]
πΈ (π, π, π§) = βππ+1πΈ0
[[[
[
πΈπ₯(π, π, π§)
πΈπ¦(π, π, π§)
πΈπ§(π, π, π§)
]]]
]
,
πΈ (π, π, π§) = βππ+1πΈ0
[[[
[
(π (πΌπ+1πππβ πΌπβ1πβππ))
(πΌπ+1πππ+ πΌπβ1πβππ)
(2πΌπ)
]]]
]
expπππ,
(4)
where π, π, and π§ are the cylindrical coordinates of anobservation point in the focal region, πΈ
0is a constant, and
π is the topological charge, where
πΌπ(π, π§) = β«
πΌ
0
π (π)βcos πsin2ππ½π(ππ sin π)
Γ exp (πππ§ cos π) ππ,(5a)
πΌπΒ±1
(π, π§) = β«
πΌ
0
π (π)βcos π sin π cos ππ½πΒ±1
(ππ sin π)
Γ exp (πππ§ cos π) ππ,(5b)
where π(π) is the pupil apodization function and π½πis the πth
order Bessel function of the first kind. Assuming that the fieldwave is monochromatic, the cross-spectral density matrix ofpartially coherent beams is given by [30]
πππ(π1, π2) = β¨πΈ
β
π(πΎ1, π1π§1) πΈπ(πΎ2, π2π§2)β© ,
where (π, π = π₯, π¦, π§) ,(6)
where πΈπ(πΎ1, π1, π§1) and πΈ
π(πΎ2, π2, π§2) denote the Cartesian
components of the electric field, the asterisk stands forthe complex conjugate, and the angle brackets represent anensemble average.
The explicit expressions of the diagonal elements of πππ
can be derived from (1) as follows:
ππ₯π₯(π1, ππ§, π§) = πΈ
2
0[πΌβ
π+1(π1, π§) πβππ1β πΌβ
πβ1(π1, π§) πππ1]
Γ [πΌπ+1
(π2, π§) πβππ2β πΌπβ1
(π2, π§) πππ2]
Γ exp [ππ (π2β π1)] ,
(7a)
ππ¦π¦(π1, ππ§, π§) = πΈ
2
0[πΌβ
π+1(π1, π§) πβππ1+ πΌβ
πβ1(π1, π§) πππ1]
Γ [πΌπ+1
(π2, π§) πππ2+ πΌπβ1
(π2, π§) πβππ2]
Γ exp [ππ (π2β π1)] ,
(7b)
ππ§π§(π1, ππ§, π§) = 4πΈ
2
0πΌβ
π(π1, π§) πΌπ(π2, π§) exp [ππ (π
2β π1)] ,
(7c)
πΌβ
π(π1, π§) πΌπ(π2, π§)
= β¬
πΌ
0
π΄ (π1, π2)βcos π
1cos π2sin π1sin π2π (π1) π (π2)
Γ π½π(ππ1sin π1) π½π(ππ2sin π2)
Γ exp [πππ§ (cos π2β cos π
1)] ππ1ππ2,
(8)
where
π (ππ) = {
sin π, π, π = π,
cos π, π, π = π Β± 1.(9)
The intensity distribution πΌ(π, π, π§) of the focal field in thefocal region is given by [30, 31]
πΌ (π, π, π§) = Trπ(π, π, π§)
= ππ₯π₯(π, π, π§) + π
π¦π¦(π, π, π§) + π
π§π§(π, π, π§) ,
(10)
where Tr denotes the trace of the electric cross-spectraldensity matrixπ(π
1, π2).
3. Result
In this paper, we describe a numerical study in the focalregion of incident, partially coherent, radially polarizedvortex beam based on vector diffraction theory that is tightlyfocused by a combination of proposed amplitude modulatedfilter and a high NA lens [13]. Without loss of validity andgenerality, it was supposed that NA = 0.95, π = 1, and πΈ
0=
1 for simplicity. To illustrate the axial intensity distributionand the associated focal depth, numerical calculations wereperformed. The numerical calculation is performed for thetopological charge π = 1; it can be seen that a rotationallysymmetric and tiny dark core with nonzero intensity issurrounded by a high-intensity ring in the focal plane.
The Scientific World Journal 3
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
β2 β1 0 1 2
x(π)
Figure 1: Two-dimensional intensity distribution of a partially coherent, radially polarized vortex beam for πΏπ= 0.1 cm,π
0= 1 cm,π = 1 cm,
π = 1, and πΌ = 70β.
β2
β1
0
1
2
z(π)
r(π)
β3
3
β4 β2 0 2 4
(a)
z(π)
β4 β2 0 2 4
4.8 π
1.0
(b)
Figure 2: Intensity distribution of the partially coherent radially polarized vortex beam of high NA lens for NA = 0.95, other parameters arethe same as in Figure 1.
Firstly, based on (10), the normalized two-dimensionalintensity distributions in focal region of the focused beamare investigated numerically and are illustrated in Figure 1 forπΏπ= 0.1 cm, πΌ = 70β, and it agreed with the result shown in
Figure 2(a) of [21]. It should be noted that the distance unitin all figures in this paper is π, where π is the wave number(π = 2π/π). Here, πΌ is the convergence semiangle of the lenssuch that πΌ = arcsin(NA/π), NA is the numerical aperture,and π is the index of refraction between the lens and thesample.
Figure 2 shows the normalized total electric field intensitydistribution in the focal region of high NA objective lensunder the illumination of partially coherent, radially polar-ized vortex beams forNA=0.95.The other parameters are thesame as in Figure 1. Figure 2(a) shows that three-dimensionaltotal electric field intensity distribution in the focal region ofincident beam generates a focal depth of FWHM (4.8 π) andthat its corresponding two-dimensional intensity distributionat π = 0 is shown in Figure 2(b). However, the focal depth ofthe incident beam is smaller in the focal region. To expand
4 The Scientific World Journal
z(π)
β6
β4
β2
0
2
4
6
β10 β5 0 5 10
r(π)
(a)
z(π)
1
0
22.08 π
β10 β5 0 5 10
(b)
Figure 3: Intensity distribution of the partially coherent, radially polarized vortex beam of high NA lens with amplitude modulated filter forNA = 0.95, other parameters are the same as in Figure 1.
the depth of focus in the focal region of incident, partiallycoherent, radially polarized vortex beams, we propose to usediffractive optical element (DOE).
In order to study the effect of DOE, we replaced π΄(π1, π2)
byπ΄0(π1, π2)π0(π1, π2), it is necessary to increase the concen-
tric rings of theDOE to increase the depth of focus in the focalregion. The intensity distribution of the modified DOE withsix concentric rings of the input beam can be calculated byrewriting the apodization function of (2) which is rewrittenas
π΄ (π1, π2) = π΄
0(π1, π2) π0(π1, π2) , (11)
where
π0(π1, π2) = {
0, 0 β€ π β€ πΏ1, πΏ2β€ π β€ πΏ
3, πΏ4β€ π β€ πΏ
5,
1, πΏ1β€ π β€ πΏ
2, πΏ3β€ π β€ πΏ
4, πΏ5β€ π β€ πΌ,
(12)
where
πΏπ= π πβ πΌ, where π = 1, 2, . . . , 5. (13)
We choose one structure with random values for πΏ1to πΏ5
from all possibilities and simulate their focusing propertiesby vector diffraction theory. If the structure generates asubwavelength long focal depth and satisfies the limitingconditions of side lobe intensity of less than 15%, it is chosenas the initial structure during the optimization procedures. Inthe following steps, we continue to vary π of one chosen zoneto generate a long focal depth on an optical axial electric fielduntil the value of the focal depth is not getting smaller or thefocusing properties are not satisfying the limiting condition.
The value of the newly chosen zone thickness is used in thenext step. Then, we randomly choose the other zone andrepeat these procedures to improve the uniformity of the on-axial intensity profilewithout affecting the limiting condition.We repeat these procedures and, as an example, the sets ofoptimized βπ β values to generate long focal depth in the focalsegment of the high NA objective lens are π
1= 0.09, π
2=
0.32, π 3= 0.71, π
4= 0.82, and π
5= 0.95.
With appropriate combinations of these adjustments (π π),
an optical needle (βlong focal depthβ) can be generated in thefocal region of high NA lens as it is shown in Figure 3.
Figure 3 shows the normalized total electric field inten-sity distribution in the focal region of high NA objectivelens under the illumination of partially coherent, radiallypolarized vortex beams for NA = 0.95. The other parametersare the same as in Figure 1. Figure 3(a) shows that three-dimensional total electric field intensity distribution in thefocal region of incident beam generates a focal depth ofFWHM(22.08π) and that its corresponding two-dimensionalintensity distribution at π = 0 is shown in Figure 3(b). Weobserved that the generated focal segment in the focal regionin combination with DOE of incident beam is 4.6 timesgreater which is suitable and has high resolution for the aboveapplications.
4. Conclusion
We have studied the tight focusing effect of incident, partiallycoherent, radially polarized beams in the focal field of highNA lens with DOE numerically. The Numerical results showthat the generation of long focal depth of FWHM (22.08π)is achieved in the focal region high NA lens in combination
The Scientific World Journal 5
with DOE, which finds useful application in microscopytechniques such as particle acceleration, laser processing,optical micromanipulation, and beam shaping.
Conflict of Interests
The authors declare that there is no conflict of interestsregarding the publication of this paper.
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