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Heteroepitaxy on Silicon
www.cambridge.org© in this web service Cambridge University Press
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MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS
ISSN 0272 - 9172
Volume 1—Laser and Electron-Beam Solid Interactions and Materials Processing,J. F. Gibbons, L. D. Hess, T. W. Sigmon, 1981
Volume 2—Defects in Semiconductors, J. Narayan, T. Y. Tan, 1981
Volume 3—Nuclear and Electron Resonance Spectroscopies Applied to MaterialsScience, E. N. Kaufmann, G. K. Shenoy, 1981
Volume 4—Laser and Electron-Beam Interactions with Solids, B. R. Appleton,G. K. Celler, 1982
Volume 5—Grain Boundaries in Semiconductors, H. J. Leamy, G. E. Pike,C H. Seager, 1982
Volume 6—Scientific Basis for Nuclear Waste Management, S. V. Topp, 1982
Volume 7—Metastable Materials Formation by Ion Implantation, S. T. Picraux,W. J. Choyke, 1982
Volume 8—Rapidly Solidified Amorphous and Crystalline Alloys, B. H. Kear,B. C. Giessen, M. Cohen, 1982
Volume 9—Materials Processing in the Reduced Gravity Environment of Space,G. E. Rindone, 1982
Volume 10—Thin Films and Interfaces, P. S. Ho, K.-N. Tu, 1982
Volume 11—Scientific Basis for Nuclear Waste Management V, W. Lutze, 1982
Volume 12—In Situ Composites IV, F. D. Lemkey, H. E. Cline, M. McLean, 1982
Volume 13—Laser Solid Interactions and Transient Thermal Processing of Materials,J. Narayan, W. L. Brown, R. A. Lemons, 1983
Volume 14—Defects in Semiconductors II, S. Mahajan, J. W. Corbett, 1983
Volume 15—Scientific Basis for Nuclear Waste Management VI, D. G. Brookins, 1983
Volume 16—Nuclear Radiation Detector Materials, E. E. Haller, H. W. Kraner, W. A.Higinbotham, 1983
Volume 17—Laser Diagnostics and Photochemical Processing for SemiconductorDevices, R. M. Osgood, S. R. J. Brueck, H. R. Schlossberg, 1983
Volume 18—Interfaces and Contacts, R. Ludeke, K. Rose, 1983
Volume 19—Alloy Phase Diagrams, L. H. Bennett, T. B. Massalski, B. C. Giessen,1983
Volume 20—Intercalated Graphite, M. S. Dresselhaus, G. Dresselhaus, J. E. Fischer,M. J. Moran, 1983
Volume 21—Phase Transformations in Solids, T. Tsakalakos, 1984
Volume 22—High Pressure in Science and Technology, C. Homan, R. K. MacCrone,E. Whalley, 1984
Volume 23—Energy Beam-Solid Interactions and Transient Thermal Processing,J. C. C. Fan, N. M. Johnson, 1984
Volume 24—Defect Properties and Processing of High-Technology NonmetallicMaterials, J. H. Crawford, Jr., Y. Chen, W. A. Sibley, 1984
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MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS
Volume 25—Thin Films and Interfaces II, J. E. E. Baglin, D. R. Campbell, W. K. Chu,1984
Volume 26—Scientific Basis for Nuclear Waste Management VII, G. L. McVay, 1984
Volume 27—Ion Implantation and Ion Beam Processing of Materials, G. K. Hubler,O. W. Holland, C. R. Clayton, C. W. White, 1984
Volume 28—Rapidly Solidified Metastable Materials, B. H. Kear, B. C. Giessen, 1984
Volume 29—Laser-Controlled Chemical Processing of Surfaces, A. W. Johnson,D. J. Ehrlich, H. R. Schlossberg, 1984.
Volume 30—Plasma Processsing and Synthesis of Materials, J. Szekely, D. Apelian,1984
Volume 31—Electron Microscopy of Materials, W. Krakow, D. Smith, L. W. Hobbs,1984
Volume 32—Better Ceramics Through Chemistry, C. J. Brinker, D. E. Clark, D. R.Ulrich, 1984
Volume 33—Comparison of Thin Film Transistor and SOI Technologies, H. W. Lam,M. J. Thompson, 1984
Volume 34—Physical Metallurgy of Cast Iron, H. Fredriksson, M. Hillerts, 1985
Volume 35—Energy Beam-Solid Interactions and Transient Thermal Processing/1984,D. K. Biegelsen, G. Rozgonyi, C. Shank, 1985
Volume 36—Impurity Diffusion and Gettering in Silicon, R. B. Fair, C. W. Pearce,J. Washburn, 1985
Volume 37—Layered Structures, Epitaxy and Interfaces, J. M. Gibson, L. R. Dawson,1985
Volume 38—Plasma Synthesis and Etching of Electronic Materials, R. P. H. Chang,B. Abeles, 1985
Volume 39—High-Temperature Ordered Intermetallic Alloys, C. C. Koch, C T. Liu,N. S. Stoloff, 1985
Volume 40—Electronic Packaging Materials Science, E. A. Giess, K.-N. Tu,D. R. Uhlmann, 1985
Volume 41—Advanced Photon and Particle Techniques for the Characterization ofDefects in Solids, J. B. Roberto, R. W. Carpenter, M. C. Wittels, 1985
Volume 42—Very High Strength Cement-Based Materials, J. F. Young, 1985.
Volume 43—Coal Combustion and Conversion Wastes: Characterization, Utilization,and Disposal, G. J. McCarthy, R. J. Lauf, 1985
Volume 44—Scientific Basis for Nuclear Waste Management VIII, C. M. Jantzen,J. A. Stone, R. C. Ewing, 1985
Volume 45—Ion Beam Processes in Advanced Electronic Materials and DeviceTechnology, F. H. Eisen, T. W. Sigmon, B. R. Appleton, 1985
Volume 46—Microscopic Identification of Electronic Defects in Semiconductors, N. M.Johnson, S. G. Bishop, G. D. Watkins, 1985
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MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS
Volume 47—Thin Films: The Relationship of Structure to Properties, C. R. Aita,K. S. SreeHarsha, 1985
Volume 48—Applied Material Characterization, W. Katz, P. Williams, 1985
Volume 49—Materials Issues in Applications of Amorphous Silicon Technology,D. Adler, A. Madan, M. J. Thompson, 1985
Volume 50—Scientific Basis for Nuclear Waste Management IX, L. O. Werme, 1985
Volume 51—Beam-Solid Interactions and Phase Transformations, H. Kurz, G. L. Olson,J. M. Poate, 1986
Volume 52—Rapid Thermal Processing, T. O. Sedgwick, T. E. Siedel, B. Y. Tsaur, 1986
Volume 53—Semiconductor-on-Insulator and Thin Film Transistor Technology,
A. Chiang. M. W. Geis, L. Pfeiffer, 1986
Volume 54—Interfaces and Phenomena, R. H. Nemanich, P. S. Ho, S. S. Lau, 1986
Volume 55—Biomedical Materials, M. F. Nichols, J. M. Williams, W. Zingg, 1986Volume 56—Layered Structures and Epitaxy, M. Gibson, G. C. Osbourn, R. M. Tromp,
1986
Volume 57—Phase Transitions in Condensed Systems—Experiments and Theory,G. S. Cargill III, F. Spaepen, K. N. Tu, 1986
Volume 58—Rapidly Solidified Alloys and Their Mechanical and Magnetic Properties,B. C. Giessen, D. E. Polk, A. I. Taub, 1986
Volume 59—Oxygen, Carbon, Hydrogen, and Nitrogen in Crystalline Silicon,J. W. Corbett, J. C. Mikkelsen, Jr., S. J. Pearton, S. J. Pennycook, 1986
Volume 60—Defect Properties and Processing of High-Technology NonmetallicMaterials, Y. Chen, W. D. Kingery, R. J. Stokes, 1986
Volume 61—Defects in Glasses, Frank L. Galeener, David L. Griscom, Marvin J. Weber,1986
Volume 62—Materials Problem Solving with the Transmission Electron Microscope,L. W. Hobbs, K. H. Westmacott, D. B. Williams, 1986
Volume 63—Computer-Based Microscopic Description of the Structure and Propertiesof Materials, J. Broughton, W. Krakow, S. T. Pantelides, 1986
Volume 64—Cement-Based Composites: Strain Rate Effects on Fracture, S. Mindess,S. P. Shah, 1986
Volume 65—Fly Ash and Coal Conversion By-Products: Characterization, Utilizationand Disposal III, G. J. McCarthy , D. M. Roy, 1986
Volume 66—Frontiers in Materials Education, G. L. Liedl, L. W. Hobbs, 1986
Volume 67—Heteroepitaxy on Silicon Technology, J. C. C. Fan, J. M. Poate, 1986
Volume 68—Plasma Processing, J. Coburn, R. A. Gottscho, D. W. Hess, 1986
Volume 69—Materials Characterization, M.-A. Nicolet, N. W. Cheung, 1986
Volume 70—Materials Issues in Amorphous-Semiconductor Technology, D. Adler,Y. Hamakawa, A. Madan, 1986
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MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS
Volume 71—Materials Issues in Silicon Integrated Circuit Processing, M. Wittmer,J. Stimmell, M. Strathman, 1986
Volume 72—Electronic Packaging Materials Science, D. R. Ulrich, R. C. Pohanka,D. R. Uhlmann, K. A. Jackson, 1986
Volume 73—Better Ceramics Through Chemistry II, C. J. Brinker, D. E. Clark,D. R. Ulrich, 1986
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MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS VOLUME 67
Heteroepitaxy on Silicon
Symposium held April 16-18, 1986, Palo Alto, California, U.S.A.
EDITORS:
J. C. C. FanKopin Corporation, Taunton, Massachusetts, U.S.A.
J. M. PoateAT&T Bell Laboratories, Murray Hill, New Jersey, U..S.A.
I MATERIALS RESEARCH SOCIETY1 Pittsburgh, Pennsylvania
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cambridge university press Cambridge, New York, Melbourne, Madrid, Cape Town, Singapore, São Paulo, Delhi, Mexico City
Cambridge University Press32 Avenue of the Americas, New York ny 10013-2473, USA
Published in the United States of America by Cambridge University Press, New York
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© Materials Research Society 1986
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First published 1986 First paperback edition 2012
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This work was supported in part by the Air Force Office of Scientific Research, Air Force Systems Command, USAF, under Grant Number AFOSR-85-0355. The United States Government has a royalty-free license throughout the world in all copyrightable material contained herein.
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Contents
PREFACE xiii
ACKNOWLEDGMENTS XV
REPORT OF PANEL SESSION xvii
PART I: GROWTH OF GaAs ON Si
*MBE GROWTH OF GaAs ON Si: PROBLEMS AND PROGRESSHerbert Kroemer 3
*MOCVD GROWTH OF III-V COMPOUNDS ON Si USING STRAINEDSUPERLATTICES
Shiro Sakaif Tetsuo Sogaf Masanari Takeyasurand Masayoshi Umeno 15
MBE GROWTH OF LOW DISLOCATION AND HIGH MOBILITYGaAs-on-Si
Jhang Woo Lee 29
THE GROWTH OF GaAs ON Si BY MOLECULAR BEAM EPITAXYS.M. Koch, S.J. Rosner, Darrell Schlom, andJ.S. Harris, Jr. 37
INITIAL STAGES OF EPITAXIAL GROWTH OF GaAs ON (100)SILICON
D.K. Biegelsen, F.A. Poncer A.J. Smith, andJ.C. Tramontana 45
PART II: PROPERTIES OF GaAs ON Si
•GROWTH OF GaAs ON Si AND ITS APPLICATION TO FETS ANDLEDS
Masahiro Akiyamaf Yoshihiro Kawaradaf Seiji Nishif
Takashi Uedar and Katsuzo Kaminishi 53
*GaAs/Ge CRYSTAL GROWTH ON Si AND SiO2/Si SUBSTRATESYoshiro Ohmachi, Yukinobu Shinoda, andSatoshi Oku 65
MICROSTRUCTURE OF THIN LAYERS OF MBE-GROWN GaAs ONSi SUBSTRATES
S.J. Rosnerr S.M. Koch, S. Laderman, andJ.S. Harris, Jr. 77
OBSERVATION OF GaAs/Si EPITAXIAL INTERFACES BY ATOMICRESOLUTION ELECTRON MICROSCOPY
N. Otsuka, C. Choi, Y. Nakamura, S. Nagakura,R. Fischer, C.K. Peng, and H. Morkoc 85
•Invited paper
ix
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MATERIAL CHARACTERIZATION OF EPITAXIAL GaAs AND GeFILMS ON (100) Si SUBSTRATES
M. Abdul Awalf El Hang Lee, G.L. Koos, E.Y. Chan,G.K. Celler, and T.T. Sheng 93
PART III: HETEROSTRUCTURES OFSEMICONDUCTORS AND INSULATORS ON Si
*HETEROEPITAXY OF Sir Ge, AND GaAs FILMS ON CaF2/SiSTRUCTURES
H. Ishiwara, T. Asano, H.C. Lee, Y. Kuriyama,K. Seki, and S. Furukawa 105
USING RAPID THERMAL ANNEALING TO IMPROVE EPITAXIALCaF2/CoSi2/Si (111) STRUCTURES
Julia M. Phillips and W.M. Augustyniak 115
MOLECULAR BEAM EPITAXY OF GaSb/AlSb OPTICAL DEVICELAYERS ON Si (100)
R.J. Malik, J.P. van der Ziel, B.F. Levine,C.G. Bethea, P.M. Petroff, J. Walker, andR. Hamm 119
ELECTRICAL PROPERTIES AND STRUCTURAL DEFECTS INEPITAXIAL CaF2 ON Si
L.J. Schowalter, R.W. Fathauer, F.A. Ponce,G. Anderson, and Shin Hashimoto 125
HETEROEPITAXY OF GALLIUM ARSENIDE ON GERMANIUMCOATED SILICON SUBSTRATES
Shirley S. Chu, T.L. Chu, and H. Firouzi 135
A HgCdTe/CdTe/GaAs/Si EPITAXIAL STRUCTUREK. Zanio, R. Bean, K. Hay, R. Fischer, andH. Morkoc 141
PART IV: DEVICE PROPERTIES OF GaAs ON Si
*HIGH SPEED GaAs BASED DEVICES ON Si SUBSTRATESHadis Morkoc 149
*GaAs/AlGaAs DIODE LASERS ON MONOLITHIC GaAs/SiSUBSTRATES
T.H. Windhorn, G.W. Turner, and G.M. Metze 157
MONOLITHIC INTEGRATION OF Si AND GaAs DEVICESH.K. Choi, G.W. Turner, B-Y. Tsaur, andT.H. Windhorn 165
GaAs MESFET's ON SILICON SUBSTRATES FOR DIGITAL ICAPPLICATIONS
Hisashi Shichijo and Jhang Woo Lee 173
HIGH-SPEED PHOTOCONDUCTIVE DETECTORS FABRICATED INHETEROEPITAXIAL GaAs LAYERS
G.W. Turner, V. Diadiuk, H.Q. Le, H.K. Choi,G.M. Metze,and B-Y. Tsaur 181
*Invited paper
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STRUCTURE AND PROPERTIES OF ULTRATHIN Ge-SiSUPERLATTICES
J. Bevkf J.P. Mannaerts, L.C. Feldman, B.A.Davidson, W.P. Lowe, A.M. Glass, T.P. PearsallrJ. Menendez, A. Pinczukf and A. Ourmazd 189
HIGH VOLUME PRODUCTION GROWTH OF GaAs ON SILICONSUBSTRATES
Chris R. Ito, M. Fengf V.K. Euf and H.B. Kim 197
PHOTOLUMINESCENCE AND PHOTOLUMINESCENCE EXCITATIONSPECTRA OF GaAs GROWN DIRECTLY ON Si
S. Zemon, S.K. Shastryr P. Norrisr C. Jagannathfand G. Lambert 203
PART V: HETEROSTRUCTURES OFSEMICONDUCTORS AND METALS ON Si
*THE FORMATION OF THIN LAYERS AND DOUBLE HETERO-STRUCTURES OF EPITAXIAL SILICIDES
R.T. Tung and J.M. Gibson 211
TUNNELING SPECTROSCOPY OF SINGLE-CRYSTAL CoSi2 ANDNiSi, EPILAYERS ON n-TYPE Si
R.J. Hauenstein, L.J. Schowalterf B.D. Hunt, O.J.Marsh, and T.C. McGill 227
•PROPERTIES AND APPLICATIONS OF MOLECULAR BEAMEPITAXIAL SILICIDES
K.L. Wang and Y.C. Kao 235
GROWTH OF GROUP IV-IV HETEROSTRUCTURES: INITIALSTAGES OF INTERFACE FORMATION
H.-J. Gossmann and L.C. Feldman 251
EPITAXIAL CRYSTALLIZATION OF Ge ON Si USINGEVAPORATION AND RECRYSTALLIZATION TECHNIQUES
El Hang Lee, M. Abdul Awal, G.K. Celler,L. Pfeiffer, and T.T. Sheng 259
AUTHOR INDEX 269
SUBJECT INDEX 271
•Invited paper
xi
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Preface
This volume contains papers presented at the symposium on "Heteroepitaxy on Silicon"held in Palo Alto, California, April 16-18, 1986. The symposium was the first of its kinddevoted to the subject of heteroepitaxy on Si. Silicon homoepitaxy is well established and isvital in the Si industry. If heteroepitaxy on Si is successful, the applications will beconsiderable, ranging from optical communication, high-speed integrated circuits, to solar cells.Understanding and controlling the crystal growth processes present a major challenge tomaterial scientists. Significant advances in heteroepitaxy and device fabrication have recentlybeen achieved by many workers.
The symposium was well attended (over two hundred attendees) and represented aninternational forum for this emerging subject. Progress is outstanding, both in terms offundamental understanding and in the area of practical applications. Over thirty papers werepresented in oral sessions, and the majority of these are incorporated in this book.
Nine internationally recognized scientists were invited to give papers on topics, rangingfrom material and device properties of GaAs on Si, initial nucleation phenomena and the growthof insulators and metals on Si. An evening panel session on "Future of GaAs on Si" brought outlively discussion. The issues and responses from the panelists have been tabulated anddescribed in the volume.
Symposium Co-Chairmen
John C. C. Fan John M. Poate
July 1986
xiii
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Acknowledgments
We wish to thank all the contributors and participants who made the symposium sosuccessful. We particularly would like to acknowledge the invited speakers, who providedexcellent summaries of specific areas and set the tone of the meeting. They are:
M. Akiyama S. SakaiH. Ishiwara R. T. TungH. Kroemer K L WangH. Morkoc T. H. WindhornY. Ohmaehi
We are also grateful to the panelists who helped bring out many important issues on"GaAs on Si". They are:
M. Akiyama R. KoyamaJ. Goodman H. KroemerK Kim H. Morkoc
We are deeply indebted to the session chairs who directed the sessions, guided thediscussions, and gave invaluable help in getting the papers refereed. They are:
J. C. C. Fan J. M. PoateR. P. Gale G. A. RozgonyiJ. S. Harris B.-Y. TsaurH. hhiwara S. WangJ. M. Phillips
Special thanks are also due to Ms. Henrietta Weston and Ms. Cami Davis. It is throughtheir efforts that the symposium and the book have come to fruition. We would like to thankMs. Karen Martelli for her support in running the evening panel session.
It is our great pleasure to acknowledge with gratitude, the financial support provided bythe Air Force Office of Scientific Research (Dr. Kevin J. Malloy and Dr. Gerald L. Witt).
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Report of Panel Session (April 17, 1986)
Future of GaAs on Si
Moderator: John C. C. Fan, Kopin Corporation, Taunton, MA
Panel Members:
M. Akiyama OKI ElectricJ. Goodman Stanford UniversityH. Kim Ford MicroelectronicsR. Koyama TriQuint SemiconductorH. Kroemer Univ. of California, Santa BarbaraH. Morkoc University of Illinois
There are a number of critical issues facing GaAs on Si technology. The panel sessionconsisted of leaders in the GaAs on Si community. Their viewpoints, shown in tabulated form,were presented for general discussion in the session which was attended by about 200 people.There is considerable excitement on the rapid progress in this technology, and all its potentialapplications. Major technological advances are still required before this technology will besuccessful.
xv i i
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Que
stio
n 1
Wha
t ar
e th
e po
tent
ial
appl
icat
ions
of
GaA
s on
Si
in o
rder
of
impo
rtan
ce?
Ak
iyam
a
ICs
wit
h G
aAs
and
Si D
evic
es
GaA
s po
wer
dev
ices
Sola
r C
ells
Goo
dman
Opt
ical
Inte
rcon
nect
s
Mon
olit
hic
Mic
row
ave
Su
bst
rate
s
Mul
tifu
ncti
onSi
-GaA
sdi
gita
l ci
rcui
ts
Sola
r C
ells
Kim
Dis
cret
es a
ndSm
all
Scal
eIn
terg
rate
d C
ircu
its
Pow
er F
ET
s(m
icro
wav
e)
Dig
itia
l In
tegr
ated
Cir
cuit
and
Mon
olit
hic
Mic
row
ave
Inte
grat
edC
ircu
it
Op
tica
l In
tegr
atio
n
Foc
al P
lan
eA
rray
Su
bst
rate
s
Kro
emer
Op
toel
ectr
onic
Inte
grat
ion
GaA
s/A
lGaA
sIC
s
Pow
er F
ET
s
Sola
r C
ells
Koy
ama
HE
MT
/Si
ICs
Het
eroj
un
ctio
nB
ipol
ar T
ran
sist
or/S
iIC
s
GaA
s/C
MO
S Si
ICs
III-
V E
lect
ro-O
pti
c/S
iIC
s
Mor
koc
Rep
lace
GaA
sS
ub
stra
tes
Hyb
rid
Dev
ices
for
Opt
ical
Det
ecto
rs a
ndD
isp
lays
Inte
grat
ed G
aAs
and
Si d
evic
es
Op
toel
ectr
onic
sin
Si
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Que
stio
n 2
Wha
t ar
e th
e m
ajor
mat
eria
l pr
oble
ms
faci
ng G
aAs
on S
i, in
ord
er o
f im
port
ance
?
Aki
yam
a
Ten
sile
str
ess
(waf
er b
endi
ng,
crac
king
)
Def
ects
whi
ch a
reno
t in
dica
ted
byet
ch p
it de
nsiti
es
Dem
onst
ratio
n of
hig
h-qu
ality
opt
ical
dev
ices
and
ICs
Goo
dman
Ach
ieve
low
disl
ocat
ions
(<10
3cm
-2)
Obt
ain
good
unif
orm
ity
Min
imiz
e st
rain
Kim
Low
dis
loca
tion
dens
ity a
ndan
tiph
ase
dom
ain
Rep
rodu
cibl
elo
w-d
islo
catio
ngr
owth
Sem
i-In
sula
ting
epi
Hig
h-de
nist
y(L
SI)
dem
onst
rati
on
Scal
ing
up t
o6"
, 8"
Kro
emer
Thr
eadi
ngD
islo
catio
ns
Cro
ss-d
opin
g
Ant
i-Ph
ase
Dom
ain
Dir
ty S
iS
tart
ing
Surf
ace
Koy
ama
Dis
loca
tion
/Def
ects
/Im
puri
ties
Stre
ss i
n th
e in
terf
ace
and
in b
ulk
epi
Uni
form
ity/
Rep
ro-
duci
bilit
y of
the
epi
laye
rs
Prod
uce
4" o
r la
rger
waf
ers
Cos
t of
epi
Mor
koc
Mat
eria
ls q
ualit
y re
lati
ng t
odi
sloc
atio
n an
d st
rain
cau
sed
byth
erm
al m
ism
atch
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Que
stio
n 3
Wha
t ar
e th
e pr
opos
ed s
olut
ions
for
the
se m
ater
ials
pro
blem
s?
Aki
yam
a
Cla
rify
grow
th m
echa
nism
and
rela
tion
ship
bet
wee
ngr
owth
and
crys
talli
zatio
n
Sele
ctiv
e an
d/or
embe
dded
gro
wth
Goo
dman
Low
dis
loca
tion
solid
pha
se r
egro
wth
,su
per
latt
ice
buff
er
Stra
in-l
owgr
owth
tem
pera
ture
(pla
sma-
enha
nce
MO
CV
D)
Kim
Inte
nse
prod
uctio
nsc
ale-
upde
velo
pmen
t
R&
D in
gro
wth
kine
tics
for
the
grow
th s
yste
ms
Acc
umul
ate
mat
eria
ls a
ndde
vice
dat
a on
the
mat
eria
l
Kro
emer
Stra
ined
Lay
erSu
perl
atti
ces
(211
)
Eit
her
(211
) or
hig
hte
mpe
ratu
re a
nnea
lon
(10
0)
TL
C
Koy
ama
Gai
n E
xper
ienc
e
Dev
elop
OM
VPE
Mor
koc
Use
dis
loca
tion
cont
rol
tech
niqu
esan
d hi
gh-q
ualit
y m
ater
ials
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Que
stio
n 4
Wha
t ar
e th
e de
vice
pro
cess
ing
prob
lem
s fa
cing
GaA
s on
Si,
in o
rder
of
impo
rtan
ce?
Aki
yam
a
Waf
er b
endi
ng
Goo
dman
Mai
ntai
nanc
eof
cir
cuits
duri
ng G
aAs
grow
th/d
evic
epr
oces
sing
Inhe
rent
ste
phe
ight
pro
blem
duri
ng G
aAs
and
Si d
evic
es
For
optic
alin
terc
onne
cts
over
com
e ba
sic
inco
mpa
tibili
tyof
opt
ical
and
elec
tron
icm
ater
ial r
equi
re-
men
ts
Kim
Ada
ptat
ion
ofpr
oces
sing
chem
istr
y, t
herm
altr
eatm
ent
com
patib
ility
Equ
ipm
ent
com
patib
ility
(han
dlin
g),
war
ping
, waf
erde
tect
ion
syst
em e
tc.
Ado
ptio
n/co
nver
sion
of la
rge
6M S
i lin
e in
to G
aAs
line
Kro
emer
Bui
lt-in
str
ain
duri
ng c
ool
dow
n
Cle
avag
e in
com
patib
ility
Pos
sibl
e in
com
patib
ility
with
MO
S
Koy
ama
Waf
er f
latn
ess
(<fe
w u
rn)
The
rmal
sta
bilit
yof
epi
und
erva
riou
s pr
oces
sco
nditi
ons
Uni
form
ityan
d re
prod
ucib
ility
Mor
koc
In a
ll as
pect
s G
aAs
on S
i mak
espr
oces
sing
sim
pler
For
hybr
id d
evic
es,
com
pute
r ch
ips,
need
to
mai
ntai
n th
e qu
ality
of
met
alliz
atio
n on
Si
duri
ng G
aAs
grow
th
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Que
stio
n 5
Is G
aAs
on S
i te
chno
logy
rea
lly
need
ed?
If s
o, w
hen
will
it
be c
omm
erci
ally
ava
ilab
le?
Aki
yam
a
Yes
,GaA
s/Si
has
man
yad
vant
ages
(su
ch a
s hi
ghth
erm
al c
ondu
ctiv
ity,
larg
er w
afer
3-5
" in
size
, lig
ht w
eigh
t, et
c.)
Whe
n de
vice
pro
pert
ies
are
bett
er (
1990
?)
Goo
dman
Nee
d te
chno
logy
brea
kthr
ough
Kim
Yes
Rea
son:
Low
cost
(ne
arly
com
petit
ive
with
Si e
pi)
Eas
y to
sca
le u
p
Pot
enti
alre
duct
ion
in d
is-
loca
tions
and
pur
ity
Oth
er a
pplic
atio
nssu
ch a
s in
te-
grat
ed o
ptic
s an
dhi
gh p
ower
dev
ices
1987
-198
8
Kro
emer
Yes
, bu
t la
ter
than
you
and
I ho
pe
Koy
ama
GaA
s/Si
cou
ld n
otbe
cos
t ef
fect
ive
agai
nst
undo
ped
LE
C t
oday
for
com
mer
cial
ME
SFE
T's
The
rea
l ad
vant
age
may
be
for
hete
roju
nctio
nde
vice
s
Not
exp
ecte
d co
m-
mer
cial
ly b
efor
e2-
3 ye
ars
Mor
koc
Fir
st n
eed
is t
o re
plac
e G
aAs
and
InP
subs
trat
esfo
r co
mpo
und
sem
icon
duct
orde
vice
s, c
ircu
its a
ndlo
ng-w
avel
engt
h m
ater
ials
Shou
ld b
e av
aila
ble
in 2
-5 y
ears
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