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MECH9010 – Mechanical Engineering Project
THE UNIVERSITY OFNEW SOUTH WALES
SCHOOL OF MECHANICALAND MANUFACTURING
ENGINEERING
Master Of Engineering Science (MEngSc) Project Report
Establishing a Particle ImageVelocimetry (PIV) System
forStudying Heat Transfer
Enhancements using DimpledSurfaces
by
Patrick Sean Coray – 3109350
February 2005
Supervisors: Prof. Eddie Leonardi
Dr. Tracie Barber
Abstract
Abstract
A particle image velocimetry (PIV) system was developed to aid the analysis of two-
dimensional flowfields on dimpled surfaces and other structures.
The work included setting up a pulsed laser, programming a laser control application,
aligning beam combining and frequency doubling optics, designing a suitable light
sheet made of low cost components and synchronising with an image recording system.
Furthermore the generation of suitable seeding particles and the requirements for
successful imaging and evaluation of the flowfield has beenaddressed with particular
attention towards dimple specific flow issues.
Acquiring a good theoretical and practical understanding of the processes involved in
generating and imaging laser light, as well as gaining experience in handling lasers and
optics were found to be a key issue in the development of the PIV system.
The PIV system was completed and successfully applied on a small test windtunnel and
a larger tunnel used with dimples. Remaining issues includefurther optimisation of
flow seeding.
i
Statement of Originality
Statement of Originality
I hereby declare that this submission is my own work and to thebest of my knowledge
it contains no material previously published or written by another person, nor material
which to a substantial extent has been accepted for the awardof any other degree or
diploma at UNSW or any other educational institution, except where due
acknowledgement is made in the thesis. Any contribution made to the research by
others, with whom I have worked at UNSW or elsewhere, is explicitly acknowledged in
the thesis.
I also declare that the intellectual content of this thesis is the product of my own work,
except to the extent that assistance from others in the project's design and conception or
in style, presentation and linguistic expression is acknowledged.
Patrick Coray
9 Feb 2005
ii
Acknowledgements
Acknowledgements
The realisation of this project during the past five months would have not been possible
without the contribution of a number of lecturers, staff / technicians, peers and industry
professionals to which I would hereby like to express my gratitude.
Firstly, I would like to thank my supervisors Prof. Eddie Leonardi and Dr. Tracie
Barber for giving me the opportunity to work on this excitingand interesting project;
with further sincere thanks for their support and guidance and for believing in my
ability of getting a running system despite the many pitfalls encountered.
A special acknowledgement and thank you goes to Alex Litvak,Fluids Lab manager
and laser safety officer, for his efforts in assisting me with the many administrative and
technical matters as well as for taking time to discuss problems whenever I got stuck.
I also especially acknowledge the help of the following UNSW staff:
• Tim Anderson, IC Engines and Heat Transfer laboratory manager for the support
during the measurements with the school's ILA PIV system andfor the always
helpful assistance on several other occasions.
• The help of George Otvos in electrical matters.
• Graeme Louk and Andrew Higley for occasional assistance, John Barron for the
manufacturing of necessary parts and Terry Flynn from the Aero Lab for feedback on
previous experience in using the PIV laser.
• Sharon Turnbull, coursework program advisor for her generally uncomplicated help
in administrative matters related to both this project as well as my Master by
Coursework degree.
Due to the initial condition of the laser, the work would havenot been possible without
the always very professional, efficient and - most notably -prompt support of Irmantas
Mikulskas from Ekspla Experimental Lasers Ltd., to whom I amtherefore deeply
indebted.
The help and support of the following students is also greatly appreciated:
• Chris Beves and Sam Diasinos, with their help on lab and otherproject related
iii
Acknowledgements
matters.
• Indra Budihardjo for introduction to the ILA PIV system.
• Soo Too Yen Chean with whom I had to share the time available for the ILA PIV
system.
• Ekim Özkan, who kindly agreed to print and bind the final version of this report as I
already had to leave Australia.
Finally I would like to make use of this opportunity to thank ABB Switzerland / ABB
University Marketing for their Master scholarship award. Without their generous
financial assistance studying in Australia would have been difficult for me.
iv
Table of Contents
Table of Contents
Abstract...............................................................................................................................i
Statement of Originality....................................................................................................ii
Acknowledgements..........................................................................................................iii
Table of Contents...............................................................................................................v
Notation...........................................................................................................................xii
1. Introduction...................................................................................................................1
1.1 Background and Aim..............................................................................................1
1.2 Initial Situation and Approach................................................................................1
2. Flow Over Dimpled Surfaces........................................................................................3
2.1 Introduction.............................................................................................................3
2.2 Dimple Geometry....................................................................................................3
2.3 Important Characteristic Numbers..........................................................................5
2.3.1 Introduction.....................................................................................................5
2.3.2 Independent Characteristic Numbers..............................................................5
2.3.3 Dependent Characteristic Numbers.................................................................6
2.4 Flow Features and Further Important Aspects........................................................7
3. The PIV Method..........................................................................................................10
3.1 Introduction...........................................................................................................10
3.2 PIV – The Basic Principle....................................................................................10
3.2.1 Velocity = Displacement per Time...............................................................10
3.2.2 Introduction to Estimating the Displacements..............................................11
3.2.3 A Typical ('Standard') PIV Measurement Setup...........................................13
3.2.4 More General PIV Setups.............................................................................14
3.2.5 Summarised Approach..................................................................................15
3.2.6 Further Properties of the PIV Method...........................................................15
3.3 A Short Note on 3 Component (Stereoscopic) PIV..............................................16
3.4 Distinction between PIV and other Methods such as PTV...................................18
3.5 Correlation Analysis.............................................................................................20
3.5.1 Introduction...................................................................................................20
v
Table of Contents
3.5.2 Cross-Correlation..........................................................................................20
3.5.3 Auto-Correlation...........................................................................................24
3.5.4 Increasing the Evaluation Speed by FFT......................................................25
3.5.5 Subpixel Interpolation...................................................................................26
3.5.6 Resolution, Accuracy and Dynamic Range..................................................28
3.5.7 Further Improvements – Adaptive Correlation.............................................28
3.6 Post-processing.....................................................................................................30
3.6.1 Introduction...................................................................................................30
3.6.2 Finding Outliers (Erroneous Vectors)...........................................................31
3.6.3 Reconstucting Missing Vectors.....................................................................33
3.6.4 Further Processing of Data............................................................................33
3.7 Pitfalls and Errors.................................................................................................34
3.7.1 Introduction...................................................................................................34
3.7.2 2-C vs 3-C PIV: A Perspective Error............................................................35
3.7.3 Velocity Gradients .......................................................................................37
3.7.4 Particles Moving Out of Bounds and Laser Flash Separation......................38
3.7.5 Pulse Duration...............................................................................................39
3.7.6 Pixel (Peak) Locking and Particle Image Diameter......................................39
3.7.7 Seeding Particle Density...............................................................................43
3.7.8 Quantisation Levels (n-bit Pictures).............................................................44
3.7.9 Light Sheet Coincidence...............................................................................45
3.7.10 Image Intensity Distribution.......................................................................45
3.7.11 Other Image Quality Aspects......................................................................46
3.7.12 Computational Scheme (Subpixel, Adaptive etc.)......................................46
3.7.13 First Order Approximation of the Particle - Not Flow - Velocity..............46
4. The Laser.....................................................................................................................48
4.1 Introduction...........................................................................................................48
4.2 Working Principle of a PIV Nd-YAG Laser.........................................................49
4.2.1 Basic Laser Principle.....................................................................................49
4.2.2 Pumping with Flashlamps.............................................................................51
4.2.3 Introducing a Q-Switch.................................................................................52
vi
Table of Contents
4.2.4 Varying and Maximising the Pulse Energy..................................................54
4.2.5 Combining Two Lasers.................................................................................55
4.2.6 Frequency Doubling: Invisible IR→ Visible Green.....................................55
4.2.7 Further Nd-YAG Properties..........................................................................56
4.3 Laser Safety..........................................................................................................57
4.3.1 Introduction...................................................................................................57
4.3.2 Potential Sources of Eye Damage.................................................................58
4.3.3 Improving the Safety by Appropriate Shielding...........................................60
4.3.4 Some Theory on Laser Goggles....................................................................61
4.3.5 To See Or Not To See: On Handling Laser Goggles....................................63
4.3.6 Further Tips and Comments on How to Prevent Potential Accidents..........64
4.4 Ekspla Nd-YAG Laser – Operation......................................................................64
4.4.1 Introduction...................................................................................................64
4.4.2 Connections...................................................................................................64
4.4.3 Powering Up – Making the Laser Ready......................................................65
4.4.4 Using the Control Pad...................................................................................66
4.5 Ekspla Nd-YAG Laser – Maintenance.................................................................69
4.5.1 Introduction...................................................................................................69
4.5.2 Changing the Cooling Water.........................................................................69
4.5.3 Laser Head View...........................................................................................70
4.5.4 Changing the Flashlamps..............................................................................71
4.5.5 Visualising Infrared.......................................................................................71
4.5.6 Cleaning Optical Components......................................................................72
4.5.7 Optimising the Beam Overlap and Beam Path..............................................72
4.5.8 Storing the KTP Crystal................................................................................74
4.5.9 Optimising the KTP-Crystal Alignment.......................................................74
4.5.10 Measuring the High Voltage at the Pockels Cell........................................76
4.5.11 Measuring the Laser Pulse Energy..............................................................78
4.5.12 Optimising the High Voltage Circuit..........................................................79
4.5.13 Optimising the Q-Switch Timing................................................................80
4.5.14 Potential Problems and Troubleshooting....................................................80
vii
Table of Contents
4.6 Labview Laser Control.........................................................................................82
4.6.1 Introduction...................................................................................................82
4.6.2 Program Usage / Interface.............................................................................83
4.6.3 Program Structure.........................................................................................85
4.6.4 Effect of the Energy% Setting.......................................................................86
5. The Light Sheet...........................................................................................................88
5.1 Introduction...........................................................................................................88
5.2 Principles in Designing a PIV Lightsheet.............................................................89
5.2.1 Introduction...................................................................................................89
5.2.2 Lens Material Damage Thresholds...............................................................89
5.2.3 Do's and Don'ts: Back Reflections................................................................90
5.2.4 Do's and Don'ts: Power Density....................................................................90
5.2.5 From Beam to Lightsheet: The Basic Principle............................................91
5.2.6 On the Importance of the Light Sheet Intensity Distribution........................93
5.2.7 From Beam to Lightsheet: A More Advanced System.................................94
5.3 Designing a Lightsheet (LS) from Pre-Made Parts..............................................95
5.3.1 Parts Available from Edmund Optics...........................................................95
5.3.2 Mathcad Program for Evaluating Possible LS Configurations.....................96
5.3.3 The Resulting Light Sheet.............................................................................97
5.3.4 Mounting the Parts and Using the Final Light Sheet....................................98
5.4 Designing a Beam Redirection Mirror and LS Mount.........................................99
5.4.1 Introduction...................................................................................................99
5.4.2 Choosing a Suitable Mirror...........................................................................99
5.4.3 Mount Design and Alignment.....................................................................100
5.5 Possible Future Extensions.................................................................................100
6. Camera, Lens and Imaging........................................................................................102
6.1 Introduction.........................................................................................................102
6.2 Basic Principles...................................................................................................102
6.2.1 Components of a PIV Lens / Imaging System............................................102
6.2.2 Optical Bandpass Filter...............................................................................104
6.2.3 Focus...........................................................................................................105
viii
Table of Contents
6.2.4 Zoom (Scale) and Field of View.................................................................105
6.2.5 The Effect of Aperture................................................................................106
6.3 Properties of CCD Chips used for PIV...............................................................108
6.3.1 CCD Chips used for PIV.............................................................................108
6.3.2 CCD Damage (Overexposure)....................................................................110
6.4 'Safe' Approach to Getting a Picture...................................................................111
6.5 Dealing with Reflections....................................................................................113
6.6 Imaging Particles................................................................................................113
6.7 Calibrating the Image..........................................................................................117
6.8 Viewing at an Angle – The Scheimplug Correction...........................................118
6.9 Using the Redlake Megaplus ES1.0 Camera......................................................120
6.9.1 General Overview.......................................................................................120
6.9.2 Mounting on the ILA Scheimpflug Adaptor...............................................120
7. Synchronising the Components.................................................................................121
7.1 Introduction.........................................................................................................121
7.2 Triggered Camera Control..................................................................................121
7.2.1 Redlake ES1.0.............................................................................................121
7.2.2 PCO Sensicam Timing for Comparison......................................................123
7.3 PIV Laser and Camera Synchronisation.............................................................124
7.3.1 Introduction.................................................................................................124
7.3.2 The Common Approach..............................................................................124
7.3.3 Ekspla Laser................................................................................................124
7.4 Laser Sync-Out Signals......................................................................................124
7.4.1 Introduction.................................................................................................124
7.4.2 Measurement Setup.....................................................................................125
7.4.3 Laser Back Panel Outputs...........................................................................126
7.4.4 Laser Front Panel Sync Out........................................................................127
7.5 Trigger Level Conversion, Back Panel Sync Out...............................................127
7.5.1 Introduction.................................................................................................127
7.5.2 TTL Trigger Level Conversion...................................................................127
7.5.3 Directly Triggering the Camera from the Back Panel Sync Out................129
ix
Table of Contents
7.6 The Final Camera Synchronisation Method.......................................................130
7.6.1 The Trigger Signal Generation....................................................................130
7.6.2 Setting up the Function Generator..............................................................131
8. Seeding......................................................................................................................132
8.1 Introduction.........................................................................................................132
8.2 Seeding Particle Requirements...........................................................................132
8.2.1 Scattering Intensity and Resulting Image Size...........................................132
8.2.2 Ability to Follow the Flow..........................................................................133
8.2.3 Particle Distribution....................................................................................134
8.2.4 Health, Pollution and Other Issues..............................................................134
8.3 Seeding Liquid Flows.........................................................................................134
8.4 Seeding Gas Flows..............................................................................................135
8.5 Own Experiments................................................................................................136
8.5.1 Introduction.................................................................................................136
8.5.2 Fogger ('Smoke').........................................................................................136
8.5.3 Hollow Glass Spheres.................................................................................137
8.5.4 Vegetable Oil..............................................................................................138
8.5.5 Comparison Table.......................................................................................138
8.6 The Laskin Based Seeding Generator at UNSW................................................139
8.6.1 Introduction.................................................................................................139
8.6.2 Working Principle.......................................................................................139
8.6.3 Health Issues...............................................................................................141
8.6.4 Seeding Liquids...........................................................................................142
9. PIV Evaluation using VidPIV...................................................................................144
9.1 Introduction.........................................................................................................144
9.2 A Brief Overview of the Steps Involved in using VidPIV.................................144
9.2.1 General........................................................................................................144
9.2.2 Importing Image Pairs.................................................................................145
9.3 Preparing n-bit Images for the 8-bit Importer.....................................................146
9.3.1 Introduction.................................................................................................146
9.3.2 The Matlab Program...................................................................................147
x
Table of Contents
10. The Test Rig............................................................................................................148
10.1 Introduction.......................................................................................................148
10.2 The Test-Windtunnel........................................................................................148
10.3 The Windtunnel in Operation...........................................................................149
11. System Usage Summary..........................................................................................151
11.1 Introduction.......................................................................................................151
11.2 Steps when using the System............................................................................151
12. Conclusion...............................................................................................................153
References.....................................................................................................................156
General Literature.....................................................................................................156
Publications on Dimples...........................................................................................158
Literature on PIV, Laser and Optics.........................................................................160
Homepages Used for General (Product) Information...............................................164
Appendices....................................................................................................................166
xi
Notation
Notation
Abbreviations and Acronyms
2C-PIV Two component PIV; The vectors have only 2 components in space (x, y).
2D-PIV Two dimensional PIV; Covers both 2C and 3C vectors determined in a plane.
3C-PIV Three component PIV; The vectors have 3 components in space (x, y, z).
3D-PIVThree dimensional PIV; The vector field extends into three dimensions. Inpractice stereoscopic (3C-PIV) is often referred to as 3D-PIV.
CCD Charge coupled device.
CTA /CTV1
Constant Temperature Anemometry / Velocimetry: Pointwise velocitymeasurement method based on heat transfer from a hot wire.
FL Flashlamp.
HV High voltage.
IR Infrared.
LDA /LDV 1
Laser Doppler Anemometry / Velocimetry: Pointwise velocity measurementmethod based on interferometric / Doppler shift effects.
LS Light sheet.
LSV Laser Speckle Velocimetry.
Nd-YAG
Neodym-Yttrium-Aluminium-Garnet (Laser based on Nd3+ ions in a YAG crystal).
PIV Particle Image Velocimetry.
PTV Particle Tracking Velocimetry.
QE Quantum efficiency – likelihood of a photon to release an electron.
SH,SHG
Second harmonic / second harmonic generation.
SNR Signal to noise ratio.
vi Virtual instrument, i.e. a Labview (sub) program.
1 Velocimetry is mostly used in the US, Australia and parts of Asia while anemometry is more commonin the UK and the rest of Europe. Note that PIV is universally used (PIA is not synonymous to PIV).
xii
Notation
Physical and Mathematical Symbols
Latin:
A area, m2
bflback focal length, m (distance from the last lens of a system to the focal point)
cp specific heat at constant pressure, J/(kg·K)
Cs scattering cross section, m2
d, D diameter or length, m
Dp dimple print diameter, m
E energy, J; either pulse energy or energy level (state) of an atom
f (1)friction factor, - (dimensionless);
sometimes also denoted as λ.typically
f = p
12⋅⋅v2⋅lengthfactor
f (2) function e.g. f(x)
f (3) focal length, m
f# f-number (focal length normalised by aperture diameter)
h heat transfer coefficient, W/(m2·K); some authors use α instead
H channel height, m
I intensity (unscaled)
i, j discrete coordinates (like x, y)
J effectiveness of heat transfer augmentation, - (dimensionless),
k thermal conductivity, W/(m·K); some authors use λ instead
L (characteristic) length, m
M magnification factor, -
N number; often number of pixels or particles (compare NI and NpixI)
NI number of particles in an interrogation area; chosen to comply with [Raf98]
NpixI (explicitly) pixels per side of an interrogation area (i.e. NpixI x NpixI pixels)
Nu Nusselt number, - (2-4)
O[...] on the order of
OD optical density, - (dimensionless)
p, ∆p pressure / pressure drop, Pa
Pr Prandtl number, - (2-3)
xiii
Notation
r radius, m
Re Reynolds number, -; (2-2)
s length or distance, m
t time, s or thickness, m
t1, t2, ∆ttime of the first and second laser flash (light pulses);
time between pulses ∆t = t2 – t1
v velocity, m/s
x,y,z coordinates or lengths, m
z0 image – lens distance, m
Z0 object – lens distance, m
Greek:
δ dimple depth, m
ε error
λ wavelength of a photon (i.e. wavelength of light)
ρ density, kg/m3
τ transmission ratio (ratio of transmitted to total power impinging on a surface)
Symbolic:
[...] Matrix or functional bracket
() functional brackets or coordinates
xiv
Chapter 1 - Introduction
1. Introduction
1.1 Background and Aim
Concave dimpled surfaces are known to increase heat transfer rates whilst keeping the
associated increase in pressure drop (compared to a flat wall) lower than with other heat
transfer enhancement methods such as ribs and fins, thus allowing higher energy
efficiencies to be achieved ([Leo04a]). Current research at the UNSW School of
Mechanical Engineering aims at gaining further understanding of the physical
mechanisms causing the favourable performance of dimpled surfaces. This involves
studying the flow structures in and around dimples using both computational and
experimental methods, with the experimental methods playing a major role in validating
the numerical results.
The aim of the project presented in this report is therefore to establish a two-
dimensional particle image velocimetry (PIV) system suited for measuring flow across
dimples as well as for use in other applications. PIV involves creating two short flashes
of light distributed in a plane. Particles added to a flow areilluminated during the laser
light flashes and recorded using a special double frame camera. The flow velocity is
then estimated by dividing the displacement of the particles between the two flashes by
the elapsed time (Chapter 3).
1.2 Initial Situation and Approach
To obtain some background information on the main topics thefirst step involved
acquiring some knowledge on flow around dimples and on the PIV method. Both topics
are briefly addressed in Chapters 2 and 3.
Starting point for the PIV system was a pulsed laser (Appendix 1), which (among
others) previously was used in the PhD of Stephen Hall ([Hall01a]) and the work of
Ivan Tan ([Iv02]), both investigating the flow over a backward facing step. The laser
turned out to be defect and had to be sent to Lithuania for repairs. Setting the repaired
laser back up again involved obtaining further in depth laser knowledge which is
1
Chapter 1 - Introduction
covered in Chapter 4.
The previously used light sheet delivery system as designed by Stephen Hall ([Hall01a])
was no longer available hence an alternative had to be found.Initially it was planned to
purchase a custom designed light sheet or alternatively a more standard one as designed
by manufactures of commercial PIV systems such as Dantec andILA ([Dan02],
[ILA03b]). However these turned out to be too expensive, hence it was decided to
design a cheaper light sheet based on standard components available from Edmund
Optics (www.edmundoptics.com). This is covered in Chapter 5.
A new PIV camera together with a suitable frame grabber was acquired as well. Both
worked out of the box without causing further difficulties.Their use together with
further information on imaging is given in Chapter 6. The synchronisation between
camera and laser is covered in Chapter 7.
Proper seeding of the flow with reflective particles is one of the most critical issues for
successfully applying the PIV method. Important issues such as light scattering, ability
to follow the flow and health hazards are discussed in Chapter 8.
Finally different types of seeding particles have been tested using the school's ILA PIV
system as well as the PIV system built during this project, with the results being
discussed in Chapter 8 and the test setup presented in Chapter 10.
2
Chapter 2 - Flow Over Dimpled Surfaces
2. Flow Over Dimpled Surfaces
2.1 Introduction
Knowledge of the measurement apparatus / method, which in this case is PIV, alone
will not guarantee that the actually measured results are useful. Instead one also has to
be aware of any simplifications made during the measurements, what the experimental
boundary conditions are (e.g. laminar or turbulent flow) and to what kind of practical
real world conditions or numerical boundary conditions these experimental results
should compare to.
A common way of describing fluid- and thermodynamic problems in order to allow
comparison with other situations is by using characteristic dimensionless numbers.
Ideally all these non-dimensional parameters occurring inan experiment should be the
same as in the real world, thus complete similarity would be fulfilled. However, this is
not usually the case and therefore the experimentalist has to be aware of the
simplifications made and the potential consequences thereof. It is also helpful to
develop an understanding of the problem investigated by drawing from the results and
conclusions of others.
In this respect it is the purpose of the following subchapters to summarise potentially
helpful information found in literature to raise the awareness of what might have to be
considered for PIV measurements on flow across dimples. It is not intended however to
cover all the previous work and findings as this can already be found in [Leo04a] and
the references therein.
2.2 Dimple Geometry
A single dimple is typically a spherical and concave cavity in a surface characterised by
radius of curvature, print diameterDp and dimple depthδ as shown in Figure 2.1. It
follows from geometric relations that the curvature radiusis directly related to the
parametersDp and δ, and thus the dimple is commonly characterised by the ratio of
dimple depth to dimple print diameter δ/Dp.
3
Chapter 2 - Flow Over Dimpled Surfaces
An approach to further reduce the complexity of initial measurements and CFD
calculations is to replace the three-dimensional dimple with a two-dimensional concave
cylindrical channel as used in initial testing of the current PIV system. Due to the
strongly three-dimensional nature of the vortices described in Chapter 2.4, this
simplification is mainly useful to gain experience in doingthe measurements and
calculations, while it seems likely that results from such atwo-dimensional approach
won't be realistic enough to be of direct use.
Series of spherical dimples can be arranged on a diverse number of surfaces ranging
from simple rectangular or cylindrical channels as in references [Burg03] and [Bunk03],
to more complex objects such as gas turbine blade cooling passages ([Khal01]), as
shown in Figure 2.2.
(a) Rectangular Channel (b) Circular Channel(c) Turbine Blade
Figure 2.2 Possible applications of dimples (overview).(part c from reference [Khal01], Fig. 1; parts a and b similar to references [Grif03] and [Bunk03])
It appears that there is a vast (infinite) number of possibilities for the number, size and
geometrical arrangement of the dimples relative to each other. In order not to further
4
Figure 2.1 Schematic of a dimple. Dp: print diameter; δ: dimple depth &r: dimple radius (compare [Burg03], Fig. 3)
δ
Dp
r r=
2
D p2
8⋅
Chapter 2 - Flow Over Dimpled Surfaces
complicate things these are not further discussed at this place. Among the more
important geometrical scales are a characteristic global length, typically the channel
height or hydraulic diameter and the normalised dimple depth δ/Dp.
2.3 Important Characteristic Numbers
2.3.1 Introduction
As indicated in Chapter 2.1 characteristic numbers are usedto describe the flow in a
way that allows comparison between different models (different in scale, fluid
properties, ...). They are typically divided into independent and dependent
dimensionless numbers. The dependent dimensionless numbers can be expressed as a
function of the independent ones. In the current case of forced convection (forced flow
over a dimpled surface), the Nusselt number characterisingthe heat transfer rate
(Equation (2-4)) is – for a given geometry – predominantly a function of Reynolds (2-2)
and Prandtl (2-3) numbers as shown in Equation (2-1). Dimplerelated practical
applications can be found in the work of Vicente et al [Vic02b] for example where this
relation (2-1) was used in their study on dimpled tubes.
Nu=NuRe,Pr ,Geometry Equation (2-1) - Nusselt number dependencies(compare with the equations used in [Inc02], Chapter 8)
Further information as well as more in depth explanation of the dimensionless numbers
and relations presented can be found in standard literatureon heat transfer such as
[Inc02] or [Kr99], of which both have been used for preparingthis chapter. Note that as
the focus is more on giving an overview not all potentially useful dimensionless
numbers are covered.
2.3.2 Independent Characteristic Numbers
The problem geometry as discussed in Chapter 2.2 can be described by normalising all
lengths with a suitable reference length scale L. In case of heat transfer across the walls
of a channel the characteristic length is typically chosen as the channel (hydraulic)
diameter or height as in references [Burg03] and [Grif03]. Anumber of other
normalisations can be useful as well such as the ratio of dimple depth to dimple print
5
Chapter 2 - Flow Over Dimpled Surfaces
diameter δ/Dp mentioned in Chapter 2.2.
Arguably one of the most important non-dimensional numbersdescribing the flow
condition is the Reynolds number (2-2), which is the ratio of inertia and viscous forces.
Re=⋅v⋅L
Equation (2-2) - Reynolds number(compare with [Leo04b] and [Inc02], Table 6.2)
In many cases the flow conditions are predominately dependent of the Reynolds
number. This is especially true for subsonic flows and whereno further addition or
removal of energy from or to the flow occurs (i.e. by means of mass-, momentum-, and
heat transfer). As heat transfer is involved in the study of dimpled surfaces, the effect of
adding or removing thermal energy would strictly seen have to be accounted for as well.
By assuming that the effect thermal energy has on the flow is low compared to the
Reynolds number, initial measurements to study the effect of dimple geometry on the
flow can still be made without having to impose a heat flux. Isaev and Leont'ev [Isa03]
for example made a similar simplification in their numerical analyses by first solving
the dynamic problem and then solving the energy equation forthe pre calculated
velocity field.
Pr=
k /cp
Equation (2-3) - Prandtl number(compare with [Leo04b] and [Inc02], Table 6.2)
The Prandtl number (2-3), which is solely dependent of the fluid material properties,
can be interpreted as the ratio between momentum diffusion and diffusion of heat.
Studies investigating the effect of Prandtl numbers on the heat transfer in dimpled tubes
have been made by Vincente et al. ([Vic02a] & [Vic02b])
2.3.3 Dependent Characteristic Numbers
The Nusselt number (2-4) and the effectivenessJ (2-5) are two dependent non-
dimensional results of special interest, with the former allowing the calculation of the
heat transfer rate and the latter allowing the relative advantage of an augmented over a
smooth surface to be judged. While non of the two are a direct result from flow velocity
measurements, it is of interest to relate their behaviour toand partially explain them
with the observed flow structures.
6
Chapter 2 - Flow Over Dimpled Surfaces
The Nusselt number, Equation (2-4), can be interpreted as the total convective heat
transfer rate across a given temperature difference normalised by a hypothetical
conductive heat transfer rate through the same medium and same temperature drop.
Nusselt numbers can be given locally (i.e. at a certain location in space) or as a global
average.
Nu=h
k /LEquation (2-4): Nusselt number
(compare with [Leo04b] and [Inc02], Table 6.2)
The parameter J as described in Equation (2-5) is used to showthe increase in heat
transfer in relation to the increase in friction factor, with higher values indicating better
performance. Chen et al. [Chen01] have pointed out that J is (at least in part) dependent
of the Reynolds number (J=J(Re,...) ), which thus must be taken into account for
comparisons.
J=ha/hs
f a/ f s
Equation (2-5): effectiveness of heat transfer augmentation(from [Leo04a], page 30; a = augmented & s=smooth; also compare [Chen01])
2.4 Flow Features and Further Important Aspects
It is known that flow across dimples is an unsteady phenomenawith vortex shedding
occurring [Leo04a]. This infers that not only the time-averaged but also the
instantaneous flow-field can give valuable information for the analysis. Mahmood /
Ligrani et al. [Mah01] for example paid particular attention to how the augmentation of
local Nusselt numbers relates to the (instantaneous) localflow structure caused by
dimples.
One can expect that an important feature to be measured will be the secondary flow
occurring in and around dimples as shown in Figure 2.3. A feature of these secondary
flows is that they "promote mixing with the bulk of the flow" and thus enhance heat
transfer ([Leo04a], page 31). It follows that the measurement region is not only around
but also inside the dimples.
7
Chapter 2 - Flow Over Dimpled Surfaces
Figure 2.3 Plane view (a) and side view (b) of the flow in a dimple.(from [Leo04a], Figure 1)
The three-dimensional sketch of the flow structure around adimple based on
instantaneous flow visualisations with smoke, as made by Mahmood / Ligrani et al
[Mah01], further illustrates just how highly three-dimensional the flow structure is
(Figure 2.4). It also becomes clear that not just the flow in the main flow direction but
also the flow in the plane perpendicular to it is of central importance. Mahmood /
Ligrani et al. [Mah01] further state that these vortices areof particular interest as their
fluid mass transport together with the associated thermal transport produces heat
transfer augmentation noticeable by the increase of local Nusselt numbers. It was
further found that the vortex shedding occurred periodically and the importance of the
reattachment of the shear layer forming across the top of each dimple was mentioned
([Lig01]). More detailed description of the vortices observed by Ligrani et al. can be
found in [Mah01] and [Lig01].
Figure 2.5 shows a conceptualised description and overviewof the flow features
together with their effect on heat transfer enhancement as outlined by Griffith et al.
8
Figure 2.4 Sketch of a three-dimensional flow structure around a dimple.(from [Mah01], Fig. 4)
Chapter 2 - Flow Over Dimpled Surfaces
[Grif03]. The dimple will first cause the flow to separate, resulting in a recirculation
zone, where heat transfer is low and a flow reattachment zone, where heat transfer is
high. The flow leaving the dimple will then induce (periodical) shedding of vortex pairs
and cause a large upwash region. Flow in the upwash region will mix with the cold core
flow and the shedded vortex pairs will further facilitate heat transfer in the downstream
region.
9
Figure 2.5 Conceptualised description of secondary flow effects.(from [Grif03], Fig. 4)
Chapter 3 - The PIV Method
3. The PIV Method
3.1 Introduction
The aim of this chapter is to give an overview of how a 2-component (2-C) PIV system
works and to give an insight in some of the more detailed but nevertheless important
aspects. Apart from addressing the possibilities and limits of the method it is
additionally intended to show the fundamentals in a way thatwill allow to an
understanding on how to optimise and judge the quality of PIV results.
While the basic principle covered in Chapter 3.2 is fairly straightforward to understand,
achieving proper results and exploitation of the method's capabilities requires further in
depth knowledge. Owing to the complexity of the details, literature sources such as
[Raf98], [West93] and [West97] tend to cover the important information in an very
mathematical way which is not always easy to understand, especially for readers having
only little previous experience in using the applied (mathematical) methods. With this
in mind the intent of the following chapters is to present theimportant information
about PIV in a simple and understandable way.
Note that as the PIV system designed during this project is a 2-C PIV system the
emphasis is set on 2-C evaluation methods. Although 3-C (stereoscopic) PIV is briefly
mentioned in Chapter 3.3 and many methods can be used in 2-C aswell as in 3-C,
several aspects – among others the uncertainty and errors – are not addressed in this
place. Further information on 3-C PIV can be found in [Raf98]as a starting point.
Given the ongoing improvements of stereoscopic PIV, newer papers should also give
further information. Additionally manuals from PIV manufacturers such as Dantec
([Dan00b]) and LaVision ([LaV02a] - Chapter 13) provide valuable theoretical as well
as practical information on stereoscopic PIV.
3.2 PIV – The Basic Principle
3.2.1 Velocity = Displacement per Time
Figure 3.1 shows the schematic of flow in a rectangular channel seeded with tracer
10
Chapter 3 - The PIV Method
particles. The fundamental principle underlying PIV is to image the flow at two
different times (t1 and t2), with a time difference small enough that most of the tracer
particles are on the image at both times. By assuming that theflow velocities are
approximately equal to the particle velocities, the flow velocity field can be determined
by the displacement of the particles over time.
3.2.2 Introduction to Estimating the Displacements
By moving out of bounds some particles get lost and new ones appear between the two
recordings (times t1 and t2 on Figure 3.1). This moving out of bounds gets more likely
the higher the time between the two recordings is and hence the time has to be kept low.
Shorter times between the recordings however result in smaller displacements and thus
higher relative uncertainties of the displacements.
It follows that if an automated procedure were to concentrate on single particles alone,
the evaluation of the displacement would often not work (lost or new particles) and
have a high uncertainty. To overcome this the PIV method estimates the displacement
of particle groups contained in interrogation regions. These interrogation regions, as
indicated in Figure 3.2 and Figure 3.3, ideally contain about ten particles (compare
Chapter 3.7.7). This allows the determination of a statistical mean displacement and is
far less sensitive to the occurrence of lost and added particles.
With the exception of more sophisticated photographic methods or special situations
11
Figure 3.1 Imaging seeded flow.
xy
x
y
t
t1
t2
⇒
Camera
Seeding
seeded flowat time t1
seeded flowat time t
2
Chapter 3 - The PIV Method
(like very slow flow) it originally only was possible to record both instances of the flow
(t1, t2) on one single frame as shown in Figure 3.2. This still allowed to determine
magnitude and direction (albeit not the sign) of the velocities to be determined
statistically by the use of autocorrelation explained in Chapter 3.5. This single frame –
double exposure approach was further improved by image shifting methods ([Raf98],
Chapter 4.3) allowing to determine the sign of the velocities. Further variations include
making n-exposures (i.e. t1, t2, t3, t4, ...) on one frame.
At time of writing the single frame – double exposure approach has become very
unusual and PIV recording nowadays make use of the double frame – single exposure
method. As shown in Figure 3.3 the two instances in time (t1 and t2) are recorded on
separate frames. This method has the advantage that the signof the velocity is clear,
that it is less susceptible to noise in the image and that it asa consequence allows higher
resolution of the velocities ([Raf98], Chapter 4.4). Because this approach is now
predominant the remainder of this report will assume the single frame – double
exposure method is used expect stated otherwise.
Once the displacements have been determined the velocity vector field can be
calculated by dividing the displacement vectors by the timebetween the exposures
(Figure 3.4). Even in good quality PIV recordings it is likely that a few vectors will be
erroneous which requires the validation and further post-processing of the vector field
12
Figure 3.2 Single frame, double exposure (both instances t1 and t2 on the same frame);Statistical evaluation of ∆x and ∆y by autocorrelation.
x
y
displacement ∆x and ∆yparticle at
time t1 particle at
time t2
one double exposed picture
interrogation area
Chapter 3 - The PIV Method
as described in Chapter 3.6.
Figure 3.3 Double frame, single exposure (each instance t1 and t2 on a separate frame);Statistical evaluation of Dx and Dy by cross-correlation.
Figure 3.4 Determining vector velocity fields.
3.2.3 A Typical ('Standard') PIV Measurement Setup
A typical PIV system as shown in Figure 3.5 consists of two powerful lasers (usually
Nd-YAG) allowing two pulses of light to be created with a freely selectable time
separation. These light pulses are made coincident and passed through a light sheet
optics, generating a plane sheet of light illuminating particles in the flow. The short
light duration on the order of 5 nanoseconds generates a 'frozen' image of the flow.
Using a special double frame PIV camera allows the two illuminations of the flow to be
stored on two separate frames. Camera and laser are synchronised using a
13
x
y
two single exposed pictures
interrogation area
particles at time t
1
particles at time t
2
displacement ∆x and ∆y
x
y
→ vector fieldvx
vy≈ x
y⋅1
t1−t2
Chapter 3 - The PIV Method
synchronisation unit either available as a computer card oras an external unit. The
synchronisation unit (and in turn laser and camera) is controlled from a computer which
usually also runs some sort of PIV software allowing the evaluation of the recorded
images.
Figure 3.5 Typical (2D) PIV setup.(Idea originating from [Raf98], Fig 1.4 and [Dan00a], Fig 4.1.)
3.2.4 More General PIV Setups
Basically any method resulting in pictures which can be evaluated by the PIV method as
described in the previous chapters could be called a PIV system. In the past PIV
systems have consisted of analog (film) cameras, standard consumer video devices,
continuous wave (not pulsed) lasers, flashlamps and several other alternative devices.
Interestingly even the actual evaluation can be done without using computers. Before
reasonably (for PIV) powerful computers were readily available the PIV evaluation was
14
2 Laser Heads
Beam Combining Optics
Laser PowerSupply
Light Sheet Optics
Double FramePIV Camera
Seeded Flow
Computer with Internal or External Synchronisation Hardware and
PIV Evaluation Software
Light Sheet Illuminated
Particles
Chapter 3 - The PIV Method
often based on optical rather than computational methods (compare [West93] pages 17-
19). Once again more detailed information on this topic can be found in Raffel et al.
([Raf98]).
3.2.5 Summarised Approach
When using a 'standard' PIV setup as described in Chapter 3.2.3 the necessary steps
involved summarised are as follows (compare with reference [Dan00a], Chapter 4-2):
• Seeding of the flow.
• Illumination of the seeded flow (laser, light sheet optics).
• Imaging of the seeded flow (camera, lens).
• Synchronisation of camera, light source and other devices (e.g. phase of an engine).
• Calibration of the imaged length scales (pixel ↔ meters).
• Optimisation of image quality (seeding density, particle size, preconditioning), pulse
separation time (t1, t2 → ∆t) and other parameters.
• Cross-Correlation analyses.
• Data validation.
• Further postprocessing (interpolation, averaging, calculation of vorticity, data
visualisation, ...).
3.2.6 Further Properties of the PIV Method
Following some of the more important properties of the PIV method are listed (except
where noted the list is based on [Raf98], Chapter 1.2):
• PIV is a non-intrusive technique. Unlike measurement methods based on pitot tubes
and hot wire techniques, no physical bodies are present in the flow field.
• PIV is an indirect measurement method as not the actual flow but the seeding
particles transported with the flow are measured .
• Seeding plays an important role in accuracy ([Bol99], page 4); compare Chapter 3.7.
• PIV is a whole field technique. While other methods such as LDA/LDV, hotwire and
pitot tube can only measure at one point, PIV allows a whole flowfield to be captured
at an instance in time.
• The temporal resolution of PIV is very low. The achievable double frame rate is
15
Chapter 3 - The PIV Method
typically on the order of 4-20 Hz, which usually is not sufficient resolve unsteady
flow over time ([Bol99], page 3). However more recent developments resulting in
faster lasers and cameras do allow frame rates on the order of4000 frames per
second, and so called time resolved PIV systems for flows of lower velocity are now
available from manufacturers such as Dantec and LaVision
(www.dantecdynamics.com, www.lavision.de).
• The raw PIV data is stored in form of a picture before further processing. In contrast
to LDA/LDV and CTA/CTV methods, which commonly evaluate theraw signal
'instantly', many variations in the PIV evaluation parameters can be applied without
having to repeat the experiment.
3.3 A Short Note on 3 Component (Stereoscopic) PIV
There are a number of methods to measure the third velocity component in PIV. The
more common ones are dual plane and stereoscopic PIV. Stereoscopic PIV always
involves the use of two cameras to resolve the third component, while dual plane PIV
setups can range from using one up to four cameras, with the third component being
determined by use of a second light sheet.
The author found the dual plane method a bit less simple to understand when going into
details, especially when considering the many options available, ranging from using just
one camera and two light sheets to using up to four cameras, then allowing to determine
vorticity in three dimensions (not possible with 3C-PIV in a2D plane). It appears that
stereoscopic PIV is more commonly used and being aware of itsadvantages gives a
better understanding of the difference to the 2C-PIV systemdeveloped during this
project. Readers interested in dual plane PIV are thereforereferred to literature such as
references [Raf98] (Chapters 7.2 and 8.4) and [LaV03a].
The following introduction on stereoscopic PIV is based on information found in
[Raf98] (Chapters 7.1 and 8.3), [LaV02a] (Chapter 13) and [Dan00b].
As shown in Figure 3.6, stereoscopic PIV consists of having two cameras look at the
illuminated area from different perspectives. Due to the not perpendicular viewing angle
achieving a focused image requires tilting the camera lens relative to the camera axis by
16
Chapter 3 - The PIV Method
following the Scheimpflug correction method explained in Chapter 6.8.
Having images from two different perspectives allows a location in space to be
reconstructed from the two projections on the camera plane.While the necessary
relations for three-dimensional reconstruction could be calculated theoretically it is
more common to generate a mapping function based on images ofa 3D calibration
target.
To prevent the particles from moving out of the plane and to allow movement in the
third dimension to be imaged the light sheet thickness can now range up to 10mm
instead of the 0.5-1mm used in 2C-PIV ([Dan00b], Chapter 4.2.2). As a consequence
higher power lasers are required.
Figure 3.6 Two component vs three component (stereoscopic) PIV setup.(from [LaV02a], Fig. 13.1)
In operation standard 2C- PIV images are recorded and the vector fields thereof
calculated. Each of these vector fields will have a perspective error but using the
mapping function to combine them eventually results in a theoretically correct field of
three-dimensional vectors in a plane as indicated in Figure 3.7.
17
Chapter 3 - The PIV Method
Figure 3.7 Stereoscopic PIV evaluation.(from [LaV02a], Fig. 13.9)
3.4 Distinction between PIV and other Methods such as PTV
Newbies to the PIV method and less experienced users are often unsure of what
characterises an image suitable to be evaluated by the PIV method. Given that the
concept of determining displacements by comparing two images taken at the same
spatial location but at different times is straightforwardto understand, it is tempting to
assume that the PIV method will allow determining the displacement of almost any
moving pattern. In theory and practice however the suitability of PIV to determine
displacements and the accuracy of results is highly dependent of seeding density and
particle size (both discussed in Chapter 3.7), with an example of of a good quality PIV
image shown in Figure 3.8.
Figure 3.8 PIV Image (single exposure).(from [LaV02a], Fig. 4.1)
18
Chapter 3 - The PIV Method
As indicated in Figures 3.9a and 3.10a the seeding density used for PIV measurements
is somewhere between the two extremes of very scarce and very dense seeding.
Once the number of particles per interrogation area falls below unity the particle
tracking velocimetry (PTV) method can be used to track the movement of single,
'isolated' particles. Unlike PIV, PTV velocity vectors arenot evenly distributed but
occur randomly at the location of each particle. As stated byWesterweel [West93], this
has got the consequence that PTV "cannot fully resolve the displacement field" which is
a disadvantage compared to PIV. Other more practical issuesare that evaluation
algorithms will tend to fail as soon as there is more than one particle in an interrogation
area or when particles move out of or in bounds (get lost or appear) between the two
illuminations. The PTV method is thus only applicable in special situations where the
control over the seeding density and image quality is excellent.
Figure 3.9 The three modes of particle density as described in [Raf98], Fig 1.5.(a) low density – PTV; (b) medium density – PIV; (c) high density – LSV
At very high densities coherent (laser) light reflected from a particle will overlap with
light from other particles resulting in random interference patterns, called speckles
(speckling) hence the name laser speckle velocimetry (LSV). According to [West93]
(page 14), LSV images can in theory be evaluated in the same way as PIV images but,
as Bolinder [Bol99] points out, LSV will increase the rms error. Additionally the author
has found that in practice the evaluation of overly dense images tends to predominately
results in erroneous vectors except when the contrast between different regions is high.
It also appears that the examples shown in literature seem topredominately consist of
medium density PIV data as shown in Figures 3.9b and 3.10b andLSV is not directly
19
Chapter 3 - The PIV Method
mentioned in the manuals of PIV manufacturers. This indicates that very densely seeded
images are considerably less suited for the evaluation of flowfields.
Figure 3.10 The three modes of particle density as described in ref. [West93], Fig 1.4.The circle indicates the size of the interrogation area.
3.5 Correlation Analysis
3.5.1 Introduction
An outmost central part of a PIV analysis is determining the displacement of a group or
pattern of particles in an interrogation region (compare Chapter 3.2.2). It is desired to
achieve accurate results calculated in an time efficient way.
Dedicated literature ([West93], [West97], [Raf98]) typically addresses the correlation
analysis in a mathematical fashion which for the inexperienced is not straightforward to
understand. Even references keeping the mathematics a bit simpler ([Bol99] for
example) require some more in depth understanding of the mathematical approach. To
gain a better understanding it was therefore found that moregeneral sources on signal
analysis not directly related to PIV such as [Rand04] can be very helpful.
Giving answers on limits of the PIV method such a accuracy andbiases requires a
minimal understanding of the correlation method. The following chapters intend to
present this in a very simple way whilst still showing some ofthe simpler mathematical
relations.
3.5.2 Cross-Correlation
In the cross-correlation analysis the seeding particles attwo instances in time are
20
Chapter 3 - The PIV Method
available as separate images. If these were printed on transparencies the two images
could be moved relative to each other until qualitatively a best possible overlap is
found. The relative position of the images to each other is then directly related to the
displacement of the particles as shown in Figure 3.11.
Figure 3.11 Cross Correlation: Finding the best overlap of the two images.
With digital camera recordings the image data is stored in matrix form ([I 1], [I 2] in
Figure 3.11). Mathematically the overlapping can be done bymoving the indexes of the
two matrices relative to each other by a discrete (pixel) amount (∆i,∆j); e.g. [I1](i, j)
↔ [Ι2](i+∆i, j+∆j). A good overlap will have the feature that pixels of high intensity will be
very likely to overlap with pixels of high intensity. Multiplying those pixel intensity
values will then yield a high value. A poor overlap will cause a pixel of high intensity to
overlap with a random intensity value. Multiplication can then yield anything from low
to high intensity values. Summing up this multiplication over all pixels will in case of a
poor overlap result in a very low value while a good overlap will result in very high
correlation values. The mathematical expression of this isgiven by Equation (3-1)
(compare [Raf98] (5.1); [Käh04] (2.4) and [Bol99] (5)). To find the most likely
displacement R(∆i, ∆j) has to be maximised.
21
∆i∆ j
ji
∆i
∆ j
Image 1, Intensity Matrix [I1]
displacement∆i, ∆j
∆i'∆j
'
partial overlapdisplacement ∆i', ∆j'
'best fit' overlap→ displacement ∆i, ∆j
⇒
Image 2, Intensity Matrix [I2]
Chapter 3 - The PIV Method
R i , j = ∑ i=−N
N
∑ j=−N
N
I 1i , j ⋅I 2i i , j j Equation (3-1)
Cross-Correlation function
Figures 3.12 through 3.14 visualise this whole procedure in one dimension.
Figure 3.12 Particles moving in one dimension.
Figure 3.13 Cross-Correlation in one dimension.
22
i
I1(i)
Image 1,intensity I
1 at location i
i
I2(i)
Image 2,intensity I
2 at location i
∆i
i
particle displacement ∆i between images
particles at t1 particles at t
2
i
I1(i)
Image 1,intensity I
1 at
location i
i
I2(i+∆i')
Image 2,shifted ∆i' backwards
i
I12
(i, ∆i')=I1(i) · I
2(i+∆i')
partial overlap→ sum of intensities is low (Σ
i I
12 = 17)
mul
tiply
i
I1(i)
Image 1,intensity I
1 at
location i
i
I2(i+∆i)
Image 2,shifted ∆i backwards
i
'best' overlap→ sum of intensities
is maximal (Σ
i I
12 = 419)
mul
tiply
I12
(i, ∆i)=I1(i) · I
2(i+∆i)
Chapter 3 - The PIV Method
As shown in Figure 3.13 shifting image I2 by an amount∆i' and multiplying with image
I1 results in very low intensity2 values when the overlap is poor and in very high values
when the overlap is good. The sum of intensity2 values over all pixel locations i will
give a good indication of the overlap agreement. Calculating this sum over all possible
displacements∆i gives a function as shown in Figure 3.14 with a maxima occurring at
the most likely displacement.
Figure 3.14 Correlation function vs displacement; the most likelydisplacement will have the highest peak.
Performing the same calculations in a plane (Equation (3-1)) will result in a two-
dimensional function as shown in Figure 3.15, which is the equivalent of Figure 3.14.
Figure 3.15 Cross-correlation function.(from [Käh04], Fig. 2.12)
As stated previously this introduction to cross correlation is only a very simple
description. Most of the information is based on more detailed material which can be
found in references [Käh04], [Raf98], [LaV02a], [Dan00a] to name a few.
23
0 4 8 12 16 20 24 28 320
200
400
∆i
∑i
I12 i , i
highest peak → most likely displacement
Chapter 3 - The PIV Method
3.5.3 Auto-Correlation
When it is not possible to generate separate images single frames with multiple
exposures have to be made. The displacement can be determined using the auto-
correlation function, which essentially is a cross-correlation of the multiply exposed
image with itself ([I1] = [I 2]). As a consequence of 'merging' two images to one some
information is lost, which expresses itself by a loss of the sign, i.e. it is no longer
possible to determine whether the displacement is positiveor negative except when
special tricks such as image shifting are applied ([Raf98], Chapter 4.3).
Figure 3.16 Auto-correlation of a double exposed image.
The reason for the loss of sign becomes apparent from Figure 3.16. Again using the
transparency analogy it becomes apparent that the best agreement of the two now
identical (!) transparencies is obviously when no displacement occurs at all. Next to this
super-maxima two smaller maxima appear when moving the transparencies in either
direction. This situation with three peaks is shown in Figure 3.17.
While in the early days of PIV analysis auto-correlation wasoften the only option
available it has now become increasingly obsolete. Reasonsfor this are not only the
problem of directional ambiguity but also the increase in noise and decrease in
24
∆i
∆j
ji
∆i
∆j
Image 1 Intensity Matrix [I1] = Image 2 Intensity Matrix [I2] ([I1]=[I2])
displacement∆i, ∆j
best agreement:image
overlapping itself
⇒
−∆i
−∆j
first maxima'backwards' second maxima
'forwards'
Chapter 3 - The PIV Method
resolution ([Dan00a], Chapter 4.4.1.3). More informationon auto-correlation of PIV
images can be found in [Raf98], [Dan00a] and [Bol99].
Figure 3.17 Auto-correlation function.(adapted from [Raf98], Fig. 3.9)
3.5.4 Increasing the Evaluation Speed by FFT
Using Equation (3-1) to calculate the correlation functionfor an image region sized
NxN pixels (e.g. 32x32) requires on the order of N4 summation operations, which when
performed over a larger number of pictures can become very time consuming even with
modern computers. A neat trick which can be applied to drastically reduce the number
of operations uses theWiener-Khinchin relationship, which states that the Fourier
transform of the correlation function results in the complex conjugate multiplication of the
Fourier transforms of the two individual images ([Rand04],Unit 7). If the fast Fourier
transform is used as shown in Equation (3-2), the calculation becomes very efficient and the
number of operations reduces from O[N4] to O[N2·log2(N)] ([Raf98], Chapter 5.4). For an
interrogation region sized 32x32 pixel this adds up to a reduction from 1'048'576 to merely
5'120 operations. Although a single FFT operation is likelyto take a bit longer than a
simple summation the time saving can in some situations evenreach the order of a factor of
1000 ([LaV03b], Chapter 3.4).
25
Chapter 3 - The PIV Method
R i , j = ∑ i=−N
N
∑ j=−N
N
I 1i , j ⋅I 2i i , j j =ReFFT−1FFT I 1*⋅FFT I 2
Equation (3-2) Cross-Correlation function (Compare [Bol99], equation (6))
Nothing's free, also when using FFT and so there are a number of tradeoffs in applying
the FFT transform. These tradeoffs are due to the underlyingassumption of the FFT
that the transformed data is periodic, which strictly seen is not true for the theoretically
random seeded PIV images. If not dealt with properly the FFT transform will introduce
a number of unwanted 'errors' most notably high frequency noise (aliasing etc.), and a
bias towards lower velocities. As readers familiar with signal processing will know
these problems can be addressed by using window functions overlaid with the image, a
process which in turn will have new consequences and therefore is not addressed here
(interested readers are referred to [West93], [Raf98], [LaV03b], [Dan00a]).
Despite these pitfalls the massive advantage in speed makesit worth using the FFT
approach and one can assume that dedicated software packages will handle the
calculations appropriately.
In a final note and as mentioned previously it is interestingto know that the Fourier
transform of PIV images can also be carried out using opticalmethods as described by
Raffel et. al in [Raf98], Chapter 5.3.
3.5.5 Subpixel Interpolation
As a digital picture consists of discrete pixels, the correlation function as shown in
Figures 3.14 and 3.15 has got discrete maxima. What before digitisation was a
continuous function with a real value peak has been reduced to integer values.
Neglecting other uncertainties the actual location of the maxima could be anywhere on
the pixel, which leads to an associated uncertainty of ±0.5 pixels ([Raf98] Chapter 5.4.4
and [Hua97], Chapter 2.2).
As in PIV there is more than one particle going into the correlation analysis and as a
particle ideally will span more than just one pixel on the image, there are a number of
effects which eventually allow the displacement to be determined to subpixel accuracy.
Firstly, having more than one particle on the image will result in a kind of averaging of
26
Chapter 3 - The PIV Method
the correlation function. Raffel et al ([Raf98], page 130) describe this in an example of
an interrogation region where 5 particles are displaced by 2and another 5 by 3 pixels,
with the resulting average being 2.5. Secondly a particle spanning more than one pixel
will result in a gradual ('stepped') rather than a sudden increase of the correlation
function. Particles spanning more pixels will result in broader correlation peaks, with
the correlation peaks themselves spanning more than just one pixel. In this case a
suitable continuous function (typically a Gaussian curve)can be fitted to the discrete
correlation function as shown in Figure 3.18, allowing the displacement to be
determined to subpixel accuracy.
Figure 3.18 Subpixel interpolation of the correlation peak.(compare with Figure 4-31 in reference [Dan00a])
According to reference [Raf98], Chapter 5.4.4, subpixel interpolation allows the
displacement to be determined to an accuracy of 0.05-0.1 pixels for optimal particle
sizes of 2-3 pixels and 8-bit images with good contrast. Larger particles are said to
produce a broader correlation peak, increasing the uncertainty of the maxima, while
particles smaller than 1.5 pixels result in a poor fit as the resulting narrower correlation
peak will cause the values around the peak to be overshadowedby noise. A further
discussion in this respect is given in Chapter 3.7.6 and morein depth information on
subpixel interpolation can be found in [Raf98], Chapter 5.4.4 and [Dan00a], Chapter
4.7.2.
27
4 2 0 2 4 6 8 10 12 14 16 18 200
0.25
0.5
0.75
1
displacement, pixels
no
rma
lise
d c
orr
ela
tion
noise
discrete correlation peak
(6 pixels)
interpolated correlation peak
(6.4 pixels)
curve fitted continuous function
Chapter 3 - The PIV Method
3.5.6 Resolution, Accuracy and Dynamic Range
The topics addressed in this subchapter are closely relatedto subpixel interpolation
described in Chapter 3.5.5 and the information given in Chapter 3.7.
Both resolution and accuracy of PIV measurements are given by the goodness of the
subpixel interpolation described in Chapter 3.5.5. As previously mentioned most
sources claim realistic accuracies on the order of 0.05-0.1pixels to be achievable when
image and evaluation parameters are optimised ([LaV02a], Chapter 4.5.7). The
important image parameters are the particle diameter (2-3 pixels, compare Chapter 3.5.5
), particle density (Chapters 3.4 & 3.7.7) and contrast.
The dynamic range is a measure of the smallest to the largest displacement (velocity)
which can be resolved with reasonable accuracy. In theory the upper limit would be half
the side of the interrogation area NpixI/2 (e.g. 16 pixels for a 32x32 area), in practice
however a quarter of the interrogation area, NpixI/4, is more realistic (i.e. only 8 pixels
for a 32x32 area; compare [Bol99], page 12 and [Dan00a] Chapter 4.7.2.2). The lower
limit is given by the accuracy of the subpixel interpolation.
It follows that without subpixel interpolation the dynamicrange is NpixI/4 : 0.5 =
NpixI/2 : 1 (0.5 pixels is the accuracy without further interpolation). Image qualities
allowing subpixel interpolation to accuracies of 0.1 pixelfurther increase the dynamic
range to NpixI/4 : 0.1 = 2.5·NpixI : 1.
In this respect the author suggests that the dynamic range achievable with PIV is, as a
very crude rule of thumb, at least the size of the interrogation area NpixI : 1. Note that
increasing the interrogation area will decrease the numberof vectors extracted from the
image and vice versa.
3.5.7 Further Improvements – Adaptive Correlation
When keeping the location of the interrogation areas fixed between the two recordings a
number of particles will appear or disappear by crossing theboundaries as shown in
Figure 3.19. The actual cross-correlation function as given by Equation (3-1)
fundamentally already takes this into account by shifting the first instance of the
correlation area relative to the second as in Figure 3.20. One of the artefacts of
28
Chapter 3 - The PIV Method
calculating the correlation function in the Fourier transform domain however is that it
assumes the interrogation area to be periodic in space, shifting around is thus obsolete
as the data in theory would repeat itself. However when considering Figure 3.19 where
the effect of random seeding particle location can be seen, this is strictly not the case.
Figure 3.19 Loss of correlation due to particles moving out of bounds.
By properly handling the FFT approach using window functions it is still possible to
achieve very good results without having to shift interrogation windows as stated in
Chapter 3.5.4. By first calculating an estimation of the displacement on a fixed
interrogation area and then shifting the two images relative to each other according to
the estimated displacements (Figure 3.20) the noise will begreatly reduced and the
measurement accuracy increased. Several different schemes for applying this method
can be used as outlined in [Raf98] Chapter 5.4.3, [LaV02a] Chapter 4.5.3 and [Bol99]
pp. 10-11.
Note that users of PIV software such as VidPIV have to be awareof the possibility of
increasing the accuracy by adaptive window shifting as the software will not usually do
the shifting process in standard cross-correlation analyses. Further information can be
found in the respective software manuals.
29
ji
Image 1; [I1]
⇒
Image 2; [I2]
particles moving out of bounds
('disappearing')
particles moving into bounds('appearing')
only few overlaps – poor correlation
Chapter 3 - The PIV Method
Figure 3.20 Increasing the correlation by shifting the interrogation areas.
3.6 Post-processing
3.6.1 Introduction
While raw PIV images obtained from the correlation analysisas in the example from
Figure 3.21 usually already contain a lot of interesting information on the flow there is
still a need for further processing. Raffel et al ([Raf98], Chapter 6) group post-
processing into roughly six procedures: Validation of raw data, replacing incorrect data,
reducing data, analysing the information and bringing the results into a presentable
form.
Figure 3.21 'Raw' PIV measurement result showing spurious vectors.(from [West93], Fig. 4.1)
30
trick: offsetting (shifting) the two
interrogation areas relative to each other
⇒good overlap; excellent correlation
Image 1; [I1] Image 2; [I2]
interrogation area shift
Chapter 3 - The PIV Method
3.6.2 Finding Outliers (Erroneous Vectors)
In real world situations if is not always possible to create flawless PIV recordings and
so chances are that spurious vectors such as the odd ones in Figure 3.21 can appear.
These outliers occur when correlation peaks originating from effects such as noise and
poor seeding as shown Figure 3.15 become higher than the actual displacement
correlation peaks.
There are a number of filtering methods suited to eliminate spurious vectors and only
the most basic concepts will be presented here. Filters can roughly be grouped into two
categories: Global filters spanning all interrogation regions and local filters spanning
just a few of the neighbouring cells.
Figure 3.22 2-D global velocity histogram.
The global filter is often applied for a first coarse separation of highly erroneous
vectors. Typically all vectors falling out of an allowable range of x- and y velocities are
filtered out. Determining an allowable range of plausible data can be done by using
two-dimensional velocity histograms as shown in Figure 3.22. The limits of the global
velocity filter can be defined using statistical parameters (i.e. confidence limits),
allowing the global velocity filter to adapt to different PIV results automatically. Note
that not all histograms look similar to Figure 3.22. Flow discontinuities can cause two
regions of dense vector accumulation to exist and accordingto [Raf98] certain sources
31
Chapter 3 - The PIV Method
of noise can appear in distinctive regions of the global velocity histogram (compare
[Raf98], Chapter 6.1.1 and [ILA03a], page 62).
Once the global velocity filters have been applied local velocity filters can be used.
Local filters compare vectors with their neighbours in terms of magnitude and / or
direction to filter out further spurious vectors. The evaluation is again based on statistics
and a number of methods such as mean and median tests exist, with many literature
sources addressing the details ([Raf98] Chapter 6, [Bol99]page 10 and [West93]
Chapter 4.3). It is also helpful to address the manuals of theused PIV software for more
information on the algorithms used.
Another measure of the quality of local vectors is the ratio of the highest to the second
highest correlation peak (P1/P2 shown in Figure 3.23), giving an indication of the signal
to noise ratio. It is pointed out in Chapter 6.3 of reference [LaV02a] however that this
ratio of correlation peaks is "unspecific" and that it is prone to remove many good
vectors as well. Reason for this is that a local increase in noise might give give a bad
SNR but the result can still be in good agreement with its neighbours. Using local
velocity filters based on comparison with neighbours is thus preferable.
Figure 3.23 Signal to noise as a quality criteria.(from [LaV02a], Fig. 6.1.)
For all the mentioned methods there is still a finite probability that valid vectors are
filtered out and special care has to be taken in situations with sudden discontinuities,
namely shocks ([Raf98]).
32
Chapter 3 - The PIV Method
3.6.3 Reconstucting Missing Vectors
Once the filters have been applied the PIV images will contain a number of missing
vectors (gaps). Certain operations such as discrete differentiation will fail when gaps are
occurring hence the need to reconstruct the missing data ([Raf98] Chapter 6.1).
Algorithms to reconstruct missing velocity data are usually based on interpolation of
information from neighbouring vectors and thus are somewhat similar to local velocity
filters. For the filters to work it is important that the datafrom neighbouring cells
suffices to yield reasonable estimations and in case of frequent gaps it may be necessary
to take the data from more distant neighbours into account aswell as explained in
references [Raf98] Chapter 6.2, [Bol99] page 11 and [ILA03a] page 63.
It has to be kept in mind that several algorithms will also manage to interpolate
seemingly sensible looking vectors into regions where gapspredominate and the data is
not sufficient for accurate reconstruction. Checking the filtered PIV vectors for such
regions of poor data prior to interpolation is thus essential for achieving solid results
(compare with the comments in [LaV02a], Chapter 6.4).
3.6.4 Further Processing of Data
Once the complete vector fields have been obtained the PIV data can further be
processed to aid the analysis and interpretation of the flow phenomena.
This can include reducing the data by calculating time average flow fields, comparison
with CFD results, calculation of vorticity generation of animations and further
operations.
Among the further operations is the possibility of smoothing the data, which typically is
done by applying some Gaussian function. While this can result in a nicer looking flow-
field, it will not result in higher accuracy but instead smear out a lot of potentially
useful information. According to [LaV02a] smoothing can beuseful when applied prior
to calculation of derivatives (vorticity for example) as these can react very sensitive to
unsteadiness. Further information can again be found in [Raf98] Chapter 6 and [Bol99]
page 11.
33
Chapter 3 - The PIV Method
3.7 Pitfalls and Errors
3.7.1 Introduction
The intention of this Chapter is the raise the awareness of potential errors and pitfalls
which can be encountered when using PIV. It is also intended to present the issues in a
way that will allow to develop a rough idea of the order of the measurement uncertainty
associated with a certain measurement setup. Basic knowledge of these issues will help
to determine the quality of the measurements, which in turn is essential for justifying
results and showing that a serious and professional approach was taken.
There are numerous sources of error (i.e. deviations from the 'real world' situation) in
PIV. In a first broad categorisation the following three groups are made:
• All modifications necessary to facilitate PIV measurements at the test rig such as the
introduction of seeding particles and optical windows can potentially influence the
visualised flow.
• Errors introduced by the image recording process. This can be due to projection of
the particles, image noise and particle slip.
• Errors introduced by the image evaluation and post-processing methods.
According to Raffel et al. ([Raf98], Chapter 5.5) errors canbe grouped into systematic
errors εsys, which are predictable and residual errorsεres which are random and not
predictable. Separatingεsys andεres in practice is not always possible and thus the total
error is divided into a bias errorεbias and a random errorεrms, of which the latter could be
called the actual measurement uncertainty.
tot=sysresid.=biasrmsEquation (3-3) measurement error (uncertainty)
(from [Raf98], Equations (5.7) and (5.8))
While most types of uncertainties have been shown to be estimateable by theoretical
means ([Raf98]), doing so for an entire problem appears to bea very tedious and, given
the time ranges available in many projects, often impractical task. Nevertheless the
following subchapters will still allow an uncertainty estimation (albeit a coarse one) to
be made by considering what each of the listed effects implies for a particular PIV
application.
34
Chapter 3 - The PIV Method
3.7.2 2-C vs 3-C PIV: A Perspective Error
A central limitation of two-component PIV is that a three-dimensional displacement
will be projected onto a two-dimensional plane. As shown in Figure 3.24 this is not a
problem as long as the particle moving perpendicular is on or close to the optical axis. If
the perpendicular movement is further away from the opticalaxis however the a
perpendicular displacement in the light sheet plane will beprojected onto the camera's
CCD chip as an in-plane displacement, which strictly is not the case.
Figure 3.24 Perspective error – example sketch.(based on combining the written example in [Dan00a] Chapter 4.7.6 with Fig. 2.28 in [Raf98])
A worst case error estimation can be made by assuming that a particle moves across the
whole thickness of the light sheet in the outer region of the visible plane. The resulting
projection error can be calculated by using geometrical relations as shown in Equation
(3-4). As an example: For a camera with d1=1000 pixels at a viewing distance of
L=500mm and a light sheet thickness of 0.5mm a particle moving perpendicular across
the light sheet would already be projected as an in plane displacement on the order of ½
a pixel! This shows that for 2-component PIV measurements itis of outmost importance
35
movement normal to the light sheet→ zero in-plane displacement
displacements normal to the light sheet are zero on the optical axis only
perceived in-plane displacement
→ projection error εp
t
t: light sheet (LS) thicknessL: distance LS-CCD plane
L
d 1 d 1
x2 x1
d1: viewfield lengthd2: CCD width
x1, x2: spacing to the lens principal point
Chapter 3 - The PIV Method
that the main flow velocity lies in the plane and not perpendicular to it.
proj.max=d1
2⋅1−
1
1tL⋅d1
d2
1≈d1
2⋅
ttL
Equation (3-4) Worst caseperspective error for perpendicularviewing; conventions as in Figure3.24
Equation (3-4) assumes a situation where the camera has a perpendicular view on the
light sheet plane. Another situation with worse consequences arises when viewing at an
angle considerably smaller than 90°. Irrespective of special configurations such as
applying the Scheimpflug correction (Chapter 6), the dominant perspective error when
viewing at an angle can be estimated by a simple trigonometric cotangent function as
shown in Figure 3.25 and Equation (3-5). Unlike the perspective error for perpendicular
viewing which varies across the image (no error in the centrewith increasing error
towards the edges) the predominant part of the projection error when viewing at an
angle persists throughout the image.
Figure 3.25 Consequence of viewing at an angle.(from [LaV02a], Fig. 12.1)
proj.angle=dz⋅cotEquation (3-5) Perspective error for viewing at anangle; conventions as in Figure 3.24
Due to the vortices in dimples, which have a significantly large velocity component
perpendicular to the main flow and the necessity to view inside the dimples by tilting
the camera, projection errors are of particular importancefor two-component PIV
measurements on dimpled surfaces.
36
Chapter 3 - The PIV Method
More general equations and further information on the projection error can be found in
references [Dan00a] Chapter 4.7.6, [Raf98] Chapter 2.4.3 and [LaV02a].
3.7.3 Velocity Gradients
Having widely varying velocities within an interrogation region will cause the slower
particles to (in proportion) occur more frequently than thefaster particles. This will
cause the resulting velocity to be biased towards lower values ([Raf98] Chapter 5.5.7
and [Dan00a] Chapter 4.4.3).
Estimating the effect of a particular velocity gradient canbe done by using Monte-Carlo
simulations to create artificial images of known velocity.If own Monte-Carlo
simulations are not an option it is still possible to judge the error by comparing with
simulation results from other authors such as references [Bol99] (Fig. 12) and [Raf98]
(Fig. 5.32; shown in Figure 3.26).
Figure 3.26 Influence of velocity gradients determined by a Monte-Carlo simulation.Conditions: 2pixel particle diameter, 8bit image, no noise – idealised conditions.
NI: number of particles per interrogation area; (from [Raf98], Fig 5.33).
Decreasing the gradient error can be done by reducing the size of the interrogation area,
which requires an appropriate seeding density (number of particles in the image) and
image quality.
37
Chapter 3 - The PIV Method
3.7.4 Particles Moving Out of Bounds and Laser Flash Separation
With increasing time separation between the two light pulses (images) the number of
particles moving out of and into bounds increases. In case offixed interrogation areas
(or volumes respectively) this causes the correlation to decrease, which in turn increases
the uncertainty.
For in plane displacements the time separation should in theory be chosen so that the
particle displacements will at least lie in a range of 0.1 pixels to a quarter of the
interrogation area size NpixI/4 as stated in Chapter 3.5.6 (compare [Bol99] page 16 and
[LaV02a] Chapter 4.7). According to [LaV03c] one should aimfor a displacement of
approximately 5 pixels as a basis for further optimisation.
From the nature of the PIV method the in plane correlation loss will result in a bias
towards lower velocities which can be corrected by appropriate weighting functions.
One can assume these functions to be implemented into any serious PIV evaluation
software without requiring further user intervention (→ [Raf98] Chapter 5.5.3). Next to
the bias error, which can be compensated for, there still is anon-correctable effect of
the particle displacement on the RMS-uncertainty shown in Figure 3.27. Note the
increase of the uncertainty for displacements higher than 2-3 pixels. It is also interesting
that the larger particles tend have a higher uncertainty.
Figure 3.27 Measurement uncertainty due to in plane particle displacements.(from [Raf98] Fig. 5.26; obtained by Monte Carlo simulations; dτ: particle size in pixels)
38
Chapter 3 - The PIV Method
While it is possible to compensate for the out of bound correlation loss by adaptive
window shifting (Chapter 3.5.7) other effects such non-linear particle paths and the
subsequently addressed third displacement component impose further limits on the
allowable particle separation.
For 2-C PIV particle displacements normal to the plane can bemore problematic than
large in plane displacements. Next to causing a perspectiveerror as shown in Chapter
3.7.2 they also strongly limit the allowable normal component and according to
Bolinder, [Bol99] page 15, the displacement perpendicularto the plane must be no more
that ¼ of the light sheet thickness. In strongly three-dimensional flow this will restrict
the time separation between the laser flashes, which can cause the in-plane
displacement to be low, in turn resulting in high relative uncertainties.
Due to these effects on the uncertainty and correlation quality optimising the pulse
separation is an essential step for good PIV results.
3.7.5 Pulse Duration
According to [Raf98], page 6, the duration of the illumination must be short enough to
freeze the particle motion. The picture should neither look blurry nor contain streaks.
While this is not really an issue with the typically used Nd-YAG lasers having a pulse
duration on the order of 5ns (compare Chapter 4 and [Bol99] page 2), which is short
enough to freeze in particle images even at very high velocities, the problem has to be
kept in mind when using other light sources such as flashlamps.
3.7.6 Pixel (Peak) Locking and Particle Image Diameter
Displacements are determined to subpixel accuracy by meansof fitting a suitable
function to the discrete correlation peak as explained in Chapter 3.5.5. For this fit to be
reliable the correlation peak must be wide enough to ensure that there is more than just
one component exceeding the noise level. In practice this isfulfilled for particle image
sizes exceeding 1.5 pixels as shown in Figure 3.28. If the correlation peak gets so
narrow that there is just one discrete component exceeding the noise level left the fitting
function will 'lock' to this peak resulting in integer displacement values.
39
Chapter 3 - The PIV Method
Figure 3.28 Subpixel interpolation requires wide correlation peaks.(adapted from [LaV02a], Fig. 4.16)
A measure for this effect can be found by analysing pixel valued displacement
histograms as shown in Figure 3.29. Pixel locking manifestsitself by accumulation of
the measured displacements around integer values giving a mountain-valley like view.
Figure 3.29 Displacement histogram - pixel locking: biased towards integer values(adapted from [Raf98], Fig. 5.25)
While in theory one could try to find a better subpixel estimator the more common
approach is to try and increase the particle image diameter by means of image pre-
conditioning or variation in seeding. A trick to increase the particle diameter is by
slightly defocussing the lens resulting in a blurred image (compare with the
recommendations in [Dan00a] Chapter 4.4.1.5.4, [LaV02a] Chapter 4.7, and [Raf98]
Chapter 5.5.2). Note that due to the small size of the seedingparticles the physical
particle diameter is not the only parameter determining theimaged particle diameter but
a series of effects associated with laser diffraction causeother parameters such as the
camera lens aperture to be of importance as well (compare with the comments in
Chapter 6.6).
40
Chapter 3 - The PIV Method
Estimating the effect of pixel locking for a particular situation can again be made by
Monte Carlo simulations as shown in Figure 3.30
Figure 3.30 Pixel locking bias: the smaller the imaged diameter dτ, the larger the error(idealised 8bit image: no noise, optimum exposure, ...)
(from [Raf98], Fig. 5.24)
Most sources recommend the imaged particle diameter to be greater than 2 pixels
(compare for example with [Dan00a], page 55). While a too small particle image will
result in pixel locking a too big particle size will increasethe uncertainty as shown in
Figures 3.31 and 3.32. Exploiting the evaluation parameters and methods allows to
improve the uncertainty and allowable diameter range, which explains why Bolinder
[Bol99] recommends to limit the particle size to to 2-4.5 pixels in accordance to Figure
3.32 while Raffel et al. ([Raf98]) and LaVision ([LaV02a]) suggest an optimal range
between 2-3 pixels.
41
Chapter 3 - The PIV Method
Figure 3.31 RMS uncertainty due to the particle image diameter.Idealised image quality conditions (from [Raf98], Fig. 5.23a)
Figure 3.32 Uncertainty due to the particle image diameter and the effect ofcomputational schemes; 16 particles in a 32x32 area; zero background noise
(from [Bol99], Fig. 8)
42
Chapter 3 - The PIV Method
3.7.7 Seeding Particle Density
It is known that the quality and distinctiveness of the correlation peak and thus the
probability of having a valid result increases with the number of particles in the
interrogation region ([Raf98] Chapter 5.5.4). Most sources recommend to aim for a
seeding density of at least ten particles per interrogationarea ([Hart00], [Bol99]) a too
densely seeded flow however can result in an image of poor contrast and laser speckling
(compare with Chapter 3.4).
Information on the influence of the seeding density on the detection probablility can be
found in references [Raf98] Fig. 5.28 and [Bol99] page 4, Fig. 13. A measure for the
associated uncertainty is given by Figures 3.33 and 3.34.
Note that next to the seeding density it is desired to have theparticles distributed both
homogeneously and random ([Raf98] Chapter 1.2).
Figure 3.33 Influence of the seeding density on the RMS uncertainty.Idealised noise-free conditions; 32x32 pixels; particle size 2.5 pixels.
(after [Bol99])
43
Chapter 3 - The PIV Method
Figure 3.34 Influence of the seeding density NI on the measurement uncertainty.32x32 pixel, 8 bit, 2.2 pixel particle size, idealised conditions: no noise etc.
(from [Raf98] Fig 5.29)
3.7.8 Quantisation Levels (n-bit Pictures)
Raffel et al. concluded that the effect of image quantisation is of minor importance, as
shown in Figure 3.35 where reduction down to a level of 4 bits had little consequence.
Figure 3.35 Effect of image quantisation level. Idealised background noise free conditions; NI=10.2 particles; 32x32 pixel area.
(from [Raf98] Fig 5.30)
44
Chapter 3 - The PIV Method
One limitation of this comparison however is that Figure 3.35 is based on a background
noise free simulation. If another consequence of reducing the quantisation level were a
decreased signal to noise level this would have serious consequences on the accuracy of
the results.
While the quantisation effect turned out to be small when using the PIV evaluation
method it is noted by Raffel et al. [Raf98] that the accuracy of methods relying on
single particles such as PTV tends to improve with increasing quantisation levels.
3.7.9 Light Sheet Coincidence
In the commonly used PIV setups the two flashes of light originate from two separate
laser heads. For the system to work the two beams must overlapas good as possible or
the two flashes of light will occur in different planes thus illuminating particles which
are completely uncorrelated with each other. One way of doing this is to compare the
beams without the light sheet optics installed as explainedin Chapter 4. Another way of
checking the beam overlap is described in [LaV03c] where theflow at low velocities is
imaged with very short inter-flash delays. If the beam alignment (and seeding) is good
the resulting velocities should be zero.
A poor beam coincidence will require one of the two beams to berealigned by using the
mirrors in the laser head. Doing this with the Ekspla laser used for this project is
described in Chapter 4.5.7.
3.7.10 Image Intensity Distribution
Another potential source of bias is a varying image intensity distribution (compare
[Raf98] Chapter 3.2). Particles moving from regions of highto low intensity would tend
to have a reasonably lower correlation peak (which is a result of multiplying particle
intensities) than particles moving in regions of similar intensities, thus biasing the result
towards particles of more even illumination.
A much greater problem occurs when the intensity on one part of the image turns out
very high as frequently happens due to reflections. In ordernot to harm the camera it is
necessary to limit the peak intensity, which can lead to the situations where the particle
intensity in other parts of the image drops below the dynamicrange of the camera (i.e.
45
Chapter 3 - The PIV Method
below the lowest resolvable intensity). Without sufficiently illuminated particles the
correlation analysis and in turn the PIV evaluation method will fail.
3.7.11 Other Image Quality Aspects
Further image quality aspects are often linked with increasing the signal to noise ratio
(SNR). One of these aspects is the image background noise level, which is influenced
by the camera dark current noise, ambient light, CCD exposure time and potential
sources of reflections. It is desired to keep the backgroundnoise level as low and as
uniformly distributed as possible. A good contrast with a high particle image intensity is
also desired ([Bol99]). In this respect it was shown by Raffel et al. ([Raf98] - Chapter
5.5.6) that minor background noise up to 10% of the particle intensity level tends to be
of lesser if not neglectable effect. In practice however situations such as strong
reflections from walls can cause the noise levels to get unfavourably close to the peak
particle intensities, in turn resulting in a reduction of the measurement accuracy and
reliability (increase in false vectors).
3.7.12 Computational Scheme (Subpixel, Adaptive etc.)
Although already mentioned in the previous chapters it should not be forgotten that the
accuracy of the results can be further improved by optimising the evaluation steps.
Instead of performing just one run of correlation calculations on a fixed grid of
interrogation areas, modern PIV evaluation software usually allows to implement
several steps into the evaluation process beginning with a coarse calculation of the
displacements on large interrogation areas which then are further refined and combined
with adaptive window shifting techniques (compare [Raf98] Chapter 5.4.3).
3.7.13 First Order Approximation of the Particle - Not Flow - Velocity
Despite the name 'particle' image velocimetry the fact thatthe velocity of the particle is
measured is prone to be forgotten. Due to forces – most notably inertial forces – acting
on the particle its velocity and path will never exactly match the path of the flow as
outlined in further detail in Chapter 8.
Next to the deviation from the flow the PIV method gives a linear approximation of a
typically non-linear particle path. Reason being is that, with the exception of time
46
Chapter 3 - The PIV Method
resolved PIV (Chapter 3.2.6), it is usually not possible to capture images of more than
two coherent (i.e. correlateable) instances of the flow in time. The discrete
approximation of the displacement in time is thus confined to be a first order method as
shown in Figure 3.36 ([Raf98] page 120 and [West97]).
Figure 3.36 First order approximation of the particle path.(after [West97] Fig. 1)
47
Chapter 4 - The Laser
4. The Laser
4.1 Introduction
In PIV it is desired to illuminate a plane with a light-flash of sufficiently short duration
allowing to obtain a 'frozen', non-smeared particle image.White light sources such as
flashlamps are less suited because of the difficulty in collimating their light and the
relatively long flash duration which can make additional shutters necessary. Due to their
ability of emitting light at discrete wavelengths bundled in a defined direction lasers
tend to be more advantageous for PIV applications. With their lower intensity
continuous wave (cw) lasers are usually limited to low lightapplications such as slow
water flows. As they emit continuously cw lasers further have to be combined with an
additional shutter or scanning mechanism ([Dan00a] Chapter 4.6.3). Pulsed lasers, most
notably the Nd-YAG types, are more commonly used in PIV application because of
their ability to produce very powerful pulses of light lasting just a few nanoseconds
([Dan00a] Chapter 4.6 and [Raf98] Chapter 2.2).
A Nd-YAG type twin head laser (i.e. two lasers) model NL301-2G manufactured by
Ekspla Experimental Lasers Ltd. in Lithuania was used in this project. Unfortunately
the laser had to be sent to Lithuania for repairs at the beginning of the project due to a
broken pockels cell caused by a leak in one laser head and in order to realign the
mirrors of the other laser head. Once the laser was returned anumber of operations had
to be done by the author in order to get the laser up and running again.
Due to the number of maintenance operations a substantial part of the project consisted
of getting the laser running again and thus a major share of this chapter is about
describing the necessary operations involved. As a prefaceto the maintenance
operations theoretical laser background is explained and the topic of laser safety
addressed. Finally a laser control program which was written to allow convenient
operation of the laser from a computer is presented.
48
Chapter 4 - The Laser
4.2 Working Principle of a PIV Nd-YAG Laser
References used in this chapter: [Her02] Chapter 6.5.4, [Raf98] Chapter 2.2.1,
[LaV02b] Chapter 3.1, [Dan00a] Chapter 4.6.2 and input fromIrmantas Mikulskas -
Senior Service Engineer Ekspla Ltd.
4.2.1 Basic Laser Principle
A laser consists of a lasing material which is excited by an energy source. In the case of
a Nd-YAG laser used for PIV this is typically white light originating from a flashlamp
exciting neodym ions (Nd3+) embedded in a cylindrical yttrium-aluminium-garnet rod as
indicated in Figure 4.1. The Nd3+ ions (i.e. their electrons respectively) can be in various
energy states as shown in Figure 4.2.
Figure 4.1 Basic laser configuation. (adapted from [Raf98], Fig. 2.11)
Without further addition of energy the electrons will predominately be in the lowest
state indicated as E1. Normally photons are only able to bring an electron onto a higher
level if their energy matches the difference between two discrete states. A special
property of the Nd3+ ions is that their upper energy levels indicated as the rangeE4* are
continuous instead of discrete, which unlike other lasing materials allows them to
absorb photons of various energy levels contained in white light. Once the Nd3+ has
been excited to E4* it will first make a transition to the lower energy state E3. In state E3
it can either spontaneously emit a photon or be stimulated toemit a photon by an
impinging photon. In case of stimulated emission the emitted photon will be in phase
with the impinging photon. Note that the impinging photon will still exist so now there
49
Chapter 4 - The Laser
are two photons which can stimulate further excited atoms causing a so called
population inversion in a 'chain reaction' like manner as shown in Figure 4.3. This
population inversion will continue as long as there are excited atoms and can be in a
steady state condition if the pumping energy is added continuously.
Figure 4.2 Nd-YAG laser energy bands.(based on [Raf98] Fig. 2.13 and [LaV02b] Fig. 3.3)
Figure 4.3 Population inversion ('chain reaction').
50
E1
E2
E3
E4*
Energy level
excitation by flashlampphotons E
1→E
4
Nd-YAG: continuous upper energy level→ can absorb more than just one wavelength λ
nonradiativetransition
nonradiativetransition
radiative transition→ photon at λ=1064nm
⇒
⇒
⇒
⇒
⇒
⇒
⇒
⇒
⇒
⇒
⇒
⇒
⇒
photon stimulates emission of a second photon from an excited atom
now two photons stimulate emission from further atoms ... → population inversion
Chapter 4 - The Laser
Adding mirrors at each end of the lasing material will cause the emitted photons to pass
the lasing material several times, thus amplifying the effect of emission. In addition this
resonator-like configuration will result in standing waves of photons at discrete
resonance frequencies (i.e. wavelengths). Making one of the two mirrors partly
transparent will allow a part of this laser light to pass out of the oscillator. It is of
importance that the mirrors are perfectly aligned to each other or lasing will not occur.
4.2.2 Pumping with Flashlamps
In order to achieve high powers high excitation intensitiesare needed as well. As
continuous excitation at such high power would result in overheating and in turn failure
of conventional white light sources, Nd-YAG lasers are commonly pumped
intermittently by one or more krypton flashlamps, which usually are immersed in
deionised or distilled water pumped through the laser head by an external pump /
cooling circuit combination.
Figure 4.4 Flashlamp vs laser output.
Without further modification using flashlamps to pump a system as shown in Figure 4.1
would result in lasing as long as the flashlamp intensity is above the lasing threshold
level as indicated in Figure 4.4.
For thermal stability it is important that the flashlamps are operated at a stable
51
flashlamp envelope (intensity)
tlaser outputpower(relatively low)
laser output
t
lasing thresholdlevel
Chapter 4 - The Laser
frequency. In case of the used Ekspla laser the components are optimised for flashlamps
flashing at 20Hz and the laser output won't be activated before a five seconds warm up
([Eks97], [Raf98]). In operation it was observed that it is best to let the flashlamps flash
for several minutes until the laser head reaches a state of near thermal equilibrium with
roughly constant beam properties. Without this warm up subsequent laser flashes tended
to be of varying intensity both locally and globally, which results in an uneven
illumination of the flowfield.
4.2.3 Introducing a Q-Switch
Figure 4.5 shows the configuration of the Ekspla laser used in the current project.
Compared to Figure 4.1 it is apparent that the main difference lies in two additional
components located between the mirrors. These are a pockelscell (PC) and a polariser
plate (P), which together form the so called Q-switch.
Figure 4.5 Ekspla Nd-YAG laser configuration. (from [Eks97], Fig. 10)Legend: HV – high voltage supply; SYNC: synchronisation signals switching the HV;
M: mirrors; PC: pockels cell; P: polariser plate
In a very simple analogy the Q-switch could be regarded as "a mechanism that quickly
opens and closes the cavity" ([Dan00a] Chapter 4.6.2.1). Inorder to be able to analyse
problems however a somewhat more thorough understanding is needed:
Without any high voltage applied to the pockels cell (PC) it more or less acts as a
transparent media and the laser would lase during flashlamppulses as shown in Figure
52
Chapter 4 - The Laser
4.4. Applying high voltage to the pockels cell will cause it to turn the polarisation of
any incoming light by 90°. This alone wouldn't stop the laserfrom lasing but when
combined with a polariser plate (P) the result is a switch with basically no inertia.
Reason for this is that the polariser plate acts as a filter which only lets light at a defined
polarisation angle pass. If the light after the polariser plate is turned by another 90° the
component normal to the polariser direction will be zero and the light cannot pass.
Figure 4.6 Effect of the Q-switch.
53
a) flashlamp envelope (intensity)
tb) excitedNd atoms(stored energy)
c) HV @ the pockels cellO(5kV)
~190µs
flashlamp starts→ laser energy builds up
HV @ the pockels cell → no lasing
HV pulse → sudden population inversion→ powerful laser pulse
no HV-pulse → laser energy would decay again; no lasing occurs
t
t
d) laser outputO(MW)
t~5ns
high power laser flashtriggered by HV pulse
Chapter 4 - The Laser
Figure 4.6 shows how the effect of the Q-switch can be exploited to control the laser
output between no output at all to creating a powerful laser flash of short duration. The
topmost graph (Figure 4.6a) shows the flashlamp envelope which is a measure for the
amount of excitation energy being pumped into the Nd-YAG laser rod. As long as HV
is applied to the pockels cell the light from the back mirror will be rejected from the
polariser plate, as it is 90° out of phase and thus can't get back into the lasing material,
and so lasing does not take place. As indicated in Figure 4.6bthis causes the excitation
energy stored in the Nd3+ ions to build up and decay again if the high voltage is left at
its high state. Suddenly inverting the applied HV will allowthe light from the back
mirror to get back into the laser rod, causing immediate laser oscillation and sudden
release of the excitation energy stored in the Nd-YAG material.
When adjusted optimally the pulse duration of the Ekspla laser will be around 5ns
which for a pulse energy of 100mJ is equivalent to a power of 20MW averaged over the
flash duration!
Note that for the Q-switch to work properly the pockels cell and polariser must be
aligned perfectly within the two mirrors for otherwise the light passing the PC won't
turn out to be in perfect anti-phase with the polariser plate.
4.2.4 Varying and Maximising the Pulse Energy
There are a number of ways to change the pulse energy passed into the light sheet:
• By placing an optical attenuator after the laser: New Wave (www.new-wave.com)
offers such mechanically driven optical attenuators allowing to vary the output
power as an option for their lasers. The advantage is that thelaser can be operated
under optimal conditions as the attenuation is independent of the beam generation.
• By changing the flashlamp (FL) voltage and thus the pumping energy: This is
possible with the Ekspla laser which allows to vary the FL voltage between 600V
and 1600V, but many lasers (New Wave PIV lasers for example) often won't have
the option for continuous flashlamp voltage adjustment forreasons of thermal
stability.
• By adjusting the Q-switch timing: In principle the Q-switchcan be operated at any
time in the flashlamp cycle. The resulting pulse energy willdepend on the energy
54
Chapter 4 - The Laser
stored in the Nd-YAG rod at time of operation.
4.2.5 Combining Two Lasers
As the repetition rate of a single Nd-YAG laser usually is toosmall to result in
reasonably short delays between the two flashes it is necessary to combine two lasers
operating at the same repetition rate but out of phase to eachother. This requires joining
the two beam paths so that both beams become coincident, which is done by mirrors as
explained in Chapter 4.5.7 (compare with the sketch on beam combining optics in
Figure 3.5).
The flashes are controlled by TTL signals generated by a timing unit as explained in
Chapter 7.
4.2.6 Frequency Doubling: Invisible IR→→→→ Visible Green
The light emitted by an Nd-YAG laser at conventional operating temperatures has got a
wavelength of 1064nm ([Raf98] Chapter 2.2.2). Such infrared light is unsuited to be
detected by common CCD chips and thus it is run through a so called second harmonic
(SH) generator which doubles the frequency of a part of the incident light to 532nm
(green). After frequency doubling the green light is usually separated from the infrared
by either using a prism harmonic separator ([Raf98]) or in the case of the Ekspla laser a
dichroic mirror which has maximum reflection for 1064nm butlets the predominant
part of the green 532nm light pass.
Commonly used second harmonic (SH) generators are KDP, KD*Pand KTP type
crystals. KTP crystals as used in the Ekspla laser tend to have higher conversion
efficiencies on the order of 60% (compare with data sheets asavailable from MolTech
GmbH – www.mt-berlin.com or from [CAS99]).
When dealing with SH crystals the following points are of importance:
• The commonly used crystals are hygroscopic and would dissolve when absorbing
moisture. In case of many lasers such as the Ekspla laser thisis prevented by heating
them, which also increases the damage threshold ([CAS99]).It is of outmost
importance not to turn off the heatingfor longer periods of time (hours).
Unfortunately this requires the Ekspla laser to remain plugged in to the mains power
55
Chapter 4 - The Laser
supply. SH crystals are transported in sealed containers containing moisture
absorbing silica gel pads.
• The conversion efficiency is dependent of the angle of incidence relative to the laser
beams and follows a sin2(x)/x function ([CAS99]). Replacing the crystal requires
realignment as explained in Chapter 4.5.9.
• SH crystals are a potential source of back reflections and must be tilted in order to
avoid potentially fatal (for the laser) back reflections into the laser cavity.
Next to frequency doubling frequency tripling and quadrupling are often used in PIV
applications exploiting additional information from fluorescent tracer particles.
Further information on SH crystals and using them in lasers can be found in [Eks97],
[CAS99]) and [Raf98].
4.2.7 Further Nd-YAG Properties
In the following list some of the Nd-YAG laser properties of more direct importance for
everyday use will be listed. More detailed information can be found in the respective
laser manuals, on the manufacturers homepages (www.ekspla.com, www.new-
wave.com) and in [Raf98] (Table 2.4).
• Nd-YAG rods are water cooled. The water must be of high purity(distilled /
deionised) and has to be replaced from time to time. Some lasers also require
replacing an additional water filter located in the cooling circuit from time to time.
• The laser power supplies are either air-cooled or, as in the case of the Ekspla laser,
require additional water cooling.
• Typical repetition rates of a single laser are on the order of10..20Hz with some
specialised models allowing operation in the kHz range.
• The Q-switches and flashlamps can often be controlled by externally (user) supplied
TTL signals. Control of the Ekspla laser is more limited as described in Chapter 7.
• Power supply is usually possible via a convenient standard single phase mains plug,
500W-1000W.
• Beam diameters 2.5mm – 10mm, depending on the laser model.
• Energy stability ~ O(5%) for a good laser, i.e. the image intensity will vary on the
56
Chapter 4 - The Laser
order of 5%. These values are usually only achieved after a sufficiently long warmup
period.
• Size and weight: Modern PIV lasers offer twin-laser heads weighing less than ten
kilograms and sized on the order of a shoe box, with the power supply sized in the
range of a conventional midi-tower computer. In this respect the Ekspla laser can be
considered as relatively large.
• Sensitivity to dirt and vibrations: A laser is a sensitive device and should be handled
with care as if holding an expensive glass sculpture. Most parts of the laser are
protected from dirt by covers and unprotected optical components should remain free
of dust and (especially) grease.
4.3 Laser Safety
4.3.1 Introduction
Next to the possibility of skin burns handling Nd-YAG lasersbear the very real danger
of suffering permanent blindness, be it partial or complete.
Due to the highly directional laser beam which is concentrated on a relatively small area
even low power lasers on the order of >5mW (continuous power)have the potential of
permanently damaging the eyesight if directed straight on the human eye. Using such
lasers thus underlies safety guidelines imposed by variousinstitutions such as
governmental workplace safety agencies.
The high power Nd-YAG lasers with peak intensities of more than 20MW (!) pose an
even greater threat which leads to the situation that insurers and legislators often request
strict compliance with laser safety guidelines. Consequently PIV users are usually
obliged to follow laser safety guidelines, which in a perfect world would make perfect
sense.
Once it comes to the application of the safety guidelines however novice users of laser
devices may find it often impractical and sometimes very difficult to impossible to fully
comply with the strict interpretation of laser safety rules, as was experienced by the
author himself. To make things worse many experienced userstend not to follow many
of the strict rules at all, which after an initial phase of great respect inspires novices to
57
Chapter 4 - The Laser
follow suite. – Not an ideal situation for laser safety.
Reasons for this are manifold. One is that laser safety regulations are often not written
with PIV in mind and in particular not with setting up a PIV system, which can require
operations such as alignment of an unshielded beam. Also safety regulators appear to
have the tendency to try and completely abolish any risk of harm from laser use. In its
most extreme form this can mean complete separation of laserand user or even result in
not using a laser at all. Workplace supervisors who have to adapt these rules into PIV
guidelines potentially face the threat of possible legal issues if neglecting some of the
stricter guidelines, which again can result in unpractical guidelines.
Experienced users neglecting certain guidelines in turn may only face little risk of
severe harm by laser irradiation if handling the laser in an appropriate way, which
however can require experience and know-how obtained over several years.
Due to this situation novice users may find it difficult to obtain appropriate information
allowing them to work in a safe yet productive way. For this reason it is the intention of
this chapter to provide tips on handling PIV laser equipmentin a safe way based on a
combination of information found in literature from PIV manufacturers ([Dan00a] &
[LaV02b]), obtained by the author from various industry professionals (who are, despite
not being able to name them all, greatly acknowledged) and based on the author's own
experience with PIV and laser hardware.
Note that despite the aforementioned pitfalls laser safetyguidelines are nevertheless
worth reading and recommended for all readers interested inlaser safety. Many
guidelines provided by PIV manufacturers ([Dan00a], [LaV02b]) contain useful
information on the do's and don'ts of laser operation. Furthermore a good overview in
the nature of how lasers cause damage to the eye can be found in reference [Lit03].
4.3.2 Potential Sources of Eye Damage
Figure 4.7 shows three potential paths for hazardous laser light to reach the human eye.
These are: A direct hit by the 'unaltered' laser beam, a direct hit by a coherently
reflected laser beam and exposure to diffusely reflected light.
Installing a light sheet will additionally increase the range of the laser beam, while the
58
Chapter 4 - The Laser
intensity level (power per area) due to the high Nd-YAG powerwill still suffice to
cause severe eye damage. Distributing 20MW peak power alonga 1m long light sheet
of 1mm thickness will result in an average intensity of 20 GW/m2, 20 million times
more than the typical intensity of the sun when hitting the earth (1kW/m2; from [Lit03]).
That hurts (blinds)!
Figure 4.7 Sources of laser induced eye damage.
Chances of accidentally looking directly into the laser beam or sheet as in Figure 4.7a
are real. One of the first preventive measures is to appropriately shield the beam as
described in Chapter 4.3.3. Next to proper shielding the nature of human reactions itself
poses a threat. Despite being informed about the danger humans are prone for actions
such as going to 'take a look' when something doesn't work or changing something in
the test region while someone else is working with the laser,which can cause exactly
such a direct hit situation. Although this might sound unlikely many accidents happen
due to the occurrence of seemingly less likely events, whichis what makes them
dangerous.
Indirect hits through reflections pose another greater threat. All reflective surfaces must
be treated as a potential hazard. This includes watches (total reflection on glass),
jewellery, windows (e.g. pieces of acrylic or glass), metallic surfaces (e.g. steel rulers,
chrome-plated surfaces). Preventive measures include removing watches and other
reflective materials and inspecting all objects in the beams path before setting up the
laser. Note that not only 'total' reflection but also the case of partial reflection, which
occurs when light hits a transparent media is a risk. As shownin Equation (4-1) on the
order of 4% of the intensity of a laser beam impinging a transparent media such as glass
will be reflected (4% of 20MW=800kW).
59
a) direct hit
b) indirect hit through'coherent' reflection c) indirect hit through
diffusive reflection
Chapter 4 - The Laser
ref=n−1n1
2
=1.5−11.51
2
≈4%
Equation (4-1) Percentage of reflected lightintensity upon perpendicular incidence on glass.(compare [MelG02] - Coating theory; n: index ofrefraction)
Diffuse reflection (Figure 4.7c) from a surface often appears comparably harmless. In
fact many PIV users will have experienced that while diffusereflections can appear
partly blinding at first, especially if the rest of the room is not well lit, the actual
damaged caused is not more than what occurs after leaving a rather dim building on a
sunny day. This causes the dangerous situation of underestimating the potential of
diffuse reflections. If lets say 20MW were diffusely reflected from a surface, which
could occur for a circular laser beam hitting the surface without having a light sheet
optics installed, one could assume a Lambert's law intensity distribution ([Her02] eq. (6-
62)). At a viewing angle of 45°, 1m distance from the surface,the intensity will still be
around 4.5MW/m2 (Equation (4-2)).
I 45°=1A⋅P0
⋅cos45° ⋅
A
r 2=20MW⋅cos45°⋅ 1
1 m2
≈4.5MW
m2
Equation (4-2) Estimation of the intensity of a diffuse 20MW (P0) source in 1mdistance (r) at a viewing angle of 45°.
(based on [Her02] eq. (6-62) and (6-60) combined with the integration of (6-62) found in [Schä99])
Of course a direct comparison with the 1kW/m2 of continuous sunlight is limited as the
duration of the laser flash is only around 5ns but nevertheless the powers are enormous
and pose a serious threat to the eyesight when not handled properly.
4.3.3 Improving the Safety by Appropriate Shielding
The aim of shielding is to minimise the laser radiation goingbeyond the measurement
region and can include limiting access to the path of the laser before the measurement
region.
One part of shielding is to prevent people not involved in themeasurement process of
getting exposed to the laser, which can be done by working in closed rooms with
restricted access or by using non-transparent curtains andother materials to separate the
laser workplace from the rest of the room. Using signs informing about the laser hazard,
60
Chapter 4 - The Laser
running warning lamps while working and installing interlocks shutting down the laser
in case someone accidentally enters the room are just a few ofthe often compulsory
measures (consult [Lit03] for more conformation).
Next to shielding other people from the laser hazards it is good practice to install further
shielding inside the workspace as (in the authors opinion) just using safety goggles is
not enough, especially as there is no guarantee that they will be worn at all times.
Such shielding inside the workspace includes preventing the laser from reaching beyond
the measurement area, which in case of transparent walls canbe done by masking with
black paper, cardboard or other similar materials. It is further useful to mask regions
where stronger reflections occur, a measure which in addition can lead to improved
camera background noise. The possibilities of masking are limited however as camera,
laser and very often the operators require some minimum optical accessibility to the
measurement region.
In many cases it is also useful to restrict access to the lightsheet / laser beam before the
measurement region, further minimising potential regionsof exposure. In situations
where the lightsheet optics cannot directly be installed onthe laser housing, laser
guiding arms are particularly useful.
In a final note shielding materials should not consist of easily inflammable materials. A
sheet of quality paper (80gm/m2; preferably black) should suffice however don't mark it
with pencils as the graphite will ignite (noticeable by crackling), especially when
irradiated by 1064nm infrared.
4.3.4 Some Theory on Laser Goggles
Laser goggles are designed to protect the eyes from high power laser light occurring at
specific wavelengths. Lasers with different wavelengths and powers thus require
different goggles.
=I transmitted
I impinging
=10−ODEquation (4-3) - Transmission ratio of laser light impingingon a filter as a function of optical density. (based on definitions
found in the photonics dictionary www.photonics.com/dictionary)
The ability of protective eyeware to block incoming laser light is characterised by
61
Chapter 4 - The Laser
optical density (OD) which can be converted to a transmission ratio by using Equation
(4-3). A typical OD characteristic for Nd-YAG protective goggles is shown in Figure
4.8, where it can be seen that the critical wavelengths of 1064nm, 532nm (doubling),
355nm (tripling) and 266nm (quadrupling) are shielded by anoptical density of more
than 7. In case of a direct hit with a 6mm diameter 20MW beam (intensity 7.1e11
W/m2) the fraction of 10-7 would pass the goggles, resulting in a remaining intensity of
71 kW/m2 or 71 times the intensity of sunlight on an average sunny day,which sounds a
lot better than the MW/m2 obtained in other examples without goggles.
Despite this apparent increase in safety goggles are in the first place made to shield the
user from disturbing diffusely scattered laser light and toprevent serious eye damage in
case of accidentally caused reflections (diffuse or directed). Goggles are however
absolutely no excuse for not taking proper shielding measures and working in a zone
where parts of the body are directly exposed to high intensity (reflected) laser light!
Figure 4.8 Example filter characteristic for Nd-YAG protective eyewear.(from Glendale product specifications, glendale-laser.com)
In an important note it must be said that next to the strong goggles blocking almost all
laser light, alignment goggles, which have an optical density of just OD5 @ 532nm
(glendale-laser.com product specs), will no longer protect from direct high intensity
laser impact. Several types of goggles are used at the UNSW School of Mechanical
Engineering and users must be aware of the difference. This consists of first confirming
the wavelength range (Nd-YAG, Argon-Ion or He-Ne laser light) and the strength of
attenuation (weak - alignment versus strong).
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Chapter 4 - The Laser
4.3.5 To See Or Not To See: On Handling Laser Goggles
Due to the destructive potential of PIV Nd-YAG lasers as outlined in Chapter 4.3.2
practically all safety regulations require to permanently use protective eye-wear.
It then often comes as a first surprise for novices that many professionals don't seem to
wear goggles at all. This can be observed during conferencesand courses where PIV
manufacturers present their products to potential customers as well as when giving
instructions on how to use their PIV system.
While there are a number of reasons for this the most apparentis that the laser beam
will become completely invisible when wearing fully protective laser goggles. While
there are special adjustment goggles allowing to see the more intense reflections these
goggles won't provide the 'full' safety any more and still are often less convenient for
alignment. Many professionals will argue that seeing a laser beam will be safer than
having no idea where it is. Wearing goggles will also reduce the contrast which is
especially annoying when monitoring instant PIV images on a computer screen.
While it must be stressed that not wearing laser eye protection while using PIV lasers is
a breach of safety regulations the following list nevertheless provides tips on working
safer and productively both with and without goggles:
• Use fluorescent paper to visualise laser light when wearinggoggles. Orange
textmarkers such as the Staedler Textsurfer colour number 4on white paper give
excellent results and even scattered laser light of very lowpower can be detected
with ease. – Excellent when checking for dangerous reflections and to get a better
contrast when aligning.
• Keep your goggles close by when having to take them off (around the neck or
forehead for example; from [Dan00a], Chapter 4.6.2.2).
• Only work at low powers when aligning lasers / lightsheets.
• Only work at low powers when not wearing goggles.
• Always keep the laser power as low as the application allows.
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Chapter 4 - The Laser
4.3.6 Further Tips and Comments on How to Prevent Potential Accidents
• Don't rush – calmly reflect about and plan the next step.
• Be aware of what can pose a threat: Are there reflecting objects? Where is the beam
path? Where will the beam go if I accidentally flip this mirror? ...
• Avoid setting up any laser beam systems on eye level (compare [Dan00a] 4.6.2.2).
• Restrict access.
• Make sure the laser is disabled when working in directly exposed zones. Turn off the
power supply or use at least one mechanical shutter (you can't really do enough).
Restrict other people from being able to turn the laser back on while you are
working.
• Use goggles but don't regard them as an absolute safety guarantee.
• Know your devices. Incorrectly mounting the lightsheet, being unsure how to operate
the laser etc. is dangerous.
• Keep laser powers to the necessary minimum.
4.4 Ekspla Nd-YAG Laser – Operation
4.4.1 Introduction
This section will explain how to operate the Ekspla NL301-2GNd-YAG laser. While
the information can more or less also be 'assembled' from reading through the laser
manual ([Eks97]) it is the aim to give the instructions in a more straightforward way.
Most of this chapter is thus held in a checklist like form.
4.4.2 Connections
• Water: Connect the inflow (upper) and outflow (lower) cooling water supply on the
back panel (Figure 4.10). The inlet temperature should be lower than 20°C although
25°C will still work. Don't worry if the water won't flow oncepressure is applied as
the cooling unit has a valve which opens and closes on demand.
• Mains power: Always keep the laser connected to mains power as it is needed to heat
the KTP crystal which otherwise would dissolve after several days.
64
Chapter 4 - The Laser
• Remote: This connects to the control pad.
• Sync Out: This output is used to synchronise with the camera via a delay unit.
• RS232: Connect this to a computer running the control software (Chapter 4.6).
Figure 4.9 Ekspla Laser Front Panel. (adapted from [Eks97], Fig. 6)
4.4.3 Powering Up – Making the Laser Ready
All abbreviations refer to Figure 4.9.
• Turn the power key (K1).
• First turn on the power of the cooling unit (switch S5).
65
Chapter 4 - The Laser
• Then set the desired cooling temperature: By default the cooling unit displays the
current water temperature. Pressing the button B7 (Measure/ Set) will cause the
display to show the temperature where the valve of the cooling circuit will open.
This 'valve-trigger-level' temperature can be set with the potentiometer P7.
• Next turn on the power supply (switch S4).
• Set the triggering mode switch S3 to external. The repetition rate and delay
potentiometers P5 and P6 will then be obsolete. This may first sound unlogical but
external in this respect means that the power supply is triggered by the control unit
('Control Unit & HV') and not by the power supply's internal clock. The control and
power supply units can be viewed as two separate devices.
• Set the oscillator (laser 1) flashlamp voltage according tothe desired maximal pulse
energy (Figure 4.11) using potentiometer P3.
• Turn on the amplifier (laser 2) using switch S2 and set the flashlamp voltage using
potentiometer P4.
• Press the button B5 triggering. This activates the high voltage at the pockels cell.
• If there are no error LEDs appearing and all ready / on LEDs arealight the laser is
ready for operation (note that some LED heads lie a bit hiddenpartially inside the
cover but can still be seen).
• Finally don't forget to open the shutter on the laser head or an interlock error will
occur.
4.4.4 Using the Control Pad
Next the the control pad the laser remote control software (Chapter 4.6) can also be
used. The control pad however can be very practical for operations like aligning and
other situations where a computer is too big and too far away.It also allows changing
certain system constants used for maintenance / initial tuning which cannot be
addressed via the RS232 interface.
Using the control pad is not overly intuitive and only a rudimentary explanation
covering just a few of the available options will be given at this place. More details can
be found in the laser manual ([Eks97]).
The control pad has got 4 buttons (Figure 4.9) which work as in Table 4-1:
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Chapter 4 - The Laser
OP Operate. Turns the Q-switch / flashlamps on or off.
Warning: Pressing operate works at all menu levels and will initiate the laser if
triggering is on (Figure 4.9 button B5)!
SEL Select: Changes the position of the cursor (blinking) orworks like an enter key
to switch to the next submenu option (i.e. option within the same menu but on a
new line).
∧ / ∨ Changes the value at the cursor.
SEL+
∧ / ∨
Hold select; then press ∧ or ∨ to switch to a different menu option.
Table 4-1 Control pad controls
Table 4-2 shows a listing of the more useful remote control settings and symbols. These
can be found by browsing through the different menu options by pressing SEL+∧ / ∨
and SEL as explained in Table 4-1.
/ Stop / Operate: Symbol shown in the energy settings menu whenthe
laser is turned on or off. Note that this is not displayed in all other
menus although pressing OP will still turn the laser on and off.
Of/Ad/Ma Laser energy settings: Of – flashlamps will flash but no lasing; Ad –
lasing at ~ 10% energy; Ma – lasing at 100% energy. Note that the
flashlamps will flash for 5s before lasing begins.
DLxx Delay between the two laser flashes in 250ns steps.
E.g: DL00 – no delay; DL100 25µs delay.
F Div XX Frequency division. Ratio of flashlamp flashes toQ-switch operations.
I.e. laser flashing frequency. E.g. F Div 1 – 20Hz; F Div 2 – 10Hz; ...
Special section (Regime 8):
RegimeXX Operating regime; 0 – normal; 8 – laser servicing.
EO ON/OFF Electrooptics on / off. If set to OFF no high voltage will be applied to
the pockels cell. The laser will run in free running mode and lase during
flashlamp flashes as shown in Figure 4.4.
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Chapter 4 - The Laser
O-E1 XX Delay between flashlamp and Q-switch trigger in 250ns units.
Set as follows: O-E1 760 – 'press SEL' – O-E2 760 – 'press SEL'.The
delay is now set up 190µs (~optimal).Table 4-2 Control pad options (incomplete)
Figure 4.10 Ekspla Laser Back Panel (adapted from [Eks97], Fig. 7)
68
Chapter 4 - The Laser
Figure 4.11 Pulse energy as of December 02, 2004.(Note that this will decay with ageing flashlamps.)
4.5 Ekspla Nd-YAG Laser – Maintenance
4.5.1 Introduction
This chapter informs about performing laser maintenance and troubleshooting
operations on the Ekspla laser. It is mainly restricted to operations that had to be
performed by the author but this probably already covers more than the majority of
typical cases encountered by PIV laser users.
4.5.2 Changing the Cooling Water
The externally supplied cooling water cools an internal cooling circuit consisting of
deionised or distilled water. This internal cooling water flows through the laser head
and gets in direct contact with the flashlamps (and possiblythe laser rod), which is why
it must be of high purity as deposits on those components have a devastating effect.
While the Ekspla manual suggests changing the water every three months ([Eks97]) the
water can probably left in the laser for longer periods of time. Still it should not be
forgotten to change the water.
69
1100 1150 1200 1250 1300 1350 1400 1450 1500 1550 16000
25
50
75
100
125
150Laser 1 (OSC), measuredLaser 2 (AMP), measuredLaser 1, fit (2nd order poly)Laser 2, fit (2nd order poly)
Pulse Energy vs FL Voltage
Flashlamp Voltage, V
Max
imal
Pul
se E
nerg
y, m
J
Chapter 4 - The Laser
To change the water the cooling unit has to be removed from thelaser rack by first
removing four screws from the front panel (Figure 4.9) and then pulling out the cooling
unit while carefully watching that none of the four attachedhoses get stuck. The
additional earthing cable might also have to be removed but it is useful to keep the
interlock and power supply cables connected, allowing to test the unit before building it
back into the laser.
Once the cooling unit is outside of the rack it is helpful to remove the top steel cover to
get a better view of the inside. Then the water has to be drained via the drain port
(Figure 4.10) and the cylindrical tank refilled from an inlet on the top. The tank has got
two or three level transducers (switches) mounted on one of the two ends of the cylinder
which is transparent. The water level should be between the lowest and highest
transducer heads. Once the water has been refilled the cooling unit (not the power unit)
should be turned on and the pump activated so that the water can circulate for a while to
remove accumulations of air from the system. It is further useful to check the interior of
the cooling unit for leaks.
4.5.3 Laser Head View
The (twin) laser head as shown in Figure 4.12 consists of two lasers (Laser 1 & 2),
capacitors, a unit distributing the high voltage (HV) and trigger signals, beam
combining optics, a frequency doubling crystal (SH), a dichroic mirror separating the
green from the infrared and a beam dump (BS) for the unused infrared beam.
The Q-switch consists of a high voltage switching/driver part accessible via the small
cover plate on the top part of each laser and the pockels cell /polariser plate accessible
via the small covers located on the side of the laser heads. The flashlamp is contained in
a block called laser chamber (looks a bit like a big cover plate) mounted into each laser
head. The laser chamber is also noticeable by the thick high current cables needed to
drive the flashlamp.
Combining the beams is done as follows: The vertically polarised light from laser 1 is
directed onto the polariser plate P1 using the steering mirrors SM1 and SM2. Polariser
plate P1 will reject (i.e. reflect) all vertically polarised light and thus acts as a mirror for
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Chapter 4 - The Laser
laser 1. Before reaching the polariser plate P1 laser 2, which is vertically polarised as
well, is passed through the phase retardation plate PRP1 which turns the polarisation by
90°, now making beam 2 horizontally polarised. The polariser plate P1 won't reject
horizontally polarised light and thus is transparent for laser 2. If the mirrors SM3 and
SM4 are aligned appropriately laser 1 and laser 2 are now coincident. Before the second
harmonic generator SH the laser beam polarisation is converted to circular by phase
retardation plate PRP2 (from [Eks97] Chapter 5.3).
Figure 4.12 Ekspla laser head view. Legend: SM – steering mirror; SH: second harmonic crystal; P: polariser plate;
PRP – phase retardation plate (from [Eks97], Fig. 4)
4.5.4 Changing the Flashlamps
The maximum allowable flashlamp voltage is 1600V. If at thisvoltage the output
energy is less than 100mJ (rough indicator) or if a flashlampdoesn't work at all it is
time to change the flashlamps. Note that usually both flashlamps are changed at the
same time to ensure that both laser heads are in a similar condition.
Due to space restrictions instructions and tips on how to change the flashlamps are
given in Appendix 2.
4.5.5 Visualising Infrared
The primary wavelength of a Nd-YAG laser (1064nm) is in the infrared (IR), invisible
for the human eye. While the predominant part of the infraredis separated by the
dichroic mirror and won't get outside the PIV laser head working in the beam
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Chapter 4 - The Laser
combining region will expose the IR beam. Although IR is invisible it will still
penetrate the human eye and cause serious damage ([Lit03]).Being invisible
additionally makes it more dangerous as there is only little warning of its presence.
Detecting infrared can be done with an infrared detector card which is about the size of
a credit card and contains an IR sensitive strip which will glow greenish when hit by an
IR beam. Care has to be taken not to use the card at high powers as this will burn a hole
in the detector. IR will also ignite graphite from pencils resulting in electric discharge
like crackling sounds.
4.5.6 Cleaning Optical Components
It is important to keep all optical components free from dustand grime / grease as local
heat development around pollutants can damage the optical surface due to the very high
instant laser powers.
If an optical surface does get dirty it must be cleaned. To avoid scratches it is necessary
to first blow the dust away using a clean air spray can (alwayshold them vertically or a
nasty sticky liquid will be expelled as well, or better: use filtered dry nitrogen).
Common pressurised air should not be used as this usually is dirty and can damage the
optics. More stubborn dust can be wiped away using a clean lens brush. The surface can
then be made free of grease and grime using reagent grade isopropyl-alcohol or reagent
grade ethanol and special optical grade wipes. More detailed information on cleaning is
given in reference [Ed05].
When handling light sheet optics it is usually sufficient tojust blow the dust away. Any
grease originating from seeding particles or fingerprints should be removed as well.
4.5.7 Optimising the Beam Overlap and Beam Path
For the lightsheets generated by laser 1 and laser 2 to lie in the same plane the beams
must be coincident. This requires the beams to overlap in thenear, middle and far field
or the two lightsheets will only overlap partially, resulting in poor correlation (weird
looking PIV vectors).
Another requirement is that the beam axis is roughly coaxialwith the optical axis of the
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Chapter 4 - The Laser
lightsheet, which while setting up the laser caused some problems. Initially the beams
were aligned to be coaxial with the laser output hole shown inFigure 4.12.
Unexpectedly the laser bench as used by Stephen Hall ([Hall01a]), which serves as an
interface between laser and lightsheet optics as there are no suitable mounting holes to
directly mount the optics on the laser, turned out to be roughly 4mm off axis with the
laser output hole. As the lightsheet optics described in Chapter 5 was designed to be
able to correct for a beam which is no more than 0.5-1mm off axis, the laser beam axis
had to be corrected inside the laser. The resulting beam axiswas a compromise as the
lower position of the laser beam is limited by the KTP crystal tilt mount.
To align the beam path it is necessary to remove the laser front cover and override the
interlock switch located close to the output (tape the switch down). The infrared beam is
now exposed! Work should only be performed at low powers justabove the lasing
threshold(<1-3mJ) and the laser level (height) kept below eyesight. Note that a small
fraction of the green light will be reflected by the dichroicmirror and can pass
sidewards out of the laser.
The first step is to position beam 1 to the desired location relative to the laser output
hole. This step is not necessary for correction of the beam overlap and it should be
avoided otherwise. Beam 1 can be positioned by using steering mirrors SM1 and SM2
(Figure 4.12). The infrared beam has to be visualised using an infrared detector card.
One should try to keep the beam roughly horizontal to the laser base and in the centre of
SM2. It might be necessary to slightly move the KTP crystal incase it partially blocks
the beam (consult Chapter 4.5.9).
The next step is to get beam 2 coincident with beam 1 by using the steering mirrors
SM3 and SM4. SM3 (and only SM3!) is used to get beam 2 to overlapbeam 1 in the
near field. Then SM4 is used to do the same in the far field, at least 2 meters from the
laser. This step must then be repeated until the beams coincide. Note that if after
correcting the near field the far field is misaligned again and vice versa, slightly
overshooting the target overlap can speed up alignment.
Finally it must be checked that the infrared beam is still directed into the beam dump
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Chapter 4 - The Laser
BS. If necessary the last steering mirror can be used for correction. Note that the
infrared beam will burn objects if not dumped appropriatelyand at higher laser powers
can even leave pits on metal surfaces such as aluminium.
Tips, Hints and Notes:
• Wear safety goggles, especially in the far field where the beam goes free across the
workspace.
• Colour a piece of white paper with an orange textmarker and mark a black dot in it.
Viewing the green beam on the orange colour with the strong laser goggles gives an
excellent contrast and the dot makes a good target. This willalso allow to see ring-
like patterns of the laser beam intensity distribution.
• Use these ring-like patterns occurring across the laser beam as a help for alignment.
• Using the control pad (Chapter 4.4.4) to turn the laser on/off is convenient for this
operation.
• Don't touch any optical components such as the mirrors! If itdoes happen the mirrors
must be cleaned from grease and dust as outlined in Chapter 4.5.6.
4.5.8 Storing the KTP Crystal
If the laser has to be disconnected from the mains power supply for a longer time (more
than a day) it is necessary to remove the KTP crystal from the laser and store it at a dry
place.
The KTP crystal is mounted in a housing (Figure 4.13) which also contains its heater
and an electrical connector. It can be removed from its housing mount shown in Figure
4.14 by using two thumbscrews. Storing the crystal can be done by putting its housing
in a plastic bag which is then put in another plastic bag containing silica gel pads
sucking up moisture. After sealing the plastic bag it is bestto wrap some padded foil or
similar protection around the sensitive crystal.
When mounting the crystal back into the laser again it can be necessary to slightly
correct its alignment as explained in Chapter 4.5.9.
4.5.9 Optimising the KTP-Crystal Alignment
As stated in Chapter 4.2.6 the efficiency in converting infrared to green laser light by
74
Chapter 4 - The Laser
using a KTP crystal is dependent of the angle of indicence andfollows a sin2(x)/x
function.
Figure 4.13 KTP housing.Figure 4.14 KTP housing mount / tilt.
The KTP used with the Ekspla laser has a maximal conversion efficiency of 60%
(according to Ekspla) which in case of total misalignment reduces itself to 0%, that is
no green light will be visible. The Ekspla KTP is only sensitive to rotation around the
vertical axis and insensitive to rotation around the horizontal axis. To prevent back
reflections into the laser cavity (would destroy the laser)the crystal must be tilted
forward around the horizontal axis. The meaning of rotating around vertical / horizontal,
which can be a bit confusing, is further illustrated in Figure 4.14 with knob (a) rotating
the crystal around the horizontal and (b) around the vertical axis.
The crystal can be aligned as follows:
• First of all note that using laser goggles will make life difficult. The orange looking
532nm goggles will make it impossible to see the green glow of the detector card and
the greenish looking IR-only protection goggles will not protect against the 532nm
light.
• Shield the side of the laser against reflections from inside(especially the small
fraction of green not passing through the dichroic mirror).
• Don't place the laser on eye level.
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Chapter 4 - The Laser
• In case of strong misalignments such as after strongly changing the path of the beam
or after completely removing the tiltable KTP holder (Figure 4.14) it is best to begin
with loose base screws (don't unscrew the screws though), allowing to move around
the crystal parallel to the laser base plate.
• Make sure the KTP crystal is tilted forward (Figure 4.14 knob(a)) so that no
reflections will get back into the laser.
• Increase the flashlamp voltage until the IR is just visible on the IR detection card; do
not work at higher FL voltages.
• Move the crystal around by hand. Notice the in- and decrease of green light intensity
when rotating it around the vertical axis.
• Roughly find the maxima (qualitatively or quantitatively by using the energy meter).
→ Make sure the entire laser beam cross section passes through the crystal.
• Tighten the tiltable KTP mount to the laser base plate.
• Further optimise the maxima by using the fine adjustment screw (Figure 4.14 knob
(b)) and reading the pulse energy from the energy meter (Chapter 4.5.11).
→ Note that at the low laser powers the pulse energy tends to be unstable. Waiting
for a while will help stabilising this a bit but some engineering judgement of the
maxima's location will still be necessary.
4.5.10 Measuring the High Voltage at the Pockels Cell
As explained in Chapter 4.2.3 applying high voltage to the pockels cell will prevent
population inversion and thus the laser from lasing. Suddenly inverting the high voltage
during the flashlamp pulse will in turn result in a powerful flash.
The reason for measuring the high voltage was because after the laser returned from
repairs in Lithuania it initially only produced very weak flashes as if no high voltage
were applied to the pockels cell. Occasionally however (~ 1 in 100 flashes) a brighter
flash could be observed. To analyse the problem it was necessary to measure the high
voltage and flashlamp pulses.
Figure 4.15 Std. oscilloscope probe converted to a HV antenna.
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Chapter 4 - The Laser
An electric current flowing through a cable will cause a magnetic field around the cable.
Changing currents will cause a change of the magnetic flux which in turn will induce a
current proportional to the time rate of change of this magnetic flux in any cable close
enough to the magnetic field (compare literature on physicssuch as [Her02]). This can
be used to pick up the flashlamp and pockels cell signal usingby a simple antenna
connected to an oscilloscope, without having to make any cumbersome direct
connections to high voltage cables.
Constructing a suitable antenna to pick up the pockels cell high voltage signal at first
wasn't simple as the magnetic field induced by the strong flashlamp current tends to
predominate. However together with some suggestions from Ekspla in Lithuania a
solution was found by using an ordinary oscilloscope probe,which is shielded except
for its needle like tip. Placing this tip close under the pockels cell allowed to pick up an
excellent Q-switch signal. A good place to for the probe was ahex socket of a screw as
shown in Figures 4.16 and 4.17. Note that the tip of the probe had to be covered with
masking tape shown in Figure 4.15 as direct electrical contact with the screw would
have resulted in picking up the flashlamp current again.
Figure 4.16 HV measurement location. Figure 4.17 HV "antenna" installed.
Picking up the flashlamp signal was done by a winding up a wireto a coil and placing it
next to the flashlamp (Figure 4.18), away from the second flashlamp which would have
disturbed the signal. Note that the cable between the end of the wire and the
oscilloscope must be shielded or other disturbing signals will be picked up again.
As the change of the magnetic flux is measured, the flashlampand HV pulse picked up
by the oscilloscope as shown in Figures 4.19 and 4.20 show theunscaled time
derivative of the signals described in Figure 4.6.
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Chapter 4 - The Laser
It is important that the flashlamp and Q-switch (HV) pulse occur at the same time and
same frequency. The initial problem which occurred after the laser was returned from
repairs was that the triggering mode switch (Figure 4.9, S3)was set to internal, which
means that the internal clock in the power supply triggers the flashlamps while the HV
pulse is triggered by the control unit. On the oscilloscope both signals moved relative to
each other and thus never correctly agreed. This revealed that the two clocks are not
synchronised and setting switch S3 (Figure 4.9) solved the problem.
Figure 4.19 HV vs FL pulse, no lasing. Figure 4.20 HV vs FL, lasing.
4.5.11 Measuring the Laser Pulse Energy
To check and / or optimise the laser's performance it may be necessary to measure the
pulse energy. Sensors based on pyroelectric crystals, which build up an electric
potential due to the development of heat when absorbing laser light, are suited to
measure the energy of pulsed lasers such as the Nd-YAG types used for PIV.
78
Figure 4.18 HV and flashlamp measurement setup.
Chapter 4 - The Laser
Figure 4.21 Measuring the infrared pulse energy.
A pyroelectric head together with a display from Ophir was used to measure the laser
pulse energy of the green 532nm and infrared 1064nm light. The laser light had to be
attenuated by a special filter to avoid destroying the pyroelectric head. Users should
take care not to mistake the pyroelectric with the photodiode and other heads as these
are not suited for the Nd-YAG laser and would be destroyed. Further information can
be found on Ophir's website (www.ophiropt.com) and in [Oph03].
4.5.12 Optimising the High Voltage Circuit
To get an optimally powerful laser flash it is a requisite that there are no leaks. Having a
leak means that the laser emits infrared light, perhaps evenbelow the conversion
threshold to green light, while the flashlamps are flashingbut without inverting the high
voltage at the pockels cell (laser in 'off' mode).
After fixing the synchronisation problem it was found that the laser in off mode (Q-
switch off) would begin to emit infrared light at flashlamp voltages around 1400V. By
adjusting the HV trim potentiometer shown in Figures 4.22 and 4.23 the high voltage
level was adjusted until no infrared was emitted up to (and including) the maximal
applicable flashlamp voltage of 1600V.
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Chapter 4 - The Laser
Figure 4.22 Laser control unit (beneath thepower supply cover).
Figure 4.23 Potentiometer to tune the Q-switch HV signal.
4.5.13 Optimising the Q-Switch Timing
As explained in Chapter 4.2.3 and shown in Figure 4.6 the optimal time to invert the
high voltage at the pockels cell ('switch the Q-switch') is when the population in the
lasing material is maximal and thus the laser energy will be maximal too.
This Q-switch timing, which usually is relative to the beginning of the flashlamp pulse
or flashlamp trigger, can be adjusted and in fact used to change the laser output power
without changing the flashlamp voltage. The difference between the 'Ma' and 'Ad'
setting on the Eskpla laser control pad lies in the Q-switch timing and by using the
RS232 interface controllable via a computer the pulse energy can be adjusted between
10% ('Ad') and 100% ('Ma') in integer steps (Chapter 4.6).
The time between flashlamp trigger and maximum laser power can be programmed into
the Ekspla laser via the control pad (only) by setting the 'O-E1' and 'O-E2' value while
in regime 8 – servicing mode as outlined in Table 4-2. By tuning with the energy meter
(Chapter 4.5.11) it was found that the optimal delay value isaround 190µs (or
760x250ns steps).
4.5.14 Potential Problems and Troubleshooting
There are a number of issues which can keep the Ekspla laser from operating correctly.
This chapter will address some of the encountered problems addressed and additionally
a more complete listing can be found on pages 30 through 32 of the laser manual
[Eks97]. Further troubleshooting support can also be foundby asking the laser
manufacturer ([email protected] – Irmantas Mikulskas).
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Chapter 4 - The Laser
– Potential problems –
No lasing but flashlamps flashing:
• The following assumes that the lasing mode is not off and the flashlamp voltage is
above the lasing threshold (but not higher than 1600V).
• Check if infrared is emitted (this can be checked before the KTP crystal using the IR
detection card – Chapter 4.5.5).
→ If IR is emitted and no green light can be seen after the KTP crystal then the
crystal could be misaligned or dissolved due to insufficient or no heating.
→ If no IR is emitted then turn off the electro-optics (no HV at the pockels cell); see
Table 4-2. If still no IR can be seen then first check if the interior of the laser is
still clean, i.e. no leaks occurred. This can either be done by opening the
flashlamp cavity or by illuminating the interior via a flashlamp at the front end of
the laser and viewing with a mirror at the back end of the laser. If there is good
transparency without any dirt it is likely that the laser mirrors are misaligned.
Alignment of the mirrors is a 'complicated' procedure whichrequires a He-Ne
laser and usually has to be done by a professional with the right equipment and
training.
Weak lasing while flashlamps flashing and laser off:
• Most likely the high voltage is not correctly applied to the pockels cell.
→ Check that the EO is on via the control pad (Table 4-2).
→ Check the HV cables and HV / trigger signal unit / box (Figure 4.12). There could
be a bad contact.
• Another possibility could be misalignment of the pockels cell, which would allow a
part of the light to still pass the polariser plate.
→ This is not so simple to solve, contact Ekspla ([email protected]).
Poor beam quality (ugly looking lightsheet):
• Possibly dirt (apart from other damage); consult Chapter 4.5.6 for more information.
• Make sure this is not caused by additional windows. They mustbe clean and the
materials transparent without leaving streaks.
Varying light sheet intensities:
81
Chapter 4 - The Laser
• This is usually due to thermal stability. Run the flashlampsfor a long enough time
(several minutes) to warm up the laser. It is not necessary toactually lase and
keeping the flashlamps flashing for short 1-3 minute interruptions while just turning
of the Q-switching will further help stabilising.
Interlock:
• There are several: Laser front shutter, at the back of the power supply, when opening
the laser covers, ... .
Error LED's:
• Turning the laser on/off again can help.
Water overheat:
• Adjust the set temperature using button B7 in Figure 4.9.
4.6 Labview Laser Control
4.6.1 Introduction
While the Ekspla laser control pad shown in Figure 4.9 is small and handy, its
compactness is also its greatest disadvantage. Users may tend to find that for laser
maintenance and alignment tasks where the main operation isturning the laser on and
off the control pad allows a great degree of freedom. For PIV use on the other hand the
control pad makes it very difficult to keep track of the different settings such as delay
between lasers and repetition rate which are all hidden under different menus. It also
gives no real feedback in case something doesn't work and it only allows two laser
power settings (10% and 100%).
Another option for controlling the Ekspla laser is by sending serial commands via a
computer's RS232 port. The RS232 commands cover all optionsavailable with the
control pad in regime 0 and additionally allow to set the delay between flashlamp
trigger and Q-switch pulse at levels not just correspondingto 10% and 100% pulse
energy but at freely chooseable integer values between 10 and 100 (%). Although it is
not possible to access any laser servicing options (controlpad regime 8), this is not
overly relevant for normal laser use either.
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Chapter 4 - The Laser
As no prewritten software was available it was decided to write a control interface using
the National Instruments Labview software (www.ni.com). Labview is a graphical
programming environment. This means that contrary to more conventional (or classical)
programming languages where the code is text based, a Labview program, called a vi or
virtual instrument, is written by linking ('wiring') graphical building blocks together.
These building blocks can be almost anything from a simple addition operator to a full
blown sub-vi (i.e. subprogram).
4.6.2 Program Usage / Interface
Starting the program requires opening it in Labview, connecting the computers COM
port to the lasers RS232 interface, verifying the serial port selection (pulldown menu on
the right of the program in Figure 4.24 ) and clicking the run button (file – run).
Figure 4.24 Laser control program interface.
Upon running the program it will first try to connect to the laser by sending a series of
commands and then wait for an answer from the laser. A successful activation of the
laser can be seen from the command history table as shown in the bottom part of Figure
4.24. Failure to connect typically occurs when not turning on the laser or when
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Chapter 4 - The Laser
choosing the wrong COM port setting. Once the laser has been activated for RS232 use
the control pad will no longer work until the laser has been turned on an off again.
Note that despite only few steps being involved users not familiar with Labview may
find it difficult at first to actually get the program running. In this case it can be useful
to ask a more frequent Labview user on how to run a program and on how to change
settings in pulldown menus before running it. Once the program is running however, the
use should be pretty straightforward, similar to most other Windows programs.
On the upper right side of the program the user can set the Q-switch frequency (number
of double flashes per second), which for the camera used during this project is 10Hz.
Right beneath it is the control to set the delay between laser1 and laser 2 in
microseconds.
Note that after every new command or when changing a setting the command history –
shown in the lower half of the program window – gives feedbackover last few
commands sent to the laser together with the laser's response and an interpretation
thereof. This provides the user with information about whether the laser is actually
performing the requested tasks.
In the centre upper part of the program two controls to set thelaser energy from 10% to
100% are located. These controls change the time between flashlamp trigger and Q-
switching, which in turn influences the amount of flashlampenergy actually converted
to laser light. It is good practice to begin at low pulse energies and gradually increase
them until the necessary light intensity is reached. To ensure that the laser will already
lase at the 10% setting, the flashlamp voltage must be chosenhigh enough (at least
30mJ @ 100%). The advantage of these energy controls is that the flash intensities can
be fine tuned from the same computer where the camera image isrecorded, thus
liberating the user from the time-consuming hassle of having to go to the laser power
supply every time a slight adjustment is to be made.
The upper left part of the program hosts a number of command buttons. Clicking 'Laser
1' or 'Laser 2' will start the Q-switching of the respective laser and if the flashlamps
don't flash yet turn on the flashlamps (mind the 5 second delay after turning on the
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Chapter 4 - The Laser
flashlamps). Clicking the 'Laser 1' / 'Laser 2' button againwill stop Q-switching but still
leave the flashlamps on, allowing to maintain more stationary thermal conditions and
thus a more stable beam. The 'Stop Both' button will stop the Q-switching and the
flashlamps of both lasers. Note that the reason why the flashlamps and Q-switches aren't
started independently grew historically due to the available serial commands which
themselves don't accommodate a special command to start the flashlamps.
Finally the 'Request Status' button can be used to get information about any possible
problems such as interlocks keeping the laser from operating. The more common error
replies such as shutter closed are directly interpreted. Some hints on error codes not
encountered while testing the program might be found on page20 of the laser manual
[Eks97].
Clicking quit in the upper right corner will as the name implies quit the program after
sending a stop command to the laser.
4.6.3 Program Structure
Starting point for the program structure and interface was the documentation of the
available RS232 commands as shown in the laser manual pages 18 through 20. For
simplicity and in accordance with good Labview programmingpractices the program is
built on writing simple vi's (virtual instrument, i.e. Labview program) which eventually
are combined in a comparably complex interface vi shown in Figure 4.24. Each vi has
got a user interface and can be run 'independently' (i.e. it might need some of the other
vi's to be able to run). This allows controlling the laser without having to access the
main interface vi as shown in Figure 4.24.
Due to the graphical programming technique printing the Labview program on paper
requires large formats, which seemed unpractical for the report. The documentation of
the vi's as produced by Labview have thus been made available on the web:
http://www.yaroc.ch/unsw/
Alternatively it is also possible to request the vi documentation from the author
The first vi, called Activate_Ekspla.vi, as its name implies does nothing but activate the
85
Chapter 4 - The Laser
laser. Activation success is indicated by a boolean value.
The second vi, called Send_a_Command.vi, is used to send strings to the laser and read
the lasers reply. Any kind of string can be sent so the user is relatively free in
experimenting with commands.
After experimenting with the different commands and the laser's replies, of which the
latter differed a bit from the laser manual, the Ekspla_Serial_commands.vi was written.
Here a set of user-selectable pre-written commands are stored in a pull-down menu and
an interpretation of the more common laser replies is made as well.
Finally all sub-vi's were combined in the main vi named Ekspla_Commander.vi having
the interface shown in Figure 4.24. The graphical depencendies of the different program
components are shown in Figure 4.25.
Figure 4.25 Labview laser control program dependencies.
4.6.4 Effect of the Energy% Setting
Reducing the energy channel 1 / 2 setting adjustable with theLabview laser control
leads to a linear increase in the delay time between flashlamp and Q-switch trigger as
shown in Equation (4-4), which was made by a linear regression of delay time
measurements. The corresponding decay in pulse energy is not exactly linearly related
to the linear increase in time and is also dependent of the applied flashlamp voltage but
according to the Ekspla laser manual the resulting laser pulse energy at the 10% energy
86
Chapter 4 - The Laser
setting will be roughly 10% of the laser energy at the 100% setting.
t FL.Qswitch≈190µ s100−E%⋅131µ sEquation (4-4) Approximate delaybetween FL and Q-switch trigger.
87
Chapter 5 - The Light Sheet
5. The Light Sheet
5.1 Introduction
As the lightsheet designed by Stephen Hall ([Hall01a]) and originally used with the
Ekspla laser was no longer available an alternative had to befound. It was first intended
to buy a custom- or commercially made lightsheet from such manufacturers as Dantec,
ILA-Oxford lasers and LaVision, together with a specially made mirror system allowing
to use the lightsheet downwards and sidewards of the laser. All offers turned out to be
too expensive compared with what could be afforded from the available budget and so
another solution had to be found.
It was decided to try and design a suitable lightsheet opticsmade from standard pre-
made parts available from optics suppliers. Because the possibility to get parts
manufactured in workshops was highly limited at the time as many standardised ready-
made parts as possible had to be used.
This chapter will therefore first describe some basic principles in designing a lightsheet,
then address a design based on standard parts from Edmund Optics, and finally discuss
mounting this light sheet to the Ekspla laser by using a mirror based beam redirection
system.
References used for designing the light sheet and this chapter are first of all basic
knowledge on optical lens systems as can be found in literature on basic physics such as
[Her02], [Schä99] and most importantly the Melles Griot Optics Guide ([MelG02]). In
addition the light sheet specifications from LaVision ([LaV03d]) and Dantec ([Dan02]),
which contained some more practical details about their lenses were found to be useful.
Finally some information found in [Raf98] (Chapter 2.3) and[Wer02] (Lecture 3) was
used as well.
88
Chapter 5 - The Light Sheet
5.2 Principles in Designing a PIV Lightsheet
5.2.1 Introduction
Light sheet optics consist of a lens system turning a cylindrical beam in to a planar
sheet of light. Due to space restrictions basic lens theory as described in [MelG02] will
not be covered in this report. As it was aimed to keep the descriptions shown in this
report simple, readers having only a basic idea of what a lens does should still be able to
follow.
First of all a number of do's and don'ts when using lenses in a high power laser beam
path will be addressed. Then creating an actual light sheet is described by a succession
of simple lens combining steps.
5.2.2 Lens Material Damage Thresholds
In Appendix 4 it was estimated that the peak power densities (intensities) of the Ekspla
laser will be on the order of 100 MW/cm2. Due to these very high intensities the quality
and durability of the used optical materials becomes very important as wrongly chosen
optical components or poorly manufactured parts can end up being shattered, dimmed,
hazy, that is simply in an unusable condition.
Selecting suitable lenses depends on choosing the right type of glass, glass quality
(purity), type and quality of coatings and on the quality of surface polishing. There are
roughly two parameters determining the damage threshold: The durability of the
(ideally pure) base material itself and any disturbances caused by impurities or surface
roughness. Disturbances can cause self focussing of or absorb laser light, both leading
to local heat development resulting in damage.
A more thorough discussion on selecting suitable lens materials and coatings is made in
Appendix 4 on pages two and three . It was decided to base all lens materials on BK7
glass, combined with an MgF2 coating where available. It was further decided to only
choose lenses of highest quality as obtainable from Thorlabs, Edmund Optics or Melles
Griot.
The MgF2 coating reduces the amount of reflected 532nm laser light per surface from
89
Chapter 5 - The Light Sheet
4.3% to 1.5% (compare Appendix 4). Note that it is possible tomake wavelength
specific coatings allowing a transmission ratio of more than 99% per surface but such
lenses usually are made on order only and cost more than on-stock material.
5.2.3 Do's and Don'ts: Back Reflections
Whenever light passes from one surface to another having a finite difference in the
index of refraction a certain fraction of light will be reflected. While the fraction of
reflected light can be reduced by choosing an appropriate surface coating, it will still be
on the order of 1% per surface, which is a lot.
As laser light reflected back into the laser can cause serious damage it is of outmost
importance to arrange the lenses in a way that the incoming laser light will impinge on a
curved and not on a plane surface as shown in Figure 5.1. This will cause the reflected
light to scatter in multiple directions and not straight back into the laser.
Figure 5.1 Avoiding back reflections.(adapted from [Raf98], Fig. 2.21)
5.2.4 Do's and Don'ts: Power Density
Great care has to be taken whenever a lens with a positive focal length leading to a
converging beam is used. Reducing the effective beam cross section will lead to an
increase in intensity (power per area or power density) which can result in the following
problems:
• High beam intensity above the lens damage threshold.
• High beam intensity causing even stronger reflections.
• Increase of power density to the point that the air is ionised, noticeable by the noise
of the resulting electric discharges. This is especially a problem when removing the
diverging cylindrical lens from light sheet optics.
90
Chapter 5 - The Light Sheet
Situations where the beam is focussed onto a small spot or strip are shown in Figures
5.2 and 5.3 . It is apparent that the entire beam power will be concentrated at that spot
leading to unacceptably high power densities. Distributing the beam power across a thin
strip of a light sheet as shown in Figure 5.5 in contrast is usually not problematic.
Note that there are several examples of light-sheets suitable for low power cw lasers in
literature (in particular Figures 2.19 and 2.20 of [Raf98])which result in relatively high
power densities when used with Nd-YAG lasers and thus should not be applied.
5.2.5 From Beam to Lightsheet: The Basic Principle
Placing a single, one-dimensional (cylindrical) lens withpositive focal length in the
path of a laser beam gives a converging-diverging beam cross-section of constant width
as shown in Figure 5.2. As stated in Chapter 5.2.4 this will result in high intensities at
the focal point (which is of finite extension) and should be avoided.
Figure 5.2 Converging 1-D lens.
A similar situation as in Figure 5.2 is shown in Figure 5.3 with a 2-D lens of positive
focal length. The main difference is that the converging-diverging beam cross-section
now remains circular and that the intensity at the focal point is even higher.
Figure 5.3 Effect of a 2-D beam converging lens.
91
peak power concentrated in a small strip, intensity potentially a bit too high
converging 1D lens
focal length f
elliptical cross section, of constant width and varying height (thickness)
focussing lens→ converging beam
peak power in a very small area → too high intensity
focal length fcircular cross section,axially varying diameter
Chapter 5 - The Light Sheet
Placing a one-dimensional lens with negative focal length in the laser beam path results
in a diverging beam with an elliptical cross section of constant height (thickness) and
increasing width as shown in Figure 5.4. A two-dimensional lens of negative focal
length would also result in a diverging beam but with a circular cross-section of
increasing radius.
Figure 5.4 Effect of a 1-D beam diverging lens.
For three-component PIV applications, where a certain thickness is necessary
(→Chapter 3.3), the simple lens shown in Figure 5.4 can alreadymake a useable light
sheet although it is not possible to vary the thickness. In most applications of two-
component PIV however it is desired to have a thinner light sheet in order to reach
reasonably high intensities. This can be achieved by combining a lens having a positive
focal length with a 1-D cylindrical lens having a negative focal length as shown in
Figures 5.5 and 5.6.
Figure 5.5 Combining a 2-D converging and 1-D diverging lens.
Next to the overall positive focal length f perpendicular tothe light sheet plane and the
92
diverging 1-D lens
elliptical cross-section of constant thickness and increasing width
additional diverging1D lens
peak intensity in a thin but stretched ellipse
converging2-D lens
elliptical cross section of axially varying thickness and width
back focal
length bfl
focal length f
Chapter 5 - The Light Sheet
overall negative focal length in the light sheet plane, the back focal length (bfl) is
another important parameter for PIV users. The back focal length specifies the distance
from the last lens in a lens system to the focal point, which isimportant for positioning
the laser and lightsheet optics as it usually is desired to have the focal point in the centre
of the camera image. The positive focal length determines the thickness of the light
sheet, which is important for the intensity distribution, and the negative focal length
determines the light sheet's angle of divergence.
Figure 5.6 Combining a 1-D converging and 1-D diverging lens.
5.2.6 On the Importance of the Light Sheet Intensity Distribution
It is apparent from Figures 5.5 and 5.6 that the resulting light sheet is of varying
thickness and width, resulting in a variation of cross section (area) and thus beam
intensity. The more even the light sheet intensity distribution however, the better the
conditions for a successful PIV correlation analysis as outlined in Chapter 3.7.10.
During the design of the light sheet used in this project it turned out that for the
available sheet angles the intensity variation due to increase in width is a lesser problem
than the variation due the varying sheet thickness.
t LS.waist∞f
dbeambeforelensEquation (5-1) - light sheet thickness proportionality
The thickness of the light sheet at its waist, i.e. at the focal point, is inverse proportional
to the laser beam diameter before the light sheet lens systemand proportional to the
overall focal length f. If the overall focal length turns outto be very small this can result
in a light sheet of rapidly varying axial intensity distribution. Note that having a large
93
diverging 1D lenson the other axis
converging 1D lenson one axis
focal length f
back focal
length bflelliptical cross section of axially varying thickness and width
Chapter 5 - The Light Sheet
back focal length (bfl) can still result in an unfavourably short focal length.
5.2.7 From Beam to Lightsheet: A More Advanced System
The focal lengths of the light-sheets shown in Figures 5.5 and 5.6 are fixed, so changing
the focal length would require changing a lens. A fixed focallength also doesn't allow
fine tuning the position of the beam waist except when makinga fixture allowing to
move the single focussing lens or when moving the laser, withboth solutions not being
overly practical. The much more elegant approach commonly made ([LaV03d],
[Dan02]) is to combine a diverging and a converging lens withvariable spacing
between the lenses.
Figure 5.7 Basic variable beam focussing system.
Such a diverging / converging lens system, which resembles an inverted Galileian
telescope, is shown in Figure 5.7 with two different lens spacings s. The closer the two
lenses are together the larger the (back) focal length and for lens systems where the
negative focal length is larger than the positive one it is possible to let the maximum
focal length go up to infinity, allowing to cover a very largefocal length range with just
two different lenses. A major drawback of this system is thata decreasing back focal
length leads to an over-proportional decrease of the resulting focal length, which in turn
results in a disadvantageous intensity distribution. In Figure 5.7 this becomes apparent
94
f2 (>0)f1 (<0) s(a)
f2 (>0)f1 (<0) s(b) (s(b)>s(a))
bfl(a)
f(a)
f(b)
bfl(b)
diverging lens
converging lens
a) small lens spacing → large bfl
b) large lens spacing → small bfl
Chapter 5 - The Light Sheet
from the ratio between the focal length f and the back focal length bfl (f/bfl), which in
case b) is considerably smaller than in case a). As this behaviour was especially
pronounced with the beam from the Ekspla laser special measures as discussed in
Chapter 5.3.3 had to be taken.
It is further possible to design a lens system allowing a variable light sheet angle but in
practice is is more common to just use a set of exchangeable cylindrical lenses
([LaV03d], [Dan02]) allowing to change the angle in steps asfine tuning is rarely
needed.
Creating a light sheet of constant width is a slightly more complex task no longer
allowing a small and compact lens system as some sort of big lens or mirror has to be
employed after a lens combination as in Figures 5.5 / 5.6. Such a system has been
designed and successfully applied in the PhD of Stephen Hall([Hall01a], [Hall01b]). In
practice however such constant width systems are rarely seen and most commercially
available PIV systems come with diverging light-sheets.
Note that designing a light sheet system as in Figure 5.7 is possible with 2-D as well as
with 1-D (cylindrical) lenses. Using 1-D lenses will have the advantage that the light
sheet divergence (angle) is independent of the focal lengthdetermining the light sheet
thickness, which among other things simplifies calculations. Varying the spacing
between the lenses in turn will no longer be possible by a simple threaded tube system
as with 2-D lenses, for the 1-D lenses must not be rotated relative to each other.
5.3 Designing a Lightsheet (LS) from Pre-Made Parts
5.3.1 Parts Available from Edmund Optics
Once it was decided to design an own light sheet the products available from the three
manufacturers Edmund Optics, Thorlabs and Melles Griot were evaluated for their
suitability. It was found that all three manufacturers had awide range of lenses which
could be used on optical benches or in custom manufactured lens holders / lens systems.
However manufacturing own lens holders was restricted as the schools workshop had a
strongly limited capacity during the period of the project hence another solution had to
be found. It turned out that Edmund Optics has got a number of modular parts
95
Chapter 5 - The Light Sheet
consisting of lens holders, focussing tubes, spacing ringsand other items actually
intended to be used as a lens prototyping system. While Thorlabs and Melles Griot also
offer a number of parts which can potentially be used in a light sheet optics only the
prototyping system from Edmund Optics allowed to constructa complete light sheet
without having to manufacture additional parts.
5.3.2 Mathcad Program for Evaluating Possible LS Configurations
It is possible to design an entire light sheet system by hand using a few simple
equations, roughly estimating a pair of suitable lenses, calculating the optimal lens
spacings and constructing a suitable housing. As pre-made Edmund Optics parts were
used the possibilities to house the different lenses were limited and adaptations were
only possible in relatively broad steps. Furthermore it wasalso found that
experimenting with a lot of different lens variations couldget very time consuming so
first a Mathcad sheet, titled 'Thin Lens Combination Calculator' was written. This
simple Mathcad sheet, given in Appendix 5, allowed to enter adifferent number of
lenses, focal lengths and lens spacings and would automatically plot the resulting beam
path.
Figure 5.8 Example light sheet intensity distribution.
Next to the simple Mathcad sheet a more complete one titled 'Light Sheet Optics
Calculation' given in Appendix 4 was written as well. Here the full range of calculations
96
Chapter 5 - The Light Sheet
necessary to design a light sheet were made. Next to calculating the beam path in a
similar fashion to Appendix 5 but now with the full detail of thick lenses, the damage
threshold, the maximal power density, the light sheet thickness and an estimation of the
light sheet intensity distribution are calculated.
Next to the damage threshold calculations, the estimation of the light sheet intensity
distribution (shown in Figure 5.8) was found to be especially useful as it allowed to
compare the quality of light-sheets at similar back focal lengths.
5.3.3 The Resulting Light Sheet
Being limited to pre-manufactured parts it turned out that it making a single lens
combination which would have allowed to work in a back focal length range from
500mm to 3000mm to infinity would in turn have resulted in an rather poor light sheet
intensity distribution at short distances around 500mm from the lens. The focussing
system and situation would have turned out to be similar to Figure 5.8b with the
relatively large beam diameter of the Ekspla laser (6mm compared to the 4.5mm of a
New Wave laser) further contributing to a rather thin beam waist (Equation (5-1)).
Figure 5.9 The applied focussing system.
As many applications were expected to be relatively close tothe laser an additional lens
was added at the beginning of the optics , resulting in an overall focal length which now
closely matched the back focal length, f≈bfl as shown in Figure 5.9 (this is also shown
in the plot on page 9 of Appendix 4). The cost of this measure isthat in its basic
configuration the working distance (i.e. back focal length) is in the limited range of
roughly 450mm-800mm. It is still possible to cover working distances from 450mm-
3000mm-infinity though, but it is necessary to swap a lens, which can be done quite
97
f ≈ bfl
additional converging lensf2 (>0)f1 (<0) s
f3 (>0)
resulting longer focal length
Chapter 5 - The Light Sheet
easily as the lenses are mounted in exchangeable threaded tubular lens holders.
The light sheet angle was limited to the only two suitable cylindrical lenses available
from Edmund Optics. At a working distance of 500mm the maximal light sheet width is
roughly on the order of 125mm which might be a bit small for some applications but
still gives a reasonably large field of view considering thedistance is just 500mm from
the laser. Alternatively it is possible to buy a stronger lens from Thorlabs or Melles
Griot but this in turn requires to manufacture a lens holder,not possible at the time the
light sheet was designed.
5.3.4 Mounting the Parts and Using the Final Light Sheet
A drawing of the resulting light-sheet is shown in Figure 5.10. All parts are from the
Edmund Optics catalogue, with further details on the different possible lens
configurations and the resulting light sheet dimensions given in Appendix 6.
Figure 5.10 Modular light sheet optics.
Mounting the lenses was relatively straightforward, with the main tools used being
plastic tweezers to place the lenses into the lens holders and spanner wrenches to
tighten the ring fixing the lenses. Great care was taken not to make the lenses dirty by
wearing gloves and working in a relatively clean environment.
When changing parts of the modular light sheet optics it is advisable to avoid heavier
dirt getting inside the lens holders and on the lenses. Dust can and should be blown
away using clean pressurised air (best: dry nitrogen) from aspray can (don't tilt them to
98
Chapter 5 - The Light Sheet
avoid spilling out liquid). Further cleaning instructions are given in reference [Ed05].
A final note when using the lightsheet - there are two critical points:
• The rotationable module, which is a bit unstable (can cause the light sheet to fall). It
is intended for rotating the light sheet, which in the unsensitive range of the focus
can also be done by turning the focussing tube.
• The light sheet focus as after 25mm it will unscrew completely.
5.4 Designing a Beam Redirection Mirror and LS Mount
5.4.1 Introduction
As the Ekspla laser must be mounted horizontal (more or less)it was decided that a
suitable light sheet mount would enable pointing the sheet sidewards and downwards of
the laser as straightahead would be a rare option. This required a design with a mirror to
redirect the beam and allowing to compensate for small misalignments. To avoid having
to manufacture a great number of parts the laser bench designed by Stephen Hall
([Hall01a]) was used as a starting point to mount the light sheet.
5.4.2 Choosing a Suitable Mirror
It may sound surprising but mirrors with standard metallic coatings (even the very high
quality ones) will only reflect around 85%...95% of the incoming 532nm laser light at
45° angle of incidence (compare with Edmund Optics and Melles Griot mirror
datasheets). The remaining 5% to 15% will predominately be absorbed in the base
material, what in case of high power laser light would resultin damage of the mirror
and eventually make the mirror useless as also was noted in [Hall01b].
If the incident light consists of a single wavelength it is possible to optimise the coating
to maximise reflection for that particular wavelength. Forthe current application such a
special laser line mirror reflecting more than 99.8% of the incident laser light was
chosen from Edmund Optics.
99
Chapter 5 - The Light Sheet
5.4.3 Mount Design and Alignment
The basis for the light sheet mount and mirror holder are three plates connected together
in a corner like configuration. These plates connect to the laser bench, mirror holder and
light sheet adaptor ring as shown in Figure 5.11.
Figure 5.11 Light sheet mount and beam redirection mirror.
Full assembly and alignment instructions are given in Appendix 7. Basically the
alignment is done by first mounting a tube with two aperturesabout the size of the laser
beam cross section at each end. The beam cross section passing through this tube is then
maximised by optimising the position of the mirror.
5.5 Possible Future Extensions
There are a number of possible extensions and enhancements which could be made with
the light sheet system.:
• By using a different cylindrical lens the light sheet angle (width) could be increased.
This requires manufacturing a lens adaptor as outlined in Part 6 of Appendix 6.
• A more stable version of the light sheet rotation ring (located at the back end of the
light sheet) could be designed and manufactured.
100
Chapter 5 - The Light Sheet
• Strictly seen the mirror used to align the light sheet does not suffice as an additional
dimension of translation is necessary. Designing the lightsheet holder so that it can
be translated normal to the plane perpendicular to the laserbeam would solve this
detriment.
• Finally it is also possible to completely redesign the lightsheet so that it can be used
at working distances between 500mm and infinity but as already stated this will
require manufacturing specially adapted lens holders and focussing tubes.
101
Chapter 6 - Camera, Lens and Imaging
6. Camera, Lens and Imaging
6.1 Introduction
Unlike conventional consumer cameras where settings such as focus, aperture, exposure
etc. are set automatically, PIV cameras and lenses require making these settings
manually. Consequently the PIV operator should know and understand some of the
basic issues about camera, lens and imaging systems as addressed in this chapter. The
topic itself is more far more complex than what is covered here and can fill several
books. More interested readers are thus again referred to [Raf98], PIV manuals
([Dan00a], [LaV02b]) and a the vast amount literature available on photography such as
the 'freely' available [Merk90].
The topics addressed includes basic lens principles, properties of CCD chips,
reflections, imaging of particles, and viewing at different angles. An additional
overview on the Redlake Megaplus ES1.0 camera used in this project is given as well.
6.2 Basic Principles
6.2.1 Components of a PIV Lens / Imaging System
Figure 6.1 Imaging a seeding particle.
102
image – lens distance z
0object – lens distance: Z0
image plane(CCD chip, film, ...)
aperture, diameter D
a
Da
bandpass filter(e.g. 532±10nm),
illuminated object(particle in lightsheet)
object plane(lightsheet)
lens system(actually several lenses)
ambient light rejected
532nm laser light passes
obj
ect
scal
e H 0
imag
e sc
ale
h 0field of view(FOV)
y
z
y 0
Y0
depth of focus DOF
lens principal plane
Chapter 6 - Camera, Lens and Imaging
Figure 6.1 shows a schematic of the seeding particle image recording process. Light
reflected from a particle will be collected by a lens and imaged onto the image plane
containing the CCD chip (alternatively CMOS, film, ...). A good quality lens will also
accommodate a variable aperture, which in brief words allows to opt between better
image quality (sharpness, closed aperture) or more light (higher sensitivity, open
aperture) as explained in more detail in Chapter 6.2.5. Additionally a good lens will
allow to mount a filter and often optical bandpass filters mainly allowing 'only' the laser
light to pass are used. In order to get a sharp image the image-lens distance z0 must be
variable and especially when imaging close objects the lensquality and suitability
(macro lens) becomes very important.
Figure 6.2 Example of a quality macro lens.(from www.europe-nikon.com, PC-55-2_8.jpg)
Figure 6.3 Example of a zoom lens.(from www.europe-nikon.com, NZ-35-200.jpg)
An example of a real world lens commonly used for PIV applications is shown in
103
Chapter 6 - Camera, Lens and Imaging
Figure 6.2. Such a lens has got a fixed focal length and thus doesn't allow zooming. In
situations where the camera cannot be moved to adapt to the field of view a zoom lens
allowing to vary the focal length as shown in Figure 6.3 can be very useful.
6.2.2 Optical Bandpass Filter
The working principle of most PIV CCD cameras requires the exposure time of the
second double frame picture to be on the order of 30ms as will be outlined in Chapter
6.3. In comparison the laser flash duration of 5ns is more than six orders of magnitude
lower so any background light occurring during the 30ms exposure time will be
recorded and can deteriorate the resulting image to the point where it is no longer useful
for PIV.
Figure 6.4 Spectral transmission of a 532nm bandpass filter @10nm bandwidth.(adapted from [LaV02b], Fig. 12.2)
To avoid having to work in the dark optical bandpass filters are used which mainly let
the PIV laser wavelength pass. They are characterised by their central wavelength
(532nm for PIV), the 50% bandwidth (typically 10nm or 3nm) and the maximum
transmission at 0° angle of incidence (~65%). A typical spectral transmission plot of a
532nm bandpass filter with 10nm bandwidth is shown in Figure6.4. The bandpass
filters typically have got a shiny mirror like surface on oneside and a less reflective one
on the other. Although they work in both directions Edmund Optics (FAQ on Optics –
www.edmundoptics.com) recommends orienting the mirror like side towards the
104
Chapter 6 - Camera, Lens and Imaging
source.
(Based on [LaV02b] Chapter 12 and [Dan00a] Fig. 4-42 / Chapter 4.7.7.)
6.2.3 Focus
In order to get a sharp image the object has to be in focus, which means that the
relationship between the object position, image position and focal length must follow
Equation (6-1). A camera lens will (and must) allow to vary the image position z0 either
by a manual adjustment ring or automatically (autofocus). For PIV and generally in
technical photography it is more common to focus by hand as the object – camera
distance is usually fixed and conventional auto-focussingmethods often fail and focus
on something else.
1f=
1z0
1Z0
Equation (6-1) Relationship between focal length f, objectposition Z0 and image position z0 ([MelG02], [Her02]).
The range of the image position is an important parameter as this determines how close
the camera can be placed to the object – the larger z0 the closer the object. It is possible
to use extension rings to increase z0 and thus get closer to the object but this decreases
the amount of light collected and will also result in a poorerquality image, especially
when low quality lenses are used. Lenses allowing to focus very close to an object while
still resulting in a good image quality are called macro lenses.
On camera lenses as shown in Figures 6.2 and 6.3 the object – lens distance is marked.
While these markings are only valid for the camera type and model the lens was mainly
designed for and doesn't apply to most PIV cameras, the distances could be recalculated
and / or measured experimentally. Note that in lens systems with multiple lenses (i.e. a
common photographic lens) the lens principal plane (Figure6.1 - reference plane for f,
z0 and Z0) can also lie outside the actual lens system.
6.2.4 Zoom (Scale) and Field of View
By using simple laws of geometric similarity the magnification factor, which by
definition is the ratio between the size of the projection onthe image plane h0 and the
object itself H0, can be written as shown in Equation (6-2).
105
Chapter 6 - Camera, Lens and Imaging
M=z0
Z0
=h0
H 0
Equation (6-2) Lens magnification factor.([MelG02], [Her02], [Raf98]).
The field of view, which is the size of the object plane imagedonto the CCD chip, is
dependent of the magnification factor and the size of the CCD.
Combined with Equation (6-1) (6-2) can be rewritten as Equation (6-3), which shows
that to increase the magnification factor while keeping theobject distance Z0 constant
(zooming in) the focal length f has to be increased. Increasing the magnification factor
(focal length f) will thus decrease the field of view. If in turn one wants to increase the
field of view (zoom out) the focal length has to be decreased.Note that the ability to
focus the image will be limited by the range of the image distance z0.
M=z0
Z0
=h0
H 0
=...=f
Z0− f=
z0
f−1
Equation (6-3) Lens magnification factor continued.
6.2.5 The Effect of Aperture
The aperture influences the following three parameters:
• Amount of light collected: Larger aperture→ more light collected→ lower exposure
time possible → less shaky images.
• Depth of focus: Smaller aperture → increased depth of focus.
• Lens distortion effects: Larger aperture→ lower image quality (strongly dependent
of the lens quality).
In practice it is more common to express the influence of the aperture by using it to
normalise the focal length, resulting in the f-number shown in Equation (6-4).
f #=f
Daperture
Equation (6-4) f-number (normalised focal length)([Raf98], [Her02])
Increasing the aperture diameter will decrease the f-number. Although this is potentially
a bit confusing, introducing the normalisation does make sense as the parameters
influenced by changing the aperture are also inversely influenced by changing the focal
length.
That increasing the aperture (decreasing f#) will increase the amount of light collected is
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Chapter 6 - Camera, Lens and Imaging
quite straightforward to understand: The larger the opening the more light can get
through. The price however is an decrease in the depth of focus and to some degree in
image quality as will be explained in the next few paragraphs.
Using a lens to collect light will introduce errors which increase with increasing
distance the light ray collected by the lens has got from the optical axis. Closing the
aperture will limit the distance of the light rays from the optical axis and thus increase
the image quality. However such errors can be compensated bylens design and quality
and this should thus be less an issue when using a dedicated state of the art lens.
The depth of focus is the range normal to the object plane where the imaged object will
still be perceived as in focus. Strictly seen anything outside the object plane is out of
focus but the limited resolution of the human eye / CCD chip will make a slightly
unfocused object still be interpreted as sharp.
Figure 6.5 Effect of opening the aperture.(compare with [Raf98] Fig 2.25)
The influence the aperture has on the depth of focus is described in Figure 6.5. An
infinitesimally small point will ideally be projected as a point again, i.e. the rays of light
emitted from the point will intersect in the projected point. If the actual image
(projection) plane lies before or after the ideal projection plane however the rays of
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point('out' of focus)object plane
Z0
z0
f f
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small ('closed')aperture
wide open aperture
ideal point projection
d poin
t
d poin
t
small ('focussed')projection
large ('unfocussed')projection
Chapter 6 - Camera, Lens and Imaging
light won't intersect on the projection plane but be form a spot of finite extent. If this
finite spot is below the resolution of the CCD chip or human eye it won't be
distinguishable from an infinitesimally small point (perfect projection) and thus still
appear in focus. A spot size above the resolvable limit will in turn appear as blurred
and, in case of a very big spot, have such a low intensity (power per area – big area, low
power) that it won't even be noticed.
It is shown in Figure 6.5 that opening the aperture will causethe rays originating from a
point to have a very wide opening angle between the outmost rays when the aperture is
open. Contrary to a small aperture this will result in a very large and blurry looking
spot.
6.3 Properties of CCD Chips used for PIV
6.3.1 CCD Chips used for PIV
In order to record an image it is necessary to measure the spatial distribution of the light
energy impinging on the image plane in a certain period of time (exposure). In most
PIV applications this is done by using a CCD (charge coupled device) chip.
Figure 6.6 One CCD element (pixel).(from [LaV02b] Fig. 11.1; similar to [Raf98] Fig. 2.36)
Figure 6.6 will be used to to explain the basic principle of a CCD in very simple words
(for a more complete explanation consult [Raf98] Chapter 2.6.1). A photon (single
quantity of light) absorbed in the light sensitive region ofa single CCD element can
potentially release an electron (the likelihood of this event is called quantum efficiency
QE). The structure of the CCD chip allows such electrons to bestored as a charge,
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Chapter 6 - Camera, Lens and Imaging
proportional to the number of absorbed photons or light energy (intensity). This charge
can then be read and used as a measure for the light intensity.By reading the charge the
CCD potential will be reset and a new recording can begin.
Distributing such single CCD elements over an area as shown in Figure 6.7 results in
the CCD chip allowing to measure the discrete planar intensity distribution of light.
Figure 6.7 Arrangement of CCD elements in a PIV camera.(from [LaV02b] Fig. 11.2; compare [Raf98] Chapter 4.2.4 for greater detail)
A CCD chip is read row by row, which takes a considerable amount of time on the
order of 30ms. For PIV to work it must be possible to record to subsequent pictures on
the order ofµs between the two pictures. This can either be achieved by using more
than one CCD chip arranged in a complex system of prisms and shutters redirecting
light, with the main drawback being the prohibitive cost-factor. Luckily a much smarter
way has been found by first exposing the CCD elements and thentransferring their
charge onto separate storage areas located right next to each single element as indicated
in Figure 6.7. After a frame transfer time of less or equal 1µs the light sensitive area can
be exposed again while the stored charge is read out.
The timing associated with the readout of the CCD chip is shown schematically in
Figure 6.8 and will be addressed in further detail in Chapter7. More information can
also be found [Raf98] and PIV manuals such as [LaV02b] and [Dan00a].
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Chapter 6 - Camera, Lens and Imaging
Figure 6.8 Timing associated with CCD readout and PIV recording.(compare [LaV02b] Fig. 11.2 and [Raf98] Chapter 4.2.4)
6.3.2 CCD Damage (Overexposure)
Overexposing a single CCD element can lead to electrons overflowing onto
neighbouring elements typically filling entire columns as shown in Figure 6.9.
Figure 6.9 Pixel overflow fromreflections in multiphase flow.
Figure 6.10 Resulting permanent CCDdamage.
Figure 6.11 Strong reflections in dimples.above: from own test measurements on dimplesleft: from multiphase measurements at UNSW;
sample kindly provided by A. Litvak
110
time
even
t
readout image 1 readout image 2
time between pictures ∆t
frame transfer
frame transfer
exposure image 1 exposure image 2
laser 1 flash laser 2 flash
Chapter 6 - Camera, Lens and Imaging
Such an overexposure of the CCD chip must not happen as it can lead to permanent
damage noticeable by single white pixels or entire white columns as shown in Figure
6.10. Overexposure is a widely known problem and it is not uncommon to see PIV
manufacturers warning their customers about the phenomenon on the first few pages of
their PIV manuals ([Dan00a], [LaV02b]). According to [LaV02b] the damage can also
happen when the camera is turned off and the laser light causes local heating of the
CCD chip.
Typical sources of overexposure are strong reflections from walls and other objects
such as bubbles in multiphase flow. A safe approach is to gradually increase the light
intensity as far as necessary but no further than to the pointwhere the highest pixel
intensity values get close to saturation (i.e. 1023 counts for the Redlake ES1.0 camera).
It is also recommended ([Dan00a], [LaV02b]) to always put the protection on cap the
camera lens while it is not used or the laser adjusted.
Preventing overexposure is sometimes a bit tricky and care must be taken. In Figure
6.11 for example the laser light intensity was increased during the experiment as an
unexplainable decrease of the recorded intensity was noted. It turned out that this was
due to the excessively applied seeding smoke which attenuated the laser light and once
it cleared resulted in an overexposed image. Luckily the camera still worked fine
afterwards without showing any damage but it could have well turned out otherwise.
6.4 'Safe' Approach to Getting a Picture
The following description is the authors approach to adjustthe laser power relative to
the camera in a safe way. It is a possible but neither a universal nor the only method
which could be applied.
Among the greatest dangers when trying to capture the laser light reflected from
particles, walls and other things is that one keeps increasing the intensity but just can't
get an image. If it turns out that the problem is not the laser intensity but that the picture
isn't displayed on the computer monitor it might be that one has just successfully
destroyed a CCD chip worth several thousand dollars.
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To avoid such a nightmare it is useful to make a systematic approach which ensures that
certain types of errors can be excluded:
• First of all the laser light sheet must be in the plane of interest with the beam waist
(thinnest part of the light sheet) being in the centre of where the picture should be.
→ Only align the light sheet with the protection cap on the camera lens!
• Then a calibration image must be taken (without the laser running).
→ Close the lens aperture (highest f#).
→ Place a calibration target in the region of interest (e.g. piece of paper with
calibration markings; Chapter 6.7).
→ Illuminate the calibration target with a normal lamp (not the laser).
→ Set the camera into video mode so that a live picture can be viewed.
→ Remove the protection cap and carefully increase the exposure time up to the
maximum possible in video mode @20-25 fps (~32ms). The reason for the long
exposure time is to ensure that the laser flash will be captured and not missed.
Reduce the illumination of the target if it already is too bright.
→ Open the lens aperture until you get a nice image.
→ Remove the target; if a wall is in the field of view no seeding is needed, otherwise
seed the area.
→ Make sure the seeding / wall is still visible from the illumination with the lamp.
→ Then turn on the laser at low powers (repeatedly flashing); increase the laser
power until the flash is visible next to the illumination from the normal lamp.
→ Once the flash is visible place the optical 532nm bandpass filter on the lens. Most
light from the normal lamp should now no longer be noticeable.
→ If necessary increase the laser light a bit more until it is clearly noticeable (don't
overexpose, check the pixel intensity values).
→ Now the camera can be switched from continuous live picture (video) mode to
triggered double frame exposure mode and the timing adjusted as described in
Appendix 13.
The above steps ensure that once synchronised correctly in triggered double frame
recording mode the laser light should be visible and the camera won't be overexposed as
long as the laser pulse energy is not changed. In case of having no picture this allows to
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exclude the possibility of having a too low laser light intensity or a falsely adjusted lens
and instead narrow down errors to other parameters such as synchronisation or missing
seeding.
6.5 Dealing with Reflections
For a good quality PIV picture it is necessary to have a high scattering particle intensity
so that the contrast between particle and background is good. As the CCD chip must not
be overexposed the presence of strong reflections from walls and other objects will limit
the maximum laser power available which can result in a real problem when trying to
get useful images.
There are two main approaches which can be made: a) Reducing the reflected laser light
intensity or b) entirely filtering out the laser light.
Entirely filtering out the laser light can be done when usingfluorescent seeding
particles which absorb the laser light and emit photons at a higher wavelength. By
placing an optical cutoff filter in front of the lens the laser light will be filtered out and
reflections become less a problem. This approach is more common for liquid flows and
is especially useful with two-phase flow where reflectionsfrom bubbles would
otherwise inhibit PIV measurements (compare comments in [Dan00a] Chapter 4.7.7).
Reducing the reflected laser light intensity is a more difficult task. Possible approaches
include viewing from a different position, using matt blackpaint on the reflecting
surface, placing black cardboard behind reflecting acrylic and painting the reflecting
surfaces with fluorescent paint reflecting at a wavelengthfiltered out by the optical
bandpass filter ([LaV03c] and [Dan00a]).
6.6 Imaging Particles
When recording seeding particles two things are of interest: The intensity and the
recorded particle diameter in pixels. For the small size range of commonly used
particles both parameters follow more complex laws which will be not addressed in
great detail but described phenomenologically (refer to [Raf98] Chapter 2.4 for more
information).
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As a rule of thumb the light intensity scattered from particles will increase with the
particle diameter ([Käh04] Chapter 2.1). The intensity distribution around the particle
itself varies with the viewing angle in patterns similar to the one shown in Figure 6.12.
This variation of intensity with viewing angle can be observed by eye when watching
light scattered from particles in a light sheet.
Figure 6.12 Intensity distribution of laser light scattered from a 1µm particle.(from [Käh04] Fig. 2.2)
Getting an optimal imaged particle diameter is of importance to get accurate results as
was explained in Chapter 3 and optimally a particle will end up 2-3 pixels in size.
Due to the small size of the seeding particles the imaged diameter will no longer be
linearly related to the actual particle size according to the magnification factor M, but
be dependent of non-linear diffraction effects influencedby a number of parameters
(consult [Raf98] Chapter 2.4). This means that the projection of the particle will not
look like the particle itself but form a so-called Airy pattern as shown in Figure 6.13.
Figure 6.13 Airy pattern of light scattered from a particle.(from [Her02] Fig. 6-78)
Although the theory needed to calculate the effect of diffraction when imaging seeding
particles is quite complex, simplified approximations allowing to estimate the resulting
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particle diameter on the image exist. Such approximations as shown in reference
[Raf98] Chapter 2.4 (and also partly in [Dan00a] Chapter 4.7.2.5) were used to
calculate the pixel size data shown in Figures 6.14 and 6.15,which suffice to make an
initial pixel diameter estimation for a broad number of cases.
The particle image diameter is mainly dependent of three parameters: The f-number f#,
the magnification factor M and the particle diameter dp.
It can be seen from both graphs that decreasing the magnification factor (increases the
field of view) results in a transition from an originally linear decrease proportional to
the magnification factor to an asymptotic decrease of the imaged diameter until it
reaches a limit like value whereafter further decreasing the magnification factor will
have no effect.
Most PIV cameras use a CCD chip sized close to 10mm (~9.1-9.2 mm for the Redlake
ES1.0 used in this report - [Red 02]). For common field of views between 50mm and
100mm (and larger) this will result in magnification factors ranged between 0.1 and 0.2.
The typical pixel size is around 10µm. As outlined in Chapter 3.5.5 it is desired that the
particle on the image is at least 1.5 pixels wide, with best results occurring between 2
and 3 pixels.
Air flows rarely tolerate having a particle size greater than 5µm and it can be seen from
Figure 6.15 that for common magnification factors increasing the particle size from
1µm to 5µm has got little effect on the particle image size (the intensity however will
increase quite substantially).
A far greater effect is obtained by increasing the f-number as shown in Figure 6.14 for a
1µm particle. Closing the aperture down to a resulting f-number of 16 will increase the
image diameter into the desired pixel range. As explained inChapter 6.2.5 the cost of
doing this will be a substantial loss of particle intensity which has to be compensated by
either increasing the laser power or the particle diameter.
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Chapter 6 - Camera, Lens and Imaging
Figure 6.14 Influence of the f-number on the image diameter for a 1mm particle.
Figure 6.15 Influence of the seeding particle size for an f# of 5.6 .(when changing the f# simply shift the curves along the y-axis to the same position as in Figure 6.14)
116
0.01 0.1 10
0.5
1
1.5
2
2.5
3Influence of f#
magnification factor M
imag
e di
amet
erin
10 µ
m u
nits
⇒ ≈
pix
els
f#=1
f#=2
f#=4
f#=5.6
f#=8
f#=11
f#=16
common magnification range desired imagediameter range
0.01 0.1 10
0.5
1
1.5
2
2.5
3Influence of particle size
magnification factor M
0.5 & 1 µm(very smalldifference)
5 µm
10 µm
20 µm
30 µm50 µm100 µm
imag
e di
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10 µ
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⇒ ≈
pix
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(f#=5.6)
common magnification range
desi
red
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f# ↑
f# ↓
Chapter 6 - Camera, Lens and Imaging
Another trick following the same logic as shown in Figure 6.5is to slightly unfocus the
image resulting in a blurring of particles, thus widening their image diameter ([LaV02a]
Chapter 4.7). The cost is again a decrease of intensity (the same amount of light is
distributed over a larger area) which has to be compensated by increasing the laser
power. Note that artificial blurring after the image has been recorded can increase and
broaden the correlation peak as well but the blurred single-pixel particles will still be
biased towards that particular pixel.
6.7 Calibrating the Image
The (digital) PIV evaluation will first evaluate the displacements in pixels which
without further scaling results in pixels per second. In order to to get a real world
velocity it is necessary to have a scaling function which relates pixels to coordinates.
Image distortion is caused by lens effects (barrel, cushion), viewing at an angle and
windows (viewing through a curved wall for example), with some examples shown in
Figure 6.16.
Figure 6.16 Possible image distortions.(from [LaV02a], Fig. 4.2)
In case of an undistorted image the calibration can be as simple as taking an image of a
ruler placed in the field of view. No image will be entirely free from distortion however
and as soon as the degree of distortion gets too high it is necessary take an image of
some sort of grid placed in the field of view.
By locating the points on the grid and associating them with distinct coordinates it is
possible to generate a mapping algorithm working as indicated in Figure 6.17 (more
information on some simple mapping algorithms can be found in [Raf98] Chapter
7.1.2). More powerful PIV software is capable of (semi-) automatically detecting the
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Chapter 6 - Camera, Lens and Imaging
points on a calibration target and associating them with coordinates with further
information available in the respective manuals ([LaV02a], [Dan00a]).
Figure 6.17 The process of dewarping a distorted image.(adapted from [LaV02a] Chapter 12.2 together with [Raf98] Fig. 7.2)
6.8 Viewing at an Angle – The Scheimplug Correction
Lens systems for photography are more of less exclusively designed for perpendicular
viewing. In situations where access is limited or the view would be obstructed it can
become necessary to place the camera at an angle to the regionof interest as is the case
when studying the flow inside the concave dimple cavity.
As cameras have got a finite aperture the depth of field (DOF)where the image will be
in focus is finite as well, so when viewing at an angle it can occur that the limited depth
of focus will make it impossible to cover the entire field of view as shown in Figure
6.18a.
To get the image back in focus again it is necessary to tilt theimage recording plane
(CCD chip) relative to the optical axis of the lens. Not only will the CCD chip be tilted
in case of ideal alignment, but as shown in Figure 6.18b it will also be off-centred
relative to the optical axis of the lens.
While it is possible to calculate the ideal position of lens and CCD chip ([Merk96],
[Dan00b]), the adjustment can also be done empirically as described in [LaV02a]. The
first step is to position the camera and roughly focus on the centre of the field of interest
while viewing a live picture. The next step is to tilt the CCD plane relative to the lens as
indicated in Figure 6.18b (the camera and lens must be mounted on a special
Scheimpflug adaptor to allow this). Tilting will require some refocussing and
repositioning of the camera and lens (note that the lens mustbe translated relative to the
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Chapter 6 - Camera, Lens and Imaging
CCD as well). Further opening the aperture will decrease thefield of view and increase
the sensitivity of this iterative procedure.
Figure 6.18 Scheimpflug correction when viewing at an angle α.(DOF: depth of focus, FOV: field of view)
While the Scheimpflug correction will give a sharp image it is important to know that
viewing at an angle will increase the perspective error introduced by particles moving in
the third velocity direction as described in Chapter 3.7.2.The Scheimpflug correction is
also commonly applied in stereoscopic PIV where two camerasare positioned at an
angle (the aforementioned perspective error can then be corrected).
Another effect of viewing at an angle is that the image will appear distorted whether it
is in focus or not, which must be taken into account as described in Chapter 6.7.
119
FO
V @
αDOF
part of image in focus @ angle α
a) No Correction: b) Scheimpflug Correction:
FO
V @
0°
part of image in focus @ 0°
α α'plane of focus'
3x intersection point
corrected CCDlocation
Chapter 6 - Camera, Lens and Imaging
6.9 Using the Redlake Megaplus ES1.0 Camera
6.9.1 General Overview
The Redlake Megaplus ES1.0 Camera used in this project captures 10-bit pictures at a
resolution of 1 megapixels with a minimal time between the double frame exposure of
at least 0.2 µs.
A frame grabber controlled by a software called Epix is used to capture images from the
camera. When grabbing a picture the framegrabber takes whatever is available in the
camera output buffer and if the camera places no data in the output a time-out message
will occur after a certain period of time. It is important to understand that the camera
recording process works somewhat independently of the picture grabbing process. The
camera will read pictures from the CCD chip and make them available for the
framegrabber. The recording of the proceeding image will goon independently of
whether the framegrabber will read the image previously made available or not.
In the PIV double frame recording mode the camera is triggered via the trigger input
located on the back of the camera. It is possible to fine-tunethe synchronisation by
changing internal camera parameters as will be outlined in Chapter 7.
As most industrial CCD-cameras the Redlake PIV camera is also fitted with a c-mount
thread to connect to a lens. In order to connect a Nikon f-mount type lens an appropriate
adaptor is needed.
Details on using the frame grabber software to 'grab' an image from the camera are
given in Appendix 13 with further information on the camera available in the manual
[Red01].
6.9.2 Mounting on the ILA Scheimpflug Adaptor
As the only Scheimpflug mounts available during the projectwere designed for a PCO
camera a spacer plate allowing to mount the Redlake ES1.0 on the same Scheimpflug
adaptor was designed. Additionally another flange allowing to mount the Scheimpflug
device on a Dantec traverse system was made as well. Both drawings are available on
the web as Appendix 8.
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7. Synchronising the Components
7.1 Introduction
When recording double frame single exposure PIV pictures the time separation between
the two frames and laser flashes can get into the sub-microsecond range. For the
recording process to work the camera must switch from recording one frame to the next
one at exactly the right time or otherwise it can occur that both laser flashes will end up
on one single frame with the other frame not being exposed at all.
Each single event such as a flashlamp flash, laser flash (Q-switch), recording of frame
1, recording of frame 2 etc. is triggered by a trigger signal either generated internally in
the device itself or supplied externally. Different trigger events allow a different degree
of control: While most events are hardware specific and can't be user controlled at all
several can be related to another internal event by a software settable timing delay and
some can be controlled by applying an external user supplied TTL trigger signal.
The process of synchronisation is to control the different trigger events so that they
occur at the right time relative to each other.
7.2 Triggered Camera Control
7.2.1 Redlake ES1.0
Figure 7.1 shows the events occurring when recording doubleframes with the Redlake
ES1.0 camera.
The process of a double frame recording event is started by the positive (or negative)
flank of a user supplied trigger input signal at the back of the camera. It is important
that this input signal occurs at a fixed and known time spacing of at least 21µs but less
than 1019µs before the laser 1 flash. The beginning of the transition from the exposure
of image 1, which should capture the first laser flash, to theexposure of image 2 can be
set by the transfer pulse delay parameter (TPD). During the transition from exposure 1
to exposure 2 the image data is transferred to the masked storage area of the CCD chip
in the time called transfer pulse width (TPW) as explained inChapter 6.3. Then the next
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image, which should capture laser flash 2, is exposed for thefixed time of 33ms needed
to make the image data available for the frame grabber. Once both images have been
obtained the next trigger signal can be sent to the camera.
Figure 7.1 Events and timing - Redlake ES1.0 camera.
It may first sound surprising that the transfer pulse width TPW is held variable instead
of just setting it to the lowest possible value, minimising the delay between the two
exposures. The author assumes that the reason for this is thesame as mentioned in the
PCO Camware manual ([PCO03a]), where it is stated that decreasing this time will
increase the effect of blooming, i.e. result in a noisier image.
As both TPD and TPW values can be set manually the camera offers quite a great range
for fine tuning the synchronisation. After some experimentation it was found that
Equation (7-2) offers a useful estimation of the TPD value but requires that the delay
between trigger signal and laser flash has been measured within reasonable accuracy.
An estimation for the TPW value is shown in Equation (7-3). Itis based on the
experimental observation that a time of 5µs between laser flash and transition to the
next image is ample for a long enough time between flashes∆t. Once∆t falls below 15
µs the events laser flash and transition to the next exposure are distributed
122
time
even
t
frame grabber readout image 1frame grabberreadout image 2
TPW
frame transfer
exposure image 1
33ms, fixed
laser 1flash
laser 2flash
20µs
external(user) trigger
TPD
exposure image 2
(fixed)
ttrig-flash time between pictures ∆t
time between trigger and laser 1 flash
TPD: 1, 2, ..., 999 µsTPW: 0.2, 0.3, ..., 5 µsSoftware settable by the user.
Chapter 7 - Synchronising the Components
symmetrically, which requires adapting the TPW value. It can be that further fine tuning
is necessary after ∆t is reduced below 3µs.
t trig.flash−20µ s TPD 1019µ sEquation (7-1) – Transfer pulse delay range
TPD∈1,2, ...,999
TPD≈ t trig.flash−20µ s−TPW Equation (7-2) – Transfer pulse delay estimator
TPW= 5µ s for t≥15µ sTPW≈ t /3 for t15µ s
Equation (7-3)Transfer pulse width estimator
7.2.2 PCO Sensicam Timing for Comparison
The main difference between the PCO Sensicam as shown in Figure 7.2 and the
Redlake ES1.0 as shown in Figure 7.1 is that the PCO timing of exposure 1 is entirely
set by the duration of the external user trigger, which thus replaces the software settable
TPD of the Redlake.
Figure 7.2 Events and timing - PCO Sensicam camera.
In situations where a powerful external trigger device is available this can be seen as a
good thing as it allows great control not just over the initiation but also over the
duration of exposure 1. For setups not accommodating such a powerful external trigger,
as the case in this report where a simple function generator is used, being deprived of an
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frame grabber readout image 1frame grabberreadout image 2
DTframe transfer
ttrig
exposure image 1
fixed, < 121.5ms
laser 1flash
laser 2flash
external(user) trigger exposure image 2
ttrig-flash time between pictures ∆t
time between trigger and laser 1 flash
DT: dead time 200ns or 1µs
Chapter 7 - Synchronising the Components
additional timing feature such as TPD results in a substantial loss of (timing) resolution,
which is a major handicap and greatly limits the control and synchronisation
possibilities.
7.3 PIV Laser and Camera Synchronisation
7.3.1 Introduction
Now that the camera trigger scheme has been described ways togenerate the camera
input trigger signal in the right phase relative to the laser flashes are being discussed.
7.3.2 The Common Approach
The common approach usually found in commercial PIV systemsis to use a
synchronisation unit generating the trigger signals for the laser flashlamps, laser Q-
switches and camera. This way all PIV components are controlled from one central unit
which minimises the timing uncertainty propagation (jitter) introduced when one unit
starts triggering the next one.
7.3.3 Ekspla Laser
A first limiting feature of the Eskpla laser is that it doesn't allow triggering of
flashlamps and Q-switches from an external device other than its own control hardware.
There is an option however to apply an external synchronisation signal at 20±0.1 Hz
allowing to get the laser to operate in phase with other devices.
As no real synchronisation unit was available except for a function generator a
synchronisation output signal from the laser had to be used to trigger the camera. This
required studying the laser sync-out signals as described in the following Chapter 7.4.
7.4 Laser Sync-Out Signals
7.4.1 Introduction
The Redlake ES 1.0 cameras can be triggered by positive or negative TTL signals
having a signal level as shown in Figure 7.3. If possible the ability to trigger the camera
directly from the laser without having to use any further devices would be preferred.
Alternatively a function generator used by Stephen Hall ([Hall01a]) having a trigger
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Chapter 7 - Synchronising the Components
input which, triggered by the laser, could be used to initiate the generation of a special
trigger signal for the camera.
Figure 7.3 TTL trigger levels - input and output.(from [Kup03]: http://www.allaboutcircuits.com/vol_4/chpt_3/11.html)
An acceptable camera trigger input signal should have a correct TTL level (Figure 7.3)
and be consistent in time (i.e. constant delay relative to the first laser flash, low jitter).
7.4.2 Measurement Setup
For the first evaluations the signals from the laser were directly fed into an oscilloscope
(terminated with a 50Ω resistor) and compared with the laser flash picked up by a
Thorlabs DET210 fast photodiode, schematically shown in Figure 7.4.
Figure 7.4 Signal testing measurement setup.(some images are from [Eks97] and [Tek95])
Although not absolutely necessary the 50Ω terminator was used to damp out any high
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Chapter 7 - Synchronising the Components
frequency oscillations. The terminator was rarely used on the photodiode side though as
it would limit the width of its reaction to nanoseconds, which made it impossible for the
oscilloscope to resolve the flash when viewing over a several hundred microseconds
wide window.
To prevent damage to the fast photodiode from the high power laser it was attenuated
using a few sheets of white 80 gm/m2 printer paper.
7.4.3 Laser Back Panel Outputs
Three (four) BNC connecters located on the back panel were found to be of interest to
pick up a suitable trigger signal. These are the high voltagesync 1 and sync 2 outputs
(sync 2 was used in the previous work from [Iv02]) and the two dedicated sync out and
delayed sync out outputs (compare Figure 4.10).
The high voltage sync outputs are difficult to access as a t-piece would be necessary to
share the signal with the laser. It was decided to first focuson the other options and
after the front panel sync out appeared to be almost in phase with the laser 1 flash the
HV syncs were no longer regarded.
Both the sync out and the delayed sync out appeared to give thesame signal, although
the author surmises that the delayed sync out is related to laser 2 while the other is to
laser 1. From the measurements the back panel sync out signals were found to have the
following properties:
• When terminated with 50Ω a very nice 'rectangular' trigger shape is generated.
• The peak level when terminated with 50Ω is at 8 volts, which is outside the valid
TTL range (Figure 7.3) and can't directly be used.
• The signal is related to the flashlamp trigger and occurs about 300µs before the first
laser flash @100% energy.
→ Directly triggering the camera is possible within this timerange as discussed in
Chapter 7.2.
→ Changes in the energy % affect the timing, which is inconvenient if not
completely undesired.
• Regardless of the Q-switch frequency (1, 2, 4, 5, 10, 20 Hz) the frequency of the
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Chapter 7 - Synchronising the Components
back panel sync signal is at a constant 20Hz.
→ If the camera ignores the obsolete signals while being busy with reading the
image data to memory (what it didn't) this would not be a problem.
As apart from the level, which is addressed in the following Chapter 7.5, the signal
allows to directly trigger the camera without needing a further timing unit, it was
decided to further pursuit this option.
7.4.4 Laser Front Panel Sync Out
The trigger output on the laser front panel turned out to havea number of good
properties but one major disadvantage:
• The signal occurs 290ns before the laser 1 flash at the Q-switch and not the
flashlamp frequency.
→ 290ns is too short to be able to directly trigger the camera which requires the
signal to occur between 21µs and 1019µs before the the laser 1 flash.
• Terminated with 50Ω the trigger level is about 3.5V with a reasonably consistent
flank.
→ The TTL signal level is in the acceptable range (Figure 7.3).
7.5 Trigger Level Conversion, Back Panel Sync Out
7.5.1 Introduction
As it was desired to try and trigger the camera directly from the laser without a further
timing function, efforts were made to be able to use the back panel sync signal for this
purpose.
Due to the too high signal level of 8V a level converter generating a signal at a TTL
conform level had to be built. This was then used to directly trigger the camera and
applied in PIV measurements.
7.5.2 TTL Trigger Level Conversion
First it was intended to make a simple voltage divider using two resistors at the ratio
3:5. Thanks to the warning input of George Otvos however the author realised that the
TTL signal architecture does not allow such a trivial approach, which led to reviewing
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Chapter 7 - Synchronising the Components
literature on TTL logic ([Kup03]).
It is shown in Figure 7.5 that the level of a TTL input logic is low when it is closed (e.g.
bridged with a wire) and high when left floating (removing the wire). When placing a
resistor R over the TTL input connections a current will flowthrough the resistor and
result in a voltage U, which then defines the state of the input according to Figure 7.3.
Figure 7.5 TTL levels depending on the situation at the input.
As a consequence using a voltage divider made of resistors asshown in Figure 7.6 will
result in a trigger input level which is not clearly defined and for likely values of R2
would always be high regardless of the actual signal level.
Figure 7.6 TTL when using a voltagedivider.
Figure 7.7 TTL level conversion using atransistor (inverted logic!).
A simple solution found in reference [Kup03] (Vol. 4, Chapter 3, page 11) is shown in
Figure 7.7. If the input signal is high (e.g. 8V) the transistor will switch and TTL trigger
input situation will correspond to Figure 7.5a, giving a lowlevel. A low input level (i.e.
0V) won't switch the transistor and the TTL trigger input will be left floating, resulting
in a high level as in Figure 7.5b.
The consequence of this inverting TTL level converter is that the trigger device must
also accept a negative trigger signal. This is the case with the Redlake ES1.0 PIV
camera but not with the function generator which is also available.
Consequently a level converter box containing a circuit corresponding to the one shown
128
ITTL
ITTL
ITTL
U=0V Trigger Input:low when closed
ITTL
=0A Trigger Input:high when left floating
ITTL
ITTL
ITTL
U=R·ITTL
Trigger Input:high, low orundefined depending on R
R
a) b) c)
TriggerSignal
ITTLI
TTL
ITTL
R1
R2 U=I
TTL·R
2
Trigger Input:never clearlylow
TriggerSignal
Trigger Input:High: if floatingLow: if transistor
is switched
R
Chapter 7 - Synchronising the Components
in Figure 7.7 was built and applied.
7.5.3 Directly Triggering the Camera from the Back Panel Sync Out
Using the level converter circuit (Figure 7.7) set up as shown in Figure 7.8 resulted in
an inverted signal at the correct level successfully triggering the camera (Figure 7.9).
Figure 7.8 Setup when directly triggering the camera.
Figure 7.9 Plot of the signal before and after level conversion / inversion.
The big drawback turned out to be the 20Hz trigger signal frequency which is more than
the camera can handle (10Hz). While some pairs of images in a recording sequence
would to match each other, a substantial number of odd pictures would occur as well.
These odd pictures, which sometimes were double exposed andnever matched any
other pictures, tended to disturb the sequence of good pictures so much that a long and
tedious hand sorting would be necessary to sort out the pictures suited for PIV analysis,
which is undesirable. Consequently it was decided to focus on using the front panel
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Chapter 7 - Synchronising the Components
synchronisation signal, despite this needing another timing unit (function generator).
7.6 The Final Camera Synchronisation Method
7.6.1 The Trigger Signal Generation
Eventually the setup shown in Figure 7.10 was found to produce stable trigger signals at
a convenient time of 144µs (Figure 7.11) before the first laser flash.
The beginning of a trigger signal lies in the laser front panel sync out occurring 290ns
before the first double flash. As this is too short for the camera to react this signal is
used to trigger the function generator which generates a waveform having one single
rectangular trigger signal peak occurring 144µs before the next double flash (Figures
7.11 and 7.12).
Figure 7.10 Camera trigger signal generation.
Figure 7.11 Trigger signal recordings. Figure 7.12 Trigger signal delay.
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Chapter 7 - Synchronising the Components
The maximal waveform resolution of 16384 points or roughly 6µs for a signal duration
of 0.1s (10Hz frequency) made placing the trigger event at a suitable time before the
flash relatively simple. Note that this is only true for the Redlake ES1.0 camera. For a
camera like the PCO Sensicam where the entire exposure of thefirst image is controlled
by the duration of the trigger signal (Chapter 7.2) the resolution of 6µs is very poor,
particularly when trying to optimise delays for faster flows (>~5m/s depending on the
image scale).
Another option to adjust the occurrence of the trigger signal is by changing the
frequency of the function generator. This was done to adapt the first waveform
generated as reprogramming the waveform was found to be far more time consuming.
7.6.2 Setting up the Function Generator
As long as no settings within the laser are changed, most notably the EO-delays
accessible in the laser servicing regime ([Eks97] & Chapter4.5.13), all that has to be
done is to restore / recall the function generator settings (Figure 7.13).
Figure 7.13 Function generator settings.
The waveform was stored as function USR1. Instructions on how to reprogram the
waveform and on how to use the function generator are given in Appendix 9.
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Chapter 8 - Seeding
8. Seeding
8.1 Introduction
Generation and distribution of appropriate light scattering particles in the flow is one of
the often forgotten and underestimated critical issues in PIV. Seeding particles have to
be introduced to the flow without significantly altering it, should faithfully follow the
flow path, have scattering properties allowing the generation of good images and must
not adversely affect the health of the people involved in dealing with them. While
achieving this is usually not a big deal in liquid flows, introducing suitable seeding
particles into air flows can cause serious difficulties anddelays in the progress of the
experiments.
A part of this project was to test, compare and discuss different types of seeding
particles. Next to the discussion of those results this chapter will also give a more
general overview of seeding particles as this is necessary to draw proper conclusions
from the observations and give recommendations.
Seeding is a complex issue and only a small part of the topic will be covered here.
Among the literature available references [Dan00a] (Chapter 4.5), [Raf98] (Chapter
2.1), [Mey01], [Mel97] and [Käh02] were the most extensively used.
8.2 Seeding Particle Requirements
8.2.1 Scattering Intensity and Resulting Image Size
In Chapter 6.6 it was discussed that the seeding particle size has got some influence on
the resulting size of the particle on the image. For most situations where the particle
size is less than 10µm the effect of the particle size on the image intensity of the
scattered light is far more important than its effect on the particle image size.
Next to the particle size the viewing angle (compare Figure 6.12) and particle index of
refraction further influence the resulting intensity. In reference [Mel97] the scattering
cross section Cs, being the ratio of the total scattered power to the incidentintensity,
was presented as a convenient measure for a particle's scattering capability.
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Chapter 8 - Seeding
The most drastic change in the intensity of scattered light relevant for PIV occurs
around particle diameters of 1µm. As shown in Table 8-1 the jump in scattered intensity
from a 1µm to a 10µm particle is on the order of 103. Despite this apparent pitfall of
small diameters seeding airflows with 1µm sized particles is very common and feasible
in PIV applications ([Mel97], [Raf98]).
Particle diameter Typical scattering cross section Change of cross section
dp = 1µm Cs ≈10-12 m2 Cs ∞ (dp/λ)4
dp = 10µm Cs ≈10-9 m2 Cs ∞ (dp/λ)2
Table 8-1 Influence of the particle diameter on the scattered light intensity.(adapted from [Mel97] Table 1; λ is the wavelength i.e. 532nm for Nd-YAG)
For particles with diameters larger than 10µm the scattering intensity is roughly
proportional to the diameter squared and thus investigations in water flows where
particle sizes are on the order of 50µm can often make use of low power cw lasers (2-
5W continuous) for illumination ([Mel97] Table 4).
8.2.2 Ability to Follow the Flow
The size (diameter dp) and ratio of particle to flow density are the two most important
parameters characterising a particles ability to follow the flow.
Liquid flows have the huge advantage of a high density often closely matching that of
several seeding particle materials (such as polyamide power). This allows using larger
particle diameters sized around 20µm – 100µm without sacrificing the accuracy of a
particle's path. Air flows in contrast suffer from the low gas density which usually is on
the order of 102-103 lower than the seeding particle density. To compensate for this
density difference it is common for airflow investigationsto use rather small particles
sized on the order of 1µm-2µm, which in turn requires far higher light intensities.
A more quantitative estimation of a particle's deviance from the flow can be made by
solving the equation of motion for an idealised spherical particle. A good description
and discussion of this is given in references [Mey01] and [Mel97]. Though often not
relevant it is nevertheless important not to forget the effect of gravity on particles when
dealing with low velocity flows ([Raf98], Chapter 2.1.1).
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Chapter 8 - Seeding
8.2.3 Particle Distribution
For optimal PIV results the seeding particles should be distributed homogeneously over
the entire viewing area and have an optimal seeding density resulting in a maximal
correlation peak. In this respect liquid flows again tend tobe much easier to handle than
air flows as will be discussed in the next few chapters.
8.2.4 Health, Pollution and Other Issues
Seeding particles must not have an adverse effect on the health of the people dealing
with them. This is especially a problem with air flows where it is likely that at least a
fraction of the seeding could be inhaled by the operators especially when working
around open loop windtunnels. Additionally most solid seeding particles as well as
many liquid ones will deposit on the walls and surfaces of objects exposed to them,
often resulting in a mess. In terms of deposits it is necessary not only to consider health
effects but also any other adverse effects the seeding material might have (e.g. corrosion
of parts, abrasive effects, volatility and flammability).Next to choosing suitable seeding
particles issues such as proper workspace ventilation and additional respiratory
protection should be considered as well.
Liquid flows in contrast usually are yet once more far simpler to handle as they mostly
are operated in closed loop configurations and the particles are bound in the water and
not in the air.
(Compare reference [Dan00a] for more details on these issues.)
8.3 Seeding Liquid Flows
Apart from open loop flows where the seeding must be suppliedcontinuously liquids
are usually quite simple to seed and it is often sufficient topre-mix some solid particles
with the fluid using simple methods such as stirring by hand ([Mel97] Chapter 5.1 and
[Raf98] Chapter 2.1.3). Lists of suitable particles can be found in references [Mel97] ,
[Raf98] and [Dan00a].
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Chapter 8 - Seeding
8.4 Seeding Gas Flows
Gas flows can either be seeded by liquid droplets or solid particles. The difficulty is that
unlike with liquids, which can be seeded once and then contain the particles for a long
period of time, gas flows must be seeded more or less continuously whilst maintaining
the correct seeding density (number density), distribution and particle size. Another
requirement is that the flow should not be disturbed by the introduction of particles.
A fairly 'complete' overview of seeding generators is givenby Melling in [Mel97] with
further information available in [Raf98] and on the productwebsite of several
manufacturers. Following a brief listing of some possibilities to seed gas flows mainly
based on [Mel97] will be given.
Generating liquid particles:
• By condensation:
→ Foggers as known from the entertainment industry make use ofthis principle
based on evaporation of a liquid and condensation to fine droplets.
→ Difficult to regulate: As stated in [Mel97] such devices tend to be unsteady.
• By atomisation:
→ Droplets can be generated by sprays and other atomisers. Together with impactors
to remove larger droplets it is possible to generate narrow size distributions in the
range of 1µm.
Generating solid particles:
• By atomisation:
→ Is possible by atomising suspensions of particles in a volatile solvent.
• Directly from powders:
→ Can be done by in various ways depending on the power. Some particles already
disperse by shaking while others have to be generated in cyclones or introduced
through venturi nozzles as done in [Hall01a].
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Chapter 8 - Seeding
8.5 Own Experiments
8.5.1 Introduction
The purpose of this subchapter is to give a qualitative review of the experience made in
using a number of different seeding particles in an experimental PIV setup as described
in Chapter 10. A PIV system from ILA was used for this comparison as the Ekspla
system was mainly tested with atomised vegetable oil.
Four seeding generators dividable into three main groups shown in Figure 8.1 have been
compared. Samples of the PIV test images have been made available in a zip file on the
web (Appendix 10).
Figure 8.1 Evaluated seeding generators.
8.5.2 Fogger ('Smoke')
Two different brands of fog machines were tested: A relatively cheap one from Dick
Smith Electronics (M6000) run with Dick Smith fog juice (N6000) and an expensive
high quality Concept Colt 4 Turbo run with Concept smoke fluid type A.
While the data available on the resulting particle size is rather vague the particle size
section on the Concept website (www.concept-smoke.co.uk)claimed that concept
smoke generators would produce particles sized less than 0.6 microns with the peak
being within 0.2-0.3 microns, compared to the 1-5 micron range obtained with
conventional foggers.
Due to the claimed small particle size of the concept fogger it would have been
expected to give worse results but apparently the opposite turned out to be the case.
Generating useful PIV images with the Concept fogger seemedgenerally easier than
136
foggers solid particles(hollow spheres)
shaker and sieve
atomizer(vegetable oil)
pressurized air
tank with laskin nozzle and impactor plate
Chapter 8 - Seeding
with the Dick Smith fogger. The reason for this is that while non of the two devices
allowed obtaining pictures of nicely looking discrete particle peaks the Concept fogger
resulted in moving patterns of varying intensity which apparently were correlateable
between the two exposures. In contrast the Dick Smith fog machine resulted in a usually
very dense fog, giving what seemed to be random intensity distributions which were
widely inconsistent between two exposures apart from 'gaps' (zones with little smoke)
making apparent that the exposures do belong together. DickSmith fog obtained
towards the end of the intermittent output however appearedmore clustered and in part
similar to the Concept fog, which again was useful to evaluate.
The general impression of both devices was that they are difficult to control in output
quantity and density. Instead of producing nice discrete particle images both fogs
resulted in a more hazy seeming image ('speckling') not overly suited for PIV
evaluation. In part the small cross section of the test wind-tunnel could have contributed
to this but attempts in measuring with fog of reduced densityfailed just as well as the
resulting image was still hazy but less intense.
8.5.3 Hollow Glass Spheres
Q-Cell brand type 5020 hollow glass spheres assumed to be thesame as used by S. Hall
([Hall01a] Table 6.1) with a 5µm mean diameter and a particle density of 600 kg/m3
were used. As the small windtunnel only needed lower quantities a sieve attached to a
shaker was used to distribute the particles, allowing fairly good control. If necessary
larger quantities could be distributed using a venturi typeseeder as in Fig. 5.9 of
[Hall01a].
In terms of evaluation the produced images contained nice discrete particle peaks
spanning up to six pixels which although almost to big (Chapter 3.7.6) led to good
correlation results without ever having to optimise any seeding parameters. On the other
hand it was found that the particles had already absorbed some moisture and thus tended
to stick together giving super-particles not following theflow that faithfully any more.
The particles also were likely to make a mess and stuck on everything they got in
contact with. Finally the dust clouds produced by the particles – if not contained –
required wearing a face mask.
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Chapter 8 - Seeding
8.5.4 Vegetable Oil
Using a Laskin type atomiser (described in Chapter 8.6) to produce vegetable oil
droplets made seeding the flow a lot easier than the smoke machines. Due to the
construction of the atomiser it was possible to adapt the seeding production rate and the
steady operation of the device allowed a much easier handling than the somewhat
unwieldy intermittently operating fogging machines. The droplets gave relatively nice
intensity distributions which were a lot better than what was obtained with the smoke
machines. Due to the small diameter in the range of 1µm the intensity of scattered light
was relatively low compared to the hollow glass spheres. Furthermore the resulting
particle image diameter tended to be too small which would have to be improved by
unfocussing or closing the aperture (Chapter 6.6). The oil turned out not to be overly
messy but just as with the smoke machines working in a well ventilated room seemed to
be advantageous.
8.5.5 Comparison Table
Foggers Hollow SpheresAtomised
Vegetable Oil
intensity of scatteredlight
fair but not discrete excellent relatively low
particle image sizepoor
(small particles)good
fair, room forimprovement
relative frequency(image density)
poor(very dense)
good good
production rateover time
poor(intermittent)
good, but constantsupply not that easy
good, very stableand constant
controlpoor (Dick Smith)
fair (Concept)fair-good depending
on apparatusgood, but within
limits
pollutionfair
(ventilation)mess potentialif not contained
fair(ventilation)
healthgood ventilation
requiredrespiratoryprotection
good ventilationrequired
Table 8-2 Comparison of the three seeding generators tested.
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Chapter 8 - Seeding
8.6 The Laskin Based Seeding Generator at UNSW
8.6.1 Introduction
The seeding generator based on Laskin nozzles was found to beone of the most useful
devices for seeding airflows in situations where it is desired to avoid using solid
particles such as hollow glass spheres.
As using such a seeding generator raises a number of issues, most notably the potential
health hazard it is the intention of this chapter to discuss some of the important aspects.
8.6.2 Working Principle
The seeding generator used in this project was based on a model from PivTec
(www.pivtec.com) and consisted of five Laskin nozzles which could be turned on and
off independently.
An actual Laskin nozzle as shown schematically in Figure 8.2consists of a closed pipe
with holes of 1mm diameter at the side located right below a socalled feedhole-ring. In
operation pressurised air is guided through the nozzle which is submerged in liquid
forming tiny droplets captured in air bubbles and transported to the surface.
Figure 8.2 A single Laskin nozzle.(from [Raf98] Fig. 2.10)
A schematic of the utilised seeding generator based on five such Laskin nozzles is
shown in Figure 8.3. Pressurised air is supplied via a pressure regulating valve and then
is fed into a Laskin nozzle located in the centre of a closed container. As the container
is sealed a pressure will build up inside it and create an airflow dragging the smaller
particles outside.
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Chapter 8 - Seeding
According to the PivTec (www.pivtec.com) specifications and according to the
observations made by Kähler et al. [Käh02] the typical expected mean particle size will
be around 1µm. The particles can be guided to a suitable location via an outlet hose. By
own experimentation it was found that this outlet hose should have a big enough cross
section (~1 inch diameter) and not be too long in order to get agood mass flow and to
prevent that only the very small particles will get through.It is possible to control the
mass flow by regulating the pressure and by opening and closing the valves leading to
the additional nozzles. When operating all nozzles it was found that some non-atomised
liquid would be expelled too.
Figure 8.3 Schematic of the utilised seeding generator based on Laskin nozzles.
The seeding generator in its original configuration must not be used with corrosive
liquids and especially not with water! Before being able to use the generator it first had
to be cleaned from rust as it was filled with water. This is due to the Laskin nozzle pipes
made of steel and not of brass or plastics like most other parts. A solution would be to
replace the steel pipes with ones made of brass or stainless steel. According to the
observations of [Käh02] it would suffice to just drill some 1mm diameter holes in the
end region of the closed pipes and omit the feedhole-ring.
Recommended reading on Laskin nozzle based atomisers includes references [Käh02],
[Mel97] and [Raf98] (Chapter 2.1.3).
140
pressurisedair supply
pressure regulationvalve
5 Laskinnozzles
open / closevalve for 4 nozzles
impactorplate
seedingliquid
outlet hose
Chapter 8 - Seeding
8.6.3 Health Issues
As the seeding particles would be generated in an open loop wind tunnel placed in a
ventilated room, investigations on any adverse health effects the atomised substances
could have on the people working in the vicinity of the windtunnel were made. It was
found that the American ESTA (www.esta.org) organisation provides a lot of useful
information on the health effects and safety of atomised fogging fluids and that the
American OSHA agency (www.osha.gov) provides further useful information,
especially on the health effects of atomised vegetable oil.
The typical way to deal with the presence of the substances isto introduce exposure
limits (usually over 8-hours). Often a differentiation between the total dust and
respirable fraction exposure limit is given of which the latter only covers the particles
smaller than ten microns ([HSE97]) and should be used with foggers.
Glycol Recommended Limit
Tri- & Di- ethylene glycol 10 mg/m3
Mono- & Di- propylene glycol 10 mg/m3
Glycerin 10 mg/m3
Vegetable Oil 5 mg/m3
Table 8-3 Exposure limits (8hr average).(composed using [Coh97], [HSE97] and [OSHA04])
An overview of the commonly recommended exposure limits is given in Table 8-3.
According to [Coh97] it is believed that these concentrations won't compromise "the
intended aesthetic goal" in theatrical productions, from which the assumption can be
drawn that the same will also be true for PIV applications if good ventilation is ensured.
A really serious analysis however would still require concentration measurements in the
exposed environments, which is possible by renting appropriate aerosol monitoring
devices.
Among other issues not directly addressed here are the potential of burns from fogging
machines and the dangers involved in handling pressurised air used with many types of
atomisers. In another note many users might have noticed that the artificial fog tends to
dry out lungs and eyes which is due to the hygroscopic property of glycols.
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Chapter 8 - Seeding
8.6.4 Seeding Liquids
Next to health effects criteria for liquids used in atomiserbased seeding generators are
the resulting particle size, the evaporation time (particle stability) and the general ability
to result in a droplet.
Seeding Material Comments
Water Would be safe for humans but needs an evaporation inhibitor([Dan00a]; health issues?); Will corrode common steel.
Fogging Fluid Advantage of existing MSDSs; Expensive to use; Corrosivenessmust be tested.
Glycerine Recommended in [Dan00a], Cheaper than fogging fluids.Fogging fluid component; Corrosiveness must be tested.
Vegetable Oil,Corn Oil
Cheap; No corrosive problems.
Olive Oil Slightly more expensive than vegetable oil; Said to withstandhigher temperatures than vegetable oil ([Dan03]).
DEHS Di-Ethyl-Hexyl-Sebakat; Excellent for producing stable aerosols;Vaporises without residues; Said to be non-toxic (?) - [ILA03c].
Silicon Oil Said to be very satisfactory in [Dan03]; Health issues?Table 8-4 Different seeding materials for use in Laskin based seeding generators.
Table 8-4 lists a number of liquid seeding materials which could be considered for use
in a Laskin based seeding generator as in Figure 8.3.
From a safety point of view water would appear to be an excellent seeding material but
it can only be used in containers which won't corrode in contact with water and more
importantly it requires an evaporation inhibitor to be added ([Dan00a] Chapter 4.5.2.2).
Without the evaporation inhibitor water would evaporate, resulting in too small droplets
and poor fog properties (for PIV). Furthermore the evaporation inhibitor would raise
new health issues.
As fogging fluids are widely used in the entertainment industry and numerous MSDSs
exist it was considered to directly use them in the seeding generator. For this purpose a
corrosion experiment shown in Appendix 11 was undertaken and it appeared that the Le
Maitre brand general fogging fluid would corrode the Laskinnozzle pipes so this option
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Chapter 8 - Seeding
was never tested.
Apart from using a fogging fluid a much cheaper option would be to use one of their
components as listed in Table 8-3. It appears that glycerineis mentioned in reference
[Dan00a] as a useful fogging fluid and it allows higher fog concentration levels than
vegetable oil (Table 8-3). Before it can be used it would either have to pass a similar
corrosion test as in Appendix 11 or the Laskin nozzle pipes inthe seeding generator
would have to be replaced with corrosion resistant ones.
Another very cheap option is the vegetable oil which as used in this report gave
satisfactory results. Olive oil as a slightly more expensive option is said to withstand
somewhat higher temperatures ([Dan03]). Generally most oils similar to vegetable oil
and probably also the glycols / glycerine are said to producedroplets in the size range
of 1µm ([Mel97], [Käh02], [Raf98]).
Among the more "specialised" seeding liquids are DEHS, which is well known for its
excellent properties as an aerosol, and silicon oil, of which the toxicological properties
would still have to be ascertained.
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Chapter 9 - PIV Evaluation using VidPIV
9. PIV Evaluation using VidPIV
9.1 Introduction
Once the PIV images have been recorded they have to be evaluated using a software
capable of handling the methods and algorithms described inChapter 3. As two
software dongles are available for the VidPIV software usedwith the school's ILA PIV
system it was decided to use the second dongle with the EksplaPIV system set up in
this project.
Most details on handling the program won't be addressed hereas they can be found in
the manual [ILA03a]. Therefore first a brief overview on using VidPIV as well as on
how to import the images will be given. Additionally a Matlabscript written to
overcome unnecessary intensity downsampling due to the '8-bit image import only' limit
of VidPIV will be presented.
9.2 A Brief Overview of the Steps Involved in using VidPIV
9.2.1 General
VidPIV is based on modules which themselves can have submodules fulfilling different
purposes with a very simple example given in Figure 9.1. For the Ekspla system the
first step would be to import image pairs and a calibration image. Based on the
calibration image it then is necessary to define the image regions to exclude from the
analysis (annotations) and to define a scale (mapping) by positioning markers on pixels
and assigning corresponding real world coordinate values.As final step before cross
correlation the time between the images has to be set in the timing module.
It is possible to use several cross correlation modules witheach allowing to define a
different interrogation window size and spacing. After cross-correlation a number of
error-vector filters and interpolation functions as well as adaptive cross-correlation
modules for further refinement are available.
Once the vector field has been processed as desired, it is possible to calculate further
quantities such as average velocities and vorticity. Eventually the images and data can
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Chapter 9 - PIV Evaluation using VidPIV
be exported for further processing and presentation.
Figure 9.1 Simple example workflow in VidPIV.
9.2.2 Importing Image Pairs
Figure 9.2 Importing image pairs.
To import image pairs an "Importation (Dual)" module has to be created at the
beginning of the evaluation as in Figure 9.1. Bitmap pairs can then be imported by
145
Chapter 9 - PIV Evaluation using VidPIV
right-clicking on the icon. Although called bitmap pairs VidPIV can import many file
formats such as bmp, tif and jpg but apparently only as 8bit images with other bit depths
such as 10bit and 16bit tiff always resulting in black pictures (Chapter 9.3).
In the image import interface shown in Figure 9.2 it is first necessary to select the
images to import ordered according to their exposure (firstexposure first). If the first
image in the selection doesn't belong to the second, the cross correlation analysis will
fail. The selected images are then imported by activating both base and cross selection
options, clicking sequence and import.
9.3 Preparing n-bit Images for the 8-bit Importer
9.3.1 Introduction
Although not explicitly stated in the manual it turned out that VidPIV is only able to
import 8-bit images. Most image processing software will downsample the intensity
levels proportionally when saving 10-bit images as 8-bit images, which reduces the
information contained in the image by a factor of 4. From Chapter 3.7.8 it can be
implied that this will not have a great influence on the result as long as the intensity
range between a bright particle and the dark background is reasonably high. Due to
insufficient laser power or due to disturbing reflections from walls it is not unusual
however that the intensity range between particle and background is low, often lower
than the 256 levels of 8-bit images.
In Figure 9.3b it is illustrated what happens when proportionally downsampling a 10-bit
to an 8-bit image. While its profile still looks roughly the same the resolution of the
particle intensity peaks has been reduced by factor 4. A muchmore elegant approach
shown in Figure 9.3c is to extract the intensity range between the camera black noise
level and the highest particle intensity level and resample this as an 8-bit image.
146
Chapter 9 - PIV Evaluation using VidPIV
Figure 9.3 Converting 8-bit to 10bit images.
9.3.2 The Matlab Program
As no pre-written software allowing to extract a certain particle intensity range was
available, a Matlab script given in Appendix 12 was written for this purpose.
The example syntax "LevelConv('e:\tmp\',100,300)" wouldextract the image intensity
data between the bit levels 100 and 300 of all tif images contained in the folder 'e:\tmp'
into an 8-bit image marked by the prefix '8bit'.
Two program versions exist, with V0.11 proportionally distributing the selected range
along 8-bit, i.e. 100 in the example being 0 and 300 being 255,linearly interpolated in-
between. V0.20 in contrast will only proportionally downsample if the selected range
exceeds 8-bits, i.e. 100 → 0 and 300 → 200 in case of the example.
147
0 32 64 96 1280
64
128
192
256b) 8-bit downsampled
Pixel
Inte
nsi
ty
0 32 64 96 1280
64
128
192
256c) 8-bit range extracted
Pixel
Inte
nsity
0 32 64 96 1280
256
512
768
1024a) 10-bit image
Pixel
Inte
nsity
10b
it ra
nge
8bi
t ra
nge
proportional downsampling to 8-bit → loss of information
useful range with particle information
extracting and re-sampling the useful range
Chapter 10 - The Test Rig
10. The Test Rig
10.1 Introduction
At the beginning of the project it was intended to verify the the PIV system based on the
Ekspla laser by comparing experimental results obtained ona certain experiment with
experimental results obtained on the same experiment usingthe school's ILA PIV
system. As one part of the project was to compare the image quality of hollow glass
spheres to fog it was decided to design an experiment where this could be done with
both PIV systems. This required the test rig to be portable and in addition allow testing
the hollow spheres without making a mess as this would not be acceptable in most
testing environments.
Based on these requirements a brainstorming resulting in the two main initial concepts
shown in figure Figure 10.1 was done. As concept (b) resembled a vacuum cleaner,
which is a fairly simple solution, the decision to pursuit a vacuum cleaner driven wind
tunnel device was made.
Figure 10.1 Initial test rig concepts.
10.2 The Test-Windtunnel
The final result is shown in Figures 10.2 and 10.3. For simplicity the inlet and the
connection to the vacuum cleaner were made of cardboard heldtogether by gaffa tape.
Glued acrylic plates formed the main part of the wind tunnel with the test section
having a removable lid. To straighten the flow honeycombs made out of drinking straws
glued together with superglue were used.
148
drive
test-section
test-section drivefilter
a) closed loop b) open loop
Chapter 10 - The Test Rig
To determine the necessary cross section of the wind tunnel the volume flow of the
vacuum cleaner was estimated using a handheld propellor anemometer. Based on this
data a cross section resulting in velocities around 10 m/s was chosen.
Figure 10.2 The windtunnel schematically.Figure 10.3 Windtunnel and
Vacuum Cleaner.
10.3 The Windtunnel in Operation
The windtunnel used in the configurations shown in Figures 10.4 and 10.5 turned out to
work fairly well with the only problem being hollow glass sphere deposits on the wind
tunnel walls and on the vacuum cleaner bag, resulting in a velocity drop from ~10m/s to
less than 3m/s.
149
Chapter 10 - The Test Rig
Figure 10.4 The windtunnel used with the ILA PIV system.
Figure 10.5 The windtunnel used with the Ekspla PIV system.
150
Chapter 11 - System Usage Summary
11. System Usage Summary
11.1 Introduction
The aim of this chapter is to list the main steps when using theEkspla PIV system by
referring to other parts of the report and the appendices.
11.2 Steps when using the System
1. Prepare the test rig and the seeding generator.
→ The seeding should appear in the region of interest.
2. Set up the laser and light sheet.
→ Take safety precautions (Chapter 4.3).
→ Read the laser operation instructions (Chapter 4.4).
→ Align and mount the lightsheet in the usage direction (Chapter 5.4.3, Appendix 7).
3. Align the the camera on the target region.
→ Place an illuminated target in the test plane.
→ Adjust the camera on the target and focus the lens (live image → Appendix 13).
→ Take and store a calibration image.
4. Synchronise laser and camera.
→ Make all connections (laser front panel sync out→ function generator front panel
trigger in → CH1 out → camera back panel trigger in – Chapter 7.6).
→ Program the function generator (Chapter 7.6.2, Appendix 9).
→ Determine the TPD and TPW settings (Chapter 7.2 and Equations 7-2 & 7-3; For
∆t between flashes ≥15µs TPD = 119µs, TPW = 5µs.
→ Set the TPD and TPW settings via the Epix software (Appendix 13).
→ Set the laser intensity – approach as described in Chapter 6.4 and consult
Appendix 13. Don't overexpose the CCD chip!
→ Record single image pairs:
⇒ Make sure each image contains one laser flash only. Otherwise adjust TPD and
TPW.
151
Chapter 11 - System Usage Summary
⇒ Adjust the laser power to obtain similar image intensities between the two
images.
5. Record PIV images.
→ Image sequence recording (Appendix 13).
→ Optimise the image (particle intensity, size and density).
→ Optimise the timing between images (displacement around 3-5 pixels).
→ Export the recorded images as 16bit tifs (Appendix 13).
6. Analyse the PIV images.
→ Prepare the images for VidPIV import as 8-bit images (Chapter 9.3).
→ Analyse the images in VidPIV (Chapter 9).
152
Conclusion
12. Conclusion
Setting up the PIV system would not have been possible without a proper understanding
of the theoretical and practical basics involved and thus these aspects formed a major
part of this report.
The laser, constituting the core component of PIV illumination, was set up by applying
basic knowledge of pulsed lasers and input from the manufacturer(Chapters 4.2 & 4.5).
This required analysing and troubleshooting its operationby using information obtained
from high voltage pulse measurements, infrared visualisation and laser beam energy
measurements. Having the two lasers set up properly then allowed to combine (overlap)
the two beams and install the KTP crystal. In particular the alignment of the frequency
doubling KTP crystal, which converts infrared to green laser light at an efficiency
depending on the angle of incidence, turned out to be tricky and required several
attempts into reading and rethinking the sparse information available.
To create a light sheet (LS) a lens and laser beam redirectionsystem was designed,
requiring knowledge in geometrical- and laser optics. The more crucial aspects of
devising the lens system were to ensure that the lens materials would withstand the high
power laser beams, to avoid back reflections into the laser and to have a versatile
design. To the author's great delight the resulting light sheet worked just as predicted by
the calculations and fulfilled its purpose. Although quiteversatile already, the sheet
optics still has room for optimisation, most notably in increasing the light sheet angle by
utilising a stronger cylindrical lens, requiring the manufacture of a special lens holder.
Other improvements which could be made are to design and employ a better sheet
rotation module (Figure 5.10) and to allow translating the lens system in the plane
perpendicular to its optical axis, thereby increasing the alignment possibilities.
After proper analysis of potential synchronisation signals and camera parameters,
setting up and synchronising the camera with the laser became a fairly straightforward
step. In theory the system would even allow delay times between laser flashes of less
than a microsecond but it is expected that doing so will require further fine tuning of the
153
Conclusion
currently applied synchronisation parameters.
In operation the laser control application written in Labview appeared as remarkably
useful, not just due to its comparably intuitive interface but also due to the ability to
remotely fine tune the laser pulse energy from the same computer where the resulting
camera image is monitored. Problematic on the other hand was applying proper seeding.
Although a Laskin nozzle based seeding generator was found to be able to meet the
requirements of health issues, convenience and controllability, optimising the
introduction of seeding particles into an airflow is expected to remain one of the central
challenges in many PIV experiments.
Apart from controlling the hardware, theoretical knowledge on the output of the PIV
evaluation method depending on its input was found to be essential for obtaining
accurate and justifiable results.
It was shown that in order to obtain accurate PIV results a good image quality with
particles sized 2-3 pixels at a high intensity and suited density of occurrence (~10
particles per interrogation area) is necessary. Increasing the particle size can be done by
closing the aperture or unfocussing and thereby blurring the picture (Chapter 6.6). Both
methods result in a loss of intensity and require increasingthe laser pulse energy. Next
to the maximum laser power a major limit in the obtainable particle intensity are
reflections from walls which have to be dealt with, for example by using fluorescent
paints and black backgrounds.
In terms of PIV evaluation it was discussed that apart from just doing a simple cross
correlation analysis modern PIV programs, including the used VidPIV from ILA, allow
further refinements such as adaptive cross correlation which lead to an increase of the
resulting accuracy and resolution (vector density).
With respect to flow around dimples, one of the main reasons for establishing this PIV
system, it was reviewed from literature that the interesting part of the flow is highly
three dimensional. The established PIV system allows measuring two components only
and the not measured third component will result in an added uncertainty and the
154
Conclusion
necessity to decrease the time between exposures in order toprevent the particles to
move out of the light sheet between two illuminations. This perspective error will get
even worse when having to study the flow inside the concave region of a dimple where
viewing at an angle may be required. While the two component system should still
suffice for initial analyses and to gather experience, eventually a stereo PIV system
employing two cameras will be necessary for obtaining more accurate and complete
results.
Determining a PIV measurement uncertainty for a certain situation will not be simple if
great detail is desired as this requires numerous analyses from examining the optical
setup to performing monte carlo simulations. An easier approach is to estimate the order
of the resulting uncertainties from the phenomena presented in Chapter 3.7 by using the
graphs, tables and equations included in this report. Doingthis will also reveal potential
improvements for the applied PIV setup and thus definitely is worthwhile when the
ability to justify the obtained results is an essential requirement.
In closing it can be summarised that a working two velocity component digital PIV
system has been established and successfully run. It is not perfect but it fulfils the major
requirements of a modern tool in experimental fluid mechanics.
155
References
References
General Literature
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[Her02] Hering E., Martin R., Stohrer M.: Physik für Ingenieure. 8. Auflage.
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[Inc02] Incropera F.P., DeWitt D.P.: Fundamentals of Heat and Mass Transfer.
New York: Wiley, 2002 (Fifth Edition).
[Iv02] Leong I. (Ivan Tan Eng Leong): The Development Of Particle Image
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General Literature
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Flows Inside Circular Tubes With Concavity Surfaces.ASME Journal of
Turbomachinery, Vol. 125, pp. 665-672, 2003.
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158
Publications on Dimples
[Isa03] Isaev A.A., Leont'ev A.I.: Numerical Simulation of Vortex Enhancement
of Heat Transfer under Conditions of Turbulent Flow Past a Spherical
Dimple on the Wall of a Narrow Channel.High Temperature, Vol. 41, No.
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Surface Curvature on Heat Transfer and Hydrodynamics Within a Single
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[Lig01] Ligrani P.M., Mahmood G.I., Harrison J.L., Clayton C.M., Ne lson
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Glezer B.: Local Heat Transfer and Flow Structure on and Above a
Dimpled Surface in a Channel.ASME Journal of Turbomachinery, Vol.
123, pp. 115-123, 2001.
[Vic02a] Vicente P.G., García A., Viedma A.: Experimental Study of Mixed
Convection and Pressure Drop in Helically Dimpled Tubes forLaminar
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159
Literature on PIV, Laser and Optics
Literature on PIV, Laser and Optics
[Bol99] Bolinder Jonas: On the accuracy of a digital particle image velocimetry
system. Technical Report, Lund Institute of Technology, SWEDEN, 1999.
[CAS99] CASIX, Inc.: Principles of Nonlinear Optical Crystals.
http://www.u-oplaz.com/crystals/crystals01.htm, Revision: Apr, 24 1999.
[Dan00a] Dantec Dynamics:FlowMap Particle Image Velocimetry Instrumentation
– Installation & User’s guide.Skovlunde, Denmark: Dantec Measurement
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[Dan00b] Dantec Dynamics: FlowMap 3D-PIV System – Installation & User’s
guide. Skovlunde, Denmark: Dantec Measurement Technology A/S.
Publication no.: 9040U4112. Fourth edition. August 2000.
[Dan02] Dantec Dynamics: 80X70 High Power Nd:YAG light-sheet series
(Publication No.: pi400007). pi400007.pdf, obtained from
www.dantecdynamics.com, pdf created 2002-02-15.
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pi260307). PI260307-liquid-seeding-generator.pdf, obtained from
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[Ed05] Edmund Optics: The Importance of Cleaning Optics. Technical support
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LaVision GmbH, February 2003.
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[MelG02] Melles Griot: Optics Guide.
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1996.
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for Fluid Dynamics, Lecture Series 1991-08, 1991.
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162
Literature on PIV, Laser and Optics
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Practical Guide. Berlin, New York: Springer, 1998.
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ES1-0_data.pdf, from www.redlake.com, pdf created 2002-02-08.
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Information No. 21, Mainz, Germany: Schott Glaswerke, 1988.
[Schä99] Schärli M.: Optik: Radiometrie / geom. Optik.Lecture notes, University
of Applied Sciences Aargau, Northwestern Switzerland, 1999/2000. (In
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163
Homepages Used for General (Product) Information
Homepages Used for General (Product) Information
www.concept-smoke.co.uk Concept Smoke Systems (fogger).
www.dantecdynamics.com Dantec Dynamics A/S – Manufacturer of flow
measurement systems such as PIV.
www.ekspla.com EKSPLA – Laser manufacturer.
www.esta.org Entertainment Services & Technology Association.
Organisation with excellent information on
entertainment safety, especially foggers.
www.glendale-laser.com Bacou-Dalloz Group, section on laser eyeware.
www.ila.de Intelligent Laser Applications GmbH – Manufacturer of
flow measurement systems such as PIV.
www.lavision.de LaVision GmbH – Specialised on imaging systems such
as PIV.
www.mellesgriot.com Melles Griot – Manufacturer of optical components and
other instruments associated with photonics.
www.mt-berlin.com Molecular Technology (MolTech) GmbH – Used for
information on non-linear crystals.
www.new-wave.com New Wave Research – Manufacturer of PIV lasers.
www.ni.com National Instruments; Producer of the Labview
Software.
www.nikon.com /
www.nikon.ch /
www.europe-nikon.com/
Nikon – Photography (Top Quality Camera Lenses).
164
Homepages Used for General (Product) Information
www.ophiropt.com Ophir Optronics Inc. - Manufacturer of Laser Power and
Energy Measurement Equipment.
www.osha.gov The U.S. Occupational Safety & Health Administration.
Used for information on atomised oil health hazards.
www.oxfordlasers.com Oxford Lasers Imaging Division – Specialised on
imaging systems such as PIV.
www.pco.de PCO: Manufacturer of scientific cameras.
www.photonics.com General photonics product news. Mainlyused the
dictionary.
www.pivtec.com PivTec GmbH. Manufacturer / reseller of useful
components for PIV (seeding generator).
www.redlake.com Redlake MASD, Inc. - Digital imaging systems;
manufacturer of the PIV camera used in this report.
www.schott.com SCHOTT AG – Manufacturer of high quality glass used
for lenses.
www.tektronix.com Manufacturer of measurement equipment(oscilloscopes,
function generators, ...).
www.thorlabs.com Thorlabs, Inc. – Manufacturer of opticalcomponents and
other instruments associated with photonics.
www.u-oplaz.com U-Oplaz Technologies Inc. – Used for information on
non-linear crystals.
165
Appendices
Appendices
All appendices are available seperately on http://www.yaroc.ch/unsw/.
Appendix 1: Pulsed Laser Specifications.
Appendix 2: Changing the Flashlamps.
Appendix 3: Labview Laser Control Documentation.
Appendix 4: Light Sheet Optics Calculation (Mathcad Sheet).
Appendix 5: Thin Lens Combination Calculator (Mathcad Sheet).
Appendix 6: Light Sheet Configurations.
Appendix 7: Light Sheet Mount and Mirror Alignment.
Appendix 8: Adaptor plates to mount the ES1.0 camera on the Scheimpflug
adaptor and the Scheimpflug adaptor on the Dantec traverse
(drawings).
Appendix 9: Programming and Setting the Function Generator.
Appendix 10: PIV Test Images.
Appendix 11: Corrosion Properties of Fogging Fluids.
Appendix 12: Matlab Image Intensity Level Conversion.
Appendix 13: Using the Redlake ES1.0 Camera.
166