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User Guide

Keysight N5990A Test Automation Software Platform for SATA

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Manual Part Number N5990-91050

Edition Edition 3.0, September 2015

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Contents

N5990A User Guide for SATA 5

Contents

1 Introduction ..................................................................................................................9

1.1 What’s in This Chapter ....................................................................................9

1.1.1 Overview of This Guide......................................................................9

1.2 Document History ...........................................................................................9

2 N5990A Overview ........................................................................................................ 11

2.1 Test Automation Software Platform ............................................................... 11

3 Using Software ............................................................................................................ 13

3.1 Test Station Configuration ............................................................................. 13 3.1.1 Using Keysight IO VISA Connection Expert ...................................... 17

3.2 Starting Test Station ..................................................................................... 19 3.2.1 Configuring DUT ............................................................................. 20 3.2.2 Selecting, Modifying, & Running Tests ............................................ 23

3.2.2.1 System Calibration .......................................................... 25 3.2.2.2 Selecting Procedures....................................................... 25 3.2.2.3 Modifying Parameters ...................................................... 26 3.2.2.4 Running Procedures ........................................................ 27

3.2.3 Results ........................................................................................... 27 3.2.3.1 Run-Time Data Display .................................................... 28 3.2.3.2 MS-Excel Workbook ........................................................ 31 3.2.3.3 Smiley's Representation .................................................. 33

3.3 Oscilloscope Transmitter Test Integration ...................................................... 34 3.3.1 Using the Software ......................................................................... 34 3.3.2 Trouble Shooting ............................................................................ 37

3.3.2.1 Wrong version of the transmitter test application............. 38 3.3.2.2 Error message at start-up and connection fails ................ 38 3.3.2.3 Transmitter test application and oscilloscope seem to hang39

4 SATA Computer Bus Test Application .......................................................................... 41

4.1 Introduction .................................................................................................. 41

4.2 Supported Hardware Configurations ............................................................. 43

4.3 ValiFrame SATA Station ................................................................................ 43 4.3.1 ValiFrame SATA Station Configuration ............................................ 43

4.3.1.1 Data Generator ................................................................ 46 4.3.1.2 Error Detector ................................................................. 46 4.3.1.3 Rx BIST Control ............................................................... 46 4.3.1.4 Tx BIST Control................................................................ 47 4.3.1.5 Power Switch .................................................................. 47

4.3.2 Starting ValiFrame SATA Station..................................................... 49 4.3.3 Configuring the DUT ....................................................................... 50

4.3.3.1 DUT Parameters .............................................................. 51 4.3.3.2 Edit Parameters ............................................................... 53

Contents

6 N5990A User Guide for SATA

4.4 Calibration and Test Procedures.................................................................... 58 4.4.1 Example for Calibration and Test Procedure.................................... 58 4.4.2 Connection Diagram ....................................................................... 59 4.4.3 SATA Parameters Types .................................................................. 61

4.4.3.1 Sequencer Parameters .................................................... 62 4.4.3.2 Group Parameters ........................................................... 62 4.4.3.3 Procedure Parameters ..................................................... 63

4.5 SATA Calibration Procedures......................................................................... 64 4.5.1 Calibration Overview ....................................................................... 64 4.5.2 Group Parameters for Calibration.................................................... 65 4.5.3 De-Emphasis Calibration ................................................................ 65

4.5.3.1 Purpose ........................................................................... 66 4.5.3.2 Procedure........................................................................ 67 4.5.3.3 Connection Diagram ........................................................ 68 4.5.3.4 Parameters ...................................................................... 68 4.5.3.5 Dependencies.................................................................. 69 4.5.3.6 Results ............................................................................ 69

4.5.4 Random Jitter Calibration ............................................................... 71 4.5.4.1 Purpose ........................................................................... 72 4.5.4.2 Procedure........................................................................ 72 4.5.4.3 Connection Diagram ........................................................ 72 4.5.4.4 Parameters ...................................................................... 74 4.5.4.5 Dependencies.................................................................. 75 4.5.4.6 Results ............................................................................ 75

4.5.5 Sinusoidal Jitter Calibration ............................................................ 77 4.5.5.1 Purpose ........................................................................... 77 4.5.5.2 Procedure........................................................................ 78 4.5.5.3 Connection Diagram ........................................................ 78 4.5.5.4 Parameters ...................................................................... 78 4.5.5.5 Dependencies.................................................................. 79 4.5.5.6 Results ............................................................................ 79

4.5.6 Differential Voltage Calibration ....................................................... 81 4.5.6.1 Purpose ........................................................................... 81 4.5.6.2 Procedure........................................................................ 82 4.5.6.3 Connection Diagram ........................................................ 83 4.5.6.4 Parameters ...................................................................... 83 4.5.6.5 Dependencies.................................................................. 84 4.5.6.6 Results ............................................................................ 85

4.6 Receiver Test Procedures .............................................................................. 87 4.6.1 Dependencies for All Receiver Tests................................................ 88 4.6.2 Group Parameters for Receiver Group............................................. 89 4.6.3 Group Parameters for Data Rate specific Receiver Group Subgroups90 4.6.4 Rx Jitter Tolerance Test (RSG-01 Gen1, RSG-02 Gen2, and RSG-03 .. Gen3) ............................................................................................. 91

4.6.4.1 Purpose ........................................................................... 92 4.6.4.2 Procedure........................................................................ 92 4.6.4.3 Connection Diagram ........................................................ 93 4.6.4.4 Parameters ...................................................................... 94 4.6.4.5 Dependencies.................................................................. 94 4.6.4.6 Results ............................................................................ 95

4.6.5 RSG-05 Receiver Stress Test at +350 ppm (for 1.5 Gbit/s) .............. 96 4.6.5.1 Purpose ........................................................................... 97 4.6.5.2 Procedure........................................................................ 97

Contents


4.6.5.3 Connection Diagram ........................................................ 97 4.6.5.4 Parameters ...................................................................... 98 4.6.5.5 Dependencies.................................................................. 98 4.6.5.6 Results ............................................................................ 98

4.6.6 RSG-06 Receiver Stress Test with SSC (for 1.5 Gbit/s) .................. 100 4.6.6.1 Purpose ......................................................................... 101 4.6.6.2 Procedure...................................................................... 101 4.6.6.3 Connection Diagram ...................................................... 101 4.6.6.4 Parameters .................................................................... 102 4.6.6.5 Dependencies................................................................ 102 4.6.6.6 Results .......................................................................... 102

4.6.7 Rcvr Constant Parameter Stress Test ............................................ 104 4.6.7.1 Purpose ......................................................................... 104 4.6.7.2 Procedure...................................................................... 105 4.6.7.3 Connection Diagram ...................................................... 105 4.6.7.4 Parameters .................................................................... 105 4.6.7.5 Dependencies................................................................ 106 4.6.7.6 Results .......................................................................... 106

4.6.8 Rcvr Jitter Tolerance Test ............................................................. 108 4.6.8.1 Purpose ......................................................................... 109 4.6.8.2 Procedure...................................................................... 109 4.6.8.3 Connection Diagram ...................................................... 111 4.6.8.4 Parameters .................................................................... 111 4.6.8.5 Dependencies................................................................ 112 4.6.8.6 Results .......................................................................... 113

4.6.9 Rcvr Sensitivity Test ...................................................................... 115 4.6.9.1 Purpose ......................................................................... 116 4.6.9.2 Procedure...................................................................... 116 4.6.9.3 Connection Diagram ...................................................... 117 4.6.9.4 Parameters .................................................................... 117 4.6.9.5 Results .......................................................................... 117

4.6.10 Rcvr Data Rate Deviation Tolerance .............................................. 119 4.6.10.1 Purpose ....................................................................... 120 4.6.10.2 Procedure.................................................................... 121 4.6.10.3 Connection Diagram .................................................... 121 4.6.10.4 Parameters .................................................................. 122 4.6.10.5 Dependencies.............................................................. 122 4.6.10.6 Results ........................................................................ 122

4.6.11 Rcvr SSC Tolerance Test ............................................................... 124 4.6.11.1 Purpose ....................................................................... 124 4.6.11.2 Procedure.................................................................... 125 4.6.11.3 Connection Diagram .................................................... 125 4.6.11.4 Parameters .................................................................. 126 4.6.11.5 Dependencies.............................................................. 126 4.6.11.6 Results ........................................................................ 126

5 Troubleshooting and Support .................................................................................... 129

5.1 Log List and File .......................................................................................... 129

6 Appendix ................................................................................................................... 131

6.1 Data Structure and Backup ......................................................................... 131

6.1.1 ValiFrame Data Straucture............................................................ 131 6.1.1.1 Images .......................................................................... 131 6.1.1.2 Settings ......................................................................... 132

Contents


6.1.1.3 Pattern .......................................................................... 132 6.1.1.4 Calibrations ................................................................... 132 6.1.1.5 Tmp............................................................................... 132

6.1.2 ValiFrame Backup ......................................................................... 133

6.2 Remote Interface ........................................................................................ 134 6.2.1 Introduction .................................................................................. 134 6.2.2 Interface Description .................................................................... 134 6.2.3 Using the Remote Interface .......................................................... 136 6.2.4 Results Format ............................................................................. 139

6.3 Controlling Loop Parameters and Looping Over Selected Tests ................... 141 6.3.1 Connect()...................................................................................... 143 6.3.2 SetToDefault() .............................................................................. 143 6.3.3 Init().............................................................................................. 143 6.3.4 GetParameterList() and GetParameterValues() .............................. 143 6.3.5 SetNextValue().............................................................................. 143

6.3.5.1 Example ........................................................................ 144 6.3.6 Disconnect() ................................................................................. 144

6.4 IBerReader .................................................................................................. 145

6.4.1 IBerReader Interface ..................................................................... 147

6.5 Main Power Switch Control ......................................................................... 150

Introduction


1 Introduction

1.1 What’s in This Chapter

This chapter provides an introduction of this user guide.

1.1.1 Overview of This Guide

This guide provides a detailed description of the N5990A Test Automation Software Platfom.

1.2 Document History

First Edition

(September, 2014)

The first edition of this user guide describes functionality of software version N5990A

ValiFrame_2.23_SATA_2.20 or higher.

Second Edition

(October, 2014)

The second edition of this user guide describes functionality of software version N5990A ValiFrame_2.23_SATA_2.20 or higher.

Third Edition

(September, 2015)

The third edition of this user guide describes functionality of software version

N5990A ValiFrame_2.23_SATA_2.24 or higher.

N5990A Overview


2 N5990A Overview

2.1 Test Automation Software Platform

The Keysight Technologies N5990A Test Automation Software Platform “ValiFrame” is

an open and flexible framework for automating tests such as electrical compliance

tests for SATA bus.

The product runs on a standard PC that controls a wide range of test

hardware. Typically, the hardware comprises of instruments for

stimulus and response tests such as pattern generators, bit errror

ratio testers (BERTs), and oscilloscopes. Key elements of the

software platform are a test sequencer, receiver test libraries, and

interfaces to oscilloscope applications for transmitter tests.

Additional options are available, e.g. User Programming.

N5990A is impemented in C# within the Microsoft .NET Framework.

The software platform is specified in the data sheet 5989-5483EN,

incl. the PC requirements. Application examples for SATA

are given in the application notes 5989-5500EN.

Using Software


3 Using Software

3.1 Test Station Configuration

Test Station

Selection

The set of test instruments used for a specific application is referred to in the following as "Test Station" or short "Station". The test station is controlled by a

suitable PC and the N5990A Test Automation Software Platform. At first, ValiFrame

Station Configuration (Start > All Programs > BitifEye> <Application>) needs to be started prior to

“ValiFrame” (see Figure 3-1 and Figure 3-6).

When the ValiFrame Station Configuration is started, a window appears as shown in

Figure 3-2.

Figure 3-1: ValiFrame SATA Station Configuration Icon

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Figure 3-2: N5990A Station Selection Window

The available Test Stations are listed in a drop-down menu (highlighted in Figure

3-2). Multiple entries can be generated by User Programming (N5990A opt. 500) and

select the station to be used.

The N5990A Test Automation Software Platform supports the SATA

applications.

The N5990A primarily provides physical layer test automation.

The N5990A opt. 001 is the interface to SQL databases (and web browsers). In case

this option was purchased, the connection to the database application server is

established by unchecking the default "Database Offline" selection and entering the IP address of the server. Proceed with “Next” or quit with “Cancel”. Pressing the

“Next” Button opens a ValiFrame Station Configuration window as given in Figure

3-3.

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Figure 3-3: N5990A Station Configuration Window

Test Station

Configuration

Depending on the selected application in Figure 3-2. The ValiFrame Station

Configuration window shows the instruments or instrument combinations that are

needed. All the required instruments can be selected using the drop-down menus

here and click on “Next” button to continue.

The user must ensure that all the selected instruments for the test station are connected to the test station PC controller by remote control interfaces such as LAN,

USB, or GPIB.

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Figure 3-4: N5990A Instrument Configuration Window

After all required instruments have been selected in Figure 3-3, those are listed in

the ValiFrame Instrument Configuration Window (Figure 3-4). In order to control

instruments for use with the test station, instrument connections need to be

established by using specific hardware addresses as described in the following section. The "Mode" check box needs to be checked to set a specific instrument

status from "Offline" to "Online".

When starting a specific test station configuration for the first time, all instruments

are set to the “Offline” mode. In this mode the test automation software does not connect to any instrument. This mode can be used for demonstrations or checks.

Using Software


3.1.1 Using Keysight IO VISA Connection Expert

Introduction The Keysight IO VISA Connection Expert is recommended to setup new connections or verify existing connections. Start the Connection Expert with a right-click on the

VISA icon in the task bar and select “Keysight Connection Expert”. A window pops-up

as shown in Figure 3-5.

Figure 3-5: Keysight IO VISA Connection Expert Window

Under “Instrument IO on this PC”, select “Refresh All” (highlighted in Figure 3-5). For

each instrument that is needed, verify that an entry exists in the list in this column and that the icon for the instrument is green. The connection to instruments can be

verified by using the Keysight Visa Assistant, which is available in the same menu.

Once all the instruments to be used are listed properly, their address strings can be

entered in the ValiFrame Instrument Configuration Window (Figure 3-4). The

recommended way of doing this is by copying and pasting the instrument addresses

as follows:

Click on the “+” sign next to an instrument in the Connection Expert and its address

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will appear on a line below the instrument. Double click on this address and it will

appear in a box to the right. Copy the address, highlight the same instrument in the

Test Station Connection window, paste the address in the text field (highlighted in

Figure 3-4) and click “Apply Address”. Repeat this process for all instruments being

used, except the ParBERT and standard specific applications running on the

oscilloscope.

The applications running on the oscilloscope use a different technology to provide remote access to ValiFrame, called .NET Remoting. Communication is only possible

using the LAN connection of the oscilloscope and for this reason the IP address

needs to be used with this type of instrument.

Enter the instrument address in the text field as shown in Figure 3-4 and press

“Apply Address” to set it. Once all the instruments are set with the appropriate

addresses that may be used, select the instruments that will be used by the Test

Automation Software by checking the tick box next to “Offline” in the “Mode” column.

Use the “Check Connections” button to verify that the instrument addresses are valid.

Once you click the “Configure” button, the changes will be implemented and the Test

Station Configuration window will be closed.

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3.2 Starting Test Station

Start the ValiFrame test station with a double click on the icon on the desktop

(example for SATA test station given in Figure 3-6). Alternatively, start the ValiFrame

station from “Start / All Programs / BitifEye”.

Figure 3-6: ValiFrame SATA Test Station Icon

The ValiFrame N5990A will connect automatically to all instruments that are not set

to Offline mode in the Test Station Configuration (see Figure 3-4). It is ready for use

once all connections have been initialized successfully and the main menu will

appear as shown in Figure 3-7 .

Using Software


3.2.1 Configuring DUT

Once the N5990A main menu appeared, the DUT needs to be configured in order to proceed with testing. Click on the “Configure DUT” button in the tool bar or select

the “Configure DUT” option from the File menu (see Figure 3-7). A window will

appear as given in Figure 3-8.

Figure 3-7: ValiFrame Main Window

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Figure 3-8: Configure DUT Panel

The parameter selections available in the “Configure DUT” panel depend on the

specific application. Select all parameters which apply to the particular application to

configure the DUT. The selected DUT parameters and the information entered by the user will be shown in the measurement reports. It is also stored with the

measurement data in case a connection to a SQL database exists. As this information

will be used to retrieve data from the database, select unique identifiers and

descriptions.

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In most applications either Compliance or Expert Mode must be selected. In

compliance mode the tests run according to the specific test specification (such as

SATA). In expert mode the DUT can be characterized to determine performance margins. It is provided for advanced users and includes additional tests as well as

additional parameters to run tests differently than in compliance mode.

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3.2.2 Selecting, Modifying, & Running Tests

After the DUT has been configured, press the “OK” button in Configure DUT Panel.

The ValiFrame main window is displayed with the procedure tree as shown in Figure

3-9. It contains the list of calibration and test procedures, typically in the following

groups:

1. Calibration

2. Receiver tests

3. Transmitter tests

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Figure 3-9: M5990A Main Window with the Procedures

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Specific calibration or test procedures can appear multiple times as they might be

required for testing the DUT under various conditions. A typical example are multiple

data rates supported by the same DUT.

Use the “Properties” and “Log List” buttons of the main menu (highlighted in Figure

3-9) to display additional information on the right side and bottom of the ValiFrame

main window.

The parameter grid on the right side of the window shows the parameters which are related to the selected calibration or test procedure subgroups or to individual

procedures, These parameters can only be set before the execution of the procedure

subgroup or procedure is started. The log list in the bottom of the window shows

calibration and test status messages (regular progress updates as well as warnings and error messages).

3.2.2.1 System Calibration

It is necessary to calibrate the test system before running the first test, in order to

ensure that test results are consistent from run to run. Provided the equipment has achieved thermal stability before the calibration is started (typically after 30 min of

warm-up), the thermal environment is stable, and no system elements have been

exchanged, the calibration is very stable and may only have to be repeated once a

week or even less frequently. The calibration interval depends on the degree of accuracy desired. If the station is not calibrated prior to a DUT test, the results of the

previous calibration will be used for the current tests.

3.2.2.2 Selecting Procedures

The calibration, receiver, and transmitter test procedure groups can be selected globally by clicking on the check box at the top of the group. Alternatively, an

individual test procedure can be selected by checking the specific selection boxes in

front of the tests. Only the test procedures which are selected will be executed.

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3.2.2.3 Modifying Parameters

Most calibration and test procedures as well as the groups containing them have

parameters that control the details of how the procedures are run. In compliance mode most of these parameters are read-only. In expert mode almost all parameters

can be modified. First, select a specific calibration or test procedure or one of the

groups containing them in the ValiFrame procedure tree. The parameters should be

displayed in a property list on the right side of the screen. If they are not displayed, press the “Properties” button. Depending on the user selection on the left side of the

top of the list, the list is either ordered alphabetically or in categories. The test

parameters available can be changed individually (see Figure 3-10). The test

parameters selected are listed in the MS Excel test results worksheets, see Figure

3-12.

Figure 3-10: Editing the Test Parameters

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3.2.2.4 Running Procedures

To run the selected procedure, press the “Start” button (see Figure 3-9). The

procedures are run in the order shown in the procedure selection tree. Some

procedures may require user interaction such as changing cable connections or

entering DUT parameters. The required action is prompted in pop-up dialog boxes

prior to the execution as shown in Figure 3-11.

Figure 3-11: Connection Diagram Pop-up Window

3.2.3 Results

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3.2.3.1 Run-Time Data Display

Most procedures generate data output. While the procedure is running, the data is displayed in a temporary MS Excel worksheet, which opens automatically for each

individual procedure. An example is given in Figure 3-12 . See the Appendix for more

details about the file directories.

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Figure 3-12: Result MS-Excel Worksheet Example

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The MS-Excel worksheet is opened during the procedure run and closed once the

specific procedure is finished. As long as the N5990A Software is running, each

worksheet can be reopened with a double-click on the respective procedure. However, the individual worksheets will be lost when the N5990A main window is

closed, unless individual worksheets or a collection of them were saved by the user.

If a test or calibration procedure was run more than once, the list of results

is visible below the particular procedure after expanding the tree below the

procedure (see Figure 3-13).

Figure 3-13: Selecting the Repeated Procedure and Show Test Results

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3.2.3.2 MS-Excel Workbook

For user convenience, all individual worksheets are combined in a summary Excel workbook at the end of the test run. The workbook must be saved explicitly (File >

Save Results as Workbook...) as shown in Figure 3-14, otherwise it will be lost! After

all tests have been run, a test report document can be generated additionally for easy documentation and printing with the standard Print function of the File menu

(see Figure 3-14). An example test report for SATA is shown in Figure 3-15.

Figure 3-14: Save Results as Workbook

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Figure 3-15: Test Report Example

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3.2.3.3 Smiley's Representation

Once the selected procedures are run successfully, the smiley at the individual procedure indicates the result (Pass / Fail / Incomplete) by displaying its face in

specific ways as given below (see Table 1).

Smiley Description

It indicates that the procedure passed successfully at the previous run and the results are

available.

It indicates that the procedure passed successfully at the present run.

It indicates that the procedure was aborted/disturbed somehow and failed at the previous

run.

It indicates that the procedure was aborted/disturbed somehow and failed at the present run.

It indicates that the procedure failed at the previous run.

It indicates that the procedure failed at the present run.

Generally this kind of smiley displays two results such as the first half indicates that the

result of the present run and the second half shows the result of the previous run. In this

example, the first half indicates that the procedure passed successfully at the present run and the second half means that it was not completely run at the previous run.

Table 1: Smiley's Result Description Table

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3.3 Oscilloscope Transmitter Test Integration

Keysight Technologies provides a range of transmitter test applications for high-

speed digital interfaces. The transmitter test applications run on real-time

oscilloscopes of the Keysight 90000 series such as a DSO (Digital Sampling Oscilloscope). The transmitter test applications can be used stand-alone, without the

N5990A Test Automation Software Platform. For this use model, please refer to the

user documentation of the specific application.

The transmitter test applications however can be run through the N5990A Test

Automation Software Platform too. A remote interface is used to execute the

transmitter test procedures. For this model a test controller PC with the N5990A software needs to be connected to the oscilloscope via Ethernet, e.g. through a LAN

switch.

3.3.1 Using the Software

In the N5990A Test Station Configuration, the available transmitter test applications

are listed as instruments (see Figure 3-16 for the example of SATA). The IP address

of the oscilloscope has to be used as the instrument address. After entering the

address, the transmitter test application instrument needs to be set to “Online” with a click on its check-box. Push the “Check Connections” button to verify that the

connection works properly. If the transmitter test application is not already running

on the oscilloscope the N5990A Test Automation Software automatically starts it via

the oscilloscope firmware.

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Figure 3-16: Setting the TX Scope Application Online

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For most applications, the Configure DUT dialog separates the test procedures for

transmitter and receiver test by selecting the device type (“Transmitter” or

“Receiver”). Select “Transmitter” for running the transmitter tests and vice versa. The Configure DUT dialog shows the configuration parameters which apply to the SATA

application. The Configure DUT dialog allows to select the parameters as needed.

Figure 3-17: Configure DUT Dialog

The N5990A Main Window lists the transmitter tests in the test tree just like the

receiver tests, typically in a separate “Transmitter” group.

During the test run, the oscilloscope transmitter test application sends its connection

diagrams and pop-up dialog windows to the controller PC on which the N5990A Test

Automation Software is running. Once the oscilloscope application finished the test

run, the N5990A software will save the test results in a MS Excel worksheet which includes screen shots, data graphs, data tables and specification limits similar to the

Rx test report. For SATA, the transmitter test application requires a special test

pattern for the analysis. N5990A controls the DUT directly or indirectly (through test instruments) to configure the DUT for testing.

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3.3.2 Trouble Shooting

This section provides solutions for the following problems:

1. Wrong version of the transmitter test application

2. Error message at start-up and connection failures

3. Transmitter test application and oscilloscope seem to hang

Using Software


3.3.2.1 Wrong version of the transmitter test application

When starting the transmitter tests, the N5990A software compares the version of the transmitter test application which is currently installed on the oscilloscope with

the version which was tested with N5990A. In case the versions do not match, an error message will appear in the N5990A log file and a warning dialog will show

details about the latest tested version. The appropriate version of the transmitter test

application should be installed on the oscilloscope to avoid problems. Even if the

versions do not match, the N5990A Test Automation Software can try to run the transmitter tests. This may work if the changes between the transmitter test

application versions are small, but installing the officially supported version is always

strongly recommended.

3.3.2.2 Error message at start-up and connection fails

The connection to the transmitter test application must be established through Ethernet (LAN), however the firewall settings might not be set properly on the

oscilloscope or the controller PC. This might result in error messages when the

N5990A Test Automation Software tries to start the oscilloscope transmitter test application. In this case, check whether the following applications are added to the

firewall exception list:

1. Transmitter test application on the oscilloscope

2. N5990A Test Automation Software and N5990A Station Configuration on the controller PC

In case the controller PC has more than one LAN adapter, the .Net remoting back channel which displays the dialogs may not work and the oscilloscope application

may try to open the remoting back channel to an invalid address. To recover from

this, the LAN adapter which is connected to the oscilloscope should be set to be the

primary adapter. This might require help from a network administrator as the specific setting depends on the Windows version.

Using Software


If the connection and information dialogs from the oscilloscope are not displayed

properly, check the firewall settings first and then make sure that the LAN adapter

connected to the oscilloscope network is set to the primary one.

3.3.2.3 Transmitter test application and oscilloscope seem to hang

In general the transmitter test application expects a valid signal that can be used as

a trigger for the sampling but sometimes the signal is missing or too small, i.e. below the threshold.In this case the oscilloscope may appear to be frozen. This is expected

oscilloscope behavior because the oscilloscope trigger hardware stops the execution

of oscilloscope firmware as long as the trigger signal is missing. To exit from this state, apply a valid signal or reboot the oscilloscope and restart the N5990A software

to check the signals before starting transmitter tests if the required trigger signal is

unknown. Please report the test and test conditions to [email protected].

SATA Computer Bus

Test Application


4 SATA Computer Bus

Test Application

4.1 Introduction

This chapter describes the calibrations and test procedures conducted by

N5990A ValiFrame for SATA (Serial Advanced Technology Attachment) in

detail. The N5990A software implements the RSG (Receiver Signal

Requirements) tests according to the UTD (Unified Test Document)

specification and also offers some custom characterization tests to provide

more details on DUT behavior beyond the limits. The RSG tests are

conducted to verify that the receiver can handle maximum stress signals

according to the specification. Figure 4-1 illustrates a connection diagram for

the SATA Receiver Test Set-up.

SATA Computer Bus

Test Application


Figure 4-1: Example for SATA Receiver Test Setup

The N5990A Test Automation software supports the Keysight Technologies

Electrical Performance and Compliance Test Software N5411B for the SATA

Transmitter tests. A DSO (Digital Storage Oscilloscope) is required for

running N5411B software. Refer to Keysight N5411B SATA Compliance Test

Software data sheet for information about the supported models.

http://cp.literature.agilent.com/litweb/pdf/5990-3594EN.pdf

http://cp.literature.agilent.com/litweb/pdf/5990-3594EN.pdf

SATA Computer Bus

Test Application


4.2 Supported Hardware Configurations

ValiFrame N5990A SATA supports a range of hardware configurations based

on the Keysight J-BERT N4903B and Keysight J-BERT M8020A high-

performance serial BERTs (Bit Error Ratio Testers) and an Infiniium

oscilloscope. The 90000 model oscilloscope is recommended, but the 80000

oscilloscope model is also supported for backwards compatibility.

4.3 ValiFrame SATA Station

4.3.1 ValiFrame SATA Station Configuration

Refer to the ValiFrame “N5990A_Getting_Started_SATA.pdf” for instructions

on how to install and start the ValiFrame Test Automation software

platform. After the software has been installed, an icon is added to the

desktop as shown in Figure 4-2. Start the software with a double-click of the

left mouse button or, alternatively, start the application from “All Programs

> BitifEye > SATA > ValiFrame SATA Station Configuration”

Figure 4-2: SATA Station Configuration Icon

When the software is started, a window appears as shown in Figure 4-3. It

allows the “SATA station” to be selected.

http://www.bitifeye.com/cms/upload/Manuals/N5990A_Getting_Started_SATA.pdf

SATA Computer Bus

Test Application


Figure 4-3: SATA Station Selection Window

SATA Computer Bus

Test Application


To use the database connection for ValiFrame SATA, uncheck the

“Database Offline” check box and the “Application Server” text box is

enabled to enter the database server IP (Internet Protocol) address (see

Figure 4-3). After the SATA station has been selected, press “Next” button

to continue. A window pops up as shown in Figure 4-4.

Figure 4-4: SATA Station Configuration Window

The ValiFrame SATA Station Configuration Window (Figure 4-4) allows the

required instruments for SATA testing to be selected. It contains the

following options:

1. Data Generator

2. Error Detector

3. Rx BIST Control (Receiver Built-In Self-Test Control)

4. Tx BIST Control (Transmitter Built-In Self-Test Control)

5. Power Switch

SATA Computer Bus

Test Application


4.3.1.1 Data Generator

The data generator has two functions. It can train the DUT (Device Under

Test) into a special loopback test mode (BIST-L). It is also used to sends a

stressed test signal into the DUT when it is in the lopback mode. It can be

selected as:

JBERT M8020A

JBERT B

4.3.1.2 Error Detector

The error detector checks if the data looped back from the DUT (Device

Under Test) contains errors. It can be selected as:

JBERT M8020A

JBERT B

Serial Tek BusXpert

Custom DLL

4.3.1.3 Rx BIST Control

The Rx BIST control moves the DUT into loopback mode to perform the

tests. Typically this is a J-BERT with the second channel option. If the

second channel option is not available or the DUT needs some special

handling to go into loopback, there is the possibility of choosing a customer-

specific loopback activation method either manually or with a custom DLL to

integrate it into ValiFrame.

This option can be selected as:

Automated

Manual

Manual With Data Generator (for setting the data generator up like

in automated mode, but giving the user full control otherwise)

Custom DLL

SATA Computer Bus

Test Application


4.3.1.4 Tx BIST Control

Owing to the method of implementing the transmitter tests (by integrating

tests running in a separate application on the oscilloscope that sometimes

tries to take control of the JBERT), the Tx BIST control options are limited

to:

Automated

Manual

Custom DLL

4.3.1.5 Power Switch

This power switch has the following options:

Manual

NetIo230B

SynaccessNP

If it is chosen as Manual, the user needs to power cycle the DUT manually.

When it is selected as NetIo230B or SynaccessNP the DUT is power cycled

automatically.

In order to use the Power Switch, the ValiFrame option 008: Remote Power

Management Support is required.

For more details please refer to the Appendix section Main Power Switch

Control

After the SATA configuration has been selected, press the “Next” button to

continue. A window pops up as shown in Figure 4-5.

SATA Computer Bus

Test Application


Figure 4-5: SATA Instrument Configuration Window

After the installation process, all instruments are configured by default in

“Offline” mode. In this simulation mode, hardware does not need to be

physically connected to the test controller PC. ValiFrame cannot connect to

any instrument in this mode. In order to control the instruments that are

connected to the PC, the instrument address must be entered in the text box

shown in Figure 4-5. The address depends on the bus type that is used for

the connection, for example, GPIB (General Purpose Interface Bus) or LAN

(Local Area Network). Most of the instruments used in the SATA station use

a VISA (Virtual Instrument Software Architecture) connection. To determine

the VISA address, run the “VISA Connection Expert” (right-click on the VISA

icon in the task bar and then select the first entry “Keysight Connection

Expert”). Enter the instrument addresses in the “Station Configuration

Wizard”, for example, by copying and pasting the address strings from the

Connection Expert entries. After the address strings have been entered,

remove the “Offline” flag for all instruments needed and then press the

button “Check Connections” to verify that the connections for the

instruments are established properly.

SATA Computer Bus

Test Application


4.3.2 Starting ValiFrame SATA Station

Start the ValiFrame SATA station with a double click on the “ValiFrame

SATA” icon that appears on the desktop as shown in Figure 4-6.

Alternatively, start the ValiFrame SATA Station from “Start > All Programs

> BitifEye > SATA > ValiFrame SATA”. Starting the ValiFrame SATA

station opens the window shown in Figure 4-7.

Figure 4-6: ValiFrame SATA Icon

Figure 4-7: ValiFrame SATA User Interface

SATA Computer Bus

Test Application


4.3.3 Configuring the DUT

The DUT needs to be configured before any calibration or test procedure is

run. Pressing the “Configure DUT” button in Figure 4-7 displays a window

Figure 4-8.

Figure 4-8: Configure DUT Panel with and without Database Connection

SATA Computer Bus

Test Application


If the database option is selected in the ValiFrame SATA Station

Configuration window (see Figure 4-3), the Configure DUT panel appears as

shown in Figure 4-8. To configure the DUT with database connection, enter

values (any) for “Product Number”, “Serial Number”, and “Product ID”.

Then, click on the “Register Product” button to register the database

connection with the provided values. Clicking on the “Register Product”

button, enables the button “OK”. With a click on the “OK” button, the DUT

is configured with the selected parameters. The procedures run with the

database settings are stored at ValiFrame Webviewer and those can be

viewed by selecting the “Product Number” and “Serial Number” (these

values should be same as the provided values in Figure 4-8.

4.3.3.1 DUT Parameters

In Figure 4-8, the DUT parameters, such as DUT type, Data Rate, Spec

Version, and compliance mode or expert mode, can be selected. The DUT

Parameters are listed in Table 2.

Parameter Name Parameter Description

DUT

DUT Name Name of the DUT.

Serial Number Serial number of the DUT.

DUT Type This can be selected as:

Device

Host

These two types can be tested according to the

versions UTD 1.2, 1.3, 1.4, 1.4.2, and UTD 1.4.3. and also

have different specification limits and default BIST

activation settings.

Data Rate The value can be selected as:

1.5 Gbit/s

3.0 Gbit/s

6.0 Gbit/s

Spec Vers. The available versions are:

http://192.168.0.123/Vfwebviewer/

SATA Computer Bus

Test Application


UTD 1.2, 1.3, 1.4, 1.4.2, UTD 1.4.3 and 1.5.

Interface This can be “i” (internal), “m” (external) or “u”. “i” and

“m” use different spec limits but are identical

otherwise. “u” has a special calibration procedure for

gen3 hosts.

Description Description of the DUT.

Test

User Name User name text field.

Comment Text field for user comments.

Initial Start Time stamp of the start of the current test session.

Last Test Time stamp of the last test conducted in the current

session.

Compliance Mode Tests are conducted as mandated by the UTD. Most

parameters shown in the calibration and test

procedures are in read-only mode; they cannot be

modified by the user.

Expert Mode Calibrations and tests can be conducted beyond the

limits and constraints of the UTD. The parameters are

shown in the calibration and test procedures; they can

be modified by the user.

Additional characterization tests are available.

Edit Parameters This button enables some additional options (see 2.3.2

section) to be selected.

Table 2: DUT Parameter List

SATA Computer Bus

Test Application


4.3.3.2 Edit Parameters

A click on the “Edit Parameters” button in Figure 4-8 pops-up a window

(Figure 4-9) and the parameters in SATA Edit Parameters Panel are listed in

Table 3.

Figure 4-9: SATA Edit Parameters Panel

SATA Computer Bus

Test Application



Loopback Training

Use Switch When the “Use Switch” option is selected, it adds two

switches to the hardware setup to alternate

connections quickly between a separate BIST

activation tool and the data generator/error detector.

This option is only available when BIST initiation mode

is set to “Manual” or “Custom DLL”.

Maximum Retries for BIST

Training

This is the maximum number of loopback training

retries. If all retries fail the following test will be

considered as failed.

Power Switch Automation

Use power switch

automation

This checkbox controls if a remote controllable power

switch is used for power cycling the DUT. If this is

unchecked the remaining options related to it (Channel,

Off-On delay and Settling time) are disabled.

Channel This sets the channel number of the power switch

channel which is connected to the DUT.

Off – On delay (ms) This is the duration between turning the DUT off and

then turning it on again.

Settling time (ms) This is the wait time after the DUT is turned on and

before the test continues with loopback training.

Loopback Training drop-

down selection

This drop-down selection is used to control how

loopback training is done. It is disabled when “BIST

Control” is set to “Manual” or “Custom DLL”. The

default value is “Automatic”. In “Automatic” mode

ValiFrame uses internally created sequences for

loopback training. In “Custom” mode the user sets a

path to a directory containing custom loopback training

sequences, typically created with the SATA Link

Training Suite. In “Legacy” mode old sequences

imported from jbistgui can be used. “Legacy” mode is

only available when the data generator is set to

“JBERT B”.

Use Trigger This checkbox controls if a trigger from the DUT to the

J-BERT is used during loopback training. Most DUTs

work without a trigger, so this is disabled by default. It

is only available for hosts.

SATA Computer Bus

Test Application


Legacy Sequence

Manage Sequences Refer to Manage Sequences for a detailed explanation.

DUT Behavior

DUT transmits with SSC For receiver tests this setting is used to optimize the

error detector CDR unit setup.

For transmitter tests is controls which tests are

available. When the “DUT transmits with SSC” is

enabled, the transmitter tests related to SSC are

available. If it is disabled, a “long-term frequency

stability” test is available instead.

DUT uses protocol

loopback

If this option is selected, the J-BERT error detector

ignores all SATA primitives instead of only ALIGN

primitives. Some DUTs add additional primitives other

than ALIGN pairs to the data during loopback. This

behavior is not compliant with the SATA specification,

so this option is disabled by default.

Data Generator

Ignore voltage limits Choosing this option makes it possible to set voltage

levels higher than the specified limits. This should be

used only if it is absolutely needed. If this option is

used unnecessarily, it may damage or even destroy the

DUT if it is not designed to tolerate high voltage levels.

De-Emphasis

Use de-emphasis This checkbox controls if de-emphasis will be applied to

the test signal. Checking it also adds a de-emphasis

calibration procedure and parameters to set the desired

de-emphasis during tests. This is not required by the

SATA specification or UTD. This selection is available

for customer convenience.

De-Emphasis The calibrated de-emphasis for non-transition bits at

the TP2 test point.

Error Detector

Use full auto align The "Use full auto align" checkbox forces using

AutoAlign on the error detector every time the sample

point is adjusted. Without it TimeCenter is used

instead.

TimeCenter is a lot faster than AutoAlign. When the

DUT transmits a good signal both work equally well.

Forcing AutoAlign is useful for testing DUTs that

SATA Computer Bus

Test Application


transmit a signal with a deformed eye shape or not

properly centered around 0 V.

InfiniiSim

Rx Calibration Settings Opens a window where the user can control embedding

of a custom channel during receiver calibration by

setting paths to .tf4 files.

Tx Test Settings Opens a window where the user can control embedding

of a custom channel during transmitter tests. It is a

direct mapping of the options available in the

transmitter test app.

Table 3: SATA Edit Parameter List

4.3.3.2.1 Manage Sequences

The manage sequence button is only available in Legacy mode. It is used for

importing and managing loopback training sequences based on the external

“jbistgui” tool available from The University of New Hampshire

InterOperability Laboratory. Importing sequences is only needed when the

defaults for J-BERT based loopback activation do not work with a DUT.

Clicking on the “Manage Sequences” button displays a window as shown in

Figure 4-10. To import a sequence, first create the J-BERT setting that can

put the DUT into loopback setup using the “jbistgui” software. Then follow

the instructions given in the Manage BIST Training Sequences Panel.

https://www.iol.unh.edu/services/testing/sata/jbistgui_20110322.zip

https://www.iol.unh.edu/services/testing/sata/jbistgui_20110322.zip

SATA Computer Bus

Test Application


Figure 4-10: Manage BIST Training Sequences Panel

SATA Computer Bus

Test Application


4.4 Calibration and Test Procedures

During the execution of all calibration and test procedures, the results are

displayed automatically in a MS Excel worksheet graphically as well as in a

data table. Once a specific calibration or test procedure is finished, the MS

Excel worksheet is closed. To re-open it at any time, double click on the

respective procedure. All calibration and test data worksheets can be saved

in a workbook by selecting “File > Save Results as Workbook...” at any time.

It is recommended that this step is carried out at least at the end of each

ValiFrame run. If the calibration and test procedures are conducted during

the same ValiFrame run, the calibration and test result worksheets are

combined in the workbook. If a test procedure is conducted without prior

execution of calibration procedures in the same test run, only the test

results will be saved to the workbook. As a safety feature, all calibration and

test procedure results are saved by default to the ValiFrame “Tmp”

directory. In addition to the calibration data worksheets, the calibration data

files are also generated. These files are saved by default to the ValiFrame

calibrations folder (refer to “N5990A_Getting_Started_SATA.pdf”).

4.4.1 Example for Calibration and Test Procedure

All calibration and test procedures are included in the respective groups

such as “Calibration”, “Receiver”, “Transmitter”, and “OOB”. For most of

the calibration and test procedures, some specific parameters can be set in

expert mode by the user. In Figure 4-11 the “1.5 Gbit/s Random Jitter

Calibration” procedure is highlighted as an example and the respective

calibration parameters are shown on the right-hand side of the ValiFrame

user interface. This is achieved by clicking on the calibration name. To start

the calibration or test procedure, check the box corresponding to the

selected procedure. Then the “Start” button is enabled and colored green.

Pressing the “Start” button runs the calibration/test.

http://www.bitifeye.com/cms/upload/Manuals/N5990A_Getting_Started_SATA.pdf

SATA Computer Bus

Test Application


Figure 4-11: Example for SATA Calibration and Test Procedure

Before executing any calibration or test procedures, ensure that the SATA

Station Configuration is conducted properly with all necessary instruments

such as the Infiniium oscilloscope and J-BERT set to “online”. All procedures

can be run in offline mode, that is without any instrument connected. The

offline mode is intended for product demonstrations with simulated data.

CALIBRATIONS RUN IN OFFLINE MODE DO NOT GENERATE VALID

CALIBRATION DATA. TESTS RUN IN OFFLINE MODE DO NOT PRODUCE

VALID RESULTS.

4.4.2 Connection Diagram

The connection diagram is displayed by right-clicking on the desired test or

calibration and selecting “Show Connection” as shown in Figure 4-12.

Alternatively, the connection diagram is displayed automatically on starting

the selected test or calibration.

SATA Computer Bus

Test Application


Figure 4-12: Show Connection Diagram

The connection diagram changes according to the options selected in the

Edit Parameters window (Figure 4-9), such as “Use Switch” and “Use de-

emphasis”. Once the selected procedures are run successfully, the

individual procedures display the result by representing the smiley in

different styles such as given below (see Table 4: Smiley's Result

Description Table).

SATA Computer Bus

Test Application


Smiley Description

It indicates that the procedure passed successfully at the previous run and

the results are available.

It indicates that the procedure passed successfully at the last run

It indicates that the procedure was aborted/disturbed somehow and failed at

the previous run. It indicates that the procedure was aborted/disturbed somehow and failed at

the last run. It indicates that the procedure failed at the previous run.

It indicates that the procedure failed at the last run.

Generally this kind of smiley indicates two results such as the first half

indicates that the result of the last run and the second half shows the result

of the previous run. In this example, the first half indicates that the

procedure passed successfully at the last run and the second half represents

that the procedure was not completely run at the previous run.

Table 4: Smiley's Result Description Table

4.4.3 SATA Parameters Types

The SATA parameters are categorized as:

1. Sequencer Parameters

2. Group Parameters

3. Procedure Parameters

All these types of parameters are explained in the following sections.

SATA Computer Bus

Test Application


4.4.3.1 Sequencer Parameters

The sequencer parameters control the flow of the test sequencer, not the

behavior of individual procedures. They are identical across all versions of

ValiFrame. One of them, Repetitions, is available for all procedures and

groups in the procedure tree. The others are only available for procedures.

Like all other parameters the sequencer parameters are shown on the right

side of the ValiFrame user interface and they can be changed by the user.

Which parameters are visible depends on the selected element in the

procedure tree on the left side of the user interface. In Figure 4-11, the 1.5

Gbit/s Random Jitter Calibration is highlighted as an example. All sequencer

parameters are listed in alphabetical order in Table 5.


Procedure Error Case

Behavior

“Proceed With Next Procedure” or “Abort Sequence”,

selects what will happen if an error happens during

the procedure. Error in this context is defined as

something outside of the scope of what the procedure

is supposed to do normally that prevents it from

running.

Procedure Failed Case

Behavior

“Proceed With Next Procedure” or “Abort Sequence”,

selects what will happen if the procedure fails. For

calibrations failing in this context means the

measured data is inconsistent or indicates that

compliant testing is not possible with the used

hardware. For tests failing means the test finished

properly but the DUT did not pass.

Repetitions The number of times the group or procedure is going

to be repeated. If the value is '0', it runs only once.

Table 5: SATA Sequencer Parameters

4.4.3.2 Group Parameters

The group parameters are used for several related calibration or test

procedures. They are shown on the right side of the ValiFrame user interface

when the selected entry of the procedure tree on the left is a group instead

of an individual procedure as shown in Figure 4-13.

SATA Computer Bus

Test Application


Figure 4-13: SATA Common Parameters

4.4.3.3 Procedure Parameters

The Procedure Parameters are all parameters that do not fall into one of the

previously described categories. They are shown on the right side of the

ValiFrame user interface when the selected entry of the procedure tree on

the left is an individual procedure. They only change the behavior of that

single procedure. Procedures often have parameters with the same name,

but set settings always only apply on a per procedure basis. The meaning

may be slightly different depending on the procedure. These parameters are

listed in the chapters of the procedure they belong to.

SATA Computer Bus

Test Application


4.5 SATA Calibration Procedures

4.5.1 Calibration Overview

Before any receiver test procedure can be run, the SATA receiver test

system must be calibrated. The ValiFrame calibration plane is given by the

DUT input ports. The receiver test signal characteristics such as the SATA

signal generator output voltage level and jitter parameters are typically

affected by the signal transmission between the generator output ports and

the DUT input ports. Thus for any signal output parameter selected by the

user (set value), the jitter and the signal received at the DUT input ports

(actual value) deviate from the set value. Additional deviations can be

caused by effects such as offset errors, hysteresis, and nonlinear behavior of

the signal generator. The ValiFrame calibration procedures measure these

deviations so they can be compensated in the test procedures. All

calibration procedures required for SATA receiver testing are included in the

ValiFrame software. The ValiFrame calibration procedures are implemented

such that the calibration process is conducted as fast as possible and is

automated as much as possible, for example, by minimizing the number of

reconfigurations of the hardware connections.

SATA Computer Bus

Test Application


4.5.2 Group Parameters for Calibration

The parameters for the calibration group are listed in Table 6.


Embed Custom Channel Controls if a custom channel is embedded during

calibrations.

CIC Transfer Function File This shows the path to the transfer function file

containing the standard CIC definition for gen3 UHost

calibrations. Only visible if Embed Custom Channel is

false. Read-only.

Custom Channel Transfer

Function FIle

This is the path to a user-created custom transfer

function file that will be embedded during calibrations

(all expect for gen3 UHost). Only available if Embed

Custom Channel is true.

Custom Channel + CIC

Transfer Function File

This is the path to a user-created custom transfer

function file that will be embedded during gen3 UHost

calibrations. It should contain a transfer function

definition that is equivalent to adding the custom

channel definition and the standard CIC definition.

Only available if Embed Custom Channel is true.

Table 6: SATA Group Parameters for Calibration Procedures

4.5.3 De-Emphasis Calibration

The De-Emphasis Calibration procedure is available for all data rates when

the “Use de-emphasis” check box is checked in SATA Edit Parameters

Panel (see Figure 4-9: SATA Edit Parameters Panel).

SATA Computer Bus

Test Application


Figure 4-14: De-Emphasis Calibration

4.5.3.1 Purpose

This procedure calibrates the de-emphasis.

SATA Computer Bus

Test Application


4.5.3.2 Procedure

The pattern generator sends a Framed COMP pattern to the oscilloscope.De-

emphasis is applied to the data signal over several steps. The set de-

emphasis value starts with a value defined by the “Start De-Emphasis”

property (default 12 dB). The de-emphasis value is increased in linear steps.

At each step, the resulting de-emphasis value is measured using the

oscilloscope. The results are stored in pairs of set and measured values.

SATA Computer Bus

Test Application


4.5.3.3 Connection Diagram

Figure 4-15: Connection Diagram for De-Emphasis Calibration

4.5.3.4 Parameters


Start De-Emphasis This is the initial de-emphasis value set for the

calibration.

Table 7: SATA Parameters for De-Emphasis Calibration

SATA Computer Bus

Test Application


4.5.3.5 Dependencies

No calibration is required for this procedure.

4.5.3.6 Results

An example MS-Excel worksheet for the De-Emphasis Calibration procedure

is shown in Figure 4-16: MS-Excel Worksheet for De-Emphasis Calibration.

The result sheet contains the following data:

A calibration data graph

A parameter list

A calibration data table (refer to Table 8)

SATA Computer Bus

Test Application


Figure 4-16: MS-Excel Worksheet for De-Emphasis Calibration

SATA Computer Bus

Test Application



Set De-Emphasis This is the de-emphasis value set in the instrument.

Measured De-

Emphasis

This is the de-emphasis value measured at the test point.

Table 8: De-Emphasis Calibration Data Table

4.5.4 Random Jitter Calibration

The Random Jitter Calibration procedure is available for all data rates

Figure 4-17: Random Jitter Calibration

SATA Computer Bus

Test Application


4.5.4.1 Purpose

This procedure calibrates random jitter.

4.5.4.2 Procedure

The pattern generator sends the mid-frequency test pattern (MFTP) to the

oscilloscope. Random jitter is added to the data signal. The set RJ value

starts at 0 mUI and is increased in linear steps using the “Jitter Step Size”

value until the value of “Stop Jitter” is reached. At each set value, the

resulting RJ amplitude is measured using the RJ/DJ-separation software

(EZJIT Plus) on the oscilloscope. The results are stored in pairs of set and

measured values.


Refer to Figure 4-18 for the connection diagram.

SATA Computer Bus

Test Application


Figure 4-18: Connection Diagram for Random Jitter Calibration

SATA Computer Bus

Test Application


4.5.4.4 Parameters


Transitions The number of transitions (0 to 1 or 1 to 0) used for the jitter

measurement.

Stop Jitter This is the final jitter value for the calibration procedure.

Jitter Step Size The difference value of set jitter between two jitter

measurements.

De-Emphasis The de-emphasis for the non-transition bits used during

calibration. Read-only.

Table 9: SATA Parameters for Random Jitter Calibration Table

SATA Computer Bus

Test Application



No calibration is required for this method.

4.5.4.6 Results

An example MS-Excel worksheet for the Random Jitter Calibration

procedure is shown in Figure 4-19. The result sheet contains the following

data:


A parameter list


SATA Computer Bus

Test Application


Figure 4-19: Example MS-Excel Worksheet for Random Jitter Calibration

SATA Computer Bus

Test Application



Set Jitter This is the jitter amplitude value set in the instrument.

Measured Jitter This is the jitter amplitude value measured at the test

point.

Table 10: Random Jitter Calibration Data Table

4.5.5 Sinusoidal Jitter Calibration

This Sinusoidal Jitter Calibration is available for all data rates.

Figure 4-20: Sinusoidal Jitter Calibration

4.5.5.1 Purpose

This procedure calibrates the SJ value.

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4.5.5.2 Procedure

The pattern generator sends the mid-frequency test pattern (MFTP) to the

oscilloscope. Sinusoidal jitter is applied to the data signal. The procedure

uses up to eight SJ frequencies between 0 MHz and the value of “Max Jitter

Frequency”. The set SJ amplitude starts at 0 mUI and is increased in linear

steps using the value of “Jitter Step Size” until the “Stop Jitter” value is

reached. The calibration procedure iterates through all frequencies for each

set amplitude value before proceding to the next amplitude value. The

resulting SJ values at the test point are measured with the RJ/DJ-

separation software (EZJIT Plus Software) on the oscilloscope. The results

are stored in sets of one set jitter amplitude value and one resulting jitter

amplitude value per frequency.


The connection diagram is as shown in Figure 4-18.

4.5.5.4 Parameters


Transitions The number of transitions (0 to 1 or 1 to 0) used for the jitter

measurement.

Stop Jitter This is the final jitter value for the calibration procedure.

Jitter Step Size The difference value of set jitter between two jitter

measurements.

Max Jitter

Frequency

The highest frequency that is calibrated.



Table 11: SATA Parameters for Sinusoidal Jitter Calibration Table

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Versions below UTD 1.4 use the Random Jitter Calibration for this

procedure. The remaining versions (≥ UTD 1.4) do not require any

calibration.

4.5.5.6 Results

An example MS-Excel worksheet for the Sinusoidal Jitter Calibration

procedure is shown in Figure 4-21.

The result sheet contains the following data:


A parameter list

A calibration data table

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Figure 4-21: Example MS-Excel Worksheet for Sinusoidal Jitter Calibration


Set Jitter This is the sinusoidal jitter amplitude value set in the

instrument.

Sinusoidal Jitter (X MHz) This is the sinusoidal jitter amplitude value measured

at the test point for the frequency listed in the column

caption.

Table 12: Sinusoidal Jitter Calibration Data Table

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4.5.6 Differential Voltage Calibration

This Differential Voltage Calibration is available for all data rates.

Figure 4-22: Differential Voltage Calibration

4.5.6.1 Purpose

This procedure calibrates the differential voltage.

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4.5.6.2 Procedure

The method for the Differential Voltage Calibration changes depending on

the selected UTD version (see Figure 4-8). The basic principle of this

procedure is that the pattern generator sends a pattern to the real-time

oscilloscope. The set differential voltage value is increases over four linear

steps. At each step, the oscilloscope measures the resulting differential

voltage value. The results are stored in pairs of set and measured values.

4.5.6.2.1 Patterns

For the Framed COMP pattern a lone bit pattern (LBP) is used. This pattern

contains the following:

1. Five ‘0’s followed by one ‘1’ (1000001, lone ‘1’)

2. Five ‘1’s followed by one ‘0’ (0111110, lone ‘0’)

The lone bit has the lowest differential amplitude that can occur during the

transmission of valid 10-bit SATA symbols. For the calibration procedure,

either the full Framed COMP pattern or the LBP can be used.

4.5.6.2.2 Signal stress

The calibration can be done with or without inter-symbol interference (ISI),

RJ, and SJ.

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4.5.6.2.3 Measurement methods

Lone bit amplitude

The oscilloscope is triggered to find the measured values of the lone

bit and the amplitude of the bit.

Extrapolated eye opening

The inner eye height is measured with a histogram and extrapolated

to the required bit error rate (BER).

Fixed length eye opening

The inner eye height is measured over 5 E-6 UI.

Version Pattern Signal Stress Measurement Method

≤ UTD 1.3 Framed COMP No Lone Bit Amplitude

UTD 1.4 Framed COMP Yes Extrapolated Eye

Opening

UTD 1.4.2 LBP Yes Fixed Length Eye

Opening

UTD 1.4.3 Framed COMP Yes Fixed Length Eye

Opening with narrow

histogram

Table 13: Pattern, Signal Stress, and Measurement Method Details of UTD Versions Table



4.5.6.4 Parameters




Table 14: SATA Parameters for Differential Voltage Calibration

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No calibration is required for this procedure.

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4.5.6.6 Results

An example MS-Excel worksheet for the Differential Voltage Calibration


data:


A parameter list


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Figure 4-23: Example MS-Excel Worksheet for Differential Voltage Calibration

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Set Voltage This is the differential voltage (peak–peak) set at the

data generator.

Measured Voltage This is the differential voltage value measured at the

test point.

Table 15: Differential Voltage Calibration Data Table

4.6 Receiver Test Procedures

The basic principle of all SATA receiver tests (Figure 4-24) is as follows:

Train the DUT into the Far End Re-timed Loopback Mode (BIST-L)

Send the Framed COMP pattern with defined stress characteristics

Use the error detector to verify that the DUT loops back the correct

pattern without errors

This is how a single point of data is taken. Most tests will then continue to

change the signal stress to collect more data. If the DUT leaves the

loopback mode the test will try to re-initialize it.

If calibration data is available it will be used to make sure the signal stress

is at the correct level at the test point it is defined for. If the calibration data

is missing a warning message pops up. When the user explicitly ignores the

warning the tests can be run without the calibration data.

For Rx tests, the real-time oscilloscope is not needed.

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Figure 4-24: SATA Receiver Test Groups and Common Parameters

4.6.1 Dependencies for All Receiver Tests

All receiver tests use the same calibration data. The De-Emphasis

Calibration is only used when “Use de-emphasis” is enabled (see Figure

4-9). Apart from that, all receiver tests use all calibrations.

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4.6.2 Group Parameters for Receiver Group

The common parameters for the receiver test group are listed in Table 16.


Data Generator

Number of aligns in

Framed COMP pattern

This is the number of ALIGN primitives in each ALIGN

block in the test pattern used for receiver tests. This

setting has no effect on the part of the training

sequence before the looped test pattern.

De-Emphasis This is the de-emphasis value for the non-transition

bits used during receiver tests. Read-only.

Error Detector

Recovery Time This is the time after the loopback training or changing

signal stress the DUT is allowed to settle. Errors

during this time are ignored.

Use full AutoAlign This parameter controls how centering the sample

point in the error detector is done. If it is “true” a full

AutoAlign is used. If it is “false” TimeCenter is used

instead. TimeCenter is a lot faster than AutoAlign, but

AutoAlign is better at compensating for non-ideal DUT

transmitter signals.

Data Rate Mode This parameter controls how the BusXpert error

detector selects its data rate. It has two options,

‘Specific’ and ‘Automatic’. If it is set to “Specific” the

BusXpert is set up to expect the specific data rate at

which the procedure is running. If it is set to

“Automatic” the BusXpert is set up to find the correct

data rate automatically.This parameter is only

available if a BusXpert is selected as the error

detector.

BIST Training

Force Retraining When this parameter is “true”, a new loopback

training is always done when the SJ frequency

changed.

Always Power Cycle When this parameter is “true”, a power cycle is done

before starting loopback training. When it is set to

“false” the first attempt is done without a power

cycle. Loopback training retries always start with a

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power cycle.

Loopback Training Max

Retries

This is the maximum number of retries to train the

DUT into loopback mode.

BIST Activation Sequence This parameter displays the BIST sequence type

selected using the sequence drop-down menu in the

Edit Parameters window (see Table 3 for details).

Read-only.

Power Switch Automation

Use Power Switch

Automation

This parameter controls if a remote controllable power

switch is used for power cycling the DUT. If it is

“false”, all following parameters (Power Switch

Channel Number, Off-On delay, Settling Time) are

disabled.

Power Switch Channel

Number

This sets the channel number of the power switch

channel which is connected to the DUT.

Power Cycle Off-On Delay This is the duration between turning the DUT off and

then turning it on again.

Power Cycle Settling Time This is the wait time after the DUT is turned on and

before the test continues with loopback training.

Table 16: Receiver Tests Group Common Parameter List

4.6.3 Group Parameters for Data Rate specific Receiver Group Subgroups


Error Detector

CDR Bandwidth This is the loop bandwidth of the error detector clock data

recovery (CDR) unit.

CDR Peaking This is the loop bandwidth of the error detector clock data

recovery (CDR) unit. It can be set to “low”, “medium” or

“high”.

Transition

Density

This is the expected transition density at the error detector

used to optimize the internal CDR settings.

Table 17: SATA Group Parameters for Receiver Procedures at a Specific Data Rate (1.5 Gb/s, 3.0 Gb/s, 6.0 Gb/s)

Table

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4.6.4 Rx Jitter Tolerance Test (RSG-01 Gen1, RSG-02 Gen2, and RSG-03 Gen3)

The Rx Jitter Tolerance test is available for all data rates.

Figure 4-25: Rx Jitter Tolerance Test

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4.6.4.1 Purpose

This test verifies that the receiver is able to recover data in presence of

jitter. It is an official receiver compliance test that has to be passed in order

to obtain SATA certification. Separate versions of this test are available for

all data rates:

RSG-01 Gen1 Rx Jitter Tolerance Test runs at 1.5 Gbit/s



A compliant DUT must pass all the tests up to and including the one for the

highest supported data rate. Refer to the beginning of the Receiver Test

Procedures (page 87) for a description of the general operating principle of

all SATA receiver tests.

4.6.4.2 Procedure

The stress applied to the data signal is RJ and SJ. There is a set of

compliance frequencies for the SJ. For each frequency the DUT has to loop

back the pattern for the complete test duration without error. The test

duration for a single frequency at different data rates is given as:

10 minutes for RSG-01 Gen1 (1.5 Gbit/s)

5 minutes for RSG-02 Gen2 (3.0 Gbit/s)

2.5 minutes for RSG -03 Gen3 (6.0 Gbit/s)

The compliance jitter frequencies for UTD 1.2 are 5 MHz, 33 MHz, and 62

MHz. The compliance jitter frequencies for UTD 1.3 and higher versions are

5 MHz, 10 MHz, 33 MHz, and 62 MHz.

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Figure 4-26: Rx Jitter Tolerance Test

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4.6.4.4 Parameters


Number of

Allowed Frame

Errors

This is the number of frame errors that are allowed. The

default value is '0'.

Test Duration The duration of the frame error measurement at each SJ

frequency.

Data Generator

Differential

Voltage

The calibrated inner eye height at TP2.

Random Jitter

(RJ)

The amount of calibrated RJ added to the signal.

Total Jitter (TJ) The amount of calibrated TJ added to the signal. This is only

available for UTD versions < 1.4.

Sinusoidal Jitter

(SJ)

The amount of calibrated SJ added to the signal. This is only

available for UTD versions ≥ 1.4.

Data Rate

Deviation

A fixed deviation from the nominal data rate.

SSC Deviation Maximum amount of deviation from the nominal data rate due

to down-spread SSC modulation.

SSC Frequency The frequency of the SSC modulation.

Error Detector

Show Additional

Counters

Additional counters, such as the frame counter, are shown in

the result table.

Table 18: SATA Procedure Parameters for Rx Jitter Tolerance (RSG-01, RSG-02, RSG-03) Table


Refer to Dependencies for All Receiver Tests for details.

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4.6.4.6 Results

An example MS-Excel worksheet for the Rx Jitter Tolerance Test procedure

is shown in Figure 4-27. The result sheet contains the following data:

A parameter list

A data table with the tested SJ frequencies and measured frame errors

(refer to Table 19)

Figure 4-27: Example MS-Excel Worksheet for Rx Jitter Tolerance Test

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Result “Pass”/“Fail”, if the FER test at a specific frequency

is passed, the value is “Pass” otherwise “Fail”.

SJ Frequency This is the frequency value of the SJ that is applied to

the test signal.

Frame Errors The number of frame errors that occurred during the

observation time.

Table 19: Rx Jitter Tolerance Test Data Table

4.6.5 RSG-05 Receiver Stress Test at +350 ppm (for 1.5 Gbit/s)

It is available for only 1.5 Gbit/s data rate.

Figure 4-28: RSG-05 Receiver Stress Test at +350 ppm

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4.6.5.1 Purpose

This is the official receiver data rate deviation tolerance test that has to be

passed in order to obtain SATA certification. It was introduced in UTD

version 1.4 and so is not available for earlier versions. This test is always

performed at the data rate 1.5 Gbit/s even if the DUT supports higher data

rates.

4.6.5.2 Procedure

A data rate deviation of +350 ppm is applied to the data signal. The UTD

specifies that this test must run for at least 18 successive iterations of the

Framed COMP pattern, which is a bit more than 1 ms. The test runs for a

whole second.



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4.6.5.4 Parameters


Number of Allowed Frame

Errors

This is the number of frame errors that are allowed.

The default value is '0'.

Test Duration The duration of the frame error measurement.

Data Generator

Differential Voltage The calibrated inner eye height at TP2.

Random Jitter (RJ) The amount of calibrated RJ added to the signal.

Total Jitter (TJ) The amount of calibrated TJ added to the signal. This

is only available for UTD versions < 1.4.

SJ Frequency The frequency of the calibrated SJ added to the signal.

Sinusoidal Jitter (SJ) The amount of calibrated SJ added to the signal. This

is only available for UTD versions ≥ 1.4.

Data Rate Deviation A fixed deviation from the nominal data rate.

SSC Deviation Maximum amount of deviation from the nominal data

rate due to down-spread SSC modulation.


Error Detector

Show Additional Counters Additional counters, such as the frame counter, are

shown in the result table.

Table 20: SATA Procedure Parameters for RSG-05 Receiver Stress Test at +350 ppm

(for 1.5 Gbit/s) Table



4.6.5.6 Results

An example MS-Excel worksheet for the RSG-05 Receiver Stress Test at

+350 ppm procedure is shown in Figure 4-29. The result sheet contains the

following data:

A parameter list

A data table for the measured frame errors (refer to Table 21)

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Figure 4-29: Example MS-Excel Worksheet for RSG-05 Receiver Stress Test at +350ppm

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Result “Pass”/“Fail”, if the FER (Frame Error Rate) test at a

specific frequency is passed, the value is “Pass”

otherwise “Fail”.


observation time.

Table 21: RSG-05 Receiver Stress Test at +350 ppm Data Table

4.6.6 RSG-06 Receiver Stress Test with SSC (for 1.5 Gbit/s)

It is available for only 1.5 Gbit/s data rate.

Figure 4-30: RSG-06 Receiver Stress Test with SSC

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4.6.6.1 Purpose

This is the official receiver SSC tolerance test defined in the UTD. It is

defined as an informative test, so passing it is not required to obtain SATA

certification. It was introduced in UTD version 1.4 and so is not available for

earlier versions. This test is always performed at the data rate 1.5 Gbit/s,

even if the DUT supports higher data rates.

4.6.6.2 Procedure

The stress that is applied to the data signal for this test is 5000 ppm down-

spread SSC at 33 kHz and a Data Rate Deviation of –350 ppm. The UTD

specifies that this test must run for at least 18 successive iterations of the

Framed COMP pattern, which is a bit more than 1 ms. The test runs for a

whole second.



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4.6.6.4 Parameters



Errors




Data Generator












Error Detector



Table 22: SATA Procedure Parameters for RSG-06 Receiver Stress Test with SSC (for 1.5 Gbit/s) Table



4.6.6.6 Results

An example MS-Excel worksheet for the RSG-06 Receiver Stress Test with

SSC procedure is shown in Figure 4-31. The result sheet contains the

following data:

A parameter list

A data table for the measured frame errors (refer to Table 23)

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Figure 4-31: Example MS-Excel Worksheet for RSG-06 Receiver Stress Test with SSC


Result “Pass”/“Fail”, if the FER test at a specific frequency is

passed, the value is “Pass” otherwise “Fail”.


observation time.

Table 23: RSG-06 Receiver Stress Test with SSC Data Table

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4.6.7 Rcvr Constant Parameter Stress Test

It is available foe all data rates.

Figure 4-32: Rcvr Constant Parameter Stress Test

4.6.7.1 Purpose

The Rcvr Constant Parameter Stress Test examines the DUT with a

combination of jitter parameters where the Rcvr Jitter Tolerance Test or one

of the compliance tests raises a problem with the specific combination.

When the problem is already reduced to a single point, it avoids testing for a

range of frequencies.

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4.6.7.2 Procedure

This is a debugging test and very similar to the RSG-01/RSG-02/RSG-03 Rx

Jitter Tolerance Tests. The only difference is that only one FER

measurement is performed. The frequency of the SJ component can be

selected.



4.6.7.4 Parameters



Errors




Data Generator












Error Detector



Table 24: SATA Procedure Parameters for Rcvr Constant Parameter Stress Test Table

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4.6.7.6 Results

An example MS-Excel worksheet for the Rcvr Constant Parameter Stress

Test procedure is shown in Figure 4-33. The result sheet contains the

following data:

A parameter list

A data table for the measured Frame Errors

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Figure 4-33: Example MS-Excel Worksheet for Rcvr Constant Parameter Stress Test

Refer to Table 25 for parameter description.

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Result “Pass” or ”Fail”.

Frame Errors This is the number of frame errors occurred during the

observation time.

Table 25: Rcvr Constant Parameter Stress Test Data Table

4.6.8 Rcvr Jitter Tolerance Test

This test is available for all data rates.

Figure 4-34: Rcvr Jitter Tolerance Test

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4.6.8.1 Purpose

The Rcvr Jitter Tolerance Test determines how much jitter a DUT can

tolerate at different SJ frequencies.

4.6.8.2 Procedure

The test procedure depends on the selected value of the Search Algorithm

property. The different types of Search Algorithms are explained below. The

selected algorithm is sequentially used over a range of jitter frequencies

defined with the Min Jitter Frequency, Max Jitter Frequency, Number of

Frequency steps and Include Compliance Frequencies properties. At each

jitter frequency value the maximum jitter amplitude where the DUT produced

no more frame errors than the Number of Allowed Frame Errors is stored as

the max passed jitter value.

The result is a curve that shows the maximum jitter that the DUT can

tolerate over the SJ frequency. It reflects the Rx clock data recovery (CDR)

characteristics of the DUT. Typically the CDR can follow low frequency jitter

(f < Rx phase-locked loop (PLL) bandwidth) better than high frequency jitter

(f > Rx PLL bandwidth).

All search algorithms start with a jitter amplitude value defined by the “Start

Sinusoidal Jitter” property value.

Search Algorithms:

LinearUp

This algorithm increases the applied jitter amplitude linearly with

the value of “Jitter Step Size” until a test point is failed.

LinearUp2Layer

This algorithm first increases the applied jitter amplitude linearly

using large steps. When an error is found, it jumps back to the

previous test point (which passed the test) and starts increasing

linearly again with small steps of “Jitter Step Size” value. The size

of the larger steps depends on the relation between Jitter Step Size

and difference between the maximum jitter possible with the setup

and the “Start Sinusoidal Jitter” property value. It is calculated as:

Small Step ∗ √((Max Jitter − Start Jitter) Small Step)⁄

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LinearUpHysteresis

This algorithm first increases the applied jitter amplitude linearly

using large steps. When an error is found it goes back to the

previous test point (which passed the test) and tests that one again.

If it fails with the applied jitter amplitude is decreased using mid-

sized steps until a test point succeeds. From there the applied jitter

amplitude is increased again using small steps (the selected “Jitter

Step Size” value) until an error is found again. The value of the large

step size is calculated the same way as for LinearUp2Layer. The size

of the medium steps is calculated as:

Small Step ∗ √(Big Step Small Step⁄ )

The stepping down with the mid-sized steps is conducted to ensure that

DUTs with hysteresis are not stuck in their failed-state when the final part of

the search algorithm starts. For DUTs that do not have any hysteresis the

search is performed almost exactly like LinearUp2Layer. There is only one

test point more.

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4.6.8.4 Parameters



Errors

This is the number of frame errors that are allowed. The default

value is '1'.

Number of Frames The number of frames used for frame error measurement.

Frequency Mode It can be selected as:

Compliance Frequencies

Equally Spaced Frequencies

User Defined Frequencies

Single Frequency

Frequency Scale It is chosen as Linear or Logarithmic scale.

Min Jitter Frequency The first jitter frequency used for the test.

Max Jitter Frequency The last jitter frequency used for the test.

Number of Frequency

Steps

The number of different jitter frequencies that are tested. The

distribution of frequencies between minimum and maximum is

equidistant on a either a logarithmic or a linear scale, depending

on the “Frequency Scale” value.

Include Compliance

Frequencies

If this value is set to true the test uses the compliance jitter

frequencies in addition to the frequencies defined by the other

parameters.

Start Sinusoidal Jitter It is the initial value of the SJ for the procedure.

Jitter Step Size It is the jitter value to be increased/decreased at each step of the

procedure.

Search Algorithm Select how the test searches for the fail point for each frequency.

Data Generator




SSC Deviation Maximum amount of deviation from the nominal data rate due to

down-spread SSC modulation.


Table 26: SATA Procedure Parameters for Rcvr Jitter Tolerance Test Table

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4.6.8.6 Results

An example MS-Excel worksheet for the Rcvr Jitter Tolerance Test


data:

A test data graph

A parameter list

A data table for the measurement results (refer to Table 27)

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Figure 4-35: Example MS-Excel Worksheet for Rcvr Jitter Tolerance Test

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Sinusoidal Jitter

Frequency

This is the value of SJ frequency applied to the test signal.

Max Passed Jitter This is the maximum value of SJ that the DUT can tolerate at a

specific SJ frequency.

Jitter Capability Test

Setup

This is the maximum value of jitter that the test setup can

generate at a specific SJ frequency.

Min Spec This is the smallest value of jitter that the DUT must tolerate in

order to pass the test.

Margin This is the margin between the max passed jitter and min spec.

Table 27: Rcvr Jitter Tolerance Test Data Table

4.6.9 Rcvr Sensitivity Test


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Figure 4-36: Rcvr Sensitivity Test

4.6.9.1 Purpose

The Rcvr Sensitivity Test determines the minimum eye opening (differential

voltage) the DUT can tolerate.

4.6.9.2 Procedure

This test starts with the differential voltage set to the “Start Voltage” value.

It is decreased linearly by the “Voltage Step Size” value each step until

either an error is found or the “Stop Voltage” value is reached without an

error. The minimum passed value is the last test point that did not return an

error.

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4.6.9.4 Parameters



Errors


value is '1'.


Start Voltage The value at which the test starts with initial calibrated eye

opening at TP2.

Stop Voltage The last calibrated eye opening at TP2.

Voltage Step Size The amount the calibrated eye opening at TP2 is changed from

step to step.

Data Generator



Sinusoidal Jitter (SJ) The amount of calibrated SJ added to the signal.





Table 28: SATA Procedure Parameters for Rcvr Sensitivity Test Table

4.6.9.5 Results

An example MS-Excel worksheet for the Rcvr Sensitivity Test procedure is

shown in Figure 4-37. The result sheet contains the following data:

A parameter list

A data table for the min passed differential voltage, min spec, and

margin (refer to Table 29)

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Figure 4-37: Example MS-Excel Worksheet for Rcvr Sensitivity Test

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Min Passed Differential

Voltage

This is the minimum differential eye opening that the DUT can

tolerate.

Min Spec This is the minimum differential eye opening for which the DUT

must pass the test.

Margin This is the margin between min passed differential voltage and

min spec.

Table 29: Rcvr Sensitivity Test Data Table

4.6.10 Rcvr Data Rate Deviation Tolerance


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Figure 4-38: Rcvr Data Rate Deviation Tolerance

4.6.10.1 Purpose

This test determines the maximum data rate deviation (positive and

negative) the DUT can tolerate.

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4.6.10.2 Procedure

The test starts with a data rate deviation value of '0' ppm. The data rate

deviation is decreased linearly with large steps until either the value of “Min

Deviation” is reached or an error is found. When an error is found, the data

rate deviation is set back to the last passed test point. From there it is

decreased linearly again with smaller steps (“Deviation Step Size” value)

until an error is found. The minimum passed value is the final test point that

returns no error. The larger step size value used for this test depends on the

relation between “Deviation Step Size” and “Min Deviation”. It is calculated

as:

Deviation Step Size ∗ √(∣∣(Min Deviation)∣∣ Deviation Step Size⁄ )

For the default values of Deviation Step Size = 10 ppm and Min Deviation =

–1000 ppm, the value of an initial step size is 100 ppm.

Once the minimum passed value has been found, the test performs the

same method for the upper limit with “Max Deviation” and positive steps

instead of “Min Deviation” and negative steps.

This algorithm avoids initializing a DUT repeatedly, which makes the DUT

come out of loopback mode. If an error occurs, it requires fewer test points

than a simple linear search.



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4.6.10.4 Parameters



Errors


value is '1'.


Deviation Step Size The minimum distance between two tested data rate deviations.

Min Deviation If no error occurs, this is the lowest data rate deviation that is

tested.

Max Deviation If no error occurs, this is the highest data rate deviation that is

tested.

Data Generator








Table 30: SATA Procedure Parameters for Rcvr Data Rate Deviation Tolerance Table



4.6.10.6 Results

An example MS-Excel worksheet for the Rcvr Data Rate Deviation Tolerance

Test procedure is shown in Figure 4-39. The result sheet contains the

following data:

A parameter list

A data table for the min passed data rate deviation and max passed

data rate deviation (refer to Table 31)

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Figure 4-39: Example MS-Excel Worksheet for Rcvr Data Rate Deviation Tolerance Test


Result “Pass”or ”Fail”.

Min Passed Data Rate

Deviation

This is the minimum data rate deviation that the DUT can tolerate.

Max Passed Data Rate

Deviation

This is the maximum data rate deviation that the DUT can

tolerate.

Table 31: Rcvr Data Rate Deviation Tolerance Test Data Table

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4.6.11 Rcvr SSC Tolerance Test


Figure 4-40: Rcvr SSC Tolerance Test

4.6.11.1 Purpose

This test determines the maximum down spread SSC the DUT can tolerante.

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4.6.11.2 Procedure

The test sequentially steps through a range of SSC frequencies defined with

the “Min SSC Frequency”, “Max SSC Frequency” and “Number of SSC

Frequency Steps” properties. At each SSC frequency value the maximum

SSC amplitude where the DUT produced no more frame errors than the

“Number of Allowed Frame Errors”value is stored as the max passed SSC

value. The next paragraph describes how that value is determined for a

given SSC frequency value.

The test starts with an SSC deviation value of '0' ppm. The deviation value is

increased using large steps until either the value of “Max SSC Deviation” is

reached or an error is found. When an error is found, it goes back to the

previous passed test point. Then the deviation value is increased again, this

time with smaller steps (the selected “SSC Step Size” value) until an error

occurs again. The maximum passed value is the last test point that did not

return an error. The step size value for the larger steps at the beginning

depends on the relation between the “SSC Step Size” and “Max Deviation”.

It is calculated as:

SSC Step Size ∗ √(∣(Max SSC Deviation)∣ SSC Step Size⁄ )

For the default values of SSC Step Size = 50 ppm and Max Deviation = 5000

ppm, the initial step size is 500 ppm.

This algorithm avoids initializing a DUT repeatedly, which makes the DUT

come out of the loopback mode. If an error is encountered, it requires fewer

test points than a simple linear search.



SATA Computer Bus

Test Application


4.6.11.4 Parameters



Errors


value is '1'.


SSC Step Size The minimum distance between two tested SSC values.

Max SSC Deviation If no error occurs, this is the maximum SSC value to be tested.

Min SSC Frequency This is the minimum value of the SSC frequency to be used for the

procedure.

Max SSC Frequency This is the highest SSC frequency value to be tested.

Number of SSC Frequency

Steps

It is the number of different SSC frequencies to be tested. The

distribution of frequencies between minimum and maximum is

equidistant.

Data Generator






Table 32: SATA Procedure Parameters for Rcvr SSC Tolerance Test Table



4.6.11.6 Results

An example MS-Excel worksheet for the Rcvr SSC Tolerance Test procedure

is shown in Figure 4-41. The result sheet contains the following data:

A test data graph

A parameter list

A data table for the SSC frequency and max passed deviation (refer

to Table 33)

SATA Computer Bus

Test Application


Figure 4-41: Example MS-Excel Worksheet for Rcvr SSC Tolerance Test

SATA Computer Bus

Test Application



Result “Pass”or ”Fail”.

SSC Frequency This is the value of the SSC frequency applied to the test signal.

Max Passed Deviation This is the highest SSC value that the DUT can tolerate.

Table 33: Rcvr SSC Tolerance Test Data Table

Troubleshooting and Support


5 Troubleshooting and Support

5.1 Log List and File

In the case of problems the Log List can often help identifying the root cause. To activate the Log List, click on the Log List button. The log file can be accessed by

right-clicking within the Log List section as

shown in Figure 5-1. Note that all log information will be lost when the N5990A

application is terminated unless the log file is saved manually.

Troubleshooting and Support


Figure 5-1: ValiFrame N5990A Log List and File

In case of persisting problems with an application, send the Log File with a problem

description to: [email protected]

Appendix


6 Appendix

6.1 Data Structure and Backup

6.1.1 ValiFrame Data Straucture

All ValiFrame internal data is saved in the application data folder:

"Documents and Settings\All Users\Application Data\BitifEye \ValiFrame" for Windows XP or "ProgramData\BitifEye\ValiFrame" for Windows 7.

Windows hides the system folders by default. To make the application data folder

visible, the "Hidden Files and Folders" setting needs to be set to "Show hidden files

and folders" in the Windows file explorer > View settings.

The ValiFrame application data folder contains the following folders:

Images

Settings

Pattern

Calibrations

Tmp

6.1.1.1 Images

The "Images" folder contains the connection diagram images.

Appendix


6.1.1.2 Settings

The “Settings” folder contains the default setting file for the instrument and .vset files which contains the changes to the default registry entries. For each application, a

sub folder is created and a ValiFrame.vset file is created in this sub folder as soon as any ValiFrame setting is changed from its default. The settings files contain for

example the instrument connection setup.

6.1.1.3 Pattern

The Pattern folder contains the test pattern files. These are text files which contain

the pattern in hexadecimal format.

6.1.1.4 Calibrations

The calibration data is stored in the “Calibrations” folder. For each calibration

procedure at least one calibration file is stored. These files are text files and can be

imported into MS Excel.

6.1.1.5 Tmp

All temporary files are created in the Tmp folder. The sub folder "Results" contains the Excel file of the final result of each calibration and test procedure. This is a safety

feature and these files are used for recovery in case the user forgot to save them.

Appendix


6.1.2 ValiFrame Backup

Use the ValiFrame application data folder to save calibration data, modified test pattern or settings for backup or transfer to another PC.

The files in the folders, “Images” and “Pattern” will be generated or if they already

exist, be overwritten during a ValiFrame installation. In the “Settings” folder, all instrument settings are overwritten by the installation except the .vset files. In the

“Calibration” folder, all files are generated by the calibration procedures and will not

be overwritten by the installation. To compare or archive the calibration data, backup

the “Calibration” folder.

Appendix


6.2 Remote Interface

6.2.1 Introduction

The N5990A ValiFrame remote interface allows ValiFrame functionality (such as test setup information, calibration and test procedures, and results) to be accessed from

external programming environments, for example MS.NET/C#, VEE, LabView,

TestExec SL, or TestStand. The remote interface can thus be used to control N5990A by external software. In typical use, a top-level external test sequencer takes

advantage of ValiFrame functionality.

If ValiFrame is to be used as a top-level test sequencer, the control of external software is achieved with N5990A opt. 500, User Programming. Refer to the User

Programming Manual for details.

6.2.2 Interface Description

The ValiFrame functionality is accessible via ValiFrameRemote.dll. It contains a class

ValiFrameRemote in the BitifEye.ValiFrame.ValiFrameRemote namespace (see Figure

6-1). Its use is illustrated by the ValiFrameRemoteTester application. The source code

and the Visual Studio solution of this example are available on the BitifEye support webpage. Using this interface requires that the ValiFrame dlls are either in the same

folder or the Windows Path variable contains the folder in which these dlls are

located.

Appendix


Figure 6-1: Members of the ValiFrameRemote Class

Appendix


6.2.3 Using the Remote Interface

1. Add the ValiFrameRemote.dll as a reference to the project.

2. Create an instance of the ValiFrameRemote class.

3. Call SetConfigurationFile(string filename), if it is needed. It is required only when the station configuration file generated by the station configurator is

not to be used. This file format is same as the files generated by the station

configurator, which can be found in the Valiframe Application data folder (Windows XP: C:\documents and settings\all users\application

data\bitifeye\valiframe\settings\<application name>\ValiFrame.vset, or

Windows 7: c:\programdata\bitifeye\valiframe\settings\<application

name>\ValiFrame.vset). The station configuration files contain just the

differences to the registry. Refer to Figure 6-2 for more details.

4. By calling InitApplication(string applicationName), the instruments of the

selected Test Station (see section 3.1) are connected and initialized. The

applicationName is SATA.

5. Call either ConfigureApplication() or LoadProject(string filename)

to initialize the DUT properties and test procedures. The project file

can be generated with the ValiFrame User Interface and it contains

the DUT properties, the selected test procedures and the properties

of each test procedure.

6. Calling Configure Application() prompts a dialog for setting the DUT

properties.

The number and type of available test procedures can depend on the DUT properties!

7. Get the list of available procedures with GetProcedures(out int[]

procedureIds, out string[] procedureNames[]).

8. Select procedures individually with SelectProcedures(int[] procedureIds) or

combined with Run(int[] procedureIds, out stringxmlResult).

9. Execute selected procedures by calling any of the Run functions given below:

10. The Run(out string[]xmlResults) executes all selected procedures. The results

of all procedures executed are returned at the end of the execution of all

selected procedures.

The RunProcedure(int id, out string xmlResult) executes a single procedure

and returns the result in an xml formatted string.

The RunProcedures(int[] procedureIds, out string[] xmlResults) executes

the list of procedures given in the procedureIds array.

The StartRun() function returns immediately. It is mainly used for

event-driven programming. In this case the events StatusChanged()

and ProcedureCompleted() can be used to determine the actual status of the ValiFrame sequencer and read the results. The ProcedureCompleted() event

provides the ID and the xmlResult of the procedure completed. After the run

the xmlResults are also available via the Result property.

Appendix


<?xml version="1.0" encoding="utf-8" standalone="yes"?> <Folder name="ValiFrame"> <Folder name="Stations"> <Folder name="SATA Station"> <Folder name="Instruments"> <Folder name="Instrument8"> <Property name="Address">TCPIP0::192.168.0.112::inst0::INSTR</Property> <Property name="Offline">False</Property> </Folder> <Folder name="Instrument9"> <Property name="Address">192.168.0.112</Property> <Property name="Offline">False</Property> </Folder> <Folder name="Instrument12"> <Property name="Offline">False</Property> <Property name="Address">TCPIP0::192.168.0.111::inst0::INSTR</Property> <Property name="Timeout">00:00:30</Property> <Property name="Description">M8020A J-BERT with integrated jitter sources for FER tests</Property> <Property name="Dll">VFAgM8000.dll</Property> </Folder> <Folder name="Instrument13"> <Property name="Offline">True</Property> <Property name="Address">TCPIP0::192.168.0.120::inst0::INSTR</Property> <Property name="Timeout">00:01:00</Property> <Property name="Description">DCA-J with differential TDR module, needed for Tx/Rx tests</Property> <Property name="Dll">VFAgDca.dll</Property> </Folder> <Folder name="Instrument14"> <Property name="Offline">True</Property> <Property name="Address">TCPIP0::192.168.0.102::inst0::INSTR</Property> <Property name="Timeout">00:01:00</Property> <Property name="Description">Signal generator used to generate SSC</Property> <Property name="Dll">VFAgE4438C.dll</Property> </Folder> <Folder name="Instrument15"> <Property name="Offline">True</Property> <Property name="Address">GPIB0::12::INSTR</Property> <Property name="Timeout">00:01:00</Property> <Property name="Description">Triangle source used to generate SSC</Property> <Property name="Dll">VFAg33250A.dll</Property> </Folder> <Folder name="Instrument16"> <Property name="Offline">True</Property> <Property name="Address">4000</Property> <Property name="Timeout">00:01:00</Property> <Property name="Description">SerialTek BusXpert protocol analyzer</Property> <Property name="Dll">BusXpert.dll</Property> </Folder> <Folder name="Instrument17"> <Property name="Offline">False</Property>

Appendix


<Property name="Address">192.168.0.113;username;password</Property> <Property name="Timeout">00:01:00</Property> <Property name="Description">Main power switch</Property> <Property name="Dll">VFNetIo230B.dll</Property> </Folder> </Folder> <Folder name="Properties"> <Property name="Station Name">Unknown</Property> <Property name="Show All Instruments">False</Property> <Property name="System Configuration">Unknown</Property> <Property name="Data Generator Type">JBERT M8020A</Property> <Property name="Error Detector Type">JBERT M8020A</Property> <Property name="BIST-L Activation Type">Automated</Property> <Property name="BIST-T Activation Type">Automated</Property> <Property name="Power Switch Type">NetIo230B</Property> </Folder> </Folder> </Folder> </Folder>

Figure 6-2: Example of a Station Configuration File

Appendix


If the ValiFrame sequencer is called via a .NET GUI

(System.Windows.Forms.Form), the current status, the available procedures,

and the procedure selection can be shown and modified by passing a

TreeView control via the ProductPreTreeView property to the ValiFrame

sequencer prior to the InitApplication() call. In this case, the TreeView

control directly shows which procedures were selected as well as the

procedure currently being processed during the run. At the end of each run,

the pass/fail result is given. Refer to the ValiFrameRemoteTester source

code for more details.

The log entries generated by the ValiFrame sequencer can be accessed via

the LogChanged() event. Each time the sequencer generates a log entry this

event will be broadcast. It is recommended that the user monitors this event

and tracks the log changes to identify problems during execution.

The procedures requiring interaction with the user will pop up dialog panels.

For example, each time a new connection between an instrument and the

DUT is necessary, the procedure will start to display pop-up windows with

the required connections. The dialog can be suppressed by attaching to the

ConnectionChangeRequired() event. In some cases, internal dialogs or

message boxes are also shown. For full automation without any user

interaction, events must be defined and implemented such that the

controlling environment can react to all dialog and message boxes without

user input. Currently, how to handle these dialogs has to be decided case by

case.

6.2.4 Results Format

Each Procedure Run will produce an xml-formatted result string, which can

be accessed via the out parameters of the Run() functions or the Results

property of the ValiFrameRemote class. The result string starts with a

summary, which contains the procedure name, ID, result, and the time

stamp of the procedure run (Figure 6-3):

Appendix


<?xml version="1.0" encoding="utf-16"?> <Test Results> <Summary> <ProcedureName>Jitter Tolerance Test 2 MHz SJ RBR Lane 0</ProcedureName> <ProcedureID>400008</ProcedureID> <Result>Passed</Result> <DateTime>4/30/2009 11:29:14 AM</DateTime> </Summary> <DocumentElement> <Parameters> <Name>Number of Lanes</Name> <Value>1</Value> </Parameters> <Parameters> <Name>Spec. Version</Name> <Value>1.1</Value> </Parameters> <Parameters> <Name>ISI Amplitude</Name> <Value>570 mUI</Value> </Parameters> <Parameters> <Name>Step Mode</Name> <Value>False</Value> </Parameters> <Parameters> <Name>Parade DP621 Device</Name> <Value>False</Value> </Parameters> </DocumentElement> <Data> <ColumnHeader>|Result|Jitter Freq.|Sin.-Jitter Amp.|Number of Errors|Min Spec|Max Spec|Details|</ColumnHeader> <Values>|pass|2000000|0.981|2|0|1000||</Values> </Data> </Test Results>

Figure 6-3: Result String Format

The following part contains the list of parameters. These parameters may be

changed via the project file or the remote interface. The last part contains

the test data. It starts with the column header, followed by one or more data

rows. The format is similar to what is obtained in the Excel output if the

same procedure is run via the ValiFrame user interface. Each column

name/value is separated by the pipe symbol '|'.

Appendix


6.3 Controlling Loop Parameters and Looping Over Selected Tests

Often parameters such as temperatures or supply voltages need to be varied

systematically. A simple example would be repeating tests over a

temperature range from –10 to 30 °C to verify an operating temperature

range. In this case, after the tests have been run at –10 °C, the temperature

of the climate chamber is increased by the selected temperature step width,

for example, 1°C. The tests are then repeated at –9 °C. After the test

execution, the temperature is incremented again and the tests are rerun

repeatedly until they are finally run at 30 °C. This repetitive process is called

looping. In this example, the temperature within a climate chamber is the

loop parameter. While the loop is executed, the test results have to be

documented for each loop parameter value. In practice, multiple loop levels

might be required, as shown in Figure 6-4.

Figure 6-4: Temperature and Voltage Sweeps using N5990A Sequencer

Appendix


As the loop parameters are typically customer-specific, N5990A permits a

list of loop parameters to be specified. N5990A supports:

1. Looping over user-specified parameters or run tests with a single

parameter value.

2. Defining a set of loop parameters and for each parameter a range of

test points.

3. Using custom drivers to control instruments that are not part of the

ValiFrame Test Station (see Chapter 4, Test Station Selection and

Configuration), e.g. climate chambers, ovens, and power supplies.

4. Saving the results of each test together with the actual loop

parameter value independently of the results from the other runs.

5. An overview of each run after the end of the test execution.

These features are provided by an interface called IVFEnvironmentalControl.

The definition of this interface is:

namespace BitifEye.ValiFrame.Instruments { public interface IVFEnvironmentalControl { string UserLabel { get; } void Connect(); void Disconnect(); string[] GetParameterList(); string[] GetParameterValues(); void Init(); bool SetNextValue(); void SetToDefault(); }

}

The interface has to be implemented by a class EnvironmentalControl in

a .NET dll named EnvironmentalControl.dll, which then needs to be copied

into the ValiFrame Program Files Folder. ValiFrame will load this dll and call

the function of the Interface in the following order:

Appendix


6.3.1 Connect()

At startup of ValiFrame allows the implementation to load the instrument

drivers and connect to them.

6.3.2 SetToDefault()

After the Connect() call, the implementation should set all instruments with

initial values to set default values. It is recommended that the sequence is

stated with nominal values to ensure that the test setup is done properly.

With this setting, the first run will be done and the Init() call will not

overwrite the values.

6.3.3 Init()

The function is used to initialize the instruments with start values at the

beginning of test sequence.

6.3.4 GetParameterList() and GetParameterValues()

These functions are used to get the parameter names and values lists and

put them into the result output of each test procedure.

6.3.5 SetNextValue()

If this function returns true at the end of each run over the selected test

procedures, ValiFrame will run the selected tests again. This function should

get the next parameter set, set the controlling instruments, and return true if

a new set of parameters is available.

Appendix


6.3.5.1 Example

For a sweep over temperature starts at 20 °C, increasing the temperature by

2 °C at each run, and ending at 40 °C, the function should increase the

temperature of the chamber and return true if 40 °C is not reached. If the

next step is greater than 40 °C, this function should return false. ValiFrame

will end the test sequence in this case.

6.3.6 Disconnect()

It is called at the closing of ValiFrame. The driver should set the instruments

to default values and disconnect from the instruments. An example project

is available on the BitifEye webpage.

Appendix


6.4 IBerReader

ValiFrame cannot integrate all possible instruments and custom interfaces

to communicate with the DUT. To overcome this problem, a .NET DLL can be

provided which implements the IBerReader interface. This DLL is used by

ValiFrame, and is invoked during the test; the DLL then takes care of the

instrument or DUT communication. To use this feature, in ValiFrame SATA

set either "Tx BIST Control", "Rx BIST Control", or "Error Detector" in the

station configurator to "Custom DLL" (see Figure 6-5). ValiFrame will search

for a file named SataCustomBerReader.dll in its installation folder.

SATA-specific calling conventions:

Connect(string)

The string parameter is an empty string by default. It can be

changed by setting the "Custom BER Reader Address" property in

the root node of the SATA test tree.

This is used to do general initialization or start external programs, if

it required.

Disconnect()

This method will be called every time a test run is finished (after all

selected tests are done, not after each individual test).

It is used to clean up or shut down external programs, if applicable.

Init(string)

This will be called when the DUT needs to be put into a specific

state. For receiver tests this will always be "BIST-L".

For transmitter tests it will also always be "BIST-L" if the tests are

set to run in that mode. If the transmitter tests are set to run in

"BIST T" mode the string will contain the short name of the pattern

needed for the test (LBP, LFTP, MFTP, HFTP, LTTP, HTTP, LFSCP,

SSOP, or COMP).

For OOB tests the input string will be "OOB", which signals the DUT

should be in neither BIST-T nor BIST-L mode. While the OOB tests

are not transmitter tests in a strict sense they are also implemented

in the scope app, and thus the "Tx BIST Control" setting in the

Station Configurator controls if the custom DLL is used for them.

Appendix


Figure 6-5: Custom DLL Selection

Appendix


6.4.1 IBerReader Interface

using System; using System.Collections.Generic; using System.Text; namespace BitifEye.ValiFrame.Instruments {

public interface IBerReader

{

/// <summary> /// This method is called to connect to your BER reader. /// </summary> /// <param name="address">The address string can be used by your implementation /// to configure the connection to the MipiBerReader interface</param> void Connect(string address); /// <summary>

/// This method will be called once the connection should be closed /// </summary> void Disconnect();

/// <summary> /// This method will be called prior to individual tests to tell the device

/// what mode is tested. This can be used to load appropriate setups. /// </summary>

/// <param name="mode"> configuration mode in which the DUT will be

tested</param> void Init(string mode);

/// <summary> /// Will be called at the beginning of the BER measurement and allows to /// implement a reset for a DUT. /// </summary> void ResetDut();

/// <summary> /// Start the counters. This method MUST reset the counters! /// </summary>

void Start(); /// <summary> /// Stop the DUT to read out the counters (see

/// GetReadCounterWithoutStopSupported()). /// </summary> void Stop();

/// <summary> /// This method should return counters, on counting the

bits/frames/lines

Appendix


/// or bursts and on counting the errors detected by the

MipiBerReader. /// The automation software will compute the BER using the following /// equation BER=errorCounter/bitCounter. If bitCounter stays at 0, even

/// if the stimulus is sending data then this will also be interpreted as fail. /// </summary>

/// <param name="bitCounter"> Contains the number of bits which are

received /// by the DUT. If it is not possible to count bits the value can also contain /// frames or bursts. It is just a matter of the value defined as target BER.

/// If it is not possible to get the number of bits/frames/bursts then the /// method can return a value of -1 and the automation software can

compute

/// the number of bits by the data rate and the time of running.</param>

/// <param name="errorCounter"> Total number of errors since the last

start. /// </param> void GetCounter(out double bitCounter, out double errorCounter); /// <summary> /// This method should return a Boolean value depending if the device supports /// reading the counters while it is running or not. In case of this

method

/// returns a false then the device needs to be stopped for reading the counters. /// In this case the automation software will stop data transmission

/// before calling the GetCounter() function, and starting the system after

/// that again /// </summary> /// <returns> false if device needs to be stopped before reading the

counters, /// and true if the counters can be read on the fly.</returns> bool GetReadCounterWithoutStopSupported();

/// <summary>

/// This number is used to check if all frames were counted, because from the /// data rate divided by BitsPerFrame the number of frames can be computed and

/// compared with the number given by the bit counter / frame counter resulted /// by the GetCounter() function. If this property is one the bit

counter

/// is exactly a bit counter and not a frame counter.

/// If this number is -1 then the bits per frame is not defined /// </summary> Double BitsPerFrame {set; get;} /// <summary>

/// This number is used to compute the BER out of the bit counter of /// the GetCounter() function. This number can be smaller then the

Appendix


BitsPerFrame /// because if the error counter is resulted from the checksum /// then only the payload will be taken into account.

/// if this property is -1 then the counted bits per frame will be

/// estimated by test automation.

/// </summary> double CountedBitsPerFrame {set; get;}

} }

Appendix


6.5 Main Power Switch Control

Intended to power on/off automatically the DUT and run the loopback training without user interaction.

The Main Power Switch Control can be selected as:

Manual

Netlo 230B. It is a PDU (Power Distribution Unit) that integrates one 230 V input and four 230 V outlets which allow to connect virtually any 230 V

powered device)

SynaccessNP

If it is selected as Manual, the DUT has to be power cycle manually. A dialog asking

for power cycling the DUT, pops-up in the initialisation of each receiver test

procedure (See Figure 6-6).

Figure 6-6: Manual Power Cycle Dialog

The number of user interactions for Manual option is equal to the number of times that the DUT need to be trained into loopback.

When it is selected as Netlo230B or SynaccsessNP, the DUT is power cycle

automatically. A dialog asking to check the connection between the power supply and the power switch, pops-up in the first receiver test procedure executed

(See Figure 6-7).

Figure 6-7: Automatic Power Cycle Dialog

Appendix


In this case, the number of user interactions (related with the power cycle) is one,

independently of the number of Rx tests and the number of times that a retraining is

required.

Some properties related with the remote controllable power switch can be selected in the Parameters Dialog (See Figure 6-8).

Figure 6-8: Power Switch Parameters (I)

Appendix


The same properties can be selected in the Parameters Panel of the Main Windows

(See Figure 6-9).

Figure 6-9: Power Switch Parameters (II)

These configurable properties are:

Channel: This sets the channel number of the power switch channel which is

connected to the DUT.

On-Off Duration: This is the duration between turning the DUT off and then

turning it on again.

Setting Time: This is the wait time after the DUT is turned on and before the

test continues with loopback training.

This information is subject to change without notice.

© Keysight Technologies 2015

Edition 3.0, September 2015

www.keysight.com