Chemistry and BioChemistry http://www.chem.ucsb.edu/

Mass Spectroscopy Facility http://www.chem.ucsb.edu/~massspec/Facility Manager: Dr. James Pavlovich (pavlovich@chem.ucsb.edu)

Instruments: VG70MagneticSector MicromassQTOF2Quadrupole/Time-of-FlightTandemmassspectrometer PESciexQStarquadrapole/time-of-flighttandemmassspec GC/MSinstruments

NMR Facilityhttp://www.chem.ucsb.edu/~nmr/FacilityManager:AtaShirazi(shirazi@chem.ucsb.edu)

Instruments: VarianUNITYINOVA500MHzNMRSpectrometer VarianUNITYINOVA400MHzNMRSpectrometer VarianMERCURYVx200MHzNMRSpectrometer

Optical Characterization Facilityhttp://www.chem.ucsb.edu/~ocf/FacilityManager:AlexanderMikhailovsky(mikhailovsky@chem.ucsb.edu)

Instruments:Laser SpectraphysicsTsunami BroadbandtunablefemtosecondTi:Sapphirelaser SpectraphysicsSpitfire ChirpedpulseTi:Sapphireamplifier SpectraphysicsMillenia-V Diodepumpedall-solidstatecontinuouswaveYAG:Ndlaser SpectraphysicsEvolution-X Diodepumpedall-solidstatepulsedYAG:Ndlaser SpectraphysicsBeamlock2060

Equipment Available for Industry Use:

Ar-ionCWlaser

Non-LinearCrystal

UsingsecondharmonicgenerationinBBOcrystals,outputofthefemtosecondlaserscanbeconvertedfromIRtoUV: 345-435nmusingoutputofTsunami(~200mWat400nm) 375-425nmusingoutputofSpitfire(~200mJ/pulseat400nm)

OutputofSpitfirecanbeusedforgenerationofthefemtosecondwhite-lightcontinuum 2nmcrystallinesapphireplatepumpedwith100fs,2mJpulsegenerateschirpedcontinuum coveringtherange430-700nm

ConventionalLightSources OceanOpticsLS-1tungstenlampwithnear-blackbodyemissionspectrum(colortemperature 3100K).

BeamDiagnosticsTools SingleShotPulseAutocorrelator Home-builtinstrumentformeasurementsoftheshapeoffemtosecondpulses OceanOpticsPortableSpectrometerUSB2000 Palm-sizeportablespectrometerwithUSBcomputerinterfaceforreal-timespectral analysis FGWSystemsIRViewer HandheldIRviewerforvisualizationofweakorinvisiblebeams. Newport1815-COpticalPowerMeter Generalpurposeopticalpowermeterwiththermoelectricsensor.

Photodetectors HamamatsuR928PhotomultiplierTube Highsensitivity/lownoiseanalogPMTformeasurementsofthelowintensitylight LargeareaUV-enhancedSiphotodiodes Large(diameter1cm)genericSiphotodiodeswithenhancedresponseinUVrange. Thebestchoiceforhighintensityandlowrepetitionratemeasurements. FastSiphotodiodeswithbuilt-inpreamplifiers FastpreamplifiedSi-photodiodesareavailablein100MHzand200MHzversions. Thesearetypicallyusedwithhighrepetitionratesystems.Spectrometers ActonResearchSP300ispectrometer Versatile,highlyautomatedgeneralpurposespectrometer ActonResearchSP500spectrometer

Versatile,highlyautomatedgeneralpurposespectrometer.Goodchoiceforsimple Ramanandfluorescencespectroscopyexperiments.

SignalProcessingInstrumentation StanfordResearchSystemsSR830DSPLock-inAmplifier DigitalSignalProcessor(DSP)basedlock-inamplifierforthephase-sensitivesignal detection.Ensuresoutstandingsignal/noiseratioinmeasurementsoflow-levelsignals. StanfordResearchSystemsSR570CurrentPreamplifier Low-noisecurrentpreamplifierforphotodetectors(PMT,photodiodes)withvariable sensitivity,bandwidth,andinputbiascurrent.

MiscellaneousEquipment NewportILS-200TranslationStage High-precisioncomputercontrolledlineartranslationstage. NewFocus5203OpticalChopper Mechanicalmodulatorforthelaserbeams.Itismostlyusedinthephasesensitive detection. JanisResearchInc.VPF-100LN2Cryostat ColdfingerliquidnitrogencryostatforopticalmeasurementswithPIDtemperature controller.

X-ray Analytical Facilityhttp://www.chem.ucsb.edu/~xray/FacilityManager:Dr.GuangWu(wu@chem.ucsb.edu)

Instruments:

SingleCrystalDiffraction PowderDiffraction

Chemical Engineering-PatrickDaughteryLab,psd@engr.ucsb.edu FluorescenceActivatedCellSorter(FACS)

Materials Research Laboratory (MRL)http://www.mrl.ucsb.edu/mrl/centralfacilities/index.html

TEMPO - Thermal, Electronic, Elemental, Magnetic, Porosity, and Optical Facilityhttp://www.mrl.ucsb.edu/mrl/centralfacilities/chemistry/index.htmlFacilityDirector:ProfessorRamSeshadri(seshadri@mrl.ucsb.edu)Facility Manager: Joe Doyle (jdoyle at mrl.ucsb.edu)

Instruments:

QuantumDesignPhysicalPropertiesMeasurementSystem(PPMS) QuantumDesignMPMS5XLSQUIDMagnetometer METTLERTGA/sDTA851eThermoGravimetricAnalyzerWithBlazersThermoStar300AMU MassSpectrometer BrukerD8Advance InductivelyCoupledPlasma(ICP)AtomicEmissionSpectrometer ShimadzuUV3600UV-Nir-NIRSpectrometer PerkinElmerLS55luminescencespectrometer MicromeriticsPorosimiters MicroMeriticsAccuPyc1330Pycnometer

Microscopy and Microanalysis Facilityhttp://www.mrl.ucsb.edu/mrl/centralfacilities/microscopy/index.htmlFacilityDirector:ProfessorJamesS.Speck(speck@mrl.ucsb.edu)FacilityManager: Dr.TomMates(mates@mrl.ucsb.edu) Dr.Jin-PingZhang(jpzhang@mrl.ucsb.edu) Dr.JanP.Lofvander(lofvander@engineering.ucsb.edu) MarkCornish(cornish@engineering.ucsb.edu)

Instruments: Transmissionelectronmicroscopes: FEITitanFEGHighResolutionTEM/STEMandAnalyticalMicroscope(ininstallation) FEITecnaiG2SpheraMicroscopeforLifeScienceStudies FEITecnaiG2SpheraMicroscopew/EDSforMaterialsScienceStudies(Coming) Scanningelectronmicroscopes: FEIXL40SirionFEGmicroscopew/EDSSystem FEIXL30SirionFEGmicroscope FEIInspectSSystemw/CLSystem(coming) Scanningprobemicroscopes(STM/AFM): DigitalInstrumentsMulti-modeNanoscope(2) DigitalInstrumentsDimension3000microscope DigitalInstrumentsDimension3100microscope AsylumMFP-3DSLSystem AsylumMFP-3DBioSystem SecondaryIonMassSpectrometrySystem: PhysicalElectronics6650Quadrupole X-rayPhotoelectronSpectroscopySystem: KratosAxisUltraw/UPSCapability FocusedIonBeamSystem: FEIFocusedIonBeam(ModelDB235DualBeam)w/EDSSystem InstrumentsforSamplepreparation:

Gatanprecisionionpolishingsystem(Model691)x2 Fischioneionpolishingsystem(Model1010) AlliedMultiPreppolishingmachine(Model15-1000) Gatandimplegrinder(Model650) ImageProcessingtools: MicrotekScanMakeri900(6400x3200DPI)Scanner EpsonV700DualLensScannerforfilm/imagedigitization Electronmicroscopysimulation: SoftwareforScanningElectronMicroscopy(SEM) SoftwareforTransmissionElectronMicroscopy(TEM)

Polymer Characterization Facilityhttp://www.mrl.ucsb.edu/mrl/centralfacilities/polymer/index.htmlFacilityDirector:ProfessorCraigHawker(hawker@mrl.ucsb.edu)FacilityManager:Dr.KrystynaR.Brzezinska(kbrzez@mrl.ucsb.edu)

Instruments: Circulardichroism(CD) DifferentialScanningColorimetry(DSC) LightScattering(DLSandSLS) DynamicMechanicalAnalyzer(DMA) GPCusingDMFasasolvent GPCusingTHFasasolvent HPLCHighPerformanceLiquidChromatography MicrowaveReactor ModulatedDifferentialScanningCalorimeter(MDSC)Q2000 PreparativeGPC RheometerI(withwaterbath) RheometerII(withoven) WyattGPCwithMALS Spectroscopy Facilityhttp://www.mrl.ucsb.edu/mrl/centralfacilities/spectroscopy/index.htmlFacilityDirector:ProfessorSong-IHan(songi@chem.ucsb.edu)FacilityManager:Dr.JerryHu(jghu@mrl.ucsb.edu) Instruments: NicoletMagna850IR/Raman VarianCaryEclipseFluorimeter BrukerDPX200SBNMRforsolution BrukerDSX300WBNMRforsolids BrukerDMX500SBNMRforsolution

BrukerIPSO500WBNMRforsolids BrukerEMXPlusEPRSpectrometer

X-ray Facilityhttp://www.mrl.ucsb.edu/mrl/centralfacilities/xray/index.htmlFacilityDirector:ProfessorCryusR.Safinya(safinya@mrl.ucsb.eduFacilityManager:Dr.YouliLi(youli@mrl.ucsb.edu)

Instruments: PhilipsXPERTPowderDiffractometer BrukerD8AdvancePowerDiffractometer PanalyticalMRDPROThinFilmDiffractometer(I) PanalyticalMRDPROThinFilmDiffractometer(II) SmallAngleX-raySpectrometer(SAXS) IntermediateSAXS(2-Circle) WideAngleX-ray(4-circle) AncillaryEquipment ConfocalMicroscope

Micro-Environmental Imaging & Analysis FacilityDonaldBrenSchoolofEnvironmentalScience&ManagementContact:meiaf@bren.ucsb.eduor(805)893-5892

Instrument:ThecoretechnologyisanFEICo.XL30ESEMwithafieldemissiongun(FEG).TheESEMdetectorsincludeapatentedgaseoussecondaryelectrondetector(GSED),asolid-statebackscatteredelectrondetector(BSED),andalargefielddetector(LFD).TheESEMcanbeusedasaconventionalSEM(highvacuummode)orasanenvironmentalSEM(wetmode,i.e.moderatevacuumandmoistatmosphere).

National Nanotechnology Infrastructure Network (NNIN)http://www.nanotech.ucsb.edu/ Contact:JackWhaley(whaley@ece.ucsb.edu)ContactBrianThibeault(thibeault@ece.ucsb.edu)

Instruments:Lithography High-resolution,directwriteElectronBeamLithographySystem NanonexNX2000NanoimprintingSystem DeepUVFloodExposer MaskAligner/MJB3UV400IRwithback-sidealignment

MaskAligner/MJB3UV400 GCAAutoStep200i-linewaferstepper GCA6300i-LineWaferStepper Karl-SussMA-BA-6Mask/BondAlignerwithbacksideoptics VeecoDimension3100NanomanAFM-basedLithographytool FEISirionfield-emissionSEMwithNabityPatternGeneratorySystem 250nmPitchInterferenceLithographySystem

VacuumDeposition E-beam#1:SharonVacuum4-pocketElectronBeamEvaporator(metals) E-Beam#2Electron-BeamEvaporationSystem E-Beam#3LoadLockedMetalEvaporatorDualGun(8sources) E-Beam#4CHAMuti-WaferMetalEvaporator PECVDPlasmaTherm790forOxidesandNitrides UnaxisHighDensityPECVD SputteredFilmsDC/ACbipolar3-chamberReactiveSputteringSystem 3-sourceSolderEvaporator,VeecoVE-300 3-sourceresearchS-gunDC/PulsedDCReactiveSputteringSystem NRC31173-sourceThermalEvaporator VeecoNexusIonBeamDepositionTool 6-sourceDC/RFmagnetronsputtersystem

Etching RIE#1Custom,LoadlockedChlorine-BasedSystem RIE#2Methane/Hydrogen-BasedSystem RIE#3Fluorine-BasedSystemMRC51 RIE#5Programmable,LoadlockedChlorine-BasedSystem SiRIEICPBasedFlourineEtcherforBoschMEMSProcesses TechnicsPEIIPlasmaEtchingSystems ICP#2PanasonicInductivelyCoupledPlasmaEtcher-Fluorine/Chlorine ICP#3UnaxisICPetchingsystemwith200Cchuck-Chlorine ICP#4PanasonicInductivelyCoupledPlasmaEtcher-Fluorine/Chlorine EVGPlasmaActivationSystem

TestandInspection FEISirionUltraHighResolutionField-EmissionSEMw/EDX VeecoDimension3100NanomanAFM Hitachis2400ScanningElectronMicroscope VeecoMultimodeScanningProbeMicroscope VariousOpticalInspectionMicroscopes(5) RudolphAuto-ELEllipsometer FilmetricsWhiteLightReflectionDielectricCharacterizationtool

Nanometrics210Reflectometer DektakIIAProfilometer ProbeStationwithCurveTracer TencorFlexus2320FilmStressMeasurementSystem DektakVIProfilometer

ThermalProcessing M-8AFlipChipAlignerBonder Karl-SussSB-6WaferBonder AETmodelRXRapidThermalAnnealer CustomMadeStripAnnealer WaferFusionAnnealer

Neuroscience Research Institutehttp://www.nri.ucsb.edu/index.html

Microscopy FacilityContact:BrianMatsumoto(matsumot@lifesci.ucsb.edu)

Instruments: Basic Light Microscopy Twouprightmicroscopesequippedforhigh-resolutionfluorescenceanddigitalrecordingofthe images(OlympusBX51,BX60withMacroFirecamera). Oneuprightmicroscopeequippedwithoilimmersiondarkfielddarkfieldcondenserandlow lightdigitalimagingcamera(BX51withQimagingcamera). OneStereomicroscopewithphotoportsforimagingspecimensinthree-dimensions(Olympus SZXZwithMicroFirecamera). Oneinvertedmicroscopeequippedwithlongworkingdistancephaseobjectivesand epifluorescentilluminator.ThismicroscopeisusedforlookingatculturedsamplesPetridishes ormulti-wellplates.

ConfocalMicroscopy Therearetwoconfocalmicroscopes,apoint-scanninglaserbasedsystemforthehighest verticalandlateralresolution(OlympusFluoview500)andaspinningdiscconfocalmicroscope (OlympusDSU)forlivecellrecordings.

ElectronMicroscopy ThefacilityhasaJEOL123transmissionelectronmicroscopeforimagingspecimensthat requireresolvingstructuresthatareseparatedbyonlyananometer. SOLiDDNASequencer