norhayati soin 05 keee 4425 week 6/2 8/19/2005 lecture : keee 4425 week 6/2 design rules,layout and...
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Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
LECTURE : KEEE 4425
WEEK 6/2
DESIGN RULES,LAYOUT AND STICK DIAGRAM
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
SYSTEM
GATE
CIRCUIT
VoutVin
CIRCUIT
VoutVin
MODULE
+
DEVICE
n+S D
n+
G
Review: Design Abstraction Levels
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Summary of VLSI Components
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
CMOS Mask Layers
P substrate
wafer
n well
• Determine placement of layout objects
• Color coding specifies layers
• Layout objects:
– Rectangles
– Polygons
– Arbitrary shapes
• Grid types
– Absolute (“micron”)
– Scaleable (“lambda”)
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Mask Generation
• Mask Design using Layout Editor
– user specifies layout objects on different layers
– output: layout file
• Pattern Generator
– Reads layout file
– Generates enlarged master image of each mask layer
– Image printed on glass
• Step & repeat camera
– Reduces & copies image onto mask
– One copy for each die on wafer
– Note importance of mask alignment
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Symbolic Mask Layers
• Key idea: – Reduce layers to those that describe design– Generate physical layers as needed
• Magic Layout Editor: "Abstract Layers”– metal1 (blue) - 1st layer metal (equiv. to physical layer)– Poly (red) - polysilicon (equivalent to physical layer)– ndiff (green) - n diffusion (combination of active, nselect)– ntranistor (green/red crosshatch) - combined poly, ndiff– pdiff (brown) - p diffusion (combination of active, pselect)– ptransistor (brown/red crosshatch) - combined poly, pdiff– contacts: combine layers, cut mask
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
About Magic
• Scalable Grid for Scalable Design Rules– Grid distance: lambda)– Value is process-dependent:
= 0.5 X minimum transistor length
• Painting metaphor– Paint squares on grid for each mask layer– Layers to interact to form components (e.g.
transistors)
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Mask Layers in Magic
• Poly (red)
• N Diffusion (green)
• P Diffusion (brown)
• Metal (blue)
• Metal 2 (purple)
• Well (cross-hatching)
• Contacts (X)
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Magic User-Interface
Cursor
Box
Paint(poly)
Paint(pdiff)
Paint(ntransistor)
• Graphic Display Window– Cursor
– Box - specifies area to paint
• Command window (not shown)– accepts text commands:paint poly:paint red:paint ndiff:paint green:write
– prints error & status messages
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Layer Interaction in Magic
• Transistors - where poly, diffusion cross
– poly crosses ndiffusion - ntransistor
– poly crosses pdiffusion – ptransistor
• Vias - where layers connect
– Metal 1 connecting to Poly - polycontact
– Metal 1 connecting to P-Diffusion (normal) - pdc
– Metal 1 connecting to P-Diffusion (substrate contact) - psc
– Metal 1 connecting to N-Diffusion (normal) - ndc
– Metal 1 connecting to N-Diffusion (substrate contact) - nsc
– Metal 1 connecting to Metal 2 - via
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Magic Layers – Example
nwell
nsc
psc
p-transistor
ntransistor
metal1
metal1
metal1
poly
poly
ndc ndc
polycontact
polycontact
pdc
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Why we need design rules
• Masks are tooling for manufacturing.
• Manufacturing processes have inherent limitations in accuracy.
• Design rules specify geometry of masks which will provide reasonable yields.
• Design rules are determined by experience.
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Manufacturing problems
• Photoresist shrinkage, tearing.
• Variations in material deposition.
• Variations in temperature.
• Variations in oxide thickness.
• Impurities.
• Variations between lots.
• Variations across a wafer.
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Transistor problems
• Variations in threshold voltage:– oxide thickness;– ion implantation;– poly variations.
• Changes in source/drain diffusion overlap.
• Variations in substrate.
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Wiring problems
• Diffusion: changes in doping -> variations in resistance, capacitance.
• Poly, metal: variations in height, width -> variations in resistance, capacitance.
• Shorts and opens:
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Oxide problems
• Variations in height.• Lack of planarity -> step coverage.
metal 1metal 2
metal 2
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Via problems
• Via may not be cut all the way through.• Undesize via has too much resistance.• Via may be too large and create short.
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
MOSIS CMOS design rules
• Designed to scale across a wide range of technologies.
• Designed to support multiple vendors.• Designed for educational use.• Ergo, fairly conservative.
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
and design rules
is the size of a minimum feature.• Specifying particularizes the scalable rules. • Parasitics are generally not specified in units
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Design Rules
• Typical rules:
– Minumum size
– Minimum spacing
– Alignment / overlap
– Composition
– Negative features
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Types of Design Rules
• Scalable Design Rules Based on scalable “coarse grid” - (lambda)
– Idea: reduce value for each new process, but keep rules the same
• Key advantage: portable layout
• Key disadvantage: not everything scales the same
– Not used in “real life”
• Absolute Design Rules
– Based on absolute distances (e.g. 0.75µm)
– Tuned to a specific process (details usually proprietary)
– Complex, especially for deep submicron
– Layouts not portable
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
CMOS Design Rule Summary• Contacts (Vias)
– Cut size: exactly 2l X 2l
– Cut separation: minimum 2l
– Overlap: min 1l in all directions
– Magic approach: Symbolic contact layer min. size 4l X 4l
– Contacts cannot stack (i.e., metal2/metal1/poly)
• Other rules
– cut to poly must be 3l from other poly
– cut to diff must be 3l from other diff
– metal2/metal1 contact cannot be directly over poly
– negative features must be at least 2l in size
– CMP Density rules (AMI/HP subm): 15% Poly, 30% Metal
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Design Rule Checking in Magic
• Design violations displayed as error paint
• Find which rule is violated with ":drc why” Poly must overhang transistor by at least 2 (MOSIS rule #3.3)
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Aside - About MOSIS
• MOSIS - MOS Implementation Service
• Rapid-prototyping for small chips
– Multi-project chip idea - several designs on the same wafer
– Reduced mask costs per design
– Accepts layout designs via email
– Brokers fabrication by foundries (e.g. AMI, Agilent, IBM, TSMC)
– Packages chips & ships back to designers
• Our designs will use AMI 1.5µm process (more about this later)
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Aside - About MOSIS• Some Typical MOSIS Prices (from www.mosis.org)
– AMI 1.5µm “Tiny Chip” (2.2mm X 2.2mm) $1,080
– AMI 1.5µm 9.4mm X 9.7mm $17,980
– AMI 0.5µm 0-5mm2 $5,900
– TSMC 0.25µm 0-10mm2 $15,550
– TSMC 0.18µm 0-7mm2 $24,500
– TSMC 100-159mm2 $63,250 + $900 X size
• MOSIS Educational Program (what we use)
– AMI 1.5µm “Tiny Chip” (2.2mm X 2.2mm) FREE*
– AMI 0.5mm “Tiny Chip” (1.5mm X 1.5mm) FREE*
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Wires
6
3
3
3
metal 3
metal 2
metal 1
pdiff/ndiff
poly2
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Transistors
2
3
1
3 2
5
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Vias
4
1
4
2
• Types of via: metal1/diff, metal1/poly, metal1/metal2.
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Metal 3 via
• Type: metal3/metal2.
• Rules:– cut: 3 x 3– overlap by metal2: 1– minimum spacing: 3– minimum spacing to via1: 2
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Spacings
• Diffusion/diffusion: 3
• Poly/poly: 2
• Poly/diffusion: 1
• Via/via: 2
• Metal1/metal1: 3
• Metal2/metal2: 4
• Metal3/metal3: 4
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Stick diagrams
• A stick diagram is a cartoon of a layout.
• Does show all components/vias (except possibly tub ties), relative placement.
• Does not show exact placement, transistor sizes, wire lengths, wire widths, tub boundaries.
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Stick Diagrams
• Key idea: "Stick figure cartoon" of a layout
• Useful for planning layout– relative placement of transistors– assignment of signals to layers – connections between cells– cell hierarchy
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Stick Diagrams
Metal (BLUE)
Polysilicion (RED )
N-Diffusion (Green)
P-Diffusion (Brown)
Contact / Via
poly
n-diff
p-diff
metal
poly n-diff p-diff metal
S N P NC
S X NC
S NC
S
Connection RulesLayers
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Example - Stick Diagrams
A B
A
B
Circuit Diagram. Pull-Down Network(The easy part!)
Alternatives - Pull-up Network
Complete Stick Diagram
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Example - Stick Diagrams
Inverter
Vdd
In
Gnd
Out
NAND Gate
Vdd
AOut
Gnd
B
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Dynamic latch stick diagram
VDD
in
VSSphiphi’
out
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Stick Diagram XOR Gate Examples
Exclusive OR Gate
Vdd
A
Out
GndB
A’ B’
A’
B’
BA’
Out
A A’
B B’
A
B’
A
B
A’
B’
A’
B
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Hierarchical Stick Diagrams
VddA
Out
Gnd
B
Vdd
Gnd
VddA
Out
Gnd
B
Vdd
Gnd
NAND
NAND CellStick Diagram
NAND CellOutline
• Define cells by outlines & use in a hierarchy to build more complex cells
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Cell Connection Schemes
• External connection - wire cells together
• Abutment - design cells to connect when adjacent
• Reflection, mirroring - use to make abutment possible
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Example: 2-input multiplexer
• First cut: Vdd
A
Out
NAND
A
B
Gnd
Vdd
Gnd
Vdd
Out
NAND
A
B
Gnd
Vdd
Gnd
Vdd
Out
NAND
A
B
Gnd
Vdd
Gnd
Vdd
Out
S
B
S’
Gnd
A
S
B
S’
OUT
OUT = A*S + B*S’
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Sticks design of multiplexer
• Start with NAND gate:
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
NAND sticks
VDD
a
VSS
out
b
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Refined one-bit Mux Design
• Use NAND cell as black box
• Arrange easy power connections
• Vertical connections for allow multiple bits
NAND
A
B
Gnd
Vdd
Gnd
Vdd
OutNAND
A
B
Gnd
Vdd
Gnd
Vdd
Out
select’ select
NAND
A
B
Gnd
Vdd
Gnd
Vdd
Out
VddAB
Gnd
Out
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Multiple-Bit Mux
select’ select
NAND
A
BGnd
Vdd
Gnd
Vdd
OutNAND
A
BGnd
Vdd
Gnd
Vdd
OutNAND
A
BGnd
Vdd
Gnd
Vdd
Out
VddA0A0
Gnd
Out0
NAND
A
BGnd
Vdd
Gnd
Vdd
OutNAND
A
BGnd
Vdd
Gnd
Vdd
OutNAND
A
BGnd
Vdd
Gnd
Vdd
Out
VddA1B1
Gnd
Out1
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Cell Mirroring, Overlap
• Use mirroring, overlap to save area
VddA0B0
Gnd
NAND
A
B
Gnd
Vdd
Gnd
Vdd
OutNAND
A
B
Gnd
Vdd
Gnd
Vdd
OutNAND
A
B
Gnd
Vdd
Gnd
Vdd
Out
B1A1
Vdd
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Example: Layout / Stick Diagram
• Create a layout for a NAND gate given constraints:
– Use minimum-size transistors
– Assume power supply lines “pass through” cell from left to right at top and bottom of cell
– Assume inputs are on left side of cell
– Assume output is on right side of cell
– Optimize cell to minimize width
– Optimize cell to minimize overall area
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Layout Example
A B
A
B
A
B
OUT
Vdd!Vdd!
Gnd! Gnd!
Circuit Diagram. Exterior of Cell
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Example - Magic Layout
• Overall Layout: 52 X 16
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Review - VLSI Levels of Abstraction
Specification(what the chip does, inputs/outputs)
Architecturemajor resources, connections
Register-Transferlogic blocks, FSMs, connections
Circuittransistors, parasitics, connections
Layoutmask layers, polygons
Logicgates, flip-flops, latches, connections
You are Here
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Levels of Abstraction - Perspective
• Right now, we’re focusing on the “low level”:– Circuit level - transistors, wires, parasitics– Layout level - mask objects
• We’ll work upward to higher levels:– Logic level - individual gates, latches, flip-flops– Register- transfer level - Verilog HDL– Behavior level - Specifications
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
The Challenge of Design
• Start: higher level (spec)
• Finish: lower level (implementation)
• Must meet design criteria and constraints
– Design time - how long did it take to ship a product?
– Performance - how fast is the clock?
– Cost - NRE + unit cost
• CAD tools - essential in modern design
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
CAD Tool Survey: Layout Design
• Layout Editors• Design Rule Checkers (DRC)• Circuit Extractors• Layout vs. Schematic (LVS)
Comparators• Automatic Layout Tools
– Layout Generators– ASIC: Place/Route for Standard Cells, Gate
Arrays
Norhayati Soin 05 KEEE 4425 WEEK 6/2 8/19/2005
Automatic layout
• Cell generators (macrocell generators) create optimized layouts for ALUs, etc.
• Standard cell/sea-of-gates layout creates layout from predesigned cells + custom routing.– Sea-of-gates allows routing over the cell.