measurement of fast ion losses due to mhd modes driven by fast ions in the large helical device
DESCRIPTION
At ASIPP. Measurement of fast ion losses due to MHD modes driven by fast ions in the Large Helical Device. 2009/03 Kunihiro OGAWA A , Mitsutaka ISOBE, Kazuo TOI, LHD experiment group A Nagoya University National Institute for Fusion Science (NIFS). Contents. Background & Purpose - PowerPoint PPT PresentationTRANSCRIPT
Measurement of fast ion losses due to MHD modes driven by fast ions in the Large Helical Device
2009/03
Kunihiro OGAWAA, Mitsutaka ISOBE, Kazuo TOI, LHD experiment group
A Nagoya University
National Institute for Fusion Science (NIFS)
At ASIPP
Page 2
Contents
Background & Purpose
Experimental setup
– Scintillator based lost fast-ion probe
Result
– Typical discharge & Scintillation image
– Loss flux correlate with TAE/EPM burst
– Relation of fluctuation level and increase of loss flux
Summary & Future plan
Page 3
Background & Purpose
Understanding of fast ion loss process due to fast ion driven MHD mode such as Alfvèn eigenmode (AE) is needed
– fast ion losses may cause a damage of the first wall in a fusion device
– the effect of AEs on fast ion loss must be clarified
example : in NSTX
– fast ions which have wide range of pitch angle are lost due to AE
understanding of the effect of AE on co-going fast-ions in LHD
contribution to understanding of fast ion loss process induced by AE in tokamaks
pitchD. Darrow NF (2008) pitch angle
Fast ion loss due to AE in NSTX
Page 4
Scintillator based lost fast-ion probe (SLIP) scintillator probe
– it works as a magnetic spectrometer
– it has a set of apertures (front/rear)
• it allow to enter ions having certain velocities
– scintillation points
• it have information of velocity and pitch angle of ions
this SLIP has two set of apertures
– it can be applicable to the case of CW or CCW direction of Bt
observation of co-going lost fast-ions at relatively low field (Bt < 0.75 T)
model of scintillator head
LHD & location of SLIP
R0 / a = 3.9 m / 0.6 mVNBacc = 180 keV
pitchangle arctan( ) / /v v
picture of SLIP
orbit of co-going ion @ CW-Bt
orbit of co-going ion @ CCW-Bt
Page 5
Typical discharge & Scintillation image
Page 6
Observation of lost fast-ion flux using Photomultiplier (PMT) array
observation of loss flux with PMT
– loss flux correlates with TAE/EPM burst
PMT array (consist of 16-PMT)
– it has high-time resolution (~ 2 s)
– we mainly monitor the signal of Ch. 14
• it sees high luminescent point
– we haven’t done calibration of image pattern
• At present, this image doesn’t give information of velocity and pitch angle of lost fast ions.
SLIP Ch. 14
Scintillation image (t = 2.78 s)and position of PMT
TAE(f~45 kHz)
EPM(chirping)
scintillator PMT
AMP
PCI
CAMERA
PC
half mirror
block diagram of data acquisition system
MP spectra
Page 7
Loss flux correlate with TAE/EPM burst
Bt = 0.75 T, Rax = 3.75 m, =1.254
when NB#2 and #3 inject
a) : filtered magnetic fluctuations
b) : PMT signal (Ch. 14)
increase in ion loss flux induced by TAE
– #90048 case
– mode structure : m~1, n=1 (from MP array)
– frequency : 55 ~ 75 kHz
increase in ion loss flux induced by EPM
– #90044 case
– mode structure : m=2 , n=2 (from MP array)
– frequency : 10 ~ 40 kHz
– frequency sharply chirping down(~ 2 ms)
TAE fluc. and SLIP sig.
EPM fluc. and SLIP sig.
a)
b)
Page 8
Relation of fluctuation level and increase in loss flux evaluation of fluctuation level
– : magnetic fluctuation @ MP position
evaluation of increase in loss flux
– ΔSLIP : ISLIP (mode exist) – ISLIP (no mode)
TAE case (m ~ 1, n = 1)
–
EPM case (m=2, n=2)
– ΔSLIP has threshold in , then constant
– #90043 :
• it is due to difference of density?
• m/n=4/3 mode affects transport?#90043 MP spectra
m/n = 4/3
EPM
TAE
peakb
Fluctuation level and increase of loss flux
#90045 MP spectra
EPM
TAE
2~ peakSLIP b
2~ peakSLIP b
peakb
Page 9
Summary
co-going lost fast-ions are measured with a scintillator-based lost fast-ion probe– recurrent increase of lost fast-ion flux induced by TAE or EPM burst
is observed
– increase in loss flux due to TAE/EPM (toward Ch.14)
• TAE : loss flux is expressed as
• EPM : loss flux have a certain threshold(?), then constant
but in #90043
Future plan– calibration of scintillation image
• scintillation pattern gives us information of velocity and pitch angle of lost ions
– Are there effects of radial structure of TAE/EPM in lost fast-ion flux?
2~ peakb
2~ peakb