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Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher, Knowledge Systems Group National Institute of Standards and Technology May 22, 2001

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Page 1: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

Intelligent Systems DivisionManufacturing Engineering Laboratory

Analysis of Standards Needs for Automated Metrology

Thomas R. KramerGuest Researcher, Knowledge Systems Group

National Institute of Standards and Technology

May 22, 2001

Page 2: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Outline

• Overview of analysis• Major systems diagram, all modules diagram• Major recommendations

-- design data-- inspection programs-- measurement data-- inspection planning data-- low-level inspection instruction commands-- avoid duplication of effort

Page 3: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Overview of Analysis

• Clean draft (68 pages) circulated for comment.• Sec. 1 - executive summary• Sec. 2 - focus, purpose, and scope of analysis• Sec. 3 - 15 activities identified, plus their interfaces• Sec. 4 - 4 major systems identified• Sec. 5 - languages for writing standards discussed• Sec. 6 - 22 APIs and data formats discussed• Appendix A - modules and interfaces in detail

Page 4: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Metrology Automation Major Systems and

Hot Interfaces

•AutoCAD•Catia

•I-DEAS•Pro/E

•Solid Edge•etc.

•Origin•QMC

•Valisysanalyze

•etc.

•Camio•Metrolog•PC DMIS•Quindos•Umess•Valisys

programming•etc.

Control for•B&S•G&L•LK

•Mitutoyo•Starett•Zeiss•etc.

Program Meas. DataDesign

Low-level InspectionInstruction Commands

CAD InspectionProgramming

Software.

InspectionProgram

Execution

Reportingand

Analysis.

InspectionPlanning Data

Page 5: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules and Interfaces in a Dimensional Metrology Systemactive interfaces shown in black, data interfaces in yellow

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

Page 6: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules of CAD System

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

•AutoCAD•Catia

•I-DEAS•Pro/E

•Solid Edge•etc.

Page 7: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules of Inspection Programming System

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring•Camio

•Metrolog•PC DMIS•Quindos•Umess•Valisys

programming

•etc.

Page 8: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules of Inspection Program Execution System

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device MeasuringControl for

•B&S•G&L•LK

•Mitutoyo•Starett•Zeiss•etc.

Page 9: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules of Reporting and Analysis System

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

•Origin•QMC

•Valisysanalyze

•etc.

Page 10: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Systems - Design Data

•AutoCAD•Catia

•I-DEAS•Pro/E

•Solid Edge•etc.

•Origin•QMC

•Valisysanalyze

•etc.

•Camio•Metrolog•PC DMIS•Quindos•Umess•Valisys

programming•etc.

Control for•B&S•G&L•LK

•Mitutoyo•Starett•Zeiss•etc.

Program Meas. DataDesign

Low-level InspectionInstruction Commands

CAD InspectionProgramming

Software.

InspectionProgram

Execution

Reportingand

Analysis.

InspectionPlanning Data

Page 11: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules - Design Data

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

Page 12: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Design Data

• Finished part shapes are output from CAD system.• Intermediate workpiece shapes and feature shapes

are output from Routing Planning, Inspection Planning, and Machining Planning modules.

• Many different proprietary formats exist.• Dimensional metrology applications need tolerance

items (tolerances, datums, etc.) modeled in CAD data, not just given as annotations.

Page 13: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Design Data (cont.)

• STEP AP 203 (boundary representation) is only design data standard representation supported by all CAD systems but does not model tolerance items.

• STEP AP 224 (feature representation) models tolerance items but is not supported by CAD systems.

• Draft recommendation: Build a new version of STEP AP 203 that models tolerance items.

Page 14: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Systems - High-level Inspection Instruction Data

•AutoCAD•Catia

•I-DEAS•Pro/E

•Solid Edge•etc.

•Origin•QMC

•Valisysanalyze

•etc.

•Camio•Metrolog•PC DMIS•Quindos•Umess•Valisys

programming•etc.

Control for•B&S•G&L•LK

•Mitutoyo•Starett•Zeiss•etc.

Program Meas. DataDesign

Low-level InspectionInstruction Commands

CAD InspectionProgramming

Software.

InspectionProgram

Execution

Reportingand

Analysis.

InspectionPlanning Data

Page 15: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules - High-level Inspection Instruction Data

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

Page 16: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Program Data

• Program Data = High-level Inspection Instruction Data• Many proprietary languages exist.• DMIS is the only standard language.• DNSC has done excellent work in developing and

maintaining the standard.• Additional infrastructure is needed to support DMIS

-- fixed conformance classes-- formal conformance tests-- conformance testing service

Page 17: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Program Data (cont.)

• Draft recommendation: Solidify position of DMIS as the one and only standard for inspection programs.

• Draft recommendation: Complete standardization of DMIS Part 2.

• Draft recommendation: Harmonize AP 219 and DMIS.

Page 18: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Systems - Measurement Data

•AutoCAD•Catia

•I-DEAS•Pro/E

•Solid Edge•etc.

•Origin•QMC

•Valisysanalyze

•etc.

•Camio•Metrolog•PC DMIS•Quindos•Umess•Valisys

programming•etc.

Control for•B&S•G&L•LK

•Mitutoyo•Starett•Zeiss•etc.

ProgramMeasurement

Data

Design

Low-level InspectionInstruction Commands

CAD InspectionProgramming

Software.

InspectionProgram

Execution

Reportingand

Analysis.

InspectionPlanning Data

Page 19: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules - Measurement Data

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

Page 20: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Measurement Data

• Measurement data feeds into Reporting and Analysis from various sources.

• Measurement data of the same type from different sources should be in the same format.

• A DMIS output format standard exists but is not widely used.

• Draft recommendation: Work towards a standard representation for measurement data which is input to Reporting and Analysis.

Page 21: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Systems - Inspection Planning Data

•AutoCAD•Catia

•I-DEAS•Pro/E

•Solid Edge•etc.

•Origin•QMC

•Valisysanalyze

•etc.

•Camio•Metrolog•PC DMIS•Quindos•Umess•Valisys

programming•etc.

Control for•B&S•G&L•LK

•Mitutoyo•Starett•Zeiss•etc.

Program Meas. DataDesign

Low-level InspectionInstruction Commands

CAD InspectionProgramming

Software.

InspectionProgram

Execution

Reportingand

Analysis.

InspectionPlanning Data

Page 22: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules - Inspection Planning Data

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

Page 23: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Inspection Planning Data

• No standard or widely used format for inspection planning data exists, but one is needed.

• STEP AP 219 is working towards such a standard.• Draft recommendation: Continue development of

STEP AP 219.• Draft recommendation: Harmonize AP 219 and

DMIS.

Page 24: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Systems - Low-level Inspection Intstruction Commands

•AutoCAD•Catia

•I-DEAS•Pro/E

•Solid Edge•etc.

•Origin•QMC

•Valisysanalyze

•etc.

•Camio•Metrolog•PC DMIS•Quindos•Umess•Valisys

programming•etc.

Control for•B&S•G&L•LK

•Mitutoyo•Starett•Zeiss•etc.

Program Meas. DataDesign

Low-level InspectionInstruction Commands

CAD InspectionProgramming

Software.

InspectionProgram

Execution

Reportingand

Analysis.

InspectionPlanning Data

Page 25: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Other Inspection Device Control

High-level Inspection Instruction Execution

Low-level Inspection Instruction Execution

InspectionProgramming

MachiningProgramming

MachiningPlanning

CAD.

Reportingand Analysis

SolidModeling

Probe Instruction Execution

ActivityCoordination

Modules - Low-level Instruction Execution Commands

RoutingPlanning

Math Computing

InspectionPlanning

Hand-held Device Measuring

Page 26: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Low-Level Inspection Instruction Commands

• Many proprietary APIs exist.• Three standards development efforts in progress:

-- CMM-Driver Commands-- DMIS Part 2 DmeEQUIP-- I++

• This standard will be useful to system builders.• Draft recommendation: Continue work on CMM-

Driver Command standard.• Draft recommendation: Harmonize current efforts.

Page 27: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Avoid Duplication of Effort!

• Draft recommendation: Avoid multiple standards for the same purpose; their existence is costly.

• Draft recommendation: Where there is overlap, harmonize.

• Draft recommendation: Harmonize AP 219 and DMIS.

• Draft recommendation: Forestall multiple standards for low-level inspection instruction commands.

Page 28: Intelligent Systems Division Manufacturing Engineering Laboratory Analysis of Standards Needs for Automated Metrology Thomas R. Kramer Guest Researcher,

NIST • Manufacturing Engineering Laboratory • Intelligent Systems Division

Questions and Discussion