MARCH/APRIL 2001 13

into the giga- or terabyte realm is in-creasingly becoming a headache, somore and more installations are usinggraphical analysis to visualize largedatasets. These installations are usingthe remarkable integrative powers ofhuman vision to help spot importantfeatures and anomalies in multidimen-sional data.

Accordingly, the makers of Noesys, ahigh-end data-analysis program, haveenhanced their offering with newgraphics visualization and analysis toolsand have combined these with a simplepoint-and-click user interface (see Fig-ure 1) and access to their powerful In-teractive Data Language. I reviewedversion 2.0 for this issue, but version2.4 (with a few added features) will bereleased soon. The program is availablein two flavors: Noesys, for executingsingle-line IDL analysis commands,and Noesys+IDL, for compiling andexecuting multiline IDL files. Both ver-sions include the visualization applica-tions Transform, T3D, and Plot. Thefirst two generate 2D and 3D visualiza-tions of areas, volumes, slices, or iso-surfaces, while Plot permits the quick

generation of many types of graphs andparametric plots. Both PC and Macversions are available.

Users can import data from a widevariety of text and numeric, raster-image, and color-palette data files, inup to seven dimensions. Then, userscan convert the data into the self-describing Hierarchical Data Format,originated at the national Center forSupercomputing Applications. HDF isespecially useful for large datasets, suchas those that NASA’s Earth ObservingSystem provides. In addition, severalNoesys editors conveniently providedrag-and-drop editing between HDFobjects. The dataset and grid editorshave a spreadsheet-like interface tomultidimensional data, and the text ed-itor stores file information and executesIDL commands (one line at a time inthe normal version or entire storedIDL macros in the +IDL version).

Noesys elementsThe Plot program provides an ac-

ceptable point-and-click method formaking 2D graphs. The data-analysisand curve-fitting features in Plot were

easy to use but disappointing in thatthe uncertainties of the fitted parame-ters were not provided—a necessitywhen comparing experiments. (If youhave the +IDL version of Noesys, youcan obtain the uncertainties using theLINFIT command.) Adding a fittedline or error bars to plotted data pointsis not straightforward. You must in-voke the plot editor to “layer” addi-tional sets of points onto the graph,and then you must convert these to theline or error-bar format. Although lin-ear, exponential, and polynomial fitsare provided, the exponential fit doesnot provide a semilog graph, there isno automatic way to draw an exponen-tial or polynomial curve on a lineargraph except as a succession of linesegments, and there is no way toweight the data points. Even more un-fortunate is the fact that the exponen-tial fits are not weighted properly; theyare merely linear fits to the logarithmof the ordinate, so the fitted parame-ters are nowhere near the optimumvalues. Noesys shares this error withseveral other commercial data-analysisprograms, and, as with those, I cannotrecommend the Noesys Plot program’scurve-fitting options.

The Transform and T3D programsare much more valuable (see Figure 2).They provide the means for makingsurface, contour, and raster maps usingmany types of grids, including at least adozen map projections. A few of these

Editors: Donald L. Shirer, donald.shirer@yale.eduDouglas Tougaw, doug.tougaw@valpo.edu

T E C H N O L O G Y N E W S & R E V I E W S

NOESYS ADDS POWERFUL GRAPHICS ANALYSIS TOOLSBy Donald L. Shirer

N OWADAYS, BOTH RESEARCHERS AND TECHNICAL MAN-

AGERS ARE OVERWHELMED BY THE MASS OF INFORMA-

TION POURING FROM COMPUTERIZED DATA-RETRIEVAL SYSTEMS

AND AUTOMATED EXPERIMENTS. DEALING WITH FILES REACHING

14 COMPUTING IN SCIENCE & ENGINEERING

(Goode Homolosine, Lambert EqualArea, and so forth) seem available onlyon the Windows version, so I recom-mend that platform if you have globaldata such as weathermaps or satellite

images to process. Three-dimensionalviews can be rotated, sized, and assignedcolors from several palettes for easier vi-sual interpretation, and the grid editormakes it easy to extract slices from mul-

tidimensional data sets for graphing.T3D can also create animations show-ing successive slices through a volume.

IDLThe basic IDL commands include

simple algebraic functions (SIN, COSH,EXP, SQRT), logical operations (LT,XOR), fundamental data operations(SHIFT, SIZE), commands to generateor modify arrays (UNITARR, TRANSPOSE,ROTATE) output commands (PRINT,STRING), and many more. They oper-ate on all types of IDL objects, scalars,vectors, or arrays. You can invoke thesecommands one at a time in the basicNoesys program, or combine intomacros, compile, and execute them allat once in the Noesys+IDL program. Inaddition, the +IDL version allows ac-cess to hundreds of additional com-mands (the index alone takes up 40pages), which provide the ability to pro-gram and run applications and subrou-tines that can access essentially all of thecapabilities of Noesys, Plot, Transform,and T3D. Figure 3 shows one such pos-

T E C H N O L O G Y N E W S & R E V I E W S

Figure 2. Two views of a hydrogen atom wavefunction in Transform.

Figure 1. A typical Noesys window, showing several views into a radio map of theM81 nebula and a false-color rendering.

MARCH/APRIL 2001 15

sibility. The usual control statements(IF, FOR, GOTO) are included, and accessis provided to all the graphics routines,system variables, and I/O routines.

The programming syntax is some-what similar to Fortran or Visual Basic,but perhaps a comparison of IDL toMatlab or MathCad would be moreappropriate. It supplies the same con-venience of a programming language,built-in mathematical analysis andgraphics routines, plus the ability tohandle huge datasets. Someone famil-iar with programming in one of thesesystems would feel somewhat comfort-able with Noesys+IDL, but there aresignificant differences, especially in thedetails of handling IDL data structures.The beginner would be wise to studythe Building IDL Applications manualcarefully before starting to develop hisor her own IDL programs.

A 440-page User’s Guide and ReferenceManual provides instruction in using theNoesys system but does not cover either

the theory or practice of data analysis.Novice users will need help from otherpublications or experienced analysts.The user guide mentions only the barestessentials of the Plot, Transform, andT3D programs, but there are also onlinepdf manuals for Noesys, Plot, Trans-form, and T3D (plus a handful of addi-tional manuals for the +IDL version).The bare listing of IDL commandsbarely scratches the surface of this pow-erful language, and purchasing an addi-tional textbook on IDL for the beginnerwould be wise (see www.rsinc.com).

W ith such an extensive system, acomprehensive review would

be difficult to obtain without severalmonths experience. However, playingwith the sample datasets furnished withthe supplied demonstrations seems toconfirm the usefulness of the analysisfeatures of Noesys, Transform, andT3D. I could easily produce differenttypes of displays, take slices through 3D

objects, and manipulate the images, al-though in several cases the operationsweren’t obvious from the menus pro-vided. Digging into the manuals usuallysupplied the answer, and someone us-ing the system full time should quicklybecome accustomed to its quirks.

Noesys indeed seems to be a power-ful visualization and analysis aid, espe-cially for those working with largemultidimensional datasets or satellite-derived information. Those users in-tending to do large-scale data massag-ing should probably opt for the moreexpensive Noesys+IDL version withthe ability to compile and run completeapplications, but users should alsoschedule a good block of time to be-come familiar with its programmingfeatures.

Figure 3. An IDL application showing an H-atom wavefunction dynamically linked tothe n, l, and m quantum numbers adjusted by the sliders.

For More Information

Noesys is distributed by

Research Systems4000 Pearl East CircleBoulder, CO 80301+1 303 786 9900 (phone) noesys@rsinc.com (email)

Pricing in the US and Canada startsat $300 and runs up to $900 foracademic and commercial versionsof Noesys 2.4 (soon to be released)and $900 to $3,200 forNoesys+IDL 2.4. System require-ments are a Pentium Windows95/98/NT installation with 32Mbytes of RAM and 125 Mbytes of(typical) disk space, or a PowerMacintosh running MacOS 8.1 orhigher with 32 Mbytes of RAM and153 Mbytes of (typical) disk space.For more details and a seven-minute demo, see www.rsinc.com.

16 COMPUTING IN SCIENCE & ENGINEERING

T E C H N O L O G Y N E W S & R E V I E W S

News Briefs

Image Pro PlusAn alternate visualization and analysis system that I did not

review in depth is Image-Pro Plus 4.1 (see Figure A) from Me-dia Cybernetics (phone: +1 301 495 3305). It is advertised asproviding an easy way to acquire, process, and analyze im-ages on a single machine or across an entire network. Itcomes complete with point-and-click simplicity, an intuitiveinterface, and the ability to integrate text, data, and graphicsinto one package. A Visual Basic compatible macro languageallows for easy customization of Image-Pro Plus to meet spe-cific imaging needs. Images can be acquired from video, digital cameras, scanners, scientific instruments, image capture cards, and image databases. Sample applications atwww.mediacy.com/ippage.htm reveal similarities to Noesyscapabilities (reviewed in the main text).

3D-DoctorAnother program for 3D image visualization, volume ren-

dering, and deconvolution for scientific, medical, and engi-neering applications is 3D-Doctor 2.0 from Able Software(phone: +1 781 862 2804). Supporting most commonlyused 2D and 3D file formats, its vector-based boundaryand contour editor provides a flexible tool for image edit-ing and handling (see Figure B). An image slice alignmentfunction corrects image misalignment automatically, usingthe maximum-likelihood image-matching technique. Manyimage-processing functions are provided, and they can beextended with the 3DBasic scripting language. A Pentiumclass CPU is required with Windows NT/2000 or Windows9X. For more information or to download a demo version,see www.ablesw.com. Although most examples have a med-ical background, the system seems suitable for general visualanalysis needs.

Graphic programming system for Visual Basic

Engineers more familiar with wiring diagrams than com-puter programming might be interested in SoftWIRE 2.0, agraphical programming system from ComputerBoards. Re-leased as an add-on to Microsoft Visual Basic 6.0, it letsusers produce applications by drawing flow diagrams in-stead of files of language statements. Over 120 types of ob-

jects—representing variables, loops, I/O, Active-X controls,or entire instruments—are placed anywhere on the screenand connected by drag-and-drop “wires” in a manner simi-lar to the National Instruments LabView system (see FigureC). SoftWIRE 2.0 automatically produces required Visual Ba-sic code, and interfaces for unsupported instruments can bewritten in Visual Basic. It also has features allowing the use

Figure A. Image-Pro Plus window, showing an enlarged slice ofcell membrane.

Figure B. 3D Doctor window, showing cross section of headwith cutaway 3D view.

of advanced database, communications, and analysis func-tions. It requires a Pentium-90 (or better)-based PC with VB6.0 installed. A “starter kit” that can do everything exceptcompile executable files is available for $49. For more informa-tion, see www.computerboards.com.

Data acquisition catalogOmega Engineering has released the latest edition of its

Data Acquisition Systems Handbook and Encyclopedia. It hasover 1,200 pages of data acquisition products, including soft-ware, hardware boards, data loggers, filters, and completestandalone systems. Additional articles on data acquisition andtechnical tables make this an important reference for those in-volved in experiment or test automation. You can find a re-quest form at www.omega.com/literature.

Figure C. SoftWIRE graphics programming window, showinginstrumentation objects linked by dataflow wires.

— In fairness to all potential authors, late abstracts will not be accepted.June 5, 2001: for abstracts sent via fax or mail • June 19, 2001: for abstracts sent via the MRS Web site

Exhibit and

Inorganic Electronic Materials and Devices

A: Materials Issues in Novel Si-Based TechnologyB: Materials Science of Microelectromechanical

Systems (MEMS) Devices IVC: Ferroelectric Thin Films XD: Polarization Dynamics in Ferroic MaterialsE: Materials for High-Temperature

Superconductor TechnologiesF: SpintronicsG: Thermoelectric Materials 2001—

Research and Applications

Photonic/Optoelectronic Materials and Devices

H: Progress in Semiconductor Materials forOptoelectronic Applications

I: GaN and Related AlloysJ: Materials Engineering for Solid-State LightingK: Microphotonics–Materials, Physics, and Applications

Thin Films and Surfaces

L: Thin Films–Stresses and Mechanical Properties IXM: Surface Science and Thin-Film Growth in ElectrolytesN: Current Issues in Heteroepitaxial Growth—Stress

Relaxation and Self AssemblyO: Complex Oxide HeteroepitaxyP: Advances in Surface Engineering—Fundamentals

and Applications

Materials Science, Processing, and Evaluation

Q: Rapid Prototyping Technologies—Tissue Engineeringto Conformal Electronics

R: Electrically Based Microstructural Characterization III

S: Combinatorial and Artificial Intelligence Methodsin Materials Science

T: Statistical Mechanical Modeling in Materials ResearchU: Advanced Fibers, Plastics, Laminates, and Composites

Nanoscale Materials and Processes

V: Nanophase and Nanocomposite Materials IVW: Nanoparticulate MaterialsY: Nanopatterning—From Ultralarge-Scale Integration

to BiotechnologyZ: Making Functional Materials with NanotubesAA: Self-Assembly Processes in Materials

Organic/Biological Materials and Devices

BB: Organic Optoelectronic Materials, Processing,and Devices

CC: Advances in Liquid Crystalline Materials and Technologies

DD: Polymer Interfaces and Thin FilmsEE: Electroactive Polymers and Their Applications as

Actuators, Sensors, and Artificial MusclesFF: Physical Characterization of Biological Materials

and SystemsGG: Polymeric Biomaterials for Tissue EngineeringHH: Bio-Inspired Materials—Moving Towards Complexity

Materials and Society

II: Materials Issues in Art and Archaeology VIJJ: Scientific Basis for Nuclear Waste Management XXVKK: Design, Characteristics, and Properties of

Cementitious MaterialsX: Frontiers of Materials Research

SYMPOSIA MEETING ACTIVITIES

Symposium Tutorial ProgramAvailable only to meeting registrants, the symposiumtutorials will concentrate on new, rapidly breaking ar-eas of research.

Exhibit and Research Tools SeminarsOver 225 international exhibitors will display a fullspectrum of equipment, instrumentation, products,software, publications, and services. Research ToolsSeminars, an educational seminar series that focuseson the scientific basis and practical application ofcommercially available, state-of-the-art tools, will beheld again this fall.

Publications DeskA full display of over 700 books, plus videotapesand electronic databases, will be available at theMRS Publications Desk.

Symposium Assistant OpportunitiesGraduate students planning to attend the 2001MRS Fall Meeting are encouraged to apply for aSymposium Assistant (audio-visual assistant) posi-tion.

Employment CenterAn Employment Center for MRS meeting attendeeswill be open Tuesday through Thursday.

The 2001 MRS Fall Meeting will serve as a key forum for discussion of interdisciplinary leading-edge materials research from around the world.Various meeting formats—oral, poster, round-table, forum and workshop sessions— are offered to maximize participation.

Member ServicesMaterials Research Society

506 Keystone DriveWarrendale, PA 15086-7573

Tel 724-779-3003Fax 724-779-8313

E-mail: info@mrs.org

For additional meeting information, visit the MRS Web site at

or contact:

• Materials Development• Characterization Methods• Process Technology

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