TINY LOGIC COURSE OUTLINE

1.0 PRODUCT OVERVIEW

2.0 TINY LOGIC FAMILY

2.1 HS/HST SERIES2.2 UHS SERIES2.3 BASIC EQUIVALENT CIRCUIT

3.0 BASIC TEST CONFIGURATIONS

3.1 GROSS TEST3.2 FUNC TEST3.3 ICC 3.4 VOL3.5 VOH

4.0 TINYLOGIC AUTOMATIC TEST EQUIPMENT (ATE)

4.1 MCT2000 BASIC TESTER CONFIGURATION

4.2 MCT2000 MAINTENANCE QUALIFICATION and TROUBLESHOOTING

PRODUCT OVERVIEW

Fairchild’s TinyLogic family consists of a broad spectrum of high speed, low power, CMOS single-gate logic functions in a choice of two space saving packages: the SOT23-5 and SC70-5 Lead.

TINYLOGIC CONNECTION DIAGRAM

Pin assignment for 5 lead packages.

*TinyLogic is categorized into three: HS, HST, and the UHS series.

HS SERIES: TinyLogic High Speed (HS) series with CMOS input.

*NC7S00 > 2- Input NAND Gate*NC7S02 > 2- Input NOR Gate*NC7S04 > Inverter*NC7SU04 > HS Unbuffered Inverter*NC7S08 > 2- Input AND Gate*NC7S14 > Inverter w/ Schmitt Trigger Input*NC7S32 > 2- Input OR Gate*NC7S86 > 2- Input Exclusive-OR Gate

HST SERIES: TinyLogic High Speed w/ TTL input.*NC7ST00 > 2- Input NAND Gate*NC7ST02 > 2- Input NOR Gate*NC7ST04 > Inverter*NC7ST08 > 2- Input AND Gate*NC7ST32 > 2- Input OR Gate*NC7ST86 > 2- Input Exclusive-OR Gate

UHS SERIES: Ultra High Speed Series*NC7SZ00 > 2- Input NAND Gate*NC7SZ02 > 2- Input NOR Gate*NC7SZ04 > Inverter*NC7SZU04> Unbuffered Inverter*NC7SZ05 > Inverter (Open Drain Output)*NC7SZ08 > 2- Input AND Gate*NC7SZ14 > Inverter w/ Schmitt Trigger Input

43

1

2

5 VCC

GNDOUT

IN A

IN B

*NC7SZ32 > 2- Input OR Gate*NC7SZ38 > 2- Input NAND Gate (Open Drain Output)

HS, HST & UHS>>What’s the difference?***HS (High Speed)

…Intended for use in 5V application.…Operates on a voltage range of 2V-6V…Propagation delay of 4 nsec.

***HST(High Speed w/ TTL input)…Operates on a voltage range of 4.5 V-5.5V…Propagation delay of 7 nsec.

***UHS (Ultra High Speed)…Vcc voltage range of 1.8V – 5.5V…Propagation delay of 2.9 nsec

TINYLOGIC BASIC EQUIVALENT CIRCUIT

AND Gate

TRUTH TABLE

INPUT OUTPUTA B YL L LL H LH L LH H H

IN B

IN A

OUT

NAND Gate

TRUTH TABLE

INPUT OUTPUTA B YL L HL H HH L HH H L

A

B

OUT

Basic Inverter

NOTE:

P-Channel- Normally “off”- Need Neg (-) signal to

turn “on”

TRUTH TABLE

INPUT OUTPUTA YL HH L

VinVout

P

N

BASIC GATE MODEL WITH ESD PROTECTION DIODES

V in V out

BASIC TEST CONFIGURATION

GROSS Test: Vcc=0.3 v 2.5u > Icc >-0.3u

FUNC Test

ICC Test: Vcc=6.1V 0.9 u > ICC > -0.3 u

Force 0.0 A @ output pin

VOH : High Level Output Voltage

VOL : Low Level Output Voltage

Force 0.0 A @Output pin

TTL NAND Gate

TRUTH TABLE

INPUT OUTPUTA B YL L HL H HH L HH H L

TINYLOGIC BASIC EQUIVALENT CIRCUIT

A

B

OUTPUT

CMOS NAND Gate

TRUTH TABLE

INPUT OUTPUTA B YL L HL H HH L HH H L

SUPPLY VOLTAGE: +5 to +15 V.Speed & Power: Slower, but has negligible quiescent power dissipation

TINYLOGIC ATE TESTING

SYSTEM DESCRIPTION

MCT test system are microprocessor controlled digital logic testers that are capable of performing DC parametric, AC parametric and Dynamic Functional Test on integrated circuits that have up to 64 pins.

OUTPUT

A

B

Major components in each system include the controller module (PC), power supply module and the test head.

The power supply module and the controller module are connected to the test head by a hose assembly (also called as Umbilical Cord) which transfers cooling air, digital signals and power between them.

As a complete device testing station, the controller module and power supply module are in the same vertical rack-mount cabinet. The test head has its own enclosure, which is designed to interface with other test equipment such as a device handler or wafer prober.

FIGURE 1-1: Typical 2001 system configurations.CONTROLLER MODULE

Test head module

Power Supplymodule

Controller module

Keyboard

Provide system control and mass storage for the Test System.

POWER SUPPLY MODULE:

Supplies DC power and cooling air to the test head. Power supply module contains eight DC power supply. Power supplies 1 through 3 are located on the top of the module with supply 1 being toward the back of the module and supply three being toward the front.Power supplies 4 through 8 are located in the front of the module with supply four being toward the top of the module and supply eight at the bottom.

The power supply module also contains two high capacity blowers , a line matching transformer that provides 230Vac to the dc supplies and a step –down transformer that converts 230Vac to 115 Vac for the backpanel receptacle. This receptacle accepts the 110V power cord from the controller module. A flexible hose transfers air from the power supply module blower to the test head. The hose contains conductors that transfer dc power and communication signals between the power supply module and controller, and the test head. A pair of high-temperature sensors in the power supply module monitor the temperature within the power supply cabinet, and sends power supply module high-temperature signals to the controller.

REFERENCEGENERATOR

Cut-away view of power supply module showing location of the power supplies.

TEST HEAD

Contains the circuits that perform device testing. Elements in the test head have short conductor paths to the device under test (DUT) in order to maintain signal integrity. There are four large boards attached to each other and transfer signals by means of vertical connectors.

Note:The test contains a power interrupt switch. This switch will automatically remove power to the test head when the test head cover is removed. This circuit will prevent a power to ground short from occurring when pin cards or APS card are removed or inserted into the test head. It is recommended, however , that when any work is done in the test head, test system power be turned off. Main components in the test head and their approximate lay-out.

PS1 = -5 V @ 35 APS2 = -5 V @ 35 APS3 = -5 V @ 35 APS4 = +5 V @35 APS5 = +5 V @ 35 APS6 = - 5V @ 35 APS7 = +15V @ 15 APS8 = -15V @ 15 A

TOP COVER

SHROUD

AIR DEFLECTOR

REFERENCEGENERATORAUXILLIARYPOWER SUPPLY

PIN CARDS64 MAX

MOTHER BOARD

FRAME

AC MEASURE

AUXILLIARYPOWERSUPPLY

TOP COVER

TEST HEAD COMPONENTS*Mother Board Interface Board

*Reference Generator*Motherboard

*APS*PEC

*Timing Generator*AC Measurement Board*Functional Sequencer

PIN CARDS

Up to 64 pin cards (also called Pin Electronics Cards or PEC’s) are located in the test head. Each pin card is the connecting link between one pin of a DUT (device under test) and the tester. The basic pin card performs two basic functions on all models: DC parametric force/measure, and functional drive/compare. On 2020 models the pin

TIMING GENERATOR

FUNCTIONAL SEQUENCER

BOTTOMPLATE

HOSE ASSEMBLY

MOTHER BOARDINTERFACE BUS

(MBIB)

FRAME

PIN CARDS

MOTHER BOARD

AC MEASURE

cards also include a virtual timing generator (VTG) circuit which allows software control and calibration of T0, TGEN or strobe clock signal edges reaching the DUT. The pin cards plug into 64 connectors on the motherboard in a radial pattern.To shorten drive and sense lines most of the high-speed logic is located on the pin cards in the test head. This reduces settling time and waveform distortion to provide faster and more accurate testing. Also, since there is one pin card per pin, the customer needs to install only as many pin cards as there are pins on the device to be tested.

REFERENCE GENERATOR

Provides accurate reference voltages used for calibration, dynamic functional testing, ac parametric testing, and for setting the output voltage of the auxiliary output supplies. These voltages are available to each pin card and the auxiliary power supply board on the mother board via the analog bus. Except for calibration voltages, all reference voltages are programmable.AUXILIARY POWER SUPPLIES

The test head contains one auxiliary power supply board with two programmable supplies, each able to supply up to +/-1.5A of DC power in the –10 to +10 Volt range.

MotherBoard Interface Bus

The contoller transfers data and addresses from the Multibus to the test head over the MCbus and makes them available to test head elements via the stack bus and the ring bus. The motherboard interface board decodes address signals on the MCbus to determine the test head destination or source for MCbus data signals. Test programs running in the controller transfer data over the MCbus by executing reads and writes to the test head. The test head is memory mapped, therefore, the CPU sees no difference between RAM and test memory locations.

TIMING GENERATORProvides three programmable pulse trains called TO (time zero), TG (timing generator) and STROBE. These pulses are available to each PIN card and are used for dynamic functional and ac parametric testing.

FUNCTIONAL SEQUENCERAddresses functional memory for two purposes: to address functional memory so it can have data written to it, and can write out the functional operands to the driver and comparator circuits for functional testing.

AC MEASUREMENT The AC measurement circuit consists of two 64-to-1 matrices and one ac measurement device. The ac measurement device is a multiple sample, time differential digitizer that

determines the time between two positive going waveform edges.

NEGATIVE FLOW-RESPONSE

1. Check AC input power and cables. 2. Check/replace 208 volt AC converter or matching swi 3. Check main breakers.

1. Check 230 volt AC input at Hubble connector on back of power module.

2. Check main and aux, breakers, 120 volt AC out of power module for controller and disk drive, also line fuse in back of controller.

3. Check solid state relays SSR1 and SSR2 in the power module.

4. Check for 10 volts from power controller board pin 9 to P77 (power controller cable) 5. Check and replace front switch panel if necessary.

1. Check 120 volt AC controller and disk drive. 2. Check and replace power controller board if require.

1. If cursor present, check CRT controller or power sequencer board. 2. If no cursor present, turn up intensity, look for retrace. 3. If present –check video inputs. If not –check AC power to

the CRT. 4. Check and swap keyboard if required. 5. Reset the board or replace CPU.

Maintenance Troubleshooting and Qualification

POSITIVE FLOW SEQUENCE OF EVENTSTurn on main breaker

Cabinet blower on ------------------------ NO YESPower on tester

Main blower on --------------------------- NO

YES

10 sec power lights---------------------- NO

YESBoot system

YES

Run Autocal1 –DC------------------ FAILED

PASSED

Continue troubleshooting on next page

ALL PINSSOME PINS1. Check data cables.2. Check DC power

supplies3. Check/ Swap MBIB

board.4. Check +/- 10.000 volts

DC reference. If bad , check,Reseat, swap ref gen. Brd.

5. Reseat diagnostic board

1. Seat (reseat ) failing PEC.2. Move failing PEC to new

location . If card still fails in new location replace it.

3. Place a good PEC in the bad location . If PEC fail , card slot probably is bad.

NOTE: One PEC could cause the other PEC’s to appear bad. Remove all PEC’s except first three . Replace PEC’s on at a time , until bad PEC is found.

POSITIVE FLOW SEQUENCE OF EVENTS

RUN AUTOCAL1 – AC----------------------------FAILED

PASSED

RUN AUTOCAL2 –FP------------------------------FAILED

PASSED

RUN AUTOCAL 3- AP-----------------------------FAILED

PASSED

RUN AUTOCAL 4- AI-----------------------------FAILEDNon-invert

PASSED

Run AUTOCAL 5- TG -----------------------------FAILED

PASSED

Run TESTFADR--------------------------------------FAILED

PASSED

(See next page to continue troubleshooting)

NEGATIVE FLOW- RESPONSE

1.Rerun to verify the results. 2. Reseat all large boards.3. If single range is failing swap the ac board.4. If all ranges fail swap the TG board.5. Reseat diagnostic board.

ALL PINS SOME PINS

ALL PINS SOME PINS

1. Remove any dut board from test head and rerun cal routine.2. Replace timing generator board.

ALL PINS SOME PINS

1. Reseat or swap referencegenerator .2. IOL/IOH, check APS fuseor replace APS. Also check diagnostic board.3. VI’s and VO’s replaced timing generator.NOTE:One PEC could cause the other PEC’s to appear bad. Remove all PEC’s one at a time, until bad PEC is found.

1.Seat/Reseat failing cards.2. Move failing PEC to a new location . If the PEC fails, replace it.3. Place a good PEC in the bad location. If PEC fail ,card slot probably is bad.4. Reseat diagnostic board.

1.Check, reseat, swap the deskew board2. Check, reseat, swap the APS card.3. Check the inputs to the deskew board. If bad , reseat , swap the ac board.

1.Check, reseat, swap the deskew board.2. Seat/Reseat failing PEC.3. Move failing PEC to a new location . If the PEC fails, replace it.4. Place a good PEC in the bad location. If PEC fail., card slot probably is bad.

1.Verify that input, output and control lines are connected to pin cards.2. Move cables to a different set of PEC’s .3. Re-autocal FP,AP.4. Replace inverter box.5. Replace AC board.

1. Reseat and / or replace timing generator board. Also same with func. Seq. brd. Note:One PEC could cause the other PEC’s to appear bad. Remove all PEC’s except first three. Replace PEC one at a time, until bad PEC is found.

1. Reseat/ replace failing PEC.

NOTE:

One PEC could cause the other PEC’s to appear bad. Check the error count displayed to determine the failing PEC.

POSITIVE FLOW SEQUENCE OF EVENTS(Continued from previous page)

Run DCQUAL------------------------------------FAILED

PASSED

Run FUNQUAL---------------------------------FAILED

PASSED

Run SYSQUAL---------------------------------FAILED

PASSED

Run COAX-------------------------------------FAILED

PASSED

NEGATIVE FLOW -RESPONSE

ALL PINS SOME PINS

1.Check seating of diagnostic board.2. Re-autocal DC.3. Swap DC diagnostic board.4. Swap APS board.NOTE:One PEC could cause the other PEC’s to appear bad. Remove all PEC’s except for first one. Replace PEC’s one at a time, until bad PEC is found

1. Check , reseat , swap the diagnostic board.2. Seat/Reseat failing PEC.3. Move failing PEC to a new location. If PEC fails, replace it.4. Place a good PEC in the bad location. If PEC fail, card slot probably is bad.

1. Check, reseat, swap the diagnostic board.2. Re-autocal3. IOH/IOL check fuses on APS card

1. Reseat failing PEC.

1. Rerun autocal 1 and autocal 2.2. Replace AC board.

NOTE: SYSQUAL does not require dut or load board, however test head opening must be covered.

1. Re-autocal AP and save results.2. Reseat and/or replace the timing generator board. Also reseat and/or replace the AC parametric board

1. Reseat and/or swap failing PEC. Re-autocal AC and AP.2. Replace failing PEC.

SYSTEM IS WORKING