measurement and instrumentation analysis

8/10/2019 Measurement and Instrumentation Analysis

1/13

EEE310 Measurement and

Instrumentation I

Lecture 01

Kolawole S. OGUNBA,Department of Electronic and Electrical Engineering,Obafemi Awolowo University,

Ile-Ife,Osun State,

Nigeria


2/13

Useful Pieces of Information

Course Code: EEE310 Course Title: Measurement and

Instrumentation I

Number of Units: 3

Prerequisite: EEE204

Fundamentals of Electronic an

Electrical Engineering

Time Table Issues: Please sort them out ASAP

EEE310 Measurement and InstrumentationI


3/13

Useful Pieces of Information (contd.)

Introduction to Signals and Measuring Systems:

Analog and digital signals. Fundamental elements of measurement systems. Static and

dynamic characteristics of measurement systems.

Modeling of Measuring Systems:

Random noise (thermal, shot and 1/f noise), interference, errors and accuracy.

Mathematical modeling of non-ideal measuring systems. Standards and calibration.

Sensors:Sensor principles. Thermocouples, thermistors, Platinium100 (Pt100), Linear Voltage

Differential Transformers (LVDTs), accelerometers, microphones, pressure sensors,

photodiodes, strain gauges, Hall-effect sensors, flow sensors etc.

Analog Signal Processing

Filters, filter types: Butterworth, Chebyshev, Bessel, bandwidth narrowing.

Op-amp circuits: amplifiers, differential amplifiers, integrators, differentiators, Sallen-and-Key filter,

current-to-voltage converters, rectifiers, comparators and peak detectors. Op-amp non-idealities: offset, bias current, finite gain, finite bandwidth, CMRR. Instrumentationamplifiers.

Analog to Digital and Digital to Analog Conversion

Sampling, sampling theorem, aliasing, anti-aliasing and reconstruction filters, quantizationerror, sample-and-hold circuits.

Course Contents EEE310 Measurement and Instrumentation I


4/13


Haykin, S. and Van Veen, B. (1999), Signals and Systems, John Wiley and Sons Inc., 605, ThirdAvenue, New-York NY 10158-0012, United States of America.

Lathi, B.P. (1998), Signal Processing and Linear Systems, Berkeley-cambridge Press, P.O. Box 947,Carmichael, CA 95609-0947, United States of America.

Morris, A. S. (2001),Measurement and Instrumentation Principles, 3rd. ed., Butterworth-Heinemann,Linacre House, Jordan Hill, Oxford OX2 8DP, United Kingdom.

Oppenheim, A.v. and Willsky, A.S. (1997), Signals and Systems, Prentice-Hall International, UpperSaddle River, New-Jersey, United States of America.

Sawhney, A.K. and Sawhney, P. (2007), A Course in Electronic and Electrical Measurements andInstrumentation, Dhanrat Rai and Co. (P) Limited, Educational and Technical Publishers. 1710, Nai

Sarak, Delhi 110006, India.

Webster, J.G. (1999), The Measurement, Instrumentation, and Sensors Handbook, CRC Press LLC,2000, Corporate Blvd., Boca Raton, FL 33431, United States of America.

Chosen Texts for Course EEE310 Measurement and Instrumentation I


5/13


Mode of Delivery of Lectures: Powerpoint presentations are likely. I will develop them and send to the students even if I

do not present them in class. Use of black/white boards still very likely in addition

to/as a replacement of Powerpoint Presentations. Lecture Notes:

I will develop them as the Semester progresses Assessment:

Attendance Mid-Semester Test (1) Examination (1) Assignments

NBHonesty is advised with attendances.

EEE310 Measurement and Instrumentation I


6/13

Introduction toMeasurement and

Measurement Systems



7/13

Measurement and Measurement Systems

Question: Why study signals when thedestination is really measurement andinstrumentation? Answer: In life, there is a constant need to

quantify phenomena. The quantification gives rise to signals and the

process of quantification is called measurementwhile the tools we utilize in achieving thequantification are called Instruments or

Measurement Systems or InstrumentationSystems.

The signals are a collection of data and they giveinformation that ultimately gives the

knowledge needed to make calculated decisions.



8/13


Measurement:The process of comparison between a quantity

of a particular variable of interest (mostlyphysical) and a pre-defined, globally-accepted

standard. Standard:

The value of some quantity of a variable which isset up and established by authority as a rule forthe measurement of quantities of the variable.

Measurand:

The variable to be measured that represents a

particular phenomenon being invvestigated.



9/13


Signal:The variation of a dependent variable withrespect to one or more independent variables

Data:

A basic entity resulting from a measurementprocess. Information:The commodity contained within a signal/set of

signals that emerges from processed data of ameasurement process. Knowledge:Familiarity, know-how or understanding gained

through the acquisition of information.



10/13

Measurement and Measurement Systems Sensor:A device that comes in contact directly or indirectly

with a physical quantity and responds to suchquantities by undergoing changes in its specificcharacteristics.

Transducer:A device that responds to a particular physical

quantity by energy conversion from one form toanother. (Most sensors are transducers but not all

transducers are sensors) Measuring Instrument:A device, including a sensor, that transforms the

physical variable of interest to a form suitable for

display or recording or transmission or actuation.



11/13


Measurement System:A collection of devices, including sensors,

transducers, signal conversion elements, signalmanipulating elements, anddisplay/storage/transmission/actuating devices,that are put together to enhance the quality ofoutputs of simple measuring instruments and togive as accurate, precise, unambiguous, and reliablea set of readings as possible.

Measurement systems are necessitated by theincreased domestic and industrial demands forefficiency and high-quality measurements thatsimple instruments are incapable of performing.

They are sometimes called Instrumentation Systems



12/13


Simple Instrument Model

Typical Measurement System Model



13/13


Typical Measurement SituationsEEE310 Measurement and Instrumentation I

measurement and instrumentation analysis

Documents