manual usm 35x - jwj ndt · usm 35x technical reference and operating manual ident-nr. 48 001...

USM 35XTechnical Reference and Operating Manual

Ident-Nr. 48 001

Unfold this page. You will find an overview of the USM 35X function groups and operator’s controls.

This information will help you to quickly find your way through the operating manual.

This issue 01, 04/2005 applies to the following software versions:

USM 35XV.01.00.3xwith Data Logger option: V.01.01.3x

USM 35X DACV.01.10.3xwith Data Logger option: V.01.11.3x

USM 35X SV.01.20.3xwith Data Logger option: V.01.21.3x

Subject to change without notice.

0-2 Issue 01, 04/2005 Krautkramer USM 35X

Contents

First operation level

Second operation level

Third operation level

Status symbols

Symbol Description

* Display memory is enabled (freeze),display is stored.

! Data transfer active,printing or remote control

B Battery indicator; appears with low batterycharge, batteries must be charged.

F TOF is set to flank.

P TOF is set to peak.

J TOF is set to jflank.

T T-CORR (transfer correction) function isactive

R Reference echo has been recorded

A ATT-OBJ/ATT-REF function (soundattenuation is active)

LED

Symbol Description

A Gate alarm

R Function REJECT is active

D Function DUAL (pulser-receiverseparation) is active

BASE

Key functions

Key Function

Switching the unit on and off

Step size for gain setting

Storage (freezing) of screen display

Enlarged echo display over the entire

screen

Printing or transferring data

Recording measured values, saving data

Changing the operation level

Selecting the function group

Selecting the function

Changing the operation level:

Selecting the function group:

Selecting the function:

H Notes:

As a standard feature, the functiongroup REF can be changed overto the function group AWS. Withthe USM 35X DAC, there is alsothe additional function group DAC/JDAC; with the USM 35X S, thefunction groups DAC/JDAC andDGS are available.

The character > after a functionindicates a double assignment.

* DAC/JDAC

* DGSAWS or orPULS RECV aGAT bGAT

CAL REF* TRIG MEM DATA

MEAS MSEL LCD CFG1 CFG2

Krautkramer USM 35X Issue 01, 04/2005 0-1

Contents

1 Introduction ........................................ 1-1

1.1 Safety information ..................................... 1-2Batteries ...................................................... 1-2

Software ...................................................... 1-2

Defects/errors and exceptional stresses ..... 1-3

1.2 Important information onultrasonic testing ...................................... 1-3Preconditions for testing withultrasonic test equipment ............................ 1-3

Operator training .......................................... 1-4

Technical test requirements ........................ 1-4

Limits of testing .......................................... 1-5

Ultrasonic wall thickness measurement ...... 1-5

Effect of the test object’s material .............. 1-5

Effect of temperature variations .................. 1-6

Measurement of remaining wallthickness .................................................... 1-6

Ultrasonic evaluation of flaws ..................... 1-6

Flaw boundary method ................................ 1-6

Echo display comparison method ............... 1-7

1.3 The USM 35X family .................................. 1-8The different instrument versions ................ 1-8

Special features .......................................... 1-9

1.4 How to use this manual .......................... 1-10

1.5 Layout and presentation in thismanual ..................................................... 1-11Attention and Note symbols ...................... 1-11

Listings ..................................................... 1-11

Operating steps ......................................... 1-11

2 Standard package andaccessories ........................................ 2-1

2.1 Standard package ..................................... 2-3

2.2 Recommended accessories ..................... 2-5


Contents

1 Introduction ........................................ 1-1

1.1 Safety information ..................................... 1-2Batteries ...................................................... 1-2

Software ...................................................... 1-2

Defects/errors and exceptional stresses ..... 1-3

1.2 Important information onultrasonic testing ...................................... 1-3Preconditions for testing withultrasonic test equipment ............................ 1-3

Operator training .......................................... 1-4

Technical test requirements ........................ 1-4

Limits of testing .......................................... 1-5

Ultrasonic wall thickness measurement ...... 1-5

Effect of the test object’s material .............. 1-5

Effect of temperature variations .................. 1-6

Measurement of remaining wallthickness .................................................... 1-6

Ultrasonic evaluation of flaws ..................... 1-6

Flaw boundary method ................................ 1-6

Echo display comparison method ............... 1-7

1.3 The USM 35X family .................................. 1-8The different instrument versions ................ 1-8

Special features .......................................... 1-9

1.4 How to use this manual .......................... 1-10

1.5 Layout and presentation in thismanual ..................................................... 1-11Attention and Note symbols ...................... 1-11

Listings ..................................................... 1-11

Operating steps ......................................... 1-11

2 Standard package andaccessories ........................................ 2-1

2.1 Standard package ..................................... 2-3

2.2 Recommended accessories ..................... 2-5


Contents

3 Initial start-up...................................... 3-1

3.1 Power supply ............................................. 3-2Operation using the power supply unit ........ 3-2

Operation using batteries ............................ 3-3

Charging the batteries ................................. 3-5

3.2 Connecting a probe .................................. 3-7

3.3 Starting the USM 35X ................................ 3-8Switching on................................................ 3-8

Reset .......................................................... 3-8

Information lines in the startup screen ........ 3-8

4 Principles of operation ...................... 4-1

4.1 Operator’s controls ................................... 4-2

4.2 Screen display ........................................... 4-3Functions on the display ............................. 4-4

Other displays ............................................. 4-5

4.3 Keys and rotary knobs .............................. 4-6Function keys ............................................. 4-6

On/Off key .................................................. 4-6

Special keys ............................................... 4-7

Rotary knobs ............................................... 4-8

4.4 Operational concept .................................. 4-8Setting the functions ................................... 4-9

4.5 Important basic settings ......................... 4-10Selecting the language .............................. 4-10

Selecting units .......................................... 4-11

Setting the date ......................................... 4-12

Setting the time ......................................... 4-13

4.6 Basic settings of the display .................. 4-14Selecting the color scheme ....................... 4-14

Setting the lighting .................................... 4-14


Contents

3 Initial start-up...................................... 3-1

3.1 Power supply ............................................. 3-2Operation using the power supply unit ........ 3-2

Operation using batteries ............................ 3-3


3.2 Connecting a probe .................................. 3-7

3.3 Starting the USM 35X ................................ 3-8Switching on................................................ 3-8

Reset .......................................................... 3-8

Information lines in the startup screen ........ 3-8

4 Principles of operation ...................... 4-1

4.1 Operator’s controls ................................... 4-2

4.2 Screen display ........................................... 4-3Functions on the display ............................. 4-4

Other displays ............................................. 4-5

4.3 Keys and rotary knobs .............................. 4-6Function keys ............................................. 4-6

On/Off key .................................................. 4-6

Special keys ............................................... 4-7

Rotary knobs ............................................... 4-8

4.4 Operational concept .................................. 4-8Setting the functions ................................... 4-9

4.5 Important basic settings ......................... 4-10Selecting the language .............................. 4-10

Selecting units .......................................... 4-11

Setting the date ......................................... 4-12

Setting the time ......................................... 4-13

4.6 Basic settings of the display .................. 4-14Selecting the color scheme ....................... 4-14

Setting the lighting .................................... 4-14


Contents

5 Operation ............................................ 5-1

5.1 Overview of the functions ......................... 5-2Function groups first operating level ........... 5-3

Function groups second operating level ...... 5-3

Function groups third operating level .......... 5-4

5.2 Setting the gain ......................................... 5-5Defining the dB incrementation for gain ...... 5-5

5.3 Adjusting the display range(function group BASE) .............................. 5-6RANGE (Display range) .............................. 5-6

MTLVEL (Sound velocity) ........................... 5-7

D-DELAY (Display starting point) ................ 5-7

P-DELAY (Probe delay) ............................... 5-8

5.4 Adjusting the pulser(function group PULS) .............................. 5-9DAMPING (Probe matching) ....................... 5-9

POWER (Intensity) ................................... 5-10

DUAL (Pulser-receiver separation) ............ 5-10

PRF-MOD (Pulse repetition frequency) ..... 5-11

5.5 Adjusting the receiver(function group RECV) ............................ 5-11FINE G (Fine adjustment of gain) ............. 5-12

dBSTEP .................................................... 5-12

REJECT .................................................... 5-12

FREQU (Frequency range) ........................ 5-13

RECTIFY (Rectification) ............................ 5-13

5.6 Setting the gates(function groups aGAT and bGAT) ......... 5-14Tasks of the gates ..................................... 5-14

aLOGIC/bLOGIC (Evaluation logic ofthe gates) .................................................. 5-15

aSTART/bSTART (Starting points ofthe gates) .................................................. 5-16

aWIDTH/bWIDTH (Width of the gates) ...... 5-16

aTHRSH/bTHRSH (Response andmeasurement threshold of the gates) ........ 5-16


Contents

5 Operation ............................................ 5-1

5.1 Overview of the functions ......................... 5-2Function groups first operating level ........... 5-3

Function groups second operating level ...... 5-3

Function groups third operating level .......... 5-4

5.2 Setting the gain ......................................... 5-5Defining the dB incrementation for gain ...... 5-5

5.3 Adjusting the display range(function group BASE) .............................. 5-6RANGE (Display range) .............................. 5-6

MTLVEL (Sound velocity) ........................... 5-7

D-DELAY (Display starting point) ................ 5-7

P-DELAY (Probe delay) ............................... 5-8

5.4 Adjusting the pulser(function group PULS) .............................. 5-9DAMPING (Probe matching) ....................... 5-9

POWER (Intensity) ................................... 5-10

DUAL (Pulser-receiver separation) ............ 5-10

PRF-MOD (Pulse repetition frequency) ..... 5-11

5.5 Adjusting the receiver(function group RECV) ............................ 5-11FINE G (Fine adjustment of gain) ............. 5-12

dBSTEP .................................................... 5-12

REJECT .................................................... 5-12

FREQU (Frequency range) ........................ 5-13

RECTIFY (Rectification) ............................ 5-13

5.6 Setting the gates(function groups aGAT and bGAT) ......... 5-14Tasks of the gates ..................................... 5-14

aLOGIC/bLOGIC (Evaluation logic ofthe gates) .................................................. 5-15

aSTART/bSTART (Starting points ofthe gates) .................................................. 5-16

aWIDTH/bWIDTH (Width of the gates) ...... 5-16

aTHRSH/bTHRSH (Response andmeasurement threshold of the gates) ........ 5-16


Contents

5.7 Calibrating the USM 35X......................... 5-17Calibrating the display range ..................... 5-17

Choosing the measuring point ................... 5-17

Calibration with straight- andangle-beam probes .................................... 5-18

Calibration with dual-element (TR)probes ....................................................... 5-21

5.8 Measuring ................................................ 5-23General notes ............................................ 5-23

5.9 Measurement of dB difference(function group REF) .............................. 5-25Recording a reference echo ...................... 5-26

Deleting a reference echo ......................... 5-26

Echo comparison ...................................... 5-27

5.10Classification of welds(function group AWS) .............................. 5-28Rating of welds according to AWS ............ 5-28

5.11Calculation of flaw position(function group TRIG) ............................. 5-31

ANGLE (Angle of incidence) ................... 5-32X-VALUE (X-value of the probe) ................ 5-32

COLOR ..................................................... 5-33

THICKNE (Material thickness) .................. 5-33

DIAMET (Outside diameter of the testobject) ....................................................... 5-33

5.12Data saving(function group MEM) ............................. 5-34Storing a data set ...................................... 5-35

Deleting a data set .................................... 5-35

Deleting all data set .................................. 5-36

Recalling a stored data set ....................... 5-36

5.13Dataset management(function group DATA) ............................. 5-38TESTINF (Storing additionalinformation) ............................................... 5-39

PREVIEW (Dataset preview) .................... 5-41

DIR (Dataset directory) ............................. 5-42

SETTING (Function list) ............................ 5-42


Contents

5.7 Calibrating the USM 35X......................... 5-17Calibrating the display range ..................... 5-17

Choosing the measuring point ................... 5-17

Calibration with straight- andangle-beam probes .................................... 5-18

Calibration with dual-element (TR)probes ....................................................... 5-21

5.8 Measuring ................................................ 5-23General notes ............................................ 5-23

5.9 Measurement of dB difference(function group REF) .............................. 5-25Recording a reference echo ...................... 5-26

Deleting a reference echo ......................... 5-26

Echo comparison ...................................... 5-27

5.10Classification of welds(function group AWS) .............................. 5-28Rating of welds according to AWS ............ 5-28

5.11Calculation of flaw position(function group TRIG) ............................. 5-31

ANGLE (Angle of incidence) ................... 5-32X-VALUE (X-value of the probe) ................ 5-32

COLOR ..................................................... 5-33

THICKNE (Material thickness) .................. 5-33

DIAMET (Outside diameter of the testobject) ....................................................... 5-33

5.12Data saving(function group MEM) ............................. 5-34Storing a data set ...................................... 5-35

Deleting a data set .................................... 5-35

Deleting all data set .................................. 5-36

Recalling a stored data set ....................... 5-36

5.13Dataset management(function group DATA) ............................. 5-38TESTINF (Storing additionalinformation) ............................................... 5-39

PREVIEW (Dataset preview) .................... 5-41

DIR (Dataset directory) ............................. 5-42

SETTING (Function list) ............................ 5-42


Contents

5.14Configuring the USM 35X for a testapplication ............................................... 5-43TOF (Selecting the measuring point) ......... 5-44

S-DISP (Zoomed display of reading) ......... 5-46

MAGNIFY (Gate spreading) ...................... 5-48

A-Scan (Setting the A-scan) ..................... 5-48

Configuring the measurement line ............. 5-49

Setting the display .................................... 5-50

FILLED (Echo display mode) .................... 5-51

VGA .......................................................... 5-51

SCHEME .................................................. 5-51

LIGHT (LCD backlight) .............................. 5-52

SCALE (Configuring the measurementline) ........................................................... 5-52

5.15General configuration ............................. 5-53DIALOG (Selecting the language) ............. 5-53

UNIT (Selecting units of measurement) .... 5-54

BAUD-R (Baud rate for transmission) ........ 5-55

PRINTER (Printer for test report) .............. 5-55

COPYMOD (Assignment of the key) ... 5-55

TIME/DATE (Setting the time and date) .... 5-56

ANAMOD .................................................. 5-57

HORN ........................................................ 5-58

EVAMOD (Echo evaluation) ...................... 5-58

5.16Other functions with special keys .......... 5-59Freeze ....................................................... 5-59

Zooming the echo display ......................... 5-59

The key ............................................... 5-59

5.17Status symbols and LEDs ...................... 5-60Status symbols ......................................... 5-60

LEDs ......................................................... 5-60

5.18Distance-amplitude curve(only USM 35X DAC and USM 35S) ........ 5-61DACMOD (Activating DAC/TCG) ............... 5-62

DACECHO (Recording reference curve) .... 5-63

T-CORR (Sensitivity correction) ................ 5-64

OFFSET (Distance of multiple DAC) ......... 5-65

Echo evaluation with DAC ......................... 5-65


Contents

5.14Configuring the USM 35X for a testapplication ............................................... 5-43TOF (Selecting the measuring point) ......... 5-44

S-DISP (Zoomed display of reading) ......... 5-46

MAGNIFY (Gate spreading) ...................... 5-48

A-Scan (Setting the A-scan) ..................... 5-48

Configuring the measurement line ............. 5-49

Setting the display .................................... 5-50

FILLED (Echo display mode) .................... 5-51

VGA .......................................................... 5-51

SCHEME .................................................. 5-51

LIGHT (LCD backlight) .............................. 5-52

SCALE (Configuring the measurementline) ........................................................... 5-52

5.15General configuration ............................. 5-53DIALOG (Selecting the language) ............. 5-53

UNIT (Selecting units of measurement) .... 5-54

BAUD-R (Baud rate for transmission) ........ 5-55

PRINTER (Printer for test report) .............. 5-55

COPYMOD (Assignment of the key) ... 5-55

TIME/DATE (Setting the time and date) .... 5-56

ANAMOD .................................................. 5-57

HORN ........................................................ 5-58

EVAMOD (Echo evaluation) ...................... 5-58

5.16Other functions with special keys .......... 5-59Freeze ....................................................... 5-59

Zooming the echo display ......................... 5-59

The key ............................................... 5-59

5.17Status symbols and LEDs ...................... 5-60Status symbols ......................................... 5-60

LEDs ......................................................... 5-60

5.18Distance-amplitude curve(only USM 35X DAC and USM 35S) ........ 5-61DACMOD (Activating DAC/TCG) ............... 5-62






Contents

5.19Distance-amplitude curve accordingto JIS Z3060-2002 (only USM 35X DACand USM 35S) .......................................... 5-66DACMOD (Activating DAC accordingto JIS) ....................................................... 5-67


BOLDLI (Choice of a registration curve) .... 5-70




5.20Evaluation according to the DGSmethod (only USM 35X S) ...................... 5-71Measuring with DGS ................................. 5-71

Selecting the DGS mode .......................... 5-73

Default settings for the DGSmeasurement ............................................ 5-73

Recording the reference echo anddisplaying the DGS curve ......................... 5-75

Evaluation of reflectors ............................. 5-76

Transfer correction..................................... 5-78

Sound attenuation ..................................... 5-78

Locks, error messages ............................. 5-81

Validity of the DGS method ....................... 5-81

6 Documentation .................................. 6-1

6.1 Printing data .............................................. 6-2Preparing the printer .................................... 6-2

Preparing the USM 35X .............................. 6-2

Printing ........................................................ 6-3

6.2 Documentation with UltraDOC ................. 6-4

7 Maintenance and care ....................... 7-1

7.1 Care of the instrument .............................. 7-2

7.2 Care of the batteries .................................. 7-3Care of the batteries .................................... 7-3


How to handle alkaline batteries .................. 7-4

7.3 Maintenance .............................................. 7-5


Contents

5.19Distance-amplitude curve accordingto JIS Z3060-2002 (only USM 35X DACand USM 35S) .......................................... 5-66DACMOD (Activating DAC accordingto JIS) ....................................................... 5-67


BOLDLI (Choice of a registration curve) .... 5-70




5.20Evaluation according to the DGSmethod (only USM 35X S) ...................... 5-71Measuring with DGS ................................. 5-71

Selecting the DGS mode .......................... 5-73

Default settings for the DGSmeasurement ............................................ 5-73

Recording the reference echo anddisplaying the DGS curve ......................... 5-75

Evaluation of reflectors ............................. 5-76

Transfer correction..................................... 5-78

Sound attenuation ..................................... 5-78

Locks, error messages ............................. 5-81

Validity of the DGS method ....................... 5-81

6 Documentation .................................. 6-1

6.1 Printing data .............................................. 6-2Preparing the printer .................................... 6-2

Preparing the USM 35X .............................. 6-2

Printing ........................................................ 6-3

6.2 Documentation with UltraDOC ................. 6-4

7 Maintenance and care ....................... 7-1

7.1 Care of the instrument .............................. 7-2

7.2 Care of the batteries .................................. 7-3Care of the batteries .................................... 7-3


How to handle alkaline batteries .................. 7-4

7.3 Maintenance .............................................. 7-5


Contents

7.4 Recycling ................................................... 7-6General view of the device .......................... 7-6

Materials for separate disposal ................... 7-8

Further materials and components ........... 7-10

Recycling data of master device ............... 7-12

8 Interfaces and peripherals ................ 8-1

8.1 Interfaces ................................................... 8-2

8.2 I/O interface ............................................... 8-4Contact assignment of theLEMO-1-B socket ....................................... 8-5

8.3 RS 232 interface ........................................ 8-6Contact assignment of the Sub-D socket ... 8-6

8.4 RGB interface............................................. 8-7

8.5 Data exchange ........................................... 8-8Connecting a printer or a PC ....................... 8-8

Activation of serial communication ............. 8-8

Printing data ................................................ 8-9 Technical Specificationsaccording to EN 12668-1

8.6 Remote control .......................................... 8-9Syntax and timing ..................................... 8-11

Functions and remote control codes ......... 8-17

Other remote control codes ....................... 8-24

Control codes for the rotary knobs/function keys ............................................ 8-26

9 Appendix ............................................ 9-1

9.1 Function directory ..................................... 9-2

9.2 EC declaration of conformity ................... 9-7

9.3 Manufacturer/Service addresses .............. 9-8

9.4 Spare parts list ........................................ 9-10

10 Changes ........................................... 10-1

11 Index ................................................. 11-1


Contents

7.4 Recycling ................................................... 7-6General view of the device .......................... 7-6

Materials for separate disposal ................... 7-8

Further materials and components ........... 7-10

Recycling data of master device ............... 7-12

8 Interfaces and peripherals ................ 8-1

8.1 Interfaces ................................................... 8-2

8.2 I/O interface ............................................... 8-4Contact assignment of theLEMO-1-B socket ....................................... 8-5

8.3 RS 232 interface ........................................ 8-6Contact assignment of the Sub-D socket ... 8-6

8.4 RGB interface............................................. 8-7

8.5 Data exchange ........................................... 8-8Connecting a printer or a PC ....................... 8-8

Activation of serial communication ............. 8-8

Printing data ................................................ 8-9 Technical Specificationsaccording to EN 12668-1

8.6 Remote control .......................................... 8-9Syntax and timing ..................................... 8-11

Functions and remote control codes ......... 8-17

Other remote control codes ....................... 8-24

Control codes for the rotary knobs/function keys ............................................ 8-26

9 Appendix ............................................ 9-1

9.1 Function directory ..................................... 9-2

9.2 EC declaration of conformity ................... 9-7

9.3 Manufacturer/Service addresses .............. 9-8

9.4 Spare parts list ........................................ 9-10

10 Changes ........................................... 10-1

11 Index ................................................. 11-1


Introduction 1


Introduction 1


Introduction Safety information

1.1 Safety information

The USM 35X has been designed and tested accordingto DIN EN 61 010 Part 1, 2002, Safety requirements forelectrical measuring, control and lab equipment, andwas technically in perfectly safe and faultless conditionwhen leaving the manufacturing works.

In order to maintain this condition and to ensure a safeoperation, you should urgently read the following safetyinformation before putting the instrument into operation.

A Attention:

The USM 35X is an instrument for materials testing.Any use for medical applications or other purposesis not allowed!

The USM 35X may only be used in industrial envi-ronments!

The USM 35X is waterproof according to IP 66. TheUSM 35X can be operated with batteries or a powersupply unit.

The power supply unit has the electrical safety class II.

Batteries

For the battery operation of the USM 35X, we recom-mend the use of a lithium-ion battery. The operationusing alkaline batteries, NiMH or NiCad cells is likewisepossible. You should only use the products recom-mended by us for the battery operation.

You can charge the lithium-ion battery within the instru-ment itself or in an external battery charger. If you wantto use NiMH or NiCad cells, you have to charge them inan external battery charger.

As soon as you connect the power supply unit to theUSM 35X, the battery power supply is interrupted. If alithium-ion battery is inserted, the charging processstarts automatically when you connect the instrumentto the mains supply. Please refer to chapter 3.1 onpower supply, and to chapter 7 on how to handlebatteries.

Software

According to the current state of the art, software isnever completely free from errors. Before using anysoftware-controlled test equipment, please make sure


Introduction Safety information

1.1 Safety information

The USM 35X has been designed and tested accordingto DIN EN 61 010 Part 1, 2002, Safety requirements forelectrical measuring, control and lab equipment, andwas technically in perfectly safe and faultless conditionwhen leaving the manufacturing works.

In order to maintain this condition and to ensure a safeoperation, you should urgently read the following safetyinformation before putting the instrument into operation.

A Attention:

The USM 35X is an instrument for materials testing.Any use for medical applications or other purposesis not allowed!

The USM 35X may only be used in industrial envi-ronments!

The USM 35X is waterproof according to IP 66. TheUSM 35X can be operated with batteries or a powersupply unit.

The power supply unit has the electrical safety class II.

Batteries

For the battery operation of the USM 35X, we recom-mend the use of a lithium-ion battery. The operationusing alkaline batteries, NiMH or NiCad cells is likewisepossible. You should only use the products recom-mended by us for the battery operation.

You can charge the lithium-ion battery within the instru-ment itself or in an external battery charger. If you wantto use NiMH or NiCad cells, you have to charge them inan external battery charger.

As soon as you connect the power supply unit to theUSM 35X, the battery power supply is interrupted. If alithium-ion battery is inserted, the charging processstarts automatically when you connect the instrumentto the mains supply. Please refer to chapter 3.1 onpower supply, and to chapter 7 on how to handlebatteries.

Software

According to the current state of the art, software isnever completely free from errors. Before using anysoftware-controlled test equipment, please make sure


IntroductionSafety information

that the required functions operate perfectly in the in-tended combination.

If you have any questions about the use of your testequipment, please contact your nearest representativeof GE Inspection Technologies.

Defects/errors and exceptional stresses

If you have reason to believe that a safe operation ofyour USM 35X is no longer possible, you have to dis-connect the instrument and secure it against uninten-tional reconnection. Remove the batteries if necessary.

A safe operation is e.g. no longer possible

• if the instrument shows visible damages,

• if the instrument no longer operates perfectly,

• after prolonged storage under adverse conditions(e.g. exceptional temperatures and/or especially highair humidity, or corrosive environmental conditions),

• after being subjected to heavy stresses during trans-portation.

1.2 Important information onultrasonic testing

Please read the following information before using yourUSM 35X. It is important that you understand and ob-serve this information to avoid any operator errors thatmight lead to false test results. This could result in per-sonal injuries or damages to property.

Preconditions for testing with ultrasonictest equipment

This operating manual contains essential information onhow to operate your test equipment. In addition, thereare a number of factors which affect the test results. Adescription of these factors would go beyond the scopeof an operating manual. The following list therefore onlymentions the three most important conditions for a safeand reliable ultrasonic inspection:

• the operator training

• the knowledge of special technical test requirementsand limits

• the choice of appropriate test equipment.


IntroductionSafety information

that the required functions operate perfectly in the in-tended combination.

If you have any questions about the use of your testequipment, please contact your nearest representativeof GE Inspection Technologies.

Defects/errors and exceptional stresses

If you have reason to believe that a safe operation ofyour USM 35X is no longer possible, you have to dis-connect the instrument and secure it against uninten-tional reconnection. Remove the batteries if necessary.

A safe operation is e.g. no longer possible

• if the instrument shows visible damages,

• if the instrument no longer operates perfectly,

• after prolonged storage under adverse conditions(e.g. exceptional temperatures and/or especially highair humidity, or corrosive environmental conditions),

• after being subjected to heavy stresses during trans-portation.

1.2 Important information onultrasonic testing

Please read the following information before using yourUSM 35X. It is important that you understand and ob-serve this information to avoid any operator errors thatmight lead to false test results. This could result in per-sonal injuries or damages to property.

Preconditions for testing with ultrasonictest equipment

This operating manual contains essential information onhow to operate your test equipment. In addition, thereare a number of factors which affect the test results. Adescription of these factors would go beyond the scopeof an operating manual. The following list therefore onlymentions the three most important conditions for a safeand reliable ultrasonic inspection:

• the operator training

• the knowledge of special technical test requirementsand limits

• the choice of appropriate test equipment.


Introduction Important information on ultrasonic testing

Operator training

The operation of an ultrasonic test device requires aproper training in ultrasonic test methods.

A proper training comprises for example adequateknowledge of:

• the theory of sound propagation

• the effects of sound velocity in the test material

• the behavior of the sound wave at interfaces be-tween different materials

• the propagation of the sound beam

• the influence of sound attenuation in the test objectand the influence of surface quality of the test ob-ject.

Lack of such knowledge could lead to false test resultswith unforeseeable consequences. You can contact forexample NDT societies or organizations in your country(DGZfP in Germany; ASNT in the USA), or also GEInspection Technologies, for information concerningexisting possibilities for the training of ultrasonic in-spectors as well as on the qualifications and certifi-cates that can finally be obtained.

Technical test requirements

Every ultrasonic test is subject to specific technicaltest requirements. The most important ones are:

• the definition of the scope of inspection

• the choice of the appropriate test method

• the consideration of material properties

• the determination of limits for recording andevaluation.

It is the task of those with overall responsibility for test-ing to ensure that the inspector is fully informed aboutthese requirements. The best basis for such informationis experience with identical test objects. It is also es-sential that the relevant test specifications be clearlyand completely understood by the inspector.

GE Inspection Technologies regularly holds specializedtraining courses in the field of ultrasonic testing. Thescheduled dates for these courses will be given to youon request.



Operator training

The operation of an ultrasonic test device requires aproper training in ultrasonic test methods.

A proper training comprises for example adequateknowledge of:

• the theory of sound propagation

• the effects of sound velocity in the test material

• the behavior of the sound wave at interfaces be-tween different materials

• the propagation of the sound beam

• the influence of sound attenuation in the test objectand the influence of surface quality of the test ob-ject.

Lack of such knowledge could lead to false test resultswith unforeseeable consequences. You can contact forexample NDT societies or organizations in your country(DGZfP in Germany; ASNT in the USA), or also GEInspection Technologies, for information concerningexisting possibilities for the training of ultrasonic in-spectors as well as on the qualifications and certifi-cates that can finally be obtained.

Technical test requirements

Every ultrasonic test is subject to specific technicaltest requirements. The most important ones are:

• the definition of the scope of inspection

• the choice of the appropriate test method

• the consideration of material properties

• the determination of limits for recording andevaluation.

It is the task of those with overall responsibility for test-ing to ensure that the inspector is fully informed aboutthese requirements. The best basis for such informationis experience with identical test objects. It is also es-sential that the relevant test specifications be clearlyand completely understood by the inspector.

GE Inspection Technologies regularly holds specializedtraining courses in the field of ultrasonic testing. Thescheduled dates for these courses will be given to youon request.


IntroductionImportant information on ultrasonic testing

Limits of testing

The information obtained from ultrasonic tests onlyrefers to those parts of the test object which arecovered by the sound beam of the probe used.

Any conclusions from the tested parts to be applied tothe untested parts of the test object should be madewith extreme caution.

Such conclusions are generally only possible in caseswhere extensive experience and proven methods ofstatistical data acquisition are available.

The sound beam can be completely reflected fromboundary surfaces within the test object so that flawsand reflection points lying deeper remain undetected. Itis therefore important to make sure that all areas to betested in the test object are covered by the sound beam.

Ultrasonic wall thickness measurement

All ultrasonic wall thickness measurements are basedon a time-of-flight measurement. Accurate measure-ment results require a constant sound velocity in thetest object. In test objects made of steel, even with

varying alloying constituents, this condition is mostlyfulfilled. The variation in sound velocity is so slight thatit is only of importance for high-precision measure-ments. In other materials, e.g. nonferrous metals orplastics, the sound velocity variations may be evenlarger and thus affect the measuring accuracy.

Effect of the test object’s material

If the test object’s material is not homogeneous, thesound may propagate at different sound velocities indifferent parts of the test objects. An average soundvelocity should then be taken into account for the rangecalibration. This is achieved by means of a referenceblock whose sound velocity corresponds to the averagesound velocity of the test object.

If substantial sound velocity variations are to be ex-pected, then the instrument calibration should be read-justed to the actual sound velocity values at shortertime intervals. Failure to do so may lead to false thick-ness readings.



Limits of testing

The information obtained from ultrasonic tests onlyrefers to those parts of the test object which arecovered by the sound beam of the probe used.

Any conclusions from the tested parts to be applied tothe untested parts of the test object should be madewith extreme caution.

Such conclusions are generally only possible in caseswhere extensive experience and proven methods ofstatistical data acquisition are available.

The sound beam can be completely reflected fromboundary surfaces within the test object so that flawsand reflection points lying deeper remain undetected. Itis therefore important to make sure that all areas to betested in the test object are covered by the sound beam.

Ultrasonic wall thickness measurement

All ultrasonic wall thickness measurements are basedon a time-of-flight measurement. Accurate measure-ment results require a constant sound velocity in thetest object. In test objects made of steel, even with

varying alloying constituents, this condition is mostlyfulfilled. The variation in sound velocity is so slight thatit is only of importance for high-precision measure-ments. In other materials, e.g. nonferrous metals orplastics, the sound velocity variations may be evenlarger and thus affect the measuring accuracy.

Effect of the test object’s material

If the test object’s material is not homogeneous, thesound may propagate at different sound velocities indifferent parts of the test objects. An average soundvelocity should then be taken into account for the rangecalibration. This is achieved by means of a referenceblock whose sound velocity corresponds to the averagesound velocity of the test object.

If substantial sound velocity variations are to be ex-pected, then the instrument calibration should be read-justed to the actual sound velocity values at shortertime intervals. Failure to do so may lead to false thick-ness readings.



Effect of temperature variations

The sound velocity within the test object also varies asa function of the material’s temperature. This can causeappreciable errors in measurements if the instrumenthas been calibrated on a cold reference block and isthen used on a warm or hot test object. Such measure-ment errors can be avoided either by warming the refer-ence block to the same temperature before calibrating,or by using a correction factor obtained from tables.

Measurement of remaining wall thickness

The measurement of the remaining wall thickness onplant components, e.g. pipes, tanks and reaction ves-sels of all types which are corroded or eroded from theinside, requires a perfectly suitable gauge and specialcare in handling the probe.

The inspectors should always be informed about thecorresponding nominal wall thicknesses and the likelyamount of wall thickness losses.

Ultrasonic evaluation of flaws

In present-day test practice, there are basically twodifferent methods of flaw evaluation:

If the diameter of the sound beam is smaller than theextent of the flaw, then the beam can be used to ex-plore the boundaries of the flaw and thus determine itsarea.

If, however, the diameter of the sound beam is largerthan the size of the flaw, the maximum echo responsefrom the flaw must be compared with the maximumecho response from an artificial flaw provided for com-parison purposes.

Flaw boundary method

The smaller the diameter of the probe’s sound beam,the more accurately the boundaries (and therefore theflaw area) can be determined by the flaw boundarymethod. If, however, the sound beam is relativelybroad, the flaw area determined can substantially differfrom the actual flaw area. Care should therefore betaken to select a probe which will give a sufficientlynarrow beam at the position of the flaw.



Effect of temperature variations

The sound velocity within the test object also varies asa function of the material’s temperature. This can causeappreciable errors in measurements if the instrumenthas been calibrated on a cold reference block and isthen used on a warm or hot test object. Such measure-ment errors can be avoided either by warming the refer-ence block to the same temperature before calibrating,or by using a correction factor obtained from tables.

Measurement of remaining wall thickness

The measurement of the remaining wall thickness onplant components, e.g. pipes, tanks and reaction ves-sels of all types which are corroded or eroded from theinside, requires a perfectly suitable gauge and specialcare in handling the probe.

The inspectors should always be informed about thecorresponding nominal wall thicknesses and the likelyamount of wall thickness losses.

Ultrasonic evaluation of flaws

In present-day test practice, there are basically twodifferent methods of flaw evaluation:

If the diameter of the sound beam is smaller than theextent of the flaw, then the beam can be used to ex-plore the boundaries of the flaw and thus determine itsarea.

If, however, the diameter of the sound beam is largerthan the size of the flaw, the maximum echo responsefrom the flaw must be compared with the maximumecho response from an artificial flaw provided for com-parison purposes.

Flaw boundary method

The smaller the diameter of the probe’s sound beam,the more accurately the boundaries (and therefore theflaw area) can be determined by the flaw boundarymethod. If, however, the sound beam is relativelybroad, the flaw area determined can substantially differfrom the actual flaw area. Care should therefore betaken to select a probe which will give a sufficientlynarrow beam at the position of the flaw.



Echo display comparison method

The echo from a small, natural flaw is usually smallerthan the echo from an artificial comparison flaw, e.g.circular disc flaw of the same size. This is due, for in-stance, to the roughness of the surface of a naturalflaw, or to the fact that the beam does not impinge on itat right angles.

If this fact is not taken into account when evaluatingnatural flaws, there is a danger of underestimating theirmagnitude.

In the case of very jagged or fissured flaws, e.g. shrinkholes in castings, it may be that the sound scatteringoccurring at the boundary surface of the flaw is sostrong that no echo at all is produced. In such cases, adifferent evaluation method should be chosen, e.g. useof the backwall echo attenuation in the evaluation.

The distance sensitivity of the flaw echo plays an im-portant part when testing large components. Attentionshould be paid here to choosing artificial comparisonflaws which are as far as possible governed by thesame ”distance laws” as the natural flaws to be evalu-ated.

The ultrasonic wave is attenuated in any material. Thissound attenuation is very low, e.g. in parts made offine-grained steel, likewise in many small parts made ofother materials. However, if the sound wave travelslarger distances through the material, a high cumulativesound attenuation can result even with small attenua-tion coefficients. There is then a danger that echoesfrom natural flaws appear too small. For this reason, anestimate must always be made of the effects of attenu-ation on the evaluation result and taken into account ifapplicable.

If the test object has a rough surface, part of the inci-dent sound energy will be scattered at its surface andis not available for the test. The larger this initial scat-tering, the smaller the flaw echoes appear, and themore errors occur in the evaluation result.

It is therefore important to take the effect of the testobject’s surfaces on the height of the echo into account(transfer correction).



Echo display comparison method

The echo from a small, natural flaw is usually smallerthan the echo from an artificial comparison flaw, e.g.circular disc flaw of the same size. This is due, for in-stance, to the roughness of the surface of a naturalflaw, or to the fact that the beam does not impinge on itat right angles.

If this fact is not taken into account when evaluatingnatural flaws, there is a danger of underestimating theirmagnitude.

In the case of very jagged or fissured flaws, e.g. shrinkholes in castings, it may be that the sound scatteringoccurring at the boundary surface of the flaw is sostrong that no echo at all is produced. In such cases, adifferent evaluation method should be chosen, e.g. useof the backwall echo attenuation in the evaluation.

The distance sensitivity of the flaw echo plays an im-portant part when testing large components. Attentionshould be paid here to choosing artificial comparisonflaws which are as far as possible governed by thesame ”distance laws” as the natural flaws to be evalu-ated.

The ultrasonic wave is attenuated in any material. Thissound attenuation is very low, e.g. in parts made offine-grained steel, likewise in many small parts made ofother materials. However, if the sound wave travelslarger distances through the material, a high cumulativesound attenuation can result even with small attenua-tion coefficients. There is then a danger that echoesfrom natural flaws appear too small. For this reason, anestimate must always be made of the effects of attenu-ation on the evaluation result and taken into account ifapplicable.

If the test object has a rough surface, part of the inci-dent sound energy will be scattered at its surface andis not available for the test. The larger this initial scat-tering, the smaller the flaw echoes appear, and themore errors occur in the evaluation result.

It is therefore important to take the effect of the testobject’s surfaces on the height of the echo into account(transfer correction).


Introduction The USM 35X family

1.3 The USM 35X family

The USM 35X is a lightweight and compact ultrasonicflaw detector especially suitable for

• locating and evaluating material defects,

• measuring wall thicknesses,

• saving and documenting test results.

With its frequency range from 0.5 to 20 MHz and amaximum calibration range of 10 m (steel), the USM 35Xis designed for use on large workpieces and in high-resolution measurements.

The different instrument versions

The USM 35X is available in several versions which aredesgined for different applications:

• USM 35XStandard version for universal ultrasonic test applica-tions.

• USM 35X DACThe multiple DAC curves and time-corrected gainenable a field-oriented echo amplitude evaluationaccording to almost all international test specifica-tions.

• USM 35X SDGS evaluation mode in addition to multiple DACcurves and TCG.DGS curves are stored for all narrow-band single-element probes; amplitude evaluation is carried outeither in dB above DAC curve or equivalent reflectorsize (ERS).

• Data Logger optionThis option is available for all USM 35X versions andis used for the recording and documentation of thick-ness readings.


Introduction The USM 35X family

1.3 The USM 35X family

The USM 35X is a lightweight and compact ultrasonicflaw detector especially suitable for

• locating and evaluating material defects,

• measuring wall thicknesses,

• saving and documenting test results.

With its frequency range from 0.5 to 20 MHz and amaximum calibration range of 10 m (steel), the USM 35Xis designed for use on large workpieces and in high-resolution measurements.

The different instrument versions

The USM 35X is available in several versions which aredesgined for different applications:

• USM 35XStandard version for universal ultrasonic test applica-tions.

• USM 35X DACThe multiple DAC curves and time-corrected gainenable a field-oriented echo amplitude evaluationaccording to almost all international test specifica-tions.

• USM 35X SDGS evaluation mode in addition to multiple DACcurves and TCG.DGS curves are stored for all narrow-band single-element probes; amplitude evaluation is carried outeither in dB above DAC curve or equivalent reflectorsize (ERS).

• Data Logger optionThis option is available for all USM 35X versions andis used for the recording and documentation of thick-ness readings.


IntroductionThe USM 35X family

Special features• low weight (2.2 kg including lithium-ion battery) and

compact size

• waterproof instrument case with protection classIP 66

• long operating time (> 12 hours) by means of lithium-ion battery with internal and external charging possi-bility

• handy – equipped with a non-slip, ratcheting prop-upstand, also used as handle

• rotary knobs for direct adjustment of gain as well asfor changing the currently selected function

• two independant gates for accurate wall thicknessmeasurements from the workpiece surface up to thefirst echo, or between two backwall echoes, includingmeasurement on coated workpieces with a resolutionof 0.01 mm (up to 100 mm), referred to steel

• magnify gate: spreading of the gate range over theentire screen width

• 5.7", 1/4 VGA-TFT color display to display the digi-tized signals (320 × 240 pixels, 115 × 86 mm )

• VGA interface for the connection of an externalmonitor

• color display of gates for an easier distinction

• easily recognizable reflection geometry when usingangle-beam probes by the variation of A-scan orbackground color at every deflection point

• data memory: 800 data sets, including alphanumericdescription, documentation possibility via a printer

• increased calibration range: up to 9999 mm (steel),depending on the frequency range

• semiautomatic two point calibration

• pulse repetition frequency variable in ten stepsto avoid phantom echoes when testing largeworkpieces

• choice of frequency range for the connected probe

• signal display mode: full-wave rectification, positivehalf-wave or negative halv-wave and radio frequency

• display of 4 readings plus 1 reading zoomed in theA-scan, user-configurable


IntroductionThe USM 35X family

Special features• low weight (2.2 kg including lithium-ion battery) and

compact size

• waterproof instrument case with protection classIP 66

• long operating time (> 12 hours) by means of lithium-ion battery with internal and external charging possi-bility

• handy – equipped with a non-slip, ratcheting prop-upstand, also used as handle

• rotary knobs for direct adjustment of gain as well asfor changing the currently selected function

• two independant gates for accurate wall thicknessmeasurements from the workpiece surface up to thefirst echo, or between two backwall echoes, includingmeasurement on coated workpieces with a resolutionof 0.01 mm (up to 100 mm), referred to steel

• magnify gate: spreading of the gate range over theentire screen width

• 5.7", 1/4 VGA-TFT color display to display the digi-tized signals (320 × 240 pixels, 115 × 86 mm )

• VGA interface for the connection of an externalmonitor

• color display of gates for an easier distinction

• easily recognizable reflection geometry when usingangle-beam probes by the variation of A-scan orbackground color at every deflection point

• data memory: 800 data sets, including alphanumericdescription, documentation possibility via a printer

• increased calibration range: up to 9999 mm (steel),depending on the frequency range

• semiautomatic two point calibration

• pulse repetition frequency variable in ten stepsto avoid phantom echoes when testing largeworkpieces

• choice of frequency range for the connected probe

• signal display mode: full-wave rectification, positivehalf-wave or negative halv-wave and radio frequency

• display of 4 readings plus 1 reading zoomed in theA-scan, user-configurable


Introduction How to use this manual

1.4 How to use this manual

The present operating manual applies to all instrumentversions of the USM 35X. Differences in the functionsor setting values are always marked.

Before operating the USM 35X for the first time, it isabsolutely necessary that you read the chapters 1, 3and 4 of this manual. They will inform you about thenecessary preparations of the instrument, give you adescription of all keys and screen displays, and explainthe operating principle.

In doing this, you will avoid any errors or failures of theinstrument and be able to use the full range of instru-ment functions.

You will find the latest changes to this operating manualin chapter 10 Changes. It describes corrections thathave become necessary at short notice and have notyet been included in the general manual. If no correc-tions have become necessary, this chapter is empty.

The specifications/Technical Specifications accordingto EN 12668-1 for the USM 35X family can be found inthe attachment at the end of this operating manual.

The Data Logger option, which can be applied to allUSM 35X versions, is described in a chapter of its own– at the end of the operating manual. All functions refer-ring to the Data Logger and the tolerance monitor aredescribed here. At the same time, the standard operat-ing manual applies to all other functions.


Introduction How to use this manual

1.4 How to use this manual

The present operating manual applies to all instrumentversions of the USM 35X. Differences in the functionsor setting values are always marked.

Before operating the USM 35X for the first time, it isabsolutely necessary that you read the chapters 1, 3and 4 of this manual. They will inform you about thenecessary preparations of the instrument, give you adescription of all keys and screen displays, and explainthe operating principle.

In doing this, you will avoid any errors or failures of theinstrument and be able to use the full range of instru-ment functions.

You will find the latest changes to this operating manualin chapter 10 Changes. It describes corrections thathave become necessary at short notice and have notyet been included in the general manual. If no correc-tions have become necessary, this chapter is empty.

The specifications/Technical Specifications accordingto EN 12668-1 for the USM 35X family can be found inthe attachment at the end of this operating manual.

The Data Logger option, which can be applied to allUSM 35X versions, is described in a chapter of its own– at the end of the operating manual. All functions refer-ring to the Data Logger and the tolerance monitor aredescribed here. At the same time, the standard operat-ing manual applies to all other functions.


IntroductionLayout and presentation in this manual

1.5 Layout and presentation inthis manual

To make it easier for you to use this manual, all operat-ing steps, notes, etc., are always presented in thesame way. This will help you find individual pieces ofinformation quickly.

Attention and Note symbols

A Attention:

The Attention symbol indicates peculiarities and spe-cial aspects in the operation which could affect theaccuracy of the results.

H Note:

Note contains e.g. references to other chapters or spe-cial recommendations for a function.

Listings

Listings are presented in the following form:

• Variant A

• Variant B

• ...

Operating steps

Operating steps appear as shown in the following ex-ample:

– Loosen the two screws at the bottom.

– Remove the cover.

– ...


IntroductionLayout and presentation in this manual

1.5 Layout and presentation inthis manual

To make it easier for you to use this manual, all operat-ing steps, notes, etc., are always presented in thesame way. This will help you find individual pieces ofinformation quickly.

Attention and Note symbols

A Attention:

The Attention symbol indicates peculiarities and spe-cial aspects in the operation which could affect theaccuracy of the results.

H Note:

Note contains e.g. references to other chapters or spe-cial recommendations for a function.

Listings

Listings are presented in the following form:

• Variant A

• Variant B

• ...

Operating steps

Operating steps appear as shown in the following ex-ample:

– Loosen the two screws at the bottom.

– Remove the cover.

– ...


Standard package and accessories 2


Standard package and accessories 2


Standard package and accessories

This chapter informs you about the standard packageand the accessories available for the USM 35X.

It describes

• accessories included in the standard package,

• recommended accessories.



This chapter informs you about the standard packageand the accessories available for the USM 35X.

It describes

• accessories included in the standard package,

• recommended accessories.



2.1 Standard package

Product code Description Order number

Ultrasonic testing kitconsisting of:

USM 35X Compact Ultrasonic Flaw Detector, basic versionwith LEMO-1-TRIAX connectors 36 060orwith BNC connectors 36 061

or

USM 35X DAC Compact Ultrasonic Flaw Detector, DAC versionwith LEMO-1-TRIAX connectors 36 062orwith BNC connectors 36 063

or

USM 35X S Compact Ultrasonic Flaw Detector, DAC/TCG andDGS evaluation with LEMO-1-TRIAX connectors 36 064orwith BNC connectors 36 065

Standard package



2.1 Standard package


Ultrasonic testing kitconsisting of:

USM 35X Compact Ultrasonic Flaw Detector, basic versionwith LEMO-1-TRIAX connectors 36 060orwith BNC connectors 36 061

or

USM 35X DAC Compact Ultrasonic Flaw Detector, DAC versionwith LEMO-1-TRIAX connectors 36 062orwith BNC connectors 36 063

or

USM 35X S Compact Ultrasonic Flaw Detector, DAC/TCG andDGS evaluation with LEMO-1-TRIAX connectors 36 064orwith BNC connectors 36 065

Standard package


Standard package and accessories Standard package


UM 30 Transport case 35 654

AC power supply/battery charger 102 163

Operating manual in English 48 001


Standard package and accessories Standard package


UM 30 Transport case 35 654

AC power supply/battery charger 102 163

Operating manual in English 48 001


Standard package and accessoriesRecommended accessories

2.2 Recommended accessories


Operating manual in German 48 002

Operating manual in French 48 003

Operating manual in Spanish 48 004

Operating manual in Japanese 48 005

Operating manual in Chinese 48 006

LI-ION Li-Ion battery NI2020, 10.8 V, 6.6 Ah 102 208

DR36 Battery charger for external chargingof the Li-Ion battery 35 297

NCA 1-6 6 NiCd cells, 3 Ah (alternatively to Li-Ion) 25 810

Energy 16 Desk rapid charger for external chargingof NiMH or NiCd cells 101 729

UM 32 Protection bag including neck strap 35 655

UD 20 PC cable, 25-pin (PC), 9-pin (instrument) 32 291


Standard package and accessoriesRecommended accessories

2.2 Recommended accessories


Operating manual in German 48 002

Operating manual in French 48 003

Operating manual in Spanish 48 004

Operating manual in Japanese 48 005

Operating manual in Chinese 48 006

LI-ION Li-Ion battery NI2020, 10.8 V, 6.6 Ah 102 208

DR36 Battery charger for external chargingof the Li-Ion battery 35 297

NCA 1-6 6 NiCd cells, 3 Ah (alternatively to Li-Ion) 25 810

Energy 16 Desk rapid charger for external chargingof NiMH or NiCd cells 101 729

UM 32 Protection bag including neck strap 35 655






UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495

UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944

Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121

Serial-to-parallel printer cable (Patton Model 2029) 101 761

Adapter cable RS232 – USB 35 838

UM 25 Analog cable, 8-pin Lemo plug (instrument), open ended 35 268

UM 31 VGA adapter for connection of an external monitor 35 653

UM 28 D Option: Data Logger (retrofittable to all versions) 35 800

UM 200 W UltraDOC data communication software for USM 35 024

U 100 W UltraDOC 33 829

PZ-USM Calibration certificate according to EN 12668-1 35 263

Epson LX Matrix printer for mains operation, single sheet andcontinuous stationary 17 995

Seiko DPU Thermal printer for mains and battery operation 17 993

Recommended accessories





UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495

UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944

Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121

Serial-to-parallel printer cable (Patton Model 2029) 101 761

Adapter cable RS232 – USB 35 838

UM 25 Analog cable, 8-pin Lemo plug (instrument), open ended 35 268

UM 31 VGA adapter for connection of an external monitor 35 653

UM 28 D Option: Data Logger (retrofittable to all versions) 35 800

UM 200 W UltraDOC data communication software for USM 35 024

U 100 W UltraDOC 33 829

PZ-USM Calibration certificate according to EN 12668-1 35 263

Epson LX Matrix printer for mains operation, single sheet andcontinuous stationary 17 995

Seiko DPU Thermal printer for mains and battery operation 17 993

Recommended accessories


Initial start-up 3


Initial start-up 3


Initial start-up

Connecting the instrument

Connect the USM 35X to the mains socket-outlet usingthe corresponding power supply unit. The plug recep-tacle is at the top left of the USM 35X.

– Push the Lemo plug of the power supply unit into theplug receptacle until it snaps into place with a clearlyaudible click.

Power supply

3.1 Power supply

The USM 35X can be operated with an external powerpack adaptor or with batteries.

You can connect the USM 35X to the mains supplysystem even if it carries batteries. The battery power isthen automatically interrupted.

Operation using the power supply unit

Mains connection

The power supply unit is delivered with two differentpower cables – for Euro and USA standard.


Initial start-up

Connecting the instrument

Connect the USM 35X to the mains socket-outlet usingthe corresponding power supply unit. The plug recep-tacle is at the top left of the USM 35X.

– Push the Lemo plug of the power supply unit into theplug receptacle until it snaps into place with a clearlyaudible click.

Power supply

3.1 Power supply

The USM 35X can be operated with an external powerpack adaptor or with batteries.

You can connect the USM 35X to the mains supplysystem even if it carries batteries. The battery power isthen automatically interrupted.

Operation using the power supply unit

Mains connection

The power supply unit is delivered with two differentpower cables – for Euro and USA standard.


Initial start-upPower supply

– When pulling off the Lemo plug, withdraw the metalbushing on the plug first in order to release the lock.

The power supply unit is automatically set to any nomi-nal voltage between 90 VAC and 240 VAC.

Operation using batteries

Use either a lithium-ion battery or 6 standard C-cells(NiCad, NiMH, or alkaline cells) for the battery opera-tion. We recommend the use of a lithium-ion battery. Ithas a higher capacity and consequently ensures alonger operating time of the instrument.

Inserting batteries

The battery compartment is situated at the instrumentback; the lid is fastened with 2 attachment screws.

– Press the two attachment screws of the batterycompartment downward in order to loosen them.

– Lift the lid off upward. To the right in the open batterycompartment, you will see two springs and severalconnection pins.

– Insert the battery into the battery compartment. Todo this, first press the right side of the batteryagainst the springs of the battery compartment.Make sure that the socket on the right side of thebattery is connected with the connection pins in thebattery compartment.


Initial start-upPower supply

– When pulling off the Lemo plug, withdraw the metalbushing on the plug first in order to release the lock.

The power supply unit is automatically set to any nomi-nal voltage between 90 VAC and 240 VAC.

Operation using batteries

Use either a lithium-ion battery or 6 standard C-cells(NiCad, NiMH, or alkaline cells) for the battery opera-tion. We recommend the use of a lithium-ion battery. Ithas a higher capacity and consequently ensures alonger operating time of the instrument.

Inserting batteries

The battery compartment is situated at the instrumentback; the lid is fastened with 2 attachment screws.

– Press the two attachment screws of the batterycompartment downward in order to loosen them.

– Lift the lid off upward. To the right in the open batterycompartment, you will see two springs and severalconnection pins.

– Insert the battery into the battery compartment. Todo this, first press the right side of the batteryagainst the springs of the battery compartment.Make sure that the socket on the right side of thebattery is connected with the connection pins in thebattery compartment.


Initial start-up

or

– Insert the batteries into the battery compartment andcheck the right polarity.

– Close the battery compartment and fasten theattachment screws.

Checking the battery charge of lithium-ion batteries

The lithium-ion battery is equipped with a batterycharge indicator. The battery charge indicator is situatedat the front right of the battery. Four LEDs indicate thecharge level of battery. Check the battery charge beforeinserting the battery into the instrument.

The number of LEDs that are on has the followingmeaning:

• 4 LEDs – battery charge 100 ... 76%



• 1 LED – battery charge 25 ... 10%

• 1 LED flashing – battery charge <10%

Power supply


Initial start-up

or

– Insert the batteries into the battery compartment andcheck the right polarity.

– Close the battery compartment and fasten theattachment screws.

Checking the battery charge of lithium-ion batteries

The lithium-ion battery is equipped with a batterycharge indicator. The battery charge indicator is situatedat the front right of the battery. Four LEDs indicate thecharge level of battery. Check the battery charge beforeinserting the battery into the instrument.

The number of LEDs that are on has the followingmeaning:




• 1 LED – battery charge 25 ... 10%

• 1 LED flashing – battery charge <10%

Power supply


Initial start-up

– Press the button PUSH at the front side of thebattery. Four LEDs indicate the charge level ofbattery.

H Note:

You can also check the battery charge even if the batteryis located in the battery compartment of the instrument.

Battery charge indicator

In the measurement line of the USM 35X, an inverted Bappears if the battery charge is low.

Power supply

H Note:

If the icon for low battery charge appears, you shouldurgently close your test job and exchange the batteries.You should take replacement batteries with you if youaim to carry out measurements on site.

Charging the batteries

You can charge the lithium-ion battery either directly inthe instrument or by means of an external batterycharger. You always need an external battery charger tocharge standard C-cells.

Internal charging

Requirement:

• Lithium-ion battery, order number 102 208

• Power supply/charger unit, order number 102 163

If a battery is located in the instrument, the chargingprocess is started automatically when you connect theplug-in power supply unit. You can carry out ultrasonicinspections and charge a battery at the same time.


Initial start-up

– Press the button PUSH at the front side of thebattery. Four LEDs indicate the charge level ofbattery.

H Note:

You can also check the battery charge even if the batteryis located in the battery compartment of the instrument.

Battery charge indicator

In the measurement line of the USM 35X, an inverted Bappears if the battery charge is low.

Power supply

H Note:

If the icon for low battery charge appears, you shouldurgently close your test job and exchange the batteries.You should take replacement batteries with you if youaim to carry out measurements on site.


You can charge the lithium-ion battery either directly inthe instrument or by means of an external batterycharger. You always need an external battery charger tocharge standard C-cells.

Internal charging

Requirement:

• Lithium-ion battery, order number 102 208

• Power supply/charger unit, order number 102 163

If a battery is located in the instrument, the chargingprocess is started automatically when you connect theplug-in power supply unit. You can carry out ultrasonicinspections and charge a battery at the same time.


Initial start-up

The charging time is 10 hours with a simultaneous ul-trasonic inspection. If the instrument is not being usedfor ultrasonic inspections, the charging time is 8 hours.This charging time applies to ambient temperaturesfrom 25 to 30 °C. Please take into consideration thatthe batteries are not charged to their full capacity athigher temperatures.

The LED display on the plug-in power supply unit indi-cates the status of the charging process.

Power supply

green LED yellow LED red LED Status

off flashing off no battery detected

off flashing dark/bright flashing bright/dark charging at low power

off on off quick charging phase 1

flashing dark/bright flashing bright/dark off quick charging phase 2

on off off battery charged

off off flashing bright/dark temperature error, auto-reversible

off off on csharging error, permanent

External charging

Lithium-ion batteries can be charged by means of anexternal battery charger. We recommend the batterycharger with the order number 35 297. To charge singleNiCad or NiMH cells, you need the external desktopbattery charger with the order number 101 729.


Initial start-up

The charging time is 10 hours with a simultaneous ul-trasonic inspection. If the instrument is not being usedfor ultrasonic inspections, the charging time is 8 hours.This charging time applies to ambient temperaturesfrom 25 to 30 °C. Please take into consideration thatthe batteries are not charged to their full capacity athigher temperatures.

The LED display on the plug-in power supply unit indi-cates the status of the charging process.

Power supply

green LED yellow LED red LED Status

off flashing off no battery detected

off flashing dark/bright flashing bright/dark charging at low power

off on off quick charging phase 1

flashing dark/bright flashing bright/dark off quick charging phase 2

on off off battery charged

off off flashing bright/dark temperature error, auto-reversible

off off on csharging error, permanent

External charging

Lithium-ion batteries can be charged by means of anexternal battery charger. We recommend the batterycharger with the order number 35 297. To charge singleNiCad or NiMH cells, you need the external desktopbattery charger with the order number 101 729.


Initial start-up

3.2 Connecting a probe

To prepare the USM 35X for operation, you have toconnect a probe to it. Any Krautkramer probe can beused for the USM 35X, provided the appropriate cableis available and the operating frequency is within anadequate range.

The USM 35X is available with the probe connectorsLEMO-1-TRIAX or BNC.

The probe is connected to the sockets at the top righton the instrument casing. Both connector sockets areequally suitable (connected in parallel) for connectingprobes equipped with only one ultrasonic element (ultra-sonic transducer) so that it does not matter which oneof the two sockets is used.

When connecting a dual-element (TR) probe (havingone transmitter element and one receiver element), ortwo probes (of which one is transmitting and the otherone receiving), attention should be paid to connectingthe transmitter element to the right-hand socket (trans-mitter, marked with black circle at the rear of the instru-ment case) and the receiver element to the left-handsocket (receiver, marked with red circle).

A Attention:

If this is not taken into account, the consequencewould be a mismatching which may lead to consider-able power losses or even to echo waveform distor-tions.

Receiver Transmitter

Connecting a probe


Initial start-up

3.2 Connecting a probe

To prepare the USM 35X for operation, you have toconnect a probe to it. Any Krautkramer probe can beused for the USM 35X, provided the appropriate cableis available and the operating frequency is within anadequate range.

The USM 35X is available with the probe connectorsLEMO-1-TRIAX or BNC.

The probe is connected to the sockets at the top righton the instrument casing. Both connector sockets areequally suitable (connected in parallel) for connectingprobes equipped with only one ultrasonic element (ultra-sonic transducer) so that it does not matter which oneof the two sockets is used.

When connecting a dual-element (TR) probe (havingone transmitter element and one receiver element), ortwo probes (of which one is transmitting and the otherone receiving), attention should be paid to connectingthe transmitter element to the right-hand socket (trans-mitter, marked with black circle at the rear of the instru-ment case) and the receiver element to the left-handsocket (receiver, marked with red circle).

A Attention:

If this is not taken into account, the consequencewould be a mismatching which may lead to consider-able power losses or even to echo waveform distor-tions.

Receiver Transmitter

Connecting a probe


Initial start-up

3.3 Starting the USM 35X

Switching on

To start the USM 35X, press the switch-on key .

The start display of the USM 35X appears; here youwill also see the current software version of the instru-ment. The instrument carries out a self-check and thenswitches over to stand-by mode.

The settings of all function values and the basic set-tings (language and units) are the same as beforeswitching-on of the instrument.

Reset

If any functions can no longer be operated after a warmstart, or if you want to reset the instrument to the basicsetup, then you should carry out a cold start by simul-taneously pressing the and the key.

The cold start message “Basic Initialization” is dis-played. The instrument is initialized and reset to itsbasic setup (dialog language: English, for more detailson how to select the language, please refer to chapter 4).

A Attention:

All saved data are deleted.

Information lines in the startup screen

You can enter two lines (each with up to 39 characters)for information purposes in the startup screen. For thisuse the remote function (codes I1 and I2, refer to chap-ter 8).

Starting the USM 35X


Initial start-up

3.3 Starting the USM 35X

Switching on

To start the USM 35X, press the switch-on key .

The start display of the USM 35X appears; here youwill also see the current software version of the instru-ment. The instrument carries out a self-check and thenswitches over to stand-by mode.

The settings of all function values and the basic set-tings (language and units) are the same as beforeswitching-on of the instrument.

Reset

If any functions can no longer be operated after a warmstart, or if you want to reset the instrument to the basicsetup, then you should carry out a cold start by simul-taneously pressing the and the key.

The cold start message “Basic Initialization” is dis-played. The instrument is initialized and reset to itsbasic setup (dialog language: English, for more detailson how to select the language, please refer to chapter 4).

A Attention:

All saved data are deleted.

Information lines in the startup screen

You can enter two lines (each with up to 39 characters)for information purposes in the startup screen. For thisuse the remote function (codes I1 and I2, refer to chap-ter 8).

Starting the USM 35X


Principles of operation 4


Principles of operation 4


Principles of operation Operator’s controls

Keys for selectinga function

Rotary knob fordirect setting of thecurrent function

Rotary knob fordirect gain setting

Special keys forspecial instrumentfunctions

Keys for selecting a function group

On/Off key

4.1 Operator’s controls LED A: Gate alarmR: RejectionD: Dual on

Key for changingthe operation level


Principles of operation Operator’s controls

Keys for selectinga function

Rotary knob fordirect setting of thecurrent function

Rotary knob fordirect gain setting

Special keys forspecial instrumentfunctions

Keys for selecting a function group

On/Off key

4.1 Operator’s controls LED A: Gate alarmR: RejectionD: Dual on

Key for changingthe operation level


Principles of operationScreen display

4.2 Screen display

The USM 35X has a digital screen for the display of

• A-scan in the normal mode

• A-scan in the zoom modeThe zoom mode is activated using the key .

H Note:

The screen display always shows the gain and the ad-justed dB step value. All other functions are locked inzoom mode.



4.2 Screen display

The USM 35X has a digital screen for the display of

• A-scan in the normal mode

• A-scan in the zoom modeThe zoom mode is activated using the key .

H Note:

The screen display always shows the gain and the ad-justed dB step value. All other functions are locked inzoom mode.


Principles of operation Screen display

Functions on the display

The names of the five function groups are displayed atthe bottom of the screen. The currently selected func-tion group is highlighted.

Indicated at the right of the display, next to the A-scan,are the functions of the corresponding function group.The display of the functions disappears in the zoommode.


Principles of operation Screen display

Functions on the display

The names of the five function groups are displayed atthe bottom of the screen. The currently selected func-tion group is highlighted.

Indicated at the right of the display, next to the A-scan,are the functions of the corresponding function group.The display of the functions disappears in the zoommode.



Amplitude heightGate A (%)

Sound pathGate A

Amplitude heightGate B (%)

Sound pathGate B

Status indicator:TOF = Flank

Other displays

The measurement line below the screen display showsvalues of settings, measured values, and status indica-tions. As an alternative, a scale can be shown here,giving an overview of the echo positions.

H Note:

Every measurement value can also be shown in anenlarged display at the top right corner of the A-scan(setting in the function group MEAS, function S-DISP).

H Note:

You can configure the four positions of the measure-ment line for set and measured values as required(function group MSEL). Please refer to chapter 5.14,section Configuring the measurement line on this sub-ject.

Example of a measurement line



Amplitude heightGate A (%)

Sound pathGate A

Amplitude heightGate B (%)

Sound pathGate B

Status indicator:TOF = Flank

Other displays

The measurement line below the screen display showsvalues of settings, measured values, and status indica-tions. As an alternative, a scale can be shown here,giving an overview of the echo positions.

H Note:

Every measurement value can also be shown in anenlarged display at the top right corner of the A-scan(setting in the function group MEAS, function S-DISP).

H Note:

You can configure the four positions of the measure-ment line for set and measured values as required(function group MSEL). Please refer to chapter 5.14,section Configuring the measurement line on this sub-ject.

Example of a measurement line


Principles of operation Keys and rotary knobs

4.3 Keys and rotary knobs

Function keys

For changing between operation levels (below),

For selection of the function groups (below) and

For selection of the functions (right).

On/Off key

For turning the device on or off.


Principles of operation Keys and rotary knobs

4.3 Keys and rotary knobs

Function keys

For changing between operation levels (below),

For selection of the function groups (below) and

For selection of the functions (right).

On/Off key

For turning the device on or off.


Principles of operationKeys and rotary knobs

Special keys

To directly activate individual instrument functions:

To choose the increment for the gain setting

To freeze the A-scan

To display a zoomed A-scan

To transfer the data

To record measured values and to save the data


Principles of operationKeys and rotary knobs

Special keys

To directly activate individual instrument functions:

To choose the increment for the gain setting

To freeze the A-scan

To display a zoomed A-scan

To transfer the data

To record measured values and to save the data


Principles of operation

Rotary knobs

The USM 35X is equipped with two rotary knobs.

The left-hand rotary knob enables you to directly setthe gain; the right-hand rotary knob serves for settingthe currently selected function.

The two rotary knobs enable both step-by-step andaccelerated settings. You can define a setting step bystep by slightly operating the rotary knob which willsnap into place at the next setting. To accelerate thesetting, operate the rotary knob continuously, i.e. at aconstant speed. This enables you to quickly bridgegreat differences between the settings.

Keys and rotary knobs

4.4 Operational concept

The USM 35X is an easy-to-use instrument. It hasthree operating levels, and you can change betweenthem by pressing the key. You will recognize yourcurrently active operating level by the number on theseparation line between the first and the second func-tion group.

If the instrument is equipped with the Data Logger option,a fourth operating level is added to the existing ones.

Each operating level contains five function groups.

First operating level

Second operating level

Third operating level



Rotary knobs

The USM 35X is equipped with two rotary knobs.

The left-hand rotary knob enables you to directly setthe gain; the right-hand rotary knob serves for settingthe currently selected function.

The two rotary knobs enable both step-by-step andaccelerated settings. You can define a setting step bystep by slightly operating the rotary knob which willsnap into place at the next setting. To accelerate thesetting, operate the rotary knob continuously, i.e. at aconstant speed. This enables you to quickly bridgegreat differences between the settings.

Keys and rotary knobs

4.4 Operational concept

The USM 35X is an easy-to-use instrument. It hasthree operating levels, and you can change betweenthem by pressing the key. You will recognize yourcurrently active operating level by the number on theseparation line between the first and the second func-tion group.

If the instrument is equipped with the Data Logger option,a fourth operating level is added to the existing ones.

Each operating level contains five function groups.






Setting the functions

Shown below the A-scan are five function groups thatyou can directly select using the corresponding key.The selected function group is highlighted and the cor-responding four functions are displayed next to theA-scan on the right. You can likewise directly select theindividual functions using the corresponding keys.

Functions with double assignments

Some functions have double assignments. You will rec-ognize the functions with double assignments by anarrow (icon >) after the function name.

Toggle between the two functions by repeatedly press-ing the corresponding key .

Coarse and fine adjustment of functions

You can choose between coarse and fine adjustmentfor some functions. You can toggle between these twoadjustment modes by pressing the corresponding

key several times. The fine adjustment is identifiedby an asterisk preceding the function value.

The following functions offer a choice between coarseand fine adjustment:

Function Function group

RANGE BASEMTLVEL BASED-DELAY BASEaSTART aGATaWIDTH aGATbWIDTH bGATS-REF1 CALS-REF2 CALANGLE TRIGTHICKNE TRIGDIAMET TRIG

For more details on the adjustment possibilities, pleaseread from page 5-5 onward.

Operational concept



Setting the functions

Shown below the A-scan are five function groups thatyou can directly select using the corresponding key.The selected function group is highlighted and the cor-responding four functions are displayed next to theA-scan on the right. You can likewise directly select theindividual functions using the corresponding keys.

Functions with double assignments

Some functions have double assignments. You will rec-ognize the functions with double assignments by anarrow (icon >) after the function name.

Toggle between the two functions by repeatedly press-ing the corresponding key .

Coarse and fine adjustment of functions

You can choose between coarse and fine adjustmentfor some functions. You can toggle between these twoadjustment modes by pressing the corresponding

key several times. The fine adjustment is identifiedby an asterisk preceding the function value.

The following functions offer a choice between coarseand fine adjustment:

Function Function group

RANGE BASEMTLVEL BASED-DELAY BASEaSTART aGATaWIDTH aGATbWIDTH bGATS-REF1 CALS-REF2 CALANGLE TRIGTHICKNE TRIGDIAMET TRIG

For more details on the adjustment possibilities, pleaseread from page 5-5 onward.

Operational concept



4.5 Important basic settings

Selecting the language

Select the language in which the function names shouldbe displayed on the screen in the function DIALOG(Function group CFG1). The following languages areavailable:

• German• English (default setting)• French• Italian• Spanish• Portuguese• Dutch• Swedish• Slovenian• Romanian• Finnish• Czech• Danish• Hungarian• Croatian

• Russian• Slovakian• Norwegian• Polish• Japanese

H Note:

More dialog languages can be added on request.

– If necessary, go to the third operating level.

– In the function group CFG1 select the functionDIALOG.

Important basic settings



4.5 Important basic settings

Selecting the language

Select the language in which the function names shouldbe displayed on the screen in the function DIALOG(Function group CFG1). The following languages areavailable:

• German• English (default setting)• French• Italian• Spanish• Portuguese• Dutch• Swedish• Slovenian• Romanian• Finnish• Czech• Danish• Hungarian• Croatian

• Russian• Slovakian• Norwegian• Polish• Japanese

H Note:



– In the function group CFG1 select the functionDIALOG.



Principles of operationImportant basic settings

H Note:

Double assignment of the function DIALOG/UNIT(icon >). Toggle between the two functions by repeatedlypressing the corresponding key .

– Select the required language by means of the right-hand rotary knob.

Selecting units

In the function UNIT (function group CFG1) you canchoose your favorite units between mm or inch.


– In the function group CFG1 select the function UNIT.

H Note:


– Set the required unit by means of the right-handrotary knob.

A Attention:

Select your units immediately when you start workingwith the USM 35X because if you change the unit, allthe current settings are deleted, and the basic setup isloaded again.


Principles of operationImportant basic settings

H Note:


– Select the required language by means of the right-hand rotary knob.

Selecting units

In the function UNIT (function group CFG1) you canchoose your favorite units between mm or inch.


– In the function group CFG1 select the function UNIT.

H Note:


– Set the required unit by means of the right-handrotary knob.

A Attention:

Select your units immediately when you start workingwith the USM 35X because if you change the unit, allthe current settings are deleted, and the basic setup isloaded again.



In order not to delete anything by accident, a safetyprompt is displayed in the measurement line.

– If you are sure that you want to change the unit,press the key belonging to the function UNIT onemore time.

The unit is now changed, the current data aredeleted.

– If you want to abort the process, press any otherkey. The previous setting is kept in that case.

Setting the date

The date is saved together with the test results. Youcan set it in the function DATE (function group CFG2).

A Attention:

Please take into account that the USM 35X only indi-cates the year with two digits.

You should always make sure that you use correctlyset values of date. Test results may otherwise be falsi-fied.

– If necessary, change to the third operation level.

– Select the function DATE in the function groupCFG2.

H Note:

Double assignment of the function DATE/TIME (icon >).Toggle between the two functions by repeatedly press-ing the corresponding key .

– Use the left-hand rotary knob to select the value thatyou want to vary, e.g. the day.

– Use the right-hand rotary knob to vary the selectedvalue.




In order not to delete anything by accident, a safetyprompt is displayed in the measurement line.

– If you are sure that you want to change the unit,press the key belonging to the function UNIT onemore time.

The unit is now changed, the current data aredeleted.

– If you want to abort the process, press any otherkey. The previous setting is kept in that case.

Setting the date

The date is saved together with the test results. Youcan set it in the function DATE (function group CFG2).

A Attention:

Please take into account that the USM 35X only indi-cates the year with two digits.

You should always make sure that you use correctlyset values of date. Test results may otherwise be falsi-fied.


– Select the function DATE in the function groupCFG2.

H Note:


– Use the left-hand rotary knob to select the value thatyou want to vary, e.g. the day.





Setting the time

The function TIME (function group CFG2) serves forsetting the current hour of time. It is saved togetherwith the test results.

A Attention:

You should always make sure that you are using thecorrect time settings. Test results may otherwise befalsified.

Don’t forget to manually set the time when changingfrom winter to summer time.


– Select the function TIME in the function group CFG2.

H Note:


– Use the left-hand rotary knob to select the value thatyou want to vary, e.g. the hour.





Setting the time

The function TIME (function group CFG2) serves forsetting the current hour of time. It is saved togetherwith the test results.

A Attention:

You should always make sure that you are using thecorrect time settings. Test results may otherwise befalsified.

Don’t forget to manually set the time when changingfrom winter to summer time.


– Select the function TIME in the function group CFG2.

H Note:


– Use the left-hand rotary knob to select the value thatyou want to vary, e.g. the hour.





4.6 Basic settings of the display

The equipment of the USM 35X includes a high-resolu-tion color display. You can optimize the display settingsto your individual viewing habits and to the operationalenvironment.

Selecting the color scheme

You can use the function SCHEME (function groupLCD) to choose one of four color schemes. The colorscheme determines the color of all displays and that ofthe background. You cannot vary the colors of gatesbecause they are fixed as follows:

• Gate A – red

• Gate B – green

• Gate C – blue

H Note:

All color schemes are suitable for indoor use. For out-door use, we recommend the color schemes 3 and 4.

Basic settings of the display


– Select the function SCHEME in the function groupLCD.

– Use the right-hand rotary knob to choose the requiredcolor scheme.

Setting the lighting

Use the function LIGHT (function group LCD) to set thedisplay lighting. You can choose between the defaultlighting max. and a lighting in the economy mode min..

H Note:

The economy mode reduces the current consumptionand consequently increases the operating time in bat-tery operation.


– Select the function LIGHT in the function group LCD.

– Use the right-hand rotary knob to set the requiredlighting.



4.6 Basic settings of the display

The equipment of the USM 35X includes a high-resolu-tion color display. You can optimize the display settingsto your individual viewing habits and to the operationalenvironment.

Selecting the color scheme

You can use the function SCHEME (function groupLCD) to choose one of four color schemes. The colorscheme determines the color of all displays and that ofthe background. You cannot vary the colors of gatesbecause they are fixed as follows:

• Gate A – red


• Gate C – blue

H Note:


Basic settings of the display


– Select the function SCHEME in the function groupLCD.


Setting the lighting

Use the function LIGHT (function group LCD) to set thedisplay lighting. You can choose between the defaultlighting max. and a lighting in the economy mode min..

H Note:



– Select the function LIGHT in the function group LCD.



Operation 5


Operation 5


Operation Overview of the functions

5.1 Overview of the functions

The functions of the USM 35X are combined to formfunction groups on three operating levels.

If the instrument has the option Data Logger, there is anadditional fourth operation level.

– Press the key to change between the operatinglevels.

– Press the key to select the function group shownabove it.

– Press the key to select the function shown nextto it. The setting of the selected function is carriedout via the right-hand rotary knob.

The gain function is always directly available via theleft-hand rotary knob.

You can carry out important functions (switch on/off,dB-step, freeze, zoom and report printout) by pressingthe special keys (ref. chapter 4).

You will also find an overview of the function groupsand their functions on the fold-out page.

Each operating level contains five function groups. Youwill recognize your currently active operating level bythe number on the separation line between the first andthe second function group.




H Note:

If the instrument is equipped with the Data Logger op-tion, a fourth operating level is added. For this, refer tothe corresponding chapter Option Data Logger.


Operation Overview of the functions

5.1 Overview of the functions

The functions of the USM 35X are combined to formfunction groups on three operating levels.

If the instrument has the option Data Logger, there is anadditional fourth operation level.

– Press the key to change between the operatinglevels.

– Press the key to select the function group shownabove it.

– Press the key to select the function shown nextto it. The setting of the selected function is carriedout via the right-hand rotary knob.

The gain function is always directly available via theleft-hand rotary knob.

You can carry out important functions (switch on/off,dB-step, freeze, zoom and report printout) by pressingthe special keys (ref. chapter 4).

You will also find an overview of the function groupsand their functions on the fold-out page.

Each operating level contains five function groups. Youwill recognize your currently active operating level bythe number on the separation line between the first andthe second function group.




H Note:

If the instrument is equipped with the Data Logger op-tion, a fourth operating level is added. For this, refer tothe corresponding chapter Option Data Logger.


OperationOverview of the functions

Function groups first operating level

BASE The functions that you find here are re-quired for the basic adjustment of thescreen displays.

PULS Combined in this group are the functionsthat serve for the adjustment of pulser.

RECV Combined in this group are the functionsthat serve for the adjustment of receiver.

aGAT All functions for setting the gate A can befound in this group.

bGAT All functions for setting the gate B can befound in this group.

Function groups second operating level

CAL This function group makes functions for thesemiautomatic calibration available to you.

REF This function group serves for measuringthe dB difference between a referenceecho and the reflector echo.

or

AWS This is where you will find all functions forthe classification of flaws in welds accord-ing to the AWS D1.1 specification.

or

DAC This is the function group where you canset the functions for the DAC (onlyUSM 35X DAC and USM 35X S).

or

JDAC The DAC functions in this function groupare modified to allow for a flaw evaluationaccording to JIS (Japanese IndustrialStandard) Z3060-2002 (only USM 35X DACand USM 35X S).


OperationOverview of the functions

Function groups first operating level

BASE The functions that you find here are re-quired for the basic adjustment of thescreen displays.

PULS Combined in this group are the functionsthat serve for the adjustment of pulser.

RECV Combined in this group are the functionsthat serve for the adjustment of receiver.

aGAT All functions for setting the gate A can befound in this group.

bGAT All functions for setting the gate B can befound in this group.

Function groups second operating level

CAL This function group makes functions for thesemiautomatic calibration available to you.

REF This function group serves for measuringthe dB difference between a referenceecho and the reflector echo.

or

AWS This is where you will find all functions forthe classification of flaws in welds accord-ing to the AWS D1.1 specification.

or

DAC This is the function group where you canset the functions for the DAC (onlyUSM 35X DAC and USM 35X S).

or

JDAC The DAC functions in this function groupare modified to allow for a flaw evaluationaccording to JIS (Japanese IndustrialStandard) Z3060-2002 (only USM 35X DACand USM 35X S).


Operation

or

DGS This function group serves for the ampli-tude evaluation according to the DGSmethod (only USM 35X S).

TRIG Combined in this group are the functionsrequired for angle beaming using angle-beam probes for the display of a (reduced)projection distance and depth position of areflector (for plane-parallel and circularcurved test components).

MEM These functions serve for storing, loadingand deleting of data sets.

DATA The functions of this group serve for thedataset management and documentation.

Function groups third operating level

MEAS In this group, you can define the measuringpoint, select a parameter for the zoomedmeasured-value display in the A-scan aswell as for the setting of the Magnify func-tion, and you can select different settingsfor the A-scan.

MSEL This is where you configure your measure-ment line. You can choose one display foreach of the four positions.

LCD This is the function group where you canset the LCD contrast and backlight as wellas the echo display mode on the screen.

CFG1 Functions for the configuration: unit, dialoglanguage, printer driver and assignment of

the key

CFG2 Other functions for configuration: time anddate, alarm horn; plus the changeoverbetween the evaluation modes

Overview of the functions


Operation

or

DGS This function group serves for the ampli-tude evaluation according to the DGSmethod (only USM 35X S).

TRIG Combined in this group are the functionsrequired for angle beaming using angle-beam probes for the display of a (reduced)projection distance and depth position of areflector (for plane-parallel and circularcurved test components).

MEM These functions serve for storing, loadingand deleting of data sets.

DATA The functions of this group serve for thedataset management and documentation.

Function groups third operating level

MEAS In this group, you can define the measuringpoint, select a parameter for the zoomedmeasured-value display in the A-scan aswell as for the setting of the Magnify func-tion, and you can select different settingsfor the A-scan.

MSEL This is where you configure your measure-ment line. You can choose one display foreach of the four positions.

LCD This is the function group where you canset the LCD contrast and backlight as wellas the echo display mode on the screen.

CFG1 Functions for the configuration: unit, dialoglanguage, printer driver and assignment of

the key

CFG2 Other functions for configuration: time anddate, alarm horn; plus the changeoverbetween the evaluation modes

Overview of the functions


OperationSetting the gain

5.2 Setting the gain

This function, operated via the left-hand rotary knob,enables you to quickly and directly set the gain.

You can use the gain to adjust the required sensitivityin order to control the echo amplitudes.

– Turn the left-hand rotary knob to set the gain. Thecurrent gain is indicated in the top left corner of thescreen.

Defining the dB incrementation for gain

You can use the key to select a certain incremen-tation for setting the gain. You have a choice between6 steps:

• 0.0 dB (locked)

• 0.5 dB

• 1.0 dB

• 2.0 dB

• 6.0 dB

• 6.5 … 20.0 dB

H Note:

The setting 0.0 dB locks the gain in this way preventingany accidental change of setting.

You can determine the step size of the sixth step usingthe function dBSTEP in the function group RECV.

– Press to change between the six steps.The corresponding step size setting is indicatedbelow the current gain on the screen.


OperationSetting the gain

5.2 Setting the gain

This function, operated via the left-hand rotary knob,enables you to quickly and directly set the gain.

You can use the gain to adjust the required sensitivityin order to control the echo amplitudes.

– Turn the left-hand rotary knob to set the gain. Thecurrent gain is indicated in the top left corner of thescreen.

Defining the dB incrementation for gain

You can use the key to select a certain incremen-tation for setting the gain. You have a choice between6 steps:

• 0.0 dB (locked)

• 0.5 dB

• 1.0 dB

• 2.0 dB

• 6.0 dB

• 6.5 … 20.0 dB

H Note:

The setting 0.0 dB locks the gain in this way preventingany accidental change of setting.

You can determine the step size of the sixth step usingthe function dBSTEP in the function group RECV.

– Press to change between the six steps.The corresponding step size setting is indicatedbelow the current gain on the screen.


Operation

5.3 Adjusting the display range(function group BASE)

The function group BASE enables you to make thebasic adjustment of the display range. The display onthe screen must be adjusted for the material to be test-ed (function MTLVEL) and for the probe used (functionP-DELAY).

– If required, go to the first operating level.

– Select the function group BASE.

Adjusting the display range (function group BASE)

H Note:

In order to accurately adjust the material velocity andthe probe delay, please read the section Calibrating theUSM 35X, chapter 5.7, beforehand.

RANGE (Display range)

You can adjust the range for your measurement inRANGE.

• Coarse adjustment:from 0.5 mm ... 1400 (9999) mm in even steps

• Fine adjustment:up to 9.99 mm in steps of 0.01 mmup to 99.9 mm in steps of 0.1 mmup to 999 mm in steps of 1 mm

H Note:

The adjustment range for the display range depends onthe frequency range setting (function FREQU in func-tion group RECV).


Operation

5.3 Adjusting the display range(function group BASE)

The function group BASE enables you to make thebasic adjustment of the display range. The display onthe screen must be adjusted for the material to be test-ed (function MTLVEL) and for the probe used (functionP-DELAY).


– Select the function group BASE.

Adjusting the display range (function group BASE)

H Note:

In order to accurately adjust the material velocity andthe probe delay, please read the section Calibrating theUSM 35X, chapter 5.7, beforehand.

RANGE (Display range)

You can adjust the range for your measurement inRANGE.

• Coarse adjustment:from 0.5 mm ... 1400 (9999) mm in even steps

• Fine adjustment:up to 9.99 mm in steps of 0.01 mmup to 99.9 mm in steps of 0.1 mmup to 999 mm in steps of 1 mm

H Note:

The adjustment range for the display range depends onthe frequency range setting (function FREQU in func-tion group RECV).


OperationAdjusting the display range (function group BASE)

Frequency range Adjustment range (c = 5920 m/s)0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390"0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390"0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50"2 to 20 MHz 0.5 to 1420 mm/0.02" to 50"

– Select the function RANGE.

– If required, toggle between coarse and fine adjust-ment.

– Adjust the required value by means of the right-handrotary knob.

MTLVEL (Sound velocity)

Use MTLVEL to set the sound velocity within the testobject. You can use sound velocities between 1000 and15000 m/s.

• Coarse adjustment, in steps as follows (m/s):15000 9000 5000 200014000 8000 4000 160013000 7000 3250 145012000 6320 3130 100011000 6000 300010000 5920 2730

• Fine adjustment1000 ... 15000 in steps of 1 m/s

A Attention:

Always ensure that the function MTLVEL is correctlyset. The USM 35X calculates all range and distanceindications on the basis of the value adjusted here.

– Select the function MTLVEL.



D-DELAY (Display starting point)

Here you can choose whether to display the adjustedrange (for example 250 mm) starting from the surfaceof the test object, or in a section of the test objectstarting at a later point. This allows you to shift thecomplete screen display and consequently also thedisplay zero.


OperationAdjusting the display range (function group BASE)

Frequency range Adjustment range (c = 5920 m/s)0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390"0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390"0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50"2 to 20 MHz 0.5 to 1420 mm/0.02" to 50"

– Select the function RANGE.



MTLVEL (Sound velocity)

Use MTLVEL to set the sound velocity within the testobject. You can use sound velocities between 1000 and15000 m/s.

• Coarse adjustment, in steps as follows (m/s):15000 9000 5000 200014000 8000 4000 160013000 7000 3250 145012000 6320 3130 100011000 6000 300010000 5920 2730

• Fine adjustment1000 ... 15000 in steps of 1 m/s

A Attention:

Always ensure that the function MTLVEL is correctlyset. The USM 35X calculates all range and distanceindications on the basis of the value adjusted here.

– Select the function MTLVEL.



D-DELAY (Display starting point)

Here you can choose whether to display the adjustedrange (for example 250 mm) starting from the surfaceof the test object, or in a section of the test objectstarting at a later point. This allows you to shift thecomplete screen display and consequently also thedisplay zero.


Operation Adjusting the display range (function group BASE)

If the display should for example start from the surface ofthe test object, the value in D-DELAY must be set to 0.

• Coarse adjustment–10 mm ... 1024 mm/–0.3" ... 40" in even steps

• Fine adjustmentup to 99.9 mm/9.999" in steps of 0.01 mm/0.001"up to 1024 mm/10" in steps of 0.1 mm/0.001"

– Select the function D-DELAY.


– Adjust the value for the display starting point bymeans of the right-hand rotary knob.

P-DELAY (Probe delay)

Every probe has a delay line between the transducerelement and the coupling face. This means that theinitial pulse must first pass through this delay line be-fore the sound wave can enter the test object. You cancompensate for this influence of the delay line in thefunction P-DELAY.

H Note:

If the value for P-DELAY is not known, read the sectionCalibrating the USM 35X, chapter 5.7, in order to deter-mine this value.

– Select the function P-DELAY.

– Adjust the value for the probe delay by means of theright-hand rotary knob.


Operation Adjusting the display range (function group BASE)

If the display should for example start from the surface ofthe test object, the value in D-DELAY must be set to 0.

• Coarse adjustment–10 mm ... 1024 mm/–0.3" ... 40" in even steps

• Fine adjustmentup to 99.9 mm/9.999" in steps of 0.01 mm/0.001"up to 1024 mm/10" in steps of 0.1 mm/0.001"

– Select the function D-DELAY.


– Adjust the value for the display starting point bymeans of the right-hand rotary knob.

P-DELAY (Probe delay)

Every probe has a delay line between the transducerelement and the coupling face. This means that theinitial pulse must first pass through this delay line be-fore the sound wave can enter the test object. You cancompensate for this influence of the delay line in thefunction P-DELAY.

H Note:

If the value for P-DELAY is not known, read the sectionCalibrating the USM 35X, chapter 5.7, in order to deter-mine this value.

– Select the function P-DELAY.

– Adjust the value for the probe delay by means of theright-hand rotary knob.


Operation

5.4 Adjusting the pulser(function group PULS)

You will find all functions for the adjustment of the puls-er in the function group PULS.


– Select the function group PULS.

DAMPING (Probe matching)

This function serves for matching the probe. You canuse it to adjust the damping of the probe’s oscillatingcircuit and to consequently change the height, widthand resolution of the echo display.

• lowThis setting has a lower damping effect and produc-es higher and broader echoes.

• highThis setting reduces the echo height but mostly alsoproduces narrow echoes with higher resolution.

– Select the function DAMPING.

– Set the required value by means of the right-handrotary knob.

Adjusting the pulser (function group PULS)


Operation

5.4 Adjusting the pulser(function group PULS)

You will find all functions for the adjustment of the puls-er in the function group PULS.


– Select the function group PULS.

DAMPING (Probe matching)

This function serves for matching the probe. You canuse it to adjust the damping of the probe’s oscillatingcircuit and to consequently change the height, widthand resolution of the echo display.

• lowThis setting has a lower damping effect and produc-es higher and broader echoes.

• highThis setting reduces the echo height but mostly alsoproduces narrow echoes with higher resolution.

– Select the function DAMPING.

– Set the required value by means of the right-handrotary knob.

Adjusting the pulser (function group PULS)


Operation Adjusting the pulser (function group PULS)

POWER (Intensity)

Use the function POWER to set the pulser voltage. Youcan choose between two settings:

• high – high voltage

• low – low voltage

The setting high is recommended for all inspections inwhich maximum sensitivity is important, e.g. for thedetection of small flaws. Choose the setting low forbroadband probes or if narrow echoes are required (bet-ter lateral resolution).

– Select the function POWER.

– Use the right-hand rotary knob to choose the requiredsetting.

DUAL (Pulser-receiver separation)

You can use the function DUAL to activate the pulser-receiver separation.

• offSingle-element operation; the probe connectionsockets are connected in parallel.

• onDual mode for the use with dual-element (TR) probes;the left-hand socket (red) is connected with theamplifier input whereas the initial pulse is available atthe right-hand socket (black).

• throughThrough-transmission mode for the use with twoseparate probes; the receiver is connected with left(red), the pulser is connected with right (black).

– Select the function DUAL.


If the DUAL function is active, the LED D (dual) is on.


Operation Adjusting the pulser (function group PULS)

POWER (Intensity)

Use the function POWER to set the pulser voltage. Youcan choose between two settings:

• high – high voltage

• low – low voltage

The setting high is recommended for all inspections inwhich maximum sensitivity is important, e.g. for thedetection of small flaws. Choose the setting low forbroadband probes or if narrow echoes are required (bet-ter lateral resolution).

– Select the function POWER.


DUAL (Pulser-receiver separation)

You can use the function DUAL to activate the pulser-receiver separation.

• offSingle-element operation; the probe connectionsockets are connected in parallel.

• onDual mode for the use with dual-element (TR) probes;the left-hand socket (red) is connected with theamplifier input whereas the initial pulse is available atthe right-hand socket (black).

• throughThrough-transmission mode for the use with twoseparate probes; the receiver is connected with left(red), the pulser is connected with right (black).

– Select the function DUAL.


If the DUAL function is active, the LED D (dual) is on.


OperationAdjusting the pulser (function group PULS)

PRF-MOD(Pulse repetition frequency)

The pulse repetition frequency indicates the number oftimes an initial pulse is triggered per second. You candetermine whether you need the highest possible PRFvalue, or whether you are satisfied with a low value. Youhave 10 steps available for the setting; step 1 meansthe lowest PRF value.

The larger your workpiece, the smaller PRF values areneeded in order to avoid phantom echoes. In the caseof smaller PRF values, however, the A-scan updaterate becomes lower; for this reason, high values arerequired if a workpiece should be scanned fast.

The best way to determine the suitable PRF value is byexperimenting: start from the highest step and reducethe value until there are no more phantom echoes.

– Select the function PRF-MOD.


5.5 Adjusting the receiver(function group RECV)

You will find all functions for the adjustment of the puls-er in the function group RECV.


– Select the function group RECV.

H Note:

Double assignment of the function FINE G/dBSTEP(icon >). Toggle between the two functions by repeated-ly pressing the corresponding key .


OperationAdjusting the pulser (function group PULS)

PRF-MOD(Pulse repetition frequency)

The pulse repetition frequency indicates the number oftimes an initial pulse is triggered per second. You candetermine whether you need the highest possible PRFvalue, or whether you are satisfied with a low value. Youhave 10 steps available for the setting; step 1 meansthe lowest PRF value.

The larger your workpiece, the smaller PRF values areneeded in order to avoid phantom echoes. In the caseof smaller PRF values, however, the A-scan updaterate becomes lower; for this reason, high values arerequired if a workpiece should be scanned fast.

The best way to determine the suitable PRF value is byexperimenting: start from the highest step and reducethe value until there are no more phantom echoes.

– Select the function PRF-MOD.


5.5 Adjusting the receiver(function group RECV)

You will find all functions for the adjustment of the puls-er in the function group RECV.


– Select the function group RECV.

H Note:

Double assignment of the function FINE G/dBSTEP(icon >). Toggle between the two functions by repeated-ly pressing the corresponding key .


Operation

FINE G (Fine adjustment of gain)

This function serves for the fine adjustment of the cur-rent gain value. The fine adjustment is possible over arange of 40 steps within the range of approx. 4 dB. Thedisplayed gain value will not change.

Adjustment range: –10 ... +30

– Select the function FINE G.

– Use the right-hand rotary knob to adjust the value forthe fine gain.

dBSTEP

Use this function to set a step size for the gain vari-ation by means of the key . The value set here issubsequently available to you as the sixth step for thestepwise gain variation. You have a free choice of thevalue within the setting range.

Setting range: 6.5 ... 20 dB

– Select the function dBSTEP.

– Set the value for the gain by means of the right-handrotary knob.

REJECT

The function REJECT allows you to suppress unwantedecho indications, for example structural noise from yourtest object.

The % screen height setting indicates the minimumheight that the echoes should attain in order for them tobe displayed on the screen at all. The Reject settingcannot be higher than the lowest threshold setting(minus 1 %) of any gate.

A Attention:

You should handle this function with great caution, as itmay of course happen that you suppress echoes fromflaws as well. Many test specifications expressly forbidusing the reject function.

– Select the function REJECT.

– Set the required percentage value by means of theright-hand rotary knob.

The LED R is therefore lit with active REJECT function.

Adjusting the receiver (function group RECV)


Operation

FINE G (Fine adjustment of gain)

This function serves for the fine adjustment of the cur-rent gain value. The fine adjustment is possible over arange of 40 steps within the range of approx. 4 dB. Thedisplayed gain value will not change.

Adjustment range: –10 ... +30

– Select the function FINE G.

– Use the right-hand rotary knob to adjust the value forthe fine gain.

dBSTEP

Use this function to set a step size for the gain vari-ation by means of the key . The value set here issubsequently available to you as the sixth step for thestepwise gain variation. You have a free choice of thevalue within the setting range.

Setting range: 6.5 ... 20 dB

– Select the function dBSTEP.

– Set the value for the gain by means of the right-handrotary knob.

REJECT

The function REJECT allows you to suppress unwantedecho indications, for example structural noise from yourtest object.

The % screen height setting indicates the minimumheight that the echoes should attain in order for them tobe displayed on the screen at all. The Reject settingcannot be higher than the lowest threshold setting(minus 1 %) of any gate.

A Attention:

You should handle this function with great caution, as itmay of course happen that you suppress echoes fromflaws as well. Many test specifications expressly forbidusing the reject function.

– Select the function REJECT.

– Set the required percentage value by means of theright-hand rotary knob.

The LED R is therefore lit with active REJECT function.

Adjusting the receiver (function group RECV)


OperationAdjusting the receiver (function group RECV)

FREQU (Frequency range)

In this function, you can adjust the operating frequencyaccording to the frequency of your probe.

You have a choice between four frequency ranges:

• 0.2 ... 1 MHz

• 0.5 ... 4 MHz

• 0.8 ... 8 MHz

• 2 ... 20 MHz

– Select the function FREQU.


RECTIFY (Rectification)

You can select the rectification mode of the echo puls-es according to your application in the function RECTI-FY. You have the following options to choose from:

• full-w (= full-wave)All half-waves are displayed above the baseline.

• pos hw (= positive half-wave)Only positive half-waves are displayed.

• neg hw (= negative half-wave)Only negative half-waves are displayed.

• rf (= radio frequency)Only applies to the display range up to 50 mm (steel).

– Select the function RECTIFY.

– Use the right-hand rotary knob to adjust the requiredsetting.


OperationAdjusting the receiver (function group RECV)

FREQU (Frequency range)

In this function, you can adjust the operating frequencyaccording to the frequency of your probe.

You have a choice between four frequency ranges:

• 0.2 ... 1 MHz

• 0.5 ... 4 MHz

• 0.8 ... 8 MHz

• 2 ... 20 MHz

– Select the function FREQU.


RECTIFY (Rectification)

You can select the rectification mode of the echo puls-es according to your application in the function RECTI-FY. You have the following options to choose from:

• full-w (= full-wave)All half-waves are displayed above the baseline.

• pos hw (= positive half-wave)Only positive half-waves are displayed.

• neg hw (= negative half-wave)Only negative half-waves are displayed.

• rf (= radio frequency)Only applies to the display range up to 50 mm (steel).

– Select the function RECTIFY.

– Use the right-hand rotary knob to adjust the requiredsetting.


Operation Setting the gates (function groups aGAT and bGAT)

5.6 Setting the gates(function groups aGATand bGAT)

All functions for setting the (dual) gate are arranged inthe function group aGAT and bGAT.


– Select the function group aGAT or bGAT.

H Note:

If you have an instrument equipped with the Data Loggeroption at your disposal, you’ll be additionally able to usethe C gate including all corresponding functions.

Tasks of the gates

• It monitors the range of the test object where youexpect to detect a flaw. If an echo exceeds or fallsbelow the gate, an alarm signal is output via theLED A.

• The gates A and B are independant of one another.Gate A can also have the function of an echo-startgate.

• The gate chooses the echo for the digital time-of-flight or amplitude measurement. The measuredvalue is indicated in the measurement line.

H Note:

Error alarms can be triggered unter certain circum-stances. These are caused by intermediate conditionsin instrument operation occuring when the instrument is


Operation Setting the gates (function groups aGAT and bGAT)

5.6 Setting the gates(function groups aGATand bGAT)

All functions for setting the (dual) gate are arranged inthe function group aGAT and bGAT.


– Select the function group aGAT or bGAT.

H Note:

If you have an instrument equipped with the Data Loggeroption at your disposal, you’ll be additionally able to usethe C gate including all corresponding functions.

Tasks of the gates

• It monitors the range of the test object where youexpect to detect a flaw. If an echo exceeds or fallsbelow the gate, an alarm signal is output via theLED A.

• The gates A and B are independant of one another.Gate A can also have the function of an echo-startgate.

• The gate chooses the echo for the digital time-of-flight or amplitude measurement. The measuredvalue is indicated in the measurement line.

H Note:

Error alarms can be triggered unter certain circum-stances. These are caused by intermediate conditionsin instrument operation occuring when the instrument is


Operation

used, i.e. when function parameters are changed. Pos-sible alarms occuring during instrument operation(setting of functions) are to be ignored.

Display of gates

To make the assignment easier, the gates are displayedin different colors. You cannot vary the colors of gatesbecause they are fixed as follows:

• Gate A – red


• Gate C – blue

aLOGIC/bLOGIC(Evaluation logic of the gates)

This function allows you to choose the method for trig-gering the gate alarm. The alarm is output to the LED Aon the front panel of the USM 35X. There are four set-ting options available:

Setting the gates (function groups aGAT and bGAT)

• off – Evaluation logic offThe alarm and measurement capability are switchedoff. The gate is not visible.

• pos – CoincidenceThe alarm (LED A) is on if the preset responsethreshold of the gate is exceeded within the dis-played range.

• neg – AnticoincidenceThe alarm (LED A) is on if the preset responsethreshold of the gate is not reached within thedisplayed range.

• a trig – Triggering by interface echoWhen using gate A as echo-start gate (setting of theevaluation logic for gate B)

– Select the function aLOGIC or bLOGIC.

– Set the required alarm logic by means of the right-hand rotary knob.

H Note:

The alarm and measurement function of the gates isonly active within the display range.


Operation

used, i.e. when function parameters are changed. Pos-sible alarms occuring during instrument operation(setting of functions) are to be ignored.

Display of gates

To make the assignment easier, the gates are displayedin different colors. You cannot vary the colors of gatesbecause they are fixed as follows:

• Gate A – red


• Gate C – blue

aLOGIC/bLOGIC(Evaluation logic of the gates)

This function allows you to choose the method for trig-gering the gate alarm. The alarm is output to the LED Aon the front panel of the USM 35X. There are four set-ting options available:


• off – Evaluation logic offThe alarm and measurement capability are switchedoff. The gate is not visible.

• pos – CoincidenceThe alarm (LED A) is on if the preset responsethreshold of the gate is exceeded within the dis-played range.

• neg – AnticoincidenceThe alarm (LED A) is on if the preset responsethreshold of the gate is not reached within thedisplayed range.

• a trig – Triggering by interface echoWhen using gate A as echo-start gate (setting of theevaluation logic for gate B)

– Select the function aLOGIC or bLOGIC.

– Set the required alarm logic by means of the right-hand rotary knob.

H Note:

The alarm and measurement function of the gates isonly active within the display range.


Operation

aSTART/bSTART(Starting points of the gates)

You can fix the starting point of the gates A or B withinthe adjustment range of 0 ... 9999 mm/250".

– Select the function aSTART or bSTART.

– Uuse the right-hand rotary knob to adjust the requiredsetting.

aWIDTH/bWIDTH (Width of the gates)

You can determine the gate width within the range of0.2 ... 9999 mm/0.008 ... 250".

– Select the function aWIDTH or bWIDTH.

– Use the right-hand rotary knob to adjust the requiredvalue.

aTHRSH/bTHRSH (Response and mea-surement threshold of the gates)

You can determine the threshold value of the gates withinthe range of 10 to 90 % screen height for triggering theLED alarm if this value is exceeded or not reached, de-pending on the setting of the aLOGIC/bLOGIC function.In the RF mode, the threshold can be additionally setfrom –90 % to –10 %.

– Select the function aTHRSH or bTHRSH.

– Set the required value using the right-hand rotaryknob.



Operation

aSTART/bSTART(Starting points of the gates)

You can fix the starting point of the gates A or B withinthe adjustment range of 0 ... 9999 mm/250".

– Select the function aSTART or bSTART.

– Uuse the right-hand rotary knob to adjust the requiredsetting.

aWIDTH/bWIDTH (Width of the gates)

You can determine the gate width within the range of0.2 ... 9999 mm/0.008 ... 250".

– Select the function aWIDTH or bWIDTH.

– Use the right-hand rotary knob to adjust the requiredvalue.

aTHRSH/bTHRSH (Response and mea-surement threshold of the gates)

You can determine the threshold value of the gates withinthe range of 10 to 90 % screen height for triggering theLED alarm if this value is exceeded or not reached, de-pending on the setting of the aLOGIC/bLOGIC function.In the RF mode, the threshold can be additionally setfrom –90 % to –10 %.

– Select the function aTHRSH or bTHRSH.

– Set the required value using the right-hand rotaryknob.



OperationCalibrating the USM 35X

5.7 Calibrating the USM 35X

Calibrating the display range

Before working with the USM 35X, you have to cali-brate the instrument: you have to adjust the materialvelocity and display range and allow for the probe delaydepending on the material and dimensions of the testobject.

To ensure a safe and proper operation of the USM 35X,it is necessary that the operator be adequately trainedin the field of ultrasonic testing technology.

Below you will find some examples of common calibra-tion methods for certain test tasks. In addition, theUSM 35X has a semiautomatic calibration functionwhich is described as Case B: With unknown materialvelocity.

Choosing the measuring point

The sound path measurement in the calibration processor in the subsequent echo evaluation process dependson the choice of the measuring point which can be seteither to flank, to jflank or to peak in the USM 35X. Inprinciple, the peak measurement should be preferredbecause the measured distances do not depend on theecho height in that case. However, there are applicationcases in which the flank measurement is either speci-fied, or it must be applied for technical reasons, e.g. inmany tests using dual-element (TR) probes.

A Attention:

In any case, the setting of the measuring point mustalways be identical for the calibration and for the subse-quent test application. Otherwise measurement errorsmight occur.



5.7 Calibrating the USM 35X

Calibrating the display range

Before working with the USM 35X, you have to cali-brate the instrument: you have to adjust the materialvelocity and display range and allow for the probe delaydepending on the material and dimensions of the testobject.

To ensure a safe and proper operation of the USM 35X,it is necessary that the operator be adequately trainedin the field of ultrasonic testing technology.

Below you will find some examples of common calibra-tion methods for certain test tasks. In addition, theUSM 35X has a semiautomatic calibration functionwhich is described as Case B: With unknown materialvelocity.

Choosing the measuring point

The sound path measurement in the calibration processor in the subsequent echo evaluation process dependson the choice of the measuring point which can be seteither to flank, to jflank or to peak in the USM 35X. Inprinciple, the peak measurement should be preferredbecause the measured distances do not depend on theecho height in that case. However, there are applicationcases in which the flank measurement is either speci-fied, or it must be applied for technical reasons, e.g. inmany tests using dual-element (TR) probes.

A Attention:

In any case, the setting of the measuring point mustalways be identical for the calibration and for the subse-quent test application. Otherwise measurement errorsmight occur.


Operation Calibrating the USM 35X

Calibration with straight- andangle-beam probes

Case A: With known material velocity

Calibration process

– Set the known material velocity in MTLVEL (functiongroup BASE).

– Couple the probe to the calibration block.

– Set the required display range in RANGE (functiongroup BASE). The calibration echo must be dis-played on the screen.

– Position the gate on one of the calibration echoesuntil the sound path of the echo is indicated in themeasurement line.

– After this, change the adjustment of the functionP-DELAY (function group BASE) until the correctsound path for the selected calibration echo isindicated in the measurement line.

Example:

You are carrying out the calibration for the calibrationrange of 100 mm/5" via the function group BASE usingthe calibration block V1 (thickness 25 mm/1") which islaid flatwise.

– Set RANGE to 100 mm/5".

– Set the known material velocity of 5920 m/s(233 "/ms) in MTLVEL.

– Set the gate so that it is positioned on the firstcalibration echo (from 25 mm/1").

– Read the sound path in the measurement line. If thisvalue is not equal to 25 mm/1", change the adjust-ment for the function P-DELAY until it is at 25 mm/1".

This completes the calibration of the USM 35X to thematerial velocity of 5920 m/s (233 "/ms) with a calibra-tion range of 100 mm/5" for the probe used.



Calibration with straight- andangle-beam probes

Case A: With known material velocity

Calibration process

– Set the known material velocity in MTLVEL (functiongroup BASE).

– Couple the probe to the calibration block.

– Set the required display range in RANGE (functiongroup BASE). The calibration echo must be dis-played on the screen.

– Position the gate on one of the calibration echoesuntil the sound path of the echo is indicated in themeasurement line.

– After this, change the adjustment of the functionP-DELAY (function group BASE) until the correctsound path for the selected calibration echo isindicated in the measurement line.

Example:

You are carrying out the calibration for the calibrationrange of 100 mm/5" via the function group BASE usingthe calibration block V1 (thickness 25 mm/1") which islaid flatwise.

– Set RANGE to 100 mm/5".

– Set the known material velocity of 5920 m/s(233 "/ms) in MTLVEL.

– Set the gate so that it is positioned on the firstcalibration echo (from 25 mm/1").

– Read the sound path in the measurement line. If thisvalue is not equal to 25 mm/1", change the adjust-ment for the function P-DELAY until it is at 25 mm/1".

This completes the calibration of the USM 35X to thematerial velocity of 5920 m/s (233 "/ms) with a calibra-tion range of 100 mm/5" for the probe used.



Case B: With unknown material velocity

Use the semiautomatic calibration function of theUSM 35X via the function group CAL for this calibrationcase.

The distances between 2 calibration echoes must beentered as default data. The USM 35X will then carryout a plausibility check, calculate the material velocityand the probe delay, and automatically set the parame-ters.

Calibration process

– Set the required display range in RANGE (functiongroup BASE). The two calibraion echoes selectedmust be displayed on the screen. Set the range sothat the second calibration echo is located on theright edge of the screen.

– Select the function group CAL.

– Enter the distances of the two calibation echoes inS-REF1 and S-REF2.

– Position the gate (function aSTART) on the firstcalibration echo.

– Press to record the first calibration echo.

– The recording of the first calibration echo is con-firmed by the message “Echo is recorded”, and thefunction CAL indicates the value 1.

– Move the gate to the second calibration echo.

– Press to record the second calibration echo.



Case B: With unknown material velocity

Use the semiautomatic calibration function of theUSM 35X via the function group CAL for this calibrationcase.

The distances between 2 calibration echoes must beentered as default data. The USM 35X will then carryout a plausibility check, calculate the material velocityand the probe delay, and automatically set the parame-ters.

Calibration process

– Set the required display range in RANGE (functiongroup BASE). The two calibraion echoes selectedmust be displayed on the screen. Set the range sothat the second calibration echo is located on theright edge of the screen.


– Enter the distances of the two calibation echoes inS-REF1 and S-REF2.



– The recording of the first calibration echo is con-firmed by the message “Echo is recorded”, and thefunction CAL indicates the value 1.





The correct calibration is confirmed by the message“Calibration is done”.

The USM 35X will now automatically determine thesound velocity and the probe delay and set the corre-sponding functions accordingly. The value of the func-tion CAL jumps back to 0.

H Note:

If the instrument is not able to carry out any valid cali-bration on the basis of the input values and the echoesrecorded, a corresponding error message is displayed.In that case, please check the values of your calibra-tion lines and repeat the process of recording the cali-bration echoes.

Example

– Enter the distances (thicknesses) of the two calibra-tion lines S-REF1 (20 mm) and S-REF2 (40 mm).

– Position the gate on the first calibration echo.




The correct calibration is confirmed by the message“Calibration is done”.

The USM 35X will now automatically determine thesound velocity and the probe delay and set the corre-sponding functions accordingly. The value of the func-tion CAL jumps back to 0.

H Note:

If the instrument is not able to carry out any valid cali-bration on the basis of the input values and the echoesrecorded, a corresponding error message is displayed.In that case, please check the values of your calibra-tion lines and repeat the process of recording the cali-bration echoes.

Example

– Enter the distances (thicknesses) of the two calibra-tion lines S-REF1 (20 mm) and S-REF2 (40 mm).

– Position the gate on the first calibration echo.




– Position the gate on the second calibration echo:

– Press .

The second echo is stored, the calibration is carriedout, and the CAL function is reset to 0. The valid cali-bration is briefly confirmed and carried out.

If you select the function group BASE, you can readthe material velocity and probe delay.

Calibration with dual-element (TR) probes

Dual-element (TR) probes are especially used for wallthickness measurement. The following peculiaritiesmust be taken into account when using these probes:

Echo flank

Most dual-element (TR) probes have a roof angle(transducer elements with inclined orientation towardthe test surface). This causes mode conversions bothat beam index (sound entry into the material) and at thereflection from the backwall, which can result in veryjagged echoes.

V-path error

Dual-element (TR) probes produce a v-shaped soundpath from the pulser via the reflection from the backwallto the receiver element. This so-called “V-path error”affects the measuring accuracy. You should thereforechoose two wall thicknesses that cover the expectedthickness measurement range for the calibration. In thisway, the V-path error can be corrected to the greatestpossible extent.



– Position the gate on the second calibration echo:

– Press .

The second echo is stored, the calibration is carriedout, and the CAL function is reset to 0. The valid cali-bration is briefly confirmed and carried out.

If you select the function group BASE, you can readthe material velocity and probe delay.

Calibration with dual-element (TR) probes

Dual-element (TR) probes are especially used for wallthickness measurement. The following peculiaritiesmust be taken into account when using these probes:

Echo flank

Most dual-element (TR) probes have a roof angle(transducer elements with inclined orientation towardthe test surface). This causes mode conversions bothat beam index (sound entry into the material) and at thereflection from the backwall, which can result in veryjagged echoes.

V-path error

Dual-element (TR) probes produce a v-shaped soundpath from the pulser via the reflection from the backwallto the receiver element. This so-called “V-path error”affects the measuring accuracy. You should thereforechoose two wall thicknesses that cover the expectedthickness measurement range for the calibration. In thisway, the V-path error can be corrected to the greatestpossible extent.



Higher material velocity

Due to the V-path error, a higher material velocity thanthat of the test material is given during calibration, es-pecially with small thicknesses. This is typical of dual-element (TR) probes and serves for compensation ofthe V-path error.

With small wall thicknesses, the above-described effectleads to an echo amplitude drop which has to be espe-cially taken into account with thicknesses less than2 mm/0.08".

A stepped reference block having different wall thick-nesses is required for calibration. The wall thicknessesmust be selected so that they cover the expected read-ings.

Calibration process:

We recommend to use the semiautomatic calibrationfunction for the calibration with T/R probes.

– Set the required test range.

– Increase the probe delay (P-DELAY) until the twocalibration lines are displayed within the range.

– Set the pulser and receiver functions according tothe probe used and the test application.

– Set the function TOF (function group MEAS) toflank.

– Vary the gain so that the highest echo reachesapproximately the full screen height.

– Set the gate threshold to the required height formeasuring the sound paths at the echo flanks.


– Enter the distances of the two calibration echoes inS-REF1 and S-REF2.



– Couple the probe to the calibration block containingthe second calibration line, and set the height so thatit’s about as high as the first calibration echo.




Higher material velocity

Due to the V-path error, a higher material velocity thanthat of the test material is given during calibration, es-pecially with small thicknesses. This is typical of dual-element (TR) probes and serves for compensation ofthe V-path error.

With small wall thicknesses, the above-described effectleads to an echo amplitude drop which has to be espe-cially taken into account with thicknesses less than2 mm/0.08".

A stepped reference block having different wall thick-nesses is required for calibration. The wall thicknessesmust be selected so that they cover the expected read-ings.

Calibration process:

We recommend to use the semiautomatic calibrationfunction for the calibration with T/R probes.

– Set the required test range.

– Increase the probe delay (P-DELAY) until the twocalibration lines are displayed within the range.

– Set the pulser and receiver functions according tothe probe used and the test application.

– Set the function TOF (function group MEAS) toflank.

– Vary the gain so that the highest echo reachesapproximately the full screen height.

– Set the gate threshold to the required height formeasuring the sound paths at the echo flanks.


– Enter the distances of the two calibration echoes inS-REF1 and S-REF2.



– Couple the probe to the calibration block containingthe second calibration line, and set the height so thatit’s about as high as the first calibration echo.





The correct calibration is confirmed by the message“Calibration is done”. The material velocity andprobe delay are set. The value of the CAL functiongoes back to 0.

– If necessary, check the calibration on one or severalknown calibration lines, e.g. using the steppedreference block VW.

H Note:

Always keep in mind that the measured value is deter-mined at the intersection point of gate and echo flankwhen the function TOF was set to flank. A correct set-ting of the echo height and gate threshold is thereforedecisive for accurate calibration and measurement!

Calibrations or measurements in the peak mode aremostly not possible when using dual-element (TR)probes. As the echoes are often very broad and jagged,a clear echo peak cannot always be found in thesecases.

5.8 Measuring

General notes

Please pay attention to the following notes when mea-suring with the USM 35X.

• Condition for measurements is the correct instrumentcalibration (sound velocity, probe delay).

• All amplitude measurements are carried out at thehighest or the first signal in the gate.

• All distance measurements are carried out at theintersection point of gate and the first echo flank(TOF = flank or jflank), or at the peak of the highestecho (TOF = peak).

• If the echo amplitudes do not succeed 5 % screenheight all sound path and amplitude measurementswill be suppressed. Thus, rapidly changing randommeasurements caused by the instrument’s back-ground noise are avoided.




The correct calibration is confirmed by the message“Calibration is done”. The material velocity andprobe delay are set. The value of the CAL functiongoes back to 0.

– If necessary, check the calibration on one or severalknown calibration lines, e.g. using the steppedreference block VW.

H Note:

Always keep in mind that the measured value is deter-mined at the intersection point of gate and echo flankwhen the function TOF was set to flank. A correct set-ting of the echo height and gate threshold is thereforedecisive for accurate calibration and measurement!

Calibrations or measurements in the peak mode aremostly not possible when using dual-element (TR)probes. As the echoes are often very broad and jagged,a clear echo peak cannot always be found in thesecases.

5.8 Measuring

General notes

Please pay attention to the following notes when mea-suring with the USM 35X.

• Condition for measurements is the correct instrumentcalibration (sound velocity, probe delay).

• All amplitude measurements are carried out at thehighest or the first signal in the gate.

• All distance measurements are carried out at theintersection point of gate and the first echo flank(TOF = flank or jflank), or at the peak of the highestecho (TOF = peak).

• If the echo amplitudes do not succeed 5 % screenheight all sound path and amplitude measurementswill be suppressed. Thus, rapidly changing randommeasurements caused by the instrument’s back-ground noise are avoided.


Operation Measuring

The following example shows the dependency of dis-tance measurement on the echo waveform, i.e. on theheight of the gate threshold and thus on the selection ofthe intersection point at the signal.

H Note:

The point of amplitude measurement is marked with asmall upward triangle on the corresponding gate bar.The point of distance measurement is marked with asmall downward triangle.

Gate threshold at 20 %measured sound path: 24.44 mm



Operation Measuring

The following example shows the dependency of dis-tance measurement on the echo waveform, i.e. on theheight of the gate threshold and thus on the selection ofthe intersection point at the signal.

H Note:

The point of amplitude measurement is marked with asmall upward triangle on the corresponding gate bar.The point of distance measurement is marked with asmall downward triangle.




Operation

5.9 Measurement of dB difference(function group REF)

You can evaluate reflector echoes by means of refer-ence echoes. The function group REF makes all func-tions for the echo comparison between a reflector echoand a reference echo available to you.

– If required, go to the second operating level.

– Select the function group REF.

Measurement of dB difference (function group REF)

H Note:

Depending on the setting in the function EVAMOD(function group CFG2), one of the function groupsAWS, DAC, JDAC, or DGS may also be displayed atthis point. Please also refer to chapter 5.15 Generalconfiguration.

You will find the following function:

REFECHO Storing or deleting the reference echo

REFMOD Activating the measurement ofdB difference

aSTART Positioning the A gate

The functions are described in the order in which youneed them during your work.


Operation

5.9 Measurement of dB difference(function group REF)

You can evaluate reflector echoes by means of refer-ence echoes. The function group REF makes all func-tions for the echo comparison between a reflector echoand a reference echo available to you.


– Select the function group REF.


H Note:

Depending on the setting in the function EVAMOD(function group CFG2), one of the function groupsAWS, DAC, JDAC, or DGS may also be displayed atthis point. Please also refer to chapter 5.15 Generalconfiguration.

You will find the following function:

REFECHO Storing or deleting the reference echo

REFMOD Activating the measurement ofdB difference

aSTART Positioning the A gate



Operation

Recording a reference echo

Before using the measurement of dB difference, youhave to first record a reference echo.

A Attention:

When recording a reference echo, an already storedreference echo is overwritten after a correspondingwarning.

– Peak the reference echo according to the testspecification.

– Position the A gate over the reference echo using thefunction aSTART.

– Select the function REFECHO.

– Turn the right-hand rotary knob upward in order tostore the echo in gate A as a reference echo.

– If necessary, confirm the warning message in orderto overwrite a stored reference echo.

The reference echo is now recorded. An inverted R isshown in the measurement line.

Deleting a reference echo

You can delete stored reference echoes.


– Turn the right-hand rotary knob downward in order todelete the reference echo.

– If necessary, confirm the warning message in orderto delete the stored reference echo.



Operation

Recording a reference echo

Before using the measurement of dB difference, youhave to first record a reference echo.

A Attention:

When recording a reference echo, an already storedreference echo is overwritten after a correspondingwarning.

– Peak the reference echo according to the testspecification.

– Position the A gate over the reference echo using thefunction aSTART.


– Turn the right-hand rotary knob upward in order tostore the echo in gate A as a reference echo.

– If necessary, confirm the warning message in orderto overwrite a stored reference echo.

The reference echo is now recorded. An inverted R isshown in the measurement line.

Deleting a reference echo

You can delete stored reference echoes.


– Turn the right-hand rotary knob downward in order todelete the reference echo.

– If necessary, confirm the warning message in orderto delete the stored reference echo.



Operation

Echo comparison

You can compare the echo of any reflector of yourchoice with the reference echo. The displayed result isthe dB difference of the two echoes.

H Note:

The dB difference is independent of any possible gainvariation.

– Choose Ha dB or Hb dB as measured value.

– Position the A gate over the echo.

– Select the function REFMOD.

– Activate the function by means of the right-handrotary knob.

The dB difference between the reference echo andthe reflector echo is now displayed as the measuredvalue.

Measurement of dB difference(function group REF)


Operation

Echo comparison

You can compare the echo of any reflector of yourchoice with the reference echo. The displayed result isthe dB difference of the two echoes.

H Note:

The dB difference is independent of any possible gainvariation.

– Choose Ha dB or Hb dB as measured value.

– Position the A gate over the echo.

– Select the function REFMOD.

– Activate the function by means of the right-handrotary knob.

The dB difference between the reference echo andthe reflector echo is now displayed as the measuredvalue.

Measurement of dB difference(function group REF)


Operation

5.10 Classification of welds(function group AWS)

You can rate flaws in welds according to the specifica-tion AWS D1.1. You will find the corresponding functionsin the function group AWS.

– If necessary, change to the second operation level.

– Select the function group AWS.

Classification of welds (function group AWS)

H Note:

Double assignment of the function INDICA/aSTART.Press the corresponding key repeatedly to togglebetween the functions.

H Note:

Depending on the setting in the function EVAMOD(function group CFG2), one of the function groups REF,DAC, JDAC, or DGS may also be displayed at thispoint. Please also refer to chapter 5.15 General configu-ration.

Rating of welds according to AWS

The rating of flaws in welds according to the AWSspecifications is based on an evaluation of the signalamplitude. In this process, the echo amplitude of theflaw echo is compared with the echo amplitude of aknown reference reflector. In addition, the sound attenu-ation in the workpiece is also taken into consideration.The result is a dB value which is called flaw rating. Theflaw rating D is calculated according to the formula:


Operation

5.10 Classification of welds(function group AWS)

You can rate flaws in welds according to the specifica-tion AWS D1.1. You will find the corresponding functionsin the function group AWS.

– If necessary, change to the second operation level.

– Select the function group AWS.


H Note:

Double assignment of the function INDICA/aSTART.Press the corresponding key repeatedly to togglebetween the functions.

H Note:

Depending on the setting in the function EVAMOD(function group CFG2), one of the function groups REF,DAC, JDAC, or DGS may also be displayed at thispoint. Please also refer to chapter 5.15 General configu-ration.

Rating of welds according to AWS

The rating of flaws in welds according to the AWSspecifications is based on an evaluation of the signalamplitude. In this process, the echo amplitude of theflaw echo is compared with the echo amplitude of aknown reference reflector. In addition, the sound attenu-ation in the workpiece is also taken into consideration.The result is a dB value which is called flaw rating. Theflaw rating D is calculated according to the formula:


Operation

D = A – B – C

with:

• A = Indication (in dB)Absolute instrument gain with which the maximumflaw echo is at 50 % (±5 %) echo height

• B = Reference (in dB)Absolute instrument gain with which the maximumreference echo (1.5 mm side-drilled hole from thereference block 1) is at 50 % (±5 %) echo height

• C = Attenuation (in dB)This value is calculated according to the formulaC = 0.079 dB/mm (s – 25.4 mm). With s = soundpath of the flaw echo.

The sound attenuation correction is automaticallycalculated and displayed by the instrument. Forsound paths smaller than or equal to 25.4 mm(1 inch), the value is set to zero.

• D = D 1.1 Rating (in dB)This is the result of the evaluation according to AWS.The evaluation is carried out in the USM 35X accord-ing to the formula indicated above.


H Notes:

Make sure that all instrument options for the specialtest are calibrated before starting with the rating ac-cording to AWS.

Pay attention to peaking an echo with an amplitudebetween 45 % and 55 % screen height. A rating is notpossible with other amplitudes.

– Apply couplant, and couple the probe to the refer-ence block 1. Peak the echo from the 1.5 mm side-drilled hole.

– Select the function aSTART, and set up the A gateon the reference echo.

– Vary the gain so that the reference echo is displayedat 50 % screen height.

– Choose the function REFRNCE, and confirm thechoice in order to save the reference gain.


Operation

D = A – B – C

with:

• A = Indication (in dB)Absolute instrument gain with which the maximumflaw echo is at 50 % (±5 %) echo height

• B = Reference (in dB)Absolute instrument gain with which the maximumreference echo (1.5 mm side-drilled hole from thereference block 1) is at 50 % (±5 %) echo height

• C = Attenuation (in dB)This value is calculated according to the formulaC = 0.079 dB/mm (s – 25.4 mm). With s = soundpath of the flaw echo.

The sound attenuation correction is automaticallycalculated and displayed by the instrument. Forsound paths smaller than or equal to 25.4 mm(1 inch), the value is set to zero.

• D = D 1.1 Rating (in dB)This is the result of the evaluation according to AWS.The evaluation is carried out in the USM 35X accord-ing to the formula indicated above.


H Notes:

Make sure that all instrument options for the specialtest are calibrated before starting with the rating ac-cording to AWS.

Pay attention to peaking an echo with an amplitudebetween 45 % and 55 % screen height. A rating is notpossible with other amplitudes.

– Apply couplant, and couple the probe to the refer-ence block 1. Peak the echo from the 1.5 mm side-drilled hole.

– Select the function aSTART, and set up the A gateon the reference echo.

– Vary the gain so that the reference echo is displayedat 50 % screen height.

– Choose the function REFRNCE, and confirm thechoice in order to save the reference gain.


Operation

– Couple the probe to the test object in order to evalu-ate a flaw echo.

– Select the function aSTART, and set up the A gateon the flaw echo.

– Vary the gain so that the flaw echo is displayed at50 % screen height.

– Go to the function group AWS.

– Save the current gain using the function INDICA. Thecurrent gain is saved. The USM 35X will automatical-ly determine the values of the AWS variables C andD. You can then evaluate the rating D using thecorresponding requirements from AWS.



Operation

– Couple the probe to the test object in order to evalu-ate a flaw echo.

– Select the function aSTART, and set up the A gateon the flaw echo.

– Vary the gain so that the flaw echo is displayed at50 % screen height.

– Go to the function group AWS.

– Save the current gain using the function INDICA. Thecurrent gain is saved. The USM 35X will automatical-ly determine the values of the AWS variables C andD. You can then evaluate the rating D using thecorresponding requirements from AWS.



Operation

5.11 Calculation of flaw position(function group TRIG)

In the function group TRIG you will find the functions forsetting the flaw position calculation when using angle-beam probes.


– Select the function group TRIG.

Calculation of flaw position (function group TRIG)

H Note:

Double assignment of the function X-VALU/COLOR.Toggle between the two functions by repeatedly press-ing the corresponding key .

The functions in the group TRIG enable to automaticallycalculate the (reduced) projection distance and the realdepth of the flaw in addition to the sound path S, and todigitally display them in the measurement line.

• Projection distance PD:distance of probe index (sound exit point) from theposition of the flaw, projected on the surface

• Reduced projection distance rPD:distance of the probe’s leading face from the positionof the flaw, projected on the surface

• Depth d:Distance between flaw position and surface


Operation

5.11 Calculation of flaw position(function group TRIG)

In the function group TRIG you will find the functions forsetting the flaw position calculation when using angle-beam probes.


– Select the function group TRIG.


H Note:

Double assignment of the function X-VALU/COLOR.Toggle between the two functions by repeatedly press-ing the corresponding key .

The functions in the group TRIG enable to automaticallycalculate the (reduced) projection distance and the realdepth of the flaw in addition to the sound path S, and todigitally display them in the measurement line.

• Projection distance PD:distance of probe index (sound exit point) from theposition of the flaw, projected on the surface

• Reduced projection distance rPD:distance of the probe’s leading face from the positionof the flaw, projected on the surface

• Depth d:Distance between flaw position and surface


Operation

When using angle-beam probes, the instrument canadditionally calculate the sound path section or so-called leg L up to the next reflection point. This soundpath section or leg can be displayed as the measuredvalue La, Lb, or Lc.


ANGLE (Angle of incidence)

The ANGLE function enables you to adjust the angle ofincidence of your probe for the material used. This val-ue is required for the automatic calculation of the flawposition.

Adjustment range: 0° ... 90°

– Select the ANGLE function.

– Use the right-hand rotary knob to select the requiredsetting.

X-VALUE (X-value of the probe)

The function X-VALUE enables you to set the X-value(distance between the probe’s leading face and probeindex/sound exit point) of the probe used. This value isrequired for the automatic calculation of the reducedprojection distance.

Adjustment range: 0 ... 100 mm/0 ... 40"

– Select the function X-VALUE.

– Use the right-hand rotary knob to set the required value.


Operation

When using angle-beam probes, the instrument canadditionally calculate the sound path section or so-called leg L up to the next reflection point. This soundpath section or leg can be displayed as the measuredvalue La, Lb, or Lc.


ANGLE (Angle of incidence)

The ANGLE function enables you to adjust the angle ofincidence of your probe for the material used. This val-ue is required for the automatic calculation of the flawposition.

Adjustment range: 0° ... 90°

– Select the ANGLE function.


X-VALUE (X-value of the probe)

The function X-VALUE enables you to set the X-value(distance between the probe’s leading face and probeindex/sound exit point) of the probe used. This value isrequired for the automatic calculation of the reducedprojection distance.

Adjustment range: 0 ... 100 mm/0 ... 40"

– Select the function X-VALUE.



OperationCalculation of flaw position (function group TRIG)

COLOR

To make the orientation easier, the instrument is able todisplay the different sound path sections or legs in dif-ferent ways. You can choose between two display modes:

• 1 – The A-scan is shown in another color in every leg.– Leg 1 in magenta– Leg 2 in blue– Leg 3 in magenta

• 2 – The legs are shown as background shadings.

• off – No legs are displayed.

– Select the function COLOR.

– Use the right-hand rotary knob to set the requiredmode.

THICKNE (Material thickness)

Use the THICKNE function to set the material’s wallthickness. This value is required for the automatic cal-culation of the real depth.

Adjustment range: 1 ... 1000 mm/0.05 ... 400"

– Select the THICKNE function.


DIAMET (Outside diameter of the test object)

You will need the DIAMET function for tests on circularcurved surfaces, for example when testing longitudinal-ly welded tubes. In order to make the USM 35X carryout the corresponding correction of (reduced) projectiondistance and depth, you should enter the outside diam-eter of your test object in this function.

If you plan to carry out the flaw position calculation forplane-parallel (flat) test objects, the DIAMET functionshould be set to flat.

Adjustment range:

• 10 ... 2000 mm/0.4 ... 800"

• flat

– Select the DIAMET function.

– Use the right-hand rotary knob to set the requiredvalue.


OperationCalculation of flaw position (function group TRIG)

COLOR

To make the orientation easier, the instrument is able todisplay the different sound path sections or legs in dif-ferent ways. You can choose between two display modes:

• 1 – The A-scan is shown in another color in every leg.– Leg 1 in magenta– Leg 2 in blue– Leg 3 in magenta

• 2 – The legs are shown as background shadings.

• off – No legs are displayed.

– Select the function COLOR.

– Use the right-hand rotary knob to set the requiredmode.

THICKNE (Material thickness)

Use the THICKNE function to set the material’s wallthickness. This value is required for the automatic cal-culation of the real depth.

Adjustment range: 1 ... 1000 mm/0.05 ... 400"

– Select the THICKNE function.


DIAMET (Outside diameter of the test object)

You will need the DIAMET function for tests on circularcurved surfaces, for example when testing longitudinal-ly welded tubes. In order to make the USM 35X carryout the corresponding correction of (reduced) projectiondistance and depth, you should enter the outside diam-eter of your test object in this function.

If you plan to carry out the flaw position calculation forplane-parallel (flat) test objects, the DIAMET functionshould be set to flat.

Adjustment range:

• 10 ... 2000 mm/0.4 ... 800"

• flat

– Select the DIAMET function.

– Use the right-hand rotary knob to set the requiredvalue.


Operation

5.12 Data saving(function group MEM)

You will find all functions for storing, recalling and delet-ing complete data sets in the function group MEM.


– Select the function group MEM.

Data saving (function group MEM)

A data set contains all instrument settings as well asthe A-scan. This means that whenever you recall astored data set, your instrument is again set up exactlythe same as it was at the moment when the data setwas stored. This makes each one of your tests repro-ducible.

You will find the following functions:

SET-# selecting number of a data set

RECALL recalling a stored data set

STORE storing a data set

DELETE deleting a data set



Operation

5.12 Data saving(function group MEM)

You will find all functions for storing, recalling and delet-ing complete data sets in the function group MEM.


– Select the function group MEM.


A data set contains all instrument settings as well asthe A-scan. This means that whenever you recall astored data set, your instrument is again set up exactlythe same as it was at the moment when the data setwas stored. This makes each one of your tests repro-ducible.

You will find the following functions:

SET-# selecting number of a data set

RECALL recalling a stored data set

STORE storing a data set

DELETE deleting a data set



Operation

Storing a data set

You can save your current setup to a data set.

– Select the function SET-#.

– Use the right-hand rotary knob to set the numberwhere you would want to store the current data set(1 to 200).

– Select the function STORE.

– Use the right-hand rotary knob to set it to on.

The USM 35X stores the current data set. When thestorage process is completed, the function STORE isautomatically reset to off.

H Note:

The asterisk (*) before a selected data set number indi-cates that this data set is already occupied. It is notpossible to overwrite an occupied data set; select an-other data set which is still empty, or delete the occu-pied data set. To avoid loss of data e.g. in case of asoftware update you should save the data sets to a PC.

All active entries in the information table (TESTINF) areautomatically allocated to the data set being stored(see chapter 5.13 Dataset management).

Deleting a data set

An occupied data set is marked with an asterisk (*)before the data set number. You can delete these datasets if you no longer need them.


– Use the right-hand rotary knob to set the number ofthe data set that you want to delete.

– Select the function DELETE.

– Use the right-hand rotary knob to set it to on. Themeasurement line will then prompt: Delete data set?

– Confirm by pressing the corresponding key onemore time (all other keys would abort the process).

The data set is now deleted; the asterisk precedingthe data set number is no longer there. The functionDELETE is automatically reset to off.



Operation

Storing a data set

You can save your current setup to a data set.


– Use the right-hand rotary knob to set the numberwhere you would want to store the current data set(1 to 200).

– Select the function STORE.

– Use the right-hand rotary knob to set it to on.

The USM 35X stores the current data set. When thestorage process is completed, the function STORE isautomatically reset to off.

H Note:

The asterisk (*) before a selected data set number indi-cates that this data set is already occupied. It is notpossible to overwrite an occupied data set; select an-other data set which is still empty, or delete the occu-pied data set. To avoid loss of data e.g. in case of asoftware update you should save the data sets to a PC.

All active entries in the information table (TESTINF) areautomatically allocated to the data set being stored(see chapter 5.13 Dataset management).

Deleting a data set

An occupied data set is marked with an asterisk (*)before the data set number. You can delete these datasets if you no longer need them.


– Use the right-hand rotary knob to set the number ofthe data set that you want to delete.


– Use the right-hand rotary knob to set it to on. Themeasurement line will then prompt: Delete data set?


The data set is now deleted; the asterisk precedingthe data set number is no longer there. The functionDELETE is automatically reset to off.



Operation

Deleting all data set

You can delete all data sets if you no longer need them.


H Note:

Double assignment of the function DELETE/DELALL.Press the corresponding key repeatedly to togglebetween the functions.


– Use the right-hand rotary knob to set it to on. Themeasurement line will then prompt: Delete all datasets?


All data sets are now deleted. The function DELETE isautomatically reset to off.

Recalling a stored data set

You can recall a stored data set; your instrument willthen be provided with all the test-relevant technicalfeatures that existed at the moment of the setup. Afrozen display of the stored A-scan appears.

A Attention:

If a saved data set is loaded, the current instrumentsetup is lost. If necessary, save the current instrumentsetup to a new data set before loading a saved dataset.



Operation

Deleting all data set

You can delete all data sets if you no longer need them.


H Note:

Double assignment of the function DELETE/DELALL.Press the corresponding key repeatedly to togglebetween the functions.


– Use the right-hand rotary knob to set it to on. Themeasurement line will then prompt: Delete all datasets?


All data sets are now deleted. The function DELETE isautomatically reset to off.

Recalling a stored data set

You can recall a stored data set; your instrument willthen be provided with all the test-relevant technicalfeatures that existed at the moment of the setup. Afrozen display of the stored A-scan appears.

A Attention:

If a saved data set is loaded, the current instrumentsetup is lost. If necessary, save the current instrumentsetup to a new data set before loading a saved dataset.



Operation

– Use the right-hand rotary knob to set the number ofthe data set that you want to recall.

– Select the function RECALL.

– Use the right-hand rotary knob to set it to on. Themeasurement line will then prompt: Recall data set?


The data set is now loaded and the current setup isoverwritten. When the loading process is completed, thefunction RECALL is automatically reset to off.

H Note:

The gate for surveying the echo can be moved in therecalled A-scan. However, as the evaluation is made inthe frozen A-scan, the measurement resolution is only0.5 % of the adjusted calibration range.



Operation

– Use the right-hand rotary knob to set the number ofthe data set that you want to recall.

– Select the function RECALL.

– Use the right-hand rotary knob to set it to on. Themeasurement line will then prompt: Recall data set?


The data set is now loaded and the current setup isoverwritten. When the loading process is completed, thefunction RECALL is automatically reset to off.

H Note:

The gate for surveying the echo can be moved in therecalled A-scan. However, as the evaluation is made inthe frozen A-scan, the measurement resolution is only0.5 % of the adjusted calibration range.



Operation

5.13 Dataset management(function group DATA)

The USM 35X offers comprehensive functions for aneasy dataset management.


– Select the function group DATA.

The functions in the function group DATA enable you toeasily manage the data sets stored in the USM 35X.

The following functions are available:

TESTINF You can save a lot of additional informa-tion for every data set, e.g. data on thetest object, on the flaw detected, or com-ments.

PREVIEW In this dataset preview you will see theA-scan, the dataset name and the storagedate of each data set.

DIR This function enables you to display a listof all stored data sets, including the corre-sponding dataset names.

SETTING This is where you will see a list of func-tions including all settings of the currentdata set.

Dataset management (function group DATA)


Operation

5.13 Dataset management(function group DATA)

The USM 35X offers comprehensive functions for aneasy dataset management.


– Select the function group DATA.

The functions in the function group DATA enable you toeasily manage the data sets stored in the USM 35X.

The following functions are available:

TESTINF You can save a lot of additional informa-tion for every data set, e.g. data on thetest object, on the flaw detected, or com-ments.

PREVIEW In this dataset preview you will see theA-scan, the dataset name and the storagedate of each data set.

DIR This function enables you to display a listof all stored data sets, including the corre-sponding dataset names.

SETTING This is where you will see a list of func-tions including all settings of the currentdata set.



Operation

TESTINF (Storing additional information)

For every data set, you can store additional informationwhich will support you in the easy management of thedata sets. You have 9 fields at your disposal for thispurpose.

You can enter a maximum of 24 alphanumeric charac-ters in the following fields:

DATNAME Dataset name

OBJECT Object description

FLAWIND Flaw indication

OPERAT Name of the person carrying out the test

SURFACE Surface quality

COMMENT Comments

You can enter numerical values in these fields:

FLAWLEN Flaw length

X-POS x-position coordinate

Y-POS y-position coordinate

You can

• save the current settings – together with the editedadditional information – at a new and still emptydataset number (analogously to function STORE inthe function group MEM),

• subsequently enter and save additional informationfor an already stored data set,

• overwrite the already saved additional information ofa data set.

– Use the right-hand rotary knob to select and acitvatethe function TESTINF. The table will now show theadditional information saved for the currently select-ed data set.

– Use (INFO 3) and to select the field SET-#.

– Use the right-hand rotary knob to view the additionalinformation for other data sets and to edit thisinformation if required.



Operation

TESTINF (Storing additional information)

For every data set, you can store additional informationwhich will support you in the easy management of thedata sets. You have 9 fields at your disposal for thispurpose.

You can enter a maximum of 24 alphanumeric charac-ters in the following fields:

DATNAME Dataset name

OBJECT Object description

FLAWIND Flaw indication

OPERAT Name of the person carrying out the test

SURFACE Surface quality

COMMENT Comments

You can enter numerical values in these fields:

FLAWLEN Flaw length

X-POS x-position coordinate

Y-POS y-position coordinate

You can

• save the current settings – together with the editedadditional information – at a new and still emptydataset number (analogously to function STORE inthe function group MEM),

• subsequently enter and save additional informationfor an already stored data set,

• overwrite the already saved additional information ofa data set.

– Use the right-hand rotary knob to select and acitvatethe function TESTINF. The table will now show theadditional information saved for the currently select-ed data set.

– Use (INFO 3) and to select the field SET-#.

– Use the right-hand rotary knob to view the additionalinformation for other data sets and to edit thisinformation if required.



Operation

H Note:

All stored data are displayed for data sets which arealready occupied. An occupied data set is marked withan asterisk (*) before the data set number. If you haveselected an empty data set, the field data of the previ-ously displayed data set are automatically transferred.However, the data in the numerical fields FLAWLEN,X-POS and Y-POS are deleted. This means that youonly have to edit the variable fields in test applicationswhich include continuous saving of results. All alpha-numerical field data are automatically transferred butcan also be edited if necessary.

Editing additional information

You can edit all items with additional information.

A Attention:

As long as the field data edited in this table have notbeen saved, the previous entries remain valid. Pleasekeep this in mind, e.g. before selecting a new datasetnumber: all changes in the current data set are lost!

– Select the required field.

– Use the left-hand rotary knob to mark the requiredcharacter position.

– Use the right-hand rotary knob to select the charac-ter for this position. You only need the right-handrotary knob to enter the numerical values inFLAWLEN, X-POS and Y-POS.

H Note:

You cannot edit the field SET-#. The number of the cur-rent data set is displayed here.



Operation

H Note:

All stored data are displayed for data sets which arealready occupied. An occupied data set is marked withan asterisk (*) before the data set number. If you haveselected an empty data set, the field data of the previ-ously displayed data set are automatically transferred.However, the data in the numerical fields FLAWLEN,X-POS and Y-POS are deleted. This means that youonly have to edit the variable fields in test applicationswhich include continuous saving of results. All alpha-numerical field data are automatically transferred butcan also be edited if necessary.

Editing additional information

You can edit all items with additional information.

A Attention:

As long as the field data edited in this table have notbeen saved, the previous entries remain valid. Pleasekeep this in mind, e.g. before selecting a new datasetnumber: all changes in the current data set are lost!

– Select the required field.

– Use the left-hand rotary knob to mark the requiredcharacter position.

– Use the right-hand rotary knob to select the charac-ter for this position. You only need the right-handrotary knob to enter the numerical values inFLAWLEN, X-POS and Y-POS.

H Note:

You cannot edit the field SET-#. The number of the cur-rent data set is displayed here.



Operation

Storing additional information

A Attention:

If you have edited already existing additional informa-tion, all previous additional information is overwrittenwhen the data are stored.

– Select the field STO-INF.

– Use the right-hand rotary knob to set this functionon. The currently displayed data of the fields are nowstored. The function STO-INF is automatically resetto off at the end of data storage.

– If necessary, press one of the keys , or togo back to the A-scan without storing the data.

H Note:

In the case of previously empty data sets, all instru-ment settings and the current A-scan are stored simul-taneously with the edited field data. Only the editedfield data are stored for the previously occupied datasets. Previously stored instrument settings andA-scans are kept.

PREVIEW (Dataset preview)

This function enables you to view the A-scans of allstored data sets.

– Select the PREVIEW function.

– Use the right-hand rotary knob to set the function toon. The A-scan and the name of the first data set aredisplayed.

Viewing other data sets:

– Select the SET-# function.

– Use the right-hand rotary knob to select the numberof the required data set.

– Select the RECALL function.

– Use the right-hand rotary knob to set the function toon. The selected data set is displayed.

– If necessary, confirm the message using the corre-sponding key .

– If necessary, press one of the keys , or togo back to the currently active A-scan.



Operation

Storing additional information

A Attention:

If you have edited already existing additional informa-tion, all previous additional information is overwrittenwhen the data are stored.

– Select the field STO-INF.

– Use the right-hand rotary knob to set this functionon. The currently displayed data of the fields are nowstored. The function STO-INF is automatically resetto off at the end of data storage.

– If necessary, press one of the keys , or togo back to the A-scan without storing the data.

H Note:

In the case of previously empty data sets, all instru-ment settings and the current A-scan are stored simul-taneously with the edited field data. Only the editedfield data are stored for the previously occupied datasets. Previously stored instrument settings andA-scans are kept.

PREVIEW (Dataset preview)

This function enables you to view the A-scans of allstored data sets.

– Select the PREVIEW function.

– Use the right-hand rotary knob to set the function toon. The A-scan and the name of the first data set aredisplayed.

Viewing other data sets:

– Select the SET-# function.

– Use the right-hand rotary knob to select the numberof the required data set.

– Select the RECALL function.

– Use the right-hand rotary knob to set the function toon. The selected data set is displayed.

– If necessary, confirm the message using the corre-sponding key .




Operation

DIR (Dataset directory)

This function enables you to get an overview of allstored data sets, including their names and numbers.

– Select the DIR function.

– Use the right-hand rotary knob to set the function toon.

The directory list of the stored data sets is displayed(dataset numbers and names). The display shows12 data sets at a time. Occupied data sets aremarked with an asterisk (*).

– Turn the right-hand rotary knob to have other datasets displayed. The list always advances by one lineeach.



SETTING (Function list)

This function provides you with an overview of all setfunctions of the current data set.

– Select the SETTING function.

– Use the right-hand rotary knob to set the function toon. The list of the currently set functions is displayed.

– Turn the right-hand rotary knob to have other linesdisplayed. The list is advanced by one line each.



Operation

DIR (Dataset directory)

This function enables you to get an overview of allstored data sets, including their names and numbers.

– Select the DIR function.

– Use the right-hand rotary knob to set the function toon.

The directory list of the stored data sets is displayed(dataset numbers and names). The display shows12 data sets at a time. Occupied data sets aremarked with an asterisk (*).

– Turn the right-hand rotary knob to have other datasets displayed. The list always advances by one lineeach.



SETTING (Function list)

This function provides you with an overview of all setfunctions of the current data set.

– Select the SETTING function.

– Use the right-hand rotary knob to set the function toon. The list of the currently set functions is displayed.

– Turn the right-hand rotary knob to have other linesdisplayed. The list is advanced by one line each.



Operation

5.14 Configuring the USM 35X fora test application

Besides the default settings for the instrument opera-tion, you have to configure the USM 35X for calibrationand test tasks. You will find the corresponding functionsin the function groups MEAS, MSEL and LCD.

In addition, you have to check the current time anddate, and set them if required, so that they are correctlystored together with the test results. Please look up thefunction groups CFG1 and CFG2 for more functions forthe general instrument setup (please refer to chapter5.15 General configuration).

– If required, go to the third operating level.

– Select the function group MEAS.

Configuring the USM 35X for a test application


Operation

5.14 Configuring the USM 35X fora test application

Besides the default settings for the instrument opera-tion, you have to configure the USM 35X for calibrationand test tasks. You will find the corresponding functionsin the function groups MEAS, MSEL and LCD.

In addition, you have to check the current time anddate, and set them if required, so that they are correctlystored together with the test results. Please look up thefunction groups CFG1 and CFG2 for more functions forthe general instrument setup (please refer to chapter5.15 General configuration).


– Select the function group MEAS.



Operation

TOF (Selecting the measuring point)

The sound path measurement in the calibration processor in the subsequent echo evaluation process dependson the selected measuring point which can be adjustedeither to flank, to peak or to jflank in the USM 35X.

The point of amplitude measurement is marked by asmall upward triangle on the corresponding gate bar.The point of distance measurement is marked by asmall downward triangle.

H Note:

While DAC, TCG or JISDAC is active you can changethe TOF mode from peak to flank.

When adjusted to flank or jflank the sound path mea-surement is made at the point of intersection of themonitor gate with the rising flank of the highest echo inthe gate.

measured soundpath: 19,44 mmamplitude: 94 %

A Attention:

The highest echo in the gate does not have to be theecho for which the sound path has been measured. Thismay lead to false echo evaluation!



Operation

TOF (Selecting the measuring point)

The sound path measurement in the calibration processor in the subsequent echo evaluation process dependson the selected measuring point which can be adjustedeither to flank, to peak or to jflank in the USM 35X.

The point of amplitude measurement is marked by asmall upward triangle on the corresponding gate bar.The point of distance measurement is marked by asmall downward triangle.

H Note:

While DAC, TCG or JISDAC is active you can changethe TOF mode from peak to flank.

When adjusted to flank or jflank the sound path mea-surement is made at the point of intersection of themonitor gate with the rising flank of the highest echo inthe gate.


A Attention:

The highest echo in the gate does not have to be theecho for which the sound path has been measured. Thismay lead to false echo evaluation!



Operation

In order to identify the points of measurement and toavoid misinterpretation two indicators were introducedper gate: The first triangle pointing downwards indicatesthe position of the measured sound path (distance),whereas the triangle pointing upwards marks the posi-tion of the measured amplitude.

In TOF mode peak the sound path and amplitude mea-surement is made at the maximum of the highest echoin the gate.


In TOF mode jflank the sound path measurement ismade at the point of intersection of the monitor gatewith the rising flank of the first echo in the gate. Theamplitude is measured at the maximum of the firstecho in the gate even if there are further signals withhigher amplitudes in the gate.




Operation

In order to identify the points of measurement and toavoid misinterpretation two indicators were introducedper gate: The first triangle pointing downwards indicatesthe position of the measured sound path (distance),whereas the triangle pointing upwards marks the posi-tion of the measured amplitude.

In TOF mode peak the sound path and amplitude mea-surement is made at the maximum of the highest echoin the gate.


In TOF mode jflank the sound path measurement ismade at the point of intersection of the monitor gatewith the rising flank of the first echo in the gate. Theamplitude is measured at the maximum of the firstecho in the gate even if there are further signals withhigher amplitudes in the gate.




Operation

In principle, the peak measurement should be preferredbecause the measured distances do not depend on theecho height in that case. However, there are applicationcases in which the flank measurement is either specified,or it must be applied for technical reasons, e.g. in manytests using dual-element (TR) probes.

A Attention:

In any case, the adjustment of the measuring point forcalibration and for the subsequent test use must al-ways be identical. Otherwise measurement errors mayoccur.

– Select the TOF function.


S-DISP (Zoomed display of reading)

You can have a selected reading zoomed in the A-scandisplay. The following readings can be selected for thezoomed display (in the second column the indication ofthe readings in the measurement line):

Sa Sa Sound path for gate A

Sb Sb Sound path for gate B

Sb-a ba Difference of single measurements forsound path gate B – gate A

Ha % Ha Echo height gate A in % screen height

Hb % Hb Echo height gate B in % screen height

Ha dB ha Echo height gate A in dB

Hb dB hb Echo height gate B in dB

R-start Rs Range start

R-end Re Range end

La La Number of legs in gate A

Lb Lb Number of legs in gate B

Lc Lc Number of legs in gate C

Only for flaw position calculation:

Da Da Depth for gate A



Operation

In principle, the peak measurement should be preferredbecause the measured distances do not depend on theecho height in that case. However, there are applicationcases in which the flank measurement is either specified,or it must be applied for technical reasons, e.g. in manytests using dual-element (TR) probes.

A Attention:

In any case, the adjustment of the measuring point forcalibration and for the subsequent test use must al-ways be identical. Otherwise measurement errors mayoccur.

– Select the TOF function.


S-DISP (Zoomed display of reading)

You can have a selected reading zoomed in the A-scandisplay. The following readings can be selected for thezoomed display (in the second column the indication ofthe readings in the measurement line):

Sa Sa Sound path for gate A

Sb Sb Sound path for gate B

Sb-a ba Difference of single measurements forsound path gate B – gate A

Ha % Ha Echo height gate A in % screen height

Hb % Hb Echo height gate B in % screen height

Ha dB ha Echo height gate A in dB

Hb dB hb Echo height gate B in dB

R-start Rs Range start

R-end Re Range end

La La Number of legs in gate A

Lb Lb Number of legs in gate B

Lc Lc Number of legs in gate C

Only for flaw position calculation:

Da Da Depth for gate A



Operation

Db Db Depth for gate B

Pa Pa Projection distance for gate A

Pb Pb Projection distance for gate B

Ra Ra Reduced projection distance for gate A

Rb Rb Reduced projection distance for gate B

Only for DGS:

ERS ER Equivalent reflector size

Gt dB Gt DGS test sensitivity

GrdB Gr DGS reference gain (= instrument gainfor the reference echo on 80 % screenheight)

Only for DGS and DAC:

Ha %crv Ca Echo height gate A in % referred to curve

Hb %crv Cb Echo height gate B in % referred to curve

DGS-Crv Dc Diameter of the DGS curve

class cl Flaw class according to JIS Z3060-2002

DAC dB db dB-value by which the DAC gain hasbeen changed related to the referencegain (= instrument gain for the DACecho on 80 % screen height)


General:

Alarm Al Choice of gates for alarm triggering:gate A, B or A+B

H Note:

If you use the Data Logger option, values for the C gateas well as a few special values for the Data Logger areadded to the existing ones, see chapter Option DataLogger.

– Select the function S-DISP.

– Use the right-hand rotary knob to select the requiredvalue for the zoomed display.

H Note:

You can likewise configure all readings to be displayedbelow the A-scan at the four corresponding positions.Please refer to Configuring the measurement line.


Operation

Db Db Depth for gate B

Pa Pa Projection distance for gate A

Pb Pb Projection distance for gate B

Ra Ra Reduced projection distance for gate A

Rb Rb Reduced projection distance for gate B

Only for DGS:

ERS ER Equivalent reflector size

Gt dB Gt DGS test sensitivity

GrdB Gr DGS reference gain (= instrument gainfor the reference echo on 80 % screenheight)

Only for DGS and DAC:

Ha %crv Ca Echo height gate A in % referred to curve

Hb %crv Cb Echo height gate B in % referred to curve

DGS-Crv Dc Diameter of the DGS curve

class cl Flaw class according to JIS Z3060-2002

DAC dB db dB-value by which the DAC gain hasbeen changed related to the referencegain (= instrument gain for the DACecho on 80 % screen height)


General:

Alarm Al Choice of gates for alarm triggering:gate A, B or A+B

H Note:

If you use the Data Logger option, values for the C gateas well as a few special values for the Data Logger areadded to the existing ones, see chapter Option DataLogger.

– Select the function S-DISP.

– Use the right-hand rotary knob to select the requiredvalue for the zoomed display.

H Note:

You can likewise configure all readings to be displayedbelow the A-scan at the four corresponding positions.Please refer to Configuring the measurement line.


Operation

MAGNIFY (Gate spreading)

The setting of the MAGNIFY function causes a spreadingof the gate over the entire display width. You can choosethe gate to be used for the magnify function.

– Select the function MAGNIFY.

– Use the right-hand rotary knob to set the function toaGATE or bGATE if you want to spread the range ofgate A or B over the entire display range.

A-Scan (Setting the A-scan)

This function offers you several options for setting yourA-scan.

• stndardNormal A-scan setting. The key effects a staticfreeze.

• compare (A-scan comparison)You can compare a current echo display with astored one. The display last stored using – eitherfrom the current application or from a stored data set– is displayed in the background as a dotted line.

H Note:Read chapter 5.12 to learn how to load a saved dataset. As a restored data set is displayed with a frozenA-scan, press the key first.

• envelop (echo dynamics)The echo envelope is shown as a dotted line addi-tionally to the A-scan.

• peak b (maximum display)You can use this function to record and document(as well as to save if required) the peaked, maximumecho display. With the B gate active, the A-scan withthe highest echo amplitude (recording of maximumdisplay) is shown as a dotted line additionally to the“live” A-scan when peaking an echo display (in Bgate). This A-scan becomes the statically frozenA-scan by pressing the key, and it can then beevaluated accordingly.



Operation

MAGNIFY (Gate spreading)

The setting of the MAGNIFY function causes a spreadingof the gate over the entire display width. You can choosethe gate to be used for the magnify function.

– Select the function MAGNIFY.

– Use the right-hand rotary knob to set the function toaGATE or bGATE if you want to spread the range ofgate A or B over the entire display range.

A-Scan (Setting the A-scan)

This function offers you several options for setting yourA-scan.

• stndardNormal A-scan setting. The key effects a staticfreeze.

• compare (A-scan comparison)You can compare a current echo display with astored one. The display last stored using – eitherfrom the current application or from a stored data set– is displayed in the background as a dotted line.

H Note:Read chapter 5.12 to learn how to load a saved dataset. As a restored data set is displayed with a frozenA-scan, press the key first.

• envelop (echo dynamics)The echo envelope is shown as a dotted line addi-tionally to the A-scan.

• peak b (maximum display)You can use this function to record and document(as well as to save if required) the peaked, maximumecho display. With the B gate active, the A-scan withthe highest echo amplitude (recording of maximumdisplay) is shown as a dotted line additionally to the“live” A-scan when peaking an echo display (in Bgate). This A-scan becomes the statically frozenA-scan by pressing the key, and it can then beevaluated accordingly.



Operation

• afreeze/bfreeze (automatic freeze)Whenever you select this function, an echo displayconnected with the A or B gate will automaticallyswitch over to A-scan freeze (automatic freeze). Thissetting is especially well suited e.g. for high-tempera-ture measurements, for measurements involvingdifficult coupling conditions, or for spot weld testing.

H Note:

If you are using a Data Logger option, you also havethe function cfreeze (for C gate) at your disposal.

– Select the function A-SCAN.


– Pay attention to the additional information referring tothe corresponding setting options (see preceedingpage).

Configuring the measurement line

The configuration of your measurement line is carriedout in the function group MSEL, this means that youcan choose the reading for one of the four possiblepositions of the measurement line for direct measured-value display during the test.


– Select the function group MSEL.

Functions of the function group MSEL:

MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4Measured values at positions 1 to 4



Operation

• afreeze/bfreeze (automatic freeze)Whenever you select this function, an echo displayconnected with the A or B gate will automaticallyswitch over to A-scan freeze (automatic freeze). Thissetting is especially well suited e.g. for high-tempera-ture measurements, for measurements involvingdifficult coupling conditions, or for spot weld testing.

H Note:

If you are using a Data Logger option, you also havethe function cfreeze (for C gate) at your disposal.

– Select the function A-SCAN.


– Pay attention to the additional information referring tothe corresponding setting options (see preceedingpage).

Configuring the measurement line

The configuration of your measurement line is carriedout in the function group MSEL, this means that youcan choose the reading for one of the four possiblepositions of the measurement line for direct measured-value display during the test.


– Select the function group MSEL.

Functions of the function group MSEL:

MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4Measured values at positions 1 to 4



Operation

All measured values which have also been describedfor the zoomed display of the function S-DISP areavailabe to you at each position.

H Note:

As an alternative, you can display a scale in the mea-surement line (ref. function SCALE).

– Select the function MEAS-P1 to MEAS-P4.

– Use the right-hand rotary knob to set the requiredmeasured value for each position in the correspond-ing function.


Setting the display

In the function group LCD, you will find setting optionsfor the display screen itself and for the echo display.


– Select the function group LCD.

H Note:

Double assignment of the function FILLED/VGA. Togglebetween the two functions by repeatedly pressing thecorresponding key .


Operation

All measured values which have also been describedfor the zoomed display of the function S-DISP areavailabe to you at each position.

H Note:

As an alternative, you can display a scale in the mea-surement line (ref. function SCALE).

– Select the function MEAS-P1 to MEAS-P4.

– Use the right-hand rotary knob to set the requiredmeasured value for each position in the correspond-ing function.


Setting the display

In the function group LCD, you will find setting optionsfor the display screen itself and for the echo display.


– Select the function group LCD.

H Note:

Double assignment of the function FILLED/VGA. Togglebetween the two functions by repeatedly pressing thecorresponding key .


Operation

FILLED (Echo display mode)

The function FILLED toggles between the filled and thenormal echo display mode. The filled echo display modeimproves the echo perceptibility due to the strong con-trast, especially in cases where workpieces are scannedmore quickly.

H Note:

If the function COLOR is active, the filled area is alsodisplayed in different colors.

– Select the function FILLED.

– Use the right-hand rotary knob to set the function toon or off.

VGA

You can switch the VGA output on and off.

H Note:

You should only switch the VGA output on if you aim totransfer the display contents to an external instrument.If the VGA output is switched off, the current consump-tion is reduced and the operating time is extended inbattery operation.

– Select the function VGA.


SCHEME

You have a choice between four color schemes. Thecolor scheme determines the color of all displays andthat of the background. You cannot vary the colors ofgates because they are fixed as follows:

• Gate A – red


• Gate C – blue



Operation

FILLED (Echo display mode)

The function FILLED toggles between the filled and thenormal echo display mode. The filled echo display modeimproves the echo perceptibility due to the strong con-trast, especially in cases where workpieces are scannedmore quickly.

H Note:

If the function COLOR is active, the filled area is alsodisplayed in different colors.

– Select the function FILLED.


VGA

You can switch the VGA output on and off.

H Note:

You should only switch the VGA output on if you aim totransfer the display contents to an external instrument.If the VGA output is switched off, the current consump-tion is reduced and the operating time is extended inbattery operation.

– Select the function VGA.


SCHEME

You have a choice between four color schemes. Thecolor scheme determines the color of all displays andthat of the background. You cannot vary the colors ofgates because they are fixed as follows:

• Gate A – red


• Gate C – blue



Operation

H Note:


– Select the function SCHEME.


LIGHT (LCD backlight)

You can choose between a lighting in the economymode min. and a brighter lighting max. for the displaylighting. The economy mode is the default setting.

H Note:


– Select the function LIGHT.


SCALE (Configuring the measurement line)

As an alternative to the measured values, the USM 35Xenables to display a scale in the measurement line. Thescale gives you an overview of the position of echoes.You have a choice between a dimensionless ten-divi-sion scale and a scale showing the real position of theechoes.

The following settings are possible:

• measval Display of measured values

• snd-pth Display of sound path scale

• div. Display of a dimensionless scale

– Select the function SCALE.

– Use the right-hand rotary knob to set the requireddisplay mode.



Operation

H Note:


– Select the function SCHEME.


LIGHT (LCD backlight)

You can choose between a lighting in the economymode min. and a brighter lighting max. for the displaylighting. The economy mode is the default setting.

H Note:


– Select the function LIGHT.


SCALE (Configuring the measurement line)

As an alternative to the measured values, the USM 35Xenables to display a scale in the measurement line. Thescale gives you an overview of the position of echoes.You have a choice between a dimensionless ten-divi-sion scale and a scale showing the real position of theechoes.

The following settings are possible:

• measval Display of measured values

• snd-pth Display of sound path scale

• div. Display of a dimensionless scale

– Select the function SCALE.

– Use the right-hand rotary knob to set the requireddisplay mode.



Operation

5.15 General configuration

More functions for the basic configuration of the USM 35Xmay be found in the function groups CFG1 and CFG2.


– Select the function group CFG1 or CFG2.

Functions ofCFG1 CFG2:Dialog language DateUnit TimeBaud rate Analog outputPrinter selection HornAssignment of the key Evaluation mode

H Note:

Double assignment of the functions DIALOG/UNIT andDATE/TIME. Toggle between the two functions by re-peatedly pressing the corresponding key .

DIALOG (Selecting the language)

In this function you can select the language for dis-playing the function names on the screen and for thetest report.

The following languages are available:

• German• English (default setting)• French• Italian

General configuration


Operation

5.15 General configuration

More functions for the basic configuration of the USM 35Xmay be found in the function groups CFG1 and CFG2.


– Select the function group CFG1 or CFG2.

Functions ofCFG1 CFG2:Dialog language DateUnit TimeBaud rate Analog outputPrinter selection HornAssignment of the key Evaluation mode

H Note:

Double assignment of the functions DIALOG/UNIT andDATE/TIME. Toggle between the two functions by re-peatedly pressing the corresponding key .

DIALOG (Selecting the language)

In this function you can select the language for dis-playing the function names on the screen and for thetest report.

The following languages are available:

• German• English (default setting)• French• Italian



Operation

• Spanish• Portuguese• Dutch• Swedish• Slovenian• Romanian• Finnish• Czech• Danish• Hungarian• Croatian• Russian• Slovakian• Norwegian• Polish• Japanese

H Note:


– Select the function DIALOG.

– Use the right-hand rotary knob to select the requiredlanguage.


UNIT (Selecting units of measurement)

You can choose the required units between mm or inchin the function UNIT.

A Attention:

You should always make your decision on the unitsimmediately when starting to work with the USM 35X. Ifyou change the unit, all current settings are deleted,and the basic setup is loaded.

– Select the function UNIT.

– Use the right-hand rotary knob to select the requiredunit.

To avoid any accidental deleting of values, themeasurement line will display a safety prompt:Change unit?

– If you are sure that you want to change the unit ofmeasurement, press the corresponding key of thefunction UNIT. Any other key would abort the process.

The unit of measurement is now changed; the currentdata are deleted.


Operation

• Spanish• Portuguese• Dutch• Swedish• Slovenian• Romanian• Finnish• Czech• Danish• Hungarian• Croatian• Russian• Slovakian• Norwegian• Polish• Japanese

H Note:


– Select the function DIALOG.

– Use the right-hand rotary knob to select the requiredlanguage.


UNIT (Selecting units of measurement)

You can choose the required units between mm or inchin the function UNIT.

A Attention:

You should always make your decision on the unitsimmediately when starting to work with the USM 35X. Ifyou change the unit, all current settings are deleted,and the basic setup is loaded.

– Select the function UNIT.

– Use the right-hand rotary knob to select the requiredunit.

To avoid any accidental deleting of values, themeasurement line will display a safety prompt:Change unit?

– If you are sure that you want to change the unit ofmeasurement, press the corresponding key of thefunction UNIT. Any other key would abort the process.

The unit of measurement is now changed; the currentdata are deleted.


Operation

BAUD-R (Baud rate for transmission)

In this function you can select the baud rate for theserial port transmission. You have a choice between300, 600, 1200, 2400, 4800, 9600, 19200, 38400, and57600 Baud.

– Select the function BAUD-R.

– Use the right-hand rotary knob to select the requiredbaud rate.

PRINTER (Printer for test report)

In this function you can select the connected printer forprinting out your test report.

You have a choice between the following printer types:

• Epson

• HP LaserJet

• HP DeskJet

• Seiko DPU

• HP LaserJet 1200 series

• HP DeskJet 1200 series


H Note:

For more details on the how to print out a test report,please refer to chapter 6 Documentation.

– Select the function PRINTER.

– Use the right-hand rotary knob to select the requiredprinter.

COPYMOD (Assignment of the key)

When the key is pressed, data are output to theRS232 interface and transferred to a printer or a PC.

You can use the function COPYMOD to choose thedata to be transferred when the key is pressed. Youhave the following setting options:

• hardcpyHardcopy of the screen contents

• reportTest report with A-scan, all relevant settings for theinspection and space for hand-written remarks

• meas P5The magnified value given at the right upper cornerof the A-scan


Operation

BAUD-R (Baud rate for transmission)

In this function you can select the baud rate for theserial port transmission. You have a choice between300, 600, 1200, 2400, 4800, 9600, 19200, 38400, and57600 Baud.

– Select the function BAUD-R.

– Use the right-hand rotary knob to select the requiredbaud rate.

PRINTER (Printer for test report)

In this function you can select the connected printer forprinting out your test report.

You have a choice between the following printer types:

• Epson

• HP LaserJet

• HP DeskJet

• Seiko DPU

• HP LaserJet 1200 series

• HP DeskJet 1200 series


H Note:

For more details on the how to print out a test report,please refer to chapter 6 Documentation.

– Select the function PRINTER.

– Use the right-hand rotary knob to select the requiredprinter.

COPYMOD (Assignment of the key)

When the key is pressed, data are output to theRS232 interface and transferred to a printer or a PC.

You can use the function COPYMOD to choose thedata to be transferred when the key is pressed. Youhave the following setting options:

• hardcpyHardcopy of the screen contents

• reportTest report with A-scan, all relevant settings for theinspection and space for hand-written remarks

• meas P5The magnified value given at the right upper cornerof the A-scan


Operation

• meas P1The measured value given at position 1 in themeasurement line

• pardumpAll instrument functions with the current settings

• PCXScreen contents as a PCX-format file. To transfer thedata to the PC, you will need a terminal program.

• storeThe current instrument setting is stored to theselected (free) data set, and the data set number(DAT-#) is automatically increased.

• datalog (only with Data Logger option)The selected job is printed out as a report includingall measured values.

• offThe key is deactivated.

• specialas setting “hardcpy”. After printout of the screencontents no form feed, every press on the key printsout the next hardcopy on the same page (three orfour hardcopies depending on the printer).

H Note:

Please also refer to chapter 6 Documentation.

– Select the function COPYMOD.

– Use the right-hand rotary knob to set the requiredassignment for the key.

TIME/DATE (Setting the time and date)

You have to check the current date and time and, ifrequired, set them so that these data are correctlysaved together with the test results.



Operation

• meas P1The measured value given at position 1 in themeasurement line

• pardumpAll instrument functions with the current settings

• PCXScreen contents as a PCX-format file. To transfer thedata to the PC, you will need a terminal program.

• storeThe current instrument setting is stored to theselected (free) data set, and the data set number(DAT-#) is automatically increased.

• datalog (only with Data Logger option)The selected job is printed out as a report includingall measured values.

• offThe key is deactivated.

• specialas setting “hardcpy”. After printout of the screencontents no form feed, every press on the key printsout the next hardcopy on the same page (three orfour hardcopies depending on the printer).

H Note:

Please also refer to chapter 6 Documentation.

– Select the function COPYMOD.

– Use the right-hand rotary knob to set the requiredassignment for the key.

TIME/DATE (Setting the time and date)

You have to check the current date and time and, ifrequired, set them so that these data are correctlysaved together with the test results.



Operation

H Note:


A Attention:

Always make sure that you are using correctly settime and date values. Otherwise test results might becorrupted. Be aware that the USM 35X displays theyear as a two digit number!

– Select the function TIME.

– Use the left-hand rotary knob to highlight the valuethat you want to change, e.g. the hour.

– Use the right-hand rotary knob to change the high-lighted value.

– Select the function DATE.

– Use the left-hand rotary knob to highlight the valuethat you want to change, e.g. the day.



ANAMOD

You can output results of measurements at the analogoutput for external further processing. Use the functionANAMOD to configure the analog output in case thereis no echo in the evaluation gate and the analog voltagehas been selected for the sound path at the output.

You have the following setting options:

• lo voltThe analog output supplies 0 volt.

• hi voltThe analog output supplies 5 volts.

– Select the function ANAMOD.

– Use the right-hand rotary knob to choose the requiredvalue.


Operation

H Note:


A Attention:

Always make sure that you are using correctly settime and date values. Otherwise test results might becorrupted. Be aware that the USM 35X displays theyear as a two digit number!

– Select the function TIME.

– Use the left-hand rotary knob to highlight the valuethat you want to change, e.g. the hour.


– Select the function DATE.

– Use the left-hand rotary knob to highlight the valuethat you want to change, e.g. the day.



ANAMOD

You can output results of measurements at the analogoutput for external further processing. Use the functionANAMOD to configure the analog output in case thereis no echo in the evaluation gate and the analog voltagehas been selected for the sound path at the output.

You have the following setting options:

• lo voltThe analog output supplies 0 volt.

• hi voltThe analog output supplies 5 volts.

– Select the function ANAMOD.

– Use the right-hand rotary knob to choose the requiredvalue.


Operation

HORN

In this function, you can decide whether or not anacoustic alarm should be given in addition to the visualalarm (LED A).

– Select the function HORN.

– Use the left-hand rotary knob to set the horn to on oroff.

H Note:

Error alarms can be triggered unter certain circum-stances. These are caused by intermediate conditionsin instrument operation occuring when the instrument isused, i.e. when function parameters are changed. Pos-sible alarms occuring during instrument operation(setting of functions) are to be ignored.


EVAMOD (Echo evaluation)

This is where you can choose a method for the evalua-tion of the measured reflector echo. Depending on theinstrument version used, you have various methods tochoose from.

• REF (default setting)Evaluation using the measurement of dB difference,available for all instrument versions

• AWSRating of welds according to AWS

• DAC (only USM 35X DAC and USM 35X S)Evaluation using the Distance-Amplitude Curve

• JISDAC (only USM 35X DAC and USM 35X S)Evaluation using the Distance-Amplitude Curveaccording to JIS Z3060-2002

• DGS (only USM 35X S)Evaluation using the DGS method

– Select the function EVAMOD.

– Use the right-hand rotary knob to choose the requiredmethod.


Operation

HORN

In this function, you can decide whether or not anacoustic alarm should be given in addition to the visualalarm (LED A).

– Select the function HORN.

– Use the left-hand rotary knob to set the horn to on oroff.

H Note:

Error alarms can be triggered unter certain circum-stances. These are caused by intermediate conditionsin instrument operation occuring when the instrument isused, i.e. when function parameters are changed. Pos-sible alarms occuring during instrument operation(setting of functions) are to be ignored.


EVAMOD (Echo evaluation)

This is where you can choose a method for the evalua-tion of the measured reflector echo. Depending on theinstrument version used, you have various methods tochoose from.

• REF (default setting)Evaluation using the measurement of dB difference,available for all instrument versions

• AWSRating of welds according to AWS

• DAC (only USM 35X DAC and USM 35X S)Evaluation using the Distance-Amplitude Curve

• JISDAC (only USM 35X DAC and USM 35X S)Evaluation using the Distance-Amplitude Curveaccording to JIS Z3060-2002

• DGS (only USM 35X S)Evaluation using the DGS method

– Select the function EVAMOD.

– Use the right-hand rotary knob to choose the requiredmethod.


Operation

5.16 Other functions withspecial keys

H Note:

You will find a description of the key (setting of thedB incrementation for gain) on page 5-5; the key,which you will need for printing out your test report, isdescribed in chapter 6 Documentation.

Freeze

The key enables you to store (freeze) the displayedimage on the screen. Gate parameters may still bechanged in order to evaluate any signal being displayedin the frozen screen. The measurement resolution isonly 0.5 % of the displayed range.

– Press if you want to store (“freeze”) a currentdisplay.

– Press again in order to return to normal mode.

Other functions with special keys

Zooming the echo display

If you press the key , the echo display is zoomed (zoomfunction) and is superimposed on the function group.

The functions are not accessible in this mode, exceptfor the gain. It can still be set by means of the left-handrotary knob.

H Note:

You cannot switch on the zoom function with gatewidths smaller than 0.5 mm/0.02" (5920 m/s).

– Press the button in order to change to the zoommode.

– Press the button one more time in order to returnto the normal mode.

The key

You can use this key to save measured values and A-scans. In addition, it serves for recording echoes, forexample as a reference echo.

– Press the key in order to save a measured valueor to record an echo.


Operation

5.16 Other functions withspecial keys

H Note:

You will find a description of the key (setting of thedB incrementation for gain) on page 5-5; the key,which you will need for printing out your test report, isdescribed in chapter 6 Documentation.

Freeze

The key enables you to store (freeze) the displayedimage on the screen. Gate parameters may still bechanged in order to evaluate any signal being displayedin the frozen screen. The measurement resolution isonly 0.5 % of the displayed range.

– Press if you want to store (“freeze”) a currentdisplay.

– Press again in order to return to normal mode.

Other functions with special keys

Zooming the echo display

If you press the key , the echo display is zoomed (zoomfunction) and is superimposed on the function group.

The functions are not accessible in this mode, exceptfor the gain. It can still be set by means of the left-handrotary knob.

H Note:

You cannot switch on the zoom function with gatewidths smaller than 0.5 mm/0.02" (5920 m/s).

– Press the button in order to change to the zoommode.

– Press the button one more time in order to returnto the normal mode.

The key

You can use this key to save measured values and A-scans. In addition, it serves for recording echoes, forexample as a reference echo.

– Press the key in order to save a measured valueor to record an echo.


Operation

5.17 Status symbols and LEDs

Status symbols can be displayed in the line below thescreen display to inform about certain settings andconditions of the USM 35X. The LEDs above the dis-play give you further information.

Status symbolsSymbol Description


! Data transfer active,(printing or remote control).


F Function TOF is set to flank.

P Function TOF is set to peak.

J Function TOF is set to jflank.

T Function T-CORR is active.

R Reference echo has been recorded (DGS).

A Function ATT-OBJ/ATT-REF (soundattenuation) is active.

Staus symbols and LEDs

H Note:

If you are using the Data Logger option, you’ll find morestatus symbols, see chapter Option Data Logger.

LEDsSymbol Description

A Gate alarm.

R Function REJECT is active.

D Function DUAL (pulser-receiver separation)is active.

H Note:

Error alarms can be triggered unter certain circumstanc-es. These are caused by intermediate conditions in instru-ment operation occuring when the instrumet is used, i.e.when function parameters are changed. Possible alarmsoccuring during instrument operation (setting offunctions) are to be ignored.


Operation

5.17 Status symbols and LEDs

Status symbols can be displayed in the line below thescreen display to inform about certain settings andconditions of the USM 35X. The LEDs above the dis-play give you further information.

Status symbolsSymbol Description


! Data transfer active,(printing or remote control).


F Function TOF is set to flank.

P Function TOF is set to peak.

J Function TOF is set to jflank.

T Function T-CORR is active.

R Reference echo has been recorded (DGS).

A Function ATT-OBJ/ATT-REF (soundattenuation) is active.

Staus symbols and LEDs

H Note:

If you are using the Data Logger option, you’ll find morestatus symbols, see chapter Option Data Logger.

LEDsSymbol Description

A Gate alarm.

R Function REJECT is active.

D Function DUAL (pulser-receiver separation)is active.

H Note:

Error alarms can be triggered unter certain circumstanc-es. These are caused by intermediate conditions in instru-ment operation occuring when the instrumet is used, i.e.when function parameters are changed. Possible alarmsoccuring during instrument operation (setting offunctions) are to be ignored.


OperationDistance-amplitude curve (only USM 35X DAC and USM 35S)

5.18 Distance-amplitude curve(only USM 35X DAC andUSM 35S)

H Note:

The DAC function is available as a fixed function in thesecond operating level on the USM 35X DAC. With theUSM 35X S, the DAC function can be additionallyswitched over to DGS evaluation mode.

Due to the angle of the sound beam spread and to thesound attenuation in the material the echo height ofreflectors of equal size depends on the distance to theprobe.

A distance-amplitude curve, which is recorded withdefined reference reflectors, graphically displays theseinfluences.

If you use a reference block having artificial flaws whenrecording a DAC you will be able to apply these echoamplitudes for the evaluation of discontinuities withoutany further correction. The reference block should bemade of the same material as the test object.

You will find the functions for the distance-amplitudecurve in the function group DAC. If required, select thesetting DAC in the function group EVAMOD first.


– Select the function group CFG2.

– Switch the function EVA-MOD over to the settingDAC.

– Go to the second operating level.

– Select the function group DAC.



5.18 Distance-amplitude curve(only USM 35X DAC andUSM 35S)

H Note:

The DAC function is available as a fixed function in thesecond operating level on the USM 35X DAC. With theUSM 35X S, the DAC function can be additionallyswitched over to DGS evaluation mode.

Due to the angle of the sound beam spread and to thesound attenuation in the material the echo height ofreflectors of equal size depends on the distance to theprobe.

A distance-amplitude curve, which is recorded withdefined reference reflectors, graphically displays theseinfluences.

If you use a reference block having artificial flaws whenrecording a DAC you will be able to apply these echoamplitudes for the evaluation of discontinuities withoutany further correction. The reference block should bemade of the same material as the test object.

You will find the functions for the distance-amplitudecurve in the function group DAC. If required, select thesetting DAC in the function group EVAMOD first.



– Switch the function EVA-MOD over to the settingDAC.


– Select the function group DAC.


Operation

H Note:

Double assignment of the function T-CORR/OFFSET.Toggle between the two functions by repeatedly press-ing the corresponding key .

DACMOD (Activating DAC/TCG)

You can use this function to activate the DAC. The fol-lowing settings are available:

• offNo DAC is active.

• DACThe already saved distance-amplitude curve isdisplayed on the screen, or a new DAC is recorded.

• TCGAn existing DAC (at least 2 reference points) isdisplayed as a horizontal TCG line.

H Note:

No reference echoes can be recorded withDACMODE = TCG. TCG can only be activated if thereference echoes recorded are situated within a dynam-ic range of 40 dB. Otherwise an error message is out-put. If the TCG setting should be nevertheless be usedin this case, then the DAC must be reduced (by delet-ing the last reference points) until TCG can be switchedon.

– Select the function DACMOD.

– Use the right-hand rotary knob to select the DACsetting.

If there is a DAC stored, it will now be active.

– Select the TCG setting.

The TCG function is activated so that the DACbecomes a horizontal recording threshold. Thismeans: all reference echoes recorded are brought(lifted or lowered) to the same echo height.

– Use the right-hand rotary knob to select the settingoff in order to deactivate the DAC again.

Distance-amplitude curve (only USM 35X DAC and USM 35S)


Operation

H Note:

Double assignment of the function T-CORR/OFFSET.Toggle between the two functions by repeatedly press-ing the corresponding key .

DACMOD (Activating DAC/TCG)



• DACThe already saved distance-amplitude curve isdisplayed on the screen, or a new DAC is recorded.

• TCGAn existing DAC (at least 2 reference points) isdisplayed as a horizontal TCG line.

H Note:

No reference echoes can be recorded withDACMODE = TCG. TCG can only be activated if thereference echoes recorded are situated within a dynam-ic range of 40 dB. Otherwise an error message is out-put. If the TCG setting should be nevertheless be usedin this case, then the DAC must be reduced (by delet-ing the last reference points) until TCG can be switchedon.










DACECHO (Recording reference curve)

A Attention:

Before starting to record a reference curve, the instru-ment must be correctly calibrated (ref. section5.7 Calibrating the USM 35X).

The moment a new curve is recorded, a possibly al-ready existing curve must be deleted. If necessary,make sure that the old curve has been stored in a freedata set before starting to record a new curve!


– Use the right-hand rotary knob to set the function toDAC. The function DACECHO is set to 0 since thereis no previously recorded echo.

– Couple the probe to the reference block, and peakthe first reference echo. Use the left-hand rotary knobto bring the echo to an amplitude between 70 % and100 % screen height.

– Select the function aSTART, and then move the gateso that the selected echo is the highest of the echosequence within the gate range.

– Press to record the first reference echo. Theinstrument gain will automatically change until theDAC echo in gate A reaches 80% screen height(+/–0,3 dB). The function DACECHO is set to 1 toindicate that the first reference echo has beensuccessfully recorded. Simultaneously the statussymbol “R” appears (= reference echo stored).

– Peak the next reference echo, and repeat the record-ing process for other curve points. The number in thefunction DACECHO is increased by 1 with eachrecording.

H Note:

If the message “Echo is not valid” appears, the refer-ence point could not be recorded. Check the gate posi-tion as well as the height of the reference echo andrepeat the recording.

As soon as you have recorded at least two curve refer-ence points. Your DAC is already active (please seeprevious section). You can record a maximum of10 curve reference points.




A Attention:

Before starting to record a reference curve, the instru-ment must be correctly calibrated (ref. section5.7 Calibrating the USM 35X).






– Press to record the first reference echo. Theinstrument gain will automatically change until theDAC echo in gate A reaches 80% screen height(+/–0,3 dB). The function DACECHO is set to 1 toindicate that the first reference echo has beensuccessfully recorded. Simultaneously the statussymbol “R” appears (= reference echo stored).


H Note:


As soon as you have recorded at least two curve refer-ence points. Your DAC is already active (please seeprevious section). You can record a maximum of10 curve reference points.


Operation Distance-amplitude curve (only USM 35X DAC and USM 35X S)

Deleting reference points or the complete DAC

You can delete the reference point which was recordedlast in each case, or the complete DAC.

– Select the function DACECHO.

– Turn the right-hand rotary knob downward (counter-clockwise). The message “Do you want to deletethe DAC echo?” appears in the measurement line.

– Press the key in order to delete the last echo, orpress another key in order to cancel the process ofdeleting.

In this way, you can record one or several new refer-ence points.

– In order to delete the complete DAC, turn the right-hand rotary knob upward (clockwise). The message“Do you want to delete all DAC echoes?” appearsin the measurement line.

– Press the key in order to delete all echoes, orpress another key in order to cancel the process ofdeleting.

T-CORR (Sensitivity correction)

This function enables you to compensate for the trans-fer losses in the material under test. This correction isnecessary if test object and reference block have differ-ent surface qualities.

You have to find out the adjustment value for the com-pensation of transfer losses by experiments. The gainis varied accordingly in this connection, the curve lineremains the same.

– Select the function T-CORR.



Operation Distance-amplitude curve (only USM 35X DAC and USM 35X S)















Operation

OFFSET (Distance of multiple DAC)

You can activate a multiple DAC and at the same timedetermine the distance from the registration curve. Thedefault setting 6.0 dB generates four other curves at–12 dB, –6 dB, +6 dB, and +12 dB from the registrationcurve. The setting 0 generates only the registrationcurve. Any setting different from 0 generates four othercurves at a set distance from the original curve. For abetter distinction in multiple DACs the registration curveis displayed as a bold line.

Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB

– Select the function OFFSET.



Echo evaluation with DAC

In order to be able to evaluate a flaw indication bymeans of the DAC, certain conditions must be met:

• The distance-amplitude curve must already berecorded.

• It only applies to the same probe that was usedwhen recording the curve. Not even another probe ofthe same type must be used!

• The DAC only apply to the material corresponding tothe material of the reference block.

• All functions affecting the echo amplitude must beset the same way as they were when the curve wasrecorded. This applies in particular to the followingfunctions: POWER, FREQU, RECTIFY, MTLVEL andREJECT.


Operation


You can activate a multiple DAC and at the same timedetermine the distance from the registration curve. Thedefault setting 6.0 dB generates four other curves at–12 dB, –6 dB, +6 dB, and +12 dB from the registrationcurve. The setting 0 generates only the registrationcurve. Any setting different from 0 generates four othercurves at a set distance from the original curve. For abetter distinction in multiple DACs the registration curveis displayed as a bold line.












Operation

5.19 Distance-amplitude curveaccording to JIS Z3060-2002(only USM 35X DAC andUSM 35S)

H Note:

The JISDAC function for echo evaluation with thedictance-amplitude curve and additional classificationaccording to JIS Z3060-2002 is available in theUSM 35X DAC and USM 35X S.

You will find the functions for the distance-amplitudecurve according to JIS Z3060-2002 in the functiongroup JDAC. If required, select the setting JDAC in thefunction group EVAMOD first.



– Switch the function EVAMOD over to the settingJDAC.


DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)

– Select the function group JDAC.

H Note:

Double assignment of the functions DACMOD/BOLDLIand T-CORR/OFFSET. Toggle between the two functionsby repeatedly pressing the corresponding key .


Operation

5.19 Distance-amplitude curveaccording to JIS Z3060-2002(only USM 35X DAC andUSM 35S)

H Note:

The JISDAC function for echo evaluation with thedictance-amplitude curve and additional classificationaccording to JIS Z3060-2002 is available in theUSM 35X DAC and USM 35X S.

You will find the functions for the distance-amplitudecurve according to JIS Z3060-2002 in the functiongroup JDAC. If required, select the setting JDAC in thefunction group EVAMOD first.



– Switch the function EVAMOD over to the settingJDAC.



– Select the function group JDAC.

H Note:

Double assignment of the functions DACMOD/BOLDLIand T-CORR/OFFSET. Toggle between the two functionsby repeatedly pressing the corresponding key .


OperationDAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)

DACMOD (Activating DAC according to JIS)



• DACDAC according to JIS with 6 curves. The first 4 curvesare identified with the letters L, M, H and U dedicatedto these curves, and therefore move with any gainchange.

In JISDAC also the echo evaluation in classes can beperformed. The flaw class depends on the position ofthe echo peak within the first 4 curves:

class I: amplitude < curve Lclass II: curve L < amplitude < curve Mclass III: curve M < amplitude < curve H (registra-tion level)class IV: amplitude > curve H








OperationDAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)

DACMOD (Activating DAC according to JIS)



• DACDAC according to JIS with 6 curves. The first 4 curvesare identified with the letters L, M, H and U dedicatedto these curves, and therefore move with any gainchange.

In JISDAC also the echo evaluation in classes can beperformed. The flaw class depends on the position ofthe echo peak within the first 4 curves:

class I: amplitude < curve Lclass II: curve L < amplitude < curve Mclass III: curve M < amplitude < curve H (registra-tion level)class IV: amplitude > curve H








Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)


A Attention:

Before starting to record a reference curve, the instru-ment must be correctly calibrated (ref. section 5.7Calibrating the USM 35X).






– Press to record the first reference echo. Theinstrument gain will automatically change until theDAC echo in gate A reaches 80% screen height(+/– 0,3 dB). The function DACECHO is set to 1 toindicate that the first reference echo has beensuccessfully recorded. Simultaneously the statussymbol “R” appears (= reference echo stored).

H Note:

The dB-value by which the gain has been changed re-lated to the reference gain can be displayed using thenew parameter DAC dB.


Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)


A Attention:

Before starting to record a reference curve, the instru-ment must be correctly calibrated (ref. section 5.7Calibrating the USM 35X).






– Press to record the first reference echo. Theinstrument gain will automatically change until theDAC echo in gate A reaches 80% screen height(+/– 0,3 dB). The function DACECHO is set to 1 toindicate that the first reference echo has beensuccessfully recorded. Simultaneously the statussymbol “R” appears (= reference echo stored).

H Note:

The dB-value by which the gain has been changed re-lated to the reference gain can be displayed using thenew parameter DAC dB.


Operation

The function DACECHO displays the number 1.


H Note:












Operation

The function DACECHO displays the number 1.


H Note:












Operation

BOLDLI (Choice of a registration curve)

One of the four curves marked with a character (L, M,H, U) can be selected as the registration curve. Thisregistration curve will then be displayed as a bold lineand an echo amplitude evaluation (dB-to-curve) will bemade for this curve.

– Select the function BOLDLI.








You can activate a multiple DAC and at the same timedetermine the distance from the registration curve. Thedefault setting 6.0 dB generates four other curves at–12 dB, –6 dB, +6 dB, and +12 dB from the registrationcurve, and additionally two other curves at +18 dB and+24 dB. The setting 0 generates only the registrationcurve and the two fixed curves. Any setting differentfrom 0 generates four other curves at a set distancefrom the original curve. For a better distinction in multi-ple DACs the registration curve is displayed as a boldline.






Operation

BOLDLI (Choice of a registration curve)

One of the four curves marked with a character (L, M,H, U) can be selected as the registration curve. Thisregistration curve will then be displayed as a bold lineand an echo amplitude evaluation (dB-to-curve) will bemade for this curve.

– Select the function BOLDLI.








You can activate a multiple DAC and at the same timedetermine the distance from the registration curve. Thedefault setting 6.0 dB generates four other curves at–12 dB, –6 dB, +6 dB, and +12 dB from the registrationcurve, and additionally two other curves at +18 dB and+24 dB. The setting 0 generates only the registrationcurve and the two fixed curves. Any setting differentfrom 0 generates four other curves at a set distancefrom the original curve. For a better distinction in multi-ple DACs the registration curve is displayed as a boldline.






Operation








5.20 Evaluation according to theDGS method (only USM 35X S)

With the USM 35X S, you can use both the DAC andthe DGS method of amplitude evaluation.

Measuring with DGS

Using the DGS function (Distance Gain Size), you cancompare the reflecting power of a natural flaw in thetest object with that of a theoretical flaw (circular disk-shaped equivalent reflector) at the same depth.

A Attention:

You are comparing the reflecting power of a natural flawwith that of a theoretical flaw. No definite conclusionsmay be drawn on the natural flaw (roughness, inclinedposition, etc.).

The so-called DGS diagram forms the basis for thiscomparison of the reflecting power. This diagram con-sists of a set of curves showing the correlation of threeinfluencing variables:


Operation








5.20 Evaluation according to theDGS method (only USM 35X S)

With the USM 35X S, you can use both the DAC andthe DGS method of amplitude evaluation.

Measuring with DGS

Using the DGS function (Distance Gain Size), you cancompare the reflecting power of a natural flaw in thetest object with that of a theoretical flaw (circular disk-shaped equivalent reflector) at the same depth.

A Attention:

You are comparing the reflecting power of a natural flawwith that of a theoretical flaw. No definite conclusionsmay be drawn on the natural flaw (roughness, inclinedposition, etc.).

The so-called DGS diagram forms the basis for thiscomparison of the reflecting power. This diagram con-sists of a set of curves showing the correlation of threeinfluencing variables:


Operation Evaluation according to the DGS method (only USM 35X S)

• Distance D between the probe and circular disk-shaped equivalent reflector

• Difference in gain G between various large circulardisk-shaped equivalent reflectors and an infinitelylarge backwall

• Size S of the circular disk-shaped equivalent reflec-tor. The influencing variable S always remainsconstant for one curve of the set of curves

The advantage of the DGS method lies in the fact thatyou can carry out reproducible evaluations of smalldiscontinuities. The reproducibility is most of all impor-tant, for example, whenever you aim to carry out anacceptance test.

Apart from the influencing variables already mentioned,there are other factors determining the curve shape:

• sound attenuation

• transfer losses

• amplitude correction value

• probe.

The following probe parameters affect the curve shape:

• element or crystal diameter

• frequency

• delay length

• delay velocity

You can adjust these parameters on the USM 35X S insuch a way that you can use the DGS method withmany different probes and on different materials.

H Note:

Before setting the DGS function, the instrument mustfirst be calibrated because all functions affecting theDGS evaluation mode (MTLVEL, P-DELAY, DAMPING,POWER, FINE G, FREQU, RECTIFY) can no longer bechanged after the reference echo has been recorded.

Please also refer to chapter 5.7 Calibrating theUSM 35X on this subject.


Operation Evaluation according to the DGS method (only USM 35X S)

• Distance D between the probe and circular disk-shaped equivalent reflector

• Difference in gain G between various large circulardisk-shaped equivalent reflectors and an infinitelylarge backwall

• Size S of the circular disk-shaped equivalent reflec-tor. The influencing variable S always remainsconstant for one curve of the set of curves

The advantage of the DGS method lies in the fact thatyou can carry out reproducible evaluations of smalldiscontinuities. The reproducibility is most of all impor-tant, for example, whenever you aim to carry out anacceptance test.

Apart from the influencing variables already mentioned,there are other factors determining the curve shape:

• sound attenuation

• transfer losses

• amplitude correction value

• probe.

The following probe parameters affect the curve shape:

• element or crystal diameter

• frequency

• delay length

• delay velocity

You can adjust these parameters on the USM 35X S insuch a way that you can use the DGS method withmany different probes and on different materials.

H Note:

Before setting the DGS function, the instrument mustfirst be calibrated because all functions affecting theDGS evaluation mode (MTLVEL, P-DELAY, DAMPING,POWER, FINE G, FREQU, RECTIFY) can no longer bechanged after the reference echo has been recorded.

Please also refer to chapter 5.7 Calibrating theUSM 35X on this subject.


OperationEvaluation according to the DGS method (only USM 35X S)

Selecting the DGS mode



– Switch the function EVA-MOD over to the settingDGS.


– Select the function group DGS.

Double assignment of functions:

The following functions are double assigned. Togglebetween the two functions by repeatedly pressing thecorresponding key .

DGSMEN> DGSMEN>Calling the DGS menu Switching on/off the

DGS evaluation mode

T-CORR> OFFSET>Setting the transfer Activating the multi-curvecorrection display mode

Default settings for the DGS measurement

In the next step, the DGS menu is called enabling toselect the corresponding probe and to set the otherDGS parameters:

– Select the function DGSMEN.

– Use the right-hand rotary knob to call the DGS menu.



Selecting the DGS mode



– Switch the function EVA-MOD over to the settingDGS.


– Select the function group DGS.

Double assignment of functions:

The following functions are double assigned. Togglebetween the two functions by repeatedly pressing thecorresponding key .

DGSMEN> DGSMEN>Calling the DGS menu Switching on/off the

DGS evaluation mode

T-CORR> OFFSET>Setting the transfer Activating the multi-curvecorrection display mode

Default settings for the DGS measurement

In the next step, the DGS menu is called enabling toselect the corresponding probe and to set the otherDGS parameters:

– Select the function DGSMEN.

– Use the right-hand rotary knob to call the DGS menu.


Operation

– Define your settings:

• PROBE-#: probe numberFixed-programmed probes with all settings (PRB-NAME, DEL-VEL, D eff and PRBFREQ cannot bechanged in the case of these probes);PROBE-# = 0 is user-programmable with referenceto all parameters.

• PRBNAME: probe nameThe name belongs to the selected probe number andcannot be changed; the individual probe name can beentered only with PROBE-# = 0.

• DGS-CRV: registration curve for DGS evaluationThis enables you to select the circular disk-shapedequivalent reflector diameter to be used for displayingthe DGS curve and used as recording threshold forecho evaluations.

• DEL-VEL: delay material velocity of the probePredefined with programmed probes.

• D eff: effective element diameter of the probe usedPredefined with programmed probes.

• PRBFREQ: probe frequencyFrequency of the transducer; predefined with pro-grammed probes.

• REFECHO: type of the reference reflector usedBW backwallSDH side drilled holeFBH flat bottom hole

• REFSIZE: size of the reference reflector

• ATT-REF: sound attenuation in the reference block

• ATT-OBJ: sound attenuation in the test object

• AMPLCOR: value for the amplitude correction.This is required whenever you are using an angleprobe and the quadrant echo from the calibrationstandards K1 or K2 as a reference reflector.

– To return to the A-scan, press one of the followingkeys: , or .

Evaluation according to the DGS method (only USM 35X S)


Operation

– Define your settings:

• PROBE-#: probe numberFixed-programmed probes with all settings (PRB-NAME, DEL-VEL, D eff and PRBFREQ cannot bechanged in the case of these probes);PROBE-# = 0 is user-programmable with referenceto all parameters.

• PRBNAME: probe nameThe name belongs to the selected probe number andcannot be changed; the individual probe name can beentered only with PROBE-# = 0.

• DGS-CRV: registration curve for DGS evaluationThis enables you to select the circular disk-shapedequivalent reflector diameter to be used for displayingthe DGS curve and used as recording threshold forecho evaluations.

• DEL-VEL: delay material velocity of the probePredefined with programmed probes.

• D eff: effective element diameter of the probe usedPredefined with programmed probes.

• PRBFREQ: probe frequencyFrequency of the transducer; predefined with pro-grammed probes.

• REFECHO: type of the reference reflector usedBW backwallSDH side drilled holeFBH flat bottom hole

• REFSIZE: size of the reference reflector

• ATT-REF: sound attenuation in the reference block

• ATT-OBJ: sound attenuation in the test object

• AMPLCOR: value for the amplitude correction.This is required whenever you are using an angleprobe and the quadrant echo from the calibrationstandards K1 or K2 as a reference reflector.

– To return to the A-scan, press one of the followingkeys: , or .



Operation

Example

In this example, the probe MB 4 S is selected. Referencereflector = backwall, the 3 mm circular disc is to bedisplayed as curve. The sound attenuation correctionsATT-REF and ATT-OBJ and the amplitude correctionAMPLCOR (for angle probes and calibration standardK1/K2) remain at 0.

Recording the reference echo anddisplaying the DGS curve

To be able to display the required DGS curve, you haveto first record the reference echo.

– You have to start by optimizing the echo of thereference reflector, in this case the backwall echofrom the test object.

– Continue by positioning the gate on the reference echo.

– Select the function DGS-REF, and use the right-handrotary knob to switch the function on. The message:“Do you want to change the DGS reference echo?”appears.



Operation

Example

In this example, the probe MB 4 S is selected. Referencereflector = backwall, the 3 mm circular disc is to bedisplayed as curve. The sound attenuation correctionsATT-REF and ATT-OBJ and the amplitude correctionAMPLCOR (for angle probes and calibration standardK1/K2) remain at 0.

Recording the reference echo anddisplaying the DGS curve

To be able to display the required DGS curve, you haveto first record the reference echo.

– You have to start by optimizing the echo of thereference reflector, in this case the backwall echofrom the test object.

– Continue by positioning the gate on the reference echo.

– Select the function DGS-REF, and use the right-handrotary knob to switch the function on. The message:“Do you want to change the DGS reference echo?”appears.



Operation

– If required, confirm by pressing again.

After the successful recording of the reference echo, ahighlighted R will be displayed in the measurement line.

– Set the function DGSMOD> to on, to switch on DGScurve.

Taking the general DGS diagram as a basis, the instru-ment calculates the required test sensitivity for display-ing the 3 mm curve with its maximum at 80 % screenheight, and sets this value. The current gain is set to 0during this. In the case of subsequent gain variations,the curve is automatically adapted.


Evaluation of reflectors

Every echo situated within the gate can be immediatelyevaluated:

The measurement line has been configured in such away that the sound path S, the echo height in dBreferred to the DGS curve, the equivalent reflectorsize (ERS) of the flaw echo and the calibration rangeare displayed.

The measured value to be zoomed in the A-scan ischosen by means of the function S-DISP in the func-tion group MEAS. ERS was chosen in the above exam-ple. (Also refer to Configuring the measurement line,p. 5-49.)


Operation

– If required, confirm by pressing again.

After the successful recording of the reference echo, ahighlighted R will be displayed in the measurement line.

– Set the function DGSMOD> to on, to switch on DGScurve.

Taking the general DGS diagram as a basis, the instru-ment calculates the required test sensitivity for display-ing the 3 mm curve with its maximum at 80 % screenheight, and sets this value. The current gain is set to 0during this. In the case of subsequent gain variations,the curve is automatically adapted.


Evaluation of reflectors

Every echo situated within the gate can be immediatelyevaluated:

The measurement line has been configured in such away that the sound path S, the echo height in dBreferred to the DGS curve, the equivalent reflectorsize (ERS) of the flaw echo and the calibration rangeare displayed.

The measured value to be zoomed in the A-scan ischosen by means of the function S-DISP in the func-tion group MEAS. ERS was chosen in the above exam-ple. (Also refer to Configuring the measurement line,p. 5-49.)


Operation

S-DISP = Ha%, i.e. echo height evaluation as a per-centage.At the same time, the multiple-curve display mode isalso active with a curve distance of OFFSET = 6 dB.

S-DISP = Ha%Crv, the evaluation result is now thevalue exceeding the curve in %.

S-DISP = Gt is a special case: the value displayed isthe DGS test sensitivity with which the maximum of thespecified curve is at 80 %.

This value serves for the purpose of checking and doc-umenting.



Operation

S-DISP = Ha%, i.e. echo height evaluation as a per-centage.At the same time, the multiple-curve display mode isalso active with a curve distance of OFFSET = 6 dB.

S-DISP = Ha%Crv, the evaluation result is now thevalue exceeding the curve in %.

S-DISP = Gt is a special case: the value displayed isthe DGS test sensitivity with which the maximum of thespecified curve is at 80 %.

This value serves for the purpose of checking and doc-umenting.



Operation

Transfer correction

The transfer correction is activated by means of thefunction T-CORR. The test sensitivity is varied by thisvalue without recalculating the curve.

This means that the test sensitivity is increased by6 dB in the example in order to compensate for a possi-bly existing surface roughness. The echo is conse-quently drawn higher by 6 dB on the left, i.e. evaluatedwith ERS 3.2. Status indicator in the measurement line:a highlighted T.

Sound attenuation

If necessary, the DGS curve can take the component’seffective sound attenuation (ATT-OBJ) into account.With the value set here, the curve shape is recalculat-ed so that the effect of sound attenuation is now takeninto consideration when evaluating reflectors.

The DGS curve now includes the effect of sound at-tenuation. An active sound attenuation correction isindicated in the measurement line by a highlighted A.

The sound attenuation in the reference block can onlybe set prior to recording the reference echo. Therefore,an error message is displayed here if an attempt is



Operation

Transfer correction

The transfer correction is activated by means of thefunction T-CORR. The test sensitivity is varied by thisvalue without recalculating the curve.

This means that the test sensitivity is increased by6 dB in the example in order to compensate for a possi-bly existing surface roughness. The echo is conse-quently drawn higher by 6 dB on the left, i.e. evaluatedwith ERS 3.2. Status indicator in the measurement line:a highlighted T.

Sound attenuation

If necessary, the DGS curve can take the component’seffective sound attenuation (ATT-OBJ) into account.With the value set here, the curve shape is recalculat-ed so that the effect of sound attenuation is now takeninto consideration when evaluating reflectors.

The DGS curve now includes the effect of sound at-tenuation. An active sound attenuation correction isindicated in the measurement line by a highlighted A.

The sound attenuation in the reference block can onlybe set prior to recording the reference echo. Therefore,an error message is displayed here if an attempt is



Operation

made to change the value because, in fact, a validreference echo already exists.

In addition, a different reference reflector type has beenused in the DGS menu below: instead of a backwall, acircular disk (flat-bottom hole) having a diameter of3 mm has been set in this case. In this case, of course,the reference echo has to be received from a 3 mmcircular disk.

After switching on the DGS curve, the reference echomust therefore clearly touch the 3 mm curve.


A side-drilled hole can also be used as a further refer-ence reflector with some limitations. It must have adiameter corresponding to at least 1.5 times the wave-length used, and the distance must be 1.5 times thenear-field length. The USM 35X S will check these con-ditions if you aim to use a side-drilled hole as referencereflector, and will issue an error message if required.

The table on the next page indicates these minimumdata for the existing probes in steel.

Conditions for the use of side-drilled holes as referencereflectors in steel. For other materials, the values mustbe converted accordingly.


Operation

made to change the value because, in fact, a validreference echo already exists.

In addition, a different reference reflector type has beenused in the DGS menu below: instead of a backwall, acircular disk (flat-bottom hole) having a diameter of3 mm has been set in this case. In this case, of course,the reference echo has to be received from a 3 mmcircular disk.

After switching on the DGS curve, the reference echomust therefore clearly touch the 3 mm curve.


A side-drilled hole can also be used as a further refer-ence reflector with some limitations. It must have adiameter corresponding to at least 1.5 times the wave-length used, and the distance must be 1.5 times thenear-field length. The USM 35X S will check these con-ditions if you aim to use a side-drilled hole as referencereflector, and will issue an error message if required.

The table on the next page indicates these minimumdata for the existing probes in steel.

Conditions for the use of side-drilled holes as referencereflectors in steel. For other materials, the values mustbe converted accordingly.


Operation

Probe Wavelength Minimum Diameter Near Field Length Minimum Distancein steel side-drilled hole in steel in steel[mm] [mm] [mm] [mm]

B 1 S 6.0 9.0 23 35

B 2 S 3.0 4.5 45 68

B 4 S 1.5 2.3 90 135

MB 2 S 3.0 4.5 8 12

MB 4 S 1.5 2.3 15 23

MB 5 S 1.2 1.8 20 30

MWB ...-2 1.6 2.4 15 23

MWB ...-4 0.8 1.2 30 45

SWB ...-2 1.6 2.4 39 59

SWB ...-5 0.7 1.1 98 147

WB ...-1 3.3 5.0 45 68

WB ...-2 1.6 2.4 90 135



Operation

Probe Wavelength Minimum Diameter Near Field Length Minimum Distancein steel side-drilled hole in steel in steel[mm] [mm] [mm] [mm]

B 1 S 6.0 9.0 23 35

B 2 S 3.0 4.5 45 68

B 4 S 1.5 2.3 90 135

MB 2 S 3.0 4.5 8 12

MB 4 S 1.5 2.3 15 23

MB 5 S 1.2 1.8 20 30

MWB ...-2 1.6 2.4 15 23

MWB ...-4 0.8 1.2 30 45

SWB ...-2 1.6 2.4 39 59

SWB ...-5 0.7 1.1 98 147

WB ...-1 3.3 5.0 45 68

WB ...-2 1.6 2.4 90 135




Locks, error messages

As long as a valid reference echo is stored, no func-tions can be changed which could cause an incorrectDGS evaluation. If an attempt is made to change sucha function, the corresponding error message will appear,e.g.

“P-DELAY locked by DGS-REF = on”

The DGS evaluation must likewise be switched off andthe reference echo deleted in the case of selecting anew probe, e.g. for a new test application.

Validity of the DGS method

Echo amplitude evaluations according to the DGSmethod are only reliable and reproducible in caseswhen:

• The reference echo is received from the test object ifpossible. If this is not possible, it should be ensuredthat the reference block is made of the same materi-al as the test object.

• The evaluation is carried out using the same probewhich was also used for recording the referenceecho. Another probe of the same type can be usedafter recording a new reference echo.

• Echo amplitudes for reflector distances smaller thanhalf of the probe’s near-field length are subject toheavy variation – for physical reasons due to interfer-ence phenomena effecting the area. Thus, evaluationresults may fluctuate more as the usually permissi-ble ±2 dB. An evaluation according to the DGSmethod is possible but not recommended for thiscases.



Locks, error messages

As long as a valid reference echo is stored, no func-tions can be changed which could cause an incorrectDGS evaluation. If an attempt is made to change sucha function, the corresponding error message will appear,e.g.

“P-DELAY locked by DGS-REF = on”

The DGS evaluation must likewise be switched off andthe reference echo deleted in the case of selecting anew probe, e.g. for a new test application.

Validity of the DGS method

Echo amplitude evaluations according to the DGSmethod are only reliable and reproducible in caseswhen:

• The reference echo is received from the test object ifpossible. If this is not possible, it should be ensuredthat the reference block is made of the same materi-al as the test object.

• The evaluation is carried out using the same probewhich was also used for recording the referenceecho. Another probe of the same type can be usedafter recording a new reference echo.

• Echo amplitudes for reflector distances smaller thanhalf of the probe’s near-field length are subject toheavy variation – for physical reasons due to interfer-ence phenomena effecting the area. Thus, evaluationresults may fluctuate more as the usually permissi-ble ±2 dB. An evaluation according to the DGSmethod is possible but not recommended for thiscases.


Documentation 6


Documentation 6


Documentation Printing data

6.1 Printing data

Direct printing of the following data via the RS 232interface is possible using the USM 35X:

• test report containing the A-scan and the adjustmentdata

• A-scan

• single reading (position 1 of the measurement line)

• function list (including all current settings)

• Data Logger (if the version is available)

To do this, you need

• a printer with serial interface RS 232

• a printer cable (please see chapter 2)

Preparing the printer

The transfer parameter settings for the serial port are:

• Baud rate 0 (no transmission), 300, 600, 1200,2400, 4800, 9600 (default), 19200,38400, and 57600

• Word length 8 data bits (fixed)

• Parity none (fixed)

• Stop bits 2 (fixed)

In order to ensure a perfect communication, set theprinter to the parameters of the USM 35X.

Preparing the USM 35X

You decide on the type of printout by assigning the key.



– Select the function PRINTER, and then use the right-hand rotary knob to select the correct printer driver.


Documentation Printing data

6.1 Printing data

Direct printing of the following data via the RS 232interface is possible using the USM 35X:

• test report containing the A-scan and the adjustmentdata

• A-scan

• single reading (position 1 of the measurement line)

• function list (including all current settings)

• Data Logger (if the version is available)

To do this, you need

• a printer with serial interface RS 232

• a printer cable (please see chapter 2)

Preparing the printer

The transfer parameter settings for the serial port are:

• Baud rate 0 (no transmission), 300, 600, 1200,2400, 4800, 9600 (default), 19200,38400, and 57600

• Word length 8 data bits (fixed)

• Parity none (fixed)

• Stop bits 2 (fixed)

In order to ensure a perfect communication, set theprinter to the parameters of the USM 35X.

Preparing the USM 35X

You decide on the type of printout by assigning the key.



– Select the function PRINTER, and then use the right-hand rotary knob to select the correct printer driver.


DocumentationPrinting data

– Use to select the function COPYMOD, and thenuse the right-hand rotary knob to select the setting:hardcpy, report, meas P5 (enlarged value in A-scan),meas P1 (measured value at position 1), pardump(function list), datalog (Data Logger job includingmeasured values), special (several A-scans on onepage).

H Note:

The setting PCX generates a PCX-format file which youcan transfer to a PC by means of a suitable programcapable of receiving and storing data.

Printing

If you have connected, prepared and activated theprinter, just press the key.

The report is printed out.

If you have selected the setting special, press the key again for each A-scan that you want to print out.


DocumentationPrinting data

– Use to select the function COPYMOD, and thenuse the right-hand rotary knob to select the setting:hardcpy, report, meas P5 (enlarged value in A-scan),meas P1 (measured value at position 1), pardump(function list), datalog (Data Logger job includingmeasured values), special (several A-scans on onepage).

H Note:

The setting PCX generates a PCX-format file which youcan transfer to a PC by means of a suitable programcapable of receiving and storing data.

Printing

If you have connected, prepared and activated theprinter, just press the key.

The report is printed out.

If you have selected the setting special, press the key again for each A-scan that you want to print out.


Documentation

6.2 Documentation with UltraDOC

The special application program UltraDOC from GEInspection Technologies enables you to remote-controlthe USM 35X and to include instrument settings inASCII format or screen contents in PCX or IMG formatin your test report.

All data can be further processed using commericalword processing or DTP programs.

You will receive information about the reliable use of theprogram in a detailed operating manual.

Documentation with UltraDOC


Documentation

6.2 Documentation with UltraDOC

The special application program UltraDOC from GEInspection Technologies enables you to remote-controlthe USM 35X and to include instrument settings inASCII format or screen contents in PCX or IMG formatin your test report.

All data can be further processed using commericalword processing or DTP programs.

You will receive information about the reliable use of theprogram in a detailed operating manual.

Documentation with UltraDOC


Maintenance and care 7


Maintenance and care 7


Maintenance and care Care of the instrument

7.1 Care of the instrument

Clean the instrument and its accessories using a moistcloth. Only use the following recommended instrumentcleaners:

• water,

• a mild household cleaner or

• alcohol (no methyl alcohol).

A Attention:

Do not use any methyl alcohol, solvents, or dye pen-etrant cleaners!The plastic parts can be damaged or embrittled by this.


Maintenance and care Care of the instrument

7.1 Care of the instrument

Clean the instrument and its accessories using a moistcloth. Only use the following recommended instrumentcleaners:

• water,

• a mild household cleaner or

• alcohol (no methyl alcohol).

A Attention:

Do not use any methyl alcohol, solvents, or dye pen-etrant cleaners!The plastic parts can be damaged or embrittled by this.


Maintenance and careCare of the batteries

7.2 Care of the batteries

Care of the batteries

Capacity and life of batteries mainly depend on thecorrect handling. Please therefore observe the tips be-low.

You should charge the batteries in the following cases:

• before the initial startup

• after a storage time of 3 months or longer

• after frequent partial discharge


You can charge the lithium-ion battery either directly inthe instrument or by means of the external batterycharger DR36 (order number 35 297) recommended byus. You always need an external battery charger tocharge standard C-cells. In this regard, please pay at-tention to the information on the operation of the batterycharger.

A Attention:

You should only use the batteries recommended by usand the corresponding battery charger. An improperhandling of the batteries and of the battery charger maycause explosion hazard.

Charging of partially discharged NiCd batteries

If batteries are only partially discharged (less than50 % of operating time), the full capacity is not reachedby normal charging.

– Start by fully discharging the batteries. You can usethe discharging function of the charger for this. Formore details, please read the notes on the operationof the battery charger.

– The batteries are automatically charged after that.

Charging of exhausted NiCd batteries

If batteries are exhausted, e.g. after a prolonged stor-age time in empty state, they often reach their full ca-pacity only after repeated discharge/charge cycles.


Maintenance and careCare of the batteries

7.2 Care of the batteries

Care of the batteries

Capacity and life of batteries mainly depend on thecorrect handling. Please therefore observe the tips be-low.

You should charge the batteries in the following cases:

• before the initial startup

• after a storage time of 3 months or longer

• after frequent partial discharge


You can charge the lithium-ion battery either directly inthe instrument or by means of the external batterycharger DR36 (order number 35 297) recommended byus. You always need an external battery charger tocharge standard C-cells. In this regard, please pay at-tention to the information on the operation of the batterycharger.

A Attention:

You should only use the batteries recommended by usand the corresponding battery charger. An improperhandling of the batteries and of the battery charger maycause explosion hazard.

Charging of partially discharged NiCd batteries

If batteries are only partially discharged (less than50 % of operating time), the full capacity is not reachedby normal charging.

– Start by fully discharging the batteries. You can usethe discharging function of the charger for this. Formore details, please read the notes on the operationof the battery charger.

– The batteries are automatically charged after that.

Charging of exhausted NiCd batteries

If batteries are exhausted, e.g. after a prolonged stor-age time in empty state, they often reach their full ca-pacity only after repeated discharge/charge cycles.


Maintenance and care Care of the batteries

The charger identifies defective batteries. In that case,replace the batteries by a new set. Otherwise there isthe danger that individual cells have different capacitiesso that you will no longer obtain the normal operatingtime with the instrument in battery operation.

How to handle alkaline batteries

– Please remove the batteries from the instrument if ithas not been operated for a longer time.

A Attention:

Leaking batteries may cause severe damages to theinstrument! You should always only use leak-proofbatteries and remove them from the instrument afterturning it off.

H Note:

Used batteries are special waste and have to bedisposed of according to legal requirements!

In the interest of environmental protection, we recom-mend that you only use rechargeable batteries.


Maintenance and care Care of the batteries

The charger identifies defective batteries. In that case,replace the batteries by a new set. Otherwise there isthe danger that individual cells have different capacitiesso that you will no longer obtain the normal operatingtime with the instrument in battery operation.

How to handle alkaline batteries

– Please remove the batteries from the instrument if ithas not been operated for a longer time.

A Attention:

Leaking batteries may cause severe damages to theinstrument! You should always only use leak-proofbatteries and remove them from the instrument afterturning it off.

H Note:

Used batteries are special waste and have to bedisposed of according to legal requirements!

In the interest of environmental protection, we recom-mend that you only use rechargeable batteries.


Maintenance and care

7.3 Maintenance

The USM 35X requires basically no maintenance.

A Attention:

Repair work may only be carried out by members ofauthorized Service staff of GE Inspection Technologies.

Maintenance



7.3 Maintenance

The USM 35X requires basically no maintenance.

A Attention:

Repair work may only be carried out by members ofauthorized Service staff of GE Inspection Technologies.

Maintenance



7.4 Recycling

General view of the device

In the following you find an instrument overview as well as guidelines and notes for recycling and waste disposal ofthe components.

Recycling



7.4 Recycling

General view of the device

In the following you find an instrument overview as well as guidelines and notes for recycling and waste disposal ofthe components.

Recycling



No. Recycling/material code Description

1 Lithium-ion battery Battery inside the battery compartment at the bottom of the instrument. Inorder to open the compartment the quick acting closures have to beactuated.

2 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg)of Mercury (Hg)

3 >PC< / Brass Upper equipment cover Polycarbonat >PC< with pressed in brass threadinsert.

4 Stainless steel Handle complete

5 Aluminium Rotary control button

6 >PC< Holder for handle

7 Stainless steel Ratchet disk

8 >PC< Housing lower part

9 Aluminium Div. mounting brackets

Recycling




1 Lithium-ion battery Battery inside the battery compartment at the bottom of the instrument. Inorder to open the compartment the quick acting closures have to beactuated.

2 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg)of Mercury (Hg)


4 Stainless steel Handle complete

5 Aluminium Rotary control button

6 >PC< Holder for handle

7 Stainless steel Ratchet disk

8 >PC< Housing lower part

9 Aluminium Div. mounting brackets

Recycling



Materials for separate disposal

In the following you find guidelines and notes for removing materials/components, which must be removed andtreated separately.

Recycling



Materials for separate disposal

In the following you find guidelines and notes for removing materials/components, which must be removed andtreated separately.

Recycling




1 In order to remove the LCD-Display the upper housing has to be withdrawnfirst. After loosing 6 screws on the bottom side and one further in battery-compartment, the complete upper housing can be taken away.

2 In order to open the compartment at the bottom of the equipment, the quickacting closures have to be actuated.

3 Lithium-ion battery Inside the battery compartment. Can easily be removed after opening thebattery cover.

4 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg)of Mercury (Hg).

Recycling




1 In order to remove the LCD-Display the upper housing has to be withdrawnfirst. After loosing 6 screws on the bottom side and one further in battery-compartment, the complete upper housing can be taken away.

2 In order to open the compartment at the bottom of the equipment, the quickacting closures have to be actuated.

3 Lithium-ion battery Inside the battery compartment. Can easily be removed after opening thebattery cover.

4 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg)of Mercury (Hg).

Recycling



Further materials and components

In the following you find notes for dismantling materials/components, which can disturb several recycling pro-cesses, and materials/components for which benefits can normally be achieved.

Recycling



Further materials and components

In the following you find notes for dismantling materials/components, which can disturb several recycling pro-cesses, and materials/components for which benefits can normally be achieved.

Recycling





2 Circuit boards Circuit board in lower housing, under it battery-PCB

3 Aluminium Two rotary control buttons

4 Stainless steel Handle, rubber tube can be removed

5 >PC< Lower housing and battery-cover

Recycling





2 Circuit boards Circuit board in lower housing, under it battery-PCB

3 Aluminium Two rotary control buttons

4 Stainless steel Handle, rubber tube can be removed

5 >PC< Lower housing and battery-cover

Recycling



Recycling data of master device

Recycling/material code Weight Descriptionapprox. (kg)

Materials/components, which must be removed and treated separately:

LCD - display 0.22 Fluorescent lamps of the LCD display contain trance amounts(0 – 0.5 mg) of Mercury (Hg)

Lithium-ion battery 0.49 Located inside the battery compartment

subtotal 0.71

Materials/components, which can disturb certain recycling processes:

>PC< / brass 0.16 Upper equipment cover Polycarbonat >PC< with pressed inbrass thread insert.

Circuit boards 0.33 Under LC display unit

subtotal 0.49

Materials/components, through which benefits can normally be achieved:

Stainless steel 0.18 Handle, ratchet disk,

Aluminium 0.15 Rotary control button, mounting sheets, …

>PC< 0.42 Lower housing, holder for handle, battery-cover

Rubber 0.05 O-Rings, rubberbase, rubber tube of handle, keypad sealing

subtotal 0.80

Recycling



Recycling data of master device


Materials/components, which must be removed and treated separately:

LCD - display 0.22 Fluorescent lamps of the LCD display contain trance amounts(0 – 0.5 mg) of Mercury (Hg)

Lithium-ion battery 0.49 Located inside the battery compartment

subtotal 0.71

Materials/components, which can disturb certain recycling processes:

>PC< / brass 0.16 Upper equipment cover Polycarbonat >PC< with pressed inbrass thread insert.

Circuit boards 0.33 Under LC display unit

subtotal 0.49

Materials/components, through which benefits can normally be achieved:

Stainless steel 0.18 Handle, ratchet disk,

Aluminium 0.15 Rotary control button, mounting sheets, …

>PC< 0.42 Lower housing, holder for handle, battery-cover

Rubber 0.05 O-Rings, rubberbase, rubber tube of handle, keypad sealing

subtotal 0.80

Recycling




Composite materials*:

Membrane keypad 0.20 Foil/aluminium/glass/spring steel/stainless steel

subtotal 0.20

Total 2.20

Mounting material, cables, 0.16clamps, screws ...

Total weight (incl. battery) 2.36

Special notes: none

* Materials/components, which cannot be separated into mono materials by destructive mechanical processes

Recycling




Composite materials*:

Membrane keypad 0.20 Foil/aluminium/glass/spring steel/stainless steel

subtotal 0.20

Total 2.20

Mounting material, cables, 0.16clamps, screws ...

Total weight (incl. battery) 2.36

Special notes: none

* Materials/components, which cannot be separated into mono materials by destructive mechanical processes

Recycling


Interfaces and peripherals 8


Interfaces and peripherals 8


Interfaces and Peripherals

8.1 Interfaces

The USM 35X presents different interfaces for the con-nection of external units and for the data exchange. Allinterfaces are located at the instrument front. The fol-lowing figure gives an overview of the position of inter-faces.

Interfaces



8.1 Interfaces

The USM 35X presents different interfaces for the con-nection of external units and for the data exchange. Allinterfaces are located at the instrument front. The fol-lowing figure gives an overview of the position of inter-faces.

Interfaces


Interfaces and PeripheralsInterfaces

1 BNC or LEMO-1-TRIAX socket for the connection ofthe transmitter probe (black ring)

2 BNC or LEMO-1-TRIAX socket for the connection ofthe receiver probe (red ring)

3 RS 232serial interface, 9-way Sub-D socket

4 I/Oanalog interface, 8-way LEMO-1-B socket

5 RGB-OUTVGA interface, 10-way LEMO-1-B socket

6 12V DCMains connection socket, 4-way LEMO-0-B socket


Interfaces and PeripheralsInterfaces

1 BNC or LEMO-1-TRIAX socket for the connection ofthe transmitter probe (black ring)

2 BNC or LEMO-1-TRIAX socket for the connection ofthe receiver probe (red ring)

3 RS 232serial interface, 9-way Sub-D socket

4 I/Oanalog interface, 8-way LEMO-1-B socket

5 RGB-OUTVGA interface, 10-way LEMO-1-B socket

6 12V DCMains connection socket, 4-way LEMO-0-B socket



8.2 I/O interface

The USM 35X has an 8-way I/O interface (LEMO-1-Bsocket) for different input and output signals:

• SAP output (transmitter trigger pulse)

• Alarm output (TTL): switching delay approx. 50 ms,hold time approx. 500 ms.

• TDR input (test data release)

• Analog output

H Note:

You are able to externally process the alarm conditionwith the alarm output, e.g. for sorting and other controlpurposes. Error alarms can be triggered under certaincircumstances. These are caused by intermediate con-ditions in instrument operation occuring when the in-strument is used, i.e. when function parameters arechanged. Possible alarms occuring during instru-ment operation (setting of functions) are to be ig-nored.

I/O interface

View of the 8-way LEMO-1-B socket



8.2 I/O interface

The USM 35X has an 8-way I/O interface (LEMO-1-Bsocket) for different input and output signals:

• SAP output (transmitter trigger pulse)

• Alarm output (TTL): switching delay approx. 50 ms,hold time approx. 500 ms.

• TDR input (test data release)

• Analog output

H Note:

You are able to externally process the alarm conditionwith the alarm output, e.g. for sorting and other controlpurposes. Error alarms can be triggered under certaincircumstances. These are caused by intermediate con-ditions in instrument operation occuring when the in-strument is used, i.e. when function parameters arechanged. Possible alarms occuring during instru-ment operation (setting of functions) are to be ig-nored.

I/O interface

View of the 8-way LEMO-1-B socket



Contact assignment of the LEMO-1-B socketContact Description Signal direction Level Colour (UM 25*)

1 SAP output TTL white

2 alarm A output TTL grey

3 alarm B output TTL yellow

4 unassigned – – pink

5 unassigned – – black

6 TDR input TTL active high blue

7 Analog output, amplitude or time of flight output 0 – 5 V green(selectable via remote-control code, seechapter 8.4 Remote Control)

8 GND ground – brown

*UM 25: analog cable (35 268)

I/O interface



Contact assignment of the LEMO-1-B socketContact Description Signal direction Level Colour (UM 25*)

1 SAP output TTL white

2 alarm A output TTL grey

3 alarm B output TTL yellow

4 unassigned – – pink

5 unassigned – – black

6 TDR input TTL active high blue

7 Analog output, amplitude or time of flight output 0 – 5 V green(selectable via remote-control code, seechapter 8.4 Remote Control)

8 GND ground – brown

*UM 25: analog cable (35 268)

I/O interface



8.3 RS 232 interface

The USM 35X has a RS 232 interface for remote con-trol and documentation (report printout).

Contact assignment of the Sub-D socketContact Designation Signal direction Level

1 unassigned – –

2 RXD input RS 232

3 TXD output RS 232

4 DTR output RS 232

5 ground – RS 232

6 DSR input RS 232

7 RTS output RS 232

8 CTS input RS 232


H Note:

Switch off the instrument before connecting a cable tothe RS 232 socket or before withdrawing any plugs.

RS 232 interface

View of the 9-way Sub-D socket



8.3 RS 232 interface

The USM 35X has a RS 232 interface for remote con-trol and documentation (report printout).

Contact assignment of the Sub-D socketContact Designation Signal direction Level


2 RXD input RS 232

3 TXD output RS 232

4 DTR output RS 232

5 ground – RS 232

6 DSR input RS 232

7 RTS output RS 232

8 CTS input RS 232


H Note:

Switch off the instrument before connecting a cable tothe RS 232 socket or before withdrawing any plugs.

RS 232 interface

View of the 9-way Sub-D socket



8.4 RGB interface

The RGB interface serves for the output of the VGAsignal. You can use this interface to connect theUSM 35X with a monitor or with a VGA projector(beamer). The current display contents are then trans-ferred to the external unit and can be further usedaccordingly.

H Note:

For technical reasons it is unfortunately not possible tomaintain a stable synchronisation of both displays ifthe VGA output is active. The external signal for theconnected monitor or beamer is entirely synchronised.A flickering of the internal display has to be acceptedthough. The internal display will be synchronous assoon as the VGA output has been deactivated.

The interface is a 10-way socket type Lemo-0-B. Thestandard contact assignment makes it suitable for allVGA output units. Use the VGA adapter UM 31 (ordernumber 35 653) in order to connect a VGA output unit.

H Note:

Before you are able to use the RGB interface, youhave to activate the function VGA in the function groupLCD first.

RGB interface



8.4 RGB interface

The RGB interface serves for the output of the VGAsignal. You can use this interface to connect theUSM 35X with a monitor or with a VGA projector(beamer). The current display contents are then trans-ferred to the external unit and can be further usedaccordingly.

H Note:

For technical reasons it is unfortunately not possible tomaintain a stable synchronisation of both displays ifthe VGA output is active. The external signal for theconnected monitor or beamer is entirely synchronised.A flickering of the internal display has to be acceptedthough. The internal display will be synchronous assoon as the VGA output has been deactivated.

The interface is a 10-way socket type Lemo-0-B. Thestandard contact assignment makes it suitable for allVGA output units. Use the VGA adapter UM 31 (ordernumber 35 653) in order to connect a VGA output unit.

H Note:

Before you are able to use the RGB interface, youhave to activate the function VGA in the function groupLCD first.

RGB interface



8.5 Data exchange

The USM 35X is equipped with the serial interfaceRS 232 for bi-directional data communication with a PC.When you connect the instrument with a PC you can:

• remote control the instrument via the PC,

• transfer A-scans for documentation,

• transfer instrument settings in ASCII format,

• transfer reports from stored datasets,

• transfers Datalogger jobs in ASCII format (option)

• read and write datasets in binary format.

Connecting a printer or a PC

You can connect the USM 35X to a printer or a PCusing the special Krautkramer cables:

PC: UD 20 (25-way) or UD 31 (9-way)Printer: UD 31 (Seiko DPU) or UD 32 (Epson)

Please refer to chapter 2.

Activation of serial communication

After connecting the instrument to the PC you mustrun a software that opens the serial port. This can ei-ther be a commercial terminal program (e.g. MicrosoftHyper Terminal) or a customised program likeUltraDOC. Make sure that the serial communicationparameters on the PC are identical to those of theinstrument.

The data transmission parameters are as follows:

Baud rate: 0 (no transmission), 300, 600, 1200,2400, 4800, 9600 (default), 19200,38400, and 57600

Word length: 8 data bits (fixed)Parity: none (fixed)Stop bits: 2 (fixed)

The baud rate can be set in the function BAUD-R inthe menu CFG1 from the third operating level.

The settings on the USM 35X apply to most of theprinters and PCs. To ensure a perfect communication,please check the settings of the connected peripheralsand adjust them to the parameters of the USM 35X.

Data exchange



8.5 Data exchange

The USM 35X is equipped with the serial interfaceRS 232 for bi-directional data communication with a PC.When you connect the instrument with a PC you can:

• remote control the instrument via the PC,

• transfer A-scans for documentation,

• transfer instrument settings in ASCII format,

• transfer reports from stored datasets,

• transfers Datalogger jobs in ASCII format (option)

• read and write datasets in binary format.

Connecting a printer or a PC

You can connect the USM 35X to a printer or a PCusing the special Krautkramer cables:

PC: UD 20 (25-way) or UD 31 (9-way)Printer: UD 31 (Seiko DPU) or UD 32 (Epson)

Please refer to chapter 2.

Activation of serial communication

After connecting the instrument to the PC you mustrun a software that opens the serial port. This can ei-ther be a commercial terminal program (e.g. MicrosoftHyper Terminal) or a customised program likeUltraDOC. Make sure that the serial communicationparameters on the PC are identical to those of theinstrument.

The data transmission parameters are as follows:

Baud rate: 0 (no transmission), 300, 600, 1200,2400, 4800, 9600 (default), 19200,38400, and 57600

Word length: 8 data bits (fixed)Parity: none (fixed)Stop bits: 2 (fixed)

The baud rate can be set in the function BAUD-R inthe menu CFG1 from the third operating level.

The settings on the USM 35X apply to most of theprinters and PCs. To ensure a perfect communication,please check the settings of the connected peripheralsand adjust them to the parameters of the USM 35X.

Data exchange



Printing data

The USM 35X enables a direct printout of data, forexample a report including the echo display and theinstrument settings.

To do this, select the printer driver in the functionPRINTER (function group CFG1) and just press the

key after having initialized and activated the printer.The data selected by you in the function COPYMOD(function group CFG1) are printed.

For more details on this, please refer to chapter 6.

Data exchange

8.6 Remote control

You can use a connected PC for the remote control ofthe USM 35X.

The data transfer is carried out by means of a remotecontrol program and the corresponding remote controlcommands. These commands represent instructionsreferring to the individual functions of the USM 35X.

The program Crosstalk can for example be used asremote control program under DOS. In Windows basedsystems it is possible to use e.g. the Terminal program.

After the remote control program has been started andthe program interface has been configured, the com-mands are input via the keyboard of the computer. Inthis connection, please observe the following differen-tiation:

• Interrogation of a value or state of a USM 35Xfunction using the command structure:

<ESC> <COMMAND> <RETURN>

The USM 35X transmits the value of the current setting.



Printing data

The USM 35X enables a direct printout of data, forexample a report including the echo display and theinstrument settings.

To do this, select the printer driver in the functionPRINTER (function group CFG1) and just press the

key after having initialized and activated the printer.The data selected by you in the function COPYMOD(function group CFG1) are printed.

For more details on this, please refer to chapter 6.

Data exchange

8.6 Remote control

You can use a connected PC for the remote control ofthe USM 35X.

The data transfer is carried out by means of a remotecontrol program and the corresponding remote controlcommands. These commands represent instructionsreferring to the individual functions of the USM 35X.

The program Crosstalk can for example be used asremote control program under DOS. In Windows basedsystems it is possible to use e.g. the Terminal program.

After the remote control program has been started andthe program interface has been configured, the com-mands are input via the keyboard of the computer. Inthis connection, please observe the following differen-tiation:

• Interrogation of a value or state of a USM 35Xfunction using the command structure:

<ESC> <COMMAND> <RETURN>

The USM 35X transmits the value of the current setting.



• Entry of a new value or state of a function using thecommand structure:

<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>

All values are entered or transmitted by the USM 35Xwithout a comma or a point. The resolution of the func-tion should therefore be observed with all values. Theresolution of a function applies to the entire valuerange of that function.

A resolution of 0.01 means:

The USM 35X transmits the value of a function multi-plied by the factor of 100. The entry of a value must bedone multiplied by the factor of 100.

Examples

• Setting of the display delay to 72.39 mm:

<ESC>dd 7239 <RETURN>

• Setting of the display width to 72.3 mm:

<ESC>dw 7230 <RETURN>

Remote control

• Setting of the display width to 192 mm:




Example:

• Setting of the gain to 51.5 dB

<ESC>db 515 <RETURN>

A resolution of 1 means:

The USM 35X transmits the value of a function withoutmultiplication. The entry of a value must be done with-out any multiplication.

Example:

• Setting the response threshold of gate a to 41 %:

<ESC>at 41 <RETURN>



• Entry of a new value or state of a function using thecommand structure:

<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>

All values are entered or transmitted by the USM 35Xwithout a comma or a point. The resolution of the func-tion should therefore be observed with all values. Theresolution of a function applies to the entire valuerange of that function.



Examples

• Setting of the display delay to 72.39 mm:

<ESC>dd 7239 <RETURN>

• Setting of the display width to 72.3 mm:


Remote control

• Setting of the display width to 192 mm:




Example:

• Setting of the gain to 51.5 dB

<ESC>db 515 <RETURN>

A resolution of 1 means:

The USM 35X transmits the value of a function withoutmultiplication. The entry of a value must be done with-out any multiplication.

Example:

• Setting the response threshold of gate a to 41 %:

<ESC>at 41 <RETURN>


Interfaces and PeripheralsRemote control

Syntax and timing

The syntax and timing of the communication with theinstrument is as follows:

With:

ESC = escape (ASCII CHR 27)

* = star (ASCII CHR 42)

AB = remote code of an instrument function

CR = carriage return (ASCII CHR 13)

|_| = Space (ASCII CHR 32)

n Bytes = function value of function AB

ETX = end of text (ASCII CHR 3)

LF = line feed (ASCII CHR 10)



Syntax and timing

The syntax and timing of the communication with theinstrument is as follows:

With:

ESC = escape (ASCII CHR 27)

* = star (ASCII CHR 42)

AB = remote code of an instrument function

CR = carriage return (ASCII CHR 13)

|_| = Space (ASCII CHR 32)

n Bytes = function value of function AB

ETX = end of text (ASCII CHR 3)

LF = line feed (ASCII CHR 10)



Transmission timing

• As soon as the instrument has received the ESCcommand, is will return the * which then will bedisplayed on PC screen.

• Then you key in the wanted remote code accordingto the given table. The instrument echoes yourentries.

• Finally you hit the [CR]-key on your keyboard orsend the CR-command (closing the remotecommand).

• The instrument will now return a blank, then therelated function value which may consist of severalBytes, then the “end of text” character, and finallythe carriage return and the line feed character.

Remote control



Transmission timing

• As soon as the instrument has received the ESCcommand, is will return the * which then will bedisplayed on PC screen.

• Then you key in the wanted remote code accordingto the given table. The instrument echoes yourentries.

• Finally you hit the [CR]-key on your keyboard orsend the CR-command (closing the remotecommand).

• The instrument will now return a blank, then therelated function value which may consist of severalBytes, then the “end of text” character, and finallythe carriage return and the line feed character.

Remote control



Example:

Request RANGE value from the USM 35X

Remote code of the range function is DW (displaywidth). Please note that numerical function values arealways returned as integer values with the given maxi-mum resolution, here DW = 5000 means 50.00 mm.

Example:

Request reading at position 2 in the measurement line

Remote code of measurement position 2 is E2 (evalu-ation 2). E2 = 10.81 means 10.81 mm (here soundpath of the echo in gate A had been displayed). Pleasenote that all readings are shown in that applicabledecimal format where the decimal separator is a dot.



Example:

Request RANGE value from the USM 35X

Remote code of the range function is DW (displaywidth). Please note that numerical function values arealways returned as integer values with the given maxi-mum resolution, here DW = 5000 means 50.00 mm.

Example:

Request reading at position 2 in the measurement line

Remote code of measurement position 2 is E2 (evalu-ation 2). E2 = 10.81 means 10.81 mm (here soundpath of the echo in gate A had been displayed). Pleasenote that all readings are shown in that applicabledecimal format where the decimal separator is a dot.



Changing a function value

Key in [ESC] DW [Space] 2000 [CR] in order to setthe range to 20.00 mm:

Please note that you must key in the function value asan integer with the maximum given resolution, here2000 for the range of 20 mm.

Alphanumerical entries

Key in [ESC] DN [Space] Weld inspection B 45/2[CR] in order to enter the dataset name (DATNAME)“Weld inspection B 45/2”. All alphanumerical entriesmay have a maximum length of 24 characters. In casethe string length exceeds 24 characters, it will auto-matically be cut to 24 characters.

With the other alpahnumerical fields in the TESTINFtable you may easily describe the dataset.

Remote control



Changing a function value

Key in [ESC] DW [Space] 2000 [CR] in order to setthe range to 20.00 mm:

Please note that you must key in the function value asan integer with the maximum given resolution, here2000 for the range of 20 mm.

Alphanumerical entries

Key in [ESC] DN [Space] Weld inspection B 45/2[CR] in order to enter the dataset name (DATNAME)“Weld inspection B 45/2”. All alphanumerical entriesmay have a maximum length of 24 characters. In casethe string length exceeds 24 characters, it will auto-matically be cut to 24 characters.

With the other alpahnumerical fields in the TESTINFtable you may easily describe the dataset.

Remote control



Transfer of datasets

A total of 800 datasets (complete instrument setupincluding A-scan) can be stored in the instrument. Thestored datasets including the actual setting (dataset # 0)can be transferred to the PC in compressed binaryformat for archiving purposes. If required, the datasetsmay be downloaded back to the insturment for re-useor echo comparison. This bi-directional dataset trans-fer is part of the software UltraDOC.

Actual dataset (# 0) from the instrument to the PC:

v1 ... vn describes the software version of the USM, bytesb1 ... bn contain the instrument setting including A-scan.In order to store this information you must write thetransferred bytes v1 ... vn, CR, LF, b1 ... bn into a file.



Transfer of datasets

A total of 800 datasets (complete instrument setupincluding A-scan) can be stored in the instrument. Thestored datasets including the actual setting (dataset # 0)can be transferred to the PC in compressed binaryformat for archiving purposes. If required, the datasetsmay be downloaded back to the insturment for re-useor echo comparison. This bi-directional dataset trans-fer is part of the software UltraDOC.

Actual dataset (# 0) from the instrument to the PC:

v1 ... vn describes the software version of the USM, bytesb1 ... bn contain the instrument setting including A-scan.In order to store this information you must write thetransferred bytes v1 ... vn, CR, LF, b1 ... bn into a file.



Dataset file from the PC to the instrument’s dataset#1:

*)at this time the instruments waits for the reception ofthe bytes v

1 ... v

n CR LF b

1 ... b

n. The instrument now

checks whether received dataset is compatible withthe current software version of the instrument, andwhether the dataset is valid (correct checksum).

Remote control



Dataset file from the PC to the instrument’s dataset#1:

*)at this time the instruments waits for the reception ofthe bytes v

1 ... v

n CR LF b

1 ... b

n. The instrument now

checks whether received dataset is compatible withthe current software version of the instrument, andwhether the dataset is valid (correct checksum).

Remote control



Functions and remote control codes

Presettings are in bold-face type. You will find a briefdescription of all functions in chapter 9.1 Functiondirectory.

If not otherwise stated, all values refer to steel,C = 5920 m/s.

The functions marked with * are only available in theUSM 35X DAC and USM 35X S (DAC evaluation), thefunctions marked with ** are only available in theUSM 35X S (DGS evaluation).

Functions which are only availabe in connection withthe Data Logger option are marked with *** (pleasealso refer to the section Remote control in chapterOption Data Logger on this subject).

Read only functions are marked with R.

Remote control

Function Code Range/Default Resolution

aLOGIC AM 0 = off 11 = pos2 = neg

AMPLCOR** AC -25 to +25 dB / 0 0.1

ANAMODE AQ 0 = 0 volt1 = 5 volts

ANGLE PA 0 - 90 / 0 0.1

A-SCAN AS 0 = stndard 11 = compare2 = envelop3 = peak b4 = afreeze5 = bfreeze6 = cfreeze***

aSTART AD 0 - 9999 mm / 35 0.010 - 250" / 1.500 0.001

aTHRSH AT 10 - 90 % / 40 1-90 - -10 % additionally with rf

ATTENR BC 0 - 1101 dB 0.1



Functions and remote control codes

Presettings are in bold-face type. You will find a briefdescription of all functions in chapter 9.1 Functiondirectory.

If not otherwise stated, all values refer to steel,C = 5920 m/s.

The functions marked with * are only available in theUSM 35X DAC and USM 35X S (DAC evaluation), thefunctions marked with ** are only available in theUSM 35X S (DGS evaluation).

Functions which are only availabe in connection withthe Data Logger option are marked with *** (pleasealso refer to the section Remote control in chapterOption Data Logger on this subject).

Read only functions are marked with R.

Remote control


aLOGIC AM 0 = off 11 = pos2 = neg

AMPLCOR** AC -25 to +25 dB / 0 0.1

ANAMODE AQ 0 = 0 volt1 = 5 volts

ANGLE PA 0 - 90 / 0 0.1

A-SCAN AS 0 = stndard 11 = compare2 = envelop3 = peak b4 = afreeze5 = bfreeze6 = cfreeze***

aSTART AD 0 - 9999 mm / 35 0.010 - 250" / 1.500 0.001

aTHRSH AT 10 - 90 % / 40 1-90 - -10 % additionally with rf

ATTENR BC 0 - 1101 dB 0.1




ATT-OBJ** AO 0 - 100 dB/m / 0 0.1

ATT-REF** AR 0 - 100 dB/m / 0 0.1

aWIDTH AW 0.1 - 9999 mm / 40 0.010.004 - 250" / 1.500 0.001

BAUD-R BR 0 = 01= 3002 = 6003 = 12004 = 24005 = 48006 = 96007 = 192008 = 384009 = 57600

bLOGIC 2L 0 = off 11 = pos2 = neg3 = a trig


BOLDLI DV 0 = off1 = L2 = M3 = H4 = U5 = T6 = a

bSTART 2D 0 - 9999 mm / 85 0.010 - 250" / 3.500 0.001

bTHRSH 2T 10 - 90 % / 30 1-90 - -10 % additionally with rf

bWIDTH 2W 0.1 - 9999 mm / 40 0.010.004 - 250" / 1.500 0.001

CAL CA read only

COLOR CH 0 = off1 = 12 = 2

COMMENT CO alphanumerical input

Remote control




ATT-OBJ** AO 0 - 100 dB/m / 0 0.1

ATT-REF** AR 0 - 100 dB/m / 0 0.1

aWIDTH AW 0.1 - 9999 mm / 40 0.010.004 - 250" / 1.500 0.001

BAUD-R BR 0 = 01= 3002 = 6003 = 12004 = 24005 = 48006 = 96007 = 192008 = 384009 = 57600

bLOGIC 2L 0 = off 11 = pos2 = neg3 = a trig


BOLDLI DV 0 = off1 = L2 = M3 = H4 = U5 = T6 = a

bSTART 2D 0 - 9999 mm / 85 0.010 - 250" / 3.500 0.001

bTHRSH 2T 10 - 90 % / 30 1-90 - -10 % additionally with rf

bWIDTH 2W 0.1 - 9999 mm / 40 0.010.004 - 250" / 1.500 0.001

CAL CA read only

COLOR CH 0 = off1 = 12 = 2

COMMENT CO alphanumerical input

Remote control




COPYMOD CM 0 = hardcpy 11 = report2 = meas P13 = pardump4 = PCX5 = store6 = datalog***7 = off8 = special

DACECHO* TE 0 - 10 / 0 1

DACMOD* TM 0 = off 11 = DAC2 = TCG

DAMPING PG 0 = low 11 = high

DATE DE numerical inpute.g. 26-01-99

DATNAME DN alphanumerical input

DBSTEP ST 6.5 ... 20 dB 0.1


D eff** XD 3 - 35 mm / 9.7 0.010.120 - 1.400" / 0.380 0.001(only for probe-# 0)

D-DELAY DD -10 - 1024 mm / 0 0.01-0.3 - 40" / 0 0.001

DELALL EX 0 = off1 = on

DELETE EA 0 = off 11 = on

DEL-VEL** VV 1000 - 15000 m/s / 2730 1(only for probe-# 0)

DGS-CRV** DU 0.5 - 35 mm / 3.0 0.010.02 - 1.400 / 0.1 0.001

DGSMENU T5 0 = off1 = on

DGSMOD** DS 0 = off 11 = on

DGS-REF** DR 0 = off 11 = on

Remote control




COPYMOD CM 0 = hardcpy 11 = report2 = meas P13 = pardump4 = PCX5 = store6 = datalog***7 = off8 = special

DACECHO* TE 0 - 10 / 0 1

DACMOD* TM 0 = off 11 = DAC2 = TCG

DAMPING PG 0 = low 11 = high

DATE DE numerical inpute.g. 26-01-99

DATNAME DN alphanumerical input

DBSTEP ST 6.5 ... 20 dB 0.1


D eff** XD 3 - 35 mm / 9.7 0.010.120 - 1.400" / 0.380 0.001(only for probe-# 0)

D-DELAY DD -10 - 1024 mm / 0 0.01-0.3 - 40" / 0 0.001

DELALL EX 0 = off1 = on

DELETE EA 0 = off 11 = on

DEL-VEL** VV 1000 - 15000 m/s / 2730 1(only for probe-# 0)

DGS-CRV** DU 0.5 - 35 mm / 3.0 0.010.02 - 1.400 / 0.1 0.001

DGSMENU T5 0 = off1 = on

DGSMOD** DS 0 = off 11 = on

DGS-REF** DR 0 = off 11 = on

Remote control




DIALOG DG 0 = German 11 = English2 = French3 = Italian4 = Spanish5 = Portuguese6 = Dutch7 = Swedish8 = Slovenian9 = Romanian10 = Finnish11 = Czech12 = Danish13 = Hungarian14 = Croatian15 = Russian16 = Slovakian17 = Norwegian18 = Polish19 = Japanese

DIAMET OD 10 - 2000 mm / 0.4 - 800" 0.1 / 0.01800.01" = flat

DIR T3 0 = off1 = on


DUAL DM 0 = off 11 = on

EVAMOD EM 0 = DAC 11 = DGS2 = REF5 = JISDAC

FILLED FI 0 = off 11 = on

FINE G FG –10 - +30 / 0 1

FLAWIND FB alphanumerical input

FLAWLEN FL 0 - 999 mm / 0 0.010 - 40" / 0 0.001

FREQU FR 0 = 0.5 - 4 MHz 11 = 2 - 20 MHz2 = 0.8 - 8 MHz3 = 0.2 - 1 MHz

GAIN DB 0 - 110 dB / 30 0.1

HORN HO 0 = off 11 = on

Remote control




DIALOG DG 0 = German 11 = English2 = French3 = Italian4 = Spanish5 = Portuguese6 = Dutch7 = Swedish8 = Slovenian9 = Romanian10 = Finnish11 = Czech12 = Danish13 = Hungarian14 = Croatian15 = Russian16 = Slovakian17 = Norwegian18 = Polish19 = Japanese

DIAMET OD 10 - 2000 mm / 0.4 - 800" 0.1 / 0.01800.01" = flat

DIR T3 0 = off1 = on


DUAL DM 0 = off 11 = on

EVAMOD EM 0 = DAC 11 = DGS2 = REF5 = JISDAC

FILLED FI 0 = off 11 = on

FINE G FG –10 - +30 / 0 1

FLAWIND FB alphanumerical input

FLAWLEN FL 0 - 999 mm / 0 0.010 - 40" / 0 0.001

FREQU FR 0 = 0.5 - 4 MHz 11 = 2 - 20 MHz2 = 0.8 - 8 MHz3 = 0.2 - 1 MHz

GAIN DB 0 - 110 dB / 30 0.1

HORN HO 0 = off 11 = on

Remote control




INDICAR BA -1101 - 1101 dB 0.1

LIGHT LT 0 = off 11 = on

MAGNIFY MA 0 = off 11 = aGAT2 = bGAT

MEAS-P1 M1 Setting range see S-DISP 1MEAS-P2 M2MEAS-P3 M3MEAS-P4 M4

MTLVEL SV 1000 - 15000 m/s / 5920 140 - 600 "/ms / 233 0.1

OBJECT OB alphanumerical input

OFFSET* TO 0 - 14 dB / 0 0.5

OPERAT PE alphanumerical input

P-DELAY PD 0 - 199.99 µs / 0 0.01

POWER PI 0 = low 11 = high

Remote control


PRBFREQ** XF 0.5 - 10.0 MHz 0.04

PRBNAME** PN alphanumerical input

PREVIEW T2 0 = off1 = on

PRF-MOD PF 10 steps:0 = step 1 11 = step 22 = step 33 = step 44 = step 55 = step 66 = step 77 = step 88 = step 99 = step 10

PRINTER PR 0 = Epson 11 = HP Laserjet2 = HP Deskjet3 = DPU-41x4 = HP Laserjet 1200 series5 = HP Deskjet 1200 series




INDICAR BA -1101 - 1101 dB 0.1

LIGHT LT 0 = off 11 = on

MAGNIFY MA 0 = off 11 = aGAT2 = bGAT

MEAS-P1 M1 Setting range see S-DISP 1MEAS-P2 M2MEAS-P3 M3MEAS-P4 M4

MTLVEL SV 1000 - 15000 m/s / 5920 140 - 600 "/ms / 233 0.1

OBJECT OB alphanumerical input

OFFSET* TO 0 - 14 dB / 0 0.5

OPERAT PE alphanumerical input

P-DELAY PD 0 - 199.99 µs / 0 0.01

POWER PI 0 = low 11 = high

Remote control


PRBFREQ** XF 0.5 - 10.0 MHz 0.04

PRBNAME** PN alphanumerical input

PREVIEW T2 0 = off1 = on

PRF-MOD PF 10 steps:0 = step 1 11 = step 22 = step 33 = step 44 = step 55 = step 66 = step 77 = step 88 = step 99 = step 10

PRINTER PR 0 = Epson 11 = HP Laserjet2 = HP Deskjet3 = DPU-41x4 = HP Laserjet 1200 series5 = HP Deskjet 1200 series




PROBE-#** PB 0 = variable / alphanumerical input1 = B1-S 13 = SWB45-22 = B2-S 14 = SWB60-23 = B4-s 15 = SWB70-24 = MB2-S 16 = SWB45-55 = MB4-S 17 = SWB60-56 = MB5-S 18 = SWB70-57 = MWB45-2 19 = WB45-18 = MWB60-2 20 = WB60-19 = MWB70-2 21 = WB70-110 = MWB45-4 22 = WB45-211 = MWB60-4 23 = WB60-212 = MWB70-4 24 = WB70-2

RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz:0.5 - 9999 mm / 250 0.010.02 - 390" / 10 0.001

2 - 20 / 0.8 - 8 MHz:0.5 - 1420 mm / 250 0.010.02 - 56" / 10 0.001

RATINGR BD -1101 - 1101 db 0.1

RECALL RD 0 = off 11 = on


RECTIFY RF 0 = full-w 11= pos hw2 = neg hw3 = rf

REFECHO RC 0 = no ref.1 = ref. stored

REFECHO** RE 0 = BW 11 = SDH2 = FDH

REFMODE RO 0 = off1 = on

REFRNCER BB 0 - 1101 dB 0.1

REFSIZE** RS 0.5 - 10 mm / 3 0.01

REJECT RJ 0 - 80 % / 0 1

SCALE SE 0 = measval1 = snd-pth.2 = div.

Remote control




PROBE-#** PB 0 = variable / alphanumerical input1 = B1-S 13 = SWB45-22 = B2-S 14 = SWB60-23 = B4-s 15 = SWB70-24 = MB2-S 16 = SWB45-55 = MB4-S 17 = SWB60-56 = MB5-S 18 = SWB70-57 = MWB45-2 19 = WB45-18 = MWB60-2 20 = WB60-19 = MWB70-2 21 = WB70-110 = MWB45-4 22 = WB45-211 = MWB60-4 23 = WB60-212 = MWB70-4 24 = WB70-2

RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz:0.5 - 9999 mm / 250 0.010.02 - 390" / 10 0.001

2 - 20 / 0.8 - 8 MHz:0.5 - 1420 mm / 250 0.010.02 - 56" / 10 0.001

RATINGR BD -1101 - 1101 db 0.1

RECALL RD 0 = off 11 = on


RECTIFY RF 0 = full-w 11= pos hw2 = neg hw3 = rf

REFECHO RC 0 = no ref.1 = ref. stored

REFECHO** RE 0 = BW 11 = SDH2 = FDH

REFMODE RO 0 = off1 = on

REFRNCER BB 0 - 1101 dB 0.1

REFSIZE** RS 0.5 - 10 mm / 3 0.01

REJECT RJ 0 - 80 % / 0 1

SCALE SE 0 = measval1 = snd-pth.2 = div.

Remote control




SCHEME CS 0 = green/black1 = orange/black2 = black/white3 = black/yellow

S-DISP VS 0=off 1=Sa 12=Sb 3=Sc***4=Sc-a*** 5=Sc-b***6=Sb-a*** 7=Ha %8=Hb % 9=Hc %***10=Ha dB 11=Hb dB12=Hc dB*** 13=R-start14=R-end 15=Da16=Db 17=Dc***18=Pa 19=Pb20=Pc*** 21=Ra22=Rb 23=Rc***24=ERS 25=Gt dB26=Ha %crv 27=Hb %crv28=Hc %crv*** 29=Alarm30=DGS-Crv 31=freeJob***32=freeLoc*** 33=freeAsc***34=freeLoJ 35=lastLoc36=La 37=Lb38=Lc 39=Gatewid40=Defdpth 41=class42=DAC dB 43=LOC-#44=Gr dB


SETTING T4 0 = off1 = on

SET-# ND 1 - 800 / 1 1

S-REF1 R1 0 - 5000 mm / 50 0.010 - 200" / 2.0 0.001

S-REF2 R2 0 - 5000 mm / 100 0.010 - 200" / 4.0 0.001

STO-INF SC 0 = off 11 = on

STORE SD 0 = off 11 = on

SURFACE SU alphanumerical input

T-CORR * DC -24 - +24 dB / 0 0.5

TESTINF T1 0 = off1 = on

THICKNE TH 1 - 9999 mm / 25 0.010.05 - 400" / 1 0.001

Remote control




SCHEME CS 0 = green/black1 = orange/black2 = black/white3 = black/yellow

S-DISP VS 0=off 1=Sa 12=Sb 3=Sc***4=Sc-a*** 5=Sc-b***6=Sb-a*** 7=Ha %8=Hb % 9=Hc %***10=Ha dB 11=Hb dB12=Hc dB*** 13=R-start14=R-end 15=Da16=Db 17=Dc***18=Pa 19=Pb20=Pc*** 21=Ra22=Rb 23=Rc***24=ERS 25=Gt dB26=Ha %crv 27=Hb %crv28=Hc %crv*** 29=Alarm30=DGS-Crv 31=freeJob***32=freeLoc*** 33=freeAsc***34=freeLoJ 35=lastLoc36=La 37=Lb38=Lc 39=Gatewid40=Defdpth 41=class42=DAC dB 43=LOC-#44=Gr dB


SETTING T4 0 = off1 = on

SET-# ND 1 - 800 / 1 1

S-REF1 R1 0 - 5000 mm / 50 0.010 - 200" / 2.0 0.001

S-REF2 R2 0 - 5000 mm / 100 0.010 - 200" / 4.0 0.001

STO-INF SC 0 = off 11 = on

STORE SD 0 = off 11 = on

SURFACE SU alphanumerical input

T-CORR * DC -24 - +24 dB / 0 0.5

TESTINF T1 0 = off1 = on

THICKNE TH 1 - 9999 mm / 25 0.010.05 - 400" / 1 0.001

Remote control




TIME TI numerical input, e.g. 12:30:00

TOF AF 0 = flank 11 = peak2 = jflank

UNIT UN 0 = mm 11 = inch

VGA VG 0 = off1 = on

X-POS XP 0 - 999 mm / 0 0.010 - 40" / 0 0.001

X-VALUE XV 0 - 100 mm / 0 0.010 - 40" / 0 0.001

Y-POS YP 0 - 999 mm / 0 0.010 - 40" / 0 0.001

Other remote control codesCode Function/description

< Select the next left sided menu

> Select the next right sided menu

AG dB-Difference from the reference gain (ref. echoat 80 %) to the registration gain (maximum ofselected DGS curve at 80 %), read only

AP Analog output setting0 = amplitude1 = time of flight

DA A-scan amplitudes transferred as binary data

DV Send the DAC points in tics and dB, DAC, read only

E1 Read value form measurement line (position 1)E2 Read value form measurement line (position 2)E3 Read value form measurement line (position 3)E4 Read value form measurement line (position 4)E5 Read value displayed in the A-scan

EL Send the contents of the LCD as binary datastream, read only

Remote control




TIME TI numerical input, e.g. 12:30:00

TOF AF 0 = flank 11 = peak2 = jflank

UNIT UN 0 = mm 11 = inch

VGA VG 0 = off1 = on

X-POS XP 0 - 999 mm / 0 0.010 - 40" / 0 0.001

X-VALUE XV 0 - 100 mm / 0 0.010 - 40" / 0 0.001

Y-POS YP 0 - 999 mm / 0 0.010 - 40" / 0 0.001

Other remote control codesCode Function/description

< Select the next left sided menu

> Select the next right sided menu

AG dB-Difference from the reference gain (ref. echoat 80 %) to the registration gain (maximum ofselected DGS curve at 80 %), read only

AP Analog output setting0 = amplitude1 = time of flight

DA A-scan amplitudes transferred as binary data

DV Send the DAC points in tics and dB, DAC, read only

E1 Read value form measurement line (position 1)E2 Read value form measurement line (position 2)E3 Read value form measurement line (position 3)E4 Read value form measurement line (position 4)E5 Read value displayed in the A-scan

EL Send the contents of the LCD as binary datastream, read only

Remote control



Code Function/description

EV Read alarm LED status:0 = no alarm1 = alarm in A2 = alarm in B3 = alarm in A+B

HD Editable header data from report transferred asASCII-format data

I1 Set information line in the startup screenI2 Set information line in the startup screen

(up to 39 characters)

ID Read instrument software version

RG Reference gain (reference echo at 80 %), read only

SL “Scroll home”: selection of the first function in everyfunction group and of the left function group in everyfunction group line.

TF Freeze on/off:0 = off1 = on


TZ Zoom on/off:0 = off1 = on

UD Send data set as binary data

UR Read data set as binary data

Remote control




EV Read alarm LED status:0 = no alarm1 = alarm in A2 = alarm in B3 = alarm in A+B

HD Editable header data from report transferred asASCII-format data

I1 Set information line in the startup screenI2 Set information line in the startup screen

(up to 39 characters)

ID Read instrument software version

RG Reference gain (reference echo at 80 %), read only

SL “Scroll home”: selection of the first function in everyfunction group and of the left function group in everyfunction group line.

TF Freeze on/off:0 = off1 = on


TZ Zoom on/off:0 = off1 = on

UD Send data set as binary data

UR Read data set as binary data

Remote control



Control codes for the rotary knobs/function keysFunction Key Code Range

Left-hand G+ incrementrotary knob/ G- decrementgain

Right-hand K+ incrementrotary knob K- decrement

dB-STEP P 0 = 0.01 = 0.52 = 1.03 = 2.04 = 6.05 = 6.5 – 20

FREEZE F off / on

ZOOM Z off / on

COPY C off / on

Function Key Code Range

ENTER R off / on

level 10 1st/2nd operation level

Remote control



Control codes for the rotary knobs/function keysFunction Key Code Range

Left-hand G+ incrementrotary knob/ G- decrementgain

Right-hand K+ incrementrotary knob K- decrement

dB-STEP P 0 = 0.01 = 0.52 = 1.03 = 2.04 = 6.05 = 6.5 – 20

FREEZE F off / on

ZOOM Z off / on

COPY C off / on

Function Key Code Range

ENTER R off / on

level 10 1st/2nd operation level

Remote control



Function Key Code

BASE 5

PULS 6

RECV 7

aGAT 8

bGAT 9

CAL 5

REF/DAC/ 6DGS/JDAC

TRIG 7

MEM 8

DATA 9

Function Key Code

MEAS 5

MSEL 6

LCD 7

CFG1 8

CFG2 9

Function Key Code

first 1

second 2

third 3

fourth 4

Remote control



Function Key Code

BASE 5

PULS 6

RECV 7

aGAT 8

bGAT 9

CAL 5

REF/DAC/ 6DGS/JDAC

TRIG 7

MEM 8

DATA 9

Function Key Code

MEAS 5

MSEL 6

LCD 7

CFG1 8

CFG2 9

Function Key Code

first 1

second 2

third 3

fourth 4

Remote control



A Attention:

In rare cases concerning remote control sequences,reading measurement values directly after changing afunction value in the USM 35X, there could be errors aslong as the instrument has not ended setting the value.In such cases, additional commands must be insertedinto the remote control sequence before the measure-ment values are read.

Example:

If you create a remote control sequence, by which thesound path of an echo is read after freezing the A-scan, the command chain would be as follows:

Command Answer Description

<ESC>F<RETURN> “A-scan freeze”<ESC>E3<RETURN> 50,74 “Read sound path”<ESC>F<RETURN> “Disable A-scan freeze”...

In the interests of security, insert additional read com-mands before reading the sound path, e.g.:


...<ESC>F<RETURN> “A-scan freeze”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>E3<RETURN> 50,74 “Read sound path”<ESC>F<RETURN> “Disable A-scan freeze”...

With these measures you ensure that sufficient timehas passed in order to completely execute the previ-ous command (display freeze) before transferring thesound path. Finally, check your remote control se-quence to see that the measurement values can becorrectly read, and add further read commands if nec-essary.

Remote control



A Attention:

In rare cases concerning remote control sequences,reading measurement values directly after changing afunction value in the USM 35X, there could be errors aslong as the instrument has not ended setting the value.In such cases, additional commands must be insertedinto the remote control sequence before the measure-ment values are read.

Example:

If you create a remote control sequence, by which thesound path of an echo is read after freezing the A-scan, the command chain would be as follows:


<ESC>F<RETURN> “A-scan freeze”<ESC>E3<RETURN> 50,74 “Read sound path”<ESC>F<RETURN> “Disable A-scan freeze”...

In the interests of security, insert additional read com-mands before reading the sound path, e.g.:


...<ESC>F<RETURN> “A-scan freeze”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>DB<RETURN> 580 “Read dB setting”<ESC>E3<RETURN> 50,74 “Read sound path”<ESC>F<RETURN> “Disable A-scan freeze”...

With these measures you ensure that sufficient timehas passed in order to completely execute the previ-ous command (display freeze) before transferring thesound path. Finally, check your remote control se-quence to see that the measurement values can becorrectly read, and add further read commands if nec-essary.

Remote control


Appendix 9


Appendix 9


Appendix Function directory

9.1 Function directory

The functions marked with * are only available on theUSM 35X DAC / USM 35X S (DAC evaluation mode),those market with ** are exclusively available on theUSM 35X S (DGS evaluation mode).

Function Function group Description

aLOGIC aGAT Evaluation logic of the gate A

AMPLCOR** DGS Amplitude correction

ANAMOD CFG2 Setting of the analog output

ANGLE TRIG Entry of the angle for calculatingthe (reduced) projectiondistance (angle-beam probes)

A-SCAN MEAS Settings of the A-scan

aSTART aGAT Starting point of the gate A

aTHRSH aGAT Threshold of the gate A

ATTEN DGS Sound attenuation in the testpiece


ATT-REF** DGS Sound attenuation in thereference block

ATT-OBJ** DGS Sound attenuation in thetest object

aWIDTH aGAT Width of the gate A

BAUD-R CFG1 Baud rate for serial porttransmission

bLOGIC bGAT Evaluation logic in the gate B

BOLDLI JDAC Selection and emphasizing ofregistration curve

bSTART bGAT Starting point of the gate B

bTHRSH bGAT Starting point of the gate B

bWIDTH bGAT Width of the gate B

CAL CAL Semiautomatic calibration

COLOR TRIG Marking of legs

COMMENT DATA Comment



9.1 Function directory

The functions marked with * are only available on theUSM 35X DAC / USM 35X S (DAC evaluation mode),those market with ** are exclusively available on theUSM 35X S (DGS evaluation mode).


aLOGIC aGAT Evaluation logic of the gate A

AMPLCOR** DGS Amplitude correction

ANAMOD CFG2 Setting of the analog output

ANGLE TRIG Entry of the angle for calculatingthe (reduced) projectiondistance (angle-beam probes)

A-SCAN MEAS Settings of the A-scan

aSTART aGAT Starting point of the gate A

aTHRSH aGAT Threshold of the gate A

ATTEN DGS Sound attenuation in the testpiece


ATT-REF** DGS Sound attenuation in thereference block

ATT-OBJ** DGS Sound attenuation in thetest object

aWIDTH aGAT Width of the gate A

BAUD-R CFG1 Baud rate for serial porttransmission

bLOGIC bGAT Evaluation logic in the gate B

BOLDLI JDAC Selection and emphasizing ofregistration curve

bSTART bGAT Starting point of the gate B

bTHRSH bGAT Starting point of the gate B

bWIDTH bGAT Width of the gate B

CAL CAL Semiautomatic calibration

COLOR TRIG Marking of legs

COMMENT DATA Comment


AppendixFunction directory


COPYMOD CFG1 Assignment of the key

DACECHO* DAC/JDAC Recording of a reference echofor the DAC

DACMODE* DAC/JDAC Activating/Deactivating the DAC

DAMPING PULS Damping of the probe’soscillating circuit

DATE CFG2 Current date

dBSTEP RECV User-programmable gain step

D-DELAY BASE Setting of the display start

D eff** DGS Effective element diameter ofthe probe used

DELALL MEM Deleting all stored data sets

DELETE MEM Deleting a stored data set

DEL-VEL** DGS Material velocity for probe delay


DGS-CRV** DGS Recording curve for DGSevaluation mode

DGSMENU** DGS Activating/Deactivating the DGSmenu table for selecting theprobe and further DGS settings

DGSMODE** DGS Activating/Deactivating DGSevaluation mode

DGS-REF** DGS Recording of DGS referenceecho

DIALOG CFG1 Selecting the language

DIAMET TRIG Change between plane-paralleland circular curved testcomponents

DIR DATA Dataset directory

DUAL PULS Separation of pulser andreceiver

EVAMOD CFG2 Switchover REF – DAC – DGS– JDAC




COPYMOD CFG1 Assignment of the key

DACECHO* DAC/JDAC Recording of a reference echofor the DAC

DACMODE* DAC/JDAC Activating/Deactivating the DAC

DAMPING PULS Damping of the probe’soscillating circuit

DATE CFG2 Current date

dBSTEP RECV User-programmable gain step

D-DELAY BASE Setting of the display start

D eff** DGS Effective element diameter ofthe probe used

DELALL MEM Deleting all stored data sets

DELETE MEM Deleting a stored data set

DEL-VEL** DGS Material velocity for probe delay


DGS-CRV** DGS Recording curve for DGSevaluation mode

DGSMENU** DGS Activating/Deactivating the DGSmenu table for selecting theprobe and further DGS settings

DGSMODE** DGS Activating/Deactivating DGSevaluation mode

DGS-REF** DGS Recording of DGS referenceecho

DIALOG CFG1 Selecting the language

DIAMET TRIG Change between plane-paralleland circular curved testcomponents

DIR DATA Dataset directory

DUAL PULS Separation of pulser andreceiver

EVAMOD CFG2 Switchover REF – DAC – DGS– JDAC




FILLED LCD Selecting the echo display mode(filled or normal)

FINE G RECV Fine adjustment of gain within arange of approx. 4 dB in 40 steps

FLAWLEN DATA Flawlength

FREQU RECV Selecting the frequency rangefor the connected probe

GAIN left-hand Setting of the gainrotary knob

HORN CFG2 Switching the acoustic alarmsignal on/off

INDICA AWS Flaw gain in dBfor AWS evaluation

LIGHT LCD Choice of lightning forthe display

MAGNIFY MEAS Gate spreading


MEAS-P1 MSEL Selection of measured valuesMEAS-P2 at four positions of theMEAS-P3 measurment lineMEAS-P4

MTLVEL BASE Setting of the material soundvelocity

OBJECT DATA Object description

OFFSET* DAC/JDAC Offset for multiple DAC

OPERAT DATA Name of the operator

P-DELAY BASE Compensating for the probedelay line

POWER PULS Setting the power of the initialpulse

PRBFREQ** DGS Probe frequency

PRBNAME** DGS Probe name

PREVIEW DATA Dataset preview with A-scan




FILLED LCD Selecting the echo display mode(filled or normal)

FINE G RECV Fine adjustment of gain within arange of approx. 4 dB in 40 steps

FLAWLEN DATA Flawlength

FREQU RECV Selecting the frequency rangefor the connected probe

GAIN left-hand Setting of the gainrotary knob

HORN CFG2 Switching the acoustic alarmsignal on/off

INDICA AWS Flaw gain in dBfor AWS evaluation

LIGHT LCD Choice of lightning forthe display

MAGNIFY MEAS Gate spreading


MEAS-P1 MSEL Selection of measured valuesMEAS-P2 at four positions of theMEAS-P3 measurment lineMEAS-P4

MTLVEL BASE Setting of the material soundvelocity

OBJECT DATA Object description

OFFSET* DAC/JDAC Offset for multiple DAC

OPERAT DATA Name of the operator

P-DELAY BASE Compensating for the probedelay line

POWER PULS Setting the power of the initialpulse

PRBFREQ** DGS Probe frequency

PRBNAME** DGS Probe name

PREVIEW DATA Dataset preview with A-scan




PRF-MOD PULS Setting the pulse repetitionfrequency

PROBE-#** DGS Probe number

PRINTER CFG1 Selecting the printer for the testreport

RANGE BASE Setting of the range in which themeasurement is made.

RATING AWS Flaw rating as dB value

RECALL MEM Retrieving a stored data set

RECTIFY RECV Selection of rectification

REFECHO REF For storing a reference echofor the measurement ofdB difference

REFECHO** DGS Type of the reference reflextorused

REFMOD REF Activation of echo comparison


REFRNCE AWS Reference gain in dBfor AWS evaluation

REFSIZE** DGS Size of the reference reflector

REJECT RECV Suppression of unwanted orspurious echo indications

SCALE LCD Choice of display modefor the measurement line

SCHEME LCD Choice of a color scheme forthe screen display

S-DISP MEAS Zoomed display of a selectedparameter

SET-# MEM Number of the data set

SETTING DATA Display of a function list

S-REF1 CAL Reference echo 1 for calibrationS-REF2 Reference echo 2 for calibration

STO-INF DATA Saving the current additionalinformation




PRF-MOD PULS Setting the pulse repetitionfrequency

PROBE-#** DGS Probe number

PRINTER CFG1 Selecting the printer for the testreport

RANGE BASE Setting of the range in which themeasurement is made.

RATING AWS Flaw rating as dB value

RECALL MEM Retrieving a stored data set

RECTIFY RECV Selection of rectification

REFECHO REF For storing a reference echofor the measurement ofdB difference

REFECHO** DGS Type of the reference reflextorused

REFMOD REF Activation of echo comparison


REFRNCE AWS Reference gain in dBfor AWS evaluation

REFSIZE** DGS Size of the reference reflector

REJECT RECV Suppression of unwanted orspurious echo indications

SCALE LCD Choice of display modefor the measurement line

SCHEME LCD Choice of a color scheme forthe screen display

S-DISP MEAS Zoomed display of a selectedparameter

SET-# MEM Number of the data set

SETTING DATA Display of a function list

S-REF1 CAL Reference echo 1 for calibrationS-REF2 Reference echo 2 for calibration

STO-INF DATA Saving the current additionalinformation


Appendix


STORE MEM Saving the data set

SURFACE DATA Condition of surface

T-CORR* DAC/AVG/ Sensitivity correction, e.g. toJDAC compensate for transfer losses

TESTINF DATA Saving additional information

THICKNE TRIG Entry of workpiece thicknessfor calculation of real flaw depth

TIME CFG2 Current time

TOF MEAS Selection of the measuringpoint for the gate

UNIT CFG1 Selecting the unit ofmeasurement mm or inch

VGA LCD Activating/Deactivating the VGAoutput

X-POS DATA X-position coordinate

Function directory


X-VALUE TRIG Entry of the distance betweenprobe index (sound exit point)and leading face of theangle-beam probe

Y-POS DATA Y-position coordinate


Appendix


STORE MEM Saving the data set

SURFACE DATA Condition of surface

T-CORR* DAC/AVG/ Sensitivity correction, e.g. toJDAC compensate for transfer losses

TESTINF DATA Saving additional information

THICKNE TRIG Entry of workpiece thicknessfor calculation of real flaw depth

TIME CFG2 Current time

TOF MEAS Selection of the measuringpoint for the gate

UNIT CFG1 Selecting the unit ofmeasurement mm or inch

VGA LCD Activating/Deactivating the VGAoutput

X-POS DATA X-position coordinate

Function directory


X-VALUE TRIG Entry of the distance betweenprobe index (sound exit point)and leading face of theangle-beam probe

Y-POS DATA Y-position coordinate


Appendix

9.2 EC declaration of conformity

We declare that the USM 35X conforms to the followingEuropean directives:

• 89/336EEC (Electromagnetic compatibility)

The conformity of the above-mentioned product with theregulations of the directive 89/336EEC is proven by theobservance of the standard specifications

• EN 55011: 1998 Class A, Group 2 and

• EN 61000-6-2: 1997

• EN 61000-6-4: 1997.

The conformity of the above-mentioned product with theregulations of the directive 73/23/EEC, amended by thedirective 93/68/EEC, is proven by the observance ofthe standard specification

• EN 61010-1: 2001.

EC declaration of conformity


Appendix

9.2 EC declaration of conformity

We declare that the USM 35X conforms to the followingEuropean directives:

• 89/336EEC (Electromagnetic compatibility)

The conformity of the above-mentioned product with theregulations of the directive 89/336EEC is proven by theobservance of the standard specifications

• EN 55011: 1998 Class A, Group 2 and

• EN 61000-6-2: 1997

• EN 61000-6-4: 1997.

The conformity of the above-mentioned product with theregulations of the directive 73/23/EEC, amended by thedirective 93/68/EEC, is proven by the observance ofthe standard specification

• EN 61010-1: 2001.

EC declaration of conformity


Appendix

9.3 Manufacturer/Service addresses

The Krautkramer USM 35X is manufactured by:

GE Inspection Technologies GmbHRobert-Bosch-Str. 3D – 50354 Hürth

Phone +49 (0) 22 33 - 601 111Fax +49 (0) 22 33 - 601 402

The USM 35X is manufactured according to state-of-the-art methods using high-quality components. Thoroughin-process inspections or intermediate tests and a qualitymanagement system certified to DIN EN ISO 9001ensure an optimum quality of conformance of theinstrument.

Should you nevertheless detect an error on yourinstrument, switch the instrument off and remove thebatteries. Inform your local GE Inspection TechnologiesService indicating the error and describing it.

Keep the shipping container for any repairs possiblyrequired which cannot be made on the spot.

Manufacturer/Service addresses

If there is anything special that you would like to knowabout the use, handling, operation and specifications ofthe instruments, please contact your nearest GEInspection Technologies representative or directly:

GE Inspection Technologies GmbH

Service-CenterRobert-Bosch-Str. 3D – 50354 Hürth

or:

Postfach 1363D – 50330 Hürth

Phone +49 (0) 22 33 - 601 111Fax +49 (0) 22 33 - 601 402


Appendix

9.3 Manufacturer/Service addresses

The Krautkramer USM 35X is manufactured by:

GE Inspection Technologies GmbHRobert-Bosch-Str. 3D – 50354 Hürth

Phone +49 (0) 22 33 - 601 111Fax +49 (0) 22 33 - 601 402

The USM 35X is manufactured according to state-of-the-art methods using high-quality components. Thoroughin-process inspections or intermediate tests and a qualitymanagement system certified to DIN EN ISO 9001ensure an optimum quality of conformance of theinstrument.

Should you nevertheless detect an error on yourinstrument, switch the instrument off and remove thebatteries. Inform your local GE Inspection TechnologiesService indicating the error and describing it.

Keep the shipping container for any repairs possiblyrequired which cannot be made on the spot.


If there is anything special that you would like to knowabout the use, handling, operation and specifications ofthe instruments, please contact your nearest GEInspection Technologies representative or directly:

GE Inspection Technologies GmbH

Service-CenterRobert-Bosch-Str. 3D – 50354 Hürth

or:

Postfach 1363D – 50330 Hürth

Phone +49 (0) 22 33 - 601 111Fax +49 (0) 22 33 - 601 402


Appendix

France

GE Inspection Technologies ScsSAC Sans Souci68, Chemin des OrmeauxF – 69760 Limonest

Phone +33 47 - 217 92 20Fax +33 47 - 847 56 98

Great Britain

GE Inspection Technologies892 Charter AvenueCanleyGB – Coventry CV4 8AF

Phone +44 845 - 130 - 3925Fax +44 845 - 130 - 5775

USA

GE Inspection Technologies, LP50 Industrial Park RoadUSA – Lewistown, PA 17044

Phone +1 717 - 242 03 27Fax +1 717 - 242 26 06



Appendix

France

GE Inspection Technologies ScsSAC Sans Souci68, Chemin des OrmeauxF – 69760 Limonest

Phone +33 47 - 217 92 20Fax +33 47 - 847 56 98

Great Britain

GE Inspection Technologies892 Charter AvenueCanleyGB – Coventry CV4 8AF

Phone +44 845 - 130 - 3925Fax +44 845 - 130 - 5775

USA

GE Inspection Technologies, LP50 Industrial Park RoadUSA – Lewistown, PA 17044

Phone +1 717 - 242 03 27Fax +1 717 - 242 26 06



Appendix

5

33

24

25

34

32 23 31

4

35

Spare parts list

9.4 Spare parts list


Appendix

5

33

24

25

34

32 23 31

4

35

Spare parts list

9.4 Spare parts list


AppendixSpare parts list

10

2

53

3

11

6

30

3854



10

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3854


Appendix Spare parts list

1

51

26

28

52

29

21

27

20

7

36

8

22

9


Appendix Spare parts list

1

51

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Changes 10


Changes 10


Changes

This chapter contains information about changes andadditions made at short notice and not yet included inthe operating manual.

If none exist, the chapter remains blank.


Changes

This chapter contains information about changes andadditions made at short notice and not yet included inthe operating manual.

If none exist, the chapter remains blank.


Index 11


Index 11


Index

A

a trigTriggering by an interface echo ........................... 5-15

A-ScanSetting the A-scan .............................................. 5-48

Accessories ............................................................. 2-5

Additions ................................................................ 10-2

Addresses ................................................................ 9-8

Adjustment rangeFunction directory ................................................. 9-2

AdustmentCoarse and fine ..................................................... 4-9

aGAT (function group) ............................................. 5-14

Alkaline batteries ...................................................... 7-4

aLOGICEvaluation logic gate A ....................................... 5-15

Alphanumerical entries ........................................... 8-14

Analog output ................................................. 5-57, 8-5

ANAMOD................................................................ 5-57

ANGLEAngle of incidence .............................................. 5-32

Anticoincidence ...................................................... 5-15

aSTART .................................................................. 5-25Starting point of gate A ....................................... 5-16

aTHRSHThreshold of gate A ............................................ 5-16

aWIDTHWidth of gate A ................................................... 5-16

B

Backlight ................................................................ 5-52

BASE (function group) .............................................. 5-6

Basic settings ........................................................ 4-10

Batteries ................................................................... 1-2Care ...................................................................... 7-3Charging the NiCd batteries .................................. 7-3

BAUD-R .................................................................. 5-55


Index

A

a trigTriggering by an interface echo ........................... 5-15

A-ScanSetting the A-scan .............................................. 5-48

Accessories ............................................................. 2-5

Additions ................................................................ 10-2

Addresses ................................................................ 9-8

Adjustment rangeFunction directory ................................................. 9-2

AdustmentCoarse and fine ..................................................... 4-9

aGAT (function group) ............................................. 5-14

Alkaline batteries ...................................................... 7-4

aLOGICEvaluation logic gate A ....................................... 5-15

Alphanumerical entries ........................................... 8-14

Analog output ................................................. 5-57, 8-5

ANAMOD................................................................ 5-57

ANGLEAngle of incidence .............................................. 5-32

Anticoincidence ...................................................... 5-15

aSTART .................................................................. 5-25Starting point of gate A ....................................... 5-16

aTHRSHThreshold of gate A ............................................ 5-16

aWIDTHWidth of gate A ................................................... 5-16

B

Backlight ................................................................ 5-52

BASE (function group) .............................................. 5-6

Basic settings ........................................................ 4-10

Batteries ................................................................... 1-2Care ...................................................................... 7-3Charging the NiCd batteries .................................. 7-3

BAUD-R .................................................................. 5-55


Index

bGAT (function group) ............................................. 5-14

bLOGICEvaluation logic gate B ....................................... 5-15

BOLDLI (Choice of a registration curve) ................. 5-70

bSTARTStarting point of gate B ....................................... 5-16

bTHRSHThreshold of gate B ............................................ 5-16

bWIDTHWidth of gate B ................................................... 5-16

C

CALSemiautomatic calibration ......................... 5-19, 5-22

Calibration .............................................................. 5-17Dual-element (TR) probes ................................... 5-21Straight-beam probes .......................................... 5-18With unknown materials ...................................... 5-19

CFG1 (function group) ............................................ 5-53


Changes ................................................................. 10-1

Changing a function value ...................................... 8-14

CodesCodes for function keys ...................................... 8-26Function codes ................................................... 8-17Remote control ..................................................... 8-9

Coincidence ............................................................ 5-15

Configuration .......................................................... 5-53For test applications ........................................... 5-43

Connecting a probe ................................................... 3-7

Controls .................................................................... 4-2

COPYMOD ....................................................... 6-3, 8-9Assignment of the COPY key ............................. 5-55

D

D-DELAY (Display starting point) ............................. 5-7

DAC (function group) .............................................. 5-61

DACECHORecording reference curve ........................ 5-63, 5-68


Index

bGAT (function group) ............................................. 5-14

bLOGICEvaluation logic gate B ....................................... 5-15

BOLDLI (Choice of a registration curve) ................. 5-70

bSTARTStarting point of gate B ....................................... 5-16

bTHRSHThreshold of gate B ............................................ 5-16

bWIDTHWidth of gate B ................................................... 5-16

C

CALSemiautomatic calibration ......................... 5-19, 5-22

Calibration .............................................................. 5-17Dual-element (TR) probes ................................... 5-21Straight-beam probes .......................................... 5-18With unknown materials ...................................... 5-19



Changes ................................................................. 10-1

Changing a function value ...................................... 8-14

CodesCodes for function keys ...................................... 8-26Function codes ................................................... 8-17Remote control ..................................................... 8-9

Coincidence ............................................................ 5-15

Configuration .......................................................... 5-53For test applications ........................................... 5-43

Connecting a probe ................................................... 3-7

Controls .................................................................... 4-2

COPYMOD ....................................................... 6-3, 8-9Assignment of the COPY key ............................. 5-55

D

D-DELAY (Display starting point) ............................. 5-7

DAC (function group) .............................................. 5-61

DACECHORecording reference curve ........................ 5-63, 5-68


Index

DACMODActivating DAC according to JIS ........................ 5-67Activating DAC/TCG ........................................... 5-62

DACMOD (Activating DAC) ................. 5-61, 5-66, 5-73

DAMPING (Probe matching) ..................................... 5-9

DATA (function group) ............................................. 5-38

Data exchange ......................................................... 8-8

Data saving ............................................................ 5-34

Data setDeleting ............................................................... 5-35Deleting all .......................................................... 5-36Management ....................................................... 5-38Recalling ............................................................. 5-36Storing ................................................................ 5-35

DATESetting the gate .................................................. 5-56

dBCORR (Sensitivity correction) .................. 5-64, 5-70

DBSTEP ................................................................. 5-12

Defects ..................................................................... 1-3

Deleting a reference echo ....................................... 5-27

Depth ...................................................................... 5-31

DGS evaluation (USM 35S) .................................... 5-71

DIALOGSelecting the language ....................................... 4-10

DIALOG (Selecting the language) .......................... 5-53

DIRDirectory of stored data sets .............................. 5-38

DIR (Dataset directory) ........................................... 5-41

Display ..................................................................... 4-3

Display range............................................................ 5-6

Display starting point ................................................ 5-7

Distance-amplitude curve ....................................... 5-61according to JIS Z3060-2002 .............................. 5-66

Double assignment ................................................... 4-9

DUALPulser-receiver separation .................................. 5-10


Index

DACMODActivating DAC according to JIS ........................ 5-67Activating DAC/TCG ........................................... 5-62

DACMOD (Activating DAC) ................. 5-61, 5-66, 5-73

DAMPING (Probe matching) ..................................... 5-9

DATA (function group) ............................................. 5-38

Data exchange ......................................................... 8-8

Data saving ............................................................ 5-34

Data setDeleting ............................................................... 5-35Deleting all .......................................................... 5-36Management ....................................................... 5-38Recalling ............................................................. 5-36Storing ................................................................ 5-35

DATESetting the gate .................................................. 5-56

dBCORR (Sensitivity correction) .................. 5-64, 5-70

DBSTEP ................................................................. 5-12

Defects ..................................................................... 1-3

Deleting a reference echo ....................................... 5-27

Depth ...................................................................... 5-31

DGS evaluation (USM 35S) .................................... 5-71

DIALOGSelecting the language ....................................... 4-10

DIALOG (Selecting the language) .......................... 5-53

DIRDirectory of stored data sets .............................. 5-38

DIR (Dataset directory) ........................................... 5-41

Display ..................................................................... 4-3

Display range............................................................ 5-6

Display starting point ................................................ 5-7

Distance-amplitude curve ....................................... 5-61according to JIS Z3060-2002 .............................. 5-66

Double assignment ................................................... 4-9

DUALPulser-receiver separation .................................. 5-10


Index

E

EC declaration .......................................................... 9-7

Echo display ........................................................... 5-51Enlarged echo display ......................................... 5-59Zoom mode ........................................................... 4-3

Enlarged displayMeasurement value .............................................. 4-5

Errors ........................................................................ 1-3

Evaluation logic of the gates .................................. 5-15

EVAMOD ................................................................ 5-58

F

FILLEDEcho display ....................................................... 5-51

FINE G (Fine adjustment of gain) ........................... 5-11

Flaw evaluation ......................................................... 1-6

Flaw position calculation ........................................ 5-31

Freeze function ....................................................... 5-59

FREQUFrequency range ................................................. 5-13

Frequency range ..................................................... 5-13

Function directory ..................................................... 9-2

Function groups ........................................ 4-4, 4-8, 5-3

Functions .................................................................. 4-4Function directory ................................................. 9-2Overview ............................................................... 5-2Setting the functions ............................................. 4-9Special keys ....................................................... 5-59

G

Gain .......................................................................... 5-5Fine adjustment .................................................. 5-12Incrementation ...................................................... 5-5

Gate setting ............................................................ 5-14

Gates ...................................................................... 5-14Starting point ...................................................... 5-16Width .................................................................. 5-16


Index

E

EC declaration .......................................................... 9-7

Echo display ........................................................... 5-51Enlarged echo display ......................................... 5-59Zoom mode ........................................................... 4-3

Enlarged displayMeasurement value .............................................. 4-5

Errors ........................................................................ 1-3

Evaluation logic of the gates .................................. 5-15

EVAMOD ................................................................ 5-58

F

FILLEDEcho display ....................................................... 5-51

FINE G (Fine adjustment of gain) ........................... 5-11

Flaw evaluation ......................................................... 1-6

Flaw position calculation ........................................ 5-31

Freeze function ....................................................... 5-59

FREQUFrequency range ................................................. 5-13

Frequency range ..................................................... 5-13

Function directory ..................................................... 9-2

Function groups ........................................ 4-4, 4-8, 5-3

Functions .................................................................. 4-4Function directory ................................................. 9-2Overview ............................................................... 5-2Setting the functions ............................................. 4-9Special keys ....................................................... 5-59

G

Gain .......................................................................... 5-5Fine adjustment .................................................. 5-12Incrementation ...................................................... 5-5

Gate setting ............................................................ 5-14

Gates ...................................................................... 5-14Starting point ...................................................... 5-16Width .................................................................. 5-16


Index

H

HORNAcoustic alarm .................................................... 5-58

I

InstrumentCare of the instrument .......................................... 7-2

Instrument versions .................................................. 1-8

IntefacesRS 232 interface ................................................... 8-6

Interface echo ........................................................ 5-15

InterfacesI/O interface .......................................................... 8-4

J

JDAC (function group) ............................................ 5-66

K

Keys ......................................................................... 4-6Special keys ....................................................... 5-59

L

Language ................................................................ 4-10

LCDColor scheme ...................................................... 4-14

LCD (function group) ............................................... 5-50

Lemo socket ............................................................. 8-5

LIGHTLCD backlight ..................................................... 5-52

Limits ........................................................................ 1-5

Line ........................................................................... 4-5

M

MAGNIFYGate spreading ................................................... 5-48


Index

H

HORNAcoustic alarm .................................................... 5-58

I

InstrumentCare of the instrument .......................................... 7-2

Instrument versions .................................................. 1-8

IntefacesRS 232 interface ................................................... 8-6

Interface echo ........................................................ 5-15

InterfacesI/O interface .......................................................... 8-4

J

JDAC (function group) ............................................ 5-66

K

Keys ......................................................................... 4-6Special keys ....................................................... 5-59

L

Language ................................................................ 4-10

LCDColor scheme ...................................................... 4-14

LCD (function group) ............................................... 5-50

Lemo socket ............................................................. 8-5

LIGHTLCD backlight ..................................................... 5-52

Limits ........................................................................ 1-5

Line ........................................................................... 4-5

M

MAGNIFYGate spreading ................................................... 5-48


Index

Maintenance ............................................................. 7-5

Manufacturer ............................................................ 9-8

MEAS-P1 to P4 ........................................................ 4-5

Measurement line ........................................... 4-5, 5-46Configuration ....................................................... 5-49

Measuring ............................................................... 5-23

Measuring point ...................................................... 5-17

MEM (function group) ............................................. 5-34

MSEL (function group) ............................................ 5-49

MTLVEL (Sound velocity) ......................................... 5-7

Multiple DAC ................................................. 5-65, 5-70

O

OFFSETDistance of multiple DAC .......................... 5-65, 5-70

OFFSET (Distance of multiple DAC) ............ 5-65, 5-70

Operating levelsOverview ............................................................... 5-2

Operator training ....................................................... 1-4

Operator's controls ................................................... 4-2

P

P-DELAY (Probe delay) ............................................ 5-8

Power supply ............................................................ 3-2

PREVIEWDataset preview .................................................. 5-38

PRF-MODPulse repetition frequency .................................. 5-11

PRINTERSelecting the printer driver .................................. 5-55

PrinterPreparing .............................................................. 6-2

PRINTER (Printer for test report) ........................... 5-51

Printer connection .................................................... 8-8

Printing ..................................................................... 8-9

Printing data ............................................................. 6-2


Index

Maintenance ............................................................. 7-5

Manufacturer ............................................................ 9-8

MEAS-P1 to P4 ........................................................ 4-5

Measurement line ........................................... 4-5, 5-46Configuration ....................................................... 5-49

Measuring ............................................................... 5-23

Measuring point ...................................................... 5-17

MEM (function group) ............................................. 5-34

MSEL (function group) ............................................ 5-49

MTLVEL (Sound velocity) ......................................... 5-7

Multiple DAC ................................................. 5-65, 5-70

O

OFFSETDistance of multiple DAC .......................... 5-65, 5-70

OFFSET (Distance of multiple DAC) ............ 5-65, 5-70

Operating levelsOverview ............................................................... 5-2

Operator training ....................................................... 1-4

Operator's controls ................................................... 4-2

P

P-DELAY (Probe delay) ............................................ 5-8

Power supply ............................................................ 3-2

PREVIEWDataset preview .................................................. 5-38

PRF-MODPulse repetition frequency .................................. 5-11

PRINTERSelecting the printer driver .................................. 5-55

PrinterPreparing .............................................................. 6-2

PRINTER (Printer for test report) ........................... 5-51

Printer connection .................................................... 8-8

Printing ..................................................................... 8-9

Printing data ............................................................. 6-2


Index

Probe connection ...................................................... 3-7

Probe delay .............................................................. 5-8

Probe matching ........................................................ 5-9

Projection distance ................................................. 5-31

PULS (function group) .............................................. 5-9

Pulse repetition frequency ...................................... 5-11

Pulser adjustment .................................................... 5-9

Pulser-receiver separation ...................................... 5-10

R

RANGE (Display range) ............................................ 5-6

Recalling a data set ................................................ 5-36

Receiver adjustment ............................................... 5-11

RECORD (Recording reference curve) ......... 5-62, 5-67

RECTIFY ................................................................ 5-13

RECTIFY (Rectification) ......................................... 5-13

RECV (function group) ............................................ 5-11

Recycling .................................................................. 7-6

Reduced projection distance .................................. 5-31

REFECHO .............................................................. 5-25

REFMOD ................................................................ 5-25

Registration curve .................................................. 5-70

REJECT ................................................................. 5-12

Remote control ......................................................... 8-9

Reset ........................................................................ 3-8

Rotary knobs ............................................................ 4-6

S

S-DISP ..................................................................... 4-5

S-DISP (Zoomed display of reading) ...................... 5-46

Safety information .................................................... 1-2

SCALE ................................................................... 5-52

Screen ...................................................................... 4-3

Semiautomatic calibration ............................ 5-19, 5-22


Index

Probe connection ...................................................... 3-7

Probe delay .............................................................. 5-8

Probe matching ........................................................ 5-9

Projection distance ................................................. 5-31

PULS (function group) .............................................. 5-9

Pulse repetition frequency ...................................... 5-11

Pulser adjustment .................................................... 5-9

Pulser-receiver separation ...................................... 5-10

R

RANGE (Display range) ............................................ 5-6

Recalling a data set ................................................ 5-36

Receiver adjustment ............................................... 5-11

RECORD (Recording reference curve) ......... 5-62, 5-67

RECTIFY ................................................................ 5-13

RECTIFY (Rectification) ......................................... 5-13

RECV (function group) ............................................ 5-11

Recycling .................................................................. 7-6

Reduced projection distance .................................. 5-31

REFECHO .............................................................. 5-25

REFMOD ................................................................ 5-25

Registration curve .................................................. 5-70

REJECT ................................................................. 5-12

Remote control ......................................................... 8-9

Reset ........................................................................ 3-8

Rotary knobs ............................................................ 4-6

S

S-DISP ..................................................................... 4-5

S-DISP (Zoomed display of reading) ...................... 5-46

Safety information .................................................... 1-2

SCALE ................................................................... 5-52

Screen ...................................................................... 4-3

Semiautomatic calibration ............................ 5-19, 5-22


Index

Sensitivity correction .................................... 5-64, 5-70

Serial communication activation ............................... 8-8

Service ..................................................................... 9-8

SETTINGFunction list ........................................................ 5-42

settingFunction list ........................................................ 5-38

Setting of gain .......................................................... 4-8

Sound attenuation (DGS) ........................................ 5-78

Sound velocity .......................................................... 5-7

Spare parts list ....................................................... 9-10

Standard package .................................................... 2-3

Start-up .................................................................... 3-8

Storing a data set ................................................... 5-35

Sub-D socket ............................................................ 8-6

SVEL1 (Fixed sound velocity) ................................ 5-47

Switching on/off ........................................................ 3-8

Symbols

In this manual ..................................................... 1-11LED ..................................................................... 5-60Status symbols ................................................... 5-60

Syntax .................................................................... 8-11

T

T-CORRSensitivity correction (DAC) ................................ 5-64Sensitivity correction (JDAC) .............................. 5-70Transfer correction (DGS) ................................... 5-78

TCG ........................................................................ 5-62Registration curve ............................................... 5-70

Temperature .............................................................. 1-6

Test report ................................................................ 6-3

Test requirements ..................................................... 1-4

TESTINFAdditional information for stored data sets ......... 5-38

THICKNEMaterial thickness ............................................... 5-32


Index

Sensitivity correction .................................... 5-64, 5-70

Serial communication activation ............................... 8-8

Service ..................................................................... 9-8

SETTINGFunction list ........................................................ 5-42

settingFunction list ........................................................ 5-38

Setting of gain .......................................................... 4-8

Sound attenuation (DGS) ........................................ 5-78

Sound velocity .......................................................... 5-7

Spare parts list ....................................................... 9-10

Standard package .................................................... 2-3

Start-up .................................................................... 3-8

Storing a data set ................................................... 5-35

Sub-D socket ............................................................ 8-6

SVEL1 (Fixed sound velocity) ................................ 5-47

Switching on/off ........................................................ 3-8

Symbols

In this manual ..................................................... 1-11LED ..................................................................... 5-60Status symbols ................................................... 5-60

Syntax .................................................................... 8-11

T

T-CORRSensitivity correction (DAC) ................................ 5-64Sensitivity correction (JDAC) .............................. 5-70Transfer correction (DGS) ................................... 5-78

TCG ........................................................................ 5-62Registration curve ............................................... 5-70

Temperature .............................................................. 1-6

Test report ................................................................ 6-3

Test requirements ..................................................... 1-4

TESTINFAdditional information for stored data sets ......... 5-38

THICKNEMaterial thickness ............................................... 5-32


Index

Threshold of the gates ............................................ 5-16

TIMESetting the time .................................................. 5-56

TOFSelecting the measuring point ............................. 5-44

Transfer correction (DGS) ....................................... 5-78

Transfer of datasets ................................................ 8-15

Transmission timing ................................................ 8-12

TRIG (function group) ............................................. 5-31

U

Ultrasonic testing ...................................................... 1-3

UNITUnits of measurement ......................................... 5-54

Units ....................................................................... 4-11

W

Wall thickness .......................................................... 1-6

Waste disposal ......................................................... 7-6

Width of the gates .................................................. 5-16

X

X-position ............................................................... 5-40

X-VALUEOf the probe ........................................................ 5-32

Z

Zoom mode .............................................................. 4-3


Index

Threshold of the gates ............................................ 5-16

TIMESetting the time .................................................. 5-56

TOFSelecting the measuring point ............................. 5-44

Transfer correction (DGS) ....................................... 5-78

Transfer of datasets ................................................ 8-15

Transmission timing ................................................ 8-12

TRIG (function group) ............................................. 5-31

U

Ultrasonic testing ...................................................... 1-3

UNITUnits of measurement ......................................... 5-54

Units ....................................................................... 4-11

W

Wall thickness .......................................................... 1-6

Waste disposal ......................................................... 7-6

Width of the gates .................................................. 5-16

X

X-position ............................................................... 5-40

X-VALUEOf the probe ........................................................ 5-32

Z

Zoom mode .............................................................. 4-3

Technical specifications according to EN 12668-1

USM 35XUSM 35X DACUSM 35X S

GE Inspection Technologies USM 35X S_TM036060001_D - 1

Technical specifications according to EN 12668-1

USM 35XUSM 35X DACUSM 35X S

GE Inspection Technologies USM 35X S_TM036060001_D - 1

Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1DescriptionDescriptionDescriptionDescription SymbolSymbolSymbolSymbol DimensionDimensionDimensionDimension MinMinMinMin AverageAverageAverageAverage MaxMaxMaxMax CommentCommentCommentComment

USM 35X S_TM036060001_D-2 GE Inspection Technologies

- - - Spike pulse

» Spectrum» Spectrum» Spectrum» Spectrum Picture: 1




» Damping» Damping» Damping» Damping Ý -34245

100050

- DUAL = offDAMPING = lowDAMPING = highDUAL = onDAMPING = lowDAMPING = high

» Capacity» Capacity» Capacity» Capacity pF - 2201000

- POWER = lowPOWER = high

» Pulse Repetition Frequency» Pulse Repetition Frequency» Pulse Repetition Frequency» Pulse Repetition Frequency Hz 20% 4-1000 20%

»» PRF Mode - - - Manual,automatically linkedto range in 10 steps

»» PRF step Hz - 4100

- >1,5m<1,5m

» Operating Modes» Operating Modes» Operating Modes» Operating Modes - - - Single-,dual modethrough

» Characteristics of Transmitter Pulse» Characteristics of Transmitter Pulse» Characteristics of Transmitter Pulse» Characteristics of Transmitter Pulse - - -

»» Pulse voltage Ó V -346 -315 -283 1000 HzDAMPING = lowPOWER = high



- - - Spike pulse





» Damping» Damping» Damping» Damping Ý -34245

100050

- DUAL = offDAMPING = lowDAMPING = highDUAL = onDAMPING = lowDAMPING = high

» Capacity» Capacity» Capacity» Capacity pF - 2201000

- POWER = lowPOWER = high

» Pulse Repetition Frequency» Pulse Repetition Frequency» Pulse Repetition Frequency» Pulse Repetition Frequency Hz 20% 4-1000 20%

»» PRF Mode - - - Manual,automatically linkedto range in 10 steps

»» PRF step Hz - 4100

- >1,5m<1,5m

» Operating Modes» Operating Modes» Operating Modes» Operating Modes - - - Single-,dual modethrough

» Characteristics of Transmitter Pulse» Characteristics of Transmitter Pulse» Characteristics of Transmitter Pulse» Characteristics of Transmitter Pulse - - -

»» Pulse voltage Ó V -346 -315 -283 1000 HzDAMPING = lowPOWER = high


GE Inspection Technologies USM 35X S_TM036060001_D-3

»» Pulse rise time Ç ns 8,19 9,64 11,08

»» Pulse duration Æ ns 120,4 133,7 147,1

»» Effective output impedance Í Ý 23 29 35

»» Pulse voltage Ó V -238 -216 -195 1000 HzDAMPING = highPOWER = high




»» Pulse voltage Ó V -246 -224 -202 1000 HzDAMPING = lowPOWER = low




»» Pulse voltage Ó V -153 -139 -125 1000 HzDAMPING = highPOWER = low









»» Pulse voltage Ó V -238 -216 -195 1000 HzDAMPING = highPOWER = high




»» Pulse voltage Ó V -246 -224 -202 1000 HzDAMPING = lowPOWER = low




»» Pulse voltage Ó V -153 -139 -125 1000 HzDAMPING = highPOWER = low






ReceiverReceiverReceiverReceiver» Amplifier» Amplifier» Amplifier» Amplifier - - -

» Setting Range» Setting Range» Setting Range» Setting Range dB - 110 -

»» Increments dB - 0,512612

-

»» Attenuator uncal. range dB - 4 -

»» Accuracy of calibrated attenuator dB -2 0 2

»» Uncalibrated increments dB - ~0,1 -

» Amplifier Frequency» Amplifier Frequency» Amplifier Frequency» Amplifier Frequency - - -

»» Frequency spectrum (-3dB) MHz - 0,2 - 20 - (-3dB)

»» Frequency ranges MHz - - - 0,2 - 1 MHz Filter 4

»» Lower frequency range ¢ MHz 0,177 0,197 0,216

»» Upper frequency range ¡ MHz 1,138 1,265 1,391

»» Center frequency ¤ MHz 0,473 0,498 0,523

»» Bandwidth Ú MHz 0,962 1,069 1,175

»» Maximum frequency £ MHz 0,394 0,526 0,657

»» Dynamic range dB - >110 -

»» Noise level Ù nVÛ 1 - 80

»» Gain for 80% SH dB 24,0 25,0 26,0

»» Minimum input voltage µ áVæ 60 90 120



ReceiverReceiverReceiverReceiver» Amplifier» Amplifier» Amplifier» Amplifier - - -

» Setting Range» Setting Range» Setting Range» Setting Range dB - 110 -

»» Increments dB - 0,512612

-

»» Attenuator uncal. range dB - 4 -

»» Accuracy of calibrated attenuator dB -2 0 2

»» Uncalibrated increments dB - ~0,1 -

» Amplifier Frequency» Amplifier Frequency» Amplifier Frequency» Amplifier Frequency - - -

»» Frequency spectrum (-3dB) MHz - 0,2 - 20 - (-3dB)





»» Bandwidth Ú MHz 0,962 1,069 1,175




»» Gain for 80% SH dB 24,0 25,0 26,0




»» Maximum input voltage ¥ Væ - - 40





»» Bandwidth Ú MHz 3,551 3,946 4,340


»» Gain for 80% SH dB 23,5 24,5 25,5









»» Bandwidth Ú MHz 9,167 10,186 11,204


»» Gain for 80% SH dB 24,0 25,0 26,0











»» Bandwidth Ú MHz 3,551 3,946 4,340


»» Gain for 80% SH dB 23,5 24,5 25,5









»» Bandwidth Ú MHz 9,167 10,186 11,204


»» Gain for 80% SH dB 24,0 25,0 26,0







»» Frequency ranges MHz - - - 2 - 20 MHz Filter 2




»» Bandwidth Ú MHz 16,653 18,504 20,354


»» Gain for 80% SH dB 24,5 25,5 26,5





»» Deadtime after transmitter pulse ás - <5 us - 1nF,125 Ohm,0,5-4MHz

»» Receiver input impedance

»»» Single probe (combined transmitter and receiver) Single mode

»»» Rmax ¦ Ý - 338 - Rmax

»»» Rmin ¸ Ý - 338 - Rmin

»»» Cmax ã pf - 52 - Cmax

»»» Cmin â pf - 52 - Cmin

»»» Dual-probe (separate transmitter and receiver) Dual mode

¦ Ý - 511 -

¸ Ý - 511 -




»» Frequency ranges MHz - - - 2 - 20 MHz Filter 2




»» Bandwidth Ú MHz 16,653 18,504 20,354


»» Gain for 80% SH dB 24,5 25,5 26,5





»» Deadtime after transmitter pulse ás - <5 us - 1nF,125 Ohm,0,5-4MHz

»» Receiver input impedance

»»» Single probe (combined transmitter and receiver) Single mode

»»» Rmax ¦ Ý - 338 - Rmax

»»» Rmin ¸ Ý - 338 - Rmin

»»» Cmax ã pf - 52 - Cmax

»»» Cmin â pf - 52 - Cmin

»»» Dual-probe (separate transmitter and receiver) Dual mode

¦ Ý - 511 -

¸ Ý - 511 -



ã pf - 33 -

â pf - 33 -

» Signal Mode» Signal Mode» Signal Mode» Signal Mode - - -

»» Full Wave - yes

»» Negative Halfwave - yes -

»» Positive Halfwave - yes -

»» RF yes To 50 mm steel

» Suppression» Suppression» Suppression» Suppression - yes -

»» Adjustable % - 1 - 80 -



ã pf - 33 -

â pf - 33 -

» Signal Mode» Signal Mode» Signal Mode» Signal Mode - - -

»» Full Wave - yes

»» Negative Halfwave - yes -

»» Positive Halfwave - yes -

»» RF yes To 50 mm steel

» Suppression» Suppression» Suppression» Suppression - yes -

»» Adjustable % - 1 - 80 -



MonitorMonitorMonitorMonitor» Number of Gates» Number of Gates» Number of Gates» Number of Gates - 2 -

» Alarm logic» Alarm logic» Alarm logic» Alarm logic - off,pos,neg,trigger

-

for gate B (C)

» Start» Start» Start» Start mm - 0 to9999

-

» Width» Width» Width» Width mm - 0,2 to9999

-

» Threshold» Threshold» Threshold» Threshold % - 10 - 90 -

» Measurement points» Measurement points» Measurement points» Measurement points - flank,peakjflank

-

JIS Z3060

» Magnifier» Magnifier» Magnifier» Magnifier - yes - Display of A-scanon full screen width

» Alarm» Alarm» Alarm» Alarm - LED,horn

- Hornswitchable

» Interface echo start» Interface echo start» Interface echo start» Interface echo start - yes - Control ofGate B by Gate A

» Switch output» Switch output» Switch output» Switch output - yes - See interfaces



MonitorMonitorMonitorMonitor» Number of Gates» Number of Gates» Number of Gates» Number of Gates - 2 -

» Alarm logic» Alarm logic» Alarm logic» Alarm logic - off,pos,neg,trigger

-

for gate B (C)

» Start» Start» Start» Start mm - 0 to9999

-

» Width» Width» Width» Width mm - 0,2 to9999

-

» Threshold» Threshold» Threshold» Threshold % - 10 - 90 -

» Measurement points» Measurement points» Measurement points» Measurement points - flank,peakjflank

-

JIS Z3060

» Magnifier» Magnifier» Magnifier» Magnifier - yes - Display of A-scanon full screen width

» Alarm» Alarm» Alarm» Alarm - LED,horn

- Hornswitchable

» Interface echo start» Interface echo start» Interface echo start» Interface echo start - yes - Control ofGate B by Gate A

» Switch output» Switch output» Switch output» Switch output - yes - See interfaces



DisplayDisplayDisplayDisplay» Type» Type» Type» Type - active

color-LCD-

» Dimensions of the Display» Dimensions of the Display» Dimensions of the Display» Dimensions of the Display mm - 86 x 115 - (HxW)

» Resolution» Resolution» Resolution» Resolution - 240 x 320- Number of pixels

» Backlight» Backlight» Backlight» Backlight - yes - 2 steps

» A-scan display» A-scan display» A-scan display» A-scan display

»» Linearity of time base % -0,5 0,5

»» Sampling error % -2 0 2 bei 2 MHz

»» Display jitter - - -

»»» Amplitude % -2 0 2 Amplitude

»»» Position % -1 0 1 Position

» Measurement resolution» Measurement resolution» Measurement resolution» Measurement resolution - - -

»» Sound path mm 0,01 - 1 0,01:0 to 99 mm0,1:100 mm to 999 mm1:ab 1000 mm

»» Amplitude % - 0,5 -

ç, è

»»» ç ns - 100 - ç

»»» è ns - 250 - Following an interface echo



DisplayDisplayDisplayDisplay» Type» Type» Type» Type - active

color-LCD-

» Dimensions of the Display» Dimensions of the Display» Dimensions of the Display» Dimensions of the Display mm - 86 x 115 - (HxW)

» Resolution» Resolution» Resolution» Resolution - 240 x 320- Number of pixels

» Backlight» Backlight» Backlight» Backlight - yes - 2 steps

» A-scan display» A-scan display» A-scan display» A-scan display

»» Linearity of time base % -0,5 0,5

»» Sampling error % -2 0 2 bei 2 MHz

»» Display jitter - - -

»»» Amplitude % -2 0 2 Amplitude

»»» Position % -1 0 1 Position

» Measurement resolution» Measurement resolution» Measurement resolution» Measurement resolution - - -

»» Sound path mm 0,01 - 1 0,01:0 to 99 mm0,1:100 mm to 999 mm1:ab 1000 mm

»» Amplitude % - 0,5 -

ç, è

»»» ç ns - 100 - ç

»»» è ns - 250 - Following an interface echo



» Display width» Display width» Display width» Display width mm - 0,5 to9999

-

»» Fixed ranges mm - 55 -

»» Display start mm - -10 to900

- Display start

»» Probe delay ás - 0to199,99

-

»» Automatic Calibration - yes - 2 stepcalibration

» Material velocity» Material velocity» Material velocity» Material velocity m/s - 1000 to15000

- Resulation 1m/s

» Unit of measurement» Unit of measurement» Unit of measurement» Unit of measurement - mm, inch

-

» Linearity of time base» Linearity of time base» Linearity of time base» Linearity of time base % 0,5 0 0,5

» Trigonometry» Trigonometry» Trigonometry» Trigonometry - - -

»» Angle of incidence ° - 0 - 90 - Resulation 0,1

»»» Increments ° - 0,1 - Increments

»» X-value mm - 0 - 100 - Distance:index point toprobe front edge

»» Object thickness mm - 1 - 9999 - To calculate Sound Reflection



» Display width» Display width» Display width» Display width mm - 0,5 to9999

-

»» Fixed ranges mm - 55 -

»» Display start mm - -10 to900

- Display start

»» Probe delay ás - 0to199,99

-

»» Automatic Calibration - yes - 2 stepcalibration

» Material velocity» Material velocity» Material velocity» Material velocity m/s - 1000 to15000

- Resulation 1m/s

» Unit of measurement» Unit of measurement» Unit of measurement» Unit of measurement - mm, inch

-

» Linearity of time base» Linearity of time base» Linearity of time base» Linearity of time base % 0,5 0 0,5

» Trigonometry» Trigonometry» Trigonometry» Trigonometry - - -

»» Angle of incidence ° - 0 - 90 - Resulation 0,1

»»» Increments ° - 0,1 - Increments

»» X-value mm - 0 - 100 - Distance:index point toprobe front edge

»» Object thickness mm - 1 - 9999 - To calculate Sound Reflection



»» Diameter mm/inch 10 - 2000 flat0,40 - 800 flat

mminch

» Image processing» Image processing» Image processing» Image processing - - -

»» Readings to be displayed - 5 -

»»» Time of flight - yes - For Gate A, B

»»» Sound path difference - B-A - For Gate A, B

»»» Surface distance - yes - For Gate A, B

»»» Red. surface distance - yes - For Gate A, B

»»» Depth position - yes - For Gate A, B

»»» Amplitude in % - yes - For Gate A, B

»»» Amplitude in dB - yes -- to gate thresholdto reference (REF)for USM 35X DAC/Sto reference curve

»»» Amplitude in % curve - yes - * Only USM 35X DAC and Sfor gate A,Bto reference curve

»»» Amplitude as ERS - yes - * Only USM 35X Sfor gate A

»»» Alarm - yes - For Gate A,B

»»» Evaluation curve (DGS) - yes - * only for USM 35X S

»»» Test sensitivity - yes - * only for USM 35X S



»» Diameter mm/inch 10 - 2000 flat0,40 - 800 flat

mminch

» Image processing» Image processing» Image processing» Image processing - - -

»» Readings to be displayed - 5 -

»»» Time of flight - yes - For Gate A, B

»»» Sound path difference - B-A - For Gate A, B

»»» Surface distance - yes - For Gate A, B

»»» Red. surface distance - yes - For Gate A, B

»»» Depth position - yes - For Gate A, B

»»» Amplitude in % - yes - For Gate A, B

»»» Amplitude in dB - yes -- to gate thresholdto reference (REF)for USM 35X DAC/Sto reference curve

»»» Amplitude in % curve - yes - * Only USM 35X DAC and Sfor gate A,Bto reference curve

»»» Amplitude as ERS - yes - * Only USM 35X Sfor gate A

»»» Alarm - yes - For Gate A,B

»»» Evaluation curve (DGS) - yes - * only for USM 35X S

»»» Test sensitivity - yes - * only for USM 35X S



»»» Number of legs yes addional possiblechange of A-scancolor according toskips

»»» Flaw class yes Flaw class

»»» db-difference to reference yes for DAC

»»» Reference gain Gr yes for DGS

» Signal display mode» Signal display mode» Signal display mode» Signal display mode - standard,filled

-

» Signal processing» Signal processing» Signal processing» Signal processing - - -

»» Screen freeze - yes - Freeze

»» Auto freeze - yes - Auto freeze

»» A-scan Compare - yes -

»» Echo dynamic - yes - Echo envelope

»» Peak Freeze - yes - For Gate B

» Zoom» Zoom» Zoom» Zoom - yes - A-scan on fullscreen width

» Status information» Status information» Status information» Status information - yes -

» Dialog languages» Dialog languages» Dialog languages» Dialog languages - 20 -

» Function lock» Function lock» Function lock» Function lock - yes - In zoom mode



»»» Number of legs yes addional possiblechange of A-scancolor according toskips

»»» Flaw class yes Flaw class

»»» db-difference to reference yes for DAC

»»» Reference gain Gr yes for DGS

» Signal display mode» Signal display mode» Signal display mode» Signal display mode - standard,filled

-

» Signal processing» Signal processing» Signal processing» Signal processing - - -

»» Screen freeze - yes - Freeze

»» Auto freeze - yes - Auto freeze

»» A-scan Compare - yes -

»» Echo dynamic - yes - Echo envelope

»» Peak Freeze - yes - For Gate B

» Zoom» Zoom» Zoom» Zoom - yes - A-scan on fullscreen width

» Status information» Status information» Status information» Status information - yes -

» Dialog languages» Dialog languages» Dialog languages» Dialog languages - 20 -

» Function lock» Function lock» Function lock» Function lock - yes - In zoom mode



Amplitude evaluationAmplitude evaluationAmplitude evaluationAmplitude evaluation» DAC» DAC» DAC» DAC yes - * Only USM 35X DAC

and SDistance amplitude curve

»» Number of reference echoes - 10 - Reference echoes

»» Dynamic range dB - 40 - For TCG

»» Slope maximum dB/ás 6 - For TCG

» DGS» DGS» DGS» DGS - yes - * Only USM 35X S

»» Number of probes - 24 - In memory

»» Free programmable probe - yes - One probe per data set

»» Reference reflectors - SDHBEFBH

-

»» Attenuation correction - yes -

»» Transfer correction - yes -

»» Quadrant correction - yes -

» DAC Mode» DAC Mode» DAC Mode» DAC Mode - yes - * Only USM 35X DAC and Sdisplay of curve

»» Curve - yes - Evaluation curve

»» TCG - yes - Depth compensation

»» Additional curves - 4 -

»» Curve offset dB - 0,1 - 14 - Additional curves

»» JIS-DAC yes



Amplitude evaluationAmplitude evaluationAmplitude evaluationAmplitude evaluation» DAC» DAC» DAC» DAC yes - * Only USM 35X DAC

and SDistance amplitude curve

»» Number of reference echoes - 10 - Reference echoes

»» Dynamic range dB - 40 - For TCG

»» Slope maximum dB/ás 6 - For TCG

» DGS» DGS» DGS» DGS - yes - * Only USM 35X S

»» Number of probes - 24 - In memory

»» Free programmable probe - yes - One probe per data set

»» Reference reflectors - SDHBEFBH

-

»» Attenuation correction - yes -

»» Transfer correction - yes -

»» Quadrant correction - yes -

» DAC Mode» DAC Mode» DAC Mode» DAC Mode - yes - * Only USM 35X DAC and Sdisplay of curve

»» Curve - yes - Evaluation curve

»» TCG - yes - Depth compensation

»» Additional curves - 4 -

»» Curve offset dB - 0,1 - 14 - Additional curves

»» JIS-DAC yes



Data processingData processingData processingData processing» Analog-to-Digital Conversion» Analog-to-Digital Conversion» Analog-to-Digital Conversion» Analog-to-Digital Conversion - - -

»» Sample frequency MHz 30 - 240

» Storage of data» Storage of data» Storage of data» Storage of data - yes - From internal memory

»» Number of datasets - 800 -

»» Contents of datasets - - - A-scan + instrumentsetup

»» Dataset description - - - Numerical and alpha-numerical

»» String Length (Dataset name) - 24 -

»» Notes, No. of fields - 9 - 6 alphanumerical +3 numerical

»» Memo, No. of characters - 24 -

»» Date and time - yes -

» Measurement results» Measurement results» Measurement results» Measurement results

»» Sound path (TOF) - yes - For Gate A and B

»» Trigiometric values - selectable-

»» Amplidute - selectable-

»» Hardcopy - yes - Format PCX

»» Function list - yes -

»» Test Report - yes -



Data processingData processingData processingData processing» Analog-to-Digital Conversion» Analog-to-Digital Conversion» Analog-to-Digital Conversion» Analog-to-Digital Conversion - - -

»» Sample frequency MHz 30 - 240

» Storage of data» Storage of data» Storage of data» Storage of data - yes - From internal memory

»» Number of datasets - 800 -

»» Contents of datasets - - - A-scan + instrumentsetup

»» Dataset description - - - Numerical and alpha-numerical

»» String Length (Dataset name) - 24 -

»» Notes, No. of fields - 9 - 6 alphanumerical +3 numerical

»» Memo, No. of characters - 24 -

»» Date and time - yes -

» Measurement results» Measurement results» Measurement results» Measurement results

»» Sound path (TOF) - yes - For Gate A and B

»» Trigiometric values - selectable-

»» Amplidute - selectable-

»» Hardcopy - yes - Format PCX

»» Function list - yes -

»» Test Report - yes -



InterfacesInterfacesInterfacesInterfaces» Outputs» Outputs» Outputs» Outputs - - -

»» Alarms - TTL -

»» Horn - yes -

»» Alarm gate A/B - yes - Logical OR

»»» Switching voltage U V= - 3 - HCT level with 100 Ohmserial

»»» Max. switching current I mA 6 - Max. switching current

»»» Hysteresis % 0,5 0 0,5 Hysteresis

»»» Accuracy of the threshold % 2 - 2 Correspondig to actualthreshold

»»» Hold time t ms 20% 500 20% Hold time

»» Analog output

»»» Amplitude Gate A or B U V= - 0 - 5 - Corresponding to 100% SH

»»» Time of flight Gate A or B U V= - 0 - 5 - Corresponding to gate width

»»» Max. switch current mA - 0,5 - Max. switch current

»»» Output impedance Ý - 100 - Output impedance

»»» Linearity % 0,5 0 0,5 8 Bit +/- 1/2 LSB

»»» Rise time V/ás - 2,5 - Rise time

»»» Fall time V/ás - 2,5 - Fall time

»»» Hold time ms - 8 - 250 - Depending on PRF

» Digital input» Digital input» Digital input» Digital input



InterfacesInterfacesInterfacesInterfaces» Outputs» Outputs» Outputs» Outputs - - -

»» Alarms - TTL -

»» Horn - yes -

»» Alarm gate A/B - yes - Logical OR

»»» Switching voltage U V= - 3 - HCT level with 100 Ohmserial

»»» Max. switching current I mA 6 - Max. switching current

»»» Hysteresis % 0,5 0 0,5 Hysteresis

»»» Accuracy of the threshold % 2 - 2 Correspondig to actualthreshold

»»» Hold time t ms 20% 500 20% Hold time

»» Analog output

»»» Amplitude Gate A or B U V= - 0 - 5 - Corresponding to 100% SH

»»» Time of flight Gate A or B U V= - 0 - 5 - Corresponding to gate width

»»» Max. switch current mA - 0,5 - Max. switch current

»»» Output impedance Ý - 100 - Output impedance

»»» Linearity % 0,5 0 0,5 8 Bit +/- 1/2 LSB

»»» Rise time V/ás - 2,5 - Rise time

»»» Fall time V/ás - 2,5 - Fall time

»»» Hold time ms - 8 - 250 - Depending on PRF

» Digital input» Digital input» Digital input» Digital input



»» Control

»»» Test data release - yes - TTL

» Digital interface» Digital interface» Digital interface» Digital interface

»» Types

»»» RS-232 - yes - RS-232

»» Printer

»»» Output/type - - - RS 232

»»» Driver - - - EpsonHPSeikoHP DeskJet 1200HP LaserJet 1200

»» Data Redable aboutRS232

»»» Time of flight - yes - Time of flight

»»» Amplitude - yes - Amplitude

»»» Alarms - yes - Alarms

»»» A-Scan yes A-Scan

»» Trigger - TTL -

» Remote control» Remote control» Remote control» Remote control - - - RS 232

» VGA output» VGA output» VGA output» VGA output yes

»» Horizontal frequency kHz 31,3

»» Vertical frequency Hz 85



»» Control

»»» Test data release - yes - TTL

» Digital interface» Digital interface» Digital interface» Digital interface

»» Types

»»» RS-232 - yes - RS-232

»» Printer

»»» Output/type - - - RS 232

»»» Driver - - - EpsonHPSeikoHP DeskJet 1200HP LaserJet 1200

»» Data Redable aboutRS232

»»» Time of flight - yes - Time of flight

»»» Amplitude - yes - Amplitude

»»» Alarms - yes - Alarms

»»» A-Scan yes A-Scan

»» Trigger - TTL -

» Remote control» Remote control» Remote control» Remote control - - - RS 232

» VGA output» VGA output» VGA output» VGA output yes

»» Horizontal frequency kHz 31,3

»» Vertical frequency Hz 85



GeneralGeneralGeneralGeneral» Instrument» Instrument» Instrument» Instrument - - -

»» Size (HxWxD) mm - 176 x 255 x 105-

»» Weight kg - 2,2 - incl. Batteries

»» Storage temperature °C -20 +60

»» Temperate range for mains operation °C 0 40

»» Temperature range for battery operation °C 0 60

»» Warm-up period h - - - 10 minutes at 25° C

»» Possible power supplies - - - Battery, mains(external power supply)

»» Voltage range for battery operation V= 8,65,4

138

Li Ionen Battery6 NiCD, NiMHCells

»» Voltage range with power supply V= 9,5 13

»» Power consumption VA 5,5 - 8 Min (ECO)Max (FULL)

»» Low battery warning - yes - Status display

»» Environmental Protection - IP 66 --

»» Shock resistivity - - - Shock resistance according to DINIEC 68, 6 ms, 60gshocks per axis

»» Vibration Vibration resistanceaccording to DIN IEC 68,1-150 Hz, 2g, 20 cyclesper axis



GeneralGeneralGeneralGeneral» Instrument» Instrument» Instrument» Instrument - - -

»» Size (HxWxD) mm - 176 x 255 x 105-

»» Weight kg - 2,2 - incl. Batteries

»» Storage temperature °C -20 +60

»» Temperate range for mains operation °C 0 40

»» Temperature range for battery operation °C 0 60

»» Warm-up period h - - - 10 minutes at 25° C

»» Possible power supplies - - - Battery, mains(external power supply)

»» Voltage range for battery operation V= 8,65,4

138

Li Ionen Battery6 NiCD, NiMHCells

»» Voltage range with power supply V= 9,5 13

»» Power consumption VA 5,5 - 8 Min (ECO)Max (FULL)

»» Low battery warning - yes - Status display

»» Environmental Protection - IP 66 --

»» Shock resistivity - - - Shock resistance according to DINIEC 68, 6 ms, 60gshocks per axis

»» Vibration Vibration resistanceaccording to DIN IEC 68,1-150 Hz, 2g, 20 cyclesper axis



» Stability against temperature change» Stability against temperature change» Stability against temperature change» Stability against temperature change - - -

»» Amplitude %/10° C -5 0 5

»» Echo position %/10° C -1 0 1

» Stability against voltage change» Stability against voltage change» Stability against voltage change» Stability against voltage change - - -

»» Amplitude % -2 0 2

»» Time of flight % -1 0 1

» Power supply» Power supply» Power supply» Power supply - - - Li Ion Battery6 NiMH cells

»» Battery operation time h - 143

- Li Ion Battery6 NiMH cells

» Stability after warm-up time» Stability after warm-up time» Stability after warm-up time» Stability after warm-up time - - - After 30 minutes

»» Low battery display - - - Statussymbol

»» Amplitude %/10° C -2 0 2 +/-0,5%

»» Time of flight % -1 0 1 +/- 0,5mm

»» Change in amplitude over time base position with battery c

% - - -

» Types of Sockets» Types of Sockets» Types of Sockets» Types of Sockets

»» Probe connection - Lemo,BNC

- On order

»» I/O interface - Lemo - 8-pin

»» RS-232 - DSUB - 9-pin

»» External power supply - Lemo - 4-pin

» VGA output» VGA output» VGA output» VGA output Lemo 10-pins

» Case» Case» Case» Case - Plastic



» Stability against temperature change» Stability against temperature change» Stability against temperature change» Stability against temperature change - - -

»» Amplitude %/10° C -5 0 5

»» Echo position %/10° C -1 0 1

» Stability against voltage change» Stability against voltage change» Stability against voltage change» Stability against voltage change - - -

»» Amplitude % -2 0 2

»» Time of flight % -1 0 1

» Power supply» Power supply» Power supply» Power supply - - - Li Ion Battery6 NiMH cells

»» Battery operation time h - 143

- Li Ion Battery6 NiMH cells

» Stability after warm-up time» Stability after warm-up time» Stability after warm-up time» Stability after warm-up time - - - After 30 minutes

»» Low battery display - - - Statussymbol

»» Amplitude %/10° C -2 0 2 +/-0,5%

»» Time of flight % -1 0 1 +/- 0,5mm

»» Change in amplitude over time base position with battery c

% - - -

» Types of Sockets» Types of Sockets» Types of Sockets» Types of Sockets

»» Probe connection - Lemo,BNC

- On order

»» I/O interface - Lemo - 8-pin

»» RS-232 - DSUB - 9-pin

»» External power supply - Lemo - 4-pin

» VGA output» VGA output» VGA output» VGA output Lemo 10-pins

» Case» Case» Case» Case - Plastic



» Documentation» Documentation» Documentation» Documentation - - - Technical reference manual



» Documentation» Documentation» Documentation» Documentation - - - Technical reference manual



OtherOtherOtherOther» Software update procedure» Software update procedure» Software update procedure» Software update procedure - - - Download via RS 232

» Options» Options» Options» Options - - - Data logger



OtherOtherOtherOther» Software update procedure» Software update procedure» Software update procedure» Software update procedure - - - Download via RS 232

» Options» Options» Options» Options - - - Data logger

Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1


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manual usm 35x - jwj ndt · usm 35x technical reference and operating manual ident-nr. 48 001...

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