firb microsistemi e nanomateriali magnetici tematica t4 films e multistrati nanocompositi magnetici...
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FIRB “Microsistemi e Nanomateriali Magnetici”Tematica T4 “Films e Multistrati”
Nanocompositi Magnetici MultistratoLaboratorio “Superfici”
M. Carbucicchio, M. Rateo, M. Prezioso, F. Zini Dipartimento di Fisica – Università di Parma
Steve BennettDepartment of Synchrotron RadiationDaresbury LaboratoryWarrington, UK
Frank J. BerryDepartment of ChemistryThe Open UniversityMilton Keyness, UK
Michel LabruneLaboratoire PMTM-CNRSUniversité Paris-13Villetaneuse, France
Collaborazioni:
G. Asti, M. Ghidini, M. SolziLaboratorio “Magnetometria”Dip. Fisica, Università, Parma
A. Paoluzi, G. TurilliLaboratorio IMEMCNR, Parma
Ultra-High Vacuum Growth by Electron Beams
Vacuum: Starting10-8 Pa Operating 10-6 PaDeposition Rate: 0.5 ÷ 0.8 nm/minSubstrates:Amorphous Quartz
Si(100), Si(111) no native oxide removal
Characterization:
Auger Electron SpectroscopyLayer Thickness, Very Low Contamination
Grazing Incidence X-Ray Diffraction (SRS Daresbury, UK)Crystallographic Structure, Textures, Grain Sizes
Grazing Incidence X-Ray Reflection (SRS Daresbury, UK)Thickness, Density, Interface Roughness
Atomic Force MicroscopyMorphology of Surfaces
Transmission Electron Microscopy (Erlangen, DE)Morphology of Multilayers and Interfaces
Conversion Electron Mössbauer SpectroscopyComposition and Dimensions of InterfacesDirection of Magnetization
Magnetic Force MicroscopyMagnetic Domains
1. Model System
Co/Fe + Co Multilayers Co: 5.0 ÷ 15.0 nmFe 0.5 ÷ 45.0 nm
2. RE-TM Systems
Co/NdFeB/Co + Mo Nd2Fe14B arc evaporated5[SmCo/Fe] + SmCo + Au SmCo5 arc evaporated
3[SmCo/Co] SmCo5 from 10[Sm0.3/Co0.5]Co/SmCo5/Co SmCo5 co-evaporated
Materials:
In-plane AGFM Hysteresis Loops (IMEM)
Interaction-based deviation parameter
MR = saturation remanenceIIRM(H) = isothermal remanenceIDCD(H) = dc demagnetization remanence
M > 0 positive exchange coupling(ferromagnetic interaction)
Model System: simple materials soft/hard ratio = 3
Depth (nm)
0 1 2 3 4 5 6 7 8 9 10 11 12
Co
Con
cent
rati
on %
0
20
40
60
80
100
120
Fe C
once
ntra
tion
%
0
20
40
60
80
100
120
Co CoFe
Pure IronInterfaces
Hhf distribution:- main peak (35 T)
narrow linewidth similar sublattices sharp Fe concentration gradient
- small peak (32 T)broad linewidth a few Fe into Co
Interface Analysis: CEMS
Applied Magnetic Field (Oe)
-100 -50 0 50 100
Mag
neti
zati
on (
emu)
-1e-3
-5e-4
0
5e-4
1e-3
For Fe layer thickness up to 24 nmStrong Uniaxial Magnetic Anisotropy
Hard Axis Low Hysteresis (Mr/Ms 0)Easy Axis High Squareness (Mr/Ms 1)
Remanence ratio Mr/Ms vs the in-plane applied magnetic field angle
180° periodicity with |sin| behaviourAnisotropy constant K1 (1.77 7.63) 104 erg/cm3
Co5nm/Fe2nm
Magnetic Anisotropy
AGFM Hysteresis Loops (IMEM)
Fe layer thickness:< 5 nm in-plane magnetization 5 24 nm out-of-plane ~10° > 24 nm out-of-plane ~40°
Fe layer thickness (nm)
0 5 10 15 20 25 30
out-
of-p
lane
ang
le
(deg
)
0
10
20
30
40
No stray fields Stretched domains Stripe domains
CEMS MFM
First Endeavors: RE-TM Hard Layer
AGFM Hysteresis Loop (IMEM)
Problems: - Uncoupled Phases- Low Coercive Field- Composition
Co/NdFeB/Co
H (Oe)
-100 -80 -60 -40 -20 0 20 40 60 80 100
M (
emu/
g)
-60
-40
-20
0
20
40
60
Single Phase Magnetic Behaviour
AGFM Hysteresis Loop (IMEM)
H (Oe)-1000 -500 0 500 1000
M/M
s
-1.0
-0.5
0.0
0.5
1.05[SmCo/Fe]+SmCo+Au
Problems: - Stoichiometry- Reproducibility- Interdiffusion (GIXRR, CEMS)
CEMS for 5[SmCo/Fe] + SmCo + Au
AGFM Hysteresis Loop (IMEM)
Synchrotron Radiation GIXRD Pattern
Single Phase Magnetic BehaviourLow Coercive Field: NanostructurationSmCo5 Stoichiometry
Co/SmCo5/Co co-evaporated
H (Oe)
-400 -200 0 200 400
M/M
s
-1.0
-0.5
0.0
0.5
1.0
Co/SmCo5/Co co-evaporated
2 Angle (deg)
20 30 40 50 60 70 80 90
Cou
nt r
ate
(cps
)
0
500
1000
1500
2000
Future Activities
TEM and HEED Analyses both in plane and in cross-section
- Morphology, Defectivity - Continuity, Thickness of layers- Grain Sizes, Crystallographic textures - Phase Composition Mapping - Roughness, Interdiffusion, Dimensions of Interfaces
Synchrotron Radiation GIXRD
- Phase Composition - Grain Size, Textures- Kind and Intensities of Stresses- Depth-profiling: different X-ray incidence angles
Ultra-High Vacuum Electron Beam Deposition of
- RE-TM Films with High Coercive Fields- RE-TM/Fe Bilayers and Multilayers
AFM and MFM observations- Morphology - Magnetic Domains
CEMS- Composition and Dimensions of Interfaces- Direction of Magnetization