materials characterization labs laboratory (mcl)

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Science & Technology Innovaon Labs MATERIALS CHARACTERIZATION LABORATORY (MCL) As part of the Science and Technology Innovation Laboratories, the Material Characterization Laboratory (MCL) provides a core of exible and powerful instruments and analytical tools for advanced materials, nanotechnology, bioengineering, and space bioscience research applications. Location: Building N239, Room B30 NASA Ames Research Center, Moett Field, CA. Hours of Operation: Monday thru Thursday 9:00 am - 3:00 pm. Lab Access: A NASA hard or visitor badge is required for lab access. Persons who are not US citizens or US permanent residents require additional approvals. Point of Contact: Joseph (Joey) Varelas Ph: 1.650.604.4871 Email: [email protected] Web Site: http://nams.usra.edu/labs Photo Credit: Zinc Oxide Nanowires by Dr. Michael Oye Hitachi H-9500 300 kV Transmission Electron Microscope (TEM) 100, 200, 300 kV Ultra high-resolution microscope with point-to-point resolution of 0.18 nm and a lattice resolution of 0.10 nm AMT XR41B - 4 Megapixel (2048x2048) high mag, high sensitivity bottom mount camera for materials science and diraction studies. Brüker - Quantax XFlash 5030 silicon drift detector (SDD) for high performance energy dispersive X-ray spectroscopy (EDS) Magnication: 200 - 1500 kX Hitachi S-4800 Field Emission Scanning Electron Microscope (SEM) Field Emission Scanning Electron Microscope with light element analysis using Oxford INCA energy dispersive spectroscopy (EDS) 1-2 nanometer range resolution Dual secondary electron (SE) detector system comprised of a lower detector for surface topography imaging and an “in-lens” upper detector for high resolution imaging. Backscatter electron (BSE) detector for analysis of insulating samples Magnication range: 20 - 800 kX Primary Instrumentation

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Page 1: MATERIALS CHARACTERIZATION Labs LABORATORY (MCL)

Science & Technology

Innova!on LabsMATERIALS CHARACTERIZATION

LABORATORY (MCL)

As part of the Science and Technology Innovation Laboratories, the Material Characterization Laboratory (MCL) provides a core of flexible and powerful instruments and analytical tools for advanced materials, nanotechnology, bioengineering, and space bioscience research applications.

Location: Building N239, Room B30 NASA Ames Research Center, Moffett Field, CA.

Hours of Operation: Monday thru Thursday 9:00 am - 3:00 pm.

Lab Access: A NASA hard or visitor badge is required for lab access. Persons who are not US citizens or US permanent residents require additional approvals.

Point of Contact: Joseph (Joey) Varelas Ph: 1.650.604.4871Email: [email protected]

Web Site: http://nams.usra.edu/labs

Photo Credit: Zinc Oxide Nanowires by Dr. Michael Oye

Hitachi H-9500 300 kV Transmission Electron Microscope (TEM)

• 100, 200, 300 kV • Ultra high-resolution microscope

with point-to-point resolution of 0.18 nm and a lattice resolution of 0.10 nm

• AMT XR41B - 4 Megapixel (2048x2048) high mag, high sensitivity bottom mount camera for materials science and diffraction studies.

• Brüker - Quantax XFlash 5030 silicon drift detector (SDD) for high performance energy dispersive X-ray spectroscopy (EDS)

• Magnification: 200 - 1500 kX

Hitachi S-4800 Field Emission Scanning Electron Microscope (SEM)

• Field Emission Scanning Electron Microscope with light element analysis using Oxford INCA energy dispersive spectroscopy (EDS)

• 1-2 nanometer range resolution • Dual secondary electron (SE)

detector system comprised of a lower detector for surface topography imaging and an “in-lens” upper detector for high resolution imaging.

• Backscatter electron (BSE) detector for analysis of insulating samples

• Magnification range: 20 - 800 kX

Primary Instrumentation

Page 2: MATERIALS CHARACTERIZATION Labs LABORATORY (MCL)

USRA Ames Business Office 615 National AvenueSuite #220 Mountain View, CA 94043

Primary Point of Contact: Joseph (Joey) Varelas Ph: 650.604.4831 Email: [email protected]

Additional Instruments

South Bay Technology Ion Beam Sputtering Unit for depositing sub-nanometer grain of conductive coatings onto specimens prior to examination in the electron microscope. The unit is equipped with a rotatable and tiltable stage, capable of loading 4 metal targets without breaking vacuum. Common metals for deposition include gold, chromium, aluminum, molybdenum, tin, and nickel. Denton Vacuum HP Cold Sputter System for TEM, SEM samples preparation with Denton’s patented anode grid which collects stray electrons and prevents them from bombarding and heating the sample.. Common metals for deposition include gold, silver, platinum, palladium, and carbon. Leica EM UC7 Ultramicrotome for cutting extremely thin slices of biological and material science specimens, as well as providing smooth surfaces required for light, transmission electron, scanning electron, and atomic force microscopy.

Sample section thickness range from 1 nm to 15,000 nm

Oriel M-92190 1600W Solar Simulator capable of providing a highly collimated, uniform beam and a maximum 12 x 12 inch diverging beam. This tool is used to test solar arrays and to expose UV radiation to biological samples under a variety of solar conditions.

Supporting NASA’s Mission

To achieve its exploration ambitions, NASA needs to advance the state-of-the-art of ultra-small sensors, biosensors, and autonomous experiment systems with low mass, volume, and power consumption. The MCL provides the processing and sample characterization capabilities necessary to conduct advanced materials research and analysis to support a wide range of NASA missions.

For more information on how your project or program can take advantage of this NASA resource, please contact Joseph (Joey) Varelas at 1.650.604.4831 or via email at [email protected].

Usage Fees*

* Internal NASA payments can be made through WBS. To set up payment, please contact Wenonah Vercoutere at 1.650.604.6014 or [email protected].

Responsible NASA Official Wenonah A. Vercoutere, Ph.D., Managing Director  Science & Technology Innovation Labs Program Fostering Research Collaboration NASA Ames Research Center MS 239-24 (Building 239 Room 171) Moffett Field, CA  94035

Instruments External ($/hr) Internal ($/hr)

Single Instrument Usage (technical support staff time not included)

$125.00 $75.00

Technical Support Staff $125.00 $75.00