european space agency - comparative tests on electronic...
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vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
Thermal cycling tests on Electronic TechnologiesThermal cycling tests on Electronic Technologies
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Comparative tests on Electronic Technologies Comparative tests on Electronic Technologies to be compatible with thermal cycling over to be compatible with thermal cycling over
extreme temperature rangeextreme temperature range
Dr. Sabine [email protected] Hoerner & Sulger GmbHSchlossplatz 8, D-68723 Schwetzingen
11th ESA Workshop on Advanced Space Technologies for Robotics and Automation
ASTRA 2011
Co-authors: Nghiem Bao Duy Nguyen, Uwe Dose, Dr. Chris Gee-Yin Lee, and Dr. Josef Dalcolmo
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
Thermal cycling tests on Electronic TechnologiesThermal cycling tests on Electronic Technologies
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Presentation OutlinePresentation Outline
Introduction
Test objectives
Test items
Overall test flow
Test results
Conclusion
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
Thermal cycling tests on Electronic TechnologiesThermal cycling tests on Electronic Technologies
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ExoMarsExoMars BogieBogie Motor Controller (BMC)Motor Controller (BMC)
Basic requirements– BMC outside of thermally
controlled warm body– Electronics subject to extreme
non-operational temperatures for ~ 180 temperature cycles
– Operational range: -50°C to +40°C
– Non-operational range:-125°C to +40°C
– PP Sterilisation: 125°C
Qualification (test) temperature must exceed op & non-op limits by 10K
Non-redundant BMC consists of one controller and one power board
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Test objectivesTest objectives
Testing PCB-component level NOT the components themselves
5 populated boards – Four different configuration of
materials– One additional test item for
vibration test of ceramic substrate
Same schematic design, same layout as far as possible
Component types/packages representative of FM unit
Different track/via/pad geometries
Tested simultaneously
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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PCB materialsPCB materials
Thickfilm Hybrid PCBs– Matching CTE, good thermal conductivity– Required dimensions/configuration not space qualified
Polyimide board– High thermal resistance, CTE higher than ceramic – Fully space qualified
Solder– Indium-alloy solder remains ductile at low temperatures– Not space qualified
Parylene C Coating– Parylene is not ESA qualified Space applications MIL-I-46058C– Coating thickness with 1-20µm
Rigid-flex PCB– Light and compact solution– I/F to Ceramic boards
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Test itemsTest items
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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TestboardTestboard layoutlayout
Ceramic test items Polyimide Test item
Flexboard with Wirebonds
Printed resistors
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Overall test flowOverall test flow
1. Design of test items.
2. Manufacture/Population of test items.
3. Application of Parylene Coating.
4. Empty board tests.Application of Parylene Coating.Simulation of Dry Heat Microbial Reduction.Thermal cycling tests.
5. Simulation of Dry Heat Microbial Reduction.
6. Vibration test before thermal cycling.
7. Thermal cycling tests.
8. Vibration after thermal tests.
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Test results of empty board cyclingTest results of empty board cycling
Application of DHMR process– 3 periods of 6h at 125°C
Visual inspection: All fine
10 thermal cycles with same test procedure as for populated boards
– Starting from ambient temperature– Heating to +50°C– Cooling to –135°C– Heating to ambient temperature
Visual inspection: Small patches of coating de-lamination on ceramic board
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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DHMR and Vibration Test resultsDHMR and Vibration Test results
Populated items use same DHMR simulation process as empty boards
The visual inspection did not reveal any change of board or coating properties.
DHMR simulation had no effect on functionality of test items
Ceramic boards withstand vibration test
Approval of Mounting method for ceramic boards
All five test items fully functional after test
No visual effect of vibration
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Thermal cycling test resultsThermal cycling test results
Three major failure types:Failures on transformer solder joints on ceramic boards, caused by glueing method.Loose solder pads on ceramic boards with indium solder.Loose Parylene C coating on all test items.
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Failure type 1Failure type 1
Failure of transformers on ceramic boards likely caused by glueinglocation, allowing tilt movement.Vibration may have damaged the solder joints.
Glue on Polyimide substrate Glue on Ceramic substrate
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Failure type 2Failure type 2
Pads on indium solder ceramic board come off.Effect increased with additional hand soldering process.Indium ceramic boards have different layer material configuration than tin-lead solder boards.Gold pad with indium solder delaminates easily from track layers below.
MOSFET pads on ceramic board Thermistor pads
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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Failure type 3Failure type 3
Parylene C does not stick well to ceramic / glassivated surfaces.Parylene C is tested to survive temperatures down –160°C. Upper limit is given between 125°C and 220°C.Higher temperature and oxygen atmosphere shorten use life of Parylene C.
Backside of ceramicboard
Coating around MOSEFTson ceramic boards
Coating on polyimide item
vH&S, Apr. 2011 ASTRA 2011, 12-14 Apr. 2011
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ConclusionsConclusions
Test provided various information on considered technologies– Polyimide board shows the best results with no broken solder joint.– Ceramic with tin-lead solder performed well few broken solder joints. – Ceramic with Indium solder most failures mainly lift-off of solder pads.
Test results do show a clear difference BUT none of the technologies can be clearly favoured/completely discarded
Three main error types– Gluing method of transformers Apply same gluing method as for
Polyimide board– Ceramic boards with indium solder Review material combination– Parylene C Alternative coating/ reviewing DHMR process
Limited number of samples no statistical conclusion
Further tests required