isoelectronic systematization line strength factor:

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ISOELECTRONIC SYSTEMATIZATION Line Strength Factor: S if m i m f i | r/a o | f 2 Deduced from measured data: S if = [ if (Å) / 1265.38] 3 g i B if / i (ns) Parametrized: Z 2 S if S H + b/(Z-C) ; S H = 3n 2 (n 2 - 1) g i / 4

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ISOELECTRONIC SYSTEMATIZATION Line Strength Factor: S if   m i  m f  i | r/ a o | f  2. Deduced from measured data: S if = [  if ( Å) / 1265.38] 3 g i B if /  i (ns). Parametrized: Z 2 S if  S H + b /( Z - C ) ; S H = 3 n 2 ( n 2 -1) g i / 4. - PowerPoint PPT Presentation

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ISOELECTRONIC SYSTEMATIZATION

Line Strength Factor:

Sif mi mf

i | r/ao | f 2

Deduced from measured data:

Sif = [ if (Å) / 1265.38]3 gi Bif / i (ns)

Parametrized:

Z 2 Sif SH + b/(Z-C) ; SH = 3n2 (n2-1) gi / 4

Dirac Equation calculation

Singlet-Triplet Mixing

nsnp levels

INT

RES

1 and 2 free parameters:

Wolfe, PR 41, 443 (1932) (spin-other-orbit) King & VanVleck, PR 56, 464 (1939) (spin dep. radial wave fctn.)

sp

Alkaline-earthlike sequences

Can this be linearized?

Mixing Angles

MCDHF Calculations

8-1/2 =0.3535

5670

Radioacti

ve

All applications to here are n = 0 resonance transitions:Alkali-metallike ns – np Alkaline-earthlike ns2 – nsnp

Are these data-based semiempirical methods also applicable to other types of transitions?

Yes, but there are no data!Lifetime data exist, but branching fraction data are essentially

non-existent for multiply charged ions

Exceptions:

Differential Lifetime Measurements

18.786

Determination of branching fractions: Requires intensity calibration of detection apparatus as a function of wavelength

Standard lamps: continuum radiation fixed in laboratory beam light Doppler shifted

Line standards available in Visible, but not UV

Need in-beam ions with known intensity ratios

Si sequence

p2

S II : (Å)907, 911, 9131053, 10561167, 1173