national institute of standards and technology -...

1993 – 1995 ISSN 1044-677X

Volumes 98 – 100

Contents of the

Journal of Research of the

NationalInstitute ofStandards andTechnology

United States Department of CommerceTechnology AdministrationNational Institute of Standards and Technology

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Journal of Research

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National Institute of Standards and

Technology

TheJournal of Research of the National Institute of Standards and Technologyreports NIST research and development in those disciplines of the physical andengineering sciences in which the Institute is active. These include physics,chemistry, engineering, mathematics, and computer sciences. Papers cover abroad range of subjects, with major emphasis on measurement methodologyand the basic technology underlying standardization. Also included from timeto time are survey articles on topics closely related to the Institute’s technicaland scientific programs. Issued six times a year.

To subscribe to theJournal, print out, complete, and mail the format the end of this electronic file.

TheJournal of Researchis archived at many U.S.National Depository Libraries. Individual copies are available fromthe National Technical InformationService, telephone 703-487-4650 or 1-800-553-6847.

Volume 98, Number 1, January–February 1993Journal of Research of the National Institute of Standards and Technology

Contents

ArticlesThe NIST Cold Neutron Research Facility H. J. Prask, J. M. Rowe, J. J. 1

Rush, and I. G. Schroder

Outline of Neutron Scattering Formalism N. F. Berk 15

Small Angle Neutron Scattering at the National B. Hammouda, S. Krueger, and 31Institute of Standards and Technology C. J. Glinka

Neutron Reflectivity and Grazing J. F. Ankner, C. F. Majkrzak, 47Angle Diffraction and S. K. Satija

The Triple Axis and SPINS Spectrometers S. F. Trevino 59

Neutron Time-of-Flight Spectroscopy John R. D. Copley and 71Terrence J. Udovic

Ultra-High Resolution Inelastic D. A. Neumann and 89Neutron Scattering B. Hammouda

Neutron Depth Profiling: Overview and R. G. Downing, G. P. Lamaze, 109Description of NIST Facilities and J. K. Langland

Prompt-Gamma Activation Analysis Richard M. Lindstrom 127

Facilities for Fundamental Neutron Physics Research M. Arif, M. S. Dewey, 135at the NIST Cold Neutron Research Facility G. L. Greene, and W. M. Snow

News Briefs

GENERAL DEVELOPMENTS 145

President Honors Baldrige WinnersFAA Asks NIST to Measure High-Flying EMFsCertification Plan Assesses Antenna Performance

Microwave Users: New Noise Standards Available 146NIST/Industry to Work on Superconducting MaterialsISDN Demo Dubbed a ‘‘Milestone’’Assessors Wanted for Fastener AccreditationAward to Advance Diamond Film Technology

NVLAP Test Program Adds Wood-Based Products 147Field Strength Comparison Status UpdatedEleven Inventions Ready for Licensing


Twenty-one Grants Announced for ATP’s Third Year 148Weights and Measures Handbooks Updated for 1993Futuristic Waveguides Detect Chemicals with Light

Export Workshop Announced on Advanced Materials 149U.S. Joins Japan’s Real World Computing ProgramILAC 92 MeetingNASA Praises NIST Work Supporting Advanced

Communications Technology Satellite

NIST Carries Out First Demonstration of Integrated-Optic 150Waveguide Laser Fabricated in Lithium Tantalate

Sensor to Detect and Classify Sub-Micrometer ParticlesNow Available for Licensing from NIST

NIST Develops Method for Producing Micromachined GasSensor Array by CMOS Post-Fabrication Process

Method Developed for Electrical Characterization of 151Multicarrier Semiconductors

Product Data Hypermedia OverviewASME Y14.5.1 Standard Nears CompletionNIST Researchers Establish Environmental Properties of

MTBE, Popular Oxygenate Fuel Additive

Molecular Beams and Diode Lasers Probe Atmospheric 152Dimer Molecules

Measurements with NIST Gamma-Ray SpectrometerFeatured in International Workshop

NIST Dedicates New High-Dose Cobalt-60 Facility for 153Radiation Processing Applications

NIST Provides Radon Standards to United Kingdom and ItalyCouncil on Ionizing Radiation Measurements

and Standards (CIRMS) Meets at NISTNIST Quantifies Oxides on Intermetallics Compounds

Formed at Electronic Interconnects

Calculations Suggest Strain Reduces Steric Hindrance in 154Environmentally Enhanced Fracture of Silica and Silicon

NIST-ACC Collaboration on Environmental Degradationin Glass-Fiber-Based Composites

NIST Works to Improve U.S. Passport SecurityNIST Completes Study on Fundamental Boiling Mechanisms

of Ozone-Safe Refrigerant/Lubricant Mixtures

Acoustic Emission of Structural Materials Exposed to 155Open Flames

First Text Retrieval Conference (TREC) HeldNIST Publishes Results of First Optical Character

Recognition Systems ConferenceNIST Collaborates with the Department of the Army on

Threats to Computer Systems

Programs for Neural Network Calculations 156


STANDARD REFERENCE MATERIALS 156

Standard Reference Materials 2709–2711 Soil SamplesStandard Reference Materials 458–460 Beryllium-Copper Alloys

STANDARD REFERENCE DATA 157

Data on Chemical Reactions in Solutions AvailableNew PC Database Calibrates Infrared Spectrometers

Volume 98, Number 2, March–April 1993Journal of Research of the National Institute of Standards and Technology

Contents

ArticlesAbsolute Spatially- and Temporally-Resolved S. Djurovic, J. R. Roberts, 159Optical Emission Measurements of rf M. A. Sobolewski, andGlow Discharges in Argon J. K. Olthoff

Optimizing Complex Kinetics Experiments Using A. Fahr, W. Braun, and 181Least-Squares Methods M. J. Kurylo

Measuring Low Frequency Tilts M. L. Kohl and J. Levine 191

Optical Fiber Geometry: Accurate Measurement of Matt Young, Paul D. Hale, and 203Cladding Diameter Steven E. Mechels

Drift Eliminating Designs for Non-Simultaneous Ted Doiron 217Comparison Calibrations

A Three-Ratio Scheme for the Measurement of Isotopic Harry Ku, Frank Schaefer, 225Ratios of Silicon Staf Valkiers, and

Paul De Bievre

‘‘Wolf Shifts’’ and Their Physical Interpretation Under Klaus D. Mielenz 231Laboratory Conditions

Conference ReportsAccuracy in Powder Diffraction II: A Report on the Judith K. Stalick 241Second International Conference

Metrological Issues in Precision-Tolerance Dennis A. Swyt 245Manufacturing: A Report of a NISTIndustry-Needs Workshop

Symposium on Optical Fiber Measurements Douglas L. Franzen 253and Gordon W. Day

North American Integrated Services Digital Elizabeth B. Lennon 257Network (ISDN) Users’ Forum (NIUF)

News Briefs


NIST/Private Company Research May Increase Laser Power1993 Dates Set for ISDN Users’ ForumISDN ‘‘Solutions Catalog’’ Now Available


NCWM Publishes First Metric Size Annual Report 262Latest Baldrige Quality Award Criteria ReleasedCRADA Goal: Assessing Breast Cancer RiskNew Metal Alloy Shows Unexpected Wear Potential

Two Fed Labs to Pursue ‘‘Manufacturing Quality’’ 263New System Helps Diagnose, Solve Concrete ProblemsGetting the Cold Facts on Low-Cost CryocoolersNIST, Oil Company Study ‘‘Green’’ Waste DisposalNIST and Industry Team for MMIC Packaging

NIST Seeks Alternative Suppressants to Halon 1301 264Response Group Formed to Prevent Security ProblemsDates Set for 1993 OSE Implementors’ WorkshopsCRADA Yields Expert Advice for Small Manufacturers

For Accurate Lab Thermometers, Call NIST 265New Scanner Accurately Measures Magnetic DomainsAutomated Frequency Measurement at Your ServiceSTEP Gets ‘‘Green Light’’ to Become Standard

NIST, NTTC Team Up to Boost U.S. Competitiveness 266CRADA Partners to Seek Alternative RefrigerantComment Period Begins for Open Systems StandardBiotech Firm Establishes CARB FellowshipNew Papers Address Lab Uses for Diode Lasers

Video Highlights 1992 Baldrige Award Winners 267U.S./Canada Mutual Type Evaluation Recognition1992 Conference of Legal Metrology in Greece

NIST Scientists Able to Observe One Electron in 10 Billion 268Fast Pulse Test Services Re-Established at NISTSubmicrometer-Resolution Scanner Developed for Dynamic Measurementsof Domains in Magnetic Read Heads

New Process Produces NIST 10 V Array Standards with Industry Collaboration 269NIST Scientist Chairs Workshop Responding to Industry Needs forMCT Characterization

Navy Productivity Improved with Fastener Workcell

Information Technology Vision for theU.S. Fiber/Textile/Apparel Industry 270NIST Scientist to Chair New ISO Technical Committee on Surface Chemical AnalysisStop-Action Measurements of Energy Transfer Processes

New Detector-Based Photometric Scales and Improved Photometric Calibration Services 271NIST Assists the State of Maryland in Radiation Dose Reconstruction for an

Industrial Accelerator Accident

Structural Studies of Langmuir-Blodgett Films Using Neutron Reflectivity 272Magnetic Sensor for Mechanical PropertiesFirst Direct Observation of Photorefractive Gratings in a Nonlinear Optical MaterialMeasurements forPolymer Processing Consortium

NIST Conducts Assessment of Ventilation Measurement Techniques 273NIBS Provides NIST with Research Recommendations


NIST Delivers Home Fire Safety Information to Users 274NIST Trains BATF AgentsNew Federal Information Processing Standards (FIPS) ApprovedOpen Systems Environment (OSE) Implementors’ Workshop (OIW) MeetsNew Publication Focuses on Automatic Indexing

Standard Classification for Building Elements 275Workshop on Experiment Design for Scientists and EngineersU.S. and Canada Publish Harmonized Performance Standards on Plywood SheathingNIST Discovers ‘‘Sand’’ on YBCO Thin Films

NIST Applies for Patents on Advanced Test Structures for Nanometer-Scale Measurements 276NIST Recommends NIJ Restrict Compliance Testing of Police Body Armor to Large Sizes

Videotape Demonstrates NIST Model for Simulating Flat-Panel Displays 277NIST/Industry CRADANew CRADA Targets Key Machine for Making Future Car Engines

Calibration of Profilometer for Geometric Characterization of 278Rockwell C Hardness Indenters

New American Standard for Robot PerformanceCertification of Cadmium and Lead in AluminumWorkshop on Supercritical Water Oxidation

Thin-Film Thermocouple Response Determined to 100 kHz 279Laser Cooling and Trapping of XenonCharacterization of a New Class of Compounds Being Considered for Useas Alternative Refrigerants

Uncertainty Standard on Radiation Processing Dosimetry Developed 280NVLAP Accredits First Secondary Calibration Laboratory for Ionizing RadiationNIST-7 Replaces NBS-6 as U.S. Primary Frequency Standard

‘‘Giant Catalysts’’—A New Generation of Mesoporous Materials 281Stresses in Ceramics Measured by Raman SpectroscopyTemperature Sensing in Aluminum ProcessingGas-Coupled Acoustic Microscope

Advanced Smartcard Developed 282NIST and Industry Join Forces in Parallel Processing ResearchGuidelines for Evaluating Virtual Terminal Implementations PublishedNIST Issues Study of Open Systems Interconnection (OSI) Key ManagementGuidance on Computer Security Tools and Techniques Published


Standard Reference Materials 1400 and 1486—Bone Ash and Bone MealStandard Reference Materials 3171a, 3172a, and 3179—Multielement

Spectrometric Solution MixesStandard Reference Materials 2108-2109—Chromium (III) and

Chromium (VI) Speciation Solutions

Calendar 285

Volume 98, Number 3, May–June 1993Journal of Research of the National Institute of Standards and Technology

Contents

ArticlesCoil Probe Dimension and Uncertainties Martin Misakian 287

During Measurements of NonuniformELF Magnetic Fields

Characteristics of Unknown Linear Systems M. T. Ma and 297Deduced from Measured CW Magnitude J. W. Adams

X-Ray Diffraction Line Broadening: Modeling Davor Balzar 321and Applications to High-Tc Superconductors

Evaluation of Serum Volume Losses Neal E. Craft, Katherine S. Epler, 355During Long-Term Storage Therese A. Butler, Willie E. May,

and Regina G. Ziegler

Dependence of Quantized Hall Effect Breakdown M. E. Cage 361Voltage on Magnetic Field and Current

Conference ReportsWorkshop on Characterizing Diamond Films II Albert Feldman, Charles Beetz, 375

Paul Klocek, and Grant Lu

NIST-Industry Workshop on Thermal S. J. Dapkunas 383Spray Coatings Research

News Briefs


Federal Labs Join Forces to Help U.S. IndustryBridge Builder Gets Helping ‘‘Hand’’ from RoboCraneNIST/U.S.&FCS Joint Effort Tackles Export Concerns

Initial Grantees Say ATP Makes A Difference 392New Guide Can Help States Build A Quality AwardNew Directory Accesses Over 900 Testing LabsTwo Agencies Join Forces, Coordinate ResearchU.S., Saudi Arabia to Continue Standards Work

Partners Work to Provide Corrosion Information 393Keep Computers ‘‘On-Time’’ with New Service1993 Baldrige Award Applications Total 76Preferred Metric Units Listed in New Standard


More Questions, More Answers: ISO 9000 394New Clock is ‘‘One in a Million’’ for AccuracyTrapping Atoms May ‘‘Capture’’ Time in Less Space‘‘Clipper Chip’’ Offers Added Communications Privacy

Go with the Flow: Improving Gas Measurements 395Catalog Helps Users Build ISDN SolutionsU.S./Russian Standards Group Report AvailableCRADA Milestone Marked; FY92 Count Equaled

New Reference ‘‘Measures Up’’ for Electronics 396Bibliographies List What’s New in NIST EM StudiesNational Conference on Weights and MeasuresHolds‘‘Interim Meeting’’Collaboration with Industrial Partner Extended for Another Year

NIST Helps Kick Off the NGIS Program 397CIM Standards For Apparel IndustryLiquid-Hydrogen Cold Neutron Source Modeled by NIST Researchers

Laser-Enhanced-Ionization Spectroscopy Using Diode Lasers 398Transfer of Arc Welding TechnologyMoisture Profiles Near A Dielectric/Silicon Interface

Expanded Research Work on Substituted Derivatives of the 123 Superconductor 399Visibility Through Smoke CloudsNew Mechanism for Soot Formation in FlamesNIST Supports Computer-Aided Acquisition and Logistic Support (CALS)Program in Raster Graphics

NIST Sponsors Symposium on Digital Signature Applications 400North American Integrated Services Digital Network (ISDN) Users’ Forum (NIUF) MeetsNIST Leads Demonstration of Electronic Commerce Reply CardLaser Focus World Article Reports NIST Conclusions on Need for Laser Beam Analysis

NIST Has New Mass Comparison Capability 401Initial Release of STEP Ready for Commercial UseMammography, X Rays, and Quality Control

NIST/Industry Consortium onPolymer Blends 402NIST Evaluates Alternative Refrigerants for IndustryNIST Conducts Successful Multivendor Open Systems Interconnection(OSI)/Frame Relay Interoperability Trial

New Publication Focuses on Database Management in Engineering

Optical Character Recognition (OCR) Research Advances 403Analysis of Comments on Proposal for Conformity AssessmentSystem Evaluation (CASE) Program

NIST Demonstrates World-Record Frequency Response of 8 Terahertzin High-Temperature Josephson Junction

Guideline Offers AC Voltage Reference Based on NIST-DevelopedDigitally Synthesized Source

ISO Project Started on STEP Application Protocol for Dimensional Inspection Plans 404NIST Team Develops Tailored Stationary Phases for Carotenoid Isomer SeparationsMagnetic Engineering of Thin Films


New Carbon-Dioxide Laser Lines Observed 405Patent Disclosure on Laser RefrigeratorImproving Amorphous Silicon Films for Electronic ApplicationsInvestigation of Polymer/Metal Interfaces Using UltraSoft X-Ray Absorption Spectroscopy

Crack Propagation in Aging Aircraft

AISI Project on Microstructural Engineering 406NIST/MIT Neutron Diffractometer OperationalNIST Conducts Round-Robin of Heat-Flow-Meter-Apparatusfor Thermal Insulation Testing

Thermal Envelope Design Guidelines

NIST Publishes Manual for Data Administration 407NIST Hosts SIGCAT ’93Integrated Services Digital Network (ISDN) Agreements Published


Standard Reference Material 2520—Optical Fiber Diameter Standard

Standard Reference Material 2063a—Transmission Electron Microscope Thin Film 408Standard Reference Material 3144—Rhodium Spectrometric SolutionCertification of High-Purity Silver as Standard Reference Material 1746—A Freezing-Point Standard

Standard Reference Materials 1710—1715-Aluminum Alloys 3004 and 5182

Reference Materials 8412—8418 and 8432—8438 Agricultural/Food Reference Materials 409Standard Reference Material 931e—Liquid Absorbance Standard for Ultravioletand Visible Spectrophotometry


New Biotechnology Database on Lipids Offered

1993 SRD Products Catalog Published 410NIST Chemical Kinetics Database UpdatedNIST Surface Structure Database Released

Calendar 411

Volume 98, Number 4, July–August 1993Journal of Research of the National Institute of Standards and Technology

Contents

ArticlesX-Ray Lithography Mask Metrology: Michael T. Postek, Jeremiah R. 415Use of Transmitted Electrons in an Lowney, Andras E. Vladar,SEM for Linewidth Measurement William J. Keery, Egon Marx,

and Robert D. Larrabee

Interlaboratory Study on the Lithographically Michael T. Postek, Andras E. 447Produced Scanning Electron Microscope Vladar, Samuel N. Jones, andMagnification Standard Prototype William J. Keery

Phase Equilibria and Crystal Chemistry in Portions of the B. P. Burton, C. J. Rawn, 469System SrO-CaO-Bi2O3-CuO, Part IV—The R. S. Roth, and N. M. HwangSystem CaO-Bi2O3-CuO

Conference ReportsCOMPASS ’93, Eighth Annual Conference on Dolores R. Wallace and 517Computer Assurance Elizabeth B. Lennon

Workshop on Aging, Dimensional Stability, and Cynthia Arnold-McKenna 523Durability Issues in High Technology Polymers and Gregory B. McKenna

News Briefs


Electrical Potential: Israel, United States Agree on StandardCRADA Partners Focus on Improving Laser LensesNIST Observes One Electron in 10 Billion

Research Partners Seek Better Infrared Radiometry 536CRADA Partners to Evaluate Advanced InsulationsStandard Addresses CNC Performance EvaluationsIntegrated Optic Laser Emitting at 905, 1057, and 1356 nmTrapped Neutral Atom Methodology Applied to High-Accuracy WavelengthReference for Optical Communications

Industry, NIST Collaborate to Study Overlay Measurements 537NIST Provides Leadership for DARPA Infrared Detector Materials ProgramYoung’s Interference Experiment Using Two Atoms


Holographic Measurements of Atomization and Spray Forming 538AMRL Supports the Metric Conversion of AASHTO Materials StandardsNew SRM for Calibrating Infrared Spectrophotometers

NIST Sponsors Mammography Workshop 539Thermal Conductivity of HCFC-FilledPolymer FoamsComputer Graphics Metafile Generator Test Service InitiatedNIST/ASA/NSF Fellow Develops New Model for Controlling Measurement Processes

NIST Publishes IGES Hybrid Microcircuit Application Protocol 540Improved Method Developed for Characterizing HgCdTe Infrared DetectorsNIST Develops Improved Sensor for High AC and Pulsed Currents

Industry Focuses on Traceability Needs at NIST/DOE Gear Metrology Workshop 541Photopatterning of Alkylthiol Self-AssembledMonolayersAtmospheric Sampling in Saudi Arabia

Collaborative Research Elucidates Carbon Monoxide and Soot Oxidation 542NIST Supports Computer-Aided Acquisition and Logistic Support (CALS)Initiative in Computer Graphics

Spoken Language Technology andApplications Day Held‘‘Trapped’’ Ions Provide First View of Light Property

Partners Plan Device for Clearer Protein Images 543CRADA Seeks Better Factory Systems IntegrationU.S./Hungarian Team to Refine pH StandardsEleven Inventions Ready for Licensing

Wall Designers Get Help Avoiding the ‘‘Draft’’ 544NIST Intends to Grant Exclusive DSA LicenseAerospace Alloys Consortium Launched

Consortium to AdvancePolymer Blends Processing 545CRADA May Improve Microwave MeasurementsActivities Report Highlights 1992 for NIST LabNew CRADA to Improve On-Line CVD MonitoringReport Reviews1992 Achievements of NIST Lab

‘‘Hash’’ Standard for Digital Signatures Approved 546New Algorithm Sharpens Images, Damps NoiseA STEP Toward Competitive ‘‘Made-to-Measure’’Primer Tells What’s Cool (and Trapped) with Lasers

Examiners Needed for 1994 Baldrige Award 547NIST Measurements Confirm Quantum Hall Devices as IntrinsicStandards of Resistance

NIST Work Enables Micromachine Designers to Fabricate Devices ThroughFoundry Processing

‘‘Lift-Mode’’ Magnetic-Force Microscopy Deconvolves Magnetic Information from 548Surface Topology

NIST Develops Reference Specimens to Improve Critical-Current Measurements onHigh-Temperature Superconductors

Workshop on Thermochemical Data Needs for CVD Modeling


New Monograph of Thermocouple Reference Functions and Tables 549Based on the ITS-90 Now Available

Technology to Fabricate Nanometer-Size Surface Test Structures Developed

Observation of Strain-Induced Microcracks in HighTc 550Superconductor Composite Wire

Incommensurate Spin Density Waves in Metallic V2–y O3

High-Speed Spatial Scanning Pyrometer Developed

Computer Graphics Metafile (CGM) and POSIX FIPS Revised 551Overview of First Text REtrieval Conference PublishedNIST Sponsors Users’ Forum on Application Portability Profile (APP)and Open System Environment (OSE)

NIST Explains Role of Measurements in the Competitive Stance ofthe U.S. Electronics Industry

NIST-Industry Collaboration Developing Needed Fine-Scale Test Structures 552Private Laboratories to Use NIST Princeton Engine Video SupercomputerNIST Provides Leadership in International VAMAS Superconductor Standards Activities

NIST Leads Team Demonstrating Concept of Electronic Business Reply Card 553Sensing Surface Finish UltrasonicallyChromium in Coal Fly Ash Using Microwave

NIST/SEMATECH Gas Flow Round Robin Program 554CRADA with Private Company on Spray FlamesX-Ray Goniometer Developed for Use in Ultra High Vacuum

New Technique Reveals Unexpected Phenomenon in Electron-Ion Excitation 555Materials Evaluation in Support of Superconducting Magnetic Energy StorageNew Hg Superconductors

Measurements forPolymer Processing Consortium 556Optical and Ultrasonic Sensors forPolymer Processing

Reliability of Glass Aircraft Windows 557Ultrasonic Resonance Spectroscopy Using EMATsNIST Develops Building and Ventilation Characterization Protocols for Indoor AirQuality Investigations

Expert System for Highway Concrete 558NIST and the Department of the Treasury Sign Memorandum ofUnderstanding (MOU) in Information Technology Security

Revision of Federal Information Processing Standards (FIPS)for Database Language SQL

Guidance on Improving Software Quality IssuedConference on Extreme Value Theory and Its Applications



Tin-Lead Coating Thickness Standards 60 % Sn-40 % PbStandard Reference Material 886—Refractory Gold OreStandard Reference Materials 2556 and 2557—Used Automobile Catalysts


Russian Rocket-Space Technology Data AvailableDatabase Details Atomic-Scale Surface Structures

Volume 98, Number 5, September–October 1993Journal of Research of the National Institute of Standards and Technology

Contents

ArticlesTransformation of BCC and B2 High Temperature Phases L. A. Bendersky, A. Roytburd, 561

to HCP and Orthorhombic Structures in the Ti-Al-Nb and W. J. BoettingerSystem. Part I: Microstructural Predictions Based on aSubgroup Relation Between Phases

Transformation of BCC and B2 High Temperature Phases L. A. Bendersky, and 585to HCP and Orthorhombic Structures in the Ti-Al-Nb W. J. BoettingerSystem. Part II: Experimental TEM Study ofMicrostructures

Corrosion Characteristics of Silicon Carbide and R. G. Munro and 607Silicon Nitride S. J. Dapkunas

Conference ReportsNorth American Integrated Services Digital Elizabeth B. Lennon 633Network (ISDN) Users’ Forum (NIUF)

News Briefs


United States, Russia Develop Optical Imaging SystemBiosensor Consortium Announces First MembersStandards Working Group Plans Moscow Meeting

Models Measure Speed of Sound for Gas Mixtures 638Location Effects in Orifice Flowmeters DocumentedKey Escrow Encryption Standard ProposedGuide Helps Users Build Open Systems

Researchers Help Circuit Layers ‘‘Get in Line’’ 639Volt Standard Marketed With NIST CooperationNew Test Planned for Paint Industry’s PaletteDNA Standard Makes the ‘‘Top 100’’ ListNovel Chemical Concentrator Makes Debut


Consortium to Help Building Systems Communicate 640Plan Announced to Harmonize U.S. LabsNow Hear This: Sound Used for Cleaner BurnsMajor Barrier to Advanced Materials Identified

GATT Standards Activities Reported for 1992 641New Software Simplifies Semiconductor MeasurementsCryogenic Alloy Now Available for LicensingNew Facility Designed for Better Antenna Assessments

1993 Weights and Measures Labs Directory Published 642Atomic-Level Deposits Promise Solid ReturnsResearcher Wins Turkey’s Highest Science AwardProposals Sought for Precision Measurement GrantsData Tables on Ethane Properties Available

First Product Successfully Machined Using STEP 643NIST Measurement Technology Goes to MarketCRADA Sets Plans for Atomic Microclock in Motion

NCWM to Work on Price Accuracy in Retail Stores 644Partners to Develop Powerful Tunable LaserNew Device Precisely Measures Hydrogen in MetalsAntenna Software Measures ‘‘Near and Far’’

NIST Leads Industry to Resolve Problems in Determining Laser Beam Spatial Parameters 645NIST, Sandia Collaborate to Develop Tools for EvaluatingThermal Performance of Semiconductor Device Packaging

NIST Measurements of Ion Kinetic Energies from RF PlasmasProvide Baseline Data for Semiconductor Processing

NIST Contributes to Development of Prototype Software 646Supporting Computer Design of High-Power Microwave Tubes

AFM Maps Observe New Deposition Process

Sea-Viewing Radiometer Developed 647New Ionization Source Developed for Mass SpectroscopyMissing Link in Fission Systematics Found

Laser Ionization Monitoring Promises New Diagnostic of Semiconductor Growth 648NIST Research Associates License Bone Repair/Replacement MaterialClassification System for Advanced Ceramics Developed by International CollaborationPhase Transition Puzzle Clarified

Simultaneous Measurement of Soot Volume Fraction and Temperature in Flames 649Application Portability Profile (APP) Guide RevisedNIST Supports the Department of Defense Computer-Aided Acquisition and LogisticSupport (CALS) Initiative in Computer Graphics

FIPS for Massachusetts General Hospital Utility Multi-Programming System (MUMPS) 650Programming Language Revised

NIST/ASA/NSF Fellow Develops New Statistical Methods for Manufacturing ProcessQuality Assurance

Calendar 651

Volume 98, Number 6, November–December 1993Journal of Research of the National Institute of Standards and Technology

Contents

Articles36Cl/Cl Accelerator-Mass-Spectrometry Standards: R. Colle and 653Verification of Their Serial-Dilution-Solution Joylene W. L. ThomasPreparations by Radioactivity Measurements

Pressure-Volume-Temperature Relations E. R. Grilly 679in Liquid and Solid Tritium

Filter Transmittance Measurements A. L. Migdall, A. Frenkel, and 691in the Infrared D. E. Kelleher

On Two Numerical Techniques for Light Scattering Akhlesh Lakhtakia and 699by Dielectric Agglomerated Structures George W. Mulholland

Wavelengths and Energy Levels of Neutral Kr84 and Victor Kaufman 717Level Shifts in All Kr Even Isotopes

Conference ReportsThird International Conference on Chemical Kinetics Robert E. Huie 725Reactions in Gas and Condensed Media

Data Administration Management Association Symposium Judith Newton 729

SUBJECT INDEX TO VOLUME 98 759

AUTHOR INDEX TO VOLUME 98 763

News Briefs


Agencies Target Help for Pollution PreventionNIST, Alaska Evaluate Impact of Burning Oil SpillsNew Lab Focuses on Novel Machine-Tool Designs

Software Designed to Save Energy and Dollars 734Ceramic ‘‘Chefs’’ Fine-Tune Recipes with New OvenNo ‘‘Second Guessing’’ with NIST Time Services GuideFebruary Meeting to Feature 1993 Baldrige Winners


Two Companies Receive 1993 Baldrige Award 735New Dental Material Contains No MercuryTechnology Centers to Host SBA ExpertsPanel to Address Open Systems Compatibility

New Standard Randomly Chooses Computer Passwords 736Twenty-Nine Grants Announced for ATP Fourth RoundLaser Light Used to Focus Atoms on Surfaces‘‘Electromagnetic Bottle’’ Traps Ions for Study

1994 Baldrige Criteria Focus on Business Planning 7371994 NIUF Meeting Dates AnnouncedNew Device Improves Mammography ImagingSoftware Helps Predict, Solve Moisture Problems

New ‘‘One-Stop’’ Industry Guide to NIST Available 738Measuring Energy Flows in a Super-Cold RefrigeratorNIUF Group Studies ISDN Wiring InstallationEM Materials Measurements Focus of New Report

Atomic Clock, Wear-Resistant Alloy Receive HonorInteragency Committee on Standards Policy ISO 9000 ClearinghousePatent Issued on Sensor to Detect and Classify Submicrometer ParticlesMethod Developed for Characterizing Planar TransmissionLines Formed on Lossy Substrates

NIST Images Magnetic Recording Head with New Magnetic-Force Microscope 740NIST-Led IEEE Working Group Recognized for Development of Surge Voltage DocumentNIST’s Light Scattering Taxonomy Highlighted inApplied Optics Journal

NIST CMM Test Device Commercialized 741Ultrathin Film SnO2 Gas SensorsNew Collisional Process Responsible for Radiation Damage in Compounds

Eighth National Synchrotron Radiation Instrumentation Conference Convened 742at NIST Gaithersburg Campus

Development of Tunable, Pulsed Solid-State Lasers in the VisibleCRADA with AISI for On-Line Magnetic Monitoring of Steel

Measurements for Ceramic Powder Processing 743Combustion Study of Siloxane through CRADA with IndustryNIST Researchers Lead Earthquake Investigation to JapanSmoke Yield Measurements Made during International Offshore Experiment

New Publication Focuses on Security Issues in Database Language SOL 744Report Presents Proceedings of Workshop on the Security of National Computer NetworksNIST Releases Software for Economic AnalysisWorkshop for Industry

Second-Generation NIST Thin-Film Multijunction Thermal Converters 745Demonstrate Practicality of Approach

Device Simulations Made Possible by NIST Models Speed Utilization of New PowerSemiconductor Devices

Commercial Semiconductor Test Equipment Based on Standards 746Resulting from NIST Work

NIST Develops Electronic Police Radar CalibratorModel Developed to Evaluate Shielding Effectiveness of Aircraft Skin Structure


Results of Indo-U.S. Collaborative Program on Integrated Optics Disseminated 747through Workshop

NIST Works with Machine Tool Builder to Improve High-Speed LinearMotion Performance

Topography of Multilayer X-Ray MirrorDefects Identified in Prototype Advanced Memory Chip

Frobisher Iron Bloom Studied to Establish Provenance 748Two New NIST Precision Measurement Grants Awarded for FY 94Counting Single Atomic Layers During the Growth of Thin Films

NIST Assists Manufacturers of Color Displays 749Powerful Optically Pumped Far-infrared Laser Line DiscoveredFirst International Comparison of Phase-Noise-Measurement Systems

NIST Establishes Two-Way, Time-Coordination Link to Europe 750Cold Neutron Reflectometer CommissionedSoftware Evaluation Agreement Signed

Company Signs CRADA Investigating Fracture in EngineeringPolymers 751NIST and NCMS Sign Cooperative Agreement to Develop Lead-Free SoldersNew Techniques Used for Siting Smoke DetectorsNew Fire Suppressants Recommended for In-Flight Protection of Aircraft

BACnet Produces Positive Reaction from Industry 752Computer Security Conference Attracts Large TurnoutRaster Graphics Validation Test Service InitiatedNew Publication Focuses on Information Retrieval TechniquesSecurity of Electronic Documents Subject of NIST Report

Digital Signature Certificate Management Workshop Results Published 753NIST Critical Stability Constants of Metal Complexes Database ReleasedNIST First-Time Measurements Help Manufacturer Design Improved Portable X-Ray UnitsLocating Images Projected by Integrated-Circuit Manufacturing Tools to Nanometer-Level Accuracy

NIST Transmission Line Measurement Method Demonstrated for High-Permittivity Materials 754NIST Demonstrates Capability for High-Frequency Surface Resistivity Measurementsof High-Temperature-Superconductor Films

New Method to Detect Highly Excited Atomic States

NIST Researchers Document Thermal Aging of Foam Insulation 755ISDN Federal Information Processing Standard (FIPS) ApprovedNew Report Focuses on Emerging Features for Geographic Information Systems (GIS)Applications in Database Language Structured Query Language (SQL)

NIST Makes POSIX Conformance Test Suite Available Electronically


Standard Reference Material 1746—Silver Freezing-Point Standard

Standard Reference Material 1978—Particle Size Distribution Standard 756Standard Reference Materials 2590—2591 Josephson Array Voltage StandardsStandard Reference Material 2137—Boron Implant in Silicon Standard for Calibrationof Concentration in a Depth Profile

Calendar 757


Contents

ArticlesPrecision Comparison of the Lattice Parameters of E. G. Kessler, A. Henins, 1Silicon Monocrystals R. D. Deslattes, L. Nielsen,

and M. Arif

The NIST 30 MHz Linear Measurement System Jeffrey A. Jargon, Ronald A. 19Ginley, and Douglas D. Sutton

Uncertainties in Dimensional Measurements Dennis A. Swyt 31Made at Nonstandard Temperatures

A Null-Balanced Total-Power Radiometer System NCS1 Sunchana P. Pucic 45

Derivation of the System Equation for Null-Balanced Sunchana P. Pucic 55Total-Power Radiometer System NCS1

Evaluation of Uncertainties of the Null-Balanced Sunchana P. Pucic 65Total-Power Radiometer System NCS1

Cryogenic Blackbody Calibrations at the National R. U. Datla, M. C. Croarkin, 77Institute of Standards and Technology Low and A. C. ParrBackground Infrared Calibration Facility

Conference ReportsInternational Conference on Machining of Said Jahanmir 89Advanced Materials

Workshop on Standardization Needs in Biotechnology Kenneth D. Cole, Lura J. Powell, 93and G. Larry Eitel

News Briefs


New Method Puts ‘‘Trace’’ on the Hard-to-MeasureCRADA to Improve Semiconductor MeasurementsMore Accurate Capacitance Standard in Development


1994 Dates for OSE Workshops Scheduled 102NIST Helps Private Industry in Development of Filters for Automobile Wiring HarnessesNIST Joins with Industry to Spur Development of Nanoscale Profiling

Workshop on Flat-Panel Display Measurements Identifies Potential NIST Roles 103NIST Contributes Chapter on Optical Properties of Semiconductors to Handbook of OpticsNIST Provides Bioeffects Community with Primer for the Conduct of In-Vitro StudiesWith Power-Line Frequency Electric and Magnetic Fields

NIST Signs CRADA with Private Company to Improve the Accuracy of Pressure Measurements 104Geometric-Thermal Machine Tool Errors Predicted By Neural NetworksU.S. Patent Awarded to Novel X-Ray Photoemission Spectroscopy System Invented at NIST

ISO Guide to the Expression of Uncertainty in Measurement 105Laser-Focused Atoms Create Nanostructures

NIST and State Governments Sponsor Workshop on Radioactivity Measurement Needs 106CIRMS Meets at NISTRadiation-Therapy Dose Mapping with a New X-Ray Imaging CameraStandards for International Time Comparison

Spectral Purity Measurements 107Precision Frequency Measurements Used to Identify Interstellar IonsEvidence for Magnetic Field Annihilation on the Surface of StarsWorkshop on Composite Materials for Offshore Operations

New Joint Ventures with Industry at the CNRF 108Scanning Acoustic Imaging of Stress (SAIS)Creep Studies on Ceramics for Advanced Engine ApplicationsNIST Completes Phase 1 of Cooperative Research with Private Company

NIST Releases Computer Program MOIST 109NIST Establishes Panel on Federal Internetworking RequirementsFIPS for the User Interface Component of the Application Portability Profile (APP) RevisedNew Publication Describes Reference Model for Software Engineering Environments

Users’ Forum on the Application Portability Profile (APP) and Open Systems 110Environment (OSE) Attracts Large Turnout

User’s Guide for 1978 Fortran Compiler Validation System IssuedCRADA Seeks High-Accuracy Radiation DosimetersEncryption Algorithm Reaffirmed Until 1998New Method Measures Computer Disks Magnetically

Time Q&As, Standards Featured in Fact Sheets 111Acoustic Fire Detection ‘‘Sounds’’ Good for BuildingsNew Neutron Diffractometer Speeds CrystallographyNIST Joins Effort to Improve U.S. Steelmaking

Assistance to State Technology Programs Planned 112Powders and Slurries Consortium Signs First MembersNIST Announces Availability of Special-Test Measurements for High-Frequency PhasemetersNIST Hosts Workshop on Advanced Components for Electric and Hybrid Electric Vehicles


NIST Develops Calibration Methods to Support Introduction of New Optical Devices 113for Transmission Grid Measurements

Working Group on Circuit Simulator Model Validation Formed under NIST Leadership

DIN Standards Published in English 114Industrial Partner Collaborates in Development of a New Standard for Turning CentersDefinitive Method Developed for Serum Triglycerides

Three-Dimensional Internal Circulation in Spinning Droplets 115NIST Provides Internet Time ServiceSynchronization of LORAN-C StationsProcess Simulation for Powder Metallurgy

Ceramic Matrix Composites fromPolymer Precursors 116Fire Detector Siting for Complex CeilingsU.S. Product Data Association Adopts Application Protocol to Use with IGES

NIST Establishes Laboratory to Test Advanced Insulation Systems 117CCRL Completes Record Laboratory Inspection TourRaster Graphics Validation Test Service EstablishedNew Publication Focuses on the Fiber Distributed Data Interface (FDDI)NIST Initiates IRDS Conformance Test System and Validation Testing


New Botanical Standard Is Ripe for the Pickin’Standard Reference Material (SRM) 1800—Fifteen Non-Methane Organic Compounds in NitrogenStandard Reference Material 2389—Amino Acids in 0.1 mol/L Hydrochloric Acid


Reaction Rates of Ligands at Your Fingertips

Alternative Refrigerant Database Expanded 119


Contents

ArticlesA Sealed Water Calorimeter for Measuring Steve R. Domen 121Absorbed Dose

Planar Near-Field Measurements of Michael H. Francis, Allen C. Newell, 143Low-Sidelobe Antennas Kenneth R. Grimm, John Hoffman,

and Helmut E. Schrank

On the Physics Required for Prediction of Long Term Gregory B. McKenna 169Performance ofPolymers and Their Composites

The Measurement and Uncertainty of a Calibration J. Fu, M. C. Croarkin, and 191Standard for the Scanning Electron Microscope T. V. Vorburger

Letter to the EditorNew Values for Silicon Reference Materials, P. De Bievre, S. Valkiers 201Certified for Isotope Abundance Ratios and H. S. Peiser

News Briefs


Setting Priorities, Measuring Results: Report Tells HowCRADA Goal: Better Materials Quality AssessmentUnited States/Russia Trade to Benefit from New Program

Group Developing Standards for Use in Laptops 204Precise Voltage Standards Are ‘‘Current-ly’’ AvailablePaper Discusses ‘‘How to Make NII Happen’’New Policy Features Escrowed Encryption Standard

Partners Look to Thin Films for Data Storage 205New Spectrometer May Pave Road to Cleaner CarsNIST Handbook 44 Revised for 1994Primer Provides Help for Computerphobic Engineers

Capillaries Capture New Wave in Neutron Probes 206CRADA Partners Target Weld Spatter ReductionFinal Projects for FY 1993 TRP Awards ChosenUnited States, Canada Renew Testing Lab Agreement

Consortium to ‘‘Break Ice’’ between Building Systems 207System Improves Permittivity MeasurementsNIST Vibrational and Electronic Energy Levels of SmallPolyatomic TransientMolecules (VEEL) Upgraded

National Conference on Weights and Measures Interim Meeting Held in Bethesda, MD, Jan. 9–13


NIST Demonstrates Passively Q-Swithced Solid-State Waveguide Laser 208Test Demonstrates the Use of Precision Digital Multimeters for AuditingPapers on Mass Determination and Gravimetric Applications

NIST Participates in Defense Conversion Award for Gear Metrology Program 209Version 4.0 of REFPROP ReleasedCorrelated Photons for Standardless Detector Calibration

Infrared Calibration Measurements in Support of NASA Cassini Mission 210Structures of Triglyceride Microemulsions for Processed FoodConsortium on Ceramics Powder and Slurry CharacterizationNIST Helps Private Company Optimize Manufacturing Process

Giant Magnetoresistence Effects in Electrodeposited Multilayers 211Fire Safety of Passenger Trains: A Review of Existing Methods and of New ConceptsNew Publication Focuses on Security in Electronic Commerce

Improved Machine Tool Heads for the Factory 212Invention to Improve IR Chemical AnalysisFemtochemistry Sees Quickest Atomic Motions

Guide Helps Managers ‘‘Air Out’’ Energy Problems 213Paper Highlights Lightwave Standards DevelopmentNew Shielding for Radiotherapy DevelopedNIST Answers Industry’s Call for Measurement Program

New Spin Echo Instrument to Be First in the United States 214Industry to Improve NIST’s Molecular-Level VisionNIST, DOE Now Offer Precision Measurement Service

Micelle Complexes to Be Focus of CRADA Research 215In-House Designed Custom Comparator Chip ProvidesNew Capabilities to NIST Wideband Sampling Probe

NIST Develops Digital Partial Discharge Recording and Analysis System

Study of Degradation of High-Temperature Superconductor Thin-Film 216Surfaces Exposed to Various Gases and Vacuum Supports Developmentof Practical Superconducting Electronics

Absorption of NASA Wedges Tested in NIST Impedance TubeASTM Considers Using NIST Data to Adjust Tolerance Limits onAluminum Ultrasonic Reference Blocks

Interactions with the National Center for Metrology (CENAM) of Mexico 217Chemical Mechanism Developed for FluorocarbonsNIST Programs in Support of the National Cancer Program

NOAA-NIST Collaboration on Atmospheric Chemistry 218Direct Observation of Magnetic Flux Flow in High-Temperature SuperconductorsEvaluation of Phase Diagrams for Pb-free Solder Alloys

New Neutron Methods for Surface Corrosion and Electrochemistry 219Ultrasonic Monitoring of Fatigue Loading of Highway BridgesHUD Issues New Wind Load Requirements for Manufactured Home DesignWorkshop Shows Impact of NIST Oil Spill Studies


NIST Studies Indoor Air Quality Impacts of Residential HVAC Equipment 220New Fingerprint Standard ApprovedNIST Collaborates With the U.S. Navy on Next Generation Computer ResourcesEscrowed Encryption Standard Approved As Federal Information Processing Standard (FIPS)

NIST Hosts Workshop on Advanced Software Technology Requirements 221NIST Participates in Conferences on Open Systems in Russia and the UkraineSoftware Engineering Environments Subject of New GuideNIST Staff Lead Discussions on Improving Industrial Measurement


Standard Reference Material 2551—Oxygen Concentration in Silicon StandardStandard Reference Material 1921—Infrared Transmission Wavelength Standard

Calendar 223


Contents

ArticlesSources of Uncertainty in a DVM-Based Measurement Kevin C. Lee, Marvin E. Cage, 227

System for a Quantized Hall Resistance Standard and Patrick S. Rowe

A dc Method for the Absolute Determination of Y. C. Wu, W. F. Koch, D. Feng, 241Conductivities of the Primary Standard KCl L. A. Holland, E. Juhasz, E. Arvay,Solutions from 08Cto 508C and A. Tomek

Three-Axis Coil Probe Dimensions and Uncertainties Martin Misakian and 247During Measurement of Magnetic Fields from Appliances Charles Fenimore

Improved Automated Current Control for James H. Walker and 255Standard Lamps Ambler Thompson

Refractive Indices of Fluids Related to Thomas J. Bruno. Marcelo A. 263Alternative Refrigerants Wood, and Brian N. Hansen

A Theoretical Analysis of the Coherence-Induced Spectral John T. Foley and 267Shift Experiments of Kandpal, Vaishya, and Joshi M. Wang

Letter to the EditorComments on the paper ‘‘Wolf Shifts and Their Physical Emil Wolf 281

Interpretation Under Laboratory Conditions’’ byK. D. Mielenz

Letter to the EditorReply to Professor Wolfs comments on my paper on Klaus D. Mielenz 283

Wolf shifts

ErrataErratum: Precision Comparison of the Lattice E. G. Kessler, A. Henins, 285

Parameters of Silicon Monocrystals R. D. Deslattes, L. Nielsen, andM. Arif

Conference ReportsWorkshop on Characterizing Diamond Films III Albert Feldman, Sandor Holly, 287

Claude A. Klein, and Grant Lu


News Briefs


Commerce Adopts Metric Transition Action PlanAdvanced Fire Safety Advised for High-Speed TrainsNew Chart Details ‘‘Cold Facts’’ about Silver

Open Systems Publication Now on CD-ROM 296ATP Focuses on Five Technologies for New ProgramsQuake Report: ‘‘Good News, Bad News’’ Structurally

1994 Baldrige Award Sought by 71 Firms 297U.S. Trade to Benefit from New Assessment SystemUltrasound to Evaluate ‘‘Health’’ of Air Bag InflatorsSeminar on OMB Circular A-119Mutual Recognition of Type Evaluation between the United States and Canada

NIST Cryoelectronic Infrared Detector Sets Records 298NIST Three-Loop Method Addresses Need for Measuring ElectromagneticRadiation from VDTs

Direct Comparison System for Microwave Power Provides Basis for Improved 299Service to NIST Customers

Josephson-Junction Digitally Synthesized Sources for AC Metrology under DevelopmentDraper Laboratory Micromachined Silicon Sensors Evaluated in NIST Anechoic Chamber

Collaboration Produces Prototype Tool for Monitoring MAP Networks 300Pioneer Fund Grant for Encrypted Time Dating Awarded to NISTSimple Optical Transfer Cavity for Absolute Frequency CalibrationPolymer-Supported Catalysts for Synthesis of Cyclopolymerizable Monomers

Learning the Shape of Things Unsticky 301NIST Fire Models Utilized to Demonstrate Code EquivalencyPanel Envisions Federal Internetworking as Component of National InformationInfrastructure (NII)

New Publication Relates Virtual Environments to Manufacturing

NIST Publishes Procedures for Registering Computer Security Objects 302GAMS Connects to the World Wide WebNew Report Highlights Benefits, Barriers of NIINews from NIST Now Accessible Through Gopher

World Gets a Second to Spare on June 30 303United States/Canada/Mexico Establish NORAMET and NACCNew Service to Assess Metrology SoftwarePuzzle of Superconductor AC Loss Measurement Resolved

NIST Co-Sponsored Workshop on Interface Standard for Smart Sensors 304Symposium on Physical Interaction and Manipulation


Standard for Communication with Postal Equipment Delivered to USPS 305NIST Co-Hosts Workshop to Launch R&D Program for Custom Footwear ManufacturingBiological Macromolecule Crystallization Database

International Program Developed on Global Atmospheric Transport of Metals 306Theoretical Prediction of Gas-Phase Chemical Nucleation KineticsCRADA Results in New, High-Power, Tunable Diode LaserNew Laser Source at 194 nm

NOAA-NIST Collaboration on Atmospheric Chemistry 307Internet Time ServiceSignal Processing of Acoustic Emission for Materials ProcessingWorking Pressures for Copper Tube Joints With Lead-Free Solders

Short Course on Neutron and X-Ray Scattering Highly Successful 308Research Leads to Biomaterials with Remineralization PotentialPortland Cement Concrete HydrationNIST Releases New Multizone Airflow and Indoor Air Quality Model

Computer Graphics Metafile (CGM) Test Service Expanded 309NIST Sponsors International Workshop on Harmonizing Conformance Testing forProgramming Language and Graphics Standards

Standard Helps Users ‘‘Sign’’ Electronic Data

CRADA Partners Seek Improved Radiation Dose Maps 310New Facility Promotes Better Building MaterialsUnited States, Canada Recognize Test Results on DevicesLicensees Sought for New Lithography Method

Radiation Meeting to Highlight Measurement Quality 311


Standard Reference Material 1980—Positive Electrophoretic Mobility ( +|uE) StandardStandard Reference Materials 1818a and 1819a—Total Chlorine in LubricatingBase Oil and Sulfur in Base Oil

New Marine Sediment SRM Issued


New SRDP Products Catalog Now AvailableMass Spectral Database Innovations Announced


ContentsExtreme Value Theory and Applications

Proceedings of the Conference on Extreme ValueTheory and Applications, Volume II

Preface

ArticlesApplications of Extreme Value Theory Philip A. Scarf and 313in Corrosion Engineering Patrick J. Laycock

On the Requirements for a Reasonable Shigeru Komukai and 321Extreme Value Prediction of Maximum Komei KasaharaPits on Hot-Water-Supply Copper Tubing

Application of Extreme Value Statistics to Corrosion Toshio Shibata 327

Exact Solution to an Interacting Extreme-Value Problem: P. L. Leath and 337The Pure-Flaw Model P. M. Duxbury

Inclusion Rating by Statistics of Extreme Values and Y. Murakami 345Its Application to Fatigue Strength Prediction andQuality Control of Materials

Critical Levels of Ozone Over the United Kingdom: R. I. Smith, C. W. Anderson 353Mapping Aggregate Exceedances Over Moderate and D. Fowlerto High Thresholds

Extreme Value Estimation Applied to Aerosol Size Philip K. Hopke and 361Distributions and Related Environmental Problems Pentti Paatero

A Trivariate Extreme Value Distribution Applied to Carlos A. Escalante-Sandoval 369Flood Frequency Analysis and Jose A. Raynal-Villasenor

Fractal Theory and the Estimation of Extreme Floods Donald L. Turcotte 377

Short-Record-Based Extreme Wind Simulation Edmond D. H. Cheng and 391Arthur N. L. Chiu

Getting the Most From Your Extreme Wind Data: David Walshaw 399A Step by Step Guide

Application of an Empirical Extreme Value Distribution Jun Kanda 413to Load Models

Seismic Risk Analysis Based on Strain Energy Motoyuki Suzuki and 421Accumulation in Focal Regions Yoshio Ozaka


Techniques Used to Determine Extreme Wave Heights Marc A. Maes and 435from the NESS Data Set George Z. Gu

Extreme Value Analysis of Wave Heights E. Castillo and 445J. M. Sarabia

Dynamic Amplification of Jack-Up Platforms Jfrge n Juncher Jensen 455Subjected to Non-Gaussian Wave Loads

Prediction of Extreme Response of Nonlinear Oscillators Arvid Naess 465Subjected to Random Loading Using the PathIntegral Solution Technique

A Random Field Excursion Model of Salt Induced Gordon A. Fenton 475Concrete Delamination

Extreme Value Theory Applications to Space Radiation P. W. Marshall, C. J. Dale, 485Damage Assessment in Satellite Microelectronics and E. A. Burke

Performance Comparison Between a Statistical Model, M. Urquidi-Macdonald and 495a Deterministic Model, and an Artificial Neural Network D. D. MacdonaldModel for Predicting Damage From Pitting Corrosion

Identification of Failure Origin Through Testing and the John A. Tesk, Martin Y. M. 505Weibull Risk-of-Rupture Chiang, Spurgeon M. Keeny, III,

Jun Tang, and Yuuji Sato

Conical Extremes of a Multivariate Sample Alexander V. Gnedin 511

Bayesian Forecasting of Extreme Values in an Bruce M. Hill 521Exchangeable Sequence

On the Convergence of the Number of Exceedances J. Husler and 539of Nonstationary Normal Sequences M. Kratz

On the Multivariate Extremal Index S. Nandagopalan 543

Domains of Attraction of Multivariate Extreme Rinya Takahashi 551Value Distributions

The Aggregate Excess Measure of Severity of Clive W. Anderson 555Extreme Events

The Measurement of Averages and Extremes of C. W. Anderson and 563Environmental Variables K. F. Turkman


News Briefs


‘‘Electronic Eye’’ Improves Accuracy in LightingNavy Review Points Way to Improved CMM PracticesStandard to Focus on Turning Center Performance

Accreditation for Calibration Labs Announced 5721994 NVLAP Program Directory AvailableExaminers Needed for 1995 Baldrige AwardATP Project Develops World’s Brightest Green LED

Want to Trap Cesium Atoms? Use Microwaves 573United States Harmonizes Standards With UkraineNetwork for New York Manufacturers Expanded

Paper Details Calibration System for Power Meters 574NIST Reports on Metric, the Feds and IndustryAdvances in Fiber Optic Sensors Featured in PaperBaldrige Award Program Trains PilotHealthcare and Education Evaluators

NVLAP Procedures 575New Digital Bridge to Provide NIST Customers Improved Impedance ServicesNIST Helps Manufacturer Investigate Tacky Spots Found on Parking Areas of Hard Disks

Operation of SNS Junction for Voltage Standard Demonstrated at 38 K 576CRADA Established With Private Company to Evaluate New CalibrationTechnique and Thermal Transfer Instrument

NII Challenges Addressed in Workshop 577Project for Improving Piston Turning Machines Completed with SuccessNew, Powerful Theory for Electron-Impact Ionization Cross SectionsLaboratory Spectra of a Stratospheric Chlorine Reservoir Molecule Obtained

NIST Commissions Medical and Industrial Radiation Facility 578Improved Time Scale Reliability

Mechanism of Material Removal in Machining of Ceramics 579Molecular Dynamics of Alternative RefrigerantsSecretary of Commerce Approves Digital Signature Standard as Federal InformationProcessing Standard (FIPS)

NIST and the U.S. Nuclear Regulatory Agency (NRC) Collaborate on Nuclear SafetyNew Publication Presents Proceedings of Text Retrieval Conference

Distributed Supercomputing Software Subject of New Report 580First Customer Uses New Calibration ServiceNew Thermocouple Can ‘‘Take the Heat’’Motionless Refrigerator Liquefies Natural Gas


Consortium Seeks More Predictable Paints 581NIST, Chile to Collaborate on Analytical MethodsVirtual Reality Testbed Under Way‘‘Farsighted’’ Detector Sees More Infrared

Joint Optoelectronics Agreement Now in Place 582Software ‘‘Builds’’ Process Control SystemsDemo Puts Interoperability to the TestCRADA Partners Seek Better-Behaved VAV Systems

Lunar Reflector Works Through Silver Anniversary 583NIST to Cooperate with Argentina and EcuadorNIST Data Clarifies Model for Time-Dependent Dielectric Breakdown

Uncertainties Identified for Radar Cross-Section Measurements 584Method for Assessing Accuracy of On-Wafer Microwave MeasurementsBenefits Industry in NIST Visits

Monolithic Single-Frequency Solid-State Waveguide Laser Demonstrated

NIST Software Simplifying Resistivity Determination in Demand 585First Direct Measurements Demonstrate Low-Noise Performance Potential ofHigh-Temperature Josephson Junctions

Workshop on Testing Strategies Transfers NIST Methodology to Industry forAnalogand Mixed-Signal Products

ATP and PED Sponsors Workshop on Electron Beam Modeling 586NIST Hosts Workshop on Advanced Machine Tool Structures ResearchBody Dimensions for Apparel

High-Fidelity Sensor 587Collaboration with Hungary’s National Office of MeasuresNeutron Interferometry Facility Operational

High Magnetization Advanced Magnetic Nanocomposites 588Development of New Standards for the Continuous Steel Strip IndustryImproved Accuracy in Quantitative Phase Analysis

Nondestructive Evaluation of Natural Gas Pipelines Using Gas-Coupled Ultrasonics 589Addition to NIST Proficiency Sample Facility DedicatedNIST Develops Large Building Input Files for Multizone Indoor Air Quality ModelNIST Co-Sponsors Workshop on Standards Development and the National InformationInfrastructure (NII)

Specifications of an Electronic Research Notebook for the NIST Scientific Staff Issued 590


Protein Database Now Includes NASA Experiments

Calendar 591


Contents

ArticlesTilt Effects in Optical Angle Measurements Yun H. Queen 593

Optical Characterization in Microelectronics S. Perkowitz, D. G. Seiler, 605Manufacturing and W. Duncan

Critical Issues in Scanning Electron Michael T. Postek 641Microscope Metrology

Conference ReportsQuest for Excellence VI Cheryl Parrott and 673

Robert E. Chapman

16th National Computer Security Conference Dennis Gilbert 681

Systems Integration Needs of U.S. Manufacturers S. L. Stewart and 687Ginger Pinholster

News Briefs


NIST Transfers Fabrication Technology for Josephson-JunctionVoltage Array Standards to a Private U.S. Company

NIST Demonstrates Integrated Optical Polarization Diversity Receiver

Record Result Achieved for Mixing in Superconductors Demonstrates Potential for 696Practical IR-Frequency Synthesis

NIST Transfers Near-Field Antenna Measurement TechnologyThrough Short Course

NIST/SEMATECH CollaborationNIST Temperature Control Effort

CRADA Begun on Silicon Micromachined Acoustic Sensor Technology 697New Refrigerator for Liquefying Natural GasStatistical Properties of Islands During Thin-Film Fabrication



Standard Reference Material 2582—Powdered Paint (Low-Lead Concentration)

SRM Available for Interstitial Oxygen in Silicon 720Certification of High-Purity Aluminum as Standard ReferenceMaterial 1744—a Freezing-Point Standard

NIST Develops SRM for Composite Fabrication

Standard Reference Material 2084—CMM Probe Performance Standard 721New Blubber SRM Is a Whale of a Standard!SRM Supports Measurements of Thickness of 10-Nanomeater Oxides on Silicon


CHETAH Chemical Thermodynamic and Energy Release Program UpgradedThree Databases Released for Science/IndustryNIST Database 45 Now Available from Standard Reference Data Program


International Workshop on Measurement Standards for Studies 698of Radionuclides in Oceans

Accurate Cesium Lifetime Evaluated for Parity Nonconservation TestsJoint Neutron Research With Private Company on Adsorbent-GasInteractions in Molecular Sieves

Private Company and NIST Cooperate to Improve Process Control 699in Ceramic Thin-Film Deposition

NIST Studies Ventilation Rates and Carbon Dioxide Concentrations in an Office BuildingNew Publication Reports on Second Census OpticalCharacter Recognition Systems Conference

North American Integrated Services Digital Network Users’ Forum Meets

Federal Information Processing Standard for the Spatial Data Transfer Standard Revised 700NIST Assists GSA in Rating Historic BuildingsNew Office Champions Support for NII ApplicationsGreen Building Conference Proceedings AvailableReport Maps Metric Path to Markets and Jobs

Paper Details EMF Shielding Theory 701NIST Researchers Achieve Coldest Temperature EverProposals Sought for Precision Measurement GrantsNew Center Now Serving Chicago Manufacturers

Chip Makers Prove AFM Work Is ‘‘No Small Matter’’ 702Recipe for Inexpensive Atom Trap PublishedCold Probe May Help Restore a Warm Heart

Replacements for Banned Halon 1301 Recommended 703Ultrasound May Soon Relieve ‘‘Fatigued’’ BridgesNew Facility Focuses on Improved Radiation StandardsNIST Publishes Weights and Measures Lab Directory

NIST/ANSI to Create Electronic Standards Network 704Report Issued on Use of International GuidelinesNIST Invents New Method for Semiconductor Overlay Metrology

Calculations Improve Measurements of Power-Frequency Magnetic Fields 705NIST Expertise Contributes to Goals of Inter-Service Antenna Group MeetingCALS TechnologiesApplied to the Fiber/Textile/Apparel (FTA) Industry

New Record Stored Electron Current at SURF II 706Thin-Film Growth Properties Strongly Affect Magnetic CouplingNIST Hosts Annual Meeting of the ICRU

Revised Frequency Standards for the Infrared Based on the CO2 Laser 707Magnetic Materials for High-Density Recording HeadsOrigin of the Anomalous Low-Field Giant MagnetoresistiveEffect (GMR) in Ni80Fe20/Ag Multilayers

NIST Staff Invent New Combustion Diagnostic

NIST Software Assesses Flammability of Replacement Refrigerants 708Framework for National Information Infrastructure Services DevelopedIndustry/Government Open Systems Specification PublishedFace Recognition Technology Advances


NIST Collaborates with Department of Defense on Reusable Software 709NIST Researchers in Hot Water Over Solar DeviceReport Explores NII Quality-of-Life IssuesUnited States, Korea Agree to Cooperate on Technical IssuesForecast for Sunshine? NIST Helps Track the UV Index

Papers Highlight Waveguide Lasers for Optical Fibers 710New System Helps SEMs Put Forth a Better ImageFor STEP, It’s Off to the Publisher

Plastic vs. Metal? NIST Knows for Sprinkler Piping 711Report Says Navy Needs More Optical Fiber SensorsSURF’s Up In NIST Physics Lab!NIST Leads VAMAS ‘‘Prestandards’’ Research

Testing Tool Focus of CRADA with NIST 712Future Semiconductors May Use Electrostatic ‘‘Glue’’New Converter Wins R&D 100 for CRADA PartnersDigest Highlights Recent Optical Fiber Research

Program Highlights a Giant ‘‘STEP’’ for U.S. Industry 713Special Standards Training Program for Russia/Newly Independent State ExpertsNIST Develops Method for Measuring Resistivity of Short, Fine Conducting Fibers

Models to Predict Semiconductor Device Performance Featured in Volume of 714Springer-Verlag Series on MathematicsNIST, Industry Collaboration Takes Step Toward High-TemperatureSuperconductor Josephson Array Voltage StandardNIST M3 Performs First Measurements, Achieving Sub-Nanometer AccuracyNIST Initiates ASME-Administered Panel on Thread-Gaging Issue

Monolayer Technology Used to Pattern Immobilized Avidin Protein and to Increase 715Its Biological Activity

NIST Precision Measurement Grants Awarded for FY 1995

Workshop on Quantum Computing and Communication Convened at NIST 716Calibration Services Becoming ISO/IEC Guide 25 CompliantWorkshop on Critical Issues in Air Ultraviolet Metrology Co-Sponsored by NIST

Precise Determination and Critical Evaluation of Radon Half-Life 717Nanostructured Materials via Mechanical AlloyingFirst Principles Calculation of Phase DiagramsPatent Award for Optical Sensor forPolymer Processing

Research Priorities in Materials for Total Joint Replacements 718NIST Provides Technical Support to Santa Ana, CA Fire DepartmentNew Publication Focuses on Security in Open SystemsConference Showcases National Information Infrastructure Applications

Guidance to Federal Agencies on Videoconferencing Published 719New Federal Information Processing Standard Approved


Contents

ArticlesAn Intercomparison Between NPL (India) and J. K. N. Sharma, Kamlesh IC 725NIST (USA) Pressure Standards in the Hydraulic Jain, C. D. Ehrlich, J. C. Houck,Pressure Region up to 26 MPa and D. B. Ward

Intercomparison of the ITS-90 Radiance Temperature G. Machin, B. Carol Johnson, 731Scales of the National Physical Laboratory (U.K.) and C. Gibson, and R. L. Rusbythe National Institute of Standards and Technology

Screened-Room Measurements on the NIST G. Koepke and J. Randa 737Spherical-Dipole Standard Radiator

Beamcon III, a Linearity Measurement Ambler Thompson and 751Instrument for Optical Detectors How-More Chen

Spectroscopic Study of Quantized Breakdown C. F. Lavine, M. E. Cage, and 757Voltage States of the Quantum Hall Effect R. E. Elmquist

Conference ReportsWorkshop on Critical Issues in Air Ultraviolet Ambler Thompson and 765Metrology Mitchell K. Hobish

Data Administration Management Association Judith Newton 775Symposium

North American Integrated Services Digital Elizabeth B. Lennon 777Network (ISDN) Users’ Forum (NIUF)

Compass ’94, Ninth Annual Conference on Laura M. Ippolito, Dolores R. 781Computer Assurance Wallace, and Elizabeth B. Lennon

Indexes to Volume 98Subject Index to Volume 98 801Author Index to Volume 98 805


News Briefs


ATP Makes 41 Awards in Four Focused CompetitionsThree Companies Win 1994 Baldrige Award1995 Baldrige Criteria Recommend Built-In Quality

Digital Signature Infrastructure to be Tested 788Workshop to Highlight Semiconductor CharacterizationNew Center Now Serving Massachusetts CompaniesLatest TRP Awards Fund Nine New Extension Centers

Fifteen States Receive STEP Grants from NIST 789Get to Know Voltage Arrays With New NIST PapersFebruary Meeting Highlights 1994 Baldrige WinnersForty-Seven Grants Awarded in Two Competitions

Patent Awarded forPolymer Processing Sensor 790Joint NIST/Navy Project Seeks Trustworthy SoftwareWhite Papers on High Integrity Software SoughtCommercialization of Dental Research to be Improved

GATT Standards Activities Reported for 1993 791Publication Highlights NIST/Industry SuccessesNIST-Industry Collaboration Shows New Multilayer Thin-Film Systems MeetCritical Requirements for Use in Magnetic Read-Head Sensors

Private Company Selects NIST Software as Basis for Improving 792Capabilities of Dielectric Probe Kit

NIST Laser Power and Energy Measurement Service Extendsto Ultraviolet Wavelengths With Excimer Laser Capability

Insights Gained on the Origin of Resistance in Contacts toHigh-Temperature Superconductors

Agreement With Private Company to Foster Microelectronic Packaging 793Characterization

NIST and Private Company Sign CRADA to Develop NIST-TraceableReferences

Micrometer Enters Final Test Stage

Program Established for Intercomparison of Primary Gas 794Standards With Netherlands Measurement Institute

Real-time Measurement of Metalorganic Precursors forMetalorganic Chemical Vapor Deposition Reactors

Infrared Source Based on Difference-Frequency Mixing of Laser Radiation

Metallurgy Division to Provide Modeling Effort for USCAR 795NIST Assists Industry in Rheological MeasurementsMorphologyChanges in Copolymer Films

NIST Workshop on Improving Ventilation Evaluation 796NIST Measures Smoke from In Situ Burning of Crude Oil EmulsionsComputer Security Conference Attracts Large TurnoutNIST Assists ANSI Standards Panel


NIST Establishes Distributed Center of Excellence 797Report Focuses on Software Technology Requirements of U.S. IndustryNIST Sponsors Training for Federal Agencies on Internet Security


New Precision Artifact Helps CMMs Measure Up

Standard Reference Materials 2286 through 2293—Oxygenates in Gasoline 798Standard Reference Material 1570a—Trace Elements in Spinach Leaves

Calendar 799


Contents

ArticlesPreparation and Calibration of Carrier-Free R. Colle, Zhichao Lin, F. J. 1

209Po Solution Standards Schima, P. A. Hodge, J. W. L.Thomas, J. M. R. Hutchinson,and B. M. Coursey

Spectral Radiance of a Large-Area James H. Walker and 37Integrating Sphere Source Ambler Thompson

Deposition of Diamond Films in a Closed Hot Guan-Ren Lai, E. N. Farabaugh, 43Filament CVD System A. Feldman, and L. H. Robins

Variances in the Measurement of Ceramic Powder R. G. Munro, S. G. Malghan, 51Properties and S. M. Hsu

On the Applications of Discontinuous Bessel Integrals William T. Yap, and 61to Chronoamperometry Richard A. Durst

Conference ReportsThird International Conference on Information and Elizabeth Fong, Shirley Hurwitz, 67

Knowledge Management (CIKM-94) and Yelena Yesha

Federal Wireless Users’ Forum Workshop Mary K. Ruhl and 71Tish Antonishek

Workshop on Water: Its Measurement Stuart A. Tison and 75and Control in Vacuum J. Patrick Looney

Application Portability Profile and Open System Joseph Hungate 83Environment Users’ Forum

News Briefs


ATP Sets Six New Focus Areas for 1995Russia, NIS Experts Offered U.S. Standards TrainingUnited States, Indonesia to Harmonize Standards

Group Seeks Improved Semiconductor Competitiveness 94Open Systems Workshop Plans Four 1995 SessionsNanostructured Materials Workshop Report AvailableEnergy-Related Inventions Program Makes Recommendations


SNS Junction Breakthrough for Array Standards 95Sampling Comparator System Errors Reduced

Growing Importance of Polarization Measurements Reflected 96in Optical Fiber Measurements Symposium

NIST, University of Maryland Establish a Collaboration toDevelop and Calibrate Atomic Step Heights

ISO Meeting on Machine Tools Co-Sponsored by NIST

CAALS Develops a Communication Specification for 97Instrument-to-Controller Messaging

New Program Established with AIGER to Support ‘‘Clean Cars’’NIST Hosts Workshop Focused on QA for Vitamin Measurements

Japan and United States Begin Comparison of Temperature Scales 98Measurement Uncertainty—1994 Edition of TN 1297Solder Jet Printing for Microelectronics Applications

Method Developed for Process Monitoring of thePolymer 99Precursors for Ceramic Matrix Composites

Polycrystalline Bi2Te3 Thermoelectric Elements for RefrigerationNIST Develops Helicopter Package to Measure Smoke from Large Outdoor Fires

NIST Establishes Center for High Integrity Software Systems Assurance 100New Publication Presents Results of Flat Panel Displays (FPDs) WorkshopNIST Measures Fields in Full-Scale Aircraft in Shielding Effectiveness Study

NIST Investigates Python Programming Language 101New Symposium Developed at ASME International CongressNIST/IEEE Co-Sponsored Smart Sensor Workshop

New Special Test Service Approved at NIST 102Chemically Specific Response Patterns from Temperature-Programmed Gas SensorsNIST Delivers Leak Standard and Calibration System to the NavyCharacterization of HFCs and Solid Acid Catalysts by Prompt Gamma-RayActivation Analysis

Feasibility Studies for On-Line Recycling Aluminum Alloy Sorting Using Prompt 103Gamma-Ray Activation Analysis

U.S./Canada/Mexico Quality Assurance (QA) Program for Aquatic and AtmosphericEnvironmental Chemical Measurements

Workshop Held on the Chemical Analysis of Auto Catalysts 104EBIT Discovers ‘‘Forbidden’’ LightMultiagency Solar Ultraviolet Intercomparison Held

Council on Ionizing Radiation Measurements and Standards Meets at NIST 105Magnetoresistance Exceeds 20 % in Symmetric Spin ValvesFuture Needs in Electronic Packaging and Interconnection

NIH/NIST Biomolecular Dynamics Workshop 106First CD-ROM of NIST Fire Publications


Second Year Results for Study of Fire Detector Siting for Complex Ceilings 107NIST Supports ACI Laboratory Technician Certification ProgramSecretary of Commerce Approves Federal Information Processing Standard (FIPS) forthe Government Information Locator Service

New Publication Focuses on Electronic CommerceNIST Initial Graphics Exchange Specification (IGES) Test Service

Internet Firewalls the Subject of New Publication 108Tests of Magnetic Storage Materials Show PromiseReport Says Federal Program Helping Inventors

United States, India Agree to Mutually Recognize Labs 109Barriers to NII Highlighted in New ReportWeights and Measures Devices Handbook UpdatedNew Program Goal: Help Manufacturers Work Cleaner

Report Details NIST Work in Supercritical Fluids 110Handbook for Alternative Refrigerants Available


Oxygenates in Gasoline Standard Reference Materials (SRMs)

Standard Reference Material 1511—Multi-Drugs of Abuse in Freeze-Dried Urine 111Standard Makes Spinach More Palatable to Industry


Contents

ArticlesLow-Temperature Properties of Silver David R. Smith and 119

F. R. Fickett

Mixing Plate-Like and Rod-Like Molecules Edmund A. Di Marzio, 173With Solvent: A Test of Flory-Huggins Arthur J.-M. Yang, andLattice Statistics Sharon C. Glotzer

News Briefs


NIST Issues Standards for Cleaner GasolinesU.S. Broker Chosen for Joint Effort with JapanLaser Measurements Now Ultraprecise in Ultraviolet

NIST Physics Data Now at Your Fingertips 188Enhanced Frequency Calibrations OfferedConsortium Report: How Elbows Affect MeasurementsTwo Bibliographies of EM Metrology PublishedNIST Guide on Measurement Uncertainty Available

Video Features 1994 Baldrige Award Winners 189NIST Briefs Interagency Group on New ProgramLaboratory AccreditationEnergy-Related Inventions Program Recommendations

Special Tests Support New Trend in Industry’s Use of Transfer Standards 190Magnetic Calibration Facility Completed for Navy Primary Standards Laboratory

Gaseous Electronics Conference Draws Attendees from Around the World 191Display Materials Consortium WorkshopSurging the Upside-Down House: Bringing Together Theory and Reality

for More Reliable Electronic Appliances

Load Cell Testing: OILM R60 192NIST and Private Company Establish a Joint Process Planning Integration R&D EffortISO Technical Committee 201 on Surface Chemical Analysis Meets

Careful Re-Evaluation Leads to New Radioactivity Standard 193Process Control for Manufacture ofPolymer CompositesResonantly Amplified Neutron Waves in Thin-Film Resonators and Their Applications


NIST Delineates Effectiveness of Fine Water Sprays as Fire Suppressants 194NIST Models Bubble Formation in Burning MaterialsConstruction and Building Industries Express NeedsNIST Completes Refrigeration Cycle Simulation Model

NIST Sponsors Meeting on Cryptographic Applications Program Interfaces 195Computer Security Guidance IssuedGuidance on OSE Procurements PublishedNIST Hosts Lecture on Information Definition (IDEF) Methods in an

Object Oriented WorldNIST Collaborates with Drug Enforcement Administration (DEA) on Multi-Agency

Certification and AccreditationGAMS Sees Increasing Recognition, Usage

Improved Enzyme Not a ‘‘Wash Out’’ Fighting Stains 196Nature Shares Data Storage Scheme with ScientistsNew Paper Features Usefulness of Crystal ‘‘Disorder’’Private Company, NIST Team to Create Parallel Computing Software

MOIST Software Validated in Lab Tests 197What Can Cold Air Do? New Model Tells AllTechnology Partnership Completes Successful TermNew Report Catalogs Frozen Marine Tissues

Energy-Related Inventions Program Recommendations 198NIST EMI/EMC Metrology Workshop Focuses Industry on Roadmap IssuesNIST Scientist Chairs International Working Group on Humidity Measurement

Control Strategy for Toxic Metal Emissions 199NIST Hosts Telepresence Microscopy Working GroupNIST Scientists Collaborate with SEMATECH to Study Contamination on Silicon Wafers

Observation of Large Magnetic Domains in Magnetoresistive Granular Metals 200Accelerated Aging of Silk by Gamma Rays and ElectronsNoncollinear Spin Structures in Fe25Co75/Mn Superlattices

Ultrahigh Sensitivity Hard-Drive Read Head 201Model for Cyclic Fatigue of Lead Zirconate TitanateDeveloping a Worldwide Consensus on Building Performance Fire StandardsNIST Measures Smoke and Radiation from Forced-Ventilated Large Outdoor Fires

Computer Program Developed for Predicting Service Life of Concrete Vaults for 202Disposal of Low-Level Radioactive Wastes

Updated BLCC Program ReleasedNIST Conducts First Successful Non-Line-of-Sight Survey Experiment

NIST Hosts Post-Earthquake Fire and Lifeline Workshop 203NIST ‘‘Commissions’’ the Air Quality in a New Office BuildingNIST Collaborates with the National Aeronautics and Space Administration

(NASA) to Improve Software EngineeringNIST Collaborates with the Electronics and Telecommunications Research Institute,

Republic of Korea, on Broadband ISDN


Framework for High Integrity Software Issued 204NIST Joins Forces with the National Archives and Records Administration on Electronic

Access to InformationNew Publication Focuses on Analytical Methods for the Analysis of Cancer

Chemopreventive Agents


Standard Reference Materials 3198 and 3199—Electrolytic ConductivityStandard Helps Analyze What’s ‘‘Down By the Bay’’

Standard Reference Material 2781—Domestic Sludge 205Standard Reference Material 930e—Glass Filters for SpectrophotometryRound-Robin Results Confirm Need for Optical Fiber Connector SRM


Chemical Kinetics Database for PC Users ExpandedNIST/EPA/NIH Mass Spectral Database/Microsoft Windows Released

Calendar 207


Contents

ArticlesDetermining the Magnetic Propearties of Richard S. Davis 209

1 kg Mass Standards

1993 Intercomparison of Photometric Units Maintained Yoshihiro Ohno and 227at NIST (USA) and PTB (Germany) Georg Sauter

Determination of the Transmittance Uniformity of J. C. Travis, N. K. Winchester, 241Optical Filter Standard Reference Materials and M. V. Smith

Low-Frequency Model for Radio-Frequency Absorbers J. Randa 257

Using Quantized Breakdown Voltage Signals to Determine M. E. Cage and 269the Maximum Electric Fields in a Quantum Hall C. F. LavineEffect Sample

High Accuracy Measurement of Aperture Area Relative Joel B. Fowler and 277to a Standard Known Aperture Gyula Dezsi

Letter to the Editor: New IUPAC Guidelines for the Tyler B. Coplen 285Reporting of Stable Hydrogen, Carbon, and OxygenIsotope-Ratio Data

Conference ReportsQuest for Excellence VII Cap Frank and 287

Robert E. Chapman

17th National Computer Security Conference Dennis Gilbert 301

News Briefs


Consortium to Evaluate Tape-Bonded Seams for RoofsUltra-Sensitive Assay Available for Licensing‘‘Gray-Scale’’ Software Improves Fiber Measurements


Theory Center Workshop Grants Awarded 312NIST Handbooks 44, 130 and 133 Revised for 1995Caribbean Measurement Assurance ProgramHoldsAnnual Meeting

1995 NCWM Interim Meeting 313NIST Staff Address Grocers and Retailers on Pricing AccuracyNIST Staff Provide Technical Assistance to TV Station Investigating

School Milk and Juice Shortages

NVLAP Quality System—ISO/IEC 9001 Standard 314Atlas of Surface Structures Provides Valuable Reference ResourceEnergy-Related Inventions Program Recommendations

NIST Joins with Company to Explore New Ways of Transferring 315NIST Accuracy to Industry

Single-Electron Tunneling Electrometer Extends Null Detector CapabilitiesNIST SBIR Grant Spawns New Generation of Magneto-Optic MaterialsNIST Contributes Invited Review on Test Structures toHandbook of Critical Dimension

Metrology and Process Control

Project to Commercialize Pending Patent on Joints for Stewart Platforms Begins in 316Nano-Scale Metrology Group

ICP-MS Evaluation of Continuous-Flow Sample Preparation for the Determination ofLead in Environmental Samples

What’s New with SI?

Collaboration on Atmospheric Radon Studies Initiated 317Automation of Primary Standards

A New Timing Distribution Amplifier 318N2O LaserRaman Cooling of Stored IonsPhotonic FilmsImproved Manufacturability of Read Head Sensor Films

Thermophysical Properties of Aerospace Alloys 319Wavelets Permit Automation of Fiber Composite Fragmentation TestsMechanistic Study of Super Fire Suppressant Begins

NIST Studies Suppressant Performance in High-Speed, Turbulent Flames 320NIST Develops New Tomographic Method for Turbulent Flow FieldsBuilding Science Series Documents Validation of MOISTNIST Measures Indoor PAH Emissions from Woodstoves

Predicting the Service Life of Coatings Systems 321NIST Collaborates With a Company, on Interoperability of Object Database

Management SystemsNIST Issues Guidance on Asynchronous Transfer Mode (ATM) TechnologySoftware Reuse Terms PublishedOpen System Environment Implementors’ Workshop (OIW)HoldsQuarterly Meeting


New Report Addresses Security Concerns on the Public Switched Network (PSN) 322Federal Information Processing Standard (FIPS) for SQL Environments ApprovedStatistics Handbook and Toolkit Undertaken by SEMATECH and NISTCode Compliance Is Now Cause for ‘‘ALARM’’

Bulletin Makes SATAN Software Less Bedeviling 323New TEM Helps Make the Complex(es) SimpleLooking for Stress? New Ultrasound Mapping DoesComputer Models Contaminant Flow in Large Buildings

Forty-Seven Apply for 1995 Baldrige Quality Award 324Radioactive Waste Can Be Stored With ‘‘4SIGHT’’Neutron Lifetimes Provide Clues on Universe’s OriginMetrology for theAmericas Becomes a Reality

New Diode Laser Has Researchers Glad for the ‘‘Blues’’ 325High Power Lasers Focus of Fall MeetingNIST Takes World’s Lowest Temperature Even LowerProposals Sought for STEP Manufacturing Grants

NIST, NSF Launch New Chemistry Fellowships 326


SRM 2090 Prototype Samples Provided to Industry as a Research MaterialNew SRM Program Catalog Available in May

Calendar


ContentsThe Gaseous Electronics Conference Radio-Frequency Reference Cell

Preface

ArticlesThe Gaseous Electronics Conference RF Reference Cell— J. K. Olthoff and 327

An Introduction K. E. Greenberg

Current and Voltage Measurements in the Gaseous Mark A. Sobolewski 341Electronics Conference RF Reference Cell

Optical Emission Spectroscopy on the Gaseous Electronics J. R. Roberts 353Conference RF Reference Cell

Optical Diagnostics in the Gaseous Electronics Conference G. A. Hebner and 373RF Reference Cell Kenneth E. Greenberg

Studies of Ion Kinetic-Energy Distributions in the Gaseous J. K. Olthoff, R. J. Van Brunt, 383Electronics Conference RF Reference Cell and S. B. Radovanov

Microwave Diagnostic Results from the Gaseous Electronics Lawrence J. Overzet 401Conference RF Reference Cell

Langmuir Probe Measurements in the Gaseous Electronics M. B. Hopkins 415Conference RF Reference Cell

An Inductively Coupled Plasma Source for the Gaseous Paul A. Miller, Gregory A. 427Electronics Conference RF Reference Cell Hebner, Kenneth E. Greenberg,

Paul D. Pochan, andBen P. Aragon

Reactive Ion Etching in the Gaseous Electronics Conference M. L. Brake, J. T. P. Pender, 441RF Reference Cell M. J. Buie, A. Ricci, J. Soniker,

P. D. Pochan, and P. A. Miller

Dusty Plasma Studies in the Gaseous Electronics Conference H. M. Anderson and 449RF Reference Cell S. B. Radovanov

One-Dimensional Modeling Studies of the Gaseous T. R. Govindan and 463Electronics Conference RF Reference Cell M. Meyyappan

Two-Dimensional Self-Consistent Radio Frequency Dimitris P. Lymberopoulos 473Plasma Simulations Relevant to the Gaseous and Demetre J. EconomouElectronics Conference RF Reference Cell

Conference ReportsForty-Seventh Annual Gaseous Electronics Conference Richard J. Van Brunt and 495

Jean W. Gallagher


News Briefs


New Web Site Serves as Guide to NIIPhotovoltaic Hot Water System Exceeds ExpectationsStress Measurements Assess Railroad Wheel Safety

August Conference Focuses on Diamond Applications 502Accurate Prices Goal of New NCWM ProcedureUSDA Adopts Updated Versions of Two NIST HandbooksEnergy-Related Inventions Program Recommendations

NIST Helps Company with Measurement of Pulse Energy for Inkjet Print-Heads 503Bioelectrical Impedance Analyzers StudiedPartial Discharge Measurement Laboratory Established

NIST Facilitates International Workshop on Ultra-Shallow Profiles in Semiconductors 504NIST Testing Machining Centers for IndustryNIST and Private Company Collaborate in Presenting the Practical Application of

Scanned Probe MicroscopyNIST’S Participation in the Newly Launched Apparel Research Network Program

X-Ray Spectrometry in Electron Beam Instruments 505New Publication Focuses on Analytical Methods for Cancer Chemopreventive AgentsWorkshop on the ‘‘Treatment of Gaseous Emissions via Plasma Technology’’

Hosted by NISTNIST Parallel Applications Development Environment (PADE) Released

Nanodetector Produces First Images 506CRADA Signed with Private Company to Share Parallel Computing SoftwareNIST and the Council on Ionizing Radiation Measurements and Standards Host

Workshop on Radiation ProtectionPhotonic Films

Workshop on Materials Property Measurements 507X-Ray Diffraction Imaging of ZnSe Substrates for Blue-Green LEDsThermal Barrier Coatings WorkshopNIST Work Featured at Automotive Conference

Thermal Behavior ofPolymer Ultrathin Films 508Thermal Diffusivity Measurements in Multilayer Thermal Barrier CoatingsNSF Renews Support for the Center for High Resolution Neutron Scattering

NIST Develops New Method for Measuring Refrigerant Flammability 509NIST Participates in Development of Remote Database Access StandardSecretary of Commerce Approves Federal Information Processing Standard (FIPS) for

Document Application Profile

New Publication Looks at Object-Oriented Technology 510Information Security Training Attracts Large Federal AudienceNVCASE Public Workshop HeldCalibration AccreditationCryptographic Module Validation


Patent Issued on the Application of Arrays of Miniature Hotplates to Materials Processing 511Latest Gage Block Calibration System at NISTNIST Asserts New Approach to Unifying Rockwell Hardness Standards

First Technical Meeting of Computer-Aided Manufacturing Forum Held 512International Comparison of Humidity Standards at NISTSynthesis and In Situ Characterization of Superparamagnetic Nanocomposites from

Vapor Phase Condensation in a Flame

Computational Thermochemistry of SixHyOz Reactions 513Role of Radiocarbon Measurement Technology in Meeting Urban Air Quality StandardsEighth Annual Workshop on Secondary Ion Mass Spectrometry

Workshop on Infrared Microspectroscopy With Synchrotron Radiation Sources 514Ocean Radiometry Workshop at NISTCRADA Investigates Radiation Engineering for Environmental Cleanup

NIST Assists Industry in Thermoplastics Engineering Design 515Method Developed to Measure Material Density at SurfacesMicromagnetic Modeling Workshop

NIST Researchers Receive Patent for a Welding Control System 516NIST Hosts Joint Meeting with NSF Center for Science and Technology of Advanced

Cement-Based MaterialsNIST Models Radon Transport in Large Multizone BuildingsFault Detection and Diagnosis Using Artificial Neural Networks

Proceedings of Text Retrieval Conference Published 517New Publication Gives Blueprint for Electronic Access to Historical InformationReport Details Benefits of Electronic WorkshopCommerce, Energy Join Forces to Aid Manufacturers

First Full-Scale Fire Tests for High Ceilings Done 518Distribution Amplifiers Yield Low Noise, High Isolation


SRM 2391—PCR-Based DNA Profiling Standard

Eight Thousand Series RMs for Fine Gold, Fine Silver, and Gold Bullion from the Royal 519Canadian Mint (RCM)

SRM 1632b, 1635 Trace Elements in CoalSRM 656—Silicon Nitride Powders for Quantitative Analysis by Powder Diffraction

NIST Issues Radiopharmaceutical SRM for Health Care Providers 520NIST Sets Standard for Domestic Sludge


Contents

ArticlesLow Electrolytic Conductivity Standards Yung Chi Wu and Paula A. 521

Berezansky

Potential and Current Distributions Calculated Across a M. E. Cage and 529Quantum Hall Effect Sample at Low and High Currents C. F. Lavine

Microform Calibration Uncertainties of Rockwell J. F. Song, F. F. Rudder, Jr., 543Diamond Indenters T. V. Vorburger, and J. H. Smith

Performance Measures for Geometric Fitting in the NIST Theodore H. Hopp and 563Algorithm Testing and Evaluation Program for Mark S. LevensonCoordinate Measurement Systems

A Study on the Reuse of Plastic Concrete Using Extended Colin Lobo, William F. Guthrie, 575Set-Retarding Admixtures and Raghu Kacker

A Third Generation Water Bath Based Blackbody Source Joel B. Fowler 591

Conference ReportsCOMPASS ’95 Tenth Annual Conference on Bonnie P. Danner, Laura M. 601

Computer Assurance Ippolito, and Dolores R. Wallace

News Briefs


New State of Matter Seen Near Absolute ZeroPublication Details Methods for Measuring VitaminsProjects Provide Environmental Tech InfoNew Guide Simplifies International System of Units


Energy-Related Inventions Program Recommendations 608NIST Scientist Named Convener for New IEC Working Group on Low-Frequency Magnetic

and Electric Field MeasurementOn-Wafer Calibration Method Compensates for Substrate Permittivity

High-Temperature Superconducting Millimeter-Wave Oscillator Demonstrated 609Report Considers Effects of Polarization Uncertainty on RCS MeasurementsNIST Provides Measurement Support Needed by Satellite Communications Industry

NIST Helps Define Electrical Measurements Needed for International Trade 610NIST Leading Effort to Unify Rockwell Hardness StandardsNew Axis Representation for Geometric FittingInternational Comparison of Temperature Standards at NIST

Isotope Effects Discovered in the Formation of Combustion Aerosol with 611Implications for Climate Change

NIST Hosts Forum on Clinical Instrument-to-CLIMS CommunicationWorkshop on Radionuclide Speciation in Soils and Sediments

In situ Scanning Tunneling Microscopy Studies of the Electrode-Electrolyte Interface 612NIST Develops CRADA to Reduce Weld SpatterWorkshop on Instrumented IndentationNIST Workshop Outlines Direction for Research on Durability of Orthopaedic Devices

BACnet Interoperability Testing Achieves Promising Results 613Analysis of High Bay Hangar Facilities for Detector Sensitivity and Placement

New Publication Describes Self-Monitoring Accounting Systems 614North American Integrated Services Digital Network (ISDN) Users’ Forum (NIUF) MeetsNIST Issues Evaluation Guidelines for X.500 Directory ProductsElectronic Data Interchange (EDI) Standards ComparedSBus MultiKron Interface Board Subject of New Report

Database Puts New Spin on Refrigeration Cycles 615NIST, ANSI Pact Strengthens U.S. Standards SystemNew Sensor Gets Crackin’ on Detecting FlawsPollutants in Marine Mammals Subject of ReportResearchers Crack Open ‘‘Gate’’ to Faster Computing

G-7 Project Helps Smaller Businesses in Global Market 616NIST Handbook 150-11, Electromagnetic Compatibility and

Telecommunications—FCC MethodsAccomplishments of U.S./Saudi Arabia Standards Cooperation Program

Energy-Related Inventions Program Recommendations 617NIST Standard Spherical Dipole Radiator Commercialized with NIST HelpLarge SNS Junction Arrays Demonstrated for Programmable Voltage Standard Development

NIST Voltage-Tunable Josephson Oscillator Sets New Power Record 618Measurements on Mesoscopic Resistors Advance Understanding of

Low-Temperature Noise PhenomenaNIST Fabricates ‘‘Perfect’’ Mirrors for Microwave SpectrometerProbing the Foundations of Physics—One Atom at a Time


New Method to Polarize Neutron Beams 619Blue Diode LasersObservation of Laser Oscillation Without Population Inversion

Improved Photovoltaic Films for Electricity Production 620Sublimation Dynamics from Molecular Thin FilmsSolder Interconnect Design Workshop at NISTElectroacoustic Characterization of Ceramic Powder Suspensions for Process Control

NIST Hosts Workshop onPolymer Composites for Use in the Next Generation Vehicles 621Dendrite Growth Model for Aircraft Engine ComponentsDigital Signature Algorithm Approved as an Industry StandardNew Publication Describes the Center for High Integrity Software System Assurance (CHISSA)

NIST Assists Advanced Research Projects Agency (ARPA) in Evaluating 622Persistent Object Bases

New Report Focuses on Environment Integration RequirementsNIST, Auto Makers Team Up for Lower EmissionsNew Web Site Profiles ISDN

Group Examines Optical Tape Data Storage Standards 623New Microlithography Method May Help Shrink ChipsLaser Lens Draws Nanodots On SiliconManufacturer Gets Remineralization License

Neutron Focusing Lens Honored with R&D 100 Award 624NIST, Partners Provide Math Aid to DesignersUnited States, Canada Mutually Recognize Testing LabsComprehensive Guide to Time and Frequency Data Issued


SRM 1643d—Trace Elements in Water

SRM 2567—Lubricant Oxidation Catalyst 625


In Print and On-Line 1995-1996 SRDP Products Catalog Available

Calendar 627


Contents

ArticlesCalibration of Electret-Based Integral Radon Monitors R. Colle, P. Kotrappa, and 629

Using NISTPolyethylene-Encapsulated226Ra/222Rn J. M. R. HutchinsonEmanation (PERE) Standards

Microstructural Characterization of Cobalt-Tungsten N. S. Wheeler 641Coated Graphite Fibers

On Using Collocation in Three Dimensions and J. F. Marchiando 661Solving a Model Semiconductor Problem

Precision Tests of a Quantum Hall Effect Device A. Jeffery, R. E. Elmquist, and 677DC Equivalent Circuit Using Double-Series M. E. Cageand Triple-Series Connections

Analysis of the (5d 2+5d6s) – 5d6p Transition Arrays of G. J. van het Hof, Y. N. Joshi, 687OsVII and IrVIII , and the 6s 2S – 6p 2P J. F. Wyart, and J. SugarTransitions of IrIX

Conference ReportsApplication Portability Profile and Open System Joseph I. Hungate, Martha M. Gray, 699

Environment User’s Forum and Kathleen A. Liburdy

International Workshop on Semiconductor Characterization: D. G. Seiler and 711Present Status and Future Needs T. J. Shaffner

MetrologyIssues in Terahertz Physics and Technology Raju Datla, Erich Grossman, 717and Mitchell K. Hobish

Indexes to Volume 100

Subject Index to Volume 100 753Author Index to Volume 100 757


News Briefs


NIST Sponsors Seminar on Standards InformationNIST Collaborative Research Promotes Improvements in Semiconductor Device Reliability

NIST Work Illuminates Long-Term Stability Issues for Bragg Reflection Gratings 726Produced in Hydrogen-Loaded Fiber

Display Round-Robin Experiment CompletedNIST-Led Team Succeeds in Registering IGES as an Internet MIME Type

Handbook by Software Company Incorporates NIST Work 727NIST/SEMATECH CIM Application Framework Report PublishedPrecision Engineering Seminars Now Offered for Recertification CreditsEnhanced Machine Controller Technology TransferArchitects’ Roundtable

50th Calorimetry Conference Held at NIST 728New Form of Lithography Uses Neutral Atom BeamsNIST Hosts Workshop on Advances in Biomedical ApplicationsNIST Measures Fracture Toughness for Nuclear Reactor Pressure Vessels

NIST and the University of Pennsylvania Form CRADA to Study Biomolecular Structure 729Application of Real-Time Imaging to the Characterization of Thin Film Deposition ProcessesChemically Assisted Machining of CeramicsElectron Channeling Contrast Imaging of Crystal Defects in the Scanning Electron Microscope

Cement Testing Laboratories Recognized by ASTM 730NIST Signs CRADA with AIChEInvited Survey on Optimization PublishedCASE Tool to Assist Evaluation of High-Integrity Software Developed by NIST

Handprint Recognition Research Advances 731CRADA Goal: Predicting Space Radiation EffectsHeat Pump Modification Yields Power SavingsNIST Documents Its GATT Activities for 1994

Partners Look at Ultrasound Use in Power Plants 732Installation Effects Documented in New ReportFive Get Site Visits for Health and Education PilotsNIST Issues Update of Inventions Catalog

Paper Examines Mechanics of Electronic Packaging 733Technical Activities Report AvailableArmstrong, Corning Divisions Win 1995 Baldrige AwardMore Accurate Pricing ‘‘in Store’’ for ConsumersAdvance Made in Voltage Standards

Videos Help With Energy Conservation Decisions 734NVLAP Publishes Three New HandbooksEnergy-Related Inventions Program Recommendations


NIST Measurements Identify Critical Problem, Solution, for Remaining U.S. Manufacturer of 735Electroluminescent Flat-Panel Displays

NIST Advances Toward SIA Roadmap Goal Through Achieving Resolution of 30 nm inScanning Capacitance Microscopy Images

NIST Provides Key Independent Technical Evaluation for U.S. Ultra-High-Purity 736Silicon Program

NIST Report on Implications of Greenhouse Warming from Major SF6 Use in ElectricPower Industry Attracts Worldwide Interest

NIST Fabricates First High-Temperature SNS Josephson Junctions on Silicon Wafers

NIST Applies Expertise in Electrical Discharges to Prepare Report for Lightning 737Protection Community

Workshop on Modeling Electron Beam Specimen InteractionsNew Luminous Flux Scale for the Lighting Industry

Reference Lasers for Length Control 738NIST ResearchersHold Tutorial on ‘‘Small Angle Scattering: Structure on the Nanometer Scale’’NIST-Industry Group Advances Electronic Packaging Materials Metrology

NIST/Russian Scientists Develop Program to Measure Magnetic Domain Structure 739Summer School on Neutron ScatteringLaser-Induced Incandescence Measurements in Diffusion Flames

NIST Hosts Workshops for Industry on Key Escrow Issues 740Solution Technologies forImproving Software Products Subject of NIST WorkshopNew Publication Focuses on Network Application Programming Interfaces (APIs)NIST Develops Classification Automation System for FingerprintsBEES to Offer Tips to BuildersConferees Say It’s Easy for Buildings to Be Green

Learn New Rules for Improving ‘‘Noise’’ 741Composite Materials Workshop Proceedings AvailablePublications Highlight FY 1994 Neutron Research

SABIT Training 742NIST and ANSI Co-Chair Successful U.S. Celebration of World Standards DayLaboratory Accreditation ForumThree Officials from Mexico’s National Standards Body Visit NIST

Flash Point Reference Materials Developed 743Energy-Related Inventions Program RecommendationsNIST Leads Revision of Reliability Standards for Improved Measurements

NIST-Developed Tutorial on Microelectronic Packaging Measurements Attracts Industry Interest 744Japanese and Chinese Researchers Support NIST’s Approach to Unifying

the International Rockwell C Hardness ScalesDepartment of Veterans Affairs Awards Commendations

Enhanced Machine Controller (EMC) Video Completed 745NIST Joins OMGPetroleum Environmental Research Project Meeting on Toxic Combustion Byproducts Held at NISTAir Speed Proficiency Testing ProgramNIST Co-sponsors International Conference on Environmentrics and Chemometrics


Chemical Identification by Scanning Tunneling Spectroscopy 746Calculations Suggest That87Rb Was the ‘‘Right’’ Atom for the Bose-Einstein

Condensation ExperimentWorkshop Held on Calibration of IR Focal Plane Arrays and Imaging Systems

NIST Key Participants in Radiation Processing Workshop 747Improved Uncertainty for NIST-7Phase Equilibria Studies of Ceramics for Wireless CommunicationsMagnetic Domain Pattern Collapse Observed in Single Crystal Nickel Thin Films

NIST Reactor Restarted 748Statutory Invention Registration Issued for NIST X-Ray Resolution Device

NIBS Honor Award to Be Presented to NIST 749New STEP Project for Chemical Process Engineering DataNIST and Industry Deliver Information Exchange StandardInformation Security Conference Attracts Large TurnoutWorkshop Seeks Standards for Digital Mugshots

NIST Establishes New Publication Series 750


SRM 8090 Lithographic SEM Calibration StandardReference Materials for the Advanced Adsorbents Industry

Standard Aids Study of Vitamins, Cancer Prevention 751


First Database for Atomic Spectroscopy AvailableNIST Completes Property Database on High Temperature SuperconductorsNIST/NASA/CARB Crystallization Database Available On-line

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Volume 100, Number 3

Journal of Research of the

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