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OMICRON Test Universe

The Concept


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Article Number: VESD4001 - Manual Version: CONC.AE.13 - Year: 2010

© OMICRON electronics. All rights reserved.

This manual is a publication of OMICRON electronics GmbH.

All rights including translation reserved. Reproduction of any kind, e.g., photocopying, microfilming, optical character recognition and/or storage in electronic data processing systems, requires the explicit consent of OMICRON electronics. Reprinting, wholly or in part, is not permitted.

The product information, specifications, and technical data embodied in this manual represent the technical status at the time of writing and are subject to change without prior notice.

We have done our best to ensure that the information given in this manual is useful, accurate and entirely reliable. However, OMICRON electronics does not assume responsibility for any inaccuracies which may be present.

The user is responsible for every application that makes use of an OMICRON product.

OMICRON electronics translates this manual from the source language English into a number of other languages. Any translation of this manual is done for local requirements, and in the event of a dispute between the English and a non-English version, the English version of this manual shall govern.

Table of Contents

Table of Contents

1 OMICRON Test Universe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7

2 The Test Universe Start Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9

2.1 Test Modules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9

2.2 Control Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10

2.3 Test Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11

2.4 Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11

2.5 Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13

2.6 Custom . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14

3 Setting up the Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15

3.1 About Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15

3.1.1 Local Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15

3.1.2 Global Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16

3.1.3 Why Test Modules Change their Reference to a Test Object . .18

3.1.4 Example of Test Objects in an OCC test document . . . . . . . . . .19

3.2 XRIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20

3.2.1 LinkToXRIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21

3.2.2 XRIO Converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22

3.3 Test Object Parameters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23

3.4 Device Settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30

4 Setting Up the Test Hardware. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35

4.1 About the Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . .36

4.1.1 What is the Hardware Configuration. . . . . . . . . . . . . . . . . . . . . .36

4.1.2 Global Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . .37

4.1.3 Local Hardware Configuration if the Test Module is Embedded in the OCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42

4.1.4 Hardware Configuration if the Test Module is Running in Stand-alone Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43

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4.2 Global and Local Hardware Configurations (Test Module Embedded in OCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46

4.3 Starting the Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . .48

4.3.1 Test Module Embedded in OCC Test Document . . . . . . . . . . . .48

4.3.2 Test Module in Stand-Alone Mode . . . . . . . . . . . . . . . . . . . . . . .49

4.4 Usage of Existing Hardware Configurations . . . . . . . . . . . . . . . . . . . . . .50

4.5 Updating the Test Hardware Information. . . . . . . . . . . . . . . . . . . . . . . . .51

4.5.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51

4.5.2 Updating when Test Module is Running Stand-Alone . . . . . . . .52

4.5.3 Updating when Test Modules Access a Global Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52

4.6 The Hardware Configuration Dialog Box . . . . . . . . . . . . . . . . . . . . . . . . .54

4.6.1 Working with the Wiring Tables in the HWC Inputs and Outputs Tabs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55

4.6.2 General Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58

4.6.3 CMC Output Configuration Details . . . . . . . . . . . . . . . . . . . . . . .61

4.6.4 Amplifier Configuration Details . . . . . . . . . . . . . . . . . . . . . . . . . .66

4.6.5 Voltage and Current Sensor Simulations . . . . . . . . . . . . . . . . . .67

4.6.6 Rogowski Current Sensor Configuration . . . . . . . . . . . . . . . . . .68

4.6.7 Low Level Outputs Configuration . . . . . . . . . . . . . . . . . . . . . . . .69

4.6.8 Analog Outputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70

4.6.9 Binary / Analog Inputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . .72

4.6.10 Binary Outputs Tab. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .74

4.6.11 DC Analog Inputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76

4.6.12 IRIG-B & GPS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77

4.7 CMB IO-7 Hardware Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .83

4.7.1 Behavior in Online Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84

4.7.2 Behavior in Offline Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84

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Table of Contents

5 The OMICRON Control Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85

5.1 Test Modules in a Test Document. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85

5.1.1 Multiple Test Modules in a Single Test Document . . . . . . . . . . .86

5.1.2 Inserting a Group into an OCC Document . . . . . . . . . . . . . . . . .86

5.1.3 LinkToXRIO for the "Activate" Flag. . . . . . . . . . . . . . . . . . . . . . .90

5.1.4 Multiple Test Objects in a Single Test Document . . . . . . . . . . . .92

5.1.5 Multiple Hardware Configurations in a Single Test Document . .92

5.1.6 Variable Information in Fields . . . . . . . . . . . . . . . . . . . . . . . . . . .92

5.2 Test Reports . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .93

5.2.1 Using a Pre-defined Test Report Form. . . . . . . . . . . . . . . . . . . .94

5.2.2 Customizing a Test Report Form . . . . . . . . . . . . . . . . . . . . . . . .95

5.2.3 The Advanced Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96

5.3 Running Tests from the OCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .98

5.3.1 Selecting Test Modules for Test . . . . . . . . . . . . . . . . . . . . . . . . .98

5.3.2 Verifying the Connected Hardware. . . . . . . . . . . . . . . . . . . . . . .98

5.3.3 The Unit Manager . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99

5.3.4 Start/Continue a Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .100

5.3.5 Stopping or Pausing a Test . . . . . . . . . . . . . . . . . . . . . . . . . . .101

5.3.6 Clearing Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101

5.3.7 Changing a Passed/Failed Test Assessment . . . . . . . . . . . . . .102

5.4 Test Document Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103

5.4.1 Page Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103

5.4.2 Paragraph Formatting. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103

5.4.3 Text Font and Colors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .104

5.4.4 Text Formatting Tool Bar . . . . . . . . . . . . . . . . . . . . . . . . . . . . .104

5.4.5 Headers, Footers, and Page Numbers . . . . . . . . . . . . . . . . . . .104

5.4.6 Object Icons in Test Document. . . . . . . . . . . . . . . . . . . . . . . . .105

5.5 Exporting Data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .106

5.6 Protection Levels for Test Documents. . . . . . . . . . . . . . . . . . . . . . . . . .107

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5.7 OCC Helper Module Pause . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .109

5.7.1 Inserting a Pause Module into an OCC Document. . . . . . . . . .109

5.7.2 Running a Test With Inserted Pause Module(s) . . . . . . . . . . . .110

5.8 OCC Helper Module ExeCute . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112

5.9 OCC Helper Module TextView . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112

5.9.1 Updating the text file display. . . . . . . . . . . . . . . . . . . . . . . . . . .112

5.9.2 Report View . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112

6 Time Trigger & Synchronization. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113

6.1 Synchronizing CMC Test Sets. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113

6.2 Using GPS to Synchronize CMC Test Sets. . . . . . . . . . . . . . . . . . . . . .115

6.3 Using the IRIG-B Time Reference to Synchronize CMC Test Sets. . . .117

6.4 Time Trigger Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119

6.4.1 How to configure the Time Trigger Configuration . . . . . . . . . . .119

6.4.2 Modify Pulse Data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125

File Name Extensions within OMICRON Test Universe . . . . . . . . . . . . . .127

Contact Information / Technical Support . . . . . . . . . . . . . . . . . . . . . . . . .131

Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133

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1 OMICRON Test Universe

The OMICRON Test Universe has been designed for testing protection and measurement devices by both utilities and manufacturers. It consists of state-of-the-art hardware and user-friendly Windows1-based software and provides complete flexibility and adaptability to different testing applications.

The flexibility is provided in the diverse software packages, while the adaptability is achieved in how the components of a software package can be combined and utilized.

Each software package contains a selection of function-oriented test modules. The test modules can operate stand-alone for single tests or be "embedded" with other modules into a Control Center test document (a test plan) for complete, multi-functional tests. The Control Center test document is the key to even greater flexibility and adaptability in testing.

OMICRON Control Center (OCC) manages the execution of multiple test modules as a test plan. It allows a single test document to contain all information relating to a test. This includes Hardware Configuration, Test Object, test parameters (e.g., test points, nominal data, tolerances), test results, test assessment, notes to and from tester, as well as images and data coming from other Windows applications.

Test modules can be embedded into an OCC document in order to achieve one overall procedure for testing modern multi-function protective relay systems.

When a test document is run from the OCC, the embedded test modules are automatically started. The test values are calculated and output, and the reaction of the test object is measured, assessed, and documented. The test results are output into the same test document. Test reports can easily be customized in content and style; the results are available for future processing (printing, archiving, exporting to a database).

Because an OCC test document contains all required settings and test results, it can also serve as a template for a new test. The test report can be copied, its old results cleared, the tests run again, and the new test report saved. Thus, the complete "history" of a test object can be recorded and documented.

The OMICRON Control Center uses Windows ActiveX technology. This allows the integration of OMICRON test modules into a test document as well as other ActiveX applications, such as MS Word, MS Excel, and CorelDraw documents or drawings. This achieves the maximum flexibility in test documents.

1. Windows is a US registered trademark of Microsoft Corporation.

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The Test Universe Start Page

2 The Test Universe Start Page

There are two ways to start the OMICRON Test Universe.

• From the Windows Start menu, click the Programs | OMICRON | Test Universe Start Page command.

• Double-click the Test Universe desktop icon that was created during the installation.

Both starts the OMICRON Start Page, an organizing element of the OMICRON Test Universe software. The Start Page is a window with a functionality silimar to that of a Web page.

At the top right of the Start Page, click www.omicron.at to visit the OMICRON Web site. Customers from North and South America are requested to visit www.omicronusa.com. Make sure your computer can access the Internet.

OMICRON provides an automatic update information service. If your computer has access to the Internet, and if there is an update available for your Test Universe software, Test Universe retains this information and displays an Update available message on the Start Page right below the version number. Click the message to visit the relevant OMICRON Web site for more information regarding that update. We encourage you to always keep your software up-to-date to benefit from the latest enhancements and bug fixes.

Note: Moving the cursor over any hyperlink brings up a ToolTip that summarizes the link's function. If it is a test module or test tool hyperlink, a right-click launches the component's Help.

2.1 Test Modules

Stand-alone Startup

Click any test module of your choice to create and run a stand-alone test. "Stand-alone" means, the test module starts as an individual instance rather than being embedded into an OMICRON Control Center (OCC) document (see section 2.2 ”Control Center”).

Note: Test modules without a valid license are disabled.

See also ”License Manager” on page 12...

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2.2 Control Center

Open Existing Test Document

Click to browse through your computer's folder structure for previously saved Control Center test documents. These test documents can be identified by their file name extension .occ.

See also " ”File Name Extensions within OMICRON Test Universe” on page 127"...

Open Protection Testing Library

The Protection Testing Library contains a number of XRIO Converters, relay-specific test templates (.occ files; see above) and the corresponding documentation in PDF format.

The XRIO Converters cover the main protection functions plus some relay-specific protection functions. They provide the parameter input according to the manufacturer's software. The characteristics are automatically calculated in the advanced test modules; they are based on the new relay interface by OMICRON - XRIO1.

The test templates of the Protection Testing Library are developed particularly for the work with certain relays. They use the XRIO Converters to prepare the test data and characteristics. The templates therefore provide a basis for routine or commissioning tests.

Open Generic Template

Starts the Control Center and opens the Choose Template window in the "Test Library\Templates" folder. From this templates folder you can open a document of your choice. This can be a test document you have saved before, a ready-made or an empty OMICRON-supplied template, or the Default.occ template.

Tip: The Default.occ template already contains a Test Object and a Hardware Configuration. You can, however, customize Default.occ to meet your most common requirements, and use it as your own personalized template.

1. XRIO represents the second generation of RIO file technology. The term RIO stands for Relay Interface by OMICRON, a technology that was already available with previous Test Universe versions. The X denotes "extended". For more information about XRIO refer to section 3.2 ”XRIO” on page 20.

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New Test Document

Starts the Control Center with a blank test document. This enables you to create a new test specification from the scratch. While opening the document, Control Center adds a blank Test Object and a Hardware Configuration to that document.

Tip: If you don't want Control Center to add a Test Object and a Hardware Configuration to that document and to leave it entirely blank instead, disable that functionality by editing a Windows Registry key. Read the "Customizing Standard Characteristics of OMICRON Test Universe" instruction to learn how to do that. That instruction is named "Test Universe Registry Settings.pdf" and was installed with the Test Universe software (unless deselected). If you accepted the default installation folder, it will be stored at \ProgramFiles\OMICRON\Test Universe\Doc. If you chose a different installation folder, the manuals are stored in a subfolder named Doc underneath your installation folder.

2.3 Test Tools

The Test Tools section provides additional applications for specific testing tasks. Test tools are subject to restrictions:

• They run in stand-alone mode, only, i.e., they cannot be embedded into a Control Center test document.

• They do not use the common Test Object.

2.4 Setup

In the Setup section you find all means to set up your working environment.

Test Set Association

With the Test Set Association component you associate and configure your OMICRON CMC test set(s) via Ethernet. Using the Ethernet interface, you can put as many CMC test sets as you wish on the network and control them by even geographically remote computers (clients).

System Settings

System Settings provides the means for system-wide default settings (see the Test Universe Help topic "System Seetings" for more details).

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License Manager

The OMICRON Test Universe software is protected from unauthorized installation and use by a license file. The license file codes specify both the individual test modules and the hardware serial numbers, i.e., each code specifies a pair of "test module X to work with test set A". The license code enabling test module X to work with test set A will differ from the code for test set B, even though A and B might be the same CMC model.

The master license file Omicron.lic is installed to [Common Files]\OMICRON, whereat [Common Files] holds the full path to the folder defined by Windows to store files shared by applications that are installed on the system. In English Windows, that folder is named "Common Files" and is located in the [Program Files] folder. In other language versions of Windows, the common files folder name is localized appropriately by default.

Omicron.lic is an ASCII text file that can be viewed with any text editor.

If you purchase additional OMICRON test sets at a later point of time, you need to add their license codes, provided in separate license files, to the master license file. To do so, use the setup tool License Manager. The License Manager combines the functionality of a license browser, a merge tool and a license file editor. It searches for OMICRON license files stored on the computer's hard disk(s) and displays their contents. It merges license information from different files into the master license file Omicron.lic. It furthermore allows to add license keys manually.

Language Selection

The language you selected when you installed Test Universe is the default language when a Test Universe application is started for the first time or by a new user. Click "Language Selection" to change that language.

Once you selected the language of your choice from the Language for Test Universe Applications box and clicked "OK", the OMICRON Start Page immediately re-starts in the selected language. Still running test modules will change their user interface and test report language the next time you start them. The test report of the currently open OCC document, however, can be previewed on-the-fly with the new language by using the "Update" function of the Set All Reports dialog.

Note: If a certain Test Universe component is not available in the language you selected, it will attempt to start in the language of the operating system. Should that also not be available, it will start in English.

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2.5 Support

Get to know your OMICRON Test Universe...

Tutorials

From the OMICRON Start Page you can launch a number of Flash Animation tutorials. Click the Tutorials hyperlink to see an overview of the available tutorials and to start them. Please note that this hyperlink is disabled as long as you did not install the tutorials.

To install the tutorials, insert the Test Universe DVD into your drive.

If the Windows "Autostart" feature is enabled on your computer, the DVD browser, a Start Page-like installation screen, launches automatically. Else, open Windows Explorer, navigate to your DVD drive, and double-click Setup.exe.

Then click the DVD browser entry CM-Line Tutorials of the Install CM-Line Tools section and follow the on-screen instructions.

Manuals

OMICRON Test Universe provides a number of software and hardware manuals. Click to see an overview of the available manuals.

Help

Click to launch the OMICRON Test Universe Help.

Tips & Tricks

Tips & Tricks contains a collection of "protection goodies" that can contribute to make your daily work with Test Universe components more goal-oriented, efficient and convenient.

OMICRON User Forum

Direct link to the user forum (https://www.omicron.at/forum) at the OMICRON Web site where you can share your experience and knowledge with engineers all over the world, study technical expert discussions or post questions yourself.

Make sure your computer can access the Internet.

Contacts

OMICRON contact addresses worldwide.

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Diagnosis & Calibration...

Click OMICRON Assist to launch a diagnosis tool that collects comprehensive information about your test system. These information are meant to be forwarded to OMICRON's Technical Support in case you need the assistance of our experts for troubleshooting.

See the Test Universe Help topic "OMICRON Assist" for more details...

Click Log file to analyze the communication between a CMC test set and your computer, and to create a log file of it.

Click Calibration Info to obtain calibration information of the connected CMC test set(s).

The Field Calibration Software (FCS) facilitates and automates the calibration and testing of the OMICRON CM product line. The software runs calibration/test procedures at test points specified by templates and checks whether the test set is within the specifications. After calibrating/testing a test set, the FCS provides a report summarizing the test conditions and results.

What's New

Read the What's New to learn about new features, improvements or bug fixes of the current Test Universe version.

2.6 Custom

The Start Page has the capability of assimilating custom entries allowing to start programs or open documents that are not directly related to the Test Universe. Refer to the Start Page Customization manual for details.

That manual is named "StartPage Customization.pdf" and was installed with the Test Universe software (unless deselected). If you accepted the default installation folder, it will be stored at \ProgramFiles\OMICRON\Test Universe\Doc. If you chose a different installation folder, the manuals are stored in a subfolder named Doc underneath your installation folder.

French customers find ELISA and OTARIO pre-set in this section.

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Setting up the Test Object

3 Setting up the Test Object

The OMICRON Test Universe is designed for testing protection relays, transducers, and energy meters. Such devices are the "physical" test objects1 that need to be configured in the OMICRON Test Universe software.

For configuration, the correspondingly named software function Test Object is used. This function can be called up from the OMICRON Control Center (I N S E R T | T E S T O B J E C T) as well as from each individual test module (P A R A M E T E R S | T E S T O B J E C T).

Alternatively, click the Test Object toolbar icon. This opens the Test Object, in which you browse, access and edit the test object parameters.

The subject "Test Object" is closely related to the subject "XRIO". Therefore, to better understand Test Object - the first dialog box that opens once you selected to configure your physical test object - we recommend to also thoroughly read the section 3.2 ”XRIO” on page 20.

3.1 About Test Object

Each test module that is capable of running either stand-alone or embedded in an OMICRON Control Center (OCC) document acquires specific data of the physical test object (the device under test, most commonly a protection relay) from a data container called Test Object. Test Object has a user interface, the Test Object parameters window; it serves as test parameter management tool.

3.1.1 Local Test Object

A test module that runs stand-alone (i.e., that is launched from the Start Page, not embedded in an OCC document), has its own Test Object data container. It is launched from the test module by clicking the Test Object Parameters toolbar icon or, alternatively, the Parameters | Test Object (<Ctrl> + <T>) pull-down menu item. Since such a Test Object data container applies to a particular test module only, it is called local Test Object.

1. The word "physical" is used to draw attention to the fact that this is a real test object and not thecorrespondingly named software function Test Object, which is used for configuration.

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3.1.2 Global Test Object

When one or more test modules are embedded in an OCC document, and the OCC document does not have its own Test Object (positioned before the embedded test modules), each test module keeps its own local Test Object data container and launches it as described above.

When one or more test modules are embedded in an OCC document, and the OCC document has its own embedded Test Object (or several Test Objects), each embedded test module acquires its test object data from the Test Object that is positioned before the test module itself. Embedded Test Objects, mostly serving more than one test module, are called global Test Objects.

Local Test Object; applies to test module 1 (TM 1), only.

Local Test Object; applies to test module 2 (TM 2), only.

Example: A "flat hierarchy" with one global Test Object as data container for the following two test modules.

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In case the test module is part of a group of consecutive test modules, the rules stated for the OCC also apply inside the group. In case the group does not contain a Test Object, test modules acquire their test object data from the closest Test Object preceding the group on the next higher hierarchy level(s).

More information about groups can be found at section 5.1.2 ”Inserting a Group into an OCC Document” on page 86.

Note: When launching Test Object from within an embedded test module, every change made in the Test Object parameters window actually takes place in the hierarchically preceding Test Object data container - the global Test Object. Therefore, the change affects all test modules that refer to this global Test Object.

Example: The first embedded Test Object (TO 1) of the OCC document serves as data container for the following three test modules.

Test module 4 has a preceding Test Object (TO 2), therefore TO 2 serves as data container for TM 4 (and additional test modules that are embedded directly after TM 4).

17


3.1.3 Why Test Modules Change their Reference to a Test Object

One principal rule applies: A test module changing from "idle" (= no test results, currently not testing) to "action" (= performing a test) preserves its reference to the test object data in the condition it was before the module left the idle state. That way, test object data and test results always match up correctly, and they cannot be changed independent from each other.

In exceptional cases, however, test modules change their reference to a Test Object. This happens

a) when you subsequently insert a Test Object into an OCC document(in Control Center; command Insert | Test Object...)

b) when you subsequently embed a test module into an OCC document with the "from file" option (in Control Center; command Insert | Test Module..., and then the Create from File option),and this file was previously saved in stand-alone operation with test results.

Case a):

All test modules in the OCC document that follow this newly inserted Test Object refer to it. This also applies to a group (or groups) of test modules. Exception: those modules that already contain test results from a previous test. After clearing the test results (with Test | Clear), those modules then automatically change their reference to the Test Object positioned before them in the OCC document.

Case b) :

Since this test module (or the inserted file, respectively) contains test results, the module keeps its local Test Object data container. After clearing the test results (with Test | Clear), the module then automatically changes its reference to the Test Object positioned before it in the OCC document.

The same happens if that module was previously saved in stand-alone mode, however, with no test results: it then automatically refers to the Test Object positioned before it in the OCC document, and replaces its original test object data with the ones from the OCC Test Object data container.

18


3.1.4 Example of Test Objects in an OCC test document

Legend:

TO = Test Object, HWC = Hardware Configuration, TM = Test Module

• TM 1 keeps its own local Test Object data container because it does not have a preceding Test Object.

• TM 2 and TM 3 refer to TO 1.

• TM 4 refers to TO 1, since there is no preceding TO within Group 1.

• TM 5 refers to TO 2, since TO 2 precedes TM 5 within Group 1.

• TM 6 refers to TO 1, since TO 1 precedes TM 6 on its own level. TM 6 ignores TO 2, since TO 2 is in a lower level (in Group 1).

• TM 7 refers to the preceding TO 3.

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3.2 XRIO

XRIO® represents the second generation of RIO file technology. The term RIO stands for Relay Interface by OMICRON, a technology that was already available with previous Test Universe versions. The X denotes "extended".

XRIO’s predecessor, RIO, was developed out of a need for a uniform data format for parameters of protective relays produced by different manufacturers. RIO provides a common structure to allow functionally similar relays from diverse manufacturers to be tested with similar test procedures. Moreover, RIO permits relay characteristics to be imported into the Test Universe software from external sources.

XRIO data are organized in a tree-like structure of blocks, sub-sections and parameters with all of their properties and values as set in the Test Object (see 3.3 ”Test Object Parameters”).

The XRIO technology features a number of benefits. Two major advantages are:

1. Ease of use

In a special custom block, you can now enter names, units, values and definitions of test object parameters exactly as you know them from your protection relay. The user-defined names of those parameters appear at all relevant places throughout the Test Universe software. Test reports also display the parameters the way you defined them.

A so-called XRIO converter is an XRIO file with the integrated formulas and dependencies to convert your relay settings into OMICRON Test Object settings (see 3.2.2 ”XRIO Converter” on page 22).

2. Improved automation

Test Object parameters are defined at a central place of the Test Universe software: The Test Object. This dialog box provides all the features to browse, access and edit test object parameters. It also enables to create user-defined variables. These variables can contain values, formulas, dependencies or a combination thereof. Even simple logical functions such as "if" queries are possible (refer to the Help. In the table of contents of any test module search for "Text Object" and select "Formula Syntax").

In test modules, input fields, instead of holding a fixed value, can now directly link to one of the variables defined in XRIO - a feature named "LinkToXRIO". Furthermore, the linked value can be scaled by a constant factor, e.g., input field "Trip Time": 1.5 * ZT2; 1.5 being a multiplier of the linked variables.

In case of a change of one or more parameter setting(s) in XRIO, the entire test document, i.e., all test modules embedded in the OCC test document linking to this particular setting, automatically adjust to this change.

20


Example: Threshold determination "U>" using test module Ramping.

– In the Test Object, parameter "U>" was defined with a value of 100V.

– Within the OCC test document, various test modules link to this parameter "U>".

– In Ramping, rather than entering fixed voltage values for "from" and "to", the ramp is specified with "from: 0.5 U>" and "to: 1.5 U>".

– When executed, the test issues a ramp from 50V to 150V. The relay trips at "U>" (=100V), the test is finished.

– If parameter "U>" is now changed to, e.g., 80V, all test modules linking to "U>" automatically adjust to this change. Ramping would now issue a ramp from 40V to 120V.

3.2.1 LinkToXRIO

Instead of holding a fixed value, test modules can directly link to Test Object parameters.

Moreover, you can link to Boolean parameters ("true"/false"): This is useful if, for example, the flag "activate test module" or "activate group" is to be controlled via the LinkToXRIO feature (see 5.1.3 ”LinkToXRIO for the "Activate" Flag”).

For more information about the LinkTOXRIO feature refer to the Help. In the table of contents of any test module search for "Text Object" and select "LinkToXRIO".

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3.2.2 XRIO Converter

An XRIO converter is an XRIO file with the integrated formulas and dependencies to convert your relay settings into OMICRON Test Object settings.

The dependencies are set up to "translate" data from the Test Object’s Custom section (where the data are typically structured close to the relays’ representation) into test settings in the RIO section, which are used by test modules. This way, an XRIO converter significantly simplifies the setup of a test object.

OMICRON Test Universe distinguishes between

- test modules for specific protection functions and

- "general" test modules for universal use.

In the Test Universe releases 1.x, the general test modules only use some of the parameters of the Device Settings page. Test modules for specific protection functions possessed proprietary test module-specific pages. This was also reflected in the RIO files: The files of test modules for specific protection functions contained additional proprietary function blocks.

In Test Universe release 2.0, XRIO replaced RIO. The proprietary pages for specific protection functions, however, did not change. Test modules for specific protection functions, such as Overcurrent, Distance and Differential etc., need to have their relay settings, now entered in the XRIO "convention", translated into RIO. So-called XRIO converters do this.

Each Test Object for a specific relay needs its dedicated XRIO converter.

For more information about XRIO please refer to the XRIO manuals that were installed with the Test Universe software (unless deselected). If you accepted the default installation folder, they will be stored in PDF format at ProgramFiles\OMICRON\Test Universe\Doc.

If you chose a different installation folder, the manuals are stored in a subfolder named Doc underneath your installation folder.

For languages other than English, language specific subfolders exist.

To view a PDF file, either the Adobe Reader© or the Foxit Reader (both freeware) is required. If you have no PDF reader on your computer yet, OMICRON Test Universe installs the Foxit Reader.

22


3.3 Test Object Parameters

Test Object serves as test parameter management tool. In Test Object you browse, access and edit the contents of the test object parameters.

Figure 3-1:Test Object in Advanced mode

The left pane of the dialog box displays the extended block structure of XRIO in a tree-like view. In the tree you add specific protection functions and navigate to the different pages for Device settings and for the specific protection functions.

The right pane, the parameter table, displays the parameters that belong to the selected section. The test modules can directly link to these parameters. The number of visible columns depends on a) the set operational mode (see chapter ) and b) the context menu settings.

Context menus: Right-clicking a pane opens a context menu that contains the most relevant menu items on the pull-down menus. Right-clicking any heading cell of a parameter table column (e.g., "Name", "ID", "Description", "Value"…) opens a context menu that lists the available colums. By selecting or clearing individual colums you can customize the parameter table view.

If the XRIO template of your device under test includes a XRIO converter, the tree node above the RIO node (in ) represents the root note for the structured representation of your device-specific blocks. Enter the relay parameters for each block in the tabular view (in ). The parameters are then automatically converted into parameters of the RIO Device settings and the parameter of the specific protection or measurement function.

Note: Refrain from editing RIO parameters in such a scenario. Use the legacy user interface of the specific function pages instead to view the distance zones of your relay in a zone diagram.

1 2

1

2

1

2

23


Operational Modes and Available Functions

Test Object distinguishes between 2 operational modes: Standard and "Advanced".

Usual working mode for users who primarily execute test documents. A tester may occasionally switch to "Advanced" mode in order to carry out minor adaptations or for troubleshooting. In standard mode, some of the pull-down menus are hidden.

Working mode for test designers who create test documents. In "Advanced" mode, a test designer models the test object; defines, adds or deletes sections and parameters; sets properties; defines formulas and starts the Organizer.

Note: This mode should only be used by users with a good knowledge of the new XRIO concept.

Set the mode of your choice by selecting or clearing the pull-down menu item V I E W | A D V A N C E D.

Pull-down menu items on the F I L E menu

Imports an XRIO or RIO file. The import replaces the structure of blocks and sections of the currently loaded structure.

Exports an XRIO or RIO file.

Imports settings from an external data source such as an XML file containing the relay settings provided by, e.g., the relay manufacturer. A respective import filter is automatically invoked. The import automatically transfers the parameters to the parameter table. This saves the user from having to enter all data manually.

Note: The software assumes the imported data to be correct. Data that, by accident, may be set incorrectly in the relay can falsify the test results.

Standard mode

Advanced mode

I M P O R T

E X P O R T

I M P O R T R E L A Y S E T T I N G S

24


Opens the Organizer to arrange the contents of the Test Object and the XRIO files, i.e., to copy blocks and sections from the current test object to an external XRIO file or vice versa, or to delete blocks and sections.

The Organizer’s left pane displays the current test object, i.e., the currently loaded and active XRIO file.

Its right pane displays a RIO or XRIO file of your choice. Load the file by using the "Import..." button.

Once both panes hold an XRIO structure, you can start organizing entries.

"Duplicate Block" or "Delete Block"

Either duplicates or deletes the selected block or section with all sub-sections. Works in left pane only.

> > or < <

Copies the selected block or section with all sub-sections from the current selection to the other side.

Note: These buttons are disabled if either the hierarchical level or source and destination do not match or if the copy action you are intending to start is not plausible (e.g., the attempt to copy a Distance section to the Device block).

"Export As..."

Exports the structure in the right pane to an XRIO file with a new name of your choice. This is the only way to save changes made to this particular file.

O R G A N I Z E ("Advanced" only)

1 2

43 5 67 8

1

2

5

3 4

6

25


"OK"

Saves all changes made to the test object in the left pane, and closes the Organizer. Note: Changes made to the file in the right pane are discarded that way (see "Export As...").

"Cancel"

Closes the Organizer and discards all unsaved changes.

Provides the XRIO Converter Revision dialog box for version management of XRIO converters. Everytime you manually increment the revision number of a XRIO converter file, its date is automatically updated with the system date and saved. The author's name is also saved with each revision.

This name is taken from the Start Page's System Settings (tab User Information).

Saves all changes and exits Test Object.

Discards all unsaved changes and exits Test Object.

Pull-down menu items on the V I E W menu

Toggles between the 2 operational modes "Standard" and "Advanced".

Shows/hides the RIO subtree.

All test object-related errors that occur are saved in a list. This menu item displays that list.

Errors occurring during the import of a XRIO file with F I L E | I M P O R T remain in the list until the user deletes them with "Clear".

Errors occurring while editing a formula will automatically be deleted once the formula is corrected.

R E V I S I O N

("Advanced" only)

S A V E A N D E X I T

E X I T W I T H O U T S A V E

A D V A N C E D

R I O

E R R O R S

7

8

26


The bottom status line of the Test Object indicates the number of information messages, warnings and errors (I:1 W:0 E:0) and an according symbol: a green check mark to indicate OK, a yellow exclamation mark for a warning and a red exclamation mark for an error.

For a detailed error description, please refer to the Help. In the table of contents of any test module search for "Text Object" and select "XRIO". This help topic contains a direct hyperlink to the error description. Alternatively, search for the Index keyword "error list Test Object".

Pull-down menu items on the F U N C T I O N menu ("Advanced" mode only)

Adds a new RIO function independent from the currently selected block.

Deletes the selected function.

Opens the block-specific Test Object dialog box.

"Block-specific" means, the menu item adapts to the selected block, i.e., a Device block provides Open Device dialog, a Distance block Open Distance dialog, and a Differential block both Differential Test Objects (3-phase and single phase).

O P E N T E S T O B J E C T D I A L O G is also available on the context menu by right-clicking a block.

Pull-down menu items on the B L O C K menu ("Advanced" mode only)

Adds a new block to the XRIO file. This button is disabled if the item selected in the left pane does not allow having a block added.

Deletes an entire block with all sub-sections. This button is disabled if the item selected in the left pane does not allow a deletion.

A D D. . .

D E L E T E

O P E N T E S T O B J E C T D I A L O G

A D D. . .

D E L E T E

27


Cut/copy/paste functionality as known from, e.g., Windows Explorer. Also available on the context menu (right-click a block name in the tree view). Cuts or copies an entire block with all of its details (including formulas) and pastes it to a location of your choice. The operation is disabled where it makes no sense.

Note: This functionality is only available within one program instance and not over multiple instances.

Opens Block Details to specify further block properties.

Moves the selected block one position up in the tree.

Moves the selected block one position down in the tree.

Example: Two Distance blocks in a XRIO file.

If multiple function blocks of the same type are present in a test object (e.g., 2 Distance blocks), the corresponding test modules need to know which is the actually relevant instance they should access. This is determined by setting the active function.

The one block that - if selected - turns into a red and blue symbol is the active one of the two Distance blocks.

The other one may be a fully parameterized Distance block, but it’s inactive. This is indicated by a green filling of the symbol. To make this one the active block, select B L O C K | S E T A S A C T I V E F U N C T I O N.

What does "active function" mean?

If Test Object was called up from a stand-alone test module, the active block is the block the test module accesses for its parameters. The inactive block is ignored.

If Test Object was called up from within an OCC document, the active block is the one that is reported. The second Distance block does not appear in the test report.

C U T / C O P Y/ P A S T E

D E T A I L

M O V E U P

M O V E D O W N

S E T A S A C T I V E F U N C T I O N

28


Pull-down menu items on the P A R A M E T E R menu ("Advanced" mode only)

Adds a new parameter to the currently selected sub-section. This button is disabled if the item selected in the left pane does not allow adding a parameter.

Deletes the parameter that is selected in the right parameter table. This button is disabled if the selected item does not allow a deletion.

Cut/copy/paste functionality as known from, e.g., Windows Explorer. Also available on the context menu (right-click a parameter line in the tree view). Cuts or copies a parameter with all of its specific details (including formulas) and pastes it to a block of your choice.

Note: This functionality is only available within one program instance and not over multiple instances.

Opens the Parameter Details dialog box to specify further parameter properties.

Moves the selected parameter one position up in the list.

Moves the selected parameter one position down in the list.

Creating entries in the Custom block ("Advanced" mode only)

At the Custom block, a user can create unrestricted sub-blocks and parameters of his own.

- Left-click "Custom" and create a sub-block first by selecting B L O C K | A D D … or with the right-click context menu.

- Left-click the new sub-block and create a parameter by selecting P A R A M E T E R | A D D… or with the right-click context menu.

This procedure can be repeated as many times as needed, and also changed at any time with the B L O C K and P A R A M E T E R pull-down menu items.

A D D

D E L E T E

C U T / C O P Y/ P A S T E

D E T A I L

M O V E U P

M O V E D O W N

29


3.4 Device Settings

The Device block contains general information and settings like the relay's name or a description, its manufacturer, its device type, its address, its serial or model number, and any other information that is useful to identify it. It furthermore provides a number of preset general parameters, such as nominal values, residual factors and limits.

Double-clicking the block designation "Device" in the left tree-structure of the Test Object opens the Device Settings page. This page is a legacy from earlier Test Universe releases and lets you edit the device settings as hitherto, i.e., you can enter test object parameters in either way

• in the right pane parameter fields of the Test Object or

• on the Device Settings page.

Test modules with specific protection functions, e.g., (Adv.) Differential, (Adv.) Distance, Autoreclosure, additionally provide proprietary pages. Call up these proprietary pages from the tree view of the Test Object by double-clicking the respective block (e.g., "Device", "Distance" etc.), or on a context-menu that opens when right-clicking a section.

The input fields of the Device Settings page

Textual information for the relay to be tested (optional).

Enter the relay's name or a description, its manufacturer, its device type, its address, its serial or model number, and any other information that is useful to identify it. This information appears in all subsequent test reports, and can be exported to or imported from an XRIO file.

Enter the name and the address of the substation where the test object (the relay) is located. Textual information (optional).

Enter the name and the address of the bay where the test object (the relay) is located. Textual information (optional).

Enter the test object's nominal values here. The test modules use these values for calculation.

Device

Substation

Bay

Nominal values

30


These parameters are only relevant if your relay has separate potential/current inputs for the residual voltage/current.

The ratio of VT and CT for the residual current may differ from the VT and CT ratio for the phase current/voltage. At the Test Object set the ratio of the residual VT / CT in relation to the single phase VT/CT ratio.

Residual voltage VN = + 3 x (1/ResidualFactorV) x V01)

Ground-fault current IN = - 3 x ResidualFactorI x I02)

ResidualFactorV = VLN / VN

ResidualFactorI = IN / Inom

1) V0 = zero sequence voltage 2) I0 = zero sequence current

Default settings are:

VLN / VN = 1.7321 (√3), as the phase voltages form the residual voltage in the open delta connection, and

IN / Inom = 1

The modules Distance, Advanced Distance, QuickCMC, Autoreclosure, State Sequencer and the Annunciation Checker can put out VN and IN. To achieve this, route VN and IN in the Hardware Configuration.

Enter the maximum voltage and current values of the test object. These values are used by all test modules.

Deglitching input signals:

In order to suppress short spurious pulses a deglitching algorithm can be configured.The deglitch process results in an additional dead time and introduces a signal delay. In order to be detected as a valid signal level, the level of an input signal must have a constant value at least during the deglitch time.

Legend:

1. Signal before the filter 2. Signal after the filter

Residual voltage/current factors

Limits

Debounce/deglitch filters

1

2

tdeglitch tdeglitch

31


Debouncing input signals:

For input signals with a bouncing characteristic, a debounce function can be configured. This means that the first change of the input signal causes the debounced input signal to be changed and then be kept on this signal value for the duration of the debounce time.

The debounce function is placed after the deglitch function described above and both are realized by the firmware of the CMC test sets

and calculated in real time.

Legend:

1. Signal before the filter 2. Signal after the filter

Note: Debouncing and deglitching is possible with the test sets CMC 356, CMC 353, CMC 256plus, CMC 256, and with the CMB IO-7.

The following test modules support the debounce/deglitch functionality: Adv. TransPlay, Autoreclosure, All Differential modules, Distance and Advanced Distance, Transient Ground Fault, NetSim, Overcurrent, Pulse Ramping, Ramping, State Sequencer, Synchronizer, VI Starting.

Adjust the overload detection sensitivity of OMICRON CMC test sets and amplifiers.

Why do I want to adjust the overload sensitivity?

For example, for testing electromechanical relays.

The results of this test show that an overload has occurred during the test. Analyzing the signals with EnerLyzer reveals that the overload occurred during the prefault and therefore is not crucial for the result.

Being able to prevent the overload indication for this test produces a report without an overload message.

Set the overload disable time to either

• "High", which equals 50 ms,

• "Low", which equals 200 ms or

• "Custom". In this case enter the overload disable time of your choice into the entry field (10 ms … 1500 s).

Overload Detection

1

2

tdebounce

32


The following test sets and amplifiers support the variable overload detection:

• CMC 356

• CMC 353

• CMC 256 and CMC 256plus

• CMC 156

• CMA 56 (Ifxxxx)

• CMA 156 (HDxxxx)

• CMS 156 (HDxxxx)

• CMS 25x

Restriction: Amplifiers need a specific hardware and firmware version. The ability to adjust the overload detection sensitivity is available for devices with serial numbers greater or equal to the ones specified in brackets in the list above as well as for any device that has been modified to support the new overload algorithm. The latter is indicated by a firmware version 1.03 and special flag set in the flash.

The Test Universe Help holds additional information about Test Object. Launch the Help and search for "Text Object" in the table of contents of any test module.

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34

Setting Up the Test Hardware

4 Setting Up the Test Hardware

To define the test-specific hardware settings, a configuration module named Hardware Configuration is used. In Hardware Configuration (HWC) the user defines the combination of outputs and/or inputs he wants to use for a specific test. Furthermore, Hardware Configuration automatically documents the wiring information for the test. This way, an existing test file can additionally be used for test instructions for that particular test.

Hardware Configuration allows you to select the test hardware you want to use for the test without the necessity to physically connect any test hardware to the PC. This enables you to fully prepare a test in the office. Furthermore, the test documents become independent from the actual hardware that is used for the test. For example, a test template for differential relay testing using six output currents becomes independent from whether a CMC 356/CMC 256plus/CMC 256 or a CMC 353/CMC 156 with an external amplifier will be used.

Within OMICRON Test Universe, Hardware Configuration is a common component that is started either from the OMICRON Control Center, from any test module, or from a test document (if a HWC is embedded).

This chapter provides general information about the Hardware Configuration. For information on how to configure a specific function of the test hardware, please refer to the Help system of the OMICRON Control Center or any test module.

For specific information on how to configure a specific function of the test hardware, please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the topic of your choice.

For more detailed information about the test hardware itself, refer to the respective hardware manual that was installed with the Test Universe software (unless deselected). If you accepted the default installation folder, they will be stored in PDF format at \ProgramFiles\OMICRON\Test Universe\Doc.

If you chose a different installation folder, the manuals are stored in a subfolder named Doc underneath your installation folder.

For languages other than English, language specific subfolders exist.


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4.1 About the Hardware Configuration

4.1.1 What is the Hardware Configuration

In the broadest sense the test hardware can be seen as an "adaptation" between the test software and the test object (relay, meter, transducer, etc.). For instance, an output signal of the test software is physically put out by a test set output and then applied to the corresponding test object terminal via the wiring (see figure 4-1).

Figure 4-1:Hardware configuration, signal path between test software and test object

To set up the software according to the hardware setup, a separate software component, the Hardware Configuration (HWC), is available. The Hardware Configuration "represents" the signal path between the software and the test object and contains complete information about

• the assignments between the inputs and outputs of the test software and the test object terminals,

• the used test hardware as well as its configuration and

• the wiring between the test hardware and the test object terminals.

Test modules can be used in stand-alone mode or embedded in an OMICRON Control Center (OCC) test document. Depending on the operating mode of the test module the functional scope of the Hardware Configuration differs as shown in figure 4-2.

• If a test module is embedded in an OMICRON Control Center test document the Hardware Configuration is divided into the global Hardware Configuration and the local Hardware Configuration (see chapters 4.1.2 and 4.1.3).

• If a test module is used in stand-alone mode the functionality of the global and the local Hardware Configuration are put together and considered as the test module's Hardware Configuration (see chapter 4.1.4).

VL1

VL2

VL3

VL1VL2VL3N

Test Module

Test Object

Terminal Stripe.g. X1

Test Sete.g. CMC 256

Hos

t Int

erfa

ce

V1V2

V3

N

IA1

IA2

IA3

36


Figure 4-2:Scope of the Hardware Configuration

4.1.2 Global Hardware Configuration

If the test module is embedded in an OCC test document, a global Hardware Configuration can be inserted into the OCC test document to be used by subsequent test modules. If no global Hardware Configuration is inserted into the OCC test document, the test modules behave as if they were running stand-alone (refer to chapter 4.1.4).

The global Hardware Configuration allows the user to define the hardware at only one single place in a Control Center document, even for complex tests possibly requiring several test modules. This makes it unnecessary to open each single test module for the configuration and thus provides high comfort to the user.

Note: If a global Hardware Configuration is inserted into an OCC test document, the information specified there is valid for all subsequent test modules throughout the Control Center document or until another global Hardware Configuration is inserted, which is again valid for the test modules following it. Information specified in a global Hardware Configuration cannot be changed from a test module's local Hardware Configuration.

VL1

VL2

VL3

VL1VL2VL3N

Test Module

Test Object



Hos

t Int

erfa

ce

V1

V2V3

N

IA1

IA2

IA3

Local hardware configuration

Global hardware configuration

Test module embedded in OCC test document

Test module in stand-alone mode

V(1)-1

V(1)-2V(1)-3N

37


The following information is specified in the global Hardware Configuration (as shown in figure 4-3):

• Used test hardware.

• Usage of inputs and outputs (configuration) of the test hardware.

• Physical wiring between the test hardware and the test object terminals.

Figure 4-3:Information specified in the global Hardware Configuration

Automatic configuration of the display names and the wiring matrix with default settings

According to the test hardware the wiring matrix and the display names are automatically configured with default settings. For this, the names are generated by e.g. enumerating the voltage and current triples. This creates names such as V(1)-1, V(1)-2, etc. (the used default names can be set on the S Y S T E M S E T T I N G S menu at the Start Page). For the binary/analog inputs, the binary outputs and the analog DC inputs, the generated names are an enumeration of the input/output. For a CMB the inputs/outputs number is preceded with the slot number.

Global Hardware Configuration

Test Object



Hos

t Int

erfa

ce

V1V2V3N

IA1IA2IA3N

IB1IB2IB3

N

V(1)-1

V(1)-2V(1)-3

I(1)-1I(1)-2I(1)-3

I(2)-1I(2)-2I(2)-3

VL1VL2VL3N

I1SI2SI3S

N

I1PI2PI3PN

38


The default settings should be suitable for most applications. However, the settings can also be manually changed, if necessary.

Note: Manually performed settings and those which are stored in the test document are kept and not overwritten by newly performed automatic configurations.

An automatic configuration is performed by the software in the following cases:

• In offline mode (when no test hardware is connected) after opening the global Hardware Configuration and selecting the test hardware.

• In online mode (when test hardware is connected and switched on) each time the test hardware information is updated.

Usage of a global Hardware Configuration by multiple test modules

The global Hardware Configuration contains the wiring information between the inputs and outputs of the test hardware and the test object (relay, meter, etc.). If the wiring between the test hardware and the test object must be changed for any reason during the course of the test, a second global Hardware Configuration can be inserted containing the new wiring information.

Figure 4-4 illustrates how the test modules can access different global Hardware Configurations (containing the physical hardware and wiring information). In the example shown in figure 4-4 a second global Hardware Configuration (with new wiring information) was inserted after test module 2.

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Figure 4-4:Global and local Hardware Configuration in a test document 1

After the wiring between the test hardware and the test object is defined in the global Hardware Configuration, it is often required to define which of the wired inputs and outputs shall be used for a specific test. This is performed in the local Hardware Configurations of the individual test modules, providing the advantage that the wiring itself (defined in the global Hardware Configuration) can stay the same for different test modules.

Figure 4-5 illustrates how several test modules can access one global Hardware Configuration module (containing the physical hardware and wiring information) while at the same time being able to establish different test module signal assignments in the local Hardware Configurations.

OCC Test Document

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Figure 4-5:Global and local Hardware Configuration in a test document 2

OCC Test Document

Global Hardware Configuration

Test Module 1 Local Hardware Configuration

Test Module 2 Local Hardware Configuration

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4.1.3 Local Hardware Configuration if the Test Module is Embedded in the OCC

If the test module is embedded in an OCC test document containing a global Hardware Configuration, the signal assignments between the test module and the test object terminals (which are represented by the names in the "Display Name" column) are determined in the local Hardware Configuration of the test module. Here, each test module signal can be assigned to one physical signal path defined in the global Hardware Configuration.

Figure 4-6 shows an example.

Figure 4-6:Information specified in the local Hardware Configuration

Automatic signal assignment based on the display names

When a test module is embedded into the OCC test document, the input and/or output signals of the test module are automatically assigned to the display names in its local Hardware Configuration. For this purpose a matching algorithm of the software tries to find the display name that best fits the input or output signal of the test module.

If the algorithm cannot find a matching pair, the test module signal is assigned to the first available display name. In this case it can be necessary to perform the signal assignment manually.

Local Hardware Configuration

Test Module

Test Object



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An automatic signal assignment is performed by the software in the following cases:

• When a test module is first inserted into a test document.

• When the test object terminals (display names) defined in the global Hardware Configuration are changed.

• When a new global Hardware Configuration is imported by clicking the "Import" button on the General tab.

• When the test hardware information is updated.

Note: Signal assignments which were manually performed or changed by the user and which are stored in the test document are kept and not overwritten by newly performed automatic signal assignments.

Coupling of test module signals with the display names (test object terminals)

Once the test module signals are assigned in the local Hardware Configuration (either automatically or manually) they are coupled to the display names of the global Hardware Configuration (which represent the test object terminals). This means that if the user changes the link between a display name and a test hardware connector in the global Hardware Configuration by moving the cross in the grid, the test module signal still sticks with the display name.

This enables configuration changes in the global Hardware Configuration without any need to adjust the signal assignments in the local Hardware Configuration.

4.1.4 Hardware Configuration if the Test Module is Running in Stand-alone Mode

If a test module is used in stand-alone mode, the functionality of the global and the local Hardware Configuration are put together and considered as the test module's Hardware Configuration. In this case all necessary information is contained in the Hardware Configuration (refer to figure 4-7 below):

• Used test hardware.

• Usage of inputs and outputs (configuration) of the test hardware.

• Physical wiring between the test hardware and the test object terminals.

• Signal assignments between the test module and the physical wiring.

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Figure 4-7:Hardware configuration of a test module running in stand-alone mode

Automatic configuration of the display names and the wiring matrix with default settings

According to the test hardware the wiring matrix and the display names are automatically configured with default settings. For this, the names are generated by e.g. enumerating the voltage and current triples. This creates names such as V(1)-1, V(1)-2, etc. (the used default names can be on the S Y S T E M S E T T I N G S menu at the Start Page). For the binary/analog inputs, the binary outputs and the analog DC inputs, the generated names are an enumeration of the input/output. For a CMB the inputs/outputs number is preceded with the slot number.

The default settings should be suitable for most applications. However, the settings can also be manually changed, if necessary. Manually performed settings and those which are stored in the test are kept and not overwritten by newly performed automatic configurations.

Hardware Configuration

Test Module

Test Object



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Note: Test modules for protection relay testing automatically assign the trip signal to binary input 1 by default.

An automatic configuration is performed by the software in the following cases:

• In offline mode (when no test hardware is connected) after opening the Hardware Configuration of a test module and selecting the test hardware.

• In online mode (when test hardware is connected and switched on) each time the test hardware information is updated.

Automatic signal assignment based on the display names

Likewise, the test module input and/or output signals are also automatically assigned to the display names. For this purpose a matching algorithm of the software tries to find the display name that best fits the input or output signal of the test module.

If the algorithm cannot find a matching pair, the test module signal is assigned to the first available display name. In this case it can be necessary to perform the signal assignment manually.

An automatic signal assignment is performed by the software when a test module is opened or a new test is created.

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4.2 Global and Local Hardware Configurations (Test Module Embedded in OCC)

Suppose a multifunctional protection relay with overcurrent and differential function is to be tested within a single test document.

The first item in the list view shown in figure 4-8 is the global Hardware Configuration which is used by both test modules.

Figure 4-8:List view of the Control Center document

An example of a global Hardware Configuration is shown in figure 4-9. In this case the hardware setup consists of one CMC156 test set and one CMA156 current amplifier. The names in the "Display Name" column represent the test object terminals. The display names and the wiring matrix are automatically configured with default settings. The terminal designations in the "Connection Terminal" column must be entered manually (but can also be left blank).

Figure 4-9:Global Hardware Configuration

In the local Hardware Configuration of the Overcurrent test module (see figure 4-10) the test module signals are automatically assigned to the names in the "Display Name" column which represent the test object terminals. Once the test module signals are assigned in the local Hardware Configuration they are coupled to the "Display Names".

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Figure 4-10:Local Hardware Configuration of the Overcurrent test module (example)

Likewise, in the local Hardware Configuration of the Diff Configuration module (see figure 4-11) the test module signals are again automatically assigned to the corresponding names in the "Display Name" column.

Figure 4-11:Local Hardware Configuration of the Diff Configuration test module (example)

Note: Only the "Test Module Output Signal" can be set in the local Hardware Configuration of each test module. The selection menu contains only signals which are applicable for this test module and appropriate for the wired connector. The columns for "Display Name" and "Connection Terminal" can only be edited in the global Hardware Configuration.

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4.3 Starting the Hardware Configuration

4.3.1 Test Module Embedded in OCC Test Document

Starting the global Hardware Configuration

To start the global Hardware Configuration from the OMICRON Control Center:

• Insert a new Hardware Configuration into the test document by clicking the Hardware Configuration toolbar icon or selecting I N S E R T | H A R D W A R E C O N F I G U R A T I O N. . . .

• To open an existing Hardware Configuration from the navigation map (V I E W | N A V I G A T I O N M A P), double-click its reference in the list on the left side of the window.

• To open an existing Hardware Configuration in the list view (V I E W | L I S T V I E W), double-click its reference in the list.

• The Report view of a test document also contains references to the Hardware Configuration that can be started. Click the "Report View" toolbar icon or select V I E W | R E P O R T V I E W. The references within the test document look similar to figure 4-12, either as editable information or as an icon1.

Figure 4-12:Representation of the Hardware Configuration in the report view of a test document as editable information:

or as icon:

1. To display an object as either editable information or icon, right-click the object. From the contextmenu, click "Test Properties". At "Display As" set the option of your choice.


Test Equipment

Type Serial number

CMC256-6 EB330D

Performed at Result Details

Not yet performed

Hardware Check

HardwareConfiguration

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Starting the local Hardware Configuration

To start the local Hardware Configuration of an embedded test module:

• If necessary, insert a new test module into the test document by clicking the test module icon or selecting I N S E R T | T E S T M O D U L E . . . and then selecting a test module from the Insert Test Module dialog box. In the test module, click the Hardware Configuration toolbar icon or select P A R A M E T E R S | H A R D W A R E C O N F I G U R A T I O N . . . .

• Open the test module of your choice. Then click the Hardware Configuration toolbar icon or select P A R A M E T E R S | H A R D W A R E C O N F I G U R A T I O N. . .

4.3.2 Test Module in Stand-Alone Mode

To open the Hardware Configuration of a test module running in stand-alone mode, click the Hardware Configuration toolbar icon or select P A R A M E T E R S | H A R D W A R E C O N F I G U R A T I O N. . . .

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4.4 Usage of Existing Hardware Configurations

If you want to use an existing Hardware Configuration you can either open an existing test document (or test) or you can import a Hardware Configuration which is stored in an OHC file.

If you are working in online mode (test hardware connected and switched on), an automatic configuration of the wiring matrix and the display names is performed when the test hardware information is updated (for new test documents or tests also an automatic signal assignment between the test module signals and the display names is performed).

If the Hardware Configuration encounters a difference between a stored configuration (either being part of a test document or being imported) and the currently available test hardware, the software tries to map as many inputs/outputs as possible from the stored configuration to the current one.

If the software cannot find an appropriate input/output for each of the stored inputs/outputs, an appropriate message is displayed in the Status History window. Any information of the stored configuration that cannot be mapped to the current hardware is lost. In this case the user has to modify the Hardware Configuration manually.

When working with an existing test document or test which already contains a stored Hardware Configuration or after importing a Hardware Configuration, always verify the physical wiring and the Hardware Configuration settings.

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4.5 Updating the Test Hardware Information

Please note that the behavior explained in the following applies only to test documents that have been created/stored with the Test Universe software Version 1.31 or later.

If you are in doubt, please contact the OMICRON support (see ”Contact Information / Technical Support” on page 131).

4.5.1 General

Updating the test hardware information means that a hardware scan is performed and the data of the connected test hardware (e.g. test set type, serial number, etc.) are loaded to the Hardware Configuration. Each time the test hardware information is updated, the display names and the wiring matrix are automatically configured with default settings based on the test hardware information. Manually performed settings and signal assignments and those which are stored in the test document are kept as far as possible and not overwritten when the test hardware information is updated.

If the Hardware Configuration encounters a difference between a stored configuration (either being part of a test document or test or being imported) and the currently available test hardware, the software tries to map as many inputs/outputs as possible from the stored configuration to the current one. If the software cannot find an appropriate input/output for each of the stored inputs/outputs, an appropriate message is displayed in the Status History window. Any information of the stored configuration that cannot be mapped to the current hardware is lost. In this case the user has to modify the Hardware Configuration manually.

When the connected test set is exchanged by another test set or test set type, no message is displayed, informing you that you have other test hardware connected than displayed in your Hardware Configuration. Only the Status History window displays a corresponding message. For example, when the test hardware is changed from a CMC 356 to a CMC 353, or when an additional amplifier is used that is switched off, it could happen that the number of available outputs is no longer sufficient. This will lead most likely to a failed test (remedy: check the wiring and the Hardware Configuration settings again).

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4.5.2 Updating when Test Module is Running Stand-Alone

If a test module is running stand-alone the update behavior depends on whether test results are available or not.

• If no test results are available the moment of the test hardware information update depends on the test module.

• If test results are available, no test hardware information update is performed and the Hardware Configuration operates in read-only mode. In this case no changes can be performed until the test results are deleted.

4.5.3 Updating when Test Modules Access a Global Hardware Configuration

From Version TU1.5 on the update behavior of the test hardware information is changed compared to earlier versions. Let's assume that a user performs tests somewhere out in the field without a printer at hand and he wants to print the test document for archiving purposes when he is back in the office. In this case the test hardware information in the test document may not be changed in order to document which test hardware (serial no.) was used during the test. Consequently, the Hardware Configuration must be informed whether a test document has been tested or not.

For this purpose 3 update states are distinguished. The update state is determined by the test modules accessing a global Hardware Configuration, i.e. all tests that follow a global Hardware Configuration in the test document.

Automatic update

An automatic update of the test hardware information is performed when no test has been performed yet, i.e. no results are available and the test modules are in IDLE state. In this case the test hardware information is automatically updated as soon as the test document is opened. A hardware scan for updating the test hardware information is also immediately performed when the state is changed from one of the other two states to the automatic update state. The user can perform a manual update at any time by clicking the "Search..." button on the General tab.

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Demand update

The demand update state is reached as soon as one of the test modules following the global Hardware Configuration in the test document is not in IDLE state (PAUSED, STOPPED, FINISHED or ERROR) and at least one other test module is still in a state that allows for testing (IDLE, PAUSED or STOPPED). In this case the test hardware information is not updated upon opening of the test document. The test hardware information is updated on demand, before the test module begins to run the actual test. The user can perform a manual update at any time by clicking the "Search..." button on the General tab.

No update

If all test modules are either in FINISHED or ERROR state, the test hardware information is not updated. In this case the Hardware Configuration operates in read-only mode and no changes can be performed. This mode is like the behavior of stand-alone running test modules when test results are available.

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4.6 The Hardware Configuration Dialog Box

The Hardware Configuration dialog box consists of up to 6 different tabs. The basic purpose of each tab in the Hardware Configuration dialog box is explained in this chapter.

If the configuration is performed in the global Hardware Configuration, the selected configuration is valid throughout the Control Center document and cannot be changed from a test module's local Hardware Configuration. If no global Hardware Configuration was inserted into the OCC document, the test modules behave as if they were running stand-alone. In this case, all information has to be specified for each individual test module.

• For the General tab see chapter 4.6.2.

• For the Analog Outputs tab see chapter 4.6.8.

• For the Binary / Analog Inputs tab see chapter 4.6.9.

• For the Binary Outputs tab see chapter 4.6.10.

• For the DC Analog Inputs tab see chapter 4.6.11.

• For the IRIG-B & GPS tab see chapter 4.6.12:

• General information about working with the wiring tables in the inputs and outputs tabs are given in chapter 4.6.1.

Note: In the local Hardware Configuration of test modules or if a test module is used in stand-alone mode, possibly not all tabs are displayed in the Hardware Configuration dialog box. In this case, only those tabs are displayed which functions are supported by the specific test module. For instance, in the Hardware Configuration of the Meter test module the Binary Outputs tab and the DC Analog Inputs tab are missing because this module does not support binary outputs or DC analog inputs.

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4.6.1 Working with the Wiring Tables in the HWC Inputs and Outputs Tabs

On the inputs and outputs tabs define the usage of the inputs and outputs of the test hardware.

The wiring tables in the inputs and outputs tabs are automatically configured and adapted according to the test hardware and its configuration set in the General tab. For example, if the configuration is changed to obtain additional outputs, the wiring table is enhanced by an appropriate number of new terminal lines which are automatically wired to the new connectors and provided with default display names.

Figure 4-13:Analog Outputs tab of a test module running in stand-alone mode

Note: If no test set is connected to the PC (offline mode), question marks are displayed instead of the serial number.

2 314

5

Even though the table rows are arranged in alternating yellow- and white-colored blocks with three lines each, this grouping does not necessarily represent functional blocks, e.g. CMC output triples.

As defined in the Output Configuration Details dialog in the General tab, there are one voltage and three current triples available.

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Information about the columns and areas in the wiring tables

Refer to figure 4-13:

(1) "Test Module Input/Output Signal" column

In this column the input/output signal of the test module is assigned to the test object terminal specified in this line. To change the assignment, left-click the specific cell and select an input/output signal. The selection menu only allows signals that an individual test module knows about and that are appropriate for the wired connector. Once the test module signals are assigned they are coupled to the names in the "Display Name" column.

Note: The "Test Module Input/Output Signal" column is not available in the global Hardware Configuration of an OCC test document. The test module input/output signals can only be assigned or changed in the local Hardware Configuration or in the Hardware Configuration of a test module running in stand-alone mode.

(2) "Display Name" column

The display name is the designation of the connection between the test hardware connectors and the test object terminals. According to the test hardware connected to the PC or selected in the General tab (in offline mode) the display names are automatically configured with default settings. The display names cannot be changed in the local Hardware Configuration of a test module which is embedded in an OCC test document.

(3) "Connection Terminal" column

In the "Connection Terminal" column you can enter the names of the test object connectors. With this information the Hardware Configuration documents the wiring between the test hardware and the test object (relay, meter, etc.). At the same time the connection terminal entries are the wiring instructions for future recurring tests or if the entire test document is used as test instruction. It is recommended to use it, but it is optional and can also be left blank. The connection terminal names cannot be changed in the local Hardware Configuration of a test module which is embedded in an OCC test document.

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(4) Wiring Matrix area

In the wiring matrix the connections (physical wiring) between the test hardware connectors and the test object connectors are defined. According to the test hardware connected to the PC or selected in the General tab the wiring matrix is automatically configured with default settings. The wiring matrix cannot be changed in the local Hardware Configuration of a test module which is embedded in an OCC test document.

Note: When working in online mode, test hardware connectors which are not available because they are used by a different application are disabled in the wiring matrix (displayed with a gray background) and cannot be wired in the Hardware Configuration. For example, this is the case if inputs are reserved by the EnerLyzer and you look at the Hardware Configuration from a different test module.

(5) Test set information areaIn the heading area of the wiring matrix the test set information is displayed (type, offline or online state, input ranges of analog inputs, connector, etc.).

Handling information

• To establish a connection in the wiring matrix area, position the mouse pointer to the cell of your choice and left-click to place a cross to the cell.

• A right mouse click opens a context-menu allowing you to A D D a line at the end of the table, to I N S E R T a line above the selected line, to D E L E T E selected lines in the table and to R E S E T the A S S I G N M E N T for selected lines.

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4.6.2 General Tab

On the General tab define the used test hardware.

Note: If no test set is connected to the PC (offline mode), question marks are displayed instead of the serial number.

Figure 4-14:General tab

The combo boxes, buttons and display fields of the General tab shown in figure 4-14 are explained below:

(1) "Test Set(s)"

In the "Test Set(s)" combo boxes, the connected OMICRON test set(s) are either displayed together with their serial number or can be manually set (in offline mode). Depending on the setting in the first combo box the second combo box is disabled. The following settings can be selected or displayed:

• Only a CMC test set (entry "CMCxx" in the first combo box, "No extension device" in the second combo box or second combo box is inactive if the displayed CMC test set does not support the CMB IO-7).

• Only a CMB IO-7 test set (entry "CMB IO-7" in the first combo box, second combo box is inactive).

• Combination of a CMC (which is able to support a CMB IO-7) and a CMB IO-7 test set (entry "CMC" in the first combo box and "CMB IO-7" in the second combo box).

23

1 4

5

6

78

9

10 11 12

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(2) The display fields "Voltage Outputs", "Current Outputs" (and, where applicable, "Aux DC") show the selected configuration.

(3) The voltage/current outputs configuration of the selected CMC device can be changed by clicking the corresponding "Details..." button (refer to chapter 4.6.3 ”CMC Output Configuration Details”).

Note: The AUX DC voltage cannot be set in the Hardware Configuration. This voltage can only be set using the AUX DC utility which can be started from the Start Page.

(4) The configuration of the selected CMB IO-7 test set can be changed by clicking the "Details..." button. For more detailed information refer to chapter 4.7 ”CMB IO-7 Hardware Option”.

(5) "Amplifier(s) / Low Level Outputs / Sensor Simulation" combo boxIn this combo box you can select whether you want to define an OMICRON CMA or CMS amplifier, a user-defined non-OMICRON amplifier, a sensor simulation or a system of low level outputs. If an OMICRON CMA or CMS amplifier is connected and switched on, it is automatically displayed in the combo box. The combo box selection list also contains already existing user-defined configurations (those list entries are prefixed by a *).

(6) If the checkbox "Multiple Amplifiers / Low Level Outputs" is checked, another combo box is displayed for specifying a second amplifier, sensor simulation or system of low level outputs. Leave this option inactive if you are not using more than one amplifier, sensor simulation or system of low level outputs.

(7) The display fields "Voltage Outputs" and "Current Outputs" display information about the selected configuration.

(8) The configuration can be changed by clicking the corresponding "Details..." button (refer to chapters 4.6.4 to 4.6.7).

(9) The "Check Wiring Warning" checkbox allows switching on or off the wiring warning message. If active, this message will remind you to check the physical wiring of your hardware prior to the start of the test procedure or whenever the global Hardware Configuration instance changes (if the test document contains more than one global Hardware Configuration).

(10) Click the "Search..." button to search for connected devices and update the test equipment information. Normally it is not necessary to perform a manual search, because the software automatically finds connected OMICRON test equipment and updates the test hardware information. For detailed information refer to chapter 4.5.

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(11) Click the "Calibration..." button to open the Calibration dialog box and display the last factory calibration for the connected OMICRON devices. Guaranteed values provided in the hardware manual are valid for one year after the date of the last factory calibration.

(12) Using the import/export feature allows saving/loading of OHC files. OHC files contain all information which can be set in the Hardware Configuration. This way, Hardware Configurations can easily be transferred between e.g. different Control Center documents. For more detailed information refer to chapter 4.4.

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4.6.3 CMC Output Configuration Details

Click the "Details" button next to the combo box to change the voltage or current outputs configuration of a CMC test set which is selected/displayed in the upper combo box of the "Test Set(s)" group box in the General tab,

In this dialog box the configuration of the selected CMC test set can be changed. The image in the middle of the dialog box shows how to connect the outputs in order to achieve the wanted configuration.

Figure 4-15:Output Configuration Details dialog box for a CMC 256-6

2

3

1

4

5

5

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(1) "CMC Voltage Outputs"

In this group box select the wanted configuration of the voltage outputs of your CMC test set from the entries in the list. A corresponding connection diagram is associated with each configuration which symbolically shows how to connect the cables in order to achieve the wanted configuration. For a physically correct connection, please refer to your hardware manual.

The setting "3 x 300 V, 50 VA @ 75 V, 660 mArms, VEautomatically calculated"

This setting is available for the test sets CMC 356, CMC 353, CMC 256plus and CMC 256.

If the configuration 3 x 300 V, 50 VA @ 75 V, 660 mArms, VEautomatically calculated is set, the voltage VE is generated between the terminals V4-N. VE represents the vectorial sum of the three phase voltages V1-N, V2-N and V3-N.

Note: This function is calculated in the CMC test set's internal firmware without knowledge of any Test Object settings. Therefore, it does not consider any VT ratio deviations between phase voltage and residual voltage inputs as specified in the Test Object but will always divide the vectorial sum of the three phase-to-ground voltages by √3, e.g., if all three phases put out 10 V with equal phase angles, VE will be 17.3 V.

Since this signal is automatically generated, it will not be available anymore for the channel routing on Hardware Configuration's Analog Outputs tab.

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(2) "Voltage Factor"

The "Voltage Factor" entry field is only enabled when the configuration [3 x 300 V; 50 VA @ 75 V; 660 mArms;V0] is selected that includes the automatically calculated zero-sequence voltage (for CMC 356/CMC 353/CMC 256plus/CMC 256). The "Voltage Factor" value is the factor for the zero-sequence voltage calculation. When the field is active, the zero-sequence voltage calculated using this factor is output at the V4 output of the according CMC test set. The default value is 1/√3 (0.57735).

The fourth voltage V4-N is calculated from the residual voltage VG of the three phase system V1, V2, V3 as follows:

V4-N = fv x VG, VG = V1-N + V2-N + V3-N

fv is the voltage factor which can be entered in the input field.

(3) "CMC Current Outputs"

In this group box select the wanted configuration of the current outputs of your CMC test set from the entries in the list. A corresponding connection diagram is associated with each configuration which symbolically shows how to connect the cables in order to achieve the wanted configuration. For a physically correct connection, please refer to your hardware manual.

The setting "3 x 12.5 A, 70 VA @ 7.5 A 10 Vrms, IE automatically calculated"

This setting is available for the test sets CMC 356/CMC 353/CMC 256plus/CMC 256.

If the configuration 3 x 12.5 A, 70 VA @ 7.5 A 10 Vrms, IE automatically calculated is set, the current IE flows between the connectors 1 and 2 of the current triple B. IE represents the vectorial sum of the three phase currents (I1, I2 and I3 of triple current A).

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Note: This function is calculated in the CMC test set's internal firmware without knowledge of any Test Object settings. Therefore, it does not consider any CT ratio deviations between phase current and residual current inputs as specified in the Test Object; e.g., if all three phases put out 1 A with equal phase angles, IE will be 3 A.

Since this signal is automatically generated, it will not be available anymore for the channel routing on Hardware Configuration's Analog Outputs tab.

(4) "Compliance Voltage"

The output power limit of the current outputs can be optimized with the compliance voltage. For normal use, the default setting "high" is appropriate (6 or 15V, depending on the CMC test set), which is the optimum for most regular applications. Changed compliance voltage values can be reset to the default setting by clicking the "Default" button.

(5) Auxiliary VT/CT control

The auxiliary VT/CT control supports the connection of external current and/or voltage transformers to the analog outputs of any CMC test set or "intelligent" OMICRON amplifier (i.e., an amplifier connected to the CMC test set in a way that enables both devices to communicate with each other).

Connecting a current or voltage transformer to an analog output changes the characteristics of this output, e.g., its amplification or propagation delay time. The auxiliary VT/CT control allows specifying these changes, so the software will apply the correct values to the CMC's analog outputs, and display the correct transformer secondary winding values.

Note: Auxiliary CT/VT control holds a restriction. For setups consisting of configurations that include more than one output current or voltage group (e.g., 4 x 300 V or 6 x 12.5 A with a CMC 356/CMC 256plus/CMC 256), it is assumed that the user connects respective transformers to all analog CMC output groups. It is not possible to configure the software in such a way that one output group is connected to transformers, and the other one is not.

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Figure 4-16:Example: A configuration using the current output groups A and B (6 x 12.5 A).

Click the "Connect VT/CT…" (or, if a transformer is already connected, "Modify VT/CT…") button to open the respective Configuration Details dialog box, in which the transformer details are specified.

Click the "Remove VT/CT…" button to remove the VT/CT configuration information and reset the analog output configuration to normal operation.

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the topic "General tab" | "CMC Configuration Details" | "Output Configuration Details Dialog Box".

3 CTs,e.g., 3 x 125 A

Analog outputs, 3 x 12.5 A

Wrong:

A

B

Right:

3 CTs,e.g., 3 x 125 A

3 CTs,e.g., 3 x 125 A

A

B

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4.6.4 Amplifier Configuration Details

In the "Amplifier(s) / Low Level Outputs / Sensor Simulation" group box of the General tab you can (among other things) specify OMICRON amplifiers or user-defined non-OMICRON amplifiers.

To set or change the configuration of an amplifier which is selected/displayed in this combo box(es), click the "Details" button next to the combo box. Depending on the selected entry (OMICRON amplifier or user-defined amplifier), a dialog box is displayed where you can perform the configuration for your amplifier.

Figure 4-17:Amplifier Details dialog box for configuring a user-defined non-OMICRON current amplifier

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the topic "General tab" | "Amplifier Configuration Details".

• Configuring an OMICRON amplifier

This topic describes the configuration of OMICRON CMA and CMS amplifiers which are able to communicate with the software.

• Configuring a user-defined non-OMICRON amplifier

This topic describes the configuration of non-OMICRON amplifiers which are not able to communicate with the software. Due to this, all relevant information must be specified manually.

• AMP files

This topic describes the usage of AMP files containing the amplifier configuration data. By selecting AMP files the amplifier configuration data is read by the software instead of specifying the data manually.

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4.6.5 Voltage and Current Sensor Simulations

From the combo box in the "Amplifier(s) / Low Level Outputs / Sensor Simulation" group box in the General tab

• select the entry "Create Linear Voltage Sensor" or "Create Linear Current Sensor" to create a new voltage or current sensor simulation

• or select an existing voltage or current sensor simulation and then click the "Details" button next to the combo box.

The Linear Voltage/Current Sensor Simulation Details dialog box is opened where you can enter or change your simulation data.

Figure 4-18:Linear Voltage Sensor Simulation Details dialog box

Click O K to apply and store your simulation data. Your simulation is then added to the combo box selection list in the "Amplifier(s) / Low Level Outputs / Sensor Simulation" group box. The list entry consists of the sensor type followed by a running number and the serial number of the CMC test set (e.g. "Linear Voltage Sensor 1 (AG150A)"). If you want to delete an existing stored simulation from the combo box selection list, click D E L E T E .

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the topic "General tab" | "Voltage and Current Sensor Simulations" | Creating Voltage and Current Sensor Simulations".

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4.6.6 Rogowski Current Sensor Configuration

Configuring of a Rogowski current sensor is only possible in combination with an OMICRON test set CMC 356/CMC 353/CMC 256plus/CMC 256.


• select "Create Rogowski Current Sensor" to create a new simulation

• or select an existing Rogowski current sensor simulation and then click the "Details" button next to the combo box.

The Rogowski Current Sensor Simulation Details dialog box is opened where you can enter or change your simulation data.

Figure 4-19:Rogowski Current Sensor Simulation Details dialog box

Click O K to apply and store your simulation data. Your simulation is then added to the combo box selection list in the "Amplifier(s) / Low Level Outputs / Sensor Simulation" group box. The list entry consists of the name "Rogowski Current Sensor" followed by a consecutive number and the serial number of the test set (e.g., "Rogowski Current Sensor 1 (AG150A)"). If you want to delete an existing stored simulation from the combo box selection list, click D E L E T E .

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the topic "General tab" | "Voltage and Current Sensor Simulations" | Configuring a Rogowski Current Sensor".

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4.6.7 Low Level Outputs Configuration

In the "Amplifier(s) / Low Level Outputs / Sensor Simulation" group box in the General tab you can (among other things) select existing (stored) or specify new low level output systems of your CMC for using the external outputs directly as low level outputs.


• select the entry "Create Standard Low Level Outputs" to create a new low level output system

• or select an existing low level output system and then click the "Details" button next to the combo box.

The Amplifier Details dialog box is opened where you can select the low level output system from the "Output System" combo box.

Figure 4-20:Amplifier Details dialog box for configuration of low level outputs

Click O K to apply and store your low level output system data. Your low level output system is then added to the combo box selection list in the "Amplifier(s) / Low Level Outputs / Sensor Simulation" group box. The list entry consists of the name "Standard Low Level Outputs" followed by a running number and the serial number of the CMC test set (e.g. "Standard Low Level Outputs 1 (AG150A)"). If you want to delete an existing stored low level output system from the combo box selection list, click "Delete".

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the topic "General tab" | "Creating Low Level Output Systems".

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4.6.8 Analog Outputs Tab

In the Analog Outputs tab you define the usage of the analog outputs. The available outputs displayed in the Analog Outputs tab depend on the test hardware definition in the General tab.

Note: CMB IO-7 does not have analog outputs. Therefore, this tab is empty if the only test set selected in the General tab is a CMB IO-7.

Figure 4-21:Analog Outputs tab of a test module running in stand-alone mode

The columns and areas of the Analog Outputs tab shown in figure 4-21 are explained below:

(1) Test set information

In the heading area of the wiring matrix the test set information is displayed (test set type, voltage or current output, offline or online state, connector).

(2) In the "Connection Terminal" column you can enter the names of the test object connectors. With this information the Hardware Configuration documents the wiring between the test hardware and the test object (relay, meter, etc.). At the same time the connection terminal entries are the wiring instructions for future recurring tests or if the entire test document is used as test instruction. It is recommended to use it, but it is optional and can also be left blank.

(3) The "Display Name" is the designation of the connection between the test hardware connectors and the test object terminals.

(4) The "Test Module Output Signal" column is not available in the global Hardware Configuration. In the "Test Module Output Signal" column the output signal of the test module is assigned to the test object terminal specified in this line. The selection menu only allows signals that an individual test module knows about and that are appropriate for the wired connector.

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Mirrored Currents

What's a mirrored current?

A mirrored current is a current that is identical to a reference current in waveform, phase and frequency, but with negated amplitude.

Why mirrored currents?

Example: For testing a particular function of a multi-functional relay with an integrated differential protection feature without making this differential protection feature trip. The first current triple (IL 1 … IL3) represents the current fed into the differential protection relay, the second current triple (-IL1 … -IL3, negated amplitude) represents the current leaving the differential protection relay.

If on the Output Configuration Details dialog box the current triple IL1 … IL3 is defined, the mirrored currents (-IL1 … -IL3) are created automatically. If -IL1 is routed, its amplitude automatically gets the negated value of the amplitude of IL1 while the other signal parameters (waveform, phase and frequency) are copied from IL1.

The vector diagram of the respective test module displays the mirrored currents.

Mirrored currents are available for most test modules, however, QuickCMC, VI Starting, Ground Fault, NetSim, Synchronizer, Adv. TransPlay, Differential and Adv. Differential do not provide this feature.

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to "Analog Outputs Tab".

For general information about working with the wiring tables refer to chapter 4.6.1 of this manual.

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4.6.9 Binary / Analog Inputs Tab

In the Binary / Analog Inputs tab the usage of the binary and analog inputs is defined. In this tab all available inputs are displayed according to the test hardware definition in the General tab.

Note: The binary inputs of a CMB IO-7 can only be configured in the global Hardware Configuration and in the Hardware Configuration of test modules which are able to support CMB IO-7.

Figure 4-22:Binary / Analog Inputs tab of a test module running in stand-alone mode

The columns and areas of the Binary / Analog Inputs tab shown in figure 4-22 are explained below:

(1) "Navigation Bar"

If a CMB IO-7 and a CMC test set or only a CMB IO-7 with more than one input module is selected in the General tab, a navigation bar is displayed on the left side of the page to ease the handling of the potentially high number of inputs. The navigation bar contains one entry for the CMC inputs and one entry for each input module of the CMB IO-7. Clicking an entry in the navigation bar causes the table to be scrolled horizontally and vertically to display the inputs and the corresponding wiring matrix area in the visible part of the dialog.


In the heading area of the wiring matrix the test set information is displayed (test set type, offline or online state, input configuration, connector). The cells for the input configuration are arranged in 4 or 5 lines as follows (exception: older CMC 56 where only positive or negative biasing can be selected):

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• "Function"

For a CMC 256 with EnerLyzer option, for example, the binary inputs can have analog inputs mapped to them. Thus, their function can be switched between analog voltage inputs, analog current inputs, binary inputs, and counter inputs. All other CMC test sets only allow switching between binary and counter inputs. CMB IO-7 only has binary inputs; no switching is possible.

• "Potential Free"

Check this checkbox for potential-free binary or counter inputs. If it is unchecked, the input is potential-sensing.

• "Nominal Range"

Nominal voltage of potential-sensing binary or counter inputs, or the nominal range of analog voltage or analog current inputs.

• "Clamp Ratio" (only CMC 356/CMC 353/CMC 256plus/CMC 256)

Clamp ratio for current inputs (V/A).

• "Threshold"

Threshold voltage for potential-sensing binary or counter inputs.



(5) The "Test Module Input Signal" column is not available in the global Hardware Configuration. In the "Test Module Input Signal" column the input signal of the test module is assigned to the test object terminal specified in this line. The selection menu only allows signals that an individual test module knows about and that are appropriate for the wired connector.

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to "Binary / Analog Inputs Tab".


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4.6.10 Binary Outputs Tab

In the Binary Outputs tab the usage of the binary outputs is defined. In this tab all available outputs are displayed according to the test hardware definition in the General tab.

Note: The binary outputs of a CMB IO-7 can only be configured in the global Hardware Configuration and in the Hardware Configuration of test modules which are able to support CMB IO-7.

Figure 4-23:Binary Outputs tab of a test module running in stand-alone mode

The columns and areas of the Binary Outputs tab shown in figure 4-23 are explained below:

(1) "Navigation Bar"

If a CMB IO-7 and a CMC test set or only a CMB IO-7 with more than one output module is selected in the General tab, a navigation bar is displayed on the left side of the page to ease the handling of the potentially high number of outputs. The navigation bar contains one entry for the internal outputs of the CMC test set and one entry for each output module of the CMB IO-7. Clicking an entry in the navigation bar causes the table to be scrolled horizontally and vertically to display the outputs and the corresponding wiring matrix area in the visible part of the dialog.


In the heading area of the wiring matrix the test set information is displayed (test set type, offline or online state, relay or transistor output (if applicable), connector).


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3

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(5) The "Test Module Output Signal" column is not available in the global Hardware Configuration. In the "Test Module Output Signal" column the output signal of the test module is assigned to the test object terminal specified in this line. The selection menu only allows signals that an individual test module knows about and that are appropriate for the wired connector.

For additional information please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to "Binary Outputs Tab".


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4.6.11 DC Analog Inputs Tab

In the DC Analog Inputs tab the usage of the analog inputs is defined.

Note: CMB IO-7 does not have analog inputs. Due to this, the DC Analog Inputs tab is empty if the only test set selected in the General tab is a CMB IO-7.

Figure 4-24:DC Analog Inputs tab of a test module running in stand-alone mode

The columns and areas of the DC Analog Inputs tab shown in figure 4-24 are explained below:


In the heading area of the wiring matrix the test set information is displayed (type, offline or online state, input ranges, connector). For a CMC 356/CMC 353/CMC 256plus/CMC 256, the input range of the current input can be selected: ± 20 mA or ± 1 mA.



(4) The "Test Module Input Signal" column is not available in the global Hardware Configuration. In the "Test Module Input Signal" column the input signal of the test module is assigned to the test object terminal specified in this line. The selection menu only allows signals that an individual test module knows about and that are appropriate for the wired connector.

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4.6.12 IRIG-B & GPS

On the IRIG-B & GPS tab you configure the trigger and synchronization setup and, if the CMC test set works as IRIG-B generator, specify the time code parameters.

Note: When doing end to end testing, make sure to use the same synchronization mode, i.e., either GPS or IRIG-B, on all involved CMC test sets1.

First select your current test setup from the upper left list of available configurations. According to your selection, the picture below the list shows a typical setup of the hardware components.

<not used>

Neither a GPS nor an IRIG-B time reference is used for synchronization. On the test module's Trigger tab, select a binary or a user interaction trigger condition, or none.

Trigger via CMGPS

A CMGPS synchronization unit is connected to the test sets' external Interface input (a connector at the rear side). The trigger is generated from the CMGPS output pulses. More settings are not required on the IRIG-B & GPS tab.

On the test module's Trigger tab, select the corresponding GPS trigger condition ("Pulse from CMGPS..." or "External trigger"). The test start time and trigger period are set in the Time Trigger Configuration (click the toolbar icon ).

Trigger via IRIG-B

The CMC test set works as IRIG-B receiver. An IRIG-B generator (a third party product; e.g., a satellite synchronizing clock) is connected to the CMC test sets' external Interface input via a CMIRIG-B. The IRIG-B generator is connected to IRIG-B/PPS IN, the test object to PPX OUT, the CMC test set to CMC.

1. CMC 356, CMC 353, CMC 256plus and CMC 256.

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The trigger is generated from the received IRIG-B time reference. The PPX OUT pulse sequence is in synchronization with the CMIRIG-B input on IRIG-B/PPS IN. More settings are not required on the IRIG-B & GPS tab.

On the test module's Trigger tab, select the corresponding IRIG-B trigger condition ("After number of IRIG-B pulses" or "External Trigger"). The test start time and trigger period are set in the Time Trigger Configuration (click the toolbar icon ).

IRIG-B Generator Master

The CMC test set works as IRIG-B generator and provides its generated time reference to the CMIRIG-B, CMC input. At the CMIRIG-B output IRIG-B OUT the time reference is available for the test object (e.g., a phasor measurement unit).

The pulse sequence at PPX OUT (fixed to 1 pulse per second) is in synchronization with CMC's internal time base.

Operating the CMC test set as IRIG-B generator enables the IRIG-B parameters section at the right.

IRIG-B Generator following PPS

The CMC test set works as IRIG-B generator following an external pulse sequence (1 pps) fed into the IRIG-B/PPS IN input. CMC provides its generated time reference to the CMIRIG-B, CMC input. At the CMIRIG-B output IRIG-B OUT, the time reference is available for the test object .

The pulse sequence at PPX OUT (fixed to 1 pulse per second) is in synchronization with the external pulse sequence.

The absolute start time for the IRIG-B output is generated from the IRIG-B Source Settings at the right of the picture. The CMC triggers on PPX sequence.

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IRIG-B Generator following GPS

The CMC test set works as IRIG-B generator following 1 pps pulse sequence from a CMGPS synchronization unit fed into the CMGPS input. CMC provides its generated time reference to the CMIRIG-B input CMC. At the CMIRIG-B output IRIG-B OUT, the time reference is available for the test object.

The pulse sequence at PPX OUT (fixed to 1 pulse per second) is in synchronization with the 1 pps pulse sequence from the CMGPS unit.

The absolute start time for CMIRIG-B and CMGPS is generated from the IRIG-B Source Settings at the right of the picture. The CMC triggers on PPX sequence.

If you see this symbol next to an IRIG-B configuration, this particular configuration will not work with the connected hardware. Why does that happen? The specific GPS and/or IRIG-B settings are saved with the test document of the respective test module. Once this test document is-reopened, but this time with a different hardware connected - a hardware that does not support the IRIG-B configuration -, this symbol notifies you about this discrepancy.

"Only test if synchronized to ext. time base"

This option applies to the PermaSyncTM functionality (see ”Synchronizing to an external timebase” at section 6.1 on page 114) and is availabe for the configurations Trigger via IRIG-B, IRIG-B Generator following PPS and IRIG-B Generator following GPS; i.e., for configurations that use an external IRIG-B time reference to synchronize the CMC test set's internal time base. Accordingly, it requires a CMC 256 test set with the NET-1 option, a CMC 256plus test set in standard version with Ethernet ports (not with PAR-1 option), a CMC 353 or a CMC 356 test set.

In addition, enabling the Only test if synchronized to ext. time base option requires a test module-specific so-called "Local Hardware Configuration". In a "Global Hardware Configuration, i.e., in a Hardware Configuration whose specified parameters apply to all subsequent test modules throughout a Control Center document, this option is disabled. More information about the distinction between "Global" and "Local" Hardware Configurations can be found at chapter 4.1.1 ”What is the Hardware Configuration” on page 36 and the subsequent chapters.

• Select the option Only test if synchronized to ext. time base to only start the test if the CMC test set is able to syncronize to the external IRIG-B time reference. If the CMC test set cannot syncronize, the test will not start.

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• Clear this option to start the test at any rate. If the CMC test set should not be able to synchronize to the external IRIG-B time reference, the test will start with the test set's internal time base as reference, bypassing the external PPS.

What prevents a CMC test set from syncronizing to an external PPS?

Naturally, a synchronization of a CMC test set is only meaningful when the synchronization source, i.e., the external time base, is highly accurate. The Test Universe software (or more precise: the CM Engine component) verifies this accuracy, and if the external time base exceeds an offset of ± 10 ppm or a jitter of 2 ppm, the signal is assessed as inadequate. The CMC test set will then stay "not externally synchronized", and with the option Only test if synchronized to ext. time base selected, the test will not start.

The test module's status bar holds an icon that shows whether or not the CMC is synchronized to the external time time base ( = CMC synchronized to external time base; = CMC not synchronized to external time base). Position the mouse cursor over this icon for about a second; the ToolTip displays the average offset and the maximum jitter in ppm.

In addition, both the quality assessment and the synchronization status (CMC synchronized/not synchronized) are written to the CM Engine log file - a file with the extension .log with a user-created name and path.

Furthermore, once a test was executed, its test report will hold an entry showing whether or not the test was executed synchronized to external time base, regardless of the actual setting of the Test only if synchronized to external time base option.

Note: The first-time evaluation of the PPS signal, in the event that the CMC test set is not yet synchronized, may take up to 11 seconds. With one of the above listed configurations selected, this evaluation phase starts the moment the Hardware Configuration is closed by clicking the OK button.

When CMC test sets are connected via Ethernet and controlled by so-called "Sampled Values" data streams, also those data streams can be synchronized. However, certain limitations apply.

Read more about these limitations in the Hardware Configuration Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the "Synchronization when using Sampled Values" topic in the "IRIG-B & GPS" section.

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Telegram format

The "Telegram format" field shows the time code format configuration that the CMC test set will generate based on your selections at "Modulation" and "Coded Expressions". Test Universe supports the IRIG-B telegram formats B00x and B20x, at which B inicates the format type (B = IRIG-B); digit two the modulation technique (see below); digit three the counts included in the message (frequency/resolution) and digit four (x) the coded expressions.

Time code format B has a time frame of 1 second with an index count of 10 milliseconds (100 pps) and contains time-of-year and year information in a BCD format, and seconds-of-day in SBS (straight binary seconds); see coded expressions below.

In case of the CMC-generated IRIG-B time code format, digit three of the telefram format always remains 0, which deciphers as "no carrier/index count interval".

More information can be found in the IRIG SERIAL TIME CODE FORMATS publication at the url https://wsmrc2vger.wsmr.army.mil/rcc/manuals/200-04/index.html.

Modulation

Modulation technique, digit 2 of telegram format:

• PWM / DC level shift; telegram format B00x (pulse width modulation)

• Manchester II = modified Manchester modulation; telegram format B20x.

Coded Expressions

Digit 4 of telegram format:

0 BCDTOY, CF, SBS

1 BCDTOY, CF

2 BCDTOY

3 BCDTOY, SBS

4 BCDTOY, BCDYEAR, CF, SBS

5 BCDTOY, BCDYEAR, CF

6 BCDTOY, BCDYEAR

7 BCDTOY, BCDYEAR, SBS

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The settings here (single or in combination) define the 74-bit time code that contains 30 bits of BCD time-of-year information in days, hours, minutes and seconds, 17 bits of SB seconds-of-day, 9 bits for year information and 18 bits for control functions (coded expressions).

Control Functions: All time code formats reserve a set of bits known as control functions (CF) for the encoding of various control, identification, and other special purpose functions. The control bits may be programmed in any predetermined coding system. For Format B, 18 control functions (control bits) are available. Control functions are presently intended for internal range use, but not for interrange applications; therefore, no standard coding system exists. The inclusion of control functions into a time code format as well as the coding system employed is an individual user defined option. OMICRON supports control functions that comply with the standard IEEE C37.118.

Example:

A telegram format designated as B006 is deciphered as follows: Format B, pulse witdh modulated, no carrier/index count interval, coded expressions BCDTOY, BCDYEAR.

IRIG-B Source Settings

At "Date:" and Time:" set the absolute start time for the CMC-generated IRIG-B time code format.

Once you set a date and a time of your choice, click OK or Apply. CMC starts the IRIG-B time code format output with that date/time.

Set date and time at test start

If you select "Set date and time at test start", the IRIG-B generator (the CMC test set) is set to the time specified at "Date:" and Time:" the moment you start a test in the respective test module. Please note that this applies to each individual start of a test; therefore, you won't get a continous time reference.

Without this option the IRIG-B time reference remains unchanged when you start a test; i.e., the time reference continues normally.

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4.7 CMB IO-7 Hardware Option

To change the configuration of a CMB IO-7 test set which is selected/displayed in one of the combo boxes of the "Test Set(s)" group box in the General tab, click the "Details" button next to the combo box.

The CMB Configuration Details dialog box is opened. In this dialog box the configuration of the CMB IO-7 test set is represented in graphical form by showing the CMB rear side with the module connectors of the mounted IO modules.

Note: The AUX DC voltage of a CMB IO-7 test set can only be changed using the AUX DC utility from OMICRON.

Figure 4-25:CMB Configuration Details dialog box in offline mode

The behavior of the CMB Configuration Details dialog box in online mode differs from the behavior in offline mode. This is explained in the following chapters 4.7.1 and 4.7.2.

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4.7.1 Behavior in Online Mode

In online mode, i.e. if the CMB IO-7 is connected to the PC and switched on, the dialog box shows the actual configuration of the connected test set.


(1) The "Module Type" combo boxes display the types of the equipped IO modules. The combo boxes of empty plug-in slots are empty and disabled. The combo boxes of equipped plug-in slots contain only the designation of the module actually mounted in this slot. No other module type can be selected from the combo boxes.

(2) The "Rear View" area in the middle of the dialog box shows which plug-in slots are equipped with IO modules.

(3) The "Module In Use" checkboxes are checked for all equipped modules. This means that the inputs or outputs of all equipped IO modules are available and displayed in the Binary / Analog Inputs or Binary Outputs tabs. To reduce the number of available inputs and/or outputs each physically available module can be disabled by unchecking the corresponding checkbox "Module In Use".

Click O K to apply the selected configuration.

4.7.2 Behavior in Offline Mode

In offline mode, the configuration of the CMB IO-7 test set which was connected for the very first time is displayed by default. In offline mode any combination of supported IO modules can be defined.

Note: Input modules must be equipped in an ascending order beginning from slot 1 (1, 2, ...), output modules must be equipped in a descending order beginning from slot 7 (7, 6, ...).


(1) In the "Module Type" combo box of the corresponding plug-in slot, select the wanted module type or the entry "Empty".

(2) The "Rear View" area in the middle of the dialog box shows which plug-in slots are equipped with IO modules.

(3) Using the "Module In Use" checkboxes you can enable or disable the inputs or outputs of individual "equipped" IO modules. If the "Module In Use" checkbox of an IO module is unchecked, the inputs or outputs of this module are not displayed in the Binary / Analog Inputs or Binary Outputs tabs.

Click O K to apply the selected configuration.

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The OMICRON Control Center

5 The OMICRON Control Center

The OMICRON Control Center (OCC) simultaneously works as a test manager, word processor and script editor. The OCC is the starting point for every test document and extends the usefulness of every test module.

5.1 Test Modules in a Test Document

A test module focuses on an area of protection or measurement device testing. It can be embedded in a test document or run stand-alone. Double-clicking a test module that is embedded in a test document starts up that test module's software application.

Figure 5-1:Example of an OCC test document containing multiple Test Objects (see also section 5.1.4), Hardware Configurations and Test Modules

OCC Test Document

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Figure 5-1 depicts a test document used by the OCC. It shows how a single definition for a Test Object can be used by multiple modules. Likewise, a global definition for the Hardware Configuration can be used by multiple test modules while still maintaining the ability to tweak the hardware definition locally.

Specific test settings are made through the individual application’s interface. The test process can be initiated either from the module or from the OMICRON Control Center. The actions that a test module takes after assessing the pass/fail results of the test can be defined.

5.1.1 Multiple Test Modules in a Single Test Document

When creating comprehensive overall tests, test modules can be embedded multiple times in an OCC test document for each type of test to be performed.

Each time a test module is embedded, its properties can be specified so that different aspects and functions of the test object can be tested.

Embedding the same test module repeatedly into one OCC test document can be useful for testing, say, all fault loops for a test object with similar (but not necessarily identical) settings.

5.1.2 Inserting a Group into an OCC Document

In Control Center, "grouping" means putting together objects to a "logical group". You would most likely group consecutive test modules that, for example, have similar tasks within a test procedure or tasks that complement one another. A group, however, may also contain another Test Object or Hardware Configuration. One mouse click enables/disables the entire group with all objects in it. Just as single objects can be added to a group by dragging/dropping them, entire groups can be dragged and dropped, too.

A group of consecutive test modules:Figure 5-2:A group of consecutive test modules

Test Document "Test.occ"

Group 1Legend:

TO = Test Object

HWC = Hardware Configuration

TM = Test Module

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To name/rename a group, right-click the group in the Navigation Map, Report View or List View. On the context menu, click the command Test Properties.

Just as to single objects, context menu commands like cut/copy/paste can be applied to groups, too.

How to create a group

On the Insert pull-down menu click Group.... This inserts a new group at the current cursor position. If the current cursor position should already be inside a group, a nested group (a sub-group within this group) is created.

Nested groups:Figure 5-3:Nested groups

Rename a group like any other object in an OCC document: In the Control Center Navigation Map or the List View, right click the group's name and select the Test Properties command on the context menu (equivalent to the Test Properties command on the Edit pull-down menu). To add objects to a group, use either the drag and drop method, or the cut/copy/paste commands on the context menu or the Edit pull-down menu. This works in the Navigation Map, the List View and the Report View. In Report View, beginning and end of a group is indicated by a dotted line containig the name of the group at the begining and the end.


Group 1

Group 1-1

Legend:

TO = Test Object

HWC = Hardware Configuration

TM = Test Module

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Active/inactive objectsAn object within a group can be set active or inactive by selecting or clearing the check box next to it. The same can be applied to an entire group by using its check box.

Note: Items set "inactive" in the List View are suppressed from print-out by default. If an entire group is set "inactive", also text written in it is suppressed from print-out. To change that suppression of inactive items, click the Settings command on the Test menu, and select the option "Print Inactive Modules" on the Overall Test tab.

Selection of Multiple ObjectsThe context menus available in List View and Navigation Map provide commands like cut/copy/paste/delete etc. that can be applied to all selected objects within a group. To select more than one object at a time, hold the <Shift> key down and either successively click the objects of your choice or select a range by using the cursor up/down (↑ / ↓) keys.

Additional Test Objects or Hardware Configurations in GroupsThe majority of test documents contain exactly one Test Object and one Hardware Configuration, and their settings and parameters apply globally to all test modules embedded in the test document. The use of additional Test Objects and/or Hardware Configurations in groups requires some caution and awareness.

Since the assignement of TO and HWC configurations to test modules is quite logical and straight-forward in the examples 1 and 2, example 3 shows an additional Test Object in a group and the resulting configuration assignment.

Example 1 - Global Test Object and Hardware Configuration:Figure 5-4:Example 1 - Global Test Object and Hardware Configuration


Group 1The first objects in the test document are Test Object and Hardware Configuration. There are no more consecutive TO and HWC objects, i.e., the first two serve as global configuration objects for all test modules, including the ones of "Group 1".

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Example 2 - Global Hardware Configuration with different Test Objects:Figure 5-5:Example 2 - Global Hardware Configuration with different Test Objects

Example 3 - Additional Test Object in a group:Figure 5-6:Example 3 - Additional Test Object in a group

Note: There may be certain applications where TO or HWC nesting like this may come in handy. In general, however, it is advisable to refrain from adding Test Object and/or Hardware Configurations to groups. We recommend to confine yourself to adding test modules to groups.

TO 1 serves as configuration object for consecutive test modules TM 1 and TM 2. Then a new Test Object follows - TO 2. TO 2 now serves as local configuration object for TM 3.

There is only one Hardware Configuration in this test document, therefore it serves as global Hardware Configuration object for all test modules.

TO 1 serves as configuration object for the consecutive test modules TM 1 and TM 2. The first test module of Group 1, TM 3, refers back to its preceding TO, which is still TO 1. The "opening" of a group does not interrupt the binding to the preceding TO and HWC.

Then a new Test Object follows in Group 1 - TO 2. TO 2 interrupts the binding to the preceding TO and now serves as local configuration object for the following TM 4.

TM 5, however, refers back to TO 1 since it is not part of Group 1.

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5.1.3 LinkToXRIO for the "Activate" Flag

Not only individual test module values (current, voltage, phase angle, frequency ...) can be linked to local or global Test Object parameters via the LinkToXRIO function. Also the "activate" flag of a test module or a "group" (set in List view or in the Navigation Map of the Report view of the Control Center) can be linked to a Test Object parameter. That way, the on/off status of test modules, or groups of test modules, that are embedded into a Control Center (OCC) document is controlled directly by a Test Object parameter.

Note: To control the "active" flag via LinkToXRIO, the respective test modules or groups must be tied to a global Test Object; i.e., a Test Object embedded into the OCC document. Otherwise, LinkToXRIO is not possible.

Linking the "active" flag is only possible via a parameter of type "Boolean", i.e., a parameter whose value can be "true" or "false". To learn how to create blocks and parameters, please read section 3.3 ”Test Object Parameters” on page 23..

Link the "activate" flag to a control parameter

1. If not done yet, open the OCC document of your choice or create a new one.

2. Go to Control Center's List view or the Navigation Map of Report view. In both views you can either activate or deactivate test modules and groups.

3. To link either one, test module or group, to one of the test object parameters, right-click it in List view or Report view, and select the L I N KT OX R I O command from the context menu.

4. The LinkToXRIO dialog box provides all the Boolean parameters that belong to the associated Test Object. Browse the tree to the parameter of your choice. Click O K to establish the link. This closes the LinkToXRIO dialog box. The test module's/group's symbol changes to if the Boolean parameter it links to is true ("activated"), or to if it's false ("not activated").

Important to understand:

In a tree structure of groups and test modules only one item of a branch (a group or a test module) can be linked at a time, i.e., each of these branches can have either none or a max. of one test module or group that is linked.

In a hierarchical structure in which a test module is linked, the group that contains that test module cannot be linked once more; it will be locked. The reason for that is that it is not possible to enforce two different activation values on the same branch.

The same applies if the group is linked: the test modules or sub-groups of that linked group cannot be linked once more; they are locked.

For all locked items of a branch, LinkToXRIO is disabled. This is signaled by the symbol (or , respectively).

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The symbols and their meaning:

Active

Inactive

Partially active, i.e., a group which has items that are active and inactive.

LinkToXRIO to a "Value = true" (activated) control parameter

LinkToXRIO to a "Value = false" (deactivated) control parameter

Active locked, i.e., a group with active items or an active test module locked by a link on the branch.

Inactive locked, i.e., a group with inactive items or an inactive test module locked by a link on the branch.

Partially active locked, i.e., a group locked by a link on the branch. The group holds both active and inactive items.

Active invalid LinkToXRIO

Inactive invalid LinkToXRIO

To change a link, right-click the respective test module or group and select L I N KT OX R I O . . . from the context menu.

To remove the link, select R E M O V E L I N K from the context menu.

If you position the cursor over an established LinkToXRIO, a ToolTip displays the name of and the path to the parameter. The ToolTip differentiates between absolute and relative mode.

Link errors

Each linked test module or group is tied to a particular global Test Object. Otherwise LinkToXRIO is not possible.

Moving or copying linked items outside the range of their associated Test Object into the range of another Test Object will result in an attempt to re-establish the links to the new Test Object. If the parameters to link to are found in the new Test Object, the link is re-established, and the value will be updated. If the parameters to link to are not found in the new Test Object, or no associated Test Object can be found, the links will be invalidated.

The same applies when Test Objects are inserted, moved, copied or deleted. If possible, the links that belong to that Test Object will be updated in the way described above. Else, they will be invalidated.

The link error indication, a symbol (or , respectively), keeps the last active/inactive status symbol, however, indicates an invalid link by turning red.

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The same link error indication occurs if, for example, the linked control parameter is inadvertently deleted from the associated Test Object, or if the entire Test Object itself is deleted. Both actions result in broken links.

Both the status bar and the Status History window show descriptive error messages. Furthermore, a ToolTip displays an "Invalid link" message with additional information.

5.1.4 Multiple Test Objects in a Single Test Document

An OCC test document is not restricted to only one Test Object. However, with the introduction of XRIO with Test Universe 2.0, inserting multiple Test Objects into one OCC document has lost its significance.

Test object parameters are defined only once at a central place of the Test Universe software, the Test Object, which can contain multiple function blocks.

For details, please refer to the chapters 3.3 ”Test Object Parameters” on page 23 and 3.2 ”XRIO” on page 20.

The functionality for inserting multiple Test Objects into one OCC document still exists, however, for reasons of downwards-compatibility only.

5.1.5 Multiple Hardware Configurations in a Single Test Document

An OCC test document is not restricted to only one Hardware Configuration . Whereas a global Hardware Configuration can be used by multiple test modules, sometimes testing requires that new wiring to the test hardware or to other test hardware be carried out. Thus, a new Hardware Configuration is required. It is possible to have the execution of the test document paused at that point precisely for this purpose.

Figure 5-1 shows an example of a test document with more than one Hardware Configuration. More information about Hardware Configuration can be found in chapter 4 ”Setting Up the Test Hardware” on page 35.

5.1.6 Variable Information in Fields

Every test document generally has information associated with the test report that must be kept up to date. Sometimes this information is available from the system or user profile. This information can be inserted into the test document using fields.

The OCC supports two types of fields:

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System Fields

Include present date, time of day, creation date, date of last modification, date of test, date printed, etc.

User-Defined Fields

Include company name, title of the document, etc.

User-defined fields are created using F I L E | P R O P E R T I E S . The fields are inserted into the document using I N S E R T | F I E L D . V I E W | O P T I O N S can be used to set general information, such as the phase descriptions.

5.2 Test Reports

A test module automatically generates a report once a test is executed.

Per test module, OMICRON provides a test report template that is automatically installed with the Test Universe software. This template contains two pre-defined test report forms, a "short form" and a long form". These two forms differ in the number of selected blocks and items that will later appear in the final test report.

Each test module generates its test report reflecting the settings of the selected form. If a form does not suit your requirements, it can be customized. In addition to that, new forms can be added, unused ones deleted.

Working with test reports can be differentiated in three steps:

1. Using a pre-defined test report form (chapter 5.2.1 on page 94)

2. Customizing a test report form (chapter 5.2.2 on page 95)

3. Advanced features

– adding or deleting test report forms (chapter 5.2.3, page 96)

– defining a new test report default (chapter 5.2.3, page 97)

– reset a test report to default (chapter 5.2.3, page 97)

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5.2.1 Using a Pre-defined Test Report Form

Figure 5-7:Using a pre-defined test report form

Each test module has its own test report template.

In the test module, select P A R A M E T E R S | R E P O R T to open the dialog box Report Settings.

In the "Report Form:" combo box, specify whether the test report is to be in S H O R T F O R M or in L O N G F O R M. If there are already user-defined test report forms, they will also be listed (refer to ”Defining a new test report default” on page 97).

Click O K .

The test report is composed and generated according to the settings in the selected test report form.

Test Module, e.g. State Sequencer

1

2

3

Test ReportTest Report Template

1

2

3

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5.2.2 Customizing a Test Report Form

Any change made to the test report settings can be saved to this test report.Figure 5-8:Customizing the currently open test report, and saving the changes

Each test module has its own test report template.

In the test module, select P A R A M E T E R S | R E P O R T to open the dialog box Report Settings.

In the "Report Form:" combo box, specify whether the test report is to be in S H O R T F O R M or in L O N G F O R M. If there are already user-defined test report forms, they will also be listed (refer to ”Defining a new test report default” on page 97).

Clicking the "Define" button opens the Define Report Forms dialog box, where the composition of the test report is defined.

The check boxes in this dialog box symbolize the available blocks and items to be included in or excluded from the test report. They are arranged in a tree structure quite similar to Windows Explorer, and display the settings of the selected test report form.

Selecting a check box includes the respective block or portion in the test report form, clearing the check box excludes it.

Note that selecting a block automatically includes all of its subordinated items (if any). Click the "+" symbol to expand a collapsed tree structure.

Test Module, e.g. State Sequencer

1

2

Test Report

3

4+

Test Report Template

1

2

3

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5.2.3 The Advanced Features

Clicking the "Advanced" button expands the dialog box and displays the additional features, clicking it once more collapses the dialog box again.

Adding test report forms

Rather than using "Long Form" and "Short Form" only and overwriting their settings to suit your needs, new report forms with user-defined names can be created.

– Click "Add..." to open the dialog box Add Report Form.

– At "Name:" enter a name of your choice for your new test report form.

– In the combo box: "Copy from:" select an existing test report form, preferably one that already meets your requirements best. This forms serves as the basis for your new test report form.

– Clicking O K closes this dialog box and creates a new test report template with the name you specified.

– You can now customize the new form according to your specific requirements by including or excluding items of your choice in the tree structure to the left.

– Click O K to close the dialog box Define Reports and to save the new test report form with all of its current settings. From now on, this test report form will be available for selection from the combo box "Report Form:".

Deleting test report forms

To delete test report forms from the list

– select the test report form of your choice from the "Report Form:" combo box

– click the "Delete" button.

Note that a minimum of two test report forms is required. The deletion will not work if you try to delete more forms and would fall short of an amount of two.

Clicking OK saves the settings to the test report, and returns to the Report Settings dialog box.

Note that the changes apply to this particular test report only. The feature of saving changes to a user-specific test report template is found under "Advanced".

4

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Defining a new test report default

Using the S E T A S D E F A U L T feature defines the current test report forms with all of their settings to be the default for all future test reports that are created with this test module, e.g., State Sequencer.

Note that the "Set as Default" button is only enabled if the settings of the currently open test report forms differ from the default.

Reset to Default

The feature R E S E T T O D E F A U L T discards all changes made to the currently open test report forms and resets all of its settings to their default.

This reset includes new forms that may have been added, or forms that may have been deleted since this test report was last loaded.

Note that the "Reset to Default" button is only enabled if the settings of the currently open test report forms differ from the default.

Apply New Default to Complete OCC Document

The check box "Apply New Defaults to Complete OCC Document" comes into effect when more than one test module of this kind, e.g., more than one State Sequencer, is embedded into an OCC document (refer to 5.1.1 ”Multiple Test Modules in a Single Test Document” on page 86).

Selecting this option applies the change to the test reports of all embedded sessions of this particular test module at once, e.g., to all test reports of all embedded State Sequencer sessions within this OCC document.

Note that this feature is only enabled if

1. the test module is embedded into an OCC document

2. and a new default was defined (with S E T A S D E F A U L T) or an old one restored (with R E S E T T O D E F A U L T ).

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5.3 Running Tests from the OCC

The OMICRON Control Center controls the tests procedures. This control includes the configuration of the embedded test modules, and the starting and stopping of tests.

5.3.1 Selecting Test Modules for Test

Each test module embedded in an OCC test document can be individually selected for or cleared from the participation in an overall test. In either the OCC List View or the Report View’s navigation map, select the test modules that you want to include in the test or clear the ones you don’t need.

Figure 5-9:Selected modules are part of the test, cleared ones not

5.3.2 Verifying the Connected Hardware

"Verifying the hardware" means checking whether the connected hardware is suitable to execute the test of the selected test module and its set parameters.

To verify the hardware configuration for a single test module:

1. Select the test module of your choice either from the Report View’s navigation map or from the List View by highlighting it.

2. Select T E S T | V E R I F Y H A R D W A R E or click the respective toolbar icon.

To verify the hardware configuration for more than one or all of the test modules in the OCC test document:

1. In List View or in Report View, select the test modules of your choice by means of the boxes to the left of the list (see figure 5-9).

2. Select T E S T | V E R I F Y H A R D W A R E A L L or click the respective toolbar icon.

If the above mentioned menu items are disabled, you need to clear the test results first.

Report View’s navigation mapList View

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5.3.3 The Unit Manager

The Unit Manager is a feature available in most of the Test Universe test modules. It toggles the test parameters’ units and values between:

• time in seconds or cycles

• primary or secondary values

• absolute or relative values.

The unit settings are test module-specific, i.e., if a test document is saved, its test-specific unit settings are saved with the document. If this test document is later opened, the units and values are set accordingly.

To switch between the units:

1. On the test module’s V IEW menu, click UNITS

2. Select the unit that is to be applied to a value.

Alternatively you can use the the toolbar icons.

Figure 5-10:Unit Manager toolbar

Please also refer to the Help. Launch the Help of your test module, click the Menus, Toolbar, Status Icons entry in the table of contents and navigate to "Toolbar(s)". Under the "Unit Manager" subheader you can find important additional informations.

Toggle time between seconds and cycles

Toggle between absolute and relative values

Toggle between primary and secondary values

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5.3.4 Start/Continue a Test

The OMICRON Control Center lets you run either

a) single tests of individual test modules embedded in the OCC test document

b) or an overall test of all (selected) test modules embedded in the OCC test document.

In the latter case, the single tests are performed in sequential order. Status information about the progress of the test is displayed in the Status Bar (or the Status History Bar).

Furthermore, the OCC lets you to specify what should happen if a selected single test from the OCC test document fails: should the execution of the entire test document be terminated when a single test1 fails or when a test step2 fails? To do so, select T E S T | S E T T I N G S.

To start a single test of an individual test module:

1. In List View or in Report View, select the test module of your choice by highlighting it. To rerun a test, clear the existing results first.

2. Select T E S T | S T A R T/ C O N T I N U E .

To start a sequence of tests of several selected or of all test modules:


2. Select T E S T | S T A R T/ C O N T I N U E A L L .

If an embedded test module was started individually from the OCC test document, selecting T E S T | S T A R T / C O N T I N U E within that test module does not start or continue the OCC test procedure but only this particular test module’s portion of it.

1. Test: All test steps of a single embedded test module.2. Test step: One test step of a single embedded test module.

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5.3.5 Stopping or Pausing a Test

To stop a single test of an individual test module:

1. In List View or in Report View, select the test module of your choice by highlighting it.

2. Select T E S T | S T O P.

3. The running test step is aborted. All currents and voltages are immediately shut off.

If the "Start/Continue" button is then clicked, the current test step re-runs.

To pause an individual test:


2. Select T E S T | P A U S E.

3. The currently running test step is finished. Then the test pauses.

If the "Start/Continue" button is then clicked, the test continues with the next step test; it will not start over at the beginning, if it already finished a step.

5.3.6 Clearing Results

The results of a test run are written directly to the test document together with the other test module information. If a test (individual or overall) should be re-run, the existing results have to be cleared from the test document.

To clear the results of a single test of an individual test module:


2. Select T E S T | C L E A R .

To clear the results of more than one single test:


2. Select T E S T | C L E A R A L L .

If an embedded test module was started individually from the OCC test document, selecting T E S T | C L E A R only deletes this particular test module’s portion of the test results - not all test results of the entire OCC test procedure.

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5.3.7 Changing a Passed/Failed Test Assessment

Upon completion of a test, each test module provides information about whether the test was successful or not. These results are evaluated and displayed in the OCC. An overall result is derived from these results which represents the assessment of the entire OCC test document. These are available as document fields. Fields can be included in the document and updated automatically.

If the user does not agree with the automatic assessment of a test module, the test assessment may be corrected manually to achieve a correct overall assessment.

However, all actual test results cannot be changed or manipulated. Test results can only be cleared and re-tested.

1. In List View or in Report View, select the test module for which the assessment is to be changed by highlighting it.

2. Select T E S T | A S S E S S P A S S E D or T E S T | A S S E S S F A I L E D.

In the test report, a message appears alongside the assessment saying that it is a manual assessment.

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5.4 Test Document Layout

The entire look and feel of the test document can be changed to suite user-defined needs. The Report view (V I E W | R E P O R T V I E W) in the OMICRON Control Center is a rudimentary word processor. It permits page layout, paragraph layout, and character formatting.

Moreover, the Report view allows test modules to be embedded and manipulated.

In addition, other objects like graphic images or text can be embedded into a test document. These could be schematic or wiring diagrams or other useful images that help explain how the test is to be carried out.

5.4.1 Page Setup

F I L E | P A G E S E T U P. . . opens a dialog box where the paper size, orientation of print, and margins can be specified, as well as a paper source for printing. The Printer dialog box may be opened from here to set printer specific parameters.

The Page Setup dialog box cannot be used for printing. Instead, F I L E | P R I N T . . . is used for printing after its settings have been made.

5.4.2 Paragraph Formatting

F O R M A T | P A R A G R A P H. . . opens a dialog box that permits specification of paragraph characteristics, such as indentation and alignment. The settings apply to the selected paragraph or to new paragraphs created with a carriage return (<Enter>) after the current cursor position.

Indentation from the Options tab specifies not only the left and right margins for the paragraph, but also any special first line indenting. The paragraph alignment can be set on a drop-down menu to left-justified, right-justified or centered, or with the icons in the Format Toolbar found at V I E W | F O R M A T T O O L B A R .

Note: If text is selected before performing these actions, text is formatted as specified. Unselected text is not changed. If no text has been selected, then formatting starts from the current cursor position and is reflected in new text. If the cursor is in the middle of a paragraph, the paragraph is reformatted and the paragraphs around it are unchanged.

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5.4.3 Text Font and Colors

Any text font that is installed on the PC that is used to generate or read the test document can be used to format information. We recommend to use common fonts that are available on all systems (e.g., Times New Roman, Arial, etc.).

F O R M A T | F O N T. . . opens a dialog box where the specific font, font style, size, and effects (e.g., colors, strikeout, underline) are specified. These changes are applied to any text that was highlighted before starting this dialog box.

Note: If text is selected before performing these actions, the text is formatted as specified. Unselected text is not changed. If no text has been selected, then formatting starts from the current cursor position and is reflected in new text.

5.4.4 Text Formatting Tool Bar

The text formatting toolbar can be used instead of the F O R M A T pull-down menu to achieve some of the same text formatting effects. To view the toolbar, select V I E W | F O R M A T T O O L B A R.

Figure 5-11:Text formatting tool bar

5.4.5 Headers, Footers, and Page Numbers

Headers are lines of text that appear at the top of every page of a test document, while footers appear at the bottom of every page. Where exactly the headers or footers appear on the page can be determined from the F I L E | H E A D E R/F O O T E R . . . .

The Header/Footer dialog box permits you to enter a position for the header relative to the top of the page and for the footer relative to the bottom of the page.

The fonts that are used in the headers and footers can be changed using the items on the “Format” pull-down menu or the Format toolbar.

Page numbers are inserted into a test document as a field. Page numbers are most common in either the header or the footer of the document, where the number placement can be more accurately controlled and standardized for the entire test document. To insert a page number:

1. Select V I E W | P A G E H E A D E R or V I E W | P A G E F O O T E R for where the page number is to be placed.

2. Insert a "Page Number" field at the required position.

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5.4.6 Object Icons in Test Document

Objects that are embedded in the test document can be displayed either as icons or as information. It can helpful to have only the information displayed that really needs to be considered. Extraneous information can be iconized in the test document so that it is not distracting from other, possibly more important information.

Figure 5-12:Representation of the Hardware Configuration in the report view of a test document as editable information:

or as icon:

It is possible to switch back and forth between these two representations.

1. Select the object whose representation is to be changed.

2. Select E D I T | T E S T P R O P E R T I E S .

3. Select the appropriate radio button setting: either "Display as Editable Information" or "Display as Icon".


Test Equipment

Type Serial number

CMC256-6 EB330D

Performed at Result Details

Not yet performed

Hardware Check

HardwareConfiguration

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5.5 Exporting Data

Test results and data from any Control Center document can be exported into a database-compatible file for later use with other software applications. The file created is of either CSV or XML format.

CSV: The CSV (Comma Separated Values) file format is readable by any common database. Data is written in simple a table format. A selectable Field Delimiter separates the individual values. If a certain value is a text string, the value needs to have a Text Qualifier (the text may contain the character which is used a Field Delimiter). As the naming of Boolean values is not consistent throughout different database programs, the True and False values need to be defined as well.

XML: XML (eXtensible Markup Language) became accepted as a standard for data exchange, particularly between different platforms. XML and related technologies are W3C (World Wide Web Consortium) recommendations.

To export data, use the pull-down menu item F I L E | E X P O R T D A T A . The Export Data dialog box provides a number of additional exporting options.

For more detailled information about these options please refer to the OMICRON Test Universe online. In the Export Data dialog box click the "Help" button.

Note: Some test modules provide the possibility to switch the units from seconds to cycles, from primary to secondary and absolute or relative values (refer to 5.3.3 ”The Unit Manager”). These unit settings are saved with the test document. If this test document is later opened, the units and values are set accordingly. However, please note that the data export treats data with their original base units, i.e., data are exported with absolute secondary values with the time unit seconds - even if set differently in the test module.

Alternatively, for later use with a word processing software the test report can be exported in either ASCII format (Unicode) or RTF format. To do so, click the pull-down menu item F I L E | E X P O R T R E P O R T .

RTF: Rich Text Format, a file format that contains graphics and formatting information. Rich Text Format is used by Microsoft Word or other word processing applications.

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5.6 Protection Levels for Test Documents

A test document can be protected from accidential or unauthorized changes. This is important because a test document can grow to represent a significant amount of time from the responsible test engineer in development, refinement, and maintenance. The test documents become valuable company assets, just like the OMICRON Test Universe equipment and software.

Protection levels restrict both

– the actions a user can carry out in the user interface and in the test reports

– the actions carried out by an application or a user-written script performing automation commands.

To change the protection level of an OCC document, open it. Select F I L E | P R O T E C T . . . to open the Protect dialog box shown in figure 5-13.

Figure 5-13:Protect dialog box for test documents

In the Protect dialog box specify the level of protection required for the current OCC document, assign a password to this document to prevent others from editing the protection settings, or change an existing password.

If the "Old Password" field is active, then the document already has a password assigned to it. This password must be entered before the protection level can be changed. Type the password in the "Old Password" field, and change focus, for example by pressing tab. If the password was correct, the protection levels are now enabled for a change.

Select the protection level of your choice, and type a password for the document in the "New Password" field. Confirm your password by entering it once more in the "Confirm New Password" field.

The new protection level is now set as well as a new document password, which will be needed to edit the protection level again.

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Protection levels of OMICRON Control Center:

No Protection The OCC document is not protected, any user can view or edit it. Its contents can be copied, embedded objects can be dragged to the outside by holding the left mouse key pressed.

No Scripting This option allows viewing and editing the document (just as "No Protection") as well as carrying out a test. It protects editing a script, though.

Script Changes Only A user-written script may change settings, manual changes by the user in the user interface are not permitted.

No Changes This level protects a document's structure from being edited and its contents from being copied. Test modules and subroutines within the document, incl. the tests themselves may be run.

View/Print Only The document may be viewed and printed only. Anything else is protected.

Table 5-1:Protection levels

If the "Old Password" field is active, then the document already has a password assigned to it, and this password should be entered before the protection level can be changed. Type the password in the "Old Password" field, and change focus, for example by pressing Tab. If the password was correct, the protection levels are enabled for change.

Select the new protection level, and enter a new password for the document by entering it in the "New Password" field. Confirm your password by re-entering it in the "Confirm New Password" field.

The new protection level is now set, as well as a new document password, which will be needed to edit the protection level again.

Viewing & printing

Testing Editing Script writing

No Protection yes yes yes yes

No Scripting yes yes yes no

Script Changes Only

yes yes by script only

yes

No Changes yes yes no no

View/Print Only yes no no no

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5.7 OCC Helper Module Pause

The OCC helper module Pause Module starts from the OMICRON Control Center (OCC). Pause Module provides you with a versatile tool for pausing, continuing or stopping OCC test procedures. Wherever in an OCC doument a Pause Module is inserted (e.g., between two test modules that run sequentially), the test procedure stops, (optionally) plays a sound signal, displays a user-defined information or instruction and waits for the user to continue (or stop) the test procedure.

You may insert as many Pause Module instances as you want into an OCC document.

5.7.1 Inserting a Pause Module into an OCC Document

Pause Module is not visible from the Start Page. It can be accessed from the OCC, only.

To insert Pause Module into an OCC document:

1. Start the OMICRON Control Center (OCC).

2. Load an existing OCC test document or compose a new one.

3. If the OCC’s Test Module toolbar is not visible, select V I E W | T E S T M O D U L E S T O O L B A R.

4. On the Test Module toolbar, click P A U S E M O D U L E

(or alternatively select I N S E R T | T E S T M O D U L E | P A U S E M O D U L E).

5. Repeat this procedure as often as needed at the OCC document’s positions of your choice.

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5.7.2 Running a Test With Inserted Pause Module(s)

Figure 5-14 shows an example of a Control Center test document with two inserted Pause Modules. This test procedure would be paused twice: after Distance and after Overcurrent.

Figure 5-14:Example of an OCC test document (navigation map view)

The behavior of the inserted Pause Modules are set in each module individually. In Pause Module, use the following P A R A M E T E R S menu commands:

Font... Set font type, style and size for the runtime information or instruction shown when the test pauses.

Enter the text of your choice for the runtime information or instruction to the designated entry field of the Test View.

User Input Enables/disables a user input field that will additionally appear when Pause Module halts the OCC test procedure. When enabled, an explicit user input is required to continue the paused test.

Sound Enables/disables a notification sound when Pause Module halts the OCC test procedure.

Load Image... Lets you insert a picture of your choice into the runtime information / instruction field. Pause Module supports the graphics formats .bmp, .jpg, .wmf and .emf. Note that this picture will not appear in the test report.

Delete Image Removes the loaded picture from the runtime information/instruction field.

First test procedure pause

Second test procedure pause

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Running the test

1. In the OMICRON Control Center, select T E S T | S T A R T / C O N T I N U E A L L to start the OCC test procedure (i.e., the entire procedure as shown in figure 5-14).

2. When Distance has finished its test, Pause Module pops up its runtime information / instruction and halts the test:

If U S E R I N P U T was enabled on the P A R A M E T E R S menu, this field additionally appears requiring your input. Without an input, the "Continue" button remains disabled. Note that your input will be taken over to the test report.

3. Clicking the "Continue" button resumes the test with the Overcurrent test module. Once Overcurrent has finished its test, the second Pause Module pops up its runtime information / instruction, and the test halts once more.

Continue as mentioned above.

Note: Clicking the "Stop Test" button in any Pause Module terminates the entire OCC test procedure.

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5.8 OCC Helper Module ExeCute

ExeCute starts an executable program, a batch procedure or opens a document that is associated with an application.

Furthermore, ExeCute allows launching an external application out of a Control Center test plan.

5.9 OCC Helper Module TextView

TextView displays the contents of an ASCII text file.

With TextView embedded into an OCC document (with I N S E R T | T E S T M O D U L E | T E X TV I E W or from the Test Modules toolbar), the contents of the text file are updated and displayed in the OCC document during runtime, i.e., while executing the test.

5.9.1 Updating the text file display

Once TextView references to a text file, update the display of the file's contents by left-clicking the "Start/Continue" toolbar icon.

If embedded into an OCC document with other test modules, left-click the "Test All Start/Continue" icon". This will start the test sequence, and in the course of the test TextView will read the actual contents of the referenced text file.

5.9.2 Report View

Change to the Report view to see the contents of the text file as well as additional information as defined in the Define Report Forms dialog box.

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Time Trigger & Synchronization

6 Time Trigger & Synchronization

6.1 Synchronizing CMC Test Sets

Test Universe enables a synchronized operation of CMC test sets.

Synchronizing a test set to an external reference power frequency

In Synchronized Mode, the test sets CMC 356/CMC 353/CMC 256plus/CMC 256 synchronize the frequency of its analog outputs to a reference signal fed into its Binary/Analog Input 10. Valid frequency range of the reference signal: 40 Hz ... 70 Hz. This synchronization principle is known as Synchronized Mode.

Figure 6-1:Reference signal fed into binary input 10 of a CMC 356 test set

Synchronized Mode is available with State Sequencer and QuickCMC only and requires a CMC test set equipped with the Synchronized Mode features. CMC 256 test sets produced since mid 2004 (serial no. EI... or newer), CMC 256plus, CMC 353 and CMC 356 test sets have these features by default. Older devices can be upgraded.

For specific information about Synchronized Mode, please refer to the Help. Launch the Help, click the --- Hardware Configuration --- entry in the table of contents and navigate to the entry "Synchronized Mode".

40 Hz ... 70 Hz

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Synchronizing to an external timebase

Synchronizing to an external timebase can be achieved in two ways:

1. Triggering each shot of a test sequence by an external time event (see section 6.4 ”Time Trigger Configuration”).

2. By the so-called PermaSync TM functionality, i.e., by permanently synchronizing the internal CMC sample clock to a high-precision external time reference. PermaSync keeps the output sample clock of the CMC in permanent synchronism to an external time source, avoiding any phasor drift between CMC units operating in parallel (e.g., decentralized PMU testing).

This external time source can be an external one pulse per second (1 PPS) signal, or a 1 PPS generated from the IRIG-B or GPS signal.

For specific information about the PermaSyncTM functionality, please refer to the Help. Launch the Help and click the --- Synchronizing CMC Test Sets --- entry in the table of contents.

Synchronizing two or more CMC test sets to one another

A highly accurate time reference triggers two or more CMC test sets to start a test at the exact same point of time. This time reference can be:

1. A GPS (Global Positioning System) signal. The CMC test sets that are to be synchronized each require a CMGPS synchronization unit.

Figure 6-2:CMGPS synchronization unit

For specific information about the CMGPS synchronization unit, please refer to the CMGPS Reference Manual. A PDF version of this manual is available on your hard disk at at installation folder\Test Universe\Doc.


2. An IRIG-B (Inter Range Instrumentation Group) time reference. IRIG-B is a serial time code format and provides the time once per second in seconds through day of year in a binary coded decimal (BCD) format, and an optional binary second-of-day count.

More information about the IRIG-B standard can be found in the IRIG SERIAL TIME CODE FORMATS publication at the url https://wsmrc2vger.wsmr.army.mil/rcc/manuals/200-04/index.html.

CMC test sets required for IRIG-B:

The IRIG-B time reference requires the use of either a CMC 256 test set with the NET-1 option, a CMC 256plus (standard version with Ethernet ports; not

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with PAR-1 option), a CMC 353 or a CMC 356. In addition, a CMIRIG-B is needed to connect the IRIG-B time reference to the "ext. Interf." input of the test set.

Figure 6-3:CMIRIG-B

Via the CMIRIG-B (figure 6-3) you can connect devices to the CMC 356/CMC 353/CMC 256plus/CMC 256 test set that either transmit or receive the IRIG-B time reference signal (IRIG-B source or receiver with 5 V/TTL level; demodulated; DC level shift protocol (B00x)).

Furthermore, a CMGPS synchronization unit can optionally be integrated into the test setup to serve as source of the synchronization moment or 1PPS signal, repectively. The test set decodes (when receiving) or encodes (when transmitting) the IRIG-B protocol. The IRIG-B protocol extensions required by standard IEEE C37.118 are supported as well.

All OMICRON Test Universe test modules that show the toolbar icon support the GPS and/or IRIG-B synchronization. The icon is disabled if the setting on the IRIG-B & GPS tab of the Hardware Configuration does not specify the need for Time Trigger Configuration.

Note: When doing end to end testing, make sure to use the same synchronization mode, i.e., either GPS or IRIG-B, on all involved test sets.

6.2 Using GPS to Synchronize CMC Test Sets

What is GPS?

The Global Positioning System (GPS) is a satellite navigation systems with world-wide reception. It was developed in 1978 by the US Department of Defence to replace TRANSIT, the first US satellite navigation system, and was initially designed to develop the defence ability of the USA.

GPS consists of a total of 24 satellites.

GPS navigation is based on the principle of determining the distance between a certain location on the earth to the 24 NAVSTAR satellites revolving around the earth on six different orbits twice a day. Their orientation in relation to the equator is approx. 55 °. The satellites are continuously sending encoded position and time information in a frequency range of approx. 1500 MHz. Special GPS receivers (passive receivers) receive these signals and determine by means of the signal code as well as measurement of the time span between receiving the signals their exact position in the system of earth co-ordinates.

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Using GPS to synchronize CMC test sets

You can synchronize two or more CMC test sets by connecting a CMGPS synchronization unit to each of the test sets' external Interface inputs (a connector at the rear side). Since the GPS signal is available worldwide, the physical distance between these test sets is thereby of no relevance ("end to end" testing).

Figure 6-4:Example: Synchronizing two CMC test sets with CMGPS when testing a transmission line's protection system

The synchronization accuracy depends on the settings made at the Time Trigger Configuration window:

• Max. error 100 µs - 1.8 ° at 50 Hz in Standard Mode; possible at any point of time during a test.

• Max. error 5 µs - 0.09 ° at 50 Hz in Enhanced Mode (CMC 356/CMC 353/CMC 256plus/CMC 256).

Please note that the 5 µs accuracy is restricted to the test start only. It does not apply to actions triggered by the following GPS pulses.

Antenna Antenna

CMGPS CMGPS

Test Universe software

Signal Signal

Relay Relay

CMC 356 CMC 3563V, 3I, Trip 3V, 3I, Trip

Test Universesoftware

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6.3 Using the IRIG-B Time Reference to Synchronize CMC Test Sets

For basic information about the IRIG time codes standard, please refer to the Test Universe Help. Launch the Help from the Start Page or the test module you are currently working with, click the Time Trigger and Synchronization entry in the table of contents of any of the test modules that support this feature (e.g., State Sequencer), and navigate to the entry "Using the IRIG-B Time Reference to Synchronize CMC Test Sets".

Using the IRIG-B time reference to synchronize two or more remote CMC test sets

You can synchronize two or more CMC test sets by connecting a CMIRIG-B to each of the test sets' external Interface inputs (a connector at the rear side). The CMIRIG-B boxes on their part are synchronized by an external time base, for example, a satellite synchronizing clock (a third party product; IRIG-B generator with 5 V/TTL level; demodulated; DC level shift protocol (B00x)). Therefore, the physical distance between the test sets is of no relevance ("end to end" testing).

Using the CMC test set as IRIG-B generator

Works with CMC 356/CMC 353/CMC 256plus/CMC 256 test sets.

The CMC test set can also work as an IRIG-B generator to feed an IRIG-B time reference it creates into a test object, e.g., a PMU (phasor measurement unit). This requires an CMIRIG-B to be connected between the CMC test set and the test object.

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Figure 6-5:Feeding a CMC-generated IRIB-B time reference into a test object

The CMC test set provides exceptionally high accuracy; it can, of course, not provide the accuracy of the GPS signal. Therefore, the CMC-generated IRIG-B time reference can be GPS-synchronized. In this mode, the CMC test set generates the IRIG-B time reference for the test object, and the CMGPS synchronizes the CMC test set with GPS pulses.

Figure 6-6:Feeding a CMC-generated and GPS-synchronized IRIG-B time reference into a test object

PPX Out IRIG-B Out

CMC test set (rear view)

CMIRIG-B

Test object

PPX Out IRIG-B Out

CMC test set (rear view)

CMGPS

CMIRIG-B

Test object

Antenna

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6.4 Time Trigger Configuration

With Time Trigger Configuration you set up a synchronized operation of two or more CMC test sets. Synchronized operation means: a highly accurate time reference triggers two or more CMC test sets to start a test at the exact same point of time. This time reference can be a GPS 1) signal or an IRIG-B 2) time reference code.

Alternatively, you can use the CMC test set as an IRIG-B generator to feed its time reference into a test object, e.g., a PMU (phasor measurement unit). The CMC generates an IRIG-B time reference with or without additional GPS-synchronization.

6.4.1 How to configure the Time Trigger Configuration

The time trigger configuration settings are made in two different places:

1. In the Hardware Configuration

The IRIG-B & GPS tab provides all hardware-related settings, such as the source of the synchronization (an external IRIG-B time reference or GPS), or the CMC test set parameterization when it operates as IRIG-B generator (an operational mode that requires no external time reference).

For more information refer to chapter 4.6.12 ”IRIG-B & GPS” on page 77.

Only after GPS or IRIG-B settings were specified in the Hardware Configuration, the Time Trigger Configuration toolbar icon is enabled.

2. In the Time Trigger Configuration

Here you configure the test module-specific start time settings of the trigger pulse generation.

The specific GPS and/or IRIG-B settings are saved with the test document of the respective test module. Once this document is-reopened, all of these settings are available again.

Should the test document be reopened, but this time with a different hardware connected - a hardware that does not support the IRIG-B configuration -, this symbol next to the IRIG-B configuration on the IRIG-B & GPS tab notifies you about this discrepancy. In that case, this particular configuration will not work with the connected hardware.

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Figure 6-7:Main dialog box of the Time Trigger Configuration

Test Start Time & Trigger Data

Start time:

This is the start time of the first synchronization pulse; i.e., the time the CMC test set is triggered to start its designated action.

Depending on your start time settings (click the "Modify..." button), this moment is either an absolute time (displayed as hh:mm:ss, e.g., 10:21:00) or a certain moment within a time pattern.

The differentiation between absolute start time and moment in time pattern is set in the Modify Pulse Data dialog box (refer to section 6.4.2)

Trigger period:

Displays the time period between 2 synchronization pulses as set in the Modify Pulse Data dialog box (click the "Modify..." button).

Start Test Accuracy (GPS only)

Overall Test System:

The accuracy mode settings apply when a configuration using GPS was selected on the Hardware Configuration's IRIG-B & GPS tab, and if a CMC 356/CMC 353/CMC 256plus/CMC 256 test set is used.

1

2

3 4

1

pulse n pulse n +1trigger period

2

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Standard:

In standard accuracy mode, the synchronized test sets start the actual test GPS-triggered with the occurrence of the first synchronization pulse as described above plus a max. deviation of +/- 100 µs).

Reason: The CMC 356/CMC 353/CMC 256plus/CMC 256 test sets have a 100 µs sampling interval for reading the status of the binary inputs; that also applies to the external Interface input for the GPS signal. Since the timing of the binary input sampling of the different CMC test sets cannot be synchronized, a time difference of up to 100 µs can occur between the test sets for the recognition of the GPS pulses. This can result in an equivalent phase difference of up to 1.8 ° at 50 Hz mains frequency, or up to 2.16 ° at 60 Hz, respectively.

High Precision:

In high precision mode, the start of a test can be synchronized to the occurrence of the first synchronization pulse as described above plus a max. timing error of 5 µs. Typically, this error is in the range of only 1 µs.

Due to technical reasons, however, the high precision mode requires 2 synchronization pulses to actually start the test. This means: occurrence of first synchronization puls + trigger period = second first synchronization puls + timing error of = 5 µs = test start.

When doing end to end testing, make sure to use the same accuracy mode on all involved CMC test sets.

Restrictions of the high precision accuracy mode:

• Supported by CMC 356/CMC 353/CMC 256plus/CMC 256 test sets.

• The specified precision refers to the first state (start state) of a sequence.

• Concurrent operation of the EnerLyzer is not supported.

Please nore that changing the GPS accuracy from "standard" to "high precision" causes the CMGPS synchronization unit to re-initialize; i.e., CMGPS will start a new search to lock itself to the GPS satellites signals.

1st pulse 2nd pulse + 5 µs = test starttrigger period

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Info

Current local time:

If the GPS signal is used, the UTC time is calculated to a "local time" taking into consideration parameters such as time zone and daylight saving changes from your computer's Date and Time Properties. Note that the indicated time is not the computer's time but in fact the highly accurate GPS or IRIG-B time.

If IRIG-B is used, the received time reference is indicated here.

No. of satellites: (GPS only)

Displays the number of satellites the CMGPS synchronization unit is currently tracking. The number of satellites that the CMGPS synchronization unit requires before it can lock itself to the GPS signal varies; it depends on different factors, such as the accuracy mode and the current state of the search algorithm.

Status:

Displays the current synchronization status. This can be one of the following:

Offline

GPS state "offline" is displayed when the software cannot find any CMGPS synchronization units (CMGPS is powered off or disconnected, etc... .). No user input is possible at that time.

Initializing

When the CMGPS synchronization unit is first powered on, it takes some time to initialize.

Note that changing the GPS accuracy causes CMGPS to re-initialize; i.e., the CMGPS synchronization unit will start a new search to lock itself to the GPS satellites signals.

Searching

GPS state "searching" is displayed when the CMGPS synchronization unit cannot find enough satellites to lock itself to the GPS signal.

Locked

GPS state "locked" is displayed when the CMGPS synchronization found enough satellites to lock itself to the GPS signal. The system is ready to start generating synchronization pulses.

Error

GPS state "error" is displayed when a so-called "non-fatal" error has occurred at the CMGPS synchronization (for example, the antenna became open-circuited).

3

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Status Messages

The following status or error messages can appear

1. In case of GPS synchronization:

• "CMGPS is initializing"

• "CMGPS is saving almanac data to permanent device memory"Almanac data are constantly transmitted by each satellite. They contain important information about the status of the satellite (healthy or unhealthy), current date and time. This part of the signal is essential for determining a position.If the almanac in the CMGPS synchronization unit is older than 6 months, it is downloaded from the satellites and saved in the unit.Please note that saving almanac data may take a considerable time. 15 to 30 minutes are considered normal. Bad weather conditions, however, may lead to a temporary loss of the satellite tracking and draw out the download time.

• "A CMGPS almanac error occurred"An error in the reception of almanac data occurred. Please try again by re-initializing the CMGPS synchronization unit.

• "The CMGPS antenna is open circuited"Check the quality of the antenna connection and whether the cable is intact. The CMGPS antenna is an active antenna, i.e., it has a +5 VDC power supply. The antenna's current consumption is measured. Should it become too low, this warning message appears.

• "The CMGPS antenna is short circuited"If the antenna's current consumption becomes too high, a short-circuit message appears.

2. In case of IRIG-B synchronization:

• "IRIG-B Decoder: State 0"The CMC test set works as IRIG-B receiver. It is currently initializing (state 0) and waits for a an IRIG-B reference marker (a certain bit string of the IRIG-B time code). If the CMC test set has received the reference marker, it automatically changes to "state active".

• "IRIG-B Decoder: Error"The CMC test set works as IRIG-B receiver. A frame or bit error in the IRIG-B bit string was detected.

• "IRIG-B Encoder: No valid PPS "The CMC test set works as IRIG-B generator. The time period between 2 PPS is out of tolerance. An auto correction is applied. The CMC test set continues once the generated signal is valid again.

• "CMIRIG-B adapter removed"CMIRIG-B was removed/unplugged.

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Buttons

Restore Defaults:

Resets parameters to their default values as follows:

• Pulse Time: current time + 10 minutes

• Pulse Date: current date

• Pulse Rate: 60 seconds

• Time Mode: Satellite

• Accuracy: Low, Standard

The restored default values are saved to the flash memory of the CMGPS synchronization unit.

Save to Device...:

Saves the current pulse data, the position and the accuracy mode to the flash memory of the CMGPS synchronization unit.

This is required in order to operate the CMGPS synchronization unit independent from its software.

4

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6.4.2 Modify Pulse DataFigure 6-8:Modify Pulse Data dialog box in Time Trigger Configuration

Start Time

The start time is the time of the first synchronization pulse (trigger); i.e., the time the CMC test set is triggered to start its designated action (i.e., a test start). Select between an absolute start time (displayed as hh:mm:ss, e.g., 10:21:00) or a certain moment within a time pattern.

An absoute start time triggers an action exactly once, e.g., exactly at 10:21:00 o'clock. For any other trigger, the absolute start time needs to be set anew.

If you set a time pattern, the test module internally calculates an absolute start time from your time pattern setting at the moment you start the test, i.e., the moment you click Test Start/Continue. Therefore, a time pattern setting does not need to be set anew for every test start.

A time pattern of means

20 s the trigger pulse will occur at zero (i.e., the beginning) of the next "full 20 seconds". Full 20 seconds means at, for exampe, 10:21:00, 10:21:20 or 10:21:40 ...

30 s the trigger pulse will occur at zero (i.e., the beginning) of the next "full 30 seconds". Full 30 seconds means at, for exampe, 10:21:00, 10:21:30 or 10:22:00 ...

1 min the trigger pulse will occur at zero (i.e., the beginning) of the next "full minute". Full minute means at, for exampe, 10:21:00, 10:22:00 or 10:23:00 ...

2 min the trigger pulse will occur at zero (i.e., the beginning) of the next "full 2 minutes". Full 2 minutes means at, for exampe, 10:22:00, 10:24:00 or 10:26:00 ...



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The time pattern setting has the advantage that it most likely only needs to be set once, and will then never have to be touched again. Since the start time is not absolute, whenever you click "test start", the first synchronization pulse is calculated with reference to that "start test" time to occur at, for example, "zero of the next full 20 seconds".

If "test start" is actually clicked at 10:21:08, with this 20 s setting the first synchronization pulse will occur at 10:21:20. If the same "test start" is clicked once more at 14:52:22, the first synchronization pulse will occur at 14:52:40 - without having to change a setting.

Example: Two remote CMC test sets, each at the end of a line, set to, e.g., 30 s, and "test start" is clicked on one side at 10:21:10, on the other other side at 10:21:22, both test sets will start the actual test synchronized at exactly 10:21:30. If the test is repeated 3 days later in the afternoon, and on both sides "test start" is clicked roughly at 16:10:13, the actual synchronized test starts exactly at 16:10:30.

Such a setting could be incorporated into an Control Center document (OCC) numerous times, but it will never have to be adapted again.

Trigger period

Specify the time period between 2 synchronization pulses.

The trigger period setting is no relevant if the CMC test set works a IRIG-B generator. CMIRIG-B always issues PPS (1 pulse per second).

pulse n pulse n +1trigger period

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File Name Extensions within OMICRON Test Universe


Control Center OCC

filename.OCC OMICRON Control Center test document

OCC Helper Modules

filename.PAU Pause Module

filename.EXQ ExeCute

filename.TXV TextView


filename.OHC OMICRON Hardware Configuration (import/export from HCW’s General tab)

Test Object

filename.RIO The term RIO stands for Relay Interface by OMICRON.

RIO, was developed out of a need for a uniform data format for parameters of protective relays produced by different manufacturers. RIO provides a common structure to allow functionally similar relays from diverse manufacturers to be tested with similar test procedures. Moreover, RIO permits relay characteristics to be imported into the Test Universe software from external sources.

filename.XRIO XRIO represents the second generation of RIO file technology. The term RIO stands for Relay Interface by OMICRON, a technology that was already available with previous Test Universe versions. The X denotes "extended".

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Test Modules

filename.ADT Advanced Distance

filename ANNUCH Annunciation Checker

filename.BDF Differential

filename.CBS Circuit Breaker Simulation

filename.DST Distance

filename.GRF Transient Ground Fault

filename.HRT (Advanced Differential) Diff. Harmonic Restraint

filename.MEA EnerLyzer

filename.MET Meter

filename.NSI NetSim

filename.OAR Autoreclosure

filename.OTF (Advanced Differential) Diff. Operating Characteristic

filename.OUC UCA-CMC Configuration

filename.OVT Overcurrent

filename.PQT PQ Signal Generator

filename.PRA Pulse Ramping

filename.QCM QuickCMC

filename.RMP Ramping

filename.SEQ State Sequencer

filename.SNC Synchronizer

filename.TRA Advanced TransPlay

filename.TRD Transducer

filename.TST (Advanced Differential) Diff. Trip Time

filename.VGT (Advanced Differential) Diff Configuration

filename.VSR VI-Starting

IEC 61850

filename.OSV Samples Values Configuration (IEC 61850-9-2 LE Configuration Module).

filename.OGC GOOSE configuration file

filename.OUC GSSE configuration file

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Test Tools

filename.BIO Binary I/O Monitor

filename.HOU Harmonics

filename.LST TransPlay

filename.TYP TypConverter

Other file name extension to know about

filename.CFG COMTRADE configuration file for the description of the failure report channels (signal names, sample frequency etc.). Can be imported with the test module Advanced TransPlay, and loaded with the (optional) test tool TransView.

filename.CML Comtrade file. Can be loaded with the (optional) test tool TransView.

filename.CSV Comma Separated Value. This file format is readable by any common database. Data is written in simple a table format. A selectable field delimiter separates the individual values.

If a certain value is a text string, the value needs to have a text qualifier (the text may contain the character which is used a field delimiter). As the naming of Boolean values is not consistent throughout different database programs, the True and False values need to be defined as well.

filename.DAT COMTRADE file with the sample values of the failure report channels. Can be imported with the test module Advanced TransPlay, and loaded with the (optional) test tool TransView.

filename.HDR "Header file" that contains any data-related text that is not used by the software. Can be loaded with the test module Advanced TransPlay

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filename.PDF Invented by Adobe, Portable Document Format became the standard format for the electronic document distribution and exchange. PDF files look exactly like original documents and preserve the fonts, images, graphics, and layout of any source file - regardless of the application and platform used to create it.

To view a PDF file, either the Adobe Reader © or the Foxit Reader (both freeware) is required. If you have no PDF reader on your computer yet, OMICRON Test Universe installs the Foxit Reader.

filename.PL4 PL4 file. Can be imported with the test module Advanced TransPlay, and loaded with the (optional) test tool TransView.

filename.RTF Rich Text Format. File format used by Microsoft Word or other word processing applications.

filename.TPL Template file for the test reports (based on RTF)

filename.TRF TRF file. Can be imported with the test module Advanced TransPlay, and loaded with the (optional) test tool TransView.

filename.XML XML (eXtensible Markup Language) became accepted as a standard for data exchange, particularly between different platforms. XML and related technologies are W3C (World Wide Web Consortium) recommendations.

If you want to learn more about XML, the W3C site http://www.w3.org/XML/ may be a good starting point.

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Contact Information / Technical Support


Europe, Africa, Middle East

OMICRON electronics GmbH

Phone: +43 5523 507-333

E-Mail: [email protected]

Web: http://www.omicron.at

Asia, Pacific

OMICRON electronics Asia Ltd, Hong Kong

Phone: +852 2634 0377


Web: http://www.omicron.at

North and South America

OMICRON electronics Corp. USA

Phone: +1 713 830-4660 or 1 800 OMICRON


Web: http://www.omicronusa.com

For addresses of OMICRON offices with customer service centers, regional sales offices or offices for training, consulting and commissioning, please see the Contact section of our Web site http://www.omicron.at.

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132

Index

Index

3x12.5A, 70VA @ 7.5A 10 Vrms, IE automatically calculated (HWC) . . . . . . . . 633x300V, 50VA @ 75V, 660mArms, VE automatically calculated (HWC) . . . . . . . 62

Aabsolute or relative values (unit manager) . . 99accuracy

GPS synchronization accuracy . . . . . . . 116start test GPS-triggered . . . . . . . . . . . . . 120

addressOMICRON addresses . . . . . . . . . . . . . . 131

Advanced operational modeTest Object . . . . . . . . . . . . . . . . . . . . . . . 24

amplifier configuration detailsGeneral tab (HWC) . . . . . . . . . . . . . . . . . 66

Analog Outputs tab (HWC) . . . . . . . . . . . . . . 70ASCII

data export format . . . . . . . . . . . . . . . . . 106assessment

changing passed/failed assessment . . . 102

BBinary Outputs tab (HWC) . . . . . . . . . . . . . . 74Binary/Analog Inputs tab (HWC) . . . . . . . . . . 72block

more than one function block in an XRIO file . . . . . . . . . . . . . . . . . . . . . . . . . 28working with blocks in Organizer (TO) . . . 25

Cclearing test results (OCC) . . . . . . . . . . . . . 101CMB IO-7 (hardware option) . . . . . . . . . . . . . 83CMC configuration details (HWC) . . . . . . . . . 61

CMGPS . . . . . . . . . . . . . . . . . . . . . . . . . . . 114CMIRIG-B . . . . . . . . . . . . . . . . . . . . . . . . . . 114CM-Line tutorials . . . . . . . . . . . . . . . . . . . . . 13color

of text (OCC) . . . . . . . . . . . . . . . . . . . . . 104COMTRADE

file name extension CML . . . . . . . . . . . . 129contact information

OMICRON addresses . . . . . . . . . . . . . . 131continue a paused test . . . . . . . . . . . . . . . . 100Control Center

about the OMICRON Control Center . . . 85activate a group via LinkToXRIO . . . . . . 90activate a test module via LinkToXRIO . . 90

converterXRIO converter . . . . . . . . . . . . . . . . . . . . 22

CSVdata export format . . . . . . . . . . . . . . . . . 106

CT (current transformer)configuring a CT in HWC . . . . . . . . . . . . 64

currentcurrent output 3x12.5A, 70VA @ 7.5A 10 Vrms, IE automatically calculated . . . 63current sensor simulation (General tab HWC) . . . . . . . . . . . . . . . . . 68mirrored currents . . . . . . . . . . . . . . . . . . . 71

Custom section on Start Page . . . . . . . . . . . 14

Ddata export

exporting report data . . . . . . . . . . . . . . . 106file formats . . . . . . . . . . . . . . . . . . . . . . . 106note reg. ’unit switching’ . . . . . . . . . . . . 106

DC Analog Inputs tab (HWC) . . . . . . . . . . . . 76debouncing input signals . . . . . . . . . . . . . . . 32default

apply new test report default to OCC document . . . . . . . . . . . . . . . . . . . . . . . . 97defining a new test report default . . . . . . 97

deglitching input signals . . . . . . . . . . . . . . . . 31Device Settings tab (Test Object) . . . . . . . . 30

133


D (cont.)

Diagnosis & Calibration section on Start Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14Differential protection

preventing the trip . . . . . . . . . . . . . . . . . . 71DVD browser (installation of Test Universe) . 13

Ee-mail

OMICRON addresses . . . . . . . . . . . . . . 131end to end testing

with IRIG-B synchronization . . . . . . . . . 117withGPS synchronization . . . . . . . . . . . . 116

ExeCute (OCC Helper Module) . . . . . . . . . 112export

test results & data of OCC document . . 106

Ffile formats

data export formats . . . . . . . . . . . . . . . . 106file name extensions in Test Universe . . . . 127font

setting font for OCC document . . . . . . . 104footer of OCC document . . . . . . . . . . . . . . . 103format

layout of OCC document . . . . . . . . . . . . 103paragraph . . . . . . . . . . . . . . . . . . . . . . . 103text font and color (OCC) . . . . . . . . . . . . 104

formulain Test Object . . . . . . . . . . . . . . . . . . . . . . 20

Gglobal Hardware Configuration . . . . . . . . . . . 37global Test Object vs. local Test Object . . . . 15

GPSIRIG-B & GPS settings in HWC . . . . . . . 77synchronization accuracy . . . . . . . . . . . 116synchronization of CMC test sets . . . . . 113

groupactivate a group via LinkToXRIO (Control Center) . . . . . . . . . . . . . . . . . . . 90

HHardware Configuration

general description . . . . . . . . . . . . . . . . . 36global (test module embedded in OCC) . 37gobal vs. local . . . . . . . . . . . . . . . . . . . . . 46if test module is running stand-alone . . . 43local (test module embedded in OCC) . . 42multiple HWC in test document . . . . . . . . 92starting HWC . . . . . . . . . . . . . . . . . . . . . . 48updating HWC with data of connected test set . . . . . . . . . . . . . . . . . . . . . . . . . . . 51usage of existing HWC . . . . . . . . . . . . . . 50verifying connected hardware . . . . . . . . . 98

header of OCC document . . . . . . . . . . . . . 103high precision

start test GPS-triggered (Time Trigger Configuration) . . . . . . . . . . . . . . . . . . . . 121

hotline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131

IIE automatically calculated (3x12.5A, 70VA @ 7.5A 10 Vrms, in HWC) . . . . . . . . . 63input signal

debouncing input signals . . . . . . . . . . . . . 32deglitching input signals . . . . . . . . . . . . . 31

installation DVD browser . . . . . . . . . . . . . . . 13IRIG-B

CMC test set as IRIG-B generator . . . . 117generating an IRIG-B time reference with a CMC test set . . . . . . . . . . . . . . . . 117generator following GPS (settings in HWC) . . . . . . . . . . . . . . . . . . 79

134

Index

I (cont.)

generator following PPS (settings in HWC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78generator master (settings in HWC) . . . . 78IRIG-B & GPS settings in HWC . . . . . . . . 77synchronization of CMC test sets . . . . . 113

LLanguage Selection on Start Page . . . . . . . . 12layout

format layout of OCC document . . . . . . 103license file Omicron.lic . . . . . . . . . . . . . . . . . 12License Manager . . . . . . . . . . . . . . . . . . . . . 12link error

LinkToXRIO with test modules or groups (Control Center) . . . . . . . . . . . . . . 90

LinkToXRIO . . . . . . . . . . . . . . . . . . . . . . . . . 20activate a group via LinkToXRIO (Control Center) . . . . . . . . . . . . . . . . . . . . 90activate a test module via LinkToXRIO (Control Center) . . . . . . . . . . . . . . . . . . . . 90

local Hardware Configuration . . . . . . . . . . . . 42local Test Object vs. global Test Object . . . . 15long form

pre-defined test report form . . . . . . . . . . . 93low level outputs configuration

General tab (HWC) . . . . . . . . . . . . . . . . . 69

MManchester II (IRIG-B setting in HWC) . . . . . 81mirrored currents . . . . . . . . . . . . . . . . . . . . . . 71modulation (IRIG-B setting in HWC) . . . . . . . 81multi-functional relay

preventing diff. protection from tripping . . 71

Nno. of satellites

GPS (Time Trigger Configuration) . . . . 122

OOCC

about the OMICRON Control Center . . . 85running tests from OCC . . . . . . . . . . . . . 98

OCC Helper ModuleExeCute . . . . . . . . . . . . . . . . . . . . . . . . 112Pause Module . . . . . . . . . . . . . . . . . . . . 109TextView . . . . . . . . . . . . . . . . . . . . . . . . 112

OCC test documentexporting report data . . . . . . . . . . . . . . . 106inserting a Pause Module . . . . . . . . . . . 109

OMICRON Control Center (OCC) . . . . . . . . 85Omicron.lic license file . . . . . . . . . . . . . . . . . 12operational mode

in Test Object (toggling) . . . . . . . . . . . . . 26overload

overload detection on Device Settings tab (Test Object) . . . . . . . . . . . . . . . . . . . 32

Ppage numbers of OCC document . . . . . . . 103paragraph formatting . . . . . . . . . . . . . . . . . 103password-protection for test documents . . 108pause

continue paused test . . . . . . . . . . . . . . . 100pausing a test (Pause Module) . . . . . . . 101

Pause Module (OCC Helper Module) . . . . . 109PDF

file name extension . . . . . . . . . . . . . . . . 130PermaSync . . . . . . . . . . . . . . . . . . . . . . . . . 114primary or secondary values (unit manager) 99protection levels for test documents . . . . . . 107

135


RRelay Interface for OMICRON. Refer to RIOreset to default

test report . . . . . . . . . . . . . . . . . . . . . . . . . 97Residual voltage/current factors on Device Settings page (Test Object) . . . . . . . 31RIO

exporting a RIO file . . . . . . . . . . . . . . . . . 24file name extension . . . . . . . . . . . . . . . . 127importing a RIO file . . . . . . . . . . . . . . . . . 24the XRIO file format . . . . . . . . . . . . . . . . . 20

Rogowski current sensor simulationGeneral tab (HWC) . . . . . . . . . . . . . . . . . 68

RTFreport export format . . . . . . . . . . . . . . . . 106

SSampled Values data streams . . . . . . . . . . . 80scripting

protect OCC document from changes . . 107seconds or cycles (unit manager) . . . . . . . . . 99setting up the hardware . . . . . . . . . . . . . . . . 35Setup section on Start Page . . . . . . . . . . . . . 11short form

pre-defined test report form . . . . . . . . . . . 93signal

debouncing input signals . . . . . . . . . . . . . 32deglitching input signals . . . . . . . . . . . . . . 31

Standard operational modeTest Object . . . . . . . . . . . . . . . . . . . . . . . 24

Start Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9start/continue a test (OCC) . . . . . . . . . . . . . 100status messages

in Time Trigger Configuration . . . . . . . . 122switching units . . . . . . . . . . . . . . . . . . . . . . . . 99synchronization of CMC test sets (GPS, IRIG-B) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113syntax of formulas in Test Object . . . . . . . . . 20System Settings on Start Page . . . . . . . . . . . 11

TTechnical Support . . . . . . . . . . . . . . . . . . . 131telegram format (settings in HWC) . . . . . . . . 81template

test report template . . . . . . . . . . . . . . . . . 95test

changing passed/failed assessment . . . 102clearing test results (OCC) . . . . . . . . . . 101pausing a test (Pause Module) . . . . . . . 101running tests from OCC . . . . . . . . . . . . . 98start/continue a test . . . . . . . . . . . . . . . . 100

test documentexporting data . . . . . . . . . . . . . . . . . . . . 106layout . . . . . . . . . . . . . . . . . . . . . . . . . . . 103multiple HWCs in test document . . . . . . . 92multiple test modules in OCC document . 86multiple Test Objects in test document . . 92object icon in test document . . . . . . . . . 105password-protection . . . . . . . . . . . . . . . 108protection levels . . . . . . . . . . . . . . . . . . 107

test moduleactivate a test module via LinkToXRIO (Control Center) . . . . . . . . . . . . . . . . . . . 90in OCC test document . . . . . . . . . . . . . . . 85multiple test modules in test document . . 86

Test Object"local" vs. "global" Test Object . . . . . . . . 15LinkToXRIO . . . . . . . . . . . . . . . . . . . . . . . 20multiple Test Objects in test document . . 92setting up a test object . . . . . . . . . . . . . . 15

test objectmoving/copying LinkToXRIO-linked items from one Test Object to another (Control Center) . . . . . . . . . . . . . . . . . . . . . . . . . . 90

test plan. Refer to test documenttest report

adding test report forms . . . . . . . . . . . . . 96Apply New Default to complete OCC document . . . . . . . . . . . . . . . . . . . . . . . . 97customizing a test report . . . . . . . . . . . . . 95defining a new test report default . . . . . . 97deleting test report forms . . . . . . . . . . . . 96

136

Index

T (cont.)

test reportpre-defined forms . . . . . . . . . . . . . . . . . . . 93reset to default . . . . . . . . . . . . . . . . . . . . . 97using pre-defined forms . . . . . . . . . . . . . . 93

test start timeTime Trigger Configuration . . . . . . . . . . 120

Test Tools section on Start Page . . . . . . . . . 11text font and color (OCC) . . . . . . . . . . . . . . 104TextView (OCC Helper Module) . . . . . . . . . 112time synchronization of CMC test sets (GPS, IRIG-B) . . . . . . . . . . . . . . . . . . . . . . . 113Time Trigger Configuration

configuration . . . . . . . . . . . . . . . . . . . . . 119Tips & Tricks . . . . . . . . . . . . . . . . . . . . . . . . . 13toolbar

unit manager . . . . . . . . . . . . . . . . . . . . . . 99transformer

configuring ext. CT or VT in HWC . . . . . . 64trigger

time trigger synchronization of CMC test sets (GPS, IRIG-B) . . . . . . . . . . . . . 113trigger data (Time Trigger Configuration) . . . . . . . . . . . . . . . . . . . . 120via GPS (IRIG-B & GPS settings in HWC) . . . . . . . . . . . . . . . . . . . . . . . . . . 77via IRIG-B (IRIG-B & GPS settings in HWC) . . . . . . . . . . . . . . . . . . . . . . . . . . 77

Tutorials . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Uunit switching

and data export . . . . . . . . . . . . . . . . . . . 106the Unit Manager . . . . . . . . . . . . . . . . . . . 99

updatehardware information of connected test set . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

User Forum (link on OMICRON Web site) . . 13user-defined variables in Test Object . . . . . . 20

Vvalue

absolute or relative . . . . . . . . . . . . . . . . . 99primary or secondary . . . . . . . . . . . . . . . 99seconds or cycles . . . . . . . . . . . . . . . . . . 99value switiching in unit manager . . . . . . . 99

VE automatically calculated (3x300V, 50VA @ 75V, 660mArms in HWC) . . . . . . . 62verify connected hardware (OCC) . . . . . . . . 98voltage output

3x300V, 50VA @ 75V, 660mArms, VE automatically calculated . . . . . . . . . . 62

voltage sensor simulationsGeneral tab (HWC) . . . . . . . . . . . . . . . . . 67

VT (voltage transformer)configuring a VT in HWC . . . . . . . . . . . . . 64

WWeb site

OMICRON Web site . . . . . . . . . . . . . . . 131User Forum . . . . . . . . . . . . . . . . . . . . . . . 13

wiring tablesworking with wiring tables (HWC) . . . . . . 55

XXML

data export format . . . . . . . . . . . . . . . . . 106file name extension . . . . . . . . . . . . . . . . 130

XRIOabout XRIO . . . . . . . . . . . . . . . . . . . . . . . 20exporting an XRIO file . . . . . . . . . . . . . . . 24file name extension . . . . . . . . . . . . . . . . 127importing an XRIO file . . . . . . . . . . . . . . . 24XRIO converter . . . . . . . . . . . . . . . . . . . . 22

137


Zzero sequence current

calculation of ground-fault current . . . . . . 31zero sequence voltage

calculation of residual voltage . . . . . . . . . 31

138