keti ferrite beads x-rayユーザー会用 pptx20 summary and j-chip judgement optical analyses...
TRANSCRIPT
(2016.03.11 )
Introduction
4
• Specimen: Chip Bead
• Test: - Electrical property measurements- X-ray analyses- SEM analyses- Environmental tests
• Test term: 2015. 12. 10 ~ 2016. 03. 08
• Test environment: (25 ± 5) ℃, Below 75% room humidity
• Test apparatuses:- Precision impedance analyzer (4294A, Agilent, USA)- X-ray (Revolution, X-tek, USA)- Focused ion beam (Quanta 3D DualBeam, FEI, Netherland)- Temperature and humidity environmental test chamber (Excal 5425H,
Climates, France)
• Etc: Blind test
• Contact: Lee, Ju Ho ☎ +82-31-789-7282 / [email protected]
Introduction
5
• Test apparatuses:- Precision impedance analyzer (4294A, Agilent, USA)
Introduction
6
• Test apparatuses:- X-ray (Revolution, X-tek, USA)
Introduction
7
• Test apparatuses:- Focused ion beam (Quanta 3D DualBeam, FEI, Netherland)
Introduction
8
• Test apparatuses:- Temperature and humidity environmental test chamber
(Excal 5425H, Climates, France)
Specimens
9
A社社社社 1608
11
With a small dent
MAXECHO
A社社社社 2125
12
MAXECHO
A社社社社 2125
13
MAXECHO
B社社社社 1608
14
MURATA
B社社社社 2125
15
MURATA
B社社社社 2125
16
MURATA
C社社社社 1608
17
Samwha
C社社社社 2125
18
Samwha
C社社社社 2125
19
Samwha
20
Summary and J-chip judgement
Optical analyses result
<J-chip comment>
All of specimens are on problem except A1608. But, A1608 phenomenon is not severe which influence the electrical quality.
With a small dent
<A1608 optical analyses>
A社社社社 1608
22
MAXECHO
A社社社社 2125
23
MAXECHO
B社社社社 1608
24
MURATA
B社社社社 2125
25
MURATA
C社社社社 1608
26
Samwha
C社社社社 2125
27
Samwha
28
Summary and J-chip judgement
<J-chip comment>
All of specimens are no problem( satisfied with our expectations.)
<Multi layer ferrite beads>
X-ray analyses result