![Page 1: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/1.jpg)
Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films
Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. HuangElectrical and Computer EngineeringRutgers University
![Page 2: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/2.jpg)
Outline Motivation Multiferroics Hysteresis: The Enabling Property Ferroelectricity Bismuth Ferrite: Material of Choice Procedures Challenges Data Results Conclusion Acknowledgements
![Page 3: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/3.jpg)
Motivation
Storage limitations on existing memory devices as well asthe desire for faster write/erase capability on non-volatilememory devices has increased the demand for bettermaterials that accord with standard integrated circuitrequirements. [3]
[1] [2]
[1] http://imgs.tootoo.com/ff/29/ff290e10431d97b15c18ebd08e952f36.jpg[2] http://www.computerrepairmaintenance.com/images/flash-drive.png[3] Zambrano, Raffaele. “Applications and issues for ferroelectric NVMs.” Materials Science in Semiconductor Processing 5 (2003) 305-310.
![Page 4: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/4.jpg)
Multiferroic Materials Discovered less than a century ago,
ferroics relate to the ancient study of magnetism
Ferroic materials can be: Ferroelectric Ferromagnetic Ferroelastic
Multiferroics exhibit two or more of these properties simultaneously
![Page 5: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/5.jpg)
Hysteresis: The Enabling Property
Hysteresis: the ‘memory’a material retains of apreviously applied energy field
[4]
[4] http://www.daviddarling.info/images/hysteresis_loop.jpg
![Page 6: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/6.jpg)
Ferroelectricity
Ferroelectric materials possess a spontaneous, stable polarization that switches hysteretically in an applied electric field.
[5] http://www.fujitsu.com/img/MICRO/fme/microelectronics/fram/ferroelectric_material.jpg
[5]
![Page 7: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/7.jpg)
Ferroelectricity
Polarization characteristics change when subjected to varying Pressure Temperature Applied Voltage
These unique properties make the material useful for many different applications
![Page 8: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/8.jpg)
Bismuth Ferrite: Our Material of Choice BFO is multiferroic at room
temperature– a rarity among multiferroics
Has strong ferroelectric, but weak ferromagnetic properties
Crystalline structure, as well as polarization, alters in varying temperature
We hope to see how well BFO functions as a capacitor
Goal: document the changes in polarization that occur as the temperature changes
Fractal ferroelectric domains in thinfilms of multiferroic BiFeO3. [6]
[6] http://www.esc.cam.ac.uk/teaching/mineral-sciences/minsci-part-IA
![Page 9: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/9.jpg)
Procedure
The probe (left) controls temperature and pressure in the chamber housing the sample.Leakage current is plotted in the semiconductorprecision analyzer (above).
![Page 10: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/10.jpg)
Challenges The samples were not uniformly
dielectric; finding good contacts was difficult
Careful probing was necessary due to the properties of the material
Equipment broke down several times Redeposition of the contacts
appeared to influence the functionality of the devices
![Page 11: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/11.jpg)
Data: Varied Dielectric Behavior
Data is fromten contactson a single sampletaken at room temperature.
![Page 12: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/12.jpg)
Data: Polarization
Device becamemore resistive astemperature increased; this isevidenced by the shape of the curve.
Ideal Hysteresis
[4]
![Page 13: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/13.jpg)
Data: Remanent Polarization
Polarization showsan increasingtrend at highertemperatures; thisis not what is expected, and mayrelate to the increasing currentleakage.
![Page 14: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/14.jpg)
Data: Current Leakage
At increasingtemperatures,our device leaksmore current, asexpected.
The curved datapoints are representative of a dielectric; a linearslope would be apurely resistivedevice.
![Page 15: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/15.jpg)
Data: Remanent Current Leakage
As temperaturesincrease, we seean increasinglyleaky device. (All data was takenAt -1.5V.)
Current leakageis high at high temperatures(20nA/cm2
vs. 2.0E5 nA/cm2).
![Page 16: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/16.jpg)
Conclusion Dielectric behavior did not characterize the
behavior of this material There was non-uniformity in the samples
that DID exhibit capacitive polarization The contact deposition process may have
influenced functionality Dielectric behavior degraded at higher
temperatures, as expected
![Page 17: Temperature-Dependent Electrical Characterization of Multiferroic BFO Thin Films Danielle Hitchen, Sid Ghosh, K. Hassan, K. Banerjee, J. Huang Electrical](https://reader030.vdocuments.net/reader030/viewer/2022032709/56649eaa5503460f94baf093/html5/thumbnails/17.jpg)
AcknowledgementsI would like to thank the National Science Foundation and
the US Department of Defense for funding my research (EEC-NSF Grant # 0755115 and CMMI-NSF Grant # 1016002), as well as the University of Illinois at Chicago for hosting my undergraduate research program.
I would also like to express my thanks to the directors of my program, Professors Christos Takoudis and Greg Jursich, as well as to Professor Siddhartha Ghosh who advised me in my research.
Finally, thank you Koushik Banerjee, Jun Huang, Khaled Hassan and Hsu Bo for informing my research, assisting with the equipment, and providing me with necessary literature.