importance of metrology in developing nanotehnologies alina catrinel ion universitatea politehnica...
TRANSCRIPT
Importance of Importance of metrology in metrology in developing developing
nanotehnologiesnanotehnologies
Importance of Importance of metrology in metrology in developing developing
nanotehnologiesnanotehnologiesAlina Catrinel IonAlina Catrinel Ion
Universitatea Politehnica BucurestiUniversitatea Politehnica Bucuresti
What is nanometrology?
• Science of measurement at the nanoscale level
• Includes length or size measurements (where dimensions are given in nanometres and the measurement uncertainty is often less than 1 nm)
• Includes also measurement of force, mass, electrical and other properties
What is special about nanometrology?
• It must be seen as indispensable part of all kinds of nanotechnology;
• Precise control of dimensions of objects is a key issue of nanotechnology;
• Special protocols for nanostructures and nanomaterials must be developed;
• Standards have to be developed to match technology advances and support the increasing applications of nanostructures.
Standards and standardisation for nanotechnologies
• International formal standards by ISO, IEC, ITU
• European formal standards by CEN, CENELEC and ETSI
• National formal standards outside Europe
• National formal standards in Europe
Standardization in nanotechnologies
• Understanding and control of matter and processes at the nanoscale, below 100 nm in one or more dimensions where size-dependent phenomena usually enables novel applications;
• Utilizing the properties of nanoscale materials that differ from the properties of individual atoms, molecules, to create improved materials, devices and systems that exploit these new properties.
Specific tasks include developing standards
for:• Terminology and nomenclature• Metrology and instrumentation• Specifications for reference
materials • Test methodologies• Modeling and simulations• Science-based health, safety and
environmental practices
ISO TC 229 Nanotechnologies,
2005• TC 229/WG 1 Terminology and
nomenclature• TC 229/WG 2 Measurement and
characterization• TC 229/WG 3 Health, Safety and
Environmental Aspects of Nanotechnologies
Standards under development, WG 2, Measurement and
characterization• ISO TS 10797 Use of Transmission Electron
Microscopy (TEM) in the characterization of Single Walled Carbon nanotubes (SWCNTs)
• ISO TS 10798 Use of Scanning Electron Microscopy (SEM) in characterization of nanostructures
• ISO TS 10868 Use of UV-Vis-NIR absorption spectroscopy in the characterization of nanostructures
• ISO TSxxx
National standardization in
Europe• Germany (DIN), United Kingdom
(BSI), France (AFNOR), The Netherlands (NEN) have TC on nanotechnologies to mirror European and International standardization
• In Czech Republic (CNI) a nanotechnology TC is in foundation.
Where is Romania?• The existing facilities in
nanometrology techniques are dispersed among research institutes and research groups in universities;
• Attempts to group them in a network exist- MINAMAT-NET-Characterization of materials and structures for Micro and Nanoengineering.
What to do ?• To establish a network of laboratories with
complementary facilities; inter laboratory comparison of physical and chemical nanometrology techniques used in the characterization of the same kind of nanomaterial;
• To actively participate in adapting existing nanometrology techniques, developing new ones, coordinated by competent bodies and cooperating with standardization entities;
• Reinforcing these activities by EU projects.
And more?And more?And more?And more?
Problems in chemical characterization of
nanostructures
Challenge in nanometrology
techniques• Instrumental spectroscopy
methods such as: nuclear magnetic resonance, infrared spectroscopy or mass spectrometry can not be really applied in questions of nanoscience and nanotechnology because they intrinsically lack spatial resolution.
Challenge in nanometrology
techniques• Techniques with nanoscale lateral
resolution, such as: standard atomic force microscopy (AFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM), typically give very little or no chemical information at all.
Challenge in nanometrology
techniques• There is currently a lack of
methods capable of chemical diagnostics and characterization in particular of the molecular composition of such nano objects.