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INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February 2008 SMB Update Dr. J. Thomas Chapin, Chair Dr. Norbert Fabricius, Secretary

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Page 1: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

INTERNATIONAL

ELECTROTECHNICAL

COMMISSION

© IEC:2007

IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems

12 February 2008 SMB Update

Dr. J. Thomas Chapin,

Chair

Dr. Norbert Fabricius,

Secretary

Page 2: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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Standardization of the technologies relevant to electrical and electronic products and systems in the field of nanotechnology in close cooperation with other IEC committees and ISO TC 229.1. Components / intermediate assemblies created from nano-scaled materials

and processes.

2. Properties and functionalities of these components / intermediate assemblies are electrical or electro-optical.

3. Final products using these components / intermediate assemblies are typically within the scope of other IEC TC's

4. Fields of activities are for example:a) electronics, b) optical aspects addressed by IEC TC’s, c) magnetics and electromagnetics, d) electroacoustics, e) multimedia and telecommunication,f) energy production (direct conversion into electrical power like in fuel cells,

photovoltaic devices, storage of electrical energy).

5. Specific topics: Terminology, measurement, characterization, performance, reliability and safety and environment related to the nanoscale.

Scope and SPS of IEC TC113

Page 3: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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KOREA, REP OFLATVIA (AM)LITHUANIA (AM)LUXEMBURGMACEDONIA

(AM)MALAYSIAMALTA (AM)MEXICONETHERLANDSNEW ZEALANDNIGERIA (AM)NORWAYPAKISTANPOLANDPORTUGALROMANIARUSSIAN FED

SAUDI ARABIASERBIA &

MONTENEGROSINGAPORESLOVAKIA SLOVENIASOUTH AFRICASPAINSRI LANKA (AM)SWEDENSWITZERLANDTHAILANDTUNISIA (AM)TURKEYUKRAINEUKUSAVIETNAM (AM)

IEC TC 113 Membership 14 Participating Members – 14 Observing Members

ARGENTINA

AUSTRALIA

AUSTRIA

BELARUS

BELGIUM

BOSNIA-HERZEGOVINA

BRAZIL

BULGARIA

CANADA

CHINA

COLOMBIA (AM)

CROATIA

CYPRUS (AM)

CZECH REP

DENMARK

EGYPTESTONIAFINLANDFRANCEGERMANYGREECEHUNGARYICELAND (AM)INDIAINDONESIAIRANIRELANDISRAELITALYJAPANKAZAKHSTAN (AM)KENYA (AM)KOREA, DPR OF (AM)

Page 4: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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IEC TC 113 ISO TC 229

WG3: Health, safetyenvironment

JWG2: Measurement,characterization

JWG1: Terminology,nomenclature

WG3: Performanceassessment

International Standardisation in Nanotechnology

Appointed Observer

A-liaison

IEC TC'sSEMI

IEEE

D-liaison

D-liaison

TC47

TC86TC111

D-Liaisons: SEMI and IEEE (under SMB ballot)

Page 5: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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JWG 1: "Terminology and Nomenclature" Scope: Define and develop unambiguous and uniform terminology

and nomenclature in the field of nanotechnologies to facilitate communication and to promote common understanding.

JWG 2: "Measurement and Characterization" Scope: Standardization of metrology and test methods and

consideration of reference materials used to characterize properties of mainly materials and structures in the field of nanotechnologies.

WG 3: "Performance assessment" Scope: To develop standards for the assessment of performance,

reliability, and durability related to the nanotechnology-enabled aspects of components and systems in support of continuous improvement at all stages of the value adding chain.

Working Group Structure of IEC TC113

Page 6: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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Liaison between IEC TC113 and ISO TC229

Every two years there will be a co-allocated plenary meeting to improve networking between the TC’s.

Chairman and Secretary attend the plenary meetings of the other committee.

Two Joint Working Groups with Convener and Co-Convener from both TC’s.

Regular consultancy of the officers of both TC’s.

Common IEC/ISO standards with coordinated voting are under consideration.

Common workshops will take place (e.g. 26.2.2008 - 28.2.2008, Gaithersburg, NIST USA).

Page 7: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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IEC TC 113 WG3 Programme of Work

Standards to characterize nano-specific product performanceFast "Screening Methods" to assess reliability and durabilityModelling of nano-related failure mechanisms

Fast standardized test methods for nano fabrication Identification of "Nano Key Control Characteristics" for Material and

Process SPC

Electronic-grade nano materials specificationsGeneric nano material specificationElectronic grade CNT specification

Page 8: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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Area of Nanotechnology Standardization

NanoScience

NanoMaterials &Processes

System Integration

NanoSubassembly

Subassembly #1

Subassembly #N

Nano-enabled Product

IEC TC 113

IECProduct TC's

Page 9: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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NanoScience

NanoMaterials &Processes

System Integration

NanoSubassembly

Subassembly #1

Subassembly #N

Nano-enabled ProductIEC

Product TC's

IEC TC 113

NanoscaleDrivenFailureModes

KCC‘s

KCC – key control characteristics

Area of Nanotechnology Standardization

Page 10: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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NanoScience

NanoMaterials &Processes

System Integration

NanoSubassembly

Subassembly #1

Subassembly #N

Nano-enabled Product

KCC – key control characteristics

Area of Nanotechnology Standardization

Prof. Young Hee Lee, Sungkyunkwan

University, KO

Samsung

Carbon nanotube

Page 11: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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NanoScience

NanoMaterials &Processes

System Integration

NanoSubassembly

Subassembly #1

Subassembly #N

Nano-enabled Product

Area of Nanotechnology Standardization

Page 12: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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IEC TC 113 Working Activities

New Work Items:

IEC/TC 113/WG3 - Specification for Carbon Nanotube Characteristics for Electrotechnical Applications

Meeting History:

IEC TC 113: 26-27 March 2007 in Frankfurt (1st TC 113 Plenary)

IEC TC 113/WG3 20-21 July 2007 in San Francisco

IEC TC 113: 04-07 December 2007 in Singapore (2nd TC 113 meeting, co-located with ISO/TC 229)

IEC TC 113/WG3: 08 April 2008 in Tokyo

IEC TC 113: 11-13 November 2008 in US (3rd TC 113 Plenary)

Page 13: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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Summary

IEC TC 113 is now active and has held 2 plenary meetings.

IEC TC 113 has established a strategic liaison with ISO TC 229.

Pursuing liaisons with other organizations involved in nanotechnology (SEMI, IEEE).

IEC TC 113 and ISO TC 229 have two Joint Working Groups with parallel activities.

IEC TC 113 WG3 has been established and now working on specific work items.

Page 14: INTERNATIONAL ELECTROTECHNICAL COMMISSION © IEC:2007 IEC TC 113 Nanotechnology Standardization for Electrical and Electronic Products and Systems 12 February

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Summary, cont’d.

IEC TC 113 is actively recruiting technical experts for working group activities.

IEC TC 113 developing an international survey on nanotechnology to help guide focus and priority.

IEC TC 113 created and staffed a Chairman’s Advisory Group (CAG) to help facilitate strategic and tactical planning for the TC. CAG composed of IEC TC 113 leadership plus 1 nominated representative from each NC.