geometry, polarization and absorption corrections · 2018-11-09 · geometry, polarization and...
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Geometry, Polarization and Absorption Corrections for Two-dimensional X-ray Diffraction
Bob He Bruker AXS, Inc.
23.02.2010Bruker Confidential1
This document was presented at PPXRD -Pharmaceutical Powder X-ray Diffraction Symposium
Sponsored by The International Centre for Diffraction Data
This presentation is provided by the International Centre for Diffraction Data in cooperation with the authors and presenters of the PPXRD symposia for the express purpose of educating the scientific community.
All copyrights for the presentation are retained by the original authors.
The ICDD has received permission from the authors to post this material on our website and make the material available for viewing. Usage is restricted for the purposes of education and scientific research.
ICDD Website - www.icdd.comPPXRD Website – www.icdd.com/ppxrd
XRD2: What do we know about two-dimensional XRD?
Most recognized features of XRD2 for pharmaceutical: High speed: 102 higher than XRD with a point detectorHigh speed: 10 higher than XRD with a point detectorReliable info: Integration in γ (ring) directionMicro scale sample: Point beam and 2D patternp p
Most concerns with XRD2:R l i d d f iResolution and geometry defocusingRelative intensity is different from Bragg-BrentanoHigher instrument cost (but much higher productivity)Higher instrument cost (but much higher productivity)
This presentation interprets the differences and s p ese tat o te p ets t e d e e ces a dsuggests the best use of XRD2 systems
X-ray Applications for typical pharmaceutical samplesyp p p
XRD & XRD2 Single Crystal
Several Grains Powder Finished
Product Solutions
Qualitative Phase ID Ф⊕ Ф⊕ Ф Ф ФQualitative Phase ID Ф⊕ Ф⊕ Ф Ф ФQuantitative RietveldanalysisQuantitative analysis with standards
X-ray movie, Non-Ambient Ф Ф Ф Ф Ф
Structure solution, Indexing Ф
Microdiffraction/ Mapping Ф⊕ Ф⊕ Ф⊕/ pp g
Shape analysis Ф Ф ФHTS Ф⊕ Ф⊕ Ф⊕
Grain-Size det. Ф Ф
%Crystallinity Ф⊕ Ф⊕ Ф⊕ Ф⊕
- can be performed by either XRD or XRD2
Ф – better with XRD2
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Ф better with XRD⊕ - accept performance and accurate results only with XRD2
Bragg-Brentano-GeometryBragg Brentano GeometryAdvantages
Mono-
Resolution
Less expensive
Divergence slit Antiscatterslit
Monochromator
Disadvantages
⌧Detector-slitTube
Sample
⌧ Requires flat sample surface
⌧ Requires bulky p ⌧ Requires bulky powder sample
⌧ Slow
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Soller slits are used to control axial divergenceg
l fl l
Most part of the diffraction ring is
clipped off by:large flat sample clipped off by:
In Bragg-Brentano geometry, the line focus beam can be considered as a superposition of point beams. All in parallel with the diffractometer plane and the same
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geometry condition separated by soller slit foils.
XRD2: Two-dimensional X-ray DiffractionXRD : Two dimensional X ray DiffractionAdvantages
Hi h dHigh speed
Micro scale sample
Virtual oscillation (large grain size & preferred orientation)
Disadvantages
⌧ Resolution is limited by the detector PSFby t e detecto S
⌧ Defocusing at low angle in reflection
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⌧ Expensive
XRD2: Data Collection:Acetaminophen powder
5 second data collection 30 second data collectionLi
n (C
ps)
0
1
2
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2-Theta - Scale9 10 20 30 40
XRD2: Diffraction vector approach
Applications Vector approaches
Phase Identification: Polarization and absorption correction
T t A l i O i t ti i lTexture Analysis: Orientation mapping angles;Data collection strategy (scheme)
Stress Measurement: Fundamental equation derived by second order tensor transformation;Data collection strategy (scheme)
Crystal Size Analysis: Equations for the effective volumecalculation at both reflection and
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transmission modes.
XRD2 & Single Crystalsg y
S0
S
λh=−⋅ )( 0ssaLaue
λλ
lk=−⋅
)()( 0ssbequation
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λl=−⋅ )( 0ssc
XRD2 & PowdersXRD & Powders
Bragg law
θλ sin2dn =
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XRD2: Diffraction pattern with both γ and 2θ information
Debye Cone
Sample
Incident Beam
⎤⎡ −θ 12cos
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡
−−=
−=
γθγθ
θ
λλcos2sinsin2sin
12cos10ssH
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⎥⎦⎢⎣ γθ cos2sin
XRD2: Diffraction Space & Laboratory coordinators
The incident beam is in the direction of the XL axis in the laboratory coordinates so that the unit vectors so t at t e u t vecto sof the incident beam and diffracted beams are given respectively
⎤⎡⎤⎡ 10s ⎤⎡⎤⎡ θ2cosxs
beams are given respectively by:
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡=
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡=
001
0
0
y
x
ss
0s⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡−=
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡=
γθγθ
cos2sinsin2siny
x
ss⎥⎦⎢⎣⎥⎦⎢⎣ 00zs ⎥⎦⎢⎣−⎥⎦⎢⎣ γθ cos2sinzs
XRD2: Diffraction Vector & Unit Diffraction Vector
The diffraction vector is given in laboratory coordinates byin laboratory coordinates by
⎥⎥⎤
⎢⎢⎡−
−=⎥
⎥⎤
⎢⎢⎡
−−
=−
= γθθ
sin2sin12cos
110
00
xx
ssss
ssH
The direction of each diffraction ⎥⎥⎦⎢
⎢⎣−⎥
⎥⎦⎢
⎢⎣ − γθ
γθλλλ
cos2sinsin2sin
0
0
zz
yy
ssssH
vector can be represented by its unit vector given by:
⎤⎡⎤⎡ θih
⎥⎥⎥⎤
⎢⎢⎢⎡−
−=
⎥⎥⎥⎤
⎢⎢⎢⎡
== γθθsincos
sin
L y
x
hh
HHh
⎥⎦⎢⎣−⎥⎦⎢⎣ γθ coscoszhH
XRD2: Sample Space & Eulerian Geometry
The angular relationships between XLYLZL andbetween XLYLZL and S1S2S3 are:
X Y ZL L L
S a a a
S a a a
1 11 12 13
2 21 22 23
The transformation matrix from the diffraction space
S a a a3 31 32 33
⎥⎥⎤
⎢⎢⎡
−−−
−φψ
φωφψω
φωφψω
sincoscossin
sinsincoscoscos
sinsinsinfrom the diffraction space to the sample space is:
⎥⎥⎥⎥⎥⎥
⎢⎢⎢⎢⎢⎢
−−
−=
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡
φψφω
φψωφω
φψω
φωφω
coscossinsin
cossincossincos
cossinsin
cossincoscos
333231
232221
131211
aaaaaaaaa
⎥⎥⎦⎢
⎢⎣− ψψωψω sincoscoscossin
XRD2: Sample Space & Unit Diffraction Vector
The components of the unit vector h in the samplevector hS in the sample coordinates S1S2S3 is then given by
⎥⎥⎥⎤
⎢⎢⎢⎡
⎥⎥⎥⎤
⎢⎢⎢⎡
=⎥⎥⎥⎤
⎢⎢⎢⎡
y
x
hh
aaaaaa
hh
232221
131211
2
1
Or in expanded form:
⎥⎦⎢⎣⎥⎦⎢⎣⎥⎦⎢⎣ zhaaah 3332313
)ii( iicossincoscos)coscossinsin(sinsin1
φφθψφγθωφωψφθ ++=h
in expanded form: )sincoscossin(sinsincos ωφωψφγθ −−
)sinsincossin(cossincoscoscoscoscos)cossinsinsin(cossin2
ωφωψφγθψφγθωφωψφθ
++−−−=h
h3 = − −sin cos sin cos sin cos cos cos cos sinθ ψ ω θ γ ψ ω θ γ ψ
XRD2: Fundamental Equation for Stress Measurement
As a second order tensor thetensor, the relationship between the measured strains and the strain tensoris given by:
hkl hh ⋅⋅= εε }{
the fundamental equation for stress measurement in XRD2:
jiij hh ⋅⋅= εε φψωγ ),,,(
equation for stress measurement in XRD2:
⎞⎜⎛
+++++
θσσσσσσ
sinl)222
()(
0
2333
2222
211122
13322111
hhhhhh
hhhSS
⎠⎞
⎜⎝⎛=+++
θσσσ
sinln)222 0
322331132112 hhhhhh
XRD2: Fundamental Equation for Texture Analysis
The pole figure angles (α,β) can be calculated
22
21
13
1 cossin hhh +== −−α(α,β) can be calculated from the unit vector components by the pole
i ti
213
⎩⎨⎧
<°<≥°≥
+±= −
0000
cos 2
2211
hifhif
hhh
ββ
βmapping equations: ⎩ <<+ 00 2
22
21
hifhh β
XRD2: Relative Intensity of Powder Pattern
The integrated intensity diffracted from random polycrystalline materials is given by:
Corundum Powder Diffraction
16000
18000
20000
p y y g y
where: 6000
8000
10000
12000
14000
16000
Inte
nsity
( )sthklhkl
Ihkl MMFLPAvpk 22exp)( 23
2 −−= λI
⊕ kI - instrument constant;phkl - the multiplicity of the planes; v - the volume of the unit cell;
0
2000
4000
6000
20 25 30 35 40 45 50
Two Theta
⊕ (LPA) - the Lorentz-polarization and absorption factors;- the structure factor of the crystal plane (hkl) and
exp(-2Mt-2Ms) - the attenuation factor due to lattice thermal vibrations
Two Theta
2hklF
t s
and weak static displacements.
⊕ Denotes the factors which are different between Bragg-Brentano geometry and XRD2 geometry k is determined by the source optics and detector (PPXRD 7)
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XRD2 geometry. kI is determined by the source, optics and detector (PPXRD-7)(LPA) will be given in this presentation.
XRD2: Polarization Correction
The polarization factor for Bragg-Brentano geometryBragg Brentano geometry with incident beam monochromator is:
θθ 2cos2cos1 22+
where 2θM is the Bragg M
MIP
θθθ
2cos12cos2cos1
2++
=
angle of the monochromator.
Geometric relationship between the monochromator d d t t i l b t di t
The general polarization factor for the diffracted beam to point P is:
and detector in laboratory coordinates.
MP ρρθθρρθ cossin2cos2cos)sincos2(cos 2222222 +++=beam to point P is:
MGP
θ2cos1 2+=
XRD2: Polarization Correction
The unit vector of the diffraction vector HP and its projection on YL-ZL plane H'P in the laboratory system are given respectively as:ZL plane, H P, in the laboratory system are given respectively as:
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡−
−=
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡=
θγθ
θsincos
sin
L y
x
hhh
h⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡−=
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡
′′=′
γγ
cossin00
L y
hhh
The unit vector of YL is yL=[0,1,0], then: ⎥⎦⎢⎣−⎥⎦⎢⎣ γθ coscoszh ⎥⎦⎢⎣−⎥⎦⎢⎣ ′ γcoszh
γρ sin)cos(cos LL −=•=′= yy LL hhTherefore, andThe polarization factor for XRD2 can then be given as a function of
γρ sin),cos(cos LL • yy LL hhγρ 22 sincos = γρ 22 cossin =
p gboth θ and γ:
MMPθ
γθθγθθγθ21
cos)2cos2(cossin)2cos2cos1(),( 2
222222 +++=
Mθγ
2cos1),( 2+
XRD2: Sample Absorption Correction
The absorption can be measured by the
Absorption correction of flat slab:be measured by the transmission coefficient:
∫1
where τ is the total
dVeV
AV∫
−= µτ1
(a) reflection (b) transmissionbeam path and A is the average over all the element dV. For
(a) reflection (b) transmission.
To make the relative intensity comparable to B B t t i t dthe element dV. For
Bragg-Brentano geometry, we have:
A 1/(2 )
Bragg-Brentano geometry, we introduce a normalized transmission coefficient T:
AAAT BB µ2/ ==ABB=1/(2µ) AAAT BB µ2/
D8 DISCOVER with GADDS HTS (IµS):Reflection & Transmission (Pharmaceutical Delight)Reflection & Transmission (Pharmaceutical Delight)
Reflection Transmission convertible Geometry
Reflection mode Transmission mode
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Reflection mode Transmission mode
Comparison: IbuprofenIµS & VÅNTEC-2000 vs. Clasical set-upµ p
IµS – XRD2 – focus
2mmX2mm on sample, and 200um spot focused on detector
Sealed Tubefocused on detector
small slice for integration to obtain better resolution
15 sec collection time
• 0.3 mm collimator
• Sample-Detector distance 29 cm
120 sec collection time
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XRD2: Sample Absorption Correction
For reflection mode diffraction with a thick plate:with a thick plate:
⎥⎥⎥⎤
⎢⎢⎢⎡
= 01
os⎥⎥⎥⎤
⎢⎢⎢⎡−= γθ
θsin2sin
2coss
and⎥⎦⎢⎣0 ⎥⎦⎢⎣− γθ cos2sin
⎥⎥⎤
⎢⎢⎡−
= ψωψω
coscoscossin
n
The normalized transmission⎥⎥⎦⎢
⎢⎣
=ψ
ψωsin
coscosn
The normalized transmission coefficient:
ith( )ηcos2
=Tψωη cossincos =⋅−= nso
ψωθζ cossin2coscos == nswith( )ζη coscos +T ψωθζ cossin2coscos −=⋅= ns
ψγθψωγθ sincos2sincoscossin2sin −−
XRD2: Sample Absorption Correction
For transmission mode: ⎤⎡1 ⎤⎡ θ2cos
d⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡=
00os
⎥⎥⎥
⎦
⎤
⎢⎢⎢
⎣
⎡
−−=
γθγθ
cos2sinsin2sins
and
⎥⎥⎥⎤
⎢⎢⎢⎡
+−+
= φωφψωφωφψω
cossinsinsincoscoscossinsinsin
n
The normalized transmission coefficient :
⎥⎦⎢⎣ φψ sincos
coefficient :( ) ( )[ ]
ηζζµηµη
secsecsecexpsecexpsec2
−−−−
=ttT
φωφψωη coscossinsinsincos +=⋅= nso
γθφωφψωθφωφψωζsin2sin)cossinsinsin(cos
2cos)coscossinsin(sincos−++=⋅= ns
γθφψγφφψ
cos2sinsincos)(
−
XRD2: Texture Effect and Correction
The integrated intensity with texture is:texture is:
where g() is the normalized ( )sthklhkl
hklIhkl MMFLPA
vpk 22exp),()( 23
2 −−= βαλ gI
g()pole density function.
For the BB geometry, )0,( 2π
hklgThe texture effect for XRD2:
)( γ∆=
mhklc
hkl gII
2 )]([γ
∫ dFor fiber texture:Correct to the B-B equivalent with a texture effect:
)( γ∆hklg
)0,( 2π
=mhklhklBB g II
12
1
)]([)(
γγ
γγγχγ γ
−=∆
∫ dhkl
hkl
gg
For fiber texture:
d 1)( γ∆=
hklhkl g
I and3
1cos h−=χ
XRD2: Summary and Suggestions
Two-dimensional X-ray diffraction has many d t th ti l diff ti ( dadvantages over the conventional diffraction (speed,
completeness and accuracy, micro-sample volume).Th di b t XRD2 d B B tThe discrepancy between XRD2 and Bragg-Brentano
in geometry, polarization, absorption and preferred orientation can be interpreted and correctedorientation can be interpreted and corrected.Fortunately, most of the discrepancies can be ignored
without affecting the specific applicationwithout affecting the specific application. Or the corrections are already built in the software, so
users do have to work on the correction detailsusers do have to work on the correction details.
XRD2: Theory System and Applications
Small Angle X-ray Scattering
XRD : Theory, System and Applications
X-ray Diffraction (XRD)
Micro DiffractionGeometry Conventions
Phase Identification
Mapping
Thi Fil
System and Configuration
Phase Identification
Quantitative Analysis High-Throughput Screening
Thin Films
Texture Forensics and Archaeology
ReferenceStress Reference
XRD2: Fundamentals, theory and applicationsu da e ta s, t eo y a d app cat o s
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Finalist of MRS “Science as Art” competition:3D View of Corundum Powder Pattern
Thank You for Your AttentionThank You for Your Attention
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